SU109695A1 - X-ray camera for examining linearly stressed specimens - Google Patents
X-ray camera for examining linearly stressed specimensInfo
- Publication number
- SU109695A1 SU109695A1 SU455679A SU455679A SU109695A1 SU 109695 A1 SU109695 A1 SU 109695A1 SU 455679 A SU455679 A SU 455679A SU 455679 A SU455679 A SU 455679A SU 109695 A1 SU109695 A1 SU 109695A1
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- examining
- linearly
- ray camera
- sample
- specimens
- Prior art date
Links
- 238000002441 X-ray diffraction Methods 0.000 description 2
- 229910052790 beryllium Inorganic materials 0.000 description 2
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 2
- 239000006227 byproduct Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Description
Известные рентгеновские камеры дл исс тедовани свойств твердых тел, св занных с нх кристаллической структурой, имеют тот существенный недостаток, что в них свободна дл .чучей поверхност) нснытуемого образца при любых снособах механического воздейств1ш остаетс ненапр женной и.ти к основному напр жению нрибав.т ютс побочные. Кроме того, в этих камерах не.тьз создатт, .линейные механические напр жени в наиравлении не11вичного . при свободной поверхности Т1сс;1едуемог() образца .The known X-ray chambers for the investigation of the properties of solids associated with their crystal structure have the significant disadvantage that they have a free surface for the removable sample for any mechanical means that remain unstressed and are unattached to the main voltage. are byproducts. In addition, in these chambers there are not sozdravtt, linear mechanical stresses in the control of a non-vicious. with a free surface T1cc; 1 is unacceptable () sample.
Предметом изобретени ЯБ.ЧЙСТСЯ рентгеновска д.т по.тучени рентгенограмм нан э женных образцов, свободна от недостатков известных камер. Устройство камеры , благодар нрименению в ней бериллиевой пластинки, дает возможность определ ть изменени межнлоскостных рассто ний при линейных ианр женн5 х, нанравленных вдоль первичного луча и.ти иод небольшими к нему у1лами.The subject of the invention is the X-ray X-ray diffraction of the X-ray diffraction patterns of nanoscale samples, free from the drawbacks of the known chambers. The device of the camera, due to the use of a beryllium plate in it, makes it possible to determine the changes in the interplanar spacings with linear patterns 5, aligned along the primary beam and this small inlet to it.
На чертеже показано устройство к меры в нродольно% разрезе.The drawing shows the device to measure in butrodo% cut.
| -нтгеновскис лучи, проход че )ез систему тонких диафрагм / и бернл.тиевую пластинку 2, выполнепную в виде усеченного конуса, заирессоваииого в основание о, попадают на испытуемый образец 4. Отразившись от образца и вторично пройд через бернл.тневую пластинку , рентгеновскне фиксируютс па фотон.ченке 5. укрен.чениой в кассете 6. Кассета посредством кр()нп1тейнов 7 н бо.пов 8 закреплена па основании камеры таким обjia30M , что ее мо/кио поворачивать вокруг вс ртикальной оси, проход щей через исс.чедуемую noBeiixHoeTb образца.| - ntgenovskiy rays, passage through the thin system of diaphragms / and the burner plate 2, performed in the form of a truncated cone, pressed into the base o, get onto the test sample 4. Reflecting from the sample and passing through the burnt blue plate for the second time, X-ray fixes photon bundle 5. ukren.cheniya in cassette 6. The cassette through cr () nn1teynov 7 n bob 8 is fixed on the base of the camera such objia30M, that it can rotate around the vertical axis passing through the studied noBeiixHoeTb sample.
В задней части основани камеры , заканчивающегос цилиндрическим патрубком, имеетс отверстие, в которое вве)нут винт 9, воздействующий через щарнк 10 и шток // на внтую нружнну 12. Давление иружины через цн.чиндр 13 обеспечивает прижим образца к бериллцевой н.тастинке. Усилие дав.чени на образен определ етс по градуированной шка.че 14 иосредстводг указате .чьной стре.чки, .ченной ja штоке.In the rear part of the base of the chamber, ending with a cylindrical pipe, there is a hole into which a screw 9 is inserted, acting through shield 10 and stem // on the external spring 12. The pressure of the spring through the cylinder 13 presses the sample to the beryl-supported N. strip. The force of pressure is determined by a graduated scale of 14 and by means of a pointer of a special stretch, divided ja rod.
П р с д ,м. е т и 3 о б р с т с н и . P r d, m ET and 3 about br with t with n and.
Рентгеновска камера дл исследовани линейно-напр женных образцов , отличающа с тем, что, с целью созда.ни механнческих напр жений, направленных вдоль первичного пучка лучей или под небольшими к neiMy у1лами, в основании камеры установлена бериллиева пластинка в виде усеченного конуса, служаща передним упором дл исследуемого образца, сдавливаемого посредством винта с пружиной , усилие давлени которой на образец фиксируетс указательной стрелкой на градуированной щкале.An X-ray chamber for examining linearly stressed specimens, characterized in that, in order to create mechanical stresses directed along the primary beam of rays or under small lines, a beryllium plate in the form of a truncated cone serving as the front an emphasis for the sample under study, squeezed by means of a screw with a spring, the pressure force of which on the sample is fixed by the index arrow on the graduated scale.
/ в 3 il 10 9/ in 3 il 10 9
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU455679A SU109695A1 (en) | 1955-04-16 | 1955-04-16 | X-ray camera for examining linearly stressed specimens |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SU455679A SU109695A1 (en) | 1955-04-16 | 1955-04-16 | X-ray camera for examining linearly stressed specimens |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU109695A1 true SU109695A1 (en) | 1956-11-30 |
Family
ID=48382700
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU455679A SU109695A1 (en) | 1955-04-16 | 1955-04-16 | X-ray camera for examining linearly stressed specimens |
Country Status (1)
| Country | Link |
|---|---|
| SU (1) | SU109695A1 (en) |
-
1955
- 1955-04-16 SU SU455679A patent/SU109695A1/en active
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