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Application filed by United Microelectronics CorpfiledCriticalUnited Microelectronics Corp
Priority to TW095112610ApriorityCriticalpatent/TW200739894A/en
Publication of TW200739894ApublicationCriticalpatent/TW200739894A/en
A semiconductor image sensor and a method for fabricating the same are described. The semiconductor image sensor includes a substrate having at least a photoactive region therein and an IR-cutting layer over the photoactive region.
TW095112610A2006-04-102006-04-10Semiconductor image sensor and method for fabricating the same
TW200739894A
(en)
Nitride semiconductor substrate, method for forming a nitride semiconductor layer and method for separating the nitride semiconductor layer from the substrate