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TW201100966A - Positive photosensitive composition and method for forming cured film using the same - Google Patents

Positive photosensitive composition and method for forming cured film using the same Download PDF

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TW201100966A
TW201100966A TW99113792A TW99113792A TW201100966A TW 201100966 A TW201100966 A TW 201100966A TW 99113792 A TW99113792 A TW 99113792A TW 99113792 A TW99113792 A TW 99113792A TW 201100966 A TW201100966 A TW 201100966A
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positive photosensitive
formula
resin composition
photosensitive resin
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TW99113792A
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Chinese (zh)
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TWI481963B (en
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Satoshi Takita
Takeshi Ando
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Fujifilm Corp
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  • Materials For Photolithography (AREA)
  • Electroluminescent Light Sources (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
  • Liquid Crystal (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

The present invention provides a positive photosensitive composition and a method for forming a cured film using the same, wherein the positive photosensitive composition has excellent sensitivity, retention of film thickness and storage stability and a method for forming a cured film, and the positive photosensitive composition is capable of obtaining a cured film having excellent heat endurance, adhesiveness and transmittance by means of curing thereof. The present invention provides a positive photosensitive composition and a method for forming a cured film using the same. The positive photosensitive composition comprises a resin obtained by reacting a specific styrene-based constitution unit of a carboxyl group which is produced by dissociating from a dissociative group with a carboxyl group to form a functional group constitution unit of a covalent bon, and meanwhile the resin does not dissolve in alkali or difficultly dissolve in alkali and dissolve in alkali while a dissociative group is dissociated; a compound has more than two of epoxy groups in the molecular; and an acid compound can be produced by irradiating 300 nm of active ray.

Description

201100966 六、發明說明: 【發明所屬之技術領域】 本發明係有關於一種正型感光性樹脂組成物及使用它 之硬化膜形成方法。更詳言之,本發明係有關於一種適合 於形成液晶顯示元件、積體電路元件、固態攝影元.件、有 機EL元件等的電子零件的平坦化膜、保護膜或層間絕緣膜 之正型感光性樹脂組成物及使用它之硬化膜形成方法。 【先前技術】 ^ 先前,在液晶顯示元件、積體電路元件、固態攝影元 件、有機EL元件等的電子零件,通常,在形成用以賦予電 子零件表面的平坦性之平坦化膜、電子零件的劣化或損傷 之保護膜或用以保持絕緣性之層間絕緣膜時,係使用感光 性樹脂組成物。例如,TFT型液晶顯示元件能夠在玻璃基 板上設置偏光板,並形成ITO等的透明導電電路層及薄膜 電晶體(TFT),且使用層間絕緣膜被覆而作爲背面板之另外 Q 一方,係在玻璃基板上設置偏光板,並依照必要形成黑色 矩陣層及彩色濾光片層的圖案,而且依照順序形成透明導 電電路層、層間絕緣膜而作爲上面板,並透過間隙物使該 背面板與上面板相向而在兩板間封入液晶來製造,其中, 作爲形成層間絕緣膜時所使用的感光性樹脂組成物,被要 求具有優良的殘膜率、耐熱性、黏附性及透明性。而且, 該感光性樹脂組成物被要求保存時具有優良的經時安定 性。 作爲感光性樹脂組成物,例如專利文獻1提案揭示一 -4- 201100966 種感光性樹脂組成物,其係含有:(A)可溶於鹼性水溶液之 樹脂,其係(a)不飽和羧酸或不飽和羧酸酐、(b)具有環氧基 的自由基聚合性化合物及(c)其他自由基聚合性化合物之 聚合物;及(B)感放射線性酸產生化合物。在專利文獻2提 案揭示一種感光性樹脂組成物,其係含有鹼可溶性丙烯酸 系高分子黏合劑、含醌二叠氮基的化合物、交聯劑及光酸 產生劑而構成之感光性樹脂組成物。但是該等係任一者均 是敏感度、未曝光部殘膜率、解像性、經時安定性不充分 ^ 而無法滿足製造高品質的液晶顯示元件者。在專利文獻3 提案揭示一種正型化學增幅光阻組成物,其特徵係交聯 .劑、酸產生劑及其本身係不溶或難溶於鹼性水溶液,但是 含有一種樹脂,該樹脂具有藉由酸的作用會裂解之保護 基,該保護基裂解後會成爲對鹼性水溶液具有可溶性。但 是係因爲黏附性或透射率不充分而無法滿足製造高品質的 液晶顯示元件者。在專利文獻4提案揭示一種感放射線性 Q 樹脂組成物,其特徵係含有樹脂及酸產生劑,該樹脂係含 有縮醛構造及/或縮酮構造和環氧基,敏感度及透射率低而 無法滿足者。在專利文獻5提案揭示一種感放射線性樹脂 組成物,其特徵係含有:藉由縮醛或縮酮保護的羥基苯乙 烯樹脂;因照射波長3 OOnm以上的活性光線會產生酸之化 合物;及交聯劑;但是係透射率低而無法滿足者。 [先前技術文獻] [專利文獻] 201100966 [專利文獻1]特開平5- 1 652 1 4號公報 [專利文獻2]特開平1 0- 1 53 854號公報 [專利文獻3]特開2004-4669號公報 [專利文獻4]特開2004-264623號公報 [專利文獻5]特開2008-3 04902號公報 【發明內容】 [發明所欲解決之課題] _ 因此,本發明之課題係提供一種敏感度、殘膜率、保 〇 存安定性優良的正型感光性樹脂組成物及使用它之硬化膜 形成方法,藉由使其硬化能夠得到耐熱性、黏附性、透射 率等優良之硬化膜之正型感光性樹脂組成物及使用它之硬 化膜形成方法。 而且,提供一種使用該硬化膜形成方法而得到的硬化 膜,而且提供一種具有該硬化膜之液晶顯示元件、積體電 路元件、固態攝影元件或有機EL元件。 〇 [解決課題之手段] 爲了解決上述課題,本發明者等專心硏討的結果,完 成了本發明。 本發明係如下述。 [1]-種正型感光性樹脂組成物,其特徵係含有:(A)樹脂, 其係含有由下述通式(1)所表示之構成單元及具有能夠與 竣基反應而形成共價鍵的官能基之構成單元,並且係鹼不 溶性或鹼難溶性且解離性基解離時會成爲鹼可溶性;及(B) 201100966 藉由照射活性光線會產生酸之化合物。[Technical Field] The present invention relates to a positive photosensitive resin composition and a method of forming a cured film using the same. More specifically, the present invention relates to a positive type of a planarizing film, a protective film or an interlayer insulating film suitable for forming electronic parts of liquid crystal display elements, integrated circuit elements, solid-state imaging elements, organic EL elements, and the like. A photosensitive resin composition and a method of forming a cured film using the same. [Prior Art] Conventionally, in electronic components such as liquid crystal display elements, integrated circuit elements, solid-state imaging elements, and organic EL elements, generally, planarizing films and electronic parts for imparting flatness to the surface of electronic parts are formed. When a protective film which deteriorates or damages or an interlayer insulating film for maintaining insulation is used, a photosensitive resin composition is used. For example, a TFT-type liquid crystal display device can be provided with a polarizing plate on a glass substrate, and a transparent conductive circuit layer such as ITO or a thin film transistor (TFT) can be formed, and an interlayer insulating film can be used as a further Q side of the back surface plate. A polarizing plate is disposed on the glass substrate, and a pattern of a black matrix layer and a color filter layer is formed as necessary, and a transparent conductive circuit layer and an interlayer insulating film are sequentially formed as an upper panel, and the back panel is passed through the spacer. The panel is formed by sealing liquid crystal between the two sheets, and the photosensitive resin composition used for forming the interlayer insulating film is required to have excellent residual film ratio, heat resistance, adhesion, and transparency. Further, the photosensitive resin composition is required to have excellent stability over time when stored. As a photosensitive resin composition, for example, Patent Document 1 proposes a photosensitive resin composition comprising: (A) a resin soluble in an aqueous alkaline solution, which is (a) an unsaturated carboxylic acid. Or a unsaturated carboxylic acid anhydride, (b) a radical polymerizable compound having an epoxy group, and (c) a polymer of another radical polymerizable compound; and (B) a radiation-sensitive acid generating compound. Patent Document 2 proposes a photosensitive resin composition comprising a photosensitive resin composition comprising an alkali-soluble acrylic polymer binder, a quinonediazide-containing compound, a crosslinking agent, and a photoacid generator. . However, in any of these systems, the sensitivity, the residual film rate in the unexposed portion, the resolution, and the stability over time are insufficient, and it is not possible to satisfy the manufacture of a high-quality liquid crystal display device. Patent Document 3 proposes a positive-type chemically amplified photoresist composition characterized by a crosslinking agent, an acid generator and itself which are insoluble or poorly soluble in an alkaline aqueous solution, but contain a resin having a resin The action of the acid will cleave the protecting group, which will become soluble in the aqueous alkaline solution after cleavage. However, it is not possible to satisfy the manufacture of high-quality liquid crystal display elements because of insufficient adhesion or transmittance. Patent Document 4 proposes a radiation sensitive Q resin composition characterized by containing a resin and an acid generator containing an acetal structure and/or a ketal structure and an epoxy group, and having low sensitivity and transmittance. Unable to meet. Patent Document 5 proposes a radiation sensitive resin composition characterized by: a hydroxystyrene resin protected by an acetal or a ketal; a compound which generates an acid due to an active light having an irradiation wavelength of 300 nm or more; Joint agent; but the transmittance is low and cannot be satisfied. [PATENT DOCUMENT] [Patent Document 1] Japanese Laid-Open Patent Publication No. JP-A No. Hei No. Hei. [Patent Document 4] JP-A-2004-264623 [Patent Document 5] JP-A-2008-3 04902 SUMMARY OF INVENTION [Problems to be Solved by the Invention] _ Therefore, the subject of the present invention is to provide a sensitivity A positive photosensitive resin composition excellent in degree of resilience, residual film, and stability, and a method for forming a cured film using the same, which are cured to obtain a cured film excellent in heat resistance, adhesion, transmittance, and the like. A positive photosensitive resin composition and a method of forming a cured film using the same. Further, a cured film obtained by using the cured film forming method is provided, and a liquid crystal display element, an integrated circuit element, a solid-state imaging element or an organic EL element having the cured film is provided. [Means for Solving the Problem] In order to solve the above problems, the inventors of the present invention have completed the present invention as a result of concentration. The present invention is as follows. [1] A positive-type photosensitive resin composition characterized by comprising: (A) a resin comprising a constituent unit represented by the following formula (1) and having a reactivity with a thiol group to form a covalent bond a constituent unit of a functional group of a bond, and is alkali-insoluble or alkali-insoluble and dissociable-base dissociates to become alkali-soluble; and (B) 201100966 a compound which generates an acid by irradiation with active light.

(1) 在通式(1), R1係表示氫原子、甲基、鹵素原子或氰基。 R2及R3係各自獨立地表示氫原子、直鏈狀或分枝狀烷 〇 基。但是R2及R3同時爲氫原子之情況除外。 R4係表示亦可被取代之直鏈狀、分枝狀或環狀烷基、 或芳烷基。 R2或R3亦可與R4連結而形成環狀醚。 [2] 如[1]之正型感光性樹脂組成物,其中更含有(C)在分子 內具有2個以上的環氧基之化合物(但是,前述A除外)。 [3] 如[1]或[2]之正型感光性樹脂組成物,其中(B)成分係含 Q 有藉由照射波長300nm以上的活性光線會產生酸之化合 物。 [4] 如[1]至[3]中任一項之正型感光性樹脂組成物,其中(B) 成分係含有由下述通式(2)所表示的磺酸肟(oxime sulfonate)基之化合物。 201100966 在通式(2), R5係表示亦可被取代之直鏈狀、分枝狀、環狀烷基、或亦 可被取代之芳基。 [5]如[4]之正型感光性樹脂組成物,其中含有通式(2)所表 示的磺酸肟基之化合物係下述通式(2-1)所表示之化合物。(1) In the formula (1), R1 represents a hydrogen atom, a methyl group, a halogen atom or a cyano group. R2 and R3 each independently represent a hydrogen atom, a linear or branched alkyl group. However, except when R2 and R3 are simultaneously a hydrogen atom. R4 represents a linear, branched or cyclic alkyl group or an aralkyl group which may also be substituted. R2 or R3 may also be bonded to R4 to form a cyclic ether. [2] The positive photosensitive resin composition of [1], which further contains (C) a compound having two or more epoxy groups in the molecule (except for the above A). [3] The positive photosensitive resin composition according to [1] or [2], wherein the component (B) contains Q having an acid which generates an acid by irradiation with an active light having a wavelength of 300 nm or more. [4] The positive photosensitive resin composition according to any one of [1] to [3] wherein the component (B) contains an oxime sulfonate group represented by the following formula (2). Compound. 201100966 In the formula (2), R5 represents a linear, branched, cyclic alkyl group which may be substituted, or an aryl group which may be substituted. [5] The positive photosensitive resin composition of [4], wherein the compound containing a sulfonic acid sulfonium group represented by the formula (2) is a compound represented by the following formula (2-1).

在通式(2-1 ), R5係與在式(2)之R5相同。 x係表示直鏈狀或分枝狀烷基、烷氧基或鹵素原子。 m係表示〇〜3的整數。m爲2或3時,複數個X可以相同 亦可以不同。 [6]如[4]之正型感光性樹脂組成物,其中含有通式(2)所表 Ο 示的磺酸肟基之化合物係下述通式(2-2)所表示之化合物。In the general formula (2-1), R5 is the same as R5 in the formula (2). The x system represents a linear or branched alkyl group, an alkoxy group or a halogen atom. The m system represents an integer of 〇~3. When m is 2 or 3, a plurality of Xs may be the same or different. [6] The positive photosensitive resin composition of [4], wherein the compound containing a sulfonic acid sulfonium group represented by the formula (2) is a compound represented by the following formula (2-2).

在通式(2-2), R5係與在式(2)之R5相同。 r6係表示鹵素原子、羥基、烷基、烷氧基、氰基或硝基。 201100966 1係表示0〜5的整數。1爲2以上時,複數個R6 亦可以不同。 [7] 如[1]至[6]中任一項之正型感光性樹脂組成物 述能夠與羧基反應而形成共價鍵的官能基係環氧 [8] 如[7]之正型感光性樹脂組成物,其中前述具有 $反應而形成共價鍵的官能基之構成單元係來自 式(3)至(5)中任一項所表示的自由基聚合性單體 元。 〇 可以相同 ,其中前 基。 能夠與羧 由下述通 之構成單 R7 〇 H2C=4 - 一 R1。 I | (3) R® R8In the formula (2-2), the R5 group is the same as R5 in the formula (2). R6 represents a halogen atom, a hydroxyl group, an alkyl group, an alkoxy group, a cyano group or a nitro group. 201100966 1 is an integer from 0 to 5. When 1 is 2 or more, a plurality of R6s may be different. [7] The positive-type photosensitive resin composition according to any one of [1] to [6], wherein the functional group-based epoxy which can react with a carboxyl group to form a covalent bond [8] is positive photosensitive of [7] In the resin composition, the constituent unit having the functional group which forms a covalent bond by the reaction is derived from the radical polymerizable monomer represented by any one of the formulas (3) to (5). 〇 can be the same as the front base. It can form a single R7 〇 H2C=4 - a R1 with the carboxylic acid. I | (3) R® R8

〇 在通式(3)〜(5), R7係表示氫原子、甲基或鹵素原子。 R8〜R15係各自獨立地表示氫原子或烷基。 X係表示2價的連結基。 η係1〜1 0的整數。 ,其中前 雜環丁烷 [9]如[1]至[6]中任〜項之正型感光性樹脂組成物 述能夠與竣基反應而形成共價鍵的官能基係氧〇 In the general formulae (3) to (5), R7 represents a hydrogen atom, a methyl group or a halogen atom. R8 to R15 each independently represent a hydrogen atom or an alkyl group. X represents a divalent linking group. η is an integer from 1 to 10 0. And a positive type photosensitive resin composition of any one of [1] to [6], wherein the functional group oxygen capable of reacting with a thiol group to form a covalent bond

201100966 [ι〇]如[9]之正型感光性樹脂組成物,其中具有能夠與羧基 反應而形成共價鍵的官能基之構成單元係來自由下述通式 (6)所表示的自由基聚合性單體之構成單元。201100966 [ι〇] The positive photosensitive resin composition of [9], wherein the constituent unit having a functional group capable of reacting with a carboxyl group to form a covalent bond is derived from a radical represented by the following general formula (6) A constituent unit of a polymerizable monomer.

R7係表示氫原子、甲基或鹵素原子。 R8〜R12係各自獨立地表示氫原子或烷基。 X係表示2價的連結基。 η係1〜1 0的整數。 [11 ]如[1 ]至[1 〇]中任一項之正型感光性樹脂組成物,其中 更含有(D)黏附助劑。 Q [12]—種硬化膜形成方法,其特徵係包含:在基板上塗布 如[1]至[11]中任一項之正型感光性樹脂組成物並乾燥,來 形成塗膜之步驟;透過光罩並使用活性光線來進行曝光之 步驟;使用鹼性顯像液進行顯像,來形成圖案之步驟;及 加熱處理所得到的圖案之步驟。 [1 3 ]如[1 2]之硬化膜形成方法,其中在使用鹼性顯像液進行 顯像來形成圖案後,在加熱處理所得到的圖案的步驟之 前,更含有全面曝光之步驟。 •10- 201100966 [14] 一種硬化膜,其係使用如[12]或[13]之硬化膜形成方法 所形成。 [15] —種液晶顯示元件,其具有如[14]之硬化膜。 [16] —種積體電路元件,其具有如[14]之硬化膜。 [17] —種固態攝影元件,其具有如[14]之硬化膜。 [18] —種有機EL元件,其具有如[14]之硬化膜。 以下,進而舉出本發明之較佳實施態樣。 [1 9 ]如[1 ]至[1 1 ]中任一項之正型感光性樹脂組成物’其中 〇 相對於(A)成分的總量100質量份,含有0.1〜10質量份(B) 成分。 [2 0 ]如[1 ]至[1 1 ]及[1 9]中任一項之正型感光性樹脂組成 籾,其中相對於(A)成分的總量100質量份.,含有1〜50質 量份(C)成分。 [21]如[1]至[11]、[19]及[2 0]中任一項之正型感光性樹脂組 成物,其中相對於(A)成分的總量100質量份,含有0.1〜 Q 20質量份(D)成分。 發明之效果 依照本發明,能夠提供一種正型感光性樹脂組成物及 使用它之硬化膜形成方法,其係敏感度、殘膜率、保存安 定性優良的正型感光性樹脂組成物及使用它之硬化膜形成 方法,該正型感光性樹脂組成物藉由使其硬化能夠得到耐 熱性、黏附性、透射率等優良之硬化膜。 【實施方式】 201100966 以下,詳細地說明本發明。 又,在本說明書之基(原子團)的標記,未記載取代及 未取代之標記,係在包含未具有取代基者之同時亦包含具 有取代基者。例如所謂「烷基」,係不僅是未具有取代基之 烷基(未取代烷基),亦包含具有取代基(取代烷基)者。 (A)樹脂成分 本發明之正型感光性樹脂組成物係含有樹脂(亦成爲 「(A)成分」),該樹脂係含有由下述通式(1)所表示之構成 f) _ ^ 單元及具有能夠與羧基反應而形成共價鍵的官能基之構成 單元’並且係鹼不溶性或鹼難溶性且解離性基解離時會成 爲鹼可溶性,亦可更含有其他的樹脂。在此,所謂酸解離 性基係表示在酸的存在下能夠解離之官能基。R7 represents a hydrogen atom, a methyl group or a halogen atom. R8 to R12 each independently represent a hydrogen atom or an alkyl group. X represents a divalent linking group. η is an integer from 1 to 10 0. [11] The positive photosensitive resin composition according to any one of [1] to [1], which further comprises (D) an adhesion aid. Q [12] A method for forming a cured film, comprising the steps of: coating a positive photosensitive resin composition according to any one of [1] to [11] on a substrate and drying to form a coating film; a step of performing exposure by passing through a photomask and using active light; a step of developing a pattern using an alkaline developing solution; and a step of heat-treating the obtained pattern. [1] The method for forming a cured film according to [1 2], wherein after the image is formed by development using an alkaline developing solution, the step of comprehensively exposing is further performed before the step of heat-treating the obtained pattern. • 10-201100966 [14] A cured film formed by a method of forming a cured film such as [12] or [13]. [15] A liquid crystal display element having a cured film as [14]. [16] An integrated circuit component having a cured film as in [14]. [17] A solid-state photographic element having a cured film as in [14]. [18] An organic EL element having a cured film as [14]. Hereinafter, preferred embodiments of the present invention will be described. [1] The positive photosensitive resin composition of any one of [1] to [1 1], wherein 〇 is contained in an amount of 0.1 to 10 parts by mass based on 100 parts by mass of the total amount of the component (A) (B) ingredient. [2] The positive photosensitive resin composition 任 according to any one of [1] to [1 1], wherein the total amount of the component (A) is 100 parts by mass, and contains 1 to 50. Parts by mass (C). [21] The positive photosensitive resin composition according to any one of [1] to [11], wherein the content of the component (A) is 0.1 part by mass based on 100 parts by mass of the total amount of the component (A). Q 20 parts by mass (D). According to the present invention, it is possible to provide a positive photosensitive resin composition and a method for forming a cured film using the same, which are a positive photosensitive resin composition excellent in sensitivity, residual film ratio, and storage stability, and use thereof In the method of forming a cured film, the positive photosensitive resin composition is cured to obtain a cured film excellent in heat resistance, adhesion, transmittance, and the like. [Embodiment] Hereinafter, the present invention will be described in detail. Further, the label of the group (atomic group) of the present specification does not include a substituted or unsubstituted label, and includes a substituent having a substituent and a substituent. For example, the "alkyl group" is not limited to an alkyl group having no substituent (unsubstituted alkyl group), and also includes a substituent (substituted alkyl group). (A) Resin component The positive photosensitive resin composition of the present invention contains a resin (also referred to as "(A) component)), and the resin contains a composition represented by the following general formula (1): f) _ ^ unit And a constituent unit having a functional group capable of reacting with a carboxyl group to form a covalent bond, and is insoluble in alkali or insoluble in alkali, and is dissolvable in the dissociative group to be alkali-soluble, and may further contain other resins. Here, the acid dissociable group means a functional group which can be dissociated in the presence of an acid.

在通式(1),In the general formula (1),

Rl係表示氫原子、甲基、鹵素原子或氰基。 R2及R3係各自獨立地表示氫原子、直鏈狀或分枝狀烷 基。但是R2及R3同時爲氫原子之情況除外。 R4係表示亦可被取代之直鏈狀、分枝狀或環狀烷基、 或芳烷基。 -12- 201100966 R2或R3亦可與R4連結而形成環狀醚。 在通式(1)之R1以氫原子或甲基爲佳。 R2或R3以碳數1〜6的直鏈狀或分枝狀烷基爲佳。 R4以亦可被取代之碳數1〜10的直鏈狀、分枝狀或環 狀烷基爲佳。在此,作爲取代基,以碳數1〜5的烷氧基或 鹵素原子爲佳。 作爲R4之芳烷基,以碳數7〜10的芳烷基爲佳。 R2或R3與R4連結而形成環狀醚時,以R2或R3與R4 ^ 係連結而形成碳數2〜5的伸烷基鏈爲佳。 作爲用以形成通式(1)所表示的構成單元所使用之自 由基聚合性單體,可舉出例如鄰(1-院氧基烷氧羰基)苯乙 烯、間(1-烷氧基烷氧羰基)苯乙烯、對(1-烷氧基烷氧羰基) 苯乙烯、鄰(1-烷基-1-烷氧基烷氧羰基)苯乙烯、間(1-烷基 -1-院氧基院氧碳基)苯乙稀、對(1-院基-1-院氧基院氧鑛基) 苯乙烯、鄰(1-烷氧基烷氧羰基)-α-甲基苯乙烯、間(1-烷氧 Q 基烷氧羰基)-α-甲基苯乙烯、對(1-烷氧基烷氧羰基)-α-甲基 苯乙烯、鄰[1-(芳烷氧基)烷氧羰基]苯乙烯、間[1-(芳烷氧 基)烷氧羰基]苯乙烯、對[1-(芳烷氧基)烷氧羰基]苯乙烯、 鄰(2-氧雜環烷氧羰基)苯乙烯、間(2-氧雜環烷氧羰基)苯乙 烯、對(2-氧雜環烷氧羰基)苯乙烯等。該等之中,以間(1-烷氧基烷氧羰基)苯乙烯、對(1-烷氧基烷氧羰基)苯乙烯、 間(2-氧雜環烷氧羰基)苯乙烯、對(2-氧雜環烷氧羰基)苯乙 烯爲佳。以對(1-烷氧基烷氧羰基)苯乙烯及對(2-氧雜環烷 -13- 201100966 氧羰基)苯乙烯爲特佳。 作爲用以形成通式(1)所表示的構成單元所使用之自 由基聚合性單體的具體例,可舉出例如 鄰(1-甲氧基乙氧羰基)苯乙烯、間(1_甲氧基乙氧羰基) 苯乙烯、對(1-甲氧基乙氧羰基)苯乙烯、鄰(1·乙氧基乙氧 羰基)苯乙烯 '間(1-乙氧基乙氧羰基)苯乙烯、對(1-乙氧基 乙氧羰基)苯乙烯、鄰(1-正丙氧基乙氧羰基)苯乙烯、間(Ια 正丙氧基乙氧羰基)苯乙烯、對(1-正丙氧基乙氧羰基)苯乙R1 represents a hydrogen atom, a methyl group, a halogen atom or a cyano group. R2 and R3 each independently represent a hydrogen atom, a linear or branched alkyl group. However, except when R2 and R3 are simultaneously a hydrogen atom. R4 represents a linear, branched or cyclic alkyl group or an aralkyl group which may also be substituted. -12- 201100966 R2 or R3 may also be bonded to R4 to form a cyclic ether. R1 of the formula (1) is preferably a hydrogen atom or a methyl group. R2 or R3 is preferably a linear or branched alkyl group having 1 to 6 carbon atoms. R4 is preferably a linear, branched or cyclic alkyl group having 1 to 10 carbon atoms which may be substituted. Here, as the substituent, an alkoxy group having 1 to 5 carbon atoms or a halogen atom is preferred. The aralkyl group of R4 is preferably an aralkyl group having 7 to 10 carbon atoms. When R2 or R3 is bonded to R4 to form a cyclic ether, it is preferred that R2 or R3 is bonded to R4^ to form an alkylene chain having 2 to 5 carbon atoms. The radical polymerizable monomer used for forming the structural unit represented by the formula (1) includes, for example, o-(1-oxoalkoxycarbonyl)styrene, m-(1-alkoxyalkane). Oxycarbonyl)styrene, p-(1-alkoxyalkoxycarbonyl)styrene, o-(1-alkyl-1-alkoxyoxycarbonyl)styrene, m-(1-alkyl-1-ampleoxy) Base oxycarbyl) phenylethylene, p-(1-hospital-1-indolyloxyxy) styrene, o-(1-alkoxyalkoxycarbonyl)-α-methylstyrene, (1-Alkoxy Q-alkyloxycarbonyl)-α-methylstyrene, p-(1-alkoxyalkoxycarbonyl)-α-methylstyrene, o-[1-(aralkyloxy)alkoxy Carbonyl]styrene, m-[1-(aralkyloxy)alkoxycarbonyl]styrene, p-[1-(aralkyloxy)alkoxycarbonyl]styrene, o-(2-oxocycloalkoxycarbonyl) Styrene, m-(2-oxocycloalkoxycarbonyl)styrene, p-(2-oxecyclooxycarbonyl)styrene, and the like. Among these, m-(1-alkoxyalkoxycarbonyl)styrene, p-(1-alkoxyalkoxycarbonyl)styrene, m-(2-oxocycloalkoxycarbonyl)styrene, p-( 2-Oxoheterocyclooxycarbonyl)styrene is preferred. Preference is given to (1-alkoxyalkoxycarbonyl)styrene and p-(2-oxocyclohexane-13-201100966 oxycarbonyl)styrene. Specific examples of the radical polymerizable monomer used to form the structural unit represented by the general formula (1) include o-(1-methoxyethoxycarbonyl)styrene and m-(1-_A) Oxyethoxyethoxycarbonyl)styrene, p-(1-methoxyethoxycarbonyl)styrene, o-(1ethoxypropoxycarbonyl)styrene-(1-ethoxyethoxycarbonyl)styrene , p-(1-ethoxyethoxycarbonyl)styrene, o-(1-n-propoxyethoxycarbonyl)styrene, m-(p-α-n-propoxyethoxycarbonyl)styrene, p-(1-n-propyl) Oxyethoxycarbonyl)benzene

G 烯、對(1-異丙氧基乙氧羰基)苯乙烯、鄰(1-正丁氧基乙氧 羰基)苯乙烯、間(1-正丁氧基乙氧羰基)苯乙烯、對(1-正丁 氧基乙氧羰基)苯乙烯、對(1-異丁氧基乙氧羰基)苯乙烯、 鄰(1-苄基乙氧羰基)苯乙烯、間(1-苄基乙氧羰基)苯乙烯、 對(1·苄基乙氧羰基)苯乙烯、鄰(2-氧雜環己氧羰基)苯乙 烯、對(2-氧雜環戊氧羰基)苯乙烯、間(2-氧雜環己氧羰基) 苯乙烯、對(2-氧雜環己氧羰基)苯乙烯、間(1-乙氧基乙氧 Q 羰基)α-甲基苯乙烯、對(1-乙氧基乙氧羰基)α-甲基苯乙 烯、間(1-甲基-1-乙氧基乙氧羰基)苯乙烯、對(1-甲基-1-乙氧基乙氧羰基)苯乙烯等’可單獨或組合2種類以上而使 用。 用以形成通式(1)所表示的構成單元所使用之自由基 聚合性單體亦可使用市售品’亦可使用藉由眾所周知的方 法所合成者。例如如下述所示’能夠藉由在酸觸媒的存在 下使乙烯基苯甲酸與乙烯醚反應來合成。 -14- 201100966G olefin, p-(1-isopropoxyethoxycarbonyl)styrene, o-(1-n-butoxyethoxycarbonyl)styrene, m-(1-n-butoxyethoxycarbonyl)styrene, p-( 1-n-butoxyethoxycarbonyl)styrene, p-(1-isobutoxyethoxycarbonyl)styrene, o-(1-benzylethoxycarbonyl)styrene, m-(1-benzylethoxycarbonyl) Styrene, p-(1·benzylethoxycarbonyl)styrene, o-(2-oxohexyloxycarbonyl)styrene, p-(2-oxocyclooxycarbonyl)styrene, m-(2-oxo) Heterocyclic hexyloxycarbonyl) styrene, p-(2-oxohexyloxycarbonyl)styrene, m-(1-ethoxyethoxy Q-carbonyl)α-methylstyrene, p-(1-ethoxyB) Oxycarbonyl)α-methylstyrene, m-(1-methyl-1-ethoxyethoxycarbonyl)styrene, p-(1-methyl-1-ethoxyethoxycarbonyl)styrene, etc. It can be used individually or in combination of 2 or more types. The radical polymerizable monomer used for forming the structural unit represented by the formula (1) may be a commercially available product or may be synthesized by a known method. For example, it can be synthesized by reacting vinyl benzoic acid with vinyl ether in the presence of an acid catalyst as described below. -14- 201100966

在此,R1 ' R3及R4係對應通式(1)之R1、R3及R ’且 R13及R14係作爲-CH(R13)(R14)而對應通式(1)之R2。 本發明之感光性組成物係經由包含以下步驟來形成硬 〇 化膜:在基板上塗布並乾燥,來形成塗膜之步驟;透過光 罩並使用活性光線來進行曝光之步驟;使用鹼性顯像液進 行顯像,來形成圖案之步驟;按照必要而全面曝光之步驟; 及加熱處理所得到的圖案之步驟;在全面曝光或加熱處理 之步驟,酸解離性基(-C(R2)(R3)OR4)從(A)成分之由式(1) 所表示的構成單元解離,並在(A)成分的側鏈生成羧基。 本發明的(A)成分中所含有之具有能夠與羧基反應而 ¢) 形成共價鍵的官能基之構造單元,所謂「能夠與羧基反應 而形成共價鍵的官能基」係意味著藉由加熱處理能夠與如 上述在(A)成分的側鏈生成的羧基反應,來形成共償鍵之官 能基。 如上述,在 A成分的側鏈生成的羧基與(A)成分中的 「與羧基反應而形成共價鍵的官能基」係藉由加熱處理來 形成共價鍵,且藉由交聯來形成良好的硬化膜。 作爲能夠與此種羧基反應而形成共價鍵的官能基,可 -15- 201100966 舉出例如環氧基、氧雜環丁烷基等,以環氧基 作爲具有能夠與羧基反應而形成共價鍵的 成單元,在一態樣’以由下述通式(3)〜(5)中任 的自由基聚合性單體所構成之構成單元爲佳, 合2種以上而使用。通式(3)〜的任—者所表 聚合性單體的分子量以10〜500爲佳,以12〇〜 爲特佳。 官能基之構 一者所表示 可單獨或組 不之自由基 2〇〇爲更佳。Here, R1 'R3 and R4 correspond to R1, R3 and R' of the formula (1), and R13 and R14 correspond to -CH(R13)(R14) and correspond to R2 of the formula (1). The photosensitive composition of the present invention comprises the steps of: forming a hardened film by coating and drying on a substrate to form a coating film; passing the mask and using active light to perform exposure; using alkaline a step of forming a pattern like a liquid; a step of performing full exposure as necessary; and a step of heat-treating the obtained pattern; and an acid dissociable group (-C(R2) (in the step of total exposure or heat treatment) R3)OR4) is dissociated from the structural unit represented by the formula (1) of the component (A), and a carboxyl group is formed in the side chain of the component (A). The structural unit containing a functional group capable of forming a covalent bond by reacting with a carboxyl group in the component (A) of the present invention, the "functional group capable of reacting with a carboxyl group to form a covalent bond" means The heat treatment can react with the carboxyl group formed in the side chain of the component (A) as described above to form a functional group of the covalent bond. As described above, the carboxyl group formed in the side chain of the component A and the "functional group which reacts with the carboxyl group to form a covalent bond" in the component (A) are formed by heat treatment to form a covalent bond, and are formed by crosslinking. Good hardened film. As a functional group capable of reacting with such a carboxyl group to form a covalent bond, for example, -15-201100966 may, for example, be an epoxy group or an oxetanyl group, and the epoxy group may have a reactivity with a carboxyl group to form a covalent bond. The constituent unit of the bond is preferably a constituent unit composed of a radical polymerizable monomer of any of the following general formulas (3) to (5), and is used in combination of two or more kinds. The molecular weight of the polymerizable monomer represented by the formula (3) to (10) is preferably 10 to 500, particularly preferably 12 Å. The structure of the functional group can be expressed alone or in groups of free radicals.

G 通式(3)〜(5)中,x係表示2價的連結基, _〇、-s-或-coo-、-〇CH2C〇〇 等的有機基。χ 爲佳。 R'係表示氫原子、甲基或鹵素原子,以氫 爲佳。 R8〜Rl5係各自獨立地表示氫原子、烷基。 甲基爲佳。 可舉出例如 係以-COO- 原子或甲基 以氫原子或 -16- 201100966 η係1〜10的整數,以1〜3的整數爲佳。 具體地例示用以形成含有環氧基(其作爲能夠與羧基 反應而形成共價鍵的官能基)之構成單元所使用的自由基 聚合性單體時,可舉出丙烯酸環氧丙酯、甲基丙烯酸環氧 丙酯、丙烯酸3,4-環氧丁酯、甲基丙烯酸3,4.環氧丁酯、 丙烯酸4,5-環氧戊酯、甲基丙烯酸4,5-環氧戊酯、丙烯酸 6,7-環氧庚酯、甲基丙烯酸6,7-環氧庚酯、丙烯酸3,4-環氧 環己基甲酯、甲基丙烯酸3,4-環氧環己基甲酯等的(甲基) ^ 丙烯酸酯類;鄰乙烯基苄基環氧丙基醚、間乙烯基苄基環 氧丙基醚、對乙烯基苄基環氧丙基醚、α-甲基-鄰乙烯基节 基環氧丙基醚、α-甲基-間乙烯基苄基環氧丙基醚、α-甲基 -對乙烯基苄基環氧丙基醚等的乙烯基苄基環氧丙基醚 類;鄰乙烯基苯基環氧丙基醚、間乙烯基苯基環氧丙基醚' 對乙烯基苯基環氧丙基醚等的乙烯基苯基環氧丙基醚類° 以丙烯酸環氧丙酯、甲基丙烯酸環氧丙酯、對乙烯基苯基 Q 環氧丙基醚、丙烯酸3,4-環氧環己基甲酯、甲基丙烯酸3,4-環氧環己基甲酯爲佳,以丙烯酸環氧丙酯、甲基丙烯酸環 氧丙酯爲特佳。 作爲具有能夠與羧基反應而形成共價鍵的官能基之構 成單元,在其他態樣,以由下述通式(6)或(7)所表示的自由 基聚合性單體所構成之構成單元爲佳’可單獨或組合2種 式50 通 ~ ο ο ο 用 1 使 以 而’ 上量 以子 7 ( 佳 m爲G In the general formulae (3) to (5), x represents an organic group such as a divalent linking group, _〇, -s- or -coo-, -〇CH2C〇〇. χ is better. R' represents a hydrogen atom, a methyl group or a halogen atom, preferably hydrogen. R8 to Rl5 each independently represent a hydrogen atom or an alkyl group. Methyl is preferred. For example, an integer of 1 to 3 may be used as an integer of -COO- atoms or a methyl group, or a hydrogen atom or -16-201100966 η. Specifically, when a radical polymerizable monomer used for forming a constituent unit containing an epoxy group (which is a functional group capable of forming a covalent bond with a carboxyl group) is used, examples thereof include glycidyl acrylate and A. Glycidyl acrylate, 3,4-epoxybutyl acrylate, 3,4 epoxy methacrylate, 4,5-epoxypentyl acrylate, 4,5-epoxypentyl methacrylate 6,7-epoxyheptyl acrylate, 6,7-epoxyheptyl methacrylate, 3,4-epoxycyclohexylmethyl acrylate, 3,4-epoxycyclohexyl methacrylate, etc. (Methyl) ^ acrylates; o-vinylbenzyl epoxypropyl ether, m-vinylbenzyl epoxypropyl ether, p-vinylbenzyl epoxypropyl ether, α-methyl-o-vinyl Vinylbenzyl epoxypropyl ether, such as agglomerated epoxypropyl ether, α-methyl-m-vinylbenzylepoxypropyl ether, α-methyl-p-vinylbenzylepoxypropyl ether Vinyl phenylepoxypropyl ethers such as o-vinylphenylepoxypropyl ether, m-vinylphenylepoxypropyl ether, p-vinylphenylepoxypropyl ether, etc. Oxypropyl propyl ester, Glycidyl methacrylate, p-vinylphenyl Q epoxy propyl ether, 3,4-epoxycyclohexyl methyl acrylate, 3,4-epoxycyclohexyl methacrylate, preferably acrylic acid Glycidyl propyl ester and glycidyl methacrylate are particularly preferred. A constituent unit having a functional group capable of reacting with a carboxyl group to form a covalent bond, and a constituent unit composed of a radical polymerizable monomer represented by the following general formula (6) or (7) For the best 'can be used alone or in combination with two types of 50 pass ~ ο ο ο with 1 to make 'on the amount to sub 7 (good m for

分 之 澧 單 性。 合佳 聚更 基爲 由 ο 自 2 的 ~ 示50 表1 -17- 201100966Subdivided by unilaterality.聚佳聚更基为由 ο From 2 ~ 50 50 Table 1 -17- 201100966

(7) 通式(6)及(7)中,X係表示2價的連結基,例如0-、-S- o 或-COO-、-0CH2C00-等的有機基。X係以-coo-爲佳。 R7係表示氫原子、甲基或鹵素原子,以氫原子或甲基 爲佳。 R8〜R15係各自獨立地表示氫原子、烷基。以氫原子或 甲基爲佳。 η係1〜10的整數,以1〜3的整數爲佳。 作爲此種用以形成具有氧雜環丁烷基的構成單元所使 Q 用的自由基聚合性單體之例子,可舉出在含有環氧基的自 由基聚合性單體之上述具體例,將環氧基取代成爲氧雜環 丁烷基而成之化合物、或在特開2001-330953號公報的段 落0011〜0016所記載之具有氧雜環丁烷基的(甲基)丙烯酸 酯等。 用以形成具有能夠與羧基反應而形成共價鍵的官能基 之構成單元所使用的自由基聚合性單體亦能夠使用市售 者,亦能夠使用藉由眾所周知的方法所合成者。 -18- 201100966 元之 Ο 成分 〜6 0 元之 中, 〇 成單 成單 應而 舉出 烯、 乙烯 具有能夠與羧基反應而形成共價鍵的官能基之構成單 較佳具體例,可例示下記的構成單元。(7) In the general formulae (6) and (7), X represents a divalent linking group, for example, an organic group such as 0-, -S-o or -COO-, or -OCH2C00-. The X system is preferably -coo-. R7 represents a hydrogen atom, a methyl group or a halogen atom, and preferably a hydrogen atom or a methyl group. R8 to R15 each independently represent a hydrogen atom or an alkyl group. A hydrogen atom or a methyl group is preferred. The integer of η is 1 to 10, and preferably an integer of 1 to 3. The above-mentioned specific example of the radically polymerizable monomer containing an epoxy group is exemplified as an example of the radical polymerizable monomer used for forming the structural unit having an oxetane group. A compound obtained by substituting an epoxy group into an oxetanyl group, or a (meth) acrylate having an oxetanyl group described in paragraphs 0011 to 0016 of JP-A-2001-330953. The radical polymerizable monomer used for forming a constituent unit having a functional group capable of reacting with a carboxyl group to form a covalent bond can also be used commercially, or can be synthesized by a known method. -18- 201100966 元 Ο Ο 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 〜 、 、 、 、 、 、 、 、 、 、 、 、 、 、 、 The constituent unit of the following.

通式(1)所表示的構成單元之含有率係相對於構成(Α) 的樹脂之總重複單元中,以10〜90莫耳%爲佳,以20 莫耳%爲更佳。 具有能夠與羧基反應而形成共價鍵的官能基之構成單 含有率係相對於構成(Α)成分的樹脂之總重複單元 以5〜5 0莫耳%爲佳,以1 〇〜4 0莫耳%爲更佳。 在(Α)成分’可按照必要而共重合通式(1)所表示的構 元及具有能夠與羧基反應而形成共價鍵的官能基之構 元以外的構成單元。 作爲通式(1)所表示的構成單元及具有能夠與羧基反 形成共價鍵的官能基之構成單元以外的構成單元,可 本乙烯、第三丁氧基苯乙烯、甲基苯乙烯、羥基苯乙 α -甲基苯乙烯、乙醯氧基苯乙烯、α_甲基乙酿氧基苯 、甲氧基苯乙烯、乙氧基苯乙烯、氯苯乙烯、乙烯基 -19- 201100966 苯甲酸甲酯、乙烯基苯甲酸乙酯、丙烯酸、甲基丙烯酸、 丙烯酸甲酯、甲基丙烯酸甲酯、丙烯酸乙酯、甲基丙烯酸 乙醋、丙稀酸正丙酯、甲基丙稀酸正丙醋、丙稀酸異丙醋' 甲基丙烯酸異丙酯、丙烯酸第三丁酯、甲基丙烯酸第三丁 酯、丙烯酸2-羥基乙酯、甲基丙烯酸2-羥基乙酯、丙烯酸 2_羥基丙酯、甲基丙烯酸2-羥基丙酯、丙烯酸苄酯、甲基 丙烯酸苄酯、丙烯酸異莰酯、甲基丙烯酸異莰酯、甲基丙 烯酸環氧丙酯、丙烯腈等之構成單元,可單獨或組合2種 〇 類以上而使用。 該等構成單元的含有率係以總量計相對於構成(A)成 分的樹脂之總重複單元中,以85莫耳%以下爲佳,以60 莫耳%以下爲更佳。 (A)成分的分子量係換算成聚苯乙烯的重量平均分子 量,以1,000〜200,000爲佳,以2,000〜50,000的範圍爲 更佳。 Q (A)成分亦可混合2種以上之含有不同構成單元的樹脂 而使用,又,亦可可混合2種以上之由同一構成單元所構 成而組成不同的樹脂而使用。 又,關於(A)成分的合成方法,已知有各式各樣的方 式,舉出一個例子時,能夠藉由將至少含有用以形成通式 (1)所表示的構成單元所使用的自由基聚合性單體及用以 形成具有能夠與羧基反應而形成共價鍵的官能基之構成單 元所使用的自由基聚合性單體之自由基聚合性單體混合 -20- 201100966 物’在有機溶劑中使用自由基聚合引發劑進行聚合來合成。 (B)藉由照射活性光線或放射線會產生酸之化合物 在本發明所使用之藉由照射活性光線或放射線會產生 酸之化合物(亦稱爲「(B)成分」)或光酸產生劑),可舉出例 如銃鹽或碘鑰鹽、重氮甲烷化合物、亞胺基磺酸鹽化合物、 肟磺酸酯化合物等,可單獨或組合2種類以上而使用。 光酸產生劑以對波長3 OOnm以上的活性光線會感光並 產生酸之化合物爲佳,以含有由通式(2)所表示的肟磺酸酯 ^ 基之化合物爲更佳。 、 Ο p»N—Ο—S—R5 (2) / s w 在通式(2), R5係表示亦可被取代之直鏈狀、分枝狀、環狀烷基, 或亦可被取代之芳基。 Q 作爲R5的烷基,以碳數1〜10之直鏈狀或分枝狀烷基 爲佳。R5的烷基係包含碳數6〜11的芳基、碳數1〜1〇的 烷氧基或脂環式基(7,7_二甲基-2-側氧降萡基等的有橋式 脂環基,較佳是亦可被雙環烷基等取代。 作爲R5的芳基,以碳數6〜11的芳基爲佳,以苯基或 萘基爲更佳。R5的芳基亦可被碳數1〜5的烷基、芳氧基 或鹵素原子取代。 含有通式(2)所表示的肟磺酸酯基之光酸產生劑’在一 -21- 201100966 態樣’以下述通式(2-1)所表示之化合物爲更佳。The content ratio of the constituent unit represented by the formula (1) is preferably 10 to 90 mol%, more preferably 20 mol%, based on the total repeating unit of the resin constituting (Α). The constituent unit content of the functional group having a functional group capable of reacting with a carboxyl group to form a covalent bond is preferably 5 to 50 mol% with respect to the total repeating unit of the resin constituting the (Α) component, and is preferably 1 〇 to 4 0 0 Ear % is better. In the (Α) component, a constituent unit represented by the formula (1) and a constituent unit other than a moiety having a functional group capable of reacting with a carboxyl group to form a covalent bond may be uniformly added as necessary. The structural unit represented by the formula (1) and the constituent unit other than the constituent unit having a functional group capable of forming a covalent bond with a carboxyl group may be ethylene, tert-butoxystyrene, methylstyrene or hydroxyl group. Phenylethyl α-methylstyrene, ethoxylated styrene, α-methylethyloxybenzene, methoxystyrene, ethoxystyrene, chlorostyrene, vinyl-19- 201100966 benzoic acid Methyl ester, ethyl vinyl benzoate, acrylic acid, methacrylic acid, methyl acrylate, methyl methacrylate, ethyl acrylate, ethyl methacrylate, n-propyl acrylate, methyl propyl acrylate Vinegar, isopropyl acrylate isopropyl acrylate, butyl acrylate, tert-butyl methacrylate, 2-hydroxyethyl acrylate, 2-hydroxyethyl methacrylate, 2-hydroxyl acrylate a constituent unit of propyl ester, 2-hydroxypropyl methacrylate, benzyl acrylate, benzyl methacrylate, isodecyl acrylate, isodecyl methacrylate, glycidyl methacrylate, acrylonitrile, etc. It can be used alone or in combination of two kinds of mosses. The content of the constituent units is preferably 85 mol% or less, more preferably 60 mol% or less, based on the total amount of the total repeating unit of the resin constituting the component (A). The molecular weight of the component (A) is preferably from 1,000 to 200,000, more preferably from 2,000 to 50,000, in terms of the weight average molecular weight of the polystyrene. The Q (A) component may be used by mixing two or more kinds of resins containing different constituent units, or may be used by mixing two or more kinds of resins which are composed of the same constituent unit and have different compositions. Further, various methods are known for the method of synthesizing the component (A). When an example is given, the free use of at least the constituent unit represented by the formula (1) can be used. Mixing of a radical polymerizable monomer and a radical polymerizable monomer used for forming a constituent unit having a functional group capable of reacting with a carboxyl group to form a covalent bond, -20-201100966 The solvent is synthesized by polymerization using a radical polymerization initiator. (B) a compound which generates an acid by irradiation with active light or radiation. A compound which is used in the present invention to generate an acid by irradiation with active light or radiation (also referred to as "(B) component") or a photoacid generator) For example, a phosphonium salt or an iodine salt, a diazomethane compound, an imidosulfonate compound, an oxime sulfonate compound, etc. can be used, and it can use individually or in combination of 2 or more types. The photoacid generator is preferably a compound which sensitizes an active light having a wavelength of 3,000 nm or more and generates an acid, and more preferably contains a compound of the oxime sulfonate group represented by the formula (2). Ο p»N—Ο—S—R5 (2) / sw In the formula (2), R5 represents a linear, branched, cyclic alkyl group which may also be substituted, or may be substituted Aryl. Q is preferably an alkyl group of R5, and a linear or branched alkyl group having 1 to 10 carbon atoms is preferred. The alkyl group of R5 includes an aryl group having 6 to 11 carbon atoms, an alkoxy group having 1 to 1 carbon number, or an alicyclic group (having a bridge such as 7,7-dimethyl-2-oxooxanyl group) The alicyclic group is preferably substituted by a bicycloalkyl group or the like. The aryl group of R5 is preferably an aryl group having 6 to 11 carbon atoms, more preferably a phenyl group or a naphthyl group, and the aryl group of R5 is also preferred. It may be substituted by an alkyl group, an aryloxy group or a halogen atom having 1 to 5 carbon atoms. The photoacid generator containing the oxime sulfonate group represented by the formula (2) 'in a -21 - 201100966 aspect' is as follows The compound represented by the formula (2-1) is more preferably.

在通式(2-1 ), r5係與在通式(2)之R5相同。 〇 X係表示直鏈狀或分枝狀烷基、烷氧基、或鹵素原子。 m係表示0〜3的整數。m爲2或3時,複數X可以相 同亦可以不同。 X的烷基以碳數1〜4的直鏈狀或分枝狀烷基爲佳。 X的烷氧基以碳數1〜4的直鏈狀或分枝狀烷氧基爲 佳。 X的鹵素原子以氯原子或氟原子爲佳。 〇 m以〇或1爲佳。 特別是在通式(3),以m爲1 ’ X爲甲基且X的取代位 置爲鄰位之化合物爲佳,而且以R5爲碳數1〜10的直鏈狀 烷基、7,7-二甲基-2-側氧萡基甲基或對甲苯基之化合物爲 特佳。 作爲肟磺酸酯化合物的具體例’可舉出例如下述化合 物(i)、化合物(ii)、化合物(ϋ〇、化合物(iv)、化合物(v)等’ 可單獨或組合2種類以上而使用。又’亦可與其他種類的 -22- 201100966 (B)成分而使用。In the formula (2-1), the r5 group is the same as the R5 in the formula (2). 〇 X represents a linear or branched alkyl group, an alkoxy group, or a halogen atom. The m system represents an integer of 0 to 3. When m is 2 or 3, the plural X may be the same or different. The alkyl group of X is preferably a linear or branched alkyl group having 1 to 4 carbon atoms. The alkoxy group of X is preferably a linear or branched alkoxy group having 1 to 4 carbon atoms. The halogen atom of X is preferably a chlorine atom or a fluorine atom. 〇 m is better than 〇 or 1. In particular, in the general formula (3), a compound in which m is 1 'X is a methyl group and a substitution position of X is an ortho position, and R5 is a linear alkyl group having a carbon number of 1 to 10, 7, 7 A compound of -dimethyl-2-oxomethoxymethyl or p-tolyl is particularly preferred. Specific examples of the oxime sulfonate compound include, for example, the following compound (i), compound (ii), and compound (ϋ〇, compound (iv), compound (v), etc., which may be used alone or in combination of two or more types. It can also be used with other types of -22- 201100966 (B).

化合物(i)〜(v)能夠以市售品的方式取得。 含有通式(2)所表示的肟磺酸酯基之光酸產生劑在其 他態樣,以下述通式(2-2)所表示的化合物爲更佳。The compounds (i) to (v) can be obtained as commercially available products. In the other aspect, the photoacid generator containing the oxime sulfonate group represented by the formula (2) is more preferably a compound represented by the following formula (2-2).

-23- 201100966 通式(2-2)中, R5係與通式(2)之R5相同。 R6係表示鹵素原子、羥基、烷基、烷氧基 '氰基或硝 基。 1係表示0〜5的整數。1爲2以上時,複數個R6可以 相同亦可以不同。 更詳細地說明通式(2-2)。 作爲r5,較佳者可舉出碳原子數1〜10的烷基、碳原 〇 子數1〜5的鹵化烷基、碳原子數1〜5的鹵化烷氧基、亦 可被W取代之苯基、亦可被W取代之萘基或亦可被|取 代之蒽基等。在此’ W係表示鹵素原子、氰基、硝基、碳 原子數1〜10的烷基、碳原子數1〜1〇的烷氧基、碳原子 數1〜5的鹵化烷基或碳原子數1〜5的鹵化烷氧基。 作爲通式(2-2)之R5,以甲基 '乙基、正丙基、正丁基、 正辛基、三氟甲基、五氟乙基、全氟正丙基、全氟正丁基、 Q 苄基、對甲苯基、4-氯苯基或五氟苯基爲佳,以甲基、乙 基、正丙基、正丁基、苄基或對甲苯基爲特佳。 作爲R6所表示的鹵素原子,以氟原子、氯原子或溴原 子爲佳。 作爲R6所表示的烷基,以碳原子數1〜4的烷基爲佳, 以甲基或乙基爲佳。 作爲R6所表示的烷氧基,以碳原子數1〜4的烷氧基 爲佳,以甲氧基或乙氧基爲佳。 -24- 201100966 作爲1 ’以0〜2爲佳,以〇或1爲特佳。 作爲被通式(2-2)所表示的光酸產生劑所包含的化合物 之較佳態樣’ R5係表示甲基、乙基、正丙基、正丁基或4_ 甲苯基’ R6係表示氫原子或甲氧基,1爲〇或1的態樣。 以下’例示作爲被通式(2-2)所表示的光酸產生劑所包 含的化合物之特佳例子,但是本發明不被該等限定。 α-(甲基磺醯氧基亞胺基)苄基氰(R3A=甲基、r4A =氫原子) α-(乙基磺醯氧基亞胺基)苄基氰(R3A=乙基、r/a =氫原子) 〇 、 α-(正丙基磺醯氧基亞胺基)苄基氰(R3A =正丙基、r“ =氫原 子) α-(正丁基磺醯氧基亞胺基)苄基氰(R3A =正丁基、R4A =氫原 子) α-(4-甲苯磺醯氧基亞胺基)苄基氰(R3A = 4-甲苯基、11^=氫 原子) α-(苯磺醯氧基亞胺基)苄基氰(R3A =苯基、R4A =氫原子) Q α-[(甲基磺醯氧基亞胺基)-4-甲氧基苯基]乙腈(R3A=甲基、 R4A=甲氧基) α-[(乙基磺醯氧基亞胺基)-4-甲氧基苯基]乙腈(R3A=乙基、 R4 A=甲氧基) α-[(正丙基磺醯氧基亞胺基)-4-甲氧基苯基]乙腈(R3A =正丙 基、R4A=甲氧基) α-[(正丁基磺醯氧基亞胺基)-4_甲氧基苯基]乙腈(R3A =正丁 基、R4A=甲氧基) -25- 201100966 α-[(4-甲苯基磺醯氧基亞胺基)_4_甲氧基苯基]乙腈(R3A = 4_ 甲苯基、R4A=甲氧基) α-[(苯磺醯氧基亞胺基)-4 -甲氧基苯基]乙腈(r3a=苯基、 r4A=甲氧基) 在本發明的感光性樹脂組成物,光酸產生劑(B)係相對 於100質量份共聚物(A),以含有〇_1〜10質量份爲佳,以 含有0,5〜10質量份爲更佳。 0 本發明的感光性樹脂組成物係按照必要亦可含有通式 (2)所表示的肟磺酸酯基之光酸產生劑以外的光酸產& 劑,作爲感應活性光線之光酸產生劑。 (C)在分子內具有2個以上的環氧基之化合物 作爲在分子內具有2個以上的環氧基之化合物(亦稱爲 「(C)成分」)之具體例,可舉出雙酚A型環氧樹脂、雙酚f 型環氧樹脂、苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型 環氧樹脂、脂肪族環氧樹脂等。 Q 該等能夠以市售品的方式取得。例如,作爲雙酚A型 環氧樹脂,可舉出 JER827、JER828、JER834、JER1001、 JER1002 、 JER1003 、 JER1055 、 JER1007 、 JER1009 、 JER1010(以上、JAPAN EPOXY RESINS(股)製)、EPICLON 860、EPICLON1050、EPICLON1051、EPICLON 1055(以上、 大日本INK化學工業(股)製等;作爲雙酚F型環氧樹脂, 可舉出 JER806、 JER807、 JER4004、 JER4005、 JER4007、 JER4010(以上、JAPAN EPOXY RESINS(股)製)、 -26- 201100966 EPICLON830、EPICLON835(以上、大日本INK化學工業 (股)、LCE-21、RE-602S(以上、日本化藥(股)製)等:作爲 苯酚酚醛清漆型環氧樹脂,可舉出 JER152、JER154、 JER1 57S70 (以上、JAPAN EPOXY RESINS(股)製)、 EPICLON-740、EPICLON-740、EPICLON-770、EPICLON-775 (以上、大日本INK化學工業(股)等;作爲甲酚酚醛清漆型 環氧樹脂,可舉出 EPICLON-N-660、EPICLON-N665、 EPICLON-N670 、 EPICLON-N673 、 EPICLON-N680 、 〇 EPICLON-N690 ' EPICLON-N695 (以上、大日本 INK 化學 工業(股)、EOCN- 1 020(以上、日本化藥(股)製)等;作爲脂 肪族環氧樹脂,可舉出 ADEKA RESIN EP-4080S、同 EP-4085S、同 EP-4088S(以上、ADEKA(股)製)、CELLOXIDE 2021P、 CELLOXIDE2081、 CELLOXIDE2083、 CELLOXIDE 2085、EHPE3 1 50、EPOLE AD PB 3 600、同 PB 4700(以上、 DAICEL化學(股)製)等》此外亦可舉出 Q ADEKA RESIN EP-4000S、同 EP-4003S、同 EP-4010S、 同 EP-401 1 S(以上、ADEKA(股)製)、NC-2000、NC-3000、 NC-7300、XD-1000、EPPN-501、EPPN-502(以上、ADEKA(股) 製)等。可單獨或組合2種以上而使用。 該等之中,較佳者可舉出雙酚A型環氧樹脂、雙酚F 型環氧樹脂、苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型 環氧樹脂。以雙酚A型環氧樹脂爲特佳。 (C)成分的含有率係相對於(A)成分的總量100質量 -27- 201100966 份,以1〜5 0質量份爲佳,以5〜3 0質量份爲更佳。 (C)成分對於與鉻、鉬、鋁、鉅、鈦 '銅、鈷、鎢、鎳 等的金屬層之黏附性提升係有效的。利用濺鍍法製成該等 金屬層時,其效果顯著。 (D)黏附助劑 本發明之正型感光性樹脂組成物,可更含有(D)黏附助 劑。 作爲在本發明能夠使用的黏附助劑(D),係使當作基材 〇 ^ 之無機物例如矽、氧化矽、氮化矽等的矽化合物、金、銅、 鋁等的金屬與絕緣膜的黏附性提升之化合物。具體上,可 舉出矽烷偶合劑、硫醇系化合物等。 作爲在本發明能夠使用的黏附助劑之矽烷偶合劑係以 界面的改性作爲目的,沒有特別限定,能夠使用眾所周知 者。 作爲較佳矽烷偶合劑,可舉出例如γ-環氧丙氧基丙基 Q 三烷氧基矽烷、γ-環氧丙氧基丙基烷基二烷氧基矽烷、γ-甲基丙烯醯氧基丙基三烷氧基矽烷、γ-甲基丙烯醯氧基丙 基烷基二烷氧基矽烷、γ-氯丙基三烷氧基矽烷、γ-氫硫基 丙基三烷氧基矽烷、β·(3,4-環氧環己基)乙基三烷氧基矽 烷、乙烯基三烷氧基矽烷。 以γ -環氧丙氧基丙基二院氧基砂院或γ -甲基丙嫌酿氣 基丙基三烷氧基矽烷爲較佳,以γ-環氧丙氧基丙基三烷氧 基矽烷爲更佳。 -28- 201100966 該等可單獨或組合2種以上而使用。該等對於與基板 的黏附性提升係有效的,同時對於調整與基板的錐角亦是 有效的。 在本發明的正型感光性樹脂組成物之(A)成分、(B)成 分、(C)成分、(D)成分的混合比,係相對於(A)成分的總量 1〇〇質量份,(B)成分以0.1〜10質量份爲佳,以0.5〜10 質量份爲更佳。又,(C)成分以1〜50質量份爲佳,以5〜 30質量份爲更佳。又,(D)成分以0.1〜20質量份爲佳,以 Ο 0.5〜10質量份爲更佳。 <其他的成分> 在本發明的正型感光性樹脂組成物,除了(A)成分、(B) 成分、(C)成分、(D)成分以外’亦可按照必要添加鹼性化 合物、界面活性劑、紫外線吸收劑、敏化劑、可塑劑、增 黏劑、有機溶劑、黏附促進劑、有機或無機的防沈澱劑等。 <鹼性化合物> Q 作爲鹼性化合物,能夠從在化學增幅型光阻所使用者 之中任意地選擇而使用。可舉出例如脂肪族胺、芳香族胺、 雜環式胺、氫氧化4級銨、羧酸4級銨鹽等。 作爲脂肪族胺,可舉出例如三甲胺、二乙胺、三乙胺、 二-正丙胺、三-正丙胺、二-正戊胺、三-正戊胺、二乙醇胺、 三乙醇胺、二環己胺、二環己基甲胺等。 作爲芳香族胺,可舉出例如苯胺、苄胺、N,N-二甲基 苯胺、二苯胺等。 -29- 201100966 作爲雜環式胺,可舉出例如吡啶、2-甲基吡啶、4-甲 基吡啶、2 -乙基吡啶、4 -乙基吡啶、2 -苯基吡啶、4 -苯基吡 啶、N -甲基-4-苯基吡啶、4 -二甲胺基吡啶、咪唑、苯并咪 唑、4·甲基咪唑、二苯基苯并咪唑、2,4,5-三苯基咪唑、菸 鹼、菸鹼酸、菸鹼醯胺、喹啉、8-羥基喹啉、吡畊、吡唑、 嗒畊、嘌呤、吡咯啶、哌啶、哌畊、味啉、4-甲基味啉、1,5-二氮雜雙環[4,3,0]-5-壬烯、1,8-二氮雜雙環[5,3,〇]-7-十一烯等。 〇 作爲氫氧化4級銨,可舉出例如氫氧化四甲銨、氫氧 化四乙銨、氫氧化四正丁銨、氫氧化四正己銨等。 作爲羧酸4級銨,可舉出例如乙酸四甲銨、苯甲酸四 甲銨、乙酸四正丁銨、苯甲酸四正丁銨等。 鹼性化合物的調配率係每1〇〇質量份(A)成分,以0.001 〜1質量份爲佳’以0.005〜0.2質量份爲更佳。 <界面活性劑> G 作爲界面活性劑,係陰離子系、陽離子系、非離子系 或兩性的任一者均可使用,較佳界面活性劑係非離子系界 面活性劑。作爲非離子系界面活性劑的例子,可使用聚氧 乙燦高級院基醚類、聚氧乙烯高級烷基苯基醚類、聚氧乙 燒二醇的高級脂肪酸二酯類、矽系、氟系界面活性劑。又, 可舉出以下的商品名、κρ(信越化學工業製)、 POLYFLOW(共榮社化學製)、eft〇p(jEMC〇 製)、 MEGAFAC(大曰本ιΝΚ化學工業製)'Fur〇rad(住友3M製)、 -30- 201100966 ASAHI GUARD、SURFLON(旭硝子製)、PolyFox(OMNOVA 公司製)、FTERGENT(NEOS公司製)等的各系列。 又,作爲界面活性劑,較佳例子可舉出含有下述通式 ⑴所表示的構成單元A及構成單元B,且以四氫呋喃(THF) 作爲溶劑時之凝膠滲透色譜儀所測定之換算成聚苯乙烯的 重量平均分子量(Mw)爲1,000以上、10,000以下之共聚物。 〇 構成單位A 構成單位B ί ΐ] L ^ -CH2—0- -CH2—0- (I) 〇-)j-R4 通式(1)中,R1及R3係各自獨立地表示氫原子或甲基, R2係表示碳數1以上、4以下的直鏈伸烷基’ R4係表示氫 原子或碳數1以上、4以下的烷基’L係表示碳數3以上、 6以下的伸烷基,p及q係表示質量比之質量百分率,P係 Q 表示1 0質量%以上、8 0質量%以下的數値,q係表示2 0質 量%以上、9 0質量%以下的數値’ r係表示1以上、1 8以下 的整數,η係表示1以上、以下的整數。 前述L以下述通式(II)所表不的分枝伸院基爲佳。在式 (Π)之R5係表示碳數1以上、4以下的烷基,就相溶性及 對被塗布面之潤濕性而言,以碳數1以上、3以下的烷基 爲佳,以碳數2或3的烷基爲更佳。Ρ與q的和(p + q)爲 P + q=100,亦即,以100質量%爲佳。 -31- 201100966 —CH2CH— (") 該共聚物的重量平均分子量(M w)係在以THF作爲溶劑 的凝膠滲透色譜儀測定之換算成聚苯乙烯,以1000以上、 1 0000以下爲佳,以1 5 00以上、5 00 0以下爲更佳。 界面活性劑可單獨使用或組合2種以上而使用。 界面活性劑的調配率係每1〇〇質量份(A)成分,通常爲 ❹ 1〇質量份以下,以0.01〜10質量份爲佳’以0.01〜1質量 份爲更佳。 <可塑劑> 作爲可塑劑,可舉出例如酞酸二丁酯、酞酸二辛酯、 酞酸雙十二烷酯、聚乙二醇、甘油、二甲基甘油駄酸酯、 酒石酸二丁酯、己二酸二辛酯、三乙醯基甘油等。 可塑劑的調配率係每100質量份(A)成分,以20質量 Q 份以下爲佳,以10質量份以下爲更佳。 <敏化劑> 本發明之感光性樹脂組成物,爲了在與光酸產生劑(B) 組合時促進其分解,以含有敏化劑爲佳。 敏化劑係吸收活性光線或放射線而成爲電子激發狀 態》成爲電子激發狀態之敏化劑其與光酸產生劑接觸會產 生電子移動、能量移動、發熱等的作用。藉此光酸產生劑 會產生化學變化而分解並生成酸。 -32- 201100966 作爲較佳敏化劑之例子,可舉出屬於以下化合物且在 350nm至450nm區域的任一波長具有吸收波長之化合物。 多核芳香族類(例如芘、茈、三鄰亞苯、蒽、9, 10,-二丁氧基蒽、9,10,-二乙氧基蒽、3, 7,-二甲氧基蒽、9, 10, -二丙氧基蒽)、二苯并哌喃(xanthene)類(例如螢光素、曙 紅、赤藻辛(erythrosine)、若丹明B、玫瑰紅)、灿酮(xanthone) 類(例如卩ill酮、9 -氧硫卩山喔、二甲基-9 -氧硫岫噃、二乙基-9 -氧硫灿唱)、花青苷類(例如噻碳花青、氧雜碳花青)、部花 ^ 青素類(例如部花青素、碳部花青素)、若丹菁(rhodacyanine) 類、氧雜菁(oxonol)類、噻味類(例如噻嘻(thionine)、亞甲 藍、甲苯胺藍)、吖啶類(例如吖啶橙、氯黃素、吖啶黃)、 吖啶酮類(例如吖啶酮' 10-丁基-2-氯吖啶酮)、蒽醌類(例 如蒽醌)、角鯊烯鑰(squalium)類(例如角鯊烯鑰)、苯乙烯 基類、鹼苯乙烯(basetyryl)類(例如2-[2-[4-(二甲胺基)苯基] 乙烯基]苯并嗶唑)、香豆素類(例如7-二乙胺基4-甲基香豆 素、7 -羥基 4-甲基香豆素、2,3,6,7 -四氫-9-甲基 -1H,5H,11H[1]苯并吡喃[6,7,8-ij]唾啉啶-11-酮)。 該等敏化劑中,以多環芳香族類、吖啶酮類、苯乙烯 基類、鹼苯乙烯類、香豆素類爲佳,以多環芳香族類爲更 佳。多環芳香族類中以蒽衍生物爲最佳。 <溶劑> 本發明之正型感光性樹脂組成物能夠將上記成分溶解 於溶劑作爲溶液而使用。在本發明之正型感光性樹脂組成 -33- 201100966 物能夠使用的溶劑係例: (1) 乙一醇一甲基醚、乙二醇—乙基醚、乙二醇一丙基醚、 乙二醇一丁基醚等的乙二醇一烷基醚類; (2) 乙二醇二甲基酸、乙二醇二乙基醚、乙二醇二丙基醚等 的乙二醇二烷基醚類; (3) 乙二醇一甲基醚乙酸酯、乙二醇一乙基醚乙酸酯、乙二 醇一丙基醚乙酸酯、乙二醇一 丁基醚乙酸酯等的乙二醇一 烷基醚乙酸酯類; 〇 (4) 丙二醇一甲基醚、丙二醇一乙基醚、丙二醇一丙基醚、 丙二醇一丁基醚等的丙二醇一烷基醚類; (5) 丙二醇二甲基醚、丙二醇二乙基醚、二伸乙甘醇一甲基 醚、二伸乙甘醇一乙基醚等的丙二醇二烷基醚類; (6) 丙二醇一甲基醚乙酸酯、丙二醇一乙基醚乙酸酯、丙二 醇一丙基醚乙酸酯、丙二醇一 丁基醚乙酸酯等的丙二醇一 烷基醚乙酸酯類; Q (7)二伸乙甘醇二甲基醚、二伸乙甘醇二乙基醚、二伸乙甘 醇乙基甲基醚等的二伸乙甘醇二烷基醚類; (8) 二伸乙甘醇一甲基醚乙酸酯、二伸乙甘醇一乙基醚乙酸 酯、二伸乙甘醇一丙基醚乙酸酯、二伸乙甘醇一丁基醚乙 酸酯等的二伸乙甘醇一烷基醚乙酸酯類; (9) 二伸丙二醇一甲基醚、二伸丙二醇一乙基醚、二伸丙二 醇一丙基醚、二伸丙二醇一丁基醚等的二伸丙二醇一烷基 醚類; -34- 201100966 (10) 二伸丙二醇二甲基酸乙酸醋、二伸丙二醇二乙基酸乙 酸酯、二伸丙二醇乙基甲基酸乙酸酯等的二伸丙二醇二烷 基醚乙酸酯類; (11) 二伸丙二醇一甲基酸乙酸醋、二伸丙二醇一乙基醒乙 酸酯、二伸丙二醇一丙基醚乙酸酯、二伸丙二醇一丁基醚 乙酸酯等的二伸丙二醇一烷基醚乙酸酯類; (12) 乳酸甲酯、乳酸乙酯、乳酸正丙酯、乳酸異丙酯、乳 酸正丁酯、乳酸異丁醋、乳酸正戊酯、乳酸異戊酯等的乳 酸酯類; (13) 乙酸正丁醋、乙酸異丁酯、乙酸正戊酯、乙酸異戊酯、 乙酸正己酯、乙酸2_乙基己酯、丙酸乙酯、丙酸正丙酯、 丙酸異丙酯、丙酸正丁酯、丙酸異丁酯、丁酸甲酯、丁酸 乙酯、丁酸乙酯、丁酸正丙酯、丁酸異丙酯、丁酸正丁酯、 丁酸異丁酯等的脂肪族羧酸酯類; (14) 羥基乙酸乙酯、2-羥基-2-甲基丙酸乙酯、2·羥基-3-甲 Q 基丁酸乙酯、甲氧基乙酸乙酯、乙氧基乙酸乙酯、3-甲氧 基丙酸甲酯、3-甲氧基丙酸乙酯、3-乙氧基丙酸甲酯、3-乙氧基丙酸乙酯、乙酸3-甲氧基丁酯、乙酸3-甲基-3-甲氧 基丁酯、丙酸3-甲基-3-甲氧基丁酯、丁酸3-甲基-3-甲氧 基丁酯、乙醯乙酸甲酯、乙醯乙酸乙酯、丙酮酸甲酯、丙 酮酸乙酯等其他的酯類; (15) 甲基乙基酮、甲基丙基酮、甲基-正丁基酮、甲基異丁 基酮、2-庚酮、3-庚酮、4-庚酮、環己酮等的酮類; -35- 201100966 (16) 正甲基甲醯胺、N,N -二甲基甲醯胺、N -甲基乙醯胺、 N,N -二甲基乙醯胺、N -甲基吡咯啶酮等的醯胺類; (17) γ-丁內酯等的內酯類等。 又’該等溶劑亦可按照必要,更添加苄基乙基醚、二 己基醚、乙二醇一苯基醚乙酸酯、二伸乙甘醇一甲基醚、 二伸乙甘醇一乙基醚、異佛爾酮、己酸、辛酸、1-辛醇、 1-壬醇、苄醇、茴香醚、乙酸苄酯、苯甲酸乙酯、草酸二 乙酯、順丁烯二酸二乙酯、碳酸乙烯酯、碳酸丙烯酯等的 〇 ^ 溶劑。 溶劑可單獨或混合2種以上而使用。 溶劑的調配率係每100質量份(Α)成分,通常爲50〜 3,000質量份,以100〜2,000質量份爲佳,以100〜1,000 質量份爲更佳。 藉由使用含有(Α)成分、(Β)成分之正型感光性樹脂組 成物,能夠提供一種正型感光性樹脂組成物,其係敏感度、 Q 殘膜率及經時安定性優良之正型感光性樹脂組成物,藉由 使其硬化,能夠得到耐熱性、黏附性、透明性等優良之硬 化膜。 <硬化膜的形成方法> 隨後,說明使用本發明的正型感光性樹脂組成物而成 之硬化膜的形成方法。 藉由在基板上塗布本發明之正型感光性樹脂組成物並 加熱,能夠在基板上形成塗膜。 -36- 201100966 藉由對所得到的塗膜照射活性光線,(B)成分分解並產 生酸。藉由所產生的酸之觸媒作用,在(A)成分中所含有之 通式(1)所表示的構成單元中的酸解離性基,因加水分解而 解離並生成羧基。隨後,藉由使用鹼性顯像液顯像,來除 去曝光部(其含有具有容易溶解於鹼性顯像液的羧基之樹 脂),來形成正型影像。 以下顯示該加水分解反應之反應式。-23- 201100966 In the formula (2-2), the R5 group is the same as the R5 of the formula (2). R6 represents a halogen atom, a hydroxyl group, an alkyl group, an alkoxy group 'cyano group or a nitro group. The 1 series represents an integer of 0 to 5. When 1 is 2 or more, a plurality of R6s may be the same or different. The general formula (2-2) will be explained in more detail. Preferred examples of r5 include an alkyl group having 1 to 10 carbon atoms, a halogenated alkyl group having 1 to 5 carbon atoms, and a halogenated alkoxy group having 1 to 5 carbon atoms, which may be substituted by W. A phenyl group, a naphthyl group which may be substituted by W, or a fluorenyl group which may be substituted by | Here, the 'W system" means a halogen atom, a cyano group, a nitro group, an alkyl group having 1 to 10 carbon atoms, an alkoxy group having 1 to 1 carbon atom, a halogenated alkyl group having 1 to 5 carbon atoms or a carbon atom. A halogenated alkoxy group having 1 to 5 is used. As R5 of the formula (2-2), methyl 'ethyl, n-propyl, n-butyl, n-octyl, trifluoromethyl, pentafluoroethyl, perfluoro-n-propyl, perfluoro-n-butyl The group, Q benzyl, p-tolyl, 4-chlorophenyl or pentafluorophenyl is preferred, and methyl, ethyl, n-propyl, n-butyl, benzyl or p-tolyl is particularly preferred. The halogen atom represented by R6 is preferably a fluorine atom, a chlorine atom or a bromine atom. The alkyl group represented by R6 is preferably an alkyl group having 1 to 4 carbon atoms, more preferably a methyl group or an ethyl group. The alkoxy group represented by R6 is preferably an alkoxy group having 1 to 4 carbon atoms, more preferably a methoxy group or an ethoxy group. -24- 201100966 As 1 ', 0~2 is better, and 〇 or 1 is especially good. A preferred aspect of the compound contained in the photoacid generator represented by the formula (2-2) 'R5 means methyl, ethyl, n-propyl, n-butyl or 4-tolyl' R6 represents A hydrogen atom or a methoxy group, and 1 is a quinone or a 1 state. The following is a particularly preferred example of the compound contained in the photoacid generator represented by the formula (2-2), but the present invention is not limited thereto. Α-(methylsulfonyloxyimino)benzyl cyanide (R3A=methyl, r4A = hydrogen atom) α-(ethylsulfonyloxyimino)benzyl cyanide (R3A=ethyl, r /a = hydrogen atom) 〇, α-(n-propylsulfonyloxyimino)benzyl cyanide (R3A = n-propyl, r " = hydrogen atom) α-(n-butyl sulfonyloxyimide Benzyl cyanide (R3A = n-butyl, R4A = hydrogen atom) α-(4-toluenesulfonyloxyimino)benzyl cyanide (R3A = 4-tolyl, 11^=hydrogen atom) α- (phenylsulfonyloxyimino)benzyl cyanide (R3A = phenyl, R4A = hydrogen atom) Q α-[(methylsulfonyloxyimino)-4-methoxyphenyl]acetonitrile ( R3A=methyl, R4A=methoxy) α-[(ethylsulfonyloxyimino)-4-methoxyphenyl]acetonitrile (R3A=ethyl, R4A=methoxy) α- [(n-propylsulfonyloxyimino)-4-methoxyphenyl]acetonitrile (R3A = n-propyl, R4A = methoxy) α-[(n-butylsulfonyloxyimino) -4_methoxyphenyl]acetonitrile (R3A = n-butyl, R4A = methoxy) -25- 201100966 α-[(4-tolylsulfonyloxyimino)_4_methoxybenzene Acetonitrile (R3A = 4_ tolyl, R4A = A α)[(phenylsulfonyloxyimino)-4-methoxyphenyl]acetonitrile (r3a=phenyl, r4A=methoxy) In the photosensitive resin composition of the present invention, photoacid generation The agent (B) is preferably contained in an amount of from 1 to 10 parts by mass, more preferably from 0,5 to 10 parts by mass, per 100 parts by mass of the copolymer (A). 0 The photosensitive resin composition of the invention A photoacid generator other than the photoacid generator of the oxime sulfonate group represented by the formula (2), if necessary, as a photoacid generator for inducing active light. (C) In the molecule Specific examples of the compound having two or more epoxy groups as a compound having two or more epoxy groups in the molecule (also referred to as "(C) component") include bisphenol A type epoxy resin and double Phenol f-type epoxy resin, phenol novolac type epoxy resin, cresol novolac type epoxy resin, aliphatic epoxy resin, and the like. Q These can be obtained as a commercial product. For example, examples of the bisphenol A type epoxy resin include JER827, JER828, JER834, JER1001, JER1002, JER1003, JER1055, JER1007, JER1009, JER1010 (above, JAPAN EPOXY RESINS), EPICLON 860, and EPICLON 1050. EPICLON1051, EPICLON 1055 (above, Dainippon INK Chemical Industry Co., Ltd., etc.; as bisphenol F-type epoxy resin, JER806, JER807, JER4004, JER4005, JER4007, JER4010 (above, JAPAN EPOXY RESINS) System, -26- 201100966 EPICLON830, EPICLON835 (above, Dainippon INK Chemical Industry Co., Ltd., LCE-21, RE-602S (above, Nippon Chemical Co., Ltd.), etc.: as phenol novolak type epoxy resin Examples include JER152, JER154, JER1 57S70 (above, JAPAN EPOXY RESINS), EPICLON-740, EPICLON-740, EPICLON-770, EPICLON-775 (above, Dainippon INK Chemical Industry Co., Ltd.); Examples of the cresol novolac type epoxy resin include EPICLON-N-660, EPICLON-N665, EPICLON-N670, EPICLON-N673, EPICLON-N680, and 〇EPICLON-N690 ' EPICLON-N695 ( , Japan's INK Chemical Industry Co., Ltd., EOCN- 1 020 (above, Nippon Chemical Co., Ltd.), etc.; as an aliphatic epoxy resin, ADEKA RESIN EP-4080S, EP-4085S, EP -4088S (above, ADEKA (share) system), CELLOXIDE 2021P, CELLOXIDE 2081, CELLOXIDE2083, CELLOXIDE 2085, EHPE3 1 50, EPOLE AD PB 3 600, same as PB 4700 (above, DAICEL chemical (share)), etc. For example, Q ADEKA RESIN EP-4000S, EP-4003S, EP-4010S, EP-401 1 S (above, ADEKA), NC-2000, NC-3000, NC-7300, XD-1000 , EPPN-501, EPPN-502 (above, ADEKA (share) system). These can be used individually or in combination of 2 or more types. Among these, a bisphenol A type epoxy resin, a bisphenol F type epoxy resin, a phenol novolak type epoxy resin, and a cresol novolac type epoxy resin are preferable. It is particularly preferred to use bisphenol A type epoxy resin. The content of the component (C) is preferably from 1 to 50 parts by mass, more preferably from 5 to 30 parts by mass, per 100 parts by mass of the component (A), from -27 to 201100966 parts. The component (C) is effective for adhesion improvement to a metal layer of chromium, molybdenum, aluminum, giant, or titanium 'copper, cobalt, tungsten, nickel, or the like. When these metal layers are formed by sputtering, the effect is remarkable. (D) Adhesive Aid The positive photosensitive resin composition of the present invention may further contain (D) an adhesion aid. The adhesion aid (D) which can be used in the present invention is an inorganic substance such as ruthenium, iridium oxide or tantalum nitride, or a metal such as gold, copper or aluminum, and an insulating film. Adhesively elevated compound. Specifically, a decane coupling agent, a thiol compound, or the like can be given. The decane coupling agent which is an adhesion aid which can be used in the present invention is not particularly limited as long as it is modified by an interface, and those skilled in the art can be used. Preferred decane coupling agents include, for example, γ-glycidoxypropyl Q trialkoxydecane, γ-glycidoxypropylalkyldialkoxydecane, and γ-methylpropene oxime. Oxypropyl propyl alkoxy decane, γ-methyl propylene methoxy propyl alkyl dialkoxy decane, γ-chloropropyl trialkoxy decane, γ-hydrothiopropyltrialkoxy Decane, β·(3,4-epoxycyclohexyl)ethyltrialkoxydecane, vinyltrialkoxydecane. Γ-glycidoxypropyl ethoxide oxalate or γ-methyl propyl methoxypropyltrialkoxy decane is preferred, γ-glycidoxypropyl trialkoxy The base decane is more preferred. -28- 201100966 These can be used alone or in combination of two or more. These are effective for adhesion improvement to the substrate, and are also effective for adjusting the taper angle with the substrate. The mixing ratio of the component (A), the component (B), the component (C), and the component (D) of the positive photosensitive resin composition of the present invention is 1 part by mass based on the total amount of the component (A). The component (B) is preferably 0.1 to 10 parts by mass, more preferably 0.5 to 10 parts by mass. Further, the component (C) is preferably 1 to 50 parts by mass, more preferably 5 to 30 parts by mass. Further, the component (D) is preferably 0.1 to 20 parts by mass, more preferably 0.5 to 10 parts by mass. <Other components> In addition to the components (A), (B), (C), and (D), the positive photosensitive resin composition of the present invention may be added with a basic compound as necessary. Surfactant, ultraviolet absorber, sensitizer, plasticizer, tackifier, organic solvent, adhesion promoter, organic or inorganic anti-precipitation agent, etc. <Basic compound> Q As the basic compound, it can be arbitrarily selected and used from among users of the chemical amplification type resist. For example, an aliphatic amine, an aromatic amine, a heterocyclic amine, a quaternary ammonium hydroxide, a carboxylic acid quaternary ammonium salt, or the like can be given. The aliphatic amine may, for example, be trimethylamine, diethylamine, triethylamine, di-n-propylamine, tri-n-propylamine, di-n-pentylamine, tri-n-pentylamine, diethanolamine, triethanolamine or bicyclod. Hexylamine, dicyclohexylmethylamine, and the like. The aromatic amine may, for example, be aniline, benzylamine, N,N-dimethylaniline or diphenylamine. -29- 201100966 The heterocyclic amine may, for example, be pyridine, 2-methylpyridine, 4-methylpyridine, 2-ethylpyridine, 4-ethylpyridine, 2-phenylpyridine or 4-phenylene. Pyridine, N-methyl-4-phenylpyridine, 4-dimethylaminopyridine, imidazole, benzimidazole, 4·methylimidazole, diphenylbenzimidazole, 2,4,5-triphenylimidazole ,nicotine,nicotinic acid,nicotinamide,quinoline, 8-hydroxyquinoline, pyridinium, pyrazole, argon, guanidine, pyrrolidine, piperidine, piperene, porphyrin, 4-methyl Porphyrin, 1,5-diazabicyclo[4,3,0]-5-pinene, 1,8-diazabicyclo[5,3,fluorene]-7-undecene, and the like. 〇 As the ammonium oxyhydroxide, for example, tetramethylammonium hydroxide, tetraethylammonium hydroxide, tetra-n-butylammonium hydroxide, tetra-n-hexylammonium hydroxide or the like can be given. Examples of the carboxylic acid quaternary ammonium salt include tetramethylammonium acetate, tetramethylammonium benzoate, tetra-n-butylammonium acetate, and tetra-n-butylammonium benzoate. The compounding ratio of the basic compound is preferably 0.001 to 1 part by mass per part by mass of the component (A), and more preferably 0.005 to 0.2 part by mass. <Interactive Agent> G As the surfactant, any of anionic, cationic, nonionic or amphoteric may be used, and a surfactant is preferably a nonionic surfactant. As examples of the nonionic surfactant, polyoxyethylene can be used as a high-grade polyetherether, a polyoxyethylene higher alkylphenyl ether, a higher fatty acid diester of polyoxyethylene propylene glycol, a lanthanide, or a fluorine. Is a surfactant. In addition, the following product names, κρ (manufactured by Shin-Etsu Chemical Co., Ltd.), POLYFLOW (manufactured by Kyoeisha Chemical Co., Ltd.), eft〇p (manufactured by JEMC), and MEGAFAC (manufactured by Otsuka ΝΚ Chemical Industry Co., Ltd.), 'Fur〇rad' (Sumitomo 3M system), -30- 201100966 ASAHI GUARD, SURFLON (made by Asahi Glass), PolyFox (made by OMNOVA), FTERGENT (made by NEOS). In addition, as a surfactant, a structural unit A and a structural unit B represented by the following general formula (1) are used, and the gel permeation chromatograph measured by tetrahydrofuran (THF) is used. The polystyrene has a weight average molecular weight (Mw) of 1,000 or more and 10,000 or less. 〇 constituent unit A constituent unit B ί ΐ L ^ -CH 2 — 0 - -CH 2 — 0 — (I) 〇 -) j - R 4 In the formula (1), R 1 and R 3 each independently represent a hydrogen atom or a R2 is a linear alkylene group having a carbon number of 1 or more and 4 or less. R4 is a hydrogen atom or an alkyl group having a carbon number of 1 or more and 4 or less. The alkyl group "L" represents an alkylene group having 3 or more and 6 or less carbon atoms. , p and q are mass ratios, and P is a number 1 of 10% by mass or more and 80% by mass or less, and q is a number 2'r of 20% by mass or more and 90% by mass or less. An integer of 1 or more and 18 or less is represented, and η represents an integer of 1 or more and below. The above L is preferably a branch extending from the following formula (II). R5 of the formula (Π) represents an alkyl group having 1 or more and 4 or less carbon atoms, and is preferably an alkyl group having 1 or more and 3 or less carbon atoms in terms of compatibility and wettability to a surface to be coated. An alkyl group having 2 or 3 carbon atoms is more preferred. The sum (p + q) of Ρ and q is P + q = 100, that is, preferably 100% by mass. -31- 201100966 —CH2CH— (") The weight average molecular weight (M w) of the copolymer is converted to polystyrene by a gel permeation chromatograph using THF as a solvent, and is 1000 or more and 100,000 or less. Preferably, it is more preferably 1 500 or more and 500 or less. The surfactants may be used singly or in combination of two or more. The blending ratio of the surfactant is usually ❹1 〇 by mass or less per 1 part by mass of the component (A), preferably 0.01 to 10 parts by mass, more preferably 0.01 to 1 part by mass. <Plasticizer> Examples of the plasticizer include dibutyl phthalate, dioctyl phthalate, dodecyl decanoate, polyethylene glycol, glycerin, dimethyl glyceryl phthalate, tartaric acid. Dibutyl ester, dioctyl adipate, triethylene glyceryl, and the like. The compounding ratio of the plasticizer is preferably 20 parts by mass or less per 100 parts by mass of the component (A), and more preferably 10 parts by mass or less. <Sensitizer> The photosensitive resin composition of the present invention preferably contains a sensitizer in order to promote decomposition thereof when combined with the photoacid generator (B). The sensitizer absorbs active light or radiation and becomes an electron-excited state. The sensitizer which becomes an electron-excited state acts in contact with the photo-acid generator to cause movement of electrons, energy movement, heat generation and the like. Thereby, the photoacid generator undergoes a chemical change to decompose and generate an acid. Further, as an example of a preferred sensitizer, a compound which belongs to the following compound and has an absorption wavelength at any wavelength in the region of 350 nm to 450 nm can be mentioned. Polynuclear aromatics (eg, ruthenium, osmium, tri-o-phenylene, anthracene, 9,10,-dibutoxyanthracene, 9,10,-diethoxyanthracene, 3,7-dimethoxyanthracene, 9, 10, -dipropoxy fluorene), xanthene (such as luciferin, eosin, erythrosine, rhodamine B, rose red), xanthone (xanthone) Classes (eg, oxime ketone, 9-oxosulfonium, dimethyl-9-oxopurine, diethyl-9-oxo-sulphur), anthocyanins (eg, thiocarbonate, Oxygen-carbonated cyanine), merocyanoids (eg, anthocyanins, carbonaceous anthocyanins), rhodacyanines, oxonols, thiazolines (eg thiazide) (thionine), methylene blue, toluidine blue), acridine (eg acridine orange, chlorferrin, acridine yellow), acridone (eg acridone ' 10-butyl-2-chloropurine) Pyridone), terpenoids (such as hydrazine), squalium (such as squalene), styryl, basetyryl (eg 2-[2-[4 -(dimethylamino)phenyl]vinyl]benzoxazole), coumarins (eg 7-two Amino 4-methylcoumarin, 7-hydroxy 4-methylcoumarin, 2,3,6,7-tetrahydro-9-methyl-1H,5H,11H[1]benzopyran [ 6,7,8-ij]porphyrin-11-one). Among these sensitizers, polycyclic aromatics, acridones, styrenes, alkali styrenes, and coumarins are preferred, and polycyclic aromatics are more preferred. Among the polycyclic aromatics, anthracene derivatives are preferred. <Solvent> The positive photosensitive resin composition of the present invention can be used by dissolving the above-mentioned component in a solvent as a solution. Examples of solvents that can be used in the positive photosensitive resin composition of the present invention are: - (1) ethyl alcohol monomethyl ether, ethylene glycol ethyl ether, ethylene glycol monopropyl ether, ethylene Ethylene glycol monoalkyl ethers such as alcohol monobutyl ether; (2) ethylene glycol dialkyl groups such as ethylene glycol dimethyl acid, ethylene glycol diethyl ether, ethylene glycol dipropyl ether Ethers; (3) Ethylene glycol monomethyl ether acetate, ethylene glycol monoethyl ether acetate, ethylene glycol monopropyl ether acetate, ethylene glycol monobutyl ether acetate, etc. Ethylene glycol monoalkyl ether acetates; propylene glycol monoalkyl ethers such as propylene glycol (4) propylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether, propylene glycol monobutyl ether; a propylene glycol dialkyl ether such as propylene glycol dimethyl ether, propylene glycol diethyl ether, diethylene glycol monomethyl ether or diethylene glycol monoethyl ether; (6) propylene glycol monomethyl ether Propylene glycol monoalkyl ether acetates such as acid ester, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether acetate, propylene glycol monobutyl ether acetate; Q (7) diethylene glycol Methyl ether Diethylene glycol dialkyl ethers such as diethylene glycol diethyl ether and diethylene glycol ethyl methyl ether; (8) diethylene glycol monomethyl ether acetate, Diethylene glycol monoalkyl ether acetate such as diethylene glycol monoethyl ether acetate, diethylene glycol monopropyl ether acetate, diethylene glycol monobutyl ether acetate (9) dipropylene glycol monoalkyl ethers such as dipropylene glycol monomethyl ether, dipropylene glycol monoethyl ether, dipropylene glycol monopropyl ether, dipropylene glycol monobutyl ether; -34 - 201100966 (10) dipropylene glycol dialkyl ether acetate such as dipropylene glycol dimethyl acetate acetate, dipropylene glycol diethyl acetate acetate, dipropylene glycol ethyl methyl acetate; (11) Dipropylene glycol propylene glycol monomethyl acetate, dipropylene glycol monoethyl ketone acetate, dipropylene glycol monopropyl ether acetate, dipropylene glycol monobutyl ether acetate Monoalkyl ether acetates; (12) methyl lactate, ethyl lactate, n-propyl lactate, isopropyl lactate, n-butyl lactate, isobutyl lactic acid, n-amyl lactate, a lactate such as isoamyl acetate; (13) n-butyl acetate, isobutyl acetate, n-amyl acetate, isoamyl acetate, n-hexyl acetate, 2-ethylhexyl acetate, ethyl propionate, N-propyl propionate, isopropyl propionate, n-butyl propionate, isobutyl propionate, methyl butyrate, ethyl butyrate, ethyl butyrate, n-propyl butyrate, isopropyl butyrate , an aliphatic carboxylic acid ester such as n-butyl butyrate or isobutyl butyrate; (14) ethyl hydroxyacetate, ethyl 2-hydroxy-2-methylpropionate, 2·hydroxy-3-methyl Q Ethyl butyrate, ethyl methoxyacetate, ethyl ethoxyacetate, methyl 3-methoxypropionate, ethyl 3-methoxypropionate, methyl 3-ethoxypropionate, Ethyl 3-ethoxypropionate, 3-methoxybutyl acetate, 3-methyl-3-methoxybutyl acetate, 3-methyl-3-methoxybutyl propionate, butyric acid Other esters such as 3-methyl-3-methoxybutyl ester, methyl acetonitrile acetate, ethyl acetate, methyl pyruvate, ethyl pyruvate; (15) methyl ethyl ketone, A Ketopropyl ketone, methyl-n-butyl ketone, methyl isobutyl ketone, 2-heptanone, 3-heptanone, 4-heptanone, cyclohexanone, etc. Ketones; -35- 201100966 (16) n-Methylformamide, N,N-dimethylformamide, N-methylacetamide, N,N-dimethylacetamide, N-A A guanamine such as a pyrrolidone; (17) a lactone such as γ-butyrolactone. Further, these solvents may also be added with benzyl ethyl ether, dihexyl ether, ethylene glycol monophenyl ether acetate, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, if necessary. Ether, isophorone, caproic acid, caprylic acid, 1-octanol, 1-nonanol, benzyl alcohol, anisole, benzyl acetate, ethyl benzoate, diethyl oxalate, diethyl maleate A solvent such as an ester, ethylene carbonate or propylene carbonate. The solvent may be used singly or in combination of two or more. The blending ratio of the solvent is usually 50 to 3,000 parts by mass per 100 parts by mass of the component, more preferably 100 to 2,000 parts by mass, more preferably 100 to 1,000 parts by mass. By using a positive photosensitive resin composition containing a (Α) component and a (Β) component, it is possible to provide a positive photosensitive resin composition which is excellent in sensitivity, Q residual film ratio, and stability over time. When the photosensitive resin composition is cured, a cured film excellent in heat resistance, adhesion, transparency, and the like can be obtained. <Method of Forming Cured Film> Subsequently, a method of forming a cured film using the positive photosensitive resin composition of the present invention will be described. By coating the positive photosensitive resin composition of the present invention on a substrate and heating it, a coating film can be formed on the substrate. -36- 201100966 By irradiating the obtained coating film with active light, the component (B) is decomposed and generates an acid. The acid-dissociable group in the structural unit represented by the formula (1) contained in the component (A) is decomposed by hydrolysis to form a carboxyl group by the action of the acid which is generated by the acid. Subsequently, a positive image was formed by removing the exposed portion (which contains a resin having a carboxyl group which is easily dissolved in the alkaline developing solution) by using an alkaline developing solution. The reaction formula of the hydrolysis reaction is shown below.

r4oh 〇 爲了使本加水分解加速,可按照必要而進行曝光後加 熱處理:Post Exposure Bake(以後稱爲PEB)。其加熱溫度 爲高溫時,因爲所產生的羧基會與環氧基產生交聯反應, 致使無法顯像。 實際上,將對第三丁氧基羰基苯乙烯使用於代替由通 式(1)所表示的重複單元時,因爲酸解離反應的活性化能量 變高,爲了使酸解離性基解離’必須以高溫進行PEB,但 是同時產生交聯反應’致使無得到影像。 另一方面,因爲本發明之通式(1)所表示的酸解離性基 係酸分解的活性化能量低,藉由來自曝光之酸產生劑的 酸,能夠容易地溶解來產生羧基’無進行PEB之必要,藉 -37- 201100966 由顯像能夠形成正型影像。 又,亦可藉由以較低溫進行PEB’不會產生交聯反應 而能夠促進酸解離性基的分解° PEB溫度以1 3 0。(:以下爲佳,以1 1 0 °C以下爲更佳’以 8 0 °C以下爲特佳。 隨後,藉由加熱所得到的正型影像,將通式(1)中的酸 解離性基熱分解,來使其生成羧基’並使其與環氧基交聯’ 能夠形成硬化膜。該加熱較佳是以1 50°C以上的高溫加熱’ Ο 以180〜250 °C爲更佳,以200〜250 °C加熱爲特佳。 加熱時間能夠依照加熱溫度等而適當地設定’通常爲 1 0〜90分鐘。 加熱步驟之前增加全面照射活性光線之步驟時,藉由 照射活性光線所產生的酸,能夠促進交聯反應。 隨後,具體地說明使用本發明的正型感光性樹脂組成 物硬化膜之硬化膜的形成方法。 Q 組成物溶液的調製方法:將(A)成分、(B)成分、(C)成 分及其他的調配劑,以規定比率且任意的方法混合,並攪 拌溶解來調製組成物溶液。例如,亦可以使各自的成分預 先溶解於溶劑後,將該等以規定比率混合來調製組成物溶 液。如以上所調製的組成物溶液,亦可使用孔徑爲0.2 μπι 的過濾器過濾後提供使用。 &lt;塗膜的製造方法&gt; 將組成物溶液塗布在規定的基板,並藉由加熱來除去 -38 - 201100966 溶劑(以後稱爲預烘烤),能夠形成所需要的塗膜。作爲前 述基板,例如在製造液晶顯示元件,可舉出設置偏光板、 及按照必要而設置黑色矩陣層、彩色濾光片層、進而設置 透明導電路層而成之玻璃板等。在基板之塗布方法沒有特 別限定,例如能夠使用噴霧法、輥塗布法、旋轉塗布法、 狹縫塗布法等的方法。 又,預烘烤時的加熱條件係在未曝光部的(A)成分中之 式(1)所表示的重複單元等不會解離而使(A)成分在鹼性顯 〇 像液成爲可溶性之範圍,依照各成分的種類或調配比而不 同,較佳是80〜130 °c、30〜120秒左右。 &lt;圖案形成方法&gt; 在設置有塗膜的基板,透過規定圖案的光罩,照射活 性光線後,按照必要進行加熱處理(PEB)後,使用顯像液除 去曝光部來形成影像圖案。 活性光線的放射,能夠使用低壓水銀燈、高壓水銀燈、 Q 超高壓水銀燈、化學燈、準分子雷射產生裝置等,以g射 線、i射線、h射線等波長爲300nm以上的活性光線爲佳。 又,亦可按照必要通過如長波長截止濾波器、短波長截止 濾波器、帶通濾波器之分光濾波器來調整照射光。 作爲顯像液,能夠使用例如氫氧化鋰、氫氧化鈉、氫 氧化鉀等的鹼金屬氫氧化物類;碳酸鈉、碳酸鉀等的鹼金 屬碳酸鹽類;重碳酸鈉、重碳酸鉀等的鹼金屬重碳酸鹽類; 氫氧化四甲銨、氫氧化四乙銨、氫氧化膽鹼等的氫氧化銨 -39- 201100966 類;矽酸鈉、甲基矽酸鈉等的水溶液。又,亦可將在上述 鹼類的水溶液適當量添加甲醇或乙醇等的水溶性有機溶劑 或界面活性劑而成的水溶液作爲顯像液而使用。 顯像液的pH以10.0以上爲佳。 顯像時間係通常爲3 0〜1 8 0秒,又,顯像方法係液體 盛裝法、浸漬法等任一者均可。顯像後行流水洗淨3 0〜90 秒,能夠使其形成所需要的圖案。 &lt;交聯步驟&gt; 〇 對具有藉由顯像所得到的未曝光部之圖案,使用熱板 或烘箱等的加熱裝置,在規定溫度例如180〜250 °C加熱處 理規定時間例如熱板時爲5〜30分鐘、烘箱時爲30〜90分 鐘,來使A成分的酸解離性基脫離並使其產生羧基,而且 使羧基與交聯的官能基反應、交聯,能夠形成耐熱性、硬 度等優良的保護膜或層間絕緣膜。又,藉由進行加熱處理 係在氮氣環境下進行,亦能夠提升透明性。 Q 而且,以在加熱處理之前,藉由在形成有圖案的基板 照射活性光線,來使酸從在未曝部分所存在的(B)成分產生 爲佳。 [實施例] 隨後,藉由實施例來更具體地說明本發明。但是本發 明不被該等實施例限定。 [合成例1 : A-1的合成] 在500ml的3頸燒瓶添加89.4g(0.36莫耳)對(1-正丁 -40- 201100966 氧基乙氧羰基)苯乙烯、34.lg(〇.24莫耳)甲基丙烯酸環氧丙 酯及300ml甲基異丁基酮,並在此添加觸媒量的2,2,_偶氮 雙(2-甲基丙酸甲酯)作爲自由基聚合引發劑,且在氮氣環境 下在80°C使其聚合6小時。將反應液冷卻後,注入至大量 的庚烷來使聚合物析出。過濾取得結晶後,溶解於二伸乙 甘醇乙基甲基醚’並藉由減壓餾去在溶液中所含有的庚烷 及甲基異丁基酮’來得到聚合物A-1[對(1-正丁氧基乙氧羰 基)苯乙烯/甲基丙烯酸環氧丙酯]作爲二伸乙甘醇乙基甲基 〇 醚溶液。 所得到的聚合物之分子量及分子量分布係以苯乙烯作 爲標準之GPC測定結果,重量平均分子量爲約8000,分子 量分布(Mw/Mn)爲1.8。 [合成例2: A-2的合成] 在500ml的3頸燒瓶添加66.1g(0.3莫耳)對(1-乙氧基 乙氧羰基)苯乙烯、25.6g(0.18莫耳)甲基丙烯酸環氧丙酯、 〇 21.lg(0.12莫耳)甲基丙烯酸苄酯及300ml甲基異丁基酮, 並在此添加觸媒量的2,2’-偶氮雙(2-甲基丙酸甲酯)作爲自 由基聚合引發劑,且在氮氣環境下在80 °C使其聚合6小 時。將反應液冷卻後,注入至大量的庚烷來使聚合物析出。 過濾取得結晶後,溶解於二伸乙甘醇乙基甲基醚,並藉由 減壓餾去在溶液中所含有的庚烷及甲基異丁基酮,來得到 聚合物A-2[對(1-乙氧基乙氧羰基)苯乙烯/甲基丙烯酸環氧 丙酯/甲基丙烯酸苄酯]作爲二伸乙甘醇乙基甲基醚溶液。 -41 - 201100966 所得到的聚合物之分子量及分子量分布係以苯乙乍 爲標準之GPC測定結果,重量平均分子量爲約8000,分子 量分布(Mw/Mn)爲1.8。 [合成例3 : A-3的合成] 在5 00ml的3頸燒瓶添加101.6g(0.36莫耳)對(1_节氧 基乙氧羰基)苯乙烯、23.1 g(0.18莫耳)丙烯酸環氧丙酯、 7.8 g(0.06莫耳)甲基丙烯酸2·羥基乙酯及30〇ml甲基異丁基 酮,並在此添加觸媒量的2,2’-偶氮雙(2 -甲基丙酸甲酯)作爲 ^ 自由基聚合引發劑,且在氮氣環境下在80 °C使其聚合6小 時。將反應液冷卻後,注入至大量的庚烷來使聚合物析出。 過濾取得結晶後,溶解於二伸乙甘醇乙基甲基醚,並藉由減 壓餾去在溶液中所含有的庚烷及甲基異丁基酮,來得到聚合 物 A-3 [對(1-苄氧基乙氧羰基)苯乙烯/丙烯酸環氧丙酯/甲基 丙烯酸2-羥基乙酯]作爲二伸乙甘醇乙基甲基醚溶液。 所得到的聚合物之分子量及分子量分布係以苯乙烯作 q 爲標準之GPC測定結果,重量平均分子量爲約7000,分子 量分布(Mw/Mn)爲1 .8。 [合成例4 : A-4的合成] 在5 00ml的3頸燒瓶添加66.1g(0.3莫耳)間(1-乙氧基 乙氧羰基)苯乙烯、25.6g(0.18莫耳)甲基丙烯酸環氧丙酯、 21.lg(0.12莫耳)甲基丙烯酸苄酯及300ml甲基異丁基酮, 並在此添加觸媒量的2,2’-偶氮雙(2-甲基丙酸甲酯)作爲自 由基聚合引發劑,且在氮氣環境下在8 0 °C使其聚合6小 -42- 201100966 時。將反應液冷卻後,注入至大量的庚烷來使聚合物析出。 過濾取得結晶後,溶解於二伸乙甘醇乙基甲基醚,並藉由 減壓餾去在溶液中所含有的庚烷及甲基異丁基酮,來得到 聚合物A-4 [間(1-乙氧基乙氧羰基)苯乙烯/甲基丙烯酸環氧 丙酯/甲基丙烯酸苄酯]作爲二伸乙甘醇乙基甲基醚溶液。 所得到的聚合物之分子量及分子量分布係以苯乙烯作 爲標準之GPC測定結果,重量平均分子量爲約5000,分子 量分布(Mw/Mn)爲1.6。 〇 [合成例5 : A_5的合成] 在500ml的3頸燒瓶添加79.3g(0.36莫耳)對(1-乙氧 基乙氧羰基)苯乙烯、35.3§(0.18莫耳)甲基丙烯酸3,4-環氧 環己基甲酯(DAICEL 化學公司製 CYLCOMER100)、 7.8 g(〇.〇6莫耳)甲基丙烯酸2-羥基乙酯及30 0ml甲基異丁 基酮,並在此添加觸媒量的2,2’-偶氮雙(2-甲基丙酸甲酯) 作爲自由基聚合引發劑,且在氮氣環境下在80 °C使其聚合 Q 6小時。將反應液冷卻後,注入至大量的庚烷來使聚合物 析出。過濾取得結晶後,溶解於二伸乙甘醇乙基甲基醚, 並藉由減壓餾去在溶液中所含有的庚烷及甲基異丁基酮, 來得到聚合物A-5[對(1-乙氧基乙氧羰基)苯乙烯/甲基丙烯 酸3,4-環氧環己基甲酯/甲基丙烯酸2-羥基乙酯]作爲二伸 乙甘醇乙基甲基醚溶液。 所得到的聚合物之分子量及分子量分布係以苯乙稀作 爲標準之GPC測定結果,重量平均分子量爲約9000,分子 -43- 201100966 量分布(Mw/Mn)爲1 ·8。 [合成例6 : Α-6的合成] 在500ml的3頸燒瓶添加84.3g(0.36莫耳)對(1-乙氧 基乙氧羰基)-α -甲基苯乙烯、31.7g(0.18莫耳)對-乙烯基苯 基環氧丙基醚、7.8g(0.06莫耳)甲基丙烯酸2-羥基乙酯及 300ml甲基異丁基酮,並在此添加觸媒量的2,2’-偶氮雙(2-甲基丙酸甲酯)作爲自由基聚合引發劑,且在氮氣環境下在 80 °C使其聚合6小時。將反應液冷卻後,注入至大量的庚 〇 烷來使聚合物析出。過濾取得結晶後,溶解於二伸乙甘醇 乙基甲基醚,並藉由減壓餾去在溶液中所含有的庚烷及甲 基異丁基酮’來得到聚合物A-6[對(1-乙氧基乙氧羰基)-α-甲基苯乙烯/對-乙烯基苯基環氧丙基醚/甲基丙烯酸2-羥基 乙酯]作爲二伸乙甘醇乙基甲基醚溶液。 所得到的聚合物之分子量及分子量分布係以苯乙烯作 爲標準之GPC測定結果,重量平均分子量爲約5000 ,分子 G 量分布(Mw/Mn)爲1.7。 [合成例7 : A-7的合成] 在500ml的3頸燒瓶添加69.7g(0.3莫耳)對(2 -氧雜環 己基)羥羰基苯乙烯、21.3g(0.15莫耳)甲基丙烯酸環氧丙 酯、15.9g(0.09莫耳)甲基丙烯酸苄酯、5.2g(0〇6莫耳)甲 基丙烯酸及300ml甲基異丁基酮,並在此添加觸媒量的 2,2’-偶氮雙(2-甲基丙酸甲酯)作爲自由基聚合引發劑,且 在氮氣環境下在80 °C使其聚合6小時。將反應液冷卻後, -44- 201100966 注入至大量的庚烷來使聚合物析出。過濾取得結晶後,溶 解於二伸乙甘醇乙基甲基醚,並藉由減壓餾去在溶液中所 含有的庚烷及甲基異丁基酮,來得到聚合物A-7 [對(2-氧雜 環己基)羥羰基苯乙烯/甲基丙烯酸環氧丙酯/甲基丙烯酸苄 酯/甲基丙烯酸]作爲二伸乙甘醇乙基甲基醚溶液。 所得到的聚合物之分子量及分子量分布係以苯乙烯作 爲標準之GPC測定結果,重量平均分子量爲約7000,分子 量分布(Mw/Mn)爲1.8。 〇 V [合成例8: A-8的合成] 在500ml的3頸燒瓶添加66.1g(0.3莫耳)對(1-乙氧基 乙氧羰基)苯乙烯、33.2g(0.18莫耳)甲基丙烯酸(1-乙基- 3-氧雜環丁基)甲酯、21.1g(0.12莫耳)甲基丙烯酸苄酯及 300ml甲基異丁基酮,並在此添加觸媒量的2,2’-偶氮雙(2-甲基丙酸甲酯)作爲自由基聚合引發劑,且在氮氣環境下在 80°C使其聚合6小時。將反應液冷卻後,注入至大量的庚 Q 院來使聚合物析出。過濾取得結晶後,溶解於二伸乙甘醇 乙基甲基醚,並藉由減壓餾去在溶液中所含有的庚烷及甲 基異丁基酮,來得到聚合物A-8 [對(1-乙氧基乙氧羰基)苯 乙烯/甲基丙烯酸(1_乙基-3_氧雜環丁基)甲酯/甲基丙烯酸 苄酯]作爲二伸乙甘醇乙基甲基醚溶液。 所得到的聚合物之分子量及分子量分布係以苯乙烯作 爲標準之GPC測定結果,重量平均分子量爲約8〇〇〇,分子 量分布(Mw/Mn)爲1.7。 -45- 201100966 [聚合物A-9〜A-15的合成] 藉由與上述製造方法同樣的方法來得後面揭示之聚合 物 A-9 〜A-15。 [合成比較例1 : A’_16的合成] 在500ml的3頸燒瓶添加61.3g(0.3莫耳)對第三丁氧 羰基苯乙烯、21.3g(0.15莫耳)甲基丙烯酸環氧丙酯、 26.4g(0.15莫耳)甲基丙烯酸苄酯及300ml甲基異丁基酮, 並在此添加觸媒量的2,2’-偶氮雙(2-甲基丙酸甲酯)作爲自 〇 由基聚合引發劑,且在氮氣環境下在80 °c使其聚合6小 時。將反應液冷卻後,注入至大量的庚烷來使聚合物析出。 過濾取得結晶後,溶解於二伸乙甘醇乙基甲基醚,並藉由 減壓餾去在溶液中所含有的庚烷及甲基異丁基酮,來得到 聚合物 A’-16[對第三丁氧羰基苯乙烯/甲基丙烯酸環氧丙 酯/甲基丙烯酸苄酯]作爲二伸乙甘醇乙基甲基醚溶液。 所得到的聚合物之分子量及分子量分布係以苯乙烯作 Q 爲標準之GPC測定結果,重量平均分子量爲約8000,分子 量分布(Mw/Mn)爲1.8。 [合成比較例2 : A’ -1 7的合成] 在500ml的3頸燒瓶添加72.lg聚4-羥基苯乙烯(日本 曹達股份公司製VP-8000)、16.4g乙基乙烯醚及300ml乙 酸乙酯,並在此添加觸媒量的對甲苯磺酸,且在氮氣環境 下在室溫使其聚合3小時。添加少量的三乙胺後,使用純 水洗淨。並在乙酸乙酯層添加二伸乙甘醇乙基甲基醚,並 -46 - 201100966 藉由減壓餾去在溶液中所含有的乙酸乙酯,來得到聚合物 A’-17(對-1-乙氧基乙氧基苯乙烯/對羥基苯乙烯)作爲二伸 乙甘醇乙基甲基醚溶液。 所得到的聚合物之對-1·乙氧基乙氧基苯乙烯單元及 對羥基苯乙烯單元的構成比率係從NMR測定爲約3 5: 65。 又’以苯乙靖作爲標準之GPC測定結果,重量平均分子量 爲約9000,分子量分布(Mw/Mn)爲1.2。 [合成比較例3 : A’-l 8的合成] 〇 依照特開2004-264623號公報的合成例I,來進行合成 A,- 18。 在3頸燒瓶添加7重量份2,2’-偶氮雙(2,4-二甲基戊 腈)' 200重量份二伸乙甘醇乙基甲基醚,隨後添加40重量 份甲基丙烯酸1-(環己氧基)乙酯、5重量份苯乙烯、45重 量份甲基丙烯酸環氧丙酯、10重量份甲基丙烯酸2 -羥基乙 酯及3重量份α-甲基苯乙烯二聚物並氮取代後,慢慢地開 Q 始攪拌。使溶液的溫度上升至70°C,並在該溫度保持5小 時’來得到含有共聚物(A,-12)的聚合物溶液。所得到的聚 合物分子量係以苯乙烯作爲標準之GPC測定結果,重量平 均分子量爲約1 1 000,分子量分布(Mw/Mn)爲1.9。 [實施例1〜19及比較例1〜4] (1)正型感光性樹脂組成物溶液的調製 如下表1混合各成分而作爲均勻的溶液後,使用孔徑 爲0.2μπι的聚四氟乙烯製過濾器過濾來調製正型感光性樹 -47- 201100966 脂組成物溶液。 (2) 保存安定性的評價 使用東機產業股份公司製 E型黏度計測定正型感光 性樹脂組成物溶液在23 °C之黏度。測定將該組成物在23 °C 的恆溫槽保存1個月後的黏度。對於調製後的黏度,將室 溫保存1個月後的黏度係上升小於5%時評價爲〇,5%以上 時爲X。其結果係如下述表2所示。 (3) 敏感度及顯像時的殘膜率之評價 ^ 在具有矽氧化膜之矽晶圓上,旋轉塗布正型感光性樹 脂組成物溶液後,以l〇〇°c在熱板上預烘烤60秒來形成膜 厚度爲3μιη的塗膜。 · 隨後,使用i-射線步進機(CANON公司製 FPA-3 000 i5+),透過規定的光罩進行曝光。然後,以50°C烘烤60秒 後,使用表2所記載之鹼性顯像液(2.38質量%或0.4 %質量 %的氫氧化四甲銨水溶液)以23 °C顯像60秒後,以超純水沖 Q 洗1分鐘。藉由該等操作,將5μηι的線與間隙以1: 1解 像時之最合適曝光量(Eopt)作爲敏感度。 藉由測定顯像後之未曝光部的膜厚度,並藉由求取對 塗布後的膜厚度之比率(顯像後的未曝光部膜厚度+塗布後 的膜厚度χΐ00(%),來評價顯像時的殘膜率。 敏感度及顯像時的殘膜率之評價結果係如表2所示。 (4) 耐熱性 在上述(3),除了使用透明基板(CORNING公司製 -48- 201100966 CORNING 1 73 7)代替具有矽氧化膜之矽晶圓以外,與上述(3) 同樣地形成塗膜,並使用接近式曝光裝置(USHIO電氣公司 製 UX- 1 000SM),並使其黏附規定的光罩,使用在3 65nm 的光強度爲18m W/cnx2之紫外線進行曝光。隨後,使用表2 所記載的鹼性顯像液(2.38質量%或0.4質量%的氫氧化四 甲銨水溶液)以23 °C曝光60秒後,以超純水沖洗1 0秒。藉 由該等操作,來製造ΙΟμιη的線與間隙成爲1: 1之圖案。R4oh 〇 In order to accelerate the decomposition of the water, it is necessary to perform post-exposure heat treatment as necessary: Post Exposure Bake (hereinafter referred to as PEB). When the heating temperature is high, the generated carboxyl group may crosslink with the epoxy group, resulting in failure to develop. In fact, when the third butoxycarbonyl styrene is used in place of the repeating unit represented by the general formula (1), since the activation energy of the acid dissociation reaction becomes high, in order to dissociate the acid dissociable group, it is necessary to PEB is carried out at a high temperature, but at the same time a cross-linking reaction occurs, resulting in no image acquisition. On the other hand, since the acid dissociable group acid represented by the general formula (1) of the present invention has low activation energy, it can be easily dissolved to produce a carboxyl group by the acid derived from the exposed acid generator. The necessity of PEB, by -37- 201100966, can form a positive image by visualization. Further, the decomposition of the acid dissociable group can be promoted by the PEB' at a lower temperature without causing a crosslinking reaction. The PEB temperature is 1300. (: The following is preferable, preferably 1 to 10 ° C or less is more preferably 80 ° C or less. Subsequently, the acid dissociation in the general formula (1) is obtained by heating the obtained positive image. The base thermally decomposes to form a carboxyl group 'and crosslinks it with the epoxy group' to form a cured film. The heating is preferably performed at a high temperature of 150 ° C or higher ' Ο preferably 180 to 250 ° C. It is particularly preferable to heat at 200 to 250 ° C. The heating time can be appropriately set according to the heating temperature or the like 'usually 10 to 90 minutes. When the step of increasing the total irradiation of the active light before the heating step is performed, the active light is irradiated The acid produced can promote the crosslinking reaction. Subsequently, a method of forming a cured film using the cured film of the positive photosensitive resin composition of the present invention will be specifically described. Q A method of preparing a composition solution: (A) component, B) the component, the component (C), and other formulation agents are mixed at a predetermined ratio and in any manner, and stirred and dissolved to prepare a composition solution. For example, the components may be dissolved in a solvent beforehand, and the components may be dissolved in a solvent. Prescribed ratio mixing to modulate The solution of the composition prepared as described above can also be used after filtration using a filter having a pore size of 0.2 μm. &lt;Manufacturing method of coating film&gt; Coating the composition solution on a predetermined substrate by using Heat-removed -38 - 201100966 Solvent (hereinafter referred to as pre-baking), a desired coating film can be formed. As the substrate, for example, a liquid crystal display element is provided, and a polarizing plate is provided and a black matrix is provided as necessary. A layer, a color filter layer, and a glass plate in which a transparent conductive circuit layer is further provided. The method of applying the substrate is not particularly limited, and for example, a spray method, a roll coating method, a spin coating method, a slit coating method, or the like can be used. In addition, the heating condition at the time of pre-baking is such that the repeating unit represented by the formula (1) in the component (A) of the unexposed portion does not dissociate, and the component (A) is formed in the alkaline smear liquid. The range of the solubility varies depending on the type of each component or the mixing ratio, and is preferably about 80 to 130 ° C and about 30 to 120 seconds. <Pattern forming method> On the substrate provided with the coating film, After the active light is applied to the mask of the fixed pattern, heat treatment (PEB) is performed as necessary, and the exposed portion is removed by using a developing solution to form an image pattern. For the emission of active light, a low-pressure mercury lamp, a high-pressure mercury lamp, or a Q ultra-high pressure mercury lamp can be used. For chemical light, excimer laser generating device, etc., it is preferable to use active light having a wavelength of 300 nm or more, such as g-ray, i-ray, or h-ray. Further, it is also possible to pass, for example, a long-wavelength cut filter and a short-wavelength cut filter as necessary. The illuminating light is adjusted by a spectroscopic filter of a band pass filter. As the developing liquid, for example, an alkali metal hydroxide such as lithium hydroxide, sodium hydroxide or potassium hydroxide; or sodium carbonate or potassium carbonate can be used. Alkali metal carbonates; alkali metal bicarbonates such as sodium bicarbonate, potassium bicarbonate; ammonium hydroxides such as tetramethylammonium hydroxide, tetraethylammonium hydroxide, choline hydroxide, etc. -39-201100966; An aqueous solution of sodium or sodium decanoate. Further, an aqueous solution obtained by adding a water-soluble organic solvent such as methanol or ethanol or a surfactant to the aqueous solution of the above-mentioned alkali may be used as a developing solution. The pH of the developing solution is preferably 10.0 or more. The development time is usually 30 to 180 seconds, and the development method may be any of a liquid filling method and a dipping method. After the development, the water is washed for 30 to 90 seconds to form the desired pattern. &lt;Crosslinking step&gt; 〇When a pattern having an unexposed portion obtained by development is used, a heating device such as a hot plate or an oven is used to heat the predetermined time, for example, a hot plate at a predetermined temperature, for example, 180 to 250 ° C. 5 to 30 minutes, 30 to 90 minutes in the oven, the acid dissociable group of the component A is removed and carboxyl groups are generated, and the carboxyl group is reacted and crosslinked with the crosslinked functional group to form heat resistance and hardness. Such as an excellent protective film or interlayer insulating film. Further, by performing heat treatment in a nitrogen atmosphere, transparency can be improved. Further, it is preferable to cause the acid to be generated from the component (B) which is present in the unexposed portion by irradiating the active light to the substrate on which the pattern is formed before the heat treatment. [Examples] Subsequently, the present invention will be more specifically described by way of examples. However, the invention is not limited by such embodiments. [Synthesis Example 1: Synthesis of A-1] In a 500 ml 3-necked flask, 89.4 g (0.36 mol) of (1-n-butyr-40-201100966 oxyethoxycarbonyl)styrene, 34.lg (〇. 24 moles of glycidyl methacrylate and 300 ml of methyl isobutyl ketone, and a catalytic amount of 2,2,-azobis(methyl 2-methylpropionate) was added as a radical polymerization. The initiator was polymerized at 80 ° C for 6 hours under a nitrogen atmosphere. After cooling the reaction liquid, a large amount of heptane was injected to precipitate a polymer. After the crystals were obtained by filtration, the product was dissolved in diethylene glycol ethyl ether, and the heptane and methyl isobutyl ketone contained in the solution were distilled off under reduced pressure to obtain a polymer A-1. (1-n-Butoxyethoxycarbonyl)styrene/glycidyl methacrylate] as a solution of diethylene glycol ethyl methyl oxime ether. The molecular weight and molecular weight distribution of the obtained polymer were measured by GPC using styrene as a standard, and the weight average molecular weight was about 8,000, and the molecular weight distribution (Mw/Mn) was 1.8. [Synthesis Example 2: Synthesis of A-2] In a 500 ml 3-necked flask, 66.1 g (0.3 mol) of (1-ethoxyethoxycarbonyl)styrene, 25.6 g (0.18 mol) of methacrylic acid ring was added. Oxypropyl propyl ester, 〇21.lg (0.12 mol) benzyl methacrylate and 300 ml of methyl isobutyl ketone, and a catalytic amount of 2,2'-azobis(2-methylpropionic acid) is added here. The methyl ester) was used as a radical polymerization initiator, and was polymerized at 80 ° C for 6 hours under a nitrogen atmosphere. After cooling the reaction liquid, a large amount of heptane was injected to precipitate a polymer. After crystallization was obtained by filtration, it was dissolved in diethylene glycol ethyl ether, and the heptane and methyl isobutyl ketone contained in the solution were distilled off under reduced pressure to obtain a polymer A-2. (1-Ethoxyethoxycarbonyl)styrene/glycidyl methacrylate/benzyl methacrylate] as a solution of diethylene glycol ethyl methyl ether. -41 - 201100966 The molecular weight and molecular weight distribution of the obtained polymer were GPC measurement results based on phenethyl hydrazine, and the weight average molecular weight was about 8,000, and the molecular weight distribution (Mw/Mn) was 1.8. [Synthesis Example 3: Synthesis of A-3] In a 500-neck 3-necked flask, 101.6 g (0.36 mol) of (1-hydroxyethoxycarbonyl)styrene, 23.1 g (0.18 mol) of acrylic epoxy was added. Propyl ester, 7.8 g (0.06 mol) of 2-hydroxyethyl methacrylate and 30 ml of methyl isobutyl ketone, and the amount of catalyst added 2,2'-azobis(2-methyl) Methyl propionate was used as a radical polymerization initiator and polymerized at 80 ° C for 6 hours under a nitrogen atmosphere. After cooling the reaction liquid, a large amount of heptane was injected to precipitate a polymer. After crystallization is obtained by filtration, it is dissolved in ethylene glycol ethyl ether, and the heptane and methyl isobutyl ketone contained in the solution are distilled off under reduced pressure to obtain a polymer A-3. (1-Benzyloxyethoxycarbonyl)styrene/glycidyl acrylate/2-hydroxyethyl methacrylate] as a solution of diethylene glycol ethyl methyl ether. The molecular weight and molecular weight distribution of the obtained polymer were measured by GPC using styrene as a standard, and the weight average molecular weight was about 7,000, and the molecular weight distribution (Mw/Mn) was 1.8. [Synthesis Example 4: Synthesis of A-4] 66.1 g (0.3 mol) of (1-ethoxyethoxycarbonyl)styrene, 25.6 g (0.18 mol) of methacrylic acid was added to a 500-neck 3-neck flask. Glycidyl acrylate, 21. lg (0.12 mol) benzyl methacrylate and 300 ml of methyl isobutyl ketone, and a catalytic amount of 2,2'-azobis(2-methylpropionic acid) is added here. The methyl ester) was used as a radical polymerization initiator and was polymerized at 80 ° C under a nitrogen atmosphere for 6 hours - 42 - 201100966. After cooling the reaction liquid, a large amount of heptane was injected to precipitate a polymer. After crystallization is obtained by filtration, it is dissolved in diethylene glycol ethyl ether, and the heptane and methyl isobutyl ketone contained in the solution are distilled off under reduced pressure to obtain a polymer A-4. (1-Ethoxyethoxycarbonyl)styrene/glycidyl methacrylate/benzyl methacrylate] as a solution of diethylene glycol ethyl methyl ether. The molecular weight and molecular weight distribution of the obtained polymer were measured by GPC using styrene as a standard, and the weight average molecular weight was about 5,000, and the molecular weight distribution (Mw/Mn) was 1.6. 〇 [Synthesis Example 5: Synthesis of A_5] In a 500 ml 3-necked flask, 79.3 g (0.36 mol) of (1-ethoxyethoxycarbonyl)styrene, 35.3 § (0.18 mol) of methacrylic acid 3 were added. 4-epoxycyclohexylmethyl ester (CYLCOMER 100 manufactured by DAICEL Chemical Co., Ltd.), 7.8 g (〇.〇6 mol) 2-hydroxyethyl methacrylate and 30 ml methyl isobutyl ketone, and a catalyst was added thereto. The amount of 2,2'-azobis(methyl 2-methylpropionate) was used as a radical polymerization initiator, and it was polymerized at 80 ° C for 6 hours under a nitrogen atmosphere. After the reaction solution was cooled, a large amount of heptane was injected to precipitate a polymer. After crystallization was obtained by filtration, it was dissolved in diethylene glycol ethyl ether, and the heptane and methyl isobutyl ketone contained in the solution were distilled off under reduced pressure to obtain a polymer A-5. (1-Ethoxyethoxycarbonyl)styrene/3,4-epoxycyclohexylmethyl methacrylate/2-hydroxyethyl methacrylate] was used as a solution of diethylene glycol ethyl methyl ether. The molecular weight and molecular weight distribution of the obtained polymer were measured by GPC measurement using styrene as a standard, and the weight average molecular weight was about 9000, and the molecular weight distribution (Mw/Mn) of the molecule -43 to 201100966 was 1.8. [Synthesis Example 6: Synthesis of Α-6] In a 500 ml 3-necked flask, 84.3 g (0.36 mol) of (1-ethoxyethoxycarbonyl)-α-methylstyrene, 31.7 g (0.18 mol) was added. p-Vinylphenylepoxypropyl ether, 7.8 g (0.06 mol) of 2-hydroxyethyl methacrylate and 300 ml of methyl isobutyl ketone, and the amount of catalyst added 2,2'- Azobis(methyl 2-methylpropionate) was used as a radical polymerization initiator, and polymerization was carried out at 80 ° C for 6 hours under a nitrogen atmosphere. After cooling the reaction liquid, a large amount of heptane was injected to precipitate a polymer. After crystallization is obtained by filtration, it is dissolved in diethylene glycol ethyl ether, and the heptane and methyl isobutyl ketone contained in the solution are distilled off under reduced pressure to obtain a polymer A-6. (1-ethoxyethoxycarbonyl)-α-methylstyrene/p-vinylphenylepoxypropyl ether/2-hydroxyethyl methacrylate] as diethylene glycol ethyl methyl ether Solution. The molecular weight and molecular weight distribution of the obtained polymer were measured by GPC using styrene as a standard, and the weight average molecular weight was about 5,000, and the molecular G amount distribution (Mw/Mn) was 1.7. [Synthesis Example 7: Synthesis of A-7] In a 500 ml 3-necked flask, 69.7 g (0.3 mol) of p-(2-oxocyclohexyl)hydroxycarbonylstyrene, 21.3 g (0.15 mol) of methacrylic acid ring was added. Oxypropyl propyl ester, 15.9 g (0.09 mol) benzyl methacrylate, 5.2 g (0 〇 6 mol) methacrylic acid and 300 ml methyl isobutyl ketone, and the amount of catalyst added 2, 2' -Azobis(methyl 2-methylpropionate) was used as a radical polymerization initiator, and it was polymerized at 80 ° C for 6 hours under a nitrogen atmosphere. After the reaction solution was cooled, -44 to 201100966 was injected into a large amount of heptane to precipitate a polymer. After crystallization is obtained by filtration, it is dissolved in diethylene glycol ethyl ether, and the heptane and methyl isobutyl ketone contained in the solution are distilled off under reduced pressure to obtain a polymer A-7. (2-oxocyclohexyl)hydroxycarbonylstyrene/glycidyl methacrylate/benzyl methacrylate/methacrylic acid] as a solution of diethylene glycol ethyl methyl ether. The molecular weight and molecular weight distribution of the obtained polymer were measured by GPC using styrene as a standard, and the weight average molecular weight was about 7,000, and the molecular weight distribution (Mw/Mn) was 1.8. 〇V [Synthesis Example 8: Synthesis of A-8] In a 500 ml 3-necked flask, 66.1 g (0.3 mol) of (1-ethoxyethoxycarbonyl)styrene, 33.2 g (0.18 mol) of methyl group was added. (1-ethyl-3-oxetanyl)methyl acrylate, 21.1 g (0.12 mol) of benzyl methacrylate and 300 ml of methyl isobutyl ketone, and the amount of catalyst added 2, 2 '-Azobis(methyl 2-methylpropionate) was used as a radical polymerization initiator, and it was polymerized at 80 ° C for 6 hours under a nitrogen atmosphere. After the reaction solution was cooled, it was poured into a large amount of G-yard to precipitate a polymer. After crystallization is obtained by filtration, it is dissolved in diethylene glycol ethyl ether, and the heptane and methyl isobutyl ketone contained in the solution are distilled off under reduced pressure to obtain a polymer A-8. (1-ethoxyethoxycarbonyl)styrene/(1-ethyl-3-oxetanyl)methyl methacrylate/benzyl methacrylate] as diethylene glycol ethyl methyl ether Solution. The molecular weight and molecular weight distribution of the obtained polymer were measured by GPC using styrene as a standard, and the weight average molecular weight was about 8 Å, and the molecular weight distribution (Mw/Mn) was 1.7. -45-201100966 [Synthesis of Polymers A-9 to A-15] Polymers A-9 to A-15 which will be disclosed later were obtained by the same method as the above production method. [Synthesis Comparative Example 1: Synthesis of A'_16] In a 500 ml 3-necked flask, 61.3 g (0.3 mol) of p-butoxycarbonylstyrene, 21.3 g (0.15 mol) of glycidyl methacrylate, 26.4 g (0.15 mol) of benzyl methacrylate and 300 ml of methyl isobutyl ketone, and a catalytic amount of 2,2'-azobis(methyl 2-methylpropionate) was added thereto as a self-tanning agent. The initiator was polymerized from the base and polymerized at 80 ° C for 6 hours under a nitrogen atmosphere. After cooling the reaction liquid, a large amount of heptane was injected to precipitate a polymer. After crystallization was obtained by filtration, it was dissolved in diethylene glycol ethyl methyl ether, and the heptane and methyl isobutyl ketone contained in the solution were distilled off under reduced pressure to obtain a polymer A'-16 [ For the third butoxycarbonylstyrene/glycidyl methacrylate/benzyl methacrylate] as a solution of diethylene glycol ethyl methyl ether. The molecular weight and molecular weight distribution of the obtained polymer were measured by GPC using styrene as a standard, and the weight average molecular weight was about 8,000, and the molecular weight distribution (Mw/Mn) was 1.8. [Synthesis Comparative Example 2: Synthesis of A' -1 7] 72 g of 4-hydroxystyrene (VP-8000, manufactured by Nippon Soda Co., Ltd.), 16.4 g of ethyl vinyl ether and 300 ml of acetic acid were placed in a 500 ml 3-neck flask. Ethyl ester, and a catalytic amount of p-toluenesulfonic acid was added thereto, and it was polymerized at room temperature for 3 hours under a nitrogen atmosphere. After adding a small amount of triethylamine, it was washed with pure water. Further, diethylene glycol ethyl ether was added to the ethyl acetate layer, and ethyl acetate contained in the solution was distilled off under reduced pressure to obtain polymer A'-17 (p. 1-ethoxyethoxystyrene/p-hydroxystyrene) was used as a solution of diethylene glycol ethyl methyl ether. The composition ratio of the obtained polymer to -1·ethoxyethoxystyrene unit and p-hydroxystyrene unit was determined to be about 3 5:65 from NMR. Further, as a result of GPC measurement using phenethylamine as a standard, the weight average molecular weight was about 9000, and the molecular weight distribution (Mw/Mn) was 1.2. [Synthesis of Comparative Example 3: Synthesis of A'-l 8] 合成 Synthesis A, -18 was carried out in accordance with Synthesis Example I of JP-A-2004-264623. 7 parts by weight of 2,2'-azobis(2,4-dimethylvaleronitrile)' 200 parts by weight of diethylene glycol ethyl methyl ether in a 3-neck flask, followed by addition of 40 parts by weight of methacrylic acid 1-(cyclohexyloxy)ethyl ester, 5 parts by weight of styrene, 45 parts by weight of glycidyl methacrylate, 10 parts by weight of 2-hydroxyethyl methacrylate, and 3 parts by weight of α-methylstyrene After the polymer is replaced by nitrogen, slowly start Q and stir. The temperature of the solution was raised to 70 ° C and maintained at this temperature for 5 hours to obtain a polymer solution containing the copolymer (A, -12). The molecular weight of the obtained polymer was determined by GPC measurement using styrene as a standard, the weight average molecular weight was about 1 000, and the molecular weight distribution (Mw/Mn) was 1.9. [Examples 1 to 19 and Comparative Examples 1 to 4] (1) Preparation of Positive Photosensitive Resin Composition Solution As shown in Table 1 below, each component was mixed to obtain a uniform solution, and then a polytetrafluoroethylene having a pore diameter of 0.2 μm was used. The filter was filtered to prepare a positive photosensitive tree-47-201100966 lipid composition solution. (2) Evaluation of preservation stability The viscosity of the positive photosensitive resin composition solution at 23 ° C was measured using an E-type viscometer manufactured by Toki Sangyo Co., Ltd. The viscosity of the composition after storage in a thermostat at 23 ° C for one month was measured. For the viscosity after the preparation, the viscosity after the room temperature was stored for one month was increased to less than 5%, and it was evaluated as 〇, and when it was 5% or more, it was X. The results are shown in Table 2 below. (3) Evaluation of sensitivity and residual film rate during development ^ After spin coating a positive photosensitive resin composition solution on a silicon wafer having a tantalum oxide film, preheating on a hot plate at 10 ° C Bake for 60 seconds to form a coating film having a film thickness of 3 μm. • Subsequently, an i-ray stepper (FPA-3 000 i5+ manufactured by CANON Corporation) was used to perform exposure through a prescribed mask. Then, after baking at 50 ° C for 60 seconds, the image was visualized at 23 ° C for 60 seconds using an alkaline developing solution (2.38 mass% or 0.4% by mass aqueous tetramethylammonium hydroxide solution) shown in Table 2. Wash with ultrapure water for 1 minute. By these operations, the optimum exposure amount (Eopt) when the line of 5 μm is resolved with a gap of 1:1 is taken as the sensitivity. The film thickness of the unexposed portion after the development was measured, and the ratio of the film thickness after coating (the thickness of the unexposed film after development + the film thickness after coating χΐ00 (%)) was evaluated. The residual film rate at the time of development. The evaluation results of the sensitivity and the residual film rate at the time of development are shown in Table 2. (4) The heat resistance is the above (3), except that a transparent substrate (manufactured by CORNING-48-) is used. 201100966 CORNING 1 73 7) In addition to the tantalum wafer having a tantalum oxide film, a coating film is formed in the same manner as in the above (3), and a proximity exposure apparatus (UX-1 000SM manufactured by USHIO Electric Co., Ltd.) is used and adhered. The photomask was exposed to ultraviolet light having a light intensity of 18 mW/cnx2 at 3 65 nm. Subsequently, the alkaline developing solution (2.38 mass% or 0.4 mass% aqueous solution of tetramethylammonium hydroxide) described in Table 2 was used. After exposure at 23 ° C for 60 seconds, it was rinsed with ultrapure water for 10 seconds. By these operations, the line and the gap of ΙΟμηη were made into a 1:1 pattern.

將所得到的圖案進而全面曝光100秒,且在烘箱中以220 °C 〇 加熱1小時,在玻璃基板上形成加熱硬化膜。 藉由測定加熱硬化前後的底部尺寸之變化率(1 -加熱 硬化膜的底部尺寸+顯像後的底部尺寸)xl〇〇( %),來進行評 價耐熱性。 耐熱性的評價結果係如表2所示。 (5)透射率及黏附性 與上述(4)同樣地形成塗膜,未曝光而使用表2所記載 Q 之鹼性顯像液(2.3 8質量%、或0 · 4質量%的氫氧化四甲銨 水溶液)以23 °C顯像60秒後,以超純水沖洗1 〇秒。隨後, 使用接近式曝光裝置(USHIO電氣公司製 UX-1000SM),使 用在3 65nm的光強度爲18mW/cm2之紫外線進行全面曝光 100秒。隨後,藉由在烘箱中以240°C加熱1小時,在玻璃 基板上形成加熱硬化膜。 將所得到的加熱硬化膜使用分光光度計(U-3 000 :曰立 製作所製),以波長400〜800nm測定。 -49- 201100966 在加熱硬化膜使用切割器,在縱橫lmm的間隔切入’ 並使用透明膠黏帶(Scotch Tape)進行膠黏帶剝離試驗。從 被轉印至膠黏帶面之硬化膜的面積來評價硬化膜與胃 之黏附性。其面積小於1 %時評價爲〇,1〜小於5 %時爲△’ 5%以上時爲X。 透射率及黏附性之評價結果係如表2所示。 [實施例20] 使用實施例1 8的組成物並如以下進行來形成圖案。 〇 在2,16〇x 2,460mm的玻璃基板上狹縫塗布感光性樹脂 組成物,以90 °C在熱板上預烘烤90秒而除去溶劑,來形成 膜厚度爲3μιη的塗膜。隨後,使用FX_85S(NIKON(股)製)’ 並透過直徑15 μιη的接觸洞圖案之光罩而進行最合適曝光 量曝光。曝光後,使用〇·4質量%的氫氧化四甲銨水溶液以 23 °C進行噴淋顯像60秒後,以超純水沖洗1分鐘。藉由該 等操作,來得到圖案。進而將所得到的圖案進行全面曝光, Q 且在烘箱中以220°C加熱1小時,在玻璃基板上形成加熱硬 化膜。使用電子顯微鏡觀察時’係底部直徑爲15μιη的錐 狀之完美的接觸洞圖案。 [實施例21] 除了將曝光變更爲波長3 5 5 nm的雷射以外,與實施例 20同樣地製造接觸洞圖案。能夠與實施例20同樣地得5[) 完美的接觸洞圖案。又’雷射裝置係使用V-Technology公 司製的「AEGIS」。 -50- 201100966The obtained pattern was further exposed to full exposure for 100 seconds, and heated in an oven at 220 ° C for 1 hour to form a heat-cured film on the glass substrate. The heat resistance was evaluated by measuring the rate of change of the bottom size before and after heat curing (1 - the bottom size of the heat-cured film + the bottom size after development) xl 〇〇 (%). The evaluation results of heat resistance are shown in Table 2. (5) Transmittance and Adhesiveness A coating film was formed in the same manner as in the above (4), and an alkaline developing solution (2.3% by mass or 0.4% by mass) of Q shown in Table 2 was used without exposure. After the image was developed at 23 ° C for 60 seconds, it was rinsed with ultrapure water for 1 〇 second. Subsequently, using a proximity exposure apparatus (UX-1000SM manufactured by USHIO Electric Co., Ltd.), full exposure was performed for 100 seconds using ultraviolet rays having a light intensity of 18 mW/cm 2 at 3 65 nm. Subsequently, a heat-cured film was formed on the glass substrate by heating at 240 ° C for 1 hour in an oven. The obtained heat-cured film was measured at a wavelength of 400 to 800 nm using a spectrophotometer (U-3 000: manufactured by Konica Minolta Co., Ltd.). -49- 201100966 In the heat-cured film, a cutter was used, and the cutter was cut at intervals of 1 mm in the longitudinal and lateral directions, and the adhesive tape peeling test was performed using a Scotch Tape. The adhesion of the cured film to the stomach was evaluated from the area of the cured film transferred to the adhesive tape surface. When the area is less than 1%, it is evaluated as 〇, and when it is less than 5%, it is X when it is Δ' 5% or more. The evaluation results of transmittance and adhesion are shown in Table 2. [Example 20] The composition of Example 18 was used and patterned as follows.感光 A photosensitive resin composition was slit-coated on a glass substrate of 2,16 Å x 2,460 mm, and pre-baked on a hot plate at 90 ° C for 90 seconds to remove the solvent to form a coating film having a film thickness of 3 μm. Subsequently, the most suitable exposure exposure was carried out using a FX_85S (manufactured by NIKON) and passing through a mask of a contact hole pattern having a diameter of 15 μm. After the exposure, spray development was carried out at 23 ° C for 60 seconds using a 4% by mass aqueous solution of tetramethylammonium hydroxide, and then rinsed with ultrapure water for 1 minute. By these operations, a pattern is obtained. Further, the obtained pattern was subjected to total exposure, and Q was heated at 220 ° C for 1 hour in an oven to form a heat-hardened film on the glass substrate. When viewed with an electron microscope, the cone-shaped perfect contact hole pattern having a bottom diameter of 15 μm was used. [Example 21] A contact hole pattern was produced in the same manner as in Example 20 except that the exposure was changed to a laser having a wavelength of 35 5 nm. A perfect contact hole pattern of 5 [) was obtained in the same manner as in Example 20. Further, the laser device uses "AEGIS" manufactured by V-Technology. -50- 201100966

敏化劑 質量份 1 1 1 t 1 1 1 1 1 &lt;N (N 種類 1 1 1 1 1 1 1 1 1 DBA DBA 界面活性劑 質量份 CN 〇 &lt;S Ο CS 〇 &lt;N 〇 CS 〇 CS o fS 〇 CN 〇 CN 〇 (N 〇 CS o 種類 (N &lt;N 1¾ m m cn Ph 埋 質量份 0.02 0.02 0.02 i 0.02 0..01/0.02 1 ;0.02 0.02 0.02 0.02 0.02 0.02 種類 Ξ CN w W E1/E2 w w Ξ ω (N ω &lt;N W Q 質量份 m cn ΓΛ cn m KD &lt;N yn cn 1 m 種類 1—Η (N Q s 1 *—H i—H 〇 質量份 Ο o 〇 o V£&gt; O 〇 1 o o 種類 cs G 3 i—1 1 G G 質量份 勺· cs &lt;N m 00 cn CO &lt;N 騷 tlnrli 腳 Ξ (N PQ cn CQ 兮 CQ B1/B4 s 5 &lt;N CQ CQ SO Ό CQ &lt; 質量份 ο o o o o o O 100 o O r«H o 種類 &lt; A-2 tn &lt; ! Λ. 1 A-5 A-6 A-7 A-8 &lt; A-9 A-10 實施例1 實施例2 實施例3 實施例4 實施例5 實施例6 實施例7 實施例8 實施例9 實施例10 實施例11 201100966Sensitizer part by mass 1 1 1 t 1 1 1 1 1 &lt;N (N type 1 1 1 1 1 1 1 1 1 DBA DBA surfactant mass part CN 〇 &lt;S Ο CS 〇&lt;N 〇CS 〇 CS o fS 〇CN 〇CN 〇(N 〇CS o type (N &lt;N 13⁄4 mm cn Ph buried mass 0.02 0.02 0.02 i 0.02 0..01/0.02 1 ; 0.02 0.02 0.02 0.02 0.02 0.02 Type Ξ CN w W E1/E2 ww Ξ ω (N ω &lt; NWQ mass parts m cn ΓΛ cn m KD &lt;N yn cn 1 m Type 1 - Η (NQ s 1 * - H i - H 〇 mass parts Ο o 〇 o V £ &gt; O 〇1 oo Type cs G 3 i-1 1 GG mass scoop · cs &lt;N m 00 cn CO &lt;N 赛tlnrli Ξ (N PQ cn CQ 兮CQ B1/B4 s 5 &lt;N CQ CQ SO Ό CQ &lt; mass parts ο ooooo O 100 o O r«H o kind &lt; A-2 tn &lt; ! Λ. 1 A-5 A-6 A-7 A-8 &lt; A-9 A- 10 Embodiment 1 Embodiment 2 Embodiment 3 Embodiment 4 Embodiment 5 Embodiment 6 Embodiment 7 Embodiment 8 Embodiment 9 Embodiment 10 Embodiment 11 201100966

&lt;Ν (N 、 &lt;N tN (N (N &lt;N (N 1 1 1 1 &lt; ΠΊ &lt; m &lt; &lt; c &lt;1 &lt; &lt; Q Q Q W Q W Q w Q W Q W Q CN Ο O (N 〇 &lt;N 〇 (N 〇 cs o CN 〇 (N 〇 &lt;N 〇 (N o CN 〇 m ro Ph m IXi m m P-l m m cn 5: s: s s s s s S g s s s g g ο 〇 o o o o o o 〇 o 〇 o cs ti] ω CN ω (N PJ CN (N W cs ω CN Ξ Ξ w Ξ m c〇 ro m m m m 1 1 I—( T-^ T-H F—H r-H T—H 1 1 o O O o o o o o o o 1 1 Q G G G G G G G f**~4 1—H 1 1 cN (N (N CN (N CN iTi (N (N m ΓΛ 〇 Ό PQ v〇 CQ so Ό CQ 0Q Ό CQ 00 PQ S s B,9 B,9 o o o o F—H 100 o O T-H o O 〇 o ! 100 ΓΝ) »—H m 寸 ir&gt; Os On m 卜 00 00 &lt; &lt; &lt; &lt; &lt; &lt; &lt; &lt; $ cs CO 寸 Ό »—H 卜 00 Os (S m 寸 m 琢 m 辑 習 辑 辑 習 辑 辑 窗 s u 伽; 舾 u 蛔 IK J_D ΟΛ J_J -la J_3 J-X ΛΛ 201100966 表1所記載之(A)成分、(B)成分、(C)成分、(D)成分、鹼性 化合物、溶劑及界面活性劑係如下述。 (A)成分 構成單元的右側之數値係表示構成單元的莫耳比。 CH3&lt;Ν (N , &lt; N tN (N (N &lt; N (N 1 1 1 1 &lt; ΠΊ &lt; m &lt;&lt; c &lt; 1 &lt;&lt;&lt; QQQWQWQ w QWQWQ CN Ο O (N 〇 &lt;N 〇(N 〇cs o CN 〇(N 〇&lt;N 〇(N o CN 〇m ro Ph m IXi mm Pl mm cn 5: s: sssss S gsssgg ο 〇oooooo 〇o 〇o cs ti] ω CN ω (N PJ CN (NW cs ω CN Ξ Ξ w Ξ mc〇ro mmmm 1 1 I—( T-^ TH F—H rH T—H 1 1 o OO ooooooo 1 1 QGGGGGGG f**~4 1— H 1 1 cN (N (N CN (N CN iTi (N (N m ΓΛ 〇Ό PQ v〇CQ so Ό CQ 0Q Ό CQ 00 PQ S s B, 9 B, 9 oooo F-H 100 o O TH o O 〇o ! 100 ΓΝ) »—H m inch ir> Os On m 00 00 &lt;&lt;&lt;&lt;&lt;&lt;&lt;&lt; $ cs CO Ό Ό »—H 卜 00 Os (S m寸m 琢m 习 辑 辑 su su ; ; ; ; ; 蛔 蛔 J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J J The components, basic compounds, solvents, and surfactants are as follows. Component The number of the right side of the constituent unit indicates the molar ratio of the constituent unit. CH3

Mw:8000 Mw/Mn:l.8 A-1 :Mw: 8000 Mw/Mn: l.8 A-1 :

°°〇vW°°〇vW

00 Ο CHa Α一 2 : ί: CH5 CH300 Ο CHa Α一 2 : ί: CH5 CH3

Mw:8000 Mw/Mn:K8 coo. .och2ch3 A· CHaMw: 8000 Mw/Mn: K8 coo. .och2ch3 A· CHa

c〇〇v^s? 〇〇〇^〇aOC〇〇v^s? 〇〇〇^〇aO

Mw:7000 Mw/Mn:1.8Mw: 7000 Mw/Mn: 1.8

COOv OCHCOOv OCH

coo-ch2\JCoo-ch2\J

Mw:5000 Mw/Mn:1.6 C00v .OCH2CH3 CHa -53- 201100966 A— 5 :Mw: 5000 Mw/Mn: 1.6 C00v . OCH2CH3 CHa -53- 201100966 A-5 :

CH CH3 CH3紅♦今CH岵·十吹〇* COO /- coov •0CH CH3 CH3 Red ♦ Today CH岵· 十吹〇* COO /- coov •0

OHOH

Mw:9000 Mw/Mn:1.8 coo 丫och2ch3 ch3 A-6 : CHa ❹Mw: 9000 Mw/Mn: 1.8 coo 丫och2ch3 ch3 A-6 : CHa ❹

-CH ch3 c〇〇v/\-CH ch3 c〇〇v/\

Mw:5000 Mw/Mn:1.7Mw: 5000 Mw/Mn: 1.7

OH C00n.0CH2CH3 ch3 A-7 : CH3 ch3 ch3 -CH^i Sc-Ch%5* *-fC-CH^5* ^°°N^S? COO-CH2-^^ Cl ΪΟΟΗOH C00n.0CH2CH3 ch3 A-7 : CH3 ch3 ch3 -CH^i Sc-Ch%5* *-fC-CH^5* ^°°N^S? COO-CH2-^^ Cl ΪΟΟΗ

Mw:7000 Mw/Mn:1.8 COO,Mw: 7000 Mw/Mn: 1.8 COO,

〇 A-8 : CH3〇 A-8 : CH3

_c味;·十响 *會CHho·产^ coo p〇 coo-ch2-^^_c味;·十响 *会CHho·产^ coo p〇 coo-ch2-^^

Mw:8000 Mw/Mn:1.7 ch2ch3 CO〇v〇CH2CH3 ch3 54- 201100966 A-9Mw: 8000 Mw/Mn: 1.7 ch2ch3 CO〇v〇CH2CH3 ch3 54- 201100966 A-9

Mw: 8000 Mw/Mn: 1.9Mw: 8000 Mw/Mn: 1.9

A-10A-10

Mw: 30000 Mw/Mn: 1.4 A-11Mw: 30000 Mw/Mn: 1.4 A-11

Mw: 8000 Mw/Mn: 17 -55- 201100966 A-13Mw: 8000 Mw/Mn: 17 -55- 201100966 A-13

。人〇^^OH. People 〇^^OH

Mw: 8000 Mw/Mn: 2.1Mw: 8000 Mw/Mn: 2.1

A-14A-14

〇人〇^/OH〇人〇^/OH

Mw: 8000 Mw/Mn: 1.9 A-15Mw: 8000 Mw/Mn: 1.9 A-15

-56- 201100966 A'-16-56- 201100966 A'-16

Mw:8000 Mw/Nto:l,8 Α,·17Mw: 8000 Mw/Nto: l, 8 Α, · 17

Mw;9000 Mw/Mn:1.2 0-〒 h-och2ch3 〇h ch3 Α_·18Mw; 9000 Mw/Mn: 1.2 0-〒 h-och2ch3 〇h ch3 Α_·18

CH 3 COO. &gt;CH 3 COO. &gt;

ch3Ch3

Mw:11000 Mw/Mn:1.9 (B)成分 B 1 : IRGACURE PAG1 03(CIBA SPECIALTY CHEMICALS 公 司製)Mw: 11000 Mw/Mn: 1.9 (B) Component B 1 : IRGACURE PAG1 03 (manufactured by CIBA SPECIALTY CHEMICALS)

-57- 201100966 B2 : IRGACURE PAG1 08(CIB A SPECIALTY CHEMICALS 公 司製)-57- 201100966 B2 : IRGACURE PAG1 08 (manufactured by CIB A SPECIALTY CHEMICALS)

CH3 CN ΟCH3 CN Ο

ItIt

N**0—S—n-CaHi7 O B3 : CGI 1 3 8 0(CIBA SPECIALTY CHEMICALS 公司製)N**0—S—n-CaHi7 O B3 : CGI 1 3 8 0 (manufactured by CIBA SPECIALTY CHEMICALS)

O o B4 : IRGACURE PAG121(CIBA SPECIALTY CHEMICALS 公 司製)O o B4 : IRGACURE PAG121 (manufactured by CIBA SPECIALTY CHEMICALS)

B5 : CGI 725(CIBA SPECIALTY CHEMICALS 公司製)B5: CGI 725 (manufactured by CIBA SPECIALTY CHEMICALS)

0 II •s- 11 o B6: PAI-1001(MIDORI 化學公司製) -58- 2011009660 II • s- 11 o B6: PAI-1001 (manufactured by MIDORI Chemical Co., Ltd.) -58- 201100966

B7: PAI-1001(MIDORI 化學公司製)B7: PAI-1001 (manufactured by MIDORI Chemical Co., Ltd.)

B8: α-(4 -甲苯磺醯氧基亞胺基)苄基氰 (依照特表2002-52 845 1號公報的段落0108所記載之方法 〇合成。B8: α-(4-toluenesulfonyloxyimino)benzyl cyanide (synthesis according to the method described in paragraph 0108 of JP-A-2002-52 845 1).

B’9: 4,7-二正丁氧基-1-萘基四氫噻吩鑰三氟甲烷磺酸酯 (C)成分 C1 : JER1 00 1 (JAPAN Ε Ρ Ο X Y RE S IN S (股)製) C2 : JER834(JAPAN EPOXY RESINS(股)製) -59- 201100966 C3 : JER157S70(JAPAN EPOXY RESINS(股)製) C4 : JER154(JAPAN EPOXY RESINS(股)製) (D)成分 D1 : γ-環氧丙氧基丙基三甲氧基矽烷 D2: β-(3,4-環氧環己基)乙基三甲氧基矽烷 D3: γ-甲基丙烯醯氧基丙基甲氧基矽烷 [鹼性化合物] Ε 1 : 4 -二甲胺基吡啶 Ε2: 1,5-二氮雜雙環[4,3,0]-5-壬烯 [界面活性劑] FI : Furorad F-430(3M 公司製) F2 : MEGAFAC R-〇8(大日本INK化學工業製) F3: P〇lyF〇xPF-6320(OMNOVA 公司製) W-3 :B'9: 4,7-di-n-butoxy-1-naphthyltetrahydrothiophene trifluoromethanesulfonate (C) component C1 : JER1 00 1 (JAPAN Ε Ρ Ο XY RE S IN S (share) C2: JER834 (JAPAN EPOXY RESINS) -59- 201100966 C3: JER157S70 (JAPAN EPOXY RESINS) C4: JER154 (JAPAN EPOXY RESINS) (D) Component D1 : γ- Glycidoxypropyltrimethoxydecane D2: β-(3,4-epoxycyclohexyl)ethyltrimethoxydecane D3: γ-methylpropenyloxypropylmethoxydecane [alkaline Compound] Ε 1 : 4 -Dimethylaminopyridinium 2: 1,5-diazabicyclo[4,3,0]-5-nonene [surfactant] FI : Furorad F-430 (manufactured by 3M Company) F2 : MEGAFAC R-〇8 (made by Dainippon INK Chemical Industry Co., Ltd.) F3: P〇lyF〇xPF-6320 (made by OMNOVA) W-3 :

W-3W-3

2〇Μ% βΟΧϋ% Mw: 1500 [敏化劑] DBA: 9,10-二丁 氧基蒽 -60- 2011009662〇Μ% βΟΧϋ% Mw: 1500 [sensitizer] DBA: 9,10-dibutoxy oxime -60- 201100966

[表2] 顯像液濃度 (質量%) 保存 安定性 敏感度(Eopt) (mJ/cm2) 殘膜率 (%) 耐熱性 (%) 黏附性 透射率(%) (240。。/小時加熱後) 實施例1 0.4 〇 36 98 &lt;1 〇 98 實施例2 2.38 〇 46 99 &lt;1 〇 97 實施例3 0.4 〇 42 98 &lt;1 〇 98 實施例4 2.38 〇 38 98 &lt;1 〇 98 實施例5 0.4 〇 43 99 &lt;1 〇 97 實施例6 0.4 〇 40 98 &lt;1 〇 97 實施例7 0.4 〇 37 99 &lt;1 〇 98 實施例8 0.4 〇 43 99 &lt;1 〇 97 實施例9 0.4 〇 38 98 &lt;1 〇 98 實施例10 0.4 〇 32 98 &lt;1 〇 97 實施例11 0.4 〇 36 99 &lt;1 〇 97 實施例Π 0.4 〇 29 98 &lt;1 〇 97 實施例13 0.4 〇 28 98 &lt;1 〇 97 實施例14 0.4 〇 28 98 &lt;1 〇 97 實施例15 0.4 〇 31 98 &lt;1 〇 97 實施例16 0.4 〇 35 99 &lt;1 〇 97 實施例17 0.4 〇 32 98 &lt;1 〇 97 實施例18 0.4 〇 27 98 &lt;1 〇 97 實施例19 0.4 〇 27 98 &lt;1 〇 97 比較例1 0.4 〇 無法形成影像 〇 97 比較例2 2.38 〇 51 97 &lt;20 〇 70 比較例3 2.38 〇 &gt;800 99 &lt;1 X 85 比較例4 0.4 〇 &gt;800 99 &lt;1 X 86 -61 - 201100966 從表2,清楚明白本發明之正型感光性樹脂組成物係 敏感度、殘膜率、保存安定性優良且藉由使其硬化能夠得 到耐熱性、黏附性、透射率等優良之硬化膜。 【圖式簡單說明】 姐〇 【主要元件符號說明】 蛀。[Table 2] Developing solution concentration (% by mass) Preservation stability sensitivity (Eopt) (mJ/cm2) Residual film rate (%) Heat resistance (%) Adhesive transmittance (%) (240% / hour heating After) Example 1 0.4 〇36 98 &lt;1 〇98 Example 2 2.38 〇46 99 &lt;1 〇97 Example 3 0.4 〇42 98 &lt;1 〇98 Example 4 2.38 〇38 98 &lt;1 〇98 Example 5 0.4 〇43 99 &lt;1 〇97 Example 6 0.4 〇40 98 &lt;1 〇97 Example 7 0.4 〇37 99 &lt;1 〇98 Example 8 0.4 〇43 99 &lt;1 〇97 Example 9 0.4 〇38 98 &lt;1 〇98 Example 10 0.4 〇32 98 &lt;1 〇97 Example 11 0.4 〇36 99 &lt;1 〇97 Example Π 0.4 〇29 98 &lt;1 〇97 Example 13 0.4 〇28 98 &lt;1 〇97 Example 14 0.4 〇28 98 &lt;1 〇97 Example 15 0.4 〇31 98 &lt;1 〇97 Example 16 0.4 〇35 99 &lt;1 〇97 Example 17 0.4 〇32 98 &lt;1 〇97 Example 18 0.4 〇27 98 &lt;1 〇97 Example 19 0.4 〇27 98 &lt;1 〇97 Comparative Example 1 0.4 〇 No image formation 〇97 Comparative Example 2 2.38 〇51 97 &lt;20 〇70 Comparative Example 3 2.38 〇&gt;800 99 &lt;1 X 85 Comparative Example 4 0.4 〇&gt;800 99 &lt;1 X 86 -61 - 201100966 From Table 2, it is clear that the positive photosensitive resin composition of the present invention is sensitive. The cured film having excellent heat resistance, adhesion, transmittance, and the like can be obtained by being excellent in storage, stability, and storage stability. [Simple description of the schema] Sister 〇 [Main component symbol description] 蛀.

-62--62-

Claims (1)

201100966 七、申請專利範圍: 1·—種正型感光性樹脂組成物,其特徵係含有:(A)樹脂, 其係含有由下述通式(1)所表示之構成單元及具有能夠與 羧基反應而形成共價鍵的官能基之構成單元,並且係鹼 不溶性或鹼難溶性且解離性基解離時會成爲鹼可溶性; 及(B)藉由照射活性光線會產生酸之化合物,201100966 VII. Patent application scope: 1. A positive photosensitive resin composition characterized by: (A) a resin containing a constituent unit represented by the following general formula (1) and having a carboxyl group a constituent unit of a functional group which forms a covalent bond by reaction, and is alkali-insoluble or alkali-insoluble and dissociable-based dissociates to become alkali-soluble; and (B) a compound which generates an acid by irradiation with active light. 在通式(1), R1係表示氫原子、甲基、鹵素原子或氰基, R2及R3係各自獨立地表示氫原子、直鏈狀或分枝狀烷 基,但是R2及R3同時爲氫原子之情況除外, R4係表示亦可被取代之直鏈狀、分枝狀或環狀烷基、或 芳烷基, R2或R3亦可與R4連結而形成環狀醚。 2.如申請專利範圍第1項之正型感光性樹脂組成物,其中 更含有(C)在分子內具有2個以上的環氧基之化合物(但 是,前述A除外)。 3 .如申請專利範圍第1或2項之正型感光性樹脂組成物’ 其中(B)成分係含有藉由照射波長30〇11111以上的活性光線 -63- 201100966 會產生酸之化合物。 4.如申請專利範圍第1至3項中任一項之正型感光性樹脂 組成物,其中(B)成分係含有由下述通式(2)所表示的磺酸 月弓(oxime sulfonate)基之化合物, 、 〇 ^C*N-0-S-R5 (2) 0 在通式(2), R5係表示亦可被取代之直鏈狀、分枝狀、環狀烷基、或 亦可被取代之芳基。 5 ·如申請專利範圍第4項之正型感光性樹脂組成物,其中 含有通式(2)所表示的磺酸肟基之化合物係下述通式(2-1) 所表示之化合物,In the formula (1), R1 represents a hydrogen atom, a methyl group, a halogen atom or a cyano group, and R2 and R3 each independently represent a hydrogen atom, a linear or branched alkyl group, but R2 and R3 are simultaneously hydrogen. In the case of an atom, R4 represents a linear, branched or cyclic alkyl group or an aralkyl group which may be substituted, and R2 or R3 may be bonded to R4 to form a cyclic ether. 2. The positive photosensitive resin composition according to the first aspect of the invention, which further comprises (C) a compound having two or more epoxy groups in the molecule (except for the above A). 3. A positive photosensitive resin composition as claimed in claim 1 or 2 wherein the component (B) contains a compound which generates an acid by an active light of -63 to 201100966 having a wavelength of 30 〇 11111 or more. 4. The positive photosensitive resin composition according to any one of claims 1 to 3, wherein the component (B) contains an oxime sulfonate represented by the following formula (2). a compound of the formula, 〇^C*N-0-S-R5 (2) 0 in the formula (2), R5 represents a linear, branched, cyclic alkyl group which may also be substituted, or An aryl group that can be substituted. 5. The positive photosensitive resin composition of claim 4, wherein the compound containing a sulfonic acid sulfonium group represented by the formula (2) is a compound represented by the following formula (2-1). 在通式(2-1 ), R 5係與在式(2 )之R5相同。 X係表示直鏈狀或分枝狀烷基、烷氧基或鹵素原子。 m係表示〇〜3的整數。m爲2或3時,複數個X可以相 同亦可以不同。 6.如I申請專利範圍第4項之正型感光性樹脂組成物,其中 含有通式(2)所表示的磺酸肟基之化合物係下述通式(2 _ 2) -64- 201100966 所表示之化合物,In the formula (2-1), the R 5 group is the same as R5 in the formula (2). The X system represents a linear or branched alkyl group, an alkoxy group or a halogen atom. The m system represents an integer of 〇~3. When m is 2 or 3, the plurality of Xs may be the same or different. 6. The positive photosensitive resin composition of claim 4, wherein the compound containing a sulfonic acid sulfonium group represented by the general formula (2) is a compound of the following formula (2 _ 2) -64 - 201100966 a compound expressed, 在通式(2-2), R5係與在式(2)之R5相同, 0 R6係表示鹵素原子、羥基、烷基、烷氧基、氰基或硝基, 1係表示0〜5的整數。1爲2以上時,複數個R6可以相 同亦可以不同。 7_如申請專利範圍第1至6項中任一項之之正型感光性樹 脂組成物,其中能夠與前述羧基反應而形成共價鍵的官 能基係環氧基。 8 ·如申請專利範圍第7項之正型感光性樹脂組成物,其中 具有能夠與前述羧基反應而形成共價鍵的官能基之構成 ^ 單元係來自由下述通式(3)至(5)中任一項所表示的自由 基聚合性單體之構成單元,In the formula (2-2), R5 is the same as R5 in the formula (2), 0 R6 represents a halogen atom, a hydroxyl group, an alkyl group, an alkoxy group, a cyano group or a nitro group, and 1 represents a group of 0 to 5 Integer. When 1 is 2 or more, a plurality of R6s may be the same or different. The positive photosensitive resin composition according to any one of claims 1 to 6, wherein the functional group-based epoxy group capable of reacting with the carboxyl group to form a covalent bond. 8. The positive-type photosensitive resin composition of claim 7, wherein the functional group having a functional group capable of reacting with the carboxyl group to form a covalent bond is derived from the following general formula (3) to (5) a constituent unit of a radical polymerizable monomer represented by any one of -65- 201100966 在通式(3)〜(5), R7係表不氮原子、甲基或鹵素原子, R8〜R15係各自獨立地表示氫原子或烷基, X係表示2價的連結基, η係1〜1 0的整數。 9.如申請專利範圍第1至6項中任一項之正型感光性樹脂 組成物,其中具有能夠與前述羧基反應而形成共價鍵的 0 官能基係氧雜環丁烷基。 1 0 ·如申請專利範圍第9項之正型感光性樹脂組成物,其中 具有能夠與前述羧基反應而形成共價鍵的官能基之構成 單元係來自由下述通式(6)所表示的自由基聚合性單體 之構成單元,-65- 201100966 In the general formulae (3) to (5), R7 represents a nitrogen atom, a methyl group or a halogen atom, and R8 to R15 each independently represent a hydrogen atom or an alkyl group, and X represents a divalent linking group. , η is an integer from 1 to 10 0. The positive photosensitive resin composition according to any one of claims 1 to 6, which has a 0-functional oxetane group which can react with the carboxyl group to form a covalent bond. The positive photosensitive resin composition of claim 9, wherein the constituent unit having a functional group capable of reacting with the carboxyl group to form a covalent bond is derived from the following formula (6) a constituent unit of a radical polymerizable monomer, 式中 R7係表示氫原子、甲基或鹵素原子, R·8〜R12係各自獨立地表示氫原子或烷基, X係表示2價的連結基, η係1〜1 0的整數。 Η·如申請專利範圍第1至10項中任一項之正型感光性樹 脂組成物,其中更含有(D)黏附助劑。 -66- 201100966 12 _—種硬化膜形成方法,其特徵係包含:在基板上塗布如 如申請專利範圍第1至1 1項中任一項之正型感光性樹脂 組成物並乾燥’來形成塗膜之步驟;透過光罩並使用活 性光線來進行曝光之步驟;使用鹼性顯像液進行顯像, 來形成圖案之步驟;及加熱處理所得到的圖案之步驟。 13.如申請專利範圍第12項之硬化膜形成方法,其中在使 用鹼性顯像液進行顯像來形成圖案後,在加熱處理所得 Q 到的圖案的步驟之前,更含有全面曝光之步驟。 1 4 · 一種硬化膜,其係使用如申請專利範圍第1 2或1 3項之 硬化膜形成方法所形成。 \ 15. —種液晶顯示元件,其具有如申請專利範圍第14項之 硬化膜。 16. —種積體電路元件,其具有如申請專利範圍第14項之 硬化膜。 17·—種固態攝影元件,其具有如申請專利範圍第14項之 〇 硬化膜。 18.—種有機EL元件,其具有如申請專利範圍第14項之硬 化膜。 -67- 201100966 四、指定代表圖: (一) 本案指定代表圖為:無。 (二) 本代表圖之元件符號簡單說明: 無。 ❹ 五、本案若有化學式時,請揭示最能顯示發明特徵的化學式: 〇 〇In the formula, R7 represents a hydrogen atom, a methyl group or a halogen atom, and R·8 to R12 each independently represent a hydrogen atom or an alkyl group, X represents a divalent linking group, and η is an integer of 1 to 10; The positive photosensitive resin composition according to any one of claims 1 to 10, which further comprises (D) an adhesion aid. -66-201100966 12 - A method for forming a cured film, comprising: coating a positive photosensitive resin composition as in any one of claims 1 to 11 on a substrate and drying it to form a step of coating a film; a step of exposing through a photomask and using active light; a step of developing an image using an alkaline developing solution; and a step of heat-treating the obtained pattern. 13. The method for forming a cured film according to claim 12, wherein after the pattern is formed by development using an alkaline developing solution, the step of comprehensively exposing is further performed before the step of heat-treating the resulting pattern of Q to . 1 4 A cured film formed by a method of forming a cured film as disclosed in claim 12 or 13. A liquid crystal display element having a cured film as in claim 14 of the patent application. 16. An integrated circuit component having a cured film as in claim 14 of the patent application. 17. A solid-state photographic element having a sturdy film as in claim 14 of the patent application. 18. An organic EL device having a hardened film as in claim 14 of the patent application. -67- 201100966 IV. Designated representative map: (1) The representative representative of the case is: None. (2) A brief description of the component symbols of this representative figure: None. ❹ 5. If there is a chemical formula in this case, please reveal the chemical formula that best shows the characteristics of the invention: 〇 〇
TW099113792A 2009-05-01 2010-04-30 Cured film forming composition for liquid crystal display element and method for forming cured film using the same TWI481963B (en)

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