KR0165321B1 - 습식 식각 장비 - Google Patents
습식 식각 장비 Download PDFInfo
- Publication number
- KR0165321B1 KR0165321B1 KR1019950059508A KR19950059508A KR0165321B1 KR 0165321 B1 KR0165321 B1 KR 0165321B1 KR 1019950059508 A KR1019950059508 A KR 1019950059508A KR 19950059508 A KR19950059508 A KR 19950059508A KR 0165321 B1 KR0165321 B1 KR 0165321B1
- Authority
- KR
- South Korea
- Prior art keywords
- wafer
- wet etching
- chemical
- temperature
- etching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
-
- H10P50/642—
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30604—Chemical etching
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Weting (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Abstract
Description
Claims (1)
- 적어도 한 개의 웨이퍼를 반응성 화학 약품이 담겨진 용기 상부로부터 투입하여 식각 공정을 수행한 후에 상기 용기 상부로 반출시키는 습식 식각 장비에 있어서, 상기 용기 하부에 설치되어 상기 용기의 하부에 있는 화학 약품의 온도가 상기 용기의 하부에 있는 상기 화학 약품의 온도보다 더 높도록 하는 냉각 수단을 구비하는 것을 특징으로 하는 습식 식각 장비.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950059508A KR0165321B1 (ko) | 1995-12-27 | 1995-12-27 | 습식 식각 장비 |
| TW085104375A TW301778B (en) | 1995-12-27 | 1996-04-12 | Wet etching station and wet etching method adopting the same |
| JP8124327A JPH09186129A (ja) | 1995-12-27 | 1996-05-20 | 湿式蝕刻装置及びこれを利用した湿式蝕刻方法 |
| US08/773,062 US5788800A (en) | 1995-12-27 | 1996-12-24 | Wet etching station and a wet etching method adapted for utilizing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950059508A KR0165321B1 (ko) | 1995-12-27 | 1995-12-27 | 습식 식각 장비 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR970049082A KR970049082A (ko) | 1997-07-29 |
| KR0165321B1 true KR0165321B1 (ko) | 1999-03-20 |
Family
ID=19445219
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950059508A Expired - Fee Related KR0165321B1 (ko) | 1995-12-27 | 1995-12-27 | 습식 식각 장비 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5788800A (ko) |
| JP (1) | JPH09186129A (ko) |
| KR (1) | KR0165321B1 (ko) |
| TW (1) | TW301778B (ko) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5904572A (en) * | 1996-12-24 | 1999-05-18 | Samsung Electronics Co., Ltd. | Wet etching station and a wet etching method adapted for utilizing the same |
| US20070119069A1 (en) * | 2005-11-30 | 2007-05-31 | Youngtack Shim | Electromagnetically-shielded hair drying systems and methods |
| FR3104810B1 (fr) | 2019-12-17 | 2023-03-31 | Soitec Silicon On Insulator | Procede de gravure de substrats comportant une couche mince superficielle, pour ameliorer l’uniformite d’epaisseur de ladite couche |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2802726A (en) * | 1954-10-25 | 1957-08-13 | Turco Products Inc | Method and apparatus for selectively removing metal from a metal part |
| US4053347A (en) * | 1973-03-08 | 1977-10-11 | United States Steel Corporation | Method for forming an internal taper in the walls of a sleeve-like body |
| JPS5568633A (en) * | 1978-11-20 | 1980-05-23 | Fujitsu Ltd | Method and device for back etching of semiconductor substrate |
-
1995
- 1995-12-27 KR KR1019950059508A patent/KR0165321B1/ko not_active Expired - Fee Related
-
1996
- 1996-04-12 TW TW085104375A patent/TW301778B/zh not_active IP Right Cessation
- 1996-05-20 JP JP8124327A patent/JPH09186129A/ja active Pending
- 1996-12-24 US US08/773,062 patent/US5788800A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US5788800A (en) | 1998-08-04 |
| TW301778B (en) | 1997-04-01 |
| KR970049082A (ko) | 1997-07-29 |
| JPH09186129A (ja) | 1997-07-15 |
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