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TW200700301A - Method of holding an electronic component in a controlled orientation during parametric testing - Google Patents

Method of holding an electronic component in a controlled orientation during parametric testing

Info

Publication number
TW200700301A
TW200700301A TW095118241A TW95118241A TW200700301A TW 200700301 A TW200700301 A TW 200700301A TW 095118241 A TW095118241 A TW 095118241A TW 95118241 A TW95118241 A TW 95118241A TW 200700301 A TW200700301 A TW 200700301A
Authority
TW
Taiwan
Prior art keywords
electronic component
notch end
seat
holding
parametric testing
Prior art date
Application number
TW095118241A
Other languages
English (en)
Other versions
TWI400189B (zh
Inventor
Jeffrey L Fish
Gerald F Boe
Original Assignee
Electro Scient Ind Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electro Scient Ind Inc filed Critical Electro Scient Ind Inc
Publication of TW200700301A publication Critical patent/TW200700301A/zh
Application granted granted Critical
Publication of TWI400189B publication Critical patent/TWI400189B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G01R31/013—Testing passive components
    • G01R31/016—Testing of capacitors
    • H10P74/00—

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW095118241A 2005-05-23 2006-05-23 於參數測試期間使電子元件保持於受控制方向之方法 TWI400189B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/135,728 US7161346B2 (en) 2005-05-23 2005-05-23 Method of holding an electronic component in a controlled orientation during parametric testing

Publications (2)

Publication Number Publication Date
TW200700301A true TW200700301A (en) 2007-01-01
TWI400189B TWI400189B (zh) 2013-07-01

Family

ID=37447764

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095118241A TWI400189B (zh) 2005-05-23 2006-05-23 於參數測試期間使電子元件保持於受控制方向之方法

Country Status (8)

Country Link
US (1) US7161346B2 (zh)
JP (1) JP5094713B2 (zh)
KR (1) KR101226618B1 (zh)
CN (1) CN100514593C (zh)
DE (1) DE112006001321T5 (zh)
GB (1) GB2442630B (zh)
TW (1) TWI400189B (zh)
WO (1) WO2006127787A2 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106132847A (zh) * 2014-03-27 2016-11-16 株式会社村田制作所 姿势变换装置·对齐装置及姿势变换方法·对齐方法

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7704033B2 (en) * 2006-04-21 2010-04-27 Electro Scientific Industries, Inc. Long axis component loader
US7819235B2 (en) * 2007-01-29 2010-10-26 Electro Scientific Industries, Inc. Venturi vacuum generator on an electric component handler
US7965091B2 (en) * 2007-04-30 2011-06-21 Electro Scientific Industries, Inc. Test plate for electronic handler
US7609078B2 (en) * 2007-12-21 2009-10-27 Electro Scientific Industries, Inc. Contact alignment verification/adjustment fixture
US20110140726A1 (en) * 2009-11-23 2011-06-16 Applied Materials, Inc. Apparatus and Methods for Measuring Solar Cell Module Performance
US9636713B2 (en) * 2013-01-07 2017-05-02 Electro Scientific Industries, Inc. Systems and methods for handling components
US10683114B2 (en) * 2017-02-24 2020-06-16 Taiyo Yuden Co., Ltd. Taping apparatus

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5568870A (en) * 1994-08-18 1996-10-29 Testec, Inc. Device for testing and sorting small electronic components
US5540317A (en) * 1995-01-17 1996-07-30 Chipstar, Inc. Machine to detect and process to correct capacitor chip misalignment in loading for processing
US5673799A (en) * 1995-06-05 1997-10-07 Chip Star Inc. Machine for testing and sorting capacitor chips and method of operating same
US5863331A (en) * 1996-07-11 1999-01-26 Braden; Denver IPC (Chip) termination machine
US5984079A (en) * 1996-07-12 1999-11-16 Electro Scientific Industries, Inc. Method and apparatus for loading electronic components
US5785484A (en) * 1996-08-23 1998-07-28 Electro Scientific Industries, Inc. Method and apparatus for orienting miniature components
JPH10185824A (ja) * 1996-12-24 1998-07-14 Kooei:Kk 小製品の製品検査装置及びそれを用いた小製品の製品検査方法
US6025567A (en) * 1997-11-10 2000-02-15 Brooks; David M. Binning wheel for testing and sorting capacitor chips
JP3446598B2 (ja) * 1998-03-23 2003-09-16 株式会社村田製作所 チップ部品の移載装置
US6204464B1 (en) * 1998-06-19 2001-03-20 Douglas J. Garcia Electronic component handler
US6100707A (en) * 1998-09-25 2000-08-08 Electro Scientific Industries, Inc. Apparatus for testing multi-terminal electronic components
US6441315B1 (en) * 1998-11-10 2002-08-27 Formfactor, Inc. Contact structures with blades having a wiping motion
DE60034820T2 (de) * 2000-05-23 2008-01-17 Electro Scientific Industries, Inc., Portland Inspektionsmachine für passives oberflächenmontiertes bauelement

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106132847A (zh) * 2014-03-27 2016-11-16 株式会社村田制作所 姿势变换装置·对齐装置及姿势变换方法·对齐方法

Also Published As

Publication number Publication date
DE112006001321T5 (de) 2008-04-17
US20060261832A1 (en) 2006-11-23
CN101180720A (zh) 2008-05-14
CN100514593C (zh) 2009-07-15
KR20080020606A (ko) 2008-03-05
KR101226618B1 (ko) 2013-01-28
JP2008542720A (ja) 2008-11-27
GB2442630B (en) 2010-02-03
GB0724605D0 (en) 2008-01-30
JP5094713B2 (ja) 2012-12-12
GB2442630A (en) 2008-04-09
WO2006127787A2 (en) 2006-11-30
TWI400189B (zh) 2013-07-01
US7161346B2 (en) 2007-01-09
WO2006127787A3 (en) 2007-03-29

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees