SG10201700452RA - High temperature atomic layer deposition of silicon-containing films - Google Patents
High temperature atomic layer deposition of silicon-containing filmsInfo
- Publication number
- SG10201700452RA SG10201700452RA SG10201700452RA SG10201700452RA SG10201700452RA SG 10201700452R A SG10201700452R A SG 10201700452RA SG 10201700452R A SG10201700452R A SG 10201700452RA SG 10201700452R A SG10201700452R A SG 10201700452RA SG 10201700452R A SG10201700452R A SG 10201700452RA
- Authority
- SG
- Singapore
- Prior art keywords
- silicon
- high temperature
- atomic layer
- layer deposition
- containing films
- Prior art date
Links
Classifications
-
- H10P14/69215—
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
- C23C16/402—Silicon dioxide
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4401—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
- C23C16/4408—Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber by purging residual gases from the reaction chamber or gas lines
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
- C23C16/45536—Use of plasma, radiation or electromagnetic fields
- C23C16/45542—Plasma being used non-continuously during the ALD reactions
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45553—Atomic layer deposition [ALD] characterized by the use of precursors specially adapted for ALD
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- H10P14/63—
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- H10P14/6334—
-
- H10P14/6339—
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- H10P14/6684—
-
- H10P14/6686—
-
- H10P14/6922—
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Electromagnetism (AREA)
- Formation Of Insulating Films (AREA)
- Chemical Vapour Deposition (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Spectroscopy & Molecular Physics (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201662280886P | 2016-01-20 | 2016-01-20 | |
| US15/404,376 US10283348B2 (en) | 2016-01-20 | 2017-01-12 | High temperature atomic layer deposition of silicon-containing films |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG10201700452RA true SG10201700452RA (en) | 2017-08-30 |
Family
ID=57860744
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG10201700452RA SG10201700452RA (en) | 2016-01-20 | 2017-01-19 | High temperature atomic layer deposition of silicon-containing films |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10283348B2 (en) |
| EP (1) | EP3196336A1 (en) |
| JP (2) | JP6856388B2 (en) |
| KR (1) | KR102013412B1 (en) |
| CN (2) | CN106992114B (en) |
| SG (1) | SG10201700452RA (en) |
| TW (2) | TW202018116A (en) |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI663281B (en) * | 2015-06-16 | 2019-06-21 | Versum Materials Us, Llc | Preparation and composition of halidosilane compounds, and container containing same |
| US9786491B2 (en) | 2015-11-12 | 2017-10-10 | Asm Ip Holding B.V. | Formation of SiOCN thin films |
| US9786492B2 (en) | 2015-11-12 | 2017-10-10 | Asm Ip Holding B.V. | Formation of SiOCN thin films |
| KR102378021B1 (en) | 2016-05-06 | 2022-03-23 | 에이에스엠 아이피 홀딩 비.브이. | Formation of SiOC thin films |
| US11591692B2 (en) * | 2017-02-08 | 2023-02-28 | Versum Materials Us, Llc | Organoamino-polysiloxanes for deposition of silicon-containing films |
| US10847529B2 (en) | 2017-04-13 | 2020-11-24 | Asm Ip Holding B.V. | Substrate processing method and device manufactured by the same |
| US10504901B2 (en) | 2017-04-26 | 2019-12-10 | Asm Ip Holding B.V. | Substrate processing method and device manufactured using the same |
| CN110546302B (en) | 2017-05-05 | 2022-05-27 | Asm Ip 控股有限公司 | Plasma enhanced deposition method for controlled formation of oxygen-containing films |
| US10950454B2 (en) * | 2017-08-04 | 2021-03-16 | Lam Research Corporation | Integrated atomic layer passivation in TCP etch chamber and in-situ etch-ALP method |
| KR20190065962A (en) | 2017-12-04 | 2019-06-12 | 에이에스엠 아이피 홀딩 비.브이. | UNIFORM DEPOSITION OF SiOC ON DIELECTRIC AND METAL SURFACES |
| WO2019118019A1 (en) * | 2017-12-12 | 2019-06-20 | Dow Silicones Corporation | Method of depositing a silicon-containing film on a substrate using organo(halo) siloxane precursors |
| US10431695B2 (en) | 2017-12-20 | 2019-10-01 | Micron Technology, Inc. | Transistors comprising at lease one of GaP, GaN, and GaAs |
| US10825816B2 (en) | 2017-12-28 | 2020-11-03 | Micron Technology, Inc. | Recessed access devices and DRAM constructions |
| US10319586B1 (en) * | 2018-01-02 | 2019-06-11 | Micron Technology, Inc. | Methods comprising an atomic layer deposition sequence |
| US10734527B2 (en) | 2018-02-06 | 2020-08-04 | Micron Technology, Inc. | Transistors comprising a pair of source/drain regions having a channel there-between |
| US11521849B2 (en) * | 2018-07-20 | 2022-12-06 | Applied Materials, Inc. | In-situ deposition process |
| US20200040454A1 (en) * | 2018-08-06 | 2020-02-06 | Lam Research Corporation | Method to increase deposition rate of ald process |
| US10985010B2 (en) * | 2018-08-29 | 2021-04-20 | Versum Materials Us, Llc | Methods for making silicon and nitrogen containing films |
| TWI816086B (en) * | 2018-10-05 | 2023-09-21 | 美商慧盛材料美國責任有限公司 | High temperature atomic layer deposition of silicon-containing films |
| US20200131628A1 (en) * | 2018-10-24 | 2020-04-30 | Entegris, Inc. | Method for forming molybdenum films on a substrate |
| KR102157137B1 (en) * | 2018-11-30 | 2020-09-17 | 주식회사 한솔케미칼 | Silicon precursor and fabrication method of silicon-containing thin film using the same |
| CN113169070A (en) | 2018-12-21 | 2021-07-23 | 乔治洛德方法研究和开发液化空气有限公司 | Precursors and processes for depositing Si-containing films using ALD at temperatures of 550 ℃ or greater |
| KR20220042442A (en) | 2019-08-06 | 2022-04-05 | 램 리써치 코포레이션 | Thermal atomic layer deposition of silicon-containing films |
| TWI834919B (en) * | 2019-10-16 | 2024-03-11 | 荷蘭商Asm Ip私人控股有限公司 | Method of topology-selective film formation of silicon oxide |
| KR102789199B1 (en) * | 2019-12-19 | 2025-04-01 | 주식회사 원익아이피에스 | Thin film deposition method |
| JP7227122B2 (en) | 2019-12-27 | 2023-02-21 | 株式会社Kokusai Electric | Substrate processing method, semiconductor device manufacturing method, substrate processing apparatus, and program |
| US12341005B2 (en) | 2020-01-17 | 2025-06-24 | Asm Ip Holding B.V. | Formation of SiCN thin films |
| US12142479B2 (en) | 2020-01-17 | 2024-11-12 | Asm Ip Holding B.V. | Formation of SiOCN thin films |
| JP7386732B2 (en) * | 2020-03-06 | 2023-11-27 | 東京エレクトロン株式会社 | Film forming method |
| JP7254044B2 (en) * | 2020-03-25 | 2023-04-07 | 株式会社Kokusai Electric | Substrate processing method, semiconductor device manufacturing method, substrate processing apparatus, and program |
| KR102364476B1 (en) * | 2020-05-08 | 2022-02-18 | 주식회사 한솔케미칼 | Silicon precursor and fabrication method of silicon-containing thin film using the same |
| WO2021247592A1 (en) * | 2020-06-03 | 2021-12-09 | Lam Research Corporation | In-feature wet etch rate ratio reduction |
| TWI797640B (en) | 2020-06-18 | 2023-04-01 | 法商液態空氣喬治斯克勞帝方法研究開發股份有限公司 | Silicon-based self-assembling monolayer compositions and surface preparation using the same |
| US12412742B2 (en) | 2020-07-28 | 2025-09-09 | Lam Research Corporation | Impurity reduction in silicon-containing films |
| US20240170283A1 (en) * | 2021-03-02 | 2024-05-23 | Versum Materials Us, Llc | Selective deposition of silicon dielectric film |
| JP2024524553A (en) | 2021-07-09 | 2024-07-05 | ラム リサーチ コーポレーション | Plasma-enhanced atomic layer deposition of silicon-containing films |
| US12382633B2 (en) | 2022-04-26 | 2025-08-05 | Micron Technology, Inc. | Microelectronic devices including a selectively removable cap dielectric material, methods of forming the microelectronic devices, and related systems |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3642851A (en) | 1968-12-27 | 1972-02-15 | Union Carbide Corp | Preparation of linear halosiloxanes and compounds derived therefrom |
| JP3229419B2 (en) * | 1993-02-10 | 2001-11-19 | ダウ・コ−ニング・コ−ポレ−ション | Method for forming silicon oxide film |
| JPH08165294A (en) | 1994-12-15 | 1996-06-25 | Shin Etsu Chem Co Ltd | Method for producing 1,3-dichloro-1,1,3,3-tetramethyldisiloxane |
| US5989998A (en) * | 1996-08-29 | 1999-11-23 | Matsushita Electric Industrial Co., Ltd. | Method of forming interlayer insulating film |
| US6013740A (en) | 1998-08-27 | 2000-01-11 | Dow Corning Corporation | Sheet and tube polymers with pendant siloxane groups |
| KR100505668B1 (en) | 2002-07-08 | 2005-08-03 | 삼성전자주식회사 | Method for forming silicon dioxide layer by atomic layer deposition |
| TWI262960B (en) * | 2003-02-27 | 2006-10-01 | Samsung Electronics Co Ltd | Method for forming silicon dioxide film using siloxane |
| US7084076B2 (en) * | 2003-02-27 | 2006-08-01 | Samsung Electronics, Co., Ltd. | Method for forming silicon dioxide film using siloxane |
| US7022864B2 (en) * | 2003-07-15 | 2006-04-04 | Advanced Technology Materials, Inc. | Ethyleneoxide-silane and bridged silane precursors for forming low k films |
| JP2006060066A (en) * | 2004-08-20 | 2006-03-02 | Mitsubishi Electric Corp | Method and apparatus for forming silicon oxide film |
| KR20060019868A (en) * | 2004-08-30 | 2006-03-06 | 삼성코닝 주식회사 | Method for manufacturing insulating film using double organosiloxane precursor |
| JP5019742B2 (en) * | 2005-01-31 | 2012-09-05 | 東ソー株式会社 | Cyclic siloxane compound, Si-containing film forming material, and use thereof |
| JP4341560B2 (en) * | 2005-01-31 | 2009-10-07 | 東ソー株式会社 | Si-containing film forming material, Si-containing film, method for producing Si-containing film, and semiconductor device |
| US8084294B2 (en) * | 2005-02-18 | 2011-12-27 | Nec Corporation | Method of fabricating organic silicon film, semiconductor device including the same, and method of fabricating the semiconductor device |
| KR100660890B1 (en) | 2005-11-16 | 2006-12-26 | 삼성전자주식회사 | Silicon dioxide film formation method using ALD |
| US7498273B2 (en) * | 2006-05-30 | 2009-03-03 | Applied Materials, Inc. | Formation of high quality dielectric films of silicon dioxide for STI: usage of different siloxane-based precursors for harp II—remote plasma enhanced deposition processes |
| US8129555B2 (en) * | 2008-08-12 | 2012-03-06 | Air Products And Chemicals, Inc. | Precursors for depositing silicon-containing films and methods for making and using same |
| US7935643B2 (en) * | 2009-08-06 | 2011-05-03 | Applied Materials, Inc. | Stress management for tensile films |
| JP2011165657A (en) * | 2010-01-15 | 2011-08-25 | Semiconductor Energy Lab Co Ltd | Electricity storage device |
| US8592294B2 (en) * | 2010-02-22 | 2013-11-26 | Asm International N.V. | High temperature atomic layer deposition of dielectric oxides |
| US9460912B2 (en) * | 2012-04-12 | 2016-10-04 | Air Products And Chemicals, Inc. | High temperature atomic layer deposition of silicon oxide thin films |
| JP6415808B2 (en) | 2012-12-13 | 2018-10-31 | 株式会社Kokusai Electric | Semiconductor device manufacturing method, substrate processing apparatus, and program |
| US9796739B2 (en) * | 2013-06-26 | 2017-10-24 | Versum Materials Us, Llc | AZA-polysilane precursors and methods for depositing films comprising same |
| US20150275355A1 (en) | 2014-03-26 | 2015-10-01 | Air Products And Chemicals, Inc. | Compositions and methods for the deposition of silicon oxide films |
| JP6545093B2 (en) | 2015-12-14 | 2019-07-17 | 株式会社Kokusai Electric | Semiconductor device manufacturing method, substrate processing apparatus and program |
-
2017
- 2017-01-12 US US15/404,376 patent/US10283348B2/en active Active
- 2017-01-19 TW TW107120415A patent/TW202018116A/en unknown
- 2017-01-19 TW TW106101964A patent/TWI639723B/en active
- 2017-01-19 SG SG10201700452RA patent/SG10201700452RA/en unknown
- 2017-01-20 CN CN201710047967.9A patent/CN106992114B/en active Active
- 2017-01-20 EP EP17152346.7A patent/EP3196336A1/en active Pending
- 2017-01-20 JP JP2017008324A patent/JP6856388B2/en active Active
- 2017-01-20 CN CN202110169653.2A patent/CN112899648A/en active Pending
- 2017-01-20 KR KR1020170009657A patent/KR102013412B1/en active Active
-
2019
- 2019-06-18 JP JP2019112867A patent/JP7092709B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP6856388B2 (en) | 2021-04-07 |
| TW201736633A (en) | 2017-10-16 |
| KR20170087425A (en) | 2017-07-28 |
| TW202018116A (en) | 2020-05-16 |
| CN106992114A (en) | 2017-07-28 |
| US20170207082A1 (en) | 2017-07-20 |
| US10283348B2 (en) | 2019-05-07 |
| CN106992114B (en) | 2021-02-19 |
| KR102013412B1 (en) | 2019-08-22 |
| JP7092709B2 (en) | 2022-06-28 |
| EP3196336A1 (en) | 2017-07-26 |
| JP2017130665A (en) | 2017-07-27 |
| JP2019186562A (en) | 2019-10-24 |
| TWI639723B (en) | 2018-11-01 |
| CN112899648A (en) | 2021-06-04 |
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