TW200811300A - A treatment method of metalization of metal or ceramic substrate - Google Patents
A treatment method of metalization of metal or ceramic substrate Download PDFInfo
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- TW200811300A TW200811300A TW95130377A TW95130377A TW200811300A TW 200811300 A TW200811300 A TW 200811300A TW 95130377 A TW95130377 A TW 95130377A TW 95130377 A TW95130377 A TW 95130377A TW 200811300 A TW200811300 A TW 200811300A
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- layer
- metal
- conductive layer
- substrate
- plating
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- 239000000758 substrate Substances 0.000 title claims abstract description 33
- 229910052751 metal Inorganic materials 0.000 title claims abstract description 27
- 239000002184 metal Substances 0.000 title claims abstract description 27
- 238000000034 method Methods 0.000 title claims abstract description 14
- 238000001465 metallisation Methods 0.000 title claims abstract description 12
- 239000000919 ceramic Substances 0.000 title claims abstract description 11
- 239000010949 copper Substances 0.000 claims abstract description 15
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 10
- 229910052802 copper Inorganic materials 0.000 claims abstract description 8
- 239000011651 chromium Substances 0.000 claims abstract description 5
- 238000009713 electroplating Methods 0.000 claims abstract description 5
- 239000010936 titanium Substances 0.000 claims abstract description 5
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims abstract description 3
- 229910052719 titanium Inorganic materials 0.000 claims abstract description 3
- 238000007747 plating Methods 0.000 claims description 14
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 claims description 8
- 238000000576 coating method Methods 0.000 claims description 8
- 238000005516 engineering process Methods 0.000 claims description 8
- 239000011248 coating agent Substances 0.000 claims description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 5
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 3
- 229910052759 nickel Inorganic materials 0.000 claims description 3
- 150000004767 nitrides Chemical class 0.000 claims description 3
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 claims description 2
- CXOWYMLTGOFURZ-UHFFFAOYSA-N azanylidynechromium Chemical compound [Cr]#N CXOWYMLTGOFURZ-UHFFFAOYSA-N 0.000 claims description 2
- 239000000463 material Substances 0.000 claims description 2
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 claims description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims 2
- 101100008046 Caenorhabditis elegans cut-2 gene Proteins 0.000 claims 1
- 229910010293 ceramic material Inorganic materials 0.000 claims 1
- 235000003642 hunger Nutrition 0.000 claims 1
- -1 nickel nitride Chemical class 0.000 claims 1
- 238000005121 nitriding Methods 0.000 claims 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims 1
- 238000009413 insulation Methods 0.000 abstract description 9
- 238000005240 physical vapour deposition Methods 0.000 abstract description 9
- 238000004381 surface treatment Methods 0.000 abstract description 6
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 abstract description 2
- 229910052804 chromium Inorganic materials 0.000 abstract description 2
- 239000010410 layer Substances 0.000 description 32
- 238000004519 manufacturing process Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 239000011889 copper foil Substances 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005253 cladding Methods 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 210000003298 dental enamel Anatomy 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005242 forging Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- QGLKJKCYBOYXKC-UHFFFAOYSA-N nonaoxidotritungsten Chemical compound O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 QGLKJKCYBOYXKC-UHFFFAOYSA-N 0.000 description 1
- 238000011112 process operation Methods 0.000 description 1
- 229910001930 tungsten oxide Inorganic materials 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Other Surface Treatments For Metallic Materials (AREA)
Abstract
Description
200811300 九、發明說明: 【發明所屬之技術領域】 一 本發明為有關於一種金屬或陶瓷基材金屬化處理方法,特別 •是指基板經金屬化鍍膜處理後,品質穩定,可提升高功率LED模組 散熱需求與使用效率。 【先前技術】 按,以現行既有基板的製造技術,主要係於一金屬基板(通常 •為鋁板)上施以一層具有導熱功能之絕緣膠,於絕緣膠上黏貼附有 -層厚約15條義屬,_高溫高壓環境下將鋪金屬壓合 於至屬基板上結合。由於銅金屬必須藉助絕緣膠與金屬基板, 在金屬基板的邊緣因應力集中的關係,會使得銅箔金屬層無法完 王!口合’甚至其間含有氣泡,也會使得結合性變差,導致鍾曲現 象,若是絕緣膠塗佈不均勻,亦會造成銅箔金屬層壓合後難以控 制其平坦度問題。 • a現階段—種高功率的LED為未來發展方向,目此現行的金屬基 板是所使用之導熱絕緣膠再經高功率LED模組運作時所產生的數 ,付(w)高溫狀態下’該導舰轉即無法騎產生的高溫,因此 膠體遇高溫即形成軟化,這時便會使得所結合之_金屬產生剝 離現象’魏於_製簡侧、定辦雜會大大影響。 【發明内容】 本發社要課題在_決上述高功率⑽基板目導熱絕緣效 率不佳所引起的相關問題’同時可以提高高功率led之效率與使用 5 200811300 壽命,進而使得基板品質、生產效率、成本及品質穩定度均高於 習知壓合技術。 r 本發明之主要目的,即表於提供一種具有鍍膜層之金屬或陶 #瓷基材’運用卿(Physical Vapor Deposition)批次級連續表 面處理技術,於金屬或陶瓷基材上依序形成一均勻之導熱絕緣層 及一均勻之導電層,後續再以電鍍技術於導電層上電鍍以達導電 層所需應用之增厚。 _ 本發明之次一目的,即在於提供一種一貫化製程作業,針對 '孟屬或陶瓷基材金屬化處理方式,將基材藉由PVD處理技術能使導 '…、、、巴緣層構成之成分以原子級狀態呈現均勻且確實的附著於基材 上’後績亚以PVD方式鍍覆導電層於導熱絕緣層上,最後一道續製 程以電鍍金屬方式增厚導電層輯需厚度;由於導熱絕緣層與導 電層均MPVD方式鍍覆技術處理,故基材、導熱絕緣層、導電層 之間得以達到具有穩定的結合效果。 ’ 【實施方式】 *有關於本發明為達上述目的、特__的技術手段及其功 技例舉較佳實施例並配合圖式說明如下: -請參閱第_圖至第三圖所示,本發明為—種金屬或陶絲材 二,_方法’其主要係於_上結合有導熱絕緣層2及 ¥包層3,其處理步驟為: 步驟―、基材1為金屬或陶兗基材,基材1可為銘⑻、銅 6 200811300 (Cu)、氧化鋁(Al2〇3)、氧化锆(Zr〇2)等材質; 步驟二、將基材1表面鍍覆一層導熱絕緣層2,該導熱絕緣層2 r 主要成分為氧化鋁(AI2O2)、氮化鋁(A1N)、氧化砍(Si〇D、氧化铪 • ⑽⑹及氧化鎢(W〇2)、氮化鉻((^)、氮化鈦(1^)、氮化鎳釩 (NiVN)等成分,由這些成分每種均可實施成為導熱絕緣層2,每種 成分均可由PVD批次級連續表面處理技術將其鍍覆於基材1表面, 達到具有高導熱效率與絕緣效果; • 步驟三、於導熱絕緣層2上以PVD批次級連續表面處理技術鍍 -覆導電層3,該導電層3包含以鉻(Cr)、鋁(41)、鈦(1^)、鎳(1^)、 銅(Cu),每種金屬成分均可實施成為導電層3,達到具有導電效果 之金屬鍍層。 步驟四、將具有導電功能之導電層3利用電鍍技術方式處理, 該電鍍層4為銅(Cu)電鍍層或其他金屬電鍍層,該電鍍層4結合於 V電層3上,依設計需求增後至所需厚度,以達到最佳傳導功率。 • 另外’在步驟三中,導熱絕緣層2所包含的成分,包含可以PVD 方式鍍著之導熱絕緣氧化物、氮化物、碳化物等均可以複合於導 .熱絕緣層2中。_含有這魏化物、氮錄、碳化物的導°熱絕緣 —鍍層2 ’可以與喊或是金屬材質之基财良好而穩定的結合。 【圖示簡單說明】 第一圖所示係本發明金屬基材結構剖面示意圖。 第二圖所示係本發明分層結構示意圖。 7 200811300 第三圖所示係本發明製造步驟流程圖。 【主要元件符號說明】 1. ···.····..··基材 2. · ....... · · · ·導熱絕緣層 3.............鍍膜層 4.. · .........電鍛層200811300 IX. Description of the invention: [Technical field of invention] A invention relates to a metallization treatment method for a metal or ceramic substrate, in particular, the method is characterized in that the substrate is subjected to metallization coating treatment, the quality is stable, and the high-power LED can be improved. Module cooling requirements and efficiency. [Prior Art] According to the current manufacturing technology of existing substrates, mainly on a metal substrate (usually • aluminum plate), a layer of insulating adhesive with thermal conductivity is applied, and a layer of about 15 is attached to the insulating adhesive. Article genus, _ high temperature and high pressure environment, the metal is laminated to the substrate. Since copper metal must rely on insulating glue and metal substrate, the copper foil metal layer cannot be finished due to stress concentration at the edge of the metal substrate! The mouth' even contains bubbles, which may cause the bonding to deteriorate, resulting in a bell-curve phenomenon. If the insulating coating is unevenly applied, it may cause difficulty in controlling the flatness of the copper foil after lamination. • a current stage – a kind of high-power LED is the future development direction. The current metal substrate is the number of heat-conductive insulating rubber used and then operated by high-power LED module, pay (w) high temperature state' The guide ship can not ride the high temperature generated, so the gel will soften when it encounters high temperature. At this time, the metal-debonding phenomenon of the combined metal will be greatly affected. SUMMARY OF THE INVENTION The subject of the present invention is to solve the related problems caused by the poor thermal conductivity of the high-power (10) substrate, and to improve the efficiency of the high-power LED and the life of the use of 5 200811300, thereby making the substrate quality and production efficiency. The cost and quality stability are higher than the conventional press-fit technology. r The main purpose of the present invention is to provide a metal or ceramic substrate with a coating layer, a physical Vapor Deposition batch-level continuous surface treatment technology, sequentially forming a metal or ceramic substrate. A uniform thermal conductive layer and a uniform conductive layer are subsequently plated on the conductive layer by electroplating to increase the thickness of the conductive layer. _ The second objective of the present invention is to provide a consistent process operation for the metallization treatment of the genus or ceramic substrate, and the substrate can be formed by the PVD processing technology. The composition is uniformly and surely adhered to the substrate in an atomic state. After that, the conductive layer is plated on the thermally conductive insulating layer by PVD, and the final continuous process is to thicken the thickness of the conductive layer by electroplating. Both the thermal conductive insulating layer and the conductive layer are treated by the MPVD plating technology, so that a stable bonding effect can be achieved between the substrate, the thermal conductive insulating layer and the conductive layer. [Embodiment] * The present invention is directed to the above-described objects, the technical means and the technical means thereof, and the preferred embodiments are described as follows: - Please refer to the figures _ to 3 The invention is a metal or ceramic wire 2, the method is mainly based on the thermal conductive insulating layer 2 and the outer cladding layer 3, and the processing steps are as follows: Step ―, the substrate 1 is metal or ceramic enamel The substrate 1 may be made of materials such as Ming (8), copper 6 200811300 (Cu), alumina (Al 2 〇 3), and zirconia (Zr 〇 2); Step 2: plating a surface of the substrate 1 with a thermal conductive layer 2, the thermal conductive insulation layer 2 r main components are alumina (AI2O2), aluminum nitride (A1N), oxidized chopping (Si〇D, yttrium oxide • (10) (6) and tungsten oxide (W〇2), chromium nitride ((^ ), titanium nitride (1^), nickel nitride vanadium (NiVN) and other components, each of which can be implemented as a thermally conductive insulating layer 2, each of which can be plated by PVD batch-level continuous surface treatment technology Covering the surface of the substrate 1 to achieve high thermal conductivity and insulation effect; • Step 3, plating on the thermal conductive insulation layer 2 with PVD batch-level continuous surface treatment technology Layer 3, the conductive layer 3 comprises chromium (Cr), aluminum (41), titanium (1), nickel (1), copper (Cu), each of which can be implemented as a conductive layer 3, Step 4: The conductive layer 3 having a conductive function is treated by a plating technique, and the plating layer 4 is a copper (Cu) plating layer or another metal plating layer, and the plating layer 4 is bonded to the V electrical layer 3 Above, according to the design requirements, increase to the required thickness to achieve the best conduction power. • In addition, in step 3, the thermal insulation layer 2 contains components containing thermally conductive insulating oxides and nitrides that can be PVD-plated. , carbides, etc. can be composited in the thermal insulation layer 2. _ Containing this derivative, nitrogen recording, carbide thermal insulation - coating 2 'can be good and stable with shouting or metal material BRIEF DESCRIPTION OF THE DRAWINGS The first figure shows a schematic cross-sectional view of a metal substrate structure of the present invention. The second figure shows a schematic diagram of the layered structure of the present invention. 7 200811300 The third figure shows a flow chart of the manufacturing steps of the present invention. [Main component symbol description] 1. ···.·· ···················································· Electric forging layer
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95130377A TW200811300A (en) | 2006-08-18 | 2006-08-18 | A treatment method of metalization of metal or ceramic substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95130377A TW200811300A (en) | 2006-08-18 | 2006-08-18 | A treatment method of metalization of metal or ceramic substrate |
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| Publication Number | Publication Date |
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| TW200811300A true TW200811300A (en) | 2008-03-01 |
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| TW95130377A TW200811300A (en) | 2006-08-18 | 2006-08-18 | A treatment method of metalization of metal or ceramic substrate |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110643939A (en) * | 2018-06-27 | 2020-01-03 | 蒸汽技术公司 | Copper-based antibacterial PVD coating |
| CN111819303A (en) * | 2018-02-19 | 2020-10-23 | 应用材料公司 | PVD titania formation using sputter etching to stop crystallization in thick films |
-
2006
- 2006-08-18 TW TW95130377A patent/TW200811300A/en unknown
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111819303A (en) * | 2018-02-19 | 2020-10-23 | 应用材料公司 | PVD titania formation using sputter etching to stop crystallization in thick films |
| US11008647B2 (en) | 2018-02-19 | 2021-05-18 | Applied Materials, Inc. | PVD titanium dioxide formation using sputter etch to halt onset of crystalinity in thick films |
| TWI796438B (en) * | 2018-02-19 | 2023-03-21 | 美商應用材料股份有限公司 | Pvd titanium dioxide formation using sputter etch to halt onset of crystalinity in thick films |
| CN111819303B (en) * | 2018-02-19 | 2023-12-08 | 应用材料公司 | Using sputter etching to halt PVD titanium dioxide formation where crystallization occurs in thick films |
| TWI845907B (en) * | 2018-02-19 | 2024-06-21 | 美商應用材料股份有限公司 | Pvd titanium dioxide formation using sputter etch to halt onset of crystalinity in thick films |
| CN110643939A (en) * | 2018-06-27 | 2020-01-03 | 蒸汽技术公司 | Copper-based antibacterial PVD coating |
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