KR900004564B1 - Composition of paste capacitor - Google Patents
Composition of paste capacitor Download PDFInfo
- Publication number
- KR900004564B1 KR900004564B1 KR1019880003552A KR880003552A KR900004564B1 KR 900004564 B1 KR900004564 B1 KR 900004564B1 KR 1019880003552 A KR1019880003552 A KR 1019880003552A KR 880003552 A KR880003552 A KR 880003552A KR 900004564 B1 KR900004564 B1 KR 900004564B1
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- KR
- South Korea
- Prior art keywords
- frit
- paste
- composition
- low
- temperature
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Conductive Materials (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Ceramic Capacitors (AREA)
Abstract
내용 없음.No content.
Description
본 발명은 전자부품용 및 파인 세라믹(FINE CERAMIC)에 사용되는 전극형성재인 페이스트(PASTE)에 융제로서 첨가되는 조성물인 프릿트(FRIT)에 관한 것이다.The present invention relates to a frit (FRIT), which is a composition added as a flux to a paste (PASTE), which is an electrode forming material used for electronic parts and fine ceramics (FINE CERAMIC).
페이스트(PASTE)는 전자부품용 세라믹재인 전극형성재로서, 저온에서 소성시키고자 하는 추세에 따라 이에 맞는 용도 및 특성의 페이스트가 개발중에 있다.Paste (PASTE) is an electrode forming material that is a ceramic material for electronic components, according to the trend to be fired at a low temperature, a paste having a use and characteristic corresponding thereto is being developed.
이러한 저온 소성의 목적을 달성하기 위해서는 여러방법이 있겠으나, 본 발명은 상기 페이스트에 융제역할의 프릿트(FRIT)를 첨가하여 전자부품(RESISTOR, MLCC, CERAMIC CONDENSER)의 귀금속 페이스트의 화도를 저온에서 소성시킬 수 있도록 한 것이다.In order to achieve the purpose of the low-temperature firing, there are various methods, but the present invention adds a frit frit to the paste to improve the degree of noble metal paste of electronic components (RESISTOR, MLCC, CERAMIC CONDENSER) at low temperature. It is to be fired.
이러한 페이스트에 대한 종래의 기술로 고화도의 프릿트는 제조되어 있지만, 프릿트는 저화도 및 융착관계의 기술난이점 때문에 개발되어 있지 않다.Although a high degree of frit has been produced by conventional techniques for such pastes, frit has not been developed due to technical difficulties of low degree of melting and fusion.
더구나, 전극재에 사용하기 위한 프릿트의 조건은 융착성외에도 핀호울(PINHOLE), 버블(BUBBLE)등이 발생하지 않아야 함은 물론 페이스트와 접착성이 용이 해야하고 혼합시 균일한 조성물로 만들어져야 하는 이유도 개발의 저해요소가 되어왔던 것이다.In addition, the conditions of the frit for use in the electrode material should not only generate pinholes, bubbles, etc. in addition to the adhesiveness, but also should be easily adhered to the paste and made of a uniform composition upon mixing. The reason for this has also been a deterrent to development.
이에 본 발명에서는 페이스트의 화도를 저온에서 소성시키려는 저화도의 프릿트를 개발하여 이를 페이스트에 융제로서 첨가하면 원하는 페이스트를 얻을 수 있고, 이 프릿트는 페이스트의 온도와 저화도 프릿트와의 접착성을 향상시키고, 융착시 매끄러운 표면을 갖게되며, 열팽창 계수가 안정됨을 물론 이중 분리현상이 없어 표면처리가 우수한 효과를 내게된다.Accordingly, in the present invention, the desired paste can be obtained by developing a low frit frit for baking the paste at a low temperature and adding it as a flux to the paste, and the frit has adhesive properties between the paste temperature and the low frit frit. It improves and has a smooth surface when fused, and the coefficient of thermal expansion is stabilized, and there is no double separation phenomenon, so the surface treatment has an excellent effect.
이하 본 발명의 1실시예를 들어 프릿트의 개발 과정을 상술하면 다음과 같다.Hereinafter, the development process of the frit will be described as an example of the present invention.
[실시예]EXAMPLE
전자부품용 저화도 프릿트의 조성을 위한 용융조건은Melting conditions for the composition of low frit frits for electronic components
①용융전 파우더(POWDER)의 입도는 300-350mesh 40%, 420-450mesh 60%.① The particle size of powder before melting is 300-350mesh 40%, 420-450mesh 60%.
②용융온도는 250°±5에서 실시하며 과열이 되지 않도록 온도를 유지 시킨다.② Melting temperature is performed at 250 ° ± 5 and maintain temperature to prevent overheating.
③SiO2는 350-400mesh 80%, 300-350mesh 20%의 입자를 사용한다.③SiO 2 uses particles of 350-400mesh 80% and 300-350mesh 20%.
상기한 조건하에서 저화도 프릿트 조성비는,Under the above conditions, the low frit frit composition ratio is
를 용융한 후 파우더를 제조하여 페이스트 80±5%에 프릿트 20±5를 혼합조성 시킨다.After melting, prepare a powder and mix and mix frit 20 ± 5 in paste 80 ± 5%.
여기서, 전자부품용 저화도 프릿트의 특징은 800℃ 부근에서 완전용융되어 버블(BUBBLE) 크랙(CRACK)의 발생을 막아야 하고, 급속냉각에도 견고해야 하므로 프릿트(FRIT)용융조건 온도를 1250℃±5°로 하여 PbO의 손상을 적도록 한 것이다.Here, the characteristics of the low-temperature frit for electronic components are to be completely melted at around 800 ° C to prevent the occurrence of bubble cracks and to be robust to rapid cooling, so the frit melting temperature is 1250 ° C. The damage of PbO is made less by ± 5 °.
또한, 용융전 파우더의 입자를 325mesh 이하가 되도록하여 버블 및 크랙등의 발생소지를 없애고, 진동혼합기(VIBRO MILL)를 사용하여 72시간 내지 80시간 동안 완전 혼합한다.In addition, the particles of the powder before melting to 325mesh or less to eliminate the occurrence of bubbles and cracks, using a vibrating mixer (VIBRO MILL) is completely mixed for 72 to 80 hours.
상기와 같은 조건하의 조성물(FRIT)을 전자부품에 적용시키므로서 다음과 같은 효과를 얻을 수 있다.The following effects can be obtained by applying the composition (FRIT) under the above conditions to the electronic component.
즉, 페이스트의 온도와 저화도 프릿트와의 접착성이 좋고 융착시의 표면이 매끄러우며 열팽창계수가 안정함은 물론 이중 분리현상이 없어 표면 처리가 우수하다.That is, the adhesion between the temperature of the paste and the low frit is good, the surface at the time of fusion is smooth, the coefficient of thermal expansion is stable, and the surface treatment is excellent because there is no double separation phenomenon.
또한, 조성비 변화의 안정화로 페이스트로 사용시 점성 및 농도가 개선되고 작업성이 향상되는 효과도 얻을 수 있다.In addition, it is possible to obtain an effect of improving viscosity and concentration and improving workability when used as a paste by stabilizing the change in composition ratio.
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019880003552A KR900004564B1 (en) | 1988-03-31 | 1988-03-31 | Composition of paste capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019880003552A KR900004564B1 (en) | 1988-03-31 | 1988-03-31 | Composition of paste capacitor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR890015309A KR890015309A (en) | 1989-10-28 |
| KR900004564B1 true KR900004564B1 (en) | 1990-06-29 |
Family
ID=19273283
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019880003552A Expired KR900004564B1 (en) | 1988-03-31 | 1988-03-31 | Composition of paste capacitor |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR900004564B1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102583890B1 (en) * | 2016-02-18 | 2023-10-05 | 삼성전자주식회사 | Electronic device with thermal spreader |
-
1988
- 1988-03-31 KR KR1019880003552A patent/KR900004564B1/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| KR890015309A (en) | 1989-10-28 |
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