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JPH11326238A - Apparatus for detecting defect of sheet and formation for sheet - Google Patents

Apparatus for detecting defect of sheet and formation for sheet

Info

Publication number
JPH11326238A
JPH11326238A JP6844299A JP6844299A JPH11326238A JP H11326238 A JPH11326238 A JP H11326238A JP 6844299 A JP6844299 A JP 6844299A JP 6844299 A JP6844299 A JP 6844299A JP H11326238 A JPH11326238 A JP H11326238A
Authority
JP
Japan
Prior art keywords
sheet
defect
light
threshold value
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6844299A
Other languages
Japanese (ja)
Inventor
Yasuhiro Nakai
康博 中井
Shuichi Ukawa
修市 宇川
Hajime Hirata
肇 平田
Tetsuya Ito
哲哉 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toray Industries Inc
Original Assignee
Toray Industries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toray Industries Inc filed Critical Toray Industries Inc
Priority to JP6844299A priority Critical patent/JPH11326238A/en
Publication of JPH11326238A publication Critical patent/JPH11326238A/en
Pending legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Nonwoven Fabrics (AREA)

Abstract

PROBLEM TO BE SOLVED: To highly accurately detect defects of even a sheet woven irregularly, by arranging sheet polarizers between the sheet to be measured and a light source, a photodetecting part with specific angles in direction of polarization and detecting bright, dark defects on the basis of binarized data of image signals. SOLUTION: This apparatus has a light source 1 and a photodetecting part 3 with a non-woven cloth 4 held therebetween. Sheet polarizers 2a, 2b are arranged between the non-woven cloth 4 and the light source 1 and between the non-woven cloth 4 and the photodetecting part 3 with approximately 70-110 deg. of directions of polarization. A light from the light source 1 passes the sheet polarizer 2a, non-woven cloth 4 and sheet polarizer 2b to be detected at the photodetecting part 3. The detected light is binarized by a binarization process means 6a to larger, smaller signal values (a), (b) (a>b) than a first threshold value, and larger, smaller signals than a second threshold value smaller than the first threshold value are binarized at a binarization process means 6b to values (b), (c) (b>c). The binarized signals are detected by a defect detection means 7 as bright defects if showing the value (a) to an input signal or as dark defects is showing the value (c). The detected defect is marked by 11 at an end part of the non-woven cloth 4.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、不織布などのシー
トの欠点をインラインで検出するのに好適な装置および
かかる装置を用いたシートの製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus suitable for in-line detecting defects of a sheet such as a nonwoven fabric and a method for producing a sheet using the apparatus.

【0002】[0002]

【従来の技術】光透過性で、かつ光学的異方性をもつシ
ート、たとえば不織布を製造する際、特に延伸、開繊等
の工程においては、ピンホール欠点や、繊維が局所的に
集中することによる膜厚異常欠点、溶融繊維の固まりが
混入することによるドリップ欠点、延伸されない繊維が
混入する未延伸糸欠点などが発生する。そのような欠点
をもつ不織布が製品として出荷されるのをさけるため
に、また、欠点が発生した場合に直ちに製造工程の不具
合箇所を修正して不良製品を造らないようにするために
も、欠点の検出をインラインで確実に行うことが必要と
なってくる。また、不織布は、その構造上、たとえ製品
としては問題にならない程度であっても目付むらの発生
は避けられないため、この目付むらに影響されない欠点
検出が必要である。
2. Description of the Related Art When manufacturing a sheet having optical transparency and optical anisotropy, for example, a non-woven fabric, particularly in a process such as stretching or spreading, a pinhole defect or a local concentration of fibers occurs. As a result, an abnormal film thickness may occur, a drip defect may occur due to the incorporation of the molten fiber mass, and an undrawn yarn defect may occur in which undrawn fibers may enter. In order to prevent non-woven fabrics with such defects from being shipped as products, and to correct defects in the manufacturing process immediately when defects occur so as not to produce defective products, It is necessary to reliably detect inline. Further, in the nonwoven fabric, since the occurrence of unevenness of the fabric is inevitable even if it does not cause a problem as a product, it is necessary to detect a defect which is not affected by the unevenness of the fabric.

【0003】ところで、従来、不織布の欠点検出は目視
に頼っていたが、高速で走行する不織布の地合と欠点を
瞬時に区別して欠点のみを検出するのははなはだ困難な
ことであり、検査が律速となって生産性の向上が難しい
ので、近年、画像処理技術を利用した自動化が検討され
るようになってきた。たとえば、特開平6−18445
号公報には、不織布を挟んで光源と受光部を配置すると
ともに、不織布と光源の間および不織布と受光部の間に
偏光板をその偏光方向が互いに20度以下となるように
配置することによって不織布に発生したピンホール欠点
を検出するようにした装置が記載されている。
Conventionally, the detection of defects in nonwoven fabrics has relied on visual observation. However, it is extremely difficult to detect the defects only by instantaneously distinguishing the formation of the nonwoven fabric running at high speed from the defects. Since it is rate-limiting and it is difficult to improve productivity, automation using image processing technology has recently been considered. For example, Japanese Patent Application Laid-Open No. 6-18445
In the publication, a light source and a light receiving portion are arranged with a non-woven fabric interposed therebetween, and a polarizing plate is arranged between the non-woven fabric and the light source and between the non-woven fabric and the light receiving portion such that the polarization directions thereof are 20 degrees or less with each other. An apparatus for detecting a pinhole defect generated in a nonwoven fabric is described.

【0004】しかしながら、この従来の装置は、目付む
らを有する不織布のピンホール欠点、膜厚異常欠点、ド
リップ欠点について、検出精度が低いという問題があっ
た。すなわち、ピンホール欠点については、偏光板をそ
の偏光方向が互いに20度以下になるように配置してい
るため、不織布を透過する過程で偏波面の方向が変化し
なかった成分のみを検出することになる。したがって、
低目付の部分では光の吸収が少ない上光の偏波面の回転
が少ないので非常に明るく、逆に高目付の部分では反対
に非常に暗くなる。また、ピンホール欠点は低目付の部
分よりもやや明るくなるため、同じピンホール欠点であ
っても発生した場所の地合の明るさによって、得られる
信号強度が異なるのである。また、膜厚異常欠点やドリ
ップ欠点についてもピンホール欠点と同様に発生した場
所の地合の明るさにより、得られる信号強度が異なり、
精度のよい検出は困難であった。
[0004] However, this conventional apparatus has a problem in that the pinhole defect, the abnormal film thickness defect, and the drip defect of the nonwoven fabric having a non-uniform weight are low in detection accuracy. In other words, regarding the pinhole defect, since the polarizing plates are arranged so that the polarization directions thereof are 20 degrees or less with each other, it is necessary to detect only the component in which the direction of the polarization plane has not changed during the transmission through the nonwoven fabric. become. Therefore,
The low-weight portion has very little light absorption and the rotation of the polarization plane of light is small, so that it is very bright, while the high-weight portion has very low brightness. Further, since the pinhole defect is slightly brighter than the low-weight portion, the obtained signal intensity differs depending on the brightness of the formation at the place where the pinhole defect occurs even with the same pinhole defect. In addition, the obtained signal intensity differs depending on the brightness of the formation at the place where the film thickness abnormality defect and the drip defect occur similarly to the pinhole defect,
Accurate detection has been difficult.

【0005】さらに、未延伸糸欠点については、この従
来の装置は光学的異方性をもつ部分を透過する過程で光
強度を弱くするため、未延伸糸欠点部分の信号は地合部
分よりも若干暗くなる程度であり検出はきわめて困難で
あった。
[0005] Further, regarding the undrawn yarn defect, the signal of the undrawn yarn defect portion is smaller than that of the formation portion because the conventional apparatus weakens the light intensity in the process of transmitting through the portion having optical anisotropy. It was a little dark and very difficult to detect.

【0006】[0006]

【発明が解決しようとする課題】本発明の目的は、従来
の技術の上記問題点を解決し、目付むらを有するような
シートであっても、ピンホール欠点、膜厚異常欠点、ド
リップ欠点、未延伸糸欠点を精度よく検出することがで
きる装置およびかかる装置を用いたシートの製造方法を
提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned problems of the prior art, and to provide a pinhole defect, an abnormal film thickness defect, a drip defect, even for a sheet having a non-uniform weight. It is an object of the present invention to provide an apparatus capable of accurately detecting an undrawn yarn defect and a sheet manufacturing method using such an apparatus.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するため
の本発明は、被測定シートを挟んで光源と受光部とを配
置し、受光部で得られた映像信号を画像処理手段で処理
することによってシートの欠点を検出する装置であっ
て、被測定シートと光源との間および被測定シートと受
光部との間に偏光板を偏光方向が互いに70〜110度
の角度をなすように配置するとともに、かつ画像処理装
置に、映像信号を第1閾値によって2値化する第1の2
値化手段と、映像信号を第1閾値よりも低い第2閾値に
よって2値化する第2の2値化手段と、第1、第2の2
値化手段によって得られた2値化データに基づいて、明
暗それぞれの欠点を検出する欠点検出手段とを設けたこ
とを特徴とするものである。
According to the present invention, in order to achieve the above object, a light source and a light receiving section are arranged with a sheet to be measured interposed therebetween, and a video signal obtained by the light receiving section is processed by an image processing means. This is an apparatus for detecting a defect of a sheet by arranging a polarizing plate between the sheet to be measured and the light source and between the sheet to be measured and the light receiving section such that the polarization directions form an angle of 70 to 110 degrees with each other. And binarizes the video signal with the first threshold value in the image processing apparatus.
Binarizing means, second binarizing means for binarizing the video signal with a second threshold lower than the first threshold, first and second binarizing means,
A defect detecting means for detecting each of the light and dark defects based on the binarized data obtained by the value converting means is provided.

【0008】被測定シートとしては、光透過性で光学的
異方性をもつシートであればよく、合成繊維の不織布、
合成樹脂フィルム、紙、ガラス繊維シートのようなもの
である。なかでも、未延伸糸欠点が発生しやすいスパン
ボンド法により製造された不織布への適用が特に好まし
い。不織布の中でも、白色かつ目付量が100g/m 2
以下であるものが透過光量の点で特に好ましい。色が淡
いものは厚みの変動による光透過率の変化と偏波面の回
転による検出光量の変化のバランスをとりやすく、目付
量が小さいものほど目付むらが発生しやすく、本発明の
効果が現れやすい。また、不織布としては、電線の被覆
材に用いられているものへの適用が特に好ましい。電線
の被覆材に用いられる場合、不織布を30mm程度にス
リットし、強い張力をかけながら電線に巻いていく。こ
の工程において、不織布に未延伸糸やドリップ欠点が発
生していると、そこにクラックが発生し、張力によって
不織布が切断される。すると電線を切断して巻き直さな
ければならないという問題が生じる。本発明では、クラ
ックの発生源となる未延伸糸、ドリップ欠点を精度良く
検出することができ、電線の製造工程における不織布の
切断を未然に防ぐことができる。
The sheet to be measured is optically transparent and optical
Any sheet that has anisotropy may be used.
Something like synthetic resin film, paper, glass fiber sheet
It is. Above all, span where undrawn yarn defects are likely to occur
Particularly preferred is application to nonwoven fabrics produced by the bond method.
No. Among non-woven fabrics, white and the basis weight is 100 g / m Two
The following are particularly preferred in terms of the amount of transmitted light. Light color
Light transmittance changes due to thickness fluctuations and polarization
It is easy to balance changes in the detected light amount due to
The smaller the amount, the more likely the unevenness of the weight is to be generated.
The effect is easy to appear. In addition, as a non-woven fabric, the coating of electric wires
It is particularly preferred to apply it to the material used. Electrical wire
When used as a covering material, the nonwoven fabric should be
Lit and wrap it around the wire with strong tension. This
Undrawn yarn and drip defects in the non-woven fabric
When it is growing, cracks occur there, and due to tension
The nonwoven is cut. Then cut the wire and rewind
The problem arises that it must be done. In the present invention,
Precisely remove undrawn yarn and drip defects that cause
It can detect and detect non-woven fabric in the wire manufacturing process.
Cutting can be prevented beforehand.

【0009】また、2つの偏光板の偏光方向の差は、目
付むらを除去できるために90度であるのが最も好まし
い。光源としては、高周波で点灯する蛍光灯が、シート
の幅方向において、より均一に光を照射でき、映像信号
に時間的なノイズがのらないという理由で好ましい。ま
た、受光部としてはCCDカメラを用いることができる
が、画素を線状に配列したラインセンサCCDカメラが
シートの走行方向に対して切れ目なく検査を行うことが
できるという理由で好ましい。さらに好ましくは、画素
を直線状に配列した固体撮像素子を不織布の走行方向に
複数個並べ、不織布の走行速度に同期させて電荷を次々
に隣の固体撮像素子へ蓄積し移動させていく時間積分型
のラインセンサカメラが、偏光板により少なくなった透
過光を感度よく受光できるのでよい。
The difference between the polarization directions of the two polarizing plates is most preferably 90 degrees in order to remove the unevenness in the weight. As a light source, a fluorescent lamp that is turned on at a high frequency is preferable because it can irradiate light more uniformly in the width direction of the sheet and does not have temporal noise in a video signal. Although a CCD camera can be used as the light receiving unit, a line sensor CCD camera in which pixels are arranged in a line is preferable because the inspection can be performed without interruption in the sheet traveling direction. More preferably, a plurality of solid-state imaging devices in which pixels are linearly arranged are arranged in the running direction of the nonwoven fabric, and time integration for accumulating and moving charges one after another to adjacent solid-state imaging devices in synchronization with the running speed of the nonwoven fabric. The line sensor camera of the type can receive transmitted light reduced by the polarizing plate with high sensitivity.

【0010】本発明においては、画像処理装置がシート
の走行方向における映像信号を平均化する平均化処理手
段を備えていることが好ましい。
[0010] In the present invention, it is preferable that the image processing apparatus includes averaging processing means for averaging video signals in the traveling direction of the seat.

【0011】また、画像処理装置が受光部の少なくとも
1回の受光から得られる映像信号から第1の閾値および
第2の閾値を算出する閾値算出手段を備えているのも好
ましい。
It is also preferable that the image processing apparatus includes a threshold value calculating means for calculating a first threshold value and a second threshold value from a video signal obtained from at least one light reception of the light receiving section.

【0012】さらに、被測定シートに欠点の存在を示す
マークを付与するマーキング手段を備えていることが好
ましい。マーキング手段は、シートの端部にマーキング
する手段であるのが好ましい。
Further, it is preferable that the sheet to be measured is provided with marking means for giving a mark indicating the presence of a defect. The marking means is preferably a means for marking the end of the sheet.

【0013】さらにまた、欠点履歴管理手段を備えてい
ることが好ましい。
Further, it is preferable that a defect history management means is provided.

【0014】また、本発明のシートの製造方法は、上記
の欠点検出装置を用いて不織布製造工程を管理すること
を特徴とするものである。
Further, the sheet manufacturing method of the present invention is characterized in that the nonwoven fabric manufacturing process is managed by using the above-mentioned defect detecting device.

【0015】[0015]

【発明の実施の形態】図1において、装置は被測定シー
トとしての不織布4を挟んで光源1と受光部3とを配置
し、不織布4と光源1との間に偏光板2aを、不織布4
と受光部3との間に偏光板2bを偏光方向が互いに70
〜110度の範囲の角度をなすように配置している。受
光部3は2つの2値化処理手段に接続されている。第1
閾値よりも大きい信号を2値化する第1の2値化処理手
段6aと、第2閾値よりも小さい信号を2値化する第2
の2値化処理手段6bは、データバス8を介して欠点検
出手段7と接続されている。これら、第1の2値化処理
手段6a、第2の2値化処理手段6b、欠点検出手段
7、データバス8が画像処理装置5を構成している。さ
らに欠点検出手段7は、マーキング手段11と欠点履歴
管理手段12に接続されている。
FIG. 1 shows an apparatus in which a light source 1 and a light receiving section 3 are arranged with a non-woven fabric 4 as a sheet to be measured interposed therebetween, and a polarizing plate 2a is interposed between the non-woven fabric 4 and the light source 1.
The polarizing plate 2b is placed between the light receiving section 3 and the
They are arranged so as to form an angle in the range of up to 110 degrees. The light receiving section 3 is connected to two binarization processing means. First
A first binarization processing unit 6a for binarizing a signal larger than the threshold value, and a second binarization unit for binarizing a signal smaller than the second threshold value
The binarization processing means 6b is connected to the defect detection means 7 via the data bus 8. The first binarization processing unit 6a, the second binarization processing unit 6b, the defect detection unit 7, and the data bus 8 constitute the image processing device 5. Further, the defect detecting means 7 is connected to the marking means 11 and the defect history managing means 12.

【0016】さて、光源1から発せられた光は、第1の
偏光板2a、不織布4、第2の偏光板2bを透過し、受
光部3によって受光される。受光された光は1次元映像
信号となって画像処理装置5に取り込まれ、第1の2値
化処理手段6aによって第1閾値よりも大きい信号はa
に、第1閾値よりも小さい信号はb(a>b)に2値化
される。また前記1次元映像信号は、第2の2値化処理
手段6bによって、第1閾値よりも小さい値である第2
閾値よりも小さい信号はcに、第2閾値よりも大きい信
号はb(b>c)に2値化される。第1、第2の2値化
手段で2値化された信号は欠点検出手段7に入力され、
欠点検出手段7は、入力信号に対して値がaであれば明
欠点、値がcであれば暗欠点として欠点を検出する。検
出された欠点に対して、マーキング手段11は欠点が発
生した不織布の端部にマークを施し、欠点履歴管理手段
12は欠点が発生した時間、場所、欠点種類、面積など
を管理する。
The light emitted from the light source 1 passes through the first polarizing plate 2a, the nonwoven fabric 4, and the second polarizing plate 2b, and is received by the light receiving section 3. The received light is taken into the image processing device 5 as a one-dimensional video signal, and a signal larger than the first threshold is set to a by the first binarization processing unit 6a.
In addition, a signal smaller than the first threshold is binarized to b (a> b). Further, the one-dimensional video signal is processed by the second binarization processing means 6b so that the one-dimensional video signal has a value smaller than the first threshold value.
A signal smaller than the threshold is binarized to c, and a signal larger than the second threshold is binarized to b (b> c). The signals binarized by the first and second binarization means are input to the defect detection means 7,
The defect detecting means 7 detects a defect as a bright defect if the value is a with respect to the input signal, and detects a defect as a dark defect if the value is c with respect to the input signal. For the detected defect, the marking means 11 makes a mark on the end of the nonwoven fabric where the defect has occurred, and the defect history management means 12 manages the time, place, defect type, area and the like when the defect occurred.

【0017】ここで第1の偏光板2a、不織布4、第2
の偏光板2bを透過した光の偏光方向について説明す
る。偏光板2aを透過した光はある一定の方向のみに振
動する直線偏光となる。この直線偏光が検査対象である
不織布4中の正常糸を透過する際、正常糸の複屈折率に
よって楕円偏光となる。さらにこの楕円偏光は不織布4
と受光部3との間に、偏光方向が偏光板2aの偏光方向
に直交するように配置された偏光板2bに照射される。
偏光板2bに照射された光の中で、偏光板の偏光方向と
同じ方向を持つ成分のみが透過し、受光部3によって受
光される。
Here, the first polarizing plate 2a, the nonwoven fabric 4, the second
The polarization direction of the light transmitted through the polarizing plate 2b will be described. Light transmitted through the polarizing plate 2a becomes linearly polarized light that vibrates only in a certain direction. When this linearly polarized light passes through the normal yarn in the nonwoven fabric 4 to be inspected, it becomes elliptically polarized light due to the birefringence of the normal yarn. Furthermore, this elliptically polarized light is
The light is irradiated onto a polarizing plate 2b arranged between the light receiving unit 3 and the polarizing direction so that the polarizing direction is orthogonal to the polarizing direction of the polarizing plate 2a.
Of the light applied to the polarizing plate 2b, only a component having the same direction as the polarization direction of the polarizing plate is transmitted and received by the light receiving unit 3.

【0018】一方、不織布4が存在しない場合について
は、第1の偏光板2aを透過した光は偏光方向を変える
ことなく第2の偏光板2bに照射される。第1の偏光板
2aを透過した光と第2の偏光板2bの偏光方向は互い
に直交しているので、第1の偏光板2aを透過した光は
第2の偏光板2bを透過することができない。このた
め、不織布4が存在しない場合(たとえば、ピンホール
がある場合)は暗い信号が得られる。したがって、受光
部3においては不織布が存在する場合は、不織布が存在
しない場合と比較して明るい信号が得られる。
On the other hand, when the nonwoven fabric 4 does not exist, the light transmitted through the first polarizing plate 2a is applied to the second polarizing plate 2b without changing the polarization direction. The light transmitted through the first polarizing plate 2a and the polarization direction of the second polarizing plate 2b are orthogonal to each other, so that the light transmitted through the first polarizing plate 2a can be transmitted through the second polarizing plate 2b. Can not. Therefore, when the nonwoven fabric 4 does not exist (for example, when there is a pinhole), a dark signal is obtained. Therefore, when the non-woven fabric is present in the light receiving unit 3, a brighter signal is obtained as compared with the case where no non-woven fabric is present.

【0019】ここで、不織布4の高目付の部分と低目付
の部分について考えてみると、高目付の部分は低目付の
部分と比較して膜厚が厚いので透過率が小さい。一方、
高目付の部分を透過する光は、低目付の部分を透過する
光よりも多く糸を透過するので大きく偏光され、第2の
偏光板2bの偏光方向と同じ成分を多く含む。
Here, considering the high-weight portion and the low-weight portion of the nonwoven fabric 4, the high-weight portion has a larger thickness than the low-weight portion, and thus has a low transmittance. on the other hand,
The light transmitted through the high-weight portion passes through the thread more than the light transmitted through the low-weight portion, and is thus largely polarized, and contains many components the same as the polarization direction of the second polarizing plate 2b.

【0020】このように、高目付の部分は光の透過率は
低いが、第2の偏光板2bの偏光方向と同じ成分が多
く、逆に低目付の部分は光の透過率は高いが、第2の偏
光板2bの偏光方向と同じ成分は少ない。したがって、
目付の高い部分と低い部分については、光の透過率と第
2の偏光板2bを透過する光の釣り合いがとれるので、
透過光量の差は小さくなる。これによって、正常な範囲
の目付むらであれば、目付むらによる透過光量の違いを
問題がない程度に除去することができ、均一な地合の映
像信号を得ることができる。また、この映像信号の地合
の明るさは製品毎に設定された目付と相関がある。
As described above, the high-weight portion has low light transmittance, but has many components in the same direction as the polarization direction of the second polarizing plate 2b. Conversely, the low-weight portion has high light transmittance. The component that is the same as the polarization direction of the second polarizing plate 2b is small. Therefore,
Since the light transmittance and the light passing through the second polarizing plate 2b can be balanced between the high and low weight portions,
The difference in the amount of transmitted light becomes smaller. As a result, if the weight is within the normal range, the difference in the amount of transmitted light due to the weight can be removed to a level that does not cause a problem, and a video signal with a uniform formation can be obtained. Further, the brightness of the formation of the video signal has a correlation with the basis weight set for each product.

【0021】以下に各欠点において、検出される信号に
ついて説明する。
The signal detected for each of the drawbacks will be described below.

【0022】ピンホール欠点については、偏光板2aを
透過した光は偏光方向を変えることなくピンホール欠点
を通過し偏光板2bに照射される。偏光板2aを透過し
た光と偏光板2bの偏光方向は互いに直交しているの
で、偏光板2aを透過してピンホール欠点を通過した光
は偏光板2bを透過することができない。このため、ピ
ンホール欠点については地合の映像信号と比較して十分
に暗い信号が得られ、暗欠点として検出できる。
As for the pinhole defect, the light transmitted through the polarizing plate 2a passes through the pinhole defect without changing the polarization direction and is irradiated on the polarizing plate 2b. Since the light transmitted through the polarizing plate 2a and the polarization direction of the polarizing plate 2b are orthogonal to each other, the light transmitted through the polarizing plate 2a and passing through the pinhole defect cannot be transmitted through the polarizing plate 2b. For this reason, with respect to the pinhole defect, a signal which is sufficiently darker than the video signal of the formation is obtained, and can be detected as a dark defect.

【0023】膜厚異常欠点やドリップ欠点は、高目付の
部分と比較してはるかに目付が高く、膜厚が厚い。この
部分を透過する光は多く偏光されても透過光量自体が極
めて少ないので、地合の映像信号と比較して十分に暗い
信号が得られ、暗欠点として検出できる。ただし、膜厚
が薄いドリップ欠点は、次に述べる未延伸糸と同様、地
合の映像信号と比較して十分に明るい信号が得られ、明
欠点として検出できることもある。
The abnormal film thickness defect and the drip defect are much higher in weight and thicker than those in the high-weight portion. Even if the light transmitted through this portion is polarized in a large amount, the transmitted light amount itself is extremely small, so that a signal sufficiently darker than the video signal of the formation is obtained and can be detected as a dark defect. However, the drip defect having a small film thickness can be detected as a bright defect, as in the case of the undrawn yarn described below, a signal sufficiently brighter than the video signal of the formation is obtained.

【0024】未延伸糸の複屈折率は正常糸の複屈折率よ
りも大きく、未延伸糸を透過した光は正常糸を透過した
光よりも円偏光に近い楕円偏光となる。このため、未延
伸糸を透過した光について、偏光板2bの偏光方向と同
じ成分は正常糸のものよりも大きいため、地合の映像信
号と比較して十分に明るい信号が得られ、明欠点として
検出できる。
The birefringence of the undrawn yarn is larger than the birefringence of the normal yarn, and the light transmitted through the undrawn yarn becomes elliptically polarized light closer to circularly polarized light than the light transmitted through the normal yarn. Therefore, for the light transmitted through the undrawn yarn, the same component as the polarization direction of the polarizing plate 2b is larger than that of the normal yarn, so that a sufficiently bright signal can be obtained as compared with the video signal of formation, and Can be detected as

【0025】このように、本発明の欠点検出装置によれ
ば、目付むらを有する不織布においても、均一な地合の
映像信号を得ることができ、不織布に発生する多様な欠
点について十分検出可能な信号を得ることができるの
で、精度よく検出することができる。
As described above, according to the defect detecting apparatus of the present invention, even in a nonwoven fabric having a non-uniform weight, a video signal of a uniform formation can be obtained, and various defects occurring in the nonwoven fabric can be sufficiently detected. Since a signal can be obtained, detection can be performed with high accuracy.

【0026】図2は、画像処理装置5に平均化処理手段
9を付加した本発明の別の実施形態に係る装置を示すも
のである。不織布4にエンボス加工をおこなうと、受光
部で得られる映像信号に明暗のストライプがはいってし
まうが、そのような不織布でも走行方向に平均化処理す
ることでこのストライプを除去することができ、より精
度よく欠点を検出できる。図2において、平均化処理手
段9は、受光部3と2つの2値化処理手段とに接続され
ている。ここで、平均化処理手段9は、入力された1次
元映像信号を、平均化処理する長さに対応する本数だけ
バッファに格納し、この複数の1次元映像信号に対し不
織布の走行方向に平均化処理を行なう。バッファに新し
い1次元映像信号が入力されると、平均化処理された1
次元映像信号が出力され、第1、第2の2値化手段へ入
力される。
FIG. 2 shows an apparatus according to another embodiment of the present invention in which averaging means 9 is added to the image processing apparatus 5. When the nonwoven fabric 4 is embossed, light and dark stripes are included in the video signal obtained at the light receiving portion. However, even with such a nonwoven fabric, the stripes can be removed by averaging in the running direction. Defects can be detected accurately. In FIG. 2, the averaging processing means 9 is connected to the light receiving section 3 and two binarization processing means. Here, the averaging means 9 stores the inputted one-dimensional video signals in the buffer by the number corresponding to the length to be averaged, and averages the plurality of one-dimensional video signals in the running direction of the nonwoven fabric. Perform a conversion process. When a new one-dimensional video signal is input to the buffer, the averaged 1
A two-dimensional video signal is output and input to the first and second binarizing means.

【0027】図3は、画像処理装置5に閾値算出手段1
0を付加した本発明のさらに別の実施形態に係る装置を
示すものである。目付のみが異なる不織布においては、
目付は映像信号の地合の明るさと相関がある。このた
め、映像信号から閾値を設定することで閾値設定の手間
を省くことができる。図3において、閾値算出手段10
は、平均化処理手段9とデータバス8とに接続されてい
る。ここで、閾値算出手段10は、平均化処理手段9か
ら出力された少なくとも1つの1次元映像信号の平均値
を算出し、その平均値に目付のみが異なる品種毎にあら
かじめ定められた値、または1次元映像信号の分散値か
ら算出した値などを加減乗除することによって第1およ
び第2の2値化手段の閾値を算出する。算出された閾値
はデータバス8を介して第1、第2の2値化手段へ送ら
れる。閾値の算出はある一定周期毎に行うとよい。ま
た、照明交換時や生産品種を換えたときに行うと有効で
ある。平均化処理手段9は必ずしも必要ないが、より精
度よく欠点を検出できるので使用するのが好ましい。
FIG. 3 shows that the image processing apparatus 5 has a threshold calculating means 1.
9 shows an apparatus according to yet another embodiment of the present invention, to which 0 is added. For nonwoven fabrics that differ only in basis weight,
The basis weight has a correlation with the brightness of the formation of the video signal. For this reason, by setting the threshold value from the video signal, the trouble of setting the threshold value can be saved. In FIG. 3, the threshold value calculating means 10
Are connected to the averaging means 9 and the data bus 8. Here, the threshold value calculating means 10 calculates an average value of at least one one-dimensional video signal output from the averaging processing means 9, and a predetermined value for each type having a different basis weight from the average value, or A threshold value of the first and second binarizing means is calculated by adding, subtracting, multiplying, and dividing a value calculated from a variance value of the one-dimensional video signal. The calculated threshold is sent to the first and second binarizing means via the data bus 8. The calculation of the threshold value may be performed at regular intervals. Also, it is effective to perform this when replacing the lighting or when changing the product type. The averaging means 9 is not always necessary, but is preferably used because the defect can be detected more accurately.

【0028】[0028]

【実施例】実施例1 図1に示す装置を用いて、不織布の欠点を検出した。光
源1としては、有効発光長550mm、周波数30KH
zの高周波蛍光灯を使用した。受光部3としては、不織
布4の幅方向に2,048個の画素が並んだ固体撮像素
子が、不織布4の走行方向に96列配置された時間積分
型ラインセンサカメラを使用した。偏光板2aと偏光板
2bは、偏光方向が互いに直交するように配置した。不
織布4としては、スパンボンド法によって製造され、か
つエンボス加工された、ピンホール欠点、膜厚異常欠
点、ドリップ欠点、未延伸糸欠点を含む目付が55g/
2の不織布を用いた。不織布の走行速度は60m/分
とした。
Example 1 A defect of a nonwoven fabric was detected using the apparatus shown in FIG. The light source 1 has an effective emission length of 550 mm and a frequency of 30 KH
A high frequency fluorescent lamp of z was used. As the light receiving unit 3, a time-integrating line sensor camera in which 96 solid-state imaging devices in which 2,048 pixels are arranged in the width direction of the nonwoven fabric 4 are arranged in the running direction of the nonwoven fabric 4 was used. The polarizing plate 2a and the polarizing plate 2b were arranged so that the polarization directions were orthogonal to each other. The nonwoven fabric 4 has a basis weight including a pinhole defect, an abnormal film thickness defect, a drip defect, and an undrawn yarn defect produced and spunbonded by a spun bond method and having a basis weight of 55 g /.
using the m 2 of non-woven fabric. The running speed of the nonwoven fabric was 60 m / min.

【0029】その結果、目付むらを有する不織布につい
ても均一な地合の映像信号を得ることができた。
As a result, it was possible to obtain a video signal having a uniform formation even for a nonwoven fabric having a non-uniform basis weight.

【0030】ピンホール欠点および膜厚異常欠点および
膜厚が厚いドリップ欠点については、地合の信号と比較
して十分に暗い信号が得られたため、第2の2値化手段
によって2値化し、欠点検出手段によって暗欠点とし
て、目付むらの影響を受けずに精度よく検出できた。
Regarding the pinhole defect, the abnormal film thickness defect, and the drip defect having a large film thickness, a sufficiently dark signal was obtained as compared with the formation signal, so that the signal was binarized by the second binarization means. As a dark defect, the defect detecting means could accurately detect the dark defect without being affected by the unevenness of the eyes.

【0031】未延伸糸欠点および膜厚が薄いドリップ欠
点については、地合の信号と比較して十分に明るい信号
が得られるため、第1の2値化手段によって2値化し、
欠点検出手段によって明欠点として、目付むらの影響を
受けずに精度よく検出できた。 実施例2 図2に示す装置を用いて、不織布の欠点を検出した。
Regarding the undrawn yarn defect and the drip defect having a small film thickness, a sufficiently bright signal can be obtained as compared with the formation signal, so that the first binarization means binarizes the signal.
As a bright defect, the defect detecting means was able to accurately detect a bright defect without being affected by unevenness in the weight. Example 2 A defect of the nonwoven fabric was detected using the apparatus shown in FIG.

【0032】光源、受光部、偏光板、検査対象となる不
織布は実施例1で用いたものと同一のものを使用した。
The same light source, light receiving part, polarizing plate and non-woven fabric as the object to be inspected were the same as those used in Example 1.

【0033】その結果、平均化処理手段によって、エン
ボス加工による明暗のストライプを除去することができ
たので、ピンホール欠点、膜厚異常欠点、ドリップ欠
点、未延伸糸欠点をさらに精度よく検出することができ
た。 実施例3 図3に示す装置を用いて、不織布の欠点を検出した。
As a result, the light and dark stripes due to embossing could be removed by the averaging means, so that pinhole defects, abnormal film thickness defects, drip defects and undrawn yarn defects can be detected more accurately. Was completed. Example 3 The defect of the nonwoven fabric was detected using the apparatus shown in FIG.

【0034】光源、受光部、偏光板は実施例1で用いた
ものと同一のものを使用した。不織布としては、目付が
55g/m2のものと80g/m2のものとの2種類を用
いた。また、閾値算出手段での閾値の算出は、検査開始
直後の1つの映像信号から行った。
The same light source, light receiving section and polarizing plate as those used in Example 1 were used. As the nonwoven fabric, two types having a basis weight of 55 g / m 2 and a fabric having a basis weight of 80 g / m 2 were used. The calculation of the threshold value by the threshold value calculation means was performed from one video signal immediately after the start of the inspection.

【0035】その結果、閾値算出手段によって、それぞ
れの不織布の1次元映像信号の平均値に定数を加減乗除
して閾値を算出するので、検査条件を変更せずに、どち
らの不織布についてもピンホール欠点、膜厚異常欠点、
ドリップ欠点、未延伸糸欠点を全て検出することができ
た。 実施例4 図1に示す装置で、インラインで不織布の欠点を検出し
た。
As a result, the threshold value is calculated by adding, subtracting, multiplying, and dividing the average value of the one-dimensional video signal of each nonwoven fabric by the threshold value calculation means. Defects, abnormal film thickness defects,
All drip defects and undrawn yarn defects could be detected. Example 4 A defect of the nonwoven fabric was detected in-line by the apparatus shown in FIG.

【0036】光源、受光部、偏光板は実施例1で用いた
ものと同一のものを使用した。不織布4としては、スパ
ンボンド法による、目付が55g/m2で、かつエンボ
ス加工されたものを使用した。不織布の走行速度は60
m/分とした。
The same light source, light receiving portion and polarizing plate as those used in Example 1 were used. As the non-woven fabric 4, an embossed fabric having a basis weight of 55 g / m 2 by a spun bond method was used. The running speed of the nonwoven fabric is 60
m / min.

【0037】その結果、発生した欠点を精度よく検出で
き、また、欠点が発生したとき、マーキング手段によっ
て、欠点が発生した不織布の端部にマークを貼り付ける
ことができた。また、欠点が頻発した場合にも、欠点履
歴管理手段で管理している発生した欠点の種類、面積、
場所、時間から、欠点が発生している製造工程の不具合
箇所を直ちに特定し修正することで、不良製品の製造を
最小限にとどめることができた。したがって、不織布の
製造コストを削減することができた。
As a result, the generated defect could be detected with high accuracy, and when a defect occurred, a mark could be attached to the end of the nonwoven fabric where the defect occurred by the marking means. Also, even when defects occur frequently, the type, area,
Immediately identifying and correcting the defective part in the manufacturing process where the defect occurred from the place and time, it was possible to minimize the manufacture of defective products. Therefore, the manufacturing cost of the nonwoven fabric could be reduced.

【0038】上記実施例にて検査した結果欠点が認めら
れなかった不織布を30mm幅の帯状にスリットし、電
線に巻回することにより電線を生産したところ、巻回中
に不織布が切断することが少なく、電線の生産効率が高
まりコスト低減をはたすとができた。
When the non-woven fabric having no defect as a result of the inspection in the above example was slit into a 30 mm wide band and wound around the electric wire to produce an electric wire, the non-woven fabric could be cut during the winding. It was possible to increase the production efficiency of electric wires and reduce costs.

【0039】[0039]

【発明の効果】本発明は、被測定シートと光源との間お
よび被測定シートと受光部との間に偏光板を偏光方向が
互いに70〜110度の角度をなすように配置している
ので、目付むらを有するシートであっても、目付むらに
よる映像信号の地合のむらを問題がない程度まで低くす
ることができ、また、複屈折率の高い部分を地合よりも
明るく、ピンポール欠点および膜厚異常欠点を地合より
も十分に暗くした信号を得ることができるようになる。
また、画像処理装置に、映像信号を第1閾値によって2
値化する第1の2値化手段と、映像信号を前記第1閾値
よりも低い第2閾値によって2値化する第2の2値化手
段と、第1、第2の2値化手段によって得られた2値化
データに基づいて明暗それぞれの欠点を検出する欠点検
出手段とを設けているので、シートに発生した明暗の欠
点を検出することができるようになる。この結果、目付
むらを有するシートに発生するピンホール欠点、膜厚異
常欠点、ドリップ欠点、未延伸糸欠点を精度よく検出す
ることができるようになる。
According to the present invention, the polarizing plates are arranged between the sheet to be measured and the light source and between the sheet to be measured and the light receiving section so that the polarization directions are at an angle of 70 to 110 degrees with each other. Even with a sheet having uneven weight, unevenness of the formation of a video signal due to uneven weight can be reduced to a level that does not cause a problem, and a portion having a high birefringence is brighter than the formation, and the pin pole defect and It is possible to obtain a signal in which the film thickness defect is sufficiently darker than the formation.
Further, the image signal is transmitted to the image processing device by the first threshold value by 2.
A first binarizing unit for binarizing the video signal, a second binarizing unit for binarizing the video signal with a second threshold lower than the first threshold, and a first and a second binarizing unit. Since there is provided a defect detecting means for detecting each of the light and dark defects based on the obtained binarized data, the light and dark defects generated on the sheet can be detected. As a result, pinhole defects, abnormal film thickness defects, drip defects, and undrawn yarn defects, which occur in a sheet having uneven weight, can be accurately detected.

【0040】また、画像処理装置が、被測定シートの走
行方向における映像信号を平均化する平均化処理手段を
備えている場合には、シートの走行方向に対して斜め方
向に周期的に発生する、たとえばエンボス加工などによ
る明暗のストライプを除去することができ、欠点をより
精度よく検出することができるようになる。
When the image processing apparatus has an averaging processing means for averaging the video signal in the running direction of the sheet to be measured, the image signal is periodically generated in a direction oblique to the running direction of the sheet. For example, light and dark stripes due to embossing or the like can be removed, and defects can be detected with higher accuracy.

【0041】また、画像処理装置が、受光部の少なくと
も1回の受光から得られる映像信号から第1、第2の閾
値を算出する閾値算出手段を備えている場合には、目付
が異なる複数品種のシートについて閾値設定の手間を省
くことができ、閾値の設定ミスによる誤検出を防ぐこと
ができるようになる。
In the case where the image processing apparatus is provided with threshold calculating means for calculating the first and second thresholds from video signals obtained from at least one light reception of the light receiving section, a plurality of products having different basis weights are provided. For this sheet, the trouble of setting the threshold value can be saved, and erroneous detection due to the setting error of the threshold value can be prevented.

【0042】また、被測定シートに欠点の存在を示すマ
ークを付与するマーキング手段を備えている場合には、
欠点が発生した不織布であっても出荷前に欠点部分を取
り除くことができ、歩留まりを向上させることができる
ようになる。
In the case where the sheet to be measured is provided with marking means for giving a mark indicating the presence of a defect,
Even if the nonwoven fabric has a defect, the defect can be removed before shipping, and the yield can be improved.

【0043】また、欠点履歴管理手段を備えている場合
には、欠点を発生させている製造工程を直ちに特定し処
置できるので、不良製品の製造を最小限にとどめること
ができ、製造コストを削減することができるようにな
る。
Further, when the defect history management means is provided, the manufacturing process causing the defect can be immediately identified and treated, so that the production of defective products can be minimized and the production cost can be reduced. Will be able to

【0044】また、本発明の欠点検出装置を用いて、電
線の被覆材となる不織布の欠点を検出する場合には、電
線製造工程で不織布切断の原因となる未延伸糸、ドリッ
プ欠点を精度良く検出できる。
When the defect detecting device of the present invention is used to detect a defect of a non-woven fabric used as a covering material of an electric wire, an undrawn yarn or a drip defect that causes cutting of the non-woven fabric in the electric wire manufacturing process can be accurately detected. Can be detected.

【0045】また、本発明の欠点検出装置を不織布の製
造工程に適用した場合には、不具合箇所を直ちに修正す
ることができるようになり、不織布の製造コストを低減
することができるようになる。
Further, when the defect detecting device of the present invention is applied to a nonwoven fabric manufacturing process, a defective portion can be immediately corrected, and the manufacturing cost of the nonwoven fabric can be reduced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態に係る欠点検出装置のブロ
ック図である。
FIG. 1 is a block diagram of a defect detection device according to an embodiment of the present invention.

【図2】本発明の他の実施形態に係る欠点検出装置のブ
ロック図である。
FIG. 2 is a block diagram of a defect detection device according to another embodiment of the present invention.

【図3】本発明のさらに別の実施形態に係る欠点検出装
置のブロック図である。
FIG. 3 is a block diagram of a defect detection device according to still another embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 :光源 2a :偏光板 2b :偏光板 3 :受光部 4 :不織布 5 :画像処理装置 6a :第1の2値化手段 6b :第2の2値化手段 7 :欠点検出手段 8 :データバス 9 :平均化処理手段 10 :閾値算出手段 11 :マーキング手段 12 :欠点履歴管理手段 1: light source 2a: polarizing plate 2b: polarizing plate 3: light receiving portion 4: non-woven fabric 5: image processing device 6a: first binarizing means 6b: second binarizing means 7: defect detecting means 8: data bus 9: average processing means 10: threshold value calculation means 11: marking means 12: defect history management means

───────────────────────────────────────────────────── フロントページの続き (72)発明者 伊藤 哲哉 滋賀県大津市園山1丁目1番1号 東レ株 式会社滋賀事業場内 ──────────────────────────────────────────────────の Continuing on the front page (72) Inventor Tetsuya Ito 1-1-1 Sonoyama, Otsu-shi, Shiga Pref.

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】光透過性で、かつ光学的異方性をもつ被測
定シートを挟んで光源と受光部とを配置し、受光部で得
られた映像信号を画像処理手段で処理することによって
被測定シートの欠点を検出する装置であって、前記被測
定シートと前記光源との間および前記被測定シートと前
記受光部との間に偏光板を偏光方向が互いに70〜11
0度の角度をなすように配置するとともに、前記画像処
理装置に、前記映像信号を第1閾値によって2値化する
第1の2値化手段と、前記映像信号を前記第1閾値より
も低い第2閾値によって2値化する第2の2値化手段
と、前記第1、第2の2値化手段によって得られた2値
化データに基づいて明暗それぞれの欠点を検出する欠点
検出手段とを設けたことを特徴とする、シートの欠点検
出装置。
1. A light source and a light receiving section are disposed with a light transmitting and optically anisotropic sheet to be measured interposed therebetween, and a video signal obtained by the light receiving section is processed by image processing means. An apparatus for detecting a defect of a sheet to be measured, wherein a polarizing plate is disposed between the sheet to be measured and the light source and between the sheet to be measured and the light receiving unit so that the polarizing directions are 70 to 11 with respect to each other.
First binarizing means for binarizing the video signal with a first threshold value, the video signal being lower than the first threshold value; A second binarizing unit for binarizing with a second threshold value, and a defect detecting unit for detecting each defect of light and dark based on the binarized data obtained by the first and second binarizing units. A sheet defect detecting device, comprising:
【請求項2】画像処理装置が、被測定シートの走行方向
における映像信号を平均化する平均化処理手段を備えて
いる、請求項1に記載のシートの欠点検出装置。
2. The sheet defect detecting apparatus according to claim 1, wherein the image processing apparatus includes averaging processing means for averaging video signals in a running direction of the sheet to be measured.
【請求項3】画像処理装置が、受光部の少なくとも1回
の受光から得られる映像信号から第1、第2の閾値を算
出する閾値算出手段を備えている、請求項1または2に
記載のシートの欠点検出装置。
3. The image processing apparatus according to claim 1, wherein the image processing apparatus includes a threshold value calculating unit that calculates first and second threshold values from a video signal obtained from at least one light reception of the light receiving unit. Sheet defect detection device.
【請求項4】被測定シートに欠点の存在を示すマークを
付与するマーキング手段を備えている、請求項1〜3の
いずれかに記載のシートの欠点検出装置。
4. The sheet defect detecting apparatus according to claim 1, further comprising a marking means for providing a mark indicating the presence of a defect on the sheet to be measured.
【請求項5】欠点履歴管理手段を備えている、請求項1
〜4のいずれかに記載のシートの欠点検出装置。
5. The apparatus according to claim 1, further comprising a defect history management unit.
5. The apparatus for detecting a defect of a sheet according to any one of claims 1 to 4.
【請求項6】被測定シートが不織布である、請求項1〜
5のいずれかに記載のシートの欠点検出装置。
6. The sheet to be measured is a non-woven fabric.
A sheet defect detecting apparatus according to any one of claims 5 to 10.
【請求項7】請求項1〜6のいずれかに記載の欠点検出
装置を用いてシートの製造工程を管理することを特徴と
する、シートの製造方法。
7. A sheet manufacturing method, wherein a sheet manufacturing process is managed by using the defect detecting device according to claim 1.
【請求項8】不織布が、電線の被覆材である、請求項7
に記載の不織布の製造方法。
8. The nonwoven fabric is a covering material for an electric wire.
3. The method for producing a nonwoven fabric according to item 1.
JP6844299A 1998-03-16 1999-03-15 Apparatus for detecting defect of sheet and formation for sheet Pending JPH11326238A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6844299A JPH11326238A (en) 1998-03-16 1999-03-15 Apparatus for detecting defect of sheet and formation for sheet

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP10-65229 1998-03-16
JP6522998 1998-03-16
JP6844299A JPH11326238A (en) 1998-03-16 1999-03-15 Apparatus for detecting defect of sheet and formation for sheet

Publications (1)

Publication Number Publication Date
JPH11326238A true JPH11326238A (en) 1999-11-26

Family

ID=26406351

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6844299A Pending JPH11326238A (en) 1998-03-16 1999-03-15 Apparatus for detecting defect of sheet and formation for sheet

Country Status (1)

Country Link
JP (1) JPH11326238A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005120563A (en) * 2003-10-10 2005-05-12 Truetzschler Gmbh & Co Kg Device for detecting foreign material in plastic material in fiber flock in spinning preparation
JP2005274383A (en) * 2004-03-25 2005-10-06 Sumitomo Chemical Co Ltd Inspection method for perforated defects in oriented film
JP2006146536A (en) * 2004-11-19 2006-06-08 Daicel Chem Ind Ltd Analysis program
JP2006226910A (en) * 2005-02-18 2006-08-31 Central Res Inst Of Electric Power Ind Anomaly detection method and anomaly detection apparatus for solid insulator
JP2013068500A (en) * 2011-09-22 2013-04-18 Dainippon Printing Co Ltd Film inspection system and film inspection method
CN103616388A (en) * 2013-11-26 2014-03-05 安徽锦绣经纬编有限公司 Cloth breakage inspection machine
JP2016113721A (en) * 2014-12-15 2016-06-23 セイコーエプソン株式会社 Sheet manufacturing device and sheet manufacturing method
CN119287647A (en) * 2024-10-25 2025-01-10 杭州顺龙无纺科技有限公司 A thickness detection device for nonwoven fabric production

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005120563A (en) * 2003-10-10 2005-05-12 Truetzschler Gmbh & Co Kg Device for detecting foreign material in plastic material in fiber flock in spinning preparation
JP2005274383A (en) * 2004-03-25 2005-10-06 Sumitomo Chemical Co Ltd Inspection method for perforated defects in oriented film
JP2006146536A (en) * 2004-11-19 2006-06-08 Daicel Chem Ind Ltd Analysis program
JP2006226910A (en) * 2005-02-18 2006-08-31 Central Res Inst Of Electric Power Ind Anomaly detection method and anomaly detection apparatus for solid insulator
JP2013068500A (en) * 2011-09-22 2013-04-18 Dainippon Printing Co Ltd Film inspection system and film inspection method
CN103616388A (en) * 2013-11-26 2014-03-05 安徽锦绣经纬编有限公司 Cloth breakage inspection machine
JP2016113721A (en) * 2014-12-15 2016-06-23 セイコーエプソン株式会社 Sheet manufacturing device and sheet manufacturing method
CN119287647A (en) * 2024-10-25 2025-01-10 杭州顺龙无纺科技有限公司 A thickness detection device for nonwoven fabric production

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