KR102815037B1 - Display device - Google Patents

Abstract

A display device includes a substrate having a display area and a non-display area adjacent to the display area, a plurality of pixel rows arranged in the display area on the substrate, and a lighting inspection circuit section arranged in the non-display area on the substrate and including a plurality of lighting inspection transistors, and providing a lighting inspection voltage to the pixel rows. Each of the lighting inspection transistors includes an active pattern arranged in the non-display area on the substrate and having a source area, a drain area, and a channel area, a gate electrode arranged in the channel area on the active pattern, an interlayer insulating layer covering the gate electrode, exposing a portion of the source area of the active pattern, and including a first contact hole positioned at a distance of 7 um or more from a first side of the gate electrode, and a source electrode contacting the source area of the active pattern through the first contact hole.

Description

DISPLAY DEVICE

The present invention relates to a display device. More specifically, the present invention relates to a display device with improved display quality.

Organic light-emitting diode displays have recently been the focus of development because they have the advantages of a wide viewing angle, fast response speed, thin thickness, and low power consumption.

Meanwhile, whether the display device is damaged (for example, whether the wiring, pixels, etc. are damaged) can be detected through the lighting inspection. In this case, a lighting inspection transistor for the lighting inspection is formed in the display device, and an insulation breakdown phenomenon may occur in the lighting inspection transistor due to static electricity generated during the manufacturing process of the display device. When the insulation breakdown phenomenon occurs, the insulating layer loses its insulating properties and becomes conductive, and a short phenomenon may occur in the lighting inspection transistor. When the display device is driven, the data voltage is provided to the pixels through the lighting inspection transistor, and therefore, the display quality of the display device may deteriorate due to the short phenomenon.

An object of the present invention is to provide a display device with improved display quality.

However, the purpose of the present invention is not limited to the purpose described above, and may be expanded in various ways without departing from the spirit and scope of the present invention.

In order to achieve the object of the present invention, a display device according to embodiments of the present invention may include a substrate having a display area and a non-display area positioned adjacent to the display area, a plurality of pixel rows arranged in the display area on the substrate, and a lighting inspection circuit section including a plurality of lighting inspection transistors arranged in the non-display area on the substrate and providing a lighting inspection voltage to the pixel rows, wherein each of the lighting inspection transistors is arranged in the non-display area on the substrate and includes an active pattern having a source region, a drain region, and a channel region, a gate electrode arranged in the channel region on the active pattern, an interlayer insulating layer covering the gate electrode, exposing a part of the source region of the active pattern, and including a first contact hole positioned spaced apart from a first side of the gate electrode by 7 um or more, and a source electrode contacting the source region of the active pattern through the first contact hole.

In one embodiment, the interlayer insulating layer may further include a second contact hole positioned at a distance of 7 μm or more from a second side of the gate electrode and exposing a portion of the drain region of the active pattern, and each of the lighting inspection transistors may further include a drain electrode contacting the drain region of the active pattern through the second contact hole.

In one embodiment, a distance at which the first contact hole is spaced apart from the first side of the gate electrode and a distance at which the second contact hole is spaced apart from the second side of the gate electrode may be the same.

In one embodiment, the length between the first side and the second side of the gate electrode may be 3 um to 4 um.

In one embodiment, the distance between the first contact hole and the second contact hole may be 17 um or more.

In one embodiment, each of the lighting inspection transistors further includes a gate insulating layer interposed between the substrate and the interlayer insulating layer and covering the active pattern, and each of the first and second contact holes can penetrate the gate insulating layer to expose a portion of each of the source and drain regions of the active pattern.

In one embodiment, the display device further includes a data driver that is arranged in the non-display area on the substrate and generates a data voltage, and the lighting inspection circuit may be arranged between the pixel rows and the data driver.

In one embodiment, the display device further includes a demultiplexer disposed between the lighting inspection circuit unit and the pixel rows in the non-display area on the substrate, and the demultiplexer can receive the data voltage from the data driver unit and provide the data voltage to the pixel rows.

In one embodiment, the source electrode may be positioned adjacent to the data driver, and the drain electrode may be positioned adjacent to the demultiplexer.

In one embodiment, the display device is disposed in the non-display area on the substrate, and further includes an anti-static circuit section that is electrically connected to the lighting inspection circuit section and measures a voltage level of the lighting inspection voltage, and when the anti-static circuit section measures the voltage level of the lighting inspection voltage to be higher than a preset voltage level, the lighting inspection voltage may not be provided to the lighting inspection transistors.

In one embodiment, the maximum distance by which the first contact hole is spaced from the first side of the gate electrode of each of the lighting inspection transistors can be determined corresponding to the preset voltage.

In one embodiment, the pixel columns may include a first pixel column in which first pixels displaying a first color and second pixels displaying a second color are repeatedly arranged, a second pixel column in which third pixels displaying a third color are repeatedly arranged, and a third pixel column in which the second pixels and the first pixels are repeatedly arranged.

In one embodiment, the lighting inspection circuit unit can alternately apply the lighting inspection voltage to the first pixel and the second pixel included in the first pixel column and the third pixel column.

In one embodiment, the lighting test transistors include a first lighting test transistor, a second lighting test transistor, and a third lighting test transistor, wherein the first and second lighting test transistors are electrically connected to the first pixel column and the third pixel column, and the third lighting test transistor can be electrically connected to the second pixel column.

In one embodiment, the lighting test voltage includes a first lighting test voltage, a second lighting test voltage, and a third lighting test voltage, and the first lighting test transistor can provide the first lighting test voltage to the first pixel based on a first test control signal, the second lighting test transistor can provide the second lighting test voltage to the second pixel based on a second test control signal, and the third lighting test transistor can provide the third lighting test voltage to the third pixel based on a third test control signal.

According to one embodiment, the display device may further include a data driver that generates a data voltage provided to the pixel columns, a gate driver that generates a scan signal provided to the pixel columns, and a timing control unit that generates a control signal that controls the data driver and the gate driver.

A display device according to embodiments of the present invention may include a lighting inspection transistor having a first distance of 7 um or more. Accordingly, the charge mobility of the lighting inspection transistor may be reduced, and an insulation breakdown phenomenon caused by static electricity generated in a manufacturing process of the display device may not occur. Accordingly, the display device may perform a lighting inspection, and through the lighting inspection, whether the display device is damaged (for example, whether wiring, pixels, etc. are damaged, etc.) may be detected. In addition, since the lighting inspection transistor may not be short-circuited, the display quality may be improved when the display device is driven.

However, the effects of the present invention are not limited to the above-described effects, and may be expanded in various ways without departing from the spirit and scope of the present invention.

FIG. 1 and FIG. 2 are drawings for explaining a manufacturing process of a display device according to embodiments of the present invention.
FIG. 3 is a drawing showing a display device according to embodiments of the present invention.
Fig. 4 is a circuit diagram showing the display device of Fig. 3.
FIG. 5 is a plan view for explaining a lighting inspection transistor included in the display device of FIG. 3.
Figure 6 is a cross-sectional view taken along line I-I' of Figure 5.
Figure 7 is a block diagram of the display device of Figure 3.

Hereinafter, embodiments of the present invention will be described in more detail with reference to the attached drawings. The same reference numerals are used for the same components in the drawings, and redundant descriptions of the same components are omitted.

Figures 1 and 2 are drawings for explaining the manufacturing process of the display device.

Referring to FIGS. 1 and 2, a plurality of cell regions (40) in which a display device (1000) of FIG. 3 is to be formed may be arranged in a grid shape on a substrate (10). After the substrate (10) is aligned with a mask (20) in which a plurality of openings are formed, a deposition material (31) from a deposition source (30) may pass through the openings and be deposited on the cell regions (40) of the substrate (10). Here, the cell regions (40) may include the display region (DA) of FIG. 3 and the non-display region (NDA) of FIG. 3. For example, the deposition material (31) may be an organic material included in a pixel (for example, PX of FIG. 3) arranged in the display region (DA). In this case, pixel transistors disposed below the organic material may be disposed in the display area (DA), and lighting inspection transistors (for example, TR1, TR2 or TR3 of FIG. 4) for lighting inspection of the pixels may be disposed in the non-display area (NDA). At this time, in the process of aligning the mother substrate (10) and the mask (20) in a single row, the central portion (A) of the mother substrate (10) may sag. As the central portion (A) of the mother substrate (10) sags, the central portion (A) of the mother substrate (10) may come close to or come into contact with the mask (20). In this case, static electricity may be generated in the central portion (A) of the mother substrate (10) that comes close to or comes into contact with the mask (20) formed of metal, and this may damage the lighting inspection transistor located in the central portion (A). For example, in order to align the substrate (10) with the mask (20), the alignment speed of the substrate (10) may be set to approximately 300 mm/s, and the distance between the substrate (10) and the mask (20) may be set to approximately 5 mm. In this case, static electricity having a voltage level of approximately 500 V may be generated in the central portion (A) of the substrate (10). This may cause an insulation breakdown phenomenon in the lighting inspection transistor of the display device (1000) manufactured in the cell regions (40) located in the central portion (A) of the substrate (10). When the insulation breakdown phenomenon occurs, the insulating layer (for example, the gate insulating layer (250) or the interlayer insulating layer (270) of FIG. 6) included in the lighting inspection transistor loses its insulating property and becomes conductive, and a short phenomenon may occur in the lighting inspection transistor. When the display device (1000) is driven, the data voltage is provided to the pixel through the lighting inspection transistor, so the display quality of the display device (1000) may deteriorate due to the short-circuit phenomenon.

FIG. 3 is a drawing showing a display device according to embodiments of the present invention. For example, a display device (1000) may be formed in each of a plurality of cell regions (40) illustrated in FIGS. 1 and 2, and the display device (1000) may be separated from the substrate (10) by performing cell cutting.

Referring to FIG. 3, a display device (1000) may include a substrate (100), data lines (DL), a plurality of pixel columns (110, 120, 130), a lighting inspection circuit (200), a demultiplexer (300), a data driving unit (400), and a static electricity prevention circuit (500). The substrate (100) may have a display area (DA) and a non-display area (NDA) positioned adjacent to the display area (DA).

Data lines (DL) may be arranged in a display area (DA) on a substrate (100). For example, the data lines (DL) may extend in a column direction and be arranged in parallel in a row direction perpendicular to the column direction. The data lines (DL) may be electrically connected to pixel columns (110, 120, 130), respectively.

The pixel columns (110, 120, 130) may be arranged parallel to the data lines (DL). Each of the pixel columns (110, 120, 130) may include pixels (PX), and when the display device (1000) is tested for lighting, the pixels (PX) may emit light in response to a lighting test voltage provided through the data lines (DL).

In one embodiment, the pixel columns (110, 120, 130) may include a first pixel column (110), a second pixel column (120), and a third pixel column (130). The first pixel column (110) may include a first pixel (R) displaying a first color and a second pixel (B) displaying a second color, and the first pixels (R) and the second pixels (B) may be arranged repeatedly. The second pixel column (120) may include a third pixel (G) displaying a third color, and the third pixels (G) may be arranged repeatedly. The third pixel column (130) may include a first pixel (R) and a second pixel (B), and the first pixels (R) and the second pixels (B) may be arranged repeatedly. At this time, the first pixel (R) and the second pixel (B) included in the third pixel column (130) may be arranged in the opposite order to the first pixel (R) and the second pixel (B) included in the first pixel column (110). For example, the first color may be red, the second color may be blue, and the third color may be green.

In one embodiment, as illustrated in FIG. 3, a first pixel column (110), a second pixel column (120), a third pixel column (130), and a second pixel column (120) may be repeatedly arranged in a display area (DA) on a substrate (100). Meanwhile, the order in which the pixel columns (110, 120, 130) are arranged is not limited thereto, and although FIG. 3 illustrates eight pixel columns (110, 120, 130), the number of pixel columns (110, 120, 130) arranged is not limited thereto.

The lighting inspection circuit (200) may be placed in a non-display area (NDA) on the substrate (100). The lighting inspection circuit (200) may provide a lighting inspection voltage to pixel rows (110, 120, 130) through data lines (DL) during lighting inspection of the display device (1000).

In one embodiment, the lighting inspection circuit unit (200) can alternately apply a lighting inspection voltage to the first pixel (R) and the second pixel (B) included in the first pixel column (110) and the third pixel column (130). For example, the lighting inspection circuit unit (200) can detect a lighting failure of the first pixel (R) by applying a first lighting inspection voltage that causes the first pixel (R) to emit light. Thereafter, the lighting inspection circuit unit (200) can detect a lighting failure of the second pixel (B) by applying a second lighting inspection voltage that causes the second pixel (B) to emit light.

In one embodiment, the lighting inspection circuit (200) can apply a lighting inspection voltage to a third pixel (G) included in the second pixel row (120). For example, the lighting inspection circuit (200) can detect a lighting failure of the third pixel (G) by applying a third lighting inspection voltage that causes the third pixel (G) to emit light.

In addition, the lighting inspection circuit (200) may not operate when the display device (1000) is driven. For example, when the display device (1000) is driven, the display device (1000) may turn off the lighting inspection transistor included in the lighting inspection circuit (200).

A demultiplexer (300) may be placed between a lighting inspection circuit unit (200) and pixel columns (110, 120, 130) in a non-display area (NDA) on a substrate (100). When driving a display device (1000), the demultiplexer (300) may receive a data voltage from a data driving unit (400) and apply the data voltage to pixel columns (110, 120, 130) through data lines (DL).

The data driving unit (400) can generate the data voltage and provide the data voltage to the pixel rows (110, 120, 130) through the demultiplexer (300) and the data lines (DL) when driving the display device (1000). In one embodiment, the data driving unit (400) can be placed in a non-display area (NDA) on the substrate (100). In another embodiment, the data driving unit (400) can be placed on a flexible printed circuit board (FPCB) in the form of a chip-on-film (COF).

The static electricity prevention circuit (500) can be placed in a non-display area (NDA) on the substrate (100). The static electricity prevention circuit (500) will be described in detail with reference to FIG. 4.

Fig. 4 is a circuit diagram showing the display device of Fig. 3.

Referring to FIGS. 3 and 4, the lighting inspection circuit unit (200) may include first to third lighting inspection transistors (TR1, TR2, TR3). When performing a lighting inspection of the display device (1000), the first to third lighting inspection transistors (TR1, TR2, TR3) may provide a lighting inspection voltage to the first to third pixels (R, G, B). To this end, the first and second lighting inspection transistors (TR1, TR2) may be electrically connected to the first pixel column (110) and the third pixel column (130), and the third lighting inspection transistor (TR3) may be electrically connected to the second pixel column (120).

The first lighting test transistor (TR1) can provide a first lighting test voltage (LS_R) to the first pixel (R) based on a first test control signal (LCS_R). The first test control signal (LCS_R) can have voltage levels for turning on and off the first lighting test transistor (TR1), and the first lighting test voltage (LS_R) can have a voltage level for causing the first pixel (R) to emit light. For example, a gate terminal of the first lighting test transistor (TR1) can receive the first test control signal (LCS_R), a source terminal can receive the first lighting test voltage (LS_R), and a drain terminal can provide the first lighting test voltage (LS_R) to the first pixel column (110) or the third pixel column (130).

The second lighting test transistor (TR2) can provide a second lighting test voltage (LS_B) to the second pixel (B) based on a second test control signal (LCS_B). The second test control signal (LCS_B) can have voltage levels for turning on and off the second lighting test transistor (TR2), and the second lighting test voltage (LS_B) can have a voltage level for causing the second pixel (B) to emit light. For example, a gate terminal of the second lighting test transistor (TR2) can receive the second test control signal (LCS_B), a source terminal can receive the second lighting test voltage (LS_B), and a drain terminal can provide the second lighting test voltage (LS_B) to the first pixel column (110) or the third pixel column (130).

The first pixel (R) can emit light by receiving the first lighting test voltage (LS_R), and the second pixel (B) can emit light by receiving the second lighting test voltage (LS_B). For example, the voltage level of the first lighting test voltage (LS_R) can be higher than the voltage level of the second lighting test voltage (LS_B). In addition, as described above, the lighting test circuit unit (200) can alternately apply the lighting test voltage to the first pixel (R) and the second pixel (B). To this end, the first test control signal (LCS_R) and the second test control signal (LCS_B) can be alternately provided to the first and second lighting test transistors (TR1, TR2), respectively.

The third lighting inspection transistor (TR3) can provide a third lighting inspection voltage (LS_G) to the third pixel (G) based on a third inspection control signal (LCS_G). The third inspection control signal (LCS_G) can have voltage levels for turning on and off the third lighting inspection transistor (TR3), and the third lighting inspection voltage (LS_G) can have a voltage level for causing the third pixel (G) to emit light. For example, a gate terminal of the third lighting inspection transistor (TR3) can receive the third inspection control signal (LCS_G), a source terminal can receive the third lighting inspection voltage (LS_G), and a drain terminal can provide the third lighting inspection voltage (LS_G) to the second pixel row (120).

The demultiplexer (300) may include a plurality of control transistors. When the display device (1000) is driven, the control transistors may provide data voltages to the first to third pixels (R, G, B) based on control signals (CS_1, CS_2).

As described above, when driving the display device (1000), the data driving unit (400) can generate a data voltage and provide the data voltage to the first to third pixels (R, G, B) through the demultiplexer (300) and the data lines (DL).

The static electricity prevention circuit unit (500) is electrically connected to the lighting inspection circuit unit (200) and can measure voltage levels of first to third lighting inspection voltages (LS_R, LS_G, LS_B) provided to the lighting inspection circuit unit (200). When the static electricity prevention circuit unit (500) measures the voltage level of at least one lighting inspection voltage among the first to third lighting inspection voltages (LS_R, LS_G, LS_B) as being higher than a preset voltage level, the at least one lighting inspection voltage may not be provided to the first to third lighting inspection transistors (TR1, TR2, TR3). In other words, the electrostatic prevention circuit unit (500) can prevent static electricity generated in at least one of the wires transmitting the first to third lighting inspection voltages (LS_R, LS_B, LS_G) from being provided to the first to third lighting inspection transistors (TR1, TR2, TR3). For example, when the preset voltage level of the electrostatic prevention circuit unit (500) is approximately 6.5 V and the voltage level of the voltage transmitted through the at least one wire is approximately 7 V, the electrostatic prevention circuit unit (500) can prevent the voltage of approximately 7 V from being provided to the first to third lighting inspection transistors (TR1, TR2, TR3).

FIG. 5 is a plan view for explaining a lighting inspection transistor included in the display device of FIG. 3, and FIG. 6 is a cross-sectional view taken along line I-I' of FIG. 5.

Referring to FIGS. 3, 4, 5, and 6, each of the first to third lighting inspection transistors (TR1, TR2, TR3) of FIG. 4 may include an active pattern (240), a gate insulating layer (250), a gate electrode (260), an interlayer insulating layer (270), a source electrode (280), and a drain electrode (290).

A buffer layer (230), an active pattern (240), a gate insulating layer (250), a gate electrode (260), an interlayer insulating layer (270), a source electrode (280), and a drain electrode (290) can be sequentially arranged on a substrate (100).

The buffer layer (230) may be disposed on the substrate (100). The buffer layer (230) may prevent metal atoms or impurities from diffusing from the substrate (100) to the active pattern (240). In addition, the buffer layer (230) may control the heat transfer rate during the crystallization process for forming the active pattern (240) so that the active pattern (240) may be uniformly formed. Meanwhile, in another embodiment, the display device (1000) may not include the buffer layer (230).

The active pattern (240) may be disposed on the buffer layer (230). In one embodiment, the active pattern (240) may include a silicon semiconductor such as amorphous silicon, polycrystalline silicon, or a metal oxide semiconductor. The active pattern (510) may have a source region (243), a drain region (245), and a channel region (241) between the source region (243) and the drain region (245). The source and drain regions (243, 245) of the active pattern (240) may be doped with impurities. Accordingly, the channel region (241) of the active pattern (240) may have lower conductivity and higher resistance than the source and drain regions (243, 245). The gate insulating layer (250) may be interposed between the substrate (100) and the interlayer insulating layer (270) and may cover the active pattern (240). A portion of each of the first and second contact holes (281, 291) may be formed in the gate insulating layer (250) and may expose a portion of each of the source and drain regions (243, 245) of the active pattern (240). The gate insulating layer (250) may include an insulating material. For example, the gate insulating layer (250) may be made of silicon oxide, silicon nitride, titanium oxide, tantalum oxide, or the like.

The gate electrode (260) may be arranged in the channel region (241) on the gate insulating layer (250). The gate electrode (260) may include a metal, an alloy, a conductive metal oxide, etc. For example, the gate electrode (260) may include gold (Au), silver (Ag), copper (Cu), nickel (Ni), chromium (Cr), aluminum (Al), tungsten (W), molybdenum (Mo), titanium (Ti), tantalum (Ta), or an alloy thereof, and may have a single layer or a multilayer structure including different metal layers. Meanwhile, the gate electrode (260) may correspond to the gate terminal described with reference to FIG. 4.

Meanwhile, the gate electrode (260) may include a first side and a second side facing the first side. For example, as illustrated in FIG. 5, the gate electrode (260) may include the first side facing the source electrode (280) and the second side facing the first side and facing the drain electrode (290). In other words, the distance between the first side and the second side may be equal to the length (LEN) of the gate electrode (260).

The interlayer insulating layer (270) can cover the gate electrode (260), and each of a portion of the first and second contact holes (281, 291) can be formed. In other words, a first contact hole (281) can be formed by removing a first portion of the gate insulating layer (250) and the interlayer insulating layer (270), and a second contact hole (291) can be formed by removing a second portion of the gate insulating layer (250) and the interlayer insulating layer (270). That is, the gate insulating layer (250) and the interlayer insulating layer (270) can include the first and second contact holes (281, 291). The interlayer insulating layer (270) can include an insulating material. For example, the interlayer insulating layer (270) can be made of silicon oxide, silicon nitride, titanium oxide, tantalum oxide, or the like.

The first contact hole (281) may expose a portion of the source region (243) of the active pattern (240) and may be positioned at a distance of approximately 7 um or more from the first side surface of the gate electrode (260). In other words, the first distance (DIS_1) between the gate electrode (260) and the first contact hole (281) may be approximately 7 um or more.

The second contact hole (291) may expose a part of the drain region (245) of the active pattern (240) and may be positioned at a distance of about 7 um or more from the second side surface of the gate electrode (260). In other words, the second distance (DIS_2) between the gate electrode (260) and the second contact hole (291) may be about 7 um or more.

In one embodiment, the distance between the first contact hole (281) and the second contact hole (291) may be approximately 17 um or more.

The source electrode (280) may be disposed on the interlayer insulating layer (270) and may be in contact with the source region (243) of the active pattern (240) through the first contact hole (281). The source electrode (280) may include a metal, an alloy, a conductive metal oxide, etc. For example, the source electrode (280) may include Au, Ag, Cu, Ni, Cr, Al, W, Mo, Ti, Ta, or an alloy thereof, and may have a single layer or a multilayer structure including different metal layers. In addition, the source electrode (280) may correspond to the source terminal described with reference to FIG. 4. Accordingly, the source electrode (280) may be positioned adjacent to the data driving unit (400) and may be electrically connected to the data driving unit (400) to receive a data voltage from the data driving unit (400).

The drain electrode (290) may be disposed on the interlayer insulating layer (270) and may be in contact with the drain region (245) of the active pattern (240) through the second contact hole (291). The drain electrode (290) may include a metal, an alloy, a conductive metal oxide, or the like. In one embodiment, the drain electrode (290) may be formed together with the source electrode (280), and thus may include the same material as the source electrode (280). In addition, the drain electrode (290) may correspond to the drain terminal described with reference to FIG. 4. Accordingly, the drain electrode (290) may be positioned adjacent to the demultiplexer (300) and may be electrically connected to the demultiplexer (300) to provide a data voltage to the demultiplexer (300).

The charge mobility of the first lighting inspection transistor (TR1) can be determined according to the lengths of the components forming the first lighting inspection transistor (TR1) and the distances between the components. For example, as the first distance (DIS_1) between the first contact hole (281) filled with the source electrode (280) and the first side of the gate electrode (260) and the second distance (DIS_2) between the second contact hole (291) filled with the drain electrode (290) and the second side of the gate electrode (260) become longer, the movement distance of charges moving from the source region (243) to the drain region (245) can increase. Accordingly, as the first and second distances (DIS_1, DIS_2) become longer, the charge mobility of the first lighting inspection transistor (TR1) can decrease. Additionally, as the length (LEN) of the channel region (241) having high resistance compared to the source and drain regions (243, 245) increases, the charge mobility of the first lighting inspection transistor (TR1) may decrease.

Meanwhile, as described above, in the manufacturing process of the display device (1000), as the central portion (A of FIGS. 1 and 2) of the substrate (10 of FIGS. 1 and 2) sags, the central portion may come close to or come into contact with the mask (20 of FIGS. 1 and 2), and thus, static electricity having a voltage level of approximately 500 V may be generated in the central portion. In order to prevent an insulation breakdown phenomenon of the first lighting inspection transistor (TR1) due to the static electricity, each of the first and second distances (DIS_1, DIS_2) of the first lighting inspection transistor (TR1) may be approximately 7 um or more. In other words, by designing the first lighting inspection transistor (TR1) to have the first or second distances (DIS_1, DIS_2) of approximately 7 um or more, the charge mobility of the first lighting inspection transistor (TR1) can be reduced, and accordingly, the insulation breakdown phenomenon of the first lighting inspection transistor (TR1) can be prevented.

Additionally, in one embodiment, the length (LEN) of the gate electrode (260) may be about 3 um to about 4 um. Since the first lighting inspection transistor (TR1) includes the gate electrode (260) having a length (LEN) of about 3 um to about 4 um, the charge mobility of the first lighting inspection transistor (TR1) may be reduced, and accordingly, an insulation breakdown phenomenon of the first lighting inspection transistor (TR1) may be prevented.

Table 1 below is a table showing whether an insulation breakdown phenomenon occurred in the first lighting inspection transistor (TR1) according to changes in each of the first and second distances (DIS_1, DIS_2) when the length (LEN) of the gate electrode (260) is approximately 3.5 um. As shown in the table below, when the first and second distances (DIS_1, DIS_2) were approximately 3.2 um, approximately 3.3 um, approximately 3.5 um, and approximately 6 um, respectively (i.e., for CASE 1 to CASE 4), an insulation breakdown phenomenon occurred in the first lighting inspection transistor (TR1). On the other hand, when the first and second distances (DIS_1, DIS_2) were approximately 7 um, approximately 8.7 um, and approximately 11 um, respectively (i.e., for CASE 5 to CASE 7), an insulation breakdown phenomenon did not occur in the first lighting inspection transistor (TR1).

Each of the first and second distances
(um) Whether insulation breakdown phenomenon occurs CASE 1 3.2 Occurred CASE 2 3.3 Occurred CASE 3 3.5 Occurred CASE 4 6 Occurred CASE 5 7 Does not occur CASE 6 8.7 Does not occur CASE 7 11 Does not occur

Meanwhile, the maximum distance of each of the first and second distances (DIS_1, DIS_2) of the first lighting inspection transistor (TR1) may be determined in response to the preset voltage of the electrostatic prevention circuit (500). For example, the maximum distance of each of the first and second distances (DIS_1, DIS_2) of the first lighting inspection transistor (TR1) may be approximately 11 um. As described above, when the electrostatic prevention circuit (500) measures the voltage level of the lighting inspection voltage as being higher than the preset voltage level, the lighting inspection voltage may not be provided to the first to third lighting inspection transistors (TR1, TR2, TR3). For example, the preset voltage level of the electrostatic prevention circuit (500) may be approximately 6.5 V. When the first distance (DIS_1) or the second distance (DIS_2) of the first lighting inspection transistor (TR1) is approximately 11 um or more, the charge mobility of the first lighting inspection transistor (TR1) may be reduced. Accordingly, the first lighting inspection transistor (TR1) may not be able to transmit the lighting inspection voltage having a voltage level of approximately 6.5 V or less, and accordingly, the display device (1000) may not be able to perform the lighting inspection. However, when the voltage level of the lighting inspection voltage is set to approximately 6.5 V or more, the lighting inspection voltage may not be provided to the first to third lighting inspection transistors (TR1, TR2, TR3) by the static electricity prevention circuit unit (500).

In one embodiment, the first and second distances (DIS_1, DIS_2) may be the same. For example, when the first distance (DIS_1) is shorter than the second distance (DIS_2), the distance by which charges move from the source region (243) to the channel region (241) may be shorter than the distance by which charges move from the channel region (241) to the drain region (245). In this case, static electricity generated during the manufacturing process of the display device (1000) may be concentrated and provided to the source region (243), and thus, an insulation breakdown phenomenon may occur in the first lighting inspection transistor (TR1). In order to prevent static electricity from being concentrated and provided to the source or drain regions (243, 245), the first and second distances (DIS_1, DIS_2) may be the same.

Meanwhile, the structure of each of the second and third lighting inspection transistors (TR2, TR3) may be substantially the same as the structure of the first lighting inspection transistor (TR1) described above. In addition, a display layer may be further disposed on the source and drain electrodes (280, 290). In one embodiment, when the display device (1000) is a liquid crystal display, the display layer may include a first electrode, a second electrode, and a liquid crystal layer disposed between the first electrode and the second electrode. In another embodiment, when the display device (1000) is an organic light emitting display, the display layer may include a first electrode, a second electrode, and an organic light emitting layer disposed between the first electrode and the second electrode.

Figure 7 is a block diagram of the display device of Figure 3.

Referring to FIGS. 3 and 7, the display device (1000) may include a display panel (600), a data driver (400), a gate driver (700), and a timing controller (800).

The display panel (600) may include data lines (DL), gate lines, and pixels (PX) connected to the data lines (DL) and the gate lines, a lighting inspection circuit (200), a demultiplexer (300), and a static electricity prevention circuit (500). The display panel (600) may receive a data voltage (DS) through the data lines (DL) and may receive a gate signal (GS) through the gate lines.

The above gate lines may be arranged in a display area (DA) on a substrate (100). For example, the gate lines may extend in a row direction and be arranged in a row direction perpendicular to the row direction. Pixels (PX) may be formed in an area where the gate lines and data lines (DL) intersect.

The data driving unit (400) can generate a data voltage (DS) based on image data (RGB') and a data control signal (DCTRL) provided from the timing driving unit (800), and provide the data voltage (DS) to a plurality of pixels (PX) through data lines (DL). For example, the data control signal (DCTRL) can include an output data enable signal, a horizontal start signal, and a load signal.

The gate driver (700) may generate a gate signal (GS) based on a gate control signal (GCTRL) provided from a timing controller (800) and provide the gate signal (GS) to a plurality of pixels (PX) through the gate lines. For example, the gate control signal (GCTRL) may include a vertical start signal, a clock signal, etc. For example, the gate driver (700) may be directly mounted in a non-display area (NDA) on the substrate (100). In another embodiment, the gate driver (700) may be disposed on an FPCB in the form of a COF.

The timing control unit (800) can receive input image data (RGB) and a control signal (CTRL) from the outside. For example, the input image data (RGB) can be RGB data including red image data, green image data, and blue image data. The control signal (CTRL) can include a vertical synchronization signal, a horizontal synchronization signal, an input data enable signal, a master clock signal, etc. The timing control unit (800) can generate a gate control signal (GCTRL), a data control signal (DCTRL), and image data (RGB') based on the input image data (RGB) and the control signal (CTRL). In addition, the timing control unit (800) can provide the gate control signal (GCTRL) to the gate driver (700) and provide the data control signal (DCTRL) and the image data (RGB') to the data driver (400).

A display device (1000) according to embodiments of the present invention may include first to third lighting inspection transistors (TR1, TR2, TR3) having a first distance (DIS_1) of 7 um or more. Accordingly, charge mobilities of the first to third lighting inspection transistors (TR1, TR2, TR3) may be reduced, and an insulation breakdown phenomenon caused by static electricity generated during a manufacturing process of the display device (1000) may not occur. Accordingly, the display device (1000) may perform a lighting inspection, and through the lighting inspection, whether the display device (1000) is damaged (for example, whether wiring, pixels (PX), etc. are damaged, etc.) may be detected. In addition, since the first to third lighting inspection transistors (TR1, TR2, TR3) may not be short-circuited, display quality may be improved when the display device (1000) is driven.

Although the present invention has been described with reference to exemplary embodiments thereof, it will be understood by those skilled in the art that various modifications and changes may be made therein without departing from the spirit and scope of the present invention as set forth in the claims below.

The present invention can be applied to display devices and electronic devices including the same. For example, the present invention can be applied to high-resolution smart phones, mobile phones, smart pads, smart watches, tablet PCs, vehicle navigation systems, televisions, computer monitors, laptops, etc.

Although the present invention has been described above with reference to exemplary embodiments thereof, it will be understood by those skilled in the art that various modifications and changes may be made to the present invention without departing from the spirit and scope of the present invention as set forth in the claims below.

1000 : Display device 10 : Mosquito plate
20: Mask 100: Substrate
110, 120, 130: 1st to 3rd pixel rows 200: Lighting inspection circuit
300: Demultiplexer 400: Data driver
500: Anti-static circuit DL: Data lines
TR1, TR2, TR3: 1st to 3rd lighting test transistors
240: Active pattern 260: Gate electrode
280: Source electrode 290: Drain electrode
281: 1st contact hole 282: 2nd contact hole
600 : Display panel 700 : Gate driver
800 : Timing Control Unit

Claims (16)

A substrate having a display area and a non-display area positioned adjacent to the display area;
A plurality of pixel rows arranged in the display area on the substrate; and
A lighting inspection circuit section is disposed in the non-display area on the substrate, includes a plurality of lighting inspection transistors, and provides a lighting inspection voltage to the pixel rows,
Each of the above lighting inspection transistors,
An active pattern disposed in the non-display area on the substrate and having a source region, a drain region, and a channel region;
A gate electrode disposed on the active pattern and overlapping the channel region;
An interlayer insulating layer covering the gate electrode, exposing a part of the source region of the active pattern, and including a first contact hole positioned at a distance of 7 um or more from the first side of the gate electrode; and
A display device including a source electrode in contact with the source region of the active pattern through the first contact hole. In the first paragraph, the interlayer insulating layer is,
Further comprising a second contact hole positioned at a distance of 7 um or more from the second side of the gate electrode, exposing a portion of the drain region of the active pattern;
Each of the above lighting inspection transistors,
A display device further characterized by comprising a drain electrode in contact with the drain region of the active pattern through the second contact hole. A display device, characterized in that in the second paragraph, a distance at which the first contact hole is spaced from the first side of the gate electrode and a distance at which the second contact hole is spaced from the second side of the gate electrode are the same. A display device according to claim 2, characterized in that the length between the first side and the second side of the gate electrode is 3 um to 4 um. A display device, characterized in that in the second paragraph, the distance between the first contact hole and the second contact hole is 17 um or more. In the second paragraph, each of the lighting inspection transistors,
Further comprising a gate insulating layer interposed between the substrate and the interlayer insulating layer and covering the active pattern,
A display device, characterized in that each of the first and second contact holes penetrates the gate insulating layer to expose a portion of each of the source and drain regions of the active pattern. In the second paragraph,
Further comprising a data driver arranged in the non-display area on the substrate and generating a data voltage,
A display device, characterized in that the lighting inspection circuit unit is arranged between the pixel rows and the data driving unit. In Article 7,
Further comprising a demultiplexer arranged between the lighting inspection circuit and the pixel rows in the non-display area on the substrate,
A display device, characterized in that the demultiplexer receives the data voltage from the data driving unit and provides the data voltage to the pixel columns. A display device, characterized in that in claim 8, the source electrode is positioned adjacent to the data driving unit, and the drain electrode is positioned adjacent to the demultiplexer. In the first paragraph,
Further comprising an anti-static circuit section disposed in the non-display area on the substrate, electrically connected to the lighting inspection circuit section, and measuring the voltage level of the lighting inspection voltage;
A display device characterized in that when the static electricity prevention circuit measures the voltage level of the lighting inspection voltage as being higher than a preset voltage level, the lighting inspection voltage is not supplied to the lighting inspection transistors. A display device, characterized in that in claim 10, the maximum distance at which the first contact hole is spaced from the first side of the gate electrode of each of the lighting inspection transistors is determined in response to the preset voltage. In the first paragraph, the pixel rows are
A first pixel column in which a first pixel displaying a first color and a second pixel displaying a second color are repeatedly arranged;
a second pixel array in which a third pixel representing a third color is arranged; and
A display device characterized by including a third pixel row in which the second pixel and the first pixel are repeatedly arranged. A display device, characterized in that in claim 12, the lighting inspection circuit unit alternately applies the lighting inspection voltage to the first pixel and the second pixel included in the first pixel column and the third pixel column. In the 13th paragraph, the lighting inspection transistors include a first lighting inspection transistor, a second lighting inspection transistor, and a third lighting inspection transistor,
The first and second lighting inspection transistors are electrically connected to the first pixel row and the third pixel row,
A display device, characterized in that the third lighting inspection transistor is electrically connected to the second pixel row. In the 14th paragraph, the lighting inspection voltage includes a first lighting inspection voltage, a second lighting inspection voltage, and a third lighting inspection voltage,
The first lighting inspection transistor provides the first lighting inspection voltage to the first pixel based on the first inspection control signal,
The second lighting inspection transistor provides the second lighting inspection voltage to the second pixel based on the second inspection control signal,
A display device, characterized in that the third lighting inspection transistor provides the third lighting inspection voltage to the third pixel based on a third inspection control signal. In the first paragraph,
A data driver that generates a data voltage provided to the above pixel rows;
A gate driver for generating a scan signal provided to the above pixel rows; and
A display device further comprising a timing control unit that generates a control signal for controlling the data driving unit and the gate driving unit.