JPS5387783A - Minute temperature detecting system - Google Patents
Minute temperature detecting systemInfo
- Publication number
- JPS5387783A JPS5387783A JP223977A JP223977A JPS5387783A JP S5387783 A JPS5387783 A JP S5387783A JP 223977 A JP223977 A JP 223977A JP 223977 A JP223977 A JP 223977A JP S5387783 A JPS5387783 A JP S5387783A
- Authority
- JP
- Japan
- Prior art keywords
- temperature detecting
- detecting system
- minute temperature
- secondary medium
- minute
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 abstract 1
- 230000035945 sensitivity Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/12—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance
- G01K11/16—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance of organic materials
- G01K11/165—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance of organic materials of organic liquid crystals
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radiation Pyrometers (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
PURPOSE:To make possible measurement of temperature of minute portions at high resolution and high sensitivity by forming a secondary medium on the surface of the material to become specimen and applying plural kinds of monochromatic light to said secondary medium.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP52002239A JPS6020691B2 (en) | 1977-01-12 | 1977-01-12 | Minute temperature detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP52002239A JPS6020691B2 (en) | 1977-01-12 | 1977-01-12 | Minute temperature detection method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5387783A true JPS5387783A (en) | 1978-08-02 |
| JPS6020691B2 JPS6020691B2 (en) | 1985-05-23 |
Family
ID=11523796
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP52002239A Expired JPS6020691B2 (en) | 1977-01-12 | 1977-01-12 | Minute temperature detection method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6020691B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59210352A (en) * | 1983-05-16 | 1984-11-29 | Nippon Telegr & Teleph Corp <Ntt> | Method and device for measuring thermal conductivity |
| JPS6029620A (en) * | 1983-07-28 | 1985-02-15 | Nec Kansai Ltd | Detector for liquid crystal temperature |
| US6953281B2 (en) * | 2001-04-21 | 2005-10-11 | Robert Bosch Gmbh | Method for determining temperatures on semiconductor components |
-
1977
- 1977-01-12 JP JP52002239A patent/JPS6020691B2/en not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59210352A (en) * | 1983-05-16 | 1984-11-29 | Nippon Telegr & Teleph Corp <Ntt> | Method and device for measuring thermal conductivity |
| JPS6029620A (en) * | 1983-07-28 | 1985-02-15 | Nec Kansai Ltd | Detector for liquid crystal temperature |
| US6953281B2 (en) * | 2001-04-21 | 2005-10-11 | Robert Bosch Gmbh | Method for determining temperatures on semiconductor components |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6020691B2 (en) | 1985-05-23 |
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