KR920008839A - SiNx/a-Si 계면 형성방법 - Google Patents
SiNx/a-Si 계면 형성방법 Download PDFInfo
- Publication number
- KR920008839A KR920008839A KR1019900016602A KR900016602A KR920008839A KR 920008839 A KR920008839 A KR 920008839A KR 1019900016602 A KR1019900016602 A KR 1019900016602A KR 900016602 A KR900016602 A KR 900016602A KR 920008839 A KR920008839 A KR 920008839A
- Authority
- KR
- South Korea
- Prior art keywords
- sinx
- film
- formation method
- forming
- interface formation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0321—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
- H10D30/6731—Top-gate only TFTs
-
- H10P14/3411—
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- H10P14/6532—
-
- H10P14/69433—
Landscapes
- Formation Of Insulating Films (AREA)
- Thin Film Transistor (AREA)
Abstract
Description
Claims (2)
- SiNx막 위에 a-Si막을 형성하는 데 있어서, SiNx막을 형성한 뒤, 플라즈마화한 NH3가스 분위기에서 SiNx막의 표면을 먼저 활성화 시킨 다음에 형성하는 것을 특징으로 하는 SiNx/a-Si 계면 형성방법.
- 제 1 항에 있어서, 상기 NH3가스의 플라즈마화를 SiNx막 형성 후 a-Si막 향상을 위해 온도를 낮추는 동안 행하는 것을 특징으로 하는 SiNx/a-Si 계면 형성방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019900016602A KR930009547B1 (ko) | 1990-10-16 | 1990-10-16 | SiNx/a-Si 계면 형성 방법 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019900016602A KR930009547B1 (ko) | 1990-10-16 | 1990-10-16 | SiNx/a-Si 계면 형성 방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR920008839A true KR920008839A (ko) | 1992-05-28 |
| KR930009547B1 KR930009547B1 (ko) | 1993-10-06 |
Family
ID=19304825
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019900016602A Expired - Fee Related KR930009547B1 (ko) | 1990-10-16 | 1990-10-16 | SiNx/a-Si 계면 형성 방법 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR930009547B1 (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20170001210U (ko) | 2015-09-25 | 2017-04-04 | 박성진 | 다용도 물품 정리대 |
-
1990
- 1990-10-16 KR KR1019900016602A patent/KR930009547B1/ko not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20170001210U (ko) | 2015-09-25 | 2017-04-04 | 박성진 | 다용도 물품 정리대 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR930009547B1 (ko) | 1993-10-06 |
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