JPS63160355U - - Google Patents
Info
- Publication number
- JPS63160355U JPS63160355U JP5331687U JP5331687U JPS63160355U JP S63160355 U JPS63160355 U JP S63160355U JP 5331687 U JP5331687 U JP 5331687U JP 5331687 U JP5331687 U JP 5331687U JP S63160355 U JPS63160355 U JP S63160355U
- Authority
- JP
- Japan
- Prior art keywords
- piston
- annular
- engine
- utility
- oil passage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001816 cooling Methods 0.000 claims description 4
- 238000002485 combustion reaction Methods 0.000 claims description 2
Description
第１図ａ及びｂはこの考案の第一の実施例の平
面図及び縦断面図、第２図ａ及びｂはこの考案の
第二の実施例の平面図及び縦断面図、第３図は従
来のエンジン用ピストンの断面図である。
１０……ピストン、１２……直接燃焼室用凹所
（被冷却部位）、１４……環状溝（被冷却部位）
、２４，３０……環状冷却パイプ、２６，３２…
…環状オイル通路、２８，３４……ドリル孔。
Figures 1 a and b are a plan view and a vertical sectional view of the first embodiment of this invention, Figures 2 a and b are a plan view and a longitudinal sectional view of the second embodiment of this invention, and Figure 3 is a FIG. 2 is a sectional view of a conventional engine piston. 10... Piston, 12... Direct combustion chamber recess (cooled part), 14... Annular groove (cooled part)
, 24, 30... annular cooling pipe, 26, 32...
...Annular oil passage, 28, 34...Drill hole.
Claims (1)
に鋳込まれる環状冷却パイプと、ピストンの下面
側から延びて上端において前記環状冷却パイプ内
の環状オイル通路に連通しこの環状オイル通路へ
冷却用オイルを導くドリル穴とを有してなること
を特徴とするエンジン用ピストン。 (2) 前記被冷却部位は、ピストンの上面に形成
された直接燃焼室用凹所又はピストンの側面に嵌
着されるトツプリングであることを特徴とする実
用新案登録請求の範囲第１項記載のエンジン用ピ
ストン。[Claims for Utility Model Registration] (1) An annular cooling pipe disposed near the cooled portion of the piston and integrally cast, extending from the lower surface of the piston and communicating with an annular oil passage in the annular cooling pipe at its upper end. A piston for an engine, comprising a drilled hole for guiding cooling oil into the annular oil passage. (2) The cooled portion is a direct combustion chamber recess formed on the upper surface of the piston or a top ring fitted to the side surface of the piston, as described in claim 1 of the utility model registration claim. piston for the engine.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5331687U JPS63160355U (en) | 1987-04-08 | 1987-04-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5331687U JPS63160355U (en) | 1987-04-08 | 1987-04-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63160355U true JPS63160355U (en) | 1988-10-20 |
Family
ID=30879267
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5331687U Pending JPS63160355U (en) | 1987-04-08 | 1987-04-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63160355U (en) |
Cited By (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7138810B2 (en) | 2002-11-08 | 2006-11-21 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
| US7164279B2 (en) | 1995-04-14 | 2007-01-16 | Cascade Microtech, Inc. | System for evaluating probing networks |
| US7176705B2 (en) | 2004-06-07 | 2007-02-13 | Cascade Microtech, Inc. | Thermal optical chuck |
| US7187188B2 (en) | 2003-12-24 | 2007-03-06 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
| US7190181B2 (en) | 1997-06-06 | 2007-03-13 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
| US7221146B2 (en) | 2002-12-13 | 2007-05-22 | Cascade Microtech, Inc. | Guarded tub enclosure |
| US7250626B2 (en) | 2003-10-22 | 2007-07-31 | Cascade Microtech, Inc. | Probe testing structure |
| US7268533B2 (en) | 2001-08-31 | 2007-09-11 | Cascade Microtech, Inc. | Optical testing device |
| US7330041B2 (en) | 2004-06-14 | 2008-02-12 | Cascade Microtech, Inc. | Localizing a temperature of a device for testing |
| US7330023B2 (en) | 1992-06-11 | 2008-02-12 | Cascade Microtech, Inc. | Wafer probe station having a skirting component |
| US7348787B2 (en) | 1992-06-11 | 2008-03-25 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
| US7352168B2 (en) | 2000-09-05 | 2008-04-01 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7368925B2 (en) | 2002-01-25 | 2008-05-06 | Cascade Microtech, Inc. | Probe station with two platens |
| US7498828B2 (en) | 2002-11-25 | 2009-03-03 | Cascade Microtech, Inc. | Probe station with low inductance path |
| US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
| US7554322B2 (en) | 2000-09-05 | 2009-06-30 | Cascade Microtech, Inc. | Probe station |
| US7616017B2 (en) | 1999-06-30 | 2009-11-10 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
-
1987
- 1987-04-08 JP JP5331687U patent/JPS63160355U/ja active Pending
Cited By (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7348787B2 (en) | 1992-06-11 | 2008-03-25 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
| US7330023B2 (en) | 1992-06-11 | 2008-02-12 | Cascade Microtech, Inc. | Wafer probe station having a skirting component |
| US7492147B2 (en) | 1992-06-11 | 2009-02-17 | Cascade Microtech, Inc. | Wafer probe station having a skirting component |
| US7595632B2 (en) | 1992-06-11 | 2009-09-29 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
| US7589518B2 (en) | 1992-06-11 | 2009-09-15 | Cascade Microtech, Inc. | Wafer probe station having a skirting component |
| US7321233B2 (en) | 1995-04-14 | 2008-01-22 | Cascade Microtech, Inc. | System for evaluating probing networks |
| US7164279B2 (en) | 1995-04-14 | 2007-01-16 | Cascade Microtech, Inc. | System for evaluating probing networks |
| US7190181B2 (en) | 1997-06-06 | 2007-03-13 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
| US7626379B2 (en) | 1997-06-06 | 2009-12-01 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
| US7436170B2 (en) | 1997-06-06 | 2008-10-14 | Cascade Microtech, Inc. | Probe station having multiple enclosures |
| US7616017B2 (en) | 1999-06-30 | 2009-11-10 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
| US7554322B2 (en) | 2000-09-05 | 2009-06-30 | Cascade Microtech, Inc. | Probe station |
| US7518358B2 (en) | 2000-09-05 | 2009-04-14 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7352168B2 (en) | 2000-09-05 | 2008-04-01 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7514915B2 (en) | 2000-09-05 | 2009-04-07 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7501810B2 (en) | 2000-09-05 | 2009-03-10 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7423419B2 (en) | 2000-09-05 | 2008-09-09 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7268533B2 (en) | 2001-08-31 | 2007-09-11 | Cascade Microtech, Inc. | Optical testing device |
| US7368925B2 (en) | 2002-01-25 | 2008-05-06 | Cascade Microtech, Inc. | Probe station with two platens |
| US7138810B2 (en) | 2002-11-08 | 2006-11-21 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
| US7498828B2 (en) | 2002-11-25 | 2009-03-03 | Cascade Microtech, Inc. | Probe station with low inductance path |
| US7221146B2 (en) | 2002-12-13 | 2007-05-22 | Cascade Microtech, Inc. | Guarded tub enclosure |
| US7639003B2 (en) | 2002-12-13 | 2009-12-29 | Cascade Microtech, Inc. | Guarded tub enclosure |
| US7250626B2 (en) | 2003-10-22 | 2007-07-31 | Cascade Microtech, Inc. | Probe testing structure |
| US7362115B2 (en) | 2003-12-24 | 2008-04-22 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
| US7187188B2 (en) | 2003-12-24 | 2007-03-06 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
| US7504823B2 (en) | 2004-06-07 | 2009-03-17 | Cascade Microtech, Inc. | Thermal optical chuck |
| US7176705B2 (en) | 2004-06-07 | 2007-02-13 | Cascade Microtech, Inc. | Thermal optical chuck |
| US7330041B2 (en) | 2004-06-14 | 2008-02-12 | Cascade Microtech, Inc. | Localizing a temperature of a device for testing |
| US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |