KR101401803B1 - 패턴 형성 방법 - Google Patents
패턴 형성 방법 Download PDFInfo
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- KR101401803B1 KR101401803B1 KR1020127018415A KR20127018415A KR101401803B1 KR 101401803 B1 KR101401803 B1 KR 101401803B1 KR 1020127018415 A KR1020127018415 A KR 1020127018415A KR 20127018415 A KR20127018415 A KR 20127018415A KR 101401803 B1 KR101401803 B1 KR 101401803B1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D5/00—Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/389—Improvement of the adhesion between the insulating substrate and the metal by the use of a coupling agent, e.g. silane
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0042—Photosensitive materials with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0755—Non-macromolecular compounds containing Si-O, Si-C or Si-N bonds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/095—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having more than one photosensitive layer
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/265—Selective reaction with inorganic or organometallic reagents after image-wise exposure, e.g. silylation
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- H10P76/20—
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/11—Treatments characterised by their effect, e.g. heating, cooling, roughening
- H05K2203/1173—Differences in wettability, e.g. hydrophilic or hydrophobic areas
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/12—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Organic Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Inorganic Chemistry (AREA)
- Catalysts (AREA)
- Materials For Photolithography (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Optical Filters (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
Description
도 2는 본 발명의 제2 실시 형태를 설명하는 설명도이다.
도 3은 본 발명의 실시예의 결과를 나타내는 도면이다.
도 4는 본 발명의 실시예의 결과를 나타내는 도면이다.
도 5는 본 발명의 실시예의 결과를 나타내는 도면이다.
도 6은 본 발명의 실시예의 결과를 나타내는 도면이다.
2, 4, 7, 8, 9ㆍㆍㆍ실란 커플링제,
2A, 2B, 7A, 7B, 7Cㆍㆍ박막,
3, 6ㆍㆍㆍ광촉매,
5ㆍㆍㆍ패턴 형성 재료
Claims (11)
- 대상물의 피처리면에 소망한 패턴을 형성하는 패턴 형성 방법으로서,
상기 피처리면에, 일반 식 (1):
[식 1]
(식 중, R1은 광조사에 의해 탈리(脫離)하는 광반응성 보호기를 나타내고, R2는 R1이 탈리하는 것에 의해 R1과 다른 친발액성(親撥液性)을 가지는 관능기를 생성하는 유기기(有機基)를 나타내고, X1은 알콕시기 또는 할로겐 원자를 나타내고, X2, X3은 수소 원자, 알킬기, 알케닐기, 알콕시기, 할로겐 원자로부터 선택되는 치환기를 나타낸다. X1, X2, X3은 동일해도 달라도 좋다)
로 나타내는 실란 커플링제를 배치하고, 상기 피처리면 상에서 상기 실란 커플링제에 대해서 광촉매를 존재시키는 공정;및
상기 실란 커플링제 및 상기 광촉매에 대해서, 상기 실란 커플링제의 흡수 파장의 광 및 상기 광촉매의 흡수 파장의 광을 포함하는 광을 조사하는 공정을 포함하며,
상기 광조사에 의해 탈리하는 광반응성 보호기는 2-니트로 벤질 유도체 골격을 가지는 치환기, 디메톡시 벤조인기, 2-니트로 피페로닐 옥시카르보닐(NPOC)기, 2-니트로 베라트릴 옥시카르보닐(NVOC)기, α-메틸-2-니트로 피페로닐 옥시카르보닐(MeNPOC)기, α-메틸-2-니트로 베라트릴 옥시카르보닐(MeNVOC)기, 2,6-디니트로 벤질 옥시카르보닐(DNBOC)기, α-메틸-2,6-디니트로 벤질 옥시카르보닐(MeDNBOC)기, 1-(2-니트로 페닐) 에틸 옥시카르보닐(NPEOC)기, 1-메틸-1-(2-니트로 페닐) 에틸 옥시카르보닐(MeNPEOC)기, 9-안트라세닐 메틸 옥시카르보닐(ANMOC)기, 1-피레닐 메틸 옥시카르보닐(PYMOC)기, 3'-메톡시 벤조이닐 옥시카르보닐(MBOC)기, 3',5'-디메톡시 벤조일 옥시카르보닐(DMBOC)기, 7-니트로 인드리닐 옥시카르보닐(NIOC)기, 5,7-디니트로 인드리닐 옥시카르보닐(DNIOC)기, 2-안트라키노닐 메틸 옥시카르보닐(AQMOC)기, α,α-디메틸-3,5-디메톡시 벤질 옥시카르보닐기, 5-브로모-7-니트로 인드리닐 오시키카르보닐(BNIOC)기, 2,2-디메틸-1,3-디옥신기, 2-니트로 벤질 카르바모일기 및 하기의 식 (3) ~ (6)으로 나타내는 보호기로 이루어진 군으로부터 선택되고,
[식 3]
[식 4]
[식 5]
[식 6]
상기 R1과는 다른 친발액성을 가지는 관능기는 아미노기, 히드록실기, 카르복실기, 술포기 및 인산기로 이루어진 군으로부터 선택되는 패턴 형성 방법. - 청구항 1에 있어서,
일반 식 (1)에 있어서 R1이 불소 치환 알킬기를 가지는 것인 패턴 형성 방법. - 청구항 1에 있어서,
상기 광을 조사하는 공정의 후에, 일반 식 (1)에 있어서 R1의 탈리에 의해 일반 식 (1)에 있어서 R2에 생기는 관능기를, R1과는 다른 친발액성을 가지는 치환기로 수식(修飾)하는 공정을 포함하는 패턴 형성 방법. - 청구항 1에 있어서,
상기 실란 커플링제에 대해서 광촉매를 존재시키는 공정은
상기 대상물 상에 상기 실란 커플링제를 배치하는 공정;및
상기 실란 커플링제 상에 상기 광촉매의 분산액을 도포하는 공정을 포함하는 패턴 형성 방법. - 청구항 1에 있어서,
상기 실란 커플링제에 대해서 광촉매를 존재시키는 공정은
상기 대상물 상에 상기 광촉매를 형성 재료로 하는 광촉매층을 형성하는 공정;및
상기 광촉매층 상에 상기 실란 커플링제를 배치하는 공정을 포함하는 패턴 형성 방법. - 청구항 1에 있어서,
상기 실란 커플링제를 도포하는 것에 의해, 상기 실란 커플링제를 배치하는 패턴 형성 방법. - 청구항 1에 있어서,
상기 실란 커플링제 및 상기 광촉매의 흡수 파장이 동일한 파장 대역에 있는 패턴 형성 방법. - 청구항 1에 있어서,
상기 광을 조사한 영역을 상대적으로 발액성(撥液性)의 영역으로 하는 패턴 형성 방법. - 청구항 1에 있어서,
상기 광을 조사한 영역을 상대적으로 친액성(親液性)의 영역으로 하는 패턴 형성 방법. - 청구항 1 내지 청구항 9 중 어느 한 항에 있어서,
상기 광을 조사하는 공정의 후에, 상기 패턴에 있어서 상대적으로 친액성을 발현하는 영역에, 패턴 형성 재료의 용액 또는 분산액을 도포하는 공정을 포함하는 패턴 형성 방법. - 청구항 10에 있어서,
상기 패턴 형성 재료가 도전성 재료인 패턴 형성 방법.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2010-043022 | 2010-02-26 | ||
| JP2010043022 | 2010-02-26 | ||
| PCT/JP2011/053106 WO2011105249A1 (ja) | 2010-02-26 | 2011-02-15 | パターン形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20120102119A KR20120102119A (ko) | 2012-09-17 |
| KR101401803B1 true KR101401803B1 (ko) | 2014-05-29 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020127018415A Active KR101401803B1 (ko) | 2010-02-26 | 2011-02-15 | 패턴 형성 방법 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20130078389A1 (ko) |
| JP (1) | JP5278591B2 (ko) |
| KR (1) | KR101401803B1 (ko) |
| CN (1) | CN102782580B (ko) |
| WO (1) | WO2011105249A1 (ko) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101967589B1 (ko) * | 2012-05-24 | 2019-04-09 | 가부시키가이샤 니콘 | 디바이스 제조 방법 및 기판 처리 방법 |
| JP6824713B2 (ja) * | 2016-11-30 | 2021-02-03 | キヤノン株式会社 | インプリント方法、インプリント装置、型、および物品の製造方法 |
| CN107065444B (zh) * | 2017-01-20 | 2019-03-05 | 中国科学院广州能源研究所 | 一种制备亲疏图案的光刻方法 |
| CN114574187B (zh) * | 2020-11-30 | 2024-03-05 | 北京京东方技术开发有限公司 | 纳米粒子、纳米粒子层图案化的方法及相关应用 |
| JP7732272B2 (ja) * | 2021-08-17 | 2025-09-02 | 株式会社ニコン | 感光性表面処理剤、積層体、トランジスタ、パターン形成方法及びトランジスタの製造方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007206552A (ja) | 2006-02-03 | 2007-08-16 | Asahi Glass Co Ltd | 光処理基材の製造方法 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5378502A (en) * | 1992-09-09 | 1995-01-03 | U.S. Philips Corporation | Method of chemically modifying a surface in accordance with a pattern |
| JP3679943B2 (ja) * | 1999-03-02 | 2005-08-03 | 大日本印刷株式会社 | パターン形成体の製造方法 |
| US6150430A (en) * | 1999-07-06 | 2000-11-21 | Transitions Optical, Inc. | Process for adhering a photochromic coating to a polymeric substrate |
| US6899999B2 (en) * | 2001-03-28 | 2005-05-31 | Kabushiki Kaisha Toshiba | Method of manufacturing composite member, photosensitive composition, porous base material, insulating body and composite member |
| KR100877708B1 (ko) * | 2001-03-29 | 2009-01-07 | 다이니폰 인사츠 가부시키가이샤 | 패턴 형성체의 제조 방법 및 그것에 사용하는 포토마스크 |
| US6973710B2 (en) * | 2001-08-03 | 2005-12-13 | Seiko Epson Corporation | Method and apparatus for making devices |
| JP4236081B2 (ja) * | 2001-10-16 | 2009-03-11 | 大日本印刷株式会社 | パターン形成体の製造方法 |
| JP4201173B2 (ja) * | 2001-11-20 | 2008-12-24 | 大日本印刷株式会社 | パターン形成体の製造方法 |
| US20030215723A1 (en) * | 2002-04-19 | 2003-11-20 | Bearinger Jane P. | Methods and apparatus for selective, oxidative patterning of a surface |
| JP4332360B2 (ja) * | 2003-02-28 | 2009-09-16 | 大日本印刷株式会社 | 濡れ性パターン形成用塗工液およびパターン形成体の製造方法 |
| US7102155B2 (en) * | 2003-09-04 | 2006-09-05 | Hitachi, Ltd. | Electrode substrate, thin film transistor, display device and their production |
| JP4346017B2 (ja) * | 2003-12-12 | 2009-10-14 | 大日本印刷株式会社 | マイクロアレイチップの製造方法 |
| US20060138083A1 (en) * | 2004-10-26 | 2006-06-29 | Declan Ryan | Patterning and alteration of molecules |
| US7517791B2 (en) * | 2004-11-30 | 2009-04-14 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
| US20070158804A1 (en) * | 2006-01-10 | 2007-07-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, manufacturing method of semiconductor device, and RFID tag |
| JP2007246417A (ja) * | 2006-03-14 | 2007-09-27 | Canon Inc | 感光性シランカップリング剤、表面修飾方法、パターン形成方法およびデバイスの製造方法 |
-
2011
- 2011-02-15 WO PCT/JP2011/053106 patent/WO2011105249A1/ja not_active Ceased
- 2011-02-15 KR KR1020127018415A patent/KR101401803B1/ko active Active
- 2011-02-15 CN CN201180010819.0A patent/CN102782580B/zh active Active
- 2011-02-15 JP JP2012501745A patent/JP5278591B2/ja active Active
-
2012
- 2012-08-22 US US13/591,350 patent/US20130078389A1/en not_active Abandoned
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007206552A (ja) | 2006-02-03 | 2007-08-16 | Asahi Glass Co Ltd | 光処理基材の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20130078389A1 (en) | 2013-03-28 |
| KR20120102119A (ko) | 2012-09-17 |
| CN102782580A (zh) | 2012-11-14 |
| CN102782580B (zh) | 2015-04-22 |
| JPWO2011105249A1 (ja) | 2013-06-20 |
| WO2011105249A1 (ja) | 2011-09-01 |
| JP5278591B2 (ja) | 2013-09-04 |
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