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TW200637006A - Method of fabricating TFT array substrate and metal layer thereof - Google Patents

Method of fabricating TFT array substrate and metal layer thereof

Info

Publication number
TW200637006A
TW200637006A TW094111962A TW94111962A TW200637006A TW 200637006 A TW200637006 A TW 200637006A TW 094111962 A TW094111962 A TW 094111962A TW 94111962 A TW94111962 A TW 94111962A TW 200637006 A TW200637006 A TW 200637006A
Authority
TW
Taiwan
Prior art keywords
metal layer
layer
array substrate
tft array
semi
Prior art date
Application number
TW094111962A
Other languages
English (en)
Other versions
TWI272725B (en
Inventor
Chi-Wen Yao
Pei-Shin Yu
Original Assignee
Quanta Display Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Quanta Display Inc filed Critical Quanta Display Inc
Priority to TW094111962A priority Critical patent/TWI272725B/zh
Priority to US11/404,425 priority patent/US7585712B2/en
Publication of TW200637006A publication Critical patent/TW200637006A/zh
Application granted granted Critical
Publication of TWI272725B publication Critical patent/TWI272725B/zh

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/02—Electroplating of selected surface areas
    • C25D5/022—Electroplating of selected surface areas using masking means
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
    • H10D30/6737—Thin-film transistors [TFT] characterised by the electrodes characterised by the electrode materials
    • H10D30/6739—Conductor-insulator-semiconductor electrodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01—Manufacture or treatment
    • H10D86/021—Manufacture or treatment of multiple TFTs
    • H10D86/0241—Manufacture or treatment of multiple TFTs using liquid deposition, e.g. printing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/441—Interconnections, e.g. scanning lines
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/441—Interconnections, e.g. scanning lines
    • H10D86/443—Interconnections, e.g. scanning lines adapted for preventing breakage, peeling or short circuiting
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Thin Film Transistor (AREA)
TW094111962A 2005-04-15 2005-04-15 Method of fabricating TFT array substrate and metal layer thereof TWI272725B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW094111962A TWI272725B (en) 2005-04-15 2005-04-15 Method of fabricating TFT array substrate and metal layer thereof
US11/404,425 US7585712B2 (en) 2005-04-15 2006-04-14 Methods of fabricating thin film transistor array substrate and forming metal layer of thin film transistor array substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094111962A TWI272725B (en) 2005-04-15 2005-04-15 Method of fabricating TFT array substrate and metal layer thereof

Publications (2)

Publication Number Publication Date
TW200637006A true TW200637006A (en) 2006-10-16
TWI272725B TWI272725B (en) 2007-02-01

Family

ID=37107445

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094111962A TWI272725B (en) 2005-04-15 2005-04-15 Method of fabricating TFT array substrate and metal layer thereof

Country Status (2)

Country Link
US (1) US7585712B2 (zh)
TW (1) TWI272725B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI577079B (zh) * 2015-12-24 2017-04-01 國立中山大學 全相位功率分配器及其製造方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080149490A1 (en) * 2006-12-26 2008-06-26 Bonhote Christian R Electroplating on ultra-thin seed layers
CN105428245B (zh) * 2016-01-26 2019-03-01 京东方科技集团股份有限公司 像素结构及其制备方法、阵列基板和显示装置
CN112877740A (zh) * 2021-01-08 2021-06-01 深圳市华星光电半导体显示技术有限公司 纳米材料薄膜的制作方法及显示面板

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5130263A (en) * 1990-04-17 1992-07-14 General Electric Company Method for photolithographically forming a selfaligned mask using back-side exposure and a non-specular reflecting layer
US5972193A (en) * 1997-10-10 1999-10-26 Industrial Technology Research Institute Method of manufacturing a planar coil using a transparency substrate
US5976902A (en) * 1998-08-03 1999-11-02 Industrial Technology Research Institute Method of fabricating a fully self-aligned TFT-LCD
US6506675B1 (en) 1999-07-09 2003-01-14 Kabushiki Kaisha Toshiba Copper film selective formation method
JP2001094238A (ja) 1999-07-16 2001-04-06 Sharp Corp 金属配線の製造方法およびその金属配線を備えた配線基板
JP4613271B2 (ja) 2000-02-29 2011-01-12 シャープ株式会社 金属配線およびその製造方法およびその金属配線を用いた薄膜トランジスタおよび表示装置
KR100569587B1 (ko) * 2000-06-30 2006-04-10 주식회사 하이닉스반도체 고유전체 캐패시터의 제조 방법
US6670224B2 (en) * 2002-01-03 2003-12-30 Industrial Technology Research Institute Method for manufacturing thin film transistors
KR100870697B1 (ko) * 2002-03-07 2008-11-27 엘지디스플레이 주식회사 저저항 구리배선 형성방법
US6887776B2 (en) * 2003-04-11 2005-05-03 Applied Materials, Inc. Methods to form metal lines using selective electrochemical deposition
US6963083B2 (en) * 2003-06-30 2005-11-08 Lg.Philips Lcd Co., Ltd. Liquid crystal display device having polycrystalline TFT and fabricating method thereof
CN100428414C (zh) * 2005-04-15 2008-10-22 中芯国际集成电路制造(上海)有限公司 形成低应力多层金属化结构和无铅焊料端电极的方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI577079B (zh) * 2015-12-24 2017-04-01 國立中山大學 全相位功率分配器及其製造方法

Also Published As

Publication number Publication date
US20060231407A1 (en) 2006-10-19
TWI272725B (en) 2007-02-01
US7585712B2 (en) 2009-09-08

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees