TW200526920A - Testing method for polariscope - Google Patents

Abstract

The present invention is related to a checking method for a polariscope. The method includes processes of a selected beam of light passing through a filter, a polarizer, a concave lens or a filter, a mirror, a concave lens and finally to an optical coating sample; the optical coating sample is rotated along z-axis to ascertain that if there is any variation of shade in an optical domain, in order to differentiate defective samples from qualified ones. By applying the method of the present invention, gooseflesh in thickness of the optical coating is apparently ascertained by a naked eye easily while feeding and checking results can be reflected to a factory owner. The cost for the checking is not too much and no expensive instruments need to be set up additionally; moreover, an addition processing of polarizing plate pasting is needless and the sample itself can be checked. Therefore, the checking method has a simplified procedure and it does not take much time to finish the checking.

Description

200526920

[Technical field to which the invention belongs] The present invention is a light source for a polarizer that rotates an optical film sample along the Z axis after passing through a filter, a polarizer mirror, a concave lens to an optical ^ focal length; if there is, The optical film sample opening is a qualified sample. The detection method is based on a selected lens, a concave lens or a filter, a sample, moving the optical film sample to adjust the rotation, and determine whether there is a defect in the light field brightness; if not, the optical film sample [prior art] in When making a polarizing film, it is often necessary to inspect the new optical film material first to avoid defects in the finished product in the future. However, some defects are not visible to the naked eye: the irregularity of film thickness is an example. The non-uniformity of the film thickness is caused by the non-uniformity of the film thickness of the polarizing film, which cannot be clearly discerned by the naked eye. ^ Frequently, defects are detected when the polarizing film is in the previous process to the semi-finished product, thereby increasing the production cost. When the polarizing film is in the pre-production process to the semi-finished product, it is necessary to pass through the inspection of the polarized light to check the seriousness of the Goose flesh. The method of this test seems to be a bit late, because the flaw can be detected when the semi-finished product is in use. 'Cost-effective. + It is also difficult to react to defects with upstream manufacturers of optical film materials. The non-uniformity of 111 film thickness cannot be identified with the naked eye, and it can be detected only when it is semi-finished. It cannot be immediately reflected to the manufacturer when feeding. At the same time, the thickness K of this film cannot be clearly described in words and there is no standard ’# on the communication ^ & the upstream manufacturers have no idea about the unevenness of the film thickness

200526920 V. Description of Invention (2) Introduction. Because the upstream manufacturers of optical film materials themselves do not know much about the unevenness of film thickness and cannot clearly recognize it with the naked eye, even if they want to improve, they do not know where to improve. For various reasons mentioned above, the motivation for this invention was then brewed. However, the solution should not take too long, so that it can be detected and reflected to the manufacturer at the time of feeding, without waiting for the semi-finished product to be checked out. The most important purpose is to highlight the disadvantages of non-uniform film thickness. At the same time, it is best to identify it with the naked eye without relying on instrumentation for detection. Although there is no relevant detection method in this industry, there are still other cases available for reference in other industries. Semiconductor industry Liancheng Integrated Circuit Company applied for the Republic of China patent certificate number 1 0 7 2 6 1 "Transparent film surface defect detection method", the invention in order to detect defects on the surface of the semiconductor wafer, must be pre-plated with an anti-transmission The component of the transmission layer may be silicon nitride (Silicon Nitride), silicon oxide nitride (Silicon Oxynitride), titanium metal (Ti), titanium nitride (TiN), titanium titanium (TiW) compound or light Resistive materials. In addition, the Republic of China Patent No. 8 2 8 8 5 "Method for inspecting film thickness" filed by IWC is an inspection method for detecting the thickness of a color filter film using a scanning rangefinder. [Summary of the Invention] The present invention is a method for detecting polarizers. The first purpose of the present invention is to solve the problem that the unevenness of the film thickness is difficult to identify with the naked eye. The detection method of the present invention can easily distinguish the unevenness of the film thickness with the naked eye Sex phenomenon.

200526920

V. Description of the invention (3) The present invention is a kind of partial pole # It can be checked and reflected when feeding, and it can be obvious through direct inspection.% The present invention is a partial pole # The detection cost is not high. Semi-finished polarizing film, sample # is not long. The second purpose of the detection method is to determine the non-uniformity of the thickness of the polarized film when the semi-finished product is not required. The third purpose of the detection method is to use heavy equipment, and it can be used for testing without having to be a finished product. The program is simple and consumable. The present invention is a bias; ^ ^ ^, Η Ϊ +, + 氺 ,, original, ft — 噙 氺 Κ cup loose test method, is based on a selected light source, two filters,-polarizer, a concave lens or-filter,

Mirror, -concave lens to -optical film sample; # 动 Optical Film ^ Rotate the optical film sample along the Z axis after adjusting the focal length, and determine whether there is any change in the light field brightness; if so, the optical film sample is defective; if not The optical film sample is a qualified sample. In order to make those skilled in the art understand the purpose, characteristics and effects of the present invention, the following specific embodiments are given in conjunction with the accompanying drawings to explain the present invention in detail as follows: [Embodiment]

In the present invention, polarized light is used to irradiate a transparent optical film, and the phase difference caused by the uneven thickness of the film is used to make the emitted light projected on a white screen. There is a difference between light and dark, thereby determining whether there is uneven film thickness (Gooseflesh )The phenomenon. Please refer to FIG. 1 and FIG. 3 ', which are a detection flowchart of the first preferred embodiment of the present invention and a detection device diagram of the first preferred embodiment of the present invention.

Page 9 200526920 V. Description of the invention (4) Formula. (Step 1 0 1), first start with the determination of the brightness of a light source 11; step 10 2), determine the light source 11 that can produce the clearest projection shadow color in order to detect ζ if the light projection shadow of the light source 11 is not the clearest, Then reselect, '/ source 11', that is, return to step 1 0 1, when a light source f which has the clearest projection shadow has been selected, proceed to the next step; (step 1 〇 3), fix the optical film 1 product 1 6; (step 104), the light projected by the selected light source 1i is passed through a polystyrene (PS) board 12 to strengthen the polarized line; (step 105), the light passes through the focus After the styrene board i 2 to a light ^, the filter 13 is used to filter the light emitted by the light source 1 1 to screen ^ the wavelength of the light that the person wants to detect, and at the same time, the = ^ The range can cover the wavelength range of red light, blue light and green light at the same time; (Step 206) After filtering the light wavelength, pass the light through a polarizer to polarize the light; (Step 1〇 7) When the light has been polarized, @ 4 magnifies the light through a concave lens 15 so that the naked eye can easily discern t (step 1 0 8) ' The film sample 16 is moved to the light source 11 1 at a distance of 2 weeks to make the imaging clearer and easier for the naked eye to observe; (steps 丨 〇_, after the distance is adjusted and the image is clear, the optical film sample 16 is moved along the vertical direction. (Step 110), judging whether the light and shade of the light field has changed with the naked eye. I can directly observe the optical film sample 16 with the naked eye to judge the "light and shade change at this time, or you can image 18 projection to a screen i 7 1 light j or its light and dark changes (because mainly the TAC part is inspected, so Yicheng ① when the light field thickness is uneven, the optical model sample 16 or projection imaging 丨 non-unidirectional arrangement (Produced), if there is no obvious change in light and darkness in the light field, there are first, and text into the next step, if there is a change in light and darkness in the light field, go to steps i · ,, d, (step

200526920 V. Description of the invention (5) 1 11), the optical film sample 16 is qualified, and the process proceeds to step 11 3; (step 11 2), the optical film sample u ^ is qualified; (step 11 3), this This concludes the detection method. Please refer to FIG. 2 and FIG. 4, which are a detection flowchart of the second preferred embodiment and a diagram of a detection device of the second preferred embodiment of the present invention. (Step 201), first start with the determination of the brightness of a light source 21; (Step 202), determine the light source 21 that can produce the clearest projection shadow for detection purposes. If the projection shadow of the light source 21 is not the clearest, then Select a light source 21 again, that is, return to step 2 0 1 'When a light source 2 1 with the clearest projection shadow has been selected, proceed to the next step; (step 2 03), fix the optical film sample 2 6; ( Step 2 0 4), the light passes through a filter 23, which filters the light emitted by the light source 21 to filter out the wavelength of the light that we want to detect, and at the same time, the The detection wavelength range can cover the wavelength range of red light, blue light and green light at the same time; (step 2 0 5), after the light wavelength is filtered, the light is reflected by a mirror 2 4 and the light is refracted toward a concave lens 2 5 (Step 2 0 6), when the light is refracted, pass it through the concave lens 25 to magnify the light so that the naked eye can easily identify and interpret; (Step 2 0 7), place the optical film sample 2 6 on the light source 2 1 Move to adjust the focus to make the image 2 8 clearer for the naked eye Observation; (step 208), after the focal length is adjusted and the imaging 28 is clear, the optical film sample 26 is reversed along the longitudinal axis I f-°; (step 209), the presence or absence of light in the light field is judged with the naked eye The optical film sample 26 itself can also be directly observed with the naked eye, and the light and dark changes (because the main part of the TAC is viewed, the light and dark changes, or the imaging 28 can be projected on a screen to judge one of the light fields .... ", a ι a. # 幕 U 来看 光 域 So if TAC's

200526920 V. Description of the invention (6) When the thickness is uneven, the optical pattern sample 26 or projection image 28 will have a non-unidirectional arrangement of light streaks). If there is no significant change in the light field brightness, then proceed to the next step. If there is a change in the lightness and darkness of the domain, go to step 2; (Step 210) 'The optical film sample 26 is combined, and proceed to step 212; (Step 2 1 1)' The optical film sample 26 is unqualified; ( Step 2 1 2), the detection method ends here.

In addition to detecting defects in unevenness of the thickness of the optical film, the detection method can also detect defects such as scratches, scratches, and uneven coating of the optical film. Another advantage of this detection method is that the detection cost is not high, no need to add expensive equipment, and no additional processing procedures such as coating. The sample itself can be used for detection, and the procedure is simple and time-consuming. As above, however, it is not used without departing from the essence of the present invention, therefore the insurer of the present invention shall prevail. Although the present invention has been disclosed with a preferred embodiment to limit the present invention, anyone skilled in the art, within the scope of God, can make various changes and retouching. The scope of protection is defined by the scope of the attached patent

200526920 ;; Scheme diagrams, maps, maps, schedules, backups, flow settings, JUJ. Rnj. JUJ., Tricks, tricks, check, check, check, check, check, check, check, check, check, check, check, check, check, check examples More than ft -lu one, t one 丨 -B one 3 4 Figure No. Figure Number Description 11 Light Source 12 Polyethylene Plate 13 Filter 14 Polarizer 15 Concave Lens 16 Sample 17 Screen 18 Imaging 21 Light Source 23 Filter 24 Mirror 25 Concave Lens 26 Sample 27 Screen 28 Imaging step 101 Light source selection step 102 Identifying the light source that produces the clearest projection shadows Step 103 Fixing the optical film sample

Page 13 200526920 Schematic description of step i 0 4 step 1 0 5 step 1 0 6 step 0 7 step 1 0 8 step 1 0 9 step 1 1 0 step 1 1 1 step 11 2 step 11 3 step 2 0 1 step 2 0 2 step 2 0 3 step 2 0 4 step 2 0 5 step 2 0 6 step 2 0 7 step 2 0 8 step 2 0 9 step 2 1 0 step 2 1 1 the light source is taken one to strengthen it; Pole ::: Dilute (Po—reverse light source passes through one, ♦, ♦, can be passed, considering the light sheet to make the desired wavelength range—the polarizer polarizes the light to be detected, and the concave lens amplifies the light to be optical; Move the light source to adjust the focus to determine whether it ’s a good time. Rotate counterclockwise along the z-axis. Do you want to change the brightness of the first field? Do not match the light source. Select the light source port for the clearest projected shadow. Learn the film sample first! Pass-through light sheet passes the light source of the desired wavelength range through a mirror to reflect the detected light. The light source passes through a concave lens to magnify the detected light. Move the film sample to the light source to adjust the focal length. Rotate the optical film sample counterclockwise along the ζ axis. …, To determine whether there is a change in the light and shade of the light domain 20 Schematic description Step 2 1 2 End

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Claims (1)

200526920 6. Scope of patent application 1. A method for detecting polarizers, including: (1) selecting a light source; (2) judging whether the light source can produce the clearest projection shadow, and if yes, proceed to the next step; if not, Then return to step (1); (3) fix the optical film sample and proceed to the next step; (4) irradiate the compared light source to the optical film sample through a detection device and proceed to the next step; (5) The optical film sample moves to adjust the focal length and proceed to the next step; (6) Rotate the optical film sample along the Z axis and proceed to the next step; (7) Determine whether the light field brightness has changed, and if not, proceed to the next step Step; if yes, proceed to step (9); (8) the optical film sample is tested as qualified and proceed to step (10); (9) the optical film sample is tested as unqualified and proceed to the next step ; (1 0) End. 2. According to the detection device described in step 4 of item 1 of the scope of patent application, the detection device has the following two types: a reflection detection device and a penetration detection device. 3. According to the penetrating detection device described in item 2 of the scope of patent application, the reflection detection device further includes the following steps: (4 B) the light source passes through a filter and a light sheet; (4C) the light source passes through a polarizer; ( 4D) The light source passes through a concave lens. Page 16 200526920 VI. Patent application scope 4. As the penetrating detection device described in item 3 of the patent application scope, the penetrating detection device can add a step before step (4B): (4A) the light source passes through A polystyrene (Polystyrene) board; 5. As in the penetrating detection device described in item 3 of the scope of patent application, the penetrating detection device can add a step after step (4D): (4E) make light Shine on a screen. 6. According to the reflective detection device described in item 2 of the scope of patent application, the reflective detection device further includes the following steps: (4 A ′) the light source passes through a filter; (4B ') The light source is reflected by a mirror; (4C') The light source is passed through a concave lens. 7. According to the reflective detection device described in item 6 of the scope of patent application, the reflective detection device can add a step after step (4C ′): (4D ′) irradiate light onto a screen. 8. The detection method as described in item 1 of the patent application range, wherein the wavelength range to be detected by the detection method covers both the red, blue and green wavelength ranges. Page 17