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TW200736597A - An apparatus for inspecting defects of sheetfed film and a method for inspecting defects of sheetfed film - Google Patents

An apparatus for inspecting defects of sheetfed film and a method for inspecting defects of sheetfed film

Info

Publication number
TW200736597A
TW200736597A TW095142439A TW95142439A TW200736597A TW 200736597 A TW200736597 A TW 200736597A TW 095142439 A TW095142439 A TW 095142439A TW 95142439 A TW95142439 A TW 95142439A TW 200736597 A TW200736597 A TW 200736597A
Authority
TW
Taiwan
Prior art keywords
inspection
film
sheet film
processing part
area
Prior art date
Application number
TW095142439A
Other languages
Chinese (zh)
Other versions
TWI435069B (en
Inventor
Ichirou Washizaki
Atsuhiko Shinozuka
Osamu Fukuta
Original Assignee
Sumitomo Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co filed Critical Sumitomo Chemical Co
Publication of TW200736597A publication Critical patent/TW200736597A/en
Application granted granted Critical
Publication of TWI435069B publication Critical patent/TWI435069B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3305—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts detector fixed; source and body moving

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

To extract a boundary in a cut sheet film of an inspection object from an inspection area to be recognized automatically, and to inspect a dimension and a defect within an recognized area. This sheet film inspection 1 is provided with an inspection processing part 17 provided with an image processing part as an inspection area extracting means provided with a roller for conveying the cut sheet film along a conveying direction Y as shown in Fig.1, and a CCD line sensor 15 for acquiring an image data in a prescribed area of the conveyed sheet film, to detect the boundary between the sheet film and a background from the image data acquired by the CCD line sensor 15, and to extract an inspection effective area in the film sheet, and a defect inspection processing part for inspection-processing the defect within the effective area extracted by the image processing part. The inspection processing part 17 extracts a data of the sheet film from the acquired image data, determines further the effective area of the inspection object, and conducts finally the defect inspection, the dimension inspection and the like, within the effective area. A work is extracted from the acquired data by the CCD line sensor 15.
TW095142439A 2005-11-21 2006-11-16 An apparatus for inspecting defects of sheetfed film and a method for inspecting defects of sheetfed film TWI435069B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005336247A JP4755888B2 (en) 2005-11-21 2005-11-21 Sheet-fed film inspection apparatus and sheet-fed film inspection method

Publications (2)

Publication Number Publication Date
TW200736597A true TW200736597A (en) 2007-10-01
TWI435069B TWI435069B (en) 2014-04-21

Family

ID=38165032

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095142439A TWI435069B (en) 2005-11-21 2006-11-16 An apparatus for inspecting defects of sheetfed film and a method for inspecting defects of sheetfed film

Country Status (4)

Country Link
JP (1) JP4755888B2 (en)
KR (1) KR20070053618A (en)
CN (1) CN1982060A (en)
TW (1) TWI435069B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI630380B (en) * 2013-08-07 2018-07-21 日東電工股份有限公司 Optical member inspection method, optical product manufacturing method, and optical member inspection apparatus

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4726983B2 (en) * 2009-10-30 2011-07-20 住友化学株式会社 Defect inspection system, and defect inspection imaging apparatus, defect inspection image processing apparatus, defect inspection image processing program, recording medium, and defect inspection image processing method used therefor
KR101733018B1 (en) * 2015-02-25 2017-05-24 동우 화인켐 주식회사 Apparatus and method for detecting defect of optical film
CN114322773A (en) * 2021-12-31 2022-04-12 杭州电子科技大学 Device and method for visual detection of strip sheet part

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06288927A (en) * 1993-03-30 1994-10-18 Sekisui Chem Co Ltd Image process inspection method
JP3330014B2 (en) * 1996-04-23 2002-09-30 松下電工株式会社 Appearance inspection method
JPH11231129A (en) * 1997-11-17 1999-08-27 Sumitomo Chem Co Ltd Optical film laminated intermediate, method for producing the same, and method for producing optical film laminated chip
JP2004333446A (en) * 2003-05-12 2004-11-25 Matsushita Electric Ind Co Ltd Appearance inspection method, appearance inspection apparatus, its program, and its recording medium
JP2005241361A (en) * 2004-02-25 2005-09-08 Jfe Steel Kk Shape measuring method and shape measuring apparatus for plate-like object to be measured

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI630380B (en) * 2013-08-07 2018-07-21 日東電工股份有限公司 Optical member inspection method, optical product manufacturing method, and optical member inspection apparatus

Also Published As

Publication number Publication date
JP4755888B2 (en) 2011-08-24
JP2007139666A (en) 2007-06-07
CN1982060A (en) 2007-06-20
KR20070053618A (en) 2007-05-25
TWI435069B (en) 2014-04-21

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