TW200538394A - Method for making a metal containing indium - Google Patents
Method for making a metal containing indium Download PDFInfo
- Publication number
- TW200538394A TW200538394A TW094110198A TW94110198A TW200538394A TW 200538394 A TW200538394 A TW 200538394A TW 094110198 A TW094110198 A TW 094110198A TW 94110198 A TW94110198 A TW 94110198A TW 200538394 A TW200538394 A TW 200538394A
- Authority
- TW
- Taiwan
- Prior art keywords
- indium
- solution
- acid
- metal
- oxalic acid
- Prior art date
Links
- 229910052738 indium Inorganic materials 0.000 title claims abstract description 321
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 title claims abstract description 316
- 229910052751 metal Inorganic materials 0.000 title claims abstract description 83
- 239000002184 metal Substances 0.000 title claims abstract description 83
- 238000000034 method Methods 0.000 title claims abstract description 60
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 claims abstract description 263
- 235000006408 oxalic acid Nutrition 0.000 claims abstract description 87
- 239000002253 acid Substances 0.000 claims abstract description 79
- 239000007788 liquid Substances 0.000 claims abstract description 57
- LKEDUJPRSZGTHZ-UHFFFAOYSA-H indium(3+);oxalate Chemical compound [In+3].[In+3].[O-]C(=O)C([O-])=O.[O-]C(=O)C([O-])=O.[O-]C(=O)C([O-])=O LKEDUJPRSZGTHZ-UHFFFAOYSA-H 0.000 claims abstract description 50
- 239000002244 precipitate Substances 0.000 claims abstract description 44
- 238000000926 separation method Methods 0.000 claims abstract description 28
- 238000006467 substitution reaction Methods 0.000 claims abstract description 26
- 239000000126 substance Substances 0.000 claims abstract description 23
- 238000005266 casting Methods 0.000 claims abstract description 6
- 238000001556 precipitation Methods 0.000 claims description 45
- 238000004140 cleaning Methods 0.000 claims description 42
- 238000011282 treatment Methods 0.000 claims description 40
- 150000002500 ions Chemical class 0.000 claims description 39
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 claims description 37
- 229910017604 nitric acid Inorganic materials 0.000 claims description 37
- 238000002161 passivation Methods 0.000 claims description 35
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims description 30
- 230000015572 biosynthetic process Effects 0.000 claims description 29
- 239000003795 chemical substances by application Substances 0.000 claims description 25
- 239000000463 material Substances 0.000 claims description 24
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 23
- 238000001914 filtration Methods 0.000 claims description 23
- 238000004519 manufacturing process Methods 0.000 claims description 21
- 239000000203 mixture Substances 0.000 claims description 18
- 150000002739 metals Chemical class 0.000 claims description 14
- 239000003513 alkali Substances 0.000 claims description 12
- 230000001376 precipitating effect Effects 0.000 claims description 12
- 238000005406 washing Methods 0.000 claims description 12
- 229910002651 NO3 Inorganic materials 0.000 claims description 11
- 238000004090 dissolution Methods 0.000 claims description 10
- NHNBFGGVMKEFGY-UHFFFAOYSA-N Nitrate Chemical compound [O-][N+]([O-])=O NHNBFGGVMKEFGY-UHFFFAOYSA-N 0.000 claims description 7
- 244000025254 Cannabis sativa Species 0.000 claims description 6
- 230000008018 melting Effects 0.000 claims description 6
- 238000002844 melting Methods 0.000 claims description 6
- 238000000746 purification Methods 0.000 claims description 4
- 239000009600 shenyin Substances 0.000 claims 2
- 239000003518 caustics Substances 0.000 claims 1
- 238000002360 preparation method Methods 0.000 claims 1
- 239000000243 solution Substances 0.000 abstract description 217
- 238000002156 mixing Methods 0.000 abstract description 36
- 229910052782 aluminium Inorganic materials 0.000 abstract description 20
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract description 20
- 239000007858 starting material Substances 0.000 abstract description 5
- 239000010409 thin film Substances 0.000 abstract description 4
- 239000003929 acidic solution Substances 0.000 abstract 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 97
- 229910021529 ammonia Inorganic materials 0.000 description 48
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 42
- 238000011084 recovery Methods 0.000 description 41
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 32
- 239000010949 copper Substances 0.000 description 30
- 229910052802 copper Inorganic materials 0.000 description 29
- 239000007864 aqueous solution Substances 0.000 description 27
- 239000012535 impurity Substances 0.000 description 27
- 229910003437 indium oxide Inorganic materials 0.000 description 27
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 27
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 26
- 238000003756 stirring Methods 0.000 description 17
- 229910000831 Steel Inorganic materials 0.000 description 14
- 239000010959 steel Substances 0.000 description 14
- 239000002699 waste material Substances 0.000 description 14
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 13
- -1 aluminum or zinc) Chemical class 0.000 description 13
- 238000006243 chemical reaction Methods 0.000 description 13
- 230000000052 comparative effect Effects 0.000 description 13
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 12
- 239000007787 solid Substances 0.000 description 12
- 238000012360 testing method Methods 0.000 description 11
- IGUXCTSQIGAGSV-UHFFFAOYSA-K indium(iii) hydroxide Chemical compound [OH-].[OH-].[OH-].[In+3] IGUXCTSQIGAGSV-UHFFFAOYSA-K 0.000 description 9
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 8
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 8
- 150000001875 compounds Chemical class 0.000 description 8
- 235000011114 ammonium hydroxide Nutrition 0.000 description 7
- 238000004458 analytical method Methods 0.000 description 7
- 239000010408 film Substances 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 7
- 238000010979 pH adjustment Methods 0.000 description 7
- 239000011701 zinc Substances 0.000 description 7
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 230000003647 oxidation Effects 0.000 description 6
- 238000007254 oxidation reaction Methods 0.000 description 6
- 239000013049 sediment Substances 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 229960002050 hydrofluoric acid Drugs 0.000 description 5
- 239000000843 powder Substances 0.000 description 5
- 239000002994 raw material Substances 0.000 description 5
- 238000000967 suction filtration Methods 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 4
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 4
- 150000007513 acids Chemical class 0.000 description 4
- 238000007598 dipping method Methods 0.000 description 4
- 239000000706 filtrate Substances 0.000 description 4
- 238000007654 immersion Methods 0.000 description 4
- 150000002471 indium Chemical class 0.000 description 4
- 239000004973 liquid crystal related substance Substances 0.000 description 4
- 229910052762 osmium Inorganic materials 0.000 description 4
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 description 4
- 238000004064 recycling Methods 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 4
- 229910001887 tin oxide Inorganic materials 0.000 description 4
- CVNKFOIOZXAFBO-UHFFFAOYSA-J tin(4+);tetrahydroxide Chemical compound [OH-].[OH-].[OH-].[OH-].[Sn+4] CVNKFOIOZXAFBO-UHFFFAOYSA-J 0.000 description 4
- 229910052725 zinc Inorganic materials 0.000 description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- 229910001854 alkali hydroxide Inorganic materials 0.000 description 3
- 150000008044 alkali metal hydroxides Chemical class 0.000 description 3
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid group Chemical group C(CC(O)(C(=O)O)CC(=O)O)(=O)O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 239000012065 filter cake Substances 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- 150000004679 hydroxides Chemical class 0.000 description 3
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 3
- 239000011777 magnesium Substances 0.000 description 3
- 239000012452 mother liquor Substances 0.000 description 3
- 239000012071 phase Substances 0.000 description 3
- 238000003828 vacuum filtration Methods 0.000 description 3
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonium chloride Substances [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 235000013339 cereals Nutrition 0.000 description 2
- 150000001879 copper Chemical class 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000004255 ion exchange chromatography Methods 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 229910021645 metal ion Inorganic materials 0.000 description 2
- 238000001465 metallisation Methods 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 229910052702 rhenium Inorganic materials 0.000 description 2
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 2
- 150000003839 salts Chemical class 0.000 description 2
- 238000005245 sintering Methods 0.000 description 2
- 238000000638 solvent extraction Methods 0.000 description 2
- 239000012085 test solution Substances 0.000 description 2
- 229910021642 ultra pure water Inorganic materials 0.000 description 2
- 239000012498 ultrapure water Substances 0.000 description 2
- KIUKXJAPPMFGSW-DNGZLQJQSA-N (2S,3S,4S,5R,6R)-6-[(2S,3R,4R,5S,6R)-3-Acetamido-2-[(2S,3S,4R,5R,6R)-6-[(2R,3R,4R,5S,6R)-3-acetamido-2,5-dihydroxy-6-(hydroxymethyl)oxan-4-yl]oxy-2-carboxy-4,5-dihydroxyoxan-3-yl]oxy-5-hydroxy-6-(hydroxymethyl)oxan-4-yl]oxy-3,4,5-trihydroxyoxane-2-carboxylic acid Chemical compound CC(=O)N[C@H]1[C@H](O)O[C@H](CO)[C@@H](O)[C@@H]1O[C@H]1[C@H](O)[C@@H](O)[C@H](O[C@H]2[C@@H]([C@@H](O[C@H]3[C@@H]([C@@H](O)[C@H](O)[C@H](O3)C(O)=O)O)[C@H](O)[C@@H](CO)O2)NC(C)=O)[C@@H](C(O)=O)O1 KIUKXJAPPMFGSW-DNGZLQJQSA-N 0.000 description 1
- 235000001674 Agaricus brunnescens Nutrition 0.000 description 1
- 239000004135 Bone phosphate Substances 0.000 description 1
- 241000283690 Bos taurus Species 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- 229910017061 Fe Co Inorganic materials 0.000 description 1
- 229910000846 In alloy Inorganic materials 0.000 description 1
- 235000000177 Indigofera tinctoria Nutrition 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- 241001465754 Metazoa Species 0.000 description 1
- DXISOTXRTSGIEG-UHFFFAOYSA-N O(Cl)Cl.[In] Chemical compound O(Cl)Cl.[In] DXISOTXRTSGIEG-UHFFFAOYSA-N 0.000 description 1
- 241000283973 Oryctolagus cuniculus Species 0.000 description 1
- 229910020816 Sn Pb Inorganic materials 0.000 description 1
- YZCKVEUIGOORGS-NJFSPNSNSA-N Tritium Chemical compound [3H] YZCKVEUIGOORGS-NJFSPNSNSA-N 0.000 description 1
- WLRHJCCDKYXTJO-UHFFFAOYSA-N [In].[Re] Chemical compound [In].[Re] WLRHJCCDKYXTJO-UHFFFAOYSA-N 0.000 description 1
- BXTPDVUPAKXURS-UHFFFAOYSA-J [OH-].[Re+4].[OH-].[OH-].[OH-] Chemical compound [OH-].[Re+4].[OH-].[OH-].[OH-] BXTPDVUPAKXURS-UHFFFAOYSA-J 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 229930013930 alkaloid Natural products 0.000 description 1
- 150000003797 alkaloid derivatives Chemical class 0.000 description 1
- VBIXEXWLHSRNKB-UHFFFAOYSA-N ammonium oxalate Chemical compound [NH4+].[NH4+].[O-]C(=O)C([O-])=O VBIXEXWLHSRNKB-UHFFFAOYSA-N 0.000 description 1
- 150000001450 anions Chemical class 0.000 description 1
- 239000008346 aqueous phase Substances 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000005119 centrifugation Methods 0.000 description 1
- 239000003638 chemical reducing agent Substances 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- ZURAKLKIKYCUJU-UHFFFAOYSA-N copper;azane Chemical compound N.[Cu+2] ZURAKLKIKYCUJU-UHFFFAOYSA-N 0.000 description 1
- QYCVHILLJSYYBD-UHFFFAOYSA-L copper;oxalate Chemical compound [Cu+2].[O-]C(=O)C([O-])=O QYCVHILLJSYYBD-UHFFFAOYSA-L 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 150000004683 dihydrates Chemical class 0.000 description 1
- AUYOHNUMSAGWQZ-UHFFFAOYSA-L dihydroxy(oxo)tin Chemical compound O[Sn](O)=O AUYOHNUMSAGWQZ-UHFFFAOYSA-L 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
- 238000004993 emission spectroscopy Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- JEGUKCSWCFPDGT-UHFFFAOYSA-N h2o hydrate Chemical compound O.O JEGUKCSWCFPDGT-UHFFFAOYSA-N 0.000 description 1
- 238000000703 high-speed centrifugation Methods 0.000 description 1
- 229920002674 hyaluronan Polymers 0.000 description 1
- 229960003160 hyaluronic acid Drugs 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- QOSATHPSBFQAML-UHFFFAOYSA-N hydrogen peroxide;hydrate Chemical compound O.OO QOSATHPSBFQAML-UHFFFAOYSA-N 0.000 description 1
- 239000000413 hydrolysate Substances 0.000 description 1
- GPRLSGONYQIRFK-UHFFFAOYSA-N hydron Chemical compound [H+] GPRLSGONYQIRFK-UHFFFAOYSA-N 0.000 description 1
- 238000005470 impregnation Methods 0.000 description 1
- 229940097275 indigo Drugs 0.000 description 1
- COHYTHOBJLSHDF-UHFFFAOYSA-N indigo powder Natural products N1C2=CC=CC=C2C(=O)C1=C1C(=O)C2=CC=CC=C2N1 COHYTHOBJLSHDF-UHFFFAOYSA-N 0.000 description 1
- 150000002472 indium compounds Chemical class 0.000 description 1
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 1
- SRNMFPSMASDEKJ-UHFFFAOYSA-N indium;nitric acid Chemical compound [In].O[N+]([O-])=O SRNMFPSMASDEKJ-UHFFFAOYSA-N 0.000 description 1
- 238000005342 ion exchange Methods 0.000 description 1
- 238000002386 leaching Methods 0.000 description 1
- 239000010985 leather Substances 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 239000008267 milk Substances 0.000 description 1
- 210000004080 milk Anatomy 0.000 description 1
- 235000013336 milk Nutrition 0.000 description 1
- 150000007522 mineralic acids Chemical class 0.000 description 1
- 150000004682 monohydrates Chemical class 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 235000005985 organic acids Nutrition 0.000 description 1
- MUBZPKHOEPUJKR-UHFFFAOYSA-M oxalate(1-) Chemical compound OC(=O)C([O-])=O MUBZPKHOEPUJKR-UHFFFAOYSA-M 0.000 description 1
- ZDYUUBIMAGBMPY-UHFFFAOYSA-N oxalic acid;hydrate Chemical compound O.OC(=O)C(O)=O ZDYUUBIMAGBMPY-UHFFFAOYSA-N 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 210000000496 pancreas Anatomy 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000010298 pulverizing process Methods 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 239000013535 sea water Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000010802 sludge Substances 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 238000003980 solgel method Methods 0.000 description 1
- 239000006228 supernatant Substances 0.000 description 1
- 239000013077 target material Substances 0.000 description 1
- 238000012549 training Methods 0.000 description 1
- 229910052722 tritium Inorganic materials 0.000 description 1
- 230000005641 tunneling Effects 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B58/00—Obtaining gallium or indium
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B3/00—Extraction of metal compounds from ores or concentrates by wet processes
- C22B3/20—Treatment or purification of solutions, e.g. obtained by leaching
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B3/00—Extraction of metal compounds from ores or concentrates by wet processes
- C22B3/20—Treatment or purification of solutions, e.g. obtained by leaching
- C22B3/22—Treatment or purification of solutions, e.g. obtained by leaching by physical processes, e.g. by filtration, by magnetic means, or by thermal decomposition
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B3/00—Extraction of metal compounds from ores or concentrates by wet processes
- C22B3/20—Treatment or purification of solutions, e.g. obtained by leaching
- C22B3/44—Treatment or purification of solutions, e.g. obtained by leaching by chemical processes
- C22B3/46—Treatment or purification of solutions, e.g. obtained by leaching by chemical processes by substitution, e.g. by cementation
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02W—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO WASTEWATER TREATMENT OR WASTE MANAGEMENT
- Y02W30/00—Technologies for solid waste management
- Y02W30/50—Reuse, recycling or recovery technologies
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02W—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO WASTEWATER TREATMENT OR WASTE MANAGEMENT
- Y02W30/00—Technologies for solid waste management
- Y02W30/50—Reuse, recycling or recovery technologies
- Y02W30/82—Recycling of waste of electrical or electronic equipment [WEEE]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Geochemistry & Mineralogy (AREA)
- Geology (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Manufacture And Refinement Of Metals (AREA)
Abstract
Description
200538394 九、發明說明: 、【發明所屬之技術領域】 、本發明關於一種含有銦之金屬之製造方法,係由將 1丁〇薄膜製造時所飛散的ITO(indium tin oxide ··銦錫氧化 : 物)回收物、廢棄ITO靶材、含ITO廢料(scrap)等,予以 : 溶解之含銦溶液,而製造含高純度之銦。 、【先前技術】 ‘ 銦係屬於被活用於光學材料、光電子材料、化合物半 籲導體、濾材等各種領域中的金屬,最近廣泛的利用作為液 晶顯示器(LCD : liquid crystal display)、電漿顯示器(PDP : plasma display panel)等電極材料原料等方面,但是因為钢 屬於高單價,因而要求從含銦的回收物或廢物等之中將銦 回收再予以利用。 由銦-錫氧化物(ITO)所構成ITO薄膜乃因為兼具高導 電性與可見光穿透性,因而被使用於太陽電池、液晶顯示 裝置、觸控板、及玻璃窗用防凝結發熱膜等各種透明導電 •膜用途方面。 製造ITO薄膜的方法可舉例如:濺鍍、真空蒸鍍、溶 膠·凝膠法、簇束(cluster beam)蒸鍍、PLD等方法。其中, 由於濺鍍法可在大面積基板上以較低溫的製造低電阻薄 膜,因而在工業上廣泛的被採用。 當利用濺鍍法製造ITO薄膜的情況時,一般係以對氧 化銦與氧化錫的混合物,進行燒結而所獲得的ITO燒結體 為靶材,並照射電漿等而對1丁〇施行濺鍍,俾在基板上蒸 5 316907 200538394 鍍形成ITO薄膜。此時, ^ 、, 叶由於經濺鍍之ΙΤΟ並未於基板上 蒸鍍’而導致ΙΤΟ飛勒·於田m 本 取政方;周圍的情況,因而要求將所飛散 的ITO利用鹽酸等酸 义岭%,而形成含銦·錫的酸溶液,再200538394 IX. Description of the invention: [Technical field to which the invention belongs] The present invention relates to a method for manufacturing a metal containing indium, which is made of ITO (indium tin oxide ·· indium tin oxide: (Recycling), waste ITO targets, scraps containing ITO, etc., are given: Dissolved indium-containing solution, to produce high-purity indium. [Previous technology] 'Indium is a metal that is used in various fields such as optical materials, optoelectronic materials, compound semiconducting conductors, and filter materials. Recently, it has been widely used as liquid crystal displays (LCD: liquid crystal display) and plasma displays ( For electrode materials such as PDP (plasma display panel), but steel has a high unit price, it is required to recover and reuse indium from indium-containing recycled materials or waste. ITO film made of indium-tin oxide (ITO) is used in solar cells, liquid crystal display devices, touch panels, and anti-condensation heating films for glass windows because of its high conductivity and visible light transmission. Various transparent conductive film applications. Examples of the method for manufacturing the ITO film include sputtering, vacuum evaporation, sol-gel method, cluster beam evaporation, and PLD. Among them, the sputtering method is widely used in industry because it can produce a low-resistance film on a large-area substrate at a relatively low temperature. When the ITO thin film is produced by a sputtering method, a ITO sintered body obtained by sintering a mixture of indium oxide and tin oxide is generally used as a target material, and plasma is irradiated to perform sputtering. In order to form an ITO thin film, the substrate is vapor-deposited on the substrate for 5 316907 200538394. At this time, ^, 叶, because the ITO that was sputtered was not evaporated on the substrate, ITO Fei Yutian took the political party; the surrounding situation, it is required to use the acid such as hydrochloric acid scattered ITO Yiling% to form an acid solution containing indium tin
由該含銦·錫的酸滚、、在击 A 液中回收銦及錫,並再度當作IT〇原 料等而予以再利用。 : 此種從含銅物中回收姻㈣的方4,以往已知有組合: S夂冷解法、離子父換法、溶劑萃取法等濕式純化的方法, 此外尚有提案數種新方法。 # 例士口於下述專利文獻1中揭示:將除了 In之外尚含 有Sn Pb、Cu、Ag等不純物的In電解黏泥(sHme),利用 鹽酸溶出,經利用鹼劑調整為ρΗ〇·5至2 〇之後,再分離 不/合殘渣,其次添加還原劑,並將所生成沈澱物分離後, 再添加逛原劑,而回收電解用粗銦的方法。 於下述專利文獻2中揭示:在除了 Ιη之外尚含有心與 Μη等不純物的Ιη含有物中,添加過氧化氫水(俗稱雙氧 籲水、’ Η2〇2)與硫酸,而將金屬鹽溶解,然後再添加鹼劑並調 整為ρΗ4·5至6.0,接著施行過濾處理而獲得As與Ιη共存 的沈氣物且使Μη、Zn移往經中和後的溶液中,然後再 攸上述沈殿物中去除As的銦回收方法。 於下述專利文獻3中揭示:對銦含有塊狀物施行粉碎 處理,並將該粉碎物在過氧化氫存在下,於酸性水溶液中 施行溶出處理,然後將鋁板浸潰於該溶出液中,利用取代 反應而在紹板上析出海绵銦(sponge indium),接著對該海 綿姻施行鹼熔鑄而獲得銦金屬的銦回收方法。 316907 6 200538394 於下述專利文獻4中揭* :將含有編勺鹽酸溶液,利用 ,溶劑萃取式⑽_lngextract丨〇ntype)萃取劑進行萃取,其 *次將其以稀酸施行反萃取而所回收的铜溶液,施行電解或 中和而㈣氫氧化物’再利用碳或氫施行還原或利用硫酸 : 溶解而電解,俾回收銦的方法。 ! ☆在下述專利文獻5中所揭示的銦之时方法,係包 '含有:將含冑ITO !因之廢料利用鹽酸溶解而形成鹽化銦溶 液的步驟;在該氯化姻溶液中添加氮氧化納水溶液,而將 #廢料中所含有的锡形成氫氧化錫並去除的步驟;以及經去 除該氫氧化錫後,再從溶液中利用鋅取代姻並回收的步驟。 專利文獻1:日本專利特開平5_156381號公報 專利文獻2:日本專利特開平5_3丨丨267號公報 專利文獻3:曰本專利特開平9_268334號公報 專利文獻4··特開2002-201026號公報 專利文獻5·•特開2002-69544號公報 鲁【發明内容】 (發明所欲解決之绿題) 本發明之目的在於提供一種含有鋼之金屬之製造方 细=將ITO薄膜製造時所飛散的銦回收,並將所獲得含 知物豸利用酸等進行溶解,再以 了績㈣所b含銦溶液作為起始 项杆的情況時,便可效率佳、其 銦 手仫间產率的獲得銦的新穎含有 之金屬之製造方法。 (部解決課題之手段) 為能解決該課題,本發明者等便選用在姻溶液中混入 316907 7 200538394 如依照該方法,便可 沈澱劑,而使銦沈澱並回收的方法 依較少的操作獲得含有銦之金屬。 方面’此種簡單的方法中,當使此銦沈殿之際, 必須盡可能的不使不純物聚集(偕同)於Μ物中H 本發明者等便針對當從含銦溶液中使銦沈殿之際,可“ =制不純物而不使4沉殺的沈職劑進行探討,結果= 卓酸具有特別優越的銦分離能力,遂完成本發明。 換句話說,本發明的含有銦之金屬之製造方法,係從 3有銦的含銦溶液中,製造含有銦之金屬的方法,其包含 有:在含銦溶液中,藉由混合沈澱劑之草酸(。xalic ac⑷而 生成草酸銦(1ndium Gxalate)沈殿物的步驟;以及將上述草 酸銦沈澱物利用固液分離而回收的步驟。 立如上述所回收獲得的草酸銦沈澱物,便直接施行烘 培、或配合必要經與氧或氨以&氫氧化驗接觸後施行烘 培’便可形成含有銦之金屬。 人充再者,亦可將如上述所回收獲得的草酸銦沈澱物溶解 方、駄中,而形成酸溶解液之後,再於此酸溶解液中放入金 屬,藉由與該金屬間的取代反應而生成海綿銦,便可從此海 ,銦中形成含有銦之金屬。另外,此時亦可施行鈍化形成原 離子β洗處理1次以上,該清洗處理包含將所回收獲得的 草&L銦沈澱物浸潰於不會溶解銦的液體中,而使在後續取代 析出步驟中形成金屬表面鈍化原因的離子溶解於該液體 中’亚去除此溶解液。然後將經此鈍化形成原因離子清洗處 理所獲得的清洗處理過的物質溶解於酸中,而形成酸溶解 8 316907 200538394 液,然後在此醆溶解液中放入金屬並藉 i代反應而生成海綿銦,而由海 ^ 、.蜀間的取 向由此海綿銦令形成含有銦之 . &照此種含有銦之金屬之製造方等 種含銦廢料形成含銦溶液,或以 靶材寺各 不僅可有效率的製造含有銦之金屬,且將抑制不 的斌集’而製得高純度含有銦的含銦金屬。 :係ik者LCD、PDP的普及而增加其使用量,且材料 化之備受矚目的材料。所以,本發明透過銦的有 >:利用’便可達到降低材料成本、及該等該等I置的低價 格化。 另外,本發明中所謂「含有銦之金屬」係指金屬塊狀 ⑽物質(姻純度80質量%以上,最好9〇質量%以上),並 涵盍氧化銦在内。 【實施方式】 、,以下係根據實施形態而進行本發明之說明,惟本發明 並不僅限於下述實施形態。 (弟1貫施形態) 弟1實施形態的含有銦之金屬之製造方法,係經由下 述步驟進行含有銦之金屬的製造。 經由: 一在含銦溶液中,藉由混合添加沈澱劑的草酸,而生成 草酸銦沈澱物的步驟(:草酸銦沈澱步驟); 藉由將上途草酸銦沈澱物施行固液分離而回收的步驟 (:沈澱物回收步驟); 9 316907 200538394 配合需要,使所回收的沈澱物接觸氨、 ' 鹼的步驟(:鹼接觸步驟);及 ' f後,將所回收的沈澱物施行供培的步驟(:烘培工程) 等步驟而進行含有銦之金屬的製造。 . 以下,針對本實施形態進行詳細說明。 :(原料:含銦溶液) 本實施形態所使用的原料係含有銦的含銦溶液。 雌p此含姻溶液係除了將1丁〇、銦合金的廢料、或LCD、 DP廢料,利用酸溶解而所形成的溶液之外,尚包括將含 、:r 2半‘體知仃酸清洗的溶液等,僅要屬於含有銦的溶 攻=.於此種含銦溶液而並無特別的限制。 巧’將此含銦廢料等予以溶解的酸,可考慮如:硝 :虱氟义」文、硫酸等,並以由該等酸所形成的硝酸 容液、氟酸系銦溶液、鹽酸系銦溶液等為對象。 對於Ϊ含銦溶液中亦可含有不純物。此時不純物含有量相 、夜、:液中的銦’可為含有〇1冑量%以上之不純物的溶 :亦可適用於含有1重量%以上、5重量%以上、10重 里以士%、甚至20重量%以上之含大量不純物的翻水溶液。 含銦溶液係如上述乃屬於源自廢料、清洗液的 :液,因而可判斷不純物元素的紹,、鎂、鋼、鐵、錄、 有’將單獨存在或含有複數種元素,而亦可均含 料二二其:然卿料中預測大多屬於含錫廢 (草酸鋼:材㈣得含㈣液亦可成為處理對象。 316907 10 200538394 藉由在3銦岭液中添加草酸並混合’便可從含有不純 物的含銦溶液中,選擇性的將銅形成草酸銦並使之沈殿。 混合草酸的形態可採用固體狀(包括粉末)、水溶液、 :體狀:f練灵等任何形態。當混合固體狀草酸的情況 日守,可混合無水合物,但是就成本面觀之,最好為二水合 物的混合。 {是A使草酸銦均勻沈殿並抑制夹帶不純物,最好 赢1 友水溶液狀態進行混合。當以水溶液添加草酸的情況時, •,由水溶液中的草酸濃度形成較飽和濃度低10%以上的低 嚴度,便可使即便草酸水溶液的液溫產生 產生固體草酸沈殺物。此外,若草酸濃度過度降低 施行铜的回收而使草酸水溶液量增加,遂而增加排水量。 有惩於上述’早酸水溶液的草酸濃度最好在〇」m〇L/L以 上,尤以0.2moL/L以上為佳。 再者,所混合的草酸可使用草酸銨或草酸氫錄’因為 •該匕合物均含有草酸因而均可適用,但是依照本發明者 的w,當使用該等化合物的情況時,因為在與含鋼溶液 進行混合後,含銦溶液中所殘留的銦量將較多於使用草酸 時的情況,導致姻回收率降低,因而最好使用草si 旦與田含銦溶液混合的草酸混合量(換言之,所添加的草酸 :)’取好設定為含銦溶液中所含銦量之當量(亦稱「理論 里」)的1.2至5倍。若低於12倍,銦溶液中的殘留量將 增加而降低回收率;反之,超過5倍而即便混合仍不致有 助於回收率的提升。所以,較佳的混合量係為含銦溶液中 316907 200538394 所含钢量當量的1.4至4倍。此外,草酸對銦的當量係指 *姻平均1 moL為草酸1.5moL。所以,所謂「對銦的當量之 • I·2至5倍」,係指平均銦imoL,而草酸為i 8至7 5则乙 在本實施形態中,就從所回收銦純度的觀點而言,最 ··好執行草酸混合前後的含銦溶液之pH管理。草酸混人前 :的含銦溶液PH最好設定在2以下。理由乃是在pH超過2 狀態的含銦溶液中,部分的銦將與不純物一起形成氫氧化 物並存在,導致與草酸混合而所獲得的草酸銦中不純物增 #多的緣故。此外,藉由將草酸混合前的含姻溶液_設^ 在2以下,便可將與草酸混合後的pH形成後述較佳範圍。 此含銦溶液的pH越低越好,最好在1〇以下,尤以〇 5以 下為佳。 · i 所以,若含銦溶液的pH超出上述範圍之外時,最好 對溶液施行pH調整。此pH調整最好為在含銦溶液中予加 石肖酸、鹽酸、氫就酸、硫酸等,而降低pH的方法。但"是, 籲雖从降低pH’但是最好不要添加過剩的酸。當所添加的過 剩酸濃度換算成一元酸為超過3m〇L/L的大量酸之情況時 (硝酸、鹽酸、氫氟酸等依一元酸計添加3m〇L/L以上:: 硫酸等二元酸則添加UmoL/L以上之酸的情況時),將導 致㈣回收率降低。所以,當施行PH調整時,最好酸添 加量不要添加超過上述數値,而當超過此數值的情況時, 最好添加氫氧化鈉或氫氧化鉀,將酸濃度調整至此數值以 下。 另一方面,對有關經混合草酸後的含銦溶液pH,就從 316907 12 200538394 「牛低沈;殿物φ & 的不純物觀點而言,最好設定在1 .〇以下, ’尤以更降低$ η < < a - U·5以下為佳。將草酸混合後的溶液pH範圍 °又疋在此耗圍者,係、利用將混合前❾pH言免定在上述範圍 便可輕易的達成。 • 對有關含銦溶液與沈澱劑(草酸)的混合方法,除了將 ·’含:溶液攪拌,並於其中添加沈澱劑的方法之外,尚有將 ^岭液或聚狀沈殺劑進行攪拌,且添加含銦溶液的方法, "^ 個心(或谷為)中同時導入含銦溶液與沈殿劑的方 ⑩法等之任何方法均可。 士含銦洛液與草酸的混合時間,最好設定為5分鐘至24 ^ ^ >尤以1〇分鐘至12小時為佳。若少於5分鐘,不純 物對草S夂銦的混入量恐將增加;反之,如超過%小時,即 使此合,不純物之降低效果仍無差別,只是降低效率而已。 —再者,含銦溶液與草酸混合時的液溫最好在0至9(rc =範圍内,但是從能源成本面而言,最好在未施行溫度調 鲁節=—酿中鈿仃混合。此外,混合時的液溫若高至某種程 f時,伴隨不純物的情況將減少,且對草酸銦與烘焙後的 氧化銦粒度亦具影響,但是液溫並不怎麼重要。理由乃是 即便不純物伴隨沉激方面幾乎沒有差異,且粒度亦幾乎^ 有差異的情況下,所回收的氧化銦大多實施更進一步之純 ,,在如此之情況時,乃假設使用溶解後更進一步純化的 氧化銦等銦化合物或銦金屬。 I曰由上述所說明的經由含銦溶液與沈澱劑之混合,便 將沉澱出草酸銦。 316907 13 200538394 /'中如上述之,本實施形態在含銦溶液令對尚各有 的情況時仍屬有效,但是關於錫則將大部:隨 •⑴儿又於沈;殿物中。關於此與草義一起沉题的錫,因為 在_的用途方面右ττη — 面有ίΤ〇的情況,因而可直接回收且最後形 :成氧化銦與氧化錫而可再以使用。 : 再者,此情況下,本實施形態亦可將錫分離而僅回收 銦。 ^實施形態中的錫分離法係在含銦溶液與草酸進行混 •合,便對含銦溶液利用酸或驗將PH調整至0.5至4〇 ▲的把圍’再藉由將其過攄便可將錫去除。含姻溶液中的錫 右,pHO.5以上的溶液中,便將形成氫氧化物而沈殿,因 此藉由將其過滤便可去除錫。此外,若超過〇,因為 ,同錫一起沈澱的銦量增加,導致銦之回收率降低,因而 取好避免。另外’當為去除錫而施行pH調整之際,所使 用的驗最好添加氫氧化鈉或氫氧化鉀。理由乃是即使同為 φ 4疋田添加氨的情況時,在添加草酸後的含銦溶液^ 銦殘留量將增加。 然後,經回收的沈澱物(草酸銦)為能以更高純度回收 钔最好利用清洗步驟施行清洗。此時的清洗液最好為水 或草酸水溶液’而水則包括純水、超純水在内,另外,草 西欠水/合液則隶好在濃度〇 5m〇L/L以下的草酸水溶液。 (鹼接觸步驟) 隧著形成含銦 >谷液原料的廢料種類及酸種類,在含銦 溶液中將有含較高濃度銅的情況。此銅較容易混入由草酸 316907 14 200538394 銦所構成的沈澱物中,此銅即便利用上述的水、草酸水容 " 液施行清洗亦難以去除。 ^ 所以,在從含銅的含銦溶液中進行的回收步驟中,最 奸使沈澱物、與氨(或氨與氫氧化鹼)(以下,有時亦簡稱「氨 : 等」)接觸便可去除銅。 ~ : 纟沈殿物的草酸銦中所混人之銅,藉由與氨進行反應 便將形成銅氨錯離子([CuWH3)4]2,而呈可去除狀態。= t ’該反應雖可直接由草酸銦進行反應,但是本發明所析 出草酸銦的結晶性較高,頗難對混入其内部中的銅進行反 應。此接觸處理便藉由使氨(或氨與氫氧切)、與草酸姻 進仃接觸,便將使草酸銦變化為氫氧化鋼而破壞結晶,便 的進行氨與銅的反應。此接觸處理可僅與氨接觸, :二在乳與沈澱物進行接觸的前後(或同時)(包括混合狀 =内)’接職氧化鹼,俾促進草酸銦轉化為氫氧化物, 而進行銅的反應。 化 '、,卜=月中所明「虱氧化鹼」係指驗金屬的氫氧 在内。此氫氧化驗可舉例如:氫氧化納、 工羊’·甲寺別就成本面而言最好使用氫氧化納。 再者’使沈殿物接觸的氨量或 氣氧化於旦人π 义里及使尤Α物接觸的氮量與 …置,至少沈殺物的銅平均^,最好設 所需要的理論必要量上。此㈣量乃使鋼產生反應 其中」最好設定為沈殺物的鋼平均im〇L,為相當於 moL之旲耳數、與沈殿物The indium and tin-containing acid rolls were used to recover indium and tin in the A solution, and reused as IT0 materials. : Recipe 4 for recovering indigo from copper-containing materials has been known in the past in combination: wet-purification methods such as S 夂 cryolysis, parent ion exchange, and solvent extraction. In addition, several new methods have been proposed. # Example Shikou is disclosed in the following Patent Document 1: In electrolytic sludge (sHme) containing impurities such as Sn Pb, Cu, and Ag in addition to In, was eluted with hydrochloric acid, and adjusted to ρΗ〇 · with an alkaline agent. After 5 to 20, the residues are separated, followed by the addition of a reducing agent, and the resulting precipitate is separated, and then the original agent is added to recover crude indium for electrolysis. It is disclosed in the following Patent Document 2 that hydrogen peroxide water (commonly known as hydrogen peroxide, Η2202) and sulfuric acid are added to an Ιη containing substance that contains impurities such as heart and Mn in addition to Ιη, and metal Dissolve the salt, then add an alkali agent and adjust it to ρΗ4.5 to 6.0, and then perform a filtration treatment to obtain a gaseous substance coexisting with As and Ιη and move Mn and Zn to the neutralized solution, and then re-use the above Indium recovery method for removing As from Shen Dianwu. It is disclosed in the following Patent Document 3 that the indium-containing mass is subjected to a pulverization treatment, and the pulverized material is subjected to a dissolution treatment in an acidic aqueous solution in the presence of hydrogen peroxide, and then an aluminum plate is immersed in the dissolution solution. The sponge indium is precipitated on the plate by a substitution reaction, and then the sponge indium is subjected to alkali melting casting to obtain an indium recovery method of indium metal. 316907 6 200538394 is disclosed in the following Patent Document 4 *: The solution containing a scoop of hydrochloric acid is extracted with a solvent extraction type ⑽lngextract (ontype) extractant, and the second time it is recovered by dilute acid for back extraction The copper solution is electrolyzed or neutralized and the rhenium hydroxide is reused carbon or hydrogen for reduction or sulfuric acid: a method of dissolving and electrolyzing and recovering indium. ☆ The indium time method disclosed in the following Patent Document 5 includes the steps of: dissolving ITO containing osmium; and dissolving the waste material with hydrochloric acid to form a salted indium solution; adding nitrogen to the chlorinated solution A step of oxidizing the aqueous solution to form tin hydroxide contained in the #waste material and removing the tin hydroxide; and a step of removing the tin hydroxide, and then replacing zinc with zinc from the solution and recovering the tin hydroxide. Patent Literature 1: Japanese Patent Laid-Open No. 5_156381 Patent Literature 2: Japanese Patent Laid-Open No. 5_3 丨 丨 267 Patent Literature 3: Japanese Patent Laid-Open No. 9_268334 Patent Literature 4… Japanese Patent Laid-Open No. 2002-201026 Document 5 · • Japanese Unexamined Patent Publication No. 2002-69544 [Summary of the Invention] (The Green Problem to be Solved by the Invention) The object of the present invention is to provide a manufacturing method of a metal containing steel = indium scattered when the ITO film is manufactured. In the case of recovering and dissolving the obtained erbium-containing indium with an acid, etc., and using the indium-containing solution as the starting term, the indium can be obtained with good efficiency and indium yield. Method for manufacturing novel contained metals. (Means to solve the problem) In order to solve this problem, the inventors have chosen to mix 316907 7 200538394 with the marriage solution. According to this method, a precipitating agent can be used, and the method of precipitating and recovering indium can be performed with fewer operations. Obtain a metal containing indium. In terms of this simple method, when making this indium sink, it is necessary to prevent impurities from being collected (differently) in M as much as possible. The present inventors have targeted the case of indium sinking from an indium-containing solution. It can be discussed as “= the impure substance that does not cause 4 sinking agents, and the result = citric acid has a particularly superior indium separation ability, so the present invention is completed. In other words, the manufacturing method of the indium-containing metal of the present invention Is a method for manufacturing indium containing metal from 3 indium-containing indium-containing solution, which comprises: indium-containing solution, by mixing precipitating agent oxalic acid (.xalic ac) to generate indium oxalate (1ndium Gxalate) Shen Dian And the step of recovering the above indium oxalate precipitate by solid-liquid separation. Immediately after the indium oxalate precipitate recovered and obtained as described above, baking or mixing with & After contacting the oxidation test, the indium-containing metal can be formed by baking. After filling, the indium oxalate precipitate recovered as described above can be dissolved in the square and osmium to form an acid-dissolved solution. Acid soluble Metal is put into the liquid, and sponge indium is generated by the substitution reaction with the metal. From this sea, indium can be formed into a metal containing indium. In addition, at this time, passivation can be performed to form the original ion β washing process more than once. The cleaning process includes immersing the recovered grass & L indium precipitate in a liquid that does not dissolve indium, and dissolving ions forming the cause of metal surface passivation in the subsequent replacement precipitation step in the liquid. Remove the dissolving solution, and then dissolve the cleaning-treated substance obtained by the ion cleaning treatment of the passivation formation cause in the acid to form an acid-dissolving 8 316907 200538394 solution, and then put the metal in the dissolving solution and borrow i Generation of indium sponge, and from the orientation of the sea ^ ,. Shu from this sponge indium to form indium-containing indium. &Amp; According to such indium-containing metal manufacturers and other indium-containing waste to form an indium-containing solution, or The target temples can not only efficiently produce indium-containing metals, but also suppress intensive binji 'to produce high-purity indium-containing indium-containing metals.: The popularity of LCDs and PDPs has increased their use. The amount of use, and materialization of the attention of the material. Therefore, the present invention through the use of indium >: the use of 'can be achieved to reduce the cost of materials, and these low-priced I. In addition, the so-called in the present invention "Metal containing indium" refers to a metal lump material (80% by mass or more, preferably 90% by mass or more), and contains indium oxide. [Embodiment] The following is based on the embodiment. Although the description of the present invention is made, the present invention is not limited to the following embodiments. (First embodiment) The method for manufacturing an indium-containing metal according to the first embodiment is to produce the indium-containing metal through the following steps. Via:-a step of generating an indium oxalate precipitate by adding precipitating oxalic acid in an indium-containing solution (: indium oxalate precipitation step); and recovering the indium oxalate precipitate by performing solid-liquid separation Step (: Precipitation recovery step); 9 316907 200538394 According to needs, the step of contacting the recovered precipitate with ammonia, the alkali step (: alkali contact step); and after 'f, the recovered precipitate is executed The step of training (: Engineering baking) is performed like step of producing the metal-containing indium. Hereinafter, this embodiment will be described in detail. : (Raw material: indium-containing solution) The raw material used in this embodiment is an indium-containing solution containing indium. The female solution is a solution formed by dissolving 1 butyl, indium alloy waste, or LCD or DP waste with acid, and it also includes cleaning with: 2r The solution, etc., is only required to be a solution containing indium = there is no particular limitation on such an indium-containing solution. For the acid in which this indium-containing waste material is dissolved, consider, for example, nitric acid: fluoride, sulfuric acid, etc., and use the nitric acid solution formed by these acids, fluoric acid-based indium solution, and hydrochloric acid-based indium. The solution is targeted. Impurities may also be contained in rhenium indium-containing solutions. At this time, the impurity content phase, indium, and indium in the liquid may be a solution containing impure matter of 0.1% by weight or more: it may also be suitable for containing 1% by weight or more, 5% by weight or more, 10 li%, Even 20% by weight or more of an aqueous solution containing a large amount of impurities. As mentioned above, the indium-containing solution belongs to the waste and cleaning fluids: liquid, so it can be judged that the elements of impurities, magnesium, steel, iron, iron, aluminum, and aluminum will exist alone or contain multiple elements, but they can also be all Contained materials: Ranqing materials are mostly predicted to be tin-containing wastes (oxalate steel: material containing mash can also be treated. 316907 10 200538394 By adding oxalic acid to 3 indium ridge solution and mixing it ' From the indium-containing solution containing impurities, the copper can be selectively formed into indium oxalate and allowed to sink. The form of mixed oxalic acid can be in any form such as solid (including powder), aqueous solution,: body: f, and so on. When mixed The state of solid oxalic acid can be mixed, but anhydrate can be mixed, but in terms of cost, it is best to mix dihydrate. {It is A to make indium oxalate uniformly sink the temple and suppress the inclusion of impurities, it is best to win 1 friend aqueous solution When the oxalic acid is added in an aqueous solution, the oxalic acid concentration in the aqueous solution forms a low severity of more than 10% lower than the saturated concentration, so that even when the liquid temperature of the oxalic acid aqueous solution is generated, solid oxalic acid is produced. In addition, if the concentration of oxalic acid is excessively reduced, the amount of oxalic acid aqueous solution is increased due to the recovery of copper, and the amount of drainage is increased. The penalty for the above-mentioned 'early acid aqueous solution is preferably above 0 "m0L / L, especially It is better to be at least 0.2moL / L. Furthermore, the mixed oxalic acid can be ammonium oxalate or hydrogen oxalate. 'This compound is applicable because it contains oxalic acid, but according to the inventor's w, when using this In the case of compounds, the amount of indium remaining in the indium-containing solution after mixing with the steel-containing solution will be greater than that when oxalic acid is used, resulting in a lower recovery rate. Therefore, it is best to use grass si The mixed amount of oxalic acid (in other words, added oxalic acid :) 'is set to 1.2 to 5 times the equivalent of the amount of indium contained in the indium-containing solution (also known as "theory"). If less than 12 Times, the residual amount in the indium solution will increase and decrease the recovery rate; on the contrary, more than 5 times will not help to improve the recovery rate even if mixed. Therefore, the better mixing amount is contained in the indium-containing solution 316907 200538394 Steel equivalent In addition, the equivalent of oxalic acid to indium means that the average 1 moL of oxalic acid is 1.5 moL of oxalic acid. Therefore, the so-called "I · 2 to 5 times the equivalent of indium" refers to the average indium imoL, and The oxalic acid is i 8 to 75. In this embodiment, from the viewpoint of the purity of the recovered indium, the pH management of the indium-containing solution before and after oxalic acid mixing is best performed. Before the oxalic acid is mixed: the indium-containing solution The pH is preferably set below 2. The reason is that in the indium-containing solution whose pH exceeds 2, some of the indium will form hydroxide with the impurities and exist, resulting in an increase in impurities in the indium oxalate obtained by mixing with oxalic acid # In addition, by setting the solution containing oxalic acid before mixing oxalic acid to 2 or less, the pH after mixing with oxalic acid can be set to a preferable range described later. The lower the pH of this indium-containing solution, the better, and it is preferably below 10, especially below 0.5. · I Therefore, if the pH of the indium-containing solution is outside the above range, it is best to adjust the pH of the solution. This pH adjustment is preferably a method of lowering the pH by adding shirasmic acid, hydrochloric acid, hydrogen acid, sulfuric acid, etc. to the indium-containing solution. But "yes, from the lowering of pH ', it is better not to add excess acid. When the added excess acid concentration is converted into a large amount of acid whose monobasic acid is more than 3mOL / L (Nitrate, hydrochloric acid, hydrofluoric acid, etc. are added as more than 3mOL / L in terms of monobasic acid :: binary such as sulfuric acid When acid is added above UmoL / L), the recovery rate of tritium will decrease. Therefore, when pH adjustment is performed, it is best not to add more acid than the above amount. When it exceeds this value, it is best to add sodium hydroxide or potassium hydroxide to adjust the acid concentration to below this value. On the other hand, the pH of the indium-containing solution after mixing with oxalic acid is preferably set to 1.0 or less from the viewpoint of impurities of 316907 12 200538394 "bovine low sinking; temple objects φ & $ η < < a-U · 5 or less is preferred. The pH range of the solution after the oxalic acid is mixed is in this range, and it can be easily achieved by using the pH range before mixing to avoid the above range. • For the mixing method of indium-containing solution and precipitation agent (oxalic acid), in addition to the method of stirring the solution and adding a precipitating agent to it, there is also a method of using ridge solution or a polymeric sinking agent. The method of stirring and adding an indium-containing solution can be any method such as the method of simultaneously introducing the indium-containing solution and the Shen Dian agent into the heart (or Guwei). Mixing time of the indium-containing solution and oxalic acid It is best to set it to 5 minutes to 24 ^ ^ > especially 10 minutes to 12 hours. If less than 5 minutes, the amount of impurities mixed with grass indium will increase; otherwise, if it exceeds% hours, Even if this is the case, there is no difference in the reduction effect of impurities, but it only reduces the efficiency. — Moreover, the temperature of the liquid when the indium-containing solution is mixed with oxalic acid is preferably in the range of 0 to 9 (rc =, but in terms of energy costs, it is best to perform temperature adjustment without performing temperature adjustment =-Brewing in the pot仃 Mixed. In addition, if the liquid temperature during mixing is high to a certain range f, the situation of impurities is reduced, and it also affects the particle size of indium oxalate and indium oxide after baking, but the liquid temperature is not very important. Reason However, even if there is almost no difference in impure substances accompanying the impregnation and the particle size is almost the same, most of the recovered indium oxide is further purified. In this case, it is assumed that further purification is performed after dissolution. Indium compounds such as indium oxide or indium metal. I means that indium oxalate is precipitated by mixing the indium-containing solution and the precipitation agent as described above. 316907 13 200538394 / 'As mentioned above, this embodiment contains indium. The solution order is still effective for each situation, but most of the tin will be: Sui⑴er again in Shen; Dianwu. About this question with Cao Yi tin, because of the use of _ Right ττη — There is a case of ΤΤ, so it can be directly recovered and finally formed: indium oxide and tin oxide can be reused .: Furthermore, in this case, tin can be separated and only indium can be recovered in this embodiment. ^ Implementation mode In the tin separation method, the indium-containing solution is mixed with oxalic acid, and then the pH of the indium-containing solution is adjusted to 0.5 to 40 by using an acid or test, and the tin can be tinned by passing it through. Remove. In the solution containing tin right, in the solution above pHO.5, hydroxide will form and Shen Dian, so tin can be removed by filtering. In addition, if it exceeds 0, it will precipitate with tin. The increase in the amount of indium leads to a decrease in the recovery rate of indium, so it should be avoided. In addition, when pH adjustment is performed to remove tin, it is best to add sodium hydroxide or potassium hydroxide to the test. The reason is that even when ammonia is added for φ 4 Putian, the indium-containing solution after adding oxalic acid ^ the indium residual amount will increase. Then, the recovered precipitate (indium oxalate) can be recovered in a higher purity. It is best to use a cleaning step for cleaning. The cleaning solution at this time is preferably water or an oxalic acid aqueous solution, and the water includes pure water and ultrapure water. In addition, the oxalic acid underwater / hyaluronic acid solution is preferably an oxalic acid aqueous solution having a concentration of 0.5 m0L / L or less. . (Alkali contact step) The types of waste materials and acids that form the indium-containing grain liquid by tunneling may contain higher concentrations of copper in the indium-containing solution. This copper is easier to mix into the precipitate composed of 316907 14 200538394 indium oxalate. This copper is difficult to remove even if it is cleaned by using the above water and oxalic acid water " solution. ^ Therefore, in the recovery step from a copper-containing indium-containing solution, it is sufficient to contact the precipitate with ammonia (or ammonia and alkali hydroxide) (hereinafter, sometimes referred to as "ammonia: etc.") Remove copper. ~: The copper mixed in the indium oxalate of Shen Dianwu will react with ammonia to form copper ammonium ion ([CuWH3) 4] 2, which can be removed. = t 'Although this reaction can be directly performed from indium oxalate, the indium oxalate precipitated by the present invention has high crystallinity, and it is quite difficult to react copper mixed in the inside. In this contact treatment, by contacting ammonia (or ammonia and oxyhydroxide) with oxalic acid, the indium oxalate will be changed to steel hydroxide to destroy the crystal, and the reaction between ammonia and copper will proceed. This contact treatment can only be in contact with ammonia. Second, before and after (or at the same time) (including mixed = internal) contact between the milk and the sediments, it takes over the oxidation of alkali, promotes the conversion of indium oxalate to hydroxide, and performs copper. Reaction. "'," Bu = "alkali alkaloid" stated in the middle of the month refers to the metal's hydrogen and oxygen. Examples of this hydroxide test include: sodium hydroxide, Gongyang '· jiasi, it is best to use sodium hydroxide in terms of cost. Furthermore, 'the amount of ammonia or gas contacted by Shen Dianwu will be oxidized in the pi yi and the amount of nitrogen contacted by A will be at least equal to the average copper of the sinker, and it is best to set the required theoretical amount on. This amount is to make the steel react. Among them, it is best to set the average im0L of the steel, which is equivalent to the number of moL, and Shen Dianwu.
的姻+均1m〇L為相當於3m〇L 316907 15 200538394 _ =的合計莫耳數以上。此乃草酸銦將充分的轉換為 = 銦,且銅將與氨進行反應而較容易去除的緣故。另 -:方面,有關該等氨等的接觸量上限,最好沈澱物的銅平 :lm〇L為相當於4mQL之莫耳數、與沈殺物的翻平均 之莫耳數的合計莫耳數之b倍之莫耳數以 ·’ :。此上限値乃就從去除銅的觀點而言並非 :導:是考慮如使用多餘的大量氨等,將發生姻溶出現ΐ 而V致回收率降低的情況。 但是:上述氨等的使用量雖以沈澱物(草酸銦)的 二’:是為能以沈澱物中的成分為基準而決定氨 須施行沈殿物分析,並根據此結果再計算出使 ==行此分析’多少亦需要等待時間,而將對有 效率的回收作業形成阻礙。另外,尋常的回收作業方面 、在作業錢執行含銦溶液的成分分析。、 決定=吏施形態中’以含銦溶液中的成分為基準再 疋虱寺使用1,可謂最佳狀況。 —3钔,合液中的成分為基準的氨等使用量,在考 恤谷液中的大部分銅將混合於沈殿物 在2 含銦溶液中的銅平 J丨月况下,取好 t = m〇L,而設定為相當於4moL的莫 =尤以含銦溶液,的銅平均_ ⑴耳 含銦溶液中的銦平均—為心二 、 、。计莫耳數以上。而上限值則最好為人_ ^ y 二銅平一為相當一之莫耳::=二 中的銦平均lm〇i盎4上 /、3姻,合/夜 0[為相當於3m〇L之莫耳數的合計莫耳數2 316907 16 200538394 倍量以下。藉由此種設定,毫笙 致小於以辦為基準時的使用:使用量之下限値,若不 不致大於以沈澱物為基.準時的限値’且上限値亦 地執行銅的去除。 )使用!之上限値,便可確實 對沈澱物的接 & ^ ^ T隹不〉谷液之狀態下實施。 包括有:將沈殿物與水進行混合並吹入氨氣, 添加固體氣氧化驗等步驟,最後才形成水 虽使心水溶液、氫氧化驗水溶液時的濃度並無特別 ^限制’只要含有上述必要量之溶液者即可。但是,如濃 度過低時’排水量將增加;反之,如濃度過高時,相對於 沈澱物量的液量將變得過少造成接觸不足,因而該等水溶 液浪度最好設定為0.5至15m〇L/L,尤以i至ι〇_ 佳。 、再者,處理次數,可將必要量的氨(水溶液)[或氨(水溶 φ液)與氫氧化驗(水溶液)],分成複數次而使接觸沈殿物,但 是從效率面等觀點而言,最好單次實施。 、再者,氨水、/谷液的溫度可施行加熱亦可為常溫,但是 為不致降低效率,最好為常溫。 對有關在進行與該氨之間的接觸處理時,仍最好在此 步知的則及/或後(特別係在之前),將沈澱物以水或草酸水 浴液施行清洗。藉此便可回收極高純度的銦。然後,藉由 接觸處理前的清洗,便可將因接觸處理所應產生氫氧化物 之外的其他不純物予以去除。 17 316907 200538394 沈殿物的清洗方法及與氨間的接觸處理方法,可列舉 如.將含銦溶液中的草酸銦沉殿並去除上清液,再於並中 =入清洗液或氨溶液並施行㈣的方法;或將含銦溶液過 〜,再將_餅以清洗㈣氨料進行混合时驟,並施 =此步驟!次以上的再製浆清洗法;或在對含銦溶液利用 ^空過遽或Μ濾機⑼ter press)等施行過滤的過滤裝置 中,通入清洗液或氨溶液的過濾清洗法等任何方法。 再者,當經沈殿劑添加後並未施行清洗而是直接馬上 回,草酸銦的情況時’或利用過遽清洗以外的方法施行清 先τ雖可將草酸銦固液分離,但是此將可採用通 濾方法。 (烘焙步驟)Marriage + average 1mOL is equivalent to 3mOL 316907 15 200538394 _ = the total number of moles or more. This is because indium oxalate will be fully converted to = indium, and copper will react with ammonia to be easily removed. On the other hand, regarding the upper limit of the amount of exposure to such ammonia, the copper level of the precipitate is best: lm0L is equivalent to the total number of moles of 4mQL, and the total number of moles of the average of the moles of the sinker. The number of moles b times the number is · ':. This upper limit is not from the point of view of copper removal: It is considered that, if an excessive amount of ammonia is used, a marriage will occur, and the recovery rate will decrease due to V. However, although the amount of ammonia used above is based on the di 'of the precipitate (indium oxalate): it is necessary to perform the analysis of Shen Dianwu based on the components in the precipitate, and then calculate the value based on this result. Performing this analysis will require waiting time to some extent, which will hinder efficient recycling operations. In addition, in the ordinary recycling operation, the component analysis of the indium-containing solution is performed at the operating cost. , Decision = In the form of official application, the best condition is based on the use of the indium-containing solution as the reference and then use of Lice Temple. —3 钔, the amount of ammonia and other components used in the mixture as the basis. Most of the copper in the test solution will be mixed with Shen Dianwu ’s copper in 2 indium-containing solution. = m〇L, and set to equivalent to 4moL Mo = especially the indium-containing solution, the average copper _ _ ear indium-containing solution indium average-for the heart II,. Count more than Mohr. The upper limit is preferably _ ^ y Two copper flat one is quite a mole: :: = the average indium in the two lm 〇 4 、, 3 marriage, together / night 0 [is equivalent to 3 m〇 The total mole number of L is 2 316907 16 200538394 or less. With this kind of setting, it is less than the use when it is based on the office: the lower limit of the amount of use, if not not greater than the sediment-based. Just-in-time limit 'and the upper limit of copper removal. )use! If the upper limit is 値, the connection to the Shen Dian Lake can be carried out under the condition of the valley liquid. It includes the steps of mixing Shen Dianwu with water, blowing ammonia gas, adding solid gas oxidation test, and finally forming the concentration of water to make the aqueous solution and hydrogen hydroxide solution. There are no special restrictions ^ as long as it contains the above necessary The amount of solution is sufficient. However, if the concentration is too low, the drainage volume will increase; conversely, if the concentration is too high, the amount of liquid relative to the amount of sediment will become too small and cause insufficient contact. Therefore, the wave length of these aqueous solutions is preferably set to 0.5 to 15 mL / L, especially i to ι〇_. Third, the number of treatments can be divided into a plurality of times to contact Shen Dianwu with the necessary amount of ammonia (aqueous solution) [or ammonia (water-soluble φ liquid) and hydroxide test (aqueous solution)], but from the point of view of efficiency, etc. , Preferably a single implementation. Furthermore, the temperature of the ammonia water and / valley liquid can be heated or normal temperature, but in order not to reduce the efficiency, the normal temperature is preferred. For the contact treatment with the ammonia, it is still best to know at this step and / or after (especially before), washing the precipitate with water or oxalic acid bath. This allows very high purity indium to be recovered. Then, by washing before the contact treatment, impurities other than hydroxides due to the contact treatment can be removed. 17 316907 200538394 Shen Dianwu's cleaning method and contact treatment method with ammonia, for example, immersing indium oxalate in an indium-containing solution and removing the supernatant, and then adding the cleaning solution or ammonia solution to the mixture ㈣ method; or pass indium-containing solution ~, and then _ cake to wash ㈣ ammonia material when mixing step, and apply = this step! Repulping and cleaning method for more than two times; or any method such as filtration and cleaning method in which a cleaning solution or an ammonia solution is passed into a filtering device that filters indium-containing solutions by using a vacuum filter or a filter press. In addition, when Shen Dianji was added, cleaning was not performed but immediately returned. In the case of indium oxalate, or Qingxian τ was performed by a method other than cleaning, although the indium oxalate can be separated from solid and liquid, but this will Adopt the filtration method. (Baking step)
、、’二口液刀離的沈;殿物(草酸銦或氫氧化銦),藉由施行 U可$成氧化銦。此烘培最好將固液分離後的沈殿物 f接加熱。亦可在固液分離後經乾燥才施行烘焙,但是就 能源成本、效率等觀點而言,最好採取直接烘焙方式。烘 培溫度最好設定為_ i讓。c,尤以7GG i謂。0為 ,。此外,烘培時間係!至48小時,尤以2至24小時為 ,。對有關供培條件若低於下純的話,將無法完全形成 ,物反之,即便依超過上限値的溫度、時間施行烘培, 則僅空徒浪費能源而已。 (第2實施形態) 第2貝把形怨之含有銦之金屬之製造方法係經由下述 步驟進行含有銦之金屬的製造。 316907 200538394 經由: :回收原料的含銦物質溶解於酸之含銦溶液,六 -力口沈;殿劑的草齡 _ . /,J" 經轧合而生成草酸銦沈澱物的步驟 酸銦沈;殿步驟); 、·早 :肖由對上述草酸銦沈殿物施行固液分離 :(:沈澱物回收步驟); 將所回收的沈;殿物浸潰於不會溶解姻的液體中,而 鈍化形成原因離子溶解於該液體中,再施行1次以上去除 此溶解液的鈍化形成原因離子清洗處理之步驟(·鈍化^ 原因離子清洗步驟); (.鈍化形成 ,使上述鈍化形成原因離子清洗處理中所獲得清洗處理 :)的物質’溶解於酸中而形成酸溶解液的步驟(:酸溶解步 在職轉财浸潰金屬板,藉由與該金相的 反應而析出海綿銦的步驟(:取代析出步驟” …從海_獲得含有銦之金屬的步驟(:金屬化步驟 等步驟而製造含有銦之金屬。 另外’所謂「海綿銦」係指藉由與金 而所生成的多孔質狀(海綿狀)之含銦物質。 代反應 再者,「經取代析出步驟而在今麗 她工 士 /「 孟屬板上形成鈍化原因的 離子」,亦稱「鈍化形成原因離子」。 以下’針對本實施形態中的 明。 ]原枓與各步驟進行詳細說 (含銦物質) 316907 19 200538394 原料的含_物質來源並無特別的㈣。例如薄膜 ,製造時所飛散ίτο的回收物、廢棄IT〇革巴材、ιτ〇或姻合 孟的,料、或者LCD與PDP的廢料、含有銦的半導體回 收物寻,或者從經使用完畢或偏離原本使用用途中所回收 :的含銦物質。其中,從在IT〇薄膜製造時飛散的含姻物質 ••所回收到的物質’係例如將氧化銦與氧化錫的混合物施行 燒結而獲得ΙΤ0燒結體,再以此ΙΤ〇燒結體為乾材,當昭 射電漿“们TQ雜之際,將未蒸肋基板上而飛散於 •周圍的ΓΓΟ回收,所獲得的含銦物質便屬於最適用於本實 施形態之原料的一例。 (含铜溶液) 3銦/谷液最好為將上述含銦物質溶解於酸中的溶液。 曰含銦溶液中的銦含有量雖無特別限制,但是銦含有量 最好在10g/L以上,尤以15g/L以上為佳,又以2(^以 上為更佳。此外,關於錫最好少於銦含有量的ι〇%。此外, 鲁在除了銦與錫以外的金屬方面,若考慮除了取代析出時所 ,用:金屬(例如鋁或鋅等)以外之金屬,最好總量少於銦 含有量的10%。即便該等含有在銦含有量的1〇%以上,並 非無法適用本實施形態㈣造方法,但是因絲代析出步 驟中的效率、銦純度將降低,因此最好少於銦 1 10%。 ▽ 溶解含銦物質之酸的種類雖無特別限制,但是適於本 實2形態者有如利用鹽酸、硝酸、氟酸、硝氟酸等無機酸 所溶解的含銦溶液,其中最好為硝酸。 316907 20 200538394 如使用硝酸,便可輕易地溶解含銦物質。當使用硝酸 時’在取代析出步财’硝_子將形成鈍化而恐將妨礙 到取代析出,但是若如本實施形態之當添加草酸而析出草 酸銦時,因為硝酸與草酸的相容性佳,且由於草酸姻(沈殿 物)之結晶變大’因此當施行@液分離之際,分離性能將提 高,可達到減少固液分離後的沈澱物中之母液量,藉此便 可減少硝酸離子殘留量,隨固液分離的方法亦可能省略純 化形成原因離子清洗步驟。"," And two mouthpieces are separated by a knife; the object (indium oxalate or indium hydroxide) can be converted into indium oxide by performing U. This baking preferably heats the Shen Dianwu f after the solid-liquid separation. Baking can also be performed after solid-liquid separation and drying, but from the standpoint of energy cost and efficiency, it is best to adopt direct baking. The baking temperature is best set to _ i let. c, especially 7GG i. 0 is. Also, baking time is up! To 48 hours, especially 2 to 24 hours. If the relevant feeding conditions are lower than the lower purity, it will not be fully formed. Conversely, even if baking is performed at a temperature and time exceeding the upper limit, only empty energy is wasted. (Second Embodiment) The second method for manufacturing a metal containing indium containing metal is performed through the following steps. 316907 200538394 Via :: The indium-containing material of the recovered raw material is dissolved in the indium-containing solution of the acid, six-force mouth sinking; the grass age of the agent _. /, J " The step of rolling to generate an indium oxalate precipitate. Temple steps) ;, early: Xiao You performed solid-liquid separation on the above indium oxalate sinking house: (: precipitation recovery step); the recovered sink; the house was immersed in a liquid that would not dissolve the marriage, and The passivation formation cause ions are dissolved in the liquid, and the passivation formation cause ion cleaning step (passivation ^ cause ion cleaning step) to remove the dissolved solution is performed more than once; (.passivation formation, the above passivation formation cause ion cleaning is performed) The cleaning process obtained in the process :) The step of dissolving the substance 'in acid to form an acid solution (: The step of acid dissolving in the step of leaching a metal plate and depositing sponge indium by reaction with the metallographic phase ( : Substituting the precipitation step "… a step of obtaining indium-containing metal from the sea_ (a metallization step and the like to produce indium-containing metal. In addition," the "sponge indium" refers to a porous state formed by contact with gold ( Sponge-like) indium-containing substances. The generation reaction is further, "the ionization cause of passivation is formed on the current Laita engineer /" mongolian plate "by replacing the precipitation step", also known as "passivation formation cause ion". The explanation in this embodiment.] The original 枓 and the steps are described in detail (indium-containing substances) 316907 19 200538394 The source of _ containing materials is not particularly ㈣. For example, thin films, recycled materials scattered during manufacturing, and discarded IT 〇 leather materials, ιτ〇 or marriage with Bangladesh, materials, or LCD and PDP waste, indium-containing semiconductor recyclables, or indium-containing substances recovered after use or departure from the original use: Among them From the marriage-containing substance scattered during the manufacturing of IT0 film, the recovered substance is, for example, a ITO sintered body obtained by sintering a mixture of indium oxide and tin oxide, and the ITO sintered body is used as a dry material. When the Zhaoqi Plasma TQ is mixed, the non-steamed rib substrate is scattered and scattered around the ΓΓΟ to recover, and the indium-containing substance obtained is an example of the raw material most suitable for this embodiment. (Including Copper solution) 3Indium / valley solution is preferably a solution in which the above-mentioned indium-containing substance is dissolved in an acid. Although the indium content in the indium-containing solution is not particularly limited, the indium content is preferably 10 g / L or more, especially 15 g / L or higher is preferred, and 2 or higher is more preferred. In addition, tin is preferably less than ι0% of the indium content. In addition, for metals other than indium and tin, if In place of precipitation, use metals other than metals (such as aluminum or zinc), and the total amount is preferably less than 10% of the indium content. Even if the content is more than 10% of the indium content, it is not impossible to apply this The morphology forming method is implemented. However, since the efficiency and the purity of indium in the silk deposition step will decrease, it is preferably less than 10% of indium. ▽ Although there is no particular limitation on the type of acid that dissolves indium-containing substances, those suitable for the second form are indium-containing solutions that are dissolved with inorganic acids such as hydrochloric acid, nitric acid, fluoric acid, and nitrofluoric acid. Among them, nitric acid is preferred. 316907 20 200538394 If you use nitric acid, you can easily dissolve indium-containing substances. When nitric acid is used, nitrate will form a passivation during substitution and precipitation, which may hinder substitution precipitation. However, if indium oxalate is precipitated when oxalic acid is added as in this embodiment, the compatibility between nitric acid and oxalic acid is good. And because the crystallization of oxalic acid (Shen Dianwu) becomes larger, so when the @liquid separation is performed, the separation performance will be improved, and the amount of mother liquid in the precipitate after solid-liquid separation can be reduced, thereby reducing nitrate ions. Residual amount, with the method of solid-liquid separation, may also omit the ion cleaning step for purification formation reasons.
再者,當將含銦物質溶解於硝酸之含有銦之硝酸溶液 的情況時,藉由在含有銦之硝酸溶液狀態下靜置適當時 間,便可將含有銦之硝酸溶液中所含的錫,形成偏錫酸 (ΗβηΟ3)而沈澱去除,可減輕後續步驟的負擔。此時的靜 置時間最好在24小時以上,尤以168小時以上為佳。 (草酸銦沈殺步驟) 邮藉由在含銦溶液中添加草酸並混合,便可從含銦溶液 馨中選擇性的將銦形成草酸銦並使之沈殿。 添加草酸的形態可採用固體狀(包括粉末)、水溶液、 固體狀者以分散的於漿等任何形態均可適用。當混合固體 ^草酸的情況時,可混合無水合物,但是就成本面觀之, 表好為一水合物的混合。 、但是’為使草酸铜均勻沈殿並抑㈣夾帶不純物,最好 j水〉谷液狀態進行混合。f以水溶液添加草酸的情況時, f由將水料中的草酸濃度形成較飽和濃度低⑽以上的 /辰度’即便草酸水溶液的液溫產生變動,仍可使之較難以 316907 200538394 發生固體草酸沈澱物的情況。此外,如 *低,為施行銦回收的草酸水溶液量便將^之遭度過度降 -量。有鑑於上述,蕈醅皮、、六汸沾#, ^ 而增加排水When the indium-containing substance is dissolved in a nitric acid-containing nitric acid solution, the tin contained in the indium-containing nitric acid solution can be left standing for an appropriate time in a state of the nitric acid solution containing indium. Metastannic acid (酸 βηΟ3) is formed and removed by precipitation, which can reduce the burden of subsequent steps. The standing time at this time is preferably at least 24 hours, and more preferably at least 168 hours. (Indium oxalate precipitation step) By adding and mixing oxalic acid in an indium-containing solution, the indium can be selectively formed from the indium-containing solution to form indium oxalate and allowed to sink. The form of adding oxalic acid can be applied in any form such as solid (including powder), aqueous solution, and solid form in a dispersed form. In the case of solid oxalic acid, anhydrous hydrates can be mixed, but in terms of cost, it is a mixture of monohydrates. However, in order to uniformly sink copper oxalate and suppress impurities, it is best to mix with water> valley. When oxalic acid is added in an aqueous solution, f is obtained by changing the concentration of oxalic acid in the water to a saturation concentration that is lower than ⑽ / °. 'Even if the liquid temperature of the oxalic acid aqueous solution changes, it is still difficult to produce 316907 200538394. Condition of the sediment. In addition, if * is low, the amount of the oxalic acid aqueous solution recovered for the implementation of indium will be excessively reduced. In view of the above, the mushroom skin, and six 汸 汸 #, ^ and increase drainage
以上,尤以二二 濃度最好在一L 兀以UnoL/L以上為佳。 • 再者,所混合的草酸可使用草酸録^ •為該二化合物均含有草酸因而均可適二:=料因 化合物的情況時,因為在盥含銦、容 疋田使用忒寻 液中所殘留的銦量將較多於使用草酸的:;Γ:導:Γ 收率降低,ϋ而最好❹草酸。 W致銦回 與含銦溶液混合的草酸混合量(換言之 τ’最好設定為含銦溶液中所含銦之當量(亦= 勺1.2至5倍。若低於丨2倍,銦、容 」 而降低回收率;反之,即便_5倍梅=^ = :::=r。所一的混合量係為== 所3銦里§置的1 ·4至4倍。 此外,草酸對銦的當量係銦平肖lm〇L為草酸 1:所以/所謂「對姻的當量之至5倍」,係指平 :·.因ImoL ’早酸為18至7 5m〇卜就從提高所回收含有 $之=屬的域度之觀點而言,最好執行草酸混合前後的 二钔冷液之pH官理。草酸混合前的含銦溶液之最好設 定f小於3.5,尤以2以下為佳。理由乃是如在ΡΗ3.5 :乂 上日τ ’由於部分鋼形成氫氧化物而並未形成草酸姻,因而 將降低銦之回收率。此外,藉由設定在PH2以下便可提升 銦回收率,就此觀點而言,含銦溶液的pH以越低越好, 316907 200538394 因而最好在1·〇以下,尤以0.5以下為佳。 Α 當含銦溶液的pH超出上述範圍之外時,最好對溶液 -施行pH調整。但是,雖欲降低pH,可是仍最好不要添加 過剩的酸。當所添加的過剩酸濃度換算成一元酸為超過 ;3m〇L/L的大量酸之情況時(硝酸、鹽酸、氫氟酸等一元酸 :中添加3m〇L/L以上,而硫酸等二元酸中則添加 以上之酸的情況),將導致銦的回收率降低。所以,當施行 pH調整時,最佳之酸添加量不添加超過上述數値,而當超 _過此數值之時,最好添加氫氧化鈉或氫氧化鉀,將酸濃度 調整至此數值以下。 另一方面’對有關經混合草酸後的含銦溶液pH,就從 降低沈殿物中的不純物觀點而言,最好設定在2 〇以下, 尤以更降低至1 · 〇以下為佳。 有關含銦溶液與沈澱劑(草酸)的混合方法,除了將銦 含有液攪拌,並於其中添加沈澱劑的方法之外,尚有將水 谷液或漿狀沈澱劑進行攪拌,且添加含銦溶液的方法,或 2在1個槽(或容器)中同時導入含銦溶液與沈澱劑的方法 等之任何方法均可。 一再者,含銦溶液與草酸混合時的液溫如在0至90。(:之 =圍内即可。由於混合時之液溫以較高者有降低不純物伴 f沈,的傾向,但是影響並不大,因此就從能源成本面而 °最好在未施行溫度調節的常溫中施行混合。 δ I□溶液中添加草酸之後,最好以適度的時間攪拌 混合,且配合需要適當的靜置。 316907 23 200538394 此%·的搜拌日可間最好設定為5分鐘至^小時,尤以 10分鐘至12小時為佳。若少於5分鐘,不純物對草酸姻 的混入量恐將增加;反之,如超過24小時,即便加以混人, 不純物降低效果仍無差別,只是降低效率而已。 (沈澱物回收步驟) : ^上述草酸銦沈殿物施行固液分離的方法,可採用習 知的固液分離方法,例如可使用抽吸過遽等真空過濾、舞 慮機等加壓過濾、高速離心機或離心、分離等分離方法等之 _固液分離方法。 ,、另外,隨本步驟中所施行的固液分離程度,亦有可能 省各接下來的鈍化形成原因離子清洗步驟。特別係當以含 有銦之硝酸溶液為起始原料的情況時,因為硝酸離子在取 代析出步!^中將形成鈍化形成原因離子,而妨礙取代析出 反應’因此通常必須施行鈍化形成原因離子清洗步驟,但 是藉由充分的施行本步驟的固液分離,例如採取分離性能 佳的固液分離方法,或者拉長過濾時間、或增加過濾面積 等方式’便將減少草酸銦沈澱物中所含的母液量,而減少 鈍化形成原因離子的量,H此便可省略鈍化形成原因離子 清洗步驟。具體而言,當省略鈍化形成原因離子清洗步驟 之際,若紐溶解㈣巾所製得溶解液中的鈍化形成原因 離子濃度’在10000Ppm以下(最好85〇〇ppm以下)之方式 施行固液分料,即便省略鈍化形錢_子清洗步驟而 仍可進行取代反應。 (鈍化形成原因離子清洗步驟) 316907 24 200538394 其次,將經固液分離而得之沈澱物浸潰於不會溶解銦 *的液體(亦稱「浸潰液」)中,而使在後續的取代析出步驟 中,將至屬板上形成鈍化原因的離子(鈍化形成原因離子) 溶解於該液體巾’並藉由施行1次以上去除溶解液的處 ••理,便可將沈殺物表面上所附著的母液、或被吸入沈殿物 -之政承脰内β中的母液,取代為浸潰液而清洗去除純化形 成原因離子。藉由將鈍化形成原因離子清洗去除,便可效 率佳的施行後續的取代析出步驟,而可回收更高純度的含 φ有銦之金屬。 鈍化形成原因離子除了 In以外的金屬,尚可舉例 士 .Fe Co Cr Νι等金屬離子、及與該等金屬離子形成 鹽的瑣酸離子(NCV)、氟化物離子(F·)等陰料。#起始原 料使用含有細之硝酸溶液的情況時,主要係㈣酸離子 (NCV)形成鈍化形成原因離子,而#使用含有銦之㈣溶 液的情況時’主要係由氟離子(F·)及氫氟離子(hf_)等形成Above, especially the concentration of 22 is better than 1 L and more than UnoL / L. • Furthermore, the mixed oxalic acid can be recorded using oxalic acid ^ • Because both compounds contain oxalic acid and are suitable for both purposes: = In the case of the compound, it is left in the toiletry solution containing indium and Rongtian The amount of indium will be more than that of using oxalic acid:; Γ: lead: Γ The yield is reduced, and the best is oxalic acid. W causes the mixed amount of oxalic acid mixed with indium-containing solution (in other words, τ 'is preferably set to the equivalent of indium contained in the indium-containing solution (also = 1.2 to 5 times the spoon. If it is less than 2 times, indium, capacity) However, the recovery rate is reduced; on the other hand, even if it is _5 times plum = ^ = ::: = r. The mixing amount is 1 = 4 to 4 times that of 3 indium §. In addition, Equivalent is indium pingxiao lm〇L is oxalic acid 1: so / the so-called "up to 5 times the equivalent of marriage" means Ping: ·. Because ImoL 'early acid is 18 to 7 5m, the content recovered from increasing From the point of view of the domain degree of $, it is best to perform the pH management of the dihydrazone cold liquid before and after the oxalic acid mixing. The indium-containing solution before the oxalic acid mixing is preferably set to less than 3.5, especially preferably 2 or less. The reason is that in ρ3.5: Η on the day τ 'because the oxalic acid is not formed due to the formation of hydroxides in some steels, the recovery rate of indium will be reduced. In addition, the indium recovery rate can be improved by setting it below PH2 From this point of view, the lower the pH of the indium-containing solution, the better, 316907 200538394, so it is best to be below 1.0, especially 0.5 or less. Α When the pH of the indium-containing solution is over When it is out of the above range, it is best to perform pH adjustment on the solution. However, although it is desired to lower the pH, it is still better not to add excess acid. When the concentration of the added excess acid is converted into a monobasic acid, it is more than 3 mOL In the case of a large amount of acid / L (in the case of monoacids such as nitric acid, hydrochloric acid, hydrofluoric acid: more than 3mol / L, and the above acids in dibasic acids such as sulfuric acid), the recovery of indium will result Therefore, when pH adjustment is performed, the optimal acid addition amount is not more than the above number, and when it exceeds this value, it is best to add sodium hydroxide or potassium hydroxide to adjust the acid concentration to this On the other hand, for the pH of the indium-containing solution after mixing with oxalic acid, from the viewpoint of reducing impurities in Shen Dian, it is better to set it to below 20, especially to lower it to below 1.0 For the mixing method of the indium-containing solution and the precipitation agent (oxalic acid), in addition to the method of stirring the indium-containing liquid and adding a precipitating agent thereto, there is also a method of stirring the water valley solution or a slurry-like precipitating agent and adding indium. Solution method, or 2 in 1 Any method such as the method of simultaneously introducing an indium-containing solution and a precipitation agent into each tank (or container) can be used. Again, the liquid temperature when the indium-containing solution is mixed with oxalic acid is 0 to 90. (: == within the range is Yes. Because the liquid temperature at the time of mixing tends to lower the impurities and the impurities, but the influence is not large, so it is best to perform mixing at normal temperature without temperature adjustment from the aspect of energy cost. Δ I □ After adding oxalic acid to the solution, it is best to stir and mix at a moderate time, and it needs to stand properly. 316907 23 200538394 This% · search and mixing day can be set to 5 minutes to ^ hours, especially 10 Minutes to 12 hours are preferred. If it is less than 5 minutes, the amount of impurities mixed with oxalic acid may increase; on the contrary, if it is mixed for more than 24 hours, there is no difference in the effect of reducing impurities, but it only reduces the efficiency. (Sediment recovery step): ^ The above-mentioned method for performing solid-liquid separation of the indium oxalate Shen Dianwu can adopt a conventional solid-liquid separation method. For example, vacuum filtration such as suction filtration, pressurization filtration such as a dance machine, high speed _Solid-liquid separation methods such as centrifuges, separation methods such as centrifugation, separation, etc. In addition, depending on the degree of solid-liquid separation performed in this step, it is also possible to save each subsequent passivation formation cause ion cleaning step. Especially when using a nitric acid solution containing indium as the starting material, because nitrate ions are replacing the precipitation step! ^ Will form passivation formation cause ions and hinder the substitution of the precipitation reaction. Therefore, it is usually necessary to perform a passivation formation cause ion cleaning step, but by fully performing the solid-liquid separation of this step, for example, a solid-liquid separation method with good separation performance, Either lengthening the filtration time or increasing the filtration area will reduce the amount of mother liquor contained in the indium oxalate precipitate and reduce the amount of passivation formation cause ions. H This can omit the passivation formation cause ion cleaning step. Specifically, when the ion cleaning step for passivation formation reason is omitted, solid-liquid is applied in a manner that the concentration of the passivation formation cause ion in the dissolving solution prepared by dissolving the passivation towel is 10,000 Ppm or less (preferably 850,000 ppm or less). Dispensing can carry out the substitution reaction even if the passivation coin cleaning step is omitted. (Ion cleaning step for the cause of passivation formation) 316907 24 200538394 Second, the precipitate obtained by solid-liquid separation is immersed in a liquid that does not dissolve indium * (also known as "dipping solution"), so that it will be replaced in the subsequent In the precipitation step, the ions forming the passivation cause (passivation formation cause ions) on the metal plate are dissolved in the liquid towel, and the dissolving solution is removed more than once, and then the surface of the sinker can be removed. The attached mother liquor, or the mother liquor sucked into β in Shen Dianwu-Zhengcheng Cheng, is replaced with the dipping solution and washed to remove and purify the formation ions. By purging and removing the cause of passivation formation, the subsequent replacement precipitation step can be performed with high efficiency, and higher purity metals containing φ with indium can be recovered. Examples of metals other than In due to passivation formation include metal ions such as Fe.Fe Co Cr Nom, and anions such as tribasic acid ions (NCV) and fluoride ions (F ·) that form salts with these metal ions. #In the case of using a fine nitric acid solution as the starting material, the main reason is that the osmium acid ion (NCV) forms a passivation formation ion. In the case of using the indium-containing osmium solution, the main reason is that the fluoride ion (F ·) and Hydrogen ion (hf_) and other formation
鈍化形成原因離子。 雖不會溶解銦,但是會溶解鈍化形成原因離子的浸潰 液,可舉例如:水、草酸水溶液、ψ醇或乙醇之類的低級醇、、 或該等的混合物等,最妊兔☆ . ^ ^ ▲ 子取好為水。水係包括純水、超純水在 内’且早酸水溶液最好為、、貧n c 汉取对马/辰度05m〇L/L以下的草酸水溶 液0 鈍化形成原因離子清洗處理的方法係可例如將所回收 的沈殿物投人浸潰液中’並騎至少1次以上崎分離的 步驟。若分成2次以上實施時, 、 ^丨示了可降低浸潰液的使用 316907 25 200538394 .=之外,尚可在短時間内去除鈍化形成原因離子。此外, 最奸將沈澱物投入浸潰液中再施行適度攪拌。 .* #化形成原因離子清洗處理所使用的浸潰液量或處理 時間,並無特別的限制。 ,料時的浸潰液溫度並無特別的限制,就從效率 •,點而言,亦可由室溫程度更進行加溫。 卜鈍化形成原因離子的清洗目標係在下—步驟中當利用 酉=行溶解清洗處理完成物f時,酸溶解液中的_離子 =以在刪叶师以下為佳,尤以_剛以 — 此為目禚而調整處理時間或處理次翁 二若溶解液中的硝酸離子濃度在1〇_啊以下時,於 取代析出步射,將可抑制鈍化形成原 全 面上形成鈍化現象,可利用與金屬板之金屬離= 的取代反應而析出海綿銦。 辑千間 :此種觀點而έ ’若下一步驟的酸溶解液 濃度在5000ppm以下時 月牧離子 另外,如上、T更良好的促進海綿銦之析出。 驟中的固液分離,例如=才更加充分的施行沈殺物回收步 方法,或增加過浦時間2取分離性能良好的固液分離 θ ^ , 愿Τ間而減少草酸銦沈澱物中所含的母、$ 置並減少鈍化形成原 3的母液 化形成原因離子清洗步驟;;之[错此亦Μ略本步驟(純 (酸溶解步驟) 洗處理完成====原因離子清洗處理所獲得的清 /合角午於酸中而形成酸溶解液。 316907 26 200538394 q本A巾可使用的_類,可❹如:賴、趟酸等 然機酸,但是當起始原料使用含 ^ 、 時,鹽酸的使用頗為重要。 “。谷液的情況 此時的鹽酸濃度並無特別的限制,就 而言,最好使用m至12N之鹽酸。 硯”,、占 再者,酸溶解的溫度係除了添加酸時的溶解轨之外, 最好施行溫度調節而調整至坑以上,最好有 至30至6(TC範圍。 干J Πι 另外,當將清洗處理完成物質溶解於酸中時將有容解 殘渣的情況,經適度時間(例如1小時左右)授拌後,再配 合需要靜置適度時間,而岐分離並去除溶解㈣,便可 回收酸溶解液。 (取代析出步驟) 其次,將上述步驟所獲得的酸溶解液放入反應槽中, 亚浸潰金屬板(最好鋁板),而與該金屬板的金屬(例如鋁) 鲁進行取代反應,便可析出海綿銦。 取代反應時的酸溶解液之pH若低於〇·5或高於15 ’因為銦與金屬(例如鋁)間的取代反應性降低,因此酸 >谷解液的pH値隶好利用添加如驗化合物或水等,而調整 為〇 · 5至1 · 5 (特別係〇 · 5至1 · 〇之範圍内)。此時,所添加 的驗化合物可舉例如:氫氧化鈉、氫氧化鉀、氫氧化約、氨、 或該等的水溶液等。此外,當添加水而調整pH時,最好 酸溶解液中的銦濃度不要過度降低。 銦與金屬(例如紹)間的取代反應,將隨溶液溫度低於 27 316907 200538394 .201而有急遽下降的傾向,其結果使海綿姻的析出量降 *低。反之,如溫度過高日寺,將有使作業性、熱能損失等方 •㈣成問題的可能性。所以,當實施此取代反應時的溫度, ,好調整至2代以上,尤以調整至2代1 6代之範圍又為 ; 佳0 .'銦的取代析出係除了浸潰鋁板等金屬板的方法之外, 尚可採取投入鋅粉末(粒狀)等金屬粉的方法。但是,當投 入辞粉末(粒狀)等金屬粉的情況時,將有海綿鋼 =題:為解決此問題而下工夫努力,因而在本實施形= 中取好抓取如上述之使用金屬板的方法。 (金屬化步驟) 金屬其次’將依上述所獲得的海緯銦金屬化而形成塊狀姻 溶轉具體方法並無特別的限制,但是最好採取驗 ^ ^至>、加熱至麵熔點⑴6。〇以上的驗溶液令施行 二防IS二海綿銦雖較易氧化’但是藉由施行鹼熔鑄 A ^況,而且亦可將料銦表面所存在的氧化 被胰及海綿銦中的不純物予以分離、去除。 ^驗,鑄中所使用的驗化合物並無特別的限制,但 疋在業上最好使用氫氧化納。依此驗炫轉所獲得的 .♦因之金屬將成為銦品質較高的金屬。 已,2 ’上述所說明的實施形㈣為本發明之—例而 =不㈣本發㈣效果賴τ,村在上 插入其他步驟’亦可將各步驟的順序互換。 中 316907 28 200538394 實施例 - 以下,針對本發明之實施例,在與比較例相比較下進 • 行說明。 (實施例1至1 8及比較例1至5) ; 準備下述2種含銦溶液,並施行該等銦之回收。該等 ^ 含銦溶液係以硝酸將含銦廢料溶解而得者。 [表1]Causes passivation to form ions. Although it does not dissolve indium, it can dissolve the immersion solution of passivation-forming ions, such as water, aqueous oxalic acid solution, lower alcohols such as ψ alcohol or ethanol, or a mixture of these. Most pregnant rabbits ☆. ^ ^ ▲ Take it for water. The water system includes pure water and ultrapure water, and the early acid solution is preferably, and the nc is poor, and the aqueous solution of oxalic acid is less than 05m0L / L. The cause of passivation is ion cleaning. For example, the recovered Shen Dianwu is thrown into the immersion solution, and the step of saki separation is performed at least once. When divided into two or more implementations, ^ and ^ show that the use of the dipping solution can be reduced. In addition to 316907 25 200538394. =, The cause of passivation can be removed in a short time. In addition, the most difficult thing is to put the precipitate into the dipping solution and then perform moderate stirring. . * #Formation cause There is no particular limitation on the amount of immersion solution or processing time used in the ion cleaning treatment. There is no particular limitation on the temperature of the immersion solution at the time of feeding. In terms of efficiency, the temperature can also be increased from room temperature. The cleaning target of the passivation formation ions is as follows. When 酉 = is used to dissolve and clean the finished product f, the _ ion in the acid solution is preferably below the deleter, especially _ Adjust the treatment time for the purpose or treatment. If the concentration of nitrate ions in the solution is less than 10_ah, instead of the precipitation step, the passivation phenomenon on the passivation formation can be suppressed. Sponge indium is precipitated by the metal ionization reaction of the plate. Jisenma: From this point of view, ‘If the concentration of the acid solution in the next step is less than 5000ppm, the ions of the animal husbandry will be better. As mentioned above, T will better promote the precipitation of sponge indium. The solid-liquid separation in the step, for example, is only to fully implement the sinking and killing material recovery step method, or to increase the flow time 2 to take a solid-liquid separation with good separation performance θ ^, I hope to reduce the content of indium oxalate precipitation And reduce the passivation and formation of the original 3 mother liquefaction formation cause ion cleaning step; the [error this is also omitted this step (pure (acid dissolution step) washing process is completed ==== caused by ion cleaning treatment) 316907 26 200538394 q The kind of towels that can be used in this A towel can be, for example, organic acids such as Lai, Tang acid, etc., but when the starting material contains ^, At the time, the use of hydrochloric acid is quite important. ". In the case of cereal fluids, the concentration of hydrochloric acid is not particularly limited at this time. As far as it is concerned, it is best to use m to 12N hydrochloric acid. 砚", again, the acid is dissolved In addition to the dissolving rail when acid is added, the temperature is preferably adjusted above the pit by temperature adjustment, and it is preferably 30 to 6 (TC range. Dry J Πι In addition, when the cleaning finished material is dissolved in the acid Residues will be tolerated after a moderate amount of time (eg 1 hour After the mixing, the mixture needs to stand for a moderate amount of time, and the dissolution and removal of the dissolve can be used to recover the acid solution. (Instead of the precipitation step) Next, the acid solution obtained in the above step is placed in the reaction tank. In the process, a metal plate (preferably an aluminum plate) is sub-impregnated, and a sponge indium is precipitated by performing a substitution reaction with a metal (such as aluminum) of the metal plate. If the pH of the acid solution during the substitution reaction is lower than 0.5 Or higher than 15 'because the substitution reactivity between indium and metals (such as aluminum) is reduced, so the pH of the acid > hydrolysate is adjusted to 0.5 · 1 · 1 by adding a test compound or water, etc. 5 (particularly in the range of 0.5 to 1 · 〇). At this time, the test compounds to be added may include, for example, sodium hydroxide, potassium hydroxide, hydroxide, ammonia, or an aqueous solution thereof. When adding water to adjust the pH, it is best not to reduce the indium concentration in the acid solution. The substitution reaction between indium and metals (such as Shao) will decrease sharply as the solution temperature falls below 27 316907 200538394.201 Tendency, the result of which makes sponge marriage The amount of precipitation is reduced *. Conversely, if the temperature is too high, it may cause problems in workability and thermal energy loss. Therefore, the temperature during the replacement reaction can be adjusted to 2 generations. Above, it is especially adjusted to the range of 2nd generation to 16th generation. Good. In addition to the method of impregnating the metal plate such as aluminum plate, the metal powder such as zinc powder (granular) can also be used. However, when metal powder such as powder (granular) is used, there will be sponge steel = title: to work hard to solve this problem, so in this embodiment = take good use as described above Method of metal plate. (Metalization step) The second method is to metallize the inferior seawater indium obtained in the above to form a block-shaped insoluble melt, but the specific method is not particularly limited, but it is best to take inspection ^ to >, Heat to surface melting point ⑴6. 〇The above test solution makes the implementation of the second anti-IS two sponge indium easier to oxidize, but by the implementation of alkali melting casting A, and can also be separated from the oxidation of the indium present on the surface of the indium by the pancreas and impurities in the sponge indium, Remove. ^ The test compound used in the casting is not particularly limited, but it is best to use sodium hydroxide in the industry. According to this test, the metal obtained will become a metal with higher indium quality. Now, the implementation form described in 2 'above is an example of the present invention, but the effect of the present invention depends on τ, and other steps are inserted in the above sequence. The order of the steps can also be reversed. Medium 316907 28 200538394 Examples-In the following, examples of the present invention will be described in comparison with comparative examples. (Examples 1 to 18 and Comparative Examples 1 to 5); The following two kinds of indium-containing solutions were prepared, and the indium was recovered. These indium-containing solutions are obtained by dissolving indium-containing waste with nitric acid. [Table 1]
In A1 — Mg Si Ca Sn Zn — pH 2.6 A 溫度(gA) 25.8 11.9 0.26 <0.01 <0.01 <0.01 < 0 04 0.18 〇 7〇 對In比率(重量%) 100 Γ46.1 1.0 卜<0.04 < 〇y〇r B 溫度(g/1) 28.5 15.7 0.43 0.11 0.13 \ V/ · 0.29 \J · / \J 0.35 ------- 0.1 對In比率(重量〇/〇) 100 55.1 1.5 0.39 0.46 1.0 1.2 ------- 根據上述2種含銦溶液(A,B),改變各種條件施行銦回 收。針對此步驟的基本流程採用第1圖進行說明。 準備A、B任一含銦溶液1〇L(步驟(1)),參照此溶液 的pH並適當的添加而調整pH(步驟(2))。然後,依情況在 60 C中幵溫(步驟(3)),將含銦溶液與沈澱劑混合(步驟 (4))。混合步驟基本上係攪拌含銦溶液,並添加沈澱劑(實 施例為草酸’而比較例則為氨水),部分的實施例則採取授 拌沈澱劑並在其中添加含銦溶液的形式。 在4加沈殿劑而完全產生沈殿的情況下,將溶液施行 真空過濾、(步驟(5)),將沉澱物利用純水施行清洗(步驟 (6))°此清洗步驟係利用100mL的水施行4次通液而進行。 月先元带後’所獲得的草酸銦(比較例為氫氧化銦)藉由在 316907 29 200538394 電爐中於1000°C下加熱5小時而施行烘焙(步驟(7)),便形 成氧化銦。 再者’其中一部分的實施例在pH調整前便添加 4m〇L/L的NaOH形成pH達L8,之後並過濾溶液,而施 行去除含銦溶液中之錫的處理(步驟(8))。 依照上述步驟,在實施例中所實施的複數銦回收條件 係如下所述。 ” [表2]In A1 — Mg Si Ca Sn Zn — pH 2.6 A Temperature (gA) 25.8 11.9 0.26 < 0.01 < 0.01 < 0.01 < 0 04 0.18 〇7〇 To In ratio (% by weight) 100 Γ46.1 1.0 bu < 0.04 < 〇y〇r B temperature (g / 1) 28.5 15.7 0.43 0.11 0.13 \ V / · 0.29 \ J · / \ J 0.35 ------- 0.1 to In ratio (weight 0 / 〇) 100 55.1 1.5 0.39 0.46 1.0 1.2 ------- According to the above two kinds of indium-containing solutions (A, B), change the various conditions to perform indium recovery. The basic flow of this step will be described using Figure 1. Prepare 10 L of either of the indium-containing solutions A and B (step (1)), adjust the pH by referring to the pH of this solution and adding appropriately (step (2)). Then, according to circumstances, the temperature is maintained at 60 C (step (3)), and the indium-containing solution is mixed with the precipitation agent (step (4)). The mixing step basically involves stirring the indium-containing solution and adding a precipitating agent (the example is oxalic acid 'and the comparative example is ammonia water), and some examples take the form of stirring the precipitating agent and adding the indium-containing solution thereto. In the case of adding Shen Dian agent to 4 to produce Shen Dian, the solution is subjected to vacuum filtration, (step (5)), and the precipitate is washed with pure water (step (6)). This washing step is performed with 100 mL of water The solution was passed four times. The indium oxalate (comparative example: indium hydroxide) obtained after the first month of the month was baked in a 316907 29 200538394 electric furnace at 1000 ° C for 5 hours (step (7)) to form indium oxide. Furthermore, in some of the examples, 4mOL / L of NaOH was added to adjust the pH to L8 before pH adjustment, and then the solution was filtered to remove tin in the indium-containing solution (step (8)). Following the steps described above, the conditions for recovery of multiple indium implemented in the examples are as follows. " [Table 2]
• >儿屬又劑使用量係相對於含銦溶液中 * 之銦理論量的倍數 2:過剩酸濃度...實施例6:2·5_1Α、實施例7:3·5 ^16907 30 200538394 *3:沉澱劑中混合含銦溶液 *4··將含溶液升溫至60V後,再添加6〇V的沉澱劑 *5··施行脫錫處理,在脫錫處理後,於未施行pH調整的情 況下添加沉澱劑 *6··實施脫錫處理,於脫錫處理後添加硝酸而形成ρΗ〇 ι, 並添加沉澱劑• > The amount of pediatric agent used is a multiple of the theoretical amount of indium * in the indium-containing solution 2: Excess acid concentration ... Example 6: 2 · 5_1Α, Example 7: 3.5 · ^ 16907 30 200538394 * 3: Indium-containing solution is mixed in the precipitant. * 4. After heating the solution to 60V, add 60V of precipitant. * 5. Perform de-tinning treatment. After de-tinning treatment, do not perform pH adjustment. In the case of adding a precipitant * 6 ·· de-tinning treatment is performed, and after the de-tinning treatment, nitric acid is added to form ρΗ〇ι, and a precipitating agent is added.
*7:PH管理…決定混合後的pH,並添加氨水使達㈣pH 值 >然後,依表2的實施例丨至18及比較例丨至5的條件, 將所回收之氧化銦的成分分析値、回收率,示於表3。* 7: PH management ... Determine the pH after mixing, and add ammonia water to reach the pH value. Then, according to the conditions of Examples 丨 to 18 and Comparative Examples 丨 to 5 in Table 2, analyze the components of the recovered indium oxide.値, recovery rate is shown in Table 3.
316907 31 200538394 [表3] __銦分析値(重量%) In回收率 (%) In A1 Si Ca Sn Ζπ 實施例1 82.6 <0.1 <0.1 <0.1 <0.1 <0.1 <0.1 95.3 實施例2 82.8 <0.1 <0.1 <0.1 <0.1 <0.1 <0.1 94.8 貫施例3 82.5 0.2 <0.1 <0.1 <0.1 <0.1 <0.1 95.6 ~ 實施例4 82.3 0.5 <0.1 <0.1 <0.1 <0.1 <0.1 95.9 實施例5 Γδΐ.3 1.5 r<oT <0.1 <0.1 <0.1 <0.1 96.7 實施例6 82.7 <0.1 <0.1 <0.1 <0.1 <0.1 <0.1 93.8 實施例7 82.8 <0.1 <0.1 <0.1 <0.1 <0.1 <0.1 85.5 ~ 貫施例8 82.7 <0.1 <0.1 <0.1 <0.1 <0.1 <0.1 78.3 貫施例9 82.8 <0.1 <0.1 <0.1 <0.1 <0.1 <0.1 90.3 實施例10 82.6 <0.1 <0.1 <0.1 <0.1 <0.1 <0.1 93.3 貝施例11 82.6 <0.1 <0.1 <0.1 <0.1 <0.1 <0.1 98.2 實施例12 82.8 <0.1 <0.1」 <0.1 <0.1 <0.1 <0.1 98.4 戶、施例13 飞 1·Ί <0.1 <〇.Γ <0.1 <0.1 <0.1 <0.1 95.4 貫靶例14 82.6 <0.1 <0.1 <0.1 <0.1 <0.1 <0.1 95.3 實施例15 82.6 0.1 <0.1 ———-- <0.1 <0.1 <0.1 <0.1 95.2 貝施例16 /Α» juU /-r 1 1 82.0 <ο·Γ <0.1 一<0·1 <0.1 0.8 <0.1 95.1 實施例1 / 音姑;柘il 1 8 82.6 0.3 〆η Γ" <〇Τ —-—— <0.1 <0.1 <0.3 <0.1 94.2 ^ OvL Ir'J 1 Ο ο2.7 〈0· 1 <0.1 <0.1 <0.1 <0.1 <0.1 94.5 比車父例1 l|^ 47.4 22.1 〇.48~ ——— <0.1 <0.1 <0.1 0.15 96.3 pG -fx ir'J L 49.3 20.9 〇·47 <0.1 <0.1 <0.1 0.12 92.5 比車父例3 48.4 21.4 0.48^ <0.1 <0.1 <0.1 0.11 95.8 比李父例4 »1 I £Τ 47.5 22.1 0.48 <0.1 <0.1 <0.1 0.12 98.2 比車父例5 * ΓΡΠ ,1/r 48.7 -li^J ^〇Α6^ <0.1 <0.1 <0.1 0.10 96.0 、-,•〜…千u 茨四里-龙囚、夯年 %)}/{處理溶液(A,B)的銦濃度(g/1)}x處理溶液量⑴} *氧化麵中的銦含有率之理論値為82.7重量0/〇。 由上述結果得知,首先將實施例,與以氨為沈澱 比較例進^亍μμ 丁比,結果得知比較例所回收的氧化銦均屬 不純物含有| 、 巧里幸父多,特別係鋁隨同沉澱的情況較為明顯。 316907 32 200538394 相對於此,實施例則雖含有些微的鋁,但是可回收幾乎沒 有不純物的高純度氧化銦。此現象可認為所回收的氧化銦 中之銦含有率均極接近理論値的緣故。 再者,探討在各實施例中因回收條件的不同而相異, 首先,就從不純物混入的觀點而言,在實施例3至實施例 ,5中,僅發現些微的鋁混入現象。由此現象得知,隨沈澱 劑混合時的含銦溶液之pH增加,鋁含有率亦將上昇,因 而在本發明中最好儘可能的降低銦含有液的pH,尤以〇 5 •以下為佳。此外,有關銦回收率,僅只有實施合"低於 80%。可認為其原因在於沈澱劑的混合量,在實施例8中 相對於含銦溶液中的銦量,僅添加理論値的丨倍量的沈澱 W 所以’彳于知為能彳隻得80%以上的回收率,如實施例9 至12般的混合L2倍量以上的沈澱劑可謂最佳方法。但 是,如將實施例11(添加5倍量)與實施例12(添加6倍量) 進仃比較時,因為銦回收率幾乎沒有改變,而得知作為沈 鲁厥劑的添加量最好設定在5倍量以内。 本實施例所使用的含銦溶液中,溶液B係含較高濃度 的锡。針對此溶液B施行回收的例子為實施例16、1 7。由 一者結果得知,施行錫去除(步驟(9))的實施例17中,確認 到回收氧化銦中的錫已完全被去除。所以,當從所回收的 氧化銦中回收高純度銦之單一金屬的情況時,得知最好施 行錫的去除步驟。但是,是否施行脫錫步驟,係由回收氧 化銦之後,配合依何種目的而利用銦以決定,即便未施行 脫錫步驟的情況時,由於可將銦與錫二者回收,因而當, 316907 33 200538394 造ιτ〇n兄時便較為彳面,纟&亦得知脫錫處理的有無 乃屬於使用區分的問題,而並非優劣的問題。 (實施例19至27) 在此準備下述含銦溶液(C),在根據該等以施行銦之回 收此含銦/合液係當以氫氟酸清洗液晶基板時的廢液。 [表4]316907 31 200538394 [Table 3] __Indium analysis rhenium (% by weight) In recovery (%) In A1 Si Ca Sn Zπ Example 1 82.6 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 95.3 Example 2 82.8 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 94.8 Example 3 82.5 0.2 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 95.6 ~ Example 4 82.3 0.5 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 95.9 Example 5 Γδΐ. 3 1.5 r < oT < 0.1 < 0.1 < 0.1 < 0.1 96.7 Example 6 82.7 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 93.8 Example 7 82.8 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 85.5 ~ Example 8 82.7 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 78.3 Example 9 82.8 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 90.3 Example 10 82.6 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 93.3 Example 11 82.6 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 98.2 Example 12 82.8 < 0.1 < 0.1 '' < 0.1 < 0.1 < 0.1 < 0.1 98.4 households, Example 13 11Ί; < 0.1 < 〇.Γ < 0.1 < 0.1 < 0.1 < 0.1 95.4 Through Target Example 14 82.6 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 95.3 Example 15 82.6 0.1 < 0.1 -------- < 0.1 < 0.1 < 0.1 < 0.1 95.2 Example 16 / Α »juU / -r 1 1 82.0 < ο · Γ < 0.1-< 0 · 1 < 0.1 0.8 < 0.1 95.1 Example 1 / Yingu; 柘il 1 8 82.6 0.3 〆η Γ " < 〇Τ ---—— < 0.1 < 0.1 < 0.3 < 0.1 94.2 ^ OvL Ir'J 1 Ο ο2.7 <0 · 1 < 0.1 < 0.1 < 0.1 < 0.1 < 0.1 94.5 Than the car parent example 1 l ^^ 47.4 22.1 〇.48 ~ ------ < 0.1 < 0.1 < 0.1 0.15 96.3 pG -fx ir'J L 49.3 20.9 〇47 < 0.1 < 0.1 < 0.1 0.12 92.5 than the car parent example 3 48.4 21.4 0.48 ^ < 0.1 < 0.1 < 0.1 0.11 95.8 than the Lee parent example 4 »1 I £ Τ 47.5 22.1 0.48 < 0.1 < 0.1 < 0.1 0.12 98.2 Case example 5 * ΓΡΠ, 1 / r 48.7 -li ^ J ^ 〇Α6 ^ < 0.1 < 0.1 < 0.1 0.10 96.0 、-, ... ~ 千 u 茨 四 里-龙爪, Tamping year%)} / {indium concentration (g / 1)} of the treatment solution (A, B) x the amount of the treatment solution ⑴} * Theoretical content of the indium content on the oxidized surface is 82.7 weight 0 / 〇. From the above results, it is known that the example is first compared with the comparative example using ammonia as the precipitation. The result shows that the indium oxide recovered in the comparative example is an impurity. It contains many impurities, especially aluminum. The situation with the precipitation is more obvious. 316907 32 200538394 In contrast, although the example contains a little aluminum, high-purity indium oxide with almost no impurities can be recovered. This phenomenon is considered to be due to the fact that the indium content in the recovered indium oxide is very close to the theoretical value. Furthermore, the differences in the recovery conditions will be discussed in each of the examples. First, from the viewpoint of mixing in impurities, in Examples 3 to 5, only a small amount of aluminum mixing was found. From this phenomenon, it is known that as the pH of the indium-containing solution increases when the precipitant is mixed, the aluminum content will also increase. Therefore, in the present invention, it is best to reduce the pH of the indium-containing solution as much as possible, especially 0. good. In addition, only the implementation of the indium recovery rate is below 80%. The reason is believed to be the mixing amount of the precipitating agent. In Example 8, compared to the indium content in the indium-containing solution, only a theoretical amount of precipitation W was added. Therefore, it is known that only 80% or more can be obtained. The recovery rate is the best method of mixing the precipitant in an amount more than L2 times as in Examples 9 to 12. However, when comparing Example 11 (adding 5 times the amount) with Example 12 (adding 6 times the amount), because the recovery rate of indium hardly changes, it is learned that the amount of Shen Lujue is best set to 5 Within the amount. Of the indium-containing solutions used in this example, Solution B contains a higher concentration of tin. Examples of recycling this solution B are Examples 16 and 17. As a result, it was found that in Example 17 in which tin removal (step (9)) was performed, it was confirmed that the tin in the recovered indium oxide was completely removed. Therefore, when a single metal of high purity indium is recovered from the recovered indium oxide, it is known that the step of removing tin is preferably performed. However, whether to implement the de-tinning step is determined by the purpose of using indium after the indium oxide is recovered. Even if the de-tinning step is not performed, both indium and tin can be recovered. Therefore, 316907 33 200538394 When I was making ιτοn brothers, I was more embarrassed. I also learned that the presence or absence of de-tinning treatment is a matter of use, not a matter of good or bad. (Examples 19 to 27) Herein, the following indium-containing solution (C) was prepared, and the indium-containing / synthetic liquid was used as the waste liquid when the liquid crystal substrate was washed with hydrofluoric acid in accordance with the indium recovery. [Table 4]
In A1In A1
Mg c 溫度(g/l)Win 58.0 <0.01Mg c Temperature (g / l) Win 58.0 < 0.01
比率 (重量%) <0.01Ratio (% by weight) < 0.01
SiΈΪΤSiΈΪΤ
Ca <0.01Ca < 0.01
SnSn
ZnZn
CuCu
pH 19.7 100 <0.02 <0.02 0.36 <0.02 34.0 <0.01 <0.02 2.1 3.6 0.1 根據此含銦溶液(〇,變更條件施行銦回收。 針對本實施例的步驟基本流程,採用第2圖進行說 明。準備含銦溶液60L[銦含有量3480g(30.3moL),銅含有 篁126g(1.98moL):步驟(丨乃,再將含銦溶液與沈澱劑(草酸) 混合(步驟(2))。此草酸溶液的混合係將〇 5m〇L/L的草酸水 浴液’將草酸置相對於含銦溶液中的銦理論量為2 · 5倍的 液里,以10分鐘進行添加。此時便攪拌含銦溶液並添加草 酸水溶液。 當添加沈殺劑而完全產生沈澱時,便對溶液施行真空 過濾(步驟(3)),再對沉澱物利用純水施行清洗(步驟(句)。 此清洗步驟係利用HOOmL的水施行4次通液而實施。經 清洗完成後’便針對所獲得的草酸銦(比較例為氫氧化銦) 施行分析,結果含有銦3228g(28 lm〇L)、銅1〇8g(1 7〇m〇L)。 其次’將所回收的草酸銦分成12等份,將其中的9 316907 34 200538394 個草酸銦,變更條件並施行接觸處理(以下依各條件設為實 施例1 9至27:步驟(5))。接觸處理内容如表5所示。此夕卜, 在本實施例中,為求比較,亦針對沈澱物未施行氨接觸處 理的狀況進行探討(参考例)。 -[表 5] 接觸處理的内容 接觸處理溶液 NaOH水溶液 氨水溶液 合計mol數 液濃度 Mol數 液·温度 Mol數 實施例19 僅接觸氨 - - lmol/1 0.5mol 0.5mol 實施例20 僅接觸氨 - - lmol/1 0.66mol 0.66mol 實飽例21 僅接觸氨 - - 3mol/l 7mol 7mol 實施例22 僅接觸氨 - - 3mol/l 8.25mol 8.25mol 實施例23 僅接觸氨 - - 3 mo 1/1 lOmol lOmol 實施例24 僅接觸氨 - - 3mol/l 16.5mol 16.5mol 實施例25 僅接觸氨 - - 3mol/l 20mol 20mol 實施例26 接觸NaOH+氨 3mol/l 9.34mol 3moi/l 0.66mol lOmol 實施例27 接觸NaOH+氨 3mol/l 9.5mol 3mol/l 0.5mol lOmol 参考例 未施行接觸處理 - - - - -pH 19.7 100 < 0.02 < 0.02 0.36 < 0.02 34.0 < 0.01 < 0.02 2.1 3.6 0.1 According to this indium-containing solution (0, change the conditions to perform indium recovery. For the basic flow of the steps in this embodiment, use Figure 2 Explain. Prepare 60L of indium-containing solution [indium content 3480g (30.3moL), copper containing rhenium 126g (1.98moL): Step (1), then mix the indium-containing solution with the precipitation agent (oxalic acid) (step (2)) The mixing system of this oxalic acid solution is to add 0,5m0L / L of oxalic acid aqueous bath solution to oxalic acid in a solution which is 2.5 times the theoretical amount of indium in the indium-containing solution, and add it in 10 minutes. Stir the indium-containing solution and add an oxalic acid aqueous solution. When the precipitation is added completely and the precipitate is completely generated, the solution is subjected to vacuum filtration (step (3)), and the precipitate is washed with pure water (step (sentence). This washing The steps were performed using HOOmL of water for 4 passes. After the cleaning was completed, the obtained indium oxalate (comparative example: indium hydroxide) was analyzed, and the result contained 3228g (28 lm0L) of indium and copper 1 〇8g (170m〇L). Secondly, the recovered grass Indium is divided into 12 equal parts. Among them, 9 316907 34 200538394 indium oxalates are changed in conditions and subjected to contact treatment (the following conditions are set to Examples 1 to 9: 27: step (5)). The contact treatment contents are shown in Table 5. For the sake of comparison, in this example, for the sake of comparison, the situation in which the Shendian is not subjected to ammonia contact treatment is also discussed (reference example).-[Table 5] Contact treatment content Contact treatment solution NaOH aqueous solution ammonia aqueous solution Total mol number of liquid concentration Mol number of liquids · temperature Mol number Example 19 Exposure to ammonia only--lmol / 1 0.5mol 0.5mol Example 20 Exposure to ammonia only--lmol / 1 0.66mol 0.66mol Saturation example 21 Exposure to ammonia only- -3 mol / l 7 mol 7 mol Example 22 exposure to ammonia only--3 mol / l 8.25 mol 8.25 mol example 23 exposure to ammonia only-3 mo 1/1 lOmol lOmol example 24 exposure to ammonia only-3 mol / l 16.5 mol 16.5 mol Example 25 Contact with ammonia only-3 mol / l 20 mol 20 mol Example 26 Contact with NaOH + ammonia 3 mol / l 9.34 mol 3 moi / l 0.66 mol 10 mol Example 27 Contact with NaOH + ammonia 3 mol / l 9.5 mol 3 mol / l 0.5 mol 10 mol Reference Example No contact treatment------
註:從處理對象的含銦溶液(之12分之1)中所含銦量、及所 析出草酸銦(之12分之1)中所含銦量,所求得的氨量下限 値,以及接觸處理溶液量(氨+氫氧化鹼)的上限値、下限 値,係如下述。 氨使用量之下限値 接觸處理溶液使用量 下限値 上限値 含銦溶液基準 0.66mol 8.25mol 16.5mol 草酸钢基準 0.57mol 7.59mol 1 8.97mol 針對接觸處理後的沈澱物,將溶液施行真空過濾(步驟 (6)),對所回收的沈殿物利用純水施行清洗(步驟(7))。此 清洗步驟係利用將lOOmL的水施行1次通液而實施。然 35 316907 200538394 准一將β洗伎的沈澱物(氫氧化銦),在電爐中於10001下 K丁加熱5小時而施行烘培(步驟⑻),便形成氧化銦。 ,對所製得氧化銦確認銦的回收效果。在該確認時的 :估仏將氧化銦的組成分析,及從實驗結果所獲得氧化銦 一勺钔重里,所求出銦之回收率進行比較而實施。其結果 示於表ό。 、 η [表6]Note: From the amount of indium contained in the indium-containing solution (1/12) of the treatment object and the amount of indium contained in the precipitated indium oxalate (1/12), the lower limit of the amount of ammonia obtained, and The upper limit 値 and lower limit 値 of the amount of the contact treatment solution (ammonia + alkali hydroxide) are as follows. Lower limit of ammonia usage 下 Lower limit of contact treatment solution usage 値 Upper limit 基准 Indium-containing solution basis 0.66mol 8.25mol 16.5mol oxalate steel basis 0.57mol 7.59mol 1 8.97mol For the precipitate after contact treatment, vacuum filter the solution (step (6)), washing the recovered Shen Dianwu with pure water (step (7)). This washing step is performed by passing 100 mL of water once. Ran 35 316907 200538394 Precipitation of the β-washing precipitate (indium hydroxide) was performed in an electric furnace at 10001 for 5 hours and then baked (step ⑻) to form indium oxide. To confirm the recovery effect of indium on the indium oxide produced. At the time of confirmation: The estimation was performed by comparing the composition analysis of indium oxide and the scoop of indium oxide obtained from the experimental results with the obtained indium recovery ratios. The results are shown in Table ό. , Η [Table 6]
關於表6結果,首先針對有無氨的接觸處理,經對各 只轭例與参考例進行比較,得知所回收氧化銦中的銅濃度 將隨氨接觸處理的實施而去除大半部分,而確認到此之去 除效果。 另一方面,對有關接觸處理的條件進行探討,針對氨 (氣與IL氧化驗)的接觸量範圍’就設定於最佳範圍(參照表 5的下表)内之處理結果(表5中雙線所包圍的實施例22至 24、貫施例26,27)) ’與其餘實施例的結杲進行對比,結果 36 316907 200538394 付知在接觸量較少的彳杳 錮…一 “Μ 19至21)下,氧化銦中的 ^又二阿°此現冢可認為氨(或氨及氫氧化驗)的接觸量 ==銦並未完全轉為氯氧化銦,而無法去除部分混 H姻中的鋼。此夕卜,當接觸量較多的情況(實施例 日守,所^收的氧化銦純度雖可滿足,但A回收率較差。 此現象:,忍為因添加過剩的驗而發生氧化钢的溶解現象。 上L侍知,氨(或氨及氫氧化鹼)的接觸處理對氧化銦中 勺銅去除乃屬有效方式,且藉由將接觸量設定於適當值, _便可施行更有效的銦回收。 第3圖所不係針對剛析出後的沈澱物(草酸銦)及經氨 接觸處理便的沈殿物(氫氧化銦),所施行的X線繞射分析 結果。 口由第〇圖(Μ得知,剛析出後的沈澱物(草酸銦),屬於 二見大銳波峰的強結晶性狀態之草酸銦。所以,藉由使此 ^心鋼結晶接觸氨’便將使沈澱物形成較寬形狀的繞射圖 瞻木(第3圖(b):呈示實施例23者)。此變化可判斷由草酸銦 :構成的沈殿物’藉由與氨的接觸,其結晶經破壞而經結 晶性較弱的氫氧化銦所取代。然後,在經此種草酸銦結晶 的破壞、取代為氫氧化銦的過程中,被夾帶入沈澱物中的 銅將被去除。 再者’第3圖(c)所示係此氫氧化銦烘焙後的氧化銦繞 射圖案。 (貫施例28至30) 本實施例中,將氧化銦與氧化錫的混合物施行燒結, 37 316907 200538394 並以所獲得ITO燒結體為靶材且照射電漿等,當使ITO濺 -鍍時飛散於周圍並附著於防護板上的ΙΤΟ含有物,將ITO - 含有物利用硝酸進行溶解,並將所獲得含有銦的硝酸溶液 (pHO. 12)使用作為原料。針對此含有銦之硝酸溶液利用離 • 子層析儀進行分析,結果含有:In(30g/L)、Sn(0.06g/L)、 • Al(10g/L)、Mg(0.23g/L)、Zn(0.03g/L)、Fe(0.04g/L)、Cr(少 於 lOppm)。 準備上述含有銦之硝酸溶液(液溫27°C)500mL,在此 籲溶液中添加草酸水溶液(液溫26°C、草酸濃度80g/L) 500mL,經攪拌30分鐘後,靜置1小時30分鐘。接著, 使用表7所示各種大小的濾紙(東洋濾紙(股)公司製4A), 利用吸濾器施行抽吸過濾,獲得沈澱物(草酸銦)與濾液 (NCV濃度、pH、In濃度,如表7所示)。另外,在過濾中 途當濾餅發生裂開時,便先將表面抹平然後再繼續施行過 濾,任一情況均是將含有銦之硝酸溶液投入於漏斗中,在 經過15分鐘的時候便結束過濾。 將所獲得沈澱物投入450mL的水中,並添加12N鹽 酸50mL調整為PH0.5,經酸溶解便獲得500mL的酸溶解 液(Ν〇3·濃度、pH、In濃度,如表7所示)。 其次,在將溫度控制成酸溶解液未超過60°C的狀態下 進行攪拌1小時,利用吸濾器施行過濾而去除殘渣(未溶解 的固體),回收酸溶解液,在此酸溶解液(ρΗ0·7)中,浸潰 寬100mm、長300mm、厚6mm的链板,在將溫度控制成 液溫50°C狀態下施行攪拌,而持續進行取代反應1小時。 38 316907 200538394 然後,將經取代反應所析出的海綿銦回收,經去除水分等 之伎,再使用氫氧化鈉施行鹼熔鑄(3〇〇。〇,然後從模具中 取出含有銦之金屬。 海绵銦之獲取量、含有銦之金屬的獲取量、含有銦之 金屬的In品質、及從酸溶解液中可回收含有銦之金屬的h •回收率(In回收率(%卜[含有銦之金屬中的In量/酸溶解液 中的In量]χ100,以下稱「In回收率」},係如表7所示。 另外,含有銦之金屬的In品質係利用lcp發光分光法 _施灯分析’而硝酸離子濃度係利用離子層析法進行測定(後 述亦同)。 (實施例31至32) 準備如同實施例28的含有銦之硝酸溶液5〇〇mL,在 此溶液中添加草酸水溶液(液溫26艽、草酸濃度⑼以匕) 500mL,經攪拌3〇分鐘後,靜置}小時%分鐘。接著, 使用表7所示各種大小的濾紙(東洋濾紙(股)公司製4a), 鲁利用吸濾器施行抽吸過濾,獲得沈澱物(草酸銦)與濾液 (NO,濃度、pH、In濃度,如表7所示)。另外,在過滹中 途當濾、餅發生裂開時,便先將表面抹平然後再繼續施行過 濾,任一情況均是將含有銦之硝酸溶液投入於漏斗中,在 經過1 5分鐘的時候便結束過濾。 將所獲得沈澱物投入20〇mL的水(2(rc)中,經攪拌1〇 分鐘後,停止授拌經靜置〇.5小時,再利用高速離心去除 水相的清洗處理’在實施例中施行i次,在實施例Μ 中重複施打2次,便獲得清洗處理完成物質與清洗完成溶 316907 39 200538394 液(N〇3-濃度、PH、In濃度,如表7所示)。 將該清洗處理完成物質投入450mL之水中,並添加 12N之鹽酸500mL ’將pH值調整為〇·5,使酸溶解而得 500mL之酸溶解液(NO,3濃度、pH、In濃度,如表7所示)。 • 其次’在將溫度控制成酸溶解液未超過60°C的狀態下 "施行攪拌1小時,利用吸濾器施行過濾而去除殘渣(未溶解 的固體),回收酸溶解液,在此酸溶解液(ρΗ〇·7)中,浸潰 覓100mm、長300mm、厚6mm的鋁板,在將溫度控制成 瞻液溫50 C狀態下施行攪拌,而持續進行取代反應丨小時。 然後,將經取代反應所析出的海綿銦回收,經去除水分等 之後,再使用氫氧化鈉施行鹼熔鑄(3〇〇t),然後從模具中 取出含有銦之金屬。 海綿銦之獲取量(g)、含有銦之金屬的獲取量化)、含有 麵之金屬的In品質及In回收率,係如表7所示。 (比較例6) • 準備如同實施例28的含有銦之硝酸溶液5〇〇mL,在 其中添加室溫(20°C)的水l〇〇mL,更添加25%氨水,經調 整為ΡΗ4·5之後,攪拌〇·5小時,經靜置〇 5小時而析出 氫氧化銦而獲得漿料。接著,使用表7所示各種大小的濾 紙(東洋濾紙(股)公司製4Α),利用吸濾器施行抽吸過濾, 後得沈澱物(草酸銦)與濾液(NO/濃度、ρΗ、Ιη濃度,如表 7所示)。另外,在過濾中途當濾餅發生裂開時,便先將表 面抹平然後再繼續施行過濾,經投入含有銦之硝酸溶液後 經1小時便結束過濾。 316907 40 200538394 將中和沈殿物260g投入360mL的水中,益添加濃硫 -酸而調整為ΡΗ0·5,經酸溶解便獲得500mL的酸溶解液 • (NO3 >辰度、pH、In濃度,如表7所示)。 其次,在將溫度控制成酸溶解液未超過60°C的狀態下 - 施行攪拌1小時,利用吸濾器施行過濾而去除殘渣(未溶解 • 的固體),回收酸溶解液。 其次,調整此酸溶解液(pH0.7)後,浸潰寬100mm、長 300mm、厚6mm的鋁板,在將溫度控制成液溫50°C狀態 _下施行攪拌,而持續進行取代反應24小時,並未發現海綿 姻的析出。 (比較例7) 準備如同實施例28的含有銦之硝酸溶液500mL,在 其中添加室溫(2〇°C )的水lOOmL,更添加25%氨水,經調 整為ρΗ4·5之後,攪拌〇·5小時。接著,使用表7所示各 種大小的濾紙(東洋濾紙(股)公司製4Α),利用吸濾器施行 籲抽吸過濾,獲得經中和之沈澱物與濾液(NO,濃度、ρΗ、化 /辰度,如表7所示)。另外,在過濾中途當濾餅發生裂開時, 便先將表面抹平然後再繼續施行過濾,經投入含有銦之硝 酸溶液後經1小時便結束過濾。 將中和沈澱物260g投入400mL的水(20。〇中,經攪 拌10分鐘後,停止攪拌經靜置0 5小時’再利用高速 $除水相的清洗處理,並重複施行2次,而獲得清洗處理 凡成物質與清洗完成溶液(Ν〇3·濃度、ρΗ、Ιη濃度,如表7 所示)。 316907 41 200538394 其次,將此清洗處理完成物質投入360mL的水中,並 添加濃硫酸而調整為pH0.5,經酸溶解便獲得500mL的酸 溶解液(Ν03·濃度、pH、In濃度,如表7所示)。 接著,在將溫度控制成酸溶解液未超過60°C的狀態下 - 施行攪拌1小時,利用吸濾器施行過濾而去除殘渣(未溶解 • 的固體),回收酸溶解液。 其次,調整此酸溶解液(pHO.7)後,浸潰寬100mm、長 300mm、厚6mm的铭板,在將溫度控制成液溫50°C狀態 •下施行攪拌,而持續進行取代反應8小時。然後,將經取 代反應所析出的海綿銦回收,經去除水分等之後,再使用 氫氧化鈉施行鹼熔鑄(300°C ),然後從模具中取出含有銦之 金屬。 海綿銦之獲取量(g)、含有銦之金屬的獲取量(g)、含有 銦之金屬的In品質及In回收率,係如表7所示。Regarding the results in Table 6, first of all, for the contact treatment with or without ammonia, after comparing each yoke example with the reference example, it was learned that the copper concentration in the recovered indium oxide will be removed by the majority of the ammonia contact treatment, and it was confirmed that The removal effect. On the other hand, the conditions of the contact treatment were discussed. The range of contact amount of ammonia (gas and IL oxidation test) was set within the optimal range (refer to the table in Table 5). Examples 22 to 24 surrounded by the lines, Examples 26, 27)) were compared with the results of the other examples, and the result was 36 316907 200538394. It is known that the amount of contact is small ...-"M 19 to 21 ), It is considered that the contact amount of ammonia (or ammonia and hydroxide) in indium oxide == indium has not been completely converted to indium oxychloride, and it is impossible to remove part of the mixed H Steel. On the other hand, when there is a large amount of contact (in the case of the example, the purity of the indium oxide collected can be met, but the recovery rate of A is poor. This phenomenon: tolerance is caused by the addition of excess inspection and oxidation. The dissolution phenomenon of steel. As mentioned above, the contact treatment of ammonia (or ammonia and alkali hydroxide) is an effective way to remove copper from indium oxide, and by setting the contact amount to an appropriate value, _ can be implemented more Effective indium recovery. Figure 3 is not for the precipitate immediately after precipitation (indium oxalate And the result of X-ray diffraction analysis of Shen Dianwu (indium hydroxide) which had been treated by ammonia contact. From the figure 0 (M), the precipitate immediately after precipitation (indium oxalate) belongs to Futami Rui The indium oxalate in the strong crystalline state of the wave peak. Therefore, by contacting the core steel crystal with ammonia ', the diffraction pattern of the precipitate will be formed in a wider shape This change can be judged that the Shen Dianwu composed of indium oxalate: 'by contact with ammonia, its crystal was destroyed and replaced with weakly crystalline indium hydroxide. Then, the In the process of destruction and replacement with indium hydroxide, the copper entrained in the precipitate will be removed. Moreover, the indium oxide diffraction pattern after baking the indium hydroxide is shown in Figure 3 (c). Examples 28 to 30) In this example, a mixture of indium oxide and tin oxide was sintered, 37 316907 200538394, and the obtained ITO sintered body was used as a target and plasma was irradiated. When the ITO was sputter-plated, it was scattered in ITO content in the surrounding and attached to the protective plate, ITO- It was dissolved with nitric acid, and the obtained indium-containing nitric acid solution (pHO. 12) was used as a raw material. The indium-containing nitric acid solution was analyzed by ion chromatography, and the results contained: In (30g / L), Sn (0.06g / L), • Al (10g / L), Mg (0.23g / L), Zn (0.03g / L), Fe (0.04g / L), Cr (less than 10ppm). Prepare the above contents 500mL of indium nitric acid solution (liquid temperature 27 ° C), 500mL of oxalic acid aqueous solution (liquid temperature 26 ° C, oxalic acid concentration 80g / L) was added to the solution, and after stirring for 30 minutes, it was left to stand for 1 hour and 30 minutes. Using filter paper of various sizes shown in Table 7 (manufactured by Toyo Filter Paper Co., Ltd. 4A), suction filtration was performed with a suction filter to obtain a precipitate (indium oxalate) and a filtrate (NCV concentration, pH, In concentration, as shown in Table 7). As shown). In addition, when the filter cake is cracked in the middle of filtering, the surface is smoothed first and then the filtering is continued. In either case, the nitric acid solution containing indium is put into the funnel, and the filtering ends after 15 minutes. . The obtained precipitate was put into 450 mL of water, and 50 mL of 12N hydrochloric acid was added to adjust the pH to 0.5, and 500 mL of an acid-dissolved solution (NO3 · concentration, pH, and In concentration, as shown in Table 7) was obtained after acid dissolution. Next, the temperature is controlled so that the acid-dissolved solution does not exceed 60 ° C, and the mixture is stirred for 1 hour. The residue (undissolved solids) is removed by filtration with a suction filter, and the acid-dissolved solution (ρ 在 0) is recovered. • In 7), the chain plate with a width of 100 mm, a length of 300 mm, and a thickness of 6 mm was immersed, and the substitution reaction was continued for 1 hour while the temperature was controlled to a liquid temperature of 50 ° C. 38 316907 200538394 Then, recover the sponge indium precipitated by the substitution reaction, remove the moisture and so on, and then use sodium hydroxide to perform alkali melting (30000), and then remove the metal containing indium from the mold. Sponge indium The amount obtained, the amount of metal containing indium, the In quality of the metal containing indium, and the amount of metal that can be recovered from an acid-soluble solution. • Recovery rate (In recovery rate (%) [in metals containing indium In content / In content in acid solution] χ 100, hereinafter referred to as "In recovery"}, are shown in Table 7. In addition, the In quality of metals containing indium was measured by lcp emission spectrometry _ lamp analysis The nitrate ion concentration was measured by ion chromatography (the same will be described later). (Examples 31 to 32) 500 mL of an indium-containing nitric acid solution was prepared as in Example 28, and an oxalic acid aqueous solution (liquid) was added to the solution. The temperature is 26 ° C, the concentration of oxalic acid is 500 mL, and after stirring for 30 minutes, it is allowed to stand for} hours% minutes. Next, filter papers of various sizes shown in Table 7 (manufactured by Toyo Filter Paper Co., Ltd. 4a) were used. Suction filter for suction filtration Obtain a precipitate (indium oxalate) and a filtrate (NO, concentration, pH, and In concentration, as shown in Table 7). In addition, when the filter and cake cracked in the middle of the process, first smooth the surface and then continue Filtration is performed. In either case, the nitric acid solution containing indium is put into the funnel, and the filtration is finished after 15 minutes. The obtained precipitate is put into 20 mL of water (2 (rc), and stirred) After 10 minutes, the mixing was stopped and the mixture was allowed to stand for 0.5 hours, and then the high-speed centrifugation was used to remove the aqueous phase. The cleaning process was performed i times in the example, and repeated in the example M two times to obtain the cleaning process. Finished substance and washing completed dissolving 316907 39 200538394 solution (NO3-concentration, pH, In concentrations, as shown in Table 7). Put the washing-treated finished substance into 450mL of water, and add 12N hydrochloric acid 500mL 'to pH Adjust to 0.5 and dissolve the acid to obtain 500 mL of acid-dissolved solution (NO, 3 concentration, pH, and In concentration, as shown in Table 7). • Secondly, the temperature should be controlled so that the acid-dissolved solution does not exceed 60 ° C. Under the condition of "quoting for 1 hour, filtering with suction filter Remove the residue (undissolved solids) and recover the acid solution. In this acid solution (ρΗ〇 · 7), immerse the aluminum plate 100mm, 300mm long, and 6mm thick, and control the temperature to 50 ° C. Stirring is performed in the state, and the substitution reaction is continued for one hour. Then, the sponge indium precipitated by the substitution reaction is recovered, and after removing water and the like, alkali casting (300t) is performed using sodium hydroxide, and then the mold is removed from the mold. The metal containing indium is taken out. The amount of sponge indium obtained (g), the quantity of metal containing indium), the In quality and In recovery of the metal containing the surface are shown in Table 7. (Comparative Example 6) • 500 mL of an indium-containing nitric acid solution was prepared as in Example 28, and 100 mL of room temperature (20 ° C) water was added thereto, and 25% ammonia water was further added, and adjusted to pH 4 · After 5 minutes, the mixture was stirred for 0.5 hours, and the indium hydroxide was precipitated by standing for 0.5 hours to obtain a slurry. Next, using various sizes of filter papers shown in Table 7 (manufactured by Toyo Filter Paper Co., Ltd. 4A), suction filtration was performed using a suction filter to obtain a precipitate (indium oxalate) and a filtrate (NO / concentration, ρΗ, Ιη concentration, As shown in Table 7). In addition, when the filter cake was cracked in the middle of filtration, the surface was smoothed first, and then the filtration was continued. After the nitric acid solution containing indium was added, the filtration was completed in 1 hour. 316907 40 200538394 Put 260g of neutralized Shen Dianwu into 360mL of water, and add concentrated sulfur-acid to adjust to pH 0.5. After acid dissolution, 500mL of acid dissolving solution is obtained. • (NO3 > degree, pH, In concentration, As shown in Table 7). Next, control the temperature so that the acid solution does not exceed 60 ° C-Stir for 1 hour, filter with a suction filter to remove residues (undissolved solids), and recover the acid solution. Next, after adjusting this acid solution (pH 0.7), immerse the aluminum plate with a width of 100mm, a length of 300mm, and a thickness of 6mm, and control the temperature to a liquid temperature of 50 ° C. Stirring is performed, and the substitution reaction is continued for 24 hours. No precipitation of sponge marriage was found. (Comparative Example 7) 500 mL of an indium-containing nitric acid solution was prepared as in Example 28, and 100 mL of room temperature (20 ° C) water was added to the solution, and 25% ammonia water was added. After adjusting to ρΗ4.5, the mixture was stirred. 5 hours. Next, filter paper of various sizes shown in Table 7 (manufactured by Toyo Filter Paper Co., Ltd. 4A) was used to perform suction filtration with a suction filter to obtain a neutralized precipitate and filtrate (NO, concentration, ρΗ, 化 / 辰). Degrees, as shown in Table 7). In addition, when the filter cake was cracked in the middle of filtration, the surface was smoothed first, and then the filtration was continued. After the nitric acid solution containing indium was added, the filtration was completed in 1 hour. 260 g of neutralized sediment was put into 400 mL of water (20.0, after stirring for 10 minutes, the stirring was stopped, and the mixture was left to stand for 0.5 hours, and then the high-speed $ water-removing phase was cleaned and repeated twice to obtain Cleaning treatment of all substances and cleaning completion solution (NO3 · concentration, ρΗ, Ιη concentration, as shown in Table 7). 316907 41 200538394 Second, put this cleaning treatment completed substance into 360mL of water, and add concentrated sulfuric acid to adjust At pH 0.5, 500 mL of an acid-dissolved solution (N03 · concentration, pH, and In concentration, as shown in Table 7) was obtained after acid dissolution. Next, the temperature was controlled so that the acid-dissolved solution did not exceed 60 ° C. -Stir for 1 hour, filter with a suction filter to remove residues (undissolved solids), and recover the acid solution. Next, adjust the acid solution (pHO.7) and immerse it with a width of 100mm, a length of 300mm, and a thickness The 6mm nameplate was stirred while controlling the temperature to a liquid temperature of 50 ° C, and the substitution reaction was continued for 8 hours. Then, the sponge indium precipitated by the substitution reaction was recovered, and after removing moisture, it was used. Sodium hydroxide Alkali melting (300 ° C), and then remove the metal containing indium from the mold. The amount of sponge indium obtained (g), the amount of metal containing indium (g), the quality of In and the recovery of In , As shown in Table 7.
42 316907 200538394 [表7] 形成 手段 清 洗 遽紙 大小 (mm Φ) 濾液 清洗完成溶液 酸溶解液 海 綿 In (g) 含有In之金屬 NO;; (ppm) pH In濃度 Ν03· (ppm) pH In濃 度 _ ν〇3· (ppm) PH In 濃 度 獲 取 量 (g) 品 質 (%) In回收 率 (%) 實施例 28 添加 草酸 無 150 280000 0.6 3 — '— 一 3000 0.8 26 12.4 12.0 98 90 實施例 29 添加 草酸 無 110 290000 0.7 3 — — — 8500 0.8 26 12.2 11.8 98 89 實施例 30 力口 草酸 無 90 250000 0.7 3 — — 一 10000 0.8 29 13.0 12.0 98 85 實施例 31 力口 草酸 有 150 260000 0.7 3 16000 1.1 0.7 2700 0.8 26 12.7 12.3 98 93 實施例 32 添力口 草酸 有 110 230000 0.6 4 27000 1.1 0.6 6500 0.8 26 12.7 12.3 98 93 比較例6 氨中 和 無 150 140000 4.0 0.1 比較例7 氨中 和 有 150 140000 4.4 0.1 26000 5.2 <0.1 4600 0.6 27 11.9 11.6 97 8342 316907 200538394 [Table 7] Forming means Cleaning paper size (mm Φ) Filtration cleaning solution Acid dissolving solution sponge In (g) Metal NO containing In; (ppm) pH In concentration N03 · (ppm) pH In concentration _ ν〇3 · (ppm) PH In Concentration Obtained Amount (g) Quality (%) In Recovery (%) Example 28 Adding oxalic acid without 150 280000 0.6 3 — '— 3000 0.8 26 12.4 12.0 98 90 Example 29 Add oxalic acid 110 290000 0.7 3 — — 8500 0.8 26 12.2 11.8 98 89 Example 30 Likou oxalic acid 90 250000 0.7 3 — — 10000 0.8 29 13.0 12.0 98 85 Example 31 Likou oxalic acid 150 260000 0.7 3 16000 1.1 0.7 2700 0.8 26 12.7 12.3 98 93 Example 32 Timonic acid oxalic acid 110 230000 0.6 4 27000 1.1 0.6 6500 0.8 26 12.7 12.3 98 93 Comparative example 6 Ammonia neutral without 150 140000 4.0 0.1 Comparative example 7 Ammonia neutral with 150 140000 4.4 0.1 26000 5.2 < 0.1 4600 0.6 27 11.9 11.6 97 83
另外,含有銦之硝酸溶液的分析結果將如實施例28 所示,隨含有銦之硝酸溶液的In濃度差或操作誤差等因 素,酸溶解液中的In含有量將發現不一致(零散)情況,但 是如表7所示,得知有關In回收率係酸溶解液中的硝酸含 有量如少於1000Oppm時,將可有效率的回收In。 (試驗1 :酸溶解液中的硝酸離子濃度、與鋁取代析出的關 係) 探討酸溶解液中的硝酸離子濃度,對鋁取代析出反應 所造成的影響。 在上述實施例28中所獲得的酸溶解液500mL中,添 加既定量的14N硝酸,並如表8所示,調整酸溶解液中的 NCV濃度,並如同實施例28般的使用鋁板施行取代析出而 43 316907 200538394 獲仔滑、绵I η ’再如同戸、施例2 8般的施行驗炼禱便獲得含 有銦之金屬。 此時針對採用ί呂板的取代析出反應,依下述基準施行 評估。 • ◎ : 1小時以内便結束取代析出。 - 〇:在1至1 · 5小時以内結束取代析出。 △ ··雖經進行取代,但是在2小時的時點下尚未完成取 代。 • X :無法取代。 [表8] NO^(ppm) 取代析出評估 3000 ◎ 4600 ◎ 7000 10000 15000 "' --- 22000 29000 △ X V 海綿In(g) 6.9 6.8 7 6.3 4.4 --------- 0 八 0 In含有金屬(g) 6.7 6.4 6.8 5.5 2.7 0 0 一 由表8得知,當使用含有銦之硝酸溶液為起始原料的 情況時,為能進行鋁取代析出反應,酸溶解液中的硝酸離 #子濃度(鈍化形成原因離子濃度)必須低於22〇〇〇ppm,最好 低於1 5000ppm,尤以1 〇〇〇〇ppm以下為佳。 【圖式簡單說明】 第1圖係說明實施例丨至18及比較例1至5中銦回收 步驟之流程圖。 第2圖係說明實施例i 9至2 7中銦回收步驟之流程圖。 1第3圖係呈示剛析出後的沈澱物⑷、接觸處理後的沈 而·物(b)、烘焙後的氧化銦(c)之χ線繞射圖案。 316907 44In addition, the analysis result of the nitric acid solution containing indium will be as shown in Example 28. With the difference in In concentration of the nitric acid solution containing indium or the operation error, the In content in the acid solution will be found to be inconsistent (scattered). However, as shown in Table 7, it was found that if the content of nitric acid in the acid-dissolved solution concerning the In recovery rate is less than 1000 Oppm, In can be efficiently recovered. (Experiment 1: Relationship between the concentration of nitrate ions in the acid-dissolved solution and aluminum substitution precipitation) The effects of the concentration of nitrate ions in the acid-dissolved solution on the aluminum substitution precipitation reaction were examined. To 500 mL of the acid-dissolved solution obtained in the above Example 28, a predetermined amount of 14N nitric acid was added, and as shown in Table 8, the NCV concentration in the acid-dissolved solution was adjusted, and the substitution and precipitation were performed using an aluminum plate as in Example 28. However, 43 316907 200538394 was obtained by carrying out trials and prayers like 戸 and Example 28 to obtain a metal containing indium. At this time, the substitution precipitation reaction using ίLu plate was evaluated according to the following criteria. • ◎: Substitution precipitation is completed within 1 hour. -〇: Substitution precipitation was completed within 1 to 1.5 hours. △ ... Although replaced, the replacement has not been completed at the time of 2 hours. • X: Cannot be replaced. [Table 8] NO ^ (ppm) Replacement precipitation evaluation 3000 ◎ 4600 ◎ 7000 10000 15000 " '--- 22000 29000 △ XV sponge In (g) 6.9 6.8 7 6.3 4.4 --------- 0 8 0 In contains metal (g) 6.7 6.4 6.8 5.5 2.7 0 0 As can be seen from Table 8, when a nitric acid solution containing indium is used as the starting material, in order to enable aluminum substitution precipitation reaction, nitric acid in the acid solution The ion concentration (ion concentration due to passivation formation) must be less than 220,000 ppm, preferably less than 15,000 ppm, and particularly preferably less than 10,000 ppm. [Brief description of the drawings] Fig. 1 is a flowchart illustrating the indium recovery steps in Examples 丨 to 18 and Comparative Examples 1 to 5. Fig. 2 is a flowchart illustrating the indium recovery steps in Examples i 9 to 27. Fig. 3 shows the X-ray diffraction pattern of the precipitate ⑷ immediately after precipitation, the precipitate b after the contact treatment (b), and the indium oxide (c) after baking. 316907 44
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| WO2007102207A1 (en) * | 2006-03-08 | 2007-09-13 | Mitsui Mining & Smelting Co., Ltd. | Process for producing indium-containing metal |
| CN100443604C (en) * | 2006-11-20 | 2008-12-17 | 深圳市中金岭南有色金属股份有限公司韶关冶炼厂 | Extraction and separation technology for reclaiming main impurity in indium in hydrochloric acid system |
| JP2008214693A (en) * | 2007-03-05 | 2008-09-18 | Sumitomo Metal Mining Co Ltd | Recovery method of crude indium |
| JP5354989B2 (en) * | 2008-08-14 | 2013-11-27 | 関東化学株式会社 | Etching composition for transparent conductive film |
| WO2013118622A1 (en) * | 2012-02-08 | 2013-08-15 | 東海光学株式会社 | Optical product and method for manufacturing same |
| KR101249327B1 (en) | 2012-09-12 | 2013-04-02 | 주식회사 엔코 | Indium hydrate cake and copper sulfide cake extraction method from spent acids of the ito sputtering process |
| CN111793805B (en) * | 2020-06-03 | 2022-09-09 | 先导薄膜材料有限公司 | Indium oxide and preparation method of precursor thereof |
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