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KR870005236A - 측각기 - Google Patents

측각기 Download PDF

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Publication number
KR870005236A
KR870005236A KR860009422A KR860009422A KR870005236A KR 870005236 A KR870005236 A KR 870005236A KR 860009422 A KR860009422 A KR 860009422A KR 860009422 A KR860009422 A KR 860009422A KR 870005236 A KR870005236 A KR 870005236A
Authority
KR
South Korea
Prior art keywords
rod
goniometer
housing
staging
adjustable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR860009422A
Other languages
English (en)
Inventor
골도우스키 마이클
Original Assignee
잭 오이셔
노스 아메리칸 필립스 코포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 잭 오이셔, 노스 아메리칸 필립스 코포레이션 filed Critical 잭 오이셔
Publication of KR870005236A publication Critical patent/KR870005236A/ko
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C1/00—Measuring angles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20016—Goniometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)

Abstract

내용 없음

Description

측각기
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 새로운 측각기의 측정면도.
제1A도는 제1도에서 A-A를 따라 절취한 단면도.
제1B도는 제1도에서 B-B를 따라 절취한 단면도.
제3도는 본 발명의 부에 대한 구성을 도시.
제3A도는 제3도의 C-C를 따라 절취한 단면도.
* 도면의 주요부분에 대한 부호의 설명
1 : 측각기, 2 : 외팔보 막대, 3 : 리이드 나사, 4 : 실린더, 6 : 작동기, 8 : 중심나사, 9 : 서라운딩 나사, 10 : 하우징, 15 : 견인 나사, 17 : 슬롯

Claims (2)

  1. 외팔보 막대, 상기 막대를 둘러싸며 장착된 견고한 하우징, 0의 병기 운동으로 상기 막대의 각 편향만을 달성하기 위한 위치에서 상기 하우징에 힘을 가하는 작동기 수단을 구비하는 것을 특징으로 하는 측각기.
  2. 제1항에 있어서,
    상대 막대는 수직으로 조절가능한 것을 특징으로 하는 측각기.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR860009422A 1985-11-12 1986-11-08 측각기 Withdrawn KR870005236A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US79710585A 1985-11-12 1985-11-12
US797,105 1985-11-12

Publications (1)

Publication Number Publication Date
KR870005236A true KR870005236A (ko) 1987-06-05

Family

ID=25169919

Family Applications (1)

Application Number Title Priority Date Filing Date
KR860009422A Withdrawn KR870005236A (ko) 1985-11-12 1986-11-08 측각기

Country Status (6)

Country Link
EP (1) EP0223297A3 (ko)
JP (1) JPS62184340A (ko)
KR (1) KR870005236A (ko)
CN (1) CN1007836B (ko)
AU (1) AU6496786A (ko)
CA (1) CA1257714A (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5519234A (en) * 1991-02-25 1996-05-21 Symetrix Corporation Ferroelectric dielectric memory cell can switch at least giga cycles and has low fatigue - has high dielectric constant and low leakage current
DE19900346A1 (de) * 1999-01-07 2000-07-13 Europ Lab Molekularbiolog Präzisions-Probendrehvorrichtung

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1179237A (en) * 1966-03-30 1970-01-28 Ass Elect Ind Improvements relating to X-Ray Analysers.
NL6908565A (ko) * 1968-06-27 1969-12-30
GB8325544D0 (en) * 1983-09-23 1983-10-26 Howe S H Orienting crystals
DE3379075D1 (en) * 1983-10-12 1989-03-02 Philips Nv X-ray examination apparatus

Also Published As

Publication number Publication date
AU6496786A (en) 1987-05-14
CN1007836B (zh) 1990-05-02
EP0223297A2 (en) 1987-05-27
JPS62184340A (ja) 1987-08-12
EP0223297A3 (en) 1988-07-27
CN86107651A (zh) 1987-05-20
CA1257714A (en) 1989-07-18

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 19861108

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid