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TW200706885A - Apparatus for inspecting display panel and method for inspecting display panel using the same - Google Patents

Apparatus for inspecting display panel and method for inspecting display panel using the same

Info

Publication number
TW200706885A
TW200706885A TW095127435A TW95127435A TW200706885A TW 200706885 A TW200706885 A TW 200706885A TW 095127435 A TW095127435 A TW 095127435A TW 95127435 A TW95127435 A TW 95127435A TW 200706885 A TW200706885 A TW 200706885A
Authority
TW
Taiwan
Prior art keywords
display panel
inspecting display
inspecting
worktables
same
Prior art date
Application number
TW095127435A
Other languages
Chinese (zh)
Other versions
TWI328121B (en
Inventor
Yun-Kwang Cheon
Original Assignee
Phicom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Phicom Corp filed Critical Phicom Corp
Publication of TW200706885A publication Critical patent/TW200706885A/en
Application granted granted Critical
Publication of TWI328121B publication Critical patent/TWI328121B/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

There is provided an apparatus for inspecting a display panel, which makes it possible to perform a consecutive lighting inspection for small-sized display panels. The apparatus includes a first worktable fixed to one side of a frame, a second worktable fixed to the other side of the frame, and a moving probe unit. The display panels are loaded on the first and second worktables. The moving probe unit moves on the first and second worktables when spaced therefrom, and alternately inspects the display panels loaded on the first and second worktables.
TW095127435A 2005-07-29 2006-07-27 Apparatus for inspecting display panel and method for inspecting display panel using the same TWI328121B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050069571A KR100733276B1 (en) 2005-07-29 2005-07-29 Display panel inspection equipment and display panel inspection method using the same

Publications (2)

Publication Number Publication Date
TW200706885A true TW200706885A (en) 2007-02-16
TWI328121B TWI328121B (en) 2010-08-01

Family

ID=37673881

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095127435A TWI328121B (en) 2005-07-29 2006-07-27 Apparatus for inspecting display panel and method for inspecting display panel using the same

Country Status (4)

Country Link
JP (1) JP4365391B2 (en)
KR (1) KR100733276B1 (en)
CN (1) CN100529713C (en)
TW (1) TWI328121B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI396848B (en) * 2008-11-10 2013-05-21 Nihon Micronics Kk Electrical inspection probe unit, electrical inspection device and lighting inspection device

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102591044A (en) * 2012-01-12 2012-07-18 北京凌云光视数字图像技术有限公司 TFT (thin film transistor) liquid crystal screen quality detection method
CN106124538B (en) * 2016-08-31 2019-02-12 天津三英精密仪器股份有限公司 A kind of double-station multitask X-ray three-dimensional imaging detection system
CN106842641B (en) * 2016-12-23 2019-11-01 武汉精立电子技术有限公司 The mobile detection image acquisition device of display module
CN108318753A (en) * 2017-01-16 2018-07-24 研华股份有限公司 Detection system
CN108415095A (en) * 2018-05-09 2018-08-17 清华大学 Vehicle inspection system
KR102068560B1 (en) * 2019-11-20 2020-01-21 금교필 Backlight Unit for Testing System of Display Panel
KR102658169B1 (en) * 2022-03-10 2024-04-19 (주)베러셀 Multi-cell lighting signal generator for substrate cells composed of multiple pad blocks

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3673022B2 (en) * 1996-06-24 2005-07-20 株式会社日本マイクロニクス LCD panel inspection equipment
JPH1010153A (en) * 1996-06-26 1998-01-16 Nippon Maikuronikusu:Kk Probe unit storage and inspection system using the same
JP3999863B2 (en) * 1997-12-22 2007-10-31 株式会社日本マイクロニクス Substrate inspection device
KR100492638B1 (en) * 1998-01-12 2005-09-02 이억기 Apparatus and method for loading panel for lighting test
US6353466B1 (en) * 1999-04-23 2002-03-05 De & T Co., Ltd. Apparatus for testing an LCD
JP3480925B2 (en) * 2000-09-12 2003-12-22 株式会社双晶テック Display panel or probe frame support frame
KR100354105B1 (en) * 2001-02-05 2002-09-28 메카텍스 (주) Microscope Moving Apparatus of Liquid Crystal Display Panel System
KR100358707B1 (en) * 2001-02-05 2002-10-31 메카텍스 (주) Panel Sending Apparatus of Liquid Crystal Display Inspection System
JP2002357626A (en) * 2001-05-31 2002-12-13 Matsushita Electric Ind Co Ltd Inspection method of liquid crystal display element
JP2004170249A (en) * 2002-11-20 2004-06-17 Gallant Precision Machining Co Ltd Circulation type inspection system
TWI231964B (en) * 2003-03-10 2005-05-01 Phicom Corp LCD panel auto gripping apparatus and method for use in a panel carrier for an automatic probe unit
JP3745750B2 (en) * 2003-06-27 2006-02-15 東芝テリー株式会社 Display panel inspection apparatus and inspection method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI396848B (en) * 2008-11-10 2013-05-21 Nihon Micronics Kk Electrical inspection probe unit, electrical inspection device and lighting inspection device

Also Published As

Publication number Publication date
CN100529713C (en) 2009-08-19
CN1904576A (en) 2007-01-31
TWI328121B (en) 2010-08-01
KR20070014710A (en) 2007-02-01
JP2007041587A (en) 2007-02-15
KR100733276B1 (en) 2007-06-28
JP4365391B2 (en) 2009-11-18

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees