SG63828A1 - Interconnects using metal spacers and method for forming same - Google Patents
Interconnects using metal spacers and method for forming sameInfo
- Publication number
- SG63828A1 SG63828A1 SG1998000565A SG1998000565A SG63828A1 SG 63828 A1 SG63828 A1 SG 63828A1 SG 1998000565 A SG1998000565 A SG 1998000565A SG 1998000565 A SG1998000565 A SG 1998000565A SG 63828 A1 SG63828 A1 SG 63828A1
- Authority
- SG
- Singapore
- Prior art keywords
- interconnects
- forming same
- metal spacers
- spacers
- metal
- Prior art date
Links
Classifications
-
- H10W20/031—
-
- H10W20/039—
-
- H10W20/064—
-
- H10W20/42—
-
- H10W20/425—
-
- H10W20/435—
-
- H10W20/496—
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
- Y10S257/903—FET configuration adapted for use as static memory cell
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/838,371 US5808364A (en) | 1997-04-08 | 1997-04-08 | Interconnects using metal spacers |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG63828A1 true SG63828A1 (en) | 1999-03-30 |
Family
ID=25276953
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG1998000565A SG63828A1 (en) | 1997-04-08 | 1998-03-14 | Interconnects using metal spacers and method for forming same |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US5808364A (en) |
| JP (1) | JP2970757B2 (en) |
| KR (1) | KR100301644B1 (en) |
| MY (1) | MY117252A (en) |
| SG (1) | SG63828A1 (en) |
| TW (1) | TW379433B (en) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5756396A (en) * | 1996-05-06 | 1998-05-26 | Taiwan Semiconductor Manufacturing Company Ltd | Method of making a multi-layer wiring structure having conductive sidewall etch stoppers and a stacked plug interconnect |
| US6074943A (en) * | 1997-04-16 | 2000-06-13 | Texas Instruments Incorporated | Sidewalls for guiding the via etch |
| US5969425A (en) * | 1997-09-05 | 1999-10-19 | Advanced Micro Devices, Inc. | Borderless vias with CVD barrier layer |
| US5925932A (en) | 1997-12-18 | 1999-07-20 | Advanced Micro Devices, Inc. | Borderless vias |
| US6146996A (en) * | 1998-09-01 | 2000-11-14 | Philips Electronics North America Corp. | Semiconductor device with conductive via and method of making same |
| TW503518B (en) * | 2000-04-19 | 2002-09-21 | Ibm | Interconnect via structure and method |
| US6426286B1 (en) * | 2000-05-19 | 2002-07-30 | Lsi Logic Corporation | Interconnection system with lateral barrier layer |
| US7087997B2 (en) * | 2001-03-12 | 2006-08-08 | International Business Machines Corporation | Copper to aluminum interlayer interconnect using stud and via liner |
| US6686279B2 (en) * | 2002-04-01 | 2004-02-03 | Chartered Semiconductor Manufacturing Limited | Method for reducing gouging during via formation |
| US7196006B2 (en) * | 2004-04-13 | 2007-03-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Manufacturing method for microelectronic device |
| US8299455B2 (en) * | 2007-10-15 | 2012-10-30 | International Business Machines Corporation | Semiconductor structures having improved contact resistance |
| US10468346B2 (en) | 2018-04-09 | 2019-11-05 | International Business Machines Corporation | Advanced interconnects containing an IMT liner |
| US20240258115A1 (en) * | 2021-06-09 | 2024-08-01 | Hitachi High-Tech Corporation | Semiconductor manufacturing method and semiconductor manufacturing apparatus |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5146291A (en) * | 1988-08-31 | 1992-09-08 | Mitsubishi Denki Kabushiki Kaisha | MIS device having lightly doped drain structure |
| JPH0354828A (en) * | 1989-07-24 | 1991-03-08 | Oki Electric Ind Co Ltd | Compound conductor layer of semiconductor device, hole-making process of capacitor using compound conductor layer and compound conductor layer |
| JP3170791B2 (en) * | 1990-09-11 | 2001-05-28 | ソニー株式会社 | Method for etching Al-based material film |
| US5061647A (en) * | 1990-10-12 | 1991-10-29 | Motorola, Inc. | ITLDD transistor having variable work function and method for fabricating the same |
| US5217570A (en) * | 1991-01-31 | 1993-06-08 | Sony Corporation | Dry etching method |
| JPH04288828A (en) * | 1991-03-18 | 1992-10-13 | Sony Corp | Dry etching method |
| US5053351A (en) * | 1991-03-19 | 1991-10-01 | Micron Technology, Inc. | Method of making stacked E-cell capacitor DRAM cell |
| JP3225532B2 (en) * | 1991-03-29 | 2001-11-05 | ソニー株式会社 | Dry etching method |
| US5170243A (en) * | 1991-11-04 | 1992-12-08 | International Business Machines Corporation | Bit line configuration for semiconductor memory |
| US5291053A (en) * | 1992-07-06 | 1994-03-01 | Motorola, Inc. | Semiconductor device having an overlapping memory cell |
| US5670806A (en) * | 1993-12-28 | 1997-09-23 | Lg Semicon Co., Ltd. | Semiconductor memory device |
| US5514622A (en) * | 1994-08-29 | 1996-05-07 | Cypress Semiconductor Corporation | Method for the formation of interconnects and landing pads having a thin, conductive film underlying the plug or an associated contact of via hole |
| JPH08250589A (en) * | 1995-03-14 | 1996-09-27 | Sony Corp | Method for manufacturing semiconductor device |
| JPH08293549A (en) * | 1995-04-25 | 1996-11-05 | Sony Corp | Multilayer wiring contact structure and method of forming the same |
| US5484747A (en) * | 1995-05-25 | 1996-01-16 | United Microelectronics Corporation | Selective metal wiring and plug process |
| US5633781A (en) * | 1995-12-22 | 1997-05-27 | International Business Machines Corporation | Isolated sidewall capacitor having a compound plate electrode |
-
1997
- 1997-04-08 US US08/838,371 patent/US5808364A/en not_active Expired - Fee Related
- 1997-12-16 TW TW086118940A patent/TW379433B/en not_active IP Right Cessation
-
1998
- 1998-02-12 KR KR1019980004129A patent/KR100301644B1/en not_active Expired - Fee Related
- 1998-03-04 MY MYPI98000951A patent/MY117252A/en unknown
- 1998-03-14 SG SG1998000565A patent/SG63828A1/en unknown
- 1998-04-03 JP JP10091982A patent/JP2970757B2/en not_active Expired - Fee Related
- 1998-06-24 US US09/104,074 patent/US5926738A/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR100301644B1 (en) | 2001-10-19 |
| US5808364A (en) | 1998-09-15 |
| KR19980079710A (en) | 1998-11-25 |
| US5926738A (en) | 1999-07-20 |
| JPH10289949A (en) | 1998-10-27 |
| MY117252A (en) | 2004-06-30 |
| JP2970757B2 (en) | 1999-11-02 |
| TW379433B (en) | 2000-01-11 |
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