KR102809640B1 - Apparatus and method for measuring lift time of light emitting device, and record media recoded program for implement thereof - Google Patents

Abstract

According to one embodiment of the present specification, a life-span measuring device of a light-emitting element includes a chamber having a stage, at least one light-emitting panel disposed on the stage and including at least one light-emitting element, a signal supply unit which applies a test signal to the at least one light-emitting panel during each of first to nth (n is a natural number greater than or equal to 2) test periods of each of first to mth (m is a natural number greater than or equal to 2) panel life-span measuring periods and applies an aging signal to the at least one light-emitting panel during each aging period between the first to nth test periods, a luminance detection unit which detects luminance of the at least one light-emitting element during each of the first to nth test periods, and a control unit which analyzes the life-span of the at least one light-emitting element based on a luminance detection value supplied from the luminance detection unit, wherein the test signal may be variable during each of the first to nth test periods.

Description

{APPARATUS AND METHOD FOR MEASURING LIFT TIME OF LIGHT EMITTING DEVICE, AND RECORD MEDIA RECODED PROGRAM FOR IMPLEMENT THEREOF}

The present specification relates to a device and method for measuring the life of a light-emitting element, and a recording medium having recorded thereon a program for performing the method.

Light-emitting elements have many advantages, such as self-luminescence, high efficiency, wide viewing angle, fast response speed, and low power consumption, and are used as light sources for display elements and lighting.

Light-emitting elements can be classified into inorganic light-emitting elements and organic light-emitting elements depending on whether they are inorganic or organic. The brightness of a light-emitting element decreases with the driving time from the initial driving point. The time it takes for the initial brightness at the initial driving point to decrease to half of the initial brightness as the driving time elapses is usually referred to as the lifespan of the light-emitting element, and the lifespan of the light-emitting element is the most important factor in commercializing the light-emitting element.

The lifespan characteristics of a light-emitting element can be analyzed by measuring the brightness of the light-emitting element within a short period of time while applying a relatively high aging brightness (or high aging current) to the light-emitting element, and converting this to normal operating conditions.

However, since the general life measurement device and method of a light-emitting element can only measure at a single brightness, there is a problem in that the causes affecting the life of the light-emitting element, such as the driving method of the light-emitting element, cannot be analyzed in detail.

The inventor of the present invention recognized the problems of general light-emitting device life measurement devices and methods, and conducted several experiments to implement a light-emitting device life measurement device and method capable of measuring the life change of a light-emitting device by luminance (or by gradation). Through several experiments, a novel light-emitting device life measurement device and method capable of measuring the life change of a light-emitting device by luminance (or by gradation) were invented.

The problem to be solved according to an embodiment of the present specification is to provide a device and method for measuring the lifespan of a light-emitting element capable of measuring a change in the lifespan according to the brightness of the light-emitting element, and a recording medium having recorded thereon a program for performing the method.

In addition, the problem solved by the embodiment of the present specification is to provide a device and method for measuring the lifespan of a light-emitting element capable of measuring a change in the lifespan of the light-emitting element by luminance in aging luminance units, and a recording medium having recorded thereon a program for performing the method.

The problems to be solved by the examples of this specification are not limited to the problems mentioned above, and other problems not mentioned can be clearly understood by a person having ordinary knowledge in the technical field to which the technical idea of this specification belongs from the description below.

According to one embodiment of the present specification, a life-span measuring device of a light-emitting element includes a chamber having a stage, at least one light-emitting panel disposed on the stage and including at least one light-emitting element, a signal supply unit which applies a test signal to the at least one light-emitting panel during each of first to nth (n is a natural number greater than or equal to 2) test periods of each of first to mth (m is a natural number greater than or equal to 2) panel life-span measuring periods and applies an aging signal to the at least one light-emitting panel during each aging period between the first to nth test periods, a luminance detection unit which detects luminance of the at least one light-emitting element during each of the first to nth test periods, and a control unit which analyzes the life-span of the at least one light-emitting element based on a luminance detection value supplied from the luminance detection unit, wherein the test signal may be variable during each of the first to nth test periods.

A method for measuring the life of a light-emitting element according to one embodiment of the present specification is a method for measuring the life of a light-emitting element for at least one light-emitting panel including at least one light-emitting element, comprising: a step of applying a test signal to at least one light-emitting panel during each of first to nth (n is a natural number greater than or equal to 2) test periods of each of first to mth (m is a natural number greater than or equal to 2) panel life-measuring periods; a step of detecting the luminance of at least one light-emitting element through a luminance detection unit during each of the first to nth test periods; a step of applying an aging signal to at least one light-emitting panel during each aging period between the first to nth test periods; and a step of analyzing the life of the at least one light-emitting element based on a luminance detection signal supplied from the luminance detection unit, wherein the test signal may be variable during each of the first to nth test periods.

Specific details according to various examples of this specification other than the means of solving the problems mentioned above are included in the description and drawings below.

Some embodiments of the present specification have the effect of measuring and analyzing changes in the lifetime of a light-emitting device according to its luminance.

Some embodiments of the present specification have the effect of measuring and analyzing changes in luminance-by-luminance life of a light emitting element in aging luminance units.

Since the contents of the problems to be solved, the means for solving the problems, and the effects mentioned above do not specify the essential features of the claims, the scope of the rights of the claims is not limited by the matters described in the contents of the invention.

FIG. 1 is a drawing showing a life measurement device of a light emitting element according to one embodiment of the present specification.
Figure 2 is a drawing showing the light-emitting panel illustrated in Figure 1.
FIG. 3 is a drawing showing a panel life measurement period for a light emitting element according to one embodiment of the present specification.
FIG. 4a is a diagram showing a test signal and an aging signal according to one embodiment of the present specification.
Figure 4b is an enlarged view of the 'A' portion shown in Figure 4a.
FIG. 5 is a diagram showing a test signal and an aging signal according to another embodiment of the present specification.
FIG. 6a is a diagram showing a test signal and an aging signal according to another embodiment of the present specification.
Figure 6b is an enlarged view of the 'B' portion shown in Figure 6a.
FIGS. 7A and 7B are diagrams showing a test signal and an aging signal according to another embodiment of the present specification.
FIG. 8 is a drawing showing a life measuring device of a light emitting element according to another embodiment of the present specification.
FIGS. 9A to 9I are graphs showing the luminous intensity versus the driving time of a light-emitting element according to the luminance measured by a life-span measuring device and method of a light-emitting element according to an embodiment of the present specification.

The advantages and features of the present specification and the method for achieving them will become clear with reference to the embodiments described in detail below together with the accompanying drawings. However, the present specification is not limited to the embodiments disclosed below, but may be implemented in various different forms, and the present embodiments are provided only to make the disclosure of the present specification complete and to fully inform a person having ordinary skill in the art to which the present specification belongs of the scope of the invention, and the present specification is defined only by the scope of the claims.

The shapes, sizes, ratios, angles, numbers, etc. disclosed in the drawings for explaining the embodiments of the present specification are illustrative and therefore the present specification is not limited to the matters illustrated. Like reference numerals refer to like elements throughout the specification. In addition, in describing the present specification, if it is determined that a detailed description of a related known technology may unnecessarily obscure the gist of the present specification, the detailed description will be omitted. When the terms “includes,” “has,” “consists of,” etc. are used in the present specification, other parts may be added unless “only” is used. When a component is expressed in the singular, it includes a case where the plural is included unless there is a specifically explicit description.

When interpreting a component, it is interpreted as including the error range even if there is no separate explicit description of the error range.

When describing a positional relationship, for example, when the positional relationship between two parts is described as "on," "above," "below," "next to," etc., there may be one or more other parts located between the two parts, unless, for example, "right" or "directly" is used.

When describing a temporal relationship, if the temporal continuity is described as "after," "following," "next to," "before," etc., it can also include cases where it is not continuous, as long as "right away" or "directly" is not used.

Although the terms first, second, etc. are used to describe various components, these components are not limited by these terms. These terms are only used to distinguish one component from another. Thus, a first component referred to below may also be a second component within the technical scope of this specification.

"At least one" should be understood to include any combination of one or more of the associated components. For example, "at least one of the first, second, and third components" could be understood to include any combination of two or more of the first, second, and third components, as well as the first, second, or third components.

The individual features of the various embodiments of the present specification may be partially or wholly combined or combined with each other, and may be technically interconnected and operated in various ways, and the individual embodiments may be implemented independently of each other or implemented together in a related relationship.

Hereinafter, examples of the present specification will be described with reference to the attached drawings and examples. The scale of the components illustrated in the drawings is different from the actual scale for convenience of explanation, and is therefore not limited to the scale illustrated in the drawings.

FIG. 1 is a drawing showing a life measuring device of a light emitting element according to one embodiment of the present specification, and FIG. 2 is a drawing showing the light emitting panel shown in FIG. 1.

Referring to FIGS. 1 and 2, a life measurement device of a light-emitting element according to one embodiment of the present specification may include a chamber (10), at least one light-emitting panel (100), a signal supply unit (20), a brightness detection unit (30), and a control unit (40).

The chamber (10) includes a process space for measuring the lifetime of a light-emitting element. The chamber (10) according to one embodiment may include a stage (11).

The stage (11) can be placed on the inner bottom surface of the chamber (10).

A stage (11) according to one embodiment is fixed to the inner floor surface of the chamber (10) and can support a light-emitting panel (100) loaded from a panel loading/unloading device.

A stage (11) according to one embodiment may be implemented to move a loaded light-emitting panel (100) in a first direction (or X-axis direction) (X) and/or a second direction (or Y-axis direction) (Y) intersecting the first direction (X). Furthermore, the stage (11) may be implemented to elevate the loaded light-emitting panel (100) in a third direction (or Z-axis direction) (Z) perpendicular to the first direction (X).

The process space of the chamber (10) including the stage (11) can be configured to correspond to the life measurement environment of the light emitting element. For example, the process space of the chamber (10) can be maintained in a high temperature and high humidity atmosphere. To this end, the process space of the chamber (10) can be connected to a chamber environment control device. The chamber environment control device can be configured to always keep the temperature and humidity of the process space of the chamber (10) constant during the period of measuring the life of the light emitting element.

At least one light-emitting panel (100) can be loaded onto the stage (11) by a panel loading/unloading device. At least one light-emitting panel (100) for which the life measurement process of the light-emitting element has been completed can be unloaded from the stage (11) to the outside of the chamber (10) by the panel loading/unloading device.

At least one light-emitting panel (100) according to one embodiment may include an array of light-emitting elements arranged on a substrate. For example, at least one light-emitting panel (100) may include an array of light-emitting elements according to a passive matrix driving method, but is not limited thereto, and may include an array of light-emitting elements according to an active matrix driving method. In the following description, it is assumed that at least one light-emitting panel (100) includes an array of light-emitting elements according to a passive matrix driving method.

The light emitting element array can include at least one column line (CL1, CL2, CL3), at least one row line (RL1, RL2, RL3), a pad portion (PP), and at least one light emitting element (ED). For example, the light emitting element array can include first to third column lines (CL1, CL2, CL3), first and second row lines (RL1, RL2), a pad portion (PP), and a plurality of light emitting elements (ED).

Each of the first to third column lines (CL1, CL2, CL3) can be arranged parallel to the second direction (Y). For example, each of the first to third column lines (CL1, CL2, CL3) can be represented as a vertical line, a data line, or an anode drive line.

Each of the first and second row lines (RL1, RL2) is arranged parallel to the first direction (X) and can intersect each of the first to third column lines (CL1, CL2, CL3). For example, each of the first and second row lines (RL1, RL2) can be represented as a horizontal line, a scan line, or a cathode drive line.

The pad portion (PP) is arranged at one edge portion of the light-emitting panel (100) and may include a plurality of pads that are connected one-to-one with each of the first to third column lines (CL1, CL2, CL3) and the first and second row lines (RL1, RL2). The pad portion (PP) is electrically contacted with a jig (or pad contact module) arranged on the stage (11) and may receive a test signal (Tdata) or an aging signal (Sdata) and a scan signal (or a common current or a common power) supplied from a signal supply portion (20) through the jig. For example, the test signal (Tdata) or the aging signal (Sdata) may be individually supplied to each of the first to third column lines (CL1, CL2, CL3). The scan signal (or a common current or a common power) may be individually supplied to each of the first and second row lines (RL1, RL2).

Each of the plurality of light-emitting elements (ED) may be arranged at an intersection area of each of the first to third column lines (CL1, CL2, CL3) and each of the first and second row lines (RL1, RL2). Each of the plurality of light-emitting elements (ED) according to one embodiment may include a first electrode (E1), a light-emitting layer (EL), and a second electrode (E2).

The first electrode (or anode electrode) (E1) can be electrically connected to a corresponding column line (CL1, CL2, CL3) among the first to third column lines (CL1, CL2, CL3). The first electrode (or cathode electrode) (E2) can be electrically connected to a corresponding row line (RL1, RL2) among the first and second row lines (RL1, RL2). For example, the first electrode (E1) of each of the plurality of light-emitting elements (EDs) can be arranged on the corresponding column line (CL1, CL2, CL3). Each of the first and second row lines (RL1, RL2) can be arranged on the second electrode (E2) of the corresponding light-emitting element (ED).

The light-emitting layer (EL) may be interposed between the first electrode (E1) and the second electrode (E1). The light-emitting layer (EL) according to one embodiment may include a hole transport layer and an electron transport layer disposed between the first electrode (E1) and the second electrode (E1), and an organic light-emitting layer disposed between the hole transport layer and the electron transport layer. The light-emitting layer (EL) according to one embodiment may further include a hole injection layer interposed between the first electrode (E1) and the hole transport layer, and an electron injection layer interposed between the second electrode (E2) and the electron transport layer, in order to improve light emission efficiency. When a data signal is applied to the first electrode (E1) and a scan signal (or a common current or a common power source) is applied to the second electrode (E2), the light-emitting layer (EL) may emit light by combination of holes transferred from the first electrode (E1) and electrons transferred from the second electrode (E2).

According to one embodiment, the light emitting panel (100) may include, but is not limited to, first to sixth light emitting elements (ED1 to ED6).

The first to sixth light-emitting elements (ED1 to ED6) may be arranged in a 2x3 configuration, but are not limited thereto.

In a 2×3 configuration, each of the first to third light-emitting elements (ED1, ED2, ED3) may be connected to each of the first internal third column lines (CL1, CL2, CL3) and the first row line (RL1). For example, the first light-emitting element (ED1) may be a red light-emitting element, the second light-emitting element (ED2) may be a green light-emitting element, and the third light-emitting element (ED3) may be a blue light-emitting element, but is not limited thereto.

In a 2×3 configuration, each of the fourth to sixth light-emitting elements (ED4, ED5, ED6) may be connected to each of the first internal third column lines (CL1, CL2, CL3) and the second row line (RL2). For example, the fourth light-emitting element (ED4) may be a blue light-emitting element, the fifth light-emitting element (ED5) may be a green light-emitting element, and the sixth light-emitting element (ED6) may be a red light-emitting element, but is not limited thereto.

At least one light-emitting panel (100) may further include an encapsulating member surrounding the array of light-emitting elements arranged on the substrate. In one example, the encapsulating member may include a plurality of inorganic material layers formed on the substrate to surround the array of light-emitting elements. In another example, the encapsulating member may include an encapsulating substrate bonded to an edge portion of the substrate to surround the array of light-emitting elements.

The signal supply unit (20) can generate a test signal (Tdata) or an aging signal (Sdata) and a scan signal, respectively, under the control of the control unit (40), and apply them to at least one light-emitting panel (100). For example, the test signal (Tdata) can be individually supplied to each of the first internal third column lines (CL1, CL2, CL3) through the jig of the stage (11) and the pad portion (PP) of the light-emitting panel (100). The aging signal (Sdata) can be simultaneously supplied to each of the first internal third column lines (CL1, CL2, CL3) through the jig of the stage (11) and the pad portion (PP) of the light-emitting panel (100). The scan signal (or common current or common power) can be sequentially or simultaneously supplied to each of the first and second row lines (RL1, RL2) through the jig of the stage (11) and the pad portion (PP) of the light-emitting panel (100).

Each of a plurality of light-emitting elements (EDs) arranged on at least one light-emitting panel (100) can individually emit light according to a test signal (Tdata) and a scan signal (or a common current or a common power source), and can simultaneously emit light according to an aging signal (Sdata) and a scan signal (or a common current or a common power source). For example, each of the first to sixth light-emitting elements (ED1 to ED6) can sequentially emit light or individually according to a test signal (Tdata) and a scan signal (or a common current or a common power source). Each of the first to sixth light-emitting elements (ED1 to ED6) can simultaneously emit light according to an aging signal (Sdata) and a scan signal (or a common current or a common power source).

The luminance detection unit (30) is arranged on the stage (11) and can detect the luminance of light emitted from at least one light-emitting element (ED) under the control of the control unit (40). For example, the luminance detection unit (30) is arranged movably on the stage (11) and can detect the luminance of light emitted from at least one light-emitting element (ED) under the control of the control unit (40). The luminance detection unit (30) can detect the luminance of light emitted from at least one light-emitting element (ED), convert the detected luminance into a digital form, and provide the luminance detection value to the control unit (40) in real time. For example, the luminance detection unit (30) can detect the luminance of one light-emitting element (ED) for 10 to 20 seconds, but is not limited thereto.

The brightness detection unit (30) according to one embodiment may include a photo sensor or a photo diode, but is not limited thereto. For example, the brightness detection unit (30) may include a brightness detection camera.

The control unit (40) can control the operation of each of the signal supply unit (20) and the luminance detection unit (30). As illustrated in FIG. 3, the control unit (40) can generate a control signal for life measurement of at least one light-emitting panel (100) loaded onto the stage (11) of the chamber (10) for each of the first to mth panel life measurement periods (LMP1 to LMPm) to control the operation of each of the signal supply unit (20) and the luminance detection unit (30). For example, the panel life measurement periods (LMP1 to LMPm) can be life measurement periods for at least one first light-emitting panel (110) loaded onto the stage (11). Accordingly, each of the first to mth panel life measurement periods (LMP1 to LMPm) can be life measurement periods for different light-emitting panels (110). For example, when measuring the lifespan by loading only one light-emitting panel (110) on the stage (11), lifespan measurements for different light-emitting panels (110) can be performed in the first to mth panel lifespan measurement periods (LMP1 to LMPm). Each of the first to mth panel lifespan measurement periods (LMP1 to LMPm) can include the first to nth test periods (TP1 to TPn), and the first to nth aging periods (AP1 to APn) between the first to nth test periods (TP1 to TPn). Accordingly, the control unit (40) can generate a test synchronization signal (Tsync) corresponding to the first to nth test periods (TP1 to TPn) and an aging synchronization signal (Async) corresponding to the first to nth aging periods (AP1 to APn) to control the driving of each of the signal supply unit (20) and the luminance detection unit (30).

According to one embodiment, each of the first to nth test periods (TP1 to TPn) may be set to 10 minutes or less, but is not limited thereto. Each of the first to nth aging periods (AP1 to APn) may be set to 1 hour or more.

According to one embodiment, the control unit (40) may generate a test data variable signal for varying the test signal (Tdata) in each of the first to nth test periods (TP1 to TPn) and provide the test data variable signal to the signal supply unit (20). Accordingly, the signal supply unit (20) may vary the luminance value (or grayscale value) of the test signal (Tdata) applied to the light-emitting element (ED) in each of the first to nth test periods (TP1 to TPn) in response to the test data variable signal supplied from the control unit (40). For example, the test data variable signal may include luminance value (or grayscale value) information of the test signals (Tdata) to be varied.

According to one embodiment, the control unit (40) can generate a test data variable signal for varying the luminance value (or grayscale value) of the test signal (Tdata) at least twice in each of the first to nth test periods (TP1 to TPn). Accordingly, the signal supply unit (20) can vary the luminance value (or grayscale value) of the test signal (Tdata) applied to the light-emitting element (ED) at least twice in each of the first to nth test periods (TP1 to TPn) in response to the test data variable signal supplied from the control unit (40). For example, the signal supply unit (20) may apply a first test signal (Tdata) having a first luminance value (or a first grayscale value) to the light-emitting element (ED) in each of the first to nth test periods (TP1 to TPn), and then apply a second test signal (Tdata) having a second grayscale value different from the first luminance value (or the first grayscale value) to the light-emitting element (ED).

According to another embodiment, the control unit (40) can generate a test data variable signal for stepwise decreasing the luminance value (or grayscale value) of the test signal (Tdata) in each of the first to nth test periods (TP1 to TPn). Accordingly, the signal supply unit (20) can stepwise decrease the luminance value (or grayscale value) of the test signal (Tdata) applied to the light-emitting element (ED) in each of the first to nth test periods (TP1 to TPn) in response to the test data variable signal supplied from the control unit (40). For example, the signal supply unit (20) may apply a first test signal (Tdata) having a first luminance value (or a first grayscale value) to the light-emitting element (ED) in each of the first to nth test periods (TP1 to TPn), and then apply a second test signal (Tdata) having a second grayscale value lower than the first luminance value (or the first grayscale value) to the light-emitting element (ED).

According to one embodiment, the luminance detection unit (30) may detect the luminance of light emitted from the light-emitting element (ED) emitting light by the first test signal (Tdata) in each of the first to nth test periods (TP1 to TPn) and provide the same to the control unit (40), and may detect the luminance of light emitted from the light-emitting element (ED) emitting light by the second test signal (Tdata) and provide the same to the control unit (40). For example, the luminance detection unit (30) may detect the luminance of light of each of the first to sixth light-emitting elements (ED1 to ED6) emitting light by the first test signal (Tdata) and the second test signal (Tdata) in each of the first to nth test periods (TP1 to TPn), for each light-emitting element, and convert the detected luminance into a luminance detection value in digital form and provide the same to the control unit (40). As a result, the brightness detection unit (30) can provide brightness detection values for each test period and brightness for each of the first to sixth light-emitting elements (ED1 to ED6) to the control unit (40).

According to one embodiment, the control unit (40) may generate an aging data variable signal to maintain the aging signal (Sdata) at the same luminance value (or grayscale value) in each of the first to mth panel life measurement periods (LMP1 to LMPm) or vary the aging signal (Sdata) to different luminance values (or grayscale values) in each of the first to mth panel life measurement periods (LMP1 to LMPm), and provide the generated aging data variable signal to the signal supply unit (20). Accordingly, the signal supply unit (20) may maintain the aging signal (Sdata) at the same luminance value (or grayscale value) in each of the first to mth panel life measurement periods (LMP1 to LMPm) or vary the aging signal (Sdata) applied to the light emitting element (ED) to different luminance values (or grayscale values) in each of the first to mth panel life measurement periods (LMP1 to LMPm) in response to the aging data variable signal supplied from the control unit (40).

The control unit (40) can analyze the lifespan of at least one light-emitting element based on the luminance detection value supplied from the luminance detection unit (30). According to one embodiment, the control unit (40) can analyze the lifespan of each of the first to sixth light-emitting elements (ED1 to ED6) based on the luminance detection value for each luminance of each of the first to nth test periods (TP1 to TPn) supplied from the luminance detection unit (30). For example, the control unit (40) normalizes the luminance detection value for each luminance of each of the first to nth test periods (TP1 to TPn) for each of the first to sixth light-emitting elements (ED1 to ED6) to calculate the luminance intensity for each luminance-specific driving time of each of the first to sixth light-emitting elements (ED1 to ED6), and can store it in a storage device or display it on the screen of a display device.

FIG. 4a is a diagram showing a test signal and an aging signal according to one embodiment of the present specification, and FIG. 4b is an enlarged view of a portion 'A' shown in FIG. 4a.

Referring to FIGS. 1, 2, 4a, and 4b, a test signal (Tdata) according to one embodiment of the present specification can be varied at least twice in each of the first to nth test periods (TP1 to TPn) of the first to mth panel life measurement periods (LMP1 to LMPm). For example, a luminance value (or grayscale value) of the test signal (Tdata) can be gradually reduced in each of the first to nth test periods (TP1 to TPn).

According to one embodiment, the test signal (Tdata) can be stepwise and evenly varied in each of the first to i-th measurement periods (MP1 to MPi) set in each of the first to n-th test periods (TP1 to TPn). For example, the luminance value (or grayscale value) of the test signal (Tdata) can be stepwise and evenly decreased from the first measurement period (MP1) to the i-th measurement period (MPi) of each of the first to n-th test periods (TP1 to TPn). For example, the test signal (Tdata) can be decreased by a preset luminance value (or grayscale value) from the luminance value (or grayscale value) of the first measurement period (MP1) to the i-th measurement period (MPi).

According to one embodiment, when each of the first to nth test periods (TP1 to TPn) includes the first to tenth measurement periods (MP1 to MP10), the luminance value (or grayscale value) of the test signal (Tdata) may be evenly reduced in a stepwise manner from the first measurement period (MP1) to the tenth measurement period (MP10). For example, assuming that the maximum luminance value (or maximum grayscale value) of the test signal (Tdata) is 1200 nit, the luminance value (or grayscale value) of the test signal (Tdata) may be reduced in a stepwise manner by 120 nit from the first measurement period (MP1) to the tenth measurement period (MP10). In this case, the test signal (Tdata) applied in the first measurement period (MP1) may have a luminance value of 1200 nit, the test signal (Tdata) applied in the second measurement period (MP2) may have a luminance value of 1080 nit, and the test signal (Tdata) applied in the 10th measurement period (MP10) may have a luminance value of 120 nit.

According to one embodiment, the luminance detection unit (30) can sequentially detect the luminance of each of the first to sixth light-emitting elements (ED1 to ED6) that sequentially emit light in units of the first to tenth measurement periods (MP1 to MP10) in each of the first to nth test periods (TP1 to TPn). For example, the luminance detection unit (30) can sequentially detect the luminance of the first light-emitting element (ED1) that emits light by the test signal (Tdata) corresponding to each of the first to tenth measurement periods (MP1 to MP10) for each measurement period, and then sequentially detect the luminance of the second light-emitting element (ED2) that emits light by the test signal (Tdata) corresponding to each of the first to tenth measurement periods (MP1 to MP10) for each measurement period. In this way, the luminance of each of the third to sixth light-emitting elements (ED3 to ED6) for each measurement period (MP1 to MP10) can be sequentially detected. For example, when luminance detection in one measurement period is considered as one luminance detection, the luminance detection unit (30) performs luminance detection 10 times for each light-emitting element during one test period (TP1 to TPn), thereby performing a total of 60 luminance detections, thereby detecting the luminance of each of the first to sixth light-emitting elements (ED1 to ED6) for each measurement period of the first to nth test periods. For example, each of the first to tenth measurement periods (MP1 to MP10) can be set in a range of 10 to 20 seconds.

An aging signal (Sdata) according to one embodiment of the present specification may be simultaneously supplied to a plurality of light emitting elements (ED1 to ED6) during each aging period (AP1 to APn) between the first to nth test periods (TP1 to TPn). For example, the aging signal (Sdata) may be set to a maximum luminance value (or maximum grayscale value) of the test signal (Tdata). For example, the aging signal (Sdata) may have the same luminance value (or grayscale value) during each aging period (AP1 to APn) of the first to mth panel life measurement periods (LMP1 to LMPm). For example, the aging signal (Sdata) may always have the same luminance value (or grayscale value) regardless of the first to mth panel life measurement periods (LMP1 to LMPm) and the aging periods (AP1 to APn).

Referring to FIGS. 1, 2, 4a, and 4b, a method for measuring the life of a light-emitting device according to the present specification is described as follows.

At least one light-emitting panel (100) including at least one light-emitting element (ED) is loaded onto the stage (11) of the chamber (10). Then, the brightness detection unit (30) is aligned on at least one light-emitting panel (100). Here, the light-emitting panel (100) may be in a stabilized state by performing an initial aging period (APini) process.

Next, a test signal (Tdata) is applied to at least one light-emitting panel (ED) during each of the first to nth test periods (TP1 to TPn) of the first to mth panel life measurement periods (LMP1 to LMPm) through a signal supply unit (20), the test signal (Tdata) is varied at least twice during each of the first to nth test periods (TP1 to TPn), and the brightness of the light-emitting element (ED) emitting light by the test signal (Tdata) is detected through a brightness detection unit (30).

For example, the luminance value (or grayscale value) of the test signal (Tdata) applied to the first light-emitting element (ED1) is evenly reduced in stages from the first measurement period (MP1) to the tenth measurement period (MP10), and the luminance of the first light-emitting element (ED1) emitting light by the test signal (Tdata) corresponding to each of the first to tenth measurement periods (MP1 to MP10) can be sequentially detected for each measurement period through the luminance detection unit (30). Next, the luminance value (or grayscale value) of the test signal (Tdata) applied to the second light-emitting element (ED2) is gradually and evenly reduced from the first measurement period (MP1) to the tenth measurement period (MP10), and the luminance of the first light-emitting element (ED1) emitting light by the test signal (Tdata) corresponding to each of the first to tenth measurement periods (MP1 to MP10) can be sequentially detected for each measurement period through the luminance detection unit (30). In this way, the luminance value (or grayscale value) of the test signal (Tdata) applied to each of the remaining third to sixth light-emitting elements (ED3 to ED6) can be gradually and evenly reduced from the first measurement period (MP1) to the tenth measurement period (MP10), and the luminance of each of the third to sixth light-emitting elements (ED3 to ED6) can be sequentially detected for each measurement period through the luminance detection unit (30).

Next, for each of the first to i-th measurement periods (MP1 to MPi), an average value of the luminance detection values for each of the first to sixth light-emitting elements (ED1 to ED6) detected by the luminance detection unit (30) is calculated, and based on this, the luminance values for each of the first to sixth light-emitting elements (ED1 to ED6) are calculated, and based on the luminance values for each of the first to sixth light-emitting elements (ED1 to ED6) in each of the measurement periods, the lifetime for each of the first to sixth light-emitting elements (ED1 to ED6) can be analyzed for luminance (or grayscale). For example, the control unit (40) normalizes the luminance values for each measurement period of each of the first to nth test periods (TP1 to TPn) for each of the first to sixth light-emitting elements (ED1 to ED6), calculates the luminance intensity for each driving time for each of the first to sixth light-emitting elements (ED1 to ED6), and stores this in a storage device or displays it on the screen of a display device.

Therefore, the life measurement device and life measurement method of a light-emitting element according to the present embodiment can measure the change in life of the light-emitting element (ED) according to the luminance by detecting the luminance of the light-emitting element (ED) according to the test signal by varying the test signal (Tdata) supplied to the light-emitting element (ED) in each of the first to nth test periods (TP1 to TPn).

FIG. 5 is a diagram showing a test signal and an aging signal according to another embodiment of the present specification.

Referring to FIGS. 1 to 3 and 5, a test signal (Tdata) according to another embodiment of the present specification is identical to the test signal (Tdata) described in FIGS. 4a and 4b, and therefore, a duplicate description thereof is omitted.

According to another embodiment of the present specification, the aging signal (Sdata) may be varied to a different luminance value (or grayscale value) in at least one of the first to mth panel life measurement periods (LMP1 to LMPm). For example, the aging signal (Sdata) applied to at least one light-emitting panel (110) loaded onto the stage (11) in the first panel life measurement period (LMP1) may have a luminance value (or grayscale value) equal to a maximum luminance value (or maximum grayscale value) of the test signal (Tdata). The aging signal (Sdata) applied to at least one other light-emitting panel (110) newly loaded onto the stage (11) in the jth panel life measurement period (LMPj) among the first to mth panel life measurement periods (LMP1 to LMPm) may have a lower luminance value (or grayscale value) than the aging signal (Sdata) in the first panel life measurement period (LMP1). For example, the aging signal (Sdata) in the first panel life measurement period (LMP1) may have a luminance value of 1200 nit, and the aging signal (Sdata) in the jth panel life measurement period (LMPj) may have a luminance value less than 1200 nit. For example, the aging signal (Sdata) in the jth panel life measurement period (LMPj) may have a luminance value of 600 nit or a luminance value of 300 nit.

The life measurement method of a light-emitting element based on the test signal and aging signal illustrated in Fig. 5 is the same as the life measurement method of a light-emitting element described in Figs. 4a and 4b except that the aging signal is changed for each aging period (AP1 to APn), and therefore, a description thereof is omitted.

Therefore, the life measurement device and life measurement method of a light emitting element according to the present embodiment can measure the change in the life of the light emitting element by brightness of the light emitting element (ED) in units of aging brightness by varying the brightness value (or grayscale value) of the aging signal (Sdata) in each of the first to mth panel life measurement periods (LMP1 to LMPm), and by varying the test signal supplied to the light emitting element (ED) in each of the first to nth test periods (TP1 to TPn) of each of the first to mth panel life measurement periods (LMP1 to LMPm).

FIG. 6a is a diagram showing a test signal and an aging signal according to another embodiment of the present specification, and FIG. 6b is an enlarged view of a portion 'B' shown in FIG. 6a, which only changes the test signal shown in FIG. 4a. Accordingly, a description of the remaining components in FIG. 6a and FIG. 6b excluding the test signal is omitted because it overlaps with the description of FIG. 4a and FIG. 4b.

Referring to FIGS. 1, 2, 6A, and 6B, a test signal (Tdata) according to another embodiment of the present specification may be stepwise and unequally varied in each of the first to i-th measurement periods (MP1 to MPi) set in each of the first to n-th test periods (TP1 to TPn). For example, a luminance value (or grayscale value) of the test signal (Tdata) may be stepwise and unequally decreased from the first measurement period (MP1) to the i-th measurement period (MPi) of each of the first to n-th test periods (TP1 to TPn). For example, the test signal (Tdata) may be stepwise decreased from a luminance value (or grayscale value) of the first measurement period (MP1) to a preset luminance value (or grayscale value) in the i-th measurement period (MPi).

According to one embodiment, when each of the first to nth test periods (TP1 to TPn) includes the first to tenth measurement periods (MP1 to MP10), the luminance value (or grayscale value) of the test signal (Tdata) can be decreased stepwise and unevenly from the first measurement period (MP1) to the tenth measurement period (MP10). For example, assuming that the maximum luminance value (or maximum gradation value) of the test signal (Tdata) is 1200 nit, the test signal (Tdata) applied in the first measurement period (MP1) has a luminance value of 1200 nit, the test signal (Tdata) applied in the second measurement period (MP2) has a luminance value of 600 nit, the test signal (Tdata) applied in the third measurement period (MP3) has a luminance value of 300 nit, the test signal (Tdata) applied in the fourth measurement period (MP4) has a luminance value of 200 nit, the test signal (Tdata) applied in the fifth measurement period (MP5) has a luminance value of 100 nit, the test signal (Tdata) applied in the sixth measurement period (MP6) has a luminance value of 80 nit, the test signal (Tdata) applied in the seventh measurement period (MP7) has a luminance value of 50 nit, and The test signal (Tdata) applied to the 8th measurement period (MP8) may have a luminance value of 20 nit, the test signal (Tdata) applied to the 9th measurement period (MP9) may have a luminance value of 10 nit, and the test signal (Tdata) applied to the 10th measurement period (MP10) may have a luminance value of 2 nit, but is not limited thereto, and may be set to various luminance values (or grayscale values) according to the maximum luminance of the light-emitting element and the first to tenth measurement periods.

According to another embodiment, with respect to the luminance of half of the maximum luminance of the light emitting element (ED), the decrease in luminance value per measurement period may be large in a high luminance region, and the decrease in luminance value per measurement period may be small in a low luminance region. In this case, the life of the light emitting element for the low luminance region can be measured more precisely.

According to another embodiment, with respect to the luminance of half of the maximum luminance of the light emitting element (ED), the decrease in luminance value per measurement period may be small in a high luminance region, and the decrease in luminance value per measurement period may be large in a low luminance region. In this case, the life of the light emitting element for the high luminance region can be measured more precisely.

Referring to FIGS. 1, 2, 6A, and 6B, a method for measuring the life of a light-emitting device according to the present specification is described as follows.

At least one light-emitting panel (100) including at least one light-emitting element (ED) is loaded onto the stage (11) of the chamber (10). Then, the brightness detection unit (30) is aligned on at least one light-emitting panel (100). Here, the light-emitting panel (100) may be in a stabilized state by performing an initial aging period (APini) process.

Next, a test signal (Tdata) is applied to at least one light-emitting panel (ED) during each of the first to nth test periods (TP1 to TPn) of the first to mth panel life measurement periods (LMP1 to LMPm) through a signal supply unit (20), and a luminance value (or grayscale value) of the test signal (Tdata) is gradually and unevenly reduced from the first measurement period (MP1) to the tenth measurement period (MP10) in each of the first to nth test periods (TP1 to TPn), and the luminance of the light-emitting element (ED) emitting light by the test signal (Tdata) is detected through a luminance detection unit (30).

For example, the luminance value (or grayscale value) of the test signal (Tdata) applied to the first light-emitting element (ED1) may be gradually and unevenly reduced from the first measurement period (MP1) to the tenth measurement period (MP10), and the luminance of the first light-emitting element (ED1) emitting light by the test signal (Tdata) corresponding to each of the first to tenth measurement periods (MP1 to MP10) may be sequentially detected for each measurement period through the luminance detection unit (30). Next, the luminance value (or grayscale value) of the test signal (Tdata) applied to the second light-emitting element (ED2) is gradually and unevenly reduced from the first measurement period (MP1) to the tenth measurement period (MP10), and the luminance of the first light-emitting element (ED1) emitting light by the test signal (Tdata) corresponding to each of the first to tenth measurement periods (MP1 to MP10) can be sequentially detected for each measurement period through the luminance detection unit (30). In this way, the luminance value (or grayscale value) of the test signal (Tdata) applied to each of the remaining third to sixth light-emitting elements (ED3 to ED6) is gradually and unevenly reduced from the first measurement period (MP1) to the tenth measurement period (MP10), and the luminance of each of the third to sixth light-emitting elements (ED3 to ED6) can be sequentially detected for each measurement period through the luminance detection unit (30).

Next, for each of the first to i-th measurement periods (MP1 to MPi), an average value of the luminance detection values for each of the first to sixth light-emitting elements (ED1 to ED6) detected by the luminance detection unit (30) is calculated, and based on this, the luminance values for each of the first to sixth light-emitting elements (ED1 to ED6) are calculated, and based on the luminance values for each of the first to sixth light-emitting elements (ED1 to ED6) in each of the measurement periods, the lifetime for each of the first to sixth light-emitting elements (ED1 to ED6) can be analyzed for luminance (or grayscale). For example, the control unit (40) normalizes the luminance values for each measurement period of each of the first to nth test periods (TP1 to TPn) for each of the first to sixth light-emitting elements (ED1 to ED6), calculates the luminance intensity for each driving time for each of the first to sixth light-emitting elements (ED1 to ED6), and stores this in a storage device or displays it on the screen of a display device.

Therefore, the life measurement device and life measurement method of a light-emitting element according to the present embodiment can measure the change in life of the light-emitting element (ED) according to the luminance by detecting the luminance of the light-emitting element (ED) according to the test signal by varying the test signal (Tdata) supplied to the light-emitting element (ED) in each of the first to nth test periods (TP1 to TPn).

FIGS. 7A and 7B are diagrams showing a test signal and an aging signal according to another embodiment of the present specification.

Referring to FIGS. 1 to 3, 7a, and 7b, a test signal (Tdata) according to another embodiment of the present specification is identical to the test signal (Tdata) described in FIGS. 6a and 6b, and therefore, a duplicate description thereof is omitted.

According to another embodiment of the present specification, the aging signal (Sdata) may be varied to a different luminance value (or grayscale value) in at least one of the first to mth panel life measurement periods (LMP1 to LMPm). For example, the aging signal (Sdata) applied to at least one light-emitting panel (110) loaded onto the stage (11) in the first panel life measurement period (LMP1) may have a luminance value (or grayscale value) equal to a maximum luminance value (or maximum grayscale value) of the test signal (Tdata). The aging signal (Sdata) applied to at least one other light-emitting panel (110) newly loaded onto the stage (11) in the jth panel life measurement period (LMPj) among the first to mth panel life measurement periods (LMP1 to LMPm) may have a lower luminance value (or grayscale value) than the aging signal (Sdata) in the first panel life measurement period (LMP1). Additionally, the aging signal (Sdata) applied to at least one other light-emitting panel (110) newly loaded onto the stage (11) during the mth panel life measurement period (LMPm) may have a lower luminance value (or grayscale value) than the aging signal (Sdata) during the jth panel life measurement period (LMPj).

According to the present embodiment, the aging signal (Sdata) in the first panel life measurement period (LMP1) can have a luminance value of 1200 nit, the aging signal (Sdata) in the jth panel life measurement period (LMPj) can have a luminance value of 600 nit, and the aging signal (Sdata) in the mth panel life measurement period (LMPm) can have a luminance value of 300 nit.

The method for measuring the life of a light-emitting element based on the test signal and aging signal illustrated in FIGS. 7a and 7b is the same as the method for measuring the life of a light-emitting element described in FIGS. 6a and 6b except that the aging signal is changed for each aging period (AP1 to APn), and therefore, a description thereof is omitted.

Therefore, the life measurement device and life measurement method of a light emitting element according to the present embodiment can measure the change in the life of the light emitting element by brightness of the light emitting element (ED) in units of aging brightness by varying the brightness value (or grayscale value) of the aging signal (Sdata) in each of the first to mth panel life measurement periods (LMP1 to LMPm), and by varying the test signal supplied to the light emitting element (ED) in each of the first to nth test periods (TP1 to TPn) of each of the first to mth panel life measurement periods (LMP1 to LMPm).

FIG. 8 is a drawing showing a life measuring device of a light emitting element according to another embodiment of the present specification.

Referring to FIG. 8, a life measurement device of a light emitting element according to another embodiment of the present specification may include a chamber (10), a plurality of light emitting panels (100), a signal supply unit (20), a brightness detection unit (30), and a control unit (40).

The chamber (10) includes a process space for measuring the life of a light-emitting element. The chamber (10) according to one embodiment may include a stage (11). The stage (11) may be arranged on the inner bottom surface of the chamber (10). The process space of the chamber (10) including the stage (11) may be configured to correspond to an environment for measuring the life of a light-emitting element.

A plurality of light-emitting panels (100) can be loaded onto a stage (11) by a panel loading/unloading device and arranged in a grid shape on the stage (11). At least one light-emitting panel (100) for which the life measurement process of the light-emitting element has been completed can be unloaded from the stage (11) to the outside of the chamber (10) by the panel loading/unloading device. For example, the plurality of light-emitting panels (100) can be arranged in a 6×8 shape, but is not limited thereto.

Since each of the plurality of light-emitting panels (100) is identical to the light-emitting panel (100) illustrated in FIG. 2, a duplicate description thereof will be omitted.

The signal supply unit (20) can generate a test signal (Tdata) or an aging signal (Sdata) and a scan signal respectively according to the control of the control unit (40) and apply them to each of the plurality of light-emitting panels (100). For example, the test signal (Tdata) can be individually applied to the light-emitting elements (ED) of each of the plurality of light-emitting panels (100). The aging signal (Sdata) can be simultaneously applied to the light-emitting elements (ED) of each of the plurality of light-emitting panels (100). The scan signal (or common current or common power) can be individually applied to the light-emitting elements (ED) of each of the plurality of light-emitting panels (100).

The brightness detection unit (30) can be implemented to detect the brightness of each light emitting element (ED) of a plurality of light emitting panels (100) loaded on the stage (11).

According to one embodiment, the luminance detection unit (30) may include a moving module (310) and a luminance detector (330).

The movement module (310) is arranged around the stage (11) and can move the luminance detector (330) on the stage (11). For example, the movement module (310) can move the luminance detector (330) in a first direction (or X-axis direction (X)) and/or a second direction (or Y-axis direction (Y)) on the stage (11).

The moving module (310) according to one embodiment may be a gantry. For example, the moving module (310) may include a pair of first guide rails (311), a pair of first moving blocks (313), a second guide rail (315), and a second moving block (317).

A pair of first guide rails (311) can be arranged parallel to each other along the second direction (Y) with the stage (11) between them.

A pair of first moving blocks (313) are movably arranged on each of a pair of first guide rails (311) and can move in the second direction (Y) along the first guide rails (311). For example, one first moving block (313) can be moved according to a linear motor method, but is not limited thereto, and can be moved according to a ball screw method including a motor and a ball screw.

A second guide rail (315) can be installed between a pair of first moving blocks (313). The second guide rail (315) can be moved in the second direction (Y) according to the movement of the pair of first moving blocks (313).

The second moving block (317) is movably arranged on the second guide rail (315) and can be moved in the first direction (X) along the second guide rail (315). For example, the second moving block (317) can be moved according to a linear motor method, but is not limited thereto, and can be moved according to a ball screw method including a motor and a ball screw.

The luminance detector (330) may be placed on or supported by the second moving block (317) of the moving module (310). The luminance detector (330) may be aligned on one of the plurality of light-emitting panels (100) by moving in the first direction (X) and/or the second direction (Y) on the stage (11) according to the movement of the second guide rail (315) and/or the second moving block (317).

The luminance detector (330) may include, but is not limited to, a photo sensor or a photo diode. For example, the luminance detector (30) may include a luminance detection camera.

In this luminance detection unit (30), when all of the plurality of light-emitting panels (100) are loaded onto the stage (11), the luminance detector (330) is aligned on one of the plurality of light-emitting panels (100) according to the operation of the moving module (310), and can detect the luminance of the light-emitting element (ED) arranged on the light-emitting panel according to the control of the control unit (40) and provide it to the control unit (40).

The signal supply unit (20) can generate a test signal or an aging signal and a scan signal respectively according to the control of the control unit (40) and apply them to the plurality of light-emitting panels (100). For example, the signal supply unit (20) can apply a test signal to a light-emitting panel of a measurement target among the plurality of light-emitting panels (100) based on a set life measurement order, and can apply an aging signal to light-emitting panels other than the light-emitting panel of the measurement target. For example, one of the plurality of light-emitting panels (100) can perform a life measurement process, and the remaining light-emitting panels (100) can perform an aging process.

The control unit (40) can control the operation of each of the signal supply unit (20) and the luminance detection unit (30). The control unit (40) can generate a control signal to drive the light-emitting panel (100) loaded on the stage (11) of the chamber (10) for the first to mth panel life measurement periods (LMP1 to LMPm), as illustrated in FIG. 3, and control the operation of each of the signal supply unit (20) and the luminance detection unit (30). In addition, the control unit (40) can control the signal supply unit (20) so that the test signal and the aging signal illustrated in FIG. 4a, FIG. 5, FIG. 6a, FIG. 7a, or FIG. 7b are applied to the light-emitting panel to be measured, and can control the luminance detection unit (30) so that the luminance of the light-emitting element arranged on the light-emitting panel to be measured is detected in each of the first to nth test periods (TP1 to TPn). Since this control unit (40) is the same as the control unit (40) described in FIGS. 1 to 7b, a duplicate description thereof is omitted.

The method for measuring the life of a light emitting element using the life measuring device of a light emitting element illustrated in FIG. 8 is the same as the life measuring method described in FIG. 4a, FIG. 5, FIG. 6a, FIG. 7a, or FIG. 7b, except that the method detects the luminance of a light emitting element (ED) arranged on a light emitting panel of the measurement target by applying a test signal to the light emitting panel of the measurement target among a plurality of light emitting panels (100) based on a set life measuring order, and simultaneously applies an aging signal to light emitting panels other than the light emitting panel of the measurement target, and therefore, a duplicate description thereof is omitted.

FIGS. 9A to 9I are graphs showing the luminous intensity versus the driving time of a light-emitting element according to the luminance measured by a life-span measuring device and method of a light-emitting element according to an embodiment of the present specification.

In FIGS. 9A to 9I, the graph of G1 represents the luminance intensity when the test luminance has a luminance value of 1200 nit, the graph of G2 represents the luminance value of 600 nit, the graph of G3 represents the luminance value of 300 nit, the graph of G4 represents the luminance value of 200 nit, the graph of G5 represents the luminance value of 100 nit, the graph of G6 represents the luminance value of 80 nit, the graph of G7 represents the luminance value of 50 nit, the graph of G8 represents the luminance value of 20 nit, the graph of G9 represents the luminance value of 10 nit, and the graph of G10 represents the luminance value of 2 nit.

Fig. 9a is a graph showing the luminescence intensity with respect to the driving time for each luminance of a red light-emitting element when aging with an aging luminance having a luminance value of 1200 nit. Through the graph of Fig. 9a, the rate of decrease in luminescence intensity with respect to the driving time for each luminance of the red light-emitting element can be analyzed.

Fig. 9b is a graph showing the luminescence intensity with respect to the driving time for each luminance of a green light-emitting element when aging with an aging luminance having a luminance value of 1200 nit. Through the graph of Fig. 9b, the rate of decrease in luminescence intensity with respect to the driving time for each luminance of the green light-emitting element can be analyzed.

Fig. 9c is a graph showing the luminescence intensity with respect to the driving time for each luminance of a blue light-emitting element when aging with an aging luminance having a luminance value of 1200 nit. Through the graph of Fig. 9c, the rate of decrease in luminescence intensity with respect to the driving time for each luminance of the blue light-emitting element can be analyzed.

Fig. 9d is a graph showing the luminescence intensity with respect to the driving time for each luminance of a red light-emitting element when aging with an aging luminance having a luminance value of 600 nit. Through the graph of Fig. 9d, the rate of decrease in luminescence intensity with respect to the driving time for each luminance of the red light-emitting element can be analyzed.

Fig. 9e is a graph showing the luminescence intensity with respect to the driving time for each luminance of a green light-emitting element when aging with an aging luminance having a luminance value of 600 nit. Through the graph of Fig. 9e, the rate of decrease in luminescence intensity with respect to the driving time for each luminance of the green light-emitting element can be analyzed.

Fig. 9f is a graph showing the luminescence intensity with respect to the driving time for each luminance of a blue light-emitting element when aging with an aging luminance having a luminance value of 600 nit. Through the graph of Fig. 9f, the rate of decrease in luminescence intensity with respect to the driving time for each luminance of the blue light-emitting element can be analyzed.

Fig. 9g is a graph showing the luminance intensity versus the driving time for each luminance of a red light-emitting element when aging with an aging luminance having a luminance value of 300 nit. Through the graph of Fig. 9g, the rate of decrease in luminance intensity according to the driving time for each luminance of the red light-emitting element can be analyzed.

Fig. 9h is a graph showing the luminescence intensity with respect to the driving time for each luminance of a green light-emitting element when aging with an aging luminance having a luminance value of 300 nit. Through the graph of Fig. 9h, the rate of decrease in luminescence intensity with respect to the driving time for each luminance of the green light-emitting element can be analyzed.

Fig. 9i is a graph showing the luminescence intensity with respect to the driving time for each luminance of a blue light-emitting element when aging with an aging luminance having a luminance value of 300 nit. Through the graph of Fig. 9i, the rate of decrease in luminescence intensity with respect to the driving time for each luminance of the blue light-emitting element can be analyzed.

Therefore, the device and method for measuring the life of a light-emitting element according to the embodiment of the present specification can detect the luminance of the light-emitting element by varying the luminance value of the test signal in each of the first to nth test periods, thereby calculating the luminance intensity for each luminance-specific driving time of the light-emitting element, thereby analyzing the luminance-specific lifespan change of the light-emitting element, and more specifically analyzing the luminance-specific luminance mechanism of the light-emitting element through the luminance-specific lifespan change of the light-emitting element.

As described above, a method for measuring the life of a light-emitting element using a device for measuring the life of a light-emitting element according to an embodiment of the present specification can be implemented in the form of program commands that can be executed through various computer means and recorded in a computer-readable medium.

A computer-readable medium may include program commands, data files, data structures, etc., either singly or in combination. The computer-readable medium may include all types of recording media (or devices) that store data that can be read by a computer system. For example, a recording medium having recorded thereon a program for performing a method for measuring the life of a light-emitting element according to an embodiment of the present specification may include a hard disk drive (HDD), a solid state disk (SSD), a silicon disk drive (SDD), a ROM, a RAM, a CD-ROM, a magnetic tape, a floppy disk, or an optical data storage device, and may also include one implemented in the form of a carrier wave (e.g., transmission via the Internet).

The device and method for measuring the life of a light-emitting element according to the present specification can be described as follows.

According to some embodiments of the present disclosure, a device for measuring the life of a light-emitting element includes a chamber having a stage, at least one light-emitting panel disposed on the stage and including at least one light-emitting element, a signal supply unit for applying a test signal to the at least one light-emitting panel during each of first to nth (n is a natural number greater than or equal to 2) test periods of first to mth (m is a natural number greater than or equal to 2) panel life measurement periods and for applying an aging signal to the at least one light-emitting panel during each aging period between the first to nth test periods, a luminance detection unit for detecting luminance of the at least one light-emitting element during each of the first to nth test periods, and a control unit for analyzing the life of the at least one light-emitting element based on a luminance detection value supplied from the luminance detection unit, wherein the test signal may be variable during each of the first to nth test periods.

According to some embodiments of the present disclosure, the aging signal can have the same luminance value in each of the first through mth panel life measurement periods or can vary to a different luminance value in at least one of the first through mth panel life measurement periods.

According to some embodiments of the present specification, the luminance detection unit can detect the luminance of at least one light-emitting element for each of the first to i-th measurement periods.

According to some embodiments of the present specification, the control unit calculates an average value of luminance detection values supplied from the luminance detection unit for each of the first to i-th measurement periods as a luminance value for each measurement period corresponding to each of the first to i-th measurement periods, and analyzes a luminance-specific lifespan for at least one light-emitting element based on the luminance values for each measurement period.

According to some embodiments of the present disclosure, at least one light-emitting panel includes a plurality of red, green, and blue light-emitting elements, a test signal is applied to each of first to i-th measurement periods of each of the plurality of red, green, and blue light-emitting elements, an aging signal is applied commonly to each of the plurality of red, green, and blue light-emitting elements for each aging period, and a luminance detection unit can detect luminance of a corresponding light-emitting element for each of the first to i-th measurement periods of each of the plurality of red, green, and blue light-emitting elements.

According to some embodiments of the present specification, the control unit calculates an average value of luminance detection values supplied from the luminance detection unit for each of the first to i-th measurement periods as a luminance value for each measurement period corresponding to each of the first to i-th measurement periods, and analyzes a luminance-specific lifespan for a corresponding light-emitting element based on the luminance value for each measurement period.

A method for measuring the life of a light emitting element according to some embodiments of the present specification is a method for measuring the life of a light emitting element for at least one light emitting panel including at least one light emitting element, comprising: applying a test signal to at least one light emitting panel during each of first to nth (n is a natural number greater than or equal to 2) test periods of each of first to mth (m is a natural number greater than or equal to 2) panel life measurement periods; detecting luminance of the at least one light emitting element through a luminance detection unit during each of the first to nth test periods; applying an aging signal to the at least one light emitting panel during each aging period between the first to nth test periods; and analyzing the life of the at least one light emitting element based on a luminance detection signal supplied from the luminance detection unit, wherein the test signal may be variable during each of the first to nth test periods.

A method for measuring the life of a light emitting element according to some embodiments of the present disclosure may be such that the aging signal has the same luminance value in each of the first to m-th panel life measurement periods or may vary to a different luminance value in at least one of the first to m-th panel life measurement periods.

According to some embodiments of the present disclosure, the test signal can be varied at least twice in each of the first through nth test periods. For example, the test signal can be stepwise decreased in each of the first through nth test periods.

According to some embodiments of the present specification, each of the first to nth test periods includes the first to ith (where i is a natural number greater than or equal to 2) measurement periods, and the test signal can have different luminance values in each of the first to ith measurement periods. For example, the luminance value of the test signal can decrease evenly in a stepwise manner from the first measurement period to the ith measurement period or can decrease unequally in a stepwise manner.

According to some embodiments of the present specification, the step of detecting the luminance of at least one light-emitting element can detect the luminance of at least one light-emitting element in each of the first to i-th measurement periods.

According to some embodiments of the present specification, the step of analyzing the lifespan of at least one light-emitting element may include the step of calculating an average value of luminance detection values supplied from a luminance detection unit for each of the first to i-th measurement periods as a luminance value for each measurement period corresponding to each of the first to i-th measurement periods, and the step of analyzing the luminance-specific lifespan of at least one light-emitting element based on the luminance values for each measurement period.

According to some embodiments of the present disclosure, at least one light-emitting panel includes a plurality of red, green, and blue light-emitting elements, a test signal is applied to each of first to i-th measurement periods of each of the plurality of red, green, and blue light-emitting elements, an aging signal is applied commonly to each of the plurality of red, green, and blue light-emitting elements for each aging period, and the step of detecting luminance of the at least one light-emitting element can detect luminance of a corresponding light-emitting element for each of the first to i-th measurement periods of each of the plurality of red, green, and blue light-emitting elements.

According to some embodiments of the present specification, the step of analyzing the lifespan of at least one light-emitting element may include the step of calculating an average value of luminance detection values supplied from a luminance detection unit for each of the first to i-th measurement periods as a luminance value for each measurement period corresponding to each of the first to i-th measurement periods, and the step of analyzing the luminance-specific lifespan for the corresponding light-emitting element based on the luminance values for each measurement period.

The features, structures, effects, etc. described in the various examples of the present specification described above are included in at least one example of the present specification, and are not necessarily limited to just one example. Furthermore, the features, structures, effects, etc. exemplified in at least one example of the present specification can be combined or modified and implemented in other examples by a person having ordinary knowledge in the field to which the technical idea of the present specification belongs. Therefore, the contents related to such combinations and modifications should be interpreted as being included in the technical scope or rights scope of the present specification.

The present specification described above is not limited to the above-described embodiments and the attached drawings, and it will be apparent to those skilled in the art to which this specification pertains that various substitutions, modifications, and changes are possible within a scope that does not depart from the technical spirit of this specification. Therefore, the scope of this specification is indicated by the claims set forth below, and all changes or modified forms derived from the meaning and scope of the claims and their equivalent concepts should be interpreted as being included in the scope of this specification.

10: Chamber 11: Stage
20: Signal supply section 30: Luminance detection section
40: Control unit 100: Light-emitting panel

Claims (20)

A chamber having a stage;
At least one light-emitting panel disposed on the stage and comprising at least one light-emitting element;
A signal supply unit for applying a test signal or an aging signal to at least one light-emitting panel during each of the first to mth (m is a natural number greater than or equal to 2) panel life measurement periods;
A brightness detection unit for detecting the brightness of at least one light-emitting element; and
A control unit that analyzes the lifespan of at least one light-emitting element based on a brightness detection value supplied from the brightness detection unit,
Each of the first to mth panel life measurement periods includes a test period and an aging period after the test period,
The signal supply unit applies the test signal to the at least one light-emitting panel during the test period, and applies the aging signal to the at least one light-emitting panel during the aging period.
The above luminance detection unit detects the luminance of at least one light-emitting element during the test period,
The above test signal is variable during each of the test periods of the first to mth panel life measurement periods.
A device for measuring the life of a light-emitting element. In paragraph 1,
The above test period includes the first to nth test periods,
A device for measuring the life of a light emitting element, wherein the test signal is varied at least twice in each of the first to nth test periods. In paragraph 1,
The above test period includes the first to nth test periods,
Each of the above first to nth test periods includes the first to ith (i is a natural number greater than or equal to 2) measurement periods,
A device for measuring the life of a light-emitting element, wherein the test signal has different luminance values in each of the first to i-th measurement periods. In the third paragraph,
A device for measuring the life of a light-emitting element, wherein the luminance value of the test signal decreases evenly or unevenly in steps from the first measurement period to the i-th measurement period. In the third paragraph,
A device for measuring the life of a light emitting element, wherein the aging signal has the same luminance value in each of the first to m-th panel life measurement periods or varies to a different luminance value in at least one of the first to m-th panel life measurement periods. In any one of paragraphs 3 to 5,
A device for measuring the life of a light-emitting element, wherein the luminance detection unit detects the luminance of at least one light-emitting element for each of the first to i-th measurement periods. In paragraph 6,
A device for measuring the life of a light-emitting element, wherein the control unit calculates an average value of the brightness detection values supplied from the brightness detection unit for each of the first to i-th measurement periods as a brightness value for each measurement period corresponding to each of the first to i-th measurement periods, and analyzes the brightness-specific life of at least one light-emitting element based on the brightness values for each measurement period. In any one of paragraphs 3 to 5,
wherein said at least one light-emitting panel comprises a plurality of red, green, and blue light-emitting elements;
The above test signal is applied to each of the first to i-th measurement periods of each of the plurality of red, green, and blue light-emitting elements,
The above aging signal is commonly applied to each of the plurality of red, green, and blue light-emitting elements for each aging period,
A device for measuring the life of a light-emitting element, wherein the luminance detection unit detects the luminance of the light-emitting element corresponding to each of the first to i-th measurement periods of each of the plurality of red, green, and blue light-emitting elements. In Article 8,
A device for measuring the life of a light-emitting element, wherein the control unit calculates an average value of the luminance detection values supplied from the luminance detection unit for each of the first to i-th measurement periods as a luminance value for each measurement period corresponding to each of the first to i-th measurement periods, and analyzes the luminance-specific life of the corresponding light-emitting element based on the luminance values for each measurement period. A method for measuring the life of a light emitting element for at least one light emitting panel including at least one light emitting element, comprising:
A step of measuring the life of a light emitting element for at least one light emitting panel through a first to mth (m is a natural number greater than or equal to 2) panel life measurement period,
Each of the first to mth panel life measurement periods includes a test period and an aging period after the test period,
The step of measuring the life of the above light-emitting element is:
A step of applying a test signal to the at least one light-emitting panel during the test period and detecting the brightness of the at least one light-emitting element through a brightness detection unit;
a step of applying an aging signal to at least one light-emitting panel during the aging period; and
A step of analyzing the lifespan of at least one light-emitting element based on a brightness detection signal supplied from the brightness detection unit,
The above test signal is variable during each test period of the first to mth panel life measurement periods.
Method for measuring the life of a light-emitting device. In Article 10,
The above test period includes the first to nth test periods,
A method for measuring the life of a light emitting element, wherein the test signal is varied at least twice in each of the first to nth test periods. In Article 11,
A method for measuring the life of a light-emitting element, wherein the test signal has a luminance value that gradually decreases in each of the first to nth test periods. In Article 11,
Each of the above first to nth test periods includes the first to ith (i is a natural number greater than or equal to 2) measurement periods,
A method for measuring the life of a light-emitting element, wherein the test signal has different luminance values in each of the first to i-th measurement periods. In Article 13,
A method for measuring the life of a light-emitting element, wherein the luminance value of the test signal decreases evenly or unevenly in steps from the first measurement period to the i-th measurement period. In Article 13,
A method for measuring the life of a light emitting element, wherein the aging signal has the same luminance value in each of the first to m-th panel life measurement periods or varies to a different luminance value in at least one of the first to m-th panel life measurement periods. In Article 13,
A method for measuring the life of a light-emitting element, wherein the step of detecting the brightness of the at least one light-emitting element detects the brightness of the at least one light-emitting element for each of the first to i-th measurement periods. In Article 16,
The step of analyzing the life of at least one light emitting element comprises:
A step of calculating an average value of the luminance detection values supplied from the luminance detection unit for each of the first to i-th measurement periods as a luminance value for each measurement period corresponding to each of the first to i-th measurement periods; and
A method for measuring the lifespan of a light-emitting element, comprising a step of analyzing the lifespan by luminance for at least one light-emitting element based on the luminance value by the measurement period. In Article 13,
wherein said at least one light-emitting panel comprises a plurality of red, green, and blue light-emitting elements;
The above test signal is applied to each of the first to i-th measurement periods of each of the plurality of red, green, and blue light-emitting elements,
The above aging signal is commonly applied to each of the plurality of red, green, and blue light-emitting elements for each aging period,
A method for measuring the life of a light-emitting element, wherein the step of detecting the brightness of at least one light-emitting element detects the brightness of the light-emitting element corresponding to each of the first to i-th measurement periods of each of the plurality of red, green, and blue light-emitting elements. In Article 18,
The step of analyzing the life of at least one light emitting element comprises:
A step of calculating an average value of the luminance detection values supplied from the luminance detection unit for each of the first to i-th measurement periods as a luminance value for each measurement period corresponding to each of the first to i-th measurement periods; and
A method for measuring the lifespan of a light-emitting element, comprising a step of analyzing the lifespan by luminance for the corresponding light-emitting element based on the luminance value by the above measurement period. A recording medium having recorded thereon a program for performing a method for measuring the lifespan of a light-emitting element according to any one of claims 10 to 19.

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