TW200734435A - Aqueous dispersion for chemical mechanical polishing and chemical mechanical polishing method and the kit for preparing aqueous dispersion for chemical mechanical polishing - Google Patents
Aqueous dispersion for chemical mechanical polishing and chemical mechanical polishing method and the kit for preparing aqueous dispersion for chemical mechanical polishingInfo
- Publication number
- TW200734435A TW200734435A TW095143163A TW95143163A TW200734435A TW 200734435 A TW200734435 A TW 200734435A TW 095143163 A TW095143163 A TW 095143163A TW 95143163 A TW95143163 A TW 95143163A TW 200734435 A TW200734435 A TW 200734435A
- Authority
- TW
- Taiwan
- Prior art keywords
- mechanical polishing
- chemical mechanical
- aqueous dispersion
- kit
- preparing
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- H10P52/403—
-
- H10W20/062—
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005338961 | 2005-11-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200734435A true TW200734435A (en) | 2007-09-16 |
Family
ID=38067099
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW095143163A TW200734435A (en) | 2005-11-24 | 2006-11-22 | Aqueous dispersion for chemical mechanical polishing and chemical mechanical polishing method and the kit for preparing aqueous dispersion for chemical mechanical polishing |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JPWO2007060869A1 (fr) |
| TW (1) | TW200734435A (fr) |
| WO (1) | WO2007060869A1 (fr) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5013732B2 (ja) * | 2006-04-03 | 2012-08-29 | Jsr株式会社 | 化学機械研磨用水系分散体、化学機械研磨方法、化学機械研磨用キット、および化学機械研磨用水系分散体を調製するためのキット |
| JP5196112B2 (ja) * | 2007-07-09 | 2013-05-15 | Jsr株式会社 | 化学機械研磨用水系分散体および多層回路基板の製造方法 |
| JPWO2009028256A1 (ja) * | 2007-08-31 | 2010-11-25 | Jsr株式会社 | 化学機械研磨用水系分散体調製用セットおよび化学機械研磨用水系分散体の調製方法 |
| JPWO2009031389A1 (ja) * | 2007-09-03 | 2010-12-09 | Jsr株式会社 | 化学機械研磨用水系分散体およびその調製方法、化学機械研磨用水系分散体を調製するためのキット、ならびに半導体装置の化学機械研磨方法 |
| JP2009164188A (ja) * | 2007-12-28 | 2009-07-23 | Fujimi Inc | 研磨用組成物 |
| JP5403922B2 (ja) * | 2008-02-26 | 2014-01-29 | 富士フイルム株式会社 | 研磨液および研磨方法 |
| JP5472585B2 (ja) | 2008-05-22 | 2014-04-16 | Jsr株式会社 | 化学機械研磨用水系分散体および化学機械研磨方法 |
| JP5495508B2 (ja) * | 2008-05-23 | 2014-05-21 | 日揮触媒化成株式会社 | 研磨用粒子分散液およびその製造方法 |
| KR20110090920A (ko) | 2008-11-10 | 2011-08-10 | 아사히 가라스 가부시키가이샤 | 연마용 조성물 및 반도체 집적 회로 장치의 제조 방법 |
| JP4990300B2 (ja) * | 2009-01-14 | 2012-08-01 | パナソニック株式会社 | 半導体装置の製造方法 |
| JP5493526B2 (ja) * | 2009-07-14 | 2014-05-14 | 日立化成株式会社 | Cmp用研磨液及び研磨方法 |
| JP5493528B2 (ja) * | 2009-07-15 | 2014-05-14 | 日立化成株式会社 | Cmp研磨液及びこのcmp研磨液を用いた研磨方法 |
| TW201742900A (zh) * | 2016-06-09 | 2017-12-16 | 日立化成股份有限公司 | Cmp用研磨液及研磨方法 |
| JP7161894B2 (ja) * | 2018-09-04 | 2022-10-27 | 株式会社フジミインコーポレーテッド | 研磨用組成物および研磨システム |
| CN115595585A (zh) * | 2022-11-10 | 2023-01-13 | 江西省科学院应用物理研究所(Cn) | 一种易氧化金属专用金相抛光剂的制备方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4253141B2 (ja) * | 2000-08-21 | 2009-04-08 | 株式会社東芝 | 化学機械研磨用スラリおよび半導体装置の製造方法 |
| JP2003077920A (ja) * | 2001-09-04 | 2003-03-14 | Nec Corp | 金属配線の形成方法 |
| JP2005014206A (ja) * | 2003-05-30 | 2005-01-20 | Sumitomo Chemical Co Ltd | 金属研磨剤組成物 |
| JP2005045229A (ja) * | 2003-07-04 | 2005-02-17 | Jsr Corp | 化学機械研磨用水系分散体および化学機械研磨方法 |
| JP4336550B2 (ja) * | 2003-09-09 | 2009-09-30 | 花王株式会社 | 磁気ディスク用研磨液キット |
| JP4667013B2 (ja) * | 2003-11-14 | 2011-04-06 | 昭和電工株式会社 | 研磨組成物および研磨方法 |
| JP2005302973A (ja) * | 2004-04-12 | 2005-10-27 | Jsr Corp | 化学機械研磨用水系分散体及び化学機械研磨方法 |
-
2006
- 2006-11-15 WO PCT/JP2006/322765 patent/WO2007060869A1/fr not_active Ceased
- 2006-11-15 JP JP2007546412A patent/JPWO2007060869A1/ja active Pending
- 2006-11-22 TW TW095143163A patent/TW200734435A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| WO2007060869A1 (fr) | 2007-05-31 |
| JPWO2007060869A1 (ja) | 2009-05-07 |
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