KR850004806A - 양성 포토레지스트 박리조성물(positive photoresist stripping composition) - Google Patents
양성 포토레지스트 박리조성물(positive photoresist stripping composition) Download PDFInfo
- Publication number
- KR850004806A KR850004806A KR1019840008148A KR840008148A KR850004806A KR 850004806 A KR850004806 A KR 850004806A KR 1019840008148 A KR1019840008148 A KR 1019840008148A KR 840008148 A KR840008148 A KR 840008148A KR 850004806 A KR850004806 A KR 850004806A
- Authority
- KR
- South Korea
- Prior art keywords
- pyrrolidone
- composition
- carbon atoms
- cycloalkyl
- photoresist
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
- G03F7/422—Stripping or agents therefor using liquids only
- G03F7/425—Stripping or agents therefor using liquids only containing mineral alkaline compounds; containing organic basic compounds, e.g. quaternary ammonium compounds; containing heterocyclic basic compounds containing nitrogen
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Detergent Compositions (AREA)
- Paints Or Removers (AREA)
- Saccharide Compounds (AREA)
- Pharmaceuticals Containing Other Organic And Inorganic Compounds (AREA)
Abstract
Description
Claims (6)
- 구조의 비스-하이드록시 알키피페라진을 구성하는 그룹중 최소한 하나 또한 상기식에서 1-6탄소원자의 가지사슬을 갖는 것 및 5-6탄소 사이크로알킬환된 화합물(여기서 시클로알킬은 -(CH2)n-으로 치환된)등과 같은 피페라진 유도체를 구성하는 그룹에서 선택된 최소한개의 피페라진 및(b) R이 1-6탄소원자의 알킬그룹 혹은 5 혹은 6원자고리시크로알킬인식의 알킬 혹은 시크로알킬-2-피보리돈(pyrvolidone) 및 아미노알킬 및 1-6탄소원자의 하이드록시알킬 혹은 약 90-0중량%의 량으로 (a)내에 혼합될 수 있는 극성의 유기화합물을 포함하는 것을 특징으로 하는 포토레지스트를 함유하는 기질표면으로부터 유기양성 포토레지스트조성물을 제거하기 위한 박리조성물.
- (a)가 N-아미노에칠피페라진 및 N-하이드록시에칠피페라진의 혼합물을 포함하는 것을 특징으로 하는 청구범위 1의 박리조성물.
- (b)는 R이 1-6탄소원자의 알킬그룹 : 알킬그룹이 1-6탄소원자를 포함하는 아미노알킬-N-피로리돈 및 하이드록시알킬-2-피로리돈 : 디에칠렌그리콜의 모노에칠에테르, 디에칠렌그리콜의 노모부틸에테르, 디에치렌그리콜모밀모포린의 모노핵실에테르 및 이들의 혼합물인식의 알킬 혹은 시크로알킬-2-피로리돈을 구성하는 그룹에서 선택된 것을 특징으로 하는 청구범위 1의 박리조성물.
- (b) 구성요소는 N-메칠-2-피로리돈을 포함하는 것을 특징으로 하는 청구범위 2의 박리조성물.
- (a)는 N-아미노에칠피페라진 및 N-하이드록시에칠피페라진혼합물을 각각 1 : 1-10 : 1 정량비율로 약 30중량%의 량으로 포함하며, (b)는 약70중량%의 량으로 N-메칠-2-피로리돈을 포함하는 것을 특징으로 하는 청구범위 2의 박리조성물.
- 상기 포토레지스트가 제거될 때까지 약 15℃-160℃의 온도로 청구범위 1의 조성물로써 포토레지스트층을 접촉하는 것을 포함하는, 상기 포토레지스트층을 가진 기질표면으로부터 양성포토레지스트를 박리하는 방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US56333683A | 1983-12-20 | 1983-12-20 | |
| US563336 | 1983-12-20 | ||
| US563,336 | 1983-12-20 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR850004806A true KR850004806A (ko) | 1985-07-27 |
| KR860001841B1 KR860001841B1 (ko) | 1986-10-24 |
Family
ID=24250099
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019840008148A Expired KR860001841B1 (ko) | 1983-12-20 | 1984-12-20 | 양성 포토레지스트 박리조성물(positive photoresist stripping composition) |
Country Status (6)
| Country | Link |
|---|---|
| EP (1) | EP0145973B1 (ko) |
| JP (1) | JPS60131535A (ko) |
| KR (1) | KR860001841B1 (ko) |
| AT (1) | ATE56546T1 (ko) |
| CA (1) | CA1240907A (ko) |
| DE (1) | DE3483201D1 (ko) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6250831A (ja) * | 1985-08-30 | 1987-03-05 | Japan Synthetic Rubber Co Ltd | レジスト用剥離液組成物 |
| DE3537441A1 (de) * | 1985-10-22 | 1987-04-23 | Hoechst Ag | Loesemittel zum entfernen von photoresists |
| IE59971B1 (en) * | 1986-11-10 | 1994-05-04 | Baker J T Inc | Stripping compositions and their use for stripping resists from substrates |
| US4824763A (en) * | 1987-07-30 | 1989-04-25 | Ekc Technology, Inc. | Triamine positive photoresist stripping composition and prebaking process |
| JP2759462B2 (ja) * | 1988-11-11 | 1998-05-28 | ナガセ電子化学株式会社 | 水性剥離剤組成物 |
| US6127101A (en) * | 1999-10-12 | 2000-10-03 | Air Products And Chemicals, Inc. | Alkylated aminoalkylpiperazine surfactants and their use in photoresist developers |
| JP2002244310A (ja) * | 2001-02-21 | 2002-08-30 | Tosoh Corp | レジスト剥離剤 |
| KR101082018B1 (ko) * | 2004-05-07 | 2011-11-10 | 주식회사 동진쎄미켐 | 레지스트 제거용 조성물 |
| CN1950755B (zh) * | 2004-05-07 | 2011-05-11 | 株式会社东进世美肯 | 用于去除光刻胶的组合物 |
| KR101136026B1 (ko) | 2004-09-24 | 2012-04-18 | 주식회사 동진쎄미켐 | 포토레지스트용 박리제 및 상기 박리제를 이용한 박막트랜지스터 표시판의 제조 방법 |
| JP5279921B2 (ja) * | 2009-11-26 | 2013-09-04 | エルジー・ケム・リミテッド | フォトレジストストリッパー組成物及びこれを利用したフォトレジストの剥離方法 |
| TWI405053B (zh) * | 2009-11-27 | 2013-08-11 | Lg Chemical Ltd | 光阻剝離組成物及剝離光阻之方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4090879A (en) * | 1976-11-15 | 1978-05-23 | Gaf Corporation | Developing solutions for 2-component diazo-type materials |
| US4395479A (en) * | 1981-09-23 | 1983-07-26 | J. T. Baker Chemical Company | Stripping compositions and methods of stripping resists |
| US4428871A (en) * | 1981-09-23 | 1984-01-31 | J. T. Baker Chemical Company | Stripping compositions and methods of stripping resists |
-
1984
- 1984-05-02 JP JP59089197A patent/JPS60131535A/ja active Granted
- 1984-11-16 AT AT84113854T patent/ATE56546T1/de not_active IP Right Cessation
- 1984-11-16 DE DE8484113854T patent/DE3483201D1/de not_active Expired - Fee Related
- 1984-11-16 EP EP84113854A patent/EP0145973B1/en not_active Expired - Lifetime
- 1984-12-10 CA CA000469694A patent/CA1240907A/en not_active Expired
- 1984-12-20 KR KR1019840008148A patent/KR860001841B1/ko not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE3483201D1 (de) | 1990-10-18 |
| EP0145973A2 (en) | 1985-06-26 |
| KR860001841B1 (ko) | 1986-10-24 |
| EP0145973A3 (en) | 1986-09-17 |
| JPH0413706B2 (ko) | 1992-03-10 |
| EP0145973B1 (en) | 1990-09-12 |
| JPS60131535A (ja) | 1985-07-13 |
| ATE56546T1 (de) | 1990-09-15 |
| CA1240907A (en) | 1988-08-23 |
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