TW201040226A - Resin composition - Google Patents
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- TW201040226A TW201040226A TW099103013A TW99103013A TW201040226A TW 201040226 A TW201040226 A TW 201040226A TW 099103013 A TW099103013 A TW 099103013A TW 99103013 A TW99103013 A TW 99103013A TW 201040226 A TW201040226 A TW 201040226A
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L79/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
- C08L79/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
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- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
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- C08K3/34—Silicon-containing compounds
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- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
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Abstract
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201040226 六、發明說明 . 【發明所屬之技術領域】 本發明係關於適於多層印刷配線板等絕緣層形成之樹 脂組成物。 【先前技術】 近年、伴隨電子機器小型化、高性能化,多層印刷配 八 線板爲了提升電子零件之實裝密度而追求導體配線之微細 Ο 化。作爲多層印刷配線板之絕緣層使用之樹脂組成物,例 如已知含有環氧樹脂與作爲其硬化劑的氰酸酯樹脂之樹脂 組成物可形成介電特性優之絕緣層。又,在配線高密度化 之多層印刷配線板’因爲導體層與絕緣層之熱膨脹係數之 差異而變得易有破裂產生等問題,故要求抑制絕緣層之熱 膨脹率爲低。對樹脂組成物添加無機充塡材爲降低熱膨脹 率之常用手段’作爲無機充塡材,尤其在物理強度強、硬 Q 度高、且耐熱水性點優異的二氧化矽一般被廣泛使用。例 如在專利文獻1、2揭示含有環氧樹脂、氰酸酯樹脂、二 氧化矽等之樹脂組成物。 [先行技術文獻] [專利文獻] [專利文獻1]國際公開2003/0 99952號文獻 [專利文獻2]國際公開2008/044766號文獻 【發明內容】 -5- 201040226 [發明所欲解決之課題] 另一方面,本發明者們將含環氧樹脂、氰酸酯樹 二氧化矽之樹脂組成物層合於電路基板,對硬化該樹 成物所形成之絕緣層在高溫高濕下進行環境試驗,發 體層與絕緣層間之剝離強度顯著降低。 本發明以提供適合印刷配線板之絕緣層形成的樹 成物,藉由使用該樹脂組成物製造電路基板,可使導 與絕緣層之密著性維持更安定之樹脂組成物爲目的。 [解決課題之手段] 本發明者們發現在含環氧樹脂及氰酸酯樹脂之樹 成物中搭配滑石時’可安定地維持加速環境試驗後的 層與絕緣層之密著性。另一方面,發現爲了維持充分 性且降低絕緣層之熱膨脹率,滑石的搭配量多,則樹 成物的熔融黏度過高而不適合層合。本發明者們再檢 結果’發現於含環氧樹脂、氰酸酯樹脂、熱可塑性樹 樹脂組成物中’藉由倂用一定比例作爲無機充塡材的 與二氧化矽’而形成與導體層之密著性、低熱膨脹率 合性之均衡性佳的良好絕緣層,遂完成本發明。 亦即,本發明包含以下內容。 1、一種樹脂組成物,其係含有(A )氰酸酯樹脂 環氧樹脂、(C )熱可塑性樹脂、(d )滑石及(E )二氧化 印刷配線板用樹脂組成物,其特徵爲當樹脂組成物中 發分爲100質量%時,(1)成分(D)滑石與成分(E)二氧 脂、 脂組 現導 脂組 體層 脂組 導體 密著 脂組 討之 脂之 滑石 、層 (B) 矽之 不揮 化矽 201040226 之含量合計爲35質量%〜60質量%且(2)成分(d)滑石之含 量爲5質量%〜2 0質量%。 2、 一種樹脂組成物,其係含有(A)氰酸酯樹脂、(B) 環氧樹脂、(C)熱可塑性樹脂、(D)滑石及(E)二氧化矽之 印刷配線板用樹脂組成物,其特徵爲當樹脂組成物中不揮 發分爲100質量%時’(1)成分(D)滑石與成分(E)二氧化石夕 之含量合計爲45質量%〜60質量%,且(2)成分(D)滑石之 含量爲5質量%〜2 0質量%。 3、 如1或2之樹脂組成物’其中,成分(〇)滑石的平 均粒徑爲1 .3μπι以下。 4、 如1或2之樹脂組成物,其中,成分(c)熱可塑性 樹脂爲由苯氧樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、 聚醚醯亞胺樹脂、聚颯樹脂、聚醚楓樹脂、聚苯醚樹脂、 聚碳酸酯樹脂、聚醚醚酮樹脂、聚酯樹脂' 聚縮醛樹脂、 聚縮丁醛樹脂所選出的1種以上之樹脂。 5、 如1或2之樹脂組成物,其中,成分(C)熱可塑性 樹脂爲苯氧樹脂。 6、 如1〜3中任1項之樹脂組成物,其中,成分(d) 滑石及成分(Ε)二氧化矽預先經表面處理。 7、 如1〜6中任1項之樹脂組成物,其中,熱膨脹率 爲44ppm以下,且環境試驗前後的密著維持率爲40%以 上。 8、 如1〜7中任1項之樹脂組成物,其爲多層印刷配 線板之層間絕緣用。 201040226 9、 一種接著薄膜,其特徵係1〜8中任1項之樹脂組 成物在支持薄膜上層形成而成。 10、 一種預浸漬體,其特徵係1〜8中任1項之樹脂 組成物係在由纖維構成的薄片狀補強基材中含浸而成。 1 1 ' 一種印刷配線板,其特徵係具備含有1〜8中任 1項之樹脂組成物的硬化物之絕緣層與於該絕緣層上形成 之導體層。 [發明效果] 根據本發明,提供適用於多層印刷配線板等電路基板 之絕緣層形成的樹脂組成物,且層合性優、在硬化後形成 絕緣層時即使高溫高濕下環境試驗後,導體層與絕緣層之 密著性爲足夠,低熱膨脹率性亦優異的樹脂組成物。 [實施發明之最佳形態] 以下、將本發明之較佳實施形態詳細說明。 [滑石、二氧化矽] 本發明中所使用之滑石並未特別限定,可使用各種滑 石’亦可使用燒成滑石。滑石的平均粒徑上限値由微細配 線化、絕緣信賴性觀點,以5 μ m爲佳,4 μ m更佳,3 μ m 又更佳,2·5μιη再更佳,1.8μηι尤其佳,1·3μιη特別佳。 另外滑石的平均粒徑的下限値由防止樹脂之黏度過高、而 樹脂變得不易包埋於微細配線間之觀點,以0.1 μηι爲佳, -8- 201040226 0.2μιη更佳,0.3μπι又更佳,0.4μηι再更佳,〇·5μιη特別 佳。 市售滑石,如日本滑石(股)製 D-600(平均粒徑 0.6μηι)、D-800(平均粒徑 0·8μιη)、D-1000(平均粒徑 Ι.Ομηι)、SG-95S(平均粒徑 1 . 2 μ m)、S G - 9 5 (平均粒徑 2.5μιη)、P-8(平均粒徑 3.3 μιη)、P - 6 (平均粒徑 4.0μηι)' Ρ-4(平均粒徑4·5μιη)、Ρ-3(平均粒徑5.0μιη)、Ρ-2(平均粒徑 7·0μιη)、L-1(平均粒徑 5·0μιη)、Κ-1(平均粒徑 8.0μπΐ)、ί- Ο G(平均粒徑5·0μπ〇等。上述滑石的平均粒徑可根據Mie 散射理論而以雷射繞射·散射法測定。具體上可以雷射繞 射式粒度分布測定裝置將無機充塡材之粒度分布以體積基 準製作,且以其中値粒徑爲平均粒徑來測定。測定樣本較 佳可使用令滑石以超音波分散於水中者。雷射繞射式粒度 分布測定裝置可使用股份公司堀場製作所製LA-5 00等。 滑石的搭配量雖未特別限制,但滑石的搭配量上限 q 値,當樹脂組成物中不揮發分爲1 00質量%時,由防止對 電路基板層合性惡化觀點以20質量%爲佳,1 9質量%更 佳,18質量%又更佳,17質量%再更佳,16質量%尤其 佳,1 5質量%特別佳。另一方面,滑石的搭配量下限値, 當樹脂組成物中不揮發分爲100質量%時,由防止環境試 驗後的導體層與絕緣層之密著強度降低觀點以5質量%爲 佳,6質量%更佳’ 7質量%又更佳,8質量。/。再更佳,9 質量%尤其佳,1 0質量%特別佳。 滑石與二氧化矽之合計搭配量雖未特別限制,滑石與 -9 - 201040226 二氧化矽之合計搭配量的上限値,當樹脂組成物中不揮發 分爲100質量%時,由防止對電路基板之層合性惡化觀點 以7 0質量%爲佳,6 5質量%更佳,6 2質量%又更佳,6 0 質量%再更佳,5 8質量%尤其佳,5 6質量%特別佳。另一 方面,滑石與二氧化矽之合計搭配量的下限値,當樹脂組 成物中不揮發分爲1 〇〇質量%時,由降低絕緣層之熱膨脹 率觀點以35重量%爲佳,40質量%更佳,42質量%又更 佳,4 5質量%再更佳,4 7質量%尤其佳,4 9質量%特別 佳。 本發明樹脂組成物所搭配之二氧化矽未特別限制,使 用無定形二氧化砂、熔融二氧化砍、結晶二氧化砂、合成 二氧化矽等各種二氧化矽,尤以使用球狀熔融二氧化矽爲 佳。一現化砂平均粒徑雖未特別限制,由微細配線形成觀 點,以平均粒徑5μιη以下爲佳,尤以〇·1μιη〜1.〇μιη爲 佳。平均粒徑過小,則樹脂之黏度過高、樹脂變得不易流 入微細配線間’超過5.0 μπι,則有微細配線間、導體層間 之絕緣信賴性降低傾向。 本發明所使用之滑石及二氧化矽以經表面處理劑表面 處理而δε升其耐濕性或分散性者爲佳。表面處理劑可舉例 如胺基矽烷系偶合劑、環氧砂院系偶合劑、疏基砍院系偶 合劑、矽烷系偶合劑、有機矽氮烷化合物、鈦酸酯系偶合 劑等。胺基矽烷系偶合劑以胺基丙基三甲氧基矽烷、胺基 丙基二乙氧基矽烷、脲基丙基三乙氧基矽烷、N —苯基胺基 丙基三甲氧基矽烷、Ν-2-(胺基乙基)胺基丙基三甲氧基矽 -10- 201040226 烷爲佳。環氧矽烷系偶合劑以環氧丙氧基丙基三甲氧基砂 烷、環氧丙氧基丙基三乙氧基矽烷、環氧丙氧基丙基甲基 二乙氧基矽烷、環氧丙基丁基三甲氧基矽烷、(3,4-環氧環 己基)乙基三甲氧基矽烷爲佳。巯基矽烷系偶合劑以疏基 丙基三甲氧基矽烷、巯基丙基三乙氧基矽烷爲佳。矽烷系 偶合劑以甲基三甲氧基矽烷、十八基三甲氧基矽烷、苯基 三甲氧基矽烷、甲基丙烯醯氧基丙基三甲氧基矽烷、咪唑 ^ 矽烷、三嗪矽烷爲佳。有機矽氮烷化合物以六甲基二矽氮 〇 烷、六苯基二矽氮烷、三矽氮烷、環三矽氮烷、 1,1,3,3,5,5 -六甲基環三矽氮烷爲佳。鈦酸酯系偶合劑以丁 基鈦酸酯雙體、鈦辛二醇酯、二異丙氧基鈦雙(三乙醇 胺)、二羥基鈦雙乳酸鹽、二羥基雙(銨乳酸鹽)鈦、雙(二 辛基焦磷酸鹽)乙烯鈦酸酯、雙(二辛基焦磷酸鹽)氧基乙 酸酯鈦酸酯、三-η-丁氧基鈦單硬脂酸酯、四·η_丁基欽酸 酯、四(2-乙基己基)鈦酸酯、四異丙基雙(二辛基膦)鈦酸 Q 酯、四辛基雙(二(十三基)膦)鈦酸酯、四(2,2-二烯丙基氧 基甲基-1-丁基)雙(二(十三基))膦鈦酸酯、異丙基三辛醯 基鈦酸酯、異丙基三異丙苯基苯基鈦酸酯、異丙基三異硬 脂醯基鈦酸酯、異丙基異硬脂醯基二丙烯基鈦酸酯、異丙 基二甲基丙燦酸異硬脂酿基駄酸酯、異丙基三(二辛基碟 酸鹽)鈦酸酯、異丙基三(十二烷基)苯磺醯基鈦酸醋、異 丙基三(二辛基焦磷酸鹽)鈦酸酯、異丙基三(Ν_醯胺乙基. 胺基乙基)鈦酸酯爲佳。 -11 - 201040226 [氰酸酯樹脂] 本發明中所使用之氰酸酯樹脂並不特別限制,例如酚 醛清漆型(酚系酚醛清漆型、烷基酚系酚醛清漆型等)氰酸 酯樹脂、雙酚型(雙酚A型、雙酚F型、雙酚S型等)氰酸 酯樹脂及此等一部份經三嗪化的預聚物等。此等可單獨使 用或2種以上組合使用。氰酸酯樹脂之重量平均分子量雖 未特別限制,較佳爲500〜4,500,更佳爲600〜3,000。 氰酸酯樹脂之具體例,例如雙酚A二氰酸酯、聚苯 酚氰酸酯(寡(3-亞甲基-1,5-亞苯基氰酸酯)、4,4’-亞甲基 雙(2,6-二甲基苯基氰酸酯)、4,4’-亞乙基二苯基二氰酸 酯、六氟雙酚A二氰酸酯、2,2-雙(4_氰酸酯)苯基丙烷、 1,卜雙(4_氰酸酯苯基)甲烷、雙(4_氰酸酯-3,5-二甲基苯基) 甲烷、1,3-雙(4_氰酸酯苯基-1-(甲基亞乙基))苯、雙(4-氰 酸酯苯基)硫醚、雙(4-氰酸酯苯基)醚等2官能氰酸酯樹 脂;由含酚系酚醛清漆、甲酚酚醛清漆、二環戊二烯構造 之苯酚樹脂等所衍生的多官能氰酸酯樹脂;此等氰酸酯樹 脂一部份經三嗪化之預聚物等。 市售氰酸酯樹脂,如下式(2)所表示之酚系酚醛清漆 型多官能氰酸酯樹脂(Lonza Japan(股)製、PT30、氰酸酯 當量124)、下式(3)所表示之雙酚A二氰酸酯一部份或全 部經三曉化成爲二量體的預聚物(Lonza Japan(股)製、 BA230、氰酸酯當量232)、含二環戊二烯構造之氰酸酯樹 脂(Lonza Japan(股)製、DT-4000)等。 -12- 201040226[Technical Field] The present invention relates to a resin composition suitable for formation of an insulating layer such as a multilayer printed wiring board. [Prior Art] In recent years, with the miniaturization and high performance of electronic equipment, multi-layer printing and eight-wire boards have pursued the miniaturization of conductor wiring in order to increase the mounting density of electronic components. As the resin composition used for the insulating layer of the multilayer printed wiring board, for example, a resin composition containing an epoxy resin and a cyanate resin as a curing agent thereof is known to form an insulating layer excellent in dielectric properties. In addition, since the multilayer printed wiring board having a high density of wiring has a problem that cracking easily occurs due to the difference in thermal expansion coefficient between the conductor layer and the insulating layer, it is required to suppress the thermal expansion coefficient of the insulating layer to be low. The addition of an inorganic filler to a resin composition is a common means for lowering the coefficient of thermal expansion. As an inorganic filler, in particular, cerium oxide having high physical strength, high hardness, and excellent hot water resistance is generally used. For example, Patent Documents 1 and 2 disclose a resin composition containing an epoxy resin, a cyanate resin, or ruthenium dioxide. [Provisional Technical Documents] [Patent Document 1] [Patent Document 1] International Publication No. 2003/0 99952 [Patent Document 2] International Publication No. 2008/044766 [Invention Summary] -5-201040226 [Problems to be Solved by the Invention] On the other hand, the present inventors laminate a resin composition containing an epoxy resin and a cyanate ester ceria on a circuit board, and perform an environmental test on the insulating layer formed by hardening the tree under high temperature and high humidity. The peel strength between the hair layer and the insulating layer is remarkably lowered. According to the present invention, in order to provide a resin composition suitable for the formation of an insulating layer of a printed wiring board, it is possible to produce a circuit substrate by using the resin composition, and it is possible to maintain a resin composition in which the adhesion between the insulating layer and the insulating layer is maintained. [Means for Solving the Problems] The present inventors have found that when talc is blended in a resin containing an epoxy resin and a cyanate resin, the adhesion between the layer and the insulating layer after the accelerated environmental test can be stably maintained. On the other hand, it has been found that in order to maintain the sufficiency and reduce the thermal expansion coefficient of the insulating layer, the amount of talc is too large, and the melt viscosity of the structure is too high to be suitable for lamination. The inventors have found that the result of the re-inspection is found in a composition containing an epoxy resin, a cyanate resin, and a thermoplastic resin resin, and a conductor layer is formed by using a certain proportion of the inorganic filler material and the cerium oxide. The present invention has been completed by a good insulating layer having a good balance of adhesion and low thermal expansion coefficient. That is, the present invention includes the following. A resin composition comprising (A) a cyanate resin epoxy resin, (C) a thermoplastic resin, (d) talc, and (E) a resin composition for a printed wiring board, characterized in that When the resin composition has a hair content of 100% by mass, (1) component (D) talc and component (E) dioxane, lipid group, lipid group, body layer, lipid group conductor, dense grease, talc, layer (B) The total content of the product of 201040226 is 35 mass% to 60 mass%, and the content of the component (d) talc is 5 mass% to 20 mass%. 2. A resin composition comprising a resin comprising (A) a cyanate resin, (B) an epoxy resin, (C) a thermoplastic resin, (D) talc, and (E) cerium oxide. And the content of the (1) component (D) talc and the component (E) silica dioxide in the total amount of the resin composition is 45% by mass to 60% by mass, and 2) The content of the component (D) talc is 5% by mass to 20% by mass. 3. The resin composition of 1 or 2 wherein the average particle diameter of the component (〇) talc is 1. 3 μm or less. 4. A resin composition according to 1 or 2, wherein the component (c) thermoplastic resin is a phenoxy resin, a polyamidene resin, a polyamidimide resin, a polyether phthalimide resin, a polyfluorene resin. One or more resins selected from polyether maple resin, polyphenylene ether resin, polycarbonate resin, polyether ether ketone resin, polyester resin 'polyacetal resin, and polybutyral resin. 5. A resin composition according to 1 or 2, wherein the component (C) thermoplastic resin is a phenoxy resin. 6. The resin composition according to any one of items 1 to 3, wherein the component (d) talc and the component (cerium) cerium oxide are previously subjected to surface treatment. 7. The resin composition according to any one of items 1 to 6, wherein the coefficient of thermal expansion is 44 ppm or less, and the adhesion retention ratio before and after the environmental test is 40% or more. 8. The resin composition according to any one of items 1 to 7, which is for interlayer insulation of a multilayer printed wiring board. 201040226 9. An adhesive film comprising a resin composition of any one of the features 1 to 8 formed on the upper layer of the support film. A prepreg characterized in that the resin composition of any one of the features 1 to 8 is impregnated with a flaky reinforcing substrate made of fibers. 1 1 ' A printed wiring board characterized by comprising an insulating layer containing a cured product of a resin composition of any one of 1 to 8 and a conductor layer formed on the insulating layer. [Effect of the Invention] According to the present invention, there is provided a resin composition suitable for forming an insulating layer of a circuit board such as a multilayer printed wiring board, and having excellent lamination property, and forming an insulating layer after hardening, even after an environment test under high temperature and high humidity, the conductor A resin composition in which the adhesion between the layer and the insulating layer is sufficient and the thermal expansion coefficient is also excellent. BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, preferred embodiments of the present invention will be described in detail. [Talc, cerium oxide] The talc used in the present invention is not particularly limited, and various talc can be used, and calcined talc can also be used. The upper limit of the average particle size of talc is preferably 5 μ m from the viewpoint of fine wiring and insulation reliability, 4 μ m is better, 3 μ m is better, 2·5 μm is better, and 1.8 μm is particularly good, 1 · 3μιη is especially good. Further, the lower limit of the average particle diameter of the talc is preferably 0.1 μηι, -8-201040226 0.2 μιη, and 0.3 μπι, from the viewpoint of preventing the viscosity of the resin from being too high and the resin becoming difficult to be embedded in the fine wiring. Good, 0.4μηι is better, 〇·5μιη is especially good. Commercially available talc, such as Japanese talc (stock) D-600 (average particle size 0.6μηι), D-800 (average particle size 0·8μιη), D-1000 (average particle size Ι.Ομηι), SG-95S ( Average particle size 1.2 μm), SG - 9 5 (average particle size 2.5 μιη), P-8 (average particle size 3.3 μιη), P-6 (average particle size 4.0 μηι)' Ρ-4 (average particle size) 44·5μιη), Ρ-3 (average particle size 5.0μιη), Ρ-2 (average particle size 7.5μηη), L-1 (average particle size 5·0μιη), Κ-1 (average particle size 8.0μπΐ) ), ί- Ο G (average particle size 5·0μπ〇, etc. The average particle diameter of the above talc can be measured by the laser diffraction/scattering method according to the Mie scattering theory. Specifically, the laser diffraction type particle size distribution measuring device can be used. The particle size distribution of the inorganic filling material is determined on a volume basis, and the cerium particle diameter is determined as the average particle diameter. The measurement sample is preferably used in which the talc is dispersed in the ultrasonic wave by ultrasonic wave. The device can be used by LA-5 00, etc., which is manufactured by the company's market. The amount of talc is not particularly limited, but the upper limit of the talc is q 値, when the resin composition is not volatile, it is divided into 1 00. When the amount is %, it is preferable to prevent 20% by mass from being deteriorated in the lamination property of the circuit board, more preferably 19% by mass, more preferably 18% by mass, still more preferably 17% by mass, and particularly preferably 16% by mass, 15 On the other hand, the lower limit of the talc is 値, and when the non-volatile content of the resin composition is 100% by mass, the adhesion strength between the conductor layer and the insulating layer after the environmental test is prevented is reduced by 5 mass. % is better, 6 mass% is better' 7 mass% and better, 8 mass. /. even better, 9 mass% is especially good, and 10 mass% is particularly good. The total amount of talc and cerium oxide is not The upper limit of the total amount of talc and -9 - 201040226 cerium oxide is arbitrarily limited. When the non-volatile content of the resin composition is 100% by mass, 70% by mass is prevented from being deteriorated in the lamination property of the circuit board. Preferably, 65 mass% is better, 62 mass% is better, 60 mass% is better, 58 mass% is particularly good, and 56 mass% is particularly good. On the other hand, talc and cerium oxide The lower limit of the total amount of collocation, when the resin composition is not volatile, 1 When the mass % is 5%, the thermal expansion coefficient of the insulating layer is preferably 35 wt%, more preferably 40 mass%, more preferably 42 mass%, more preferably 45 mass%, and particularly preferably 47 mass%, 4 9 The cerium oxide to which the resin composition of the present invention is blended is not particularly limited, and various cerium oxides such as amorphous silica sand, molten oxidized slag, crystalline silica sand, and synthetic cerium oxide are used, particularly Spherical molten cerium oxide is preferred. The average particle size of the conventional sand is not particularly limited, and the average particle diameter is preferably 5 μm or less, particularly preferably 〇·1 μιη to 1. 〇μιη. When the average particle diameter is too small, the viscosity of the resin is too high, and the resin does not easily flow into the fine wiring line. When the thickness exceeds 5.0 μm, the insulation reliability between the fine wiring lines and the conductor layers tends to decrease. The talc and cerium oxide used in the present invention are preferably surface-treated with a surface treatment agent to have a moisture resistance or dispersibility of δ ε. The surface treatment agent may, for example, be an amino decane-based coupling agent, an epoxy sand-system coupling agent, a base-cutting system coupling agent, a decane-based coupling agent, an organic decane compound, or a titanate-based coupling agent. The amino decane coupling agent is aminopropyltrimethoxydecane, aminopropyldiethoxydecane, ureidopropyltriethoxydecane, N-phenylaminopropyltrimethoxydecane, hydrazine 2-(Aminoethyl)aminopropyltrimethoxyphosphonium-10-201040226 alkane is preferred. The epoxy decane coupling agent is glycidoxypropyltrimethoxy sane, glycidoxypropyl triethoxy decane, glycidoxypropyl methyldiethoxy decane, epoxy Preferably, propylbutyltrimethoxydecane or (3,4-epoxycyclohexyl)ethyltrimethoxydecane is preferred. The mercapto decane coupling agent is preferably propyl propyl trimethoxy decane or decyl propyl triethoxy decane. The decane coupling agent is preferably methyltrimethoxydecane, octadecyltrimethoxydecane, phenyltrimethoxydecane, methacryloxypropyltrimethoxydecane, imidazolium or triazinedecane. The organic sulfonium compound is hexamethyldiazepine, hexaphenyldioxane, triazane, cyclotriazane, 1,1,3,3,5,5-hexamethylcyclo Triterpenoid is preferred. The titanate coupling agent is a butyl titanate dimer, a titanium octyl glycol ester, a diisopropoxy titanium bis(triethanolamine), a dihydroxy titanium dilactate, a dihydroxy bis(ammonium lactate) titanium, Bis(dioctyl pyrophosphate) ethylene titanate, bis(dioctylpyrophosphate)oxyacetate titanate, tris-n-butoxytitanium monostearate, tetra·η_ Butyrate, tetrakis(2-ethylhexyl) titanate, tetraisopropylbis(dioctylphosphine)titanate Q ester, tetraoctylbis(di(tridecyl)phosphine) titanate , tetrakis(2,2-diallyloxymethyl-1-butyl)bis(di(tridecyl)phosphine titanate, isopropyl trioctadecyl titanate, isopropyl triisopropyl Phenylphenyl titanate, isopropyl triisostearate titanate, isopropylisostearyl decyldipropenyl titanate, isopropyl dimethyl propyl acrylate isostearyl Phthalate, isopropyl tris(dioctyl discate) titanate, isopropyl tris(dodecyl)benzenesulfonate titanate, isopropyl tris(dioctyl pyrophosphate) Titanate, isopropyl tris(Ν_醯amine ethyl. Aminoethyl) titanate good. -11 - 201040226 [Cyanate ester resin] The cyanate resin used in the present invention is not particularly limited, and is, for example, a novolac type (phenol novolak type, alkylphenol novolak type, etc.) cyanate resin, A bisphenol type (bisphenol A type, bisphenol F type, bisphenol S type, etc.) cyanate resin and a part of the triazine-based prepolymer. These may be used singly or in combination of two or more. The weight average molecular weight of the cyanate resin is not particularly limited, but is preferably 500 to 4,500, more preferably 600 to 3,000. Specific examples of the cyanate resin, such as bisphenol A dicyanate, polyphenol cyanate (oligo(3-methylene-1,5-phenylene cyanate), 4,4'-methylene Bis(2,6-dimethylphenyl cyanate), 4,4'-ethylenediphenyl dicyanate, hexafluorobisphenol A dicyanate, 2,2-bis (4 _Cyanate ester) phenylpropane, 1, bis (4-cyanate phenyl) methane, bis (4-cyanate-3,5-dimethylphenyl) methane, 1,3-double ( 4-functional cyanate esters such as cyanate ester phenyl-1-(methylethylidene) benzene, bis(4-cyanate phenyl) sulfide, bis(4-cyanate phenyl) ether a resin; a polyfunctional cyanate resin derived from a phenolic novolac, a cresol novolac, a phenol resin of a dicyclopentadiene structure, or the like; a part of the cyanate resin pre-polymerized by triazine A commercially available cyanate resin, a phenolic novolak type polyfunctional cyanate resin represented by the following formula (2) (manufactured by Lonza Japan Co., Ltd., PT30, cyanate equivalent 124), and the following formula (3) ) The bisphenol A dicyanate represented by a part or all of the bisphenol A dicyanate is a dimerized prepolymer (Lonza Japan) System, BA230, cyanate equivalent 232), containing cyanate ester resin of dicyclopentadiene structure (Lonza Japan (shares) manufactured, DT-4000) and the like. -12-201040226
Ut !ocn OCNUt !ocn OCN
OCN ⑵ [式中、n爲表示平均値之任意數。]OCN (2) [where n is an arbitrary number representing the mean 値. ]
【化2】[Chemical 2]
樹脂組成物中氰酸酯樹脂之含量雖未特別限制,氰酸 酯樹脂之含量的上限値,由防止導體層與絕緣層之密著強 〇 度降低觀點,相對於樹脂組成物中不揮發分1 〇〇質量%, 以50質量%爲佳,40質量%更佳,30質量%又更佳。另 外,氰酸酯樹脂之含量的下限値,由防止樹脂組成物的耐 熱性降低、防止絕緣層之熱膨脹率增加觀點,相對於樹脂 組成物中不揮發分1 00質量%,以5質量%爲佳,1 0質量 %更佳,15質量%又更佳。 [環氧樹脂] 本發明中所使用之環氧樹脂並不特別限制,例如雙酚 -13- 201040226 A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、 酚系酚醛清漆型環氧樹脂、烷基酚系酚醛清漆型環氧樹 脂、聯苯基型環氧樹脂、芳烷基型環氧樹脂、萘酚型環氧 樹脂、蒽型環氧樹脂、二環戊二烯型環氧樹脂、萘型環氧 樹脂、苯酚類與具有苯酚性羥基之芳香族醛的縮合物的環 氧化物、聯苯基芳烷基型環氧樹脂、芴型環氧樹脂、咕噸 型環氧樹脂、三環氧丙基異氰脲酸酯等。此等環氧樹脂可 各自單獨使用或2種以上組合使用。市售環氧樹脂,例如 Japan Epoxy Resins (股)製「jER828EL」(液狀雙酚 A 型 環氧樹脂)、大日本油墨化學工業(股)製「HP403 2」及 「HP403 2D](萘型2官能環氧樹脂)、大日本油墨化學工業 (股)製「HPOOO」(萘型4官能環氧樹脂)、東都化成(股) 製「ESN-475V」及「ESN-185V」(萘酚型環氧樹脂)、 Daicel化學工業(股)製「PB-3600」(具丁二烯構造之環氧 樹脂)、日本化藥(股)製「NC3 000H」、「NC 3 000L」、 「NC3100」及「NC3 000」(聯苯基型環氧樹脂)、Japan Epoxy Resins (股)製「YX4000」(聯苯基型環氧樹脂)、東 都化成(股)製GK3207(聯苯基型環氧樹脂)、japan Epoxy Resins (股)製「YX8 800」(含有蒽骨架型環氧樹脂)等。 樹脂組成物中環氧樹脂之含量雖未特別限制,相對於 樹脂組成物中不揮發分1 〇〇質量%,較佳爲5〜60質量 %,更佳爲1 0〜5 0質量%,又更佳爲1 5〜4 0質量%。環 氧樹脂之含量過少,則在後述硬化組成物表面之粗化處理 時有變得易產生粗化不均之傾向。環氧樹脂之含量過多, -14- 201040226 相對地氰酸酯樹脂之含量減少,所以有絕緣層之熱膨脹率 增大之傾向。 氰酸酯樹脂之氰酸酯當量與環氧樹脂之環氧當量比, 較佳爲1: 0.4〜1: 2,更佳爲1: 0.5〜1: 1.5。當量比在 上述範圍外,則後述濕式粗化步驟中絕緣層表面之低粗度 化與經鍍敷形成的導體層與絕緣層之密著強度變得難以兩 全。 ❹ [熱可塑性樹脂] 本發明所使用之熱可塑性樹脂,可舉例如苯氧樹脂、 聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚醯亞胺樹脂、聚 楓樹脂、聚醚颯樹脂、聚苯醚樹脂、聚碳酸酯樹脂、聚醚 醚酮樹脂、聚酯樹脂、聚乙烯縮醛樹脂、聚乙烯縮丁醛樹 脂等。此等熱可塑性樹脂可各自單獨使用或2種以上組合 使用。 Q 熱可塑性樹脂,由防止對電路基板之層合性惡化觀點 以苯氧樹脂、聚乙烯縮醛樹脂爲佳。聚乙烯縮醛樹脂尤以 聚乙烯縮丁醛樹脂爲佳。聚乙烯縮醛樹脂之具體例,可舉 例如電氣化學工業(股)製電化縮丁醛4000-2、5000-A、 6000-C及6000-EP、積水化學工業(股)製愛司列克bh系 列、BX系列、KS系列、BL系列及BM系列等。苯氧樹 脂之具體例,可舉例如東都化成(股)製FX2 8 0及FX293、The content of the cyanate resin in the resin composition is not particularly limited, and the upper limit of the content of the cyanate resin is not reduced by the viewpoint of preventing the adhesion strength between the conductor layer and the insulating layer from being lowered. 1% by mass, preferably 50% by mass, more preferably 40% by mass, and even more preferably 30% by mass. In addition, the lower limit of the content of the cyanate resin is 5% by mass, and 5% by mass, based on the non-volatile content of the resin composition, from the viewpoint of preventing the heat resistance of the resin composition from being lowered and preventing the thermal expansion coefficient of the insulating layer from increasing. Good, 10% by mass is better, and 15% by mass is better. [Epoxy Resin] The epoxy resin used in the present invention is not particularly limited, and examples thereof include, for example, bisphenol-13-201040226 type A epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, and phenol system. Novolak type epoxy resin, alkylphenol novolak type epoxy resin, biphenyl type epoxy resin, aralkyl type epoxy resin, naphthol type epoxy resin, fluorene type epoxy resin, dicyclopentylene An epoxide of a diene type epoxy resin, a naphthalene type epoxy resin, a condensate of a phenol and an aromatic aldehyde having a phenolic hydroxyl group, a biphenyl aralkyl type epoxy resin, a fluorene type epoxy resin, or an anthracene Tons of epoxy resin, triepoxypropyl isocyanurate, and the like. These epoxy resins may be used singly or in combination of two or more kinds. Commercially available epoxy resin, such as "JER828EL" (liquid bisphenol A type epoxy resin) manufactured by Japan Epoxy Resins Co., Ltd., "HP403 2" and "HP403 2D" manufactured by Dainippon Ink Chemical Industry Co., Ltd. "Epoxy resin", "HPOOO" (naphthalene type 4-functional epoxy resin) manufactured by Dainippon Ink Chemicals Co., Ltd., "Essence of ESN", "ESN-475V" and "ESN-185V" (naphthol type) "Epoxy resin", "PB-3600" (epoxy resin with butadiene structure) made by Daicel Chemical Industry Co., Ltd., "NC3 000H", "NC 3 000L", "NC3100" made by Nippon Kayaku Co., Ltd. And "NC3 000" (biphenyl type epoxy resin), "YX4000" (biphenyl type epoxy resin) manufactured by Japan Epoxy Resins Co., Ltd., GK3207 (biphenyl type epoxy resin) manufactured by Toho Chemical Co., Ltd. ), "YX8 800" (including enamel skeleton epoxy resin) made by japan Epoxy Resins. The content of the epoxy resin in the resin composition is not particularly limited, and is not more than 1% by mass, preferably 5 to 60% by mass, more preferably 10 to 50% by mass, based on the resin composition. More preferably 1 5 to 40% by mass. When the content of the epoxy resin is too small, the roughening treatment on the surface of the hardened composition described later tends to cause coarsening unevenness. If the content of the epoxy resin is too large, the content of the cyanate resin is decreased as compared with -14-201040226, so that the thermal expansion coefficient of the insulating layer tends to increase. The epoxy equivalent ratio of the cyanate ester equivalent of the cyanate resin to the epoxy resin is preferably 1:0.4 to 1:2, more preferably 1:0.5 to 1:1.5. When the equivalent ratio is outside the above range, the lower thickness of the surface of the insulating layer and the adhesion strength between the conductor layer and the insulating layer formed by plating in the wet roughening step will be difficult to achieve. ❹ [Thermoplastic resin] The thermoplastic resin used in the present invention may, for example, be a phenoxy resin, a polyimine resin, a polyamidimide resin, a polyether quinone resin, a poly maple resin or a polyether oxime. Resin, polyphenylene ether resin, polycarbonate resin, polyether ether ketone resin, polyester resin, polyvinyl acetal resin, polyvinyl butyral resin, and the like. These thermoplastic resins may be used singly or in combination of two or more kinds. Q The thermoplastic resin is preferably a phenoxy resin or a polyvinyl acetal resin from the viewpoint of preventing deterioration of the laminate property of the circuit board. The polyvinyl acetal resin is preferably a polyvinyl butyral resin. Specific examples of the polyvinyl acetal resin include, for example, electro-chemical industrial (s) electroformation butyral 4000-2, 5000-A, 6000-C, and 6000-EP, and Sekisui Chemical Industry Co., Ltd. Bh series, BX series, KS series, BL series and BM series. Specific examples of the phenoxy resin include FX2 80 and FX293 manufactured by Toho Chemical Co., Ltd.
Japan Epoxy Resins (股)製 YX8100、YX6954、YL6974、 YL7482 ' YL7553、YL6794、YL7213 及 YL7290 等。聚乙 -15- 201040226 烯縮醛樹脂以玻璃轉移溫度爲80t以上者特別佳。在此 「玻璃轉移溫度」係依據JIS K 7197之方法而決定。 又,玻璃轉移溫度比分解溫度高,實際無法觀測到玻璃轉 移溫度時,可將分解溫度作爲本發明之玻璃轉移溫度。 又,分解溫度係依據:Π S K 7 1 2 0之方法測定時的質量減 少率爲5 %的溫度來定義。 熱可塑性樹脂之重量平均分子量以5,000〜200,000 範圍爲佳,10,000〜150,000之範圍更佳,在 15,000〜 1 00,000之範圍又更佳,20,000〜80,000之範圍又再更 佳。較此範圍小,則薄膜成型能或機械強度提升的效果有 無法充分發揮的傾向,較該範圍大,則與氰酸酯樹脂及環 氧樹脂之相溶性降低,絕緣層表面之粗化處理後的粗度有 增大傾向。 又本發明之重量平均分子量可以膠體滲透層析法 (GPC)法(聚苯乙烯換算)測定。GPC法之重量平均分子 量’具體上作爲測定裝置使用(股)島津製作所製 LC-9A/RID-6A,而作爲管柱,使用昭和電工(股)製Shodex K-8GGP/K-804L/K-804L,作爲移動相使用氯仿等,在管柱溫 度40 °C進行測定並使用標準聚苯乙烯檢量線算出。 樹脂組成物中熱可塑性樹脂之含量雖未特別限制,相 對於樹脂組成物中不揮發分1 00質量%,較佳爲1〜20質 星% ’更佳爲2〜1 5質量%,又更佳爲3〜1 〇質量%。熱 可塑性樹脂之含量過少,則有薄膜成型能或機械強度提升 的效果無法發揮之傾向,且有環境試驗後的密著維持效果 -16- 201040226 無法發揮的傾向,過多則,後述濕式粗化步驟後的絕緣層 表面之粗度有增大傾向。 本發明的樹脂組成物包含(A)成分、(B)成分、(C)成 分、(D )成分及(E)成分,且層合性優’可提供在硬化後形 成絕緣層時,即使在高溫高濕下之環境試驗後,導體層與 絕緣層之密著性爲足夠,低熱膨脹率性亦優異樹脂組成 物。 q 本發明的樹脂組成物的硬化物的熱膨脹率可藉由後述 <熱膨脹率 CTE(coefficient of thermal expansion)之測定 及評估 > 之測定方法來把握。 本發明的樹脂組成物的硬化物的熱膨脹率以44ppm 以下爲佳,42ppm以下更佳,40ppm以下又更佳,38ppm 以下再更佳,36ppm以下尤其佳,34ppm以下特別佳。 又,該熱膨脹率的下限値亦儘可能愈低愈好,而以30ppm 爲佳,25ppm更佳,20ppm又更佳,lOppm再更佳,4ppm Q 特別佳。 由本發明的樹脂組成物所形成的絕緣層與導體層之環 境試驗前後的密著維持率可以後述 <導體層之密著強度(剝 離強度)的測定及評估 > 之測定方法來把握。 本發明的樹脂組成物所形成的絕緣層與導體層的環境 試驗前後的密著維持率以40%以上爲佳,45 %以上更佳, 5 0 %以上又更佳,5 5 %以上再更佳,6 0 %以上尤其佳,6 5 % 以上特別佳,70%以上非常佳。又,該密著維持率的上限 値愈高愈好,以8 0 %爲佳,8 2 %更佳,8 4 %又更佳,8 6 % -17- 201040226 再更佳,90%尤其佳,100%特別佳。 [有機金屬化合物] 本發明的樹脂組成物中,由硬化促進觀點可更添加有 機金屬化合物。有機金屬化合物’可舉例如銅(11)乙醯丙 酮等有機銅化合物;鋅(Π)乙醯丙酮、萘酸鋅U1)等有機鋅 化合物;鈷(II)乙醯丙酮、鈷(III)乙醯丙酮等有機鈷化合 物;鎳(Π)乙醢丙酮等有機鎳化合物;鐵(111)乙醯丙酮等 有機鐵化合物等。有機金屬化合物的添加量’相對於樹脂 組成物中不揮發分1 0 0質量%,有機金屬化合物的金屬含 量爲 25〜500ppm、更佳以 40〜200ppm之範圍者爲佳。 未達2 5 p p m則低粗度且變得難以形成尚剝離強度的導體 層,超過500ppm,則有樹脂組成物的保存安定性、絕緣 性產生問題之傾向。 [橡膠粒子] 本發明的樹脂組成物由密著性提升的觀點可再加入橡 膠粒子。本發明中可使用之橡膠粒子爲例如亦不溶於調製 該樹脂組成物的清漆時使用的有機溶劑,而亦不與必須成 分之氰酸酯樹脂或環氧樹脂等相溶者。因此,該橡膠粒子 在本發明的樹脂組成物的清漆中以分散狀態存在。如此的 橡膠粒子一般在橡膠成分分子量不溶於有機溶劑或樹脂之 程度,使其爲大且爲粒子狀來調製。 本發明可使用之橡膠粒子的較佳例如核殻型橡膠粒 -18 - 201040226 子、交聯丙烯腈丁二烯橡膠粒子、交聯苯乙烯丁二烯橡膠 粒子、丙烯基橡膠粒子等。 核殼型橡膠粒子爲具有核層與殻層之橡膠粒子,例如 外層之殼層以玻璃狀聚合物所構成、且內層之核層以橡膠 狀聚合物所構成之2層構造、或外層之殼層以玻璃狀聚合 物所構成、中間層以橡膠狀聚合物所構成、核層以玻璃狀 聚合物所構成之3層構造者等。玻璃狀聚合物層,例如甲 基丙烯酸酸甲基之聚合物等所構成、橡膠狀聚合物層由例 如丁基丙烯酸酯聚合物(丁基橡膠)等所構成。核殼型橡膠 粒子之具體例,可舉例如 StaphyloidAC3 832 、 AC3816N(商品名、Ganz 化成(股)製)、Metablen KW-4426(商品名、Mitsubishi Rayon (股)製)。 交聯丙烯腈丁二烯橡膠(NBR)粒子之具體例,可舉例 如XER-91(平均粒徑0.5μηι、JSR(股)製)等。 交聯苯乙烯丁二烯橡膠(SBR)粒子之具體例,可舉例 如XSK-500(平均粒徑0.5μιη、JSR(股)製)等。 丙烯基橡膠粒子之具體例,可舉例如 Metablen W300A(平均粒徑 Ο.ίμιη)、W450A(平均粒徑 0.2μιη) (Mitsubishi Rayon (股)製)等。 搭配之橡膠粒子平均粒徑,較佳爲0.005〜Ιμιη之範 圍,更佳爲0.2〜0.6μηι範圍。本發明所使用之橡膠粒子 平均粒徑可使用動的光散射法測定。例如於適當有機溶劑 中將橡膠粒子以超音波等均一分散、使用濃厚系粒徑分析 儀(FPAR- 1 00 0 ;大塚電子(股)製),將橡膠粒子粒度分布 -19- 201040226 以質量基準製作,可將其中値粒徑作爲平均粒徑來 '測定° 橡膠粒子含量,相對於樹脂組成物中不揮發分100質 量%,較佳爲1〜1 〇質量% ’更佳爲2〜5質量%。 [難燃劑] 本發明的樹脂組成物可在不損及本發明的效果範圍內 含有難燃劑。難燃劑可舉例如有機磷系難燃劑、有機系含 氮磷化合物、氮化合物、矽酮系難燃劑、金屬氫氧化物 等。 有機磷系難燃劑,可舉例如三光(股)製之 HC A、 HCA-HQ、HCA-NQ等膦化合物、昭和高分子(股)製之 HFB-2006M等含碟苯並H惡嗪化合物' Aj inomoto Fine-Techno(股)製之李傲佛司 30、50、65、90' 110、TPP、 RPD、BAPP、CPD、TCP、TXP、TBP、TOP、KP140 及 TIBP、北興化學工業(股)製之 PPQ、Clariant(股)製之 OP93 0、大八化學(股)製之PX200等磷酸酯化合物、東都 化成(股)製之FX2S9、FX3 10等含磷環氧樹脂、東都化成 (股)製之ERF 001等含磷苯氧樹脂等。 有機系含氮磷化合物,可舉例如四國化成工業(股)製 之SP67〇、SP703等磷酸酯醯胺化合物、大塚化學(股)製 之SPB100及SPE100、(股)伏見製作所製FP-series等磷 氮化合物等。 金屬氫氧化物,如 Ube Material (股)製之 UD65、 UD650、UD653等氫氧化鎂、巴工業(股)製之B-30、B- -20- 201040226 325、B-315、B-308、B-303 及 UFH-20 等氫氧化鋁等。 [其他成分] 本發明的樹脂組成物,在不損害本發明的效果範圍 下’因應必要可搭配其他成分。其他成分,例如矽粉末、 尼龍粉末、氟粉末等有機充塡劑:歐魯班、番通等增黏 劑’矽酮系、氟系、高分子系之消泡劑或塗平劑;咪唑 0 系、噻唑系、三唑系、矽烷系偶合劑等密著性賦予劑;咪 唑系、胺系等硬化促進劑;鈦菁素·藍、鈦菁素.綠、碘. 綠、雙偶氮黃、碳黑等著色劑等。 本發明的樹脂組成物的調製方法並不特別限制,例如 可將必須成分之氰酸醋樹脂、環氧樹脂、熱可塑性樹脂、 滑石、二氧化矽、因應必要之硬化促進劑、硬化觸媒、橡 膠粒子或其他成分以旋轉混合機等混合之方法等。 本發明的樹脂組成物的用途雖不特別限定,可使用於 Q 接著薄膜、預浸漬體等絕緣樹脂薄片、電路基板、阻焊 劑、底部塡充材、晶粒黏著材、半導體封閉材、封孔樹 脂、封零件樹脂等需要樹脂組成物用途之廣範圍。其中, 多層印刷配線板之製造中可適用於形成絕緣層。本發明的 樹脂組成物亦可以清漆狀態塗佈在電路基板後、使硬化形 成絕緣層,但工業上一般以接著薄膜、預浸漬體等薄片狀 層合材料形態使用爲佳。樹脂組成物的軟化點由薄片狀層 合材料層合性觀點以40〜150°C爲佳。 -21 - 201040226 [接著薄膜] 本發明的接著薄膜可藉由該業者公知方法、例如調製 於有機溶劑中溶解樹脂組成物之樹脂清漆,並將此樹脂清 漆使用模具塗佈機等塗佈在支持體之支持薄膜,進一步經 加熱、或熱風吹等使有機溶劑乾燥後形成樹脂組成物層而 製造。 該有機溶劑可舉例如丙酮、甲基乙基酮、環己酮等酮 類;乙酸乙酯、乙酸丁酯、溶纖劑乙酸酯、丙二醇單甲基 醚乙酸酯、卡必醇乙酸酯等乙酸酯類;溶纖劑類;丁基卡 必醇等卡必醇類;甲苯、二甲苯等芳香族烴類;二甲基甲 醯胺、二甲基乙醯胺、N-甲基吡咯烷酮等。有機溶劑亦可 2種以上組合使用。 將有機溶劑乾燥除去之條件雖未特別限制,樹脂組成 物層中有機溶劑之含量以乾燥至1 〇質量%以下爲佳,更 佳爲乾燥至5質量%以下。雖因清漆中的有機溶劑量、有 機溶劑之沸點而異,但藉由例如將含30〜60質量%有機 溶劑的清漆在5 0〜1 5 0 °C進行3〜1 0分鐘左右,形成有機 溶劑之含量爲1 〇質量%以下之樹脂組成物層。該業者可 藉由簡單的實驗來設定適宜、較佳乾燥條件。 接著薄膜中所形成之樹脂組成物層之厚度,通常在導 體層之厚度以上。因電路基板所具有的導體層之厚度通常 爲5〜70μηι之範圍者,故樹脂組成物層以具有10〜 ΙΟΟμπα厚度者爲佳。 本發明中支持薄膜可舉例如由聚乙烯、聚丙烯、聚氯 -22- 201040226 化乙烯等聚烯烴;聚乙烯對苯二甲酸酯(以下簡稱 「PET」。)、聚萘二甲酸乙二酯等聚酯;聚碳酸酯;聚醯 亞胺等所成薄膜、進而如脫模紙或銅箔、鋁箔等金屬箔 等。又,支持薄膜及後述保護薄膜除可施加mat處理、電 暈處理外,亦可施加脫模處理。 支持薄膜厚度雖未特別限制,以10〜150μιη爲佳, 25〜50μιη更佳。 於樹脂組成物層之支持薄膜未密著面,可於支持薄膜 再層合保護薄膜。保護薄膜的厚度雖未特別限制,以1〜 4〇μιη爲佳。藉由層合保護薄膜,可防止在樹脂組成物層 之表面附著灰塵等或防止刮傷。接著薄膜亦可捲取爲輥狀 以便收藏。 [使用接著薄膜的多層印刷配線板] 接著,說明使用如上述製造之接著薄膜製造多層印刷 Q 配線板之方法的一例。 首先,將接著薄膜使用真空層合機層合於電路基板之 單面或雙面。電路基板可使用之基板,可舉例如玻璃環氧 基板、金屬基板、聚酯基板、聚醯亞胺基板、ΒΤ樹脂基 板、熱硬化型聚亞苯基醚基板等。又,在此電路基板係指 上述般於基板之單面或雙面形成經圖案加工的導體層(電 路)者。又在導體層與絕緣層交互層合而成的多層印刷配 線板中,該多層印刷配線板之最外層之單面或雙面成爲有 圖案加工的導體層(電路)者亦包含於此電路基板。且於導 -23- 201040226 體層表面亦可藉由黑化處理、銅微蝕等預先施加粗化處 理。 上述層合中,接著薄膜具有保護薄膜時,在除去該保 護薄膜後,因應必要將接著薄膜及電路基板預熱並使接著 薄膜邊進行加壓及加熱邊壓附在電路基板上。本發明的接 著薄膜中,適宜使用在藉由真空層合法於減壓下層合於電 路基板之方法。層合條件雖未特別限制,例如壓著溫度 (層合溫度)較佳爲 70〜140 °C、壓著壓力較佳爲1〜 llkgf/cm2(9.8 X 104 〜1 07.9 X 1 04N/m2),以空氣壓 20mmHg(26.7hPA)以下之減壓下層合者爲佳。又,層合方 法可爲批次式或以輥進行連續式。 真空層合可使用市售真空層合機進行。市售真空層合 機,可舉例如Nichigo-morton(股)製真空貼實機、(股)名 機製作所製真空加壓式層合機、(股)日立INDUSTRIES輥 式乾式塗佈機、日立AIC (股)製真空層合機等。 又,減壓下、進行加熱及加壓的層合步驟可使用一般 真空熱壓機進行。例如可藉由將經加熱之SUS板等金屬 板從支持體層側進行加壓來進行。 加壓條件一般減壓度通常在lxl (T2MPa以下、較佳爲 1 X 1 0_3 ΜP a以下之減壓下。加熱及加壓可以1階段進行’ 但由控制樹脂之滲漏觀點以2階段以上不同條件進行爲 佳。例如以第1階段加壓在溫度70〜1 50°C、壓力1〜 15kgf/cm2之範圍、第2階段之加壓在溫度150〜200°C、 壓力1〜40kgf/em2之範圍進行爲佳。各階段之時間以30 -24 - 201040226 〜120分鐘進行爲佳。市售真空熱壓機,可舉例如MNPC-V-75 0-5-200(股)名機製作所製)、VH 1 - 1 603 (北川精機(股) 製)等。 接著將薄膜層合於電路基板後,冷卻至室溫附近再將 支持薄膜剝離時,藉由剝離、熱硬化可於電路基板上形成 絕緣層。熱硬化之條件因應樹脂組成物中的樹脂成分種 類' 含量等適宜選擇即可,但較佳爲在15 0°C〜22(TC下 20分〜180分、更佳爲在160 °C〜200 °C下30〜120分之範 〇 圍來選擇。 硬化前未剝離支持薄膜之情況,於形成絕緣層後進行 剝離。接著因應必要,在電路基板上形成之絕緣層進行開 孔以形成貫穿孔、通孔。開孔可藉由例如鑽頭、雷射、電 漿等公知方法或必要時藉由組合此等方法來進行,但以二 氧化碳雷射、YAG雷射等雷射來開孔爲最一般的方法。 接著、經乾式鍍敷或濕式鍍敷於絕緣層上形成導體 Q 層。乾式鍍敷,可使用蒸著、濺鍍、離子噴鍍等公知方 法。又,濕式鍍敷時,先將硬化之樹脂組成物層(絕緣層) 的表面進行濕式粗化處理。濕式粗化處理係指以過錳酸鹽 (過錳酸鉀、過錳酸鈉等)、重鉻酸鹽、臭氧、過氧化氫/硫 酸、硝酸等氧化劑粗化處理並形成凸凹之錨點之處理。氧 化劑尤以過錳酸鉀、過錳酸鈉等氫氧化鈉水溶液(鹼性過 錳酸水溶液)爲佳。粗化處理之後以組合無電解鍍敷與電 解鍍敷之方法形成導體層。又,導體層係指形成逆圖案的 鍍敷光阻且亦可僅以無電解鑛敷形成導體層。之後的圖案 -25- 201040226 形成方法,可使用例如該業者公知的減除法、半加成法 等。 如此將製作之導體層表面進行粗化。導體層表面之粗 化具有提高與導體層相接樹脂的密著性效果。粗化導體層 以使用有機酸系微蝕劑CZ-8100、 CZ-8101、 CZ-5480等 爲佳。又,藉由使用本發明的印刷配線板用樹脂組成物, 無關於導體層表面之粗化程度,因較以往樹脂組成物密著 性提升,形成低熱膨脹率、層合性及環境試驗後的與導體 層之密著強度等性能取得平衡性的絕緣層。 [預浸漬體] 本發明的預浸漬體可藉由將本發明的樹脂組成物於纖 維構成的薄片狀補強基材以熱熔法或溶劑法含浸、加熱 後’使半硬化而製造。亦即,本發明的樹脂組成物可成爲 於纖維所成薄片狀補強基材中含浸狀態的預浸漬體。由纖 維構成的薄片狀補強基材,例如可使用玻璃布或聚芳醯胺 纖維等作爲預浸漬體用纖維常用纖維所成者。 熱熔法爲非將樹脂溶於有機溶劑,而是暫時塗佈在與 該樹脂剝離性佳的塗佈紙上。使其於薄片狀補強基材上層 合、或使樹脂非溶於有機溶劑,而是藉由模具塗佈機於薄 片狀補強基材直接塗佈等以製作預浸漬體的方法。且溶劑 法如同接著薄膜般’將樹脂溶於有機溶劑後調製樹脂清 漆’並於i亥清漆中使薄片狀補強基材浸漬,並使樹脂清漆 含浸於薄片狀補強基材,之後乾燥的方法。 -26- 201040226 [使用預浸漬體的多層印刷配線板] 接著,說明使用如上述般製造的預浸漬體後製作多層 印刷配線板之方法例。於電路基板將本發明的預浸漬體1 片或因必要複數片重疊,間隔脫模薄膜以金屬板挾持,在 加壓·加熱條件下進行加壓層合。加壓.加熱條件較佳爲壓 力 5 〜40kgf/cm2(49xl04 〜392 xl04N/m2) ' 溫度爲 120 〜 2 00°C下20〜100分鐘。又亦可與接著薄膜同樣,使預浸 漬體以真空層合法層合於電路基板後、加熱硬化。之後, 與上述記載方法同樣將硬化之預浸漬體表面如上述般粗化 後’使導體層經鍍敷形成以製作多層印刷配線板。 以下,將本發明以實施例具體說明,但本發明不限於 此等實施例。 【實施方式】 [實施例] [實施例1 ] 將雙酣A 一氰酸醋預聚物(L〇nza Japan(股)製 「BA230S75」、氰酸酯當量約232'不揮發分75質量% 之甲基乙基酮(以下、簡稱MEK)溶液)30質量份、酚系酚 酉荃清漆型多吕目t氰酸醋樹脂(L〇nza japan(股)製 「PT30」' 氰酸酯當量約124)10質量份' MEK10質量份 一起攪拌混合,再混合作爲萘酚型環氧樹脂之東都化成 (股)製「ESN_475V」(下述一般式所表示。環氧當量約 -27- 201040226 340之不揮發分65質量%之MEK溶液)40質量份、進而液 狀雙酚 Α型環氧樹脂(Japan Epoxy Resins (股)製 「jER828EL」、環氧當量約185)8質量份、苯氧樹脂溶液 (Japan Epoxy Resins (股)製「YX6954」、重量平均分子 量40000、不揮發分30質量%之MEK與環己酮之混合溶 液)20質量份、鈷(II)乙醯丙酮(Co(AcAc)2、東京化成(股) 製)的1質量%之N,N-二甲基甲醯胺(DMF)溶液4質量 份、滑石(日本滑石(股)製「D-800」以胺基矽烷進行表面 處理者、平均粒徑 〇.8μιη)6質量份、及球形二氧化矽 ((股)Admatechs製「SO-C2」以胺基矽烷作表面處理者、 平均粒徑〇.5μπι)42質量份後,加入MEK20質量份,並以 高速旋轉混合機均一分散後,製作熱硬化性樹脂組成物清 漆。 接著,將該樹脂組成物清漆於聚乙烯對苯二甲酸酯薄 膜(厚度3 8μιη、以下簡稱PET薄膜)上,以乾燥後的樹脂 組成物層之厚度成爲40μηι之方式使用模具塗佈機進行均 一塗佈,以80〜120°C (平均100°C)進行6分鐘乾燥(樹脂 組成物層中的殘留溶劑量:約1 . 5質量%)。接著、於樹脂 組成物層之表面邊貼合厚度15μιη之聚丙烯薄膜邊捲取爲 輥狀。將輥狀接著薄膜切爲寬 507mm,而得到 5 07 X 3 3 6mm尺寸之薄片狀接著薄膜。 -28 - 201040226Japan Epoxy Resins (shares) YX8100, YX6954, YL6974, YL7482 'YL7553, YL6794, YL7213 and YL7290. Polyethylene -15- 201040226 The acetal resin is particularly preferred for glass transition temperatures above 80t. Here, the "glass transition temperature" is determined in accordance with the method of JIS K 7197. Further, when the glass transition temperature is higher than the decomposition temperature and the glass transition temperature is not actually observed, the decomposition temperature can be regarded as the glass transition temperature of the present invention. Further, the decomposition temperature is defined by the temperature at which the mass reduction rate at the time of measurement by Π S K 7 1 2 0 is 5%. The thermoplastic resin preferably has a weight average molecular weight of 5,000 to 200,000, more preferably 10,000 to 150,000, more preferably 15,000 to 1,000,000, and even more preferably 20,000 to 80,000. When the ratio is smaller than this range, the effect of improving the film forming ability or the mechanical strength may not be sufficiently exhibited. When the ratio is larger than this range, the compatibility with the cyanate resin and the epoxy resin is lowered, and the surface of the insulating layer is roughened. The thickness has a tendency to increase. Further, the weight average molecular weight of the present invention can be measured by a colloidal permeation chromatography (GPC) method (in terms of polystyrene). The weight average molecular weight of the GPC method is specifically used as a measuring device (LC-9A/RID-6A manufactured by Shimadzu Corporation), and as a column, Shodex K-8GGP/K-804L/K-made by Showa Denko Co., Ltd. 804L was measured as a mobile phase using chloroform or the like at a column temperature of 40 ° C and using a standard polystyrene calibration curve. The content of the thermoplastic resin in the resin composition is not particularly limited, and is not more than 100% by mass, preferably 1 to 20% by mass, more preferably 2 to 15% by mass, and more preferably the resin composition. Good for 3~1 〇 mass%. When the content of the thermoplastic resin is too small, the film forming ability or the effect of improving the mechanical strength is not exhibited, and the adhesion maintaining effect after the environmental test is not possible. The tendency to be exhibited is not sufficient, and if it is too large, the wet roughening will be described later. The thickness of the surface of the insulating layer after the step tends to increase. The resin composition of the present invention contains (A) component, (B) component, (C) component, (D) component, and (E) component, and has excellent lamination property, and can provide an insulating layer after hardening, even in the case of After the environmental test under high temperature and high humidity, the adhesion between the conductor layer and the insulating layer is sufficient, and the resin composition is excellent in low thermal expansion property. q The coefficient of thermal expansion of the cured product of the resin composition of the present invention can be grasped by the measurement method of the measurement and evaluation of the coefficient of thermal expansion (CTE) described later. The cured product of the resin composition of the present invention preferably has a thermal expansion coefficient of 44 ppm or less, more preferably 42 ppm or less, more preferably 40 ppm or less, more preferably 38 ppm or less, particularly preferably 36 ppm or less, and particularly preferably 34 ppm or less. Further, the lower limit 热 of the coefficient of thermal expansion is as low as possible, and preferably 30 ppm, more preferably 25 ppm, more preferably 20 ppm, more preferably 10 ppm, and 4 ppm Q is particularly preferable. The adhesion retention ratio before and after the environmental test of the insulating layer and the conductor layer formed of the resin composition of the present invention can be grasped by the measurement method of the measurement and evaluation of the adhesion strength (peeling strength) of the conductor layer to be described later. The adhesion maintaining ratio of the insulating layer and the conductor layer formed by the resin composition of the present invention before and after the environmental test is preferably 40% or more, more preferably 45% or more, more preferably 50% or more, and more preferably 55% or more. Good, 60% or more is especially good, 65% or more is particularly good, and 70% or more is very good. Moreover, the upper limit of the adhesion maintenance rate is as high as possible, preferably 80%, 82% is better, 84% is better, 8 6 % -17-201040226 is better, 90% is especially good. 100% is especially good. [Organic Metal Compound] In the resin composition of the present invention, an organic metal compound can be further added from the viewpoint of curing promotion. The organometallic compound 'is, for example, an organic copper compound such as copper (11) acetamidine acetone; an organic zinc compound such as zinc (antimony) acetonide acetone or zinc naphthalate U1); cobalt (II) acetoacetone, cobalt (III) An organic cobalt compound such as acetone; an organic nickel compound such as nickel (yttrium)acetonitrile; an organic iron compound such as iron (111) acetamidine or the like. The amount of addition of the organometallic compound 'is not more than 100% by mass in the resin composition, and the metal content of the organometallic compound is preferably from 25 to 500 ppm, more preferably from 40 to 200 ppm. When the thickness is less than 2 5 p p m, it becomes difficult to form a conductor layer having a peeling strength, and when it exceeds 500 ppm, the storage stability and the insulating property of the resin composition tend to be problematic. [Rubber Particles] The resin composition of the present invention may further contain rubber particles from the viewpoint of improving adhesion. The rubber particles which can be used in the present invention are, for example, those which are also insoluble in the varnish used to prepare the resin composition, and which are not compatible with a cyanate resin or an epoxy resin which must be formed. Therefore, the rubber particles are present in a dispersed state in the varnish of the resin composition of the present invention. Such rubber particles are generally prepared such that the molecular weight of the rubber component is insoluble in an organic solvent or a resin to make it large and particulate. Preferred rubber particles which can be used in the present invention are, for example, core-shell type rubber particles -18 - 201040226, crosslinked acrylonitrile butadiene rubber particles, crosslinked styrene butadiene rubber particles, propylene-based rubber particles and the like. The core-shell type rubber particles are rubber particles having a core layer and a shell layer, for example, a shell layer of an outer layer is composed of a glassy polymer, and a core layer of the inner layer is composed of a rubbery polymer, or an outer layer. The shell layer is composed of a glassy polymer, the intermediate layer is composed of a rubbery polymer, and the core layer is made of a glassy polymer. The glassy polymer layer is composed of, for example, a polymer of methyl methacrylate, and the rubbery polymer layer is composed of, for example, a butyl acrylate polymer (butyl rubber). Specific examples of the core-shell type rubber particles include Staphyloid AC3 832, AC3816N (trade name, manufactured by Ganz Chemical Co., Ltd.), and Metablen KW-4426 (trade name, manufactured by Mitsubishi Rayon Co., Ltd.). Specific examples of the crosslinked acrylonitrile butadiene rubber (NBR) particles are, for example, XER-91 (average particle diameter: 0.5 μm, manufactured by JSR Co., Ltd.). Specific examples of the crosslinked styrene butadiene rubber (SBR) particles include, for example, XSK-500 (average particle diameter: 0.5 μm, manufactured by JSR Co., Ltd.). Specific examples of the propylene-based rubber particles include Metablen W300A (average particle diameter Ο.ίμιη), W450A (average particle diameter 0.2 μmη) (manufactured by Mitsubishi Rayon Co., Ltd.), and the like. The average particle diameter of the rubber particles to be blended is preferably in the range of 0.005 to Ιμιη, more preferably in the range of 0.2 to 0.6 μm. The average particle diameter of the rubber particles used in the present invention can be measured by a moving light scattering method. For example, the rubber particles are uniformly dispersed by ultrasonic waves in a suitable organic solvent, and the particle size distribution of the rubber particles is -19-201040226 using a thick particle size analyzer (FPAR-10000; manufactured by Otsuka Electronics Co., Ltd.). In the production, the ruthenium particle diameter can be used as the average particle diameter to determine the rubber particle content, and the non-volatile content of the resin composition is 100% by mass, preferably 1 to 1 〇% by mass, and more preferably 2 to 5 by mass. %. [Flame Retardant] The resin composition of the present invention contains a flame retardant in a range that does not impair the effects of the present invention. Examples of the flame retardant include an organic phosphorus-based flame retardant, an organic nitrogen-containing phosphorus compound, a nitrogen compound, an anthrone-based flame retardant, and a metal hydroxide. Examples of the organophosphorus-based flame retardant include a phosphine compound such as HC A, HCA-HQ, and HCA-NQ manufactured by Sanko Co., Ltd., and a benzohexazine compound such as HFB-2006M manufactured by Showa Polymer Co., Ltd. 'Aj inomoto Fine-Techno Co., Ltd. Li Aofu 30, 50, 65, 90' 110, TPP, RPD, BAPP, CPD, TCP, TXP, TBP, TOP, KP140 and TIBP, Beixing Chemical Industry Co., Ltd. PPQ, Clariant (share) OP93 0, Da Ba Chemical (share) PX200 phosphate compound, Dongdu Chemical (FX) FX2S9, FX3 10 and other phosphorus-containing epoxy resin, Dongdu Chemical Co., Ltd. Phosphorus phenoxy resin such as ERF 001. For the organic nitrogen-containing phosphorus compound, for example, SP67〇 manufactured by Shikoku Chemicals Co., Ltd., phosphate amide compound such as SP703, SPB100 and SPE100 manufactured by Otsuka Chemical Co., Ltd., and FP-series manufactured by Fushimi Manufacturing Co., Ltd. Such as phosphorus and nitrogen compounds. Metal hydroxides such as UD65, UD650, UD653 and other magnesium hydroxides manufactured by Ube Material Co., Ltd., B-30, B--20-201040226 325, B-315, B-308, manufactured by Ba Industrial Co., Ltd. Aluminum hydroxide such as B-303 and UFH-20. [Other components] The resin composition of the present invention can be blended with other components as necessary without impairing the effects of the present invention. Other ingredients, such as tantalum powder, nylon powder, fluorine powder and other organic filling agents: Oluban, Fantong and other tackifiers 'ketones, fluorine, polymer defoamers or coating agents; imidazole 0 series , adhesion promoters such as thiazoles, triazoles, and decane coupling agents; hardening accelerators such as imidazoles and amines; phthalocyanine blue, phthalocyanine, green, iodine, green, bisazo yellow, A coloring agent such as carbon black. The preparation method of the resin composition of the present invention is not particularly limited, and for example, a cyanic acid resin, an epoxy resin, a thermoplastic resin, talc, cerium oxide, a hardening accelerator necessary for curing, a curing catalyst, and the like may be used. A method in which rubber particles or other components are mixed by a rotary mixer or the like. The use of the resin composition of the present invention is not particularly limited, and it can be used for an insulating resin sheet such as a Q-thick film or a prepreg, a circuit board, a solder resist, a bottom-filling material, a die-adhesive material, a semiconductor sealing material, and a sealing hole. Resins, seal parts, and the like require a wide range of applications for resin compositions. Among them, the multilayer printed wiring board can be suitably used for forming an insulating layer. The resin composition of the present invention may be applied to a circuit board in a varnish state to form an insulating layer after curing. However, it is generally industrially used in the form of a sheet-like laminate such as a film or a prepreg. The softening point of the resin composition is preferably from 40 to 150 ° C from the viewpoint of laminar laminate lamination. -21 - 201040226 [Continuous film] The adhesive film of the present invention can be coated with a resin varnish in which a resin composition is dissolved in an organic solvent by a method known to the manufacturer, and the resin varnish is coated with a die coater or the like. The support film of the body is further produced by drying the organic solvent by heating or hot air blowing to form a resin composition layer. The organic solvent may, for example, be a ketone such as acetone, methyl ethyl ketone or cyclohexanone; ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, carbitol acetic acid Acetates such as esters; cellosolves; carbitols such as butyl carbitol; aromatic hydrocarbons such as toluene and xylene; dimethylformamide, dimethylacetamide, N-methyl Pyrrolidone and the like. The organic solvent may be used in combination of two or more kinds. The condition for drying and removing the organic solvent is not particularly limited, and the content of the organic solvent in the resin composition layer is preferably 1% by mass or less, more preferably 5% by mass or less. Although it varies depending on the amount of the organic solvent in the varnish and the boiling point of the organic solvent, for example, a varnish containing 30 to 60% by mass of an organic solvent is formed at 50 to 150 ° C for about 3 to 10 minutes to form an organic layer. The resin composition layer having a solvent content of 1% by mass or less. The manufacturer can set suitable and preferred drying conditions by simple experimentation. The thickness of the resin composition layer formed in the film is usually more than the thickness of the conductor layer. Since the thickness of the conductor layer of the circuit board is usually in the range of 5 to 70 μm, the resin composition layer preferably has a thickness of 10 to ΙΟΟμπα. The support film in the present invention may, for example, be a polyolefin such as polyethylene, polypropylene or polychlorinated-22-201040226 ethylene; polyethylene terephthalate (hereinafter referred to as "PET"), polyethylene naphthalate A polyester such as an ester; a polycarbonate; a film formed by polyimine or the like, and further a metal foil such as a release paper, a copper foil, or an aluminum foil. Further, the support film and the protective film described later may be subjected to a mold release treatment in addition to a mat treatment or a corona treatment. The thickness of the support film is not particularly limited, and is preferably 10 to 150 μm, and more preferably 25 to 50 μm. The support film on the resin composition layer is not adhered to the surface, and the protective film can be laminated on the support film. The thickness of the protective film is not particularly limited, and is preferably 1 to 4 μm. By laminating the protective film, it is possible to prevent dust or the like from adhering to the surface of the resin composition layer or to prevent scratching. The film can then be rolled into a roll for collection. [Multilayer Printed Wiring Board Using Adhesive Film] Next, an example of a method of manufacturing a multilayer printed Q wiring board using the adhesive film manufactured as described above will be described. First, the adhesive film was laminated on one or both sides of the circuit substrate using a vacuum laminator. Examples of the substrate that can be used for the circuit board include a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a silicone resin substrate, and a thermosetting polyphenylene ether substrate. Further, the circuit board is a conductor layer (circuit) in which a pattern is formed on one surface or both surfaces of the substrate as described above. Further, in the multilayer printed wiring board in which the conductor layer and the insulating layer are alternately laminated, the one or both sides of the outermost layer of the multilayer printed wiring board are also patterned circuit conductors (circuits) included in the circuit substrate. . The surface of the body layer can also be pre-applied by blackening treatment, copper micro-etching, etc. on the surface of the body layer -23-201040226. In the above lamination, when the film has a protective film, after the protective film is removed, the film and the circuit substrate are preheated as necessary, and the film is then pressed and heated while being pressed onto the circuit board. In the film of the present invention, a method of laminating to a circuit substrate under reduced pressure by vacuum lamination is suitably used. The lamination conditions are not particularly limited, and for example, the pressing temperature (laminating temperature) is preferably 70 to 140 ° C, and the pressing pressure is preferably 1 to llkgf/cm 2 (9.8 X 104 〜 1 07.9 X 1 04 N/m 2 ). It is preferred to laminate under reduced pressure at an air pressure of 20 mmHg (26.7 hPA) or less. Further, the lamination method may be batch type or continuous in rolls. Vacuum lamination can be carried out using a commercially available vacuum laminator. Commercially available vacuum laminating machine, for example, a vacuum compactor manufactured by Nichigo-morton Co., Ltd., a vacuum pressurizing laminator manufactured by Nihon Seiki Co., Ltd., a Hitachi INDUSTRES roll dry coater, Hitachi AIC (stock) vacuum laminator, etc. Further, the laminating step of heating and pressurizing under reduced pressure can be carried out using a general vacuum hot press. For example, it can be carried out by pressurizing a metal plate such as a heated SUS plate from the side of the support layer. Under normal conditions, the pressure-reducing condition is usually 1xl (T2MPa or less, preferably 1 X 1 0_3 ΜP a or less. The heating and pressurization can be carried out in one step', but the control resin is leaked in two stages or more. It is preferable to carry out under different conditions, for example, pressurization in the first stage at a temperature of 70 to 150 ° C, a pressure of 1 to 15 kgf/cm 2 , and a second stage of pressurization at a temperature of 150 to 200 ° C and a pressure of 1 to 40 kgf / The range of em2 is preferably carried out. The time of each stage is preferably 30 - 24 - 201040226 - 120 minutes. Commercially available vacuum hot presses, for example, MNPC-V-75 0-5-200 (shares) machine manufacturer System), VH 1 - 1 603 (Beichuan Seiki Co., Ltd.), etc. Then, after the film is laminated on the circuit board, and after cooling to room temperature and peeling off the support film, an insulating layer can be formed on the circuit board by peeling and heat curing. The condition of the heat hardening may be appropriately selected depending on the kind of the resin component in the resin composition, etc., but it is preferably at 150 ° C to 22 (20 minutes to 180 minutes under TC, more preferably 160 ° C to 200 ° Selecting at a temperature of 30 to 120 minutes at ° C. The film is not peeled off before hardening, and is peeled off after forming the insulating layer. Then, if necessary, the insulating layer formed on the circuit substrate is opened to form a through hole. The through hole may be formed by a known method such as a drill, a laser, a plasma, or the like by a combination of such methods, but a hole such as a carbon dioxide laser or a YAG laser is used to open the hole. Next, dry conductor plating or wet plating is applied to the insulating layer to form a conductor Q layer. For dry plating, a known method such as evaporation, sputtering, ion plating, or the like can be used. First, the surface of the hardened resin composition layer (insulating layer) is subjected to wet roughening treatment. The wet roughening treatment refers to permanganate (potassium permanganate, sodium permanganate, etc.), dichromate. , ozone, hydrogen peroxide / sulfuric acid, nitric acid and other oxidants roughening and The treatment of the anchor point of the convex and concave. The oxidant is preferably a sodium hydroxide aqueous solution such as potassium permanganate or sodium permanganate (alkaline permanganic acid aqueous solution). After the roughening treatment, combined electroless plating and electrolytic plating are used. The method of forming a conductor layer. In addition, the conductor layer refers to a plating resist which forms an inverse pattern and can also form a conductor layer only by electroless mineralization. The subsequent pattern - 25-201040226 formation method can be used, for example, which is well known to the manufacturer. Subtractive method, semi-additive method, etc. The surface of the produced conductor layer is roughened as described above, and the surface of the conductor layer is roughened to improve the adhesion of the resin to the conductor layer. The conductor layer is roughened to use an organic acid system. Preferably, the etching agent CZ-8100, CZ-8101, CZ-5480, etc., by using the resin composition for a printed wiring board of the present invention, is not related to the degree of roughening of the surface of the conductor layer, and is denser than the resin composition of the prior art. The property is improved, and an insulating layer having a low thermal expansion coefficient, lamination property, and balance with the adhesion strength of the conductor layer after the environmental test is formed. [Prepreg] The prepreg of the present invention can be obtained by the present invention Resin The flaky reinforcing base material formed of the fiber is impregnated by a hot melt method or a solvent method, and then heated and then semi-hardened. That is, the resin composition of the present invention can be used as a flaky reinforcing substrate in which the fiber is formed. A prepreg in an impregnated state. A flaky reinforcing substrate made of a fiber may be, for example, a glass cloth or a polyamidamide fiber or the like as a fiber for prepreg fibers. The hot melt method is not a resin. The organic solvent is temporarily applied to a coated paper having good release property from the resin, and is laminated on a sheet-like reinforcing substrate, or the resin is insoluble in an organic solvent, but is applied to a sheet by a die coater. a method of directly coating a substrate to prepare a prepreg, and a solvent method, as in the case of a film, dissolving the resin in an organic solvent to prepare a resin varnish, and immersing the flaky reinforcing substrate in a varnish. A method in which a resin varnish is impregnated into a sheet-like reinforcing substrate and then dried. -26- 201040226 [Multilayer printed wiring board using prepreg] Next, an example of a method of producing a multilayer printed wiring board using the prepreg manufactured as described above will be described. On the circuit board, a prepreg of the present invention or a plurality of sheets as necessary is superposed, and the release film is held by a metal plate, and pressure lamination is performed under pressure and heating. Pressurization. Heating conditions are preferably pressures of 5 to 40 kgf/cm2 (49xl04 to 392 xl04N/m2). The temperature is 120 to 2 00 ° C for 20 to 100 minutes. Similarly to the subsequent film, the prepreg may be laminated to the circuit board by vacuum lamination, and then heat-hardened. Thereafter, the surface of the prepreg which has been cured is roughened as described above in the same manner as the above-described method, and the conductor layer is plated to form a multilayer printed wiring board. Hereinafter, the invention will be specifically described by way of examples, but the invention is not limited to the examples. [Embodiment] [Examples] [Example 1] A bismuth A-cyanate vinegar prepolymer ("BA230S75" manufactured by L〇nza Japan Co., Ltd., a cyanate equivalent of about 232' nonvolatile content of 75% by mass) 30 parts by mass of a methyl ethyl ketone (hereinafter referred to as MEK) solution, and a phenolic phenolphthalein varnish type sulphate t-cyanate vinegar resin ("PT30"' manufactured by L〇nza japan" About 124) 10 parts by mass of 'MEK 10 parts by mass were stirred and mixed, and then mixed as a naphthol type epoxy resin, "Essex" (ESN_475V) (expressed as the following general formula. Epoxy equivalent of about -27-201040226 340) 40 parts by mass of a MEK solution having a nonvolatile content of 65% by mass, and further a liquid bisphenol fluorene type epoxy resin ("JER828EL" manufactured by Japan Epoxy Resins Co., Ltd., epoxy equivalent: about 185), 8 parts by mass, phenoxy resin Solution ("YX6954" manufactured by Japan Epoxy Resins Co., Ltd., a weight average molecular weight of 40000, a mixed solution of MEK and cyclohexanone having a nonvolatile content of 30% by mass) 20 parts by mass, cobalt (II) acetamidineacetone (Co(AcAc)) 2. 4 parts by mass of N,N-dimethylformamide (DMF) solution of Tokyo Chemical Co., Ltd.) , talc (Japan Dwarf Co., Ltd. "D-800" surface treated with amino decane, average particle size 〇.8μιη) 6 parts by mass, and spherical cerium oxide ("share" Admatechs "SO-C2" After the amine decane was used as a surface treatment agent and the average particle diameter of 55 μm was 42 parts by mass, 20 parts by mass of MEK was added, and the mixture was uniformly dispersed by a high-speed rotary mixer to prepare a thermosetting resin composition varnish. Next, the resin composition was varnished on a polyethylene terephthalate film (thickness: 38 μm, hereinafter abbreviated as PET film), and the thickness of the dried resin composition layer was 40 μm, using a die coater. Uniform coating was carried out for 6 minutes at 80 to 120 ° C (average 100 ° C) (the amount of residual solvent in the resin composition layer: about 1.5% by mass). Next, a polypropylene film having a thickness of 15 μm was attached to the surface of the resin composition layer and wound up into a roll shape. The roll-shaped film was cut into a width of 507 mm to obtain a sheet-like film of a size of 5 07 X 3 3 6 mm. -28 - 201040226
(η爲平均値1〜6之數,X爲環氧丙基或碳數1〜8之烴 基,烴基/環氧丙基之比率爲〇.〇5〜2.〇。) Ο [實施例2] 除使實施例1之D800爲1〇質量份、SO-C2爲38質 量份以外,與實施例1同樣地得到接著薄膜。 [實施例3 ] 除使實施例1之D800爲12質量份、S0-C2爲36質 量份以外,與實施例1同樣地得到接著薄膜。 ^ [實施例4] 除使實施例1之D800爲16質量份' S0-C2爲32質 量份以外,與實施例1同樣地得到接著薄膜。 [實施例5 ] 除使實施例1之D800爲18質量份、S0-C2爲30質 量份以外,與實施例1同樣地得到接著薄膜。 [實施例6] -29- 201040226 除使實施例1之D 8 00爲22質量份、SO-C2爲26質 量份以外,與實施例1同樣地得到接著薄膜。 [實施例7] 實施例1之D 800爲24質量份、SO-C2爲24質量份 以外,與實施例1同樣地得到接著薄膜。 [實施例8] 除使實施例1之D800爲1 1質量份、SO-C2爲28質 量份以外,與實施例1同樣地得到接著薄膜。 [實施例9] 除使實施例1之D800爲15質量份、SO-C2爲57質 量份以外,與實施例1同樣地得到接著薄膜。 [實施例1 〇 ] 除使實施例1之D800爲18質量份、SO-C2爲90質 量份以外,與實施例1同樣地得到接著薄膜。 [實施例1 1 ] 除使實施例1之D 8 00爲8質量份、SO-C2爲66質量 份以外,與實施例1同樣地得到接著薄膜。 [實施例1 2 ] -30 - 201040226 除使實施例1之D800爲22質量份、SO-C2爲50質 量份以外,與實施例1同樣地得到接著薄膜。 [實施例1 3 ] 除取代實施例1之D8 00爲SG-95(經胺基矽烷表面處 理者、平均粒徑2.5μιη)15質量份、SO-C2爲57質量份以 外’與實施例1同樣地得到接著薄膜》 〇 [比較例1 ] 除不使用實施例1之D800,而SO-C2爲48質量份以 外’與實施例1同樣地得到接著薄膜。 [比較例2 ] 除實施例1之D800爲4質量份、SO-C2爲45質量份 以外,與實施例1同樣地得到接著薄膜。 〇 [比較例3 ] 除實施例1之D 8 00爲30質量份、SO-C2爲18質量 份以外,與實施例1同樣地得到接著薄膜。 [比較例4 ] 除實施例1之D800爲48質量份、而不使用SO-C2 以外,與實施例1同樣地得到接著薄膜。 -31 - 201040226 [比較例5] 除實施例1之D800爲10質量份、SO-C2爲21份以 外,與實施例1同樣地得到接著薄膜。 [比較例6 ] 除實施例1之D800爲21質量份、SO-C2爲115質量 份以外,與實施例1同樣地得到接著薄膜。 [比較例7] 除實施例1之D800爲13質量份、SO-C2爲54質 量份而不搭配Y X 6 9 5 4以外’與實施例1同樣地得到接著 薄膜。 <密著強度測定樣本之調製> (1) 層合板之底層處理 爲了評估導體層與絕緣層之密著強度,將形成內層電 路的雙面貼銅層合板[銅箔厚度18μιη、基板厚度〇.3mm、 松下電工(股)製 R5715ES]雙面浸漬於 Mec(股)製 MECetchBONDCZ-8100後對電路表面進行粗化處理(ra値 =1 μιη)。 (2) 接著薄膜的層合 將以實施例1〜1 〇及比較例1〜6所製作的接著薄 膜,使用批次式真空加壓層合機MVLP-5〇〇(名機(股)製商 品名),層合於層合板之雙面。層合係藉由3 0秒減壓後, -32- 201040226 氣壓在 13hPa以下,之後以 30秒鐘、100°C、壓力 〇.74MPa力口壓而進行。 (3 )銅涪之底層處理 將三井金屬礦山(股)製3EC-III(電場銅箔、35μηι)的 光澤面浸漬於Mec(股)製MECetchBONDCZ-8100後對銅箔 表面進行粗化處理(RA値=1μιη)。 (4)銅箔之層合與絕緣層形成 從上述(2)中層合的接著薄膜剝離PET薄膜,將以(3) 處理之銅箔的處理面作爲樹脂組成物層側,在與(2)同樣 條件下,使銅箔於電路基板雙面上形成的樹脂組成物層上 層合。藉由以1 90°C、90分鐘的硬化條件硬化樹脂組成物 後形成絕緣層而製作樣本。 〈熱膨賬率 CTE(coefficient of thermal expansion)的 測定及評估> 於實施例及比較例中,除於支持體使用氟樹脂系脫模 劑(ETFE)處理的PET(三菱樹脂(股)製「福落久RL50KSE 以外,同樣地,得到具有與各實施例、比較例相同樹脂組 成物層之接著薄膜。將所得接著薄膜以190°C、90分鐘加 熱使熱硬化,藉由剝離支持體而獲得薄片狀硬化物。將該 硬化物切斷爲寬約5mm、長約15mm之試驗片,使用熱機 械分析裝置 Thermo Plus TMA8310((股)Rigaku 製),以拉 伸加重法進行熱機械分析。將試驗片裝設到前述裝置後, 以荷重1 g、昇溫速度5 °C /分的測定條件連續測定2次。 -33- 201040226 算出第2次的測定中25t〜150°C的平均線熱膨脹率 (ppm)。CTE値未達35ppm時爲「◎」,35ppm以上未達 40ppm時爲「〇」,40ppm以上未達45ppm時爲「△」, 45ppm以上時爲「X」。所得結果如表1、2。 <層合性之評估> 將實施例及比較例之薄膜以上述(3)所記載層合條件 層合於電路基板,依據外觀檢査,如以下進行判定。結果 如表1、2。 〇:電路基板之電路部分無裂縫,樹脂非常連貫。 X:電路基板之電路基板有裂縫而樹脂連貫不足。 <與導體層之密著強度(剝離強度)的測定及評估> 將上述(4)記載之樣本510x340mm切斷爲150x30mm 之小片。在小片銅箱部分,寬l〇mm、長100mm之部分加 入切痕,將銅箔一端剝離以抓取工具抓牢,使用Instron 萬能試驗機,在室溫中以50mm/分之速度測定垂直方向拉 撕3 5mm時的荷重,作爲環境試驗前之剝離強度。 進一步,將同一樣本以高度加速壽命試驗裝置 PM42 2(楠本化成(股)製),在 1 30°C、85%RH條件下 1 00 小時間加速環境試驗後,以同樣方法測定拉撕強度作爲環 境試驗後的剝離強度。「環境試驗後的剝離強度+環境試 驗前剝離強度X 1 00」之値爲密著維持率(%),進行加速環 境試驗前後的剝離強度比較。密著維持率爲75%以上時爲 -34- 201040226 「◎」,未達75%且在50%以上時爲「〇」,未達50%且 40%以上時爲「△」,未達40%時爲「X」。結果如表1、 2。(η is the average number of 値1 to 6, X is a glycidyl group or a hydrocarbon group having a carbon number of 1 to 8, and the ratio of the hydrocarbon group to the epoxy group is 〇.〇5 to 2. Ο.) [Example 2 A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 1 part by mass and SO-C2 was 38 parts by mass. [Example 3] A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 12 parts by mass and S0-C2 was 36 parts by mass. [Example 4] A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 16 parts by mass of 'S0-C2. [Example 5] A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 18 parts by mass and S0-C2 was 30 parts by mass. [Example 6] -29-201040226 A film was obtained in the same manner as in Example 1 except that D 8 00 of Example 1 was 22 parts by mass and SO-C2 was 26 parts by mass. [Example 7] A film was obtained in the same manner as in Example 1 except that D 800 was 24 parts by mass and SO-C2 was 24 parts by mass. [Example 8] A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 11 parts by mass and SO-C2 was 28 parts by mass. [Example 9] A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 15 parts by mass and SO-C2 was 57 parts by mass. [Example 1] A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 18 parts by mass and SO-C2 was 90 parts by mass. [Example 1 1] A film was obtained in the same manner as in Example 1 except that D 8 00 of Example 1 was 8 parts by mass and SO-C2 was 66 parts by mass. [Example 1 2 ] -30 - 201040226 A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 22 parts by mass and SO-C2 was 50 parts by mass. [Example 1 3] Except that D8 00 of Substituting Example 1 was SG-95 (15 parts by mass of an amine decane surface treatment, an average particle diameter of 2.5 μm), and SO-C2 was 57 parts by mass, and Example 1 In the same manner as in Example 1, except that D800 of Example 1 was not used, and SO-C2 was 48 parts by mass, a film obtained in the same manner as in Example 1 was obtained. [Comparative Example 2] A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 4 parts by mass and SO-C2 was 45 parts by mass. [Comparative Example 3] A film was obtained in the same manner as in Example 1 except that D 8 00 of Example 1 was 30 parts by mass and SO-C2 was 18 parts by mass. [Comparative Example 4] A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 48 parts by mass, and SO-C2 was not used. -31 - 201040226 [Comparative Example 5] A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 10 parts by mass and SO-C2 was 21 parts. [Comparative Example 6] A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 21 parts by mass and SO-C2 was 115 parts by mass. [Comparative Example 7] A film was obtained in the same manner as in Example 1 except that D800 of Example 1 was 13 parts by mass and SO-C2 was 54 parts by mass without using Y X 6 9 5 4 . <Preparation of adhesion strength measurement sample> (1) Underlayer treatment of laminate sheet In order to evaluate the adhesion strength between the conductor layer and the insulation layer, a double-sided copper-clad laminate in which an inner layer circuit is formed [copper foil thickness 18 μm, substrate) The surface of the circuit was roughened (ra値=1 μιη) after being immersed in MECetchBONDCZ-8100 manufactured by Mec (double-sided) with a thickness of 33 mm and a R5715ES manufactured by Matsushita Electric Works Co., Ltd. (2) Next, lamination of the film was carried out using the following films prepared in Examples 1 to 1 and Comparative Examples 1 to 6, using a batch type vacuum pressure laminator MVLP-5(R) (manufactured by a famous machine) Product name), laminated on both sides of the laminate. The laminating system was decompressed for 30 seconds, and the -32-201040226 air pressure was below 13 hPa, followed by a pressure of 30 sec, 100 ° C, and a pressure of 74.74 MPa. (3) Bottom treatment of copper enamel The surface of the copper foil was roughened by immersing the shiny surface of 3EC-III (electric field copper foil, 35μηι) made by Mitsui Metals Co., Ltd. in MECetchBONDCZ-8100 manufactured by Mec.値=1μιη). (4) Lamination of Copper Foil and Formation of Insulating Layer The PET film obtained by laminating the film from the above (2) is peeled off, and the treated surface of the copper foil treated by (3) is used as the resin composition layer side, and (2) Under the same conditions, the copper foil was laminated on the resin composition layer formed on both surfaces of the circuit board. A sample was prepared by curing the resin composition at a hardening condition of 1 90 ° C for 90 minutes to form an insulating layer. <Measurement and Evaluation of Coefficient of Thermal Expansion CTE> In the examples and comparative examples, PET (Mitsubishi Resin Co., Ltd.) was used in addition to the support using a fluororesin-based release agent (ETFE). In the same manner as in the case of "Follow RL50KSE, a film having the same resin composition layer as each of the examples and the comparative examples was obtained. The obtained film was heated at 190 ° C for 90 minutes to be thermally cured, and the support was peeled off. A flaky cured product was obtained, and the cured product was cut into test pieces having a width of about 5 mm and a length of about 15 mm, and subjected to thermomechanical analysis by a tensile weighting method using a thermomechanical analyzer Thermo Plus TMA8310 (manufactured by Rigaku Co., Ltd.). After the test piece was placed in the above apparatus, the measurement was continuously performed twice under the measurement conditions of a load of 1 g and a temperature increase rate of 5 ° C /min. -33 - 201040226 The average linear thermal expansion of 25 t to 150 ° C in the second measurement was calculated. Rate (ppm): "?" when CTE is less than 35 ppm, "〇" when 35 ppm or less is less than 40 ppm, "△" when 40 ppm or less is less than 45 ppm, and "X" when it is 45 ppm or more. 1, 2. <evaluation of lamination& The films of the examples and the comparative examples were laminated on a circuit board under the lamination conditions described in the above (3), and were judged as follows according to the visual inspection. The results are shown in Tables 1 and 2. 〇: The circuit portion of the circuit substrate was not obtained. In the crack, the resin is very continuous. X: The circuit board of the circuit board has a crack and the resin is insufficiently connected. <Measurement and evaluation of the adhesion strength (peeling strength) with the conductor layer> The sample of the above (4) is cut off by 510 x 340 mm. It is a small piece of 150x30mm. In the small copper box part, the slit is added to the part of the width l〇mm and the length of 100mm, and the end of the copper foil is peeled off to grasp the grasping tool. Using the Instron universal testing machine, 50mm/min at room temperature The speed was measured as the load at the time of pulling 3 5 mm in the vertical direction as the peel strength before the environmental test. Further, the same sample was used as a highly accelerated life test device PM42 2 (manufactured by Nanben Chemical Co., Ltd.) at 1 30 ° C, 85 After the environmental test was accelerated for 1 hour under %RH conditions, the tear strength was measured in the same manner as the peel strength after the environmental test. "Peel strength after environmental test + peel strength before environmental test X 1 00" is the adhesion retention ratio (%), and the peel strength before and after the accelerated environmental test is compared. When the adhesion retention rate is 75% or more, it is -34-201040226 "◎", which is less than 75% and is 50% or more. The time is "〇", which is "△" when it is less than 50% and 40% or more, and "X" when it is less than 40%. The results are shown in Tables 1 and 2.
-35- 201040226 【I谳 實施例 I3 〇 § 00 § ο LO 57 144. 54 g s ◎ 1 <3 1 0.66 1 1 0.35 1 og 實施例 12 〇 § 00 csj 〇 s | 144.54 | g ____ 〇 0.66 0.52 丨 ®g i實施例 11 另 〇 § 00 § 00 o 146. 54 g •s_✓ 〇 1 0.66 1 0. 33 os 闺2 K 〇 〇〇 寸 00 o § | 180.54 | § 〇 ®§ 〇 fH (C ο 0.35 οΈ >w^ 實施例 1_?_ 〇 00 § 寸 ΙΛ o L〇 144. 54 g o 〇 1 0.66 1 0.39 OS 實施例 8 1_ 〇 § 00 寸 rH o 00 | 111,54 | in c〇 s og 〇 0. 72 〇 OS 實施例 7 〇 § 00 S 寸 寸 CSJ o 寸 CQ 120. 54 s' og 〇 1 0.62 1 LO 〇 ® § 實施例 6 〇 § 00 C>3 CN3 o CO CNi | 120.54 | § οσ ol ·»—^ 〇 0. 66 〇 ©g 實施例 5 〇 00 寸 00 o 另 120. 54 in o ^ V_✓ 〇 0.67 1 0.50 ! 實施例 1^4 〇 § 00 寸 CO o eg CO 120. 54 § CO og 〇 卜 ο I 0.45 I OS 實施例 ! 3 〇 § GO § 寸 N o ς〇 CO 120. 54 I § o o运 >1_/ 〇 1 0.72 1 0.41 ' 0 5 實施例 L. 2_一 〇 00 § 寸 〇 o 00 CO I 120.54 I § 00 oi N—»» 〇 1 0.76 1 0.38 1 1 o § 實施例 1 〇 00 寸 CO o 寸 | 120.54 uo o贫 〇 1 0.76 I 0.33 <3 3 ·»_✓ 固形分比率 (%) LO 〇 ί-Η LA 〇 T-M τΉ o o o o o T-^ 總固形分量(質量份) ΊΙ 卖 S m 璀 s. ¥ =-—η 熱膨脹柳Pm) 環境試驗前 環境試驗後 密著維持率 (%) 種類 BA230S75 ΡΤ30 ESN475V JER828EL YX6954 Co(acac)2 D—800 SG-95 ! S0-C2 層合怕 剝離強度 (kgf/cm) -36- 201040226 ο ο 【3谳】 比較例 7 〇 00 〇 CO 〇 寸 LA 133.54 S ◎爸 X 0.66 L_. 里 麗_ CO ο <]? N—✓ 比較例 6 〇 03 § 寸 1—Η 〇 LO 1-^ I 208.54 LO 〇 ® § X CS| co o eg CO o OS 比較例 5 〇 § 00 ο 〇 CSI 1 103.54 1 〇 v 八寸 〇 0.73 | 0· 35 I <3? ·>»_✓ 比較例 4 〇 〇〇 s 寸 00 寸 〇 〇 120. 54 § o? X o’ | 0.50 | ◎ s 比較例 3 〇 导 00 s 寸 〇 CO 120. 54 1Λ cq 〇贫 N—✓ X 0. 66 [0.46 | 〇艺 比較例 2 〇 00 寸 寸 〇 ΙΛ 寸 121. 54 CO og 〇 | 0.73 | | 0.25 | 八CO >w^ 比較例 1 ό 00 § 寸 〇 ◦ 00 寸 120. 54 ο 〇i 〇 1 0-71 1 o X f 固形分比率 (%) LO 〇 rH LA <〇 〇 ι-Η 〇 〇 〇 〇 〇 〇 總固形分量(質量份) 無機塡料比率(%) 滑石比率(%) 熱膨脹率(ppm) 層合性 環境試驗前 環境試驗後 密著維持率 (%) 種類 BA230S75 PT30 ESN475v jER828EL YX6954 | Co (acac)2 D-800 SG-95 SO-C2 剝離強度 (kgf/cm) -37- 201040226 m '層合性及 能均衡性佳者。 環境試驗後的密 θ滑石的含量過 由表1、2之結果,實施例中低熱膨 環境試驗後的密者強度皆優,成爲此等性 另一方面,比較例1、2因滑石含量少, 著強度降低變得顯著。且比較例3、4 多’層合性惡化。進一步’比較例5因滑石與二氧化砂之 總含量少’變得熱膨脹率增大。又比較例6因滑石與二氧 化砂之總合rl*量過多’層合性惡化。比較例7,與無機塡 料比率及滑石比率相同的實施例9、1 3比較,因未搭配必 須成分熱可塑性樹脂,環境試驗前後的剝離強度之密著維 持率變低。又,因未搭配苯氧樹脂,黏度變得過低,層合 性亦惡化。 [產業利用性] 本發明的樹脂組成物,可提供導體層與絕緣層之密著 良好且環境試驗後的密著降低少的接著薄膜、預浸漬體、 多層印刷配線板。進而亦可提供搭配此等之電腦、彳了動電 話、數位相機、電視等電器製品或機車、汽車、電車、船 舶、飛機等交通工具。 -38--35- 201040226 [I谳Example I3 〇§ 00 § ο LO 57 144. 54 gs ◎ 1 <3 1 0.66 1 1 0.35 1 og Example 12 〇§ 00 csj 〇s | 144.54 | g ____ 〇0.66 0.52丨®gi Example 11 〇 § 00 § 00 o 146. 54 g • s_✓ 〇 1 0.66 1 0. 33 os 闺 2 K 〇〇〇 00 o § | 180.54 | § 〇®§ 〇fH (C ο 0.35 οΈ >w^ Example 1_?_ 〇00 § inch ΙΛ o L〇144. 54 go 〇1 0.66 1 0.39 OS Example 8 1_ 〇§ 00 inch rH o 00 | 111,54 | in c〇s og 〇0. 72 〇OS Example 7 〇§ 00 S inch CSJ o inch CQ 120. 54 s' og 〇1 0.62 1 LO 〇® § Example 6 〇§ 00 C>3 CN3 o CO CNi | 120.54 | § οσ Ol ·»—^ 〇0. 66 〇©g Example 5 〇00 inch 00 o Another 120. 54 in o ^ V_✓ 〇0.67 1 0.50 ! Example 1^4 〇§ 00 inch CO o eg CO 120. 54 § CO og ο ο I 0.45 I OS Example! 3 〇§ GO § Inch N o ς〇CO 120. 54 I § oo 运>1_/ 〇1 0.72 1 0.41 ' 0 5 Example L. 2_一〇00 § inch 〇o 00 CO I 120.54 I § 00 oi N-»» 〇1 0.76 1 0.38 1 1 o § Example 1 〇00 inch CO o inch | 120.54 uo oBarrenness 1 0.76 I 0.33 <3 3 ·»_✓ Solid fraction ratio ( %) LO 〇ί-Η LA 〇TM τΉ ooooo T-^ Total solid content (parts by mass) ΊΙ Sell S m 璀s. ¥ =-—η Thermal expansion willow Pm) Adhesion retention rate after environmental test before environmental test (% ) Type BA230S75 ΡΤ30 ESN475V JER828EL YX6954 Co(acac)2 D-800 SG-95 ! S0-C2 Laminated peeling strength (kgf/cm) -36- 201040226 ο ο [3谳] Comparative Example 7 〇00 〇CO 〇 Inch LA 133.54 S ◎Daddy X 0.66 L_. Lili _ CO ο <]? N—✓ Comparative Example 6 〇03 § inch 1—Η 〇LO 1-^ I 208.54 LO 〇® § X CS| co o eg CO o OS Comparative Example 5 〇§ 00 ο 〇CSI 1 103.54 1 〇v 8 inch 〇0.73 | 0· 35 I <3? ·>»_✓ Comparative example 4 〇〇〇s inch 00 inch 〇〇120. 54 § o? X o' | 0.50 | ◎ s Comparative Example 3 00 00 s inch 〇 CO 120. 54 1Λ cq 〇 poor N—✓ X 0. 66 [0.46 | 〇艺比比2 〇00 inch inch 〇ΙΛ inch 121 . 54 CO og 〇| 0.73 | | 0.25 | 八CO >w^ Comparative Example 1 ό 00 § inch 〇◦ 00 inch 120. 54 ο 〇i 〇1 0-71 1 o X f Solid fraction (%) LO 〇 rH LA <〇〇ι-Η 〇〇〇〇〇〇 Total solid content (parts by mass) Inorganic coating ratio (%) Talc ratio (%) Thermal expansion ratio (ppm) Laminated environmental test before environmental test Maintenance rate (%) Type BA230S75 PT30 ESN475v jER828EL YX6954 | Co (acac)2 D-800 SG-95 SO-C2 Peel strength (kgf/cm) -37- 201040226 m 'Laminarity and energy balance. The content of the dense θ talc after the environmental test exceeded the results of Tables 1 and 2. In the examples, the strength of the dense heat after the low thermal expansion environment test was excellent, and on the other hand, Comparative Examples 1 and 2 had less talc content. The intensity reduction becomes significant. Further, in Comparative Examples 3 and 4, the lamination property was deteriorated. Further, in Comparative Example 5, the total content of talc and silica sand was small, and the coefficient of thermal expansion increased. Further, in Comparative Example 6, the total amount of rl* of the talc and the silica sand was too large, and the laminate property was deteriorated. In Comparative Example 7, in comparison with Examples 9 and 13 in which the ratio of the inorganic material to the talc was the same, the adhesion retention ratio of the peel strength before and after the environmental test was lowered because the thermoplastic resin was not blended with the essential component. Further, since the viscosity is too low due to the absence of the phenoxy resin, the laminate property is also deteriorated. [Industrial Applicability] The resin composition of the present invention can provide a film, a prepreg, and a multilayer printed wiring board which are excellent in adhesion between the conductor layer and the insulating layer and have less adhesion reduction after the environmental test. Further, it is also possible to provide electric appliances such as computers, smashing telephones, digital cameras, televisions, and the like, or vehicles such as locomotives, automobiles, electric cars, ships, and airplanes. -38-
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| JP5685098B2 (en) * | 2011-01-28 | 2015-03-18 | 京セラケミカル株式会社 | Manufacturing method of electronic parts |
| KR20130140798A (en) * | 2011-02-01 | 2013-12-24 | 디아이씨 가부시끼가이샤 | Thermosetting resin composition, cured product thereof, and interlayer adhesive film for printed wiring board |
| JP2013040298A (en) * | 2011-08-18 | 2013-02-28 | Sekisui Chem Co Ltd | Epoxy resin material and multilayer board |
| WO2013061478A1 (en) * | 2011-10-26 | 2013-05-02 | 味の素株式会社 | Resin composition |
| KR20150023298A (en) * | 2012-05-31 | 2015-03-05 | 닛토덴코 가부시키가이샤 | Sheet manufacturing method and sheet manufacturing device |
| JP2014069409A (en) * | 2012-09-28 | 2014-04-21 | Nitto Denko Corp | Sheet manufacturing apparatus |
| JP2014070553A (en) * | 2012-09-28 | 2014-04-21 | Nitto Denko Corp | Gear structure |
| JP2014069408A (en) * | 2012-09-28 | 2014-04-21 | Nitto Denko Corp | Gear structure |
| JP2014005429A (en) * | 2012-05-31 | 2014-01-16 | Nitto Denko Corp | Roll type sheet |
| WO2013180068A1 (en) * | 2012-05-31 | 2013-12-05 | 日東電工株式会社 | Sheet manufacturing method and sheet manufacturing device |
| WO2013180069A1 (en) * | 2012-05-31 | 2013-12-05 | 日東電工株式会社 | Rolled sheet |
| JP6353184B2 (en) | 2012-07-26 | 2018-07-04 | 味の素株式会社 | Adhesive sheet with protective film, method for producing laminate, and method for producing printed wiring board |
| JP6343884B2 (en) | 2012-09-03 | 2018-06-20 | 味の素株式会社 | Hardened body, laminate, printed wiring board, and semiconductor device |
| JP6545924B2 (en) | 2012-12-27 | 2019-07-17 | 味の素株式会社 | Roughened hardened body, laminate, printed wiring board and semiconductor device |
| TWI694109B (en) | 2013-06-12 | 2020-05-21 | 日商味之素股份有限公司 | Resin composition |
| JP6303320B2 (en) | 2013-08-06 | 2018-04-04 | 味の素株式会社 | Manufacturing method of component mounting board |
| KR101556658B1 (en) | 2013-11-26 | 2015-10-01 | 주식회사 두산 | Thermoplastic resin composition having excellent heat resistance and low permittivity, prepreg and copper clad laminate using the same |
| JP6164113B2 (en) | 2014-02-19 | 2017-07-19 | 味の素株式会社 | Resin sheet with support |
| JP6467774B2 (en) | 2014-02-28 | 2019-02-13 | 味の素株式会社 | Method for manufacturing printed wiring board |
| TWI653312B (en) * | 2014-03-11 | 2019-03-11 | 日商味之素股份有限公司 | Film |
| JP6672616B2 (en) * | 2014-06-30 | 2020-03-25 | 味の素株式会社 | Resin composition, adhesive film, printed wiring board, and semiconductor device |
| WO2016072463A1 (en) * | 2014-11-07 | 2016-05-12 | 日立化成株式会社 | Resin composition for sealing film, sealing film, sealing film with support, and electronic apparatus |
| JP5979516B2 (en) * | 2015-02-18 | 2016-08-24 | パナソニックIpマネジメント株式会社 | Printed wiring board and manufacturing method thereof |
| JP6610928B2 (en) * | 2015-08-13 | 2019-11-27 | 味の素株式会社 | Thermosetting resin composition |
| JP7085857B2 (en) * | 2017-03-01 | 2022-06-17 | ナミックス株式会社 | Resin composition, protective film for chip resistors, and chip resistors |
| JP7247471B2 (en) * | 2017-05-10 | 2023-03-29 | 味の素株式会社 | resin composition |
| JP6919508B2 (en) | 2017-11-07 | 2021-08-18 | 味の素株式会社 | Resin composition |
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| JP4400191B2 (en) * | 2003-11-28 | 2010-01-20 | 住友ベークライト株式会社 | Resin composition and substrate using the same |
| WO2005092945A1 (en) * | 2004-03-29 | 2005-10-06 | Sumitomo Bakelite Co., Ltd. | Resin composition, metal foil with resin, insulating sheet with base material and multilayer printed wiring board |
| MY154599A (en) * | 2006-10-06 | 2015-06-30 | Sumitomo Bakelite Co | Resin composition, insulating sheet with base, prepreg, multilayer printed wiring board and semiconductor device |
| TWI455988B (en) * | 2006-10-13 | 2014-10-11 | Ajinomoto Kk | Resin composition |
| JP4888147B2 (en) * | 2007-02-13 | 2012-02-29 | 住友ベークライト株式会社 | Resin composition, insulating resin sheet with film or metal foil, multilayer printed wiring board, method for producing multilayer printed wiring board, and semiconductor device |
| JP5384809B2 (en) * | 2007-07-18 | 2014-01-08 | 三菱瓦斯化学株式会社 | Prepreg and laminate |
| JP5252869B2 (en) * | 2007-09-25 | 2013-07-31 | 三菱レイヨン株式会社 | Epoxy resin composition for fiber reinforced composite material and prepreg |
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| KR101692704B1 (en) | 2017-01-04 |
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