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SE0500490L - Detektor för joniserande strålning - Google Patents

Detektor för joniserande strålning

Info

Publication number
SE0500490L
SE0500490L SE0500490A SE0500490A SE0500490L SE 0500490 L SE0500490 L SE 0500490L SE 0500490 A SE0500490 A SE 0500490A SE 0500490 A SE0500490 A SE 0500490A SE 0500490 L SE0500490 L SE 0500490L
Authority
SE
Sweden
Prior art keywords
detector
layer
ionising radiation
incident
active
Prior art date
Application number
SE0500490A
Other languages
English (en)
Inventor
Bert Junno
Jan Staalemark
Original Assignee
Nm Spintronics Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SE0402074A external-priority patent/SE0402074D0/sv
Application filed by Nm Spintronics Ab filed Critical Nm Spintronics Ab
Priority to SE0500490A priority Critical patent/SE0500490L/sv
Priority to US11/660,885 priority patent/US20080258072A1/en
Priority to JP2007529768A priority patent/JP2008511163A/ja
Priority to EP05774808A priority patent/EP1789817A1/en
Priority to KR1020077006757A priority patent/KR20070073755A/ko
Priority to PCT/SE2005/001228 priority patent/WO2006022583A1/en
Publication of SE0500490L publication Critical patent/SE0500490L/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/301—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices being sensitive to very short wavelength, e.g. being sensitive to X-rays, gamma-rays or corpuscular radiation
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1892—Direct radiation image sensors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
SE0500490A 2004-08-23 2005-03-03 Detektor för joniserande strålning SE0500490L (sv)

Priority Applications (6)

Application Number Priority Date Filing Date Title
SE0500490A SE0500490L (sv) 2004-08-23 2005-03-03 Detektor för joniserande strålning
US11/660,885 US20080258072A1 (en) 2004-08-23 2005-08-23 Detector for Ionizing Radiation
JP2007529768A JP2008511163A (ja) 2004-08-23 2005-08-23 電離放射線の検出器
EP05774808A EP1789817A1 (en) 2004-08-23 2005-08-23 Detector for ionizing radiation
KR1020077006757A KR20070073755A (ko) 2004-08-23 2005-08-23 전리 방사선 검출기
PCT/SE2005/001228 WO2006022583A1 (en) 2004-08-23 2005-08-23 Detector for ionizing radiation

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE0402074A SE0402074D0 (sv) 2004-08-23 2004-08-23 Detektor för joniserande strålning
SE0500490A SE0500490L (sv) 2004-08-23 2005-03-03 Detektor för joniserande strålning

Publications (1)

Publication Number Publication Date
SE0500490L true SE0500490L (sv) 2006-02-24

Family

ID=35967723

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0500490A SE0500490L (sv) 2004-08-23 2005-03-03 Detektor för joniserande strålning

Country Status (6)

Country Link
US (1) US20080258072A1 (sv)
EP (1) EP1789817A1 (sv)
JP (1) JP2008511163A (sv)
KR (1) KR20070073755A (sv)
SE (1) SE0500490L (sv)
WO (1) WO2006022583A1 (sv)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008148150A1 (en) 2007-06-04 2008-12-11 University Of Wollongong Radiation sensor and dosimeter
JP2011146541A (ja) * 2010-01-14 2011-07-28 Canon Inc Ｘ線センサおよびその製造方法
JP6040248B2 (ja) * 2011-09-21 2016-12-07 セルン − ヨーロピアン オーガナイゼーション フォー ニュークリア リサーチＣＥＲＮ − Ｅｕｒｏｐｅａｎ Ｏｒｇａｎｉｚａｔｉｏｎ ｆｏｒ Ｎｕｃｌｅａｒ Ｒｅｓｅａｒｃｈ ピクセル検出器、コンプトン・カメラ、陽子線治療デバイス、中性子イメージングデバイス、Ｘ線偏光計及びγ線偏光計
KR101487710B1 (ko) * 2013-07-23 2015-01-29 한국원자력연구원 방사선 영상 센서 및 그 제조 방법
WO2016010292A1 (en) * 2014-07-15 2016-01-21 Vieworks Co., Ltd. Radiation detector
CZ29250U1 (cs) * 2016-01-29 2016-03-08 Advacam S.R.O. Vrstvený pixelový detektor ionizujícího záření
EP3690490A1 (en) * 2019-02-04 2020-08-05 ams International AG X-ray detector component, x-ray detection module, imaging device and method for manufacturing an x-ray detector component

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4873439A (en) * 1988-06-27 1989-10-10 Massachusetts Institute Of Technology X-ray detector
US5182624A (en) * 1990-08-08 1993-01-26 Minnesota Mining And Manufacturing Company Solid state electromagnetic radiation detector fet array
US5886353A (en) * 1995-04-21 1999-03-23 Thermotrex Corporation Imaging device
JP2001210855A (ja) * 2000-01-27 2001-08-03 Sharp Corp 二次元画像検出器
JP4532782B2 (ja) * 2000-07-04 2010-08-25 キヤノン株式会社 放射線撮像装置及びシステム
US6624441B2 (en) * 2002-02-07 2003-09-23 Eagle-Picher Technologies, Llc Homoepitaxial layers of p-type zinc oxide and the fabrication thereof

Also Published As

Publication number Publication date
KR20070073755A (ko) 2007-07-10
EP1789817A1 (en) 2007-05-30
JP2008511163A (ja) 2008-04-10
WO2006022583A1 (en) 2006-03-02
US20080258072A1 (en) 2008-10-23

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