TW200825432A - Electronic component testing equipment - Google Patents
Electronic component testing equipment Download PDFInfo
- Publication number
- TW200825432A TW200825432A TW096139625A TW96139625A TW200825432A TW 200825432 A TW200825432 A TW 200825432A TW 096139625 A TW096139625 A TW 096139625A TW 96139625 A TW96139625 A TW 96139625A TW 200825432 A TW200825432 A TW 200825432A
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- electronic component
- bracket
- tst
- plate
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 317
- 230000013011 mating Effects 0.000 claims description 28
- 238000003825 pressing Methods 0.000 claims description 8
- 230000032258 transport Effects 0.000 description 20
- 238000003860 storage Methods 0.000 description 18
- 238000012546 transfer Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 6
- 230000008646 thermal stress Effects 0.000 description 5
- 239000000969 carrier Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000001179 sorption measurement Methods 0.000 description 2
- 239000007858 starting material Substances 0.000 description 2
- 230000035882 stress Effects 0.000 description 2
- 241000219112 Cucumis Species 0.000 description 1
- 235000015510 Cucumis melo subsp melo Nutrition 0.000 description 1
- 101000572983 Rattus norvegicus POU domain, class 3, transcription factor 1 Proteins 0.000 description 1
- FJJCIZWZNKZHII-UHFFFAOYSA-N [4,6-bis(cyanoamino)-1,3,5-triazin-2-yl]cyanamide Chemical compound N#CNC1=NC(NC#N)=NC(NC#N)=N1 FJJCIZWZNKZHII-UHFFFAOYSA-N 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000994 depressogenic effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2006/324482 WO2008068869A1 (fr) | 2006-12-07 | 2006-12-07 | Matériel de test de composants électroniques |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200825432A true TW200825432A (en) | 2008-06-16 |
| TWI349108B TWI349108B (fr) | 2011-09-21 |
Family
ID=39491788
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW096139625A TW200825432A (en) | 2006-12-07 | 2007-10-23 | Electronic component testing equipment |
Country Status (2)
| Country | Link |
|---|---|
| TW (1) | TW200825432A (fr) |
| WO (1) | WO2008068869A1 (fr) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114123008B (zh) * | 2021-12-09 | 2024-05-17 | 国网宁夏电力有限公司银川供电公司 | 10kV中置开关柜通用型智能验电小车 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11183567A (ja) * | 1997-12-24 | 1999-07-09 | Ando Electric Co Ltd | キャリア搬送機構 |
| JP2001235512A (ja) * | 2000-06-13 | 2001-08-31 | Advantest Corp | 電子部品試験装置 |
-
2006
- 2006-12-07 WO PCT/JP2006/324482 patent/WO2008068869A1/fr not_active Ceased
-
2007
- 2007-10-23 TW TW096139625A patent/TW200825432A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| TWI349108B (fr) | 2011-09-21 |
| WO2008068869A1 (fr) | 2008-06-12 |
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