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TW200514977A - Apparatus for inspecting leads and method thereof - Google Patents

Apparatus for inspecting leads and method thereof

Info

Publication number
TW200514977A
TW200514977A TW092128973A TW92128973A TW200514977A TW 200514977 A TW200514977 A TW 200514977A TW 092128973 A TW092128973 A TW 092128973A TW 92128973 A TW92128973 A TW 92128973A TW 200514977 A TW200514977 A TW 200514977A
Authority
TW
Taiwan
Prior art keywords
leads
inspecting
mask
images
pattern
Prior art date
Application number
TW092128973A
Other languages
Chinese (zh)
Other versions
TWI307769B (en
Inventor
Shwang-Shi Bai
Chia-Hui Wu
Chiu-Shun Lin
Original Assignee
Himax Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Himax Tech Inc filed Critical Himax Tech Inc
Priority to TW92128973A priority Critical patent/TWI307769B/en
Publication of TW200514977A publication Critical patent/TW200514977A/en
Application granted granted Critical
Publication of TWI307769B publication Critical patent/TWI307769B/en

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

An apparatus for inspecting leads and method thereof are suitable for inspecting the leads of carrier. The apparatus comprises a light source and a mask. The mask has a pattern; the pattern and the form of leads are complementary. The method for inspecting leads is mainly observing the images of the leads and the mask. By observing the images of the leads and the mask are complementing or not for judging the mouse-bite or the extrusion of leads.
TW92128973A 2003-10-20 2003-10-20 Apparatus for inspecting leads and method thereof TWI307769B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW92128973A TWI307769B (en) 2003-10-20 2003-10-20 Apparatus for inspecting leads and method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW92128973A TWI307769B (en) 2003-10-20 2003-10-20 Apparatus for inspecting leads and method thereof

Publications (2)

Publication Number Publication Date
TW200514977A true TW200514977A (en) 2005-05-01
TWI307769B TWI307769B (en) 2009-03-21

Family

ID=45071661

Family Applications (1)

Application Number Title Priority Date Filing Date
TW92128973A TWI307769B (en) 2003-10-20 2003-10-20 Apparatus for inspecting leads and method thereof

Country Status (1)

Country Link
TW (1) TWI307769B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110286505A (en) * 2019-06-14 2019-09-27 深圳市全洲自动化设备有限公司 A kind of automatic search foot position method and system applied to LCD white glass AOI test
TWI852360B (en) * 2023-02-22 2024-08-11 望隼科技股份有限公司 Lens testing equipment

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI807533B (en) * 2021-12-14 2023-07-01 南茂科技股份有限公司 Flexible circuit board

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110286505A (en) * 2019-06-14 2019-09-27 深圳市全洲自动化设备有限公司 A kind of automatic search foot position method and system applied to LCD white glass AOI test
CN110286505B (en) * 2019-06-14 2021-09-03 深圳市全洲自动化设备有限公司 Automatic pin searching method and system applied to AOI (automated optical inspection) test of LCD (liquid Crystal display) white glass
TWI852360B (en) * 2023-02-22 2024-08-11 望隼科技股份有限公司 Lens testing equipment

Also Published As

Publication number Publication date
TWI307769B (en) 2009-03-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees