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JPH11236676A - Atmospheric pressure discharge plasma processing method - Google Patents

Atmospheric pressure discharge plasma processing method

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Publication number
JPH11236676A
JPH11236676A JP10285520A JP28552098A JPH11236676A JP H11236676 A JPH11236676 A JP H11236676A JP 10285520 A JP10285520 A JP 10285520A JP 28552098 A JP28552098 A JP 28552098A JP H11236676 A JPH11236676 A JP H11236676A
Authority
JP
Japan
Prior art keywords
gas
electrodes
gas introduction
width
reaction gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10285520A
Other languages
Japanese (ja)
Other versions
JP3533094B2 (en
Inventor
Takuya Yara
卓也 屋良
Mamoru Hino
守 日野
Hitoshi Nakao
整 中尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sekisui Chemical Co Ltd
Original Assignee
Sekisui Chemical Co Ltd
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Application filed by Sekisui Chemical Co Ltd filed Critical Sekisui Chemical Co Ltd
Priority to JP28552098A priority Critical patent/JP3533094B2/en
Publication of JPH11236676A publication Critical patent/JPH11236676A/en
Application granted granted Critical
Publication of JP3533094B2 publication Critical patent/JP3533094B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Plasma Technology (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

(57)【要約】 【課題】工業的に有利な大気圧近傍の圧力下で発生する
放電プラズマを用い、被処理基材の膜厚ムラを±10%
以内に抑えることのできる常圧プラズマ処理方法を提供
する。 【解決手段】平行平板型の電極82a,82bに挟まれ
た空間に、その電極幅にわたる流速変動幅が±20%以
下の略均一な流速のもとに反応ガスを導入する。このよ
うな反応ガスの導入を可能とするために、例えば、ガス
導入方向に対向する斜板を有し、かつ、ガス導入口から
遠ざかるほど狭くなる空間内に反応ガスを一旦導いて拡
散させる同時に、被処理体Wの走行方向に略平行にガス
流方向を偏向させた後、電極幅より大きな長さを持ち、
かつ、その長さ方向に略一定の幅を有するスリット、あ
るいは一様に並べられた小孔を介して、電極82a、8
2b間に向けて吹き出す構造を持つガス導入容器Iを用
いる。
[PROBLEMS] To use a discharge plasma generated under a pressure near the atmospheric pressure, which is industrially advantageous, to reduce the film thickness unevenness of the substrate to be processed by ± 10%.
Provided is a normal-pressure plasma processing method that can be suppressed within the range. A reaction gas is introduced into a space sandwiched between parallel plate type electrodes (82a, 82b) at a substantially uniform flow rate of ± 20% or less in flow velocity variation across the electrode width. In order to enable the introduction of such a reaction gas, for example, a swash plate facing the gas introduction direction is provided, and at the same time, the reaction gas is once introduced and diffused into a space that becomes narrower as the distance from the gas introduction port increases. After deflecting the gas flow direction substantially parallel to the traveling direction of the processing object W, has a length larger than the electrode width,
In addition, the electrodes 82a, 8a are formed through slits having a substantially constant width in the length direction or uniformly arranged small holes.
A gas introduction container I having a structure for blowing out between 2b is used.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、大気圧近傍の圧力
下で発生させた放電プラズマを利用して基材を処理す
る、いわゆる常圧放電プラズマ処理方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a so-called normal-pressure discharge plasma processing method for processing a substrate using discharge plasma generated under a pressure near atmospheric pressure.

【0002】[0002]

【従来の技術】従来から、低圧条件下でのグロー放電に
より生じるプラズマを利用した薄膜形成方法が実用化さ
れている。しかし、この低圧条件下における薄膜形成
は、真空容器や真空装置等が必要であり、バッチ的に処
理を行うごとに真空容器の真空を破壊して、新たに真空
引きを行う必要があるなど、イニシャルコスト、ランニ
ングコストとも高価になって工業的には不利であるた
め、電子部品、光学部品等の高価な物品の処理に対して
しか適用されていなかった。
2. Description of the Related Art Conventionally, a thin film forming method utilizing plasma generated by glow discharge under low pressure conditions has been put to practical use. However, thin film formation under this low pressure condition requires a vacuum container or vacuum device, etc., and it is necessary to break the vacuum of the vacuum container every time processing is performed in batches and perform a new evacuation. Since both initial cost and running cost are high and industrially disadvantageous, they have been applied only to processing of expensive articles such as electronic parts and optical parts.

【0003】このような問題を解決するため、従来、大
気圧近傍の圧力下での放電プラズマを利用する方法が提
案されている。例えば特開平2−48626号公報に
は、大気圧近傍の圧力のヘリウムとケトンの混合雰囲気
下で発生させたプラズマを用いて処理を行う方法が開示
されており、また、特開平4−74525号公報には、
アルゴン並びにアセトンおよび/またはヘリウムからな
る大気圧近傍の雰囲気下で発生させたプラズマにより処
理を行う方法が開示されている。
In order to solve such a problem, there has been proposed a method of utilizing discharge plasma under a pressure near the atmospheric pressure. For example, Japanese Patent Application Laid-Open No. 2-48626 discloses a method of performing treatment using plasma generated in a mixed atmosphere of helium and ketone at a pressure near the atmospheric pressure. In the gazette,
A method is disclosed in which a treatment is performed using plasma generated in an atmosphere near the atmospheric pressure composed of argon and acetone and / or helium.

【0004】[0004]

【発明が解決しようとする課題】ところで、大気圧近傍
の圧力下の反応に必要な混合ガスを放電空間に導入する
場合、ガスの拡散が低圧条件下で行う場合に比して困難
であり、混合ガスの偏りが生じる結果、処理結果に不均
一性が生じやすい。
By the way, when a mixed gas necessary for a reaction under a pressure near the atmospheric pressure is introduced into the discharge space, it is more difficult to diffuse the gas than when the gas is diffused under a low pressure condition. As a result of the bias of the mixed gas, non-uniformity is likely to occur in the processing result.

【0005】すなわち、プラズマ処理空間を形成するチ
ャンバ内にガスを導入するに当たっては、通常、1箇所
ないしは数箇所のガス導入口にガス供給管を接続して行
うのであるが、大気圧近傍の圧力下においてはチャンバ
内でガスが拡散しにくいために、ガス導入口に近い位置
ほどガスの密度が高くなり、ガス導入口から遠い位置で
は必然的にガスの流速が低下する傾向にある。
That is, when introducing a gas into a chamber for forming a plasma processing space, a gas supply pipe is usually connected to one or several gas inlets. In the lower part, the gas is hardly diffused in the chamber, so that the gas density is higher at a position closer to the gas inlet, and the flow velocity of the gas is necessarily lower at a position farther from the gas inlet.

【0006】プラズマ処理の目的が被処理体の表面の濡
れ性改善等である場合には、処理面全体に効果が現れて
いれば、処理の均一性は特に大きな問題とはならない。
これに対し、反射防止膜や高反射膜、あるいはフィルタ
ーなどの光学薄膜等の形成に際しては、その処理ムラが
全体の性能を左右するほどに大きな問題となる。すなわ
ち、このような光学薄膜の処理時における処理ムラは、
色ムラとして人の目に映り、この色ムラが無視できる反
射波長のずれは20nm程度と言われている。これを膜
厚に換算すると100〜200Å程度に当たり、100
0〜2000Å程度の膜厚に対して±10%以内に膜厚
ムラを抑える必要があることを示唆している。
In the case where the purpose of the plasma treatment is to improve the wettability of the surface of the object to be treated, the uniformity of the treatment does not pose a particular problem as long as the effect is exerted on the entire treated surface.
On the other hand, when forming an anti-reflection film, a high-reflection film, or an optical thin film such as a filter, the processing unevenness is a serious problem as the overall performance is affected. That is, the processing unevenness at the time of processing such an optical thin film is as follows.
It is said that the deviation of the reflection wavelength, which appears to human eyes as color unevenness and in which the color unevenness can be ignored, is about 20 nm. When this is converted into a film thickness, it corresponds to about 100 to 200 °,
It suggests that it is necessary to suppress the film thickness unevenness within ± 10% for a film thickness of about 0 to 2000 °.

【0007】常圧放電空間にガスを均一に導入する方法
については、特開平2−48626号公報や、特開平6
−2149号公報において提案されている。しかし、こ
れらの方法では、ガスの流れが滞る部分の存在や、電極
に孔が開いていることによる処理の不均一等が生じ、被
処理基材全面にわたる膜厚ムラを±10%以内に抑える
ことは困難である。
A method for uniformly introducing a gas into a normal-pressure discharge space is disclosed in JP-A-2-48626 and JP-A-6-48626.
No. -21149. However, in these methods, the presence of a portion where the flow of gas is stagnant, unevenness in processing due to the presence of holes in the electrode, and the like occur, and unevenness in film thickness over the entire surface of the substrate to be processed is suppressed to within ± 10%. It is difficult.

【0008】本発明の目的は、工業的に有利な大気圧近
傍の圧力下で発生する放電プラズマを用いながらも、被
処理基材の膜厚ムラを±10%以内に抑えることがで
き、もって高性能の光学薄膜等を安価に形成することの
できる常圧放電プラズマ処理方法を提供することにあ
る。
An object of the present invention is to use a discharge plasma generated under a pressure near the atmospheric pressure which is industrially advantageous, while suppressing the thickness unevenness of the substrate to be processed to within ± 10%. An object of the present invention is to provide a normal-pressure discharge plasma processing method capable of forming a high-performance optical thin film or the like at low cost.

【0009】[0009]

【課題を解決するための手段】上記の目的を達成するた
め、本発明の常圧放電プラズマ処理方法は、大気圧近傍
の圧力下で、対向する一対の電極の少なくとも一方の対
向面に固体誘電体を配置した状態で、その一対の電極間
にパルス化された電界を印加することにより発生するプ
ラズマを用いるプラズマ処理方法において、上記一対の
電極を、互いの対向面がそれぞれ略平滑な平行平板電極
とするとともに、その電極間に挟まれた空間に、電極幅
にわたる流速の変動幅が±20%以下の略均一な流速の
もとに反応ガスを導入することによって特徴づけられる
(請求項1)。
In order to achieve the above object, a normal pressure discharge plasma processing method according to the present invention provides a solid dielectric material on at least one surface of a pair of electrodes facing each other under a pressure near atmospheric pressure. In a plasma processing method using plasma generated by applying a pulsed electric field between a pair of electrodes in a state where a body is arranged, the pair of electrodes are parallel flat plates whose opposing surfaces are substantially smooth. In addition to the electrodes, the reaction gas is introduced into a space interposed between the electrodes at a substantially uniform flow rate of ± 20% or less in the flow rate variation across the electrode width (claim 1). ).

【0010】ここで、本発明においては、上記一対の電
極間に被処理体を一定方向に走行させるとともに、その
被処理体の走行方向に平行な方向に反応ガスを導入する
こと(請求項2)が望ましい。
Here, in the present invention, the object to be processed is caused to travel in a certain direction between the pair of electrodes, and the reaction gas is introduced in a direction parallel to the traveling direction of the object to be processed. ) Is desirable.

【0011】また、本発明において、上記のように電極
間における流速の変動幅が±20%以下の略均一な流速
のもとに反応ガスを電極間に導入する具体的な方法とし
ては、ガス配管から供給される反応ガスを、ガス導入方
向に対向する斜板を有し、かつ、ガス導入口から遠ざか
るほど狭くなる区画内に一旦導いて拡散させると同時
に、被処理体の走行方向に略平行にガス流方向を偏向さ
せた後、電極幅より大きな長さを持ち、かつ、その長さ
方向に略一定の幅を有するスリットを介して電極間に向
けて吹き出す構造を持つガス導入容器を用いる方法(請
求項3)を挙げることができる。
In the present invention, as a specific method for introducing the reaction gas between the electrodes at a substantially uniform flow rate of ± 20% or less in the flow rate between the electrodes as described above, The reaction gas supplied from the pipe has a swash plate facing the gas introduction direction, and is guided and diffused in a section that becomes narrower as the distance from the gas introduction port increases, and at the same time, the reaction gas is substantially moved in the traveling direction of the workpiece. After deflecting the gas flow direction in parallel, a gas introduction container having a length greater than the electrode width, and having a structure to blow out between the electrodes through a slit having a substantially constant width in the length direction. The method used (claim 3) can be mentioned.

【0012】また、同じく略均一な流速のもとに反応ガ
スを電極間に導入する他の具体的な方法としては、ガス
配管から供給される反応ガスを、電極間へのガス導入方
向に断面が緩やかに拡大する第1の区画内で拡散させた
後、格子もしくは網状の壁面を介して、ガス吹出方向に
断面が緩やかに縮小する第2の区画に導き、その第2の
区画の終端に設けられた、電極幅より大きな長さを持
ち、かつ、その長さ方向に略一定の幅を有するスリット
を介して電極間に向けて吹き出す構造を持つガス導入容
器を用いる方法(請求項4)を挙げることができる。
Another specific method for introducing a reactant gas between the electrodes at a substantially uniform flow rate also involves reacting a reactant gas supplied from a gas pipe with a cross section in a gas introduction direction between the electrodes. Is diffused in the first section, which gradually expands, and then led to a second section, whose cross section gradually reduces in the gas blowing direction, via a grid or a mesh-like wall surface, and at the end of the second section. A method using a gas introduction container having a structure provided to have a length greater than the electrode width and having a structure for blowing out between the electrodes through a slit having a substantially constant width in the length direction (claim 4). Can be mentioned.

【0013】ここで、本発明において、大気圧近傍の圧
力とは、100〜800Torrの圧力を言い、中で
も、圧力調整が容易で装置構成が簡単となる700〜7
80Torrの圧力範囲とすることが好ましい。
Here, in the present invention, the pressure near the atmospheric pressure means a pressure of 100 to 800 Torr.
Preferably, the pressure range is 80 Torr.

【0014】被処理基材の膜厚ムラを±10%以内に抑
えるという本発明の目的を達成するには、均一な電界を
大面積にわたって形成することが、まず必要となる。こ
のような均一電界を形成するには、電極構造を平行平板
とするのが最も適している。
In order to achieve the object of the present invention of suppressing the thickness unevenness of the substrate to be processed to within ± 10%, it is first necessary to form a uniform electric field over a large area. In order to form such a uniform electric field, it is most suitable that the electrode structure is a parallel plate.

【0015】特に大気圧近傍のグロー放電においては、
低ガス圧放電に比べてガス分子密度が大きいので、電離
後に再結合するまでの寿命が短く、電子の平均自由行程
も短い。そのため、グロー放電空間が電極に挟まれた空
間に限定され、かつ、アークに到らない安定的な放電が
維持できる電極間隔は4mm程度までであるという特徴
がある。よって、電極間隔の平行度を保つために、電極
表面が突起なく滑らかでなくてはならない。すなわち、
電極面の突起はその部分での電界集中を生じ、アーク放
電の原因となるためである。従って、用いる電極の対向
面は、表面の荒れ(粗さ)、ないしは突起は1μm以下
であることが望ましい。
Particularly in a glow discharge near atmospheric pressure,
Since the gas molecule density is higher than that of the low gas pressure discharge, the lifetime until recombination after ionization is short, and the mean free path of electrons is short. For this reason, the glow discharge space is limited to the space between the electrodes, and the distance between the electrodes at which a stable discharge that does not reach an arc can be maintained is up to about 4 mm. Therefore, in order to maintain the parallelism of the electrode spacing, the electrode surface must be smooth without protrusions. That is,
This is because protrusions on the electrode surface cause electric field concentration at that portion, which causes arc discharge. Therefore, it is desirable that the facing surface of the electrode to be used has a surface roughness (roughness) or protrusion of 1 μm or less.

【0016】そして、本発明の目的を達成するために
は、以上のような電極を用いて均一な電界を得ることに
加えて、電極間中に存在するガスが被処理体上で層流を
形成し、その流速が基材の処理幅にわたってほぼ均一で
あることが必要であることが、本発明者らの研究によっ
て明らかとなった。
In order to achieve the object of the present invention, in addition to obtaining a uniform electric field using the above-described electrodes, the gas existing between the electrodes causes laminar flow on the object to be processed. Our studies have revealed that it is necessary that the flow rate be formed and that its flow rate be substantially uniform over the processing width of the substrate.

【0017】本発明によって、常圧プラズマ放電空間を
走行する被処理体上に成膜される膜の膜厚分布を±10
%以内に抑制することがはじめて可能となった。
According to the present invention, the film thickness distribution of the film formed on the object to be processed traveling in the normal pressure plasma discharge space is ± 10%.
For the first time, it has become possible to control it to within%.

【0018】被処理体の幅方向(走行方向に直交する方
向)の膜厚分布の均一性は、略一定電界と、幅方向に略
一定の流速でガスを吹き出すガス導入容器の利用による
均一なグロー放電によって得られると考えられる。ま
た、被処理体の走行方向の膜厚分布の均一性は、被処理
体に向かって吹き出すガスを電離したプラズマに被処理
体が曝されることで得られると考えられる。
The uniformity of the film thickness distribution in the width direction (the direction perpendicular to the running direction) of the object to be processed is uniform by using a substantially constant electric field and a gas introduction container for blowing gas at a substantially constant flow rate in the width direction. It is thought to be obtained by glow discharge. In addition, it is considered that the uniformity of the film thickness distribution in the traveling direction of the object is obtained by exposing the object to plasma ionized from a gas blown toward the object.

【0019】幅方向に略一定の流速で反応ガスを吹き出
すためのガス導入容器としては、請求項3または4に係
る発明において用いる容器を好適に挙げることができ
る。
As the gas introduction container for blowing out the reaction gas at a substantially constant flow rate in the width direction, the container used in the invention according to claim 3 or 4 can be suitably mentioned.

【0020】すなわち、一定方向に略一定の流速でガス
を吹き出すには、本発明者らの研究により、一つのガス
導入孔から区画内にガスを入れ、それを乱流化した後、
目的方向に整流して、均一幅のスリットからガスを出す
必要があることが判明した。
That is, in order to blow out gas at a substantially constant flow rate in a certain direction, according to the study of the present inventors, a gas is introduced into a compartment from one gas introduction hole, and the gas is turbulent.
It has been found that it is necessary to rectify gas in the target direction and to emit gas from a slit having a uniform width.

【0021】そのような条件を満たすガス導入容器の構
造として、図1,図2および図4〜図6に例示するよう
な構造を挙げることができる。
As a structure of the gas introduction container satisfying such conditions, there can be mentioned a structure as exemplified in FIGS. 1, 2 and 4 to 6.

【0022】図1,図2および図4は、請求項3におい
て用いるガス導入容器の例を示している。
FIGS. 1, 2 and 4 show examples of the gas introduction container used in the third aspect.

【0023】図1に示すものは、(A)に断面図を、
(B)にそのB矢視図、(C)には同じくC−C断面図
を示すように、直方形状の容器1の長手方向の一端部
に、ガス供給管Gが接続されるガス導入口11を設ける
とともに、ガス導入方向に対向するように容器1の対角
線上に斜板12を設けることにより、ガス導入口11か
ら遠ざかる程狭くなる区画を形成し、ガス導入口11か
ら導入された反応ガスを乱流化し、その区画内での密度
を略均一化させてその流速を略一様なものとすると同時
に、その方向を偏向させた後、容器1の縁部近傍に設け
た一様な多数の小孔群13からガスを整流して吹き出す
構造を有している。
FIG. 1A is a sectional view of FIG.
(B) is a view taken in the direction of the arrow B, and (C) is a cross-sectional view taken along the line CC as well, and a gas supply port G is connected to one end of the rectangular container 1 in the longitudinal direction. 11 and the swash plate 12 is provided on the diagonal line of the container 1 so as to face the gas introduction direction, thereby forming a section which becomes narrower as the distance from the gas introduction port 11 increases. The gas is made turbulent, the density in the compartment is made substantially uniform, the flow velocity is made substantially uniform, and at the same time, after the direction is deflected, the uniform gas provided near the edge of the container 1 is provided. It has a structure in which gas is rectified and blown out from many small hole groups 13.

【0024】また、図2に示すものは、(A)に断面
図、(B)にはそのB−B断面図を示すように、図1に
示した容器1と同等の構造のものを第1室21とし、そ
の小孔群13から出たガスが導入される第2室22を設
け、その第2室22内には、一端に一様な隙間23を有
する仕切り板24を配置するとともに、縁部近傍に一様
な幅のスリット25を形成して、第1室21の小孔群1
3から出たガスが仕切り板24を回り込んでスリット2
5から層流となって放電空間に吹き出すように構成され
ている。これにより、小孔群13から出たガスの流れを
更に平均化することが可能となる。
FIG. 2A is a cross-sectional view, and FIG. 2B is a cross-sectional view taken along the line BB. As shown in FIG. A first chamber 21 is provided, and a second chamber 22 into which gas from the small hole group 13 is introduced is provided. In the second chamber 22, a partition plate 24 having a uniform gap 23 at one end is arranged. A slit 25 having a uniform width is formed in the vicinity of the edge, and the small hole group 1 of the first chamber 21 is formed.
Gas coming out of 3 goes around the partition plate 24 and the slit 2
5 is configured to be discharged into the discharge space as a laminar flow. This makes it possible to further average the flow of the gas that has flowed out of the small hole group 13.

【0025】更に、第4図に示すものは、(A)に断面
図、(B)にそのB−B断面図を示すように、同じく図
1の容器1を第1室31とし、その小孔群13から出た
ガスが導入される第2室32を設けて、その第2室32
には縁部近傍に一様な幅のスリット33を形成するとと
もに、その内部に多数のボールビーズ34を封入した構
造を有し、小孔群13から出たガスをボールビーズ34
により整流してスリット33から吹き出すように構成さ
れている。
Further, as shown in FIG. 4, the container 1 shown in FIG. 1 is used as a first chamber 31 as shown in FIG. A second chamber 32 into which gas discharged from the hole group 13 is introduced is provided.
Has a structure in which a slit 33 having a uniform width is formed in the vicinity of the edge, and a number of ball beads 34 are sealed in the inside thereof.
And is blown out from the slit 33.

【0026】以上の図1,図2および図4のガス導入容
器においては、乱流化する空間は大きいほどよく、その
幅は電極幅以上にとることが望ましい。
In the gas introduction container shown in FIGS. 1, 2 and 4, the larger the turbulent space, the better, and its width is desirably larger than the electrode width.

【0027】容器の大きさはそれが取り付けられる放電
装置の大きさにより制限されるが、乱流空間の奥行きは
少なくとも幅に対して1/8以上の大きさとすることが
望ましい。
Although the size of the container is limited by the size of the discharge device to which it is attached, it is desirable that the depth of the turbulent space is at least に 対 し て or more of the width.

【0028】また、図2の構成において、小孔群13の
各小孔の大きさは仕切り板24の長さにも依存するが、
直径1〜10mm程度が望ましい。1mm未満であると
反応性の高いガスを通したとき、反応生成物が目詰まり
する恐れがあり、10mmを越えると整流効果が薄くな
る。
In the configuration of FIG. 2, the size of each small hole of the small hole group 13 also depends on the length of the partition plate 24.
A diameter of about 1 to 10 mm is desirable. If it is less than 1 mm, the reaction product may be clogged when a highly reactive gas is passed, and if it exceeds 10 mm, the rectifying effect becomes thin.

【0029】さらに、図2の構成において、ガス導入口
11を有する第1室21とガス吹き出し側の第2室22
の大きさは同じであってもよいし、異なる大きさとして
もよい。例えば図3に示すように、ガス吹き出し側の第
2室22の大きさを第1室21に対して小さくすると、
常圧放電空間に導入するガスの流速の均一性がより向上
する。
Further, in the configuration shown in FIG. 2, a first chamber 21 having a gas inlet 11 and a second chamber 22 on the gas blowing side are provided.
May have the same size or different sizes. For example, as shown in FIG. 3, when the size of the second chamber 22 on the gas blowing side is made smaller than that of the first chamber 21,
The uniformity of the flow velocity of the gas introduced into the normal pressure discharge space is further improved.

【0030】図4の構成におけるボールビーズ34は、
図1,図2の小孔群13に相当する整流効果を実現す
る。ボールビーズ34の材質はガスとの反応性のないも
のを選択すればよく、具体的には、ガラス、ポリ四フッ
化エチレン、酸化チタン、あるいはそれらでコーティン
グした球状体や金属球を挙げることができる。
The ball beads 34 in the configuration of FIG.
A rectifying effect corresponding to the small hole group 13 in FIGS. 1 and 2 is realized. The material of the ball beads 34 may be selected from those having no reactivity with gas, and specific examples include glass, polytetrafluoroethylene, titanium oxide, or a spherical body or metal sphere coated with them. it can.

【0031】図5および図6は請求項4において用いる
ガス導入容器の例を、それぞれ容器の壁体を透視した状
態で示している。
FIGS. 5 and 6 show examples of the gas introduction container used in claim 4 in a state where the wall of the container is seen through.

【0032】この各例においては、電極間へのガスの導
入方向(吹き出し方向)Aに断面が徐々に拡大する空間
41または51と、その空間41または51に対して格
子状の隔壁42または52を介して連通し、かつ、上記
方向Aに断面が徐々に縮小する空間43または53を備
え、その空間43または53の終端部に、一様な幅を有
するスリット44または54を備えた構造を有する。ま
た、図5の例では空間41の断面拡大方向に、また、図
6の例ではそれに直交する方向に沿ってガス供給管Gか
ら反応性ガスを導入するように構成されている。
In each of these examples, a space 41 or 51 whose cross section gradually expands in a gas introduction direction (blowing direction) A between the electrodes, and a grid-like partition wall 42 or 52 with respect to the space 41 or 51. And a space 43 or 53 whose cross section gradually reduces in the direction A, and a slit 44 or 54 having a uniform width is provided at the end of the space 43 or 53. Have. In the example shown in FIG. 5, the reactive gas is introduced from the gas supply pipe G in the direction in which the space 41 is enlarged in the cross section of the space 41, and in the example shown in FIG.

【0033】このような構造によると、ガス供給管Gか
ら供給されたガスは、空間41または51において乱流
化され、格子状の隔壁42または52を介して空間43
または53に流入することにより次第に整流され、スリ
ット44または54から層流となって吹き出す。
According to such a structure, the gas supplied from the gas supply pipe G is turbulent in the space 41 or 51, and the space 43 or 52 is passed through the grid-like partition 42 or 52.
Alternatively, the flow is gradually rectified by flowing into the slit 53 and is discharged from the slit 44 or 54 as a laminar flow.

【0034】電極間では被処理体の走行方向と反応ガス
の吹出方向は平行であることが好ましい。また、通常は
被処理体の走行の向きとガスの吹出の向きは同じである
方が処理効率が良いが、巻込空気による酸素阻害が問題
となる場合は被処理体の走行の向きと対向するむきにガ
スを導入するとよい。
It is preferable that the running direction of the object to be processed and the blowing direction of the reactive gas be parallel between the electrodes. In general, it is better to treat the object in the same direction as the direction of the gas blowout to improve the processing efficiency. However, when oxygen inhibition by entrained air is a problem, the direction of the object is opposite to the direction of the traveling. It is advisable to introduce gas in the area.

【0035】上記酸素阻害が問題となる場合の例として
は、フッ化膜、窒化膜、あるいは酸化膜を被処理体の表
面に形成するような場合を挙げることができる。
As an example of the case where the oxygen inhibition becomes a problem, there is a case where a fluoride film, a nitride film, or an oxide film is formed on the surface of the object to be processed.

【0036】本発明において、ガス流の流速は0.1〜
50SLMであることが望ましい。0.1SLM未満で
あるとガスの流れが滞り、層流を形成することができな
い。また、50SLMを越えると全てのガスが処理に寄
与するわけではないので不経済であるばかりでなく、容
器内の隙間や継ぎ目の部分で渦が生じ、流れを乱す結
果、処理が不均一となる。
In the present invention, the flow rate of the gas flow is 0.1 to
Preferably, it is 50 SLM. If it is less than 0.1 SLM, the flow of the gas is interrupted and a laminar flow cannot be formed. In addition, when the gas exceeds 50 SLM, not all gas contributes to the treatment, which is not only uneconomical, but also causes vortices in gaps and seams in the container, disturbing the flow, resulting in uneven treatment. .

【0037】また、以上の各ガス導入容器の材質は、例
示したような構造が実現できれは特に限定されるもので
はないが、通過する反応性ガスの気化温度によって選ぶ
必要がある。常温、常圧下でガス状である場合、ABS
(アクリロニトリル−ブタジエン−スチレン共重合
体)、ポリカーボネート、アクリル、塩化ビニル、ポリ
四フッ化エチレン等の樹脂によって構成することができ
る。液体原料ないしは固体原料を気化導入する場合のよ
うに、常温、常圧で液化、固化の可能性があるガスを使
用する場合は、容器加熱が必要となる関係上、鉄、銅、
アルミニウム等の金属製とすることが望ましく、製作上
の簡便さからステンレス製がより望ましい。
The material of each of the above-mentioned gas introduction vessels is not particularly limited as long as the exemplified structure can be realized, but it is necessary to select the material according to the vaporization temperature of the reactive gas passing therethrough. ABS when it is gaseous at normal temperature and pressure
(Acrylonitrile-butadiene-styrene copolymer), polycarbonate, acryl, vinyl chloride, polytetrafluoroethylene, and other resins. When using a gas that can be liquefied and solidified at normal temperature and normal pressure, such as when introducing a liquid material or a solid material by vaporization, iron, copper,
It is desirable to use a metal such as aluminum, and it is more desirable to use a stainless steel for ease of manufacture.

【0038】本発明において、常圧下にて対向する電極
間にグロー放電を生起させてプラズマを発生するための
条件としては、特に限定されるものではないが、放電電
流密度が0.2〜300mA/cm2 となるように、パ
ルス電界を形成する方法が、本発明者らの研究により適
していることが判明している。
In the present invention, the conditions for generating glow discharge between the opposing electrodes under normal pressure to generate plasma are not particularly limited, but the discharge current density is 0.2 to 300 mA. / Cm 2 , it has been found that a method of forming a pulsed electric field is more suitable for the study of the present inventors.

【0039】ここで言う放電電流密度とは、放電により
電極間に流れる電流値を、放電空間における電流の流れ
方向と直交する方向の面積で除した値を言い、本発明の
ように平行平板型の電極を用いる場合には、その対向面
積で上記電流値を除した値に相当する。
The term “discharge current density” as used herein refers to a value obtained by dividing the value of the current flowing between the electrodes by discharge by the area of the discharge space in the direction orthogonal to the direction of current flow, as in the present invention. In the case where the electrodes are used, the value corresponds to a value obtained by dividing the current value by the facing area.

【0040】[0040]

【実施例】以下、本発明を適用したガス導入容器を用い
て実際にガスを流してその流速を測定した結果と、その
ようなガス導入容器を用いて平行平板型の放電電極間に
ガスを導入して実際にプラズマ処理を行った実施例を、
それぞれの比較例とともに述べる。
EXAMPLES The results of measuring the flow rate of a gas actually flowing through a gas introduction vessel to which the present invention is applied and the results of measuring the flow rate of a gas between parallel plate type discharge electrodes using such a gas introduction vessel are described below. An example of introducing and actually performing plasma processing
It is described together with each comparative example.

【0041】<実施例1−1>図2に示したガス導入容
器(アクリル樹脂製、幅400mm×長さ100mm×
高さ50mm、第1室21と第2室22の大きさの比を
50:50、小孔群13が設けられた仕切り板20の板
厚を5mm、スリット25の幅2mm、小孔群13とし
て直径4mmの孔を7個等間隔で配置)に流量10SL
Mの窒素ガスを供給して、スリット25から吹き出すガ
ス流の流速を50mm間隔で測定した。その測定結果を
図7に示す。
<Example 1-1> The gas introduction container shown in FIG. 2 (made of acrylic resin, 400 mm wide × 100 mm long ×
Height 50 mm, the ratio of the size of the first chamber 21 to the second chamber 22 is 50:50, the thickness of the partition plate 20 provided with the small hole group 13 is 5 mm, the width of the slit 25 is 2 mm, and the small hole group 13 7 holes of 4 mm in diameter are arranged at equal intervals) and the flow rate is 10 SL
M nitrogen gas was supplied, and the flow velocity of the gas flow blown out from the slit 25 was measured at 50 mm intervals. FIG. 7 shows the measurement results.

【0042】<実施例1−2>図3(A),(B)に示
すように、ガス導入容器の第1室21と第2室22の大
きさの比を略60:40とし、小孔群13が設けられた
仕切り板20の板厚を15mmとした以外は実施例1−
1と同じとした。ガス流速の測定結果を図7に示す。
<Embodiment 1-2> As shown in FIGS. 3A and 3B, the size ratio of the first chamber 21 and the second chamber 22 of the gas introduction container is set to approximately 60:40, Example 1 was repeated except that the plate thickness of the partition plate 20 provided with the hole group 13 was set to 15 mm.
Same as 1. FIG. 7 shows the measurement results of the gas flow velocity.

【0043】<実施例2>図4に示したガス導入容器
(高密度ポリエチレン製、幅400mm×長さ250m
m×高さ200mm、隔壁42としてステンレス製の1
00メッシュを配置、スリット44の幅2mm、吹き出
し角度45°)を用い、他は実施例1−1と同じとし
た。ガス流速の測定結果を図7に示す。
<Embodiment 2> The gas introduction container shown in FIG. 4 (made of high-density polyethylene, 400 mm wide × 250 m long)
mx 200 mm height, stainless steel 1 as partition 42
A mesh of 00 was used, the width of the slit 44 was 2 mm, and the blowing angle was 45 °. FIG. 7 shows the measurement results of the gas flow velocity.

【0044】<比較例1>図8にこの比較例1で用いた
ガス導入容器を示す。図において(A)は正面図であ
り、(B)はそのB−B断面図である。このガス導入容
器は、直方体形状の容器71内に、一端に一様な隙間7
2を有する仕切り板73を設けるとともに、容器71の
縁部近傍に一様な幅のスリット74を形成し、容器71
には2箇所にガス導入口を設けてそれぞれにガス供給管
Gを接続した構造となっている。
<Comparative Example 1> FIG. 8 shows a gas introduction container used in Comparative Example 1. In the figure, (A) is a front view, and (B) is a BB cross-sectional view thereof. This gas introduction container has a uniform gap 7 at one end in a rectangular parallelepiped container 71.
2, a slit 74 having a uniform width is formed near the edge of the container 71,
Has a structure in which two gas inlets are provided and gas supply pipes G are connected to each.

【0045】容器71はアクリル樹脂製で、幅400m
m×長さ60mm×高さ50mmであり、スリット74
の幅は2mm、そのスリット74からのガス吹き出し角
度は45°とした。
The container 71 is made of acrylic resin and has a width of 400 m.
m × length 60 mm × height 50 mm, slit 74
Was 2 mm, and the gas blowing angle from the slit 74 was 45 °.

【0046】以上のようなガス導入容器を用いた他は実
施例1−1と同じとした。ガス流速の測定結果を図7に
示す。
The procedure was the same as in Example 1-1, except that the above gas introduction container was used. FIG. 7 shows the measurement results of the gas flow velocity.

【0047】<ガス導入容器の性能評価>図7のグラフ
から明らかなように、実施例1−1,1−2および実施
例2ではスリットの長さ方向に流速が略一定の分布とな
っているのに対し、比較例1では大きく変動しており、
本発明で用いるガス導入容器によるガス流速の均一性が
確認された。また、実施例1−1と実施例1−2の結果
から明らかなように、ガス導入容器全体に対する第1室
21の割合を第2室22(ガス吹き出し側)よりも大き
く設定すると、ガス流速の均一性が更に向上することも
確認された。
<Evaluation of Performance of Gas Introducing Container> As is clear from the graph of FIG. 7, in Examples 1-1, 1-2 and Example 2, the flow velocity has a substantially constant distribution in the length direction of the slit. On the other hand, in Comparative Example 1, there was a large fluctuation,
The uniformity of the gas flow rate by the gas introduction container used in the present invention was confirmed. Further, as is clear from the results of Example 1-1 and Example 1-2, when the ratio of the first chamber 21 to the entire gas introduction container is set to be larger than that of the second chamber 22 (gas blowing side), the gas flow rate It was also confirmed that the uniformity of the composition was further improved.

【0048】<実施例3>図9に示す常圧プラズマ処理
装置を用いて、被処理基材Wの表面に製膜した。
Example 3 A film was formed on the surface of the substrate W to be processed by using the normal pressure plasma processing apparatus shown in FIG.

【0049】装置は、ステンレス製のチャンバ81内に
平行平板型の放電電極82a,82bが設けられた構造
を有し、電極82a,82bとしては誘電体被覆電極
(電極幅350mm×長さ150mm、誘電体として酸
化チタン10重量%+酸化アルミニウム90重量%の金
属酸化物1.5mm被覆)を用い、電極間隔は2mmと
した。電極の周りを肉厚30mmのアセタール樹脂(商
品名;デルリン)で絶縁し、被処理基材Wの走行方向に
対向する位置に図2に示したガス導入容器Iを配置し
た。被処理基材Wはポリエチレンテレフタレートフィル
ム(東レ社製、ルミラーT50、幅300mm)とし、
ロール状にして電極82a,82b間を走行させた。
The apparatus has a structure in which parallel plate type discharge electrodes 82a and 82b are provided in a stainless steel chamber 81, and the electrodes 82a and 82b are dielectric coated electrodes (electrode width 350 mm × length 150 mm, As the dielectric material, a metal oxide of 10% by weight of titanium oxide + 90% by weight of aluminum oxide (1.5 mm coating) was used, and the distance between the electrodes was 2 mm. The periphery of the electrode was insulated with a 30 mm-thick acetal resin (trade name: Delrin), and the gas introduction container I shown in FIG. The substrate W to be treated is a polyethylene terephthalate film (Lumirror T50, width 300 mm, manufactured by Toray Industries, Inc.)
It was made to roll and run between the electrodes 82a and 82b.

【0050】装置を真空排気した後、0.2SLMの六
フッ化プロピレンと9.8SLMの窒素ガスの混合気を
導入して1013hPaとした。
After evacuating the apparatus, a mixture of 0.2 SLM of propylene hexafluoride and 9.8 SLM of nitrogen gas was introduced to 1013 hPa.

【0051】被処理基材Wを1m/minで走行させ、
電極82a,82b間に高周波電源83からパルス電界
(波高値29kV,周波数8kHz、立ち上がり速度1
0μs)を印加してグロー放電を生じせしめ、基材表面
に炭化フッ素の重合膜を製膜した。
The substrate W to be processed is run at 1 m / min.
A pulse electric field (peak value 29 kV, frequency 8 kHz, rising speed 1) from the high frequency power source 83 between the electrodes 82 a and 82 b
0 μs) was applied to generate glow discharge, and a fluorocarbon polymer film was formed on the surface of the substrate.

【0052】<比較例2>図8に示したガス導入容器を
用いた以外は、実施例3と同じとした。
Comparative Example 2 The procedure was the same as in Example 3 except that the gas introduction container shown in FIG. 8 was used.

【0053】<比較例3>図10に示したガス吹き出し
口、すなわち、ポリ四フッ化エチレン製のパイプで矩形
状のガス流路91を形成し、その内側に電極間に向けて
直径2mmの孔92を10mm間隔で多数個配置したも
のを用いてガスを導入した他は、実施例3と同様とし
た。
<Comparative Example 3> A gas outlet shown in FIG. 10, that is, a rectangular gas flow path 91 was formed by a pipe made of polytetrafluoroethylene, and a gas passage 91 having a diameter of 2 mm was formed inside the gas flow path 91 between the electrodes. Example 3 was the same as Example 3 except that gas was introduced using a large number of holes 92 arranged at 10 mm intervals.

【0054】<比較例4>ガス吹き出し孔付の誘電体被
覆電極(電極幅350mm×長さ150mm、誘電体と
して酸化チタン10重量%+酸化アルミニウム90重量
%の金属酸化物を1.5mm厚で被覆し、直径1mmの
孔を1cm間隔でマトリクス状に配設)を用いてガスを
導入する他は、実施例3と同じとした。
<Comparative Example 4> A dielectric-coated electrode with gas blowing holes (electrode width: 350 mm x length: 150 mm, metal oxide of 10% by weight of titanium oxide + 90% by weight of aluminum oxide as a dielectric material having a thickness of 1.5 mm) Except that gas was introduced by using a cover and holes having a diameter of 1 mm arranged in a matrix at intervals of 1 cm).

【0055】<実施例および比較例による製膜結果の評
価>実施例3および比較例2〜4による処理品につい
て、その膜厚をエンプソメータ(溝尻工学工業所製、D
VA−36VW)で幅方向および走行方向について2c
m間隔で測定した。それぞれについての膜厚の平面分布
を図11〜図14に示す。
<Evaluation of Film-Forming Results by Examples and Comparative Examples> For the processed products of Example 3 and Comparative Examples 2 to 4, the film thickness was measured using an empsometer (D
VA-36VW) and 2c in the width and running directions
It was measured at m intervals. The planar distribution of the film thickness for each is shown in FIGS.

【0056】この各図から明らかなように、本発明の実
施例3により得られた処理品では、全面にわたって膜厚
のばらつきが平均膜厚の±10%内に収まっているのに
対し、各比較例により得られた処理品では、膜厚に大き
な偏りが生じている。この偏りは、比較例2,3ではガ
スの被処理体幅方向に対する流れが不均一であることが
原因と考えられ、比較例4では、電極に孔が開いている
ため、電界に不均一が生じることが原因と考えられる。
As is clear from these figures, in the processed product obtained according to the third embodiment of the present invention, the variation in film thickness over the entire surface is within ± 10% of the average film thickness. In the processed product obtained in the comparative example, a large deviation occurs in the film thickness. This bias is considered to be caused by the non-uniform flow of the gas in the width direction of the object in Comparative Examples 2 and 3. In Comparative Example 4, the electric field was non-uniform due to holes in the electrodes. The cause is considered to be the cause.

【0057】[0057]

【発明の効果】以上のように、本発明によれば、工業的
に有利な大気圧近傍の圧力下で発生する放電プラズマを
用いた処理により、膜厚ムラ±10%以下という均一な
膜合成が可能となり、高性能の光学薄膜等を安価に形成
することできる。
As described above, according to the present invention, a uniform film having a thickness unevenness of ± 10% or less can be obtained by a process using discharge plasma generated under a pressure near the atmospheric pressure which is industrially advantageous. And a high-performance optical thin film or the like can be formed at a low cost.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明で用いることのできるガス導入容器の構
成例の説明図
FIG. 1 is a diagram illustrating a configuration example of a gas introduction container that can be used in the present invention.

【図2】本発明で用いることのできるガス導入容器の他
の構成例の説明図で、実施例1−1および3で用いたガ
ス導入容器を示す図
FIG. 2 is an explanatory diagram of another configuration example of the gas introduction container that can be used in the present invention, and is a diagram showing the gas introduction container used in Examples 1-1 and 3;

【図3】本発明で用いることのできるガス導入容器の更
に別の構成例の説明図で、実施例1−2で用いたガス導
入容器を示す図
FIG. 3 is an explanatory diagram of still another configuration example of the gas introduction container that can be used in the present invention, and is a diagram showing the gas introduction container used in Example 1-2.

【図4】本発明で用いることのできるガス導入容器の更
に別の構成例の説明図
FIG. 4 is an explanatory diagram of still another configuration example of the gas introduction container that can be used in the present invention.

【図5】本発明で用いることのできるガス導入容器の更
に別の構成例の説明図
FIG. 5 is an explanatory diagram of still another configuration example of the gas introduction container that can be used in the present invention.

【図6】本発明で用いることのできるガス導入容器の更
に別の構成例の説明図
FIG. 6 is an explanatory diagram of still another configuration example of the gas introduction container that can be used in the present invention.

【図7】本発明の実施例1−1,1−2および実施例2
と、比較例1におけるガス流速の分布の測定結果を示す
グラフ
FIG. 7 shows Examples 1-1 and 1-2 and Example 2 of the present invention.
And the graph which shows the measurement result of the distribution of the gas flow velocity in the comparative example 1

【図8】比較例1で用いたガス導入容器の構成の説明図FIG. 8 is an explanatory diagram of a configuration of a gas introduction container used in Comparative Example 1.

【図9】本発明の実施例3で用いた常圧プラズマ処理装
置の構成を示す模式図
FIG. 9 is a schematic view showing a configuration of an atmospheric pressure plasma processing apparatus used in Embodiment 3 of the present invention.

【図10】比較例3で用いたガス吹き出し口の構成の説
明図
FIG. 10 is an explanatory diagram of a configuration of a gas outlet used in Comparative Example 3.

【図11】実施例3で得た処理品の膜厚分布を示すグラ
FIG. 11 is a graph showing a film thickness distribution of a processed product obtained in Example 3.

【図12】比較例2で得た処理品の膜厚分布を示すグラ
FIG. 12 is a graph showing a film thickness distribution of a processed product obtained in Comparative Example 2.

【図13】比較例3で得た処理品の膜厚分布を示すグラ
FIG. 13 is a graph showing a film thickness distribution of a processed product obtained in Comparative Example 3.

【図14】比較例4で得た処理品の膜厚分布を示すグラ
FIG. 14 is a graph showing a film thickness distribution of a processed product obtained in Comparative Example 4.

【符号の説明】[Explanation of symbols]

1 容器(第1室) 11 ガス導入口 12 邪魔板 13 小孔群 21,31 第1室 22,32 第2室 23 隙間 24 仕切り板 25,33 スリット 34 ボールビーズ 41,51 断面が徐々に拡大する空間 42,52 格子状の隔壁 43,53 断面が徐々に縮小する空間 44,54 スリット 81 チャンバ 82a,82b 放電電極 83 高周波電源 G ガス供給管 I ガス導入容器 W 被処理基材 Reference Signs List 1 container (first chamber) 11 gas inlet 12 baffle plate 13 small hole group 21, 31 first chamber 22, 32 second chamber 23 gap 24 partition plate 25, 33 slit 34 ball bead 41, 51 The cross section is gradually enlarged Spaces 42, 52 lattice-shaped partition walls 43, 53 spaces in which the cross section gradually decreases 44, 54 slits 81 chambers 82a, 82b discharge electrodes 83 high-frequency power supply G gas supply pipe I gas introduction container W substrate to be processed

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 大気圧近傍の圧力下で、対向する一対の
電極の少なくとも一方の対向面に固体誘電体を配置した
状態で、その一対の電極間にパルス化された電界を印加
することにより発生するプラズマを用いるプラズマ処理
方法において、上記一対の電極を、互いの対向面がそれ
ぞれ略平滑な平行平板電極とするとともに、その電極間
に挟まれた空間に、電極幅にわたる流速の変動幅が±2
0%以下の略均一な流速のもとに反応ガスを導入するこ
とを特徴とする常圧放電プラズマ処理方法。
1. A pulsed electric field is applied between a pair of electrodes while a solid dielectric is disposed on at least one of the opposing surfaces of the pair of electrodes under a pressure near the atmospheric pressure. In the plasma processing method using generated plasma, the pair of electrodes is a parallel plate electrode whose opposing surfaces are each substantially smooth, and a fluctuation width of the flow velocity over the electrode width is in a space interposed between the electrodes. ± 2
A normal pressure discharge plasma processing method, wherein a reaction gas is introduced at a substantially uniform flow rate of 0% or less.
【請求項2】 上記一対の電極間に被処理体を一定方向
に走行させ、その被処理体の走行方向に平行な方向に反
応ガスを導入することを特徴とする、請求項1に記載の
常圧放電プラズマ処理方法。
2. The method according to claim 1, wherein the object to be processed is caused to travel in a certain direction between the pair of electrodes, and the reaction gas is introduced in a direction parallel to the traveling direction of the object to be processed. Atmospheric pressure discharge plasma treatment method.
【請求項3】 ガス導入方向に対向する斜板を有し、か
つ、ガス導入口から遠ざかるほど狭くなる区画内に一旦
導いて拡散させると同時に、被処理体の走行方向に略平
行にガス流方向を偏向させた後、電極幅より大きな長さ
を持ち、かつ、その長さ方向に略一定の幅を有するスリ
ット、もしくは電極幅より大きな寸法にわたって一様に
並べられた多数の小孔を介して、電極間に向けて吹き出
す構造を持つガス導入容器を用い、反応ガスを略均一な
流速のもとに電極間に導入することを特徴とする、請求
項1または2に記載の常圧放電プラズマ処理方法。
3. A swash plate facing the gas introduction direction, wherein the swash plate is once guided and diffused in a section which becomes narrower as the distance from the gas introduction port increases, and at the same time, the gas flow is substantially parallel to the running direction of the object to be processed. After deflecting the direction, through a slit having a length larger than the electrode width and having a substantially constant width in the length direction, or through a number of small holes uniformly arranged over a dimension larger than the electrode width. The normal pressure discharge according to claim 1 or 2, wherein a reaction gas is introduced between the electrodes at a substantially uniform flow rate by using a gas introduction container having a structure for blowing out the gas between the electrodes. Plasma treatment method.
【請求項4】 電極間へのガス導入方向に断面が緩やか
に拡大する第1の区画内で拡散させた後、格子もしくは
網状の壁面を介して、ガス吹出方向に断面が緩やかに縮
小する第2の区画に導き、その第2の区画の終端に設け
られた、電極幅より大きな長さを持ち、かつ、その長さ
方向に略一定の幅を有するスリットを介して電極間に向
けて吹き出す構造を持つガス導入容器を用い、反応ガス
を略均一な流速のもとに電極間に導入することを特徴と
する、請求項1または2に記載の常圧放電プラズマ処理
方法。
4. After diffusing in a first section whose cross section gradually expands in the gas introduction direction between the electrodes, the cross section gradually shrinks in the gas blowing direction via a lattice or mesh-like wall surface. To the second section, and blows out between the electrodes via a slit provided at the end of the second section and having a length greater than the electrode width and having a substantially constant width in the length direction. 3. The normal pressure discharge plasma processing method according to claim 1, wherein the reaction gas is introduced between the electrodes at a substantially uniform flow rate using a gas introduction container having a structure.
JP28552098A 1997-12-17 1998-10-07 Atmospheric pressure discharge plasma processing method and atmospheric pressure plasma processing apparatus Expired - Lifetime JP3533094B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28552098A JP3533094B2 (en) 1997-12-17 1998-10-07 Atmospheric pressure discharge plasma processing method and atmospheric pressure plasma processing apparatus

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP34799797 1997-12-17
JP9-347997 1997-12-17
JP28552098A JP3533094B2 (en) 1997-12-17 1998-10-07 Atmospheric pressure discharge plasma processing method and atmospheric pressure plasma processing apparatus

Publications (2)

Publication Number Publication Date
JPH11236676A true JPH11236676A (en) 1999-08-31
JP3533094B2 JP3533094B2 (en) 2004-05-31

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Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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