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SG144903A1 - Electrical test device for testing electrical test pieces - Google Patents

Electrical test device for testing electrical test pieces

Info

Publication number
SG144903A1
SG144903A1 SG200801056-3A SG2008010563A SG144903A1 SG 144903 A1 SG144903 A1 SG 144903A1 SG 2008010563 A SG2008010563 A SG 2008010563A SG 144903 A1 SG144903 A1 SG 144903A1
Authority
SG
Singapore
Prior art keywords
electrical test
electrical
testing
test device
test pieces
Prior art date
Application number
SG200801056-3A
Other languages
English (en)
Inventor
Gunther Boehm
Peter Stolp
Georg Steidle
Original Assignee
Feinmetall Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Feinmetall Gmbh filed Critical Feinmetall Gmbh
Publication of SG144903A1 publication Critical patent/SG144903A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG200801056-3A 2007-02-08 2008-02-06 Electrical test device for testing electrical test pieces SG144903A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007007741 2007-02-08
DE102008004800A DE102008004800A1 (de) 2007-02-08 2008-01-17 Elektrische Prüfeinrichtung zur Prüfung von elektrischen Prüflingen

Publications (1)

Publication Number Publication Date
SG144903A1 true SG144903A1 (en) 2008-08-28

Family

ID=39597747

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200801056-3A SG144903A1 (en) 2007-02-08 2008-02-06 Electrical test device for testing electrical test pieces

Country Status (6)

Country Link
US (1) US20080191721A1 (zh)
JP (1) JP2008209408A (zh)
CN (1) CN101241159A (zh)
DE (1) DE102008004800A1 (zh)
SG (1) SG144903A1 (zh)
TW (1) TW200908185A (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012016449A1 (de) * 2012-08-16 2014-03-13 Feinmetall Gmbh Prüfkopf für die elektrische Prüfung eines Prüflings
DE102013203536B4 (de) * 2013-03-01 2016-03-31 Multitest Elektronische Systeme Gmbh Vorrichtung zum Prüfen von elektronischen Bauteilen
CN112556621A (zh) * 2020-11-06 2021-03-26 浙江马尔风机有限公司 电机转子轴的检测装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4901013A (en) * 1988-08-19 1990-02-13 American Telephone And Telegraph Company, At&T Bell Laboratories Apparatus having a buckling beam probe assembly
JPH10132855A (ja) * 1996-10-31 1998-05-22 Nec Corp Ｉｃ検査用プローブカード
JP2000227443A (ja) * 1999-02-05 2000-08-15 Mitsubishi Electric Corp プローブカード
US20020118029A1 (en) * 1999-05-14 2002-08-29 Rikihito Yamasaka Probe card and contactor
US7349223B2 (en) * 2000-05-23 2008-03-25 Nanonexus, Inc. Enhanced compliant probe card systems having improved planarity
JP2003107105A (ja) * 2001-09-27 2003-04-09 Mitsubishi Electric Corp プローブカード
US6911835B2 (en) * 2002-05-08 2005-06-28 Formfactor, Inc. High performance probe system
US7102367B2 (en) * 2002-07-23 2006-09-05 Fujitsu Limited Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof
US6897666B2 (en) * 2002-12-31 2005-05-24 Intel Corporation Embedded voltage regulator and active transient control device in probe head for improved power delivery and method
DE102004023987B4 (de) * 2004-05-14 2008-06-19 Feinmetall Gmbh Elektrische Prüfeinrichtung

Also Published As

Publication number Publication date
JP2008209408A (ja) 2008-09-11
CN101241159A (zh) 2008-08-13
US20080191721A1 (en) 2008-08-14
DE102008004800A1 (de) 2008-08-14
TW200908185A (en) 2009-02-16

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