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SG47836A1 - Light source device for an image processor - Google Patents

Light source device for an image processor

Info

Publication number
SG47836A1
SG47836A1 SG1996004623A SG1996004623A SG47836A1 SG 47836 A1 SG47836 A1 SG 47836A1 SG 1996004623 A SG1996004623 A SG 1996004623A SG 1996004623 A SG1996004623 A SG 1996004623A SG 47836 A1 SG47836 A1 SG 47836A1
Authority
SG
Singapore
Prior art keywords
light source
source device
image processor
processor
image
Prior art date
Application number
SG1996004623A
Other languages
English (en)
Inventor
Hotta Tetsuo
Morita Yasuaki
Sasaki Yasuhiro
Shinano Keizo
Tsuchida Shinsaku
Yanagisawa Toru
Original Assignee
Citizen Watch Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP5197927A external-priority patent/JPH0727510A/ja
Priority claimed from JP14605194A external-priority patent/JP3548601B2/ja
Application filed by Citizen Watch Co Ltd filed Critical Citizen Watch Co Ltd
Publication of SG47836A1 publication Critical patent/SG47836A1/en

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00Television systems
    • H04N7/18Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66Testing of connections, e.g. of plugs or non-disconnectable joints
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/70Testing of connections between components and printed circuit boards
    • G01R31/71Testing of solder joints
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0817Monitoring of soldering processes

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Operations Research (AREA)
  • Analytical Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Non-Portable Lighting Devices Or Systems Thereof (AREA)
SG1996004623A 1993-07-15 1994-07-14 Light source device for an image processor SG47836A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP5197927A JPH0727510A (ja) 1993-07-15 1993-07-15 画像処理装置の光源装置及び基準マークの検出方法
JP14605194A JP3548601B2 (ja) 1994-06-28 1994-06-28 画像処理装置の光源装置

Publications (1)

Publication Number Publication Date
SG47836A1 true SG47836A1 (en) 1998-04-17

Family

ID=26476994

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1996004623A SG47836A1 (en) 1993-07-15 1994-07-14 Light source device for an image processor

Country Status (7)

Country Link
US (1) US5457492A (fr)
EP (1) EP0634892B1 (fr)
KR (1) KR100269731B1 (fr)
DE (1) DE69409299T2 (fr)
HK (1) HK1008460A1 (fr)
SG (1) SG47836A1 (fr)
TW (1) TW364717U (fr)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5758942A (en) * 1995-12-18 1998-06-02 Micron Technology, Inc. Mechanical vision system using selective wavelength and brightness illumination
JP3704157B2 (ja) * 1996-02-19 2005-10-05 アセンブレオン ネムローゼ フェンノートシャップ 電子部品検出用散乱前景照明を具える装置、及びそのような検出装置を設けられた部品取り付け機械
IE80676B1 (en) * 1996-08-02 1998-11-18 M V Research Limited A measurement system
GB2316168B (en) * 1996-08-06 2000-04-12 M V Research Limited A measurement system
US6022124A (en) 1997-08-19 2000-02-08 Ppt Vision, Inc. Machine-vision ring-reflector illumination system and method
JP3471201B2 (ja) * 1997-09-05 2003-12-02 株式会社東芝 撮像モジュール、および撮像装置
US6095661A (en) * 1998-03-19 2000-08-01 Ppt Vision, Inc. Method and apparatus for an L.E.D. flashlight
US7740371B1 (en) 1998-03-19 2010-06-22 Charles A. Lemaire Method and apparatus for pulsed L.E.D. illumination for a camera
DE19851119C2 (de) * 1998-11-06 2001-05-31 Byk Gulden Lomberg Chem Fab Behälter und Vorrichtung zur Blindung der Verabreichung von nicht festen pharmazeutischen Darreichungsformen bei der klinischen Prüfung
JP4147505B2 (ja) * 1999-01-28 2008-09-10 富士機械製造株式会社 保持ヘッド
US6788411B1 (en) 1999-07-08 2004-09-07 Ppt Vision, Inc. Method and apparatus for adjusting illumination angle
DE10009571A1 (de) * 2000-02-29 2001-09-06 Vision Components Ges Fuer Bil Verfahren und Vorrichtung zum Justieren einer Kamera
JP4288553B2 (ja) * 2000-07-25 2009-07-01 富士フイルム株式会社 カメラのストロボ装置
US20020080236A1 (en) * 2000-12-15 2002-06-27 Madsen David D. Camera with improved illuminator
DE10128324A1 (de) * 2001-06-12 2003-01-09 Matsushita Electric Works Europe Ag Gerät zur optischen Prüfung des Inhalts von Blisterpackungen
US6788406B2 (en) * 2001-11-02 2004-09-07 Delaware Capital Formation, Inc. Device and methods of inspecting soldered connections
DE10162270B4 (de) * 2001-12-18 2004-05-13 Siemens Ag Optische Sensorvorrichtung
JP4122187B2 (ja) * 2002-08-08 2008-07-23 松下電器産業株式会社 照明装置、及びこれを備えた認識装置並びに部品実装装置
US20080062424A1 (en) * 2006-09-07 2008-03-13 Mark Richard Shires Compact Ringlight
DE102007043609B4 (de) 2007-09-13 2014-05-28 Ioss Intelligente Optische Sensoren & Systeme Gmbh Integrierte Beleuchtungsvorrichtung für einen optischen Codeleser
TWI380296B (en) * 2008-07-10 2012-12-21 Sunplus Mmedia Inc Optical head that can be easily assembled
US8284305B2 (en) 2008-11-26 2012-10-09 Parata Systems, Llc System and method for acquiring images
TW201423089A (zh) * 2012-12-12 2014-06-16 Utechzone Co Ltd 檢測裝置
CN103438821B (zh) * 2013-09-11 2015-12-02 凯龙蓝烽新材料科技有限公司 一种蜂窝陶瓷载体透光检测装置及方法
JP2017167222A (ja) * 2016-03-14 2017-09-21 マイクロネット株式会社 顕微鏡用照明装置、顕微鏡用照明装置を備える顕微鏡、顕微鏡用照明装置を備える顕微鏡システム

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4028728A (en) * 1976-04-02 1977-06-07 Western Electric Company, Inc. Method of and video system for identifying different light-reflective surface areas on articles
JPS61293657A (ja) * 1985-06-21 1986-12-24 Matsushita Electric Works Ltd 半田付け外観検査方法
JPH0810196B2 (ja) * 1989-11-17 1996-01-31 松下電器産業株式会社 はんだ外観検査装置
EP0459489B1 (fr) * 1990-05-30 1997-01-22 Dainippon Screen Mfg. Co., Ltd. Procédé de lecture d'une image surface à examiner et système de lecture d'image utilisable dans ledit procédé
JP2969401B2 (ja) * 1991-10-29 1999-11-02 株式会社新川 ボンデイングワイヤ検査装置

Also Published As

Publication number Publication date
KR960016562A (ko) 1996-05-22
US5457492A (en) 1995-10-10
DE69409299T2 (de) 1998-07-23
EP0634892B1 (fr) 1998-04-01
DE69409299D1 (de) 1998-05-07
TW364717U (en) 1999-07-11
KR100269731B1 (ko) 2000-10-16
HK1008460A1 (en) 1999-05-07
EP0634892A1 (fr) 1995-01-18

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