TW200636933A - Single electron transistor and method for manufacturing the same - Google Patents
Single electron transistor and method for manufacturing the sameInfo
- Publication number
- TW200636933A TW200636933A TW094110882A TW94110882A TW200636933A TW 200636933 A TW200636933 A TW 200636933A TW 094110882 A TW094110882 A TW 094110882A TW 94110882 A TW94110882 A TW 94110882A TW 200636933 A TW200636933 A TW 200636933A
- Authority
- TW
- Taiwan
- Prior art keywords
- quantum dot
- single electron
- electron transistor
- oxide layer
- gate electrode
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 5
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000002096 quantum dot Substances 0.000 abstract 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 2
- 238000005530 etching Methods 0.000 abstract 2
- 229910052710 silicon Inorganic materials 0.000 abstract 2
- 239000010703 silicon Substances 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- 125000006850 spacer group Chemical group 0.000 abstract 1
Landscapes
- Thin Film Transistor (AREA)
- Junction Field-Effect Transistors (AREA)
Abstract
The invention relates to a structure of single electron transistor (SET) and the method for fabricating the same. The SET comprises a substrate, a quantum dot which is isolated from outside by ambient oxide, a gate oxide layer, a gate electrode and a drain/source electrode which is conspired to form the tunnel junction with the quantum dot. The fabricating method utilizes spacer technique to build the active silicon wire region on the substrate, and sequentially forms the gate oxide layer, the gate electrode and the protection layer. Then, a mask which interlaces with the active silicon wire region is given for etching above layers until etching into the buried oxide. After that, a geometric configuration of the quantum dot is obtained. Consequently, this projecting feature of the single electron transistor effectively shrinks the quantum dot below 10 nm, and allows the SET to be operated at high (room) temperature. Besides, in the fabricating method, the gate electrode, the gate oxide layer, the drain/source electrode, and the tunnel junction are self-aligned consistently.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW94110882A TWI248663B (en) | 2005-04-06 | 2005-04-06 | Single electron transistor and method for manufacturing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW94110882A TWI248663B (en) | 2005-04-06 | 2005-04-06 | Single electron transistor and method for manufacturing the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI248663B TWI248663B (en) | 2006-02-01 |
| TW200636933A true TW200636933A (en) | 2006-10-16 |
Family
ID=37429169
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW94110882A TWI248663B (en) | 2005-04-06 | 2005-04-06 | Single electron transistor and method for manufacturing the same |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI248663B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI865745B (en) * | 2020-03-13 | 2024-12-11 | 英商量子運動科技有限公司 | Quantum dot device |
-
2005
- 2005-04-06 TW TW94110882A patent/TWI248663B/en not_active IP Right Cessation
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI865745B (en) * | 2020-03-13 | 2024-12-11 | 英商量子運動科技有限公司 | Quantum dot device |
| US12453138B2 (en) | 2020-03-13 | 2025-10-21 | Quantum Motion Technologies Limited | Quantum dot device |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI248663B (en) | 2006-02-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |