200931684 九、發明說明 【發明所屬之技術領域】 本發明係有關半導體發光元件之構造’特別是有關具 備夾持半導體而加以對向配置之電極的元件構造。 -- 【先前技術】 . 揭示有針對在夾持發光層而層積P型半導體層及11型 Φ 半導體層之發光元件,爲了使供給至兩半導體層之電流擴 散至半導體平面之全面,將從外部電極之連接部延伸之電 極延伸部,沿著電極形成面的週緣部而加以形成之技術 (例如,專利文獻1 )。 作爲一例,在圖14之平面圖所示之發光元件100 中,與P型半導體層連接之p型襯墊部102乃配置於元件 之中央區域。另外,與η型半導體層連接之η型襯墊部 101乃形成於在矩形狀之電極形成部的角部,從其η型襯 φ 墊部101所延伸之電極延伸部l〇la係形成完全包圍電極 形成面之周圍四邊所有所成之包圍電極l〇lb。經由其包圍 ' 電極1 0 1 b,電流乃必須將η型半導體層移動至側方之平均 , 距離則降低,其結果,因可降低裝置之串聯阻抗,而電流 密度的均一性則提昇。 另外,近年來,對應更高輸出話的要求,伴隨η電極 側之電極構造之大面積化,由將包圍電極,極接近元件之 外周圍,也就是無餘地地從包圍電極配置至外周者,謀求 包圍電極範圍之增大化。加上,亦開發有由將經由其電極 -4- 200931684 延伸部之包圍範圍內,區分爲電極延伸部,且 複數之小範圍者,將區分範圍內之電流的擴散 構成,謀求發光均一性之提昇的構造。 例如,在圖1 5之平面圖所示之發光元件 極襯墊部201乃配置於矩形狀之電極形成面的 ·- 地,從其電極襯墊部201所延伸之電極延伸部 , 著電極形成面的周緣四邊而形成包圍電極201b φ 構成電極襯墊部201之角部之相互垂直交叉之 地加以分歧之複數電極延伸部201a乃各彎曲 將包圍電極201b內,區分爲複數之區分範圍 15的例中,複數之區分範圍乃略相似之L狀 隨著從電極襯墊部201離間而擴大,但在各區 度乃略等間隔。由此構造,降低在電極形成面 部電流密度之明顯差別,即促進電流擴散而期 面內之電流密度成爲更均一。 〇 專利文獻1 :日本特開2000- 1 64930號公報 、 【發明內容】 * [發明欲解決之課題] 但,本發明者係重新發現在電極延伸部之 電流集中,其結果,招致根據部位之電流的不 的不均係成爲元件內之過度發熱及蓄熱的要因 於元件的載體注入效率下降,促使量子效率之 地,經由在包圍電極之線長及範圍的遮光,反 更加地作爲 作爲均一之 200中,電 角部。更加 20 1 a乃圍 。加上由從 2邊,均等 爲直角者, 203 。在圖 ,各範圍係 分範圍的寬 的部位之局 待電極形成 彎曲範圍, 均者。電流 ,並且因對 下降。更加 而在以往的 -5- 200931684 外緣部包圍電極構造中’發現輸出降低者。 另外,針對在經由將高輸出作爲目的之投入電力之增 加的大電流驅動,更誘發上述的問題。加上在不充分的放 熱中,經由元件內之環境溫度的上升,引起在外部連接範 圍之合金組成的變化,其結果,有著亦誘發電阻的增加, -- 發光強度及元件本身的劣化等之虞。 : 本發明係爲了消解如以往之問題點所作爲之構成。本 Φ 發明之主要目的乃提供將局部電流密度作爲均一之同時, 對於放熱性優越之構造,進而即使在大電流區域,亦高效 率的發光同時,壽命長,高信賴性之發光元件及使用其之 發光裝置者。 [爲解決課題之手段] 爲了達成上述之目的,本發明之第1之發光元件,屬 於具有具備夾持發光層13所層積之第1導電型層11及第 〇 2導電型層12之半導體構造10,和對於第1導電型層11 及第2導電型層12,各自電性連接,相互對向之第1電極 • 21及第2電極21之發光元件,其特徵乃第1電極21係具 * 備形成於位置在光取出側之第1導電型層11上之電極形 成面1 5,相互對向之一對的電極延伸部3 0,針對在一對 的電極延伸部30之對向方向,該電極延伸部30間之W2 的距離乃較從電極延伸部30至電極形成面15的端緣爲止 之距離L2爲短者。 另外,本發明之第2之發光元件,屬於具有具備夾持 -6 - 200931684 發光層13所層積之第1導電型層11及第2導電型層12 之半導體構造10’和對於第1導電型層11及第2導電型 層12,各自電性連接,相互對向之第1電極21及第2電 極21之發光元件,其特徵乃第1電極21係具備形成於位 置在光取出側之第1導電型層U上之電極形成面15 ’相 , 互對向之一對的電極延伸部30,電極形成面15乃具備在 . 其電極形成面15之略中央區域,經由電極延伸部30所夾 0 持之第1範圍31,位置於第1範圍31之外週緣與電極形 成面15之端緣之間的第2範圍32,針對在一對的電極延 伸部30之對向方向,從第1範圍31之中心至電極形成面 15之端緣爲止的寬度中心乃位置於第2範圍32者。 另外,本發明之第3之發光元件,其特徵乃針對在一 對的電極延伸部30之對向方向,從電極延伸部30至電極 形成面15的端緣爲止的距離L2乃對於一對的電極延伸部 30之1/2之距離11而言,爲1.2倍以上1.5倍以下者。 〇 另外,本發明之第4之發光元件,其特徵乃針對在從 光取出側之平面視,電極延伸部30乃將電極形成面15之 • 中心作爲基準而略點對稱地加以配置者。 * . 另外,本發明之第5之發光元件,其特徵乃針對在從 光取出側之平面視,電極延伸部3 0乃直線狀者。 另外,本發明之第6之發光元件,其特徵乃由電極延 伸部3 0所夾持之第丨範圍31乃開口於其電極延伸部3 〇 之延伸方向者。 另外’本發明之第7之發光元件,其特徵乃針對在一 200931684 對的電極延伸部30乃重疊於電極延伸部30上之一部分, 各具有外部電極與連接可能之外部連接範圍16,一對的外 部連接範圍16係對於電極形成面15之長度方向及/或短 方向而言,相互地加以偏置者。 另外,本發明之第8之發光元件,其特徵乃針對在從 ·- 光取出側之平面視,第1電極2 1及第2電極2 1係相互地 : 加以偏置,從第1電極2 1之電極延伸部3 0,於位置於與 〇 電極形成面15之端緣之間的第2範圍32,形成第2電極 21。 另外,本發明之第9之發光元件,其特徵乃包圍第1 範圍之第2範圍32乃各具有配置於在電極延伸部30之延 伸方向的兩端範圍之第2左右範圍,和配置於在電極延伸 部30之對向方向的兩端範圍之第2上下範圍,各第2左 右範圍之寬度L3乃各第2上下範圍之寬度L4之0.2以上 0 · 8以下者。 ® 另外,本發明之第10之發光裝置,屬於具有;具有 第1電極圖案與第2電極圖案之基台14,和載置於基台 ' 14上,各電性連接第1電極圖案與第2電極圖案之一或複 * 數之發光元件1的發光裝置,其特徵乃發光元件1係爲如 申請專利範圍第1項乃至第9項任一記載之發光元件,且 經由元件被覆構件26所被覆者。 另外,本發明之第11之發光裝置,其特徵乃於元件 被覆構件26,含有吸收來自發光元件1之出射光的至少一 部分而進行波長變換之波長變換構件9及/或反射來自發 -8- 200931684 光元件1之出射光的光擴散構件者。 [發明之效果] 如根據本發明之發光元件,針對在第1電極之電極形 成面,由將離間之一對之電極延伸部30配置於靠中央 -- 者,相對地可擴大電極延伸部之外側範圍。於其電極延伸 ; 部之外側範圍,傳播在元件內之電極附近的發熱,或在一 φ 對之電極延伸部的夾帶區域的發熱而加以放熱。即,因可 擴大放熱範圍,而降低元件內之蓄熱,可作爲對於放熱性 優越之發光元件。 另外,如根據本發明之發光裝置,可作爲對於放熱性 優越,即使在大電流驅動下,信賴性亦高之發光裝置。更 加地於元件被覆構件內,由使波長變換構件或光擴散構件 混合者,加上於反射或散亂光的效果,因可變換來自光源 之出射光的波長,而得到在特定之色域具有高出之發光裝 〇 置。另外,如選擇性地搭載具有特定之波長的光源,成爲 可高效率地射出所期望之發光色的發光裝置,可實現之出 ' 射光的波長區域則增大。 【實施方式】 以下,將本發明之實施例,依據圖面加以說明。但, 以下所示之實施例乃例示爲了將本發明之技術思想做爲具 體化之發光元件,及使用其之發光裝置者,本發明係並未 將發光元件及使用其之發光裝置,特定爲以下之構成。更 -9- 200931684 加地,本說明書係呈容易理解申請專利之範圍,將對應於 實施例所示之構件的號碼,附記於「申請專利之範圍」, 及「爲解決課題之手段欄」所示之構件。但,將申請專利 之範圍所示之構成,作爲絕非特定爲實施例之構件者。特 別是記載於實施例之構成構件的尺寸,材質,形狀,其相 : 對之配置等係在無特定之記載,係爲將本發明之範圍只限 r 定於此者,而只不過爲說明例。 0 然而,各圖面所示之構件之尺寸或位置關係等係爲了 將說明作爲明確而有誇張者。更加地,在以下之說明,對 於同一之名稱,符號,係顯示同一或同質之構件,適宜省 略詳細說明。更加地,構成本發明之各要素係亦可做爲由 同一之構件構成複數之要素,以一個構件兼用複數之要素 的形態,相反地亦可由複數之構件而分擔一個構件之機能 而實現者。另外,在本說明書,層上等之「上」係指未必 限於接觸於上面所形成之情況,而亦包含作爲離間而形成 〇 於上方之情況,亦包含於層與層之間存在有介在層之情況 而使'用。 • [實施形態1] 圖1所示之平面圖乃關於本發明之實施形態之發光元 件1之一例。另外’將在圖1之11-11’線之剖面圖,顯示 於圖2’將在圖1之ΙΠ-ΙΙΓ線之剖面圖,顯示於圖3。 圖2或圖3所示之發光元件1乃主要由支擦台3,和 位置於其支撐台3之上方的半導體構造1〇,和將半導體構 -10- 200931684 造10夾持於上下之電極20所構成。另外,支撐台3乃依 支撐基板4及黏著層5順序加以層積所固定。另一方面, 半導體構造10乃具有發光層13,和夾持其發光層13所層 積之第1導電型層11之η型半導體層,和第2導電型層 12之ρ型半導體層。在圖例中,依ρ型半導體層12,發 -- 光層13 ’η型半導體層11順序層積而構成半導體構造 . 1 〇 ’位置於半導體構造1 〇之上方側的η型半導體層1 1側 0 乃成爲來自發光層13之出射光的主發光面側,即光取出 側。 (電極) 另外’電極20乃具有於各η型半導體層11及ρ型半 導體層12’供給電力之第1電極21及第2電極22。具體 而言,對於η型半導體層11係形成有第1電極21之η型 電極,成爲可電力供給。同樣地,於ρ型半導體層12之 〇 主面的一部分,形成有第2電極22。 圖1乃在從光取出側的平面示之發光元件1的平面 * 圖,主要圖示在η型半導體層11上之η型電極21的形成 . 圖案。如圖1所示,η型電極21乃形成於正方形狀之電極 形成面15之略中央區域,由一對線狀之電極延伸部30所 構成’未具有沿著電極形成面15之端緣形狀圍著週緣之 包圍電極構造。但,電極形成面15之形狀乃並不局限於 正方形狀,而可作爲正多角形,平行四邊等矩型,多角 形,圓形等之他,依存於η型半導體層11之露出範圍的 -11 -BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a structure of a semiconductor light-emitting device, particularly an element structure relating to an electrode having a semiconductor element sandwiched therebetween. [Prior Art] A light-emitting element for laminating a P-type semiconductor layer and an 11-type Φ semiconductor layer in which a light-emitting layer is sandwiched is disclosed, in order to diffuse a current supplied to the two semiconductor layers to a semiconductor plane, A technique in which an electrode extension portion in which a connection portion of an external electrode extends is formed along a peripheral portion of an electrode formation surface (for example, Patent Document 1). As an example, in the light-emitting element 100 shown in the plan view of Fig. 14, the p-type pad portion 102 connected to the P-type semiconductor layer is disposed in the central region of the element. Further, the n-type pad portion 101 connected to the n-type semiconductor layer is formed at a corner portion of the rectangular electrode forming portion, and the electrode extension portion l〇la extending from the n-type lining pad portion 101 is completely formed. The surrounding electrode l〇b is formed on all four sides surrounding the electrode forming surface. By surrounding the 'electrode 1 0 1 b, the current must move the n-type semiconductor layer to the lateral average, and the distance is lowered. As a result, the series impedance of the device can be lowered, and the uniformity of the current density is improved. Further, in recent years, in response to the demand for higher output words, the area of the electrode structure on the side of the n-electrode is increased from the surrounding electrode to the periphery of the element, that is, from the surrounding electrode to the outer periphery. The increase in the range of the surrounding electrodes is sought. In addition, it is also developed that the electrode extension portion is divided into the electrode extension portion by the extension portion of the electrode -4-200931684, and a plurality of plural ranges are formed, and the diffusion of the current in the range is formed to achieve luminescence uniformity. Improved structure. For example, the light-emitting element pole pad portion 201 shown in the plan view of Fig. 15 is disposed on the rectangular electrode forming surface, the electrode extending portion extending from the electrode pad portion 201, and the electrode forming surface. The peripheral electrode 201b φ is formed on the four sides of the periphery, and the plurality of electrode extensions 201a which are formed by the corner portions of the electrode pad portion 201 which are perpendicularly intersecting each other are formed so as to be surrounded by the electrodes 201b and divided into plural numbers 15 In the middle, the L-shaped shape in which the plural numbers are slightly similar is enlarged as being separated from the electrode pad portion 201, but is equally spaced at each interval. With this configuration, the significant difference in current density at the electrode forming surface is reduced, i.e., current spreading is promoted and the current density in the surface becomes more uniform. [Patent Document 1] Japanese Patent Laid-Open Publication No. 2000- 1 64930, and the present invention. [Invention of the Invention] However, the inventors of the present invention have newly discovered the current concentration in the electrode extension portion, and as a result, have been caused by the portion. The uneven current is caused by excessive heat generation and heat storage in the element, and the carrier injection efficiency of the element is lowered, and the quantum efficiency is promoted. 200, electric corner. More 20 1 a is around. Plus by the two sides, equal to the right angle, 203. In the figure, the range of the wide range of the range of the electrodes is to be formed into a bending range, both of which are. Current and drop due to the pair. Further, in the conventional -5-200931684 outer edge surrounding electrode structure, it was found that the output was lowered. In addition, the above-mentioned problem is further induced for driving at a large current which is increased by the input power for high output. In addition, in the case of insufficient heat release, the change in the alloy composition in the external connection range is caused by the rise in the ambient temperature in the element, and as a result, the increase in the induced resistance, the light-emitting intensity, and the deterioration of the element itself are caused. Hey. The present invention is constructed to eliminate problems as in the past. The main object of the present invention is to provide a light-emitting element which has a high local heat density and a structure which is excellent in heat dissipation, and which has high-efficiency light emission, long life, and high reliability even when used in a large current region. Light-emitting device. [Means for Solving the Problem] In order to achieve the above object, the first light-emitting element of the present invention belongs to a semiconductor including the first conductive type layer 11 and the second conductive type layer 12 in which the light-emitting layer 13 is sandwiched. The structure 10 and the light-emitting elements of the first electrode 21 and the second electrode 21 which are electrically connected to each other and the first conductive type layer 11 and the second conductive type layer 12 are characterized by the first electrode 21 The electrode forming surface 15 formed on the first conductivity type layer 11 on the light extraction side, and the electrode extension portion 30 facing each other in the opposite direction are opposed to each other in the pair of electrode extension portions 30 In the direction, the distance W2 between the electrode extending portions 30 is shorter than the distance L2 from the electrode extending portion 30 to the end edge of the electrode forming surface 15. Further, the second light-emitting device of the present invention belongs to the semiconductor structure 10' having the first conductive type layer 11 and the second conductive type layer 12 laminated with the light-emitting layer 13 sandwiching -6 - 200931684, and the first conductive layer. The first layer 21 and the second electrode 21 are electrically connected to each other, and the first electrode 21 and the second electrode 21 are electrically connected to each other, and the first electrode 21 is formed at a position on the light extraction side. The electrode forming surface 15' on the first conductive type layer U, the electrode extending portion 30 facing each other, and the electrode forming surface 15 are provided in a slightly central portion of the electrode forming surface 15, via the electrode extending portion 30. The first range 31 held by the clamp 0 is located in the second range 32 between the outer periphery of the first range 31 and the end edge of the electrode forming surface 15, and is directed in the opposing direction of the pair of electrode extending portions 30. The center of the width from the center of the first range 31 to the edge of the electrode forming surface 15 is in the second range 32. Further, the third light-emitting device of the present invention is characterized in that the distance L2 from the electrode extending portion 30 to the edge of the electrode forming surface 15 in the opposing direction of the pair of electrode extending portions 30 is for a pair The distance 11 of 1/2 of the electrode extension portion 30 is 1.2 times or more and 1.5 times or less. Further, in the fourth aspect of the invention, the light-emitting element of the present invention is characterized in that the electrode extending portion 30 is arranged in a point symmetrical manner with respect to the center of the electrode forming surface 15 as a reference from the plane of the light extraction side. Further, the light-emitting element of the fifth aspect of the present invention is characterized in that the electrode extending portion 30 is linear in view from the plane on the light extraction side. Further, in the sixth aspect of the invention, the light-emitting element of the present invention is characterized in that the third region 31 sandwiched by the electrode extension portion 30 is opened in the direction in which the electrode extension portion 3 is extended. Further, a light-emitting device according to a seventh aspect of the present invention is characterized in that the electrode extension portion 30 of a pair of 200931684 is overlapped with a portion of the electrode extension portion 30, each having an external electrode and a connection external connection range 16, a pair The external connection range 16 is offset from each other in the longitudinal direction and/or the short direction of the electrode forming surface 15. Further, in the eighth aspect of the present invention, the first electrode 2 1 and the second electrode 2 1 are mutually offset from the first electrode 2 in a plan view from the light extraction side. The electrode extension portion 30 of 1 forms the second electrode 21 at a second range 32 between the end edge and the edge of the ytterbium electrode forming surface 15. Further, the ninth aspect of the present invention is characterized in that the second range 32 surrounding the first range has a second left-right range disposed at both end portions in the extending direction of the electrode extending portion 30, and is disposed in the second light-emitting region. The second upper and lower ranges of the both ends of the electrode extending portion 30 in the opposing direction, and the width L3 of each of the second and right ranges are 0.2 or more and 0.8 or less of the width L4 of each of the second upper and lower ranges. Further, a light-emitting device according to a tenth aspect of the present invention includes: a base 14 having a first electrode pattern and a second electrode pattern; and a substrate 14 disposed on the base 14 and electrically connected to the first electrode pattern and the first electrode pattern A light-emitting device of one of the two electrode patterns or the plurality of light-emitting elements 1 is characterized in that the light-emitting element 1 is a light-emitting element according to any one of claims 1 to 9 and is provided by the element covering member 26 Covered. Further, the illuminating device according to a eleventh aspect of the present invention is characterized in that the element covering member 26 includes a wavelength converting member 9 that absorbs at least a part of the light emitted from the light-emitting element 1 and performs wavelength conversion, and/or a reflection from the -8- 200931684 Light diffusing member of the light element 1 that emits light. [Effects of the Invention] According to the light-emitting device of the present invention, the electrode extending portion of the first electrode can be enlarged by the electrode extending portion 30 of the first electrode. Outer range. The heat is radiated in the vicinity of the electrode in the element, or the heat is generated in the vicinity of the electrode in the extension of the electrode. That is, since the heat release range can be expanded and the heat storage in the element can be reduced, it can be used as a light-emitting element excellent in heat dissipation. Further, according to the light-emitting device of the present invention, it is possible to provide a light-emitting device which is superior in heat dissipation property and has high reliability even under high current driving. Further, in the element covering member, the effect of adding the wavelength converting member or the light diffusing member to the reflected or scattered light is such that the wavelength of the emitted light from the light source can be converted to obtain a specific color gamut. A light-emitting device that is higher. Further, if a light source having a specific wavelength is selectively mounted, a light-emitting device capable of efficiently emitting a desired luminescent color can be realized, and the wavelength region of the emitted light can be increased. [Embodiment] Hereinafter, embodiments of the present invention will be described with reference to the drawings. However, the embodiments shown below are illustrative of a light-emitting element that embodies the technical idea of the present invention, and a light-emitting device using the same, and the present invention does not specify a light-emitting element and a light-emitting device using the same. The following composition. -9- 200931684 ADDITIONAL STATEMENT This specification is intended to provide an easy understanding of the scope of the patent application, and the number corresponding to the components shown in the embodiment is attached to the "Scope of Application for Patent" and the "Remedy for Resolving the Problem" column. The components. However, the constitution shown in the scope of the patent application is not intended to be a component of the embodiment. In particular, the dimensions, materials, shapes, and phases of the constituent members described in the examples are not specifically described, but the scope of the present invention is limited to the above, and is merely illustrative. example. 0 However, the dimensions or positional relationships of the components shown in the drawings are intended to be illustrative and exaggerated. More specifically, in the following description, the same name or symbol indicates the same or homogeneous member, and the detailed description is omitted. Incidentally, the constituent elements of the present invention may be formed as a plurality of elements by the same members, and a single member may be used in combination with a plurality of elements, and conversely, a function of one member may be shared by a plurality of members. In addition, in the present specification, "upper" on a layer or the like means not necessarily limited to the case where it is formed in contact with the above, but also includes a case where the upper side is formed as a separation, and also includes a layer interposed between the layers. In the case of 'use. [Embodiment 1] A plan view shown in Fig. 1 relates to an example of a light-emitting element 1 according to an embodiment of the present invention. Further, a cross-sectional view taken along line 11-11 of Fig. 1 is shown in Fig. 2, which is a cross-sectional view taken along line ΙΠ-ΙΙΓ of Fig. 1, and is shown in Fig. 3. The light-emitting element 1 shown in FIG. 2 or FIG. 3 is mainly composed of a cleaning table 3, and a semiconductor structure 1 位置 positioned above the support table 3, and an electrode sandwiching the semiconductor structure 10-200931684 20 components. Further, the support table 3 is fixed by lamination in the order of the support substrate 4 and the adhesive layer 5. On the other hand, the semiconductor structure 10 has a light-emitting layer 13 and an n-type semiconductor layer sandwiching the first conductive type layer 11 in which the light-emitting layer 13 is laminated, and a p-type semiconductor layer of the second conductive type layer 12. In the illustrated example, the p-type semiconductor layer 12 and the light-emitting layer 13'n-type semiconductor layer 11 are sequentially laminated to form a semiconductor structure. 1 〇' is located at the upper side of the semiconductor structure 1 的 the n-type semiconductor layer 1 1 The side 0 is the side of the main light-emitting surface from the light emitted from the light-emitting layer 13, that is, the light-removing side. (Electrode) The electrode 20 is provided with a first electrode 21 and a second electrode 22 for supplying electric power to each of the n-type semiconductor layer 11 and the p-type semiconductor layer 12'. Specifically, the n-type electrode of the first electrode 21 is formed on the n-type semiconductor layer 11, and electric power can be supplied. Similarly, a second electrode 22 is formed on a part of the main surface of the p-type semiconductor layer 12. Fig. 1 is a plan view of the light-emitting element 1 shown in a plane from the light extraction side, mainly showing the formation of the n-type electrode 21 on the n-type semiconductor layer 11. As shown in FIG. 1, the n-type electrode 21 is formed in a substantially central region of the square-shaped electrode forming surface 15, and is constituted by a pair of linear electrode extending portions 30 which do not have an edge shape along the electrode forming surface 15. The surrounding electrode structure surrounds the circumference. However, the shape of the electrode forming surface 15 is not limited to a square shape, but may be a positive polygon, a parallelogram, a rectangular shape, a polygonal shape, a circular shape or the like, depending on the exposed range of the n-type semiconductor layer 11 - 11 -
200931684 形狀而加以調節。 另外,圖1所示之電極延伸部30乃電極形j 宁央區域,將中心C作爲基準,配置成略點對指 爲離間。更加地,針對在從光取出側的平面視, 部30之形狀乃未作爲分支之線狀,形成爲細 狀。另外,作爲對向之一對之電極延伸部30乃 互交叉,在圖1的例中,線狀的電極延伸部30 地加以延伸,離間距離係實質上爲等間隔。如此 地配置來自外部之電力供給範圍者,可高效率地 電極形成面15之全面的電流擴散。另外,由採 伸部3 0乃相互作爲離間,且未具備交叉或分歧 造者,抑制了電流的集中,而謀求電流密度之均 升。. 另外,電極形成15乃具有分割成第1範圍 圍之發光範圍29。具體而言,針對在圖1,如公 〇 助線所示,將經由作爲對向之一對之電極延伸窗 持之範圍,作爲第1範圍31,更加地,爲其第 * 之四方周邊範圍,即,將位置於第1範圍315 . 和構成電極形成面15之四邊的端緣之間之範圍 範圍32。換言之,電極延伸部30之形成位置7 第1範圍31與第2範圍32之邊界者,進而決芳 之分配量。以下,對於電極延伸部30之最佳β 加以說明。 電極延伸部30乃針對在一對之電極延伸部 突面15之 :,相互作 電極延伸 長一條線 未作爲相 乃略平行 ,由對稱 實現對於 用電極延 之直線構 一性的提 與第2範 虛線之補 30所夾 1範圍3 1 外周緣, 作爲第2 成爲固定 雙方範圍 形成範圍 30之對向 -12- 200931684 方向,從電極形成面15的中心C至端緣爲止之中點Μ乃 呈位置於第2範圍地加以配置。換言之,針對在電極延伸 部30之對向方向,從第1範圍31之中心至電極形成面15 之端緣爲止的寬度中心乃位置於第2範圍32。此時,發光 元件1的η型電極21乃在電極延伸部30之對向方向,電 -- 極延伸部30之距離L1的1/2之距離乃較從電極延伸部30 , 至電極形成面15之端緣爲止之距離L2爲小。由此,可提 Q 升後述之電流注入與擴散,放熱機能者。更加地,將其, 以寬度之中心線形成爲線對稱之元件中,第1範圍31之 寬度Η1乃較跨越第1範圍之上下的第2範圍之寬度的合 計Η2爲小,即,電極延伸部3 0乃靠中央加以配置。更具 體而言,針對在一對的電極延伸部30之對向方向,從電 極延伸部30至電極形成面15的端緣爲止的距離L2乃對 於一對的電極延伸部30間之1/2之距離1 1而言,爲1.2 倍以上1.5倍以下者爲佳。如爲此範圍,防止經由一對之 〇 電極延伸部之接近的第1範圍之過度溫度上升同時,可提 昇元件之放熱性。其結果,即使在大電流區域下,亦可得 * 到高效率之發光,壽命長,高信賴性之元件。 . 加上,在圖1之發光元件1中,第2範圍32乃包圍 第1範圍之四方所成。其第2範圍32乃針對在圖1之左 右方向,各具有配置於兩端範圍之第2左右範圍33’和配 置於在電極延伸部30之對向方向(圖1之上下方向)的 兩端範圍之第2上下範圍34。第2左右範圍33的寬度L3 係因在電極延伸部30之延伸方向,從電極延伸部30之端 -13- 200931684 緣’與電極形成面15之端緣實質上爲一致,而換言之, 第2左右範圍33的寬度L3係依存於電極延伸部3〇之延 伸程鸾。電極延伸部30係各第2左右範圍的寬度L3乃呈 成爲各第2上下範圍的寬度L4之0.2以上0.8以下地加以 配置者爲佳。如爲此範圍,因作爲未具有η型電極21之 ·- 交叉部,而可增加在電極形成面15內之電極延伸部30的 ; 配置比例。由此,迴避了電流之局部集中而促進電流之面 Q 內擴散同時,可抑制發光範圍之降低,或可使發光範圍增 加,而得到高輸出。 更加地,如爲滿足上述之範圍的電極配置,在電極形 成面15之平面視,可將在第1範圍31內的發熱,二維性 地傳達至未至於其四方之第2範圍,得到高效率之放熱作 用。加上,電極延伸部30之端緣乃位置於第1範圍31與 第2左右範圍33之邊界,可作爲從電極形成面15之端緣 離間之構造。即,存在於作爲對向之一對的電極延伸部30 〇 間之第1範圍31乃在電極延伸部30之延伸方向,作爲開 口。由如此將電極之一部分加以離間,理想爲未具有交 * 叉,彎曲部,更理想爲相互作爲離間者,可控制在其連接 • 部,交叉,彎曲部各部之電流,發熱之集中,可適當地提 昇第1,2範圍之電流注入,放熱機能者。 經由上述構造’可抑制經由電極延伸部30之過度接 近之第1範圍31內之過度的溫度上升及蓄熱同時’即使 在鄰接之寬廣之放熱範圍’即第2範圍32,或電極延伸部 3 〇之開口部附近’亦可效率佳地將電極延伸部3 0附近及 -14- 200931684 第1範圍31內之發熱進行放熱。其結果,可作爲針對在 大電流驅動下,亦具有高信賴性之發光元件。 另外,電極延伸部30之延伸程度並不局限於上述範 圍,如圖4所示,亦可將電極延伸部3 0 ’,以相當於半導 體構造1〇之一邊,即電極形成面15之一邊的長度而設 -- 置。經由如此電極到達至端緣爲止延伸之電極配置,在發 : 光元件60,將經由一對之電極延伸部3 0所夾持之第1範 ❹ 圍31,作爲在長度方向之端緣乃與電極形成面15之端緣 略相同。即,在長度方向之第1範圍31之寬度乃實質上 相當於電極形成面15之一邊。其結果,因作爲未具有交 叉部,而可更使對於電極形成面15之電極延伸部30’之配 置比例增大者,而抑制電流之不均同時,可進行電流注 入,發光效率則提昇。 另外,在第1範圍31的發熱係因在與電極延伸部30’ 之延伸方向之略垂直交叉方向,傳達至夾持第1範圍31 〇 之第2範圍32,在具有其寬廣之放熱範圍的第2範圍加以 放熱,而可控制元件全體之蓄熱。更加地,第1範圍31 • 係與圖1之發光元件1同樣,在電極延伸部30’之延伸方 . 向,具有開口部,由此更提昇放熱效果。然而,針對在圖 4之發光元件60係與在圖1之發光元件1作比較,唯電極 延伸部的構造不同,其他的構造係因實質上相同,而附上 同一之符號,省略詳細說明。 如此,針對在上述寬度中心之構造,可姜埼作爲一部 分具有之構造,理想爲將其展開之構造,例如在上述圖4 -15- 200931684 的例中,於通過中心C之面積二等分線之兩側,具有此之 構造者。其他,亦可作爲以中心C旋轉而展開之構造,例 如圖11所示之4次旋轉對稱之構造者。如此,由一部分 地展開上述寬度中心之構造者,可具備本發明之機能,由 增加其構造佔元件全體之比例者,可提昇其機能者。該寬 : 度中心的構造乃具體而言爲1/4以上,更理想爲超過 ; 1/3,最佳爲超過1/2。另外,在圖1的例中,作爲圖4同 Q 樣地展開,但在電極延伸方向,同時未具有上述寬度中心 之構造,但接近於此之構造的圖1的例乃對於機能性爲有 利。如此,在上述一部分之寬度中心的構造,在剩餘部之 範圍的構造乃接近於上述寬度中心之構造者爲佳。在此, 將矩形狀之元件作爲例而加以說明,但針對在略六角形等 之略多角形,略圓形,略橢圓形等各種形狀亦可同樣地適 用。 〇 (偏位配置) 另外,針對在半導體構造10之層積方向,及與層積 . 方向垂直交叉方向,η型電極21及p型電極22乃偏位地 • 加以配置。偏位配置乃具體而言,各電極之對向面乃從該 對向面側的電極各自作爲露出者。並不局限於此,而亦可 在平面視,第1,2電極相互作爲一部分重疊,但相互作 爲鄰接,更加地作爲分離者乃在本發明爲佳。由此,可促 進電流擴散’可使內部量子效率提昇者。另外,在電極形 成面之電流均一性提昇的同時,可作爲降低光不勻之出射 -16- 200931684 光。具體而言,如圖2及圖3所示’夾持發光層13所形 成之η型電極21及p型電極22乃在從光取出側之平面 視,呈未具有重疊範圍地,具有相互不一致之中心軸而加 以配置。即,Ρ型電極22乃形成於在圖1所示之第2範圍 3 2下,對於與鄰接之ρ型電極2 2的離間範圍,係層積有 保護膜7而加以絕緣。 : 更加地,電極延伸部30乃各具有於其一部分可與外 0 部連接之外部連接範圍16之電極襯墊部,換言之,電極 延伸部30係從電極襯墊部16所延伸而配置。在圖1之情 況,靠線狀之電極延伸部30之一方的端部,設置有電極 襯墊部16。更加地,一對之電極襯墊部16係對於構成電 極形成面15之長度方向及/或短方向而言,偏位地加以配 置,在圖1之電極襯墊部16中,將電極形成面15的中心 C’作爲基準而形成於略點對稱之位置。即,於構成電極 形成面15之矩形狀的四邊,將平行之2方向作爲基準, ❹ 相互斜對地加以形成。 另外’電極襯墊部16係與銲接線等之導電構件連 . 結’藉由其導電部,從外部電源供給電流至元件。隨之, . 必然性地將電極襯墊部1 6作爲中心之其附近乃電流密度 爲大。在另一方面’含有電極襯墊部16之電極延伸部30 之形成範圍本身乃因被覆發光範圍29,而在電極延伸部 30的正上方’光採取量則降低。即,由將電極襯墊部16 偏位地配置者’電流集中範圍及光遮斷範圍乃因可防止偏 在於電極形成面1 5內者,而成爲總合性地提昇電流密度 -17- 200931684 之均一性,且可釋放指向性高之出射光的發光元件。另 外,在圖1的例中,於各電極延伸部30,設置一之電極襯 墊部16,但亦可於一之電極延伸部30上或電極形成面15 上設置複數之型態,例如,呈作爲與電極延伸部同樣地機 能,在電極形成面15上,可配置成直線狀之其他,亦Z -- 狀等二維地加以排列。 : 另外,具有發光層13之半導體構造10係亦可爲在該 0 領域以具有公知的方法及構造所製作之任何半導體構造。 圖5〜圖9乃包含半導體構造10之發光元件1之槪略剖面 圖,說明其製造方法之一例的說明圖。以下,使用圖5~圖 9,記述有關實施型態之發光元件1之一例的氮化物半導 體元件之製造方法,及各構件之詳細的說明。 (半導體層) 首先,如圖5所示,於成長基板6上,形成具有第2 〇 導電型層12,發光層13,第1導電型層11之半導體構造 10。成長基板6乃如可使半導體構造10之氮化物半導體 • 磊晶成長之基板爲佳,成長基板的大小或厚度等係並無特 . 別限定。作爲成長基板,可舉出如將C面、R面、及A面 任一作爲主面之藍寶石或尖晶石(MgAl2〇4 )之絕緣性基 板,或碳化矽(6H、4H、3C )、矽,ZnS、ZnO、Si、 GaAs。 另外,亦可使用GaN或AIN等之氮化物半導體基板 者。 -18- 200931684 本發明之半導體構造乃不限於上記,亦可採用Pn接 合、P— i — η構造、MIS構造等各種之發光構造者。另 外,在以下,作爲平導體構造及半導體層,關於氮化物半 導體進行說明,但本發明砂不限於此,而對於GaAs系、 InP系、例如InGaAs、GaP半導体等之其他材料、波長的 發光素子亦可適用。 ; 於成長基板6上’作爲半導體構造,依η型氮化物半 Q 導體層11’發光層13,ρ型氮化物半導體層12的順序加 以層積。此時,經由成長基板6的材料,於與半導體構造 之間,亦可藉由低溫成長緩衝層,例如1〜3 nm之 AlxGai.xN ( 0 ^ X ^ 1 )、其他、高温成長的層、例如0.5 〜4/zm之AlxGa^xNCOSxSl)等之基底層。η型,ρ型 之氮化物半導體層係可使用例如以AlxGayIni.x_yN ( 0 S X $1、OSygl、χ+ySl)之組成式所表示之構成者,除 此之外,亦可將III,IV族元素之一部份,各自作爲B置 〇 換’以P ’ As,Sb等進行置換。例如,對於η型層1 1係 可使用GaN之接觸層,InGaN/ GaN之多層膜構造,對於200931684 The shape is adjusted. Further, the electrode extension portion 30 shown in Fig. 1 is an electrode-shaped y-yang region, and the center C is used as a reference, and the point-to-point pair is arranged to be separated. Further, the shape of the portion 30 is formed in a thin shape without being branched as a line in view of the plane from the light extraction side. Further, the electrode extension portions 30 which are one of the opposing pairs are mutually intersected, and in the example of Fig. 1, the linear electrode extension portions 30 are extended, and the distance between the separations is substantially equal intervals. By arranging the power supply range from the outside as described above, it is possible to efficiently diffuse the entire current of the electrode forming surface 15. Further, since the projections 30 are mutually separated and there is no crossover or divergence, the concentration of the current is suppressed, and the current density is increased. Further, the electrode formation 15 has a light-emitting range 29 divided into the first range. Specifically, as shown in FIG. 1, as shown by the male auxiliary line, the range of the electrode extension window which is one of the opposite pairs is used as the first range 31, and more specifically, it is the fourth surrounding range of the fourth That is, the range is 32 between the first range 315 . and the end edges constituting the four sides of the electrode forming surface 15 . In other words, the formation position 7 of the electrode extension portion 30 is the boundary between the first range 31 and the second range 32, and further the distribution amount of the fang. Hereinafter, the optimum β of the electrode extension portion 30 will be described. The electrode extension portion 30 is directed to the protrusion portion 15 of the pair of electrode extension portions: a line extending from each other is not parallel to the phase, and the line structure of the electrode extension is symmetrically realized by the symmetry. The range of the dotted line 30 is 1 and the range of 3 1 is the outer circumference. The second direction is the direction of the opposite direction forming range 30, and the direction from the center C to the end edge of the electrode forming surface 15 is the middle point. The position is placed in the second range. In other words, the center of the width from the center of the first range 31 to the edge of the electrode forming surface 15 in the opposing direction of the electrode extending portion 30 is in the second range 32. At this time, the n-type electrode 21 of the light-emitting element 1 is in the opposing direction of the electrode extending portion 30, and the distance 1/2 of the distance L1 of the electrode-extending portion 30 is from the electrode extending portion 30 to the electrode forming surface. The distance L2 from the end of 15 is small. Therefore, the current injection and diffusion described later can be raised, and the heat release function can be improved. Further, in the element in which the center line of the width is formed into line symmetry, the width Η1 of the first range 31 is smaller than the total Η2 of the width of the second range which is above and below the first range, that is, the electrode extension portion 30 is configured by the center. More specifically, the distance L2 from the electrode extending portion 30 to the edge of the electrode forming surface 15 in the opposing direction of the pair of electrode extending portions 30 is 1/2 between the pair of electrode extending portions 30. The distance of 1 is preferably 1.2 times or more and 1.5 times or less. In this range, the excessive temperature rise of the first range which is close to the pair of the electrode extension portions is prevented, and the heat dissipation property of the element can be improved. As a result, even in a large current region, it is possible to obtain a high-efficiency light-emitting, long-life, and highly reliable component. Further, in the light-emitting element 1 of Fig. 1, the second range 32 is formed by surrounding the four sides of the first range. The second range 32 is provided in the left-right direction of FIG. 1 and has a second left-right range 33' disposed at both end ranges and two ends disposed in the opposing direction of the electrode extending portion 30 (upper and lower directions in FIG. 1). The second range of the range is 34. The width L3 of the second left and right range 33 is substantially coincident with the end edge of the electrode forming surface 15 from the end of the electrode extending portion 30 from the end -13 to 200931684 of the electrode extending portion 30, in other words, the second The width L3 of the left and right ranges 33 depends on the extension 鸾 of the electrode extension 3〇. It is preferable that the width L3 of each of the second and right ranges of the electrode extension portion 30 is 0.2 or more and 0.8 or less of the width L4 of each of the second vertical ranges. For this range, the arrangement ratio of the electrode extension portion 30 in the electrode forming surface 15 can be increased as the intersection portion having no n-type electrode 21. Thereby, the local concentration of the current is avoided, and the diffusion of the current surface Q is promoted, and the decrease in the light-emitting range can be suppressed, or the light-emitting range can be increased to obtain a high output. Further, in order to satisfy the above-described range of electrode arrangements, the heat generated in the first range 31 can be two-dimensionally transmitted to the second range which is not in the square, as shown in the plan view of the electrode forming surface 15 The exothermic effect of efficiency. Further, the end edge of the electrode extending portion 30 is located at the boundary between the first range 31 and the second right and left range 33, and can be configured to be separated from the end edge of the electrode forming surface 15. That is, the first range 31 existing between the electrode extension portions 30 which are the opposite pairs is the opening direction of the electrode extension portion 30 as an opening. Therefore, one part of the electrode is separated from each other, and it is preferable that the cross portion is not provided, and the bent portion is more preferably used as an alien, and the current in the connection portion, the cross portion, and the curved portion can be controlled, and the heat can be appropriately concentrated. Ground boosting the current injection of the first and second ranges, and the heat release function. According to the above configuration, excessive temperature rise and heat storage in the first range 31 which is excessively close to the electrode extending portion 30 can be suppressed, and the second range 32, or the electrode extension portion 3, can be suppressed even if it is adjacent to the wide heat release range. In the vicinity of the opening portion, the heat generation in the vicinity of the electrode extension portion 30 and the first range 31 in the period of -14 to 200931684 can be efficiently radiated. As a result, it can be used as a light-emitting element which is also highly reliable in driving under a large current. In addition, the degree of extension of the electrode extension portion 30 is not limited to the above range, and as shown in FIG. 4, the electrode extension portion 3 0 ' may be equivalent to one side of the semiconductor structure 1 ,, that is, one side of the electrode formation surface 15 Set the length - set. By the electrode arrangement in which the electrode reaches the end edge, the first element circumference 31 sandwiched by the pair of electrode extensions 30 in the light-emitting element 60 is the end edge in the longitudinal direction. The end edges of the electrode forming faces 15 are slightly the same. That is, the width of the first range 31 in the longitudinal direction substantially corresponds to one side of the electrode forming surface 15. As a result, the arrangement ratio of the electrode extension portion 30' to the electrode forming surface 15 can be increased without having a cross portion, and current unevenness can be suppressed, and current injection can be performed, and luminous efficiency can be improved. Further, the heat generation in the first range 31 is transmitted to the second range 32 in which the first range 31 夹持 is sandwiched in a direction perpendicular to the direction in which the electrode extension portion 30' extends, and has a wide heat dissipation range. The second range is exothermic, and the heat storage of the entire element can be controlled. Further, the first range 31 is similar to the light-emitting element 1 of Fig. 1, and has an opening portion in the direction in which the electrode extending portion 30' extends, thereby further enhancing the heat radiation effect. However, the light-emitting element 60 of Fig. 4 is different from the light-emitting element 1 of Fig. 1, and the structure of the electrode extension portion is different, and the other structures are substantially the same, and the same reference numerals will be given, and detailed description will be omitted. As described above, the structure having the width center may have a structure as a part, and is preferably a structure in which it is developed. For example, in the example of the above-mentioned FIG. 4-15-200931684, the bisector of the area passing through the center C On both sides, there is a constructor of this. Others may be constructed as a structure in which the center C is rotated, and for example, a structure of four rotation symmetry as shown in Fig. 11 is used. As described above, the structure in which the width center is partially developed can provide the function of the present invention, and the function can be improved by increasing the ratio of the structure to the entire component. The width: the center of the structure is specifically 1/4 or more, more preferably more than 1/3, and most preferably more than 1/2. Further, in the example of Fig. 1, the structure of Fig. 4 is developed in the same manner as Q, but the structure in the direction in which the electrode extends does not have the center of the width described above. However, the example of Fig. 1 having a structure close to this is advantageous for the functional property. . Thus, in the structure of the width center of the above-mentioned part, it is preferable that the structure of the range of the remaining portion is close to the width center. Here, a rectangular element is described as an example. However, various shapes such as a slightly polygonal shape such as a slightly hexagonal shape, a slightly circular shape, and a slightly elliptical shape can be similarly applied. 〇 (Positioning arrangement) Further, the n-type electrode 21 and the p-type electrode 22 are disposed in a direction in which the semiconductor structure 10 is stacked and perpendicular to the direction of the lamination. Specifically, in the misalignment arrangement, the opposing faces of the respective electrodes are exposed as electrodes from the opposing faces. The present invention is not limited thereto, and the first and second electrodes may overlap each other in plan view, but they are adjacent to each other, and it is preferable to use them as a separator. Thereby, the current diffusion can be promoted to increase the internal quantum efficiency. In addition, while the current uniformity of the electrode forming surface is improved, it can be used as a light-reducing emission-16-200931684 light. Specifically, as shown in FIGS. 2 and 3, the n-type electrode 21 and the p-type electrode 22 formed by sandwiching the light-emitting layer 13 are inconsistent with each other in a plane from the light extraction side. Configured with the center axis. That is, the Ρ-type electrode 22 is formed in the second range 3 2 shown in Fig. 1, and the protective film 7 is laminated and insulated from the range of the adjacent p-type electrode 2 2 . Further, the electrode extending portion 30 is provided with an electrode pad portion each having a portion 16 which is connectable to the outer portion 10, and in other words, the electrode extending portion 30 is disposed to extend from the electrode pad portion 16. In the case of Fig. 1, an electrode pad portion 16 is provided at one end of the linear electrode extending portion 30. Further, the pair of electrode pad portions 16 are disposed offset in the longitudinal direction and/or the short direction of the electrode forming surface 15 , and the electrode forming surface is formed in the electrode pad portion 16 of FIG. 1 . The center C' of 15 is formed at a slightly symmetrical position as a reference. In other words, the rectangular four sides constituting the electrode forming surface 15 are formed obliquely to each other with the parallel two directions as a reference. Further, the electrode pad portion 16 is connected to a conductive member such as a bonding wire. The junction is supplied with a current from the external power source to the device by the conductive portion. Accordingly, the current density is large in the vicinity of the electrode pad portion 16 as a center. On the other hand, the formation range of the electrode extension portion 30 including the electrode pad portion 16 itself is due to the coating of the light-emitting range 29, and the amount of light taken at the right side of the electrode extension portion 30 is lowered. In other words, the current concentration range and the light interruption range in which the electrode pad portion 16 is displaced are prevented from being biased in the electrode forming surface 15 to increase the current density -17-200931684 Uniformity, and can release a light-emitting element with high directivity and outgoing light. Further, in the example of FIG. 1, an electrode pad portion 16 is provided in each electrode extending portion 30, but a plurality of patterns may be provided on one electrode extending portion 30 or on the electrode forming surface 15, for example, The function is similar to that of the electrode extension portion, and the electrode forming surface 15 may be arranged in a straight line, and may be arranged two-dimensionally in a Z-shape or the like. Further, the semiconductor structure 10 having the light-emitting layer 13 may be any semiconductor structure fabricated by a known method and structure in the field of the zero. Figs. 5 to 9 are schematic cross-sectional views showing a light-emitting element 1 of a semiconductor structure 10, and an explanatory view showing an example of a method of manufacturing the same. Hereinafter, a method of manufacturing a nitride semiconductor element according to an example of the light-emitting element 1 of the embodiment will be described with reference to Figs. 5 to 9, and a detailed description of each member will be given. (Semiconductor Layer) First, as shown in Fig. 5, a semiconductor structure 10 having a second 导电 conductivity type layer 12, a light-emitting layer 13, and a first conductivity type layer 11 is formed on the growth substrate 6. The growth substrate 6 is preferably a substrate in which the nitride semiconductor of the semiconductor structure 10 can be epitaxially grown, and the size or thickness of the growth substrate is not particularly limited. Examples of the growth substrate include an insulating substrate of sapphire or spinel (MgAl 2 〇 4 ) having a C surface, an R surface, and an A surface as a main surface, or tantalum carbide (6H, 4H, 3C).矽, ZnS, ZnO, Si, GaAs. Further, a nitride semiconductor substrate such as GaN or AIN can also be used. -18- 200931684 The semiconductor structure of the present invention is not limited to the above, and various light-emitting structures such as Pn junction, P-i-η structure, and MIS structure may be employed. In the following, a nitride semiconductor will be described as a flat conductor structure and a semiconductor layer. However, the present invention is not limited thereto, and other materials such as GaAs-based or InP-based, such as InGaAs and GaP semiconductor, and luminescent luminescent molecules are used. Also applicable. On the growth substrate 6, 'as a semiconductor structure, the n-type nitride semi-Q conductor layer 11' light-emitting layer 13 and the p-type nitride semiconductor layer 12 are laminated in this order. At this time, the material of the growth substrate 6 may be a low-temperature growth buffer layer between the semiconductor structure and the semiconductor structure, for example, AlxGai.xN ( 0 ^ X ^ 1 ) of 1 to 3 nm, and other layers which are grown at a high temperature. For example, a base layer of AlxGa^xNCOSxSl) of 0.5 to 4/zm. For the n-type, p-type nitride semiconductor layer, for example, a composition represented by a composition formula of AlxGayIni.x_yN (0 SX $1, OSygl, χ+ySl) may be used, and in addition, III, IV may be used. One of the elements is replaced by B's, Sb, etc. as B. For example, for the n-type layer 1 1 system, a contact layer of GaN, a multilayer film structure of InGaN/GaN, for
• P型層12係可使用GaN之接觸層,AlGaN,InGaN,GaN • 之単層,多層膜構造而構成者。如此,可將各種組成,摻 雜劑量的單層,多層構造作爲具有1個,複數,設置各機 能(接觸’包覆)的層著。各導電型之半導體層係使用適 當摻雜繼而作爲所期望之導電型的層,例如在ρ型,η型 之氮化物半導體中,各使用Mg,Si等。亦可於各導電型 層之一部分,具有絕緣性,半絕緣性之範圍,層,或逆導 -19 * 200931684 電型之範圍,層。 另外,使用於本發明之發光層1 3,即活性層乃具有包 含例如由 AUInbGahajN ( OSaS 1、OSbS 1、a+bS 1) 所成之井層,和由 AlcIndGa丨-c-dN(0ScSl、0$dSl、c + d$n所成之障壁層的量子井構造。使用於活性層之氮 , 化物半導體係亦可爲未摻雜,η型不純物摻雜,p型不純 ; 物摻雜之任一,理想爲經由未摻雜,或使用η型不純物摻 0 雜之氮化物半導體者而可將發光元件作爲高輸出化者。由 使 Α1含於井層者,可得到較GaN之帶隙能量的波長 3 65 nm爲短之波長者。從活性層放出的光的波長係對應於 發光元件之目的,用途等,作爲360nm〜650nm付近,而 理想爲作爲3 80nm〜560nm之波長。 井層的組成係InGaN乃最佳使用於可視光,近紫外線 域,此時的障壁層之組成乃GaN、InGaN爲佳。井層的膜 厚乃理想爲lnm以上30nm以下,可作爲藉由1個之井層 〇 的單一量子井,障壁層等之複數之井層的多重量子井構 造。 (第2電極) 接著,如圖5所示,於第2導電型層12之表面,形 成由 Rh、Ag、Ni、Au、Ti、Al、Pt等所成之第 2電極 22。第2電極22係因爲爲光反射側,而具有反射構造, 具體而言,戲劇有反射率高的反射層,特別是具有在第2 導電型層接觸側者爲佳。其他,藉由光透過之薄膜的密著 -20- 200931684 層,可作爲例如依密著層/反射層的順序層積之多層構造 者。作爲具體之第2電極22,可從半導體構造10作爲Ag / Ni/ Ti/ Pt。另外,第2電極22係從上面而視,當形 成於除了形成有第1電極21之範圍的氮化物半導體層之 略全範圍時,可增加電流注入之發光範圍爲佳。另外,針 ' 對在平面視,第1及第2電極,如具有夾持活性層13而 ; 重疊之範圍,因招致吸收至電極之光損失,而錯開爲佳。 ❹ (保護膜) 爲了保護氮化物半導體元件之周邊部等,亦可設置保 護膜7。設置於第2導電型半導體層12上之情況乃形成於 從其第2電極22露出之範圍,在圖例中,係相互鄰接或 離間而加以設置。但並不局限於此,而亦可呈被覆第2電 極22之一部分地設置者。將其保護膜7作爲絕緣膜,從 選擇性地設置於第2導電型半導體層之表面上的第2電 G 極,導通於半導體層。作爲絕緣性之保護膜,作爲具體之 材料,可使用 Si02、Nb205、Al2〇3、Zr02、Ti02 等之氧 • 化膜或,AIN、SiN等之氮化膜之單層膜或多層膜者。更 • 加地,亦可於保護膜7,被覆Al、Ag、Rh等高反射率之 金屬膜。更加地,如Si02/ Ti/ Pt,亦可將第2電極之多 層構造的一部分,設置於絕緣膜之黏階層5a側。 (半導體層側黏著層) 接著,於第2電極22上,形成在貼合時爲了作爲合 -21 - 200931684 金化之半導體層側黏著層5a。半導體層側黏著層5a乃從 含有選自Au、Sn、Pd、In所成的群之至少一個之合金所 形成。半導體層側黏著層5 a係由密著層’阻障層,共晶 層所成之3層構造爲佳。密著層乃含有選自Ni、Ti、 RhO、W、Mo所成的群之至少一個。阻障層乃含有選自 Pt、Ti、Pd、TiN、W、Mo、WN、Au 所成的群之至少一 個。共晶層乃含有選自 Au、Sn、Pd、In所成的群之至少 一個。另外,半導體層側密著層41a的膜厚乃作爲5/zm 以下。例如,可使用Ti/Pt/Au/Sn/Au者,另外,於 保護膜設置第2電極之多層構造之一部分之情況係亦可省 略密著層,作爲Pt/ Au/ Sn/ Au者。 (支撐基板) 另一方,準備支撐基板4。支撐基板4係主要除了 Si 基板,可舉出GaAs之半導体基板、Cu、Ge、Ni之金屬材 φ 料、Cu- W之複合材料等之導電性基板。加上,亦可利用 Cu — Mo、AlSiC、AIN、SiC、Cu —金剛石等之金屬和陶瓷 • 的複合體等。例如’可將Cu— W、Cu - Mo之一般式,呈 . CuxWioo-x ( 〇 ^ X ^ 30 ) 、CuxMo100-x ( OSxg 50)地各自 表示。另外,利用Si的優點係爲廉價,且容易晶片化 者。作爲支擦基板4之理想膜厚係50〜500# m。由將支擦 基板4的膜厚設定爲其範圍者,放熱性乃變佳。在另一方 面,對於支撐基板,如使用導電性基板,除了從基板側的 電力供給變爲可能之外’可作爲對於高靜電耐壓及放熱性 -22- 200931684 優越之元件。另外,通常,作爲由Si、Cu(Cu— W)等之 不透光性之材料,於此與半導體層之間,例如電極,或半 導體層內,設置反射構造之構寧,對於放熱性,發光特性 優越爲佳。另外,亦可經由電鍍,於氮化物半導體層上, 形成電鍍構件,形成支撐基板,與支撐基板4之間的黏接 -- 部者。另外’亦可爲未設置支撐基板的元件,而亦可直接 : 安裝於發光裝置之載置部,基台上,而亦可爲將經由電鍍 ❹ 之金屬構件等,設置於半導體層上之型態。 另外,亦可於對向於光取出側之半導體側之相反側, 例如支撐基板4的上面或下面,或上述之氮化物半導體層 的表面(在此係第2導電型半導體層12的表面),形成 週期性地交互層積分布布拉格反射膜(distributed Bragg reflector: DBR)等折射率不同之材料的多層薄膜者。多 層薄膜係例如由介電質多層膜,GaN/ AlGaN之半導體所 構成,可於半導體層內,其表面,例如保護膜等,單獨或 〇 與反射用之電極同時加以形成,設置反射構造者。 * (貼合工程) . 並且,如圖6所示,使半導體層側黏著層5a的表面 與支撐基板側黏著層5b的表面對向,經由加熱壓接,將 支撐基板4貼合於氮化物半導體層側之第2電極22。其加 熱壓接係進行按壓同時,加上150°C以上的熱而進行。由 此,如圖7所示,藉由黏著層5( 5a與5b)而接合半導體 層側與支撐基板側。 -23- 200931684 對於其支撐基板4的表面而言,亦形成支撐基板側黏 著層5b者爲佳。另外,對於支撐基板側黏著層5b係由密 著層,阻障層,共晶層所成之3層構造爲佳。支撐基板側 黏著層 5b 係從例如 Ti— Pt-Au、Ti—Pt— Sn、Ti—Pt — Pd 或 Ti — Pt — AuSn、W — Pt — Sn、RhO — Pt — Sn、RhO — ' Pt — Au ' RhO — Pt - (Au、Sn)等之金屬膜所形成。 . 對於在貼合而作爲共晶,係於支撐基板側與氮化物半 0 導體層側之黏接面,個具備密著層,阻障層,共晶層者爲 佳,對應於設置有此等之材料(基板,半導體),形成其 各層之材料。對於在貼合後,成爲第2電極/Ti-Pt — AuSn— Pt— Ti/支撐基板、其他,成爲第2電極/RhO — 卩1—八11811-?1—1^/支撐基板、第2之電極/1^一?1一 PdSn—Pt— Ti/ 支撐基板,或第 2 電極 /Ti 一 Pt—AuSn -Pt — RhO /支撐基板,或第 2電極/ Ti — Pt — Au - AuSn — Pt— TiSi2/ 支撐基板,或 Ti/Pt/AuSn/PdSn/Pt/ 〇 TiSi2/ 支撐基板,或 Pt/ AuSn/ PdSn/ Pt/ TiSi2/ 支撐 基板(保護膜乃Si〇2/ Ti/ Pt之場合)。如此,貼合之表 • 面金屬係當支撐基板側與氮化物半導體元件側不同時,可 . 以低溫作爲共晶,因共晶後之融點上升而爲理想。 (成長基板除去工程) 之後,如圖7所示,除去成長基板(虛線部),使半 導體構造1 〇露出。成長基板6係從成長基板側,照射準 分子雷射而進行剝離•除去(Laser Lift Off : LLO ),或 -24- 200931684 經由硏削而加以去除。在除去成長基板6後,由將露出的 氮化物半導體的表面,進行CMP (化學機械硏磨)處理 者,使所期望的膜之第1導電型層11露出。此時,對於 發光元件的光,吸收率高之基底層,例如經由除去高溫成 長之GaN層,或降低膜厚之時,例如即使在具有紫外範圍 之發光波長的LED,亦可降低吸收的影響者。經由其處 理,可除去損傷層或調整氮化物半導體層之厚度,調整表 面之面粗度。 (氮化物半導體層之分割) 更加地,如圖8所示,將導體構造10分割成晶片 狀。具體而言,爲將氮化物半導體元件晶片化,以RIE等 進行外周蝕刻,除去外周之氮化物半導體層而分離,使保 護膜7露出。 另外,爲了使光的取出效率提昇,亦可於半導體層表 〇 面等光取出表面,具有凹凸構造。例如,亦可將第1導電 型之氮化物半導體層的露出面,進行濕蝕刻,以RIE等形 • 成凹凸構造。另外,亦可設置於被覆半導體層之透光性構 . 件,例如第1導電型層表面之保護膜(未圖示)等,亦可 作爲擴充至此等材料間之凹凸構造,亦可於其界面,設置 凹凸構造。另外,亦可於第2電極側等光反射面,設置凹 凸構造。在此,於從第1電極露出之範圍的半導體層表 面,以KOH進行濕蝕刻,設置作爲粗面化之凹凸構造。 -25- 200931684 (第1電極) 面 與 圍 積 的 效 A1 1 白 X 之 其 性 電 極 接著,於第1導電型層11之露出面的電極形成 15,呈滿足上述所述之配置構成,形成第1電極21。即 第1電極21係在從電極形成面15之平面視,呈未具有 夾持活性層13而位置之第2電極22的形成範圍重疊範 - 地,加以偏移配置。由此構造,在半導體構造10之層 , 方向,因載體立體地移動在將其中心軸作爲不同之雙方 〇 電極21 ’22間,而促進面內擴散之結果,提昇內量子 率〇 第1電極係具體而言,層積順序,如Ti — Au、Ti — 等,作爲與第1導電型層之電阻用與密著用之Ti層(第 層)與作爲襯墊用之襯墊層(第2層),使用金,A1, 金族的構成,另外,於電阻用之第1層(例如,W ' Mo Ti乃對於與第1導電型層之電阻接觸爲佳),和襯墊用 第2層之間,作爲阻障層,設置高融點金屬層(W、Mo ❹ 白金族)之構造,例如使用 w — Pt— Au、Ti_ Rh — Pt Au。作爲n型氮化物半導體之反射性電極,使用 A1, • 合金者,作爲透光性電極,當然亦可使用ITO等之導電 . 氧化物者。針對在實施型態,於第1電極2 1,構成η型 極之情況,使用層積順序Ti — Al— Ni- Au、W — Al — W Pt-Au' Al-Pt-Au' Ti-Pt-Au 等。另外,第 l 電 乃將膜厚乃作爲o.l〜1.5/zm。 (晶片分割) -26- 200931684 接著,在支撐基板4及黏著層5所示之支撐台3,經 由針對在氮化物半導體元件1之邊界範圍的切劃位置D進 行切劃者,得到圖1乃至圖3所示之作爲晶片化的氮化物 半導體元件1。 ·- (透光性導電層) , 另外,亦可於與各電極之半導體層間,具備促使電流 Q 擴散之擴散層者。作爲擴散層係由以較各電極爲寬幅,大 面積所設置,具有擴散機能,爲透光性者,不會使光的射 出(第2電極側),反射(第1電極側)之機能降低者爲 佳,例如,可採用透光性導電層。導電層係經由形成於露 出之半導體層之略全面者,可均一地擴散電流於半導體全 體者。透光性導電層係具體而言,期望爲形成ITO、 ZnO、In2〇3、Sn02等含有Zn、In、Sn之氧化物的透光性 導電層者,理想爲使用ITO。或亦可將Ni等之其他金 〇 屬,作爲薄膜、氧化物、氮化物、此等之化合物、複合材 料者。 (配線構造) 針對在具有上述構造之圖1乃至圖4所示之氮化物半 導體元件1,如將黏著層5作爲導電性,且將支撐基板4 作爲SiC等之導電性的基板,可使第2電極22之一方的 主面’接觸於第2導電型之氮化物半導體層12,從第2電 極22之另一方的主面側進行外部連接。即,第2電極22 -27- 200931684 之一方的主面(在圖3之上面)乃爲使與半導體接觸的 面’第2電極22之另一方的主面(下面)乃可作爲外部 連接用的面而發揮機能。並且,將貼合之支撐基板4電性 地連接於第2電極22,可將對向隅半導體層積構造側的面 之背面側(在圖3之氮化物半導體元件1的底面側),作 ·- 爲第2電極22之外部連接範圍。例如,藉由設置於支撐 , 基板4之電極,成爲可與外部電路之連接。另外,在將支 〇 撐基板4作爲絕緣性材料之情況中,即使呈經由支撐基板 4之立體配線,或配線用通孔等支配線電極而連接形成於 半導體層積構造側之支撐基板4的電極,和形成於其相反 側之背面的電極,亦成爲可作爲從支撐基板4之背面側的 電極取出。總之,未使用露出之導線,可電性地連接第2 電極22與外部電極。更加地,於支撐基板4,由連結個別 之放熱構件者,亦更可得到放熱效果者。 在另一方,半導體層表面側之電極之第1電極21乃 ❹ 於外部電極連接用之露出範圍,藉由焊錫等而與導電性倒 線加以連接。由此,成爲可作爲與外部電極之電性的連 - 接。其他,於半導體層上具有配線構造之型態,例如,亦 - 可爲從半導體層上至外部之支撐基板上爲止設置配線層之 構造,此情況,經由上述之支撐基板的外部連接,配線構 造等,與外部連接。當爲未使用如此之導線連接之發光元 件,裝置時,成爲無需較延伸部爲寬幅之襯墊部,並可抑 制電流集中傾向者,可適當地形成後述之螢光體層,含有 其之密封構件。例如,如圖4的例,在電極到達至半導體 -28- 200931684 層端部之構造中,於延出於其外部之支撐基板上,可使電 極延伸存在者。 另外’針對在圖1乃至圖3所示之氮化物半導體元件 1,支撐基板4乃使用電性傳導性佳的材料,由此,因可 將發光層的上下,作爲以電極立體性地夾入之縱型電極構 造,而可將電流擴散於P型半導體層(第2導電型之氮化 , 物半導體層12)之全面,電流之面內擴散則成爲均一。 0 即,可降低電性阻抗,載體注入效率則提昇。更加地,支 撐基板4係可完成作爲放熱機板之機能者,可抑止經由發 熱之元件特性的惡化。 (發光裝置) 另外,圖9之發光裝置2的槪略剖面圖乃顯示將圖1 乃至圖3所示之氮化物半導體元件1,安裝於組件8的 例。組件8係具備各自與一對之電極圖案進行對應之引線 〇 14a,14b的基台14。載置於基台14之氮化物半導體元件 1係形成於支撐基板4之安裝面側的外部連接用之第2電 * 極22,和基台14之一方的引線14a乃藉由導電性黏接構 • 件而加以電性連接。另外,裝置於氮化物半導體元件1之 第1導電型層11側的第1電極21係在其外部連接範圍16 (參照圖1 ),經由另一方之引線1 4b與導電性導線1 8而 加以電性連接。另外,在圖中,於凹部的底面,載置有發 光元件,但並不限於如此之載置部的形狀,而可作爲平坦 的形狀,凸部之上面等各種形態之載置部者。 -29- 200931684 (透鏡) 另外,組件8係形成有具有側面之略凹形狀之杯狀物 1 9,於上方具有寬幅之開口部24。更加地,組件8之開口 部24的上部係經由球面透鏡,非球面透鏡,圓筒型透 *- 鏡,橢圓透鏡等之透鏡1 7加以閉塞。更加地,針對在透 , 鏡17之光取出側的面狀乃除平坦之外,亦可施以透鏡 〇 狀,具有凹凸之微透鏡狀等之加工。對應於用途,可設置 擴散或集光來自光源之所射出的光之透鏡者,此係可經由 無機玻璃,樹脂等而形成者。 另外,開口部24內係經由被覆氮化物半導體元件1 之元件被覆構件26加以塡充。作爲元件被覆構件26乃除 氣體之外,使用有透光性之矽樹脂組成物,變性矽樹脂組 成物者爲佳。另外’可使用具有環氧樹脂組成物,變性環 氧樹脂組成物’丙烯酸樹脂組成物等之透光性的絕緣樹脂 〇 組成物者。更加地’亦可利用矽樹脂,環氧樹脂,尿素樹 脂’氟素樹脂及含有此等樹脂之至少一種的混合樹脂等對 • 於耐候性優越之樹脂。另外,不限於有機物,而亦可使用 * 玻璃,矽膠等之對於耐光性優越之無機物者。另外,對於 氣密密封’係可使用不活性氣體,氮素,氧,氬,氦,或 組合此等者’或乾燥空氣等者。特別是對於作爲光源,使 用氮化鎵系之半導體兀件之情況,係由使用乾燥空氣或至 少含有氧之氣體者’防止半導體元件之劣化。 -30- 200931684 (搭載元件,保護元件) 另外,針對在本發明之發光裝置,亦可將氮化物 體元件1只載置1個’但亦可載置2個以上的發光元 除了發光元件之外,例如亦可與齊納二極體,電容器 保護元件加以組合。另外’保護元件係亦可形成於發 *. 件內之一部分者。此等之保護元件係可在該領域利用 , 之構成所有者。 ❹ (波長變換構件) 另外,於元件被覆構件26內,可混入發光成經 自發光層13的出射光所激發的螢光之螢光物質等之 變換構件9者。由此,可將光源的光,變換爲不同波 光,將光源與以波長變換構件9加以波長變換的光之 光,取出於外部者。也就是,由來自光源的光之一部 發螢光體者,得到具有與主光源的波長不同波長的光 φ 爲其波長變換構件9,係可適當利用螢光體。因營光 亦具備光散亂性極光反射性之機能,加上於波長變 * 能,達成作爲光散亂部之作用,可得到上述之光的擴 . 果者。螢光體係可以略均一的比例混合於元件被覆構 中者,亦可呈部分不平均地進行配合者。 例如,可經由從發光層1 3唯特定的距離作爲 者,在半導體層內產生的熱,不易傳達至螢光物質, 制螢光物質的劣化。另一方面,如使波長變換構件9 於半導體層側,形成略均一之波長變換層,可將經由 半導 件, 等之 光元 公知 由來 波長 長的 混色 分激 。作 體係 換機 散效 件26 離間 可抑 接近 來自 -31 - 200931684 發光層的出射光之波長變換量作爲一定,得到安定一次光 與變換光的混合比之發光色。 另外,螢光體係亦可於由一層所成之元件被覆構件?6 中,作爲內有一種類或二種類以上,亦可於由複層所成之 發光層中,各自存在一種類或二種類以上。由此,可實現 可射出所期望的波長之發光裝置。 , 作爲代表性之螢光體,可舉出以銅所附加之硫化鎘鋅 0 或由铈所附加之YGA系登光體及LAG系螢光體。特別是 針對在高亮度且長時間之使用時,(Re^xSmKAlHGaYhOu : Ce ( 0 S X < 1、0 S y $ 1、但、Re 係選自 Y、Gd、La、Lu 所成的群之至少一種之元素)等爲佳。作爲實施型態2之 波長變換構件,係使用YAG或LAG螢光體,例如可得到 白色者。另外,作爲螢光體,亦可使用對於玻璃或樹脂混 合螢光體之螢光體玻璃或螢光體含有樹脂,螢光體或含有 此之結晶體(板)。 ❹ 另外,使用具有黃〜紅色發光之氮化物螢光體等,增 加紅色成分,亦可實現平均紅色評價數Ra的高照明或燈 • 泡色LED等者。具體而言,由配合發光元件之發光波 . 長,調整CIE的色度圖上之色度點的不同之螢光體的量而 使其含有者,可使在其螢光體間與發光元件所連結之色度 圖上的任意點發光者。其他,可舉出將近紫外線〜可視光 變換爲黃色〜紅色域之氮化物螢光體,氧氮化物螢光體, 矽酸鹽螢光體,L2Si04 : Eu ( L乃鹼土金屬)、特別是 (SixMaei-x)2Si〇4: Eu(Mae 乃 Ca、Ba 等之驗 土金屬) -32- 200931684 等。作爲氮化物螢光體,羥基氮化物(氧氮化物)螢光體 係有 Sr_Ca-Si— N:Eu、Ca-Si— N:Eu、Sr_Si— N: Eu、Sr — Ca — Si — Ο — N: Eu、Ca — Si — 0 一 Ν· Eu、Sr — Si— O — N: Eu等,作爲鹼土類氮化矽螢光體係由一般式 L S i 2 〇 2N 2 ·· Eu、一般式 LxSiyN(2/3X+ 4/3y) : Eu 或 ' LxSiyOzN(2/3x + 4/ 3y-2/3z): Eu(L 乃 Sr、Ca、Sr 與 Ca 之任 , 一)所表示。 Ο (添加構件) 另外,元件被覆構件26係除了波長變換構件9之 外,可對應於年度增量劑,顏料,螢光物質,使用用途而 添加適當的構件者’經由此而得到具有良好之指向特性之 發光元件。同樣地,作爲具有切斷來自外來光或發光元件 之不要的波長之濾色片效果之過濾才,亦可添加各種著色 劑者。在此’針對在本說明書,擴散劑係指例如中心粒徑 Φ 乃lnm以上’未達者係可使來自發光元件及螢光物 質的光’良好地進行亂反射,控制大粒徑之螢光物質的色 . 不勻’或縮小發光光譜之半値寬度。另一方面,lnm以 . 上,未達l#m之擴散劑係未使光度下降而可提昇樹脂黏 度者。 (塡充劑) 更加地’於兀件被覆構件26中,除了登光物質之 外,亦可含有塡充劑。作爲具體的材料,可使用與擴散劑 -33- 200931684 同樣之構成,擴散劑係中心粒徑乃不同,針對在本說明 書,塡充劑的中心粒徑係作爲5 # m以上1 00 /z m以下者 爲佳。當將如此粒徑之塡充劑,含有於元件被覆構件26 中時,經由光散亂作用而改善發光裝置之色度不均之外, 可提昇元件被覆構件26之耐熱衝擊性者。由此,針對在 高溫下之使用,亦可防止發光元件與在不同構件界面之斷 t 裂及剝離的產生。更加地’可將樹脂的流動性調整爲長時 © 間—定者。 實施例1 以下,顯示在實施例1之電極的構成例。惟,對於與 上述構造同樣的構成要素,附上同符.號,省略其詳細說 明。圖10乃從發光元件101之光取出側的平面圖,主要 圖示在η型電極41上。圖10所示之發光元件101乃口 1 mm ( 1 mm X 1 mm之電極形成面)的略正方形狀之晶粒, © 其週緣形狀係由延伸於一方向(在圖10之左右方向)的 第1的邊35,和垂直交叉於此之第2的邊36,和各對向 • 於其2邊35,36而位置於平行之2邊35’,36’所構成。 . 另外,η型電極41係具有形成於η行半導體層11之 露出部的電極形成面15內的一對電極襯墊部16,由其電 極襯墊部16各自延伸成直線狀之電極延伸部40。另外, 如圖10所示,電極之形成範圍之電極形成面15係從發光 元件101之矩形狀的周緣保持略一定的離間距離而形成於 內側’在實施例1中,從發光元件1 0 1的外周只離間3 0 -34- 200931684 μ m,即,具有對於中心方向縮小之範圍。 更加地,一對之電極延伸部40係略平行,相互作爲 離間而對向。在圖1 〇中,各電極延伸部40乃將其延伸方 向,與第1的邊3 5平行地位置,將電極形成面15之中心 作爲基準而略點對稱地加以配置所成。 另外,電極形成面15乃由以一對之電極延伸部40所 , 夾持之第1範圍31,除了其第1範圍31之範圍,即位置 Q 在第1範圍31之四方的第2範圍32所構成。在實施例1 中,針對在與第2範圍32之平行方向,將第1範圍31之 寬度,即電極延伸部40間之距離(L1)作爲WOvm,更 加地將各第2範圍32之寬度,即從電極延伸部30至電極 形成面15的端緣爲止之離間距離(L2 )作爲260 // m,針 對在與第1的邊35之平行方向,將第2範圍之寬度 (L3 ),即至電極延伸部40之端緣23與電極形成面15 之端緣爲止之離間距離作爲165ym。 ❹ 如爲實施例1之電極構造,電極延伸部40乃未具有 一及複數段地加以彎曲之彎曲部,分歧部,交叉部,而形 • 成爲直線狀之一對之電極延伸部4 0係相互地加以離間。 • 其結果,η型電極41係未形成以電極延伸部40所閉塞之 範圍’即’因具有開口部,而可高效率地將電極附近及第 1範圍31內之發熱進行放熱。更加地,由將在電極延伸部 40之長度方向的長度(L5),作爲較雙方之電極延伸部 40之離間距離(L1)爲大者,因作爲未具有交叉部而可 增大在電極形成面15內之電極延伸部40的形成範圍,而 -35- 200931684 可排出電流集中範圍的同時’均一地進行發光範圍29的 發光。然而,電極延伸部40之離間距離(L1)係考慮在 所形成的層之面內擴散程度’即薄片阻抗等而作適宜調 節,由此’可作爲實現所期望之電流擴散狀體之發光元 件。以下’記述將在實施例1之發光元件,搭載於經由各 種形態之發光裝置所得到之各特性。 t Q (砲彈型I ) 將實施例1之發光元件,搭載於各極性用之2條的引 線之內,一方之固定用襯墊,並以樹脂密封其引線,製作 砲彈形狀之樹脂透鏡一體密封型之發光裝置。將經由其藍 色發光的裝置所得到之各特性,表示於以下。 驅動電流If:350(mA) ,Vf:3.8(V)、發光輸 力:548.7 ( mW )、入 d : 445.4 ( nm ) 、λ Ρ : 43 8.7 (nm )、外部量子効率:5 5 · 5 ( % )、電力効率:4 1.3 〇 (%) * (砲彈型II ) - 爲上述發光裝置,更加地,於上述固定引線之元件搭 載的罩體內,以YGA螢光體含有的樹脂,進行預塗層所 得到之白色發光之發光裝置的各特性係如以下。驅動電流 If : 3 50 ( mA ) . Vf : 3.8 ( V )、色温度 Tcp : 575 1 (K )、色度(X: 0.327、y: 0.333)、發光効率:79.5 (lm/ W )。 -36- 200931684 (一體密封型) 將實施例1之發光元件,搭載於2條一組的各極性用 之引線(共4條)之內,一方之組的固定用引線之罩體 內,並以樹脂透鏡一體密封所得到之藍色發光之發光裝置 -- 的各特性係如以下。 , 驅動電流 If:350(mA) - Vf : 3.7 ( V )、發光輸 ❹ 力:603.6 ( mW ) ' λ d : 445.3 ( nm ) 、 A P : 438 (nm )、外部量子効率:60.9 ( % )、電力効率:46.6 (%)。 實施例2 另外,爲具有與實施例1之發光元件同樣的構造之發 光元件,以相似關係而使電極的形狀,配置縮小。針對在 其□ 800 之發光元件,與實施例1同樣地得到最佳之 © 發光輸出,放熱效果。 ’ (比較例1 ) * 將在比較例1之發光元件301的平面圖顯示於圖11。 圖中的發光元件301乃D600"m尺寸的略正方形狀之晶 粒,與實施例1之發光元件1 0 1做比較’只有晶粒的尺寸 及電極的形成圖案不同’其他的構造乃實質上爲同一。隨 之,對於與上述構造同樣的構成要素,附上同符號,省略 其詳細說明。 -37- 200931684 在圖11之發光元件301中,第1電極之η型電極51 乃將電極形成面15之中心C,作爲中心,與電極形成面 1 5相似關係地加以縮小,即,具有圍成略正方形狀之電極 延伸部50。換言之’電極延伸部50的角部係具有彎曲成 略直角之彎曲部。另外,對於該正方形之一的角部,係具 ·- 備有外部連接範圍16之電極襯墊部。如圖11所示,電極 , 延伸部50係通過從電極形成面15之中心C至端緣爲止之 ❹ 中點Μ,且構成於較中點Μ爲外側範圍,即,電極延伸部 5 0係配置於靠電極形成面1 5之端緣側。 更加地,電極形成面3 01乃與實施例1同樣,具有經 由電極延伸部50所夾持之範圍的第1範圍31,和從第1 範圍31至電極形成面15之端緣爲止之第2範圍32。在比 較例1之發光元件中,第1範圍31乃由電極延伸部50所 包圍之封閉範圍,未具有開口部。 Q (比較例2 ) 另外,將具有電極之其他的形成圖案之發光元件,作 • 爲比較例2而顯示於圖12。圖12之發光元件401乃實施 . 例1同樣□ 1 mm的略正方形狀之晶粒,與比較例1相同, 具備包圍電極構造。然而,對於與上述構造同樣的構成要 素,附上同符號,省略其詳細說明。 在圖12之發光元件401中,在正方形狀之電極形成 面15,於作爲對向之一對的角部,具有外部連接範圍16 之電極襯墊部。從其電極襯墊部16所延伸之電極延伸部 -38- 200931684 60乃圍著電極形成面15的四方週緣而形成包圍電極爲矩 形狀所成。更加地,電極延伸部60乃呈相互連結該矩形 狀的各隊邊之中心地加以延伸,即,將矩形狀區分爲略4 等分。也就是,比較例2之第1電極61的η型電極乃具 有彎曲部,交叉部,針對在此點,類似與圖15所示之以 , 往的發光元件之電極構造。 , 另外,將有關於實施例1,比較例1,2之發光元件 φ 1,301,401之相對發光強度分布圖,各顯示於圖13之 (a) ( b ) ( c )。然而,針對在以灰階標度所顯示之各 發光分布圖,顯示在發光元件的電極形成面15內之顯示 爲高濃度程度,發光強度則變高,進而爲溫度之上升區域 者。針對在13之(a) (b) (c)之任一發光元件1, 301,401,亦了解到在電極襯墊部16附近,成爲高發光 強度範圍者。 在實施例1之發光元件1中,如圖13(a)所示,將 〇 電極襯墊部16作爲中心,在從此所延伸之直線狀的電極 延伸部30附近,亦具有發光強度高之範圍。伴隨此,在 • 該範圍中,由其他的範圍,溫度則上升,但如上述,因放 • 熱效果顯著,而在未配置η型電極構造的範圍,即第1範 圍3 1及第2範圍,加以控制。另外,具體之熱阻抗係得 到6.52〜7.67°C/W (將Cu—W所成之支撐基板的厚度作 爲100、200、3 00、400 // m,載置於陶瓷製基材而進行測 定)者。 另一方面,針對在比較例1之發光元件3 0 1係如圖1 3 -39- 200931684 (b)所示,因作爲經由電極延伸部50之包圍電極構造, 而有第1範圍31內之發光集中,在其部分’蓄熱則變 多。具體而言,在電極襯墊部16之附近,看到局部性之 電流的集中,此傾向則變爲顯著。如此,不只第1電極之 矩形形狀的內部,針對在襯墊部16之外側,亦變爲與內 *- 部同樣之傾向。 , 同樣地針對在比較例2之發光元件401,亦如圖13 ❹ (c )所示,了解到在個區分間,有電流擴散之不均衡 者。特別是,如圖的虛線範圍所示,針對在電極延伸部60 之交叉部,即使從電極襯墊部16比較遠隔之範圍,亦產 生電流的集中。即,在分割成小區分之矩形狀的四角(彎 曲部)的電流之偏在,電流之不均一則變爲顯著。 由上述結果,了解到針對在實施例1之發光元件1, 對於放熱性優越,即使在大電流下,亦具有高耐性者。在 比較例1中,如上述,比較於元件寬度,面積,即使在充 Ο 分寬廣,大的第1範圍,亦在其內部,及外部產生發光集 中,元件特性則下降。即,針對在電極構造,由未具有電 * 極延伸部之彎曲,交叉範圍,且作爲可高效率地實現元件 - 內之電流擴散的配置者,可控制電流之局部集中,並提升 放熱性之同時’可將電極內之電流密度的不均作爲極限。 也就是,可作爲在實現電流均一性,發光均一性同時,維 持或提昇光輸出之發光元件。 [產業上之可利用性] -40- 200931684 本發明之半導體發光裝置及半導體發光裝置之製造方 法乃可適當地利用於照明用光源,LED顯示器,背照光光 源’信號器,照明式開關,各種檢測器及各種指示器等。 【圖式簡單說明】 -- 圖1乃關於實施形態之發光元件之平面圖。 , 圖2乃針對在圖1之π-ll’線之槪略剖面圖。 0 圖3乃針對在圖1之m-πι’線之槪略剖面圖。 圖4乃關於實施形態之其他發光元件之平面圖。 圖5乃顯示關於實施形態之發光元件之製造方法的說 明圖。 圖6乃顯示關於實施形態之發光元件之製造方法的說 明圖。 圖7乃顯示關於實施形態之發光元件之製造方法的說 明圖。 〇 圖8乃顯示關於實施形態之發光元件之製造方法的說 明圖。 ' 圖9乃關於本實施形態之發光裝置之槪略剖面圖。 - 圖10乃關於實施例1之發光元件之平面圖。 圖11乃關於比較例1之發光元件之平面圖。 圖12乃關於比較例2之發光元件之平面圖。 圖13乃顯示發光元件之相對發光強度的分布圖, (〇係關於實施例1,( b )係關於比較例1 ( c )係關於 比較例2之發光元件。 -41 - 200931684 圖14乃關於以往形態之發光元件之平面圖。 圖1 5乃關於以往之其他形態之發光元件之平面圖。 【主要元件符號說明】 1、60、101、、301、401:發光元件(氮化物半導體 -- 元件) , 2 :發光裝置 3 :支撐台 4 :支撐基板 5 :黏著層 5a :半導體層側黏著層 5b :支撐基板側黏著層 6 :成長基板 7 :保護膜 8 :組件 ❹ 9 :波長變換構件 10 :半導體構造 ' 11:第1導電形層(η型半導體層) - 12:第2導電形層(ρ型半導體層) 13 :發光層(活性層) 14 :基台 14a,14b :引線 1 5 :電極形成面 16:外部連接範圍(電極襯墊部) -42 200931684 17 :透鏡 1 8 :導電性導線 19 :杯狀物 20 :電極 21、41、51、61:第1電極(η形電極) , 22 :第2電極(ρ型電極) t 23 :電極延伸部之端緣 0 24 :開口部 26 :元件被覆構件 29 :發光範圍 30、30’ 、40、50、60:電極延伸部 3 1 :第1範圍 3 2 :第2範圍 33 :第2左右範圍 34 :第2上下範圍 〇 3 5 :第1的邊 36 :第2的邊 • 3 5 ’ :平行於第1的邊的邊 - 3 6 ’ :平行於第2的邊的邊 100,200 :發光元件 101 : η型電極襯墊部 101a:電極延伸部 1 0 1 b :包圍電極 102 : ρ型電極襯墊部 -43- 200931684 2〇1 :電極襯墊部 201a:電極延伸部 2 0 1 b :包圍電極 203 :區分範圍 C :電極形成面的中心 ·- D :切割位置 , Η 1 :第1範圍的寬度 Ο Η2:第2範圍的寬度之合計 L 1 : 一對之電極延伸部間之距離 11 : 一對之電極延伸部間之1 /2距離 L2:從電極延伸部至半導體構造之端緣爲止的距離 L3:第2左右範圍之寬度 L4:第2上下範圍之寬度 L5:針對在電極延伸部之長度方向的長度 Μ :從電極形成面的中心至端緣爲止的中點 ❹ -44 -• The P-type layer 12 can be formed by using a contact layer of GaN, a layer of AlGaN, InGaN, GaN, or a multilayer film structure. Thus, a single layer or a multilayer structure of various compositions, doped doses can be used as a layer having one, plural, and each function (contact 'coating). Each of the conductivity type semiconductor layers is a layer which is suitably doped and then serves as a desired conductivity type. For example, in a p-type or n-type nitride semiconductor, Mg, Si or the like is used. It can also be used in one of the conductive layers to have an insulating, semi-insulating range, layer, or reverse conductivity -19 * 200931684 Electrical range, layer. Further, the light-emitting layer 13 used in the present invention, that is, the active layer has a well layer composed of, for example, AUInbGahajN (OSaS1, OSbS1, a+bS1), and AlcIndGa丨-c-dN (0ScSl, The quantum well structure of the barrier layer formed by 0$dSl, c + d$n. The nitrogen used in the active layer, the semiconductor system can also be undoped, n-type impurity doped, p-type impure; Any one of the GaN-based band gaps may be used as a high-output device by undoped or nitrided semiconductors doped with n-type impurities. By including Α1 in the well layer, a band gap larger than GaN can be obtained. The wavelength of the energy is 3 65 nm, and the wavelength of the light emitted from the active layer corresponds to the purpose of the light-emitting element, and is used as a wavelength of 360 nm to 650 nm, and preferably as a wavelength of 380 nm to 560 nm. The composition of InGaN is best used for visible light and near-ultraviolet light. The composition of the barrier layer at this time is preferably GaN or InGaN. The film thickness of the well layer is preferably 1 nm or more and 30 nm or less, which can be used as one. The weight of a plurality of well layers, such as a single quantum well of a well layer, a barrier layer, etc. (Second Electrode) Next, as shown in FIG. 5, a second electrode 22 made of Rh, Ag, Ni, Au, Ti, Al, Pt or the like is formed on the surface of the second conductivity type layer 12. The second electrode 22 has a reflection structure because it is a light reflection side, and specifically has a reflection layer having a high reflectance, and particularly preferably has a side on the side where the second conductivity type layer is in contact with each other. The adhesion of the film -20-200931684 layer can be used as a multilayer structure in which, for example, a dense layer/reflective layer is laminated in this order. As the specific second electrode 22, the semiconductor structure 10 can be used as Ag / Ni / Ti / Further, the second electrode 22 is preferably formed in a slightly wider range than the nitride semiconductor layer in the range in which the first electrode 21 is formed, and it is preferable to increase the light-emitting range of current injection. 'In the plan view, the first and second electrodes have the effect of sandwiching the active layer 13; the overlapping range is preferably caused by the loss of light absorbed into the electrode. ❹ (Protective film) To protect the nitride semiconductor A protective film 7 may be provided on the peripheral portion of the element or the like. The second conductive electrode layer 12 is formed in a range exposed from the second electrode 22, and is provided adjacent to or apart from each other in the illustrated example. However, the present invention is not limited thereto, and the second electrode may be coated. The protective film 7 is provided as an insulating film, and the second electric G electrode selectively provided on the surface of the second conductive semiconductor layer is electrically connected to the semiconductor layer. As an insulating protective film, As a specific material, an oxide film of SiO 2 , Nb 205, Al 2 〇 3, ZrO 2 , TiO 2 or the like, or a single layer film or a multilayer film of a nitride film of AIN or SiN can be used. • Adding a ground, it is also possible to coat the protective film 7 with a high-reflectivity metal film such as Al, Ag or Rh. Further, as for Si02/Ti/Pt, a part of the multilayer structure of the second electrode may be provided on the side of the adhesive layer 5a of the insulating film. (Semiconductor Layer Side Adhesive Layer) Next, on the second electrode 22, a semiconductor layer side adhesive layer 5a which is gold-plated at the time of bonding is formed. The semiconductor layer side adhesive layer 5a is formed of an alloy containing at least one selected from the group consisting of Au, Sn, Pd, and In. The semiconductor layer side adhesive layer 5a is preferably a three layer structure in which the adhesion layer 'barrier layer and the eutectic layer are formed. The adhesion layer contains at least one selected from the group consisting of Ni, Ti, RhO, W, and Mo. The barrier layer contains at least one selected from the group consisting of Pt, Ti, Pd, TiN, W, Mo, WN, and Au. The eutectic layer contains at least one selected from the group consisting of Au, Sn, Pd, and In. Further, the film thickness of the semiconductor layer side adhesion layer 41a is 5/zm or less. For example, Ti/Pt/Au/Sn/Au can be used, and in the case where a part of the multilayer structure of the second electrode is provided as the protective film, the adhesion layer can be omitted as Pt/ Au/Sn/ Au. (Support substrate) On the other hand, the support substrate 4 is prepared. The support substrate 4 is mainly a conductive substrate such as a semiconductor substrate of GaAs, a metal material of Cu, Ge, Ni, or a composite material of Cu-W, in addition to the Si substrate. In addition, a composite of a metal such as Cu-Mo, AlSiC, AIN, SiC, Cu-diamond, or the like can be used. For example, the general formula of Cu-W and Cu-Mo can be expressed as CuxWioo-x ( 〇 ^ X ^ 30 ) and CuxMo100-x (OSxg 50). In addition, the advantage of using Si is that it is inexpensive and easy to waferize. The ideal film thickness of the substrate 4 is 50 to 500 #m. When the film thickness of the rubbing substrate 4 is set to the range, the heat dissipation property is improved. On the other hand, for the support substrate, if a conductive substrate is used, it is an element superior to high electrostatic withstand voltage and heat release -22-200931684, except that power supply from the substrate side becomes possible. Further, in general, as a material having opacity such as Si or Cu (Cu-W), a reflective structure is provided between the semiconductor layer and the semiconductor layer, for example, an electrode or a semiconductor layer, and for heat dissipation, Excellent luminescent properties are preferred. Further, a plating member may be formed on the nitride semiconductor layer by electroplating to form a support substrate and adhesion to the support substrate 4. In addition, it may be an element that is not provided with a supporting substrate, and may be directly mounted on a mounting portion of the light-emitting device, a base, or a metal member to be placed on the semiconductor layer via a plating plate. state. Alternatively, the opposite side of the semiconductor side opposite to the light extraction side, for example, the upper surface or the lower surface of the support substrate 4, or the surface of the above nitride semiconductor layer (here, the surface of the second conductive type semiconductor layer 12) may be used. A multilayer film in which materials having different refractive indices such as a distributed Bragg reflector (DBR) are periodically alternately formed. The multi-layer thin film is composed of, for example, a dielectric multilayer film or a GaN/AlGaN semiconductor, and a surface of the semiconductor layer, for example, a protective film or the like, may be formed separately or in combination with an electrode for reflection, and a reflection structure may be provided. * (bonding work). As shown in Fig. 6, the surface of the semiconductor layer side adhesive layer 5a is opposed to the surface of the support substrate side adhesive layer 5b, and the support substrate 4 is bonded to the nitride by heat sealing. The second electrode 22 on the semiconductor layer side. The heating and pressing is performed while pressing, and heat of 150 ° C or more is added. Thereby, as shown in Fig. 7, the semiconductor layer side and the support substrate side are bonded by the adhesive layer 5 (5a and 5b). -23- 200931684 It is preferable that the surface of the support substrate 4 is also formed to support the substrate-side adhesive layer 5b. Further, the support substrate side adhesive layer 5b is preferably a three-layer structure in which an adhesion layer, a barrier layer, and a eutectic layer are formed. The support substrate side adhesive layer 5b is derived from, for example, Ti—Pt—Au, Ti—Pt—Sn, Ti—Pt — Pd or Ti — Pt — AuSn , W — Pt — Sn , RhO — Pt — Sn , RhO — ' Pt — Au ' RhO — Pt - (Au, Sn) and other metal films are formed. It is preferable to provide an adhesion layer, a barrier layer, and a eutectic layer on the bonding surface of the support substrate side and the nitride half-conductor layer side as a eutectic bonding. Materials such as materials (substrates, semiconductors) form the materials of their layers. After bonding, it becomes the second electrode/Ti-Pt — AuSn—Pt—Ti/support substrate, and the other is the second electrode/RhO — 卩1—eight 11811-?1—1^/support substrate, and the second The electrode / 1 ^ one? 1 - PdSn - Pt - Ti / support substrate, or 2nd electrode / Ti - Pt - AuSn - Pt - RhO / support substrate, or 2nd electrode / Ti - Pt - Au - AuSn - Pt - TiSi2 / support substrate, or Ti/Pt/AuSn/PdSn/Pt/〇TiSi2/ support substrate, or Pt/ AuSn/PdSn/Pt/TiSi2/ support substrate (when the protective film is Si〇2/Ti/Pt). In this way, when the surface of the support substrate is different from the side of the nitride semiconductor element, it is preferable to use a low temperature as a eutectic, and it is preferable that the melting point after eutectic rises. (Growth substrate removal process) After that, as shown in Fig. 7, the growth substrate (broken line portion) is removed, and the semiconductor structure 1 is exposed. The growth substrate 6 is removed from the growth substrate side by irradiation with a pseudo-molecular laser, and is removed by Laser Lift Off (LLO) or -24-200931684. After the growth of the substrate 6 is removed, the surface of the exposed nitride semiconductor is subjected to CMP (Chemical Mechanical Honing) treatment to expose the first conductive type layer 11 of the desired film. In this case, when the base layer having a high absorptivity of the light of the light-emitting element is removed from the GaN layer which is grown at a high temperature, for example, even in the case of an LED having an emission wavelength in the ultraviolet range, the influence of absorption can be reduced. By. Through the treatment, the damage layer or the thickness of the nitride semiconductor layer can be removed, and the surface roughness of the surface can be adjusted. (Section of Nitride Semiconductor Layer) Further, as shown in Fig. 8, the conductor structure 10 is divided into wafers. Specifically, in order to wafer the nitride semiconductor device, peripheral etching is performed by RIE or the like, and the nitride semiconductor layer on the outer periphery is removed and separated, whereby the protective film 7 is exposed. Further, in order to improve the light extraction efficiency, it is possible to have a concave-convex structure on the light extraction surface such as the surface of the semiconductor layer. For example, the exposed surface of the first conductivity type nitride semiconductor layer may be wet-etched to form a concavo-convex structure by RIE or the like. Further, it may be provided on a light-transmitting member covering the semiconductor layer, for example, a protective film (not shown) on the surface of the first conductive type layer, or the like, or may be expanded to have a concavo-convex structure between the materials. Interface, set the bump structure. Further, a concave-convex structure may be provided on the light-reflecting surface such as the second electrode side. Here, the surface of the semiconductor layer in the range in which the first electrode is exposed is wet-etched with KOH, and a roughened structure is provided as a roughening. -25- 200931684 (1st electrode) The effect of the surface and the surrounding effect A1 1 White X is the electrode which is formed on the exposed surface of the first conductive type layer 11 and is formed to satisfy the above-described configuration. The first electrode 21. In other words, the first electrode 21 is disposed on the surface of the electrode forming surface 15 and is disposed so as to overlap with the formation range of the second electrode 22 having no position at which the active layer 13 is sandwiched. With this configuration, in the layer of the semiconductor structure 10, the direction of the carrier is three-dimensionally moved, and the center axis is made to be different between the two electrodes 21'22, thereby promoting the in-plane diffusion, and the internal quantum ratio is raised. Specifically, the stacking order, such as Ti—Au, Ti—and the Ti layer (the first layer) for the resistance and the adhesion of the first conductivity type layer and the liner layer for the spacer (the 2 layers), using gold, A1, gold composition, and the first layer for resistance (for example, W 'Mo Ti is preferable for resistance contact with the first conductivity type layer), and padding Between the two layers, as a barrier layer, a structure of a high-melting-point metal layer (W, Mo ❹ platinum group) is provided, for example, w-Pt- Au, Ti_R-Pt Au is used. As the reflective electrode of the n-type nitride semiconductor, those using A1, • alloy, as the translucent electrode, of course, may be made of ITO or the like. In the case of the implementation type, in the case where the first electrode 2 1 constitutes an n-type pole, the stacking order Ti - Al - Ni - Au, W - Al - W Pt - Au ' Al - Pt - Au ' Ti - Pt is used. -Au, etc. In addition, the first electrode has a film thickness of o.l to 1.5/zm. (Wafer Dividing) -26- 200931684 Next, the support table 3 shown in the support substrate 4 and the adhesive layer 5 is cut by the cut position D at the boundary range of the nitride semiconductor element 1, and FIG. 1 is obtained. The wafer-formed nitride semiconductor device 1 shown in FIG. - (Translucent conductive layer), or a diffusion layer that promotes the diffusion of the current Q between the semiconductor layers of the respective electrodes. The diffusion layer is provided with a wide area and a large area, and has a diffusing function. When it is translucent, it does not emit light (on the second electrode side) and reflects (first electrode side). The lowering is preferable, and for example, a light-transmitting conductive layer can be used. The conductive layer can uniformly diffuse current to the semiconductor body through a slight overall formation of the exposed semiconductor layer. Specifically, it is desirable to form a light-transmitting conductive layer containing an oxide of Zn, In, or Sn such as ITO, ZnO, In2〇3, or Sn02, and it is preferable to use ITO. Alternatively, other metal ruthenium such as Ni may be used as a film, an oxide, a nitride, a compound of these, or a composite material. (Wiring structure) The nitride semiconductor element 1 shown in FIG. 1 to FIG. 4 having the above-described structure can be made of the conductive layer of the adhesive layer 5 and the conductive substrate of the support substrate 4 as SiC or the like. The main surface of one of the two electrodes 22 is in contact with the nitride semiconductor layer 12 of the second conductivity type, and is externally connected from the other main surface side of the second electrode 22. In other words, the main surface of one of the second electrodes 22-27 to 200931684 (on the upper side of FIG. 3) is the surface of the second electrode 22 which is in contact with the semiconductor. The other main surface (lower surface) of the second electrode 22 can be used for external connection. The function of the face. Further, the bonded support substrate 4 is electrically connected to the second electrode 22, and the back surface side of the surface facing the germanium semiconductor laminated structure side (on the bottom surface side of the nitride semiconductor device 1 of FIG. 3) can be made. - is the external connection range of the second electrode 22. For example, by being placed on the support, the electrodes of the substrate 4 are connected to an external circuit. In the case where the support susceptor 4 is used as an insulating material, the support substrate 4 formed on the side of the semiconductor laminate structure is connected even by a three-dimensional wiring via the support substrate 4 or a wiring electrode such as a via for wiring. The electrode and the electrode formed on the back side of the opposite side are also taken out as electrodes from the back side of the support substrate 4. In short, the second electrode 22 and the external electrode can be electrically connected without using the exposed wire. Further, in the support substrate 4, those who connect the individual heat radiation members can also obtain a heat release effect. On the other hand, the first electrode 21 of the electrode on the surface side of the semiconductor layer is connected to the conductive refraction by solder or the like in an exposed range for external electrode connection. Thereby, it can be connected as an electrical connection to an external electrode. Others have a wiring structure in the semiconductor layer, and may be, for example, a structure in which a wiring layer is provided from the semiconductor layer to the external supporting substrate. In this case, the wiring structure is externally connected via the above-mentioned supporting substrate. Etc., connect with the outside. In the case of a light-emitting element in which such a wire is not connected, the device is not required to have a wide pad portion, and the current concentration tends to be suppressed, and a phosphor layer to be described later can be appropriately formed and sealed. member. For example, as in the example of Fig. 4, in the configuration in which the electrode reaches the end of the layer of the semiconductor -28-200931684, on the support substrate extending outside thereof, the electrode can be extended. In addition, in the nitride semiconductor device 1 shown in FIG. 1 to FIG. 3, the support substrate 4 is made of a material having excellent electrical conductivity, whereby the upper and lower sides of the light-emitting layer can be sandwiched in a three-dimensional manner as an electrode. With the vertical electrode structure, current can be diffused into the entire P-type semiconductor layer (the second conductivity type nitrided, material semiconductor layer 12), and the in-plane diffusion of current becomes uniform. 0, the electrical impedance can be reduced and the carrier injection efficiency is improved. Further, the supporting substrate 4 can be completed as a function of the heat radiating plate, and deterioration of the characteristics of the element via the heat can be suppressed. (Light-emitting device) A schematic cross-sectional view of the light-emitting device 2 of Fig. 9 shows an example in which the nitride semiconductor device 1 shown in Fig. 1 to Fig. 3 is attached to the module 8. The module 8 is provided with a base 14 each having lead wires 14a, 14b corresponding to a pair of electrode patterns. The nitride semiconductor element 1 placed on the base 14 is formed on the mounting surface side of the support substrate 4, and the second electrode 22 for external connection is electrically conductively bonded to one of the leads 14a of the base 14. The components are electrically connected. Further, the first electrode 21 disposed on the first conductive type layer 11 side of the nitride semiconductor device 1 is connected to the external connection range 16 (see FIG. 1), and is connected to the conductive lead 18 via the other lead 14b. Electrical connection. Further, in the figure, the light-emitting element is placed on the bottom surface of the concave portion. However, the present invention is not limited to the shape of the mounting portion, and can be used as a flat shape, an upper surface of the convex portion, and the like. -29- 200931684 (Lens) Further, the assembly 8 is formed with a cup having a slightly concave shape on the side surface, and has a wide opening portion 24 on the upper side. Further, the upper portion of the opening portion 24 of the module 8 is closed by a lens 17 such as a spherical lens, an aspherical lens, a cylindrical transmissive mirror, or an elliptical lens. Further, in addition to the flat surface of the light extraction side of the mirror 17, the lens may be formed in a lens shape or a microlens shape having irregularities. A lens which diffuses or collects light emitted from a light source may be provided in accordance with the use, and may be formed by inorganic glass, resin or the like. Further, the inside of the opening 24 is filled with the element covering member 26 that covers the nitride semiconductor element 1. As the element covering member 26, a translucent enamel resin composition is used in addition to the gas, and a denatured oxime resin composition is preferred. Further, a translucent insulating resin composition having an epoxy resin composition, a denatured epoxy resin composition, an acrylic resin composition or the like can be used. Further, it is possible to use a resin excellent in weather resistance, such as a resin, an epoxy resin, a urea resin, a fluorocarbon resin, or a mixed resin containing at least one of these resins. Further, it is not limited to organic substances, and it is also possible to use an inorganic material such as glass or silicone which is excellent in light resistance. Further, for the hermetic seal, an inert gas, nitrogen, oxygen, argon, helium, or a combination of these or dry air may be used. In particular, in the case of using a gallium nitride-based semiconductor element as a light source, deterioration of a semiconductor element is prevented by using dry air or a gas containing at least oxygen. -30- 200931684 (Mounting element, protective element) In addition, in the light-emitting device of the present invention, only one of the nitrided element elements 1 may be placed, but two or more light-emitting elements may be placed in addition to the light-emitting elements. In addition, for example, a Zener diode or a capacitor protection element can be combined. Further, the 'protective element' may also be formed in one of the parts of the hair piece. These protective elements are available in the field and constitute the owner.波长 (wavelength conversion member) In the element covering member 26, a conversion member 9 such as a fluorescent substance that emits fluorescence, which is excited by the light emitted from the light-emitting layer 13, can be mixed. Thereby, the light of the light source can be converted into different wave lights, and the light source and the light of the wavelength converted by the wavelength conversion member 9 can be taken out to the outside. That is, the light φ having a wavelength different from the wavelength of the main light source is obtained as a wavelength conversion member 9 by one of the light from the light source, and the phosphor can be suitably used. Because the camp light also has the function of the light-scattering auroral reflectivity, and the wavelength is changed, it can achieve the function of the light-scattering part, and the above-mentioned light can be obtained. The fluorescent system may be mixed in a relatively uniform ratio in the component coating structure, or may be partially unevenly coupled. For example, heat generated in the semiconductor layer can be easily transmitted to the fluorescent material via the specific distance from the light-emitting layer 13 to deteriorate the fluorescent material. On the other hand, if the wavelength conversion member 9 is formed on the side of the semiconductor layer to form a slightly uniform wavelength conversion layer, it is known that the light elements passing through the semiconductor such as the semiconductor are excited by the mixed color having a long wavelength. The system is changed, and the effect of the wavelength of the emitted light of the luminescent layer is constant, and the illuminating color of the mixing ratio of the stabilized primary light and the converted light is obtained. In addition, the fluorescent system can also cover components in a component made of one layer? In the case of the luminescent layer formed of the stratified layer, there may be one type or two or more types. Thereby, a light-emitting device that can emit a desired wavelength can be realized. Examples of the representative phosphor include cadmium zinc sulfide added to copper or a YGA-based light-emitting body and a LAG-based phosphor added by ruthenium. Especially for high brightness and long time use, (Re^xSmKAlHGaYhOu : Ce ( 0 S X < 1, 0 S y $ 1, but Re is an element selected from at least one of Y, Gd, La, and Lu). As the wavelength conversion member of the second embodiment, a YAG or LAG phosphor is used, and for example, white can be obtained. Further, as the phosphor, a phosphor glass or a phosphor-containing resin containing a glass or a resin-mixed phosphor, a phosphor or a crystal body (plate) containing the same may be used. ❹ In addition, by using a nitride phosphor having yellow to red light emission and the like, a red component can be added, and an illumination with a high red evaluation number Ra or a lamp or a swatch LED can be realized. Specifically, by adjusting the amount of the phosphor of the light-emitting element of the light-emitting element and adjusting the amount of the chromaticity point on the chromaticity diagram of the CIE to be contained, the phosphor can be made between the phosphor and the light-emitting element. Any point on the connected chromaticity diagram. Other examples include a nitride phosphor that converts near-ultraviolet light to visible light into a yellow to red domain, an oxynitride phosphor, a phthalate phosphor, L2Si04: Eu (L-alkaline earth metal), and in particular ( SixMaei-x) 2Si〇4: Eu (Mae is a soil test metal such as Ca, Ba, etc.) -32- 200931684 et al. As a nitride phosphor, a oxynitride (oxynitride) fluorescent system has Sr_Ca-Si-N:Eu, Ca-Si-N:Eu, Sr_Si-N:Eu, Sr-Ca-Si-Ο-N : Eu, Ca — Si — 0— Eu, Sr — Si— O — N: Eu, etc., as an alkaline earth-based lanthanum nitride fluorescent system, from the general formula LS i 2 〇 2N 2 ·· Eu, general formula LxSiyN ( 2/3X+ 4/3y) : Eu or 'LxSiyOzN(2/3x + 4/ 3y-2/3z): Eu (L is any of Sr, Ca, Sr and Ca, one). Ο (Additional member) In addition to the wavelength conversion member 9, the element covering member 26 can be used in accordance with the annual extender, pigment, fluorescent material, and appropriate components for use. A light-emitting element that points to a characteristic. Similarly, as a filter having a color filter effect of cutting off unwanted wavelengths from external light or light-emitting elements, various coloring agents may be added. Here, in the present specification, the diffusing agent means, for example, that the central particle diameter Φ is 1 nm or more, and the light from the light-emitting element and the fluorescent material can be satisfactorily reflected and the fluorescent material having a large particle diameter can be controlled. The color. Unevenness or narrowing the width of the luminescence spectrum. On the other hand, in the case of lnm, the diffusing agent which does not reach l#m does not lower the luminosity and can increase the resin viscosity. (Mixed Agent) Further, the enamel covering member 26 may contain a smearing agent in addition to the glazing material. As a specific material, the same configuration as that of the diffusing agent-33-200931684 can be used, and the center particle diameter of the diffusing agent is different. For the present specification, the central particle diameter of the chelating agent is 5 Å or more and 1 00 /zm or less. It is better. When the enthalpy of such a particle size is contained in the element covering member 26, the chromaticity unevenness of the light-emitting device is improved by the light scattering effect, and the thermal shock resistance of the element covering member 26 can be improved. Therefore, it is possible to prevent the occurrence of breakage and peeling of the light-emitting element and the interface between the different members for use at a high temperature. Further, the fluidity of the resin can be adjusted to a long time. Example 1 Hereinafter, a configuration example of the electrode of Example 1 is shown. The same components as those described above are denoted by the same reference numerals, and detailed description thereof will be omitted. Fig. 10 is a plan view of the light extraction side of the light-emitting element 101, mainly shown on the n-type electrode 41. The light-emitting element 101 shown in Fig. 10 is a slightly square-shaped crystal grain having a mouth of 1 mm (electrode forming surface of 1 mm X 1 mm), and its peripheral shape is extended in one direction (in the left-right direction of Fig. 10). The first side 35, and the second side 36 that intersects perpendicularly thereto, and the opposite sides are formed on the two sides 35, 36 and are parallel to the two sides 35', 36'. Further, the n-type electrode 41 has a pair of electrode pad portions 16 formed in the electrode forming surface 15 of the exposed portion of the n-row semiconductor layer 11, and the electrode pad portions 16 each extend in a linear electrode extension portion. 40. Further, as shown in FIG. 10, the electrode forming surface 15 of the electrode formation range is formed on the inner side from the rectangular periphery of the light-emitting element 101 by a certain distance. In the first embodiment, the light-emitting element 10 1 The outer circumference is only between 3 0 - 34 and 200931684 μ m, that is, it has a narrowing range for the center direction. Further, the pair of electrode extending portions 40 are slightly parallel and opposed to each other as an detachment. In Fig. 1A, each of the electrode extending portions 40 is formed in a direction in which it extends in parallel with the first side 35, and is arranged in a point symmetrical manner with reference to the center of the electrode forming surface 15. Further, the electrode forming surface 15 is a first range 31 sandwiched by the pair of electrode extending portions 40, except for the range of the first range 31, that is, the second range 32 in which the position Q is in the square of the first range 31. Composition. In the first embodiment, the width of the first range 31, that is, the distance (L1) between the electrode extending portions 40 is referred to as WOvm in the direction parallel to the second range 32, and the width of each of the second ranges 32 is further increased. That is, the distance (L2) from the electrode extending portion 30 to the edge of the electrode forming surface 15 is 260 // m, and the width (L3) of the second range is parallel to the first side 35, that is, The distance between the end edge 23 of the electrode extension portion 40 and the edge of the electrode forming surface 15 was 165 μm. ❹ For the electrode structure of the first embodiment, the electrode extending portion 40 is a curved portion, a branch portion, and an intersection portion which are not bent in one or more stages, and the shape is a linear one of the electrode extension portions. Separate from each other. As a result, the n-type electrode 41 is not formed in a range in which the electrode extension portion 40 is closed, that is, the opening portion is provided, and heat generation in the vicinity of the electrode and in the first range 31 can be efficiently radiated. Further, the length (L5) in the longitudinal direction of the electrode extending portion 40 is larger as the distance (L1) between the electrode extension portions 40, and the electrode formation can be increased as the intersection portion is not provided. The electrode extension portion 40 in the surface 15 is formed in a range, and -35-200931684 can emit light in the light-emitting range 29 uniformly while discharging the current concentration range. However, the distance (L1) between the electrode extensions 40 is appropriately adjusted in consideration of the degree of diffusion in the plane of the formed layer, that is, the sheet resistance, etc., thereby being a light-emitting element that can realize a desired current-diffusion body. . In the following description, the light-emitting elements of the first embodiment are mounted on respective characteristics obtained by the light-emitting devices of various types. t Q (Cannonball type I) The light-emitting element of the first embodiment is mounted in one of the leads for each polarity, and one of the fixing pads is sealed with a resin to form a resin lens-integrated seal of a bullet shape. Type of illuminating device. The characteristics obtained by the device which emits light in blue are shown below. Driving current If: 350 (mA), Vf: 3.8 (V), luminous power: 548.7 (mW), input d: 445.4 (nm), λ Ρ: 43 8.7 (nm), external quantum efficiency: 5 5 · 5 (%), power efficiency: 4 1.3 〇 (%) * (Cannonball type II) - For the above-mentioned light-emitting device, the resin contained in the YGA phosphor is preliminarily provided in the cover body mounted on the component of the fixed lead. The characteristics of the white-emitting light-emitting device obtained by the coating are as follows. Driving current If : 3 50 ( mA ) . Vf : 3.8 ( V ), color temperature Tcp : 575 1 (K ), chromaticity (X: 0.327, y: 0.333), luminous efficiency: 79.5 (lm/W). -36-200931684 (Integrated Sealing Type) The light-emitting element of the first embodiment is mounted in two sets of leads for each polarity (four in total), and one set of the fixing lead is inside the cover. The characteristics of the blue-emitting light-emitting device obtained by integrally sealing the resin lens are as follows. , drive current If: 350 (mA) - Vf : 3.7 ( V ), illuminating power: 603.6 ( mW ) ' λ d : 445.3 ( nm ) , AP : 438 (nm ) , external quantum efficiency : 60.9 ( % ) Power efficiency: 46.6 (%). (Embodiment 2) In addition, in the case of a light-emitting element having the same structure as that of the light-emitting element of Example 1, the shape of the electrode is reduced in a similar relationship. The light-emitting element of □800 was obtained in the same manner as in the first embodiment. The light-emitting output and the heat-releasing effect were obtained. (Comparative Example 1) * A plan view of the light-emitting element 301 of Comparative Example 1 is shown in Fig. 11 . The light-emitting element 301 in the figure is a slightly square-shaped crystal grain of D600 "m size, and compared with the light-emitting element 110 of the first embodiment, 'only the size of the crystal grain and the pattern of formation of the electrode are different'. Other structures are substantially For the same. The same components as those described above are denoted by the same reference numerals, and detailed description thereof will be omitted. -37- 200931684 In the light-emitting element 301 of Fig. 11, the n-type electrode 51 of the first electrode is reduced in the same manner as the electrode forming surface 15 as the center C of the electrode forming surface 15 as a center, that is, A square-shaped electrode extension 50 is formed. In other words, the corner portion of the electrode extension portion 50 has a curved portion bent at a substantially right angle. Further, for the corner portion of one of the squares, the device has an electrode pad portion having an external connection range 16. As shown in Fig. 11, the electrode, the extending portion 50 is formed by a midpoint point from the center C of the electrode forming surface 15 to the end edge, and is formed at a midpoint of the intermediate point, that is, the electrode extending portion is 0 It is disposed on the edge side of the electrode forming surface 15 . Further, the electrode forming surface 310 has the first range 31 in the range sandwiched by the electrode extending portion 50 and the second portion from the first range 31 to the edge of the electrode forming surface 15 as in the first embodiment. Range 32. In the light-emitting element of Comparative Example 1, the first range 31 is a closed range surrounded by the electrode extending portion 50, and does not have an opening portion. Q (Comparative Example 2) Further, another pattern-forming light-emitting device having an electrode was shown in Fig. 12 as Comparative Example 2. The light-emitting element 401 of Fig. 12 was implemented. In the same manner as in Comparative Example 1, the light-emitting element 401 of the same example 1 was provided with the surrounding electrode structure. Incidentally, the same constituent elements as those of the above-described configuration are denoted by the same reference numerals, and detailed description thereof will be omitted. In the light-emitting element 401 of Fig. 12, a square-shaped electrode forming surface 15 is provided, and an electrode pad portion having an external connection range 16 is provided at a corner portion which is a pair of opposite directions. The electrode extending portion -38 - 200931684 60 extending from the electrode pad portion 16 is formed by surrounding the four circumferential edges of the electrode forming surface 15 to form a surrounding electrode. Further, the electrode extending portion 60 is extended to be connected to the center of each of the rectangular sides of the rectangular shape, that is, the rectangular shape is divided into four equal parts. That is, the n-type electrode of the first electrode 61 of Comparative Example 2 has a bent portion, and the intersection portion is similar to the electrode structure of the light-emitting element shown in Fig. 15 at this point. Further, there will be a relative luminous intensity distribution map of the light-emitting elements φ 1, 301, 401 of the first embodiment and the comparative examples 1 and 2, which are shown in (a), (b), and (c) of Fig. 13 . However, for each of the light-emission profiles displayed on the gray scale scale, the display in the electrode forming surface 15 of the light-emitting element is displayed at a high concentration level, and the light-emitting intensity is increased, and the temperature rise region is further increased. It is also known that in any of the light-emitting elements 1, (301, 401) of (a), (b), and (c), it is in the vicinity of the electrode pad portion 16 that it has a high luminous intensity range. In the light-emitting element 1 of the first embodiment, as shown in FIG. 13(a), the neodymium electrode pad portion 16 is centered, and in the vicinity of the linear electrode extending portion 30 extending therefrom, the light-emitting intensity is also high. . With this, in the range, the temperature rises in other ranges, but as described above, the range of the n-type electrode structure, that is, the first range 3 1 and the second range, is remarkable because the heat release effect is remarkable. , to control. In addition, the specific thermal resistance is 6.52 to 7.67 ° C / W (the thickness of the support substrate made of Cu-W is set to 100, 200, 300, 400 // m, and is placed on a ceramic substrate for measurement. )By. On the other hand, the light-emitting element 30 1 of Comparative Example 1 has a surrounding range of the electrode extending portion 50 as shown in FIG. 13 - 39 - 200931684 (b). The illuminating concentration is concentrated in the part of the 'heat storage. Specifically, in the vicinity of the electrode pad portion 16, the concentration of the local current is observed, and this tendency becomes remarkable. In this way, not only the inside of the rectangular shape of the first electrode but also the outer side of the pad portion 16 has the same tendency as the inner portion. Similarly, in the light-emitting element 401 of Comparative Example 2, as shown in Fig. 13 (c), it is understood that there is an imbalance in current diffusion between the divisions. In particular, as shown by the dotted line in the figure, the concentration of the current is generated even at the intersection of the electrode extending portion 60 even if the distance from the electrode pad portion 16 is relatively distant. In other words, the current of the four corners (curved portions) which are divided into the rectangular shape of the cell is biased, and the unevenness of the current becomes remarkable. From the above results, it is understood that the light-emitting element 1 of the first embodiment has excellent heat dissipation properties and high resistance even under a large current. In Comparative Example 1, as described above, in comparison with the element width and the area, even in the first wide range, the inside of the wide range, and the inside of the first range, the light-emitting concentration is generated, and the element characteristics are degraded. In other words, in the electrode structure, it is possible to control the local concentration of the current and enhance the heat release by arranging the bending of the electric pole extension portion, the crossing range, and the arrangement of the current diffusion in the element efficiently. At the same time, 'the unevenness of the current density in the electrode can be taken as the limit. That is, it can be used as a light-emitting element that maintains or enhances the light output while achieving current uniformity and uniformity of light emission. [Industrial Applicability] -40- 200931684 The semiconductor light-emitting device and the semiconductor light-emitting device manufacturing method of the present invention can be suitably used for a light source for illumination, an LED display, a backlight source, an annunciator, an illumination switch, and various Detectors and various indicators. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a plan view showing a light-emitting element of an embodiment. Figure 2 is a schematic cross-sectional view taken along line π-ll' of Figure 1. 0 Figure 3 is a schematic cross-sectional view of the m-πι' line in Figure 1. Fig. 4 is a plan view showing another light-emitting element of the embodiment. Fig. 5 is an explanatory view showing a method of manufacturing a light-emitting element of the embodiment. Fig. 6 is an explanatory view showing a method of manufacturing a light-emitting element of the embodiment. Fig. 7 is an explanatory view showing a method of manufacturing a light-emitting element of the embodiment. Fig. 8 is an explanatory view showing a method of manufacturing a light-emitting element of the embodiment. Fig. 9 is a schematic cross-sectional view showing a light-emitting device of the embodiment. - Figure 10 is a plan view of the light-emitting element of Embodiment 1. Fig. 11 is a plan view showing a light-emitting element of Comparative Example 1. Fig. 12 is a plan view showing a light-emitting element of Comparative Example 2. Fig. 13 is a view showing the distribution of the relative luminous intensity of the light-emitting element, (see, relating to Example 1, (b) relating to Comparative Example 1 (c) regarding the light-emitting element of Comparative Example 2. -41 - 200931684 Figure 14 is about Fig. 15 is a plan view of a light-emitting device of another conventional form. [Description of main components] 1. 60, 101, 301, 401: light-emitting element (nitride semiconductor--component) 2: Light-emitting device 3: Support table 4: Support substrate 5: Adhesive layer 5a: Semiconductor layer-side adhesive layer 5b: Support substrate-side adhesive layer 6: Growth substrate 7: Protective film 8: Component ❹ 9: Wavelength conversion member 10: Semiconductor structure '11: first conductive layer (n-type semiconductor layer) - 12: second conductive layer (p-type semiconductor layer) 13: light-emitting layer (active layer) 14: base 14a, 14b: lead 15: Electrode forming surface 16: External connection range (electrode pad portion) -42 200931684 17 : Lens 18: Conductive wire 19: Cup 20: Electrodes 21, 41, 51, 61: First electrode (n-shaped electrode) , 22 : 2nd electrode (p type electrode) t 23 : end of the electrode extension 0 24 : opening portion 26 : element covering member 29 : light-emitting range 30, 30 ′, 40, 50, 60: electrode extending portion 3 1 : first range 3 2 : second range 33 : second right-and-left range 34 : second Upper and lower ranges 〇3 5 : 1st side 36 : 2nd side • 3 5 ' : Side parallel to the 1st side - 3 6 ' : Side 100 parallel to the 2nd side, 200 : Light-emitting element 101 : N-type electrode pad portion 101a: electrode extension portion 1 0 1 b : surrounding electrode 102: p-type electrode pad portion -43 - 200931684 2〇1 : electrode pad portion 201a: electrode extension portion 2 0 1 b : surrounding electrode 203 : Division range C : Center of electrode formation surface · D : Cutting position, Η 1 : Width of the first range Ο Η 2 : Total of widths of the second range L 1 : Distance between the extensions of the pair of electrodes 11 : 1 / 2 distance L2 between the pair of electrode extensions: distance L3 from the electrode extension portion to the edge of the semiconductor structure: width L4 of the second left and right range: width L5 of the second upper and lower range: for the electrode extension portion Length in the length direction Μ : midpoint from the center of the electrode forming surface to the end edge ❹ -44 -