KR20190053782A - 실리콘 함유 하층 - Google Patents
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- KR20190053782A KR20190053782A KR1020180133290A KR20180133290A KR20190053782A KR 20190053782 A KR20190053782 A KR 20190053782A KR 1020180133290 A KR1020180133290 A KR 1020180133290A KR 20180133290 A KR20180133290 A KR 20180133290A KR 20190053782 A KR20190053782 A KR 20190053782A
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Abstract
Description
Claims (15)
- 조성물로서,
(a) 하나 이상의 용매; (b) (i) 축합 가능한 실리콘 함유 모이어티를 갖는 하나 이상의 제1 불포화 단량체를 중합 단위로 포함하는 하나 이상의 축합 실리콘 함유 중합체(상기 축합 가능한 실리콘 함유 모이어티는 중합체 백본에 매달려 있음)와, (ii) 하나 이상의 축합 가능한 실리콘 단량체의 축합물 및/또는 가수분해물; 및 (c) Si-O 결합이 없는 하나 이상의 가교제를 포함하는, 조성물. - 제1항에 있어서, 적어도 하나의 축합 가능한 실리콘 단량체는 하기 식 (8)을 갖고,
상기 식에서, p는 0 내지 3의 정수이고; 각각의 R50은 C1-30 하이드로카빌 모이어티 및 치환된 C1-30 하이드로카빌 모이어티으로부터 독립적으로 선택되고; 각 X는 할로겐, C1-10 알콕시, -OH, -O-C(O)-R50, 및 -(O-Si(R51)2) p2 -X1으로부터 독립적으로 선택되며; X1은 할로겐, C1-10 알콕시, -OH, -O-C(O)-R50으로부터 독립적으로 선택되고; 각 R51은 R50과 X로부터 독립적으로 선택되며; p2는 1 내지 10의 정수인, 조성물. - 제2항에 있어서, p는 0 또는 1인, 조성물.
- 제4항에 있어서, L은 2가 연결기인, 조성물.
- 제5항에 있어서, 상기 2가 연결기는 1 내지 20개의 탄소 원자 및 선택적으로 하나 이상의 헤테로원자를 갖는 유기 라디칼인, 조성물.
- 제4항에 있어서, 상기 2가 연결기는 식 -C(=O)-O-L1-을 갖고, 상기 식에서, L1은 단일 결합 또는 1 내지 20개의 탄소 원자를 갖는 유기 라디칼인, 조성물.
- 제1항에 있어서, 적어도 하나의 제1 불포화 단량체는 하기 식 (1)을 갖고,
상기 식에서, L은 단일 결합 또는 2가 연결기이고; 각 R1은 H, C1-10-알킬, C2-20-알케닐, C5-20-아릴, 및 C6-20-아랄킬로부터 독립적으로 선택되며; 각각의 R2 및 R3은 H, C1-4-알킬, C1-4-할로알킬, 할로겐, C5-20-아릴, C6-20-아랄킬, 및 CN으로부터 독립적으로 선택되고; R4는 H, C1-10-알킬, C1-10-할로알킬, 할로겐, C5-20-아릴, C6-20-아랄킬, 및 C(=O)R5로부터 선택되며; R5는 OR6과 N(R7)2로부터 선택되고; R6은 H, 및 C1-20-알킬로부터 선택되며; 각 R7은 H, C1-20-알킬, 및 C6-20-아릴로부터 독립적으로 선택되고; 각 Y1은 할로겐, C1-10-알콕시, C5-10-아릴옥시, C1-10-카르복시로부터 독립적으로 선택되며; b는 0 내지 2의 정수인, 조성물. - 제1항에있어서, 상기 축합물 및/또는 가수분해물은 축합 가능한 실리콘 함유 모이어티의 하나 이상의 제2 불포화 단량체를 중합된 단위로서 더 포함하는, 조성물.
- 제9항에 있어서, 적어도 하나의 제2 불포화 단량체는 산성 양성자 및 물에서 -5 내지 13의 pKa를 갖는, 조성물.
- 제1항에 있어서, 상기 축합물 및/또는 가수분해물은 발색단 모이어티를 갖는 하나 이상의 불포화 단량체를 중합 단위로 더 포함하는, 조성물.
- 제12항에 있어서, 상기 발색단 모이어티는 상기 중합체 백본으로부터 매달려 있는, 조성물.
- 방법으로서,
(a) 제1항의 조성물로 기판을 코팅하여 코팅층을 형성하는 단계; (b) 상기 코팅층을 경화시켜 중합체 하층을 형성하는 단계; (c) 상기 중합체 하층 위에 포토레지스트 층을 배치하는 단계; (d) 상기 포토레지스트 층을 패턴 방식으로(pattern-wise) 노출시켜 잠상을 형성하는 단계; (e) 상기 잠상을 현상하여 릴리프 상을 갖는 패턴화된 포토레지스트 층을 형성하는 단계; (f) 상기 릴리프 상을 상기 기판에 전사하는 단계; 및 (g) 습식 박리(wet stripping)에 의해 상기 중합체 하층을 제거하는 단계를 포함하는, 방법. - 제14항에 있어서, 상기 중합체 하층은 습식 박리에 의해 제거되는, 방법.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201762584151P | 2017-11-10 | 2017-11-10 | |
| US62/584,151 | 2017-11-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20190053782A true KR20190053782A (ko) | 2019-05-20 |
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| US20180164685A1 (en) * | 2016-12-14 | 2018-06-14 | Rohm And Haas Electronic Materials Llc | Method using silicon-containing underlayers |
| US11360387B2 (en) * | 2017-08-04 | 2022-06-14 | Rohm And Haas Electronic Materials Llc | Silicon-containing underlayers |
| KR102821254B1 (ko) * | 2019-07-25 | 2025-06-17 | 닛산 가가쿠 가부시키가이샤 | 레지스트 하층막 형성 조성물 |
| JP7310471B2 (ja) * | 2019-09-12 | 2023-07-19 | Jsr株式会社 | パターン形成方法及び組成物 |
| WO2025169821A1 (ja) * | 2024-02-08 | 2025-08-14 | Jsr株式会社 | 半導体基板の製造方法及びレジスト下層膜形成用組成物 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008076889A (ja) * | 2006-09-22 | 2008-04-03 | Jsr Corp | レジスト下層膜用組成物及びその製造方法 |
| KR20130020577A (ko) * | 2011-08-17 | 2013-02-27 | 신에쓰 가가꾸 고교 가부시끼가이샤 | 규소 함유 레지스트 하층막 형성용 조성물 및 패턴 형성 방법 |
| JP2013051410A (ja) * | 2011-07-29 | 2013-03-14 | Dic Corp | ドライエッチングレジスト材料、レジスト膜及びパターン形成物 |
| JP2017020000A (ja) * | 2015-06-15 | 2017-01-26 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | 湿式剥離性シリコン含有反射防止剤 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5574213B2 (ja) | 2008-07-09 | 2014-08-20 | 株式会社リコー | 画像形成装置 |
| JP5015891B2 (ja) | 2008-10-02 | 2012-08-29 | 信越化学工業株式会社 | 金属酸化物含有膜形成用組成物、金属酸化物含有膜形成基板及びパターン形成方法 |
| JP5015892B2 (ja) | 2008-10-02 | 2012-08-29 | 信越化学工業株式会社 | ケイ素含有膜形成用組成物、ケイ素含有膜形成基板及びパターン形成方法 |
| JP4790786B2 (ja) | 2008-12-11 | 2011-10-12 | 信越化学工業株式会社 | 塗布型ケイ素含有膜の剥離方法 |
| TWI401263B (zh) * | 2009-12-31 | 2013-07-11 | Far Eastern New Century Corp | 增進聚矽氧水膠潤濕性之共聚物、包含其之聚矽氧水膠組成物及由此製得之眼用物件 |
| DE112012000833T8 (de) | 2011-02-15 | 2014-01-02 | Dic Corporation | Aushärtbare Nanoprägezusammensetzung, mittels Nanoprägelithografie hergestelltes Formprodukt und Verfahren zur Ausbildung einer Strukturierung |
| JP6297992B2 (ja) | 2015-02-05 | 2018-03-20 | 信越化学工業株式会社 | ケイ素含有重合体、ケイ素含有化合物、レジスト下層膜形成用組成物、及びパターン形成方法 |
| TWI609028B (zh) * | 2016-05-06 | 2017-12-21 | 財團法人工業技術研究院 | 共聚物與含其之樹脂組合物、封裝膜及封裝結構 |
| US11360387B2 (en) * | 2017-08-04 | 2022-06-14 | Rohm And Haas Electronic Materials Llc | Silicon-containing underlayers |
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- 2018-10-25 TW TW107137695A patent/TWI731274B/zh active
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008076889A (ja) * | 2006-09-22 | 2008-04-03 | Jsr Corp | レジスト下層膜用組成物及びその製造方法 |
| JP2013051410A (ja) * | 2011-07-29 | 2013-03-14 | Dic Corp | ドライエッチングレジスト材料、レジスト膜及びパターン形成物 |
| KR20130020577A (ko) * | 2011-08-17 | 2013-02-27 | 신에쓰 가가꾸 고교 가부시끼가이샤 | 규소 함유 레지스트 하층막 형성용 조성물 및 패턴 형성 방법 |
| JP2017020000A (ja) * | 2015-06-15 | 2017-01-26 | ローム アンド ハース エレクトロニック マテリアルズ エルエルシーRohm and Haas Electronic Materials LLC | 湿式剥離性シリコン含有反射防止剤 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2019090010A (ja) | 2019-06-13 |
| TW201918508A (zh) | 2019-05-16 |
| JP7139469B2 (ja) | 2022-09-20 |
| US20210397093A1 (en) | 2021-12-23 |
| CN109765758B (zh) | 2023-04-18 |
| US20190146343A1 (en) | 2019-05-16 |
| CN109765758A (zh) | 2019-05-17 |
| JP2021073348A (ja) | 2021-05-13 |
| KR102186106B1 (ko) | 2020-12-03 |
| TWI731274B (zh) | 2021-06-21 |
| US11733609B2 (en) | 2023-08-22 |
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