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TW200844429A - An automatic optical inspection approach for detecting and classifying the surface defects on coating brightness enhancement film - Google Patents

An automatic optical inspection approach for detecting and classifying the surface defects on coating brightness enhancement film Download PDF

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TW200844429A
TW200844429A TW96117162A TW96117162A TW200844429A TW 200844429 A TW200844429 A TW 200844429A TW 96117162 A TW96117162 A TW 96117162A TW 96117162 A TW96117162 A TW 96117162A TW 200844429 A TW200844429 A TW 200844429A
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TW96117162A
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Chi-Hao Yeh
wen-cheng Tang
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Chi-Hao Yeh
wen-cheng Tang
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Publication of TW200844429A publication Critical patent/TW200844429A/en

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Abstract

This patent develops an automatic optical inspection (AOI) approach to inspect the surface defects such as Mura, bubble, streak, and contamination on coating Brightness Enhancement Film (BEF). First of all, histogram equalization and local statistics are used to enhance the contours and inner parts of surface defects. Second, using the Otsu threshold method to segment the areas of defects and obtain their locations and shapes. Once the location and shape of a surface defect are addressed, best fitting ellipse algorithm is utilized to extract the geometric features of a defect such as number, area, length of major axis, length of minor axis, and the ratio calculated by the lengths of the major and minor axes. Finally, classifier K-Nearest Neighbor (KNN) classifier is implemented to classify the defective types. Totally 120 testing images including 30 Mura, 30 bubbles, 30 streaks, and 30 contamination defective images are practically verified. Experimental results have shown that the proposed method is able to achieve 100% detection rate and 100% identification rate by appropriate parameters for KNN classifiers.

Description

200844429 九、發明說明: 【發明所屬之技術領域】 由於近年來政府積極發展影像顯示產業且我國廠商積極投入薄膜 電曰曰體液晶顯示器(TFT-LCD)面板製造,且隨著2004年在資訊產業景 氣復甦,LCD TV及PDPTV銷售增加之下,帶動平面顯示器市場的成 長以及TFTLCD «產業的成長,因而㈣上游侧原材料的商機。 全球平面顯示器材料市場,由2004年的丨〇2.6億美元成長至2〇〇5年的 141.4億美元,在液晶電視與電漿電視面板需求帶動下,平面顯示器材 料的需求到2008年將再成長50%,達213億美元。其中2〇〇5年液晶 顯示器材料占平面顯示器材料的比率超過87〇/。,達123·3億美元。在 國内部份2004年國内TFT-LCD材料市場達新台幣923億元,預測2〇〇5 年更將成長至新台幣1351億元,由於液晶顯示器材料市場商機龐大, 國内外材料廠商著眼於此商機,紛紛獨資來台設廠,材料自給率雖然 提高,但核心技術仍掌握在外商手中。國内材料廠商有意搶食此市場, 然而國内材料廠商研發技術與國外大廠先進技術仍有落差,加上國内 廠商規模小使得產量與品質無法達到具競爭力的市場經濟規模,均是 國内發展平面顯示器材料所遭遇之困難⑴。 國内在液晶顯示器材料部分需求龐大’預測在2〇〇5年時將會達到 新台幣1315億元。其中以玻璃基板、增亮膜/稜鏡片、液晶、冷陰極螢 光燈管為市場需求最高的五項,其中增亮膜/稜鏡片兩項原料之成本佔 所有成本之14%,僅次於玻璃基板的49%。由此可見若我國能夠自行 開發出品質優良且售價低廉之增亮膜與稜鏡片即可大幅降低製造液晶 200844429 顯示器所需之成本’躺提高我國平面顯示器產業之競爭力。為了提 供品質優良之增亮膜,必須具備優良之瑕錄測能力。又增亮膜為一 光學薄膜’其最主要之檢查項目即為產品之麵贼之制,目前之 檢測方式健是人工目視財式,且仍以受過繼的人員為主。 我國TFT-LCD產業之光學檢測設備主要聚焦於lcd之檢測與修整設 備,對於增亮膜或其他光學膜之檢測,為了判定的定量化與節省人力 自動化光學檢·備的導人有其必要性。故本專·明針對塗佈式增 亮膜開發-自動光學_方法,其可有效的對增細之表面瑕麵行 檢測與分類等動作。 塗佈式增亮膜的生產方式是採用成捲式(祕t〇_R〇n)且利用精密塗 佈的方式將具讀殊雙折射轉性的高分子雌佈在—紐上,在經 過反覆塗佈之後使其形成-張具有咖層高分子膜層且厚度僅達 132卿厚度的光學薄膜^在製程帽色、延伸及成品表面均有可能因 異物混入造絲碰陷或染色時著色度科,影_光學膜的偏光 度、透過率及敎度,使得光學膜的品f降蝴[3M5胸。為了協助 廠商偵測出瑕疵並判斷其瑕疵種類,即時回饋產品的品質資訊給製程 單位進行製程改善’同時為了響應細政府提出之提高國產設備 自給率在西元2008年達到50%的目標,本專利發明發展一有效的塗佈 式增亮膜瑕庇自動光學檢測方法,針對精密塗佈的製程當中主要常見 的四種瑕疵進行瑕疵檢測[7]。 1 ·大規模的塗佈不均或明暗不均(Mura or Unevenness) 200844429200844429 IX. Invention: [Technical field of invention] In recent years, the government has actively developed the image display industry and Chinese manufacturers have actively invested in the manufacture of thin film electric liquid crystal display (TFT-LCD) panels, and in the information industry in 2004. The recovery of the economy and the increase in sales of LCD TVs and PDPTVs have driven the growth of the flat panel display market and the growth of TFTLCD «the industry, and thus (4) the business opportunities of raw materials on the upstream side. The global market for flat panel display materials has grown from $260 million in 2004 to $14.14 billion in 2.5 years. Demand for flat panel display materials will grow again in 2008, driven by demand for LCD TVs and plasma TV panels. 50%, reaching $21.3 billion. Among them, the ratio of liquid crystal display materials to flat display materials exceeds 87〇/. , reaching 12.33 billion US dollars. In the domestic part of the domestic TFT-LCD materials market reached NT$29.2 billion in 2004, it is forecast to grow to NT$135.1 billion in 2005. Due to the huge market opportunities in the liquid crystal display materials market, domestic and foreign materials manufacturers are looking at In this business opportunity, they have set up factories in Taiwan alone. Although the material self-sufficiency rate has increased, the core technology is still in the hands of foreign businessmen. Domestic material manufacturers are interested in rushing to eat this market. However, there is still a gap between domestic material manufacturers' R&D technology and advanced foreign manufacturers' advanced technologies. In addition, the small scale of domestic manufacturers makes production and quality unable to reach a competitive market economy. It is the difficulty encountered in the development of flat panel display materials in China (1). Domestic demand for liquid crystal display materials is huge. It is predicted that it will reach NT$131.5 billion in 2.5 years. Among them, the glass substrate, brightness enhancement film / enamel film, liquid crystal, cold cathode fluorescent tube are the top five products in the market. The cost of the two materials of brightness enhancement film / enamel film accounts for 14% of all costs, second only to 49% of the glass substrate. It can be seen that if China can develop its own high-quality and low-cost brightness-enhancing film and enamel film, it can greatly reduce the cost of manufacturing LCD 200844429 display, and improve the competitiveness of China's flat-panel display industry. In order to provide a high-quality brightness enhancement film, it is necessary to have excellent recording capabilities. The brightening film is an optical film. The most important inspection item is the product of the product. The current detection method is artificial and financial, and is still dominated by adopted personnel. China's TFT-LCD industry's optical inspection equipment is mainly focused on the detection and finishing equipment of lcd. For the detection of brightness-enhancing film or other optical film, it is necessary for the quantification of the determination and the saving of human-powered optical inspection. . Therefore, this specializes in the development of the coated brightening film-automatic optical method, which can effectively detect and classify the surface of the thinned surface. The coating type brightness-increasing film is produced by using a roll-type (secret t〇_R〇n) and using a precision coating method to insert a high-quality female fabric with a reading birefringence. After repeated coating, it is formed into an optical film having a polymer layer of coffee layer and a thickness of only 132 Å. The color of the process cap, the extension and the surface of the finished product may be colored by the foreign matter mixed into the silk or stained. Degree, shadow _ optical film's degree of polarization, transmittance and twist, so that the optical film's product f butterfly [3M5 chest. In order to assist manufacturers to detect defects and determine their types, the quality information of the products is immediately fed back to the process unit for process improvement. At the same time, in order to respond to the goal of improving the self-sufficiency rate of domestic equipment by the government to reach 50% in 2008, this patent The invention develops an effective coating-type brightness-enhancing film occlusion automatic optical detection method, and performs cockroache detection for the four common cockroaches which are commonly used in the precision coating process [7]. 1 · Large-scale uneven coating or uneven brightness (Mura or Unevenness) 200844429

Mura的定義為在-紐與色彩都為均勻的表面上出現亮度不規則 或色彩不均㈣現象,引起這種贼產生的原因非常衫,可能在 塗佈過程中染料輸出控制不佳、機台震動問題、塗佈過程中有異物 擋在模具間隙、塗料於模具内聚集沉降和模具或刮刀上有損傷等 等,任何的小誤差都有可能導致大規模_咖產生,第一圖(a)即 為在增亮膜上的塗佈不均。 2.氣泡(Bubble) 氣泡會因不同原因而產生不同種類之瑕疲,如基材上有灰塵、染料 沒有充分娜羽、塗佈啦氣渗人、溶_騰#原_會導致不 同形態之氣泡產生。儘管氣泡的種類繁多,但其形狀均為相似之圓 形幾何圖形,故利用機器視覺可輕易地判斷出氣泡瑕疲,第一_ 即為在增党膜上之氣泡瑕疲。 3·條紋(Streaks) 條紋瑕疲出現的原因與Μ⑽類似,但是兩者相異之處為條紋只出 現-次單-線條的塗佈不均,而Mwa則為大範圍多線條塗佈不 均。此種瑕疵為增亮膜生產過程當中相當常見的瑕疵種類之一,第 一圖(c)即為增亮膜上之條紋瑕疵。 4·異物(Spots or Contamination ) 在塗佈的過程中因為塗料、膠帶或是灰塵附著在背壓輪上或滾輪沒 有定時清理,而導致增亮膜上出現異物瑕疵。此類瑕疵如果能在塗 佈刚先檢查基材並定時清理滾輪即可避免,第_圖(3)即為此類瑕 200844429 /疵之影像。 【先前技術】 現今市場上增亮膜主要的型態有兩種,一種是被稱為稜鏡片的光學薄 膜,另一種則是具有多層膜結構的反射式光學薄膜。此兩種均是由美商 3M公司所獨自研發生產,其具有專利保護故其他廠商均無法生產類似 的增亮膜。此外日商日東電工(Nitto Denko)也自行開發出利用膽固醇液 晶機構將光線回收再利用之非多層膜式反射偏光片PCF(pdarizati()n Conversion Film)[10]。現今增亮膜主要應用於薄膜電晶體液晶顯示器 (TFT-LCD)薄膜電晶體液晶顯示器(TFT_LCD)之製程主要為薄膜(Array) 製程、面板(Cell)製程與模組(Module)製程等三段製程,其中所需構成一 完整之液晶顯示器模組所需之元件非常多,包括薄膜電晶體晶格陣列 (TFT-Array)、彩色濾光片(Color filter)、液晶(Liquid crystal) ' 玻璃基板、 偏光片(Polarizer)、配向膜(Alignment film)、電極(Electrode)、薄膜電晶 體(TFT)、彩色濾光片(c〇i〇r册红)、間隙子(沖⑽沉)、儲存電容(c)、 棱鏡片 /增亮膜(Brightness ehancement film)以及驅動 IC(Driver Integrated 1C)等。 目月已有許多針對TFT-LCD產品進行外觀瑕疵點測的研究在進行, 其中主要可分為對TFT_LCD組裝完成之成品進行外觀瑕疵檢測和對 TFT-LCD之相關零組件如彩色濾光片、偏光片、玻璃基板等進行外觀瑕 疵檢驗兩大部分,現探討如下: TFT-LCD之表面瑕疵檢測Mura is defined as the phenomenon of irregular brightness or uneven color (4) on the surface with uniformity of color and color. The cause of this thief is very high. The dye output may be poorly controlled during the coating process. Vibration problems, foreign matter in the coating process, gaps in the mold, accumulation of paint in the mold, and damage to the mold or scraper, etc. Any small error may lead to large-scale production, the first picture (a) That is, coating unevenness on the brightness enhancement film. 2. Bubbles Bubbles can produce different types of fatigue due to different reasons, such as dust on the substrate, dyes that are not full of nafe, coated gas, and _Teng# original _ will lead to different forms Bubbles are generated. Although there are many kinds of bubbles, their shapes are similar to the circular geometry. Therefore, it is easy to judge the bubble fatigue by machine vision. The first is the bubble fatigue on the party film. 3. Streaks Streaks are similar to Μ (10), but the difference between the two is that the stripes only appear - the unevenness of the single-line coating, while the Mwa is unevenly applied over a wide range of lines. . This type of ruthenium is one of the most common types of enamel in the production of brightening film. The first picture (c) is the 瑕疵 on the brightness enhancement film. 4. Spots or Contamination In the process of coating, foreign matter 上 appears on the brightness-enhancing film because paint, tape or dust adheres to the back pressure roller or the roller does not clean regularly. Such enamel can be avoided if the substrate is first inspected and the roller is cleaned at regular intervals. Figure _(3) shows the image of 瑕 200844429 /疵. [Prior Art] There are two main types of brightness enhancing films on the market today, one is an optical film called a enamel film, and the other is a reflective optical film having a multilayer film structure. Both of these are independently developed and produced by American 3M, which has patent protection and cannot be produced by other manufacturers. In addition, Nitto Denko has also developed a non-multilayer film reflective polarizer PCF (pdarizati()n Conversion Film) [10] that utilizes a cholesterol liquid crystal mechanism to recover light. Today's brightness enhancement film is mainly used in thin film transistor liquid crystal display (TFT-LCD) thin film transistor liquid crystal display (TFT_LCD). The process is mainly OLED process, panel process and module process. The process requires a large number of components required to form a complete liquid crystal display module, including a TFT-Array, a Color filter, and a Liquid Crystal 'glass substrate. , Polarizer, Alignment film, Electrode, Thin Film Transistor (TFT), Color Filter (c〇i〇r Red), Gap (Chong (10) Sink), Storage Capacitor (c), a prism sheet/brightness ehancement film, and a driver IC (Driver Integrated 1C). There have been many researches on the appearance and appearance of TFT-LCD products in the month, which can be mainly divided into the appearance and detection of finished products assembled by TFT_LCD and related components of TFT-LCD such as color filters. Polarizers, glass substrates, etc. are two parts of the appearance inspection. The following are discussed: Surface detection of TFT-LCD

Kim等[9]利用機器視覺方法針對lcd面板亮度不均私疵進行檢 9 200844429 測,其利用瑕疵影像在空間域上,因亮度變化而產生的梯度來擷取影 像党度變化的等高線η,並依此等高細的變絲_贼的所在位 置。最後並將檢測結果與人工辨識的結果兩相比較,結果顯示此方法 與人工辨識的結果相吻合。MGri和騎對LCD上的Μ·瑕蘭行 瑕疵檢測,Mum產生的原因Mori將其整理成表21,其中造成lCd 出現斷a瑕_主要發生原因在於LC㈣Cdi和背光源這兩大部 分0 曰彥馨[11]使用機器視覺於TFT面板之表面瑕疫檢測,針對 TFT-LCD面板巾人眼不易麟之微觀贼,包括摘、粉塵、配向 膜孔洞與舰瑕鱗’ _傅立葉縣職(FQurief她―)與反 傅立葉影像勒、魄術,配合棘縣巾TFT面板妓水平紋路之 頻率元素與保留瑕疲能量在頻譜中所貢獻最多的區域之兩種策略,將 TFT面板規倾路加赠除纽健佩舰,再㈣統計管制界線 法凸顯瑕絲侧出贼與贼職之位置。縣在傅讀還原影像 中利用霍夫轉換法分_痕’並_ _雜_孔洞與粉塵,且透 過型態學之·_樣旨_ —_咖峨徵加以分辨。 h等⑽針對贿CD巨觀鶴I的特性,發展出[CD 面板檢測綠’將TFT_LCD模__分成數倾塊,使用輝度計 測量在每偃塊中的亮度大小,分糖__塊之灰_異數,並 使用變異數分析和指數加權平均法做為判定的標準,找出於模組中亮 度不均勻之區塊,其_效討有__触巾之勤a瑕广此。陳 200844429 志忠[13]則是針對TFT_LCD中的巨觀瑕庇,如圓^、猶等, 將TFT-LCD模組面板劃分為數個區塊,利用ccd取得各區域之影 像並計算各輯的平均亮度,再由各區塊的平均亮度中,比較出最高 的亮度值及最低的亮度值,經由最高亮度值與最低亮度值的比例,進 而判斷此模組是否具有亮度不均勾之瑕疫。^等㈣利用編灰階 的線性攝影機來對TFT_LCD成品絲面取像,制騎取得的影像 將其分離成兩鮮,分默具有灰階飽和度和具有方向性與週期 性和邊緣的影像,接下來糊高斯的拉錄斯(Lapladan ef L〇G)據波s分卿上賴?影像進行影像處理,賴將處理過後的影 像相結合並進行二值化後即可得到想要的瑕疵影像。 上述技術均為對TFT-LCD之成品進行外觀瑕錄驗,仔細觀察 TFT-LCD的成品可發現在其面板上會有規則紋路的背景圖樣出現, 如同-制整齊如陣狀規敝路出現。若檢測職為面板上小範圍 之檢測,雜狀方法大妓_鮮_方式如傅立葉轉換或是小 波轉換等來_規雜路,峨察林魏律⑽的贼麵;然而 若是針對大區域的瑕疫如Mum,卿轉度計來量測其亮度,接著 再使用空間域的影像處理方式來凸顯職,進而偵測出瑕疵的位置與 形狀。 ^ TFT_LCD相關零組件之表面瑕疵檢測Kim et al [9] used the machine vision method to check the brightness unevenness of the lcd panel. The 200844429 test uses the gradient of the 瑕疵 image in the spatial domain due to the change in brightness to capture the contour η of the image party degree change. And according to this high-definition silk _ thief's location. Finally, the test results are compared with the results of manual identification. The results show that this method is consistent with the results of manual identification. MGri and riding on the LCD Μ·瑕 瑕疵 瑕疵 , , , , , , LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD LCD MG LCD MG MG MG MG MG MG Xin [11] uses machine vision on the surface of the TFT panel for plague detection, for the TFT-LCD panel towel, the human eye is not easy to microscopic thieves, including picking, dust, alignment film holes and ship's scales' _Fu Liye County (FQurief she ―) and anti-Fourier imagery, 魄 , , 配合 , , , 棘 棘 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县 县Newkinpe Ship, and (4) Statistical Control Boundary Law highlights the position of thieves and thieves on the side of the silk. The county uses the Hough transform method to divide the _ marks and _ _ _ holes and dust in the Fu-reversion image, and distinguishes them by the morphological study. h et al. (10) developed the characteristics of bribe CD giant crane I. [CD panel detection green' divides TFT_LCD __ into several dump blocks, and uses a luminance meter to measure the brightness in each block, and the sugar __ block Gray_exclusive, and using the variance analysis and the exponential weighted average method as the criterion for judging, find out the blocks with uneven brightness in the module, and the effect of the __ touch towel is abundance. Chen 200844429 Zhizhong [13] is aimed at the giant image of TFT_LCD, such as Yuan ^, Jue, etc., the TFT-LCD module panel is divided into several blocks, using ccd to obtain images of various regions and calculate each series The average brightness, and then the highest brightness value and the lowest brightness value are compared by the average brightness of each block, and the ratio of the highest brightness value to the lowest brightness value is used to determine whether the module has a plague of brightness unevenness . ^ et al (4) using a linear camera with a gray-scale to capture the surface of the TFT_LCD, and the image obtained by the ride is separated into two fresh, with grayscale saturation and directional and periodic and edge images. Next, Lapladan ef L〇G, according to the wave, is on the list. The image is processed by the image, and the processed image is combined and binarized to obtain the desired image. All of the above technologies are used for the appearance inspection of the finished TFT-LCD. Careful observation of the finished product of the TFT-LCD reveals that a background pattern with regular lines on the panel appears, as if the system is neatly arranged as a matrix. If the inspection function is a small-scale inspection on the panel, the hybrid method is _ fresh_method such as Fourier transform or wavelet transform, etc., and the thief face of Lin Weilu (10) is observed; however, if it is for a large area The plague, such as Mum, is measured by the brightness meter, and then the image processing method in the spatial domain is used to highlight the position, thereby detecting the position and shape of the cockroach. ^ Surface detection of TFT_LCD related components

Lhn等⑽利用機器視覺的方法針對LCD的玻璃基板進行瑕疲 辨識’其主要發展-瑕疵辨識系統’用來_選某些較細微的微粒或是 200844429 不影響產品品質的瑕疵。如此在既不影響產品品質的前提下,避免花 費過多的資源在檢測與維修一些不具有潛在性威脅的細 微瑕症,並且 提高產品的產出率。趙新民[16]對觸控面板所使用之ITO導電玻璃利 用非線性擴散來偵測其表面瑕疫,其採用空間域(Spatiald_叫的非 線性擴散來進行非同質性隨機性紋路表面之瑕疵檢測,根據影像中之 灰階梯度(Gradient)資訊來進行擴散(Diffosi〇n)處理,在梯度弱的區域 進行平滑(Smoothing)處理,而在梯度強的區域則進行抑制平滑處理。 通活在具有隨機紋路的影像中,瑕疵邊緣相較於背景紋路通常具有較 高的梯度,因此將非線性擴散應用在隨機紋路表面之瑕疵檢測上,可 準確的對影像巾具有隨機紋路背景之區域進行平滑處理,而部會對瑕 疲邊緣ie成破壞進而達到抑制紋路並凸顯瑕疲的目的。其中針對隨機 紋路採用非線性擴散來處理影像的效果會隨著其所設定之擴散函數 (DiffUsivity functions)、擴散參數(Diffusivity parameters)以及迭代 (iteration)次數所影響。 邱學源[17]使用機器視覺技術應用於導光板之瑕,疵檢測,所要偵 測的瑕疵對象包括刮痕、流痕、亮點與黑點,期望能夠利用機器視覺 的技術來以改善因採用人工檢測所產生誤判而造成之損失,首先使用 傅立葉轉換來濾除導光板上由網點所組成之規律紋路背景並使用二 值化處理來凸顯影像中的瑕疵,接著利用類神經網路來對瑕疵進行分 類的動作,其對瑕疵影像擷取面積、斜率變異量、長寬比及最小平方 誤差等四種特徵值作為感知機(percepti〇n)類神經網路的輸入,並結合 12 200844429 灰度門檻縣對其進行瑕絲類之分類,其·四個具有亮點的瑕疵 樣本與十七個具有流痕瑕疵的樣本來對感知機進行訓練。 蔡奂男[18]應用影像處理技術及類神經網路理論來對偏光膜 (Polarizing Film)進行瑕疵檢測與分類,針對偏光膜常見的色差(條 狀、雲狀、點狀)、刮痕及貼合不良等贼_影像處理技術中的渡 波遮罩將影像雜訊干擾濾、除,再用區域成長法(Regk)n &Lhn et al. (10) used the machine vision method to identify the fatigue of the glass substrate of the LCD. The main development - the identification system is used to select some fine particles or the 200844429 does not affect the quality of the product. In this way, without affecting the quality of the product, avoid excessive resources to detect and repair some minor flaws that are not potentially threatening, and improve the output rate of the product. Zhao Xinmin [16] used ITO conductive glass used in touch panels to detect surface plague by nonlinear diffusion, which uses spatial domain (Spatiald_called nonlinear diffusion for non-homogeneous random texture surface) Detection, according to the gray level of the image (Gradient) information for diffusion (Diffosi〇n) processing, smoothing in the weak gradient region, and in the strong gradient region, the suppression smoothing process. In images with random texture, the edge of the ridge usually has a higher gradient than the background texture. Therefore, the nonlinear diffusion is applied to the detection of the random grain surface, which can accurately smooth the area of the image towel with random grain background. Processing, and the Ministry will destroy the edge of the fatigue and achieve the purpose of suppressing the texture and highlighting the fatigue. The effect of using nonlinear diffusion to process the image for the random texture will be related to the DiffUsivity functions. Diffusivity parameters and the number of iterations. Qiu Xueyuan [17] uses machine vision technology Applied to the light guide plate, the flaw detection, the object to be detected includes scratches, flow marks, bright spots and black spots, and it is expected to utilize machine vision technology to improve the loss caused by the false detection caused by manual detection. First, Fourier transform is used to filter out the regular texture background composed of dots on the light guide plate and use binarization to highlight the flaws in the image, and then use the neural network to classify the ripples. Four kinds of eigenvalues such as area, slope variation, aspect ratio and least square error are used as input of percepti〇n neural network, and combined with 12 200844429 grayscale threshold Four sputum samples with bright spots and seventeen samples with flow marks are used to train the perceptron. Cai et al. [18] applied image processing technology and neural network theory to conduct Polarizing Film.瑕疵Detection and classification, for the common color difference (strip, cloud, dot), scratches and poor fit of polarizing film, etc. The image mask-wave noise interference filter, in addition, then the region growth method (Regk) n &

Method),將瑕疫影像部分給予標記並分割出來,最後用拉普拉辛 (Lapladan)·子將贼邊輯認,賴驗的贼_冑何特性找 出瑕辭均亮度、瑕簡準差、瑕辭均面積及瑕齡均周長等四個 特徵值’作為贼分義特徵值,其使用三層倒傳遞類神經網路來對 其五種瑕錢行分類,分麟五觀_齡取八鋪本,總共 4〇個瑕絲本作為倒傳遞網路的爾樣本,待網路訓練完成後利用 另外40個瑕疵樣本來測試網路的辨識能力。Method), mark and segment the plague image part, and finally use the Lapladan son to recognize the thief side, and the thief _ 特性 特性 特性 瑕 瑕 瑕 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性 特性Four characteristic values, such as the average area of the vocabulary and the perimeter of the ', as the eigenvalue of the thief, which uses the three-layer reverse-transfer-like neural network to classify the five types of money. Take eight copies of the book, a total of 4 瑕 silk book as a sample of the inverted transmission network, after the network training is completed, use another 40 瑕疵 samples to test the network identification.

NakaShima[19]針對彩色濾光片之巨觀瑕疵(Macro-defect)與微觀 瑕薇(Micro-defect)進行檢測,其使用影像相減與光學傅立葉滤波器 一種方法來债測瑕疲,針對微觀瑕疵中的五類瑕疵,包含 SIR0-NUKE > Black Matrix Hole ^ Particle ^ Black Matrix Pattern Defect ^ Color Filter Defect進行影像滅之檢測方法;而另三類瑕疫(粉塵、 導電玻璃上之制、微粒)則是制^He_Ne雷射配合傅立葉滤波器 產生尚度抱UX顧丨贼。此二方法皆有其關,雜相減技術需 考量參考雜(Goldenimage)之產生麟蚊位(Regis⑽㈤等問 13 200844429 題’且若參考樣本選擇不佳献位不準確時,瑕賴測誤判的機會將 大幅提高旧個He長雷_紐格的魏控管,才得赠除雜· 目前也有許多針對TFT_LCD __轉進絲純錄測的 研究,但是主要研究對象只有針對少數部分零組件如IT〇導電玻璃、 導光板、偏光膜和彩色濾光片等元件的_進行研究,對於增客膜的 瑕疵檢測.在-国内外貝故本專利務明叫年膜瑕巍 為檢測對象;極富創新性輿實路廄玥忡〇 1·葉仰哲,「平面顯示器材料產業」,工業材料,第219期,2005,第74-83頁。 — 2. Garvin, L. Hugh, Pinnow, and A. Douglas et. al.9 "High Selectivity Thin FilmNaka Shima [19] detects macro-defects and micro-defects of color filters, using image subtraction and optical Fourier filters to measure fatigue, for microscopic The five types of 瑕疵 in the 瑕疵, including SIR0-NUKE > Black Matrix Hole ^ Particle ^ Black Matrix Pattern Defect ^ Color Filter Defect for image detection; and the other three types of plague (dust, conductive glass, particles ) is to make ^He_Ne laser with Fourier filter to produce a good UX 丨 丨 thief. These two methods have their own rules. The hetero-phase subtraction technique needs to consider the reference of the hybrid (Goldenimage) to generate the mosquitoes (Regis (10) (5), etc. 13 200844429 questions' and if the reference sample selection is not accurate, the misjudgment Opportunities will greatly improve the old He Chang Lei _ Newgger's Wei control, only to receive the addition of impurities. There are also many studies on TFT_LCD __ transfer into the pure recording, but the main research object is only for a few parts such as IT〇 Conductive glass, light guide plate, polarizing film and color filter, etc., for the detection of enthalpy of the passenger film. In the domestic and foreign patents, the patent is called the annual film 瑕巍 for the detection object; Innovative and sturdy roads 1. Ye Yangzhe, “Flat Display Materials Industry”, Industrial Materials, No. 219, 2005, pp. 74-83. — 2. Garvin, L. Hugh, Pinnow, and A. Douglas et. al.9 "High Selectivity Thin Film

Polarizer", United States Patent 4289381,1981. 3. Kelimann and Fritz, Polarizer for Infrared Radiation,’,United States Patent 5177635 1993. ? 4·宋大成,「簡介偏光膜」,工業材料,第140期,1998,第118-126頁。 5·黃朝義,「偏光膜介紹」,光電產業與技術情報,第20期,1999,第40-47頁。 6·劉怡君’「偏光膜的原理及應用」,工業材料,第188期,2002,第153-159頁。 7. 溫恕恒,「塗佈缺陷排除法-化腐朽為神奇」,工業材料,第205期,2004,第 98-105 頁。 8. 張永漢,「精密塗佈技術在平面顯示器光學膜之應用簡介」,工業材料,第211 期,2004,第 127-136 頁。 9. J. H. Kim and B. A. Barsky, uHuman Vision Based Detection of Non-Uniform Brightness on LCD Panels", Proc. Of SPIE4S&T Electronic Imaging, 6070, 2006? 60700P. 10· Y· Mori,K. Tanahashi,and S. Tsuji,“Quantitative Evaluation of Mura in Liquid Crystal Display,95 Optical Engineering, 43(11), 2004, pp. 2696-2700. 11·曾彥馨,應用機器視覺於TFT面板之表面瑕疵檢測與分類,碩士論文,元智大 學工業工程與管理學系,中壢,2003。 12. B. C. Jiang, C. C. Wang, and H. C. Liu, ''Liquid Crystal Display Surface Uniformity Defect Inspection using Analysis of Variable Exponentially Weighted Moving Average Techniques9,9 International Journal of Production Research, 43,2005, pp. 67-80. 13. 陳志忠,液晶顯示器的像素點缺陷與相對亮度均一性之自動化檢測,碩士論文, 中原大學機械工程研究所,中壢,2000。 14. K. B. Lee, M. S. Κο, Τ. Μ. Κοο, and Κ. Η. Park et. al.? "Defect Detection Method for TFT-LCD panel based on Saliency Map Model", 2004 IEEE Region 10 Conference, A? 2004, pp. 21-24. 14 200844429 15* D· C. Lim,D. G· Seo,D· Η· Jeong, “Defect Classification for the Inspection of TFT-LCD Glass99, Proceedings ofSPIE Optomechatronic Machine Vision, 6051, 2005, 6051 OF. 16.趙新民,應用非線性擴散於非同質性紋路之IT〇導電玻璃表面檢測,碩士論文, 元智大學工業工程與管理學系,中壢,2003。 17·邱學源,導光板品質自動檢測系統之研製,碩士論文,國立高雄第一科技大學機 械與自動化工程系,高雄,2004。 18·蔡英男,應用影像處理與類神經網路於偏光膜瑕疵辨識,碩士論文,國立台灣科 技大學高分子工程系,台北,2003。 19· K· Nakashima,,’Hibrid Inspection System for LCD Color Filter Panels,,, Instrumentation and Measurement Technology Conference Proceedings, IMTC/94, 1994 ? pp. 689-692. 20. R. C. Gonzalez and R. E. Woods, Digital Image Processings New York: Addison-Wesley, 1992.Polarizer ", United States Patent 4289381, 1981. 3. Kelimann and Fritz, Polarizer for Infrared Radiation, ', United States Patent 5177635 1993. 4 4. Song Dacheng, "Introduction to Polarized Film", Industrial Materials, No. 140, 1998, Pp. 118-126. 5. Huang Chaoyi, “Introduction to Polarizing Films”, Optoelectronics Industry and Technical Information, No. 20, 1999, pp. 40-47. 6. Liu Yijun, “Principles and Applications of Polarizing Films”, Industrial Materials, No. 188, 2002, pp. 153-159. 7. Wen Shuheng, “Coating Defect Elimination Method – Turning Decay into Magic”, Industrial Materials, No. 205, 2004, pp. 98-105. 8. Zhang Yonghan, “Introduction to the Application of Precision Coating Technology in Optical Films for Flat Panel Displays”, Industrial Materials, No. 211, 2004, pp. 127-136. 9. JH Kim and BA Barsky, uHuman Vision Based Detection of Non-Uniform Brightness on LCD Panels", Proc. Of SPIE4S&T Electronic Imaging, 6070, 2006? 60700P. 10· Y· Mori, K. Tanahashi, and S. Tsuji, “Quantitative Evaluation of Mura in Liquid Crystal Display, 95 Optical Engineering, 43(11), 2004, pp. 2696-2700. 11·Zeng Yanxin, Application of Machine Vision to Surface Detection and Classification of TFT Panels, Master thesis, Yuan Department of Industrial Engineering and Management, Chiku University, China, 2003. 12. BC Jiang, CC Wang, and HC Liu, ''Liquid Crystal Display Surface Uniformity Defect Inspection using Analysis of Variable Exponentially Weighted Moving Average Techniques9,9 International Journal of Production Research, 43,2005, pp. 67-80. 13. Chen Zhizhong, Automated Detection of Pixel Point Defects and Relative Brightness Uniformity of Liquid Crystal Display, Master Thesis, Institute of Mechanical Engineering, Chung Yuan Christian University, Zhongli, 2000. 14. KB Lee , MS Κο, Τ. Μ. Κοο, and Κ. Η. Park et. al.? "Defect Detection Method for TFT-LCD panel based on Saliency Map Model", 2004 IEEE Region 10 Conference, A? 2004, pp. 21-24. 14 200844429 15* D· C. Lim, D. G· Seo, D· Η· Jeong, “ Defect Classification for the Inspection of TFT-LCD Glass99, Proceedings ofSPIE Optomechatronic Machine Vision, 6051, 2005, 6051 OF. 16. Zhao Xinmin, Application of Non-homogeneous Diffusion in Non-homogeneous Textures of IT Conductive Glass Surface Inspection, Master Thesis, Yuan Department of Industrial Engineering and Management, Chiba University, China, 2003. 17. Qiu Xueyuan, Development of Automatic Light Detection System for Light Guide Plate, Master's Thesis, Department of Mechanical and Automation Engineering, Kaohsiung First University of Science and Technology, Kaohsiung, 2004. 18·Cai Yingnan, Applied Image Processing and Neural Network for Polarized Film Recognition, Master Thesis, Department of Polymer Engineering, National Taiwan University of Technology, Taipei, 2003. 19·K· Nakashima,, 'Hibrid Inspection System for LCD Color Filter Panels,,, Instrumentation and Measurement Technology Conference Proceedings, IMTC/94, 1994 ? pp. 689-692. 20. RC Gonzalez and RE Woods, Digital Image Processings New York: Addison-Wesley, 1992.

21. 鍾國亮,“影像處理與電腦視覺”,臺北:東華書局,2002。 22. N. Otsu, A threshold selection method from gray-level histogramM? IEEE Transaction on System, Man, and cybernetics, 9(1), 1979, pp. 62-66. 23. J. Weickert5 ,fA Real-Time Algorithm for Assessing Inhomogeneities in Fabrics'1, Real-Time Imaging, 5,1999, pp. 15-12. 24. R. M. Haralick and L. G. Shapiro, Computer and Robot Vision, New York: Addison-Wesley, 1992, pp. 639-658. 25. A. Khotanzad, H. Banerjee and M. D. Srinath, UA vision system for inspection of ball bonds and 2-D profile of bonding wires in integrated circuits99, IEEE Transactions on Semiconductor Manufacturing, no. 4, vol.7? 1994, pp. 413-422. 26· Η· K· Lee and S· I· Yoo,“A method for inspection of ball bonds in integrated circuits”,Systems,Man,and Cybernetics, IEEE SMC,99 Conference Proceedings, 2(12-15),1999, pp. 975-980. ’ 27. L. Higgins, L. G. Bahler, and J. E. Porter,MVoice Identification using Nearest-Neighbor Distance Measure." Proc. ICASSP, 1993, pp. 375-378. 28. 郭建廷,應用影像處理之技術於品質管理系統之研究一以信用卡檢測為例,碩士 論文,長榮管理學院經營管理研究所,台南,2001。 、 【發明内容】 本專利發明包含增亮膜瑕疵影像之前置處理方法;亦即影像強化 (Image enhancement)與二值化影像處理方法,後承接瑕疵影像幾何特徵擷 取法,最後將不同瑕疵種類以機率神經網路與K個最鄰近鄰居法兩分類器 分類之。 15 200844429 ι·影像前置處理 增痛上最主要難以_的_駿佈不均而產生之波紋(心a)和 條紋,此種瑕録視覺外觀±色_化較小,糾氣泡或是異物等瑕 絲容易分辨出來,需要使⑽殊之影像增龄法來對縣贼影像又 進行處理後才得以凸顯贼之雜與位置。故本專利翻制空間域 之”直方®均等化”與”區域性統計參數處理法,,騎亮膜影像進行影 像增強。 … 1·1 直方圖均等化(Histogram Equalization) 70整無瑕疵之增亮膜影像其整張影像的灰階值集中在某一小範圍 内,且其灰階值變異程度非常小。在具有瑕_增亮膜影像中,因瑕 症所在區域像素點灰階值較其他無则^部分灰階值變化大,因此瑕庇 所在區域之像素點灰階值類減較無瑕狀增細影像大。然而不 論是有瑕窥或無瑕疯之增亮膜影像,其灰階值變化均非常的微小,故 為了方便後續的影像增強的處理,本專利發明絲原始增亮膜瑕疫影 像進订直方’等化處理。直方圖鱗化法之物理意義為將原本灰階 值分佈太過於集中的灰階值重新擴散至灰階值〇〜255之間。經由直方 圖均等化處理過後的影像,其灰階值分佈範圍較廣且能夠更輕易的察 覺瑕疵分佈的情形。第二圖為增亮膜Mura瑕疵影像在經過直方圖均等 化法後之影像與其灰階值分佈的直方圖,第三圖則為第一圖之各瑕疵 影像經直方圖均等化之結果。 1·2影像強化(Image enhancement)—區域性統計參數處理法(L〇cal 16 20084442921. Zhong Guoliang, “Image Processing and Computer Vision”, Taipei: Donghua Book Company, 2002. 22. N. Otsu, A threshold selection method from gray-level histogramM? IEEE Transaction on System, Man, and cybernetics, 9(1), 1979, pp. 62-66. 23. J. Weickert5, fA Real-Time Algorithm For Assessing Inhomogeneities in Fabrics'1, Real-Time Imaging, 5, 1999, pp. 15-12. 24. RM Haralick and LG Shapiro, Computer and Robot Vision, New York: Addison-Wesley, 1992, pp. 639-658 25. A. Khotanzad, H. Banerjee and MD Srinath, UA vision system for inspection of ball bonds and 2-D profile of bonding wires in integrated circuits 99, IEEE Transactions on Semiconductor Manufacturing, no. 4, vol.7? 1994, Pp. 413-422. 26· Η·K· Lee and S·I· Yoo, “A method for inspection of ball bonds in integrated circuits”, Systems, Man, and Cybernetics, IEEE SMC, 99 Conference Proceedings, 2 (12 -15), 1999, pp. 975-980. ' 27. L. Higgins, LG Bahler, and JE Porter, MVoice Identification using Nearest-Neighbor Distance Measure." Proc. ICASSP, 1993, pp. 375-378. 28 Guo Jianting, application shadow Processing technology in the research of a quality management system in order to detect, for example a credit card, master's thesis, Institute of Management Evergreen School of Management, Tainan, 2001. [Description of the Invention] The patented invention includes a method for pre-processing a brightness enhancement film image; that is, an image enhancement and a binary image processing method, and a method for capturing the geometric feature of the image, and finally different types of images. It is classified by probability neural network and K nearest neighbor neighbors. 15 200844429 ι·Image pre-treatment is the most difficult to increase the pain _ _ Jun cloth uneven ripples (heart a) and stripes, this record visual appearance ± color _ smaller, rectification bubble or foreign body When the silk is easy to distinguish, it is necessary to make the (10) special image ageing method to deal with the county thief image before it can highlight the thief's miscellaneous and position. Therefore, the “Rectangle® Equalization” and “Regional Statistical Parameter Processing Method” of this patent revolving space domain, image enhancement by riding a bright film image. ... 1·1 Histogram Equalization 70 Innocent increase In the bright film image, the gray scale value of the whole image is concentrated in a small range, and the gray scale value variation degree is very small. In the image with 瑕 _ brightening film, the gray point value of the pixel in the area where the sputum is located is compared. Others have a large change in the grayscale value, so the grayscale value of the pixel in the area where the shelter is located is smaller than that of the non-sickness-enhanced image. However, the grayscale image of the brightening film image has a glimpse or no madness. The value changes are very small, so in order to facilitate the subsequent image enhancement processing, the original brightening film plague image of the patented invention is ordered to be equalized. The physical meaning of the histogram scale method is to set the original gray scale value. The grayscale values of the distribution that are too concentrated are redistributed to the grayscale values 〇~255. The images that have been processed by the histogram equalization have a wide range of grayscale values and can more easily detect the distribution of the 瑕疵. The second picture is the histogram of the image of the brightness enhancement film Mura瑕疵 image after the histogram equalization method and the distribution of the gray level value, and the third picture is the result of equalization of the histograms of the first image by the histogram. 2 Image enhancement - regional statistical parameter processing method (L〇cal 16 200844429

Statistics) ;、、、、携私疵衫像之局部區域進行影像增強,本專利發明使用區 ,圖”像處理方法結合統計的平均數(Mean)和標準差(StandardStatistics);,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,

Deviatio_影像進行處理。就影像增強而言,此方法以平均值和標準 差之概念來發展,其中平均數代表一個影像中平均灰階值之測量,而 心準差則代表對平均對比度之·,以此區域平均值和鮮差當做改 艾的基t it匕改變與影像中的每個像素附近的一個預先定義的區域中 的影像特性有關。 義個正方形遮罩(Mask)空間區域,將該遮罩的中心位置在 像素㈣逐點鶴’鮮軸方式為由左向右,由上往下依序處理影像 母像素,、:占直到整張影像均處理完畢為止,如第四圖所示,圖中 整張影像大小為16G X 12G像素,遮罩大小設定為5 χ 5,遮罩處理時在 如像上的四周分別會有—佔據2像素點之空白邊界產生,本專利發明 以鄰近像素點之灰階值填滿影像四周之空白邊界。 若像素(A狀紐值為加),在每讎素點㈣±計算其遮罩區域 内之灰階統計值,如區域平均值和_標準差。如何計算區域平均值 和區域標準差如下述[20]: 首先令4-離舰機魏,其代表棚在[GH]_餘階,並令 冰)為對應r的第/個值的正規化直方圖成分,其中冰)為灰階發生 之機率的估计。則可獲得r對其平均值的第"階動差(她定義為 陶: 17 (1) (1) 200844429 凡 00 = Σ(Γ/—尸/) ο 其中w是r的平均值(r的平均灰階值): L-l ° (2) 由⑴和⑺兩式可進-步可求得其二階動差(π施_)為 L-1 ΜΟ = Σλη - m)2p(rj " (3) 此二階矩即為4變異數;稱為如。標準差則定義為變異數的平方 根,也就是此二階矩的平方根;稱為σ(0。 接著定義-個固定大小的矩形作為執行區域直方圖統計處理的遮 罩。遮罩的大小非常重要’鮮太小無法_所賊的目的;相反地 太大則會產生過於模糊的影像且大大地增加程式的處理日摘,故—般 以3 X 3或5 X 5來作為遮罩的大小,本專利發明選用5 X 5作為遮罩= 小(x,_y)為一幅影像中一個像素的座標,令^代表影像像素點在任何 影像座標心)上的灰階值,令\表示為以座標㈣為中心的遮罩(子影 像Η第四_示,從公式⑺可計算^在^遮罩中所有像素點的平均灰 階值^^, ''Si為) ⑷ 其中〜是遮罩中在座標(〇)處的灰階值,而〆〜)為在座標CM)上灰階 值〜在〜遮罩中發生的機率。此時若將平均灰階值取代原先之 k ’則其效果等同於進行平均數過濾器(Meanfllter)之平滑(Sm00thing) 處理,上述平滑處理之目的在於消除原始瑕疵影像上的雜訊。 (5) (5)200844429 同理利用公式(3)可求帆遮罩内的像素灰階值標徵 ']2〆〜))2 故整張影像的每_像素() 纪你卜 白有其本身之氕〃與^^,此時可判斷整張 影像母一像素(X,W之A士括 “挪、、隹* " 值〜_與最小值Amln,進行下列之 &準差正規化灰階轉換,,,亦g卩 (°W - %min) (6) ' 錢W像像素點(以經“縣差正規化灰階值轉換”處理 後之新灰p自值。實務上―氣泡或異物雌之邊緣將會造成較大的 I’、若影像中_枝存在著氣_異物舰與M·,則此Mura瑕 ^域内之像素㈣準差正規化灰階值轉換,,處理後灰階值會變的非 常的小。為了克服這個特殊實務情況,如果〜』過_在公式⑹中 她疋為1G ’而且公式⑹巾%超聊祕其設定為⑺。 第五圖則為第三圖之各瑕疫影像先經公式⑷之5 χ 5遮罩平均數 過滤器之平滑處理,再經公式(5)觸求得平滑處理後之每—像素㈣ 之夂,最後經“標I差正規化灰階值轉換,,處理後之新灰階值瓜力 影像。由第五圖可知,上述平滑處理與“鮮差正規化灰階值轉換”處 理之功能與—般的邊緣制顧器如Sobel和prewitt #所呈現出來的 效果類似,但是所呈現出來的效果較s〇bel和prewitt來的模糊,其凸 顯出來的範圍不只瑕疯的輪廓,還包括瑕綱部的區域。後續的影像 強化則以此為依據,其好處是增強的部分不僅只有針對瑕疵邊緣,其 19 200844429 所增強的區域還包括瑕疵内部。 再判斷一像素點(x,3〇是否為瑕疵邊緣像素點,此方法主要是比較 、屋平β處理與標準差正規化灰階值轉換”處理後之區域標準差α和Deviatio_ images are processed. In terms of image enhancement, this method develops with the concept of mean and standard deviation, where the mean represents the measurement of the average grayscale value in an image, while the cardiac standard represents the average contrast, which is the regional average. The difference between the difference and the difference is related to the image characteristics in a predefined area near each pixel in the image. The square space of the mask is defined. The center position of the mask is in the pixel (four) point-by-point crane. The fresh axis mode is from left to right, and the image mother pixels are processed sequentially from top to bottom. After the image is processed, as shown in the fourth figure, the size of the whole image is 16G X 12G pixels, and the mask size is set to 5 χ 5. When the mask is processed, it will be occupied on the image. A blank boundary of 2 pixels is generated. The patented invention fills the blank boundary around the image with the gray scale value of the adjacent pixel. If the pixel (A value is added), the gray level statistics in the mask area, such as the regional average and _ standard deviation, are calculated at each pixel point (4). How to calculate the regional mean and regional standard deviation as follows [20]: First let the 4-off-board machine Wei, which represents the shed in the [GH]_ residual order, and let the ice be the normalization of the corresponding value of r The histogram component, in which ice) is an estimate of the probability of grayscale occurrence. Then get the "step difference of the mean of its r (she defined as Tao: 17 (1) (1) 200844429 where 00 = Σ (Γ / - 尸 /) ο where w is the average of r (r The average gray scale value): Ll ° (2) The second-order motion difference (π Shi _) can be obtained from (1) and (7) two equations (L) ΜΟ = Σλη - m)2p(rj " ( 3) The second moment is the 4th variance; called the standard deviation is defined as the square root of the variance, which is the square root of the second moment; called σ (0. Then define a fixed-size rectangle as the execution region Histogram statistical processing of the mask. The size of the mask is very important 'fresh too small can not _ the purpose of the thief; conversely too large will produce too blurred image and greatly increase the processing of the program, so 3 X 3 or 5 X 5 as the size of the mask, the patent invention uses 5 X 5 as the mask = small (x, _y) is the coordinate of one pixel in one image, so that ^ represents the image pixel in any image The grayscale value on the coordinate center, let \ denote the mask centered on the coordinate (four) (the sub-image Η fourth_show, from the formula (7) can calculate ^ all pixels in the ^ mask The average grayscale value of the point ^^, ''Si is) (4) where ~ is the grayscale value at the coordinate (〇) in the mask, and 〆~) is the grayscale value at the coordinate CM) ~ in the ~ mask The probability of occurrence. At this time, if the average grayscale value is replaced by the original k', the effect is equivalent to the smoothing (Sm00thing) processing of the average filter (Meanfllter), and the purpose of the smoothing processing is to eliminate the noise on the original image. (5) (5) 200844429 Similarly, the formula (3) can be used to find the pixel grayscale value in the sail mask '] 2 〆 ~)) 2 Therefore, the entire image of each _ pixel () In its own right, ^^, at this time, it can be judged that the entire image is a pixel (X, W's A includes "Nove, 隹* " value ~_ and minimum value Amln, and the following & Normalized gray-scale conversion,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, On the edge of the bubble or the foreign body, the edge of the female will cause a large I'. If there is a gas in the image, the foreign ship and the M., the pixel in the Mura瑕 domain (4) is normalized to the grayscale value conversion. After processing, the grayscale value will become very small. In order to overcome this special practice, if ~"over_ in formula (6) she becomes 1G' and the formula (6) towel is super-speaking and its setting is (7). Then, the plague images of the third figure are smoothed by the mask of the average mask of the formula (4), and then the smoothing process is performed by the formula (5), and then each pixel (four) is smoothed, and finally "marked I The difference normalized gray-scale value conversion, and the processed new gray-scale value melon force image. As can be seen from the fifth figure, the above-mentioned smoothing processing and the function of "fresh difference normalized gray-scale value conversion" processing and general edge preparation The effects of the devices such as Sobel and prewitt # are similar, but the effects are more blurred than that of s〇bel and prewitt, and the range that is highlighted is not only the outline of the madness, but also the area of the scorpion. Image enhancement is based on this, and the advantage is that the enhanced part is not only for the edge of the ,, but the area enhanced by 19 200844429 also includes the interior of the 。. Then judge a pixel (x, 3 〇 is the edge pixel, this The method is mainly to compare the regional standard deviation α of the treatment, the flattening β processing and the standard deviation normalized gray-scale value conversion.

Sxy 整體影像之灰階標準差平均值〜—,定義σ_4所有遮罩標準差 °Χν之平均值,亦即 Μ Ν ΣΣσ,^ ^ average = 土〇 户0The mean value of the gray scale standard deviation of the Sxy overall image ~—, defines the average value of all mask standard deviations of σ_4 °Χν, ie Μ Ν ΣΣσ, ^ ^ average = 土〇 0

MxN (7) 八中Μ與N為鱗寬與高所含像素數目,本專利發明之影像皆為_ 像素X 12G像素。若某—咬大於或等於,則將像素點㈣視 為需要灰階值轉換之像素點,其Μ為-個大於0的且不超過3的常 數,為了偵測出瑕絲緣像素點,必須將〜設定在〇至3之範圍内,這 疋基於吊㈣配在其平均數上下各三個鮮差之内的範_約包含所 有可能出現的像素灰階值的99·7%的概念所設定。令/(以代表影像像 素點在任何影像座標(以上的灰階值,且令心)代表在座標㈣上 轉換後之新灰階值,即 ,;;)。£ χ /(χ,少)若 σ 〜2 夂σ,_聊 /0,少) 其他 (8) 其中糾為敏的參數,抓频大於255則令為255,隨後將鄰 ’中移到相郝的像素位置上,並且重複以上的步驟直到整張影像上 所有的像_處理_,即錄公_換之_化結 果。第六_為第取她影像經公式⑻之轉換結果,其中嫩。 等參數設定分別為£ = 3和灸。=1。 、 20 200844429 1.3二值化影像分割 -值化去主要的目的疋要將_幅灰階影像當中所感興趣的主題或 目標,利贼階值的改㈣其凸_來使得感興_碰的灰階值 與背景的灰階值呈現完全減的黑白對比呈現則。為了使二值化後所 表現出來的瑕疲影像能夠有效的凸顯出瑕餘置與輪廊,二值化臨界 值選取法則的選用則顯得非常重要。本專利發明採用〇tsu网所提出 值化☆界H縛為—值化決定臨界值之賴。此搜尋二值化 A i值的原理為4找個門檻值,使得在各群集中之變異數的加權總 -和為最小。假設影像中有灰階值,為灰階值㈣像素點出 現次數’則影像中的總像素,每一個灰階值出現的祕 為: N (9) 如要將影像的灰階度分成兩個群體c。與ς,其中c。群體中所擁有的灰 ° 階度為〇〜k ;相同的抓群體中所擁有的灰階值為在 内。此兩群體產生的機率分別為w。和叫··MxN (7) Eight middle Μ and N are the number of pixels included in the scale width and height. The images of the present invention are all _ pixels X 12G pixels. If a bite is greater than or equal to, the pixel point (4) is regarded as a pixel point that needs grayscale value conversion, and the Μ is a constant greater than 0 and not more than 3, in order to detect the pixel edge of the silk edge, it is necessary to Set ~ in the range of 〇 to 3, which is based on the concept that the hang (4) is within the three fresh errors of the average number, and contains about 99.7% of all possible pixel grayscale values. set up. Let / (to represent the image pixel point at any image coordinate (the above grayscale value, and let the heart) represent the new grayscale value after conversion on the coordinate (4), ie, ;;). £ χ / (χ, less) if σ ~ 2 夂 σ, _ chat / 0, less) Other (8) where the parameter is corrected, the catch frequency is greater than 255, then 255, then move the neighbor 'to the phase Hao's pixel position, and repeat the above steps until all the image_processing_ on the entire image is recorded. The sixth is to take the conversion result of her image by formula (8), which is tender. The parameters are set to £=3 and moxibustion respectively. =1. , 20 200844429 1.3 Binary image segmentation - value of the main purpose of the gradual grayscale image of the theme or target of interest, the thief order value of the change (four) its convex _ to make the glory of the touch The grayscale value of the value and the background are completely reduced in black and white. In order to make the image of the fatigue after binarization effectively highlight the remaining position and the corridor, the selection of the binary selection threshold is very important. The patented invention adopts the value of 〇 网 网 ☆ ☆ 界 H 。 。 。 。 。 。 。 。 。 。 。 。 。 。 The principle of this search for binarized A i values is 4 to find a threshold so that the weighted total sum of the variances in each cluster is the smallest. Suppose there is a grayscale value in the image, which is the grayscale value (four) the number of pixel occurrences'. The total pixel in the image, the secret of each grayscale value is: N (9) If you want to divide the grayscale of the image into two Group c. With ς, where c. The ash ° gradation possessed by the population is 〇~k; the grayscale values possessed by the same captured population are within. The probability of these two groups is w. And called··

K == ^(k) /=〇 (11) μ = =1-雄) /=^+1 兩個群體的紐平均值"。和Μ為 ^〇-Σ~ /=0 冰〇 21 (12) 200844429 i=k+\ (13) 兩個群體的變異數%2和%2為: σ〇 =Σ(ζ·-"〇)2立 /=0 >^〇 (14)K == ^(k) /=〇 (11) μ = =1-male) /=^+1 The mean value of the two groups ".和Μ为^〇-Σ~ /=0 冰〇21 (12) 200844429 i=k+\ (13) The variances %2 and %2 of the two groups are: σ〇=Σ(ζ·-"〇) 2立/=0 >^〇(14)

,=“1 wx 則兩群體的變異數加權總和〜2為: aw = w〇cr〇2 (k) + \νλσχ2 (k) 利用上述之方法對所有灰階值分別進行其群體變異數之加權總和 計算後,可以求得所有灰階值的加權總和,其中加權總和為最小之灰 P白值即為所要的二值化臨界值[23]。經由上述二值化方法處理過後之瑕 庇〜像如第七圖’圖巾可清楚的看出包括、氣泡、條紋與異物等 種瑕/疵均可透過此二值化的方式將瑕疲的位置與形狀凸顯出來。 2·瑕疵影像幾何特徵擷取一最適橢圓法 (15) (16), = "1 wx then the weighted sum of the two groups of variances ~ 2 is: aw = w〇cr 〇 2 (k) + \νλσ χ 2 (k) Using the above method to weight all the gray scale values respectively After the sum is calculated, the weighted sum of all gray scale values can be obtained, wherein the weighted sum is the minimum gray P white value which is the desired binarization threshold [23]. After the processing by the above binarization method ~ As shown in the seventh figure, the towel can clearly see that the inclusions, bubbles, stripes, and foreign objects can highlight the position and shape of the fatigue through this binarization. Take an optimal ellipse method (15) (16)

本專利發明使用最適橢圓法闻聊6]進行增亮膜表面職幾何 特徵擷取,㈣二值化處理後之瑕絲像上有許多群雜絲素點, 丈可利用所有制£tj之瑕絲素點座標求出各個群體巾最適橢圓之幾 何特徵如瑕辆數、總瑕絲積、長軸長度、短軸長度和長短轴比值依據轉物賴蹄分_之讀,可觸舰麵為Μ·、乳泡、條料異物。在此我用财b像素點座標群計算出翻質心 (CentroidM^^t^fi,:J^r/A (r,c)eR (17) 22 200844429The patented invention uses the most suitable elliptical method to sneak 6] to perform the surface feature extraction of the brightness enhancement film. (4) After the binarization treatment, there are many groups of silk fibroin spots on the silk image, and the whole thread can be utilized. The geometric coordinates of the optimal ellipse of each group of towels, such as the number of vehicles, the total length of the silk, the length of the short axis, and the ratio of the length of the long and short axis, are calculated according to the coordinates of the points, and the surface of the ship can be touched. ·, milk foam, strip foreign matter. Here I use the financial b pixel coordinate group to calculate the reticle centroid (CentroidM^^t^fi,:J^r/A (r,c)eR (17) 22 200844429

c= ^c/A (r,c)eR (18) 其中 产:瑕疵像素點座標之X座標值 C :瑕疵像素點座標之座標值 及:瑕疵像素點集合 4:瑕疵像素點之總數 最適橢圓法計异出之主要幾何特徵為糖圓之長軸(Major axis)長 度、短軸(Minor axis)長度及橢圓面積。一張M X n之二值化影像,其 瑕’疵像素點之一階空間動差(Second order spatial moments)計算方式如 下[25]: 二階X轴動差:= Μ — = T,(^r)2/A r=\ (18) 二階7軸動差:/^ N =Σ(。- c=l (19) 二階混合動差:/^ N M =ΣΣ(卜 ·*—1 (20) 其中 (r,c):不規則像素點,像素灰階值為255 J):不規則像素點集合之質心 乂:不規則像素點之總數 當計算出這些二階動差之後,即能依這些不規則像素點找出最適 之橢圓,因此,橢圓之計算公式可重新被定義為[25]: 23 (21) =1200844429 dx d2 r d 1 d3 c 或 dxr2 + 2d2rc + d3c2 = 1 (22) 下[24] [25] [26]: 上述之D矩陣可以二階動差之特徵值重新表示令 D = d 1 d 2 _ 1 〜μ: d2 d3 _ 4(MrrMcc -MrC) μη (23) 當賤陣之4、d2、d3之值計算出來後可進—步推導出橢圓之長轴長 度、短軸長度以及其面積,其計算方式如下[24]: 2V2 + ^3) ~ V(^1 '~^y=+4df 長軸長度 (24) 2V2 短軸長度= VK +^3)+VK -^3)2 +4c/22 面積=了0 =W3 - β -W2 W3 - 第八圖即為第七圖增細瑕絲像經過檢測後執行最適擴圓量 測之範例。其瑕鋪類分別為Mm、氣泡、條紋與異物。在第八圖中 可清楚發現’ Mum與條紋瑕絲像上制出之_數大於丨,因此會 擷取到兩似上之橢圓特徵。為了方便後續之分類器之輸人,賴取 出之橢圓面積進行加總,而絲長度、姉長度與長姉之比值等則 取其平均值。第九圖為械影像經過最賴圓法分雛所獲得之瑕藏 幾何特徵測量數值。 (25) dl (26) 24 200844429 3·增亮膜瑕疫分類-K個最鄰近鄰居分類法㈣議对制神叫 KNN) K^«_n(KNN)來對增亮狀表面瑕疵 進行分類’並探討各個分顚之侧參數之最佳設定㈣近鄰居法 (Nearestneighbordedsicmrule)決定分類的方式為以最接近的某一鄰 居資料來決賴待分類樣本的類別。假如目前有—未知類別的樣本向 量v ’則我們在所有的資料點中找出與v最接近的一點^,並以心類 別來蚊v該歸人哪-類1數學式衫,齡滿足下舰件式時,將 V歸入Vk同一類[20]: dist(y -vk、S dist(y — v),i = 1,2,···,η,i 本 k ⑼ 可利用歐式距離(Euclidean distance)來量測未經分類之樣本與各類別之 距離:也/(v-h)。將最近鄰居決定法向上延伸,則可以演變成k個最 近鄰居決定法(k-nearest neighbor decision rule)。其是以k個最靠近的 鄰居投票決定(Voting)所屬類別。假設以Kj (k,x)表示在最靠近χ的k 個鄰居中隸屬於第j類的數目,則在滿足(k,χ) . ^ (k,χ)時, 根據k-NN法則將x歸入第j類。 4·增亮膜瑕疵檢測與分類之流程 本專利發明為利用影像處理、擷取瑕疲影像之幾何特徵和Kg分 類器進行增焭膜表面瑕疵之檢測與分類,其完整之檢測與分類流程圖 如第十圖所示,分別詳述如下: (1)前置影像處理 首先對原始的增亮膜影像進行直方圖均等化處理,使得整張影 25 200844429 像的灰階值會從縣群聚在小部分的灰階值個情況轉化成散佈在 〇〜2分之間。接___錄處理蝴_她對經過直 方圖均等化處理的瑕絲像進行影像強化。影像強化部分採取二階段 的方式進行,首先對其進行平滑處理與“標準差正規化灰階值轉換,,處 理’再經公式⑻轉狀雜歧。區辭均值處理具有去除影像雜訊 之妓。區域鮮鋼具有制影像灰階值卿變化區域之功 能’即可_瑕錄廓之形狀與位置上述影像強化處理過程可 保留瑕_部與外部輪叙f訊。糊〇tsu二值化方法⑽顯碱影 像之形狀與位置。 (2) 瑕疵幾何特徵之擷取 利用最適橢g法對二值化後之瑕/疵影像擷取其幾何特徵數值, 包括瑕疲影像之瑕鱗數、總瑕赫積、平均絲長度、平均短轴長 度與平均長短軸比值等。 (3) 分類器之分類結果 本專利發明選用KNN分類器作為Mura、氣泡、條紋與異物等 四種增壳膜表面瑕疲之分類工具。 【實施方式】 本專利發明個人電腦設備使用與IBM相容之電腦,個人電腦之中央 處理器(CPU)為 IntelPentium4 2.8G 處理器,記憶體(SDram)為 512MB。 使用之NIPCI-1409影像擷取卡與Watec公司WAT_2〇2B型灰階/彩色攝 〜機,其最大解析度為752x582像素,工作電壓為12VDC。光源設計採 26 200844429 用LED背光源’應用軟體採用National Instruments所開發之Measurement &Automati〇n(MAX)軟體。影像處理與瑕疵幾何特徵之擷取則採用c++ 程式语吕在Borland C++ 6.0的開發環境上撰寫。後續瑕疵分類則採 Matlab軟體來進行。 檢測樣本影像大小為像素,實際視野範圍大小為14mm x 10.5mm,影像之解析度可達到9〇w像素。針對增亮膜在生產過程中可 能出現次録為之械麵如Mum、氣泡、献和異物等進行瑕疲 Γ: 偵測。本實鱗-瑕__取之贼樣本為3()張,全部瑕疫影像 二圖(a)(b)與(c) 共計120張。30張施祕疵樣本影像如第十-圖⑻所示;直方圖均等 ,化之結果如軒-_)麻;經糟處理與“鮮差正聽灰階值轉換 ”處理後之影像如第十,)所示,所有Mwa贼樣本影像經公式⑻ 之轉換結果、經0tsu二值化與最適橢圓法分析後之影像則分別列於第十 同理’ 3G張氣核疵樣本影像如第十三酸第十四圖 υ 所不,30張線條瑕雜本影像如第十五嶋十六圖所㈣張異物瑕 疵樣本影像如第十七圖與第十八圖所示。 爛取·圓法對30張Mura、氣泡、條紋和異物等娜其幾何特徵, 包括瑕簡像之贼群數、触麵積、平均長軸長度、平均短轴長度 與平均長短軸比值等,#1取之幾何特徵資料分別列於第十九圖、第二十 圖、第二十—_第二十二圖。但由於所取得幾何特徵之尋位不同, 且在相同幾何特徵内不同瑕疯之 張^、瓣度嫩,故需伽 ^之戌何特徵數值進行正規化。此正規 27 200844429 化乃是採用統計方法之正規化,若將12G張贼影像當成_群體,計算 120張瑕疵影像之瑕疵群數的群體平均數和群體標準差,隨後依據公式 (28)對30張Mum、氣泡、條紋和異物等瑕疵影像之瑕疵群數進行正規 化。12G張瑕歸彡像之總喊面積、平均絲長度、平均雜長度與平 均長短軸比鮮幾何特徵練也分職行正規化,各種幾何特徵數值之 平均數與標準差如第二十三圖所示。正規化後的Mum、氣泡、線條與異 物瑕疲之幾何特徵數值分酬於第二十_、第二十五圖、第二十六圖 與第二十七圖。經過正規化後之瑕疵幾何特徵數值可減輕瑕疵分類之訓 練時間,較快_⑽狀態或制健之收斂效果錢高分義準確率。 其中V為經過正規化的瑕疵幾何特徵數值 A為瑕痖幾何特徵數值之群體平均數 σ為瑕疲幾何特徵數值之群體標準差 接著 ΚΝΝ分類器對增亮膜之表面瑕錢行分類,各種瑕龜 隨機各選取10組樣本進行網路訓練,故訓練樣本共4G組;列於第二十 八圖。各瑕疫樣本剩餘之2〇組則用來當作之測試樣本,共恥組 測試樣本;列於第二十九圖。第三十圖為不同κ值水準下,_對測 式樣本之平均辨識率。其中每—轉之κ值(κ=ι,2,3,切均重複依照 上述之隨機選取訓練與測試樣本之方式執行Μ次,並取此Μ次之平均 辨識率來代表此轉讀辭,以此方絲決定腿^之最紅值。由 第二十圖巾可輕易觀察出當K=1時,κ爾具有最大的平均辨識率為 28 200844429 故本專利路日jg膝括& & 1 ac= ^c/A (r,c)eR (18) Among them: X pixel coordinates X coordinate value C: 瑕疵 pixel point coordinate coordinates and: 瑕疵 pixel point set 4: 瑕疵 pixel points total optimal ellipse The main geometric features of the method are the length of the major axis of the sugar circle, the length of the minor axis and the area of the ellipse. A binarized image of MX n is calculated as follows: Second order X-axis motion difference: = Μ — = T, (^r ) 2/A r=\ (18) Second-order 7-axis motion difference: /^ N =Σ(.- c=l (19) Second-order mixed motion difference: /^ NM =ΣΣ(Bu·*—1 (20) where (r, c): Irregular pixel points, pixel grayscale value is 255 J): Centroid of irregular pixel point set: Total number of irregular pixel points After calculating these second-order motion differences, you can follow these Regular pixel points find the optimal ellipse, so the formula for ellipse can be redefined as [25]: 23 (21) =1200844429 dx d2 rd 1 d3 c or dxr2 + 2d2rc + d3c2 = 1 (22) next [24 ] [25] [26]: The above D matrix can be re-presented by the eigenvalues of the second-order motion difference such that D = d 1 d 2 _ 1 ~ μ: d2 d3 _ 4 (MrrMcc -MrC) μη (23) 4. After the values of d2 and d3 are calculated, the length of the long axis, the length of the short axis and the area of the ellipse can be derived. The calculation method is as follows [24]: 2V2 + ^3) ~ V(^1 '~^ y=+4df Long axis length (24) 2V2 Short axis length = VK +^3)+VK -^3)2 +4c /22 Area = 0 = W3 - β - W2 W3 - The eighth figure is an example of the seventh method of performing the optimum expansion measurement after the detection. The rafts are Mm, bubbles, stripes and foreign bodies. In the eighth figure, it can be clearly seen that the number of _Mum and the striped crepe is made larger than 丨, so that two similar elliptical features are captured. In order to facilitate the input of the subsequent classifier, the elliptical area taken up is summed, and the ratio of the length of the wire, the length of the 姊 and the length of the 姊 are taken as the average value. The ninth picture shows the measured values of the geometrical features of the mechanical images obtained by the most suitable method. (25) dl (26) 24 200844429 3· Brightening film plague classification - K nearest neighbor classification (4) Collision system called KNN) K^«_n(KNN) to classify brightening surface defects' And to explore the optimal setting of the parameters of each side of the branch (4) Nearest neighbor method (Nearestneighbordedsicmrule) determines the classification by the closest neighbor data to rely on the category of the sample to be classified. If there is currently a sample vector v ' of the unknown category, then we find the closest point to v in all the data points, and in the heart category, the mosquitoes should be returned to the human-class 1 mathematical shirt, and the age is satisfied. In the case of ship type, V is classified into the same class of Vk [20]: dist(y -vk, S dist(y - v), i = 1,2,···, η,i this k (9) Euclidean distance can be used (Euclidean distance) to measure the distance between unclassified samples and categories: also / (vh). Extending the nearest neighbor decision method, it can evolve into k nearest neighbor decision decision (k-nearest neighbor decision rule) It is the category of the voting of the nearest neighbors (Voting). It is assumed that Kj (k, x) represents the number of the jth class among the k neighbors closest to χ, and then satisfies (k, χ) . ^ (k, χ), according to the k-NN rule, x is classified into the jth class. 4. The process of brightness enhancement film detection and classification This patented invention uses image processing to capture the geometry of the image of fatigue The feature and Kg classifier are used to detect and classify the surface of the enamel film. The complete detection and classification flow chart is shown in the tenth figure. As described below: (1) Pre-image processing First, the original brightness enhancement film image is subjected to histogram equalization processing, so that the grayscale value of the whole image 25 200844429 image will be gathered from the county group in a small part of the grayscale value. Converted into scatter between ~2 points. ___record processing butterfly _ she image enhancement of the silk image after equalization of the histogram. The image enhancement part is carried out in a two-stage manner, first smoothing it Processing and "standard deviation normalized gray-scale value conversion, processing" and then formula (8) transformational mismatch. Area word mean processing has the effect of removing image noise. Regional fresh steel has the function of making image gray-scale value change area The shape and position of the 即可 瑕 瑕 上述 上述 上述 上述 上述 上述 上述 影像 影像 影像 影像 影像 与 与 与 与 与 与 与 与 与 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 The geometrical feature values of the binarized 瑕/疵 images are extracted using the optimal ellipsometry, including the number of 瑕 scales, total 瑕 积, average filament length, average short axis length and average length. Axis ratio, etc. (3) Classification result of classifier The patented invention selects KNN classifier as a sorting tool for surface fatigue of four kinds of shell-forming films such as Mura, bubbles, stripes and foreign matter. [Embodiment] The personal computer device of the patented invention uses a computer compatible with IBM. The central processing unit (CPU) of the personal computer is an Intel Pentium 4 2.8G processor, and the memory (SDram) is 512 MB. The NIPCI-1409 image capture card and the Watec WAT_2〇2B grayscale/color camera are used. The maximum resolution is 752x582 pixels and the operating voltage is 12VDC. Light source design 26 200844429 LED backlights 'application software using Measurement & Automati〇n (MAX) software developed by National Instruments. The image processing and the extraction of the geometric features are written in the development environment of Borland C++ 6.0 using the C++ programming language. Subsequent 瑕疵 classification is carried out using Matlab software. The sample size of the sample is measured as a pixel, and the actual field of view is 14 mm x 10.5 mm, and the resolution of the image can reach 9 〇w pixels. In the production process, the brightness-enhancing film may be subjected to sub-records such as Mum, bubbles, offerings and foreign objects, etc.: Detection. The actual scale - 瑕 __ taken the thief sample is 3 (), all plague images two pictures (a) (b) and (c) a total of 120. The sample images of 30 secret recipes are shown in the tenth-figure (8); the histograms are equal, and the results are as follows: Xuan-_) hemp; the image processed by the bad processing and the "difference positive gray scale value conversion" 10)), the image of all Mwa thief sample images converted by the formula (8), the image after the 0tsu binarization and the optimal ellipse method are listed in the tenth same as the '3G gas nucleus sample image as the tenth The fourteenth image of the triacid is not. The 30 lines are noisy. The image is as shown in the fifteenth and sixteenth figures. (IV) The foreign matter sample image is shown in Figures 17 and 18. The rotten and round method has 30 geometric features of Mura, bubbles, stripes and foreign objects, including the number of thieves, the contact area, the average long axis length, the average short axis length and the average length and length axis ratio. The geometric feature data of #1 is listed in the 19th, 20th, and 20th-20th. However, due to the different locating of the acquired geometric features, and the different singularity of the singularity and the sufficiency in the same geometrical features, it is necessary to normalize the eigenvalues of the gamma. This formal 27 200844429 is the normalization of statistical methods. If the 12G thief image is regarded as a group, the population average and group standard deviation of the number of 瑕疵 groups of 120 images are calculated, and then according to formula (28), 30 Normalize the number of groups of 瑕疵 images such as Mum, bubbles, stripes, and foreign objects. The total shouting area, average silk length, average miscellaneous length and average length and length of the 12G Zhang Yigui image are also normalized. The average and standard deviation of various geometric features are shown in Figure 23. . The normalized Mum, bubble, line and foreign body fatigue characteristics are paid in the twentieth, twenty-fifth, twenty-sixth and twenty-seventh. After the normalization, the geometric feature value can reduce the training time of the 瑕疵 classification, and the faster _(10) state or the convergence effect of the health and the high accuracy. Where V is the normalized 瑕疵 geometric feature value A is the 平均 geometric feature value of the group mean σ is the group standard deviation of the 几何 fatigue geometric feature value, then the ΚΝΝ classifier classifies the surface of the brightness enhancement film, various 瑕The turtle randomly selected 10 groups of samples for network training, so the training samples totaled 4G groups; listed in the twenty-eighth figure. The remaining 2 groups of each plague sample were used as test samples for the shame test samples; they are listed in Figure 29. The thirtieth figure shows the average recognition rate of _ to the test sample under different κ values. The κ value of each-turn (κ=ι, 2, 3, and the cuts are repeated in accordance with the random selection training and test samples described above, and the average recognition rate of the order is used to represent the translation. The square wire determines the red value of the leg ^. It can be easily observed from the twentieth towel. When K=1, the maximum average recognition rate of the k-k is 28 200844429, so the patent road day jg knee bracket &&; 1 a

1〇〇%的辨識率。若選取樣本編號22、19、 與10為訓練樣本,κ值設為i,其餘樣本』 辨識率100%。 本專利發日树騎錄佈辆亮默四絲硫錢行檢 測與分類,其成果如所述·· ⑴线所郎之紛_方法進行_,可有__膜瑕疫並偵 =增亮默四齡魏簡在德置,雜析度可達9卜/像素, 符口業界之最小解析度需求200w像素。處理_ 14xl05_大小, 且IX兩為160x120像素之瑕疯影像約需〇·295秒。在一般成捲式 塗佈製私巾,檢顯塗佈方向垂直長度為1Qmm,寬度為如咖之 橫列所需之處辦關為6·8秒,未來結合數個Ca_成—列並將 檢測程式最佳化後預計將可大幅縮短檢測之處理時間。 (2) 本專利發明所定義之瑕疵總類如Mura、氣泡、線條與異物中,其檢 測正確率與瑕疵分類辨識率皆可達1〇〇%,相當適合用以替代人工 目視進行之檢測作業。 (3) 利用最適橢圓法可有效地找出瑕疵位置與形狀,並擷取瑕疵部分之 幾何特徵數值:瑕症群數、總瑕疯面積、平均長軸長度、平均短軸 長度與平均長短軸比值等。可利用擷取出之幾何特徵數值作為分類 器之輸入資料進一步進行瑕疵種類辨識。 (4) 在KNN分類當中,當κ值設定為1時之KNN可達到最佳的辨識 29 200844429 ^ 々辨識率會隨著K值的增加而下降。KNN所需時間最 短只需0.05秒。 【圖式簡單說明】 第田 萍^視野範圍(F0V,刪 Of View# ⑻氣泡;(c)條紋;異t X 120像素:⑻明暗不均(Mura);1%% recognition rate. If sample numbers 22, 19, and 10 are selected as training samples, the κ value is set to i, and the remaining samples have a recognition rate of 100%. This patent is issued on the day of the tree riding and recording. The results of the test are as follows: (1) The line of the lang is the same as the method _, there may be __ membrane plague and detection = brightening The four-year-old Wei Jian is in the German, the degree of hygiesis can reach 9 b / pixel, the minimum resolution of the industry is 200w pixels. Processing _ 14xl05_ size, and IX two for 160x120 pixels of the crazy image about 〇 295 seconds. In the general roll-form coating of the private towel, it is found that the vertical direction of the coating direction is 1Qmm, and the width is as long as the position of the coffee is required to be 6.8 seconds. In the future, several Ca_ into the column are combined. Optimizing the test program is expected to significantly reduce the processing time of the test. (2) The general class of cockroaches defined by the patented invention, such as Mura, bubbles, lines and foreign bodies, has a detection accuracy rate and a 瑕疵 classification identification rate of up to 1%, which is quite suitable for the detection of artificial visual inspection. . (3) Using the optimal ellipse method, the position and shape of the sputum can be effectively found, and the geometrical values of the 瑕疵 part can be obtained: the number of sputum groups, the total madness area, the average long axis length, the average short axis length and the average length and length axis. Ratio and so on. The geometric feature values extracted can be used as the input data of the classifier to further identify the species. (4) In the KNN classification, the KNN can achieve the best recognition when the κ value is set to 1. 29 200844429 ^ The 々 recognition rate decreases as the K value increases. The time required for KNN is as short as 0.05 seconds. [Simple diagram description] Tian Tian Ping ^ field of view (F0V, delete Of View # (8) bubbles; (c) stripes; different t X 120 pixels: (8) light and dark uneven (Mura);

之灰階散紙(C) J寻化處理後之影像;⑻圖⑷之灰階值散佈圖 第三圖圖之各瑕簡像經直方圖均等化之結果:⑻明暗不均 (Mum),(b)氣泡;(c)條紋;⑷異物 弟四圖·區域性統計參數法之遮罩移動方式 第五圖· Ιΐί ^各贼师_纽後,躲“鮮差正規化灰階 _ ι處理後之影像:_暗不均_ra) ; (b)氣泡;(e)條紋; (d)異物 1 第八圖·第五圖之各瑕疲影像經公式⑻之轉換結果^ = 3和心=丨):⑻明暗 不均(Mura) ; (b)氣泡;(c)條紋;⑷異物 第七圖第㈣之各瑕細象經〇tsu二值化之結果:⑻明暗不均(Mum); (b)氣泡;(c)條紋;(φ異物 第八圖第七圖之各瑕疲影像經執行最適擴圓量測之範例 :(a)明暗不均 (Mura) ; (b)氣泡;(c)條紋;(d)異物 第九圖瑕疲影像經過最it橢圓法分析後所獲得之瑕疵幾何特 200844429 第十圖本專利發明完整之檢測與分類流程圖 第十一圖30張Mura瑕疵樣本影像··⑻原始瑕疵影像;⑼直方圖均等 處理;(c)經平滑處理與“標準差正規化灰階值轉換,,處理 第十二圖30張Mura瑕疵樣本影像:(a)經公式⑻之轉換結果;⑹經 一值化處理;(c)最適橢圓法分析後之影像 第十二圖30張氣泡瑕疵樣本影像:(a)原始瑕疵影像;(的直方圖均 處理;(c)經平滑處理與“標準差正規化灰階值轉換,,處理 第十四圖30張氣泡瑕疵樣本影像:(a)經公式(8)之轉換結果 〇 一值化處理;(c)最適擴圓法分析後之影像 第十五圖30張條紋瑕/疵樣本影像:(a)原始瑕症影像;(的直方圖均等 處理;⑹經平滑處理與“標準差正規化灰階值轉換”處理 第十六圖30張條紋瑕疵樣本影像:(a)經公式(8)之轉換結果 〇 二值化處理;(c)最適橢圓法分析後之影像 、 第十七圖30張異物瑕疯樣本影像:(a)原始瑕疲影像;作)直方圖均蓉 處理;(c)經平滑處理與“標準差正規化灰階值轉換,,處理 第十八圖30張異物瑕疵樣本影像:⑷經公式( υ 二值化處理;(c)最適橢圓法分析後之影像 %⑼a Utsu 第十九圖30張Mura瑕疵樣本影像之瑕疵群數、總瑕疵面積、 長度、平均短軸長度與平均長短軸比值等之幾何特徵資料又 第二十圖;3G張氣泡瑕絲本影像之瑕鱗數、總私疵面積 長度、平均短軸長度與平均長短軸比值等之幾何特徵資料 1 第二十-® 30 ^敝瑕絲本影像之瑕轉數、總贼面積 長度、平均短軸長度與平均長短軸比值等之幾何特徵資料 第-十二ϋ 3G $異物職樣本影像之瑕鱗數、總 長度、平均短軸長度與平均長短軸比值等之幾軸 第二十三® g行正規化之各種幾何特徵數值的群體平均數與群體標 31 200844429 第十四目3〇 mMura瑕疲樣本影像進行正規化後之各種幾何特徵數值 第十五圖3〇張氣泡瑕疵樣本影像進行正規化後之各種幾何特徵數值 第二十六》3〇張條紋瑕錄本影像進行正規化後之各種幾何特徵數值 第^-十七圖 ^ ^ 0張異物瑕疵樣本影像進行正規化後之各種幾何特徵數值 第十/又圖 、 回進行ΚΝΝ網路訓練之40組訓練樣本編號 第二十九圖80組測試樣本編號 【主要元件符號說明】 32Grayscale paper (C) J image after processing; (8) Gray scale value scatter diagram of Fig. 4 (4) The results of the equalization of the simple images of the third image are: (8) unevenness of light and darkness (Mum), (b) air bubbles; (c) stripes; (4) foreign body four figures · regional statistical parameter method of the mask movement mode fifth picture · Ιΐί ^ each thief teacher _ New Zealand, hiding "fresh difference normalized gray level _ ι processing After the image: _ dark uneven _ra); (b) bubbles; (e) stripes; (d) foreign matter 1 The eighth picture · the fifth picture of each fatigue image converted by the formula (8) ^ = 3 and heart =丨): (8) light and dark unevenness (Mura); (b) air bubbles; (c) stripes; (4) foreign matter seventh picture (4) of the fine images of the 〇tsu binarization results: (8) light and dark unevenness (Mum) (b) Bubbles; (c) Stripes; (Examples of the optimum expansion of the image of each of the fatigue images of the eighth figure in the eighth figure of the φ foreign object: (a) unevenness of light and darkness (Mura); (b) air bubbles; (c) streaks; (d) foreign matter ninth figure 瑕 fatigue image obtained after the most it elliptic method analysis 瑕疵 geometry special 200844429 tenth figure this patent invention complete detection and classification flow chart eleventh figure 30 sheets Mura瑕疵Sample image··(8) (9) Histogram equalization; (c) smoothing and "standard deviation normalized gray-scale value conversion, processing twelfth picture 30 sheets of Mura瑕疵 sample image: (a) conversion result by formula (8); (6) After binarization; (c) Image after optimal ellipse analysis Twelfth image 30 bubbles 瑕疵 sample image: (a) original 瑕疵 image; (the histogram is processed; (c) smoothed and Standard deviation normalized gray-scale value conversion, processing the fourteenth bubble 30 瑕疵 sample image: (a) the conversion result of the formula (8) 〇 value processing; (c) the image after the optimal expansion method The fifteenth figure 30 stripe 瑕 / 疵 sample image: (a) original sputum image; (histogram equalization; (6) smoothed and "standard deviation normalized grayscale value conversion" processing 16th 30th Stripe 瑕疵 sample image: (a) converted by the formula (8) 〇 binarization; (c) image after optimal ellipse analysis, 17th image 30 images of foreign body madness sample: (a) original 瑕Weak image; made) histogram uniform processing; (c) smoothed processing and "standard deviation normalized gray Value conversion, processing 18th image of 30 foreign objects 瑕疵 sample image: (4) by formula ( υ binarization; (c) image after analysis of optimal ellipse method (9) a Utsu 19th image 30 sheets of Mura 瑕疵 sample image The geometric characteristics of the number of 瑕疵 groups, total 瑕疵 area, length, average short axis length and average length and length axis are also twentieth; 3G 瑕 瑕 本 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 影像 3 3 Geometric characteristics such as the ratio of the length of the shaft to the average length and length of the axis 1 The geometric characteristics of the twentieth-- 30 敝瑕 本 本 影像 image, the total thief area length, the average short axis length and the average length and length axis ratio - Twelve ϋ 3G $ 异 职 、 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异 异Group standard 31 200844429 The fourteenth item 3 〇 瑕 瑕 样本 样本 sample image after normalization of various geometric characteristics of the value of the fifteenth Figure 3 〇 瑕疵 瑕疵 瑕疵 瑕疵 sample image normalization of various geometric characteristics of the value of the twentieth 》3 瑕 瑕 瑕 瑕 瑕 影像 影像 影像 影像 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规 正规Network Training 40 Group Training Sample Numbers 29th Figure 80 Group Test Sample Number [Main Component Symbol Description] 32

Claims (1)

200844429 十、申請專利範圍: 1·一種利用區域性統計參數(L〇cai statistics)、最適橢圓法(Best fitting ellipse)與最鄰近鄰居法(K_Nearest Neighb〇r,KNN)偵測 與为類塗佈式增免膜表面瑕/疵之自動光學檢測方法,包含: 以區域性統計麥數進行影像強化,進而判斷表面瑕疵之位置, 以最適橢圓法擷取表面瑕疵之五種幾何特徵數值,最鄰近鄰居 法則分類各幾何特徵數值以辨識瑕疵種類。 r , 2·如申請專利範圍第1項之方法,包含·. 偵測與分類之塗佈式增亮膜表面瑕疲包括明暗不均(Uneveness or Mura)、氣泡(Bubble)、線條(Streak)與異物(Contamination)等 四種瑕疵。 3·如申睛專利範圍第1項之方法,進一步地包含: 〇 _域性統計參數進行影像強化,首先以區域性鮮差進行正 規化之灰階值轉換,亦即 /㈣=7~^255, S max min ) 其中/&,;0代表像素點(以經轉概之新灰階值,〜為像素點 未經轉換前之區域性灰階標準差,、與、分別為整張影像未 經轉換前的區域性灰階標準差之最大值與最小值,如果%隨超 過10則被指定為10,%超過1〇亦將其設定為1〇。 33 200844429 4·如申請專利範圍第3項之方法,包含: 後續令表/〇:,>〇再次轉換後之新灰階值,亦即 g(x = 右 σ Sxy k k〇CT 〇yerage 其中σ〜代表像素點b,>0以/(X,y)灰階值計算而得之區域性灰階 h準差則為整體影像每一像素點之/(U)區域性灰階 標準差平均值,亦即 Μ Ν ΣΣσ、 σ average = , MxN 其中μ與ν為影像寬與高所含像素數目,£和^為指定的參數, 若^值大於255則令為255。 5·如申晴專利範圍第1項之方法,進一步地包含: 最適橢圓法擷取表面瑕疵之五種幾何特徵數值包括瑕疵群數、 瑕疫面積、長軸長度、短軸長度和長短軸之比值。 6·如申請專利範圍第1項之方法,進一步地包含: 最鄰近鄰居法之Κ值設為1。 34200844429 X. Patent application scope: 1. A method using the regional statistical parameters (L〇cai statistics), Best fitting ellipse and nearest neighbor method (K_Nearest Neighb〇r, KNN) to detect and coat The method for automatic optical detection of 瑕/疵 on the surface of the film, including: image enhancement by regional statistical wheat number, and then determining the position of the surface flaw, and extracting the five geometric characteristic values of the surface flaw by the optimum ellipse method, the nearest neighbor The neighbor rule classifies the geometric feature values to identify the type of 瑕疵. r , 2 · The method of claim 1 of the patent scope includes: · Detection and classification of coated brightening film surface fatigue including Uneveness or Mura, Bubble, Streak Four kinds of defects such as Contamination. 3. The method of claim 1 of the scope of the patent application further includes: 〇 _ domain statistical parameters for image enhancement, firstly, the gray-scale value conversion is normalized by regional difference, that is, / (four) = 7~^ 255, S max min ) where /&,;0 represents a pixel point (by the new grayscale value of the transition, ~ is the regional grayscale standard deviation before the pixel is converted, and is, respectively, the whole sheet The maximum and minimum values of the regional gray scale standard deviation before the image is not converted. If % is more than 10, it is specified as 10, and % is more than 1〇, which is also set to 1〇. 33 200844429 4·If the patent application scope The method of item 3, comprising: a subsequent grayscale value of the subsequent order table /〇:,>〇, that is, g(x = right σ Sxy kk〇CT 〇yerage where σ~ represents pixel point b, &gt The regional gray scale h standard deviation calculated by the / (X, y) gray scale value is the average value of the / (U) regional gray scale standard deviation of each pixel of the overall image, that is, Μ Ν ΣΣ σ σ average = , MxN where μ and ν are the number of pixels in the image width and height, and £ and ^ are the specified parameters, if the value is large In 255, the order is 255. 5. The method of the first paragraph of the Shenqing patent scope further includes: The optimum ellipse method for extracting five kinds of geometric features of the surface 瑕疵 includes the number of 瑕疵 groups, the plague area, the length of the long axis, The ratio of the length of the short axis to the length of the short axis. 6. The method of claim 1, further comprising: setting the value of the nearest neighbor method to 1. 34.
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