TW200931177A - Radiation-sensitive resin composition for formation of a spacer, spacer, method of producing a spacer, and liquid crystal display device - Google Patents
Radiation-sensitive resin composition for formation of a spacer, spacer, method of producing a spacer, and liquid crystal display device Download PDFInfo
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- TW200931177A TW200931177A TW97143985A TW97143985A TW200931177A TW 200931177 A TW200931177 A TW 200931177A TW 97143985 A TW97143985 A TW 97143985A TW 97143985 A TW97143985 A TW 97143985A TW 200931177 A TW200931177 A TW 200931177A
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- radiation
- resin composition
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- 125000006850 spacer group Chemical group 0.000 title claims abstract description 137
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 87
- 230000005855 radiation Effects 0.000 title claims abstract description 79
- 239000011342 resin composition Substances 0.000 title claims abstract description 64
- 238000000034 method Methods 0.000 title claims abstract description 54
- 230000015572 biosynthetic process Effects 0.000 title claims description 82
- 229920005989 resin Polymers 0.000 claims abstract description 172
- 239000011347 resin Substances 0.000 claims abstract description 172
- 150000001875 compounds Chemical class 0.000 claims abstract description 118
- -1 aromatic mercapto compound Chemical class 0.000 claims abstract description 84
- 125000002723 alicyclic group Chemical group 0.000 claims abstract description 41
- 230000002378 acidificating effect Effects 0.000 claims abstract description 31
- 125000004185 ester group Chemical group 0.000 claims abstract description 24
- 239000000758 substrate Substances 0.000 claims description 89
- 239000000203 mixture Substances 0.000 claims description 52
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 claims description 41
- 239000000178 monomer Substances 0.000 claims description 41
- 125000004432 carbon atom Chemical group C* 0.000 claims description 40
- 125000000217 alkyl group Chemical group 0.000 claims description 34
- 238000011161 development Methods 0.000 claims description 29
- 125000003118 aryl group Chemical group 0.000 claims description 28
- 239000000126 substance Substances 0.000 claims description 25
- 238000010438 heat treatment Methods 0.000 claims description 24
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 22
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 21
- 229910052799 carbon Inorganic materials 0.000 claims description 21
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 20
- 125000005647 linker group Chemical group 0.000 claims description 17
- 125000003545 alkoxy group Chemical group 0.000 claims description 11
- 125000005843 halogen group Chemical group 0.000 claims description 9
- 125000002704 decyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 claims description 8
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- 125000005073 adamantyl group Chemical group C12(CC3CC(CC(C1)C3)C2)* 0.000 claims description 4
- MAWOHFOSAIXURX-UHFFFAOYSA-N cyclopentylcyclopentane Chemical group C1CCCC1C1CCCC1 MAWOHFOSAIXURX-UHFFFAOYSA-N 0.000 claims description 4
- 125000002868 norbornyl group Chemical group C12(CCC(CC1)C2)* 0.000 claims description 3
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 claims 2
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- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 13
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- OIWOHHBRDFKZNC-UHFFFAOYSA-N cyclohexyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC1CCCCC1 OIWOHHBRDFKZNC-UHFFFAOYSA-N 0.000 description 8
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- YXIWHUQXZSMYRE-UHFFFAOYSA-N 1,3-benzothiazole-2-thiol Chemical compound C1=CC=C2SC(S)=NC2=C1 YXIWHUQXZSMYRE-UHFFFAOYSA-N 0.000 description 5
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- 125000000640 cyclooctyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C([H])([H])C1([H])[H] 0.000 description 1
- 125000001511 cyclopentyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 1
- DIOQZVSQGTUSAI-NJFSPNSNSA-N decane Chemical group CCCCCCCCC[14CH3] DIOQZVSQGTUSAI-NJFSPNSNSA-N 0.000 description 1
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- 210000003298 dental enamel Anatomy 0.000 description 1
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- ODQWQRRAPPTVAG-GZTJUZNOSA-N doxepin Chemical compound C1OC2=CC=CC=C2C(=C/CCN(C)C)/C2=CC=CC=C21 ODQWQRRAPPTVAG-GZTJUZNOSA-N 0.000 description 1
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- JJJFUHOGVZWXNQ-UHFFFAOYSA-N enbucrilate Chemical compound CCCCOC(=O)C(=C)C#N JJJFUHOGVZWXNQ-UHFFFAOYSA-N 0.000 description 1
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- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 1
- LVUYILZRQXJFAO-UHFFFAOYSA-N ethyl 4-[2-[4,5-bis(4-ethoxycarbonylphenyl)-2-(2,4,6-trichlorophenyl)imidazol-2-yl]-5-(4-ethoxycarbonylphenyl)-2-(2,4,6-trichlorophenyl)imidazol-4-yl]benzoate Chemical compound C1=CC(C(=O)OCC)=CC=C1C1=NC(C2(N=C(C(=N2)C=2C=CC(=CC=2)C(=O)OCC)C=2C=CC(=CC=2)C(=O)OCC)C=2C(=CC(Cl)=CC=2Cl)Cl)(C=2C(=CC(Cl)=CC=2Cl)Cl)N=C1C1=CC=C(C(=O)OCC)C=C1 LVUYILZRQXJFAO-UHFFFAOYSA-N 0.000 description 1
- KWKPVUKQSHTNBK-UHFFFAOYSA-N ethyl 4-[2-[4,5-bis(4-ethoxycarbonylphenyl)-2-(2-phenylphenyl)imidazol-2-yl]-5-(4-ethoxycarbonylphenyl)-2-(2-phenylphenyl)imidazol-4-yl]benzoate Chemical compound C1=CC(C(=O)OCC)=CC=C1C1=NC(C2(N=C(C(=N2)C=2C=CC(=CC=2)C(=O)OCC)C=2C=CC(=CC=2)C(=O)OCC)C=2C(=CC=CC=2)C=2C=CC=CC=2)(C=2C(=CC=CC=2)C=2C=CC=CC=2)N=C1C1=CC=C(C(=O)OCC)C=C1 KWKPVUKQSHTNBK-UHFFFAOYSA-N 0.000 description 1
- VTMOZDPKVKWLNK-UHFFFAOYSA-N ethyl 4-[2-[4,5-bis(4-ethoxycarbonylphenyl)imidazol-2-ylidene]-3-(2-chlorophenyl)-5-(4-ethoxycarbonylphenyl)-4H-imidazol-4-yl]benzoate Chemical compound ClC1=C(C=CC=C1)N1C(N=C(C1C1=CC=C(C=C1)C(=O)OCC)C1=CC=C(C=C1)C(=O)OCC)=C1N=C(C(=N1)C1=CC=C(C=C1)C(=O)OCC)C1=CC=C(C=C1)C(=O)OCC VTMOZDPKVKWLNK-UHFFFAOYSA-N 0.000 description 1
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- 229910052738 indium Inorganic materials 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
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- 125000004491 isohexyl group Chemical group C(CCC(C)C)* 0.000 description 1
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- FQPSGWSUVKBHSU-UHFFFAOYSA-N methacrylamide Chemical compound CC(=C)C(N)=O FQPSGWSUVKBHSU-UHFFFAOYSA-N 0.000 description 1
- 229920003145 methacrylic acid copolymer Polymers 0.000 description 1
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- 125000005397 methacrylic acid ester group Chemical group 0.000 description 1
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- NATLKMWRCRYQDI-UHFFFAOYSA-N methyl 4-[2-(2-ethylphenyl)-2-[2-(2-ethylphenyl)-4,5-bis(4-methoxycarbonylphenyl)imidazol-2-yl]-5-(4-methoxycarbonylphenyl)imidazol-4-yl]benzoate Chemical compound CCC1=CC=CC=C1C1(C2(N=C(C(=N2)C=2C=CC(=CC=2)C(=O)OC)C=2C=CC(=CC=2)C(=O)OC)C=2C(=CC=CC=2)CC)N=C(C=2C=CC(=CC=2)C(=O)OC)C(C=2C=CC(=CC=2)C(=O)OC)=N1 NATLKMWRCRYQDI-UHFFFAOYSA-N 0.000 description 1
- QPJVMBTYPHYUOC-UHFFFAOYSA-N methyl benzoate Chemical compound COC(=O)C1=CC=CC=C1 QPJVMBTYPHYUOC-UHFFFAOYSA-N 0.000 description 1
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- WBYWAXJHAXSJNI-UHFFFAOYSA-N methyl p-hydroxycinnamate Natural products OC(=O)C=CC1=CC=CC=C1 WBYWAXJHAXSJNI-UHFFFAOYSA-N 0.000 description 1
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- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
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- LWRAOCDRKBYALH-UHFFFAOYSA-N phenyl 4-[2-[4,5-bis(4-phenoxycarbonylphenyl)-2-(2-phenylphenyl)imidazol-2-yl]-5-(4-phenoxycarbonylphenyl)-2-(2-phenylphenyl)imidazol-4-yl]benzoate Chemical compound C=1C=C(C=2C(=NC(N=2)(C=2C(=CC=CC=2)C=2C=CC=CC=2)C2(N=C(C(=N2)C=2C=CC(=CC=2)C(=O)OC=2C=CC=CC=2)C=2C=CC(=CC=2)C(=O)OC=2C=CC=CC=2)C=2C(=CC=CC=2)C=2C=CC=CC=2)C=2C=CC(=CC=2)C(=O)OC=2C=CC=CC=2)C=CC=1C(=O)OC1=CC=CC=C1 LWRAOCDRKBYALH-UHFFFAOYSA-N 0.000 description 1
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- WVDDGKGOMKODPV-ZQBYOMGUSA-N phenyl(114C)methanol Chemical compound O[14CH2]C1=CC=CC=C1 WVDDGKGOMKODPV-ZQBYOMGUSA-N 0.000 description 1
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N phenylbenzene Natural products C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 1
- 125000000843 phenylene group Chemical group C1(=C(C=CC=C1)*)* 0.000 description 1
- 125000000286 phenylethyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])C([H])([H])* 0.000 description 1
- 230000036211 photosensitivity Effects 0.000 description 1
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- 229910000028 potassium bicarbonate Inorganic materials 0.000 description 1
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- 239000001508 potassium citrate Substances 0.000 description 1
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- QEEAPRPFLLJWCF-UHFFFAOYSA-K potassium citrate (anhydrous) Chemical compound [K+].[K+].[K+].[O-]C(=O)CC(O)(CC([O-])=O)C([O-])=O QEEAPRPFLLJWCF-UHFFFAOYSA-K 0.000 description 1
- 235000011082 potassium citrates Nutrition 0.000 description 1
- TYJJADVDDVDEDZ-UHFFFAOYSA-M potassium hydrogencarbonate Chemical compound [K+].OC([O-])=O TYJJADVDDVDEDZ-UHFFFAOYSA-M 0.000 description 1
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- FBCQUCJYYPMKRO-UHFFFAOYSA-N prop-2-enyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC=C FBCQUCJYYPMKRO-UHFFFAOYSA-N 0.000 description 1
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- 239000001488 sodium phosphate Substances 0.000 description 1
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 1
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- 229940075582 sorbic acid Drugs 0.000 description 1
- 241000894007 species Species 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
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- 230000005469 synchrotron radiation Effects 0.000 description 1
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- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 150000005622 tetraalkylammonium hydroxides Chemical class 0.000 description 1
- HWCKGOZZJDHMNC-UHFFFAOYSA-M tetraethylammonium bromide Chemical compound [Br-].CC[N+](CC)(CC)CC HWCKGOZZJDHMNC-UHFFFAOYSA-M 0.000 description 1
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- 239000004416 thermosoftening plastic Substances 0.000 description 1
- DLFVBJFMPXGRIB-UHFFFAOYSA-N thioacetamide Natural products CC(N)=O DLFVBJFMPXGRIB-UHFFFAOYSA-N 0.000 description 1
- 125000003944 tolyl group Chemical group 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- 238000010023 transfer printing Methods 0.000 description 1
- 125000001425 triazolyl group Chemical group 0.000 description 1
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 1
- RYFMWSXOAZQYPI-UHFFFAOYSA-K trisodium phosphate Chemical compound [Na+].[Na+].[Na+].[O-]P([O-])([O-])=O RYFMWSXOAZQYPI-UHFFFAOYSA-K 0.000 description 1
- 229910000406 trisodium phosphate Inorganic materials 0.000 description 1
- 235000019801 trisodium phosphate Nutrition 0.000 description 1
- 125000003523 triterpene group Chemical group 0.000 description 1
- DNYWZCXLKNTFFI-UHFFFAOYSA-N uranium Chemical compound [U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U][U] DNYWZCXLKNTFFI-UHFFFAOYSA-N 0.000 description 1
- ROVRRJSRRSGUOL-UHFFFAOYSA-N victoria blue bo Chemical compound [Cl-].C12=CC=CC=C2C(NCC)=CC=C1C(C=1C=CC(=CC=1)N(CC)CC)=C1C=CC(=[N+](CC)CC)C=C1 ROVRRJSRRSGUOL-UHFFFAOYSA-N 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
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- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F290/00—Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F290/00—Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups
- C08F290/02—Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups on to polymers modified by introduction of unsaturated end groups
- C08F290/06—Polymers provided for in subclass C08G
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F290/00—Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups
- C08F290/08—Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups on to polymers modified by introduction of unsaturated side groups
- C08F290/12—Polymers provided for in subclasses C08C or C08F
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1339—Gaskets; Spacers; Sealing of cells
- G02F1/13394—Gaskets; Spacers; Sealing of cells spacers regularly patterned on the cell subtrate, e.g. walls, pillars
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0005—Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
- G03F7/0007—Filters, e.g. additive colour filters; Components for display devices
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/028—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
- G03F7/031—Organic compounds not covered by group G03F7/029
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/033—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
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- G—PHYSICS
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- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2202/00—Materials and properties
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- G02F2202/023—Materials and properties organic material polymeric curable
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- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
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- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0388—Macromolecular compounds which are rendered insoluble or differentially wettable with ethylenic or acetylenic bands in the side chains of the photopolymer
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- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
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Abstract
Description
200931177 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種間隔物形成用感放射線性樹脂組成 物、間隔物、間隔物的形成方法及液晶顯示元件。 【先前技術】 習知之液晶顯示裝置係已泛用於顯示高畫質影像之顯 示裝置。一般而言,液晶顯示裝置係具備一液晶層,藉由 既定配向於一對基板間以使影像顯示成爲可能,此基板間 〇 隔,亦即均勻維持液晶層之厚度係決定畫質的因素之一, 爲此,配設有用以固定保持液晶層厚度之間隔物。一般而 言,此基板之間的厚度被稱爲「液晶胞厚度」。液晶胞厚 度通常表示該液晶層之厚度,換言之,顯示已將電場施加 於液晶顯示區域之2片電極間的距離。 習知,間隔物係經由玻璃珠散布所形成的,近年來逐 漸使用感光性組成物,經由光刻而使位置精確度高的間隔 物得以形成。使用如此之感光性組成物所形成的間隔物被 〇 稱爲光間隔物。 來自作爲光刻中之光源所使用之水銀燈的放射線,由 於通常於43 6iun附近(g線)、404nm附近(h線)、3 65nm 附近(i線)、3 3 5nm附近、315nm附近(j線)、3 03nm 附近等顯示強度高的光譜,感放射線性樹脂組成物中所含 之感放射線性聚合起始劑係通常在此等強度高的光譜之波 長領域選擇使用具有最大吸收波長之化合物。大部分之情 形,基於透明性之觀點,在波長爲i線以下之領域具有最 大吸收波長之感放射線性聚合起始劑將被使用(例如,參 200931177 照日本專利特開2005-208360號公報)。 若使用波長較i線爲長的g線或h線附近具有最大吸 收波長之感放射線性聚合起始劑時’由於此感放射線性聚 合起始劑係在接近可見光線的波長領域具有吸收,含有此 感放射線性聚合起始劑之感放射線性樹脂組成物將帶有顏 色,所形成的被覆膜之透明性將降低。 若被覆膜之透明性低的話,於曝光時,在膜表面進行 硬化反應的同時,也朝向被覆膜之深度方向的硬化反應將 〇 變得不足》其結果,顯像後所得的間隔物形狀係成爲倒尖 錐狀(剖面形狀爲膜表面之邊較基板側之邊爲長的倒三角 形),於其後之配向膜平磨處理時,將成爲間隔物剝離之 原因。 另一方面,實際之間隔物形成程序,經由光刻而在可 用於例如彩色濾光片等之透明基板上形成間隔物之情形 下,大多使用近接型曝光機。近年來,由於近接型曝光機 之產率提高,一般已使用照度高的水銀燈。此情形下,雖 Ο 然產率將提高,但是一旦直接使用照度高的水銀燈時,由 於使得曝光機所用之鏡片壽命降低,利用濾波器以濾除具 有高能量之低於3 5 0nm短波長的放射線而使用之情形爲多 的。但是,習知大部分之感放射線性聚合起始劑具有低於 350nm之最大吸收波長,一旦濾除低於波長350nm之放射 線時,無法充分產生感放射線性樹脂組成物硬化所必要之 自由基等活性種,硬化反應將變得不足,得到能夠滿足之 間隔物的尺寸或形狀將變得困難。 另外,習知之感放射線性聚合起始劑,由於溶液保存 200931177 性爲差的,將有必須於冷藏中使塗布液予以保存之操作性 問題,或是對於因此而造成之成本提高的影響'於塗布後 之玻璃基板上的經時安定性等問題》 【發明内容】 發明所欲解決之枝術問顆 若根據本發明,提供一種高感度且具優越保存性之間 隔物用感放射線性樹脂組成物。另外,課題在於提供一種 使用此感放射線性樹脂組成物而形成的間隔物、該間隔物 © 之形成方法、及具備該間隔物之液晶顯示元件。 解決問顆之技術手段 爲了達到該課題之具體手段係如下所示’· < 1 > 一種間隔物形成用感放射線性樹脂組成物,其係 含有: (A)在至少一側鏈中具有分枝構造及/或脂環構造、 酸性基、或是隔著酯基而鍵結於主鏈之乙烯性不飽和基的 樹脂; © ( B )聚合性不飽和化合物;及 (C)含有(C1)六芳基聯咪唑化合物、(C2)芳香族 锍基化合物與(C3 )助劑。 < 2 >揭示於< 1 >之間隔物形成用感放射線性樹脂組 成物,其中該(C3)助劑係含有由噻噸酮化合物、香豆素 化合物、二苯基酮化合物與吖啶酮化合物所選出之至少一 種。 <3>揭示於< 1>之間隔物形成用感放射線性樹脂組 成物,其中該(c 1 )六芳基聯咪唑化合物係下列通式(1) 200931177 或通式(2)所示之化合物[Technical Field] The present invention relates to a radiation sensitive resin composition for spacer formation, a spacer, a method of forming a spacer, and a liquid crystal display element. [Prior Art] A conventional liquid crystal display device has been widely used for displaying a display device of high definition image. In general, a liquid crystal display device includes a liquid crystal layer, which is defined by a predetermined alignment between a pair of substrates to enable image display, and the substrate is spaced apart, that is, the thickness of the liquid crystal layer is uniformly maintained to determine the image quality. First, for this purpose, spacers for fixing the thickness of the liquid crystal layer are provided. In general, the thickness between the substrates is referred to as "liquid crystal cell thickness". The thickness of the liquid crystal cell generally indicates the thickness of the liquid crystal layer, in other words, the distance between the two electrodes which have applied an electric field to the liquid crystal display region. Conventionally, spacers have been formed by scattering of glass beads. In recent years, photosensitive compositions have been gradually used, and spacers having high positional accuracy have been formed by photolithography. The spacer formed using such a photosensitive composition is referred to as a photo spacer. The radiation from the mercury lamp used as the light source in photolithography is usually around 43 6iun (g line), around 404 nm (h line), around 3 65 nm (i line), around 3 35 nm, and around 315 nm (j line). A spectrum having a high intensity, such as in the vicinity of 3 03 nm, and a radiation-sensitive polymerization initiator contained in the radiation-sensitive resin composition are generally selected to have a compound having a maximum absorption wavelength in the wavelength range of the high-intensity spectrum. In most cases, based on the viewpoint of transparency, a radiation-sensitive polymerization initiator having a maximum absorption wavelength in a region having a wavelength below the i-line will be used (for example, see Japanese Patent Laid-Open Publication No. 2005-208360). . When a radiation-sensitive polymerization initiator having a wavelength of longer than the i-line or a maximum absorption wavelength near the h-line is used, 'the radiation-type polymerization initiator has absorption in the wavelength range close to the visible light, as it contains The radiation sensitive linear resin composition of the radiation polymerization initiator will be colored, and the transparency of the formed coating film will be lowered. When the transparency of the coating film is low, the curing reaction proceeds to the surface of the film at the time of exposure, and the curing reaction in the depth direction of the coating film is insufficient. As a result, the spacer obtained after the development is obtained. The shape is an inverted tapered shape (the cross-sectional shape is an inverted triangle whose side of the film surface is longer than the side of the substrate side), and the spacer film is peeled off after the alignment film is subjected to the flat grinding treatment. On the other hand, in the case of an actual spacer forming process, a spacer is often used in a transparent substrate which can be used for, for example, a color filter or the like by photolithography, and a proximity type exposure machine is often used. In recent years, mercury lamps having high illuminance have been generally used due to an increase in the yield of the proximity type exposure machine. In this case, although the yield will increase, once the mercury lamp with high illuminance is directly used, the filter is used to filter out the short wavelength of less than 350 nm with high energy due to the reduced lifetime of the lens used in the exposure machine. There are many situations in which radiation is used. However, most of the conventional radiation-based polymerization initiators have a maximum absorption wavelength of less than 350 nm, and once the radiation of a wavelength lower than 350 nm is filtered, radicals necessary for the hardening of the radiation-sensitive resin composition cannot be sufficiently generated. The active species, the hardening reaction will become insufficient, and it will become difficult to obtain a size or shape of the spacer that can be satisfied. In addition, the conventional radiation-based polymerization initiator has poor operability in solution storage 200931177, and there is an operational problem that it is necessary to preserve the coating liquid in refrigeration, or an effect on the cost increase caused by the problem. Problems such as stability over time on a coated glass substrate, etc. [Explanation] According to the present invention, a spacer having high sensitivity and superior preservability is composed of a radiation sensitive resin. Things. Further, another object of the invention is to provide a spacer formed using the radiation-sensitive resin composition, a method of forming the spacer, and a liquid crystal display device including the spacer. The specific means for solving the problem is as follows: <1> A radiation-sensitive resin composition for forming a spacer, comprising: (A) having at least one side chain a branched structure and/or an alicyclic structure, an acidic group, or a resin bonded to an ethylenically unsaturated group of a main chain via an ester group; © (B) a polymerizable unsaturated compound; and (C) a C1) a hexaarylbiimidazole compound, a (C2) aromatic mercapto compound, and a (C3) adjuvant. <2> The radiation-sensitive resin composition for spacer formation according to <1>, wherein the (C3) auxiliary contains a thioxanthone compound, a coumarin compound, a diphenyl ketone compound, and At least one selected from the acridone compound. <3> The radiation-sensitive resin composition for spacer formation according to <1>, wherein the (c 1 ) hexaarylbiimidazole compound is represented by the following formula (1) 200931177 or formula (2) Compound
(A)m (1) -Ο」2(A)m (1) -Ο"2
(X)n 式(l)中,x係表示氫原子、鹵素原子、氰基、碳數 1〜4之烷基或碳數6〜9之芳基;A係表示具有碳數1〜12 之取代或未取代之烷氧基或-C 00-R (其中,R係表示碳數 1〜4之烷基或碳數6〜9之芳基);11係1〜3之整數;各 m係1〜3之整數;(X)n In the formula (1), x represents a hydrogen atom, a halogen atom, a cyano group, an alkyl group having 1 to 4 carbon atoms or an aryl group having 6 to 9 carbon atoms; and A represents a carbon number of 1 to 12; a substituted or unsubstituted alkoxy group or -C 00-R (wherein R represents an alkyl group having 1 to 4 carbon atoms or an aryl group having 6 to 9 carbon atoms); 11 is an integer of 1 to 3; each m system An integer from 1 to 3;
鹵素原子、氰基、碳數1〜4之烷基或碳數6〜9之芳基; X1、X2與X3之2個以上係不同時表示爲氫原子。 200931177 < 4 >揭示於< 1 >之間隔物形成用感放射線性樹脂組 成物,其中該分枝構造及/或脂環構造係由二環戊基、二環 戊烯基、環己基、三環戊基、三環戊烯基、金剛烷基、降 莰烷基及異莰烷基所選出之至少一種。 < 5 >揭示於< 1 >之間隔物形成用感放射線性樹脂組 成物,其中該脂環構造係由下列通式(3 )所示之單體所衍 生之基 Ο C©-°fX' 0 0 ηA halogen atom, a cyano group, an alkyl group having 1 to 4 carbon atoms or an aryl group having 6 to 9 carbon atoms; and when two or more of X1, X2 and X3 are different, they are represented by a hydrogen atom. The radiation-sensitive resin composition for spacer formation according to <1>, wherein the branching structure and/or the alicyclic structure is a dicyclopentyl group, a dicyclopentenyl group, or a ring At least one selected from the group consisting of hexyl, tricyclopentyl, tricyclopentenyl, adamantyl, norbornyl and isodecyl. <5> The radiation-sensitive resin composition for spacer formation according to <1>, wherein the alicyclic structure is a base derived from a monomer represented by the following formula (3): °fX' 0 0 η
-C一C=Chb 通式 Ο) I R 通式(3)中,X係表示2價之有機連結基,y係表示 1或2,η係表示0〜15之整數,R係表示氫原子或甲基。 < 6 >揭示於< 5 >之間隔物形成用感放射線性樹脂組 成物,其中該2價之有機連結基係由伸烷基、伸芳基、酯 基、醯胺基及醚基所選出之一基或組合。 < 7 >揭示於< 1 >之間隔物形成用感放射線性樹脂組 成物,其中該脂環構造係由下列通式(4 )所示之單體所衍 生之基:-C-C=Chb Formula Ο) IR In the formula (3), X represents a divalent organic linking group, y represents 1 or 2, η represents an integer of 0 to 15, and R represents a hydrogen atom or methyl. <6> The radioactive resin composition for spacer formation according to <5>, wherein the divalent organic linking group is an alkyl group, an aryl group, an ester group, a decyl group, and an ether group. One of the bases or combinations selected. <7> The radiation-sensitive resin composition for spacer formation according to <1>, wherein the alicyclic structure is a group derived from a monomer represented by the following formula (4):
通式(4) 通式(4)中,X係表示2價之有機連結基,y係表示 200931177 1或2,η係表示0〜15之整數,R係表示氫原子或甲基。 < 8 >揭示於< 7 >之間隔物形成用感放射線性樹脂組 成物,其中該2價之有機連結基係由伸烷基、伸芳基、酯 基、醯胺基及醚基所選出之一基或組合。 < 9 >揭示於< 1 >之間隔物形成用感放射線性樹脂組 成物,其中該分枝構造係碳原子數3〜12個的分枝狀烷基。 < 10>揭示於< 1>之間隔物形成用感放射線性樹脂 組成物,其中該(A)樹脂更含有來自苯乙烯之構造單位》 〇 <ιι>揭示於<ι>之間隔物形成用感放射線性樹脂 組成物,其中該(A)樹脂中之該分枝構造及/或脂環構造 的組成比(X )爲1 〇〜70莫耳%,該酸性基的組成比(y ) 爲5〜70莫耳%,該乙烯性不飽和基的組成比(z)爲10 〜70莫耳%。 < 12>揭示於< 1>之間隔物形成用感放射線性樹脂 組成物,其中該(B)聚合性化合物對於(A)樹脂的質量 比率〔(B) / (A)比〕爲 0.5 〜2.5。 © <13> —種間隔物,其係使用揭示於上述<1>〜<12 >中任一項之間隔物形成用感放射線性樹脂組成物所形 成。 <14> —種間隔物之製造方法,其係包含: 使用揭示於上述< 1>〜< 12>中任一項之間隔物形 成用感放射線性樹脂組成物而在基板上形成感光性樹脂 層; 於該感光性樹脂層之至少一部分,曝光實質上不包含 低於3 50nm波長之放射線; -10- 200931177 顯像曝光後之感光性樹脂層;及 加熱顯像後之感光性樹脂層。 <15> —種液晶顯示元件,其係具備揭示於上述<13 >之間隔物。 發明之效果 若根據本發明,能夠提供一種高感度且具優越保存性 之間隔物用感放射線性樹脂組成物。另外’能夠提供一種 使用該組成物而形成的間隔物、該間隔物之形成方法、具 〇 備該間隔物之液晶顯示元件。 【實施方式】 ,明之實施形態 以下,針對本發明之間隔物形成用感放射線性樹脂組 成物(以下,也簡稱爲「感放射線性樹脂組成物J )、間 隔物、間隔物之製造方法、及液晶顯示元件詳細加以說明。 間隔物形成用感放射線性樹脂組成物及間隔物之製造 方法 〇 本發明之間隔物形成用感放射線性樹脂組成物係含 有:(A)在至少一側鏈中具有分枝構造及/或脂環構造、 酸性基、或是隔著酯基而鍵結於主鏈之乙烯性不飽和基的 樹脂;(B)聚合性不飽和化合物;及(c)含有(C1)六 芳基聯咪唑化合物、(C2 )芳香族锍基化合物與(C3 )助 劑。 由於具有上述之構造,本發明之間隔物形成用感放射 線性樹脂組成物係高感度且具優越之顯像性,並且具優越 之保存性。尤其,即使不含有波長低於350nm之波長,也 -11- 200931177 爲高感度,並且硬化反應爲良好且具優越之顯像性。 另外,由該感放射線性樹脂組成物所製造之間隔物, 由於具優越之壓縮性,也具有高度之變形恢復性,能夠消 除顯示元件及/或顯示裝置中之顯示不均。 另外,本發明之間隔物之製造方法係一種具備下列構 造的液晶顯示裝置中之該間隔物之製造方法:至少二片基 板、於該基板間所配設之液晶材料、將電場施加於該液晶 材料的二片電極、及限制該基板間之液晶胞厚度的間隔 U 物。具有於該二片基板之一側上,具有形成含有本發明之 感放射線性樹脂組成物的感放射線性樹脂組成物層(以 下,也稱爲「感光性樹脂層」)之層形成步驟。 層形成步驟 本發明中之層形成步驟係使用本發明之感光性樹脂組 成物而在基板上形成感光性樹脂層的步驟。 由此感光性樹脂層,經歷後述之圖案形成步驟等之其 他步驟,變形恢復性良好且可均勻保持液晶胞厚度之本發 ~ 明的間隔物將予以形成。藉由使用該間隔物,尤其根據液In the formula (4), X represents a divalent organic linking group, y represents 200931177 1 or 2, η represents an integer of 0 to 15, and R represents a hydrogen atom or a methyl group. <8> The radiation-sensitive resin composition for spacer formation according to <7>, wherein the divalent organic linking group is an alkyl group, an aryl group, an ester group, an anthranyl group, and an ether group. One of the bases or combinations selected. <9> The radiation-sensitive resin composition for spacer formation according to <1>, wherein the branching structure is a branched alkyl group having 3 to 12 carbon atoms. <10> The radiation-sensitive resin composition for spacer formation according to <1>, wherein the (A) resin further contains a structural unit derived from styrene. 〇 < ιιι > is disclosed in the interval of <ι> a radiation-sensitive resin composition for forming a substance, wherein a composition ratio (X) of the branching structure and/or an alicyclic structure in the (A) resin is 1 〇 to 70 mol%, and a composition ratio of the acidic group ( y ) is 5 to 70 mol%, and the composition ratio (z) of the ethylenically unsaturated group is 10 to 70 mol%. <12> The radiation-sensitive resin composition for spacer formation according to <1>, wherein the mass ratio of the (B) polymerizable compound to the (A) resin [(B) / (A) ratio] is 0.5 ~2.5. The <13> is a spacer which is formed by using a radiation sensitive resin composition for spacer formation according to any one of the above items <1> to <12>. <14> The method for producing a spacer comprising: forming a photosensitive resin composition on the substrate by using the radiation sensitive resin composition for spacer formation disclosed in any one of the above <1> to <12> a resin layer; at least a portion of the photosensitive resin layer, the exposure does not substantially contain radiation having a wavelength lower than 35 nm; -10-200931177 photosensitive resin layer after development exposure; and photosensitive resin after heating development Floor. <15> A liquid crystal display device comprising the spacer disclosed in the above <13>. Advantageous Effects of Invention According to the present invention, it is possible to provide a radiation sensitive resin composition for a spacer having high sensitivity and excellent storage stability. Further, it is possible to provide a spacer formed using the composition, a method of forming the spacer, and a liquid crystal display device having the spacer. [Embodiment] The present invention relates to a radiation-sensitive resin composition for spacer formation according to the present invention (hereinafter, simply referred to as "radiation-sensitive linear resin composition J"), a method for producing a spacer, a spacer, and The liquid crystal display element is described in detail. The method for producing a radiation-sensitive resin composition for spacer formation and a spacer, the radiation-sensitive resin composition for spacer formation of the present invention contains: (A) having at least one side chain a branched structure and/or an alicyclic structure, an acidic group, or a resin bonded to an ethylenically unsaturated group of a main chain via an ester group; (B) a polymerizable unsaturated compound; and (c) a (C1) a hexaarylbiimidazole compound, a (C2) aromatic mercapto compound, and a (C3) auxiliary agent. With the above structure, the spacer-forming radiation sensitive resin composition of the present invention is highly sensitive and superior in appearance. It is image-like and has excellent preservation. Especially, even if it does not contain wavelengths below 350nm, -11-200931177 is high sensitivity, and the hardening reaction is good and superior. Further, the spacer manufactured by the radiation-sensitive resin composition can have high deformation recovery property due to superior compressibility, and can eliminate display unevenness in display elements and/or display devices. The method for producing a spacer of the present invention is a method for manufacturing the spacer in a liquid crystal display device having the following structure: at least two substrates, a liquid crystal material disposed between the substrates, and an electric field applied to the liquid crystal material a two-electrode electrode and a spacer U for limiting the thickness of the liquid crystal cell between the substrates, and having a radiation-sensitive resin composition layer containing the radiation-sensitive resin composition of the present invention on one side of the two substrates ( Hereinafter, a layer forming step of a "photosensitive resin layer" is also referred to. Layer forming step The layer forming step in the present invention is a step of forming a photosensitive resin layer on a substrate by using the photosensitive resin composition of the present invention. The photosensitive resin layer is subjected to other steps such as a pattern forming step to be described later, and a spacer having a good deformation recovery property and capable of uniformly maintaining the thickness of the liquid crystal cell will be formed. By using the spacer, especially according to the liquid
III 晶胞厚度之變動,顯示不均容易發生的液晶顯示裝置中之 顯示不均將有效地被消除。 在基板上形成感光性樹脂層之方法的例子,可列舉: (a)塗布本發明之感放射線性樹脂組成物之方法;及(” 使用具有該感光性樹脂層之感光性轉印材料,藉由加熱及/ 或加壓以層壓及轉印感光性樹脂層之轉印法等。 (a )塗布法 感放射線性樹脂組成物之塗布能夠利用習知之塗布法 進行,例如,旋轉塗布法、簾流塗布法、浸漬塗布法、氣 -12- 200931177 刀塗布法、輥塗布法、線桿塗布法、照相凹版塗布法、或 是使用揭示於美國專利第2681294號專利說明書之料斗的 擠壓塗布法等。其中,適宜使用日本特開2004-89851號公 報、特開2004-17043號公報、特開2003-170098號公報、 特開2003-164787號公報、特開2003-10767號公報、特開 2002-79163號公報、特開2001-310147號公報等之狹縫噴 嘴或狹縫塗布機之塗布法。 (b )轉印法 轉印係藉由將使用感光性轉印材料而在暫時載體上所 形成的膜狀之感光性樹脂層,貼合於利用輥或平板以壓黏 或加熱壓黏於載體(或基板)之表面後,依照暫時載體之 剝離而將感光性樹脂層轉印至載體上。具體而言,可列舉: 於曰本專利特開平7-110575號公報、特開平11-779 42號 公報、特開2000-334836號公報、特開2002-148794號公 報揭示之層壓機及層壓方法。基於低污染物之觀點,較佳 爲使用於日本專利特開平7-110575號公報揭示之方法。 形成感光性樹脂層之情形,能夠進一步於感光性樹脂 層與暫時載體之間設置氧遮斷層(以下,也稱爲「氧遮斷 層」或「中間層」)。藉此,能夠提高曝光感度。另外, 爲了使轉印性提高,也可以設置具有緩衝性之熱可塑性樹 脂層。 針對構成該感光性轉印材料之暫時載體、氧遮斷層' 熱可塑性樹脂層、其他層或該感光性轉印材料之製作方 法,能夠採用於日本專利特開2006-23696號公報之段落編 號〔0024〕〜〔 0030〕掲示之構造、製作方法。 (a)塗布法、(b)轉印法皆塗布形成感光性樹脂層 -13- 200931177 之情形,其層厚較佳爲〇.5em〜lO.Oem,更佳爲lym〜 6ym。若層厚爲該範圍時,製造時之塗布形成之際的針孔 發生將被防止,能夠不需要長時間地進行未曝光部分之顯 示去除。 於其上,形成感光性樹脂層之基板,例如,透明基板 (例如,玻璃基板或塑膠基板)、附透明導電膜(例如, ITO膜)之基板、附彩色濾光片之基板(也稱爲彩色濾光 片基板)、附驅動元件(例如,薄膜電晶體〔TFT〕)之驅 ^ 動基板等。一般而言,基板之厚度較佳爲 700#m〜 ❹ 1 2 0 0 // m。 感放射線性樹脂組成物 接著,針對感放射線性樹脂組成物加以說明。' 本發明之感放射線性樹脂組成物係含有:(A )在至少 一側鏈中具有分枝構造及/或脂環構造、酸性基、或是隔著 酯基而鍵結於主鏈之乙烯性不飽和基的樹脂;(B)聚合性 不飽和化合物;及(C)含有(C1)六芳基聯咪唑化合物、 (C2)芳香族锍基化合物與(C3)助劑。III. Variation in the cell thickness, display unevenness in the liquid crystal display device in which unevenness is likely to occur is effectively eliminated. Examples of the method of forming the photosensitive resin layer on the substrate include: (a) a method of applying the radiation sensitive resin composition of the present invention; and (" using a photosensitive transfer material having the photosensitive resin layer, The transfer method of laminating and transferring the photosensitive resin layer by heating and/or pressurization, etc. (a) Coating of the coating method The radiation sensitive resin composition can be carried out by a conventional coating method, for example, a spin coating method, Curtain coating method, dip coating method, gas coating method, gas coating method, roll coating method, wire bar coating method, gravure coating method, or extrusion coating using a hopper disclosed in the specification of U.S. Patent No. 2,681,294 For example, JP-A-2004-89851, JP-A-2004-17043, JP-A-2003-170098, JP-A-2003-164787, JP-A-2003-10767 A coating method of a slit nozzle or a slit coater such as JP-A-2001-310147 (b) Transfer printing is performed on a temporary carrier by using a photosensitive transfer material. Formed The photosensitive resin layer is bonded to the surface of the carrier (or substrate) by pressure or heat by a roll or a flat plate, and then the photosensitive resin layer is transferred onto the carrier in accordance with the peeling of the temporary carrier. A laminating machine and a laminating method disclosed in Japanese Laid-Open Patent Publication No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. From the viewpoint of the low-contamination, it is preferably used in the method disclosed in Japanese Laid-Open Patent Publication No. Hei 7-110575. In the case of forming a photosensitive resin layer, an oxygen barrier layer can be further provided between the photosensitive resin layer and the temporary carrier. (hereinafter, also referred to as "oxygen barrier layer" or "intermediate layer"). Thereby, the exposure sensitivity can be improved. Further, in order to improve the transfer property, a thermoplastic resin layer having a cushioning property may be provided. A temporary carrier of a photosensitive transfer material, an oxygen barrier layer, a thermoplastic resin layer, another layer, or a method for producing the photosensitive transfer material can be used in Japanese Patent Laid-Open No. 2006-23696 The structure and production method of the paragraphs [0024] to [0030] are shown. (a) The coating method and (b) the transfer method are all applied to form the photosensitive resin layer-13-200931177, and the layer thickness thereof is preferably 〇. .5em~lO.Oem, more preferably lym~6ym. When the layer thickness is in this range, pinhole generation at the time of coating formation at the time of manufacture is prevented, and display removal of an unexposed portion can be performed without a long time. A substrate on which a photosensitive resin layer is formed, for example, a transparent substrate (for example, a glass substrate or a plastic substrate), a substrate with a transparent conductive film (for example, an ITO film), and a substrate with a color filter (also called a substrate) It is a color filter substrate), a driving substrate to which a driving element (for example, a thin film transistor (TFT)) is attached, or the like. In general, the thickness of the substrate is preferably 700 #m~ ❹ 1 2 0 0 // m. Radiation-sensitive resin composition Next, the radiation-sensitive resin composition will be described. The radiation sensitive resin composition of the present invention contains: (A) a branched structure and/or an alicyclic structure, an acidic group, or an ethylene group bonded to the main chain via an ester group in at least one side chain a resin having an unsaturated group; (B) a polymerizable unsaturated compound; and (C) a (C1) hexaarylbiimidazole compound, (C2) an aromatic mercapto compound, and (C3) an auxiliary.
Q 另外,必要時,也可以更含有其他成分》 (A )樹脂 (A )樹脂係在至少一側鏈中具有分枝構造及/或脂環 構造、酸性基、或是隔著酯基而鍵結於主鏈之乙烯性不飽 和基。 該(A)成分之樹脂中的分枝構造及/或脂環構造、酸 性基、及乙烯性不飽和基可以於各自不同的側鏈中含有, 此等之中的至少二個也可以予以組合而於相同側鏈中含 有,全部也可以於相同側鏈中含有。 -14- 200931177 還有,於本專利說明書中,(甲基)丙烯醯基係表示 丙烯醯基或甲基丙烯醯基,(甲基)丙烯酸酯係表示丙烯 酸酯或甲基丙烯酸酯,(甲基)丙烯酸基係表示丙烯酸基 或甲基丙烯酸基,(甲基)丙烯醯胺係表示丙烯醯胺或甲 基丙烯醯胺,(甲基)丙烯醯苯胺係表示丙烯醯苯胺或甲 基丙烯醯苯胺。 分枝構造及/或脂環構造 針對分枝構造及/或脂環構造加以說明。 本發明中之(A)樹脂係於側鏈中含有至少一個分枝構 造及/或脂環構造》 分枝構造及/或脂環構造可以在樹脂(A)之相同側鏈 中含有複數個。另外,分枝構造及/或脂環構造可以在樹脂 (A)之相同側鏈中同時含有酸性基、乙烯性不飽和基。 另外,該分枝構造及/或脂環構造可以直接鍵結於樹脂 (A)之主鏈,僅以分枝構造及/或脂環構造構成樹脂(A) 之側鏈,另外,也可以隔著2價之有機連結基而鍵結於樹 脂(A)之主鏈,具有分枝構造及/或脂環構之基也可以構 成樹脂(A )之側鏈。 分枝構造之例子,可列舉:碳原子數3〜12個分枝狀 之烷基,例如,可列舉:異丙基、異丁基、二級丁基、三 級丁基、異戊基、新戊基、2-甲基丁基、異己基、2-乙基 己基、2-甲基己基、異戊基、三級戊基、3-辛基、三級辛 基等、及具有此等之基。此等烷基之中,較佳爲異丁基、 二級丁基、三級丁基、異戊基等、及具有此等之基,進一 步更佳爲異丙基、二級丁基、三級丁基等、及具有此等之 基。 -15- 200931177 脂環構造之例子,可列舉:碳原子數5〜20個之脂環 式烴基,例如,可列舉:由環戊基、環己基、環庚基、環 辛基、降莰烷基、異莰烷基、金剛烷基、三環癸基、二環 戊烯基、二環戊基、三環戊烯基及三環戊基等、及具有此 等之基所選出之至少一種。此等脂環式烴基之中,較佳爲 由環己基、降莰烷基、異莰烷基、金剛烷基、三環戊烯基、 三環戊基、二環戊烯基、二環戊基等、及具有此等之基所 選出之至少一種,進一步更佳爲環己基、異莰烷基、二環 g 戊烯基、二環戊基等、及具有此等之基所選出之至少一種。 該2價之有機連結基之例子,可列舉:伸烷基、伸芳 基、酯基、醯胺基及醚基所選出之一種或組合。 該伸烷基之例子,可列舉:總碳數1〜2 0之伸烷基, 更佳爲總碳數1〜10之伸烷基。具體而言,可列舉:亞甲 基、伸乙基、伸丙基、伸丁基、伸戊基、伸己基、伸辛基、 伸十二基、伸十八基等,此等伸烷基也可以具有分枝構造、 環狀構造或官能基,更佳爲亞甲基、伸乙基、伸辛基。 & 該伸芳基之例子,可列舉:總碳數6〜20之伸芳基, Ψ 更佳爲總碳數6〜12之伸芳基。具體而言,可列舉:伸苯 基、聯苯基、萘基、蒽基等,此等伸芳基也可以具有分枝 構造或官能基,更佳爲伸苯基、聯苯基。 爲了將分枝構造及/或脂環構造導入(Α)樹脂側鏈的 單體之例子,可列舉:(甲基)丙烯酸酯類、乙烯醚類、 乙烯酯類、(甲基)丙烯醯胺類等,較佳爲(甲基)丙烯 酸酯類、乙烯酯類、(甲基)丙烯醯胺類,進一步更佳爲 (甲基)丙烯酸酯類。 爲了將分枝構造導入(Α)樹脂側鏈之單體的具體例, -16- 200931177 可列舉:(甲基)丙烯酸異丙酯、(甲基)丙烯酸異丁酯、 (甲基)丙烯酸二級丁酯、(甲基)丙烯酸三級丁酯、(甲 基)丙烯酸異戊酯、(甲基)丙烯酸三級戊酯、(甲基) 丙烯酸二級戊酯、(甲基)丙烯酸-2-辛酯、(甲基)丙烯 酸-3-辛酯、(甲基)丙烯酸三級辛酯等,其中,較佳爲(甲 基)丙烯酸異丙酯、(甲基)丙烯酸異丁酯、(甲基)丙 烯酸三級丁酯等,進一步更佳爲(甲基)丙烯酸異丙酯、 (甲基)丙烯酸異丁酯等。 _ 爲了將脂環構造導入(A)樹脂側鏈之單體的具體例, 可列舉:碳原子數5〜20個脂環式烴基(甲基)丙烯酸酯。 具體例,可列舉:(甲基)丙烯酸(雙環〔2,2,1〕庚·2-基)酯、(甲基)丙烯酸-1-金剛酯、(甲基)丙烯酸- 2-金剛酯、(甲基)丙烯酸-3-甲基-1-金剛酯、(甲基)丙烯 酸-3,5 -二甲基-1-金剛酯、(甲基)丙烯酸-3-乙基-ΐ_金剛 酯、(甲基)丙烯酸-3-甲基-5 -乙基-1-金剛酯、(甲基) 丙烯酸-3,5,8-三乙基-1-金剛酯、(甲基)丙烯酸-3,5·二甲 基-8 -乙基-1-金剛酯、(甲基)丙烯酸-2 -甲基-2-金剛酯、 # (甲基)丙烯酸-2-乙基-2-金剛酯、(甲基)丙烯酸_3_羥 基-1-金剛酯、(甲基)丙烯酸八氫-4,7 -亞甲基二氫茚酯-5-酯、(甲基)丙烯酸八氫-4,7-亞甲基二氫茚酯-1-基甲酯、 (甲基)丙烯酸-1-薄荷酯、(甲基)丙烯酸三環戊烯酯、 (甲基)丙烯酸三環癸酯、(甲基)丙烯酸-3_羥基_2,6,6_ 三甲基雙環〔3.1.1〕庚酯、(甲基)丙烯酸- 3,7,7-三甲基 • 4-經基〔4.1_0〕酯、(甲基)丙烯酸正降莰酯、(甲基) 丙烯酸異莰酯、(甲基)丙烯酸葑酯、(甲基)丙烯酸_2,2,5-三甲基環己醋、(甲基)丙烯酸環己酯等。於此等(甲基) -17- 200931177 丙烯酸酯之中,較佳爲(甲基)丙烯酸環己醋、(甲基) 丙烯酸正降莰酯、(甲基)丙烯酸異莰酯、(甲基)丙烯 酸-1·金剛酯、(甲基)丙烯酸-2-金剛酯、(甲基)丙烯酸 葑酯、(甲基)丙烯酸-1-薄荷酯、(甲基)丙烯酸三環癸 酯等’尤以(甲基)丙烯酸環己酯、(甲基)丙烯酸三環 戊烯酯、(甲基)丙烯酸正降莰酯、(甲基)丙烯酸異莰 酯、(甲基)丙烯酸-2-金剛酯特別理想。 另外’爲了將脂環構造導入(A)樹脂側鏈之單體的具 0 體例,也可以列舉下式(3)或(4)中,χ係表示2價之 有機連結基,y係表示1或2,η係表示〇〜15之整數,R 係表示氫原子或甲基。 於通式(3)或(4)之中,較佳爲y=1或2、η = 〇〜4 之情形,更佳爲η = 0〜2之情形。 該2價之有機連結基也可以具有取代基,該2價有機 連結基之例子,可列舉:由伸烷基、伸芳基、酯基、醯胺 基及醚基所選出之之一基或組合。 0 該伸烷基之例子,可列舉:較佳爲總碳數1〜2 0之伸 院基,進一步更佳爲1〜10。具體而言,可列舉:亞甲基、 伸乙基、伸丙基、伸丁基、伸戊基、伸己基、伸辛基、伸 十二烷基、伸十八烷基等,此等伸烷基也可以具有分枝構 造、環狀構造或官能基’進一步更佳爲亞甲基、伸乙基、 伸辛基。 該伸芳基之例子’可列舉:較佳爲總碳數6〜2 0之伸 芳基,進一步更佳爲總碳數6〜12。具體而言,可列舉: 伸苯基、聯苯基、萘基、蒽基等,此等伸芳基也可以具有 分枝構造或官能基,進一步更佳爲伸苯基、聯苯基。 -18- 200931177 該2價之有機連結基也可以具有的取代基之 列舉:烷基、羥基、胺基、鹵素基、芳香環基、 構造之基等。 其中,基於具優越之顯像性、具優越之變形 觀點,較佳爲通式(3)或(4)所示之化合物,其 可列舉:下列化合物D -1〜D -1 1、T -1〜T -1 2。 丫 =ch2Further, if necessary, other components may be further contained. (A) The resin (A) resin has a branching structure and/or an alicyclic structure, an acidic group, or a bond via an ester group in at least one side chain. An ethylenically unsaturated group attached to the main chain. The branching structure and/or the alicyclic structure, the acidic group, and the ethylenically unsaturated group in the resin of the component (A) may be contained in different side chains, and at least two of these may be combined. In the same side chain, all of them may be contained in the same side chain. -14- 200931177 Also, in the present specification, (meth)acryloyl group means acryl fluorenyl or methacryl fluorenyl group, and (meth) acrylate means acrylate or methacrylate, (A The acrylic group represents an acryl group or a methacryl group, the (meth) acrylamide refers to acrylamide or methacrylamide, and the (meth) acryl anilide represents acryl aniline or methacryl oxime. aniline. Branching structure and/or alicyclic structure The branching structure and/or alicyclic structure will be described. The (A) resin in the present invention contains at least one branching structure and/or alicyclic structure in the side chain. The branching structure and/or the alicyclic structure may contain a plurality of the same side chain of the resin (A). Further, the branching structure and/or the alicyclic structure may contain an acidic group or an ethylenically unsaturated group in the same side chain of the resin (A). Further, the branching structure and/or the alicyclic structure may be directly bonded to the main chain of the resin (A), and the side chain of the resin (A) may be formed only by the branching structure and/or the alicyclic structure, or may be separated. The bivalent organic linking group is bonded to the main chain of the resin (A), and the branching structure and/or the alicyclic structure may constitute a side chain of the resin (A). Examples of the branching structure include an alkyl group having 3 to 12 branched carbon atoms, and examples thereof include an isopropyl group, an isobutyl group, a secondary butyl group, a tertiary butyl group, and an isopentyl group. Neopentyl, 2-methylbutyl, isohexyl, 2-ethylhexyl, 2-methylhexyl, isopentyl, tertiary pentyl, 3-octyl, tertiary octyl, etc., and the like The basis. Among these alkyl groups, an isobutyl group, a secondary butyl group, a tert-butyl group, an isopentyl group and the like, and the like, and further preferably an isopropyl group, a secondary butyl group, and a third group are preferable. a butyl group or the like, and having such a group. -15- 200931177 Examples of the alicyclic structure include an alicyclic hydrocarbon group having 5 to 20 carbon atoms, and examples thereof include a cyclopentyl group, a cyclohexyl group, a cycloheptyl group, a cyclooctyl group, and a reduced decane group. At least one selected from the group consisting of a base, an isodecylalkyl group, an adamantyl group, a tricyclodecyl group, a dicyclopentenyl group, a dicyclopentyl group, a tricyclopentenyl group, a tricyclopentyl group, and the like . Among these alicyclic hydrocarbon groups, preferred are cyclohexyl, norbornyl, isodecyl, adamantyl, tricyclopentenyl, tricyclopentyl, dicyclopentenyl, dicyclopentane And at least one selected from the group consisting of, and more preferably, a cyclohexyl group, an isodecyl group, a bicyclo g-pentenyl group, a dicyclopentyl group, etc., and at least selected from the group having such a group One. Examples of the divalent organic linking group include one or a combination selected from the group consisting of an alkyl group, an extended aryl group, an ester group, a decylamino group and an ether group. Examples of the alkylene group include an alkylene group having a total carbon number of 1 to 20, and more preferably an alkylene group having a total carbon number of 1 to 10. Specific examples thereof include a methylene group, an ethylidene group, a propyl group, a butyl group, a pentyl group, a hexyl group, a decyl group, a decyl group, a decyl group, and the like. It may also have a branched structure, a cyclic structure or a functional group, more preferably a methylene group, an ethyl group or a octyl group. & examples of the aryl group include an extended aryl group having a total carbon number of 6 to 20, and more preferably an extended aryl group having a total carbon number of 6 to 12. Specific examples thereof include a phenylene group, a biphenyl group, a naphthyl group, a fluorenyl group and the like. These aryl groups may have a branched structure or a functional group, and more preferably a phenyl group or a biphenyl group. Examples of the monomer for introducing the branched structure and/or the alicyclic structure into the side chain of the resin include (meth) acrylates, vinyl ethers, vinyl esters, and (meth) acrylamide. The class or the like is preferably a (meth) acrylate, a vinyl ester or a (meth) acrylamide, and more preferably a (meth) acrylate. Specific examples of the monomer for introducing the branched structure into the side chain of the resin may be exemplified by isopropyl (meth)acrylate, isobutyl (meth)acrylate, and (meth)acrylic acid. Butyl butyl ester, tertiary butyl (meth) acrylate, isoamyl (meth) acrylate, tertiary amyl (meth) acrylate, diethyl amyl (meth) acrylate, (meth) acrylate-2 - octyl ester, 3-octyl (meth)acrylate, trioctyl (meth)acrylate, etc., among which isopropyl (meth)acrylate, isobutyl (meth)acrylate, ( Further, methyl methacrylate butyl acrylate or the like is more preferably isopropyl (meth) acrylate or isobutyl (meth) acrylate. _ In order to introduce the alicyclic structure into the monomer of the (A) resin side chain, the alicyclic hydrocarbon group (meth) acrylate having 5 to 20 carbon atoms is mentioned. Specific examples thereof include (meth)acrylic acid (bicyclo[2,2,1]heptyl-2-yl)ester, (meth)acrylic acid-1-adamantyl ester, (meth)acrylic acid-2-carboxylated ester, 3-methyl-1-adamantyl (meth)acrylate, -3,5-dimethyl-1-adamantyl (meth)acrylate, 3-ethyl-indole-adamantyl (meth)acrylate , (meth)acrylic acid-3-methyl-5-ethyl-1-adamant, (meth)acrylic acid-3,5,8-triethyl-1-adamant, (meth)acrylic acid-3 ,5·Dimethyl-8-ethyl-1-adamantate, 2-methyl-2-adamantyl (meth)acrylate, 2-ethyl-2-adamantyl (meth)acrylate, (meth)acrylic acid_3_hydroxy-1-adamantyl ester, octahydro-4,7-methylenedihydrofurfuryl (meth) acrylate-5-ester, octahydro-4,7 (meth)acrylate -methylenedihydrofurfuryl ester-1-ylmethyl ester, (meth)acrylic acid-1-menthyl ester, tricyclopentenyl (meth)acrylate, tricyclodecyl (meth)acrylate, (methyl Acetic acid-3_hydroxy-2,6,6-trimethylbicyclo[3.1.1]heptyl ester, (meth)acrylic acid-3,7,7-trimethyl• 4-carbyl [4.1_0] ester, ( Acetyl n-decyl acrylate, isobutyl methacrylate, decyl (meth) acrylate, 2,2,5-trimethylcyclohexanol (meth) acrylate, (meth) acrylate ring Hexyl ester and the like. Among these (meth) -17- 200931177 acrylates, preferred are (meth)acrylic acid cyclohexanol, (meth)acrylic acid n-decyl ester, (meth)acrylic acid isodecyl ester, (methyl) Acrylic acid-1·adamantyl ester, (meth)acrylic acid-2-adamantyl ester, (meth)acrylic acid decyl ester, (meth)acrylic acid-1-menthyl ester, (meth)acrylic acid tricyclodecyl ester, etc. Cyclohexyl (meth)acrylate, tricyclopentenyl (meth)acrylate, n-northyl (meth)acrylate, isodecyl (meth)acrylate, 2-adamantyl (meth)acrylate Especially ideal. Further, in the following formula (3) or (4), in order to introduce the alicyclic structure into the monomer of the (A) resin side chain, the lanthanoid system represents a divalent organic linking group, and the y system represents 1 Or 2, η represents an integer of 〇 15 and R represents a hydrogen atom or a methyl group. In the general formula (3) or (4), it is preferable that y = 1 or 2, η = 〇 〜 4, and more preferably η = 0 〜 2. The divalent organic linking group may have a substituent. Examples of the divalent organic linking group include a group or a combination selected from an alkyl group, an aryl group, an ester group, a decyl group and an ether group. . The example of the alkylene group is preferably a substrate having a total carbon number of 1 to 2 0, and more preferably 1 to 10. Specifically, examples thereof include a methylene group, an ethylidene group, a propyl group, a butyl group, a pentyl group, a hexyl group, an octyl group, a dodecyl group, an octadecyl group, and the like. The alkyl group may also have a branched structure, a cyclic structure or a functional group 'further more preferably a methylene group, an exoethyl group or a octyl group. The example of the aryl group may be, for example, preferably an extended aryl group having a total carbon number of 6 to 20, and still more preferably a total carbon number of 6 to 12. Specific examples thereof include a phenyl group, a biphenyl group, a naphthyl group, a fluorenyl group and the like. These aryl groups may have a branched structure or a functional group, and more preferably a phenyl group or a biphenyl group. -18- 200931177 The substituents which the divalent organic linking group may have include an alkyl group, a hydroxyl group, an amine group, a halogen group, an aromatic ring group, a structural group, and the like. Among them, the compound represented by the formula (3) or (4) is preferably a compound represented by the formula (3) or (4) based on the viewpoint of superior development and superior deformation, and the following compounds D-1 to D-1, T- 1~T -1 2.丫 =ch2
R 例子,可 具有脂環 恢復率之 具體例, 通式(3)R example, which can have a specific example of the alicyclic recovery rate, general formula (3)
h2c=ch-c-o II 〇 D— 3 c=ch2H2c=ch-c-o II 〇 D— 3 c=ch2
R CH3 IH2〇=C—C-O-CH2CH2_o 0R CH3 IH2〇=C—C-O-CH2CH2_o 0
h2c=ch-c-o 〇 D- 4 D — 2 ch3 h2c=ch-c-o II〇 D- 5 通式(4)m βοm -19- 200931177 H2C=C-C-〇CH2CH2CH2—οοH2c=ch-c-o 〇 D- 4 D — 2 ch3 h2c=ch-c-o II〇 D- 5 General formula (4) m βοm -19- 200931177 H2C=C-C-〇CH2CH2CH2—οο
D- 6D- 6
D-7 CHg H2C=i-C-〇CH2CH2CH2CH2—Ο Ο 〇 ch3h 2c =c -c -oc h2c h2〇ch 2c h2—ο oD-7 CHg H2C=i-C-〇CH2CH2CH2CH2—Ο Ο 〇 ch3h 2c =c -c -oc h2c h2〇ch 2c h2—ο o
-QO D 8 ch3-QO D 8 ch3
H2C=0-jj-〇CH2CH2OCH2CH2—D~9 O H24h-—一—一 0 D- 1 0 ❹ ch3 h2c=c-c-och2ch- II I 0 ch3 -o -〇〇 D- 1 -20- 200931177H2C=0-jj-〇CH2CH2OCH2CH2—D~9 O H24h-—one—one 0 D- 1 0 ❹ ch3 h2c=c-c-och2ch- II I 0 ch3 -o -〇〇 D- 1 -20- 200931177
ch3 H2C —C —C —OCH2CH2OCH2CH2 —o_ oCh3 H2C —C —C —OCH2CH2OCH2CH2 —o_ o
T-9T-9
CH3 H2C =C _C_OCH2CH2OCH2CH2—O~CH3 H2C =C _C_OCH2CH2OCH2CH2—O~
T- 1 0T- 1 0
t- 1 1 o ch3 H2C =C _〇~ΟΟΗ2〇Η - II | 0 ch3 CH3 H2〇=C—C—OCH2CH—o— ch3T- 1 1 o ch3 H2C =C _〇~ΟΟΗ2〇Η - II | 0 ch3 CH3 H2〇=C—C—OCH2CH—o—ch3
T- 1 2 -21 -T- 1 2 -21 -
200931177 爲了將脂環構造導入(A)樹脂側鏈之單體 適當製造之單體,也可以使用市售品。 該市售品之例子,可列舉:FA-51 1A、FA-FA-512M、FA-513A、FA-513M、TCPD-A、 H-TCPD-A'H-TCPD-M'TOE-A'TOE-M'H-TOE- (全部爲商品名、日本日立化成工業(股)製 市售品之中,基於具優越之顯像性、具優越之 之觀點,較佳爲 FA-512A(S) 、FA-512M。 酸性基 (A)樹脂係在側鏈中含有至少一酸性基。 該酸性基也可以在同一側鏈中含有複數個 性基也可以在(A )樹脂之同一側鏈中同時含有 /或脂環構造,及隔著酯基所鍵結的乙烯性不飽 另外,該酸性基可以直接鍵結於樹酯(A) 以酸性基構成樹酯(A )之側鏈,也可以隔著2 結基而鍵結於樹酯(A)之主鏈,具有酸性基之 脂(A )之側鏈。於此,2價有機連結基之例子 於該分枝構造及/或脂環構造項目的說明中所例 機連結基,較佳之範圍也相同。 該酸性基並無特別之限制,能夠從習知酸 以適當選擇。其例子可列舉:羧基、磺酸基、 磷酸基、酚性羥基等。基於顯像性及硬化膜耐7」 此等酸性基之中,較佳爲羧基、酚性羥基。 爲了將酸性基導入該(A)樹脂側鏈之單體 限制,其例子可列舉:(甲基)丙烯酸酯類、 乙烯酯類、(甲基)丙烯醯胺類等,較佳爲( 可以使用所 5 1 2 A ( S )、 TCPD-M ' A' H-TOE-M )等。此等 變形恢復率 。另外,酸 分枝構造及 和基。 之主鏈,僅 價之有機連 基則構成樹 ,可列舉: 示之2價有 性基之中加 磺醯胺基、 :性之觀點, 並無特別之 乙烯醚類、 甲基)丙烯 -22- 200931177 酸酯類、乙烯酯類、(甲基)丙烯醯胺類,進一步更佳爲 (甲基)丙烯酸酯類。 爲了將酸性基導入該(A)樹脂側鏈之單體的具體例, 能夠從習知之單體中加以適當選擇,例如,可列舉:(甲 基)丙烯酸、乙烯基安息香酸、馬來酸、馬來酸單烷酯、 富馬酸、衣康酸、巴豆酸、桂皮酸、山梨酸、α·胺基桂皮 酸、丙烯酸二聚物、具有羥基的單體與環狀酸酐之加成反 應物、ω-羧基聚己內酯單(甲基)丙烯酸酯等。此等單體 g 可以使用適當所製造之單體,也可以使用市售品。 具有可用於含有該羥基的單體與環狀酸酐加成反應物 之羧基的單體,例如,可列舉:(甲基)丙烯酸-2-羥乙酯 等。緣環狀酸酐,例如,可列舉:馬來酸酐、鄰苯二甲酸 酐、環己烷二羧酸酐等。 爲了將酸性基導入該(Α)樹脂側鏈之單體,其市售品 可列舉:日本東亞合成化學工業(股)製·· Aronix Μ-5 3 00、 Aronix M-5 400、Aronix M- 5 500、 Aronix M-5 600 (全部 ^ 爲商品名);日本新中村化學工業(股)製:NK酯CB-1、 NK酯CBX-1 (全部爲商品名);日本共榮社油脂化學工業 (股)製:HOA-MP、HOA-MS (全部爲商品名);日本大 阪有機化學工業(股)製:Bisco at #2100(商品名)等。 基於具優越之顯像性、低成本之觀點,此等單體之中較佳 爲丙烯酸等。 乙烯性不飽和基 該(A)樹脂之側鏈係隔著酯基而鍵結於主鏈之「乙烯 性不飽和基」,並未予以特別限制,其例子可列舉:(甲 基)丙烯醯基。該酯基(-COO-)係連結乙烯性不飽和基與 -23- 200931177 (A )樹脂之主鏈。 於本發明之專利說明書中,所謂隔著酯基而鍵結於主 鏈之乙烯性不飽和基,係指含有乙烯性不飽和基之原子團 將藉由酯基以直接鍵結於樹脂之主鏈。因此,雖然該酯基 係直接鍵結於主鏈,該乙烯性不飽和基與該酯基可以直接 鍵結’也可以隔著連結二者之連結基而予以鍵結。 Ο 將乙烯性不飽和基導入該(A)樹脂側鏈之方法能夠從 習知方法之中加以適當選擇。例如,可列舉:將具有環氧 基之(甲基)丙烯酸酯加成於含有酸性基之重複單位之方 法;將具有異氰酸酯基之(甲基)丙烯酸酯加成於含有羥 基之重複單位之方法;將具有羥基之(甲基)丙烯酸酯加 成於含有異氰酸酯基之重複單位之方法等。 其中’將具有環氧基之(甲基)丙烯酸酯加成於含有 酸性基之重複單位之方法係最爲容易製造的,基於低成本 之觀點而較佳。 具有該環氧基之(甲基)丙烯酸酯,只要爲具有環氧 基之(甲基)丙烯酸酯的話,並未予以特別限制,例如, 較佳爲下列構造式(1 )所示之化合物及下列構造式(2 )200931177 A commercially available product can also be used in order to introduce the alicyclic structure into the monomer of the (A) resin side chain. Examples of the commercially available product include FA-51 1A, FA-FA-512M, FA-513A, FA-513M, TCPD-A, H-TCPD-A'H-TCPD-M'TOE-A'TOE -M'H-TOE- (All of the products are sold under the trade name of Japan Hitachi Chemical Co., Ltd.). Based on the superior imageability and superiority, FA-512A(S) is preferred. , FA-512M. The acidic group (A) resin contains at least one acidic group in the side chain. The acidic group may also contain a plurality of individual groups in the same side chain or may be contained in the same side chain of the (A) resin. / or alicyclic structure, and ethylene is not saturated with the ester group, the acidic group can be directly bonded to the resin (A) to form the side chain of the resin (A) with an acidic group, or a 2-linking group bonded to a main chain of a resin (A) and having a side chain of an acidic group (A). Here, examples of the divalent organic linking group are in the branched structure and/or the alicyclic structure. The acidic linking group is not particularly limited, and can be appropriately selected from a conventional acid, and examples thereof include a carboxyl group, a sulfonic acid group, a phosphoric acid group, and the like. Among the acidic groups, a carboxyl group or a phenolic hydroxyl group is preferred. For the purpose of introducing an acidic group into the monomer of the (A) resin side chain, an example thereof may be used. For example, (meth) acrylates, vinyl esters, (meth) acrylamides, etc., preferably (5 1 2 A (S), TCPD-M 'A' H-TOE-M can be used. And the recovery rate of these deformations. In addition, the main chain of the acid branching structure and the base group, the organic group of only the valence constitutes a tree, and the sulfonamide group is added to the bis-valent group. , : Sexual viewpoint, there is no special vinyl ether, methyl) propylene-22- 200931177 acid ester, vinyl ester, (meth) acrylamide, further preferably (meth) acrylate . Specific examples of the monomer in which the acidic group is introduced into the side chain of the (A) resin can be appropriately selected from conventional monomers, and examples thereof include (meth)acrylic acid, vinylbenzoic acid, and maleic acid. Addition reaction of maleic acid monoalkyl ester, fumaric acid, itaconic acid, crotonic acid, cinnamic acid, sorbic acid, α-amino cinnamic acid, acrylic acid dimer, monomer having hydroxyl group and cyclic acid anhydride , ω-carboxy polycaprolactone mono (meth) acrylate, and the like. As the monomer g, a monomer which is suitably produced may be used, or a commercially available product may be used. The monomer having a carboxyl group which can be used for the reaction of the monomer having the hydroxyl group with the cyclic acid anhydride, for example, 2-hydroxyethyl (meth)acrylate or the like can be mentioned. Examples of the edge cyclic acid anhydride include maleic anhydride, phthalic anhydride, and cyclohexane dicarboxylic anhydride. In order to introduce an acidic group into the monomer of the (Α) resin side chain, a commercially available product is exemplified by: Japan East Asia Synthetic Chemical Industry Co., Ltd. · Aronix Μ-5 3 00, Aronix M-5 400, Aronix M- 5 500, Aronix M-5 600 (all ^ is the trade name); Japan New Nakamura Chemical Industry Co., Ltd.: NK ester CB-1, NK ester CBX-1 (all are trade names); Japan Kyoritsu Oil & Fat Chemicals Industrial (stock) system: HOA-MP, HOA-MS (all are trade names); Osaka Organic Chemical Industry Co., Ltd.: Bisco at #2100 (trade name). Among these monomers, acrylic acid or the like is preferred from the viewpoint of superior development and low cost. Ethylene Unsaturated Group The side chain of the (A) resin is bonded to the "ethylenically unsaturated group" of the main chain via an ester group, and is not particularly limited, and examples thereof include (meth)acryl oxime. base. The ester group (-COO-) is bonded to the main chain of the ethylenically unsaturated group and the -23-200931177 (A) resin. In the patent specification of the present invention, the ethylenically unsaturated group bonded to the main chain via an ester group means that the atomic group containing an ethylenically unsaturated group is directly bonded to the main chain of the resin by the ester group. . Therefore, although the ester group is directly bonded to the main chain, the ethylenically unsaturated group may be directly bonded to the ester group, or may be bonded via a linking group linking the two.方法 The method of introducing an ethylenically unsaturated group into the (A) resin side chain can be appropriately selected from the conventional methods. For example, a method of adding a (meth) acrylate having an epoxy group to a repeating unit containing an acidic group; and a method of adding a (meth) acrylate having an isocyanate group to a repeating unit containing a hydroxyl group A method of adding a (meth) acrylate having a hydroxyl group to a repeating unit containing an isocyanate group. Among them, a method of adding a (meth) acrylate having an epoxy group to a repeating unit containing an acidic group is most easily produced, and is preferable from the viewpoint of low cost. The (meth) acrylate having the epoxy group is not particularly limited as long as it is an epoxy group-containing (meth) acrylate. For example, a compound represented by the following structural formula (1) and The following structural formula (2)
構造式(1) 該構造式(1)中’ R1係表示氫原子或甲基^ L1係表 示有機基。 -24- 200931177 R2Structural Formula (1) In the structural formula (1), 'R1' represents a hydrogen atom or a methyl group L1 represents an organic group. -24- 200931177 R2
示有機基。w係表示4〜7員環之脂肪族烴基。 於該構造式(1)所示之化合物及構造式(2)所示之 化合物之中,構造式(1)所示之化合物較構造式(2)者 爲佳。於該構造式(1)及(2)中,L1及L2更佳爲各自獨 立之碳數1〜4之伸院基。 該構造式(1)所示之化合物及構造式(2)所示之化 合物並未予以特別限制,例如,可列舉:以下之例示化合 物(1 )〜(10 ):Show organic base. w represents an aliphatic hydrocarbon group of 4 to 7 membered rings. Among the compounds represented by the structural formula (1) and the compounds represented by the structural formula (2), the compound represented by the structural formula (1) is more preferable than the structural formula (2). In the structural formulae (1) and (2), L1 and L2 are more preferably independent from each other having a carbon number of 1 to 4. The compound represented by the structural formula (1) and the compound represented by the structural formula (2) are not particularly limited, and examples thereof include the following exemplified compounds (1) to (10):
-25- 200931177-25- 200931177
其他之單體 於該(A)樹脂中,也可以使用其他之單體而將其他之 基予以導入。 該其他之單體並無特別之限制,例如,可列舉:具有 -26- 200931177 無分枝構造及/或脂環構造之(甲基)丙烯酸酯、苯乙烯、 乙烯醚基、二鹽基酸酐基、乙烯酯基、烯烴基等之單體等。 該乙烯醚基並無特別之限制,例如,可列舉:丁基乙 烯醚基等。 該二鹽基酸酐基並無特別之限制,例如,可列舉:馬 來酸酐基、衣康酸酐基等。 該乙烯酯基並無特別之限制,例如,可列舉:醋酸乙 烯基等。 該烯烴基並無特別之限制,例如,可列舉:丁二烯基、 異戊二烯基等。 該(A)樹脂中之其他單體的含率,組成比較佳爲1〜 40質量%,更佳爲2〜30質量%。 ° (A )樹脂之具體例,例如,以下列構造所示之化合物 (例示化合物P-1〜P-57)。 另外,例示化合物中之x、l、y、z及St係表示各重複 單位之組成比(質量比)’適宜爲以後述之範圍所構成的 -27- 200931177Other monomers In the (A) resin, other monomers may be used to introduce other groups. The other monomer is not particularly limited, and examples thereof include (meth) acrylate having a branching structure and/or an alicyclic structure of -26 to 200931177, styrene, vinyl ether group, and dibasic acid anhydride. A monomer such as a vinyl group, a vinyl ester group or an olefin group. The vinyl ether group is not particularly limited, and examples thereof include a butyl vinyl ether group and the like. The dibasic acid anhydride group is not particularly limited, and examples thereof include a maleic anhydride group and an itaconic anhydride group. The vinyl ester group is not particularly limited, and examples thereof include vinyl acetate and the like. The olefin group is not particularly limited, and examples thereof include a butadienyl group and an isoprene group. The content of the other monomer in the (A) resin is preferably from 1 to 40% by mass, more preferably from 2 to 30% by mass. Specific examples of the resin (A) are, for example, compounds represented by the following structures (exemplified compounds P-1 to P-57). Further, in the exemplified compound, x, 1, y, z and St indicate that the composition ratio (mass ratio) of each repeating unit is suitably formed by the range described later -27-200931177
cooCoo
〇〇
/y COOH COO/y COOH COO
OH IOH I
co〇、Co〇,
COOH COO P-1 x:y:z=41:24:35 〇 P-2 x:y:z=48:22:30 ΟCOOH COO P-1 x:y:z=41:24:35 〇 P-2 x:y:z=48:22:30 Ο
COOH n p_3 OH I x:y:z=45:20:35 〇COOH n p_3 OH I x:y:z=45:20:35 〇
、七 coo COOH C, seven coo COOH C
OO
OH x:y:z=40:25:35 ❹OH x:y:z=40:25:35 ❹
OH I 〇 P-5 x:y:z=42:26:32OH I 〇 P-5 x:y:z=42:26:32
-28- 200931177-28- 200931177
OH I 〇 P-7 x:y:z=40:25:35OH I 〇 P-7 x:y:z=40:25:35
P-8 〇P-8 〇
COOCOO
cooh p-io x:y:z=50:24:26 ❹Cooh p-io x:y:z=50:24:26 ❹
COO coo^^X)COO coo^^X)
COOHCOOH
HO XX〇x^ P-11 x:y:z=40:25:35HO XX〇x^ P-11 x:y:z=40:25:35
co〇〈^Co〇〈^
COOH P-12λλλ^ x:y:z=30:30:40COOH P-12λλλ^ x:y:z=30:30:40
C〇〇^s n HO -29- 200931177C〇〇^s n HO -29- 200931177
x:y:z=45:15:40x:y:z=45:15:40
ΟΟ
COO L C〇〇HCOO L C〇〇H
fyFy
C〇〇v C〇〇HC〇〇v C〇〇H
COO^Y^O OH 〇 P-15 x:y:z=45:30:25COO^Y^O OH 〇 P-15 x:y:z=45:30:25
COOCOO
❹❹
fy COOHFy COOH
〇 P-16〇 P-16
〇Y x:y:z=45:20:35〇Y x:y:z=45:20:35
XcooXcoo
y COOHy COOH
zcoo HOZcoo HO
P-17 〇 x:y:z=45:25:30 -30- 200931177P-17 〇 x:y:z=45:25:30 -30- 200931177
^ 叉/ p-18^ Fork / p-18
nu I x:y:z=40:25:35Nu I x:y:z=40:25:35
x:y:z=40:30:30x:y:z=40:30:30
p-21P-21
r»-i Ir»-i I
x:y:z=45:20:35x:y:z=45:20:35
x:y:z=40:20:40 200931177x:y:z=40:20:40 200931177
y COOHy COOH
coo^qCoo^q
COOMe COOH ΟΟΟ^^'Ύ^Ο OHCOOMe COOH ΟΟΟ^^'Ύ^Ο OH
〇Λ- P-25 x:I:y:z=46:2:20:32 〇 coo〇Λ- P-25 x:I:y:z=46:2:20:32 〇 coo
P-26 x:l:y:z=45.5:2:19:33. 5P-26 x:l:y:z=45.5:2:19:33. 5
COOHCOOH
p-27 nu I ❹ x:y:z=48:22:30 cooP-27 nu I ❹ x:y:z=48:22:30 coo
ΌΌ
y COOHy COOH
P-28 x:y:z=51.5:18.5:30 -32 200931177P-28 x:y:z=51.5:18.5:30 -32 200931177
X cooX coo
COOH P~29 OH x:y:z=40:25:35 〇COOH P~29 OH x:y:z=40:25:35 〇
〇〇
cooi^OCooi^O
COOH OH丨 〇 P-30 byi coo CH2CH2-0COOH OH丨 〇 P-30 byi coo CH2CH2-0
COOHCOOH
x:y:z=41:24:35 〇 COO^Y^A^ P-31 OH ' x:y:z=39:26:35 ❾x:y:z=41:24:35 〇 COO^Y^A^ P-31 OH ' x:y:z=39:26:35 ❾
、七 coo COOH C, seven coo COOH C
广〇Λ^ P-32 OH丨 x:y:z=35:30:35广〇Λ^ P-32 OH丨 x:y:z=35:30:35
OH P-33 x:y:z=42:28:30 -33 200931177OH P-33 x:y:z=42:28:30 -33 200931177
X COOX COO
y COOHy COOH
〇〇
p_34 OH x:y:z=37:28:35 〇P_34 OH x:y:z=37:28:35 〇
COOCOO
fy COOHFy COOH
COO^^Y^O OH 〇 々 P-35 x:y:z=39:26:35 -34- 200931177COO^^Y^O OH 〇 々 P-35 x:y:z=39:26:35 -34- 200931177
x:y:z=40:25:35 〇x:y:z=40:25:35 〇
p-38 OH 1P-38 OH 1
x:y:z=40:20:40 COOHx:y:z=40:20:40 COOH
COOCOO
C〇〇HC〇〇H
-35- 200931177-35- 200931177
COOHCOOH
x:y:z=30:25:45x:y:z=30:25:45
COO^^Y^O OHCOO^^Y^O OH
P-45P-45
x:y:z=30:30:40x:y:z=30:30:40
x:y:z:St=30:24:38:8 -36- 200931177x:y:z:St=30:24:38:8 -36- 200931177
COO COOHCOO COOH
P-47 x:y:z:St=34:24:36:6P-47 x:y:z:St=34:24:36:6
X \ /y COO COOHX \ /y COO COOH
fst 〇 0 P-48 x:y:z:St=40:23:35:2Fst 〇 0 P-48 x:y:z:St=40:23:35:2
rxRx
c〇〇^qC〇〇^q
y COOHy COOH
COO 〇 P-49 ^γ^σ OH x:y:z=32:25:43COO 〇 P-49 ^γ^σ OH x:y:z=32:25:43
COO . COOH X) OH 1 〇 P-50COO . COOH X) OH 1 〇 P-50
x:y:z:St=25:25:40:IOx:y:z:St=25:25:40:IO
COO ° COOH ΟΟΟ^^γ^ΟCOO ° COOH ΟΟΟ^^γ^Ο
u V P-51 x:y:z=34:27:39 -37 200931177u V P-51 x:y:z=34:27:39 -37 200931177
〇 GOO ch2ch2-〇〇 GOO ch2ch2-〇
COOHCOOH
m P-53 x:y:z=46. 2:24. 3:29. 5m P-53 x:y:z=46. 2:24. 3:29. 5
OH IOH I
P-54 x:y:z:St=25:25:40:10P-54 x:y:z:St=25:25:40:10
:y : z = 46 : 24 : 30 P-5 5 -38- 200931177:y : z = 46 : 24 : 30 P-5 5 -38- 200931177
-o-o
-GO :46:24:30 P- 5 6-GO :46:24:30 P- 5 6
y : z=40_ 1:2.0:26.6:31. ❹y : z=40_ 1:2.0:26.6:31. ❹
O 合成法 (A)樹脂能夠由單體的(共)聚合反應之步驟 乙烯性不飽和基之步驟的二階段步驟加以合成。 首先,(共)聚合反應可列舉:各種單體的( 合反應並無特別之限制,能夠從習知(共)聚合反 加以適當選擇。例如,針對聚合之活性種,能夠適 自由基聚合、陽離子聚合、陰離子聚合、配位聚合 等(共)聚合反應之中,合成皆爲容易的,基於低 觀點’較佳爲自由基聚合。另外,針對聚合方法, 別之限制,能夠從習知方法之中加以適當選擇。例 夠適當選擇塊狀聚合法 '懸浮聚合法、乳化聚合法 聚合法等。此等方法之中,更佳爲溶液聚合法。 與導入 共)聚 應之中 當選擇 等。此 成本之 也無特 如,能 、溶液 -39- 200931177 碳數 基於彈性係數(硬度)之觀點,(A)樹脂之總碳數較 佳爲10以上。其中,總碳數更佳爲10〜30,尤以10〜15 特別理想。 分子量 (A)樹脂之分子量,係重量平均分子量較佳爲10,000 〜10萬,更佳爲12,000〜60,000,尤以15,000〜45,000特 別理想。若重量平均分子量爲該範圍內時,基於樹脂(較 佳爲共聚物)的製造適合及顯像性之觀點而較佳。另外, 基於因熔融黏度之降低所形成的形狀將難以變形之觀點、 難以變得交聯不良之觀點、及無顯像中之間隔物形狀殘渣 之觀點而較佳。 重量平均分子量係利用凝膠滲透層析儀(GPC )所測 出。針對GPC,於所後述之實施例項目中詳細敘述。 玻璃轉移溫度 (A)樹脂之玻璃轉移溫度(Tg)較佳爲40〜180 °C, 更佳爲45〜140 °C,尤以50〜130 °C特別理想。若玻璃轉移 溫度(Tg)爲該較佳之範圍內時,可以得到具有良好之顯 像性及力學強度的間隔物。 酸價 (A)樹脂之酸價係根據可採取的分子構造,較佳之範 圍將變動,一般而言,較佳爲20mg KOH/g以上,更佳爲 4 0mg KOH/g以上,尤以50〜130mg KOH/g特別理想。若 酸價爲該較佳之範圍內時,具有良好之顯像性、及力學強 度的間隔物將可以得到。O Synthetic Method (A) The resin can be synthesized by a two-stage step of the step of (co)polymerization of the monomer, the step of ethylenically unsaturated groups. First, the (co)polymerization reaction is exemplified by various monomers (the reaction is not particularly limited, and can be appropriately selected from conventional (co)polymerization. For example, for the active species of the polymerization, it is possible to carry out radical polymerization, In the (co)polymerization reaction such as cationic polymerization, anionic polymerization, or coordination polymerization, the synthesis is easy, and based on the low viewpoint, it is preferably a radical polymerization. Further, the polymerization method is not limited, and can be obtained from a conventional method. Among them, the bulk polymerization method, the suspension polymerization method, the emulsion polymerization method, etc. are appropriately selected. Among these methods, the solution polymerization method is more preferable. . There is no such thing as cost, solution, solution -39- 200931177 Carbon number Based on the modulus of elasticity (hardness), (A) the total carbon number of the resin is preferably 10 or more. Among them, the total carbon number is preferably 10 to 30, especially 10 to 15 is particularly desirable. The molecular weight (A) of the resin preferably has a weight average molecular weight of from 10,000 to 100,000, more preferably from 12,000 to 60,000, particularly preferably from 15,000 to 45,000. When the weight average molecular weight is within this range, it is preferred from the viewpoint of suitability and development of a resin (preferably a copolymer). Further, it is preferable from the viewpoint that the shape formed by the decrease in the melt viscosity is difficult to be deformed, the viewpoint that it is difficult to cause crosslinking failure, and the residue of the spacer shape in the absence of development. The weight average molecular weight was measured by a gel permeation chromatography (GPC). The GPC is described in detail in the example items described later. Glass transition temperature (A) The glass transition temperature (Tg) of the resin is preferably from 40 to 180 ° C, more preferably from 45 to 140 ° C, particularly preferably from 50 to 130 ° C. If the glass transition temperature (Tg) is within the preferred range, a spacer having good imaging properties and mechanical strength can be obtained. The acid value of the acid value (A) resin is preferably in the range of 20 mg KOH/g or more, more preferably 40 mg KOH/g or more, particularly 50 to 50, depending on the molecular structure which can be employed. 130 mg KOH/g is particularly desirable. If the acid value is within the preferred range, a spacer having good developability and mechanical strength will be obtained.
Tg -40- 200931177 基於具有良好之顯像性及力學強度的間隔物將可以得 到之觀點,該(A)樹脂之玻璃轉移溫度(Tg)較佳爲40 〜180艺,並且重量平均分子量較佳爲1〇,〇〇〇〜1〇〇,〇〇〇; Tg更佳爲45〜140°c,並且重量平均分子量更佳爲12,000 〜60,000;尤以Tg爲50〜130°C,並且重量平均分子量爲 15,000〜45,000特別理想。 再者,該(A)樹脂之較佳例子更佳爲較佳之該分子量、 玻璃轉移溫度(Tg)及酸價的各自組合。 本發明中之(A )樹脂係於個別之重複單位(共聚合單 位)中具有分枝構造及/或脂環構造、酸性基、及與主鏈之 間隔著酯基所配設的乙烯性不飽和鍵之3元共聚合以上的 共聚物,基於形成圖案構造物(例如,彩色濾光片用之間 隔物)時之變形恢復率、顯像殘渣、皺紋之觀點而較佳。 具體而言,該(A)樹脂較佳爲至少具有含有分枝構造 及/或脂環構造之重複單位:X(x莫耳%):含有酸性基 之重複單位:Y(y莫耳%);及含有與主鏈之間隔著酯基 所配設的乙烯性不飽和鍵之重複單位:Z(z莫耳%)之3 元共聚合以上的共聚物。再者,必要時,也可以含有其他 之重複單位:L(1莫耳%)。 例如,如此之共聚物能夠使含有分枝構造及/或脂環構 造之單體;含有酸性基之單體;含有與主鏈之間係隔著酯 基所配設的乙烯性不飽和鍵之單體;及必要時與其他單體 予以共聚合而得到。其中,基於利用體積大的官能基而使 壓縮彈性係數、彈性恢復性成爲良好之觀點,至少具有該 分枝構造及/或脂環構造之單體較佳爲使該通式(4)所示 之單體予以共聚合而導入具有分枝構造及/或脂環構造之 -41 - 200931177 基的共聚物。此情形下,(A)樹脂係在主鏈中具有來自該 通式(4)所示之單體的構造單位。 針對該(A)樹脂爲共聚物之情形的共聚合組成比,係 考慮玻璃轉移溫度與酸價所決定。雖然不能一槪而論,共 聚合組成比能夠設爲下列之範圍: (A)樹脂中之具有分枝構造及/或脂環構造的重複單 位之組成比(X)較佳爲10〜70莫耳%,更佳爲15〜65莫 耳%,尤以20〜60莫耳%特別理想。若組成比(X)爲該 範圍內時,良好之顯像性可以得到的同時,影像部分之顯 像液承受性也爲良好。 (A)樹脂中之具有酸性基之組成比(y)較佳爲5〜 70莫耳%,更佳爲10〜60莫耳%,尤以20〜50莫耳%特 別理想。若組成比(y )爲該範圍內時,良好之硬化性、顯 像性將可以得到。 (A)樹脂中之具有「與主鏈之間隔著酯基所配設的乙 烯性不飽和鍵」之組成比(z )較佳爲1 〇〜7 0莫耳%,更 佳爲20〜70莫耳% ’尤以30〜70莫耳%特別理想。若組 成比(z)爲該範圍內時,具優越之顏料分散性的同時,感 度及聚合硬化性也爲良好,使得溶液調製後之溶液保存 性、及於塗布後之乾膜狀態下長期所保持之際的經時安定 性將變得良好。 再者,(A)樹脂較佳之情形:組成比(^爲“〜70 莫耳%、組成比(y )爲5〜70莫耳%、組成比(z )爲1 0 〜70莫耳%:更佳之情形:組成比(X)爲15〜65莫耳% ' 組成比(y)爲10〜60莫耳%、組成比(z)爲20〜70莫 耳% ;特別理想之情形:組成比(X)爲20〜50莫耳%、 -42- 200931177 組成比(y)爲20〜50莫耳%、組成比(z)爲30, 耳%。 相對於組成物之所有固形成分,於該(A)樹脂 性樹脂組成物中之含量較佳爲5〜70質量%,更佳j 50質量%。 (A)樹脂能夠與所後述之其他樹脂倂用,較佳 用該(A)樹脂所構成之情形。 其他之樹脂 能夠與該(A )樹脂倂用之樹脂例子較佳爲對鹼 液顯示膨潤性之化合物,更佳爲對鹼性水溶液爲可 化合物。 對鹼性水溶液顯示膨潤性或溶解性之樹脂,例 適宜列舉:具有酸性基之樹脂。具體例可列舉:將 不飽和雙鍵與酸性基導入環氧化物之化合物(例如 丙烯酸酯化合物)、側鏈中具有(甲基)丙烯醯基 基之乙烯基共聚物、環氧丙烯酸酯化合物與側鏈中I 基)丙烯醯基及酸性基之乙烯基共聚物的混合物、 醯胺酸系共聚物等。 該酸性基並無特別之限制,能夠因應於目的而 當選擇,例如,可列舉:羧基、磺酸基、磷酸基等 酸性基之中,基於原料取得性等之觀點,較佳可列 基》 利用轉印法以在基板上進行感光性樹脂層形 形,尤其該(A )樹脂可以與其他之樹脂倂用。此惰 相對於感光性樹脂層之所有固形成分,能夠與(A) 用之樹脂的合計含量(固形成分)較佳爲5〜70質 - 70莫 的感光 專1 0〜 爲僅利 性水溶 溶性之 如,可 乙烯性 ,環氧 及酸性 L有(甲 順丁烯 加以適 ,此等 舉:羧 成之情 形下, 樹脂倂 量% , -43- 200931177 更佳爲10〜50質量%。若此含量爲5質量%以上時,能夠 維持感光性樹脂層之膜強度,並能夠良好地保持該感光性 樹脂層表面之皺摺性’若爲質量%以下時’使曝光感度 成爲良好。 (B )聚合性不飽和化合物 本發明中之感光性組成物係同時含有該(A )樹脂與(B ) 聚合性不飽和化合物。 該聚合性不飽和化合物能夠由構成習知組成物之成分 選擇後而使用,例如,可列舉:日本專利特開2006-23 696 號公報之段落編號〔0010〕〜〔0020〕揭示之成分,或日 本專利特開2006-64921號公報之段落編號〔0027〕〜〔0053〕 揭不之成分。 於與該(A)樹脂之關係中,(B)聚合性化合物之相 對於(A )樹脂的質量比率〔(B ) / ( A )比〕較佳爲〇 _ 5 〜2.5’更佳爲0.6〜2.2,尤以0.8〜1.9特別理想。若(B) /( A )比爲該範圍內時,可以得到具有良好之顯像性、力 學強度的間隔物。 (C )光聚合起始劑 (C1)六芳基聯咪唑化合物 長波長之感光提高之故,本發明之感放射線性樹脂組 成物係(C)成分至少含有(C1)六芳基聯咪唑化合物。 六芳基聯咪唑系化合物,例如,可列舉:2,2’-雙(2-氯苯基)·4,4’,5,5’-四苯基聯咪唑、2,2,-雙(2-氯苯基) -4,4’,5,5’-四(4-乙氧羰基苯基)聯咪唑、2,2,-雙(2,4_二 氯苯基)-4,4’,5,5,-四(4 -苯氧羰基苯基)聯咪唑、2,2,-雙(2,4-二氯苯基)·4,4,,5,5’-四(4-乙氧羰基苯基)聯咪 -44 - 200931177 唑、2,2’-雙(2,4-二氯苯基)-4,4’,5,5’-四(4-苯氧羰基苯 基)聯咪唑、2,2’-雙(2,4,6-三氯苯基)-4,4’,5,5’-四(4-乙氧羰基苯基)聯咪唑、2,2’-雙(2,4,6-三氯苯基) -4,4’,5,5’-四(4-苯氧羰基苯基)聯咪唑、2,2’-雙(2-氰基 苯基)-4,4’,5,5’-四(4-乙氧羰基苯基)聯咪唑、2,2’-雙(2-氰基苯基)-4,4’,5,5’-四(4-苯氧羰基苯基)聯咪唑、2,2’-雙(2-甲基苯基)-4,4’,5,5’-四(4-甲氧羰基苯基)聯咪唑、 2,2’-雙(2-甲基苯基)-4,4’,5,5’-四(4-乙氧羰基苯基)聯 ^ 咪唑、2,2’-雙(2-甲基苯基)-4,4’,5,5’-四(4-苯氧羰基苯 Ό 基)聯咪唑、2,2’-雙(2-乙基苯基)-4,4’,5,5’-四(4-甲氧 羰基苯基)聯咪唑、2,2’-雙(2-乙基苯基)-4,4’,5,5’-四(4-乙氧羰基苯基)聯咪唑、2,2’-雙(2-乙基苯基’)-4,4’,5,5’-四(4-苯氧羰基苯基)聯咪唑、2,2’-雙(2-苯基苯基) -4,4’,5,5’-四(4-甲氧羰基苯基)聯咪唑、2,2’-雙(2-苯基 苯基)-4,4’,5,5’-四(4-乙氧羰基苯基)聯咪唑、2,2’-雙(2-苯基苯基)-4,4’,5,5’-四(4-苯氧羰基苯基)聯咪唑等;2,2’-雙(2-氯苯基)-4,4’,5,5’-四(4-甲氧基苯基)聯咪唑、2,2’- ◎ 雙(2-氯苯基)-4,4’,5,5’-四(3-甲氧基苯基)聯咪唑、2,2’-雙(2-氯苯基)-4,4’,5,5’-四(3,4-二甲氧基苯基)聯咪唑; 2,2’-雙(2,4-二氯苯基)-4,4’,5,5’-四苯基聯咪唑、2,2’-雙(2,4,6-三氯苯基)-4,4’,5,5’-四苯基聯咪唑、2,2’-雙(2,4-二溴苯基)-4,4’,5,5’-四苯基聯咪唑、2,2’-雙(2,4,6-三溴 苯基)-4,4’,5,5’-四苯基聯咪唑、2,2’-雙(2,4-二氰基苯基) -4,4’,5,5’-四苯基聯咪唑、2,2’-雙(2,4,6-三氰基苯基) -4,4’,5,5’-四苯基聯咪唑、2,2’ -雙(2,4 -二甲基苯基) -4,4’,5,5’-四苯基聯咪唑、2,2’-雙(2,4,6-三甲基苯基) -45- 200931177 -4,4’,5,5’-四苯基聯咪唑、2,2,-雙(2,4-二乙基苯基) -4,4’,5,5’-四苯基聯咪唑、2,2’-雙(2,4,6·三乙基苯基) -4,4’,5,5’ -四苯基聯咪唑、2,2’ -雙(2,4 -二苯基苯基) -4,4’,5,5’-四苯基聯咪唑、2,2、雙(2,4,6_三苯基苯基) _4,4’,5,5’-四苯基聯咪唑、2,2’-雙(2-氟苯基)-4,4’,5,5’-四苯基聯咪唑等之聯咪唑系化合物等。 上述之中,特別理想之化合物,可列舉:2,2’-雙(2-氯苯基)-4,4’,5,5’-四苯基聯咪唑(商品名:8-(:1]^、曰本 保土谷化學工業製)、2,2’-雙(鄰氯苯基)-4,4’,5,5’-四 (3,4-二甲氧基苯基)聯咪唑(商品名:ΗΑΒΙ131 1、日本 SiberHegner 製)、2,2’-雙(2-甲基苯基)-4,4’,5,5’-四苯 基聯咪唑(日本黑金化成製)’。 此等化合物係被單獨地或組合二種以上而予以使用。 (C2)芳香族锍基化合物 爲了提高分光感度,本發明之感放射線性樹脂組成物 係含有(C2)芳香族锍基化合物。 可用於本發明之感放射線性樹脂組成物的芳香族锍基 化合物之例子,可列舉:以苯環或雜環爲母核,具有一個 或二個锍基之化合物等。具有二個該毓基之情形下,一側 之锍基也可以藉由烷基、芳烷基或苯基予以取代,或是也 可以爲伸烷基介於其間的二聚物或採取二硫化物形式的二 聚物。 上述之中’芳香族巯基化合物,例如,較佳可列舉: 2-锍基苯并噻唑、2-锍基苯并噚唑、及N-苯基巯基苯并咪 唑等。此等化合物係被單獨地或組合二種以上而予以使用。 (C3 )助劑 -46- 200931177 爲了進一步提高感度,本發明之感放射線性樹 物係含有(C3 )助劑。 該(C3)助劑只要爲能夠提高感度之物的話, 別之限定,其中,基於感度提高效果之觀點,較佳 噸酮化合物、香豆素化合物、二苯基酮化合物、及 化合物所選出之至少一種。 (C3-1)噻噸酮化合物 於本專利說明書中,所謂噻噸酮化合物係意指 _ 具有取代基之噻噸酮。 0 該取代基,例如,可列舉:碳數1〜1 0,較佳爲 〜4之直鏈或分枝之烷基、及氟原子、氯原子或姚 之鹵素原子。敢代基之位置並無特別之限制,較佳 及/或4位。 噻噸嗣化合物,具體而言,可列舉:噻顒酮、 噻噸酮、2-丙基噻噸酮、2-異丙基噻噸酮、2,4-二甲 酮、2,4-二乙基噻噸酮、2,4-二異丙基噻噸酮、2,4. 基噻噸酮等之烷基取代噻噸酮;2-氯噻噸酮等之_ 0 酮等。 上述之中,較佳可列舉:2-異丙基噻噸酮、2,4 噻噸酮、或2-氯噻噸酮。 (C3-2 )香豆素化合物 香豆素化合物可列舉:通式(I ) 、( II )或( 示之化合物。 脂組成 並無特 爲由噻 吖啶酮 也可以 &碳數1 原子等 爲2位 2-乙基 基噻噸 -甲基乙 化噻噸 •二乙基 ΠΙ)所 -47- 200931177Tg -40- 200931177 Based on the spacer having good developing property and mechanical strength, the glass transition temperature (Tg) of the (A) resin is preferably from 40 to 180, and the weight average molecular weight is preferred. 1〇, 〇〇〇~1〇〇, 〇〇〇; Tg is more preferably 45 to 140 ° C, and the weight average molecular weight is more preferably 12,000 to 60,000; especially Tg is 50 to 130 ° C, and the weight average A molecular weight of 15,000 to 45,000 is particularly desirable. Further, a preferred example of the (A) resin is more preferably a combination of the molecular weight, the glass transition temperature (Tg) and the acid value. In the present invention, the resin (A) has a branching structure and/or an alicyclic structure, an acidic group, and an ethylene group which is disposed adjacent to the main chain in the repeating unit (copolymerization unit). It is preferable to copolymerize the above copolymer with a ternary bond of a saturated bond from the viewpoint of a deformation recovery ratio, a development residue, and wrinkles when forming a pattern structure (for example, a spacer for a color filter). Specifically, the (A) resin preferably has at least a repeating unit having a branched structure and/or an alicyclic structure: X (x mole %): a repeating unit containing an acidic group: Y (y mole %) And a copolymer containing a repeating unit of an ethylenically unsaturated bond to which an ester group is disposed at a distance from the main chain: Z (z mole %) is copolymerized with the above. Further, if necessary, other repeating units may be contained: L (1 mol%). For example, such a copolymer can be a monomer having a branched structure and/or an alicyclic structure; a monomer having an acidic group; and an ethylenically unsaturated bond interposed between the main chain and an ester group. Monomer; and if necessary, copolymerization with other monomers. In particular, the monomer having at least the branched structure and/or the alicyclic structure is preferably represented by the general formula (4), from the viewpoint of improving the compressive elastic modulus and the elastic recovery property by using a functional group having a large volume. The monomers are copolymerized to introduce a copolymer having a branched structure and/or an alicyclic structure of -41 - 200931177. In this case, the (A) resin has a structural unit derived from the monomer represented by the above formula (4) in the main chain. The copolymerization composition ratio in the case where the (A) resin is a copolymer is determined in consideration of the glass transition temperature and the acid value. Although it cannot be arbitrarily determined that the copolymerization composition ratio can be set to the following range: (A) The composition ratio (X) of the repeating unit having a branched structure and/or an alicyclic structure in the resin is preferably 10 to 70 moles. Ear %, more preferably 15 to 65 mole %, especially 20 to 60 mole % is particularly desirable. When the composition ratio (X) is within this range, good development performance is obtained, and the image forming liquid of the image portion is also good. The composition ratio (y) having an acidic group in the resin (A) is preferably from 5 to 70 mol%, more preferably from 10 to 60 mol%, particularly preferably from 20 to 50 mol%. When the composition ratio (y) is within this range, good hardenability and developability can be obtained. The composition ratio (z) of the resin having "the ethylenically unsaturated bond to the ester group interposed between the main chain" in the resin is preferably from 1 7 to 70% by mole, more preferably from 20 to 70. Moer% 'especially 30~70 mol% is especially ideal. When the composition ratio (z) is within the range, the pigment dispersibility is excellent, and the sensitivity and the polymerization hardenability are also good, so that the solution preservability after solution preparation and the long-term state in the dry film state after coating are obtained. The stability over time will be good. Further, the (A) resin is preferably a composition ratio (^ is "~70 mol%, a composition ratio (y) is 5 to 70 mol%, and a composition ratio (z) is 10 to 70 mol%: More preferably, the composition ratio (X) is 15 to 65 mol%, the composition ratio (y) is 10 to 60 mol%, and the composition ratio (z) is 20 to 70 mol%; particularly ideal case: composition ratio (X) is 20 to 50 mol%, -42 to 200931177, composition ratio (y) is 20 to 50 mol%, and composition ratio (z) is 30, ear %. With respect to all solid components of the composition, The content of the resin composition (A) is preferably 5 to 70% by mass, more preferably 50% by mass. (A) The resin can be used in combination with other resins described later, preferably the resin (A) In the case of the resin, the resin which can be used for the resin (A) is preferably a compound which exhibits swelling property to an alkali liquid, more preferably a compound which is an alkaline aqueous solution. It exhibits swelling property to an alkaline aqueous solution or The resin which is soluble is exemplified by a resin having an acidic group. Specific examples thereof include a compound in which an unsaturated double bond and an acidic group are introduced into an epoxide ( a mixture of a vinyl copolymer having a (meth) acrylonitrile group in a side chain, an epoxy acrylate compound, and a vinyl copolymer of an acryl fluorenyl group and an acidic group in a side chain, The acid group is not particularly limited, and can be selected depending on the purpose. For example, an acidic group such as a carboxyl group, a sulfonic acid group or a phosphoric acid group may be used, and the raw material availability may be used. From the viewpoint of the preferred embodiment, the photosensitive resin layer shape is formed on the substrate by a transfer method, and in particular, the (A) resin can be used together with other resins. This inertness is relative to all solid components of the photosensitive resin layer. The total content (solid content) of the resin to be used with (A) is preferably 5 to 70 mass - 70 moles of photosensitive specific 10 0 to be only suitable for water solubility, such as ethylenic, epoxy and acid L There is (meth) cis-butene, such as: in the case of carboxy, the amount of resin %, -43- 200931177 is more preferably 10 to 50% by mass. If the content is 5% by mass or more, the sensitization can be maintained. Film of resin layer In addition, the wrinkle property of the surface of the photosensitive resin layer can be favorably maintained. When the mass is less than or equal to the mass%, the exposure sensitivity is improved. (B) Polymerizable unsaturated compound The photosensitive composition of the present invention contains both (A) Resin and (B) a polymerizable unsaturated compound. The polymerizable unsaturated compound can be used by selecting a component constituting a conventional composition. For example, JP-A-2006-23 696 The components disclosed in paragraphs [0010] to [0020], or the components of the paragraphs [0027] to [0053] of JP-A-2006-64921, are not disclosed. In the relationship with the (A) resin, the mass ratio ((B) / (A) ratio) of the (B) polymerizable compound to the (A) resin is preferably 〇_5 to 2.5', more preferably 0.6. ~2.2, especially 0.8~1.9 is especially ideal. When the ratio of (B) / (A) is within this range, a spacer having good developing power and mechanical strength can be obtained. (C) photopolymerization initiator (C1) hexaarylbiimidazole compound having a long wavelength, the radiation sensitive linear resin composition (C) component of the present invention contains at least (C1) hexaarylbiimidazole compound . The hexaarylbiimidazole-based compound may, for example, be 2,2'-bis(2-chlorophenyl).4,4',5,5'-tetraphenylbiimidazole, 2,2,-bis ( 2-chlorophenyl) -4,4',5,5'-tetrakis(4-ethoxycarbonylphenyl)biimidazole, 2,2,-bis(2,4-dichlorophenyl)-4,4 ',5,5,-tetrakis(4-phenoxycarbonylphenyl)biimidazole, 2,2,-bis(2,4-dichlorophenyl)·4,4,,5,5'-tetra (4 -ethoxycarbonylphenyl) hydrazine-44 - 200931177 oxazole, 2,2'-bis(2,4-dichlorophenyl)-4,4',5,5'-tetrakis(4-phenoxycarbonylbenzene Bismuthimide, 2,2'-bis(2,4,6-trichlorophenyl)-4,4',5,5'-tetrakis(4-ethoxycarbonylphenyl)biimidazole, 2,2 '-Bis(2,4,6-trichlorophenyl)-4,4',5,5'-tetrakis(4-phenoxycarbonylphenyl)biimidazole, 2,2'-bis(2-cyano) Phenyl)-4,4',5,5'-tetrakis(4-ethoxycarbonylphenyl)biimidazole, 2,2'-bis(2-cyanophenyl)-4,4',5,5 '-tetrakis(4-phenoxycarbonylphenyl)biimidazole, 2,2'-bis(2-methylphenyl)-4,4',5,5'-tetrakis(4-methoxycarbonylphenyl) Biimidazole, 2,2'-bis(2-methylphenyl)-4,4',5,5'- (4-ethoxycarbonylphenyl)-linked imidazole, 2,2'-bis(2-methylphenyl)-4,4',5,5'-tetrakis(4-phenoxycarbonylphenylhydrazolyl) Imidazole, 2,2'-bis(2-ethylphenyl)-4,4',5,5'-tetrakis(4-methoxycarbonylphenyl)biimidazole, 2,2'-bis(2-B Phenyl)-4,4',5,5'-tetrakis(4-ethoxycarbonylphenyl)biimidazole, 2,2'-bis(2-ethylphenyl')-4,4',5 , 5'-tetrakis(4-phenoxycarbonylphenyl)biimidazole, 2,2'-bis(2-phenylphenyl)-4,4',5,5'-tetrakis(4-methoxycarbonylbenzene Bismuthimide, 2,2'-bis(2-phenylphenyl)-4,4',5,5'-tetrakis(4-ethoxycarbonylphenyl)biimidazole, 2,2'-bis ( 2-phenylphenyl)-4,4',5,5'-tetrakis(4-phenoxycarbonylphenyl)biimidazole; etc.; 2,2'-bis(2-chlorophenyl)-4,4' ,5,5'-tetrakis(4-methoxyphenyl)biimidazole, 2,2'- ◎ bis(2-chlorophenyl)-4,4',5,5'-tetrakis(3-methoxy Biphenyl)biimidazole, 2,2'-bis(2-chlorophenyl)-4,4',5,5'-tetrakis(3,4-dimethoxyphenyl)biimidazole; 2,2 '-Bis(2,4-dichlorophenyl)-4,4',5,5'-tetraphenylbiimidazole, 2 , 2'-bis(2,4,6-trichlorophenyl)-4,4',5,5'-tetraphenylbiimidazole, 2,2'-bis(2,4-dibromophenyl) -4,4',5,5'-tetraphenylbiimidazole, 2,2'-bis(2,4,6-tribromophenyl)-4,4',5,5'-tetraphenyl Imidazole, 2,2'-bis(2,4-dicyanophenyl)-4,4',5,5'-tetraphenylbiimidazole, 2,2'-bis(2,4,6-three Cyanophenyl) -4,4',5,5'-tetraphenylbiimidazole, 2,2'-bis(2,4-dimethylphenyl)-4,4',5,5'- Tetraphenylbiimidazole, 2,2'-bis(2,4,6-trimethylphenyl)-45- 200931177 -4,4',5,5'-tetraphenylbiimidazole, 2,2, - bis(2,4-diethylphenyl)-4,4',5,5'-tetraphenylbiimidazole, 2,2'-bis(2,4,6-triethylphenyl) - 4,4',5,5'-tetraphenylbiimidazole, 2,2'-bis(2,4-diphenylphenyl)-4,4',5,5'-tetraphenylbiimidazole, 2,2,bis(2,4,6-triphenylphenyl)-4,4',5,5'-tetraphenylbiimidazole, 2,2'-bis(2-fluorophenyl)-4, a biimidazole compound such as 4',5,5'-tetraphenylbiimidazole or the like. Among the above, particularly preferred compounds include 2,2'-bis(2-chlorophenyl)-4,4',5,5'-tetraphenylbiimidazole (trade name: 8-(:1) ]^, 曰本保土谷化学工业), 2,2'-bis(o-chlorophenyl)-4,4',5,5'-tetrakis(3,4-dimethoxyphenyl)biimidazole (trade name: ΗΑΒΙ131 1, manufactured by Siber Hegner, Japan), 2,2'-bis(2-methylphenyl)-4,4',5,5'-tetraphenylbiimidazole (manufactured by Nippon Black Gold Chemical Co., Ltd.). These compounds are used singly or in combination of two or more kinds. (C2) Aromatic fluorenyl compound The radiation sensitive resin composition of the present invention contains (C2) an aromatic fluorenyl compound in order to improve the spectral sensitivity. Examples of the aromatic mercapto compound of the radiation sensitive resin composition of the present invention include a compound having a benzene ring or a heterocyclic ring as a core and having one or two mercapto groups. In this case, the thiol group on one side may be substituted by an alkyl group, an aralkyl group or a phenyl group, or may be a dimer or a disulfide form in which an alkyl group is interposed therebetween. The dimer of the above-mentioned 'aromatic mercapto compound, for example, 2-mercaptobenzothiazole, 2-mercaptobenzoxazole, N-phenylmercaptobenzimidazole, etc. The compound is used singly or in combination of two or more kinds. (C3) Auxiliary-46-200931177 In order to further improve the sensitivity, the radiation sensitive tree system of the present invention contains (C3) an auxiliary agent. The agent is not particularly limited as long as it is a substance capable of improving the sensitivity, and at least one selected from the group consisting of a ketone compound, a coumarin compound, a diphenyl ketone compound, and a compound is preferred from the viewpoint of the sensitivity enhancement effect. -1) Thioxanthone compound In the present specification, the thioxanthone compound means a thioxanthone having a substituent. 0 The substituent may, for example, be a carbon number of 1 to 10, preferably a straight or branched alkyl group of ~4, and a fluorine atom, a chlorine atom or a halogen atom of Yao. The position of the dare base is not particularly limited, preferably and/or 4. The thioxanthene compound, specifically For example, thiazolone, thioxanthone, 2-propyl Tons of ketone, 2-isopropylthioxanthone, 2,4-dimethylketone, 2,4-diethylthioxanthone, 2,4-diisopropylthioxanthone, 2,4. An alkyl-substituted thioxanthone such as a ketone; a ketone or the like of 2-chlorothioxanthone or the like. Among the above, preferred are 2-isopropylthioxanthone, 2,4 thioxanthone, or 2 - chlorothioxanthone. (C3-2) Coumarin Compound The coumarin compound may be exemplified by the formula (I), (II) or (the compound shown. The lipid composition is not specifically determined by the thiazolone. & carbon number 1 atom is equal to 2 position 2-ethyl thioxanthene - methyl thioxanthen • diethyl hydrazine) -47- 200931177
通式(I)中,R1及R2可以相同,也可以不同, 各自獨立之氫原子、胺基、二烷胺基、單烷胺基、N 胺烷基、鹵素原子、或烷氧基。於此,較佳爲碳數1〜 烷基及烷氧基。 通式(II)中,R3係表示碳數1〜7之伸烷基,較 1〜4之伸烷基。R4及R5可以相同,也可以不同,表 自獨立之氫原子、或碳數1〜7之烷基。R4或R5係表 基之情形,較佳係表示1〜4之烷基。 通式(III )中,R6及R7可以相同,也可以不同 示各自獨立之氫原子、碳數1〜7(較佳爲1〜4)之傷 或碳數1〜4之烷氧基。 香豆素化合物之例子,具體而言,可列舉:7 - {{ 4 -(二乙胺基)二級三哄-2-基}胺基}-3-苯基香豆素、7 表示 取代 '4之 佳爲 示各 示院 ,表 言基’ 氯-6 --{{4- -48- 200931177 甲氧基- 6-(二乙胺基)二級三畊-2-基}胺基}-3-苯基香豆 素、7-{{4-甲氧基- 6-(二乙胺基丙胺基)二級三畊-2-基} 胺基卜3-苯基香豆素、N-( 7-二甲胺基丙基)-Ν’-{3-苯基 香豆素基- (7) }尿素、3-苯基- 7-( 4’-甲基- 5’-正丁氧基苯 并三唑-2-基)香豆素等。此等化合物之中,較佳爲7-{{4-氯-6-(二乙胺基)二級三畊-2-基}胺基卜3-苯基香豆素。 該香豆素化合物可列舉:3-芳基取代香豆素化合物之 下列通式(VIII )所示之化合物。In the formula (I), R1 and R2 may be the same or different, and each independently has a hydrogen atom, an amine group, a dialkylamino group, a monoalkylamino group, an N-aminoalkyl group, a halogen atom or an alkoxy group. Here, a carbon number of 1 to an alkyl group and an alkoxy group are preferable. In the formula (II), R3 represents an alkylene group having 1 to 7 carbon atoms and an alkylene group having 1 to 4 carbon atoms. R4 and R5 may be the same or different and represent an independent hydrogen atom or an alkyl group having 1 to 7 carbon atoms. In the case of the R4 or R5 group, it is preferred to represent an alkyl group of 1 to 4. In the formula (III), R6 and R7 may be the same or different from each other, and each independently has a hydrogen atom, a carbon number of 1 to 7 (preferably 1 to 4) or an alkoxy group having 1 to 4 carbon atoms. Examples of the coumarin compound include, in particular, 7 - {{ 4 -(diethylamino)ditrimethylene-2-yl}amino}-3-phenylcoumarin, and 7 represents a substitution. 'The best of the four is the show of each hospital, the statement base 'chloro-6 --{{4- -48- 200931177 methoxy-6-(diethylamino) secondary three tillage-2-yl} amine }-3-phenylcoumarin, 7-{{4-methoxy-6-(diethylaminopropylamino) secondary triton-2-yl} aminyl 3-phenylcoumarin, N-(7-dimethylaminopropyl)-Ν'-{3-phenylcoumarin--(7)}urea, 3-phenyl-7-(4'-methyl-5'-positive Butoxy benzotriazol-2-yl) coumarin and the like. Among these compounds, 7-{{4-chloro-6-(diethylamino) ternary trimethyl-2-yl}amino phenyl 3-phenylcoumarin is preferred. The coumarin compound may, for example, be a compound represented by the following formula (VIII) which is a 3-aryl-substituted coumarin compound.
❹ 〇 R12 通式(VIII)❹ 〇 R12 General formula (VIII)
Zb 通式(VIII)中,R8係表示氫原子、碳數1〜8之烷基、 碳數6〜10之芳基,較佳爲氫原子、甲基、乙基、丙基或 丁基。R9係表示氫原子、碳數1〜8之烷基、碳數6〜10 之芳基,或以下列通式(VIIIA )所示之基,較佳爲甲基、 乙基、丙基、丁基或通式(VIIIA)所示之基,特別理想係 表示通式(VIIIA)所示之基。Zb In the formula (VIII), R8 represents a hydrogen atom, an alkyl group having 1 to 8 carbon atoms, and an aryl group having 6 to 10 carbon atoms, preferably a hydrogen atom, a methyl group, an ethyl group, a propyl group or a butyl group. R9 represents a hydrogen atom, an alkyl group having 1 to 8 carbon atoms, an aryl group having 6 to 10 carbon atoms, or a group represented by the following formula (VIIIA), preferably a methyl group, an ethyl group, a propyl group or a butyl group. The group represented by the formula or the formula (VIIIA) is particularly preferably a group represented by the formula (VIIIA).
通式(VIIIA) R1G及R11係表示各自獨立之氫原子、碳數1〜8之烷 基、碳數1〜8之鹵烷基、碳數1〜8之烷氧基、也可以被 取代之碳數6〜10的芳基、胺基、-N(R16) (R17)或齒 -49- 200931177 素原子。於此’碳數1〜8之烷基,例如,可列舉:甲基、 乙基、丙基、丁基、辛基。碳數1〜8之鹵烷基,例如,可 列舉··氯甲基、氟甲基、三氟甲基等。碳數1〜8之烷氧基, 例如’可列舉:甲氧基、乙氧基、丁氧基。也可以被取代 之碳數6〜10的芳基’例如,可列舉:苯基。鹵素原子, 例如’可列舉:-Cl、-Br、-F。其中,較佳爲氫原子、甲 基、乙基、甲氧基、苯基,或是-N(R16) (R17) 、-Cl。 R12係表示也可以被取代之碳數6〜16的芳基,具體而 Q 言,例如,苯基、萘基、甲苯基、對異丙苄基等。可導入 此芳基之取代基可列舉:胺基、-N(R16) (R17)、碳數j 〜8之垸基(例如,甲基、乙基、丙基、丁基、辛基)、 碳數1〜8之鹵院基(例如,氯甲基、氟甲基、三氟甲基等)、 碳數1〜8之烷氧基(例如,甲氧基、乙氧基、丁氧基)、 羥基、氰基、鹵素(例如,-Cl、-Br、-F)。 R13、R14、R16及R”係表示各自獨立之氫原子、碳數 1〜8之烷基(例如,甲基、乙基、丙基、丁基、辛基)。 Q Rl3與Rl4也可以相互鍵結而同時與氮原子形成雜環(例 如,哌啶環、哌阱環、嗎啉環、吡唑環、二唑環、三唑環、 苯并三哩環等)。尺^與也可以相互鍵結而同時與氮原 子形成雜環(例如,哌啶環、哌阱環、嗎啉環、吡唑環、 二哩環、三哩環、苯并三哩環等)eR15係表示氫原子1 數1〜8之烷基(例如,甲基、乙基、丙基、丁基、辛基)、 碳數1〜8之烷氧基(例如,甲氧基、乙氧基丁氧基)、 也可以被取代之碳數6〜10的芳基(例如,苯基)、胺基、 -N ( R16) ( R17)、鹵素(例如,-ci、_Br、_F)。R1G and R11 of the formula (VIIIA) are each independently a hydrogen atom, an alkyl group having 1 to 8 carbon atoms, a haloalkyl group having 1 to 8 carbon atoms, or an alkoxy group having 1 to 8 carbon atoms, which may be substituted. An aryl group, an amine group having 6 to 10 carbon atoms, -N(R16) (R17) or a tooth-49-200931177 atom. Here, the alkyl group having 1 to 8 carbon atoms may, for example, be a methyl group, an ethyl group, a propyl group, a butyl group or an octyl group. Examples of the haloalkyl group having 1 to 8 carbon atoms include a chloromethyl group, a fluoromethyl group, and a trifluoromethyl group. The alkoxy group having 1 to 8 carbon atoms, for example, may be exemplified by a methoxy group, an ethoxy group or a butoxy group. The aryl group having 6 to 10 carbon atoms which may be substituted, for example, may be a phenyl group. The halogen atom, for example, may be -C, -Br or -F. Among them, a hydrogen atom, a methyl group, an ethyl group, a methoxy group, a phenyl group, or -N(R16)(R17) or -Cl is preferable. R12 represents an aryl group having 6 to 16 carbon atoms which may be substituted, and specifically, for example, a phenyl group, a naphthyl group, a tolyl group, a p-isopropylidene group or the like. Examples of the substituent which may be introduced into the aryl group include an amine group, -N(R16) (R17), a fluorenyl group having a carbon number of j 8 (for example, methyl group, ethyl group, propyl group, butyl group, octyl group). a halogen group having 1 to 8 carbon atoms (for example, chloromethyl, fluoromethyl, trifluoromethyl, etc.), an alkoxy group having 1 to 8 carbon atoms (for example, methoxy, ethoxy, butoxy) ), hydroxy, cyano, halogen (eg, -Cl, -Br, -F). R13, R14, R16 and R" represent independently hydrogen atoms and alkyl groups having 1 to 8 carbon atoms (for example, methyl, ethyl, propyl, butyl, octyl). Q Rl3 and Rl4 may also be mutually Bonding and simultaneously forming a heterocyclic ring with a nitrogen atom (for example, a piperidine ring, a piperazine ring, a morpholine ring, a pyrazole ring, a diazole ring, a triazole ring, a benzotriazine ring, etc.). Bonding to each other while forming a heterocyclic ring with a nitrogen atom (for example, a piperidine ring, a piperazine ring, a morpholine ring, a pyrazole ring, a diterpene ring, a triterpene ring, a benzotriazine ring, etc.), the eR15 system represents a hydrogen atom. 1 alkyl having 1 to 8 (for example, methyl, ethyl, propyl, butyl, octyl), alkoxy having 1 to 8 carbon atoms (for example, methoxy, ethoxybutoxy) An aryl group having 6 to 10 carbon atoms (for example, a phenyl group), an amine group, -N (R16) (R17), or a halogen (for example, -ci, _Br, or _F) may be substituted.
Zb 係表不=〇、=8或=(:(11丨8) (Ri9)。 -50- 200931177 R18及R19係表示各自獨立之氰基、-COOR20、-COR21。 R2G及R21係表示各自獨立之碳數1〜8之烷基(例如,甲 基、乙基、丙基、丁基、辛基)、碳數1〜8之鹵烷基(例 如,氯甲基、氟甲基、三氟甲基等)、也可以被取代之碳 數6〜10之芳基(例如,苯基)、雜環、苯環。 另外,其他香豆素化合物之例子,可列舉:下列通式 (IV )所示之化合物。Zb is not = 〇, = 8 or = (: (11 丨 8) (Ri9). -50- 200931177 R18 and R19 are independent cyano groups, -COOR20, -COR21. R2G and R21 are independent. Alkyl groups having 1 to 8 carbon atoms (for example, methyl, ethyl, propyl, butyl, octyl), haloalkyl having 1 to 8 carbon atoms (for example, chloromethyl, fluoromethyl, trifluoro) a methyl group or the like, an aryl group having 6 to 10 carbon atoms (for example, a phenyl group), a heterocyclic ring or a benzene ring which may be substituted. Further, examples of other coumarin compounds include the following general formula (IV); The compound shown.
上述通式(IV )中,R1、R2、R3、R4、R5及R6係表示 各自獨立之氫原子、胺基、二烷胺基、單烷胺基、N取代 胺烷基、鹵素、烷基或烷氧基。於此,烷基及烷氧基較佳 爲碳數1〜4者。R5及R6可以相互鍵結而形成環,也能夠 與相鄰接的Z構成縮合環。 Z較佳爲=0、=S、=C(CN) 2,尤以=0特別理想。 另外,該通式(IV )所示之化合物所代表的香豆素化 合物之例子,例如,下列化合物1〜3、或依照日本林原生 物化學硏究所目錄所得的NKX 1316、1317、1767、1768、 1320' 1769、 1319' 1770、 1771' 846' 3502' 1619,市售 品也可以購得。其中,較佳爲NKX 1767、1768' 1619(商 品名:日本林原生物化學硏究所製)。 -51 - 200931177 化合物1 化合物2 化合物3In the above formula (IV), R1, R2, R3, R4, R5 and R6 each independently represent a hydrogen atom, an amine group, a dialkylamino group, a monoalkylamine group, an N-substituted amine alkyl group, a halogen group or an alkyl group. Or alkoxy. Here, the alkyl group and the alkoxy group are preferably those having 1 to 4 carbon atoms. R5 and R6 may be bonded to each other to form a ring, and may also form a condensed ring with the adjacent Z. Z is preferably =0, =S, =C(CN) 2, especially =0 is particularly desirable. Further, examples of the coumarin compound represented by the compound represented by the above formula (IV), for example, the following compounds 1 to 3, or NKX 1316, 1317, 1767, 1768 obtained according to the catalogue of the Forest Research Institute of Biochemistry of Japan. , 1320' 1769, 1319 ' 1770, 1771 ' 846 ' 3502 ' 1619, commercially available products are also available. Among them, NKX 1767 and 1768' 1619 (trade name: manufactured by Japan Linyuan Biochemical Research Institute) are preferred. -51 - 200931177 Compound 1 Compound 2 Compound 3
於上述化合物1中,R1、R2、R3與R4係表示各自獨立 之氫原子或烷基(較佳爲碳數1〜5)。 (C3-3 )二苯基酮化合物 二苯基酮化合物之例子,可列舉:二苯基酮、苯甲醯 基安息香酸、4-苯基二苯基酮、4,4_二乙胺基二苯基酮、 3,3’-二甲基-4-甲氧基二苯基酮、4-苯甲醯基-4’-甲基二苯 基硫醚等。 " (C3-4)吖啶酮化合物 吖啶酮化合物之例子,可列舉:於日本專利特開 2007-41 082號公報之段落編號〔〇〇32〕〜〔0042〕所揭示 之化合物,其中,特別理想化合物之例子爲10-正丁基-2-氯吖啶酮(商品名:NBC A、日本黑金化成公司製)。 相對於感放射線性樹脂組成物之所有固形成分(感光 性樹脂層之所有固形成分),本發明之感放射線性樹脂組 成物中之該(C)成分的含量(亦即,C1〜C3的總含量) 較佳爲0.5〜25質量%,更佳爲0.5〜15質量%。若該含量 爲該範圍內時,能夠防止光感度或間隔物強度之降低,故 能夠使作爲間隔物所必要的變形恢復性等之性能得以提 高。 必要時,本發明之感放射線性樹脂組成物能夠含有(C ) 成分以外之其他光聚合起始劑。其他光聚合起始劑之例 -52- 200931177 子,可列舉:胺基二苯基酮系化合物、氧化醯基膦系化合 物、及肟酯系化合物。 該胺基二苯基酮系化合物之具體例,可列舉: IRGACURE( Irg)3 69 或 IRGACURE( Irg) 3 79、及 IRGACURE (Irg) 907 等(全部爲商品名;Ciba Specialty Chemicals (股)製)。 該氧化醯基膦系化合物之具體例,可列舉:DAROCURE TPO、或 IRGACURE (Irg) 819 等(全部爲商品名;Ciba Specialty Chemicals (股)製)。 該肟酯系化合物之具體例,可列舉:IRGACURE ( Irg) OXE1 或 CG1 242 等(全部爲商品名;Ciba Specialty Chemicals (股)製)。 其他之成分 本發明中之感光性組成物係至少含有該(A )樹脂、(B ) 聚合性不飽和化合物及(C)光聚合起始劑而成的,進一步 必要時,也可以含有其他之成分((D)微粒等)。 其他之成分能夠從構成習知組成物之成分加以選擇後 而使用,例如,可列舉:於日本專利特開2006-23696號公 報之段落編號〔〇〇1〇〕〜〔0020〕揭示之成分、特開 2006-64921號公報之段落編號〔 0027〕〜〔 0053〕揭示之 成分。 (D)微粒 利用轉印法以進行對基板上之感光性樹脂層形成之情 形,感光性組成物較佳爲含有微粒。 (D )微粒並無特別之限制,能夠因應於目的而加以適 當選擇,例如,較佳爲日本專利特開2003-302639號公報 -53- 200931177 之段落編號〔〇〇35〕〜〔0041〕揭示之塡充顏料’其中’ 基於具有良好之顯像性、力學強度的間隔物之觀點,較佳 爲二氧化政膠體。 基於可以得到具有力學強度高的間隔物之觀點,該(D) 微粒的體積平均粒徑較佳爲 5nm〜50nm,更佳爲 l〇nm〜 40nm >尤以15nm〜30nm特別理想》 基於可以得到具有力學強度高的間隔物之觀點,相對 於感光性樹脂層(間隔物)中之所有固形成分(質量), 該(D)微粒之感光性樹脂層(亦即間隔物)中之含量較佳 爲5〜50質量%,更佳爲10〜40質量%,尤以15〜30質 量%特別理想。 曝光步驟、顯像步驟、及加熱步驟 本發明之間隔物之製造方法係含有:上述層形成步驟 之後,基板上所形成的感光性樹脂層(被覆膜)之至少一 部分,進行實質上不含低於35 Onm波長之放射線的步驟(曝 光步驟)、將曝光後之感光性樹脂層予以顯像的步驟(顯 像步驟)、將顯像後之感光性樹脂層予以加熱的步驟(加 熱步驟)。 依照本發明之製造方法,能夠製作具優越之變形恢復 率的間隔物。 具有將在基板上所形成的感光性樹脂層予以曝光及顯 像後而形成圖案的步驟稱爲「圖案形成步驟」。 本發明所謂的「放射線」之例子,可列舉:紫外線、 is紫外線、X線、電子線、分子線、r線、同步加速器放 射線、質子束線等。 曝光步驟 -54- 200931177 於本發明之曝光步驟中,於該層形成步驟所形成的感 光性樹脂層(被覆膜)之至少一部分’曝光實質上不含低 於350nm波長之放射線。 於此,所謂「實質上不含低於350nm波長」係意指相 較於350nm以上波長之照射強度,可以含有低於350nm的 波長,係具有實質上可忽視程度之照射強度。亦即,也可 以含有不會對後述之曝光機鏡片壽命造成不良影響程度之 照射強度的波長。 對該感光性樹脂層之一部分曝光之際,係隔著既定之 圖案光罩而曝光。於本發明中’藉由濾除具有高能量之低 於3 5 0nm的短波長放射線,能夠有效抑制已使用於曝光機 之鏡片的壽命降低。 該曝光所使用之放射線,能夠使用可見光、紫外線、 遠紫外線等。 用於光照射的光源之例子,可列舉:中壓〜超高壓水 銀燈、氙燈、金屬鹵化物燈等。 若是實質上不含波長低於350nm短波長之放射線的 話,較佳爲使用從190〜450 nm範圍內之放射線且濾除低於 350nm的波長。 該放射線之曝光量係藉由照度計(商品名:OAImodel 365、OAI Optical Associates Inc.製)以測定所曝光之放射 線波長(例如,365nm)中之強度數値’通常爲 20〜 50,000J/m2,較佳爲 20 〜1,500J/m2。 濾除該放射線之低於3 50nm波長的手法,並未予以特 別限定,例如,能夠採取使用濾波器之方法。 例如,該濾波器能夠採用日本東芝玻璃(股)製之紫 -55- 200931177 外穿透濾波器「UV-35」(商品名)。 顯像步驟 於本發明之顯像步驟中,顯像該曝光後之感光性樹脂 層(被覆膜)。 用於顯像處理之顯像液係可以使用鹼性物質之稀薄水 溶液’也可以進一步將少量之與水具混合性的有機溶劑添 加於該稀薄水溶液中。 於該顯像之前,較佳利用噴淋噴嘴等以噴霧純水,均 p 勻地使感光性樹脂組成物層或氧遮斷層之表面予以濕潤。 適當鹼性物質之例子’可列舉:鹼金屬氫氧化物類(例 如’氫氧化鈉、氫氧化鉀)、鹼金屬碳酸鹽類(例如,碳 酸鈉、碳酸鉀)、鹼金屬重碳酸鹽類(例如,碳酸氫鈉、 碳酸氫鉀)、鹼金屬矽酸鹽類(例如,矽酸鈉、矽酸鉀)、 鹼金屬偏矽酸鹽類(例如,偏矽酸鈉、偏矽酸鉀)、三乙 醇胺、二乙醇胺、單乙醇胺、嗎啉、四烷基銨氫氧化物類 (例如,四甲基銨氫氧化物)、磷酸三鈉等。鹼性物質之 _ 濃度較佳爲0.01〜30質量%,pH較佳爲8〜14。 該「與水具混合性之有機溶劑」,例如,適合列舉: 甲醇、乙醇、2-丙醇、1-丙醇、丁醇、二丙酮醇、乙二醇 單甲基醚、乙二醇單乙基醚、乙二醇單正丁基醚、苄醇、 丙酮、甲基乙基酮、環己酮、ε -己內醋、7" -丁內醋、二 甲基甲醯胺、二甲基乙醯胺、六甲基磷醯胺、乳酸乙酯、 乳酸甲酯、ε-己內酯、Ν-甲基吡咯烷酮等。顯像液中之與 水具混合性之有機溶劑的濃度較佳爲0.1〜30質量%。也 可以進一步添加習知之界面活性劑,顯像液中之該界面活 性劑的濃度較佳爲0.01〜10質量%。 -56- 200931177 該顯像液也可以作成溶液而使用,或是作成噴霧液而 使用。去除感光性樹脂組成物層的未硬化部分之情形’能 夠組合於顯像液中,利用旋轉刷或濕潤海綿等以擦拭感光 性樹脂組成物層等之方法。顯像液之溶液溫度較佳爲通常 之室溫(20°C )附近至40°C。顯像時間係依照感光性樹脂 組成物層之組成、顯像液之鹼性或溫度、添加有機溶劑情 形下之其種類與濃度等,通常約爲10秒鐘〜2分鐘。若過 短時,非硬化部分(負型之情形係非曝光部分)之顯像將 Ο 變得不足;若過長時,硬化部分(負型之情形係曝光部分) 也將被鈾刻。於顯像處理之後,也可能加入水洗步驟。於 此顯像步驟中,間隔物將形成所期望之形狀。 加熱步驟 於本發明中之加熱步驟中,加熱處理(也稱爲烘烤處 理)由根據該顯像步驟所得的感光性轉印材料所構成的圖 案影像(或間隔物)。 加熱處理係加熱根據曝光及顯像所形成的圖案影像 (間隔物圖案)而予以硬化。藉此,能夠得到本發明之間 ❹ 隔物。 加熱處理之方法能夠採用習知之各種方法。例如,可 列舉:將複數片基板收納於裝載盒中,利用對流烘箱加以 處理之方法、利用熱板而以每次一片加以處理之方法 '利 用紅外線加熱器加以處理之方法等。 加熱步驟中之加熱溫度通常爲150°C〜280°C,較佳爲 1 8 0 °C〜2 5 0 °C。雖然加熱時間係根據該加熱溫度而有所變 動,將烘烤溫度設爲240°C之情形下,較佳爲1〇分鐘〜120 分鐘,更佳爲30分鐘〜90分鐘。 -57- 200931177 另外,於間隔< 減少、防止感光性 出之觀點,也可以 步驟所形成之間隔 之前,實施後曝光 小污染物將膨脹而 後曝光 用於後曝光之 _ 層之波長領域的光 Ο 能夠適當選定而使 具體例可列舉 化物燈等。 曝光量最好爲: 〜5,000mJ/cm2,較 更佳爲 500mJ/cm2' 本發明之間隔 蔽部及著色影像等 所謂該黑色遮 感光性組成物的塗 的感光性樹脂層之 該黑色遮蔽部 性組成物形成。例 塗布於基板上,於 像以將該黒色遮蔽 由將其他液體之該 他基板(暫時載體 之製造方法中,基於防止不 脂層中所含之UV吸收劑等 於加熱步驟前,進行根據該曝 物圖案的後曝光。一旦於實施 時,能夠有效防止於層壓時所 成爲缺陷》 源,若爲能夠照射可硬化感 (例如,365nm或405nm)之光 m 〇 :超高壓水銀燈、高壓水銀燈 浦償該曝光之曝光量,通常爲 佳爲 200mJ/cm2 〜2,000mJ/crrT 、l,OOOmJ/cm2 ° 物能夠於形成含有黑色矩陣等 之著色部的彩色濾光片後而形 蔽部及著色部與間隔物係任意 布法、與使用具有由感光性組 轉印材料的轉印法。 及著色部與該間隔物能夠由各 如,藉由將液體之該感光性組 形成感光性樹脂層之後,進行 部及著色部形成圖案狀,之後 感光性組成物設置於與該基板 )上,以形成感光性樹脂層所 均勻之膜 成分之析 光及顯像 加熱處理 混入之微 光性樹脂 :源的話, 、金屬鹵 5 OmJ/cm2 2,進一步 之黑色遮 成。 組合塗布 成物而成 自的感光 成物直接 曝光及顯 ,使用藉 不同的其 製造之轉 -58- 200931177 印材料,使此轉印材料緊貼於形成有該黑色遮蔽部及著色 部之該基板,於轉印感光性樹脂層之後,藉由進行曝光及 顯像而能夠形成間隔物。進行如此方式,能夠製作設置有 間隔物之彩色濾光片。 液晶顯示裝置用基板 於本發明中,液晶顯示裝置用基板係具備該本發明之 間隔物。間隔物較佳爲在載體上所形成的黑色矩陣等之黑 色遮蔽部之上或是在TFT等之驅動元件上予以形成。另 外,也可以於黑色矩陣等之黑色遮蔽部或TFT等之驅動元 件、於與間隔物之間存在有ITO等之透明導電層(透明電 極)或聚醯亞胺等之液晶配向膜。 例如,在黑色遮蔽部或驅動元件之上設置有間隔物之 情形,覆蓋在該載體上所預先配設的黑色遮蔽部(黑色矩 陣等)或驅動元件之方式來進行,例如,將感光性轉印材 料換之感光性樹脂層積層於載體面,剝離轉印而形成感光 性樹脂層之後,藉由對其實施曝光、顯像、加熱處理等以 形成間隔物,能夠製作液晶顯示裝置用基板。 另外,相同於上述之方式,例如,將液體之該感光性 組成物直接塗布於基板上而形成感光性樹脂層之後,進行 曝光及顯像,將該黑色遮蔽部及著色部形成圖案狀,之後, 使用藉由將其他液體之該感光性組成物設置於與該基板不 同的其他基板(暫時載體)上,以形成感光性樹脂層所製 作之轉印材料,使此轉印材料緊貼於形成有該黑色遮蔽部 及著色部之該基板而轉印感光性樹脂層之後,藉由進行曝 光及顯像而能夠將間隔物形成圖案狀。進行如此方式,能 夠製作設置有間隔物之液晶顯示裝置用基板。 -59- 200931177 於液晶顯示裝置用基板上’必要時,也可以進一步設 匱有紅色(R)、藍色(B)、綠色(G)三色等之著色像 素。 液晶顯示元件 於本發明中,能夠設置液晶顯示裝置用基板而構成液 晶顯示元件。液晶顯示元件之一形態可列舉:至少具備至 少一側爲光穿透性之一對載體(包含本發明之液晶顯示裝 置用基板)、及於此載體間之液晶層與液晶驅動手段(包 含單純矩陣驅動方式及主動矩陣驅動方式)之元件。 此情形下,本發明之液晶顯示裝置用基板能夠作爲具 有複數之RGB像素群’利用黑色矩陣而將構成該像素群之 各备素予以相互隔離的彩色濾光片基板使用。於此彩色濾 光片中,由於設置有具優越之彈性恢復率及載重變形量之 變形恢復性高的間隔物,具備該彩色濾光片基板之液晶顯 示元件,可有效防止起因於彩色濾光片基板與對向基板之 間的液晶胞間隙(液晶胞厚度)之變動’因液晶材料分布 不均、低溫發泡等所造成之顏色不均等顯示不均之發生。 藉此,所製作之液晶顯示元件能夠顯示鮮艷之影像。 另外,液晶顯示元件之其他形態,可列舉:至少具備 至少一側爲光穿透性之一對載體(包含本發明之液晶顯示 裝置用基板)、及於此載體間之液晶層與液晶驅動手段; 其中,該液晶驅動手段具有主動元件(例如,TFT ),並且 根據一對基板間具優越之彈性恢復率及載重變形量之變形 恢復性高的間隔物且既定寬度受限制之元件。此情形下, 本發明之液晶顯示裝置用基板也能夠作成具有複數之RGB 像素群,利用黑色矩陣以將構成該像素群之各像素所相互 -60- 200931177 隔離的彩色濾光片基板使用》 於本發明中,可能使用的液晶之例子,可列舉:向列 型液晶、膽固醇型液晶、層列型液晶、鐵電液晶。 另外,該彩色濾光片基板之該像素群可以由呈現相互 不同的顔色之2色像素而成的,也可以由3色像素、4色 以上之像素而構成。例如,3色之情形,利用紅(R )、綠 (G)及藍(B)之三種色澤所構成。配置RGB 3色像素群 之情形下,較佳爲瑪賽克形、三角形等之配置,配置4色 0 以上像素群之情形下,任意之配置皆可。例如,彩色濾光 片基板之製作可以如形成2色以上像素群的後述之方式來 形成黑色矩陣,相反的,也可以於形成黑色矩陣之後’形 成像素群。針對RGB像素之形成,能夠將日本專利特開 2004-347831號公報等作爲參考。 液晶顯示裝置 液晶顯示裝置係具備該液晶顯示裝置用基板。另外’ 液晶顯示裝置係具備該液晶顯示元件。亦即,如上所述, & 使相互相向之方式所對向配置之一對基板間之方式,來利 0 用本發明之間隔物以限制既定寬度,將液晶材料封入(將 封入部位稱爲液晶層)所限制之間隙而予以構成,於是使 液晶層之厚度(液晶胞厚度)得以保持所期望之均勻厚度。 液晶顯示裝置中之液晶顯示模式之例子,適宜可列 舉:STN型、TN型、GH型、ECB型、鐵電性液晶、反鐵 電性液晶、VA型、IPS型、OCB型、ASM型、其他各種之 液晶顯示模式。 其中,於液晶顯示裝置中,基於最有效達到本發明效 果之觀點,期望根據液晶胞之厚度變動而容易引起顯示不 -61- 200931177 均的顯不模式,液晶胞厚度較佳爲2/zm〜4/zm的VA 示模式、IPS型顯示模式、OCB型顯示模式所構成。 液晶顯示裝置的構造形態之例子,可列舉:(a) 間隔物而對向配置配列形成有薄膜電晶體(TFT)等之 元件與像素電極(導電層)之驅動側基板、與具備對 極(導電層)之對向基板,將液晶材料封入其間隙部 成之物;(b)隔著間隔物而對向配置驅動基板、與具 向電極(導電層)之對向基板,將液晶材料封入其間 而構成之物等。液晶顯示裝置能夠適用於各種液晶顯 器。 針對液晶顯示裝置,例如已揭示於「下世代液晶 器技術(內田龍男編輯、日本工業調查會、1994年發行 於液晶顯示裝置中,除了具備本發明之液晶顯示元件 晶顯不裝置用基板以外,並未予以特別限制,例如能 成該「下世代液晶顯示器技術」所揭示之各種方式的 顯示裝置。其中’尤以構成彩色TFT方式之液晶顯示 特別有效。針對彩色TFT方式之液晶顯示裝置,例如 示於「彩色TFT液晶顯示器(日本共立出版(股)、 年發行)」。 液晶顯示裝置除了具備上述之液晶顯示裝置用基 液晶顯示元件之外,一般而言,能夠使用電極基板、 薄膜、相位差薄膜、背光板、間隔物、視野角補償薄 抗反射薄膜、光擴散薄膜、防眩薄膜等之各種構件而精 針對此等構件,例如,已揭示於「’ 94液晶顯示器周邊 /化學品之市場(日本島健太郎、(股)CMC、1994年發f 「2003液晶關聯市場之現狀與將來展望(下卷)( 型顯 隔著 驅動 向電 而構 備對 隙部 示機 顯示 )j 0 或液 夠構 液晶 裝置 已揭 1996 板或 偏光 膜、 I成。 材料 "」、 表良 -62- 200931177 吉)、日本(股)富士 Kimera總硏、2003等發行_ 實施例 以下,根據實施例以更具體說明本發明,只要 本發明之主旨,並不受以下之實施例所限定。還有 無特別申明,「%」及「份」係質量基準》 樹脂之合成 以下,顯示(A)樹脂之例子係將來自苯乙烯之 位加入上述化合物P-4中之化合物P-4 + St的合成 q 是,化合物P-4中之單體比係由上述所示之物予以i 合成例1 預先將1-甲氧基-2-丙醇(商品名:MFG、日本 (股)製)7.48份加入反應容器中,升溫至90°C, 環境中,將由苯乙烯(St; w) 3.1份、甲基丙烯酸 烯酯(曰本曰立化成工業(股)製之TCPD-M (商β X) 4.28份、甲基丙烯酸(MMA; y) 11·7份、偶氮 起始劑(日本和光純藥(股)製之V601) 2.08份 Λ 甲氧基-2-丙醇55.2份而成的混合溶液,花費2小 90之反應容器中。滴入後,予以反應4小時而得到 樹脂溶液。 接著,將氫醌單甲基醚0.15份及四乙基銨溴化 份加入該丙烯酸樹脂溶液之後,再將甲基丙烯酸縮 酸酯(GLM、日本東京化成工業(股)製)26.4份 2小時滴入(GLM-MAA ; ζ )。滴入後,注入空氣Κ 也於90°C予以反應4小時後,使固形成分濃度成爲 方式來添加溶劑1-甲氧基-2-丙基醋酸酯(MMPGAc 化學工業(股)製),得到具有不飽和基之化合物 不逾越 ,只要 構造單 例。但 變更。 乳化劑 ή氮氣 三環戊 :!名); 系聚合 、及1-時滴入 丙烯酸 物 0.34 水甘油 ,花費 J同時, 45%之 、D a i s e 1 P-4+St -63- 200931177 ((A)樹脂)的樹脂溶液(固形成分酸價:76.0mgKOH/g、 Mw: 25,000、1·甲氧基-2-丙醇Π-甲氧基-2-丙基醋酸酯45 % 溶液)(X: y: z: St = 30mol% : 27mol% : 37mol% : 6mol % )。 於此,GLM-MAA係甲基丙烯酸縮水甘油酸酯鍵結於甲. 基丙烯酸之物(以下,相同)。 還有,化合物P-4 +苯乙烯化合物(化合物P-4 + St)之 分子量Mw係表示重量平均分子量,重量平均分子量之測 定係利用凝膠滲透層析法(GPC法)以進行。 GPC係使用HLC-8020GPC(T〇S〇 (股)製),管柱係 使用 3 根 TSK 凝膠、Super Multipore HZ-H(Toso (股) 製、4_6mmIDxl5cm) ’洗提液係使角THF (四氫呋喃)。 另外,條件係將試料濃度設爲0.3 5/min、將流速設爲 〇.35ml/min、將試料注入量設爲1〇βΐ、將測定溫度設爲4〇 °C ’使用IR檢測器而進行。另外,檢量線係由toso (股) 製之「標準試料TSK標準品、聚苯乙烯」:rF_4〇」、「F_4〇」、 「F-20」、「F-4」、「F-l」、「A-5000」、「a-2 5 00」、 「A-1000」、「正丁基苯」之8試料製作的(以下,相同)。 以下’(A)樹脂之其他化合物係表示合成上述化合物 P_9、P-io、P-25' P-53 及 Ρ·57 的合成例;將 來自苯乙嫌之構造單位加入此等化合物中任—種之化合物 加以合成的合成例(合成例2〜合成例8及合成例1〇〜合 成例11) ’及比較用之共聚物的合成例(合成例9)。 合成例2 如下之方式進行上述化合物Ρ_4之合成。但是,化合 物Ρ-4中之單體比係由先前所示之物予以變更。 -64- 200931177 於合成例1中,除了不使用苯乙烯,使化合物p-4中 之 X : y : z = 34mol% : 27mol % : 3 9mol % 之方式來變更 TCPD-M ( X )、甲基丙烯酸(y)及GLM-MMA(z)之添 加量以外,利用相同於合成例1之方法加以合成,得到具 有不飽和基之化合物P-4 (( A )樹脂)的樹脂溶液(固形 成分酸價:72.5mgKOH/g、Mw: 22,000、1-甲氧基-2-丙醇 /1-甲氧基-2·丙基醋酸酯45%溶液)。 合成例3 如下之方式進行將來自苯乙烯之構造單位加入上述化 合物P-3之化合物構造的化合物P-3 + St之合成。但是,化 合物P-3中之單體比係由先前所示之物予以變更。 於合成例1中,將甲基丙烯酸三環戊烯酯變更爲甲基 丙烯酸環己酯(CHMA、日本東京化成工業(股)製),使 化合物 P-3+St 中之 X: y: z: w 成爲 25mol% : 25mol% : 40mol% : lOmol%之方式來變更甲基丙烯酸環己酯(X)、 甲基丙烯酸(y )及GLM-MMA ( z)及苯乙烯之添加量以 外,利用相同於合成例1之方法加以合成,得到具有不飽 和基之化合物P-3 + St ( ( A)樹脂)的樹脂溶液(固形成 分酸價:84.9mgKOH/g、Mw: 26,000、1-甲氧基-2_丙醇/1-甲氧基-2-丙基醋酸酯45%溶液)。 合成例4 如下之方式進行上述化合物P-3之合成。但是,化合 物P-3中之單體比係由先前所示之物予以變更。 於合成例1中,除了不使用苯乙烯,將甲基丙烯酸三 環戊烯酯變更爲甲基丙烯酸環己酯(CHM A、日本東京化成 工業(股)製),使化合物P-3中之X: y: z成爲32mol -65- 200931177 % : 25mol% : 43mol%之方式來變更甲基丙烯酸環己酯 (X)、甲基丙烯酸(y)及GLM-MMA(z)之添加量以外, 利用相同於合成例1之方法加以合成,得到具有不飽和基 之化合物P-3 (( A )樹脂)的樹脂溶液(固形成分酸價: 80.9mgKOH/g、Mw: 21,000、1-甲氧基-2-丙醇/1-甲氧基-2-丙基醋酸酯45%溶液)。 合成例5 如下之方式進行上述化合物P-53之合成。但是,化合 物P-5 3中之單體比係由先前所示之物予以變更。 於合成例1中,除了不使用苯乙烯,將甲基丙烯酸三 環戊烯酯變更爲甲基丙烯酸二環戊烯氧乙酯(日本日立化 成工Ϊ| (股)製之Fancryl FA-512M(商品名)),使化合 物 P-53 中之 X : y : z = 46.2mol% : 2 4.3 mo 1 % : 2 9.5 mo 1 % 之方式來變更FA-512M(x)、甲基丙烯酸(y)及GLM-MMA (z )之添加量以外,利用相同於合成例1之方法加以合 成,得到具有不飽和基之化合物P-53 ( ( A)樹脂)的樹 脂溶液(固形成分酸價:70.2mgKOH/g、Mw : 3 0,000、1-甲氧基-2-丙醇/1-甲氧基-2-丙基醋酸酯45%溶液)。 合成例6 如下之方式進行將來自苯乙烯之構造單位加入上述化 合物P-10之化合物構造的化合物P-10 + St之合成。但是, 化合物P-10中之單體比係由先前所示之物予以變更。 於合成例1中,將甲基丙烯酸三環戊烯酯變更爲甲基 丙烯酸二環戊酯(日本日立化成工業(股)製之Fancryl FA-513M(商品名)),將苯乙烯加入化合物P-10中之X: y : z : w 成爲 2 5 m ο 1 % : 2 5 m ο 1 % : 4 0 m ο 1 % : 1 〇 m ο 1 % 之方 -66- 200931177 式來變更FA-513M(x)、甲基丙烯酸(y)及GLM-MMA (z)及苯乙烯之添加量以外,利用相同於合成例1之方法 加以合成,得到具有不飽和基之化合物P-10 + St( (A)樹 脂)的樹脂溶液(固形成分酸價:78.7mgKOH/g、Mw: 2 8,000、1-甲氧基-2-丙醇/1-甲氧基-2-丙基醋酸酯45%溶 液)。 合成例7 如下之方式進行將來自苯乙烯之構造單位加入上述化 合物P-1之化合物構造的化合物P-1 + St之合成。但是,化 合物P-1中之單體比係由先前所示之物予以變更。 於合成例1中,將甲基丙烯酸三環戊烯酯變更爲ADMA (日本出光興業(股)製),使化合物P-1+St中之X : y : z: w 成爲 30mol% : 24mol% : 38mol% : 8mol% 之方式來 變更ADMA(x)、甲基丙烯酸(y)及GLM-MMA(z)及 苯乙烯之添加量以外,利用相同於合成例1之方法加以合 成,得到具有不飽和基之化合物P-l+St ( ( A )樹脂)的 樹脂溶液(固形成分酸價:74.1 mgKOH/g、Mw : 29,000、 1-甲氧基-2-丙醇/1-甲氧基-2-丙基醋酸酯45%溶液)。 合成例8 如下之方式進行將來自苯乙烯之構造單位加入上述化 合物P-2之化合物構造的化合物P-2 + St之合成。但是’化 合物P-2中之單體比係由先前所示之物予以變更。 於合成例1中,將甲基丙烯酸三環戊烯酯變更爲甲基 丙烯酸異莰酯(ΙΒχΜΑ、日本和光純藥工業(股)製)’ 使化合物 p_2 + st 中之 x: y: z: w 成爲 34mo1% : 24mo1% : 36mol% : 6mol%之方式來變更ΙΒΧΜΑ ( X)、甲基丙烯酸 -67- 200931177 (y )及GLM-MMA ( z)及苯乙烯之添加量以外,利用相 同於合成例1之方法加以合成,得到具有不飽和基之化合 物P-2 + St ( (A)樹脂)的樹脂溶液(固形成分酸價: 72.9mgKOH/g、Mw: 29,〇〇〇、1-甲氧基-2-丙醇 /1-甲氧基-2-丙基醋酸酯45%溶液)。 合成例9 (比較用) 比較用之樹脂係進行如下之方式而合成共聚物1。 於合成例6中,將GLM-M A A變更爲甲基丙烯酸縮水 Λ 甘油酸酯(GLM ;日本東京化成工業(股)製),使共聚 Ρ 物 1 中之 X: y: z: w 成爲 27mol% : 25mol% : 40mol% : 8 mol%之方式來變更甲基丙烯酸二環戊酯(X)、甲基丙烯 酸(y )及GLM ( z )及苯乙烯之添加量以外,利用相同於 合成例6之方法加以合成,得到不具有不飽和基之共聚物 1的樹脂溶液(固形成分酸價:95.9mgKOH/g、Mw: 1 8,000、 1-甲氧基-2-丙醇/1-甲氧基-2-丙基醋酸酯45%溶液)。 合成例1 〇 B 如下之方式進行上述化合物P-57之合成。 於合成例1中,將甲基丙烯酸三環戊烯酯變更爲甲基 丙烯酸環己酯(CHM A、日本東京化成工業(股)製),使 化合物 P-57 中之 X: y: z: MMA 成爲 40.1mol% : 26.6mol % : 31.3mol% : 2.0mol%之方式來變更甲基丙烯酸環己酯 (X)、甲基丙烯酸(y)及GLM-MMA ( z)及苯乙烯之添 加量以外,利用相同於合成例1之方法加以合成,得到具 有不飽和基之化合物P-57 ( ( A)樹脂)的樹脂溶液(固 形成分酸價:97.6mgKOH/g、Mw: 31,3 00、1-甲氧基-2-丙 醇/1-甲氧基-2-丙基醋酸酯45%溶液)。 -68- 200931177 合成例11 如下之方式進行上述化合物P-25之合成。 於合成例1中,將甲基丙烯酸三環戊烯酯變更爲甲基 丙烯酸環己酯(CHM A、日本東京化成工業(股)製),使 化合物 P-25 中之 X: y: z: MMA 成爲 46.0mol% : 20.0m〇l % : 32.0mol% : 2.0mol%之方式來變更甲基丙烯酸環己酯 (X)、甲基丙燃酸(y)及GLM-MMA(Z)及甲基丙稀酸 甲酯之添加量以外,利用相同於合成例1之方法加以合 U 成,得到具有不飽和基之化合物P-25 ( ( A)樹脂)的樹 脂溶液(固形成分酸價:74.3 mgKOH/g、Mw : 3 3,600、1-甲氧基-2-丙醇/1-甲氧基-2-丙基醋酸酯45%溶液)^ 【實施例1】 實施例1:塗布法(使用液體阻劑之方法) 彩色濾光片基板之製作 依照日本專利特開200 5 -3 86 1號公報之段落編號 〔0084〕〜〔0095〕揭示之方法,製作具有黑色矩陣、R (紅色)像素、G (綠色)像素、B (藍色)像素之彩色濾 光片(以下,將其稱爲彩色濾光片基板)。於此,彩色濾 光片基板之尺寸係作成400mmx300mm。 接著,在所得的彩色濾光片基板之R像素、G像素、B 像素及黑色矩陣之上,進一步藉由濺鍍以形成ITO (銦錫 氧化物)之透明電極。 光間隔物之形成 使用在濺鍍形成有上述所製作之ITO透明電極之彩色 濾光片基板的I TO透明電極上具有狹縫狀噴嘴之玻璃基板 用塗布機MH-1600 (商品名:FAS Asia公司製),狹縫塗 -69- 200931177 布由下表1所示之配方(於實施例1中,配方1之Cl: C2: C3 = 3.7 : 1: 1(重量比))而成的感光性樹脂層用塗布液。 接著,使用真空乾燥機VCD (商品名;日本東京應化公司 製),使溶劑之一部分予以乾燥30秒鐘而失去塗布膜之流 動性後,在90 °C之熱板上預烘烤3分鐘,形成膜厚5.2 之感光性樹脂層(層形成步驟)。 接著,使用具有超高壓水銀燈之近接型曝光機(日本 日立Hightech電子工程(股)製),約略平行地垂直豎立 _ 直徑15;zm之圓形圖案的光罩(具有影像圖案之石英曝光 0 光罩)、及使該光罩與熱可塑性樹脂層得以相向之方式所 配置的彩色濾光片基板之狀態下,將光罩面與感光性樹脂 層表面之間的距離設爲100 A m,隔著免罩,利用365nm之 強度(曝光量)250 W/m2,以10秒鐘近接曝光穿透日本東 芝玻璃(股)製之紫外穿透濾光板「UV-35」(商品名)。 接著,使用碳酸鈉系顯像液(利用水以將含有0.38莫 耳/升之碳酸氫鈉、0.47莫耳/升之碳酸鈉、5%之二丁基萘 _ 磺酸鈉、陰離子性界面活性劑、消泡劑及安定劑;商品名: T-CD1 (日本富士軟片(股)製)稀釋成10倍之溶液), 於29°C,利用錐形噴嘴壓力0.15MPa,以30秒鐘噴淋顯像 而形成圖案像。接著,使用利用純水以將洗淨劑(含有磷 酸鹽、矽酸鹽、非離子性界面活性劑、消泡劑、安定劑; 商品名:T-SD3C日本富士軟片(股)製))稀釋成10倍 之溶液’於33°C,利用錐形噴嘴壓力0.02MPa,以20秒鐘 噴淋沖洗而進行所形成的圖案像周邊之殘渣去除,成爲 3 00以m X 3 00 v m的1條間隔物間隔之方式來形成圓柱形間 隔物圖案(圖案形狀步驟)。 •70- 200931177 接著,於220 °C,藉由進行設置有間隔物圖案之彩色濾 光片基板的60分鐘加熱處理(熱處理步驟),在彩色濾光 片基板上製作光間隔物。In the above compound 1, R1, R2, R3 and R4 each independently represent a hydrogen atom or an alkyl group (preferably, carbon number 1 to 5). (C3-3) Examples of the diphenyl ketone compound diphenyl ketone compound include diphenyl ketone, benzamidine benzoic acid, 4-phenyldiphenyl ketone, and 4,4-diethylamino group. Diphenyl ketone, 3,3'-dimethyl-4-methoxydiphenyl ketone, 4-benzylidene-4'-methyldiphenyl sulfide, and the like. < (C3-4) An acridinone compound acridinone compound, which is exemplified by the disclosure of the paragraphs [〇〇32] to [0042] of Japanese Patent Laid-Open Publication No. 2007-41082, wherein An example of a particularly desirable compound is 10-n-butyl-2-chloroacridone (trade name: NBC A, manufactured by Nippon Kasei Kasei Co., Ltd.). The content of the component (C) in the radiation sensitive resin composition of the present invention relative to all solid components of the radiation sensitive resin composition (all solid components of the photosensitive resin layer) (that is, the total of C1 to C3) The content) is preferably from 0.5 to 25% by mass, more preferably from 0.5 to 15% by mass. When the content is within this range, the light sensitivity or the strength of the spacer can be prevented from being lowered, so that the performance such as the recovery property required for the spacer can be improved. When necessary, the radiation sensitive resin composition of the present invention can contain other photopolymerization initiators other than the component (C). Examples of other photopolymerization initiators are -52 to 200931177, and examples thereof include an aminodiphenylketone-based compound, a phosphinylphosphine-based compound, and an oxime ester-based compound. Specific examples of the aminodiphenylketone-based compound include IRGACURE (Igg) 3 69 or IRGACURE (Irg) 3 79, and IRGACURE (Irg) 907 (all are trade names; manufactured by Ciba Specialty Chemicals Co., Ltd.) ). Specific examples of the cerium oxide phosphine-based compound include DAROCURE TPO and IRGACURE (Irg) 819 (all of which are trade names; manufactured by Ciba Specialty Chemicals Co., Ltd.). Specific examples of the oxime ester-based compound include IRGACURE (Ig) OXE1 or CG1 242 (all of which are trade names; manufactured by Ciba Specialty Chemicals Co., Ltd.). Other components The photosensitive composition of the present invention comprises at least the (A) resin, (B) a polymerizable unsaturated compound, and (C) a photopolymerization initiator, and may further contain other materials if necessary. Ingredients ((D) particles, etc.). The other components can be selected from the components constituting the conventional composition. For example, the components disclosed in paragraph numbers [〇〇1〇] to [0020] of JP-A-2006-23696, The components disclosed in paragraphs [0272] to [0053] of JP-A-2006-64921. (D) Fine Particles The photosensitive composition preferably contains fine particles by a transfer method to form a photosensitive resin layer on a substrate. (D) The fine particles are not particularly limited and can be appropriately selected depending on the purpose. For example, it is preferably disclosed in paragraphs [〇〇35] to [0041] of JP-A-2003-302639-53-200931177. The enamel pigment 'where' is preferably a oxidized political colloid based on the viewpoint of a spacer having good developing power and mechanical strength. The volume average particle diameter of the (D) fine particles is preferably from 5 nm to 50 nm, more preferably from 10 nm to 40 nm, particularly preferably from 15 nm to 30 nm, based on the viewpoint that a spacer having high mechanical strength can be obtained. From the viewpoint of obtaining a spacer having high mechanical strength, the content of the photosensitive resin layer (that is, the spacer) of the (D) fine particles is higher than that of all the solid components (mass) in the photosensitive resin layer (spacer). It is preferably 5 to 50% by mass, more preferably 10 to 40% by mass, particularly preferably 15 to 30% by mass. Exposure step, development step, and heating step The method for producing a spacer according to the present invention includes at least a part of the photosensitive resin layer (coating film) formed on the substrate after the layer forming step is substantially free a step of exposing radiation of less than 35 Onm wavelength (exposure step), a step of developing the photosensitive resin layer after exposure (development step), and a step of heating the photosensitive resin layer after development (heating step) . According to the manufacturing method of the present invention, it is possible to produce a spacer having a superior deformation recovery rate. The step of forming a pattern by exposing and developing the photosensitive resin layer formed on the substrate is referred to as a "pattern forming step". Examples of the "radiation" in the present invention include ultraviolet rays, is ultraviolet rays, X-rays, electron lines, molecular lines, r lines, synchrotron radiation, proton beam lines, and the like. Exposure Step -54- 200931177 In the exposure step of the present invention, at least a portion of the photosensitive resin layer (coating film) formed in the layer forming step is exposed to radiation substantially free of radiation having a wavelength lower than 350 nm. Here, "substantially does not contain a wavelength of less than 350 nm" means that the irradiation intensity is higher than the wavelength of 350 nm or more, and may have a wavelength of less than 350 nm, and has an irradiation intensity which is substantially negligible. That is, it is also possible to include a wavelength which does not adversely affect the life of the exposure machine lens described later. When a portion of the photosensitive resin layer is partially exposed, it is exposed through a predetermined pattern mask. In the present invention, by filtering out short-wavelength radiation having a high energy of less than 350 nm, it is possible to effectively suppress the decrease in the life of the lens which has been used in the exposure machine. For the radiation used for the exposure, visible light, ultraviolet light, far ultraviolet light or the like can be used. Examples of the light source used for light irradiation include a medium-pressure to ultra-high pressure mercury lamp, a xenon lamp, a metal halide lamp, and the like. If radiation having a wavelength shorter than a short wavelength of 350 nm is substantially absent, it is preferred to use radiation in the range of from 190 to 450 nm and to filter out wavelengths lower than 350 nm. The amount of exposure of the radiation is measured by an illuminometer (trade name: OAImodel 365, manufactured by OAI Optical Associates Inc.) to measure the intensity of the exposed radiation wavelength (for example, 365 nm) 通常 'usually 20 to 50,000 J/m 2 . Preferably, it is 20 to 1,500 J/m2. The method of filtering out the wavelength of the radiation lower than 35 nm is not particularly limited, and for example, a method using a filter can be employed. For example, the filter can be a purple-55-200931177 external transmission filter "UV-35" (trade name) manufactured by Toshiba Glass Co., Ltd., Japan. Developing Step In the developing step of the present invention, the exposed photosensitive resin layer (coating film) is developed. The developing liquid used for the development treatment may be a thin aqueous solution of a basic substance. Further, a small amount of an organic solvent which is miscible with the water may be further added to the diluted aqueous solution. Before the development, it is preferred to spray the pure water with a shower nozzle or the like to uniformly wet the surface of the photosensitive resin composition layer or the oxygen barrier layer. Examples of suitable basic substances include alkali metal hydroxides (for example, 'sodium hydroxide, potassium hydroxide), alkali metal carbonates (for example, sodium carbonate, potassium carbonate), and alkali metal bicarbonates (for alkali metal bicarbonates). For example, sodium bicarbonate, potassium bicarbonate), alkali metal silicates (eg, sodium citrate, potassium citrate), alkali metal bismuth citrates (eg, sodium metasilicate, potassium metasilicate), Triethanolamine, diethanolamine, monoethanolamine, morpholine, tetraalkylammonium hydroxide (for example, tetramethylammonium hydroxide), trisodium phosphate, and the like. The concentration of the alkaline substance is preferably 0.01 to 30% by mass, and the pH is preferably 8 to 14. The "organic solvent mixed with water" is, for example, suitably listed as: methanol, ethanol, 2-propanol, 1-propanol, butanol, diacetone alcohol, ethylene glycol monomethyl ether, ethylene glycol single Ethyl ether, ethylene glycol mono-n-butyl ether, benzyl alcohol, acetone, methyl ethyl ketone, cyclohexanone, ε-caprolactone, 7"-butyrolactone, dimethylformamide, dimethyl Ethyl acetamide, hexamethylphosphoniumamine, ethyl lactate, methyl lactate, ε-caprolactone, hydrazine-methylpyrrolidone, and the like. The concentration of the organic solvent in the developing solution which is miscible with the water is preferably from 0.1 to 30% by mass. Further, a conventional surfactant may be further added, and the concentration of the surfactant in the developing solution is preferably 0.01 to 10% by mass. -56- 200931177 This developing solution can also be used as a solution or as a spray solution. In the case where the uncured portion of the photosensitive resin composition layer is removed, a method in which a photosensitive resin composition layer or the like is wiped by a rotating brush or a wet sponge can be used in combination with a developing solution. The temperature of the solution of the developing solution is preferably from about room temperature (20 ° C) to 40 ° C. The development time is usually about 10 seconds to 2 minutes in accordance with the composition of the photosensitive resin composition layer, the alkalinity or temperature of the developing solution, and the kind and concentration thereof in the case of adding an organic solvent. If it is too short, the development of the non-hardened portion (the negative portion is the non-exposed portion) will become insufficient; if it is too long, the hardened portion (the negative portion will be exposed) will also be engraved with uranium. It is also possible to add a water washing step after the development process. In this developing step, the spacers will form the desired shape. Heating Step In the heating step in the present invention, the heat treatment (also referred to as baking treatment) is a pattern image (or spacer) composed of the photosensitive transfer material obtained in accordance with the development step. The heat treatment is performed by heating the pattern image (spacer pattern) formed by exposure and development. Thereby, the spacer between the present invention can be obtained. The method of heat treatment can employ various methods known in the art. For example, a method of accommodating a plurality of substrates in a loading case, a method of treating them by a convection oven, and a method of treating them one by one using a hot plate may be used. The heating temperature in the heating step is usually from 150 ° C to 280 ° C, preferably from 180 ° C to 2 50 ° C. Although the heating time varies depending on the heating temperature, in the case where the baking temperature is 240 ° C, it is preferably from 1 minute to 120 minutes, more preferably from 30 minutes to 90 minutes. -57- 200931177 In addition, at intervals < In view of reducing or preventing photosensitivity, it is also possible to perform a post-exposure small contaminant to expand and then expose the pupil in the wavelength region of the layer for post-exposure before the interval formed by the step. A chemical lamp or the like can be cited. The amount of exposure is preferably ~5,000 mJ/cm 2 , more preferably 500 mJ/cm 2 ′. The black masking portion of the photosensitive resin layer coated with the black photosensitive composition such as the spacer portion and the colored image of the present invention Sexual composition is formed. For example, the substrate is coated on the substrate, and the other substrate is shielded by the other color (in the manufacturing method of the temporary carrier, the exposure is based on preventing the UV absorber contained in the non-fat layer from being equal to the heating step). Post-exposure of the pattern. Once implemented, it can effectively prevent the source of defects during lamination. If it is light capable of illuminating a hardenable sensation (for example, 365 nm or 405 nm): ultra-high pressure mercury lamp, high-pressure mercury lamp The exposure amount for the exposure is usually preferably 200 mJ/cm 2 to 2,000 mJ/crrT or 1,100 mJ/cm 2 °. The color filter can be formed after forming a color portion including a black matrix, and the coloring portion and the coloring portion can be formed. The method of transferring the spacer to the spacer and using the transfer method having the photosensitive member transfer material, and the coloring portion and the spacer can be formed by, for example, forming the photosensitive resin layer by the photosensitive group of the liquid. The developing portion and the coloring portion are patterned, and then the photosensitive composition is provided on the substrate, and the film component and the image forming heat treatment which are uniform in the photosensitive resin layer are mixed. Micro-light resin: source, metal halide 5 OmJ/cm2 2, further black. The sensitized product obtained by combining the coated products is directly exposed and displayed, and the transfer material is adhered to the black masking portion and the coloring portion formed by using a different printing material manufactured by the same -58-200931177 After the substrate is transferred, the photosensitive resin layer is transferred, and a spacer can be formed by exposure and development. In this manner, a color filter provided with a spacer can be produced. In the present invention, the substrate for a liquid crystal display device includes the spacer of the present invention. The spacer is preferably formed on a black mask portion of a black matrix or the like formed on the carrier or on a driving element such as a TFT. Further, a black conductive portion such as a black matrix or a driving element such as a TFT may be used, and a transparent conductive layer (transparent electrode) such as ITO or a liquid crystal alignment film such as polyimide may be present between the spacer and the spacer. For example, in the case where a spacer is provided on the black shielding portion or the driving element, the black shielding portion (black matrix or the like) or the driving element pre-arranged on the carrier is covered, for example, the photosensitive is turned The photosensitive resin is laminated on the surface of the carrier, and the photosensitive resin layer is peeled off and transferred to form a photosensitive resin layer, and then a spacer is formed by exposure, development, heat treatment, or the like to form a substrate for a liquid crystal display device. In the same manner as described above, for example, after the photosensitive composition of the liquid is directly applied onto the substrate to form a photosensitive resin layer, exposure and development are performed, and the black shielding portion and the colored portion are patterned. And using the photosensitive composition of another liquid on another substrate (temporary carrier) different from the substrate to form a transfer material made of the photosensitive resin layer, and the transfer material is brought into close contact with the formation After the photosensitive resin layer is transferred by the substrate having the black shielding portion and the colored portion, the spacer can be patterned by exposure and development. In this manner, a substrate for a liquid crystal display device provided with a spacer can be produced. -59- 200931177 On the substrate for a liquid crystal display device, if necessary, color elements such as red (R), blue (B), and green (G) may be provided. Liquid crystal display element In the present invention, a liquid crystal display element can be formed by providing a substrate for a liquid crystal display device. In one embodiment of the liquid crystal display device, at least one side having a light transmittance, a carrier (including a substrate for a liquid crystal display device of the present invention), and a liquid crystal layer and a liquid crystal driving means between the carriers (including simple Components of matrix drive mode and active matrix drive mode). In this case, the substrate for a liquid crystal display device of the present invention can be used as a color filter substrate having a plurality of RGB pixel groups 'separating the respective elements constituting the pixel group from each other by a black matrix. In the color filter, since a spacer having a high elastic recovery rate and a load deformation amount and high deformation recovery property is provided, the liquid crystal display element including the color filter substrate can effectively prevent color filter from being caused by color filter The variation of the liquid crystal cell gap (liquid crystal cell thickness) between the sheet substrate and the counter substrate is uneven due to uneven color distribution of the liquid crystal material, low-temperature foaming, and the like. Thereby, the produced liquid crystal display element can display a vivid image. In addition, as another form of the liquid crystal display device, at least one side having a light transmittance, a carrier (including a substrate for a liquid crystal display device of the present invention), and a liquid crystal layer and a liquid crystal driving means between the carriers may be used. The liquid crystal driving means has an active element (for example, a TFT) and an element having a high elastic recovery ratio and a load deformation amount between the pair of substrates, and a predetermined width is limited. In this case, the substrate for a liquid crystal display device of the present invention can also be used as a color filter substrate having a plurality of RGB pixel groups and using a black matrix to isolate pixels constituting the pixel group from each other - 60-200931177. In the present invention, examples of the liquid crystal which may be used include nematic liquid crystal, cholesteric liquid crystal, smectic liquid crystal, and ferroelectric liquid crystal. Further, the pixel group of the color filter substrate may be formed of two color pixels that exhibit mutually different colors, or may be composed of three color pixels or four or more pixels. For example, in the case of three colors, it is composed of three colors of red (R), green (G), and blue (B). In the case of arranging RGB three-color pixel groups, it is preferable to arrange them in a mosaic shape such as a mosaic or a triangle, and in the case of arranging four color groups of 0 or more, any configuration is possible. For example, the color filter substrate can be formed by forming a black matrix as described later to form a pixel group of two or more colors, and conversely, forming a pixel group after forming a black matrix. For the formation of RGB pixels, Japanese Patent Laid-Open Publication No. 2004-347831 and the like can be referred to. Liquid crystal display device The liquid crystal display device includes the substrate for the liquid crystal display device. Further, the liquid crystal display device includes the liquid crystal display element. That is, as described above, < aligning one of the substrates to each other in a manner opposite to each other, the spacer of the present invention is used to limit the predetermined width, and the liquid crystal material is sealed (the enclosed portion is called The gap defined by the liquid crystal layer is configured so that the thickness (liquid crystal cell thickness) of the liquid crystal layer is maintained at a desired uniform thickness. Examples of the liquid crystal display mode in the liquid crystal display device include STN type, TN type, GH type, ECB type, ferroelectric liquid crystal, antiferroelectric liquid crystal, VA type, IPS type, OCB type, ASM type, and the like. Various other liquid crystal display modes. Among them, in the liquid crystal display device, it is desirable to cause a display mode in which the display is not -61 to 200931177, depending on the thickness of the liquid crystal cell, and the thickness of the liquid crystal cell is preferably 2/zm. 4/zm VA display mode, IPS type display mode, OCB type display mode. In the example of the configuration of the liquid crystal display device, (a) a spacer, a device such as a thin film transistor (TFT), a driving side substrate on which a pixel electrode (conductive layer) is formed, and a counter electrode ( a conductive substrate), a liquid crystal material is sealed in a gap portion thereof; (b) a driving substrate is disposed opposite to the spacer, and a counter substrate is disposed on the directional electrode (conductive layer), and the liquid crystal material is sealed In the meantime, it constitutes something. The liquid crystal display device can be applied to various liquid crystal displays. In the liquid crystal display device, for example, it is disclosed in the next generation of the liquid crystal display technology, which is published in the liquid crystal display device of the present invention in addition to the substrate for the liquid crystal display element crystal display device of the present invention. There is no particular limitation, for example, a display device of various modes disclosed in the "next generation liquid crystal display technology". Among them, a liquid crystal display constituting a color TFT system is particularly effective. For a liquid crystal display device of a color TFT type, for example In the liquid crystal display device, in general, the electrode substrate, the film, and the phase can be used. Various components such as a poor film, a backlight, a spacer, a viewing angle compensation thin anti-reflection film, a light-diffusing film, an anti-glare film, etc., are well-oriented for such members, for example, as disclosed in "94 LCD Peripheral/Chemical Market (Japan Island Kentaro, (share) CMC, 1994 issued f "2003 LCD The status quo and future prospects of the joint market (volume) (the type of display shows the display of the gap display by the drive-to-electricity) j 0 or the liquid-structured liquid crystal device has been exposed to the 1996 plate or the polarizing film, I into the material. ;", 良良-62-200931177 吉), Japan (shares) Fuji Kimera, 2003, 2003, etc. _ EMBODIMENT Hereinafter, the present invention will be described more specifically based on examples, as long as the gist of the present invention is not It is defined by the examples. There are no special declarations, "%" and "parts" are the basis of the quality of the resin. The following shows that the (A) resin is a compound P from the styrene to the above compound P-4. The synthesis q of -4 + St is that the monomer ratio in the compound P-4 is obtained by the above-described composition. i Synthesis Example 1 1-methoxy-2-propanol is previously added (trade name: MFG, Japan ( 7.74 parts of the system) was added to the reaction vessel and heated to 90 ° C. In the environment, 3.1 parts of styrene (St; w) and methacrylic acid ester (TCPD manufactured by Sakamoto Kasei Chemical Co., Ltd.) M (quota β X) 4.28 parts, methacrylic acid (MMA; y) 11·7 parts, azo Starting agent (V601 manufactured by Nippon Wako Pure Chemical Industries Co., Ltd.) 2.08 parts of a mixed solution of 5.2methoxy-2-propanol 55.2 parts, which takes 2 small 90 in a reaction vessel. After the dropwise addition, the reaction is carried out. The resin solution was obtained in an hour. Then, 0.15 parts of hydroquinone monomethyl ether and a portion of tetraethylammonium bromide were added to the acrylic resin solution, followed by methacrylic acid esterification (GLM, Tokyo Chemical Industry Co., Ltd.) 26.4 parts of 2 hours of dropwise addition (GLM-MAA; ζ). After the dropwise addition, the air enthalpy was also reacted at 90 ° C for 4 hours, and then the solvent was added to form a solvent to form 1-methoxy-2. -propyl acetate (manufactured by MMPGAc Chemical Industry Co., Ltd.), which gives a compound having an unsaturated group, does not exceed, as long as a single crystal is constructed. But change. Emulsifier ήNitrogen tricyclopentane: name); Polymerization, and 1-time drop of acrylate 0.34 glycerol, cost J, 45%, D aise 1 P-4+St -63- 200931177 ((A Resin solution of resin) (solid content acid value: 76.0 mgKOH/g, Mw: 25,000, 1·methoxy-2-propanol oxime-methoxy-2-propyl acetate 45% solution) (X: y: z: St = 30 mol%: 27 mol%: 37 mol%: 6 mol%). Here, GLM-MAA-based glycidyl methacrylate is bonded to an acrylic acid (hereinafter, the same). Further, the molecular weight Mw of the compound P-4 + styrene compound (compound P-4 + St) represents a weight average molecular weight, and the measurement of the weight average molecular weight is carried out by gel permeation chromatography (GPC method). GPC system uses HLC-8020GPC (manufactured by T〇S〇), and the column system uses three TSK gels, Super Multipore HZ-H (Toso (manufactured by the company), 4_6mmIDxl5cm). Tetrahydrofuran). In addition, the conditions were set to a concentration of 0.3 5 /min, a flow rate of 〇.35 ml/min, a sample injection amount of 1 〇βΐ, and a measurement temperature of 4 〇 ° C. . In addition, the calibration line is "standard sample TSK standard, polystyrene" made by toso (share): rF_4〇, "F_4〇", "F-20", "F-4", "Fl", 8 samples of "A-5000", "a-2 5 00", "A-1000", and "n-butylbenzene" (the same applies hereinafter). The following '(A) other compounds of the resin are examples of the synthesis of the above-mentioned compounds P_9, P-io, P-25' P-53 and Ρ·57; and the structural unit derived from phenylethyl is added to these compounds - Synthesis examples (synthesis example 2 to synthesis example 8 and synthesis example 1 〇 to synthesis example 11) of the synthesis of the compound of the species and a synthesis example of the copolymer for comparison (synthesis example 9). Synthesis Example 2 The synthesis of the above compound Ρ_4 was carried out in the following manner. However, the monomer ratio in the compound Ρ-4 was changed from what was previously shown. -64- 200931177 In Synthesis Example 1, except that styrene was not used, the X: y : z = 34 mol% : 27 mol % : 3 9 mol % in the compound p-4 was changed to change TCPD-M (X), A In addition to the addition amount of the acrylic acid (y) and GLM-MMA (z), a resin solution (solid form) of the compound P-4 ((A) resin) having an unsaturated group was obtained by the same method as in Synthesis Example 1. Acid value: 72.5 mgKOH/g, Mw: 22,000, 1-methoxy-2-propanol/1-methoxy-2-propyl acetate 45% solution). Synthesis Example 3 A synthesis of a compound P-3 + St in which a structural unit derived from styrene was added to the compound of the above compound P-3 was carried out in the following manner. However, the monomer ratio in Compound P-3 was changed from what was previously shown. In Synthesis Example 1, tricyclopentenyl methacrylate was changed to cyclohexyl methacrylate (CHMA, manufactured by Tokyo Chemical Industry Co., Ltd.) to make X: y: z in the compound P-3+St. : w is 25 mol% : 25 mol % : 40 mol % : lOmol % to change the addition amount of cyclohexyl methacrylate (X), methacrylic acid (y), GLM-MMA (z), and styrene The same procedure as in Synthesis Example 1 was carried out to obtain a resin solution of the compound P-3 + St ((A) resin) having an unsaturated group (solid content acid value: 84.9 mgKOH/g, Mw: 26,000, 1-methoxy) Base-2_propanol / 1-methoxy-2-propyl acetate 45% solution). Synthesis Example 4 The synthesis of the above compound P-3 was carried out in the following manner. However, the monomer ratio in the compound P-3 was changed from what was previously shown. In Synthesis Example 1, except that styrene was not used, tricyclopentenyl methacrylate was changed to cyclohexyl methacrylate (CHM A, manufactured by Tokyo Chemical Industry Co., Ltd.), and the compound P-3 was used. X: y: z is changed to 32 mol -65 - 200931177 % : 25 mol% : 43 mol%, and the addition amount of cyclohexyl methacrylate (X), methacrylic acid (y), and GLM-MMA (z) is changed. The same procedure as in Synthesis Example 1 was carried out to obtain a resin solution of the compound P-3 ((A) resin) having an unsaturated group (solid content acid value: 80.9 mgKOH/g, Mw: 21,000, 1-A) Oxy-2-propanol / 1-methoxy-2-propyl acetate 45% solution). Synthesis Example 5 The synthesis of the above compound P-53 was carried out in the following manner. However, the monomer ratio in the compound P-5 3 was changed from what was previously shown. In Synthesis Example 1, except that styrene was not used, tricyclopentenyl methacrylate was changed to dicyclopentenyloxyethyl methacrylate (Fancryl FA-512M manufactured by Hitachi Chemical Co., Ltd., Japan). Trade name)), change the FA-512M(x), methacrylic acid (y) in the compound P-53 by X: y : z = 46.2mol% : 2 4.3 mo 1 % : 2 9.5 mo 1 % In addition to the addition amount of GLM-MMA (z), it was synthesized by the same method as in Synthesis Example 1 to obtain a resin solution of the compound P-53 ((A) resin) having an unsaturated group (solid form acid value: 70.2 mgKOH) /g, Mw: 3 0,000, 1-methoxy-2-propanol / 1-methoxy-2-propyl acetate 45% solution). Synthesis Example 6 A synthesis of a compound P-10 + St in which a structural unit derived from styrene was added to the compound of the above compound P-10 was carried out in the following manner. However, the monomer ratio in the compound P-10 is changed by the one shown previously. In Synthesis Example 1, tricyclopentenyl methacrylate was changed to dicyclopentanyl methacrylate (Fancryl FA-513M (trade name) manufactured by Hitachi Chemical Co., Ltd.), and styrene was added to Compound P. X in -10: y : z : w becomes 2 5 m ο 1 % : 2 5 m ο 1 % : 4 0 m ο 1 % : 1 〇m ο 1 % square -66- 200931177 In the same manner as in Synthesis Example 1, except that the amounts of 513 M (x), methacrylic acid (y), GLM-MMA (z) and styrene were added, a compound P-10 + St having an unsaturated group was obtained. Resin solution of (A) resin) (solid content acid value: 78.7 mgKOH/g, Mw: 2 8,000, 1-methoxy-2-propanol / 1-methoxy-2-propyl acetate 45% solution ). Synthesis Example 7 A synthesis of a compound P-1 + St in which a structural unit derived from styrene was added to the compound of the above compound P-1 was carried out in the following manner. However, the monomer ratio in Compound P-1 was changed from what was previously shown. In Synthesis Example 1, tricyclopentenyl methacrylate was changed to ADMA (manufactured by Nippon Industrial Co., Ltd.) so that X: y : z: w in the compound P-1 + St became 30 mol%: 24 mol%. : In addition to the addition amount of ADMA (x), methacrylic acid (y), GLM-MMA (z) and styrene, 38 mol% : 8 mol%, the same method as in Synthesis Example 1 was used to synthesize A resin solution of a saturated compound P-l+St ((A) resin) (solid content acid value: 74.1 mgKOH/g, Mw: 29,000, 1-methoxy-2-propanol/1-methoxy- 2-propyl acetate 45% solution). Synthesis Example 8 A synthesis of a compound P-2 + St in which a structural unit derived from styrene was added to the compound of the above compound P-2 was carried out in the following manner. However, the monomer ratio in the compound P-2 was changed from what was previously shown. In Synthesis Example 1, tricyclopentenyl methacrylate was changed to isodecyl methacrylate (manufactured by Nippon & Co., Ltd.) to make x in the compound p_2 + st: y: z: w is 34mo1% : 24mo1% : 36mol% : 6mol%, and the same applies to the addition of ΙΒΧΜΑ (X), methacrylic acid-67- 200931177 (y) and GLM-MMA (z) and styrene. The method of Synthesis Example 1 was synthesized to obtain a resin solution of the compound P-2 + St ((A) resin) having an unsaturated group (solid content acid value: 72.9 mgKOH/g, Mw: 29, 〇〇〇, 1- Methoxy-2-propanol / 1-methoxy-2-propyl acetate 45% solution). Synthesis Example 9 (Comparative) The resin used for the comparison was synthesized in the following manner. In Synthesis Example 6, GLM-M AA was changed to glycidyl methacrylate (GLM; manufactured by Tokyo Chemical Industry Co., Ltd.) so that X: y: z: w in the copolymerized product 1 became 27 mol. % : 25 mol % : 40 mol % : 8 mol % The same applies to the synthesis example except that the amount of dicyclopentanyl methacrylate (X), methacrylic acid (y ), GLM (z) and styrene is changed. The method of 6 was synthesized to obtain a resin solution of the copolymer 1 having no unsaturated group (solid content acid value: 95.9 mgKOH/g, Mw: 1 8,000, 1-methoxy-2-propanol/1-methoxy Base-2-propyl acetate 45% solution). Synthesis Example 1 〇 B The synthesis of the above compound P-57 was carried out in the following manner. In Synthesis Example 1, tricyclopentenyl methacrylate was changed to cyclohexyl methacrylate (CHM A, manufactured by Tokyo Chemical Industry Co., Ltd.), and X: y: z in the compound P-57: MMA was changed to 40.1 mol%: 26.6 mol%: 31.3 mol%: 2.0 mol% to change the amount of cyclohexyl methacrylate (X), methacrylic acid (y), and GLM-MMA (z) and styrene. The synthesis was carried out in the same manner as in Synthesis Example 1 to obtain a resin solution of the compound P-57 ((A) resin) having an unsaturated group (solid content acid value: 97.6 mgKOH/g, Mw: 31,300, 1-methoxy-2-propanol / 1-methoxy-2-propyl acetate 45% solution). -68- 200931177 Synthesis Example 11 The synthesis of the above compound P-25 was carried out in the following manner. In Synthesis Example 1, tricyclopentenyl methacrylate was changed to cyclohexyl methacrylate (CHM A, manufactured by Tokyo Chemical Industry Co., Ltd.) to make X: y: z in the compound P-25: MMA was changed to 46.0 mol%: 20.0 m〇l % : 32.0 mol% : 2.0 mol% to change cyclohexyl methacrylate (X), methyl propylene acid (y), and GLM-MMA (Z) and A resin solution of the compound P-25 ((A) resin) having an unsaturated group was obtained by the same method as in Synthesis Example 1 except that the amount of the methyl methacrylate was added (solid content acid value: 74.3) mgKOH/g, Mw: 3 3,600, 1-methoxy-2-propanol/1-methoxy-2-propyl acetate 45% solution) [Example 1] Example 1: Coating method (used Method for Liquid Resistor) The color filter substrate is fabricated in accordance with the method disclosed in paragraphs [0084] to [0095] of Japanese Patent Laid-Open Publication No. Hei. No. 200-5-86 1 to produce a black matrix and R (red) pixels. A color filter of G (green) pixels and B (blue) pixels (hereinafter, referred to as a color filter substrate). Here, the size of the color filter substrate is set to 400 mm x 300 mm. Next, on the R pixel, the G pixel, the B pixel, and the black matrix of the obtained color filter substrate, a transparent electrode of ITO (indium tin oxide) is further formed by sputtering. For the formation of a photo spacer, a glass substrate coater MH-1600 having a slit nozzle on an I TO transparent electrode on which a color filter substrate having the above-described ITO transparent electrode is formed is sputtered (trade name: FAS Asia) Company-made), slit coating-69- 200931177 The sensitization of the formulation shown in the following Table 1 (in Example 1, Formula 1 Cl: C2: C3 = 3.7: 1: 1 (weight ratio)) A coating liquid for a resin layer. Next, using a vacuum dryer VCD (trade name; manufactured by Tokyo Ohka Co., Ltd.), one part of the solvent was dried for 30 seconds to lose the fluidity of the coating film, and then prebaked on a hot plate at 90 ° C for 3 minutes. A photosensitive resin layer having a film thickness of 5.2 was formed (layer formation step). Next, using a proximity type exposure machine having an ultrahigh pressure mercury lamp (manufactured by Hitachi Hightech Electronic Engineering Co., Ltd.), the reticle of the circular pattern of the diameter of 15 mm is vertically erected in parallel (the quartz pattern with image pattern is exposed to 0 light) In the state of the color filter substrate in which the mask and the thermoplastic resin layer are opposed to each other, the distance between the mask surface and the surface of the photosensitive resin layer is set to 100 Am. The UV-transparent filter "UV-35" (trade name) manufactured by Toshiba Glass Co., Ltd. was used for exposure to a thickness of 365 nm (exposure amount) of 250 W/m2 for 10 seconds. Next, using a sodium carbonate-based developing solution (using water to contain 0.38 mol/liter of sodium hydrogencarbonate, 0.47 mol/liter of sodium carbonate, 5% of dibutylnaphthalene-sulfonic acid sodium, anionic interface activity) Agent, defoamer and stabilizer; trade name: T-CD1 (made by Fujifilm Co., Ltd.) diluted to 10 times), sprayed at 30 ° C with a cone nozzle pressure of 0.15 MPa at 30 ° C The image is formed by immersion. Next, using pure water to dilute the detergent (containing phosphate, citrate, nonionic surfactant, antifoaming agent, stabilizer; trade name: T-SD3C Japan Fuji Film Co., Ltd.) 10 times the solution 'at 33 ° C, using a cone nozzle pressure of 0.02 MPa, 20 seconds of spray rinsing to remove the residue of the pattern like the surrounding, to become 300 pieces of m × 3 00 vm The spacer spacer pattern is used to form a cylindrical spacer pattern (pattern shape step). • 70-200931177 Next, at 60 ° C, a photo spacer is formed on the color filter substrate by performing a 60-minute heat treatment (heat treatment step) on the color filter substrate provided with the spacer pattern.
於此,使用三次元表面構造解析顯微鏡(製造商:ZYGO 公司、型式:New View 5 022 ),從玻璃基板側起’測定所 得的1 000個光間隔物之最高間隔物的最高位置(n = 20), 將其平均値設爲高度(平均高度)。另外,所得的光間隔 物之底面積量測係使用SEM照片進行。其結果,光間隔物 • 係直徑15.1/zm、平均高度4.7//Π1之圓柱形。 ❹ 液晶顯示裝置之製作 其他方式,對向基板係準備一玻璃基板,分別在上述 所得的彩色瀘光片基设之透明電極上及對向基板上實施 PVA模式用之圖案形成,進一步於其上設置由聚醯亞胺構 成的配向膜。 之後,包圍彩色濾光片像素群之方式,來藉由噴灑方 式以將紫外線硬化樹脂之密封劑塗布在相當於周圍所設置 之黑色矩陣外框的位置上,滴下PVA模式用液晶,與對向 基板相貼合。之後,UV照射所貼合之基板後,加以熱處理 而使密封劑硬化。將(股)Sanritsu製之偏光板HLC2-2518 (商品名)貼合於進行如此方式所得的液晶胞之兩面。 接著,紅色(R ) LED係使用FR1 1 12H(商品名;Stanley 電氣(股)製之晶片型LED)、綠色(B)LED係使用DG1112H (商品名;Stanley電氣(股)製之晶片型LED)、藍色(G) LED係使用DB1 1 12H (商品名;Stanley電氣(股)製之晶 片型LED )而構成側緣光方式之背光,配置於成爲設置有 該偏光板之液晶胞的背面側,作成液晶顯示裝置。 -71- 200931177 評估 變形恢復率 對於所得的光間隔物,藉由微小硬度計(商品名: DUH-W201、日本(股)島津製造所製),進行如下方式之 測定、評估。測定係採用5 0 μ ηιφ之圓錐形台壓痕物’設 定最大載重21 mN、保持時間5秒鐘,利用負載-解負載試 驗法進行。由此測定値,依照下式而求出變形恢復率〔%〕’ 按照下列評估基準加以評估。測定係於22±1°C、50% RH 之環境下進行。 變形恢復率(%)=(載重釋放後之恢復量〔^m〕/ 載重時之變形量〔//m〕)X100 評估基華 5 :變形恢復率爲90%以上。 4 :變形恢復率爲87%以上、低於90%。 3 :變形恢復率爲8 5 %以上、低於8 7 % ° 2:變形恢復率爲80%以上、低於85%。 1 :變形恢復率爲7 5 %以上、低於8 0 % ° 〇 :變形恢復率爲低於7 5 %。 2 5 °C之1 5 %壓縮時之彈性係數 於調整至25。(:之室內’以1〇 mN/s之載重施加速度’ 使間隔物成爲相當於初期高度H〇〔 mm〕之85%的高度Hi 〔mm〕爲止加以壓縮,讀取高度山時之載重Fi〔N〕’由 下式算出15%壓縮時(歪斜量=(Ho-H! ) /H〇 )之彈性係數。 彈性係數=(載重Fi/間隔物之底面積S〔 mm2〕)/歪 斜量 顯像性 -72- 200931177 於該「光間隔物之製作」中,近接曝光後,利用與各 實施例的顯像條件相同之方法加以顯像,進行所形成的光 間隔物周邊部之SEM觀察,確認間隔物周邊殘渣之有無。 評估基準 5:殘渣完全未被觀察到。 4:在圖案周邊,少許之殘渣被觀察到。 3:在圖案周邊,殘渣被觀察到。 2:在圖案周邊與圖案附近之基板上,殘渣被觀察到。 1:在基板上之各處,殘渣被確認。 感度 對於各實施例所使用之感光性樹脂層用塗布液,上述 顯像條件下,同樣進行使曝光量予以各種改變時能否形成 間隔物圖案形成之曝光顯現處理,經SEM觀察,將可能圖 案形成之最小曝光量設爲感度,按照下列評估基準加以評 估。 評估基準 A:曝光量低於60mJ/cm2,圖案形成爲可能的。 B:曝光量爲60mJ/cm2以上、低於150mJ/cm2,圖案形 成爲可能的。 C : 150mJ/cm2以上、低於300mJ/cm2之曝光量,對於 圖案形成爲必要的。 D : 3 00m J/cm2以上之曝光量,對於圖案形成爲必要的。 溶液經時安定性(保存性) 上述所得的已密栓之感光性樹脂層用塗布液的自然隨 時間經過(25 °C ) 1 80天、及將感光性樹脂層用塗布液置 入60°C烘箱中經過2週之後,使用該塗布液,進行相同於 -73- 200931177 上述感度評估之操作,依照下列基準以進行評估。 評估基準 A:曝光量低於60mJ/cm2,圖案形成爲可能的。 B:曝光量爲60mJ/cm2以上、低於150mJ/cm2,圖案形 成爲可能的。 C: 150mJ/cm2以上、低於300m:T/Cm2之曝光量,對於 圖案形成爲必要的。 D: 300mJ/cm2以上之曝光量,對於圖案形成爲必要的。 實施例2〜4、實施例6〜16、比較例1〜7 於實施例1中,如表1〜3揭示之化合物之方式,來變 更(A)樹脂及(C)光聚合起始劑以外,利用相同於實施 例1之方法以製作液晶顯示裝置。 針對所得的液晶顯示裝置,進行相同於實施例1之評 估(於間隔物之製造步驟內的評估(包含顯像性))。將 評估結果顯示於表 3。所得的間隔物係全部爲直徑 15.1/zm、平均高度4.7ym之圓柱形。 實施例5、17及1 8 :轉印法 於實施例1中,將用於感光性樹脂層用塗布液調製之 化合物P-1 ( (A)樹脂)、微粒及形成方法等變更如下表 1中之配方2及4(C1: C2: C3 = l: 1.7: 1(重量比))、 及表3所示之方式來加以變更,除了藉由取代感光性樹脂 層用塗布液之塗布,以進行使用如下所示之間隔物用感光 性轉印薄膜的轉印,形成感光性樹脂層以外,進行相同於 實施例1之方式,製作光間隔物及液晶顯示裝置。所得的 光間隔物係全部爲直徑平均高度4.7/zm之圓柱 形。 •74- 200931177 間隔物用感光性轉印薄膜之製作 在厚度75ym之聚對苯二甲酸乙二酯薄膜暫時載體 (PET暫時載體)上,使由下列配方A而成的熱可塑性樹 脂層用塗布液予以塗布、乾燥,形成乾燥層厚15.0 μιη之熱 可塑性樹脂層。Here, using the three-dimensional surface structure analysis microscope (manufacturer: ZYGO Co., Ltd., type: New View 5 022), the highest position of the highest spacer of the obtained 1 000 photo spacers was measured from the glass substrate side (n = 20), set its average 値 to height (average height). Further, the measurement of the bottom area of the obtained photo spacer was carried out using an SEM photograph. As a result, the photo spacers were cylindrical with a diameter of 15.1/zm and an average height of 4.7//Π1.其他 In another method of fabricating a liquid crystal display device, a glass substrate is prepared for the opposite substrate system, and a pattern for PVA mode is formed on the transparent electrode provided on the color light-emitting sheet obtained above and on the opposite substrate, and further thereon An alignment film composed of polyimine is provided. Thereafter, the color filter pixel group is surrounded, and the sealing agent of the ultraviolet curable resin is applied by spraying to a position corresponding to the surrounding black matrix frame, and the PVA mode liquid crystal is dropped and aligned. The substrates are bonded together. Thereafter, the bonded substrate is irradiated with UV, and then heat-treated to cure the sealant. A polarizing plate HLC2-2518 (trade name) manufactured by Sanritsu Co., Ltd. was attached to both sides of the liquid crystal cell obtained in this manner. Next, the red (R) LED is FR1 1 12H (trade name; wafer type LED manufactured by Stanley Electric Co., Ltd.), and green (B) LED is DG1112H (trade name; Stanley Electric Co., Ltd.) ), the blue (G) LED is used as a backlight of the side edge light type using DB1 1 12H (trade name; wafer type LED manufactured by Stanley Electric Co., Ltd.), and is disposed on the back surface of the liquid crystal cell on which the polarizing plate is provided. On the side, a liquid crystal display device is fabricated. -71-200931177 Evaluation of the deformation recovery rate The measurement and evaluation of the following methods were carried out by using a microhardness tester (trade name: DUH-W201, manufactured by Shimadzu Corporation, Japan). The measurement was carried out using a conical table indentation of 50 μmφφ, setting a maximum load of 21 mN and a holding time of 5 seconds, using a load-deloading test method. From this, the deformation recovery rate [%] was determined according to the following formula and evaluated according to the following evaluation criteria. The measurement was carried out in an environment of 22 ± 1 ° C and 50% RH. Deformation recovery rate (%) = (recovery amount after load release [^m] / deformation amount at load [//m]) X100 Evaluation Jihua 5: Deformation recovery rate is 90% or more. 4: The deformation recovery rate is 87% or more and less than 90%. 3: The deformation recovery rate is 8 5 % or more and less than 8 7 % ° 2: The deformation recovery rate is 80% or more and less than 85%. 1 : The deformation recovery rate is 7 5 % or more and less than 80 % ° 〇 : The deformation recovery rate is less than 75 %. The elastic modulus at 1 5 % compression at 5 °C is adjusted to 25. (:In the room 'with a load speed of 1〇mN/s', the spacer is compressed to a height Hi [mm] corresponding to 85% of the initial height H〇[mm], and the load at the height of the mountain is read. [N]' The elastic coefficient of 15% compression (skew amount = (Ho-H!) / H〇) is calculated by the following formula: Elastic coefficient = (load weight Fi / spacer bottom area S [mm2]) / skew amount Development-72-200931177 In the "production of photo spacers", after exposure exposure, development was carried out by the same method as the development conditions of the respective examples, and SEM observation of the peripheral portion of the formed photo spacer was performed. The presence or absence of the residue around the spacer was confirmed. Evaluation criteria 5: The residue was not observed at all. 4: A small amount of residue was observed around the pattern. 3: The residue was observed around the pattern. 2: Around the pattern and The residue was observed on the substrate in the vicinity of the pattern. 1: Residue was observed in the entire substrate. Sensitivity The coating liquid for the photosensitive resin layer used in each example was similarly exposed under the above development conditions. Whether the spacer map can be formed when the amount is changed The exposure display treatment was formed, and the minimum exposure amount of the possible pattern formation was set as the sensitivity by SEM observation, and evaluated according to the following evaluation criteria. Evaluation Reference A: The exposure amount was less than 60 mJ/cm 2 , and pattern formation was possible. The amount of the film is 60 mJ/cm 2 or more and less than 150 mJ/cm 2 , and pattern formation is possible. C : an exposure amount of 150 mJ/cm 2 or more and less than 300 mJ/cm 2 is necessary for pattern formation. D : 3 00 m J/cm 2 or more The amount of exposure is necessary for pattern formation. Stability of the solution over time (preservability) The above-mentioned obtained coating liquid for the photosensitive resin layer of the dense plug is naturally passed over time (25 ° C) for 180 days, and will be photosensitive. After the coating liquid for a resin layer was placed in an oven at 60 ° C for 2 weeks, the same coating operation as in -73 - 200931177 was carried out using the coating liquid, and the evaluation was performed according to the following criteria. Evaluation Standard A: Low exposure Pattern formation is possible at 60 mJ/cm 2 B: The exposure amount is 60 mJ/cm 2 or more and less than 150 mJ/cm 2 , and pattern formation is possible. C: Exposure amount of 150 mJ/cm 2 or more and less than 300 m: T/Cm 2 For pattern shape D: The exposure amount of 300 mJ/cm 2 or more is necessary for pattern formation. Examples 2 to 4, Examples 6 to 16, and Comparative Examples 1 to 7 In Example 1, as shown in Tables 1 to 3 The liquid crystal display device was produced in the same manner as in Example 1 except that the (A) resin and the (C) photopolymerization initiator were changed. The same liquid crystal display device was used as in Example 1. Evaluation (evaluation (including imaging) within the manufacturing steps of the spacer). The evaluation results are shown in Table 3. The resulting spacers were all cylindrical with a diameter of 15.1/zm and an average height of 4.7 ym. In the first embodiment, the compound P-1 ((A) resin) prepared in the coating liquid for a photosensitive resin layer, the fine particles, the formation method, and the like are changed as shown in Table 1 below. In the formulas 2 and 4 (C1: C2: C3 = l: 1.7: 1 (weight ratio)), and in the manner shown in Table 3, the coating is applied in place of the coating liquid for the photosensitive resin layer. A photo spacer and a liquid crystal display device were produced in the same manner as in Example 1 except that the photosensitive transfer film was transferred by using a photosensitive transfer film as described below. The resulting photo spacers were all cylindrical in shape having an average diameter of 4.7/zm. • 74- 200931177 Preparation of a photosensitive transfer film for spacers A thermoplastic resin layer made of the following formulation A was coated on a polyethylene terephthalate film temporary carrier (PET temporary carrier) having a thickness of 75 μm. The liquid was applied and dried to form a thermoplastic resin layer having a dry layer thickness of 15.0 μm.
熱可塑性樹脂層用塗布液之配方A *甲基丙烯酸甲酯/甲基丙烯酸·2_乙基己酯/甲基丙 烯酸苄酯/甲基丙烯酸共聚物 ...25.0份 赢 (=55/ 1 1.7/4.5/28.8〔莫耳比〕、重量平均分子量 90,000) 籲苯乙烯/丙烯酸共聚物 ...58·4份 (=63/37〔莫耳比〕、重量平均分子量8,000) • 2,2-雙〔4-(甲基丙嫌醯氧基聚乙氧基)苯基〕丙院 ... 3 9.0 份 ...1 0·0 份 ... 90.0 份 ...5 1 .0 份 …700份 …30% ...70% *下列界面活性劑1 *甲醇 ©« 1-甲氧基-2-丙醇 *甲基乙基酮 *界面活性劑1 *下列構造物1 ♦甲基乙基酮 -75- 200931177 構進物1 [CH2*^〇H)4d—* 0*C〇CH2CH2CnF2n+Formulation of coating liquid for thermoplastic resin layer A *Methyl methacrylate / methacrylic acid · 2 - ethylhexyl ester / benzyl methacrylate / methacrylic acid copolymer... 25.0 parts win (= 55 / 1 1.7/4.5/28.8 [Morby], weight average molecular weight 90,000) styrene/acrylic acid copolymer...58·4 parts (=63/37 [mole ratio], weight average molecular weight 8,000) • 2 , 2-bis[4-(methylpropenyloxypolyethoxy)phenyl]propene... 3 9.0 parts...1 0·0 parts... 90.0 parts...5 1 . 0 parts...700 parts...30% ...70% *The following surfactants 1 *Methanol©« 1-methoxy-2-propanol *methyl ethyl ketone * surfactant 1 *The following structures 1 ♦ Methyl ethyl ketone-75- 200931177 Construct 1 [CH2*^〇H)4d—* 0*C〇CH2CH2CnF2n+
—{CHi-OHV—{CHi-OHV
(P〇)7H 一 (ch2-〒h>「 6(ΕΟ)τΗ (Πβ=6'ώ:ϋ3Π〇: Mw/Mn = 2. 55 PO :環氧丙烷 EO :環氧乙烷) 接著,在所形成的熱可塑性樹脂層上,使由下列配方B 〇 而成的中間層用塗布液予以塗布、乾燥,積層乾蝕刻層厚 1 .5 /z m之中間層。(P〇) 7H one (ch2-〒h> "6(ΕΟ)τΗ (Πβ=6'ώ:ϋ3Π〇: Mw/Mn = 2.55 PO: propylene oxide EO: ethylene oxide) Next, at On the formed thermoplastic resin layer, the intermediate layer coating liquid obtained by the following formulation B was applied and dried, and an intermediate layer having a layer thickness of 1.5 m/zm was deposited.
中間層用塗布液之配方B 參聚乙烯醇 …3.22份 (商品名:PVA-205 (皂化率80% )、(股)Claire製) 參聚乙烯吡咯烷酮 …1.49份 (商品名:PVP K-30、ISP Japan股份有限公司製) 鲁甲醇 …42.3份 © •蒸餾水 …524份 接著,在所形成的中間層上,進一步塗布、乾燥由下 表1所示之配方2而成的感光性樹脂層用塗布液(樹脂(A ) 係表3中之化合物),積層乾燥層厚5.2//m之感光性樹脂 層。 進行如上方式,構成PET暫時載體/熱可塑性樹脂層/ 中間層/感光性樹脂層之積層構造(3層之合計層厚: 21.5 ;am)之後,進一步在感光性樹脂層之表面上,加熱及 加壓作爲覆膜厚度12/zm的聚丙烯製之薄膜而加以貼附, -76- 200931177 得到間隔物用感光性轉印薄膜。 光間隔物之製作 剝離所得的間隔物用感光性轉印薄膜,將所 光性樹脂層表面重疊於濺鑛形成有進行相同於實 方式所製作的ITO透明電極之彩色濾光片基板的 電極上,使用層壓機Lamic II型〔商品名:日本 立工業製〕,於線壓100N/cm、130°C之加壓及加熱 以搬送速度2m/分鐘相貼合。之後,在與熱可塑 〇 之界面剝離去除PET暫時載體,將感光性樹脂層 至熱可塑性樹脂層及中間層(層形成步驟)。 接著,使用具有超高壓水銀燈之近接型曝光 日立Hightech電子工程(股)製),約略平行地 直徑15ym之圓形圖案的光罩(具有影像圖案之 光罩)、及使該光罩與熱可塑性樹脂層得以相向 配置的彩色濾光片基板之狀態下,將光罩面連接 性樹脂層中間層側表面之間的距離設爲100/zm Ο 罩,從熱可塑性樹脂層側起,利用3 65nm之強度 爲25 0 W/m2,以10秒鐘近接曝光穿透日本東芝班 製之紫外穿透濾光板「UV-35」(商品名)。 接著,於30°C,利用扁平噴嘴壓力0.04MPa 噴淋顯像三乙醇胺系顯像液(利用純水以將含有 30%、商品名:T-PD2 (日本富士軟片(股)製 12倍(以1份T-PD2與純水1 1份之比例混合)& 去除熱可塑性樹脂層與中間層。接著,將空氣噴 基板上面以完全去除溶液後,經由噴淋以1 0秒 露出的感 瓶例1之 ITO透明 (股)日 條件下, 性樹脂層 同時轉印 機(日本 垂直豎立 石英曝光 之方式所 於與感光 ,隔著光 (曝光量) [璃 '(股) ,5 0秒鐘 三乙醇胺 )稀釋成 5溶液), 吹此玻璃 鐘沖刷純 -77- 200931177 水,純水噴淋洗淨,噴吹空氣以減少基板上之溶液積存。 接著,使用碳酸鈉系顯像液(利用純水以將含有〇·38 莫耳/升之碳酸氫鈉、0.47莫耳/升之碳酸鈉、5%之二丁基 萘磺酸鈉、陰離子性界面活性劑、消泡劑及安定劑;商品 名:T-CD1(日本富士軟片(股)製)稀釋成10倍之溶液), 於29°C,利用錐形噴嘴壓力0.15MPa,以30秒鐘噴淋顯像 而形成圖案像。接著,使用利用純水以將洗淨劑(含有磷 酸鹽、矽酸鹽、非離子性界面活性劑、消泡劑、安定劑; 〇 商品名:T-SD3 (日本富士軟片(股)製))稀釋成10倍 之溶液,於33°C,利用錐形噴嘴壓力0.02MPa,以20秒鐘 噴淋沖洗而進行所形成的圖案像周邊之殘渣去除,成爲 3 00 # mx 300以m的1條間隔物間隔之方式來形成圓柱形間 隔物圖案(圖案形狀步驟)。 接著,於220 °C,藉由進行設置有間隔物圖案之彩色濾 光片基板的60分鐘加熱處理(熱處理步驟),在彩色濾光 片基板上製作光間隔物。所得的光間隔物係直徑1 5 . 1 /z m、 〇 平均高度4.7 V m之圓柱形。 然後,使用製作有光間隔物之彩色濾光片基板,進行 相同於實施例1之方式而製作PVA模式液晶顯示裝置。 -78 - 200931177 【表1】 感光性樹脂組成物層用塗布液 配方1 配方2 配方4 配方5 配方6 實施例1〜4、6〜 14、比較例1〜5 實施例5 及17 實施例 18 比較例6 比較例7 1-甲氧基-2-丙基醋酸酯 26 23.35 23.35 37.275 19.43 甲基乙基酮 28 28 28 28 28 膠體二氧化矽分散物(膠體二氧化矽:30份、甲 基異丁基酮:70份、日本日產化學工業製 MIBKst) ; (D 微粒) 0 14.1 14.1 0 0 Solsperse 20000 0.42 0.42 0.42 0 0 DPHA液(六丙烯酸二季戊四醇酯:76份、1-甲 氧基-2-丙基醋酸酯:24份):(B)聚合性不飽 和化合物 18.2 14.37 14.37 18.2 8.667 (A )樹脂之溶液(但是,(A )樹脂係於表3揭 示之化合物) 20.5 26.98 26.98 0 36.6 甲基丙烯酸/甲基丙烯酸烯丙酯共聚物(莫耳比) =20/80 (重量平均分子量=3.6萬) 0 0 0 9.225 0 於下表3揭示之(C)起始劑 0.227 0.227 0.227 0.227 0.227 氫醌單甲基醚 0.0036 0.0036 0.0036 0.0036 0.0036 界面活性劑1 (Megafac F-780-F、大日本墨水化 學工業股份有限公司製) 0.032 0.032 0.032 0.032 0.032 Victoria Pure Blue NAPS (日本保土谷化學工業股 份有限公司製)之5%甲醇溶液 2.05 2.05 0 0 0 顏料分散液C.I.P.B. 15 : 6 (日本東洋墨水公司 製):11.92份、甲基丙烯酸/甲基丙烯酸苄酯共 聚物(莫耳比)=30/70 (重量平均分子量=3.0萬) 5.96份、1-甲氧基-2-丙基醋酸酯:82.12份 0 0 2.05 0 0 【表2】 感光性樹脂組成物層用塗布液 配方3 實施例15、 16 1-甲氧基-2-丙基醋酸酯 36.53 二乙二醇乙基甲基醚 28.43 DPHA液(六丙烯酸二季戊四醇酯:76份、1-甲氧基-2-丙基 醋酸酯:24份) 15.75 (A)樹脂之溶液(但是,(A)樹脂係於表3揭示之化合物) 17.74 於下表3揭示之(C)起始劑 1.27 氫醌單甲基醚 0.05 界面活性劑2 (Megafac F-781-F、大日本墨水化學工業股份 有限公司製) 0.02 矽烷耦合劑1 (KBM-403、日本信越化學工業股份有限公司) 0.2 單位:質量份 -79- 200931177Formulation B of the coating solution for the intermediate layer. 3.3.2 parts of polyvinyl alcohol... (trade name: PVA-205 (saponification ratio: 80%), (manufactured by Claire)), polyvinylpyrrolidone... 1.49 parts (trade name: PVP K-30) , ISP Japan Co., Ltd.) Lumethanol...42.3 parts © • Distilled water: 524 parts Next, the photosensitive resin layer obtained by formula 2 shown in the following Table 1 was further applied and dried on the formed intermediate layer. The coating liquid (resin (A) is a compound in Table 3) was laminated to a photosensitive resin layer having a dry layer thickness of 5.2/m. In the above manner, the laminated structure of the PET temporary carrier/thermoplastic resin layer/intermediate layer/photosensitive resin layer (the total thickness of the three layers: 21.5; am) is formed, and then further heated on the surface of the photosensitive resin layer. The pressure was applied as a film made of polypropylene having a film thickness of 12/zm, and -76-200931177 was obtained as a photosensitive transfer film for spacers. The photosensitive spacer is formed by peeling off the spacer, and the surface of the light-sensitive resin layer is superposed on the electrode of the color filter substrate on which the ITO transparent electrode produced in the same manner as the actual method is formed. In the laminating machine, the Lamic II type (trade name: manufactured by Nippon Kogyo Co., Ltd.) was used, and the bonding was carried out at a line speed of 100 N/cm and 130 ° C under pressure and heating at a conveying speed of 2 m/min. Thereafter, the PET temporary carrier is peeled off at the interface with the thermoplastic resin, and the photosensitive resin layer is laminated to the thermoplastic resin layer and the intermediate layer (layer forming step). Next, using a proximity-type exposure Hitachi Hightech Electronic Engineering Co., Ltd. with an ultra-high pressure mercury lamp, a circular mask having a circular pattern of approximately 15 μm in diameter (a mask having an image pattern), and making the mask and thermoplastic In the state of the color filter substrate in which the resin layer is disposed to face each other, the distance between the intermediate layer side surfaces of the photomask surface-attachable resin layer is set to 100/zm, and from the side of the thermoplastic resin layer, 3 65 nm is used. The intensity is 25 0 W/m2, and the UV-transparent filter "UV-35" (trade name) of Toshiba-Shiban is penetrated by a 10 second exposure. Then, at 30 ° C, a three-ethanolamine-based developing solution was sprayed with a flat nozzle pressure of 0.04 MPa (using pure water to contain 30%, trade name: T-PD2 (Japan Fuji Film Co., Ltd.) 12 times ( The thermoplastic resin layer and the intermediate layer were removed by mixing 1 part of T-PD2 in a ratio of 1 part of pure water. Then, the upper surface of the substrate was sprayed with air to completely remove the solution, and the feeling was revealed by spraying for 10 seconds. In the case of the ITO transparent (strand) of the bottle example 1, the resin layer is simultaneously transferred to the machine (the Japanese vertical erected quartz exposure method is in contact with the light, and the light is exposed (exposure amount) [glass' (share), 50 seconds Dilute triethanolamine) diluted into 5 solutions), blow this glass clock to wash pure -77- 200931177 water, wash with pure water spray, spray air to reduce the accumulation of solution on the substrate. Next, use sodium carbonate imaging solution ( Using pure water to contain 〇·38 mol/L of sodium bicarbonate, 0.47 mol/L sodium carbonate, 5% dibutyl naphthalene sulfonate, anionic surfactant, antifoaming agent and stabilizer ; Product name: T-CD1 (Japan Fujifilm (stock) system) diluted to 10 times dissolved Using a cone nozzle pressure of 0.15 MPa at 29 ° C, a pattern image was formed by spray development for 30 seconds. Next, using pure water to remove the detergent (containing phosphate, citrate, non-ion) Sexual surfactant, defoamer, stabilizer; 〇 Trade name: T-SD3 (made by Fujifilm Co., Ltd.)) diluted to 10 times solution at 33 ° C, using a cone nozzle pressure of 0.02 MPa, After 20 seconds of shower rinsing, the formed pattern image was removed by the surrounding residue, and a cylindrical spacer pattern (pattern shape step) was formed by 300 spacers of m 00 #mx 300. Next, At 60 ° C, a photo spacer was formed on the color filter substrate by performing a 60-minute heat treatment (heat treatment step) on the color filter substrate provided with the spacer pattern. The obtained photo spacer was 1 5 in diameter. A cylindrical shape of 1 / zm and an average height of 4.7 V m. Then, a PVA mode liquid crystal display device was produced in the same manner as in Example 1 using a color filter substrate on which a photo spacer was formed. -78 - 200931177 Table 1] Photosensitive resin Coating solution for forming layer 1 Formulation 2 Formulation 4 Formulation 5 Formulation 6 Examples 1 to 4, 6 to 14, Comparative Examples 1 to 5 Examples 5 and 17 Example 18 Comparative Example 6 Comparative Example 7 1-methoxy group -2-propyl acetate 26 23.35 23.35 37.275 19.43 methyl ethyl ketone 28 28 28 28 28 colloidal cerium oxide dispersion (colloidal cerium oxide: 30 parts, methyl isobutyl ketone: 70 parts, Nissan Chemical Co., Ltd. Industrial MIBKst) ; (D microparticles) 0 14.1 14.1 0 0 Solsperse 20000 0.42 0.42 0.42 0 0 DPHA solution (dipentaerythritol hexaacrylate: 76 parts, 1-methoxy-2-propyl acetate: 24 parts): (B) Polymerizable unsaturated compound 18.2 14.37 14.37 18.2 8.667 (A) A solution of the resin (however, (A) resin is a compound disclosed in Table 3) 20.5 26.98 26.98 0 36.6 Methacrylic acid/allyl methacrylate copolymerization (Mole ratio) = 20/80 (weight average molecular weight = 36,000) 0 0 0 9.225 0 (C) Starting agent 0.227 0.227 0.227 0.227 0.227 Hydroquinone monomethyl ether 0.0036 0.0036 0.0036 0.0036 0.0036 Surfactant 1 (Megafac F-780-F, Great Japan Ink Industrial Co., Ltd.) 0.032 0.032 0.032 0.032 0.032 Victoria Pure Blue NAPS (Nippon Hodogaya Chemical Industry Co., Ltd.) 5% methanol solution 2.05 2.05 0 0 0 Pigment dispersion CIPB 15 : 6 (manufactured by Toyo Ink Co., Ltd.) : 11.92 parts, methacrylic acid / benzyl methacrylate copolymer (mole ratio) = 30 / 70 (weight average molecular weight = 30,000) 5.96 parts, 1-methoxy-2-propyl acetate: 82.12 parts 0 0 2.05 0 0 [Table 2] Formulation solution 3 for photosensitive resin composition layer Example 15 and 16 1-methoxy-2-propyl acetate 36.53 Diethylene glycol ethyl methyl ether 28.43 DPHA solution (Dipentaerythritol hexaacrylate: 76 parts, 1-methoxy-2-propyl acetate: 24 parts) 15.75 (A) Resin solution (however, (A) resin is a compound disclosed in Table 3) 17.74 (C) Starting agent 1.27 Hydroquinone monomethyl ether 0.05 Surfactant 2 (Megafac F-781-F, manufactured by Dainippon Ink and Chemicals Co., Ltd.) 0.02 decane coupling agent 1 (KBM-403) , Japan Shin-Etsu Chemical Industry Co., Ltd.) 0.2 Unit: Quality Part -79-200931177
200931177 以下表示於上述實施例及比較例所使用之化合物的簡 稱: • B-CIM: 2,2’-雙(2-氯苯基)-4,4’,5,5’-四苯基聯咪唑 (日本保土谷化學工業(股)製) • HABI1311 : 2,2,-雙(鄰氯苯。'基)-4,4’,5,5’-四(3,4-二 甲氧基苯基)聯咪唑(日本SiberHegner (股)製) • 甲基聯咪唑:2,2’-雙(2-甲基苯基)-4,4’,5,5’-四苯基 聯咪唑(日本黑金化成(股)製) Ο · IRG907:2-甲基-1-〔4-(甲硫基)苯基〕-2·嗎啉基丙 院-1-酮(IRGACURE 907、Ciba Specialty Chemicals(股) 製) , 參MBI:2 -毓基苯并咪唑 • MBT : 2-锍基苯并噻唑 _ EAB:二乙胺基二苯基酮 • NKX-1619:香豆素化合物(日本(股)林原生物化學 硏究所製) ❹ 鲁MIBK-St:二氧化砂凝膠之30wt%甲基異丁基酮分散物 (曰本曰產化學製) • NBCA : 10-正丁基_2_氯吖啶酮(日本黑金化成(股)製) • NPhMBI: N -苯基锍基苯并咪哩 -81- 200931177200931177 The following is abbreviated as a compound used in the above examples and comparative examples: • B-CIM: 2,2'-bis(2-chlorophenyl)-4,4',5,5'-tetraphenylene Imidazole (manufactured by Japan Hodogaya Chemical Industry Co., Ltd.) • HABI1311: 2,2,-bis(o-chlorobenzene. 'yl)-4,4',5,5'-tetra(3,4-dimethoxy Phenyl)biimidazole (manufactured by Siber Hegner Co., Ltd.) • Methylbiimidazole: 2,2'-bis(2-methylphenyl)-4,4',5,5'-tetraphenylbiimidazole ( Japan Black Gold Chemical Co., Ltd.) Ο · IRG907: 2-methyl-1-[4-(methylthio)phenyl]-2·morpholinylpropan-1-one (IRGACURE 907, Ciba Specialty Chemicals ( ())), MBI: 2 - mercaptobenzimidazole • MBT: 2-mercaptobenzothiazole _ EAB: diethylaminodiphenyl ketone • NKX-1619: coumarin compound (Japan) MIBK-St: 30wt% methyl isobutyl ketone dispersion of sulphur dioxide gel (manufactured by Sakamoto Chemical Co., Ltd.) • NBCA: 10-n-butyl-2-chloride Acridinone (made by Japan Black Gold Chemical Co., Ltd.) • NPhMBI: N-phenylmercaptobenzopyrene-81- 20 0931177
DETX-S ο C2H5 由表3可明確得知,相較於比較例,實施例之感放射 線性樹脂組成物及間隔物係於感度、變形恢復率及溶液保 0 存安定性中任一種評估項目皆爲優異的。 【圖式簡單說明】 無。 (:主要元件符號說明】 te 〇 j\wDETX-S ο C2H5 It is clear from Table 3 that compared with the comparative example, the radiation sensitive resin composition and the spacer of the examples are evaluated in any one of sensitivity, deformation recovery rate, and solution stability. All are excellent. [Simple description of the diagram] None. (: Description of main component symbols) te 〇 j\w
-82--82-
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| KR20130047656A (en) * | 2011-10-31 | 2013-05-08 | 히타치가세이가부시끼가이샤 | Photosensitive resin composition, photosensitive element, method for forming resist pattern, and method for producing printed wiring board |
| JP6229256B2 (en) * | 2011-10-31 | 2017-11-15 | 日立化成株式会社 | Photosensitive element, resist pattern forming method, and printed wiring board manufacturing method |
| JP2014081456A (en) * | 2012-10-16 | 2014-05-08 | Sanyo Chem Ind Ltd | Photosensitive resin composition, cured product and spacer |
| KR20170028016A (en) * | 2015-09-03 | 2017-03-13 | 동우 화인켐 주식회사 | Negative-type photosensitive resin comopsition and photocurable pattern forming by the same |
| DE102015119939A1 (en) | 2015-11-18 | 2017-05-18 | ALTANA Aktiengesellschaft | Crosslinkable polymeric materials for dielectric layers in electronic components |
| KR20220110775A (en) * | 2019-12-02 | 2022-08-09 | 에네오스 가부시키가이샤 | Alicyclic acrylate compound, alicyclic epoxy acrylate compound, curable composition and cured product |
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| JP4706847B2 (en) * | 2005-03-02 | 2011-06-22 | Jsr株式会社 | Radiation sensitive resin composition and spacer for liquid crystal display element |
| TWI383253B (en) * | 2005-03-02 | 2013-01-21 | Jsr Corp | Sensitive linear resin composition and spacers for liquid crystal display elements |
| JP2007148366A (en) * | 2005-10-25 | 2007-06-14 | Hitachi Chem Co Ltd | Liquid crystal spacer and method for manufacturing the same |
| JP2007199685A (en) * | 2005-12-28 | 2007-08-09 | Fujifilm Electronic Materials Co Ltd | Photocuring coloring composition, color filter, and liquid crystal display device |
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