RU2000127414A - DEVICE FOR MEASURING THERMAL RESISTANCE OF TRANSISTORS - Google Patents
DEVICE FOR MEASURING THERMAL RESISTANCE OF TRANSISTORSInfo
- Publication number
- RU2000127414A RU2000127414A RU2000127414/09A RU2000127414A RU2000127414A RU 2000127414 A RU2000127414 A RU 2000127414A RU 2000127414/09 A RU2000127414/09 A RU 2000127414/09A RU 2000127414 A RU2000127414 A RU 2000127414A RU 2000127414 A RU2000127414 A RU 2000127414A
- Authority
- RU
- Russia
- Prior art keywords
- counter
- terminal
- circuit
- transistors
- output
- Prior art date
Links
- 230000015572 biosynthetic process Effects 0.000 claims 1
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| RU2000127414A RU2185634C1 (en) | 2000-10-31 | 2000-10-31 | Device measuring thermal resistance of transistors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| RU2000127414A RU2185634C1 (en) | 2000-10-31 | 2000-10-31 | Device measuring thermal resistance of transistors |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| RU2185634C1 RU2185634C1 (en) | 2002-07-20 |
| RU2000127414A true RU2000127414A (en) | 2002-10-10 |
Family
ID=20241671
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| RU2000127414A RU2185634C1 (en) | 2000-10-31 | 2000-10-31 | Device measuring thermal resistance of transistors |
Country Status (1)
| Country | Link |
|---|---|
| RU (1) | RU2185634C1 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2308710C2 (en) * | 2005-05-27 | 2007-10-20 | Общество с ограниченной ответственностью "Инвестиционная строительная компания" | Method and device for measuring heat resistance |
| RU2330270C2 (en) * | 2006-05-31 | 2008-07-27 | Елена Вячеславовна Абрамова | Device and calculation method of thermal resistivity |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2392631C1 (en) * | 2009-06-09 | 2010-06-20 | Государственное образовательное учреждение высшего профессионального образования Казанский государственный технический университет им. А.Н. Туполева | Device for measurement of heat resistance transition-housing of semi-conductor device |
| RU2572794C1 (en) * | 2014-11-05 | 2016-01-20 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Ульяновский государственный технический университет" | Method to measure thermal junction-to-case resistance of high-capacity mis transistors |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2592489B1 (en) * | 1985-12-27 | 1988-02-12 | Bull Sa | METHOD AND DEVICE FOR MEASURING THE THERMAL RESISTANCE OF AN ELEMENT SUCH AS AN EQUIPMENT OF HIGH DENSITY INTEGRATED CIRCUITS. |
| RU2087919C1 (en) * | 1994-08-15 | 1997-08-20 | Ульяновский государственный технический университет | Device for measuring junction-to-case thermal resistance of semiconductor diodes |
-
2000
- 2000-10-31 RU RU2000127414A patent/RU2185634C1/en active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2308710C2 (en) * | 2005-05-27 | 2007-10-20 | Общество с ограниченной ответственностью "Инвестиционная строительная компания" | Method and device for measuring heat resistance |
| RU2330270C2 (en) * | 2006-05-31 | 2008-07-27 | Елена Вячеславовна Абрамова | Device and calculation method of thermal resistivity |
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