KR830000197B1 - 고체 촬상장치 - Google Patents
고체 촬상장치 Download PDFInfo
- Publication number
- KR830000197B1 KR830000197B1 KR1019790004195A KR790004195A KR830000197B1 KR 830000197 B1 KR830000197 B1 KR 830000197B1 KR 1019790004195 A KR1019790004195 A KR 1019790004195A KR 790004195 A KR790004195 A KR 790004195A KR 830000197 B1 KR830000197 B1 KR 830000197B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- imaging device
- state imaging
- photodiode
- type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000003384 imaging method Methods 0.000 title description 21
- 239000000758 substrate Substances 0.000 claims description 36
- 239000004065 semiconductor Substances 0.000 claims description 9
- 238000006243 chemical reaction Methods 0.000 claims description 8
- 239000012535 impurity Substances 0.000 claims description 7
- 239000007787 solid Substances 0.000 description 12
- 238000009792 diffusion process Methods 0.000 description 10
- 229910004298 SiO 2 Inorganic materials 0.000 description 4
- 230000005669 field effect Effects 0.000 description 4
- 241000519995 Stachys sylvatica Species 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 239000000428 dust Substances 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000005468 ion implantation Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
- H10F39/803—Pixels having integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/15—Charge-coupled device [CCD] image sensors
- H10F39/158—Charge-coupled device [CCD] image sensors having arrangements for blooming suppression
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/186—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors having arrangements for blooming suppression
Landscapes
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Agricultural Chemicals And Associated Chemicals (AREA)
Abstract
Description
Claims (1)
- 제1도전형의 반도체 기판(21)의 주표면 영역에 제2도전형의 웰(22) 영역을 설치하고 이 웰(22) 영역내에 설치한 제1도전형 불순물 영역으로 구성되는 광다이오드(14)를 광전 변환소자(10)로 하는 고체촬상장치에 있어서, 상기 광다이오드(14)의 구동전압(18)을 상기 반도체 기판(21)에 인가하는 것을 특징으로 하는 고체촬상장치.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019790004195A KR830000197B1 (ko) | 1979-11-29 | 1979-11-29 | 고체 촬상장치 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CH12118/78 | 1978-11-27 | ||
| KR1019790004195A KR830000197B1 (ko) | 1979-11-29 | 1979-11-29 | 고체 촬상장치 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR830000197B1 true KR830000197B1 (ko) | 1983-02-21 |
| KR830001192A KR830001192A (ko) | 1983-04-29 |
Family
ID=19213695
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019790004195A Expired KR830000197B1 (ko) | 1979-11-29 | 1979-11-29 | 고체 촬상장치 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR830000197B1 (ko) |
-
1979
- 1979-11-29 KR KR1019790004195A patent/KR830000197B1/ko not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| KR830001192A (ko) | 1983-04-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0046396B1 (en) | Solid state image pickup device | |
| US6878918B2 (en) | APS pixel with reset noise suppression and programmable binning capability | |
| US6555842B1 (en) | Active pixel sensor with intra-pixel charge transfer | |
| US8390714B2 (en) | Solid-state imaging device and camera system | |
| US7217983B2 (en) | Photoelectric conversion film-stacked type solid-state imaging device | |
| US4354104A (en) | Solid-state image pickup device | |
| US6897519B1 (en) | Tunneling floating gate APS pixel | |
| US4980546A (en) | Photosensitive device of the type with amplification of the signal at the photosensitive dots | |
| US4323912A (en) | Solid-state imaging device | |
| Hynecek | BCMD-An improved photosite structure for high-density image sensors | |
| US4223330A (en) | Solid-state imaging device | |
| US4268845A (en) | Solid-state imaging device | |
| JPH0453149B2 (ko) | ||
| US20050156264A1 (en) | Solid image pickup apparatus | |
| JPH02304973A (ja) | 固体撮像装置 | |
| KR830000197B1 (ko) | 고체 촬상장치 | |
| US4789888A (en) | Solid-state image sensor | |
| JPH0230189B2 (ko) | ||
| KR830000575B1 (ko) | 고체촬상 장치 | |
| JPH02181470A (ja) | 固体撮像素子 | |
| KR0172853B1 (ko) | 씨씨디 고체촬상소자 | |
| KR830001554B1 (ko) | 고체 촬상장치 | |
| KR830001828B1 (ko) | 고체 촬상 장치 | |
| KR0119803B1 (ko) | 고체촬상장치 | |
| JPS5919479A (ja) | 撮像装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19791129 |
|
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 19820525 Patent event code: PE09021S01D |
|
| PG1605 | Publication of application before grant of patent |
Comment text: Decision on Publication of Application Patent event code: PG16051S01I Patent event date: 19821231 |
|
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 19830430 |
|
| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 19830726 Patent event code: PR07011E01D |
|
| PR1002 | Payment of registration fee |
Payment date: 19830726 End annual number: 3 Start annual number: 1 |
|
| PR1001 | Payment of annual fee |
Payment date: 19851230 Start annual number: 4 End annual number: 4 |
|
| PR1001 | Payment of annual fee |
Payment date: 19870217 Start annual number: 5 End annual number: 5 |
|
| PR1001 | Payment of annual fee |
Payment date: 19871218 Start annual number: 6 End annual number: 6 |
|
| PR1001 | Payment of annual fee |
Payment date: 19890220 Start annual number: 7 End annual number: 7 |
|
| PR1001 | Payment of annual fee |
Payment date: 19900220 Start annual number: 8 End annual number: 8 |
|
| PR1001 | Payment of annual fee |
Payment date: 19910204 Start annual number: 9 End annual number: 9 |
|
| PR1001 | Payment of annual fee |
Payment date: 19920214 Start annual number: 10 End annual number: 10 |
|
| PR1001 | Payment of annual fee |
Payment date: 19930209 Start annual number: 11 End annual number: 11 |
|
| PR1001 | Payment of annual fee |
Payment date: 19940208 Start annual number: 12 End annual number: 12 |
|
| PC1801 | Expiration of term |