JPH11339958A - Method for manufacturing electroluminescent device - Google Patents
Method for manufacturing electroluminescent deviceInfo
- Publication number
- JPH11339958A JPH11339958A JP10156831A JP15683198A JPH11339958A JP H11339958 A JPH11339958 A JP H11339958A JP 10156831 A JP10156831 A JP 10156831A JP 15683198 A JP15683198 A JP 15683198A JP H11339958 A JPH11339958 A JP H11339958A
- Authority
- JP
- Japan
- Prior art keywords
- cathode
- metal layer
- layer
- electrode
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/17—Passive-matrix OLED displays
- H10K59/173—Passive-matrix OLED displays comprising banks or shadow masks
Landscapes
- Electroluminescent Light Sources (AREA)
Abstract
(57)【要約】 (修正有)
【課題】 微細な電極が形成でき、基板の大型化も図る
ことができ、電極間のショートの発生を防止できる電界
発光素子の製造方法を提供する。
【解決手段】 積層構造のITO膜12と金属層13と
をアノード電極パターンにパターニングし、アノード電
極上の発光部となる領域以外に層間絶縁膜15を形成す
る。層間絶縁膜15上にレジストマスク16をカソード
電極の形成領域を挟むようにパターニングし、有機EL
層18と、カソード金属層19を蒸着により形成する。
この結果、レジストマスク16で挟まれた領域に有機E
L層18とカソード電極19Aが形成される。次に、ラ
イトエッチを行って、レジストマスク16の側壁に付着
したカソード金属層19を除去することにより、レジス
トマスク16上のカソード金属層19とカソード電極1
9Aとを電気的に分離することができる。このため、電
極間のショートの発生を防止することができる。また、
ハードマスクを用いずにカソード電極をパターニングで
きるため、電極をファインピッチ化でき、基板を大型化
できる。
(57) [Summary] (Problem corrected) [PROBLEMS] To provide a method for manufacturing an electroluminescent element which can form a fine electrode, increase the size of a substrate, and prevent a short circuit between electrodes. SOLUTION: An ITO film 12 and a metal layer 13 having a laminated structure are patterned into an anode electrode pattern, and an interlayer insulating film 15 is formed in a region other than a region to become a light emitting portion on the anode electrode. A resist mask 16 is patterned on the interlayer insulating film 15 so as to sandwich the region where the cathode electrode is to be formed.
The layer 18 and the cathode metal layer 19 are formed by vapor deposition.
As a result, the organic E
The L layer 18 and the cathode electrode 19A are formed. Next, the cathode metal layer 19 on the resist mask 16 and the cathode electrode 1 are removed by performing a light etch to remove the cathode metal layer 19 attached to the side wall of the resist mask 16.
9A can be electrically separated. For this reason, the occurrence of a short circuit between the electrodes can be prevented. Also,
Since the cathode electrode can be patterned without using a hard mask, the electrodes can be fine-pitched and the substrate can be enlarged.
Description
【0001】[0001]
【発明の属する技術分野】この発明は電界発光素子の製
造方法に関し、さらに詳しくは、カソード電極の欠陥を
防止できる電界発光素子の製造方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing an electroluminescent device, and more particularly, to a method for manufacturing an electroluminescent device capable of preventing a defect of a cathode electrode.
【0002】[0002]
【従来の技術】近年、有機EL(エレクトロルミネッセ
ンス)材料を発光層に用いた電界発光素子が、その寿命
の向上とともに注目され始めている。このような電界発
光素子は、発光層をカソード電極とアノード電極とで挟
む構造を有している。従来の電界発光素子の製造工程に
おいては、カソード電極の形成に際してハードマスクを
用いた蒸着法が行われていた。その理由は、有機EL材
料を含む発光層及びカソード電極材料が水分や溶剤に弱
いため、フォトリソグラフィー工程で行われるレジスト
のパターニング(現像工程、洗浄工程などを含む)やエ
ッチング工程で用いられるエッチャントなどの影響によ
り、カソード電極のエッジ部が発光層から剥離し易くな
ったり、発光層が変質するなどの弊害が発生するからで
ある。このようなハードマスクを用いたカソード電極の
形成方法では、表示の高精細化に伴う電極の微細化や表
示画面の大型化は困難であった。因に、電極の微細化で
は、0.1mm程度のライン・アンド・スペースが限界
であった。また、微細パターンの開口部が形成された大
型ハードマスクでは、マスク自体の撓みによる変形が発
生するため、形成される電極パターンに誤差が発生し易
いなどの問題点があった。2. Description of the Related Art In recent years, an electroluminescent device using an organic EL (electroluminescence) material for a light emitting layer has been receiving attention as its lifespan has been improved. Such an electroluminescent device has a structure in which a light emitting layer is sandwiched between a cathode electrode and an anode electrode. In a conventional manufacturing process of an electroluminescent device, a vapor deposition method using a hard mask has been performed when forming a cathode electrode. The reason is that the light emitting layer containing the organic EL material and the cathode electrode material are vulnerable to moisture and solvents, so that the resist is patterned in the photolithography process (including the developing process and the cleaning process) and the etchant used in the etching process. This causes adverse effects such as the edge portion of the cathode electrode being easily separated from the light emitting layer and the light emitting layer being deteriorated. With such a method of forming a cathode electrode using a hard mask, it has been difficult to miniaturize the electrode and increase the size of the display screen in accordance with higher definition of display. However, in the miniaturization of the electrode, a line and space of about 0.1 mm has been a limit. Further, in the case of a large-sized hard mask in which an opening of a fine pattern is formed, there is a problem that an error is easily generated in the formed electrode pattern because the mask itself is deformed by bending.
【0003】そこで、ファインピッチのカソード電極の
パターニング技術として、図10や図11に示すような
方法が提案されている。図10に示す方法は、透明基板
1の上にアノード電極としてのITO(indium tin oxi
de)膜2をパターニングした後、カソード電極どうしの
隔壁として逆テーパ状の側壁をもつレジスト3を形成し
て、有機EL層4とカソード金属層5を順次蒸着するも
のである。このようにして有機EL層4がITO膜2と
カソード金属層5で挟まれた発光部が形成でき、レジス
ト3を介して隣接する発光部のカソード金属層5どうし
が分離されるようになっている。また、図11に示す方
法は、断面矩形状のレジスト3を形成して、図中矢印で
示す斜め方向からの蒸着を行うことでカソード金属層5
どうしを分離するというものである。Therefore, as a patterning technique of a fine pitch cathode electrode, a method as shown in FIGS. 10 and 11 has been proposed. The method shown in FIG. 10 uses an ITO (indium tin oxi) as an anode electrode on a transparent substrate 1.
de) After patterning the film 2, a resist 3 having an inversely tapered side wall is formed as a partition between the cathode electrodes, and an organic EL layer 4 and a cathode metal layer 5 are sequentially deposited. In this manner, a light emitting portion in which the organic EL layer 4 is sandwiched between the ITO film 2 and the cathode metal layer 5 can be formed, and the cathode metal layers 5 of the adjacent light emitting portions are separated via the resist 3. I have. In the method shown in FIG. 11, a resist 3 having a rectangular cross section is formed, and the cathode metal layer 5 is formed by performing evaporation from an oblique direction indicated by an arrow in the figure.
It is to separate each other.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、図10
に示した逆テーパ状のレジスト3を用いる方法では、同
図に示すようにレジスト3の側壁の下で有機EL層4の
膜厚が薄くなり、ITO膜2とカソード金属層5とのシ
ョートが発生し易くなるという問題点がある。また、図
11に示した斜め蒸着を行う方法でも、レジスト3の一
方の側壁の下で有機EL層4の膜厚が薄くなるため同様
の問題がある。このような問題は、基板が大型化した場
合には、カソード金属材料の蒸着成分が側壁の下に回り
込む可能性が高くなり、カソードとアノードとの間のシ
ョートや、カソード間のショートが起こり易くなるとい
う問題がある。仮に、有機EL層4の膜厚が薄くなる部
分の上に形成されるカソード金属層5がITO膜2とシ
ョートを起こさないように、発光部を構成する有機EL
層4の上のカソード金属層5の幅が短くなるように形成
すると、今度はカソード金属層5が覆っていない部分の
有機EL層4から酸素や水分などのダークスポットの原
因になる物質の侵入や封止材料の溶剤の侵入などの問題
が発生する。特に、逆テーパ状のレジスト3を用いる方
法では、保護膜や封止材料を成膜した場合にレジスト3
の側壁下部への成膜が不良となり保護機能が低くなると
いう問題が発生する。However, FIG.
In the method using the inversely tapered resist 3 shown in FIG. 1, the thickness of the organic EL layer 4 is reduced below the side wall of the resist 3 as shown in FIG. There is a problem that it is likely to occur. Also, the oblique vapor deposition method shown in FIG. 11 has the same problem because the thickness of the organic EL layer 4 is reduced below one side wall of the resist 3. Such a problem is that when the size of the substrate is increased, there is a high possibility that the vapor deposition component of the cathode metal material goes under the side wall, and a short circuit between the cathode and the anode and a short circuit between the cathodes are likely to occur. Problem. The organic EL constituting the light emitting section is supposed to prevent the cathode metal layer 5 formed on the portion where the film thickness of the organic EL layer 4 becomes thin from causing a short circuit with the ITO film 2.
When the width of the cathode metal layer 5 on the layer 4 is formed to be short, invasion of a substance causing a dark spot such as oxygen or moisture from the organic EL layer 4 in a portion not covered by the cathode metal layer 5. And problems such as penetration of the solvent of the sealing material. In particular, in the method using the resist 3 having a reverse taper shape, the resist 3 is formed when a protective film or a sealing material is formed.
This causes a problem that the film formation on the lower portion of the side wall becomes defective and the protection function is lowered.
【0005】そこで、本発明は、ファインピッチな電極
が形成できると共に、基板の大型化も可能にでき、しか
も、カソード電極とアノード電極との間やカソード電極
どうしのショートの発生を防止できる電界発光素子の製
造方法を提供することを目的としている。Therefore, the present invention provides an electroluminescent device that can form a fine-pitch electrode, increase the size of a substrate, and prevent a short circuit between a cathode electrode and an anode electrode or between cathode electrodes. An object is to provide a method for manufacturing a device.
【0006】[0006]
【課題を解決するための手段】請求項1記載の発明は、
有機発光層をカソード電極とアノード電極とで挟んでな
る発光部を複数備える電界発光素子の製造方法であっ
て、透明基板の上にアノード電極をパターン形成した
後、前記透明基板及び前記アノード電極上に前記発光部
を避けて比較的膜厚の厚いフォトレジストを配置し、発
光表示領域全体に有機発光層とカソード金属層を順次堆
積させた後、前記フォトレジストの側壁に付着したカソ
ード金属層を絶縁させることを特徴としている。According to the first aspect of the present invention,
What is claimed is: 1. A method for manufacturing an electroluminescent device comprising a plurality of light-emitting portions each having an organic light-emitting layer sandwiched between a cathode electrode and an anode electrode, comprising: forming an anode electrode on a transparent substrate; A relatively thick photoresist is disposed avoiding the light-emitting portion, and an organic light-emitting layer and a cathode metal layer are sequentially deposited on the entire light-emitting display area. Then, the cathode metal layer attached to the side wall of the photoresist is removed. It is characterized by being insulated.
【0007】従って、請求項1記載の発明では、フォト
レジストの上から有機発光層とカソード金属層を堆積さ
せることにより、膜厚の厚いフォトレジストの段差によ
り、発光部領域に堆積するものと、フォトレジスト上に
堆積するものとが、段切れまたは段切れしないまでも極
薄い膜となる。このフォトレジスト側壁に形成されたカ
ソード金属層を絶縁させることにより、発光部を覆うカ
ソード電極どうしを電気的に分離することが可能にな
る。また、フォトレジストを形成した後は、フォトリソ
グラフィー工程がないため、カソードへの悪影響を回避
することができる。Therefore, according to the first aspect of the present invention, the organic light emitting layer and the cathode metal layer are deposited over the photoresist, so that the organic light emitting layer and the cathode metal layer are deposited in the light emitting portion region by the step of the thick photoresist. What is deposited on the photoresist becomes a very thin film even if it is stepped or not stepped. By insulating the cathode metal layer formed on the side wall of the photoresist, it becomes possible to electrically separate the cathode electrodes covering the light emitting portion. After the photoresist is formed, there is no photolithography step, so that adverse effects on the cathode can be avoided.
【0008】請求項2記載の発明は、請求項1記載の電
界発光素子の製造方法であって、前記フォトレジストの
側壁に付着したカソード金属層は、ライトエッチングに
より除去されることを特徴としている。According to a second aspect of the present invention, there is provided the method of manufacturing an electroluminescent device according to the first aspect, wherein the cathode metal layer attached to the side wall of the photoresist is removed by light etching. .
【0009】従って、請求項2記載の発明では、請求項
1の発明の作用において、ライトエッチングによりカソ
ード電極を除去することなく、フォトレジストの側壁に
付着した薄いカソード金属層を除去できる。Therefore, according to the second aspect of the present invention, in the operation of the first aspect, the thin cathode metal layer adhered to the side wall of the photoresist can be removed without removing the cathode electrode by light etching.
【0010】請求項3記載の発明は、請求項1記載の電
界発光素子の製造方法であって、前記フォトレジストの
側壁に付着したカソード金属層の厚み分を酸化処理によ
り電気絶縁性をもつ酸化物に変化させることを特徴とす
る。According to a third aspect of the present invention, there is provided the method of manufacturing an electroluminescent device according to the first aspect, wherein the thickness of the cathode metal layer adhered to the side wall of the photoresist is oxidized to have electrical insulation. It is characterized by being changed into an object.
【0011】従って、請求項3記載の発明では、請求項
1の発明の作用において、フォトレジストの側壁に付着
したカソード金属層の厚み分だけ酸化物となるが、薄い
膜厚であるためカソード電極自体が表面酸化される膜厚
も薄く、カソード電極への悪影響は実質的に小さい。According to the third aspect of the present invention, in the operation of the first aspect of the present invention, the oxide is formed by the thickness of the cathode metal layer attached to the side wall of the photoresist. The film thickness of which the surface itself is oxidized is small, and the adverse effect on the cathode electrode is substantially small.
【0012】[0012]
【発明の実施の形態】以下、この発明に係る電界発光素
子の製造方法の詳細を図面に示す実施形態に基づいて説
明する。 (実施形態1)図1〜図8は、アノード電極とカソード
電極とがX−Yマトリクス状に形成されるドット表示を
行う電界発光素子に本発明を適用した実施形態1を示し
ている。まず、図1(a)に示すように、例えばガラス
でなる透明基板11の上に、ITOまたは、In2O
3(ZnO)x(ただしx>0)からなる透明電極材料
膜12を成膜する。次に、透明電極材料膜12の上に、
透明電極材料膜より導電性の高いアルミニウムやクロム
などでなるの単体または合金で構成された金属膜13を
成膜する。なお、透明電極材料膜12及び金属膜13
は、マルチチャンバ成膜装置を用いて連続的に成膜する
ことができる。金属膜13表面を水洗後、金属膜13の
上にフォトレジストを塗布し、露光・現像及びベーキン
グを行ってレジストマスク14をパターニングする。こ
のレジストマスク14は、図1(b)の平面図に示すよ
うに、所定方向(図中横方向)に沿って複数が平行をな
すように形成されている。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The details of a method for manufacturing an electroluminescent device according to the present invention will be described below based on an embodiment shown in the drawings. (Embodiment 1) FIGS. 1 to 8 show Embodiment 1 in which the present invention is applied to an electroluminescent device for displaying dots in which an anode electrode and a cathode electrode are formed in an XY matrix. First, as shown in FIG. 1A, ITO or In 2 O is placed on a transparent substrate 11 made of, for example, glass.
3 A transparent electrode material film 12 of (ZnO) x (where x> 0) is formed. Next, on the transparent electrode material film 12,
A metal film 13 made of a simple substance or an alloy of aluminum, chromium, or the like having higher conductivity than the transparent electrode material film is formed. The transparent electrode material film 12 and the metal film 13
Can be formed continuously using a multi-chamber film forming apparatus. After washing the surface of the metal film 13 with water, a photoresist is applied on the metal film 13, exposed, developed, and baked to pattern the resist mask 14. As shown in the plan view of FIG. 1B, a plurality of the resist masks 14 are formed so as to be parallel in a predetermined direction (horizontal direction in the figure).
【0013】次に、上記したレジストマスク14を用い
て下地の金属膜13及び透明電極材料膜12をウェット
エッチングし、その後レジストマスク14を剥離して図
2に示すようなパターンに加工する。その後、図3
(a)、(b)に示すように、パターニングを施した透
明電極12A及び金属電極膜13Aを覆うように、略基
板全面に、ネガ型光感光性樹脂を成膜した後、露光及び
現像を行い発光領域となる部分に開口部15Aを有する
層間絶縁膜15を形成する。層間絶縁膜15にはカーボ
ンブラックを混入してもよい。この層間絶縁膜15の平
面形状は、図3(b)に示すように、後述するアノード
電極とカソード電極とが交差するそれぞれの領域の輪郭
より内側の領域で開口する開口部15Aが形成されたも
のであり、平面が略格子状に形成されている。Next, the underlying metal film 13 and the transparent electrode material film 12 are wet-etched using the above-described resist mask 14, and then the resist mask 14 is peeled off and processed into a pattern as shown in FIG. Then, FIG.
As shown in (a) and (b), a negative-type photosensitive resin is formed on substantially the entire surface of the substrate so as to cover the patterned transparent electrode 12A and the metal electrode film 13A. Then, an interlayer insulating film 15 having an opening 15A in a portion to be a light emitting region is formed. Carbon black may be mixed in the interlayer insulating film 15. As shown in FIG. 3B, the planar shape of the interlayer insulating film 15 is such that an opening 15A is formed in a region inside a contour of each region where an anode electrode and a cathode electrode to be described later intersect. And the plane is formed in a substantially lattice shape.
【0014】続いて、図4(a)、(b)に示すよう
に、ネガ型感光性樹脂を塗布し、露光・現像及びベーキ
ングを行って20μm程度の絶縁性のレジストマスク1
6を形成する。レジストマスク16は、図4(b)の面
横方向に隣接する発光部となる領域どうしの間の層間絶
縁膜15の中央を通るようにアノード電極(ITO膜1
2及び金属膜13)と交差する方向に沿って形成され、
層間絶縁膜15より幅が狭く設定されている。なお、ア
ノード電極の長手方向の両端部に形成された層間絶縁膜
15上のレジストマスク16は、側壁が層間絶縁膜15
の開口端縁より後退した位置にくるように設定されてい
る。この後、レジストマスク16を用いて金属膜13の
ウェットエッチング(又はドライエッチング)を行って
図5に示すようなパターンに形成する。なお、このエッ
チングに際しては、金属膜13の材料とITO膜12の
材料とのエッチング選択比が充分とれるエッチャントを
用いる。エッチングされた後の金属膜13とITO膜1
2との平面形状は、金属膜13を窓明けしてITO膜1
2が露呈するような形状となる。このようにして、IT
O膜12と金属膜13とでなるアノード電極が形成でき
る。Subsequently, as shown in FIGS. 4A and 4B, a negative photosensitive resin is applied, exposed, developed and baked to form an insulating resist mask 1 of about 20 μm.
6 is formed. The resist mask 16 passes through the anode electrode (the ITO film 1) so as to pass through the center of the interlayer insulating film 15 between the light emitting units adjacent to each other in the lateral direction in FIG.
2 and a metal film 13).
The width is set narrower than the interlayer insulating film 15. Note that the resist mask 16 on the interlayer insulating film 15 formed at both ends in the longitudinal direction of the anode electrode has a side wall of the interlayer insulating film 15.
Is set at a position retracted from the opening edge of the opening. Thereafter, the metal film 13 is subjected to wet etching (or dry etching) using the resist mask 16 to form a pattern as shown in FIG. In this etching, an etchant that has a sufficient etching selectivity between the material of the metal film 13 and the material of the ITO film 12 is used. Metal film 13 and ITO film 1 after being etched
The planar shape of the ITO film 1 is obtained by opening the metal film 13 and opening the ITO film 1.
2 is exposed. In this way, IT
An anode electrode composed of the O film 12 and the metal film 13 can be formed.
【0015】その後、図6に示すように、蒸着によりレ
ジストマスク16より薄い膜厚の有機EL層18を形成
する。このとき、有機EL層18は、レジストマスク1
6の上に形成される部分と、レジストマスク16で挟ま
れた部分の底部に形成される部分とがレジストマスク1
6の段差により、段ぎれを起こして分離した状態で成膜
される。ここで、レジストマスク16で挟まれた部分の
底部に形成された有機EL層18は露出していた層間絶
縁膜15を完全に覆うように形成される。なお、本実施
形態では、図示しないが、有機EL層18が下層から上
層に向けて、順次、有機正孔輸送層、有機発光層、有機
電子輸送層の3層が積層された構造を有している。有機
正孔輸送層としては、例えばN,N'-ジ(α-ナフチル)-
N,N'-ジフェニル-1,1'-ビフェニル-4,4'-ジアミン(α
−NPDという)でなる。また、有機発光層としては、
4,4'-ビス(2,2'-ジフェニルビニレン)ビフェニル(D
PVBiという)が96wt%と、4,4'-ビス(2-カル
バゾールビニレン)ビフェニル(BCzVBiという)
が4wt%とを共蒸着してなる。さらに、有機電子輸送
層としては、トリス(8-ヒドロキシキノリン)アルミニ
ウム(Alq3という)でなる。Thereafter, as shown in FIG. 6, an organic EL layer 18 having a thickness smaller than that of the resist mask 16 is formed by vapor deposition. At this time, the organic EL layer 18 is
6 and the portion formed at the bottom of the portion sandwiched between the resist masks 16
Due to the step 6, the film is formed in a state where the film is separated due to the step. Here, the organic EL layer 18 formed at the bottom of the portion sandwiched between the resist masks 16 is formed so as to completely cover the exposed interlayer insulating film 15. In this embodiment, although not shown, the organic EL layer 18 has a structure in which three layers of an organic hole transport layer, an organic light emitting layer, and an organic electron transport layer are sequentially laminated from a lower layer to an upper layer. ing. Examples of the organic hole transport layer include N, N'-di (α-naphthyl)-
N, N'-diphenyl-1,1'-biphenyl-4,4'-diamine (α
-NPD). Also, as the organic light emitting layer,
4,4'-bis (2,2'-diphenylvinylene) biphenyl (D
PVBi) and 4,4'-bis (2-carbazolevinylene) biphenyl (BCzVBi)
Is formed by co-evaporation with 4 wt%. Further, the organic electron transporting layer is made of tris (8-hydroxyquinoline) aluminum (referred to as Alq3).
【0016】続いて、図7(a)に示すように、Al−
Li、Cr−AlやMg-Inなどを略表示領域全面に
蒸着して膜厚3000Å程度のカソード金属層19を形
成する。このとき同図(a)に示すように、カソード金
属層19がレジストマスク16で段ぎれを起こさずにレ
ジストマスク16の側壁に付着したとしても次に行うラ
イトエッチングで側壁に付着したカソード金属層19を
確実に除去することができる。このライトエッチングの
条件としては、カソード金属をCr−Alで形成した場
合、Crのエッチングガスとして塩素ガスと四塩化ホウ
素ガスとを用い、Alのエッチングガスとして塩素ガス
と酸素ガスを用いる。このようなライトエッチングを行
った結果、図7(b)に示すように側壁のカソード金属
層19が除かれ、アノード電極に直交する方向に互いに
離間して延在するカソード電極19Aが形成できる。こ
のカソード電極19Aは、レジストマスク16上に成膜
された発光に寄与しないカソード金属層19と分離され
ている。このようにして本実施形態の電界発光素子10
の製造が完了する。Subsequently, as shown in FIG.
Li, Cr-Al, Mg-In, or the like is vapor-deposited on substantially the entire display region to form a cathode metal layer 19 having a thickness of about 3000 °. At this time, as shown in FIG. 3A, even if the cathode metal layer 19 adheres to the side wall of the resist mask 16 without causing a step in the resist mask 16, the cathode metal layer adhered to the side wall by the next light etching. 19 can be reliably removed. As conditions for this light etching, when the cathode metal is formed of Cr-Al, chlorine gas and boron tetrachloride gas are used as Cr etching gas, and chlorine gas and oxygen gas are used as Al etching gas. As a result of such light etching, as shown in FIG. 7B, the cathode metal layer 19 on the side wall is removed, and a cathode electrode 19A extending apart from each other in a direction perpendicular to the anode electrode can be formed. The cathode electrode 19A is separated from the cathode metal layer 19 formed on the resist mask 16 and not contributing to light emission. Thus, the electroluminescent device 10 of the present embodiment
Is completed.
【0017】次に、本実施形態の電界発光素子10の作
用について説明する。本実施形態では、アノード電極
は、ITO膜12と金属膜13とで形成される構成とし
たことにより、導電性の高い金属膜13が信号電流の伝
搬速度を速くすることができ、仕事関数の小さいITO
膜12が有機EL層18への正孔の注入性を高めてい
る。このため、信号発生源からの距離によらず各画素が
均一で高輝度に発光することができる。また、有機EL
層18に接合したITO膜12と対向するカソード電極
19Aは仕事関数が高いため、有機EL層18への電子
注入性が高い。アノード電極から注入された正孔とカソ
ード電極19Aから注入された電子とは、有機EL層1
8内で再結合して発光を起こす。また、層間絶縁膜15
の上に形成された有機EL層7は、これらの電極で挟ま
れていないため発光を起こすことはない。Next, the operation of the electroluminescent device 10 of this embodiment will be described. In the present embodiment, the anode electrode is formed by the ITO film 12 and the metal film 13, so that the highly conductive metal film 13 can increase the propagation speed of the signal current, and the work function can be improved. Small ITO
The film 12 enhances hole injection into the organic EL layer 18. For this reason, each pixel can emit light uniformly and with high luminance regardless of the distance from the signal generation source. Also, organic EL
Since the cathode electrode 19A facing the ITO film 12 bonded to the layer 18 has a high work function, the electron injecting property to the organic EL layer 18 is high. The holes injected from the anode electrode and the electrons injected from the cathode electrode 19A correspond to the organic EL layer 1
Recombination within 8 causes emission. Also, the interlayer insulating film 15
The organic EL layer 7 formed thereon does not emit light because it is not sandwiched between these electrodes.
【0018】特に、本実施形態では、カソード電極19
Aの形成に際してレジスト剥離工程がないため、層間絶
縁膜15とカソード電極19Aとの密着性が高いため、
カソード電極19Aの剥がれが発光を起こす有機EL層
18まで進行しにくくなっている。このため、従来のよ
うにハードマスクを用いる必要がなく、微細化や表示部
分の大型化を図ることが可能となり、しかもカソード電
極とアノード電極との間やカソード電極どうしのショー
トの発生を防止できる。そして、アノード電極(ITO
膜12と金属膜13)とカソード電極19Aとの間に
は、有機EL層18及びレジストマスク16より幅広な
層間絶縁膜15が介在しているため、レジストマスク1
6で囲まれた領域を有機EL層18が完全に覆えなくて
も層間絶縁膜15がアノード電極及びカソード電極19
Aとの電気的に絶縁しているので高い歩留まりで製造す
ることができる。Particularly, in this embodiment, the cathode electrode 19
Since there is no resist stripping step in the formation of A, since the adhesion between the interlayer insulating film 15 and the cathode electrode 19A is high,
It is difficult for the peeling of the cathode electrode 19A to proceed to the organic EL layer 18 where light emission occurs. For this reason, it is not necessary to use a hard mask as in the related art, and it is possible to achieve miniaturization and enlargement of a display portion, and it is possible to prevent occurrence of a short circuit between a cathode electrode and an anode electrode or between cathode electrodes. . Then, the anode electrode (ITO
Since the organic EL layer 18 and the interlayer insulating film 15 wider than the resist mask 16 are interposed between the film 12 and the metal film 13) and the cathode electrode 19A, the resist mask 1
Even if the region surrounded by 6 is not completely covered by the organic EL layer 18, the interlayer insulating film 15 forms the anode electrode and the cathode electrode 19.
Since it is electrically insulated from A, it can be manufactured with a high yield.
【0019】(実施形態2)図8は、本発明に係る電界
発光素子の製造方法の実施形態2を示す断面図である。
本実施形態2おいては、上記した実施形態1におけるカ
ソード金属層19を蒸着するまでの工程は同様である。
その後、実施形態1のライトエッチング工程に代えて酸
化処理工程を行う。本実施形態では、図8に示すよう
に、側壁のカソード金属層19をO2プラズマ処理、オ
ゾンプラズマ処理、又はレジスト剥離工程で用いるO2
アッシング処理などを施すことにより側壁のカソード金
属層19を酸化膜20に変えることにより、レジストマ
スク16上に形成されたカソード金属層19とカソード
電極19Aとを電気的に分離することができる。例え
ば、O2アッシング処理を行う場合には、5分間以上の
処理時間でレジストマスク16の側壁に付着したカソー
ド金属層19を酸化膜20に変えることができる。な
お、このような酸化処理を行うことにより、カソード電
極19Aの表面にも酸化膜20は形成されるが極薄い膜
であるため、カソード電極19Aに影響を及ぼすことは
ない。また、本実施形態では、レジストマスク16の側
壁に付着したカソード金属層19はレジストマスク16
の上のカソード金属層19と連続するものであるため、
カソード電極19Aが剥離しにくい構造となると共に、
酸化膜20に変えたことによりカソード電極19Aの剥
がれの進行を抑制する作用を付加することができる。さ
らに、本実施形態では、カソード電極19Aの分離化を
図る際に有機EL層18は雰囲気に晒されることがない
ため、ダークスポットなどの不都合が発生しにくいとい
う利点がある。本実施形態2における他の作用は、上記
した実施形態1と同様であるので説明を省略する。(Embodiment 2) FIG. 8 is a sectional view showing Embodiment 2 of a method for manufacturing an electroluminescent device according to the present invention.
In the second embodiment, the steps up to the deposition of the cathode metal layer 19 in the first embodiment are the same.
After that, an oxidation process is performed instead of the light etching process of the first embodiment. In the present embodiment, as shown in FIG. 8, O 2 using a cathode metal layer 19 on the side wall O 2 plasma treatment, an ozone plasma treatment, or a resist stripping step
The cathode metal layer 19 formed on the resist mask 16 and the cathode electrode 19A can be electrically separated by changing the cathode metal layer 19 on the side wall to an oxide film 20 by performing an ashing process or the like. For example, when performing the O 2 ashing process, the cathode metal layer 19 attached to the side wall of the resist mask 16 can be changed to the oxide film 20 in a processing time of 5 minutes or more. By performing such an oxidation treatment, the oxide film 20 is formed also on the surface of the cathode electrode 19A, but since it is an extremely thin film, it does not affect the cathode electrode 19A. In this embodiment, the cathode metal layer 19 attached to the side wall of the resist mask 16 is
Because it is continuous with the cathode metal layer 19 above
The cathode electrode 19A has a structure that is difficult to peel off,
By changing to the oxide film 20, an effect of suppressing the progress of peeling of the cathode electrode 19A can be added. Furthermore, in the present embodiment, the organic EL layer 18 is not exposed to the atmosphere when the cathode electrode 19A is separated, so that there is an advantage that inconvenience such as a dark spot does not easily occur. Other operations in the second embodiment are the same as those in the first embodiment described above, and a description thereof will be omitted.
【0020】(実施形態3)図9は、本発明に係る電界
発光素子の製造方法の実施形態3を示す断面図である。
本実施形態では、上記した実施形態1においてITO膜
12の上に金属層13を設けず、またレジストマスク1
6も形成しないものであり、他の製造工程は実施形態3
と同様である。なお、同図はライトエッチ工程を終了し
てカソード電極19Aがレジストマスク16の上のカソ
ード金属層19と電気的に分離された状態を示してい
る。なお、本実施形態3の他の作用も上記した実施形態
1と同様である。(Embodiment 3) FIG. 9 is a sectional view showing Embodiment 3 of a method for manufacturing an electroluminescent device according to the present invention.
In the present embodiment, the metal layer 13 is not provided on the ITO film 12 in the first embodiment, and the resist mask 1
6 is not formed, and the other manufacturing steps are the same as those of the third embodiment.
Is the same as The figure shows a state in which the cathode electrode 19A has been electrically separated from the cathode metal layer 19 on the resist mask 16 after the completion of the light etching step. The other operations of the third embodiment are the same as those of the first embodiment.
【0021】以上、実施形態1〜実施形態3について説
明したが、本発明はこれらに限定されるものではなく、
構成の要旨に付随する各種の変更が可能である。例え
ば、上記した実施形態1及び実施形態2では、層間絶縁
膜15の側壁をテーパ状に形成したが、異方性のエッチ
ングにより垂直に立ち上がる側壁としても勿論よい。ま
た、上記した実施形態では有機EL層18を3層構造と
したが、単層構造、2層構造、4層以上の構造としても
よい。Although the first to third embodiments have been described above, the present invention is not limited to these embodiments.
Various changes accompanying the gist of the configuration are possible. For example, in the first and second embodiments described above, the side wall of the interlayer insulating film 15 is formed in a tapered shape, but may be a side wall which rises vertically by anisotropic etching. In the above-described embodiment, the organic EL layer 18 has a three-layer structure, but may have a single-layer structure, a two-layer structure, or a structure having four or more layers.
【0022】[0022]
【発明の効果】以上の説明から明らかなように、この発
明によれば、電界発光素子においてファインピッチな電
極が形成できると共に、基板の大型化も可能となり、し
かもカソード電極とアノード電極との間やカソード電極
どうしの間のショートの発生を防止できるという効果が
ある。As is apparent from the above description, according to the present invention, fine pitch electrodes can be formed in the electroluminescent device, and the substrate can be made large. Also, there is an effect that occurrence of short circuit between cathode electrodes can be prevented.
【図1】(a)は本発明に係る電界発光素子の製造方法
の実施形態1を示す工程断面図、(b)は同平面図。FIG. 1A is a process sectional view showing Embodiment 1 of a method for manufacturing an electroluminescent element according to the present invention, and FIG. 1B is a plan view thereof.
【図2】実施形態1を示す工程断面図。FIG. 2 is a process sectional view showing the first embodiment.
【図3】(a)は実施形態1を示す工程断面図、(b)
は同平面図。FIG. 3A is a process sectional view illustrating the first embodiment, and FIG.
Is a plan view of the same.
【図4】(a)は実施形態1を示す工程断面図、(b)
は同平面図。FIG. 4A is a process sectional view illustrating the first embodiment, and FIG.
Is a plan view of the same.
【図5】実施形態1を示す工程断面図。FIG. 5 is a process sectional view showing the first embodiment.
【図6】実施形態1を示す工程断面図。FIG. 6 is a process sectional view showing the first embodiment.
【図7】(a)及び(b)は実施形態1を示す工程断面
図。FIGS. 7A and 7B are process cross-sectional views showing Embodiment 1. FIGS.
【図8】本発明に係る電界発光素子の製造方法の実施形
態2を示す断面図。FIG. 8 is a sectional view showing Embodiment 2 of the method for manufacturing an electroluminescent element according to the present invention.
【図9】本発明に係る電界発光素子の製造方法の実施形
態3を示す断面図。FIG. 9 is a sectional view showing Embodiment 3 of the method for manufacturing the electroluminescent element according to the present invention.
【図10】従来の電界発光素子の製造方法を示す断面
図。FIG. 10 is a cross-sectional view illustrating a method for manufacturing a conventional electroluminescent device.
【図11】従来の電界発光素子の製造方法を示す断面
図。FIG. 11 is a sectional view showing a method for manufacturing a conventional electroluminescent device.
10 電界発光素子 11 透明基板 12 ITO膜 13 金属層 15 層間絶縁膜 16 レジストマスク 18 有機EL層 19 カソード金属層 19A カソード電極 20 酸化膜 DESCRIPTION OF SYMBOLS 10 Electroluminescent element 11 Transparent substrate 12 ITO film 13 Metal layer 15 Interlayer insulating film 16 Resist mask 18 Organic EL layer 19 Cathode metal layer 19A Cathode electrode 20 Oxide film
Claims (3)
極とで挟んでなる発光部を複数備える電界発光素子の製
造方法であって、 透明基板の上にアノード電極をパターン形成した後、前
記透明基板及び前記アノード電極上に前記発光部を避け
て比較的膜厚の厚いフォトレジストを配置し、発光表示
領域全体に有機発光層とカソード金属層を順次堆積させ
た後、前記フォトレジストの側壁に付着したカソード金
属層を絶縁させることを特徴とする電界発光素子の製造
方法。1. A method for manufacturing an electroluminescent device comprising a plurality of light emitting portions each having an organic light emitting layer sandwiched between a cathode electrode and an anode electrode, comprising: forming a pattern of an anode electrode on a transparent substrate; And disposing a relatively thick photoresist on the anode electrode, avoiding the light-emitting portion, and sequentially depositing an organic light-emitting layer and a cathode metal layer over the entire light-emitting display area, and then adhering to the side wall of the photoresist. A method for manufacturing an electroluminescent device, comprising insulating a formed cathode metal layer.
ソード金属層は、ライトエッチングにより除去されるこ
とを特徴とする請求項1記載の電界発光素子の製造方
法。2. The method according to claim 1, wherein the cathode metal layer attached to the side wall of the photoresist is removed by light etching.
ソード金属層の厚み分を酸化処理により電気絶縁性をも
つ酸化物に変化させることを特徴とする請求項1記載の
電界発光素子の製造方法。3. The method of manufacturing an electroluminescent device according to claim 1, wherein the thickness of the cathode metal layer attached to the side wall of the photoresist is changed into an oxide having electrical insulation by an oxidation treatment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10156831A JPH11339958A (en) | 1998-05-22 | 1998-05-22 | Method for manufacturing electroluminescent device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10156831A JPH11339958A (en) | 1998-05-22 | 1998-05-22 | Method for manufacturing electroluminescent device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH11339958A true JPH11339958A (en) | 1999-12-10 |
Family
ID=15636314
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10156831A Pending JPH11339958A (en) | 1998-05-22 | 1998-05-22 | Method for manufacturing electroluminescent device |
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| Country | Link |
|---|---|
| JP (1) | JPH11339958A (en) |
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-
1998
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