TW200907567A - Photosensitive polyamic ester composition - Google Patents
Photosensitive polyamic ester composition Download PDFInfo
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- TW200907567A TW200907567A TW097112401A TW97112401A TW200907567A TW 200907567 A TW200907567 A TW 200907567A TW 097112401 A TW097112401 A TW 097112401A TW 97112401 A TW97112401 A TW 97112401A TW 200907567 A TW200907567 A TW 200907567A
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L79/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing nitrogen with or without oxygen or carbon only, not provided for in groups C08L61/00 - C08L77/00
- C08L79/04—Polycondensates having nitrogen-containing heterocyclic rings in the main chain; Polyhydrazides; Polyamide acids or similar polyimide precursors
- C08L79/08—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G73/00—Macromolecular compounds obtained by reactions forming a linkage containing nitrogen with or without oxygen or carbon in the main chain of the macromolecule, not provided for in groups C08G12/00 - C08G71/00
- C08G73/06—Polycondensates having nitrogen-containing heterocyclic rings in the main chain of the macromolecule
- C08G73/10—Polyimides; Polyester-imides; Polyamide-imides; Polyamide acids or similar polyimide precursors
- C08G73/16—Polyester-imides
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0388—Macromolecular compounds which are rendered insoluble or differentially wettable with ethylenic or acetylenic bands in the side chains of the photopolymer
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- H10P14/683—
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- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Macromonomer-Based Addition Polymer (AREA)
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Abstract
Description
200907567 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種感光性聚醯胺酸酯組合物,其成為用 作半導體裝置之表面保護膜、層間絕緣膜的耐熱性樹脂之 前驅物,能夠在低溫下硬化,且可提供具有高耐熱性及耐 化學藥品性之硬化凹凸圖案。又,本發明係關於一種使用 该感光性聚醯胺酸酯組合物之具有耐熱性的硬化凹凸圖案 之製造方法、具有該硬化凹凸圖案而形成之半導體裝置、 及與包含該硬化凹凸圖t之層相接且設彳包含鈦或紹之金 屬層的積層體。 【先前技術】 聚醯亞胺樹脂由於具有較高之熱穩定性及化學穩定性、 較低之介電常數、及優異之平坦化能力,故作為微電子相 關之材料用途而備受矚目,廣泛地用作半導體之表面保護 膜或層間絕緣膜、或多晶片模組等之材料。 使用聚醯亞胺樹脂製造半導體裝置時,通常在基材上形 成聚醯亞胺樹脂膜’再制光微影(丨ith。㈣phy)技術形成 所需之圖案。具體而言,使用如下間接圖案形成方法:使 用光阻劑及光罩於聚醯亞胺樹脂膜上形成光阻劑之圖案, 其後利用㈣1進行聚醯亞胺樹脂之圖案化。然而該方法 中,必須首先在聚醯亞胺樹脂膜上形成作為光罩之光阻劑 圖案接著進仃聚醯亞胺樹脂之蝕刻,最後將無用之光阻 劑圖案剝離’故步驟較為複雜,進而’由於係間接圖案形 成步驟’故解析度較低。又’钮刻時必須使用耕此類有毒 130388.doc 200907567 物質作為溶劑,故安全性亦存在問題。 人:克服如上所述之問題’而將如下方法實用化:將光聚 二义之感光基導入至聚醯亞胺前驅物中’直接形成聚醯亞 “驅物膜之圖案。例如’提出有如下方法等:首先,利 用感光性聚醯亞胺前驅物組合物來形成膜,該感光性聚酿 亞胺則驅物組合物含有:使具有雙鍵之化合物經由醋鍵、 酿胺鍵或離子鍵等與聚酿胺酸鍵結而形成的聚醯亞胺前驅 物以及光起始劑等。繼而,利用經由具有圖案之光軍對該 膜進行曝光而使上述塗膜之曝光部分的聚醯亞胺前驅物不 溶的手段來形成圖案,再施以顯影處理。其後,進行加熱 而將感光基成分除去,藉此將聚醯亞胺前驅物轉變為具有 熱%定性之聚醯亞胺(參照非專利文獻”。 /玄技術一般被稱為感光性聚醯亞胺技術。利用該技術, 可克服上述使用先前之非感光性聚醯亞胺前驅物之製程所 伴有的問題。因此,硬化凹凸圖案之形成係利用上述感光 性聚醯亞胺技術而進行之情況正在增多。 再者’半導體裝置(以下亦稱為「元件」)係視目的而用 各種方法封裝於印刷基板。通常之元件一般係藉由以細導 7自7L件之外部端子(烊墊)連接至導線架的打線接合法而 2作而在推進兀件之高速化、動作頻率達到GHZ之現 7封裝令之各端子間之配線長度之差異會影響元件之動 乍口此,對於尚端用途之元件之封裝而言,必須正確地 控制封裝配線之長度,打線接合無法滿足此要求。 因此’提出如下覆晶封裝··於半導體晶片之表面形成再 I30388.doc 200907567 配線層’於其上形成凸塊(電極),將晶片倒裝(fup)而直接 封裝於印刷基板。覆晶封袭可正喊地控制配線距離,故可 用於處理高速訊號之高端用途之元件,且由於封裝尺寸較 小故可用於行動電話等,其需要正在急遽擴大。於覆晶封 裝中使用聚醢亞胺之情形時,聚醯亞胺層在圖案形成後要 經由高溫下之光阻劑剝離步驟,A卜丁丨等金屬配線層之形 成及蝕刻步驟,焊錫電極形成(回焊)等步驟。因此,對於 用作再配線層之材料的感光性聚醯亞胺樹脂而言,必須具 備優異之圖案形成性及耐熱性,此外亦必須具備對上述各 步驟中使用之光阻劑剝離液、金屬㈣液、清洗劑等各種 化學品之耐化學藥品性。 近年來,由於元件結構之微細化及複合化,無法實施高 溫處理之元件逐漸增多。該等元件在封裝於基板時,若施 加28(TC左右之溫度則成品率會顯著下降。然而,對於先 刖多數之感光性聚醯亞胺而言,為表現出耐化學藥品性, 必須使之在35〇t以上之溫度下硬化。但最近,亦提出有 藉由低溫可進行硬化之感光性聚醯亞胺前驅物組合物,例 如,專利文獻1中提出有於25(TC下使如下聚醯胺酸酯加熱 硬化2小時而成之硬化膜,該聚醯胺酸酯將均苯四甲酸二 酐及4,4 -氧雙鄰苯二甲酸二酐作為四羧酸之原料,且將間 胺及對本一胺作為一胺之原料。然而,如後述比較例 所示’邊感光性聚醯亞胺前驅物組合物於2 8 〇以下之低 下進行硬化時,無法形成作為再配線層材料之具有充分 向水準之耐熱性及耐化學藥品性的硬化圖案。 J30388.doc 200907567 [專利文獻1]曰本專利特開2〇〇5-99353號公報 [非專利文獻1]山岡.表著,「p〇ly file」,1990年,第27 卷,第2號,第14~18頁 【發明内容】 * [發明所欲解決之問題] . 本發明之目的在於提供一種於28CTC以下之低溫下能夠 進行硬化、且可&供兼具高耐熱性及耐化學藥品性之硬化 < 凹凸圖案的感光性聚醯胺酸酯組合物,使用該感光性聚醯 、胺酸酯組合物之硬化凹凸圖案之形成方法,及具有該硬化 凹凸圖案而形成之半導體裝置。 [解決問題之技術手段] 為解決上述課題,本發明者等人發現,藉由使用包含僅 由特定重複單元構成之聚醯胺酸酯、光起始劑及溶劑的感 光性聚醯胺酸酯組合物,可獲得一種能夠在低溫下進行硬 化、且可提供兼具高耐熱性及耐化學藥品性之硬化凹凸圖 案的感光性聚醯胺酸酯組合物。本發明係根據上述新見解 研發而成者。 亦即’本發明係如下所述者。 L一種感光性聚醯胺酸酯組合物,其特徵在於,相對於 100質置份之僅由以下述通式(1)表示之重複單元構成的聚 I胺酸S曰(Α),含有卜40質量份之光起始劑(Β)、3〇〜15〇〇 、量伤之;谷劑(c)、及〇〜丨5〇質量份之僅由以下述通式(2)表 示之重複單元構成的聚醯胺酸酯(D)。 130388.doc 200907567 [化π[Technical Field] The present invention relates to a photosensitive polyphthalate composition which is used as a heat-resistant resin precursor for a surface protective film and an interlayer insulating film of a semiconductor device. It can be hardened at a low temperature, and can provide a hardened concave-convex pattern having high heat resistance and chemical resistance. Further, the present invention relates to a method for producing a heat-resistant cured concave-convex pattern using the photosensitive polyphthalate composition, a semiconductor device comprising the cured uneven pattern, and a method comprising the hardened concave-convex pattern t The layers are connected to each other and are provided with a laminate comprising titanium or a metal layer. [Prior Art] Polyimine resin has attracted attention as a material for microelectronics due to its high thermal stability and chemical stability, low dielectric constant, and excellent planarization ability. It is used as a material for a surface protection film or an interlayer insulating film of a semiconductor, or a multi-wafer module or the like. When a semiconductor device is fabricated using a polyimide resin, a polyimine resin film is usually formed on a substrate to produce a desired pattern by a photorefraction (丨ith. (4) phy) technique. Specifically, an indirect pattern forming method is employed in which a pattern of a photoresist is formed on a polyimide film by using a photoresist and a photomask, and then patterning of the polyimide resin is carried out by using (4). However, in this method, it is necessary to first form a photoresist pattern as a photomask on the polyimide film and then etch the polyimide film, and finally peel off the useless photoresist pattern. Further, 'the indirect pattern forming step' is low in resolution. Also, when using the button, you must use the toxic 130388.doc 200907567 substance as a solvent, so there are problems with safety. Human: Overcoming the problem as described above] The following method was put into practical use: introducing a photopolymerizable group of photopolymerization into a polyimine precursor, which directly forms a pattern of a polyimide film. For example, The following method or the like: First, a film is formed by using a photosensitive polyimide intermediate composition comprising: a compound having a double bond via a vinegar bond, an amine bond or an ion a polyimide or the like which is formed by binding a polyacrylamide to a polyacrylamide precursor, a photoinitiator, etc. Then, the exposed portion of the coating film is exposed by exposure to the film by a pattern of light. The imine precursor is insoluble to form a pattern, and then subjected to development treatment. Thereafter, heating is performed to remove the photosensitive group component, thereby converting the polyimine precursor into a heat-qualifying polyimine ( Refer to the non-patent literature. / / Xuan technology is generally referred to as photosensitive polyimide technology. With this technology, the problems associated with the above-mentioned process of using the non-photosensitive polyimide intermediate precursor can be overcome. hardening The formation of the convex pattern is increasing by the above-described photosensitive polyimide technology. Further, the semiconductor device (hereinafter also referred to as "element") is packaged on a printed circuit board by various methods depending on the purpose. Generally, by the wire bonding method in which the thin guide 7 is connected to the lead frame from the external terminal (the pad) of the 7L piece, the high speed of the pusher element and the operation frequency reach the GHZ. The difference in the length of the wiring between the components will affect the dynamic opening of the component. For the package of the component for the other end, the length of the package wiring must be correctly controlled, and the wire bonding cannot meet this requirement. Therefore, the following flip chip package is proposed. Forming a surface of the semiconductor wafer again I30388.doc 200907567 The wiring layer 'forms a bump (electrode) thereon, and flips the wafer directly onto the printed substrate. The chipping can control the wiring distance Therefore, it can be used for processing high-end components of high-speed signals, and because of its small package size, it can be used for mobile phones, etc., and its needs are rapidly expanding. In the case of using polyimine in the package, the polyimide layer is formed by a photoresist stripping step at a high temperature after pattern formation, a metal wiring layer such as Ab, and an etching step, and a solder electrode is formed (back). Therefore, the photosensitive polyimide resin used as the material of the rewiring layer must have excellent pattern formability and heat resistance, and must also have the photoresist used in each step described above. In recent years, due to the miniaturization and compositing of the device structure, the number of components that cannot be subjected to high-temperature processing has gradually increased. These components are packaged on the substrate. If a temperature of about 28 TC is applied, the yield will be significantly lowered. However, for the majority of photosensitive polyimides, in order to exhibit chemical resistance, it is necessary to make the temperature above 35 〇t. Harden under. Recently, however, there has also been proposed a photosensitive polyimide intermediate precursor composition which can be cured by low temperature. For example, Patent Document 1 proposes to heat-harden the following polyglycolate for 2 hours at 25 °C. a cured film comprising pyromellitic dianhydride and 4,4-oxydiphthalic dianhydride as a raw material of a tetracarboxylic acid, and using the meta-amine and the monoamine as a raw material of the amine However, when the "photosensitive polyimide" precursor composition is cured at a low temperature of 28 Å or less as shown in the comparative example described later, it is impossible to form a sufficient level of heat resistance and chemical resistance as a material of the rewiring layer. J30388.doc 200907567 [Patent Document 1] Japanese Patent Laid-Open Publication No. Hei 2-5-99353 [Non-Patent Document 1] Yamaoka. Table, "p〇ly file", 1990, pp. 27, No. 2, pp. 14-18 [Invention] [The problem to be solved by the invention] The object of the present invention is to provide a hardening at a low temperature of 28 CTC or less, and to provide both High heat resistance and chemical resistance hardening < The photopolymerizable polyacetate composition is a method for forming a cured polycondensate pattern of the photosensitive polyfluorene and the amine ester composition, and a semiconductor device comprising the cured concavo-convex pattern. [Technical means for solving the problem] In order to solve the above problems, the inventors of the present invention have found that by using a photosensitive polyphthalate composition containing a polyphthalate, a photoinitiator, and a solvent composed only of a specific repeating unit, it is possible to obtain a A photosensitive polyphthalate composition which is hardened at a low temperature and which provides a hardened concave-convex pattern having both high heat resistance and chemical resistance. The present invention has been developed based on the above-mentioned new findings. It is as follows. L. A photosensitive polyphthalate composition characterized by having a polyimido acid S曰 composed only of a repeating unit represented by the following general formula (1) with respect to a 100-mass fraction. (Α), containing 40 parts by mass of photoinitiator (Β), 3〇~15〇〇, amount of wound; gluten (c), and 〇~丨5〇 by mass of the following formula (2) Polyurethane composed of repeating units D). 130388.doc 200907567 [of π
(V 雙鍵之一償 示之四價芳 既可單獨使 ” +⑽.9,r2為具有 基,既可相同亦可不同。〜下 香族基、或以下述式矣一 a 飞(4)表不之四價芳香族基, 用亦可混合使用2種。 [化2] (3)(The quaternary aryl of one of the V double bonds can be used alone to make "+(10).9, r2 has a base, which can be the same or different. ~ Lower scent base, or fly with the following formula (4 ) It is not a tetravalent aromatic group, and it can be used in combination with two types. [Chemical 2] (3)
XXXX
[化3][Chemical 3]
[化4] X2為以下述式(5)表 (4) 不之四價芳香族基。 Χτχχ γ及γ2為以下述通式(6)表 同亦可不同。 [化5] 不之X2 is a tetravalent aromatic group which is not represented by the following formula (5) (4). Χτχχ γ and γ2 may be expressed by the following general formula (6). [化5] No
(5) 價芳香族J ,既可相(5) Aromatic aromatic J, which can be phased
130388.doc (6) 10- 200907567 (A、B、 n 、D、E為氫原子或碳數1〜4之一僧& # 可相同亦兄π 價知肪族基,既J不同。)) [化6]130388.doc (6) 10- 200907567 (A, B, n, D, E are hydrogen atoms or one of the carbon numbers 1~4 僧&# can be the same as the brother π valence of the aliphatic group, which is different from J.) ) [Chem. 6]
\\ 〇 u y II I y一一LL II ii〜0R3 ο ο (2) (R為具有歸烴性雙鍵之Λ J 之四價芳香族基。 土 x為以下述式(7)表 [化 7] " 不 Χ>χχ γ3為以下述式⑻表 ⑺ [化8] 示之二價芳香族基 > 2·如上述1所述之感 ⑻ 及Y2表示之 性聚醯胺酸酯組合物,其中以… 二價芳香族基。 胥族基為以下述式(9)或(10)表示之 [化9]\\ 〇uy II I y LL II ii~0R3 ο ο (2) (R is a tetravalent aromatic group having a hydrogenated double bond Λ J. The soil x is expressed by the following formula (7) 7] "不Χ> γ γ3 is a divalent aromatic group represented by the following formula (8) (7) [Chemical Formula 8] > 2. The polyglycolate combination represented by the above (1) and Y2 a divalent aromatic group. The steroid group is represented by the following formula (9) or (10) [Chemical 9]
HiC 4 130388.doc (9) 200907567 [化 ίο]HiC 4 130388.doc (9) 200907567 [化 ίο]
3·如上述1至2中任一項所述之感光性聚醯胺酸酯組合 物’其中此感光性聚醯胺酸酯組合物進一步含有2〜4〇質量 份之交聯劑。 4. 如上述3所述之感光性聚醯胺酸酯組合物,其中上述 交聯劑為烷氧基甲基化三聚氰胺化合物。 5. —種硬化凹凸圖案之形成方法’其特徵在於包括:塗 佈步驟’以塗佈層之形態於基板上形成如上述1至4中任一 項所述之感光性聚醯胺酸酯組合物;曝光步驟,經由光罩 利用光化射線對該塗佈層進行曝光,或者對該塗佈層直接 照射光線、電子射線、或離子射線;顯影步驟,用顯影液 將该曝光部或該照射部溶出除去;以及加熱步驟,對所獲 得之凹凸圖案進行加熱。 6. —種半導體裝置,其係具有藉由如上述5所述之形成 方法所獲得之硬化凹凸圖案而形成者。 7. —種積層體,其特徵在於具有:含有使如上述1至4中 任一項所述之感光性聚醯胺酸酯組合物硬化而形成之硬化 凹凸圖案的層、及與該層相接之選自由鈦及㈣組成之群 中的至少一種之金屬層。 8. -種積層體之製造方法,其特徵在於包括:將如上述 1至4中任-項所述之感光性聚醯胺酸ι组合物塗佈於基材 上並進行乾燥,藉此於該基材上形成塗膜之步驟;經由具 130388.doc 200907567 對該塗膜照射紫外線之步驟:用顯 該夷材上/ 纟將β塗膜之未光的部分除去而於 成凹凸圖案之步驟;對該凹凸圖案進行加熱, 曰於該基材上形成包含由聚醯亞胺樹脂構叙硬化凹凸 :案:層的步驟,1用選自氬氣、氧氣、及四氣化碳中之 Ί氣體對該層之表面進行乾心刻處理之步驟;以 及亥層相接而形成選自由鈦及鋁所組成之群中的至少一 種之金屬層之步驟。 [發明之效果] 根據本發明,可提供一種能夠在280°C以下之溫度下硬 化、且可提供兼具高耐熱性及耐化學藥品性之硬化凹凸圖 案之感光性聚醯胺酸酯組合物,及使用該感光性聚醯胺酸 醋組合物之積層體及其製造方法。 【實施方式】 以下’就本發明之實施形態加以詳細說明。 <感光性聚醯胺酸酯組合物> (A)聚醯胺酸酯 作為聚醯胺酸酯,可使用僅由以下述通式(1)表示之重 複單元構成的聚醯胺酸酯。 [化 11]The photosensitive polyamine amide composition according to any one of the above 1 to 2 wherein the photosensitive polyamine amide composition further contains 2 to 4 parts by mass of a crosslinking agent. 4. The photosensitive polyamidate composition according to the above 3, wherein the crosslinking agent is an alkoxymethylated melamine compound. 5. A method of forming a hardened concave-convex pattern, characterized by comprising: a coating step of forming a photosensitive polyamidite combination according to any one of the above 1 to 4 on a substrate in the form of a coating layer. Exposure step of exposing the coating layer by actinic rays through a photomask, or directly irradiating the coating layer with light, electron rays, or ion rays; developing step, using the developing solution to expose the exposed portion or the irradiation The portion is stripped and removed; and the heating step is performed to heat the obtained concavo-convex pattern. A semiconductor device comprising a hardened concave-convex pattern obtained by the method of forming according to the above 5. 7. A layered body comprising: a layer containing a hardened concave-convex pattern formed by curing the photosensitive polyamine amide composition according to any one of 1 to 4 above, and a layer A metal layer selected from at least one of the group consisting of titanium and (d). 8. A method for producing a laminated body, comprising: applying a photosensitive polyamido oxime composition according to any one of items 1 to 4 above to a substrate and drying the mixture; a step of forming a coating film on the substrate; and irradiating the coating film with ultraviolet rays by means of 130388.doc 200907567: removing the unpolished portion of the β coating film by using the material on/off to form a concave-convex pattern Heating the concave-convex pattern to form a step comprising: structuring the hardened surface layer by the polyimide resin, and using a layer selected from the group consisting of argon gas, oxygen gas, and tetra-carbonized carbon; a step of dry-engraving the surface of the layer by the gas; and a step of forming the metal layer of at least one selected from the group consisting of titanium and aluminum. [Effects of the Invention] According to the present invention, it is possible to provide a photosensitive polyamidate composition which can be cured at a temperature of 280 ° C or lower and which can provide a hardened concave-convex pattern having both high heat resistance and chemical resistance. And a laminate using the photosensitive polyacetal vinegar composition and a method for producing the same. [Embodiment] Hereinafter, embodiments of the present invention will be described in detail. <Photosensitive Polyurethane Composition> (A) Polyphthalate As the polyphthalate, a polyamine which is composed only of a repeating unit represented by the following formula (1) can be used. . [化11]
0 00 0
C*- - OfOC*- - OfO
(1) 130388.doc •13- 200907567 (〇.3.m/(m + n)^〇9aR^^ 基,既可相同亦可不同。χ1 ‘/、有烯烴性雙鍵之一價 香族基、或以下述 ^下述式(3)表示之四價芳 〜㈠表示之四僧 用亦可混合使用2種。 1貝方香族基,既可單獨使 [化 12] (3)(1) 130388.doc •13- 200907567 (〇.3.m/(m + n)^〇9aR^^ base, which may be the same or different. χ1 '/, one of the olefinic double bonds The base group or the tetravalent aryl group represented by the following formula (3) may be used in combination with the above-mentioned four groups. 1 Bayer fragrant group, either alone (12) (3)
[化 13][Chem. 13]
X>XiC Y1 及 γ2Α (5) 、以下述通式(6)表示之二價芳香族基,既可相 同亦可不同。 [化 15]X>XiC Y1 and γ2Α (5) The divalent aromatic group represented by the following formula (6) may be the same or different. [化15]
⑹ Ε為氫原子或碳數1〜4之一價脂肪族基,既 可相同亦 上述聚 之均苯四 可不同。)) 隨胺酸酯中,其重複單元中之X1基源自用作原料 甲峻二酐或3,3,,4,4,-聯苯四甲酸二酐,該等既可 130388.doc -14- 200907567 單獨使用亦可混合使用2種 雙鄰苯二甲酸二酐。 X2基源自用作原料之4,4'_氣(6) The hydrazine is a hydrogen atom or a monovalent aliphatic group having 1 to 4 carbon atoms, which may be the same or different. )) In the case of the amine acid ester, the X1 group in the repeating unit is derived from the use as a raw material for the methyl dianhydride or the 3,3,4,4,-biphenyltetracarboxylic dianhydride, which may be 130388.doc - 14- 200907567 Two kinds of bisphthalic dianhydride can also be used in combination. The X2 base is derived from the 4,4'-gas used as a raw material.
聚醯胺酸障)之合成,通常可較好地使用將進行後述四 羧酸二酐之酯化反應所獲得之四羧酸二酯直接供給於與二 胺之縮合反應的方法。 上述4酿胺酸醋中,盆重溢留-士 ,、亶複早凡中之γ1及Υ2基源自用作 原料之芳香族二胺。作為該芳 万晋族一胺之例,可列舉1 4 苯二胺、2-甲基-1,4-苯二胺、25 -甲萁1/(奸 ’ 收2,5_—甲基-l,4-苯二胺、 2,3,5_三曱基-1 4-苯二胺、2 3 4 < ™田甘, 收Ζ,3,4,5-四曱基-1,4-苯二胺等, 其中,作為較好之例,可列舉14_苯二胺、2,5_二甲基 1,4-苯二胺等。該等既可單獨使用亦可混合使用2種以上。 上述四羧酸二酐之醋化反應所使用之醇類,係具有稀烴 性雙鍵之醇。具體可列舉2_甲基丙烯醯氧基乙醇、2_丙^ 醯氧基乙#、1-丙烯醯氧基_2·丙醇、2_甲基丙烯醯胺乙 醇、2-丙烯醯胺基乙醇、羥甲基乙稀基酮、2_羥基乙基乙 烯基酮、甲基丙烯酸2-羥基乙酯、丙烯酸2_羥基丙酯、甲 基丙烯酸2-羥基丙酯、丙烯酸2_羥基丁酯、f基丙烯酸2_ 羥基丁酯、丙烯酸2_羥基_3_甲氧基丙酯、甲基丙烯酸2_羥 基-3-曱氧基丙酯、丙烯酸2_羥基_3_丁氧基丙酯、曱基丙 烯酸2-羥基-3-丁氧基丙酯、丙烯酸2-羥基_3_苯氧基丙酯、 甲基丙浠酸2-經基-3-苯氧基丙酯、丙婦酸2-經基_3_第三丁 氧基丙酯、甲基丙烯酸2-羥基-3-第三丁氧基丙酯、丙烯酸 2-羥基-3-環己基烷氧基丙酯、甲基丙烯酸2·羥基_3_環己氧 基丙@曰、丙稀酸2 -經基-3-環己氧基丙g旨、鄰苯二甲酸2_甲 130388.doc •15· 200907567 基丙稀醢氧基乙基酯2_羥基丙酯、鄰苯二甲酸2_丙歸醯氧 基乙基酯2-羥基丙酯、甘油二丙烯酸酯、甘油二甲基丙烯 酸酯等,但並不限定於該等醇。該等醇類可單獨使用或混 合使用2種以上。 又,如曰本專利特開平6-80776號公報所記載,上述具 有烯烴性雙鍵之醇中,亦可混合使用一部分甲醇、乙醇、 正丙醇、異丙醇及烯丙醇等。 fIn the synthesis of the polyglycolic acid barrier, a method in which a tetracarboxylic acid diester obtained by carrying out an esterification reaction of a tetracarboxylic dianhydride described later is directly supplied to a condensation reaction with a diamine can be preferably used. Among the above 4-brown acid vinegars, the γ1 and Υ2 groups of the pots are overflowing from the sulphate, and the γ1 and Υ2 groups are derived from the aromatic diamine used as a raw material. As an example of the aromatic amine of the aromatic group, it is exemplified by 1 4 phenylenediamine, 2-methyl-1,4-phenylenediamine, 25-methyl hydrazine 1/( ' ' 收 2,5_-methyl-l , 4-phenylenediamine, 2,3,5-tridecyl-1 4-phenylenediamine, 2 3 4 < TM Tian Gan, Ζ, 3,4,5-tetradecyl-1,4- Examples of the phenylenediamine include, for example, 14-phenylenediamine and 2,5-dimethyl 1,4-phenylenediamine. These may be used alone or in combination of two or more. The alcohol used in the vinegarization reaction of the above tetracarboxylic dianhydride is an alcohol having a dilute hydrocarbon double bond, and specific examples thereof include 2-methylpropenyloxyethanol and 2-propylpropaneoxyethyl #. 1-propenyloxy-2-propanol, 2-methylpropenylamine ethanol, 2-propenylaminoethanol, methylol ketone, 2-hydroxyethyl vinyl ketone, methacrylic acid 2 -hydroxyethyl ester, 2-hydroxypropyl acrylate, 2-hydroxypropyl methacrylate, 2-hydroxybutyl acrylate, 2-hydroxybutyl acrylate, 2-hydroxy-3-methoxypropyl acrylate, A 2-Hydroxy-3-decyloxypropyl acrylate, 2-hydroxy_3_butoxypropyl acrylate, 2-hydroxy-3-butoxy methacrylate Ester, 2-hydroxy-3-phenoxypropyl acrylate, 2-carbyl-3-phenoxypropyl methacrylate, 2-glycosyl 3-glycidylpropyl propylate , 2-hydroxy-3-t-butoxypropyl methacrylate, 2-hydroxy-3-cyclohexyl alkoxypropyl acrylate, 2-hydroxyl_3_cyclohexyloxypropane@曰, Acrylic acid 2-carbyl-3-cyclohexyloxypropyl phthalate, phthalic acid 2_甲130388.doc •15· 200907567 propylene methoxyethyl ester 2 hydroxypropyl ester, phthalic acid Formic acid 2_propyl methoxyethyl ester 2-hydroxypropyl ester, glycerin diacrylate, glycerin dimethacrylate, etc., but is not limited to such alcohols. These alcohols may be used alone or in combination 2 In the alcohol having an olefinic double bond, a part of methanol, ethanol, n-propanol, isopropanol, allyl alcohol, etc. may be used in combination, as described in JP-A-6-80776. f
I 理論上,四羧酸酸二酐之酯化反應所使用之醇類的量, 相對於四缓酸二酐U當量為當量(例如,係指相對於】 莫耳之四羧酸二酐添加2莫耳之醇類),於本發明中,若相 對於1.0當量之四幾酸二酐使社G1〜11()#量之醇來人成 四叛酸二醋’則最終獲得之感光性聚醯胺酸I組合物:保 存穩定性得到提高,因此較好。 對於本發明之組合物而言,葬 叩。错由使上述特定之四羧酸二 醋與特定之二胺縮合而成的聚酿脸舻 J取醞夂酯(A),於280〇C以下 之低溫下可進行硬化,且可取楫 J取侍耐熱性 '耐化學藥品性與 其他性能之平衡。 聚酿胺酸醋⑷之合成所使用的四㈣二_二胺 耳比’較好的是1.0 : 1.0左右,日祕 、 畏 根據目標聚醯胺酸酯(A) 之刀子篁而在Η 0.7〜…·3之範圍内使用。 關於本發明中使用之聚醯胺酸 日之具體合成方法 可採用先前公知之方法。就此而令 σ成万法 日日袖 ^ ° 例如可列舉:國際公 開第00Μ3439號小冊子所示之將四 国際么 羧酸二酯二醯氣,於鹼性化人物 日暫且轉變為四 之存在下將該四羧酸二酯 130388.doc • 16 - 200907567 二酿氣及二胺供給於縮合反應,來製造聚醯胺酸酯(A)之 方法;以及藉由在有機脫水劑之存在下將四羧酸二醋及二 胺供給於縮合反應之方法來製造聚醯胺酸酯(A)的方法。 作為有機脫水劑之例,可列舉二環己基碳化二亞胺 (DCC)、二乙基碳化二亞胺、二異丙基碳化二亞胺、乙基 %己基奴化二亞胺、二苯基碳化二亞胺、丨乙基二 甲基胺基丙基)碳化二亞胺、丨_環己基_3_(3_二甲基胺基丙 基)碳化二亞胺鹽酸鹽等。 本發明中,僅由以下述通式⑴表示之重複翠元構成的 聚醯胺酸醋之m/(m+n)較好的是處於〇·3〜〇9之㈣,更好 的是處於0·4〜0.8之範圍。當m/(m+n)為 0 · 3以上時耐化學 藥扣!·生提回,當m/(m + n)為09以下時凹凸圖案之解析性 能提向。 本月中使用之聚醯胺酸酯(A)之重量平均分子量較好 的疋8000〜150000,更好的是9咖〜谓⑼。當重量平均分 子量為8000以上昧嬙w 吋機械物性提高,當重量平均分子量 1 50000以下時於顯# 、.‘,、員办液中之分散性變好,凹凸 性能提高。 所啊 (B )光起始劑 作為光起始劑,存丨 甲酸甲酿、…二可使用:二苯甲酮、鄰苯甲醯基苯 及第_等二苯C基二苯基酮、二苯甲基鋼、 ^ 〇 τ生物;2,2丨-二乙氧基笨乙酮、及2鉍 基-2-曱基苯丙_等 及經 或戚本乙網衍生物;1-羥基環己基笨基酮· 噻噸酮,2-曱基嘍 不丞剩, 明' 異丙基嘆嘴酮、及二乙基嘆嘲 130388.doc 200907567 昨塞㈣衍,苯偶酿、节基二甲基、_、及…_ 甲氧基乙縮醛等苄基衍生物丨安良 私…& u甲醚等安息香衍生 物’ 2,6-一 (4-二疊氮苯亞甲基)_4甲基環己_、及“,二 …二疊氛苯亞甲基)環己_等疊氮類;}•笨基丁,一_ 導甲氧基幾基)肪、苯基丙二酮·2_(〇_甲氧基^基)- 肟、1_本基丙二明_2_(〇-乙氧基幾基)將、1-苯基丙二酮_2_ ⑴-苯二醯基m、!,3_二苯基丙三酮_2_(〇_乙氧基幾基)I theoretically, the amount of the alcohol used in the esterification reaction of the tetracarboxylic acid dianhydride is equivalent to the U equivalent of the tetrasulphuric acid dianhydride (for example, refers to the addition of the tetracarboxylic dianhydride relative to the molar) 2 mol alcohols), in the present invention, if compared with 1.0 equivalent of tetraacid dianhydride, the G1~11()# amount of alcohol is made into four resorcinic diacetates', and finally the photosensitivity is obtained. The polyaminic acid I composition is preferred because it has improved storage stability. For the composition of the present invention, it is buried. The styrene ester (A) obtained by condensing the above specific tetracarboxylic acid diacetate with a specific diamine can be hardened at a low temperature of 280 ° C or lower, and can be taken as 楫J Heat resistance 'balance of chemical resistance and other properties. The tetrakis(di)di-diamine ear ratio used for the synthesis of poly-branched vinegar (4) is preferably about 1.0:1.0, and the eclipse according to the target polyglycolate (A) is at Η 0.7. Use within the range of ~...·3. Regarding the specific synthesis method of the polyglycolic acid used in the present invention, a previously known method can be employed. In this case, σ 万 万 日 ^ ^ ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° ° a method for producing a polyglycolate (A) by supplying the tetracarboxylic acid diester 130388.doc • 16 - 200907567 and a diamine to a condensation reaction; and by using four in the presence of an organic dehydrating agent A method in which a carboxylic acid diacetate and a diamine are supplied to a condensation reaction to produce a polyphthalate (A). Examples of the organic dehydrating agent include dicyclohexylcarbodiimide (DCC), diethylcarbodiimide, diisopropylcarbodiimide, ethylhexyl quinolamine, and diphenylcarbamate. Diimine, decyl dimethylaminopropyl propyl carbodiimide, 丨-cyclohexyl _3_(3-dimethylaminopropyl) carbodiimide hydrochloride, and the like. In the present invention, the m/(m+n) of the polyamido vinegar composed only of the repeating formula represented by the following general formula (1) is preferably (4) in the range of 〇·3 to 〇9, more preferably in the The range of 0·4~0.8. When m/(m+n) is 0 · 3 or more, it is resistant to chemical deduction! • The raw material is lifted back. When m/(m + n) is 09 or less, the resolution of the concave-convex pattern can be raised. The polyglycolate (A) used in this month has a weight average molecular weight of 疋 8000 〜 150,000, and more preferably 9 咖 ~ (9). When the weight average molecular weight is 8000 or more, 吋w 吋 mechanical properties are improved, and when the weight average molecular weight is 15,000 or less, the dispersibility in the aging solution is improved, and the unevenness is improved. (B) photoinitiator as a photoinitiator, indole formic acid, ... can be used: benzophenone, o-benzhydrylbenzene and di-diphenyl C-diphenyl ketone, Diphenylmethyl steel, ^ 〇τ bio; 2,2 丨-diethoxy acetophenone, and 2 fluorenyl-2-mercapto phenyl propyl ketone and the hydrazine derivative; 1-hydroxycyclohexyl Stupid ketone · thioxanthone, 2-mercaptopurine, no residue, isopropyl isopropyl ketone, and diethyl sneak 130388.doc 200907567 Yesterday (four), benzene, benzyl , _, and ... benzyl derivatives such as methoxy acetal 丨 Anliang private ... & U methyl ether and other benzoin derivatives ' 2,6-mono (4-diazidobenzylidene) _4 methyl Cyclohexene _, and ", two ... two stacks of benzylidene" cyclohexyl _ azide;} • stupid, one _ methoxy group) fat, phenyl propylene dione · 2 _ ( 〇 _ methoxy group -), _, 1_本基丙二明_2_(〇-ethoxymethyl), 1-phenylpropanedione_2_(1)-benzodiazepine m, !, 3_diphenylpropanetrifluoride_2_(〇_ethoxyoxy)
肟、1-本基-3.乙氧基丙三_·2_(〇·苯甲醯基)蔣等厢類;N_ 苯基甘胺酸等N-芳基甘胺酸類;過氧化苯甲醯等過氧化物 類;芳香族聯㈣類;以及二茂鈦類等’就厚膜之硬化性 及光敏度之觀點而言,較好的是上述肟類。 該等光起始劑之添加4,相對於1〇〇質量份聚酿胺酸醋 (A)較好的是卜仂質量份,更好的是2〜2〇質量份。藉由相 對於100質量份聚醯胺酸酯(A)添加!質量份以上之光起始 劑,而使光敏度優異,藉由添加4〇質量份以下之光起始 劑,而使厚膜硬化性優異。 (C)溶劑 作為溶劑,就相對於聚醯胺酸酯(A)及光起始劑(B)之溶 解性之觀點而言,較好的是使用極性之有機溶劑。具體可 列舉N,N-二甲基甲醯胺,N_曱基吡咯烷酮(以下亦稱為 「NMP」)、N-乙基-2-吡咯烷酮、N,N-二甲基乙醯胺、二 乙一醇一甲醚、環戊酮、γ- 丁内酯、α-乙醯基-γ- 丁内酯、 四甲基脲、1,3_ 一曱基-2-味。坐琳_、Ν-環己基- 2-°比略烧酮 等’該等可單獨使用或組合使用兩種以上。 130388.doc -18- 200907567 根據塗佈臈厚、 ψ m ^ 度,该荨溶劑可在相對於100質量份 ::酸酷質量份之範圍内使用。 穩定性發明之感光性聚醯胺酸酯組合物之保存 較好的疋用作溶劑之有機溶劑中含有醇類。 乍為可使用之醇類’若為分子内具有醇性經基 =醇,則並無特別限制,作為具體例,可列 三丁:醇、正丙醇、異丙醇、正丁醇、異丁醇、第 ,礼酸乙酯等乳酸酯類;丙二醇_ 2_甲醚、丙二醇」·乙醚 丙-%_ A)m . 丙—酵_2-乙醚、丙二醇-1-(正丙 丞)醚、丙二醇_2_(正丙基 醇甲醚、,t @基)喊等丙二醇早院基賴;乙二 畔甲秘、乙二醇乙醚、 乙—知正丙醚專單醇類;2-羥基| 丁酸酯類;乙二醇、丙- *異 %·丙一知荨二醇類。該等之中,較好 疋乳酸酯類、丙二醇單p A u β 季好的 基鱗類、2,基異丁酸醋類、乙 酵尤其更好的是穿丨酿7 刃疋礼酸乙酯、丙二醇_丨_ 乙鍵、丙二醇小(正丙基)鱗。 醇_1_ 不具有烯煙系雙鍵之醢 .5 Θ 〇 -在所有溶劑中所占之含量較好的 疋5〜50重量%,更好的是1〇〜 ^ 重I /〇。备不具有烯煙系訾 鍵之醇之含量為5重量%以ρ^ π工系雙 上時,感光性聚醯胺酸酯組人 物之保存穩定性變得良好。 ° 又,§不具有烯烴系雙鍵之 之含量為50重量%以下日本 醇 好。 S…下時’聚酿胺酸醋⑷之溶解性變得良 (D)聚酿胺酸酯 除本發明之主成分即僅 元構成的聚醯胺酸酯(A)以 由以上述通式(])表示之重複單 外,視需要,為提高組合物之 130388.doc 200907567 亦可於不損及耐熱性及 以下述通式(2)表示之聚 保存穩定性或凹凸圖案之解析度, 耐化學藥品性之範圍内,任意添加 醯胺酸酯(D)。 [化 16]肟, 1-Benzyl-3. Ethoxypropyltris-_2_(〇·Benzamethylene sulfhydryl), Jiang et al; N-arylglycines such as N-phenylglycine; Benzoyl peroxide The above-mentioned hydrazines are preferred from the viewpoints of the curability and photosensitivity of the thick film, such as the peroxides; the aromatic (four) classes; and the ferrocenes. The addition of the photoinitiator 4 is preferably a diurethane mass fraction, more preferably 2 to 2 parts by mass, based on 1 part by mass of the polyamic acid vinegar (A). By adding with respect to 100 parts by mass of polyamine (A)! The photo-initiator of the above-mentioned parts is excellent in photosensitivity, and is excellent in thick film hardenability by adding 4 parts by mass or less of the photoinitiator. (C) Solvent As a solvent, it is preferred to use a polar organic solvent from the viewpoint of solubility of the polyphthalate (A) and the photoinitiator (B). Specific examples thereof include N,N-dimethylformamide, N-decylpyrrolidone (hereinafter also referred to as "NMP"), N-ethyl-2-pyrrolidone, N,N-dimethylacetamide, and Ethyl alcohol monomethyl ether, cyclopentanone, γ-butyrolactone, α-ethinyl-γ-butyrolactone, tetramethylurea, 1,3_indolyl-2-flavor. Selenium _, Ν-cyclohexyl- 2-° thiophenone, etc. These may be used alone or in combination of two or more. 130388.doc -18- 200907567 According to the coating thickness, ψ m ^ degree, the hydrazine solvent can be used in the range of 100 parts by mass of the acidity. Preservation of the photosensitive polyamidate composition of the stability invention The organic solvent used as a solvent is preferably an alcohol. The alcohol which can be used is not particularly limited as long as it has an alcoholic base group = alcohol in the molecule, and as a specific example, it may be listed as an alcohol: n-propanol, isopropanol, n-butanol or the like. Butyl alcohol, the first ester of lactic acid esters such as ethyl ethoxide; propylene glycol _ 2 - methyl ether, propylene glycol" · diethyl ether C -% _ A) m. Propionate - 2 - diethyl ether, propylene glycol - 1 (n-propyl) Ether, propylene glycol 2_(n-propyl alcohol methyl ether, t @基) shouted propylene glycol early hospital kirai; acetaminophen, ethylene glycol ether, b- propyl ether special alcohol; 2-hydroxyl | Butyrate; ethylene glycol, C-*iso-%, propylene glycol. Among these, it is better to use lactic acid esters, propylene glycol mono p A u β, good basal scales, 2, basal isobutyric acid vinegars, and b (wheat), especially better to wear 7 疋 疋 疋 疋Ester, propylene glycol _ 丨 _ ethyl bond, propylene glycol small (n-propyl) scale. Alcohol_1_ does not have a olefinic double bond. 5 Θ 〇 - a good content in all solvents 疋 5 to 50% by weight, more preferably 1 〇 ~ ^ I / 〇. When the content of the alcohol having no olefinic hydrazine bond was 5% by weight and the ρ^ π system was double-coated, the storage stability of the photosensitive polyphthalate group was good. ° Further, § does not have a olefinic double bond content of 50% by weight or less of Japanese alcohol. In the case of S, the solubility of the polyaminic acid vinegar (4) becomes good (D) the polystyrene ester in addition to the main component of the present invention, that is, the polyamine phthalate (A) consisting only of the above formula ()) Representation of the repeating single, if necessary, to improve the composition of 130388.doc 200907567 can also be used without impairing the heat resistance and the poly-storage stability or the resolution of the concave-convex pattern represented by the following general formula (2), The glutamate (D) is optionally added within the range of chemical resistance. [Chemistry 16]
(2) X3為以下述式(7)表示(2) X3 is expressed by the following formula (7)
(R3為具有烯烴性雙鍵之一價基 之四價芳香族基。 [化 17] ⑺ Y為以下述式(8)表示之二價芳香族基 [化 18] (8) Λ胺夂5曰(D)之添加量,相對於1 00質量份聚酿胺酸酯 (Α)3較好的是添加150質量份以下,更好的是添加H00 質篁份。若添加量為150質量份以下,則不會損及耐熱性 及耐化學藥品性。 (Ε)交聯劑 乍為交和劑,在對凹凸圖案進行加熱硬化時,添加可使 本fx月之主成分即僅由以上述通式(】)表示之重複單元構成 的聚ik胺酸賴進行交聯、或交聯劑自身可形成交聯網路的 1303SS.doc -20- 200907567 交聯劑’可進-步強化耐熱性及耐化學藥品性。作為此類 交聯劑,可較好地使用胺基樹脂或其衍生物,其中可較好 地使用脲樹脂、二醇脲樹脂、羥基乙烯脲樹脂、三聚氰胺 樹脂、苯代二聚氰胺樹脂、及彼等之衍生物。尤其好的是 烷氧基甲基化二聚氰胺化合物,其例可列舉六甲氧基甲基 三聚氰胺。就兼具耐熱性、耐化學藥品性以外之各性能之 觀點而言,其添加量相對於100質量份聚醯胺酸酯(A)較好 的是2〜40質量份,更好的是5〜3〇質量份。當添加量為二質 量份以上時,表現出所需之耐熱性及耐化學藥品性,又, 當添加量為40質量份以下時,保存穩定性優異。 (F)其他成分 為提高光敏度,可任意添加敏化劑。作為用以提高光敏 度之敏化劑,例如可列舉米其勒酮、4,4,_雙(二乙基胺基) 二苯甲®I、2’5-雙(4’-二乙基胺基苯亞甲基)環戊烧、2,6雙 (4·-二乙基胺基苯亞甲基)環己酮、2,6_雙(4,二乙基胺基苯 亞甲基)-4-甲基環己酮、4,4,_雙(二甲基胺基)查爾酮、4,4,_ 雙(二乙基胺基)查爾酮、對二甲基胺基苯亞烯丙基節酮、 對二甲基胺基苯亞甲基節酮、2_(對二甲基胺基苯基伸聯苯 土)苯并塞唑、2-(對二甲基胺基苯基伸乙烯基)苯并噻 唑、2-(對二甲基胺基苯基伸乙烯基)異萘幷噻唑、1,弘雙 (4、二甲基胺基苯亞甲基)丙酮、M.雙(4, ·二乙基胺基苯亞 甲基)丙嗣、3,3’_艘基_雙(7·二乙基胺基香豆素)、L乙醯 基-7-二甲基胺基香豆素、3_乙氧基幾基·7_二甲基胺基香 素3苄氧基羰基-7-二甲基胺基香豆素、3_甲氧基羰 130388.doc •21 · 200907567 基-7-二乙基胺基香豆素、3-乙氧基羰基_7_二乙基胺基香 豆素、N-苯基-Ν'-乙基乙醇胺、N_苯基二乙醇胺、N_對甲 本基一乙醇胺、N-苯基乙醇胺、4-嗎琳基二笨曱酮、二甲 基胺基苯曱酸異戊酯、二乙基胺基苯甲酸異戊酯、2_疏基 苯并咪唑、1-苯基-5-巯基四唑、2-巯基苯并噻唑、2_(對二 甲基胺基苯乙烯基)苯并噁唑、2_(對二甲基胺基苯乙烯基) 苯并噻唑、2-(對二甲基胺基苯乙烯基)萘幷(1,2_d)噻唑、 2-(對一甲基胺基苯曱醯基)苯乙稀、苯并三cr坐、5-甲基苯 并三唑、5-苯基四唑等。該等之中,就光敏度之觀點而 言,較好的是組合使用具有巯基之化合物與具有二烷基胺 基笨基之化合物。該等可單獨使用或組合使用2〜5種。 用以提高光敏度之敏化劑,較好的是相對於1〇〇質量份 聚醯胺酸酯(A)使用0.1〜25質量份。 為提高凹凸圖案之解析度,可任意添加具有光聚合性不 飽和鍵之單體。作為此類單體,較好的是藉由光聚合起始 劑發生自由基聚合反應之(曱基)丙烯酸化合物,並不特別 限疋於下述者’可列舉:以二乙二醇 '四乙二醇二曱基丙 烯酸酯為代表之乙二醇或聚乙二醇之單或二丙烯酸酯及甲 基丙稀酸醋;丙二醇或聚丙二醇之單或二丙烯酸酯及甲基 丙烯酸酯;甘油之單、二或三丙烯酸酯及曱基丙烯酸酯; 環己烷二丙烯酸酯及二甲基丙烯酸酯;丨,4_ 丁二醇之二丙 稀酸醋及二甲基丙烯酸酯;1,6-己二醇之二丙烯酸酯及二 甲基丙稀酸酿;新戊二醇之二丙烯酸酯及二甲基丙烯酸 酉曰,雙酚A之單或二丙烯酸酯及甲基丙烯酸酯;苯三甲基 130388.doc •22- 200907567 丙烯酸酯;丙烯酸異冰片酯及甲基丙烯酸異冰片基;丙烯 醯胺及其衍生物;甲基丙烯醯胺及其衍生物;三羥甲基丙 烧三丙烯酸s旨及甲基丙烯酸3旨;甘油之二或三丙烯酸醋及 甲基丙稀酸S日’季戊四醇之二、三或四丙烯酸自旨及甲基丙 烯酸酯;及該等化合物之環氧乙烷或環氧丙烷加成物等化 合物。 用以提高凹凸圖案之解析度的具有光聚合性不飽和鍵之 單體,較好的是相對於丨00質量份聚醯胺酸酯(A)使用卜 質量份。 又,可任意添加用以提高與基材之接著性的接著助劑。 作為接著助劑,可列舉:γ_胺基丙基二甲氧基矽烷、Ν_(β_ 胺基乙基)-γ-胺基丙基甲基二甲氧基矽烷、γ_縮水甘油氧 基丙基甲基二甲氧基矽烷、巯基丙基甲基二甲氧基矽 烷、3-甲基丙烯醯氧基丙基二甲氧基甲基矽烷、3_甲基丙 烯醯氧基丙基三甲氧基矽烷、二甲氧基甲基_3_哌啶基丙基 矽烷、二乙氧基-3-縮水甘油氧基丙基甲基矽烷、Ν_(3_: 乙氧基甲基石夕烧基丙基)丁二醯亞胺、Ν_ [3 _(三乙氧基石夕烧 基)丙基]鄰苯二甲醯胺酸、二苯甲酮_3,3'-雙(Ν-[3-三乙氧 基石夕烧基]丙基酿胺)-4,4'-二叛酸、苯-ΐ,4_雙(ν-[3-三乙氧 基石夕烧基]丙基醯胺)-2,5-二羧酸、3_(三乙氧基矽烷基)丙 基丁二酸酐、Ν-苯基胺基丙基三甲氧基矽烷等矽烷偶合 劑;及三(乙基乙醢乙酸)鋁、三(乙醯丙酮酸)鋁、乙醯乙 基乙酸紹二異丙醋等紹系接著助劑等。 該等之中’就接著力之觀點而言,更好的是使用矽烷偶 130388.doc -23- 200907567 合劑。接著助劑之添加量相對於100質量份聚醯胺酸酯(a) 較好的是0.5〜25質量份之範圍。 又,本發明之感光性聚醯胺酸酯組合物中,為提高保存 時之組合物溶液之黏度或光敏度之穩定性,可任意添加熱 聚合抑制劑。作為熱聚合抑制劑,可使用對苯二酚、n_亞' 硝基二苯基胺、對第三丁基鄰苯二酚、吩噻嗪、N_苯基萘 基胺、乙二胺四乙酸、i,2_環己烷二胺四乙酸、乙二醇醚 二胺四乙酸、2,6-二第三丁基·對甲基苯盼、5_亞硝基·8_經 基喹啉、1-亞硝基-2-萘酚、2_亞硝基萘酚、2_亞硝基_ 5-(N-乙基-N-磺丙基胺基)苯酚、N_亞硝基苯基羥胺銨 鹽、N-亞硝基-N(l-萘基)羥胺銨鹽等。 添加至感光性聚醯胺酸酯組合物中之熱聚合抑制劑之 量,相對於1〇〇質量份聚醯胺酸酯(A),較好的是〇〇〇5〜12 質量份之範圍。 本發明之感光性聚醯胺酸酯組合物中,可任意使用有機 鈦化合物作為提高耐熱性及耐化學藥品性之成分。作為可 使用之有機鈦化合物,若為有機化學物質經由共價鍵或離 子鍵與鈦原子鍵結而成者,則並無特別限制。 有時,由於上述有機鈦化合物與本發明中所使用之光起 始劑相干擾而難以獲得良好之圖案,因此有機鈦化合物中 更好的是不會作為光起始劑發揮作用之有機鈦化合物。 取作為有機鈦化合物之具體例,可列舉三甲氧基(五甲基 環戊二烯基)鈦等。 又,作為本發明中可使用之有機鈦化合物之例,可列舉 130388.doc -24- 200907567 鈦螯合物類。鈦螯合物類中,具有2個以上之烷氧基者可 獲得組合物之穩定性及良好之圖案,故較好,作為具體之 較好例,有雙(三乙醇胺)二異丙氧化鈦、(雙_24_戊二酸) 二(正丁氧化)鈦、(雙-2,4_戊二酸)二異丙氧化鈦、雙(四甲 基庚二酸)二異丙氧化鈦、雙(乙基乙醯乙酸)二異丙氧 等。 又,本發明中,亦可使用四(正丁氧化)鈦、四乙氧化 鈦、四(2-乙基己氧化)鈦、四異丁氧化欽、異丙氧化 鈦、四甲氧化鈦、四甲氧基丙氧化欽、四甲基苯氧化欽、 四(正壬氧化)鈦、四(正丙氧化)鈦、四硬脂氧化鈦、四(雙 2,2-(烯丙氧基甲基)丁氧化)鈦等四烷氧化物類三(二辛基 磷酸)異丙氧化鈦、三(十二烷基苯磺酸)異丙氧化鈦等單烷 氧化物類,雙(戊二酸)氧化鈦、雙(四甲基庚二酸)氧化 鈦、酞菁氧鈦等氧化鈦類’ w乙醯丙酮鈦等四乙醯丙酮化 物類,異丙基三(十二烷基苯磺醯基)鈦酸酯等鈦酸酯偶合 劑類等。 該等有機鈦化合物之添加量,相對於⑽質量份聚醯胺 酸酯(A),較好的是〇 3〜25質量份,更好的是〇·5〜5重量 份。當添加量為〇.3質量份以上_,表現出所需之耐熱性 及耐化學藥品性,Χ,當添加量為25質量份以下時,保存 穩定性優異。 、、成刀之外,本發明之感光性聚醯胺酸酯組合物 中,只要不損及本發明之感光性聚醯胺酸酯組合物之各特 陡’則亦可視需要適當地調配以散射光吸收劑或塗膜平滑 I30388.doc -25- 200907567(R3 is a tetravalent aromatic group having a valence group of an olefinic double bond. [7] Y is a divalent aromatic group represented by the following formula (8) [8] (8) Amidoxime 5 The amount of the hydrazine (D) to be added is preferably 150 parts by mass or less, more preferably H 00 parts by weight, based on 100 parts by mass of the polychar acid ester (Α). If the amount is 150 parts by mass. In the following, the heat resistance and the chemical resistance are not impaired. (Ε) The crosslinking agent is a crosslinking agent, and when the concave-convex pattern is heat-hardened, the main component of the present fx month can be added only by the above. The polyacrylic acid amide represented by the repeating unit represented by the general formula (]) can be crosslinked, or the crosslinking agent itself can form a crosslinked network. 1303SS.doc -20-200907567 The crosslinking agent can further enhance the heat resistance and Chemical resistance. As such a crosslinking agent, an amine resin or a derivative thereof can be preferably used, and among them, a urea resin, a diol urea resin, a hydroxyethylene urea resin, a melamine resin, a benzoic acid can be preferably used. Melamine resins, and derivatives thereof, particularly preferred are alkoxymethylated melamine compounds, examples of which can be listed Hexamethoxymethyl melamine. The amount of addition is preferably from 2 to 40 by mass with respect to 100 parts by mass of the polyglycolate (A) from the viewpoint of having properties other than heat resistance and chemical resistance. It is more preferably 5 to 3 parts by mass, and when it is added in an amount of two parts by mass or more, it exhibits desired heat resistance and chemical resistance, and when it is added in an amount of 40 parts by mass or less, it is stable in storage. (F) Other components may be arbitrarily added to enhance the photosensitivity, and as a sensitizer for improving photosensitivity, for example, rice ketone, 4,4, bis (diethylamine) may be mentioned. Diphenyl® I, 2'5-bis(4'-diethylaminobenzylidene)cyclopentane, 2,6 bis(4·-diethylaminobenzylidene) ring Hexanone, 2,6-bis(4,diethylaminobenzylidene)-4-methylcyclohexanone, 4,4,_bis(dimethylamino)chalcone, 4,4 , _ bis (diethylamino) chalcone, p-dimethylamino phenyl allenyl ketone, p-dimethylamino benzylidene ketone, 2 _ p-dimethylamino benzene Benzobenzil) benzoxazole, 2-(p-dimethylamino) Base-stretching vinyl)benzothiazole, 2-(p-dimethylaminophenyl-vinyl)isonaphthylthiazole, 1, Hongshuang (4, dimethylaminobenzylidene) acetone, M. double ( 4, · diethylaminobenzylidene) propionin, 3,3'_ shipyl_bis(7·diethylaminocoumarin), L-ethylidene-7-dimethylamino Coumarin, 3-ethoxylated 7-dimethylamine-based benzoin 3 benzyloxycarbonyl-7-dimethylamino coumarin, 3-methoxycarbonyl 130388.doc •21 · 200907567 -7-diethylamino coumarin, 3-ethoxycarbonyl _7-diethylamino coumarin, N-phenyl-Ν'-ethylethanolamine, N-phenyldiethanolamine , N_p-methyl-based monoethanolamine, N-phenylethanolamine, 4-morphinyl bicinchone, isoamyl dimethylaminobenzoate, isoamyl diethylaminobenzoate, 2 _ benzobenzimidazole, 1-phenyl-5-mercaptotetrazole, 2-mercaptobenzothiazole, 2-(p-dimethylaminostyryl)benzoxazole, 2-(p-dimethylamino) Styryl)benzothiazole, 2-(p-dimethylaminostyryl)naphthoquinone (1,2_d)thiazole, 2-(p-monomethylaminophenylhydrazino) phenylethylene , benzotricr, 5-methylbenzotriazole, 5-phenyltetrazole, and the like. Among these, from the viewpoint of photosensitivity, it is preferred to use a compound having a mercapto group in combination with a compound having a dialkylamino group. These may be used alone or in combination of 2 to 5 species. The sensitizer for increasing the photosensitivity is preferably used in an amount of 0.1 to 25 parts by mass based on 1 part by mass of the polyglycolate (A). In order to increase the resolution of the uneven pattern, a monomer having a photopolymerizable unsaturated bond may be arbitrarily added. As such a monomer, a (mercapto)acrylic compound which undergoes radical polymerization by a photopolymerization initiator is preferred, and is not particularly limited to the following: Ethylene glycol dimercapto acrylate as a representative of ethylene glycol or polyethylene glycol mono- or di-acrylate and methyl acrylate vinegar; propylene glycol or polypropylene glycol mono- or di-acrylate and methacrylate; glycerin Mono-, di- or tri-acrylate and mercapto acrylate; cyclohexane diacrylate and dimethacrylate; hydrazine, 4 - butanediol diacrylic acid vinegar and dimethacrylate; 1,6- Dipropylene acrylate and dimethyl acrylate acid; neopentyl glycol diacrylate and bismuth dimethacrylate, bisphenol A mono or diacrylate and methacrylate; benzene trimethacrylate Base 130388.doc •22- 200907567 Acrylate; isobornyl acrylate and isobornyl methacrylate; acrylamide and its derivatives; methacrylamide and its derivatives; trimethylolpropane triacrylate And methacrylic acid 3; glycerin or triacrylate vinegar and ACID day yl S 'di-, tri- or tetra-acrylate and aimed from pentaerythritol ester of methacrylic acid; and the compound of ethylene oxide or propylene oxide adducts of such compounds and the like. The monomer having a photopolymerizable unsaturated bond for improving the resolution of the uneven pattern is preferably used in an amount of parts based on 00 parts by mass of the polyglycolate (A). Further, a bonding aid for improving the adhesion to the substrate can be arbitrarily added. As the further auxiliary agent, γ-aminopropyl dimethoxydecane, Ν_(β-aminoethyl)-γ-aminopropylmethyldimethoxydecane, γ-glycidoxypropyl Methyldimethoxydecane, mercaptopropylmethyldimethoxydecane, 3-methylpropenyloxypropyldimethoxymethylnonane, 3-methylpropenyloxypropyltrimethoxy Base decane, dimethoxymethyl_3_piperidinylpropyl decane, diethoxy-3-glycidoxypropyl methyl decane, Ν_(3_: ethoxymethyl sulphur Butyldiamine, Ν_ [3 _(triethoxy oxalate) propyl] phthalic acid, benzophenone _3,3'-bis (Ν-[3-three Ethoxylated ethoxylate]propylamine]-4,4'-di-oroxic acid, benzo-anthracene, 4_bis(ν-[3-triethoxysulphonyl]propyl decylamine)-2 a decane coupling agent such as 5-dicarboxylic acid, 3-(triethoxydecyl)propyl succinic anhydride or hydrazine-phenylaminopropyltrimethoxy decane; and tris(ethylacetamethyleneacetate)aluminum, Aluminium tris(acetylpyruvate), ethyl acetoacetate, diisopropyl vinegar, etc. Among these, it is better to use the decane couple 130388.doc -23- 200907567 mixture. The amount of the auxiliary agent added is preferably in the range of 0.5 to 25 parts by mass based on 100 parts by mass of the polyphthalate (a). Further, in the photosensitive polyamine amide composition of the present invention, a thermal polymerization inhibitor may be optionally added in order to improve the stability of the viscosity or photosensitivity of the composition solution during storage. As a thermal polymerization inhibitor, hydroquinone, n_j'nitrodiphenylamine, p-tert-butyl catechol, phenothiazine, N-phenylnaphthylamine, ethylenediaminetetrafene can be used. Acetic acid, i, 2_cyclohexanediaminetetraacetic acid, glycol ether diamine tetraacetic acid, 2,6-di-t-butyl-p-methylbenzene, 5-nitroso-8-ylamino Porphyrin, 1-nitroso-2-naphthol, 2-nitroso-naphthol, 2-nitroso-5-(N-ethyl-N-sulfopropylamino)phenol, N-nitroso Phenylhydroxylamine ammonium salt, N-nitroso-N(l-naphthyl)hydroxylamine ammonium salt, and the like. The amount of the thermal polymerization inhibitor added to the photosensitive polyphthalate composition is preferably in the range of 5 to 12 parts by mass based on 1 part by mass of the polyphthalate (A). . In the photosensitive polyphthalate composition of the present invention, an organic titanium compound can be used arbitrarily as a component for improving heat resistance and chemical resistance. The organic titanium compound which can be used is not particularly limited as long as the organic chemical substance is bonded to the titanium atom via a covalent bond or an ion bond. In some cases, it is difficult to obtain a good pattern because the above-mentioned organotitanium compound interferes with the photoinitiator used in the present invention, and therefore an organotitanium compound which does not function as a photoinitiator is more preferable among the organotitanium compounds. . Specific examples of the organic titanium compound include trimethoxy(pentamethylcyclopentadienyl)titanium and the like. Further, examples of the organotitanium compound which can be used in the present invention include 130388.doc -24-200907567 titanium chelate compounds. Among the titanium chelate compounds, those having two or more alkoxy groups can obtain the stability of the composition and a good pattern, and therefore are preferable. As a specific preferred example, there are bis(triethanolamine) diisopropyl titanate, (double _24_glutaric acid) bis (n-butoxy) titanium, (bis-2,4-pentanedioic acid) titanium diisopropyloxide, bis(tetramethylpimelate) titanium diisotitanate, double (ethyl acetoacetic acid) diisopropyloxy and the like. Further, in the present invention, tetra (n-butoxy) titanium, tetra-titanium oxide, tetrakis(2-ethylhexoxide) titanium, tetraisobutyl oxide, titanium isopropoxide, tetra-titania, or tetra can also be used. Methoxypropane oxidized, tetramethyl benzene oxidized chin, tetra (n-indenyl oxidized) titanium, tetra (n-propoxy oxidized) titanium, tetrastearyl titanium oxide, tetra (bis 2,2-(allyloxymethyl) Butyl oxides such as tetradecyl oxides such as titanium (dioctylphosphoric acid) titanium isopropoxide, tris(dodecylbenzenesulfonic acid) titanium isopropoxide, etc., bis(glutaric acid) Titanium oxide such as titanium oxide, bis(tetramethylpimelate) titanium oxide or titanyl phthalocyanine, tetraethyl acetonide, such as titanium acetonate, and isopropyl tris(dodecylbenzenesulfonyl) a titanate coupling agent such as titanate or the like. The amount of the organic titanium compound to be added is preferably from 3 to 25 parts by mass, more preferably from 5 to 5 parts by weight, based on the (10) parts by mass of the polyphthalate (A). When the amount of addition is 〇3 parts by mass or more, the desired heat resistance and chemical resistance are exhibited, and when the amount is 25 parts by mass or less, the storage stability is excellent. In addition, the photosensitive polyamidate composition of the present invention may be appropriately formulated as needed, as long as the various characteristics of the photosensitive polyamidate composition of the present invention are not impaired. Scattering light absorber or film smoothing I30388.doc -25- 200907567
性賦予劑荨為代表之各種添加劑D <硬化凹凸圖案、及半導體裝置之製造方法〉 作為使用感光性聚醯胺酸酯組合物來形成由感光性聚醯 亞胺樹脂構成之硬化凹凸圖案的方法之丨個態樣,較好的 是以下(a)〜(d)步驟。 (a) 將感光性聚醯胺酸酯組合物塗佈於基材上並進行乾 燥’藉此於該基材上形成塗膜之步驟。The various additives D tex represented by the property-imparting agent &; the hardened concave-convex pattern and the method for producing a semiconductor device> The use of the photosensitive polyphthalate composition to form a cured concave-convex pattern composed of a photosensitive polyimide resin The following aspects (a) to (d) are preferred. (a) a step of applying a photosensitive polyamine amide composition onto a substrate and drying it to form a coating film on the substrate.
(b) 經由具有圖案之光罩或主光罩(reticie)或者直接對該 塗膜照射紫外線之步驟。 "⑷藉由用顯影液進行顯影而制溶劑將該塗膜之未經曝 光的邓刀除去,藉此於該基板上形成凹凸圖案之步驟。 ()藉由對該凹凸圖案進行加熱硬化而使該凹凸圖案中 =醯胺酸㈣亞胺化,藉此於該基板上形成由聚酿亞胺 樹脂構成的硬化凹凸圖案之步驟。 ^為硬化凹凸圖案之形成方法中可使用之基材,可列舉 m、金屬、玻璃、半導體、金屬氧化絕緣膜、氮化石夕 等’較好的是使用矽晶圓。 美乍為本發明中使用之將感光性聚醯胺酸酯組合物塗佈於 土 之方法可使用先前以來感光性聚醯胺酸酯組合物 佈機佈所制的方法,例如,利用旋轉式塗佈機、棒式塗 、!刀塗佈機、簾幕式塗佈機、網版印刷機等進行塗 2方法,利用噴塗機進行喷霧塗佈之方法等。 之力=膜之乾燥方法’可使用風乾、利用供箱或加孰板 無、真空乾燥等方法。又,塗膜之乾燥較理想的 130388.doc •26- 200907567 是在不會引起感光性聚醯胺酸酯組合物中之聚醯胺酸酯之 酿亞胺化的條件下進行。具體而言,進行風乾或加熱乾燥 寸可於20 C〜140 C、1分鐘〜1小時之條件下進行。 針對以如上方式而獲得之塗膜,使用接觸式曝光機、鏡 面投影曝光機、步進機等曝光裝置,經由具有圖案之光罩 或主光罩利用紫外線光源等進行曝光。 其後’為提高光敏度等,亦可視需要而實施任意溫度、 時間之組合的曝光後洪烤(PEB卜或顯影前㈣。供烤條 件之範圍較好的是’溫度為秦12代、時間為ι〇秒铺 秒,但只要不損及本發明之感光性聚醯胺酸酉旨組合物 特性’則不限於該範圍。 作=:所使用之顯影液,較好的是聚酿胺酸醋之良溶 二=該良溶劑與貧溶劑之組合。作為良溶劑,較好的是 土吡咯烷酮、N.環己基_2_吡咯 醢胺、環戍,、環己酮、γ_ 丁内醋、“醯:一甲基乙 等,作為坌、々^ _乙醯基-γ-丁内酯 丙醇、sih h、甲醇、乙醇、異 溶劑與貧、々方,士 ^日及水荨。混合使用良 相對於卜才, 妝心之冷解性而調整貧溶劑 用。“ 4之比例。又,亦可將各溶劑組合數種而使 為顯影所使用之方法,可自.么化1 方法例如旌 則斤知之光阻劑之顯影 等:選擇並使用任意方法。有超聲波處理之浸漬法 顯衫之後,為調整凹凸圖案之形狀等,亦可視需要 130388.doc •27- 200907567 而實施任意溫度、時間之組合的顯影後烘烤。 對於以上述方式而獲得之聚醒胺酸醋之圖案,進行加教 而使感光成分揮發並且使之醯亞胺化,藉此轉變為由聚酿 亞胺樹脂構成之硬化凹凸圖案。作為加熱硬化之方法,可 選擇利用加熱板之方法、利用烘箱之方法、利用可設定溫 度規劃之升溫式烘箱的方法等各種方法。加熱可於 150。。〜280。。、30分鐘〜5小時之條件下進行。作為使之加(b) a step of irradiating the coating film with ultraviolet light via a patterned reticle or a main reticle. <(4) A step of forming a concave-convex pattern on the substrate by removing the unexposed Deng knife of the coating film by developing with a developing solution. (Step) A step of forming a hardened concave-convex pattern composed of a polyimide resin on the substrate by imidating = the valeric acid (tetra) in the concave-convex pattern by heat-hardening the concave-convex pattern. The base material which can be used for the method of forming the hardened concave-convex pattern includes m, metal, glass, semiconductor, metal oxide insulating film, nitride nitride, etc. It is preferable to use a tantalum wafer. The method of applying the photosensitive polyamidate composition to the soil used in the present invention may be a method of using a photosensitive polyamidate composition cloth cloth, for example, using a rotary type. Coater, stick coating,! A knife coating machine, a curtain coater, a screen printing machine, or the like is applied by a coating method, a spray coating method by a spray coater, or the like. The force = the method of drying the film ' can be air dried, using a tank or a crucible, and vacuum drying. Further, the drying of the coating film is preferably carried out under the conditions of not causing the imidization of the polyamidolate in the photosensitive polyamidolate composition, 130388.doc •26-200907567. Specifically, air drying or heat drying can be carried out at 20 C to 140 C for 1 minute to 1 hour. The coating film obtained as described above is exposed to light by an ultraviolet light source or the like through a mask having a pattern or a main mask using an exposure apparatus such as a contact exposure machine, a mirror projection exposure machine, or a stepper. After that, in order to improve the photosensitivity, etc., it is also possible to carry out exposure and post-exposure bake (PEB or pre-development (4) before any combination of any temperature and time as needed. The range of the conditions for the best roasting condition is 'the temperature is Qin 12 generation, time It is not limited to this range as long as it does not impair the characteristics of the photosensitive polyamidomate composition of the present invention. ==: The developer to be used, preferably poly-aracine The good solution of vinegar is the combination of the good solvent and the poor solvent. As a good solvent, it is preferably chloropyrrolidone, N. cyclohexyl-2-pyrrolidine, guanidine, cyclohexanone, γ-butane vinegar, "醯: monomethyl b, etc., as 坌, 々^ _ acetyl γ-butyrolactone propanol, sih h, methanol, ethanol, iso-solvent and lean, sputum, scorpion and leeches. The use of good relative to Bu Cai, the cold solution of the makeup heart and adjust the lean solvent. "4 ratio. In addition, you can also combine several solvents to make the method used for development, can be customized 1 method, for example旌 斤 知 know the development of the photoresist, etc.: Select and use any method. Ultrasonic treatment of the impregnation method In order to adjust the shape of the concave-convex pattern, etc., it is also possible to carry out post-development baking of any combination of temperature and time as needed, 130388.doc •27-200907567. For the pattern of the poly-waking acid vinegar obtained in the above manner, By teaching, the photosensitive component is volatilized and imidized, thereby converting into a hardened concave-convex pattern composed of a polyimide resin. As a method of heat hardening, a method using a hot plate, a method using an oven, and utilization can be selected. Various methods such as a method of temperature-programmed temperature-increasing oven can be set. Heating can be carried out at 150 ° to 280 °, 30 minutes to 5 hours.
熱硬化時之環境氣體’既可使用空氣,亦可使用氮氣、氬 氣等惰性氣體。 本發明之半導體裝置可藉由將本發明之硬化凹凸圖案作 為表面保護mi絕緣膜、再配線用絕緣膜、覆晶裝置 用保護膜、或具有凸塊結構之裝置之保護膜,並與公知之 半導體裝置之製造方法相組合而製造。 又本發明之正型感光性樹脂組合物亦可用於多層電路 之層間絕緣、可撓性銅板之保護層、阻焊劑膜、或液晶 配向膜等用途中。 <積層體之製造方法> 作為使用上述感光性聚醯胺酸酯組合物,製造具有由聚 酿亞胺樹脂構成之硬化凹凸圖案層及金屬層而成的積層體 之方法的一個態樣,較好的是以下步驟。 在藉由上述硬化凹凸圖案之形成方法而於基材上形成硬 化凹凸圖案之步驟後’對該硬化凹凸圖案層之表面實施灰 化、或電漿蝕刻等乾式蝕刻處理。 乾式蝕刻處理較好的是,使用氧氣、氬氣、四氟化碳等 130388.doc •28- 200907567 氣體’於壓力為1〜100 Pa、時間為卜30分鐘之條件下進 行。 與以上述方式於基材上獲得之由聚醯亞胺樹脂構成的硬 化凹凸圖案之上表面相接,進一步使用濺鍍等薄膜製作方 法而設置凸塊用或再配線用金屬層(鈦、鋁、或銅等金屬 層)’藉此可製造本發明之積層體。 而且’藉由將該積層體之製造方法與公知之半導體裝置 之製造方法加以組合,可製造於聚醯亞胺樹脂層上具有選 自由鈦及鋁所組成之群中的至少一種之金屬層的半導體裝 置。 " [實施例] 以下’根據實施例及比較例具體說明本發明。 實施例、比較例及參考例中,依照如下方法對利用後述 方法所合成之感光性聚醯胺酸酯組合物之物性進行測定及 評價。 “ (1)重量平均分子量 利用凝膠滲透層析法(以下亦稱為「Gpc」)(標準聚苯乙 烯換算)測定藉由後述方法所合成之各聚醯胺酸酯之重量 平均分子量(Mw)。以下記述GPC之分析條件。 管柱··昭和電工公司製造商標名sho心 ft〇dex 805/804/803 串聯The ambient gas during heat hardening may be either air or an inert gas such as nitrogen or argon. In the semiconductor device of the present invention, the hardened concave-convex pattern of the present invention can be used as a surface protective mi insulating film, an insulating film for rewiring, a protective film for a flip chip device, or a protective film for a device having a bump structure, and is known. The manufacturing method of the semiconductor device is manufactured in combination. Further, the positive photosensitive resin composition of the present invention can also be used for applications such as interlayer insulation of a multilayer circuit, a protective layer of a flexible copper plate, a solder resist film, or a liquid crystal alignment film. <Manufacturing Method of Laminates> One aspect of a method of producing a laminate having a cured uneven pattern layer composed of a polyimide resin and a metal layer using the photosensitive polyimide composition described above The best is the following steps. After the step of forming the hardened concavo-convex pattern on the substrate by the method of forming the cured concavo-convex pattern, the surface of the hardened concavo-convex pattern layer is subjected to dry etching such as ashing or plasma etching. The dry etching treatment is preferably carried out using oxygen, argon, carbon tetrafluoride, etc. under the conditions of a pressure of 1 to 100 Pa and a time of 30 minutes. The surface of the hardened concave-convex pattern composed of the polyimide resin obtained on the substrate in the above manner is in contact with the surface, and a metal layer for bump or rewiring is further provided by a film forming method such as sputtering (titanium, aluminum Or a metal layer such as copper)" Thereby, the laminate of the present invention can be produced. Further, by combining the method for producing a laminate and the method for producing a known semiconductor device, it is possible to produce a metal layer having at least one selected from the group consisting of titanium and aluminum on the polyimide layer. Semiconductor device. <Examples Hereinafter, the present invention will be specifically described based on examples and comparative examples. In the examples, comparative examples and reference examples, the physical properties of the photosensitive polyamidate composition synthesized by the method described later were measured and evaluated according to the following method. (1) Weight average molecular weight The weight average molecular weight (Mw) of each polyamine ester synthesized by the method described later is measured by gel permeation chromatography (hereinafter also referred to as "Gpc") (standard polystyrene conversion). ). The analysis conditions of GPC are described below. Pillar · Showa Denko Co., Ltd. manufactures the trade name sho heart ft〇dex 805/804/803
浴離液:N-甲基。比〇各烧_ 4〇°C 流速.1,0 ml/min 檢測器:昭和電工製造商標名 130388.doc •29· 200907567 (2)聚醯亞胺塗膜之玻璃轉移溫度(Tg)之測定 於作為基板的厚度為625士25 μιη之5英吋矽晶圓(日本, Fujimi電子工業股份有限公司製造)上,以硬化後之膜厚約 為10 μιη之方式旋塗藉由後述方法所合成之感光性聚醯胺 酸酯組合物,其後於氮氣環境下、於250°C下加熱2小時, 獲得熱硬化之聚醯亞胺塗膜。自石夕晶圓上剥離所獲得之聚 醯亞胺塗臈而製成聚醯亞胺帶。Bath chaotropic solution: N-methyl. Comparison 〇 4〇 °C Flow rate. 1,0 ml/min Detector: Showa Denko Manufacturing Trade name 130388.doc •29· 200907567 (2) Determination of glass transition temperature (Tg) of polyimine coating On a 5 inch wafer (manufactured by Fujimi Electronics Co., Ltd., Japan) having a thickness of 625 ± 25 μm as a substrate, the film thickness after hardening is about 10 μm, which is synthesized by the method described later. The photosensitive polyamine amide composition was heated at 250 ° C for 2 hours under a nitrogen atmosphere to obtain a thermosetting polyimide film. The polyimine tape obtained by peeling off the obtained ceramsite wafer is made into a polyimide film.
以200 g/mm2之載荷、l〇°C/min之升溫速度、於2〇〜5〇(TC 之範圍内利用熱機械試驗裝置(島津製作所製造tMA_50)對 所獲得之聚酿亞胺帶進行測定’將以溫度為橫軸、以位移 量為縱軸的測定圖中聚醯亞胺帶之熱降伏點之切線交點作 為Tg 〇 (3)硬化凹凸圖案之製作 將藉由後述方法所製備之感光性聚醯胺酸酯組合物旋塗 於5吋矽晶圓上,經乾燥而形成厚度為1〇 0111厚之塗膜。使 用附有測試圖案之光罩, ’利用平行光光罩對準曝光機PLA-The obtained polyimine belt was obtained by a thermomechanical test apparatus (tMA_50 manufactured by Shimadzu Corporation) in a range of 2 〇 to 5 Torr (TC range) with a load of 200 g/mm 2 and a temperature increase rate of l 〇 ° C/min. The measurement is carried out as the Tg 〇(3) hardened concave-convex pattern by using the tangential intersection of the thermal undulation point of the polyimine band in the measurement chart with the temperature on the horizontal axis and the displacement as the vertical axis, which is prepared by the method described later. The photosensitive polyamine amide composition was spin-coated on a 5 Å wafer and dried to form a film having a thickness of 1 〇 0111. Using a photomask with a test pattern, 'aligned with a parallel ray mask Exposure machine PLA-
進行淋洗而獲得凹凸圖案Rinsing to obtain a concave and convex pattern
130388.doc -30- 200907567 J時熱處理’藉此於石夕晶圓上獲得厚度約為“㈣之由聚 醯亞胺樹脂構成之硬化凹凸圖案。 (4)硬化凹凸圖案之耐化學藥品性之評價 將上,硬化凹凸圖案之製作中所獲得的硬化凹凸圖 八;氫氧化鉀(以下亦稱為「K0H」)/二甲基亞砜(以下 亦稱為「刪〇」)/3_甲氧基_3_甲基丁醇之重量比為i : 5 9 ♦ 4 0之混合液中於]〇 〇。厂τ '夺、主!, 從甲於1 00 C下次漬1小時後,觀察表面圖 案。於四甲基氫氧化録(以下亦稱為「TMah」V二甲基亞 風之重里比為4 · 96之混合溶液中於6代下浸潰4()分鐘之 後’觀察表面圖案。每次觀察時,若無圖案之膨濶及溶 解、圖案之剝離、塗膜之裂縫,則認定為合格。 (5)硬化凹凸圖案之耐回焊(refi〇w)製程性之評價 針對上述(3)硬化凹凸圖案之製作中所獲得的該硬化凹 凸圖案’利用上述(4)硬化凹凸圖案之耐化學藥品性之評價 所記載的方法,以氫氧化鉀/二甲基亞砜(DMS〇)/3_甲氧 基-3-甲基丁醇之混合液進行處理,繼而於該圖案上旋塗助 焊劑(Alpha Metals japan公司製造商標名s〇lb〇nd ,商品 編號R5〇〇3)(每分鐘500轉,旋塗2〇秒),於使用網帶式連續 燒成爐(Koyo Thermo System公司製造,型號名6841_ 20AMC-36)之模擬回焊條件下,於氮氣環境下將其加熱至 峰值溫度260 C為止。所謂模擬回焊條件,係指以半導體 裝置之評價方法相關的美國半導體業界團體之標準規格即 IPC/JEDEC J-STD-020A之7.6項所記載之回流焊條件為基 準的形悲下,將焊錫熔點假定為高溫22〇〇c,而加以規格 130388.doc 31 200907567 化。 將於上述模擬回焊條件下進行處理後的硬化膜於助焊劑 清洗劑(荒川化學製造商標名Pine Alpha,商品編號ST· 1 00SX)中浸潰靜置1小時而將助焊劑除去,使之乾燥後, 於光學顯微鏡下觀察表面圖案。若無圖案之膨潤及溶解、 圖案之剝離、塗膜之裂縫,則認定為合格。 <參考例1 >(聚醯胺酸酯1之合成) 將作為四叛酸的43.6 g之均苯四曱酸二酐(pmda)及62.0 g之4,4'-氧雙鄰苯二甲酸二酐(〇DPA)放入容量為2升之可分 離式燒瓶中,加入106·2 g之甲基丙烯酸2_羥基乙酯 (HEMA)及400 ml之γ-丁内酯,並於室溫下攪拌,一邊攪拌 一邊加入81 ·5 g之吡啶而獲得反應混合物。由反應所引起 之放熱完畢後放置冷卻至室溫,放置1 6小時。 繼而,於冰浴冷卻下,一邊授拌於180 ml之γ_ 丁内醋中 溶解有165.1 g之二環己基碳化二亞胺(DCC)的溶液,一邊 花費40分鐘添加至反應混合物中,繼而,一邊授拌使作為 二胺的39.3 g之1,4-苯二胺懸浮於350 ml之γ-丁内酯中的懸 浮液’一邊花費60分鐘添加至上述反應混合物中。 進一步於室溫下授拌2小時後,添加30 ml之乙醇並攪拌 1小時,接著,加入400 ml之γ-丁内酯。藉由過濾將反應混 合物中所生成的沈澱物除去,獲得反應液。 將所獲得之反應液添加至3升之乙醇中而生成由粗聚合 物構成的沈澱物。過濾分離所生成之粗聚合物,溶解於 1.5升之四氫呋喃中而獲得粗聚合物溶液。將所獲得之粗 130388.doc -32- 200907567 聚合物溶液滴加至28升之水中而使聚合物沈澱,過濾分離 所獲得之沈澱物後,於4〇t下進行48小時真空乾燥而獲得 粉末狀之聚合物(聚醯胺酸酯丨)。利用凝膠滲透層析法(標 準聚苯乙烯換算)來測定重量平均分子量(Mw),結果為 16000 〇 <參考例2 >(聚醯胺酸酯2之合成) 使用58.8 g之3,3’,4,4’-聯苯四曱酸二酐(BpDA)及a 〇经之 4,4’-氧雙鄰苯二甲酸二酐(〇DpA)作為四羧酸,使用39 3 $ 之1,4-苯二胺作為二胺,利用上述參考例丨所述之方法使之 反應而獲得聚醯胺酸酯2。利用凝膠滲透層析法(標準聚笨 乙烯換算)測定重量平均分子量(Mw),結果為。 <參考例3>(聚醯胺酸酯3之合成) 使用47.1 g之3,3’,4,4'-聯苯四甲酸二酐(BpDA)及74 5呂之 4,4·-氧雙鄰笨二曱酸二酐(〇DPA)作為四羧酸,使用μ」g 之1,4-苯二胺作為二胺,利用上述參考例丨所述之方法使之 反應而獲得聚醯胺酸酯3。利用凝膠滲透層析法(標準聚笨 乙烯換算)測定重量平均分子量(Mw),結果為17〇〇〇。本 <參考例4 >(聚醯胺酸酯4之合成) 使用94.2 g之3,3,,4,4,_聯苯四甲酸二酐(BpDA)及24 8 g之 4,4’-氧雙鄭苯二曱酸二酐(〇DpA)作為四羧酸,使用μ」 之1,4-笨二胺作為二胺’利用上述參考例w述之方法使之g 反應而獲得聚酿胺酸醋4。利^疑膠滲透層析法(標準聚笨 乙烯換算)測定重量平均分子量(Mw),結果為i6〇〇〇。a本 <參考例5 >(聚醯胺酸酯5之合成) 130388.doc -33- 200907567 使用21.8 g之均苯四羧酸二酐(PMDA)、29.4 g之 3,3’,4,4’-聯苯四甲酸二酐(8卩〇人)及62.0§之4,4,_氧雙鄰苯 二甲酸二酐(ODPA)作為四羧酸,使用39.3 g之l,4-苯二胺 作為二胺,利用上述參考例1所述之方法使之反應而獲得 聚醯胺酸酯5。利用凝膠滲透層析法(標準聚苯乙稀換算)測 定重量平均分子量(Mw),結果為1 8000。 <參考例6 >(聚醯胺酸酯6之合成) 使用58.8§之3,3',4,4'-聯苯四甲酸二酐(8卩〇八)及62.〇呂之 4,4’-氧雙鄰笨二甲酸二酐(〇DPA)作為四羧酸,使用49 4 • Ο 之2,5-二甲基_1,4_苯二胺作為二胺,利用上述參考例1所述 之方法使之反應而獲得聚醯胺酸酯6。利用凝膠滲透層析 法(標準聚苯乙烯換算)測定重量平均分子量’結果為 18000。 <參考例7>(聚醯胺酸酯7之合成) 使用87.2 g之均苯四甲酸二酐(pMDA)作為四羧酸,使用 39.3 g之1,4-苯二胺作為二胺,利用上述參考例丨所述之方 法使之反應而獲得聚醯胺酸酯7。然而,所獲得之聚人物 不溶於溶劑’無法測定重量平均分子量(Mw)。 <參考例8 > (聚醯胺酸酯8之合成) 使用117.7 g之3,3',4,4’-聯苯四甲酸二酐(BPDA)作為 酸,使用39.3似4.笨二胺作為二胺,利用 者四緩 所述之方法伟々e >考例1 去使之反應而獲得聚醯胺酸酯8。利用凝膠、灸、 層析法(標準聚苯乙稀換算)測定重量平均分子量(,透 果為1 ’結 130388.doc -34- 200907567 <參考例9>(聚醢胺酸酯9之合成) 使用23·5 g之3,3,,4,4,-聯苯四甲酸二酐(BpDA)&99.3 §之 4,4’-氧雙鄰苯二甲酸二酐(〇DPA)作為四羧酸,使用π」^ 之ι,4·苯二胺作為二胺,利用上述參考例述之方法使之 反應而獲得聚醯胺酸酯9。利用凝膠滲透層析法(標準聚苯 乙烯換算)測定重量平均分子量(Mw),結果為17〇〇〇。 <參考例10>(聚醯胺酸酯1〇之合成) 使用58.8 g之3,3,,4,4,-聯苯四甲酸二酐(BpDA)&62 〇 §之 4,4’-氧雙鄰苯二甲酸二酐(〇DPA)作為四羧酸,使用54 6 g 之2,4,6-二曱基-1,3-笨一胺作為二胺,利用上述參考例}所 述之方法使之反應而獲得聚醯胺酸酯1〇。利用凝膠滲透層 析法(標準聚苯乙烯換算)測定重量平均分子量(Mw),結果 為 18000 。 <參考例11 >(聚醯胺酸酯11之合成) 使用124.1 g之4,4·-氧雙鄰苯二甲酸二酐(〇DpA)作為四 羧酸,使用72·8 g之4,4,-二胺基二苯基醚作為二胺,利用 上述參考例1所述之方法使之反應而獲得聚醢胺酸酯U。 利用凝膠滲透層析法(標準聚苯乙烯換算)測定重量平均分 子量(Mw),結果為21000。 <參考例12> (聚醯胺酸酯12之合成) 使用58.8 g之3,3’,4,4’-聯苯四甲酸二酐(Bpda)及62.0 g之 -氧雙鄰本二甲酸二針(〇DPA)作為四叛酸,使用27.5 g 之1,4-苯一胺及11·8 g之ι,3-苯二胺作為二胺,利用上述參 考例1所述之方法使之反應而獲得聚醯胺酸酯丨2。利用凝 130388.doc -35- 200907567 膠滲透層析法(標準聚苯乙烯換算)測定重量平均分子量 (Mw),結果為 16000。 <實施例1> 使用所獲得之聚醯胺酸酯1,利用如下方法製備咸光性 . 聚醯胺酸酯組合物,對所製備之組合物進行評價。將i 〇〇 g之聚醯胺酸酯1與4 g之1,3-二苯基丙三酮_2-(〇·乙氧基羰 基)肟(光起始劑)、4 g之四乙二醇二甲基丙烯酸酯、2吕之 1-苯基-5-巯基四唑、8 g之六甲氧基甲基三聚氰胺、4莒之 N-苯基二乙醇胺、3 §之冰[3·(三乙氧基矽烷基)丙基]鄰苯 二甲醯胺酸、及0.02 g之2-亞硝基_丨,萘酚一併溶解於含有 80 g之NMP及20 g之乳酸乙酯的混合溶劑中。藉由進一步 加入少量之該混合溶劑而將所獲得之溶液之黏度調整為約 3 〇泊’製成感光性聚醯胺酸酯組合物。 由该組合物所得之聚醯亞胺塗膜之Tg為290°C。又,於 利用KOH/DMSO/3-曱氧基_3_曱基丁醇所進行之耐化學藥 品性試驗中,未觀察到圖案之溶解、圖案之剝離 '塗膜之 裂縫。於TMAH/DMSO之耐化學藥品性試驗中,亦未觀察 到圖案之膨潤及溶解、圖案之剝離、塗膜之裂縫。於其後 所實施之該硬化凹凸圖案之抗回焊製程性試驗中,亦未觀 察到圖案之溶解、圖案之剝離、塗膜之裂縫。 <實施例2 > 除使用聚醯胺酸酯2來代替聚醯胺酸酯丨以外,以與實施 例1相同之方式來製備感光性聚醯胺酸酯組合物,並進疒 評價。 订 130388.doc -36- 200907567 由該組合物所獲得之聚醯亞胺塗膜之Tg為270°C。又, 於利用KOH/DMSO/3-曱氧基-3-甲基丁醇所進行之耐化學 藥品性試驗中,未觀察到圖案之溶解、圖案之剝離、塗膜 之裂縫。於TMAH/DMSO之耐化學藥品性試驗中,亦未觀 察到圖案之膨潤及溶解、圖案之剝離、塗膜之裂縫。於其 後所實施之該硬化凹凸圖案之抗回焊製程性試驗中,亦未 觀察到圖案之溶解、圖案之剝離、塗膜之裂縫。 <實施例3 >130388.doc -30- 200907567 J-time heat treatment 'This is to obtain a hardened concave-convex pattern composed of polyimine resin with a thickness of about (4) on the Shi Xi wafer. (4) Chemical resistance of the hardened concave-convex pattern The evaluation will be performed on the hardened concave-convex pattern obtained in the production of the hardened concave-convex pattern; potassium hydroxide (hereinafter also referred to as "K0H") / dimethyl sulfoxide (hereinafter also referred to as "deleted") / 3_A The weight ratio of oxy_3_methylbutanol is i: 5 9 ♦ 4 0 in the mixture of 〇〇. Factory τ 'win, Lord! After observing the next stain for 1 hour at 1 00 C, observe the surface pattern. Observe the surface pattern after 4 () minutes of immersion in the mixed solution of "TMah" V dimethyl zephyr (hereinafter referred to as "TMah" V dimethyl nitrous oxide in 4 · 96 cycles). When observing, if there is no pattern expansion and dissolution, peeling of the pattern, or crack of the coating film, it is considered to be acceptable. (5) Evaluation of the reflow resistance of the hardened concave-convex pattern for the above (3) The hardened concave-convex pattern obtained in the production of the hardened concave-convex pattern is described by the method described in the evaluation of the chemical resistance of the (4) hardened concave-convex pattern, and potassium hydroxide/dimethyl sulfoxide (DMS〇)/3 A mixture of _methoxy-3-methylbutanol is treated, and then a flux is applied to the pattern (trade name 〇〇lb〇nd, trade name R5〇〇3, manufactured by Alpha Metals japan) (per minute 500 rpm, spin coating for 2 sec.), and heated to a peak temperature under a nitrogen atmosphere using a simulated reflow condition of a mesh belt continuous firing furnace (manufactured by Koyo Thermo System, model number 6841_20AMC-36) 260 C. The so-called analog reflow conditions refer to the evaluation of semiconductor devices. The method is related to the standard specifications of the US semiconductor industry group, namely, the reflow soldering conditions described in item 7.6 of IPC/JEDEC J-STD-020A. The melting point of the solder is assumed to be 22 〇〇c, and the specification is 130388. .doc 31 200907567. The cured film treated under the above-mentioned simulated reflow conditions is immersed in a flux cleaning agent (Pen Alpha, manufactured by Arakawa Chemical Co., Ltd., trade name ST·100SX) for 1 hour. After the flux was removed and dried, the surface pattern was observed under an optical microscope. If there was no swelling or dissolution of the pattern, peeling of the pattern, or crack of the coating film, it was judged to be acceptable. Reference Example 1 > Synthesis of acid ester 1) 43.6 g of pyromellitic dianhydride (pmda) as tetrahedic acid and 62.0 g of 4,4'-oxydiphthalic dianhydride (〇DPA) were placed in a capacity of In a 2 liter separable flask, add 106·2 g of 2-hydroxyethyl methacrylate (HEMA) and 400 ml of γ-butyrolactone, and stir at room temperature, and add 81·5 while stirring. The reaction mixture is obtained by pyridine of g. After the exotherm caused by the reaction is completed After cooling to room temperature, it was allowed to stand for 16 hours. Then, while cooling in an ice bath, a solution of 165.1 g of dicyclohexylcarbodiimide (DCC) dissolved in 180 ml of γ-butyrolactone was added. It took 40 minutes to add to the reaction mixture, and then, while stirring, a suspension of 39.3 g of 1,4-phenylenediamine as a diamine suspended in 350 ml of γ-butyrolactone was added for 60 minutes. In the above reaction mixture. After further mixing for 2 hours at room temperature, 30 ml of ethanol was added and stirred for 1 hour, followed by the addition of 400 ml of γ-butyrolactone. The precipitate formed in the reaction mixture was removed by filtration to obtain a reaction liquid. The obtained reaction liquid was added to 3 liters of ethanol to form a precipitate composed of a crude polymer. The resulting crude polymer was separated by filtration and dissolved in 1.5 liters of tetrahydrofuran to obtain a crude polymer solution. The obtained polymer solution of 130388.doc -32-200907567 was added dropwise to 28 liters of water to precipitate a polymer, and the obtained precipitate was separated by filtration, and dried under vacuum at 4 Torr for 48 hours to obtain a powder. Polymer (polyamidomate). The weight average molecular weight (Mw) was measured by gel permeation chromatography (standard polystyrene conversion), and it was 16,000 Å < Reference Example 2 > (Synthesis of Polyurethane 2) Using 58.8 g of 3, 3',4,4'-biphenyltetraphthalic acid dianhydride (BpDA) and a 4,4'-oxydiphthalic dianhydride (〇DpA) as a tetracarboxylic acid, using 39 3 $ As the diamine, 1,4-phenylenediamine was reacted by the method described in the above Reference Example to obtain a polyphthalate 2. The weight average molecular weight (Mw) was measured by gel permeation chromatography (standard polystyrene conversion), and as a result, it was obtained. <Reference Example 3> (Synthesis of Polyurethane 3) 47.1 g of 3,3',4,4'-biphenyltetracarboxylic dianhydride (BpDA) and 74 5 Lu 4,4·-oxygen were used. Bis, adipic acid dianhydride (〇DPA) is used as the tetracarboxylic acid, and 1,4-phenylenediamine is used as the diamine, and the polyamine is obtained by the method described in the above Reference Example. Acid ester 3. The weight average molecular weight (Mw) was measured by gel permeation chromatography (standard polystyrene conversion) and found to be 17 Å. This <Reference Example 4 > (Synthesis of Polyurethane 4) Using 94.2 g of 3,3,4,4,4-biphenyltetracarboxylic dianhydride (BpDA) and 24 8 g of 4,4' - Oxygen bis-phthalic acid dianhydride (〇DpA) as a tetracarboxylic acid, using 1,4-thindiamine as a diamine in the above-mentioned reference example w Amino acid vinegar 4. The weight average molecular weight (Mw) was determined by the gel permeation chromatography (standard polystyrene conversion), and the result was i6 〇〇〇. a <Reference Example 5 > (Synthesis of Polyurethane 5) 130388.doc -33- 200907567 Using 21.8 g of pyromellitic dianhydride (PMDA), 29.4 g of 3,3',4 , 4'-biphenyltetracarboxylic dianhydride (8 卩〇 human) and 62.0 § 4,4, oxydiphthalic dianhydride (ODPA) as tetracarboxylic acid, using 39.3 g of l,4-benzene The diamine was reacted as a diamine by the method described in Reference Example 1 above to obtain a polyamine 5 . The weight average molecular weight (Mw) was measured by gel permeation chromatography (standard polystyrene conversion) and found to be 1 8000. <Reference Example 6 > (Synthesis of Polyamine 6) Using 58.8 § 3,3',4,4'-biphenyltetracarboxylic dianhydride (8-8) and 62. , 4'-oxybis-p-dibenzoic acid dianhydride (〇DPA) as a tetracarboxylic acid, using 49 4 • Ο 2,5-dimethyl-1,4-phenylenediamine as the diamine, using the above reference examples The method described in 1 is reacted to obtain polyphthalate 6. The weight average molecular weight was measured by gel permeation chromatography (standard polystyrene conversion) and the result was 18,000. <Reference Example 7> (Synthesis of Polyurethane 7) 87.2 g of pyromellitic dianhydride (pMDA) was used as the tetracarboxylic acid, and 39.3 g of 1,4-phenylenediamine was used as the diamine. The method described in the above Reference Example was allowed to react to obtain a polyphthalate 7. However, the obtained poly-character is insoluble in the solvent. The weight average molecular weight (Mw) cannot be determined. <Reference Example 8 > (Synthesis of Polyurethane 8) 117.7 g of 3,3',4,4'-biphenyltetracarboxylic dianhydride (BPDA) was used as the acid, and 39.3 was used as the 4. The amine is used as a diamine, and the user is allowed to react to obtain a polyphthalate 8 by the method described in the above. The weight average molecular weight was measured by gel, moxibustion, chromatography (standard polystyrene conversion) (the permeation was 1 'knot 130388.doc -34- 200907567 <Reference Example 9> (polyamide 9 Synthesis) using 23.5 g of 3,3,,4,4,-biphenyltetracarboxylic dianhydride (BpDA) & 99.3 § 4,4'-oxydiphthalic dianhydride (〇DPA) as Tetracarboxylic acid, using π"^ ι,4 phenylenediamine as a diamine, which is reacted by the method described in the above Reference Examples to obtain a polyphthalate 9. Using gel permeation chromatography (standard polyphenylene) In terms of ethylene, the weight average molecular weight (Mw) was measured and found to be 17 Å. <Reference Example 10> (Synthesis of polyglycolate 1 使用) Using 58.8 g of 3, 3, 4, 4, - Pyromellitic dianhydride (BpDA) & 62 〇§ 4,4'-oxydiphthalic dianhydride (〇DPA) as tetracarboxylic acid, using 54 6 g of 2,4,6-didecyl -1,3-phenylamine as a diamine, which was reacted by the method described in the above Reference Example} to obtain a polyphthalate ester. The weight was measured by gel permeation chromatography (standard polystyrene conversion). Average molecular weight (Mw), knot 18000. <Reference Example 11 > (Synthesis of Polyurethane 11) Using 124.1 g of 4,4·-oxydiphthalic dianhydride (〇DpA) as a tetracarboxylic acid, using 72·8 g 4,4,-diaminodiphenyl ether as a diamine, which was reacted by the method described in the above Reference Example 1 to obtain a polyphthalate U. Using gel permeation chromatography (standard polyphenylene) The weight average molecular weight (Mw) was measured in terms of ethylene and found to be 21,000. <Reference Example 12> (Synthesis of Polyurethane 12) 58.8 g of 3,3',4,4'-biphenyltetracarboxylic acid was used. Anhydride (Bpda) and 62.0 g-oxo-di-n-dicarboxylic acid two-needle (DPA) as tetra-rebel, using 27.5 g of 1,4-phenylamine and 11.8 g of iotatriene The diamine was reacted to obtain a polyamidate oxime 2 by the method described in the above Reference Example 1. The weight average was measured by gel permeation chromatography (standard polystyrene conversion) using condensate 130388.doc -35 - 200907567 Molecular weight (Mw), the result was 16,000. <Example 1> Using the obtained polyphthalate 1, the saltiness was prepared by the following method. The polyglycolate composition was prepared. The composition was evaluated. i 〇〇g of poly phthalate 1 and 4 g of 1,3-diphenyl glycerol 2 - (anthracene ethoxycarbonyl) hydrazine (photoinitiator), 4 g of tetraethylene glycol dimethacrylate, 2 phenyl 1-phenyl-5-mercaptotetrazole, 8 g of hexamethoxymethyl melamine, 4 莒 N-phenyldiethanolamine, 3 § Ice [3. (triethoxydecyl)propyl] phthalic acid, and 0.02 g of 2-nitroso-hydrazine, naphthol are dissolved together in 80 g of NMP and 20 g In a mixed solvent of ethyl lactate. The photosensitive polyamine amide composition was prepared by further adding a small amount of the mixed solvent to adjust the viscosity of the obtained solution to about 3 Torr. The Tg of the polyimide film obtained from the composition was 290 °C. Further, in the chemical resistance test conducted by KOH/DMSO/3-decyloxy_3_mercaptobutanol, no dissolution of the pattern and peeling of the pattern were observed. In the chemical resistance test of TMAH/DMSO, no swelling or dissolution of the pattern, peeling of the pattern, or cracking of the coating film were observed. In the anti-reflow process test of the hardened concave-convex pattern which was subsequently carried out, the dissolution of the pattern, the peeling of the pattern, and the crack of the coating film were not observed. <Example 2> A photosensitive polyamine amide composition was prepared in the same manner as in Example 1 except that poly phthalate 2 was used instead of poly phthalate oxime. The 130 μg of the polyimide film obtained from the composition has a Tg of 270 ° C. Further, in the chemical resistance test by KOH/DMSO/3-decyloxy-3-methylbutanol, no dissolution of the pattern, peeling of the pattern, and cracking of the coating film were observed. In the chemical resistance test of TMAH/DMSO, the swelling and dissolution of the pattern, the peeling of the pattern, and the crack of the coating film were not observed. In the anti-reflow process test of the hardened concave-convex pattern which was subsequently carried out, no dissolution of the pattern, peeling of the pattern, or cracking of the coating film were observed. <Example 3 >
除使用聚醯胺酸酯3來代替聚醯胺酸酯1以外,以與實施 例1相同之方式來製備感光性聚醯胺酸酯組合物,並進行 評價。 由該組合物所獲得之聚醯亞胺塗膜之Tg為268。(:。又, 於利用KOH/DMSO/3-甲氧基-3-甲基丁醇所進行之耐化學 藥品性試驗中,未觀察到圖案之溶解、圖案之剝離、塗膜 之裂縫。於TMAH/DMSO之耐化學藥品性試驗中,亦未觀 察到圖案之膨潤及溶解、圖案之剝離、塗臈之裂縫。於其 後所實施之該硬化凹凸圖案之抗回焊製程性試驗中,亦未 觀察到圖案之溶解、圖案之剝離、塗膜之裂縫。 <實施例4 > 除使用聚醯胺酸酯4來代替聚醯胺酸酯丨以外,以與實施 例1相同之方式來製備感光性聚醯胺酸醋組合物,並進行 評價。 由該組合物所獲得之聚醯亞胺塗膜之Tg為280t。又, 於利用KOH/DMSO/3-甲羞其3田* τλ- T乳基-3-甲基丁醇所進行之耐化學 I30388.doc -37- 200907567 藥品性試驗中,未觀察到圖案之溶解、圖案之剝離、塗膜 之裂縫。於TMAH/DMSO之耐化學藥品性試驗中,亦未觀 察到圖案之膨潤及溶解、圖案之剝離、塗膜之裂縫。於其 後所實施之該硬化凹凸圖案之抗回流製程性試驗中,亦未 觀察到圖案之溶解、圖案之剝離、塗膜之裂縫。 <實施例5 > 除使用聚醯胺酸酯5代替聚醯胺酸酯丨以外,以與實施例 Ο ϋ 1相同之方式來製備感光性聚醯胺酸酯組合物並進行 價。 由該組合物所獲得之聚醯亞胺塗膜之、為28〇它。又, 於利用KOH/DMSO/3 -甲氧基_3_甲基了醇所進行之耐化學 藥品性試驗中,未觀察到圖案之溶解、圖案之剝離、塗: 之裂縫。於TMAH/DMSO之耐化學藥品性試驗中,亦未觀 察到圖案之膨潤及溶解、圖案之剝離、塗膜之裂縫。於其 後所實施之該硬化凹凸圖案之抗回焊製程性試驗中亦未 觀察到圖案之溶解、圖案之剝離、塗膜之裂縫。 <實施例6 > 除使用聚醯胺酸酯6來代替聚醯胺酸酯丨以外, 以1興實施 例1相同之方式來製備感光性聚醯胺酸酯組合物並 評價。 ’订 由該組合物所獲得之聚醯亞胺塗膜之、為28〇它。 =利用K〇H/DMSO/3_甲氧基_3_甲基丁醇所進行之耐^學 藥品性試驗中,未觀察到圖案之溶解、圖幸 予 q木心剌離、塗膜 之裂縫。於TMAH/DMSO之耐化學藥品性試驗中亦未觀 130388.doc -38· 200907567 察到圖案之膨潤及溶解、圖案之剝離、塗膜之裂縫。於其 後所實施之該硬化凹凸圖案之抗回焊製程性試驗中,亦未 觀察到圖案之溶解、圖案之剝離、塗膜之裂縫。 <實施例7 > 除使用聚醯胺酸酯11來代替5〇質量%之聚醯胺酸酯2以 外,以與實施例2相同之方式來製備感光性聚醯胺酸酯組 合物,並進行評價。 由該組合物所獲得之聚醯亞胺塗膜之4為255()(:。又, 於利用KOH/DMSO/3-曱氧基_3·曱基丁醇所進行之耐化學 藥品性試驗中,未觀察到圖案之溶解、圖案之剝離、塗膜 之裂縫。於TMAH/DMSO之耐化學藥品性試驗中,亦未觀 察到圖案之膨潤及溶解、圖案之剝離、塗膜之裂縫。於其 後所實施之該硬化凹凸圖案之抗回焊製程性試驗中,亦未 觀察到圖案之溶解、圖案之剝離、塗膜之裂縫。 <比較例1 > , 除使用聚酿胺酸賴7來代替聚醯胺醋丨以外,以與實施例 相同之方式來製備感光性聚醯胺酸酯組合物,並進行評 價。 然而,該組合物Φ & & % A ,, 中殘留聚合物之不溶成分,無法均勻地 塗佈於SB圓上’無法獲得所需之凹凸圖案。 <比較例2 > 除使用聚醯胺酿。+ 次S日8來代替聚醯胺酸酯1以外,以與實施 例1相同之方式央制 I備感光性聚醯胺酸酯組合物,並進行 評價。 130388.doc -39· 200907567 由該組合物所獲得之聚醯亞胺塗臈之Tg為29(Tc。於 TMAH/DMSO之耐化學藥品性試驗中,未觀察到圖案之膨 潤及溶解、圖案之剝離、塗膜之裂縫。然而,於利用 KOH/DMSO/3-甲氧基-3-曱基丁醇所進行之耐化學藥品性 »式驗中,發現圖案溶解。於其後所實施之該硬化凹凸圖案 之抗回焊製程性試驗中’塗膜上亦觀察到裂縫。 <比較例3 > 除使用聚醢胺酸酯9來代替聚醯胺酸酯1以外,以與實施 例1相同之方式來製備感光性聚醯胺酸酯組合物,並進行 評價。 由該組合物所獲得之聚醯亞胺塗膜之Tg為255°c。於 TMAH/DMSO之耐化學藥品性試驗中,未觀察到圖案之膨 /閏及溶解、圖案之剝離、塗膜之裂縫。然而,於利用 KOH/DMSO/3-甲氧基-3-甲基丁醇所進行之耐化學藥品性 試驗中’發現圖案溶解。於其後所實施之該硬化凹凸圖案 之抗回焊製程性試驗中’塗膜上亦觀察到裂縫。 <比較例4 > 除使用聚醯胺酸酯1 〇來代替聚醯胺酸酯1以外,以與實 施例1相同之方式來製備感光性聚醯胺酸酯組合物,並進 行評價。 由該組合物所獲得之聚醯亞胺塗膜之Tg為260°C。然 而,於利用KOH/DMSO/3-甲氧基-3-甲基丁醇所進行之耐 化學藥品性試驗、利用TMAH/DMSO所進行之耐化學藥品 性試驗中’均發現圖案溶解。於其後所實施之該硬化凹凸 130388.doc 200907567 圖案之抗回焊製程性試驗中,塗膜上亦觀察到裂縫。 <比較例5 > 除使用聚酿胺酸酿丨丨來代替75質量%之聚醯胺酸酯2以 卜以與實知例2相同之方式來製備感光性聚醯胺酸酯組 合物,並進行評價。 由該組合物所獲得之聚醯亞胺塗膜之Tg為230。(:。然 而’於利用KQH/DMSQ/3-甲氧基_3_曱基丁醇所進行之耐 化學藥品性試驗、利用TMah/dmsA photosensitive polyamidate composition was prepared and evaluated in the same manner as in Example 1 except that polyphthalate 3 was used instead of polyphthalate 1. The polyimine coating film obtained from the composition had a Tg of 268. (: Further, in the chemical resistance test by KOH/DMSO/3-methoxy-3-methylbutanol, no dissolution of the pattern, peeling of the pattern, or crack of the coating film was observed. In the chemical resistance test of TMAH/DMSO, no cracking and dissolution of the pattern, peeling of the pattern, and cracking of the coating were observed, and in the anti-reflow process test of the hardened concave-convex pattern which was subsequently performed, The dissolution of the pattern, the peeling of the pattern, and the crack of the coating film were not observed. <Example 4> In the same manner as in Example 1, except that polyphthalate 4 was used instead of the polyphthalate oxime A photosensitive polyamido vinegar composition was prepared and evaluated. The Tg of the polyimide film obtained from the composition was 280 t. Further, using KOH/DMSO/3-methazine, 3 fields* τλ - Chemical resistance by T-milyl-3-methylbutanol I30388.doc -37- 200907567 In the pharmaceutical test, no dissolution of the pattern, peeling of the pattern, cracking of the coating film, and resistance to TMAH/DMSO were observed. In the chemical test, no swelling or dissolution of the pattern, peeling of the pattern, or coating of the film was observed. In the anti-reflux process test of the hardened concave-convex pattern which was carried out thereafter, no dissolution of the pattern, peeling of the pattern, or crack of the coating film were observed. [Example 5 > In addition to the use of poly-proline A photosensitive polyphthalate composition was prepared and priced in the same manner as in Example Ο 1 except that the ester 5 was used in place of the polyamidoxime. The polyimide film obtained from the composition was used. It is 28 。. Further, in the chemical resistance test by KOH/DMSO/3-methoxy-3-methylol, no dissolution of the pattern, peeling of the pattern, and coating were observed. Crack. In the chemical resistance test of TMAH/DMSO, no swelling or dissolution of the pattern, peeling of the pattern, crack of the coating film, and resistance to reflow process test of the hardened concave-convex pattern performed thereafter. No dissolution of the pattern, peeling of the pattern, or crack of the coating film was observed in the middle. <Example 6 > The same procedure as in Example 1 was carried out except that the polyphthalate 6 was used instead of the polyphthalate oxime The photosensitive polyphthalate composition was prepared and evaluated. The polyimine coating film obtained from the composition was 28 〇. = In the chemical resistance test conducted by K〇H/DMSO/3_methoxy-3-methylbutanol No dissolution of the pattern was observed, and the crack of the coating was observed. The chemical resistance test of TMAH/DMSO was also not observed. 130388.doc -38· 200907567 The swelling and dissolution of the pattern were observed. The peeling of the pattern and the crack of the coating film were not observed in the anti-reflow process test of the hardened concave-convex pattern which was carried out thereafter, and the dissolution of the pattern, the peeling of the pattern, and the crack of the coating film were not observed. <Example 7> A photosensitive polyphthalate composition was prepared in the same manner as in Example 2, except that polyphthalate 11 was used instead of 5% by mass of polyphthalate 2, And evaluate. The polyimine coating film obtained from the composition was 255 (). Further, the chemical resistance test was carried out using KOH/DMSO/3-decyloxy-3-3 mercaptobutanol. No dissolution of the pattern, peeling of the pattern, or cracking of the coating film were observed. In the chemical resistance test of TMAH/DMSO, no swelling or dissolution of the pattern, peeling of the pattern, or cracking of the coating film were observed. In the anti-reflow process test of the hardened concave-convex pattern which was subsequently carried out, no dissolution of the pattern, peeling of the pattern, or crack of the coating film was observed. [Comparative Example 1 > A photosensitive polyphthalate composition was prepared and evaluated in the same manner as in the Example except that polyacetamide was used. However, the composition was residual polymerization in Φ && % A , The insoluble component of the substance could not be uniformly applied to the SB circle. 'The desired concave-convex pattern could not be obtained. <Comparative Example 2 > In addition to the use of polyamide, the + S-day 8 was substituted for the polyamidate 1 In addition, in the same manner as in Example 1, the preparation of the photosensitive polyamidate composition was carried out. Evaluation: 130388.doc -39· 200907567 The Tg of the polyimide obtained from the composition was 29 (Tc. In the chemical resistance test of TMAH/DMSO, no swelling or dissolution of the pattern was observed, Peeling of the pattern, crack of the coating film. However, in the chemical resistance test by KOH/DMSO/3-methoxy-3-mercaptobutanol, the pattern was found to be dissolved. In the anti-reflow process test of the hardened concave-convex pattern, cracks were also observed on the coating film. <Comparative Example 3 > In addition to using polyphthalate 9 instead of polyphthalate 1, The photosensitive polyamine amide composition was prepared and evaluated in the same manner as in Example 1. The Tg of the polyimide film obtained from the composition was 255 ° C. Chemical resistance to TMAH/DMSO In the test, no swelling/squeezing and dissolution of the pattern, peeling of the pattern, and cracking of the coating film were observed. However, the chemical resistance with KOH/DMSO/3-methoxy-3-methylbutanol was observed. In the test, it was found that the pattern was dissolved. The anti-reflow process test of the hardened concave-convex pattern was carried out thereafter. 'Cracks were also observed on the coating film. <Comparative Example 4 > Photosensitive polyamine was prepared in the same manner as in Example 1 except that polyphthalate 1 was used instead of polyphthalate 1. The acid ester composition was evaluated and evaluated. The Tg of the polyimide film obtained from the composition was 260 ° C. However, using KOH / DMSO / 3-methoxy-3-methylbutanol In the chemical resistance test conducted by the chemical resistance test conducted by TMAH/DMSO, the pattern dissolution was found. In the subsequent test of the resistance to reflow process of the hardened concave and convex 130388.doc 200907567 pattern, Cracks were also observed on the film. <Comparative Example 5 > A photosensitive polyamidate composition was prepared in the same manner as in the case of Example 2 except that polylactomic acid was used instead of 75% by mass of polyphthalate 2 And evaluate. The polyimine coating film obtained from the composition had a Tg of 230. (:. However, the chemical resistance test using KQH/DMSQ/3-methoxy_3_mercaptobutanol, using TMah/dms
性試射,均發現圖案溶解。於其後所實施之該硬::: 圖案之抗回焊製程性試驗中,塗膜上亦觀察到裂縫。 <比較例6 > 對比啟例2中獲得之感光性聚醯胺酸酯組合物進行評價 時,將使凹凸圖案硬化之條件變更為於氮氣環境下於 200C下進订1小時熱處理、繼而於議。c下進行2小時熱處 理’而於梦晶圓上獲得屋许的也 役仔厚度約為6.0 μιτι之由聚醯亞胺樹脂 構成的硬化凹凸圖幸,眚姑#儿组# „ 固茶Λ施耐化學樂品性試驗及抗回洋贺 程性試驗。 & 由該組合物所獲得之聚醯亞胺塗膜之Tg為⑽。於 TMAH/D_之耐化學藥品性試驗中,未觀察到圖宰之臉 潤及溶解、圖案之剝離、塗 ^ / 主肤又教縫。然而,於利 KOH/DMSO/3-甲氧基_3_甲基 用 丞丁醇所進仃之耐化學藥品性 試驗中,發現圖案溶解。 於其後所實施之該硬化凹Λ圄安 化凹凸圖案之抗回焊製程性試驗 中,塗膜亦觀察到裂縫。 ~鞭 130388.doc 200907567 <比較例7 > 除使用聚醯胺酸酯1 2來代替聚醯胺酸酯1以外,以與實 施例1相同之方式來製備感光性聚醯胺酸酯組合物,並進 行評價。 由該組合物所獲得之聚醯亞胺塗膜之Tg為270°C。於利 用TMAH/DMSO所進行之财化學藥品性試驗中,未觀察到 圖案之膨潤及溶解、圖案之剝離、塗膜之裂縫。然而,於 利用KOH/DMSO/3-甲氧基-3-甲基丁醇所進行之耐化學藥 品性試驗中,發現圖案溶解。於其後所實施之該硬化凹凸 圖案之抗回焊製程性試驗中,塗膜上亦觀察到裂縫。 [產業上之可利用性] 本發明之感光性t醯胺酸i旨組合物可較好地用於製造半 導體裝置、多層配線基板等電氣、電子材料時有用之感光 性材料之領域中。更詳細而言,本發明之組合物可較好地 用作能夠在低溫下進行硬化、且可提供具有高耐熱性及_ 化學藥品性之硬化凹凸圖案的感光性聚酿胺酸醋組合物。 130388.doc 42·The test was found to have dissolved. Cracks were also observed on the film during the hard reflow process test of the hard::: pattern. <Comparative Example 6> When the photosensitive polyacetate composition obtained in Comparative Example 2 was evaluated, the conditions for curing the uneven pattern were changed to heat treatment at 200 C for 1 hour under a nitrogen atmosphere, and then In the discussion. The heat treatment was carried out for 2 hours under c, and the hardened bumps composed of polyamidene resin with a thickness of about 6.0 μm τ were obtained on the dream wafer. Fortunately, 眚姑#儿组# „固茶Λ Chemical resistance test and anti-return test. & The Tg of the polyimide film obtained from the composition is (10). In the chemical resistance test of TMAH/D_, it was not observed. To the face of Tuzai, moisturizing and dissolving, stripping of the pattern, coating / main skin and teaching. However, Yuli KOH/DMSO/3-methoxy_3_methyl is chemically resistant to butanol. In the drug-based test, the pattern was found to be dissolved. In the anti-reflow process test of the hardened concave and convex relief pattern, the crack was also observed in the coating film. ~ whip 130388.doc 200907567 <Comparative Example 7 > A photosensitive polyamine amide composition was prepared and evaluated in the same manner as in Example 1 except that poly phthalate 12 was used instead of poly phthalate 1. From the composition The Tg of the obtained polyimide film was 270 ° C. In the chemical test using TMAH/DMSO No swelling or dissolution of the pattern, peeling of the pattern, or cracking of the coating film were observed. However, in the chemical resistance test using KOH/DMSO/3-methoxy-3-methylbutanol, the pattern was found. Dissolution. In the anti-reflow process test of the hardened concave-convex pattern which was carried out thereafter, cracks were also observed on the coating film. [Industrial Applicability] The photosensitive t-proline acid composition of the present invention It can be preferably used in the field of producing photosensitive materials useful in electrical and electronic materials such as semiconductor devices and multilayer wiring boards. More specifically, the composition of the present invention can be preferably used as a hardening agent at low temperatures. Further, it is possible to provide a photosensitive polyamic acid vinegar composition having a high heat resistance and a chemically hardened concave-convex pattern. 130388.doc 42·
Claims (1)
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| JP2007097930 | 2007-04-04 |
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| JP (1) | JP5043932B2 (en) |
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Cited By (6)
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| TWI413860B (en) * | 2010-02-16 | 2013-11-01 | Asahi Kasei E Materials Corp | A negative photosensitive resin composition, a method for manufacturing a hardened embossed pattern, and a semiconductor device |
| TWI655500B (en) * | 2013-10-09 | 2019-04-01 | 日立化成杜邦微系統股份有限公司 | Resin composition containing polyimide precursor, cured film thereof, method for producing cured film, patterned cured film, method for producing the same, and electronic component |
| CN109814336A (en) * | 2019-01-21 | 2019-05-28 | 深圳市道尔顿电子材料有限公司 | Alkali soluble negative photosensitive polyimide resin combination |
| CN114316263A (en) * | 2022-01-17 | 2022-04-12 | 深圳职业技术学院 | Cross-linked polyamic acid ester, method for producing same, polyimide composition containing same, and method for producing polyimide resin film |
| TWI767436B (en) * | 2016-02-26 | 2022-06-11 | 日商富士軟片股份有限公司 | Manufacturing method of laminated body, manufacturing method of semiconductor element, and manufacturing method of rewiring layer |
| TWI813952B (en) * | 2016-05-23 | 2023-09-01 | 日商日產化學工業股份有限公司 | Composition for forming release layer and release layer |
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| JP2015127817A (en) * | 2009-04-14 | 2015-07-09 | 日立化成デュポンマイクロシステムズ株式会社 | Photosensitive resin composition and circuit formation substrate using the same |
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| CN107709407B (en) * | 2015-05-29 | 2020-11-17 | 富士胶片株式会社 | Polyimide precursor composition, photosensitive resin composition, cured film, method for producing cured film, semiconductor device, and method for producing polyimide precursor composition |
| KR20240070713A (en) * | 2016-08-22 | 2024-05-21 | 아사히 가세이 가부시키가이샤 | Photosensitive resin composition and method for producing cured relief pattern |
| US20210364919A1 (en) * | 2019-01-23 | 2021-11-25 | Microcosm Technology Co., Ltd. | Photosensitive resin composition and application thereof |
| JP7392580B2 (en) * | 2020-06-08 | 2023-12-06 | 住友ベークライト株式会社 | Photosensitive resin composition, electronic device manufacturing method, and electronic device |
| US20220204697A1 (en) * | 2020-12-31 | 2022-06-30 | Industrial Technology Research Institute | Polymer and resin composition thereof |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1219662B1 (en) * | 1999-01-21 | 2004-08-04 | Asahi Kasei Kabushiki Kaisha | Polyamic acid ester |
| JP2003316002A (en) * | 2002-04-22 | 2003-11-06 | Hitachi Chemical Dupont Microsystems Ltd | Photosensitive resin composition, method for producing pattern using the same and electronic parts |
| JP2004085637A (en) * | 2002-08-23 | 2004-03-18 | Kyocera Chemical Corp | Photosensitive resin composition and its manufacturing method |
-
2008
- 2008-04-03 JP JP2009509300A patent/JP5043932B2/en active Active
- 2008-04-03 WO PCT/JP2008/056686 patent/WO2008123583A1/en not_active Ceased
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| TWI413860B (en) * | 2010-02-16 | 2013-11-01 | Asahi Kasei E Materials Corp | A negative photosensitive resin composition, a method for manufacturing a hardened embossed pattern, and a semiconductor device |
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| TWI767436B (en) * | 2016-02-26 | 2022-06-11 | 日商富士軟片股份有限公司 | Manufacturing method of laminated body, manufacturing method of semiconductor element, and manufacturing method of rewiring layer |
| TWI813952B (en) * | 2016-05-23 | 2023-09-01 | 日商日產化學工業股份有限公司 | Composition for forming release layer and release layer |
| CN109814336A (en) * | 2019-01-21 | 2019-05-28 | 深圳市道尔顿电子材料有限公司 | Alkali soluble negative photosensitive polyimide resin combination |
| CN109814336B (en) * | 2019-01-21 | 2022-05-17 | 深圳市道尔顿电子材料有限公司 | Alkali-soluble negative photosensitive polyimide resin composition |
| CN114316263A (en) * | 2022-01-17 | 2022-04-12 | 深圳职业技术学院 | Cross-linked polyamic acid ester, method for producing same, polyimide composition containing same, and method for producing polyimide resin film |
| CN114316263B (en) * | 2022-01-17 | 2023-02-03 | 深圳职业技术学院 | Cross-linked polyamic acid ester, method for producing same, polyimide composition containing same, and method for producing polyimide resin film |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2008123583A1 (en) | 2008-10-16 |
| JPWO2008123583A1 (en) | 2010-07-15 |
| JP5043932B2 (en) | 2012-10-10 |
| TWI369583B (en) | 2012-08-01 |
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