JPS6128877A - Test system - Google Patents

Abstract

(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

Detailed Description of the Invention (Field of Application of the Invention) The present invention relates to a test system including a test module configured to measure a measurement signal applied from an object to be measured according to a measurement start signal synchronized with the measurement signal. Specifically, this relates to the improvement of the Shintan line, which has been the subject of measurements.

(Prior Art) One type of test system includes a test module configured to measure a measurement signal applied from an object to be measured according to a measurement start signal synchronized with the measurement signal. When using such a test module to measure a signal that changes over time, such as a video signal, at any desired point in time, the test module must be equipped with the same 11J L for measuring the video signal at any desired point in time. It is necessary to add a measurement start signal. FIG. 4 is a 1″ block diagram showing an example of such a conventional device,
An example of a system whose measurement target is a video signal semiconductor device is shown. In FIG. 4, reference numeral 10 denotes a video signal generator, the output signal of which is applied to a semiconductor device 20, which is an object to be measured, and after being amplified, for example, is applied to a test module 30. The test module 30 is composed of, for example, a sample and hold circuit 31, an A/D converter 32, etc., and measures the output (No. 3) of the semiconductor device fFt 20 according to a measurement start signal synchronized with this output signal. This is a measurement start signal generator that generates a measurement start signal for measurement at any desired point in time in synchronization with the output signal of the signal generator 10, and is programmable, for example, to generate a variable pattern according to a predetermined pattern program set in advance. It consists of a pattern generator, and its output signal is applied to the sample and hold circuit 31 of the test module 30. By configuring it in this way, for example, the pattern generator shown in FIG. A video signal vS as shown in FIG.
This allows measurements to be taken at any desired time.

However, with such a conventional configuration, a programmable pattern generator including a high-speed pattern memory must be used as a measurement start signal generator, making the measurement start signal generator module large and expensive. turn into. Furthermore, the setting of measurement points is limited by the capacity of the memory, making it impossible to measure multiple points. Also, 1
It is difficult to control a plurality of tilt modules so that they can each perform measurements at arbitrary times using one measurement start signal generator module. Furthermore, the programmable pattern generator has a disadvantage in that it requires a relatively large number of setting items in order to generate a desired measurement start signal, and that measurement takes time.

(Object of the Invention) The present invention has been made with attention to such points, and its purpose is to perform measurement in which the measurement signal applied from the object to be measured is synchronized with the measurement signal using a relatively simple configuration. The object of the present invention is to provide a test system that can perform measurements at any desired time according to a start signal.

(Summary of the Invention) The present invention achieves the above object in a test system including a test module configured to measure a measurement signal applied from an object to be measured according to a measurement start signal synchronized with the measurement signal. The test module is characterized in that the test module is provided with a means for delaying a signal synchronized with the measurement signal by a predetermined time depending on the purpose of the measurement and using it as a measurement start signal.

(Example) Hereinafter, a detailed explanation will be given using the drawings.

FIG. 1 is a 10-step diagram showing one embodiment of the present invention,
Parts equivalent to those in Fig. 4 are given the same number (d). In Fig.
It generates a signal @SS synchronized with the . 33 is a counter provided in the test module 30, and when the output signal SS of the pulse generator 50 is applied, the measurement n starting signal @MS is sampled and held at the time when a preset waiting time has elapsed. 31.

The operation of the system configured in this way will be explained using FIG. 2. The video signal generator 10 outputs the video signal v sh < as shown in FIG. 2(a) to the semiconductor device 20 which is the object to be measured, and the pulse generator 50 outputs the video signal as shown in FIG. The signal SS synchronized with the video signal ■S as shown is the counter 3 of the test module 30.
3 is output. As a result, the counter 33 outputs the second
As shown in Figure (C), a preset time period, e.g.
A measurement start signal MS is output to the mix hold circuit 31 at a desired arbitrary time point after T2 has elapsed. Immediately after the measurement start signal MS is applied, the sample bold circuit 31 samples and holds the video signal @vS applied from the semiconductor device 20, and the A/D converter 32 converts the sampled and held measurement signal into a digital signal. Convert. Note that the waiting time in the counter 33 can be easily set and changed by software.

With this configuration, it is possible to measure signals whose level changes in a short period of time, such as a video signal, without using a conventional programmable pattern generator, and the number of measurement points can be reduced to less than the memory capacity. There is no limit to the number of measurements, and no man-hours are required for setting measurement points.

Note a3. In the above embodiment, an example was shown in which a signal synchronized with the measurement signal for creating the measurement [llll times signal is waited for from the pulse generator, but the measurement signal may be obtained by branching.

Further, in the above embodiment, an example in which the number of the first module is one has been explained, but it is difficult to have a plurality of modules as shown in FIG. In this case, the common signal output from the measuring object 20 is
Alternatively, each test module 30 may measure various measurement signals output from each part of the object 20 according to the input signal. It's okay.

Furthermore, the measurement signal is not limited to a video signal, and can be applied to various measurements.

(Effects of the Invention) As explained above, according to the present invention, the measurement signal applied from the measurement object can be set at a desired arbitrary point in time according to the measurement start signal synchronized with the measurement signal by relatively simple setup. A test system that can perform measurements can be realized.

[Brief explanation of drawings]

Fig. 1 is a block diagram showing one embodiment of the present invention, Fig. 2 is an explanatory diagram of the operation of Fig. 1, Fig. 3 is a diagram showing another embodiment of the invention, and Fig. 4 is a diagram of a conventional system. FIG. 5 is a block diagram illustrating the operation of FIG. 4 without showing an example. DESCRIPTION OF SYMBOLS 10... BiF'A bow generator, 20... Measurement object (rod conductor device), 30... Test module, 31...
...Ripple hold circuit, 32...△/D converter,
33...Counter, 50...Pulse generator.

Claims (1)

[Claims] In a test system including a test module configured to measure a measurement signal applied from an object to be measured according to a measurement start signal synchronized with the measurement signal, a signal synchronized with the measurement signal is sent to the test module according to a predetermined measurement purpose. What is claimed is: 1. A test system comprising: a means for delaying a period of time to generate a measurement start signal.