JPH10118204A - Charged particle beam apparatus and operation method thereof - Google Patents
Charged particle beam apparatus and operation method thereofInfo
- Publication number
- JPH10118204A JPH10118204A JP9227759A JP22775997A JPH10118204A JP H10118204 A JPH10118204 A JP H10118204A JP 9227759 A JP9227759 A JP 9227759A JP 22775997 A JP22775997 A JP 22775997A JP H10118204 A JPH10118204 A JP H10118204A
- Authority
- JP
- Japan
- Prior art keywords
- charged particle
- particle beam
- irradiation
- accelerator
- electromagnet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61N—ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
- A61N5/00—Radiation therapy
- A61N5/10—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy
- A61N5/1042—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy with spatial modulation of the radiation beam within the treatment head
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61N—ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
- A61N5/00—Radiation therapy
- A61N5/10—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy
- A61N2005/1085—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy characterised by the type of particles applied to the patient
- A61N2005/1087—Ions; Protons
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- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Biomedical Technology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Animal Behavior & Ethology (AREA)
- General Health & Medical Sciences (AREA)
- Public Health (AREA)
- Veterinary Medicine (AREA)
- Radiation-Therapy Devices (AREA)
- X-Ray Techniques (AREA)
- Particle Accelerators (AREA)
Abstract
(57)【要約】
【課題】荷電粒子ビームの損失を低減した荷電粒子ビー
ム装置とその運転方法を提供する。
【解決手段】患部形状等の情報に基づき予め、演算装置
131でビームの水平方向の照射点と必要な線量を定め
ておく。水平方向の照射点の間隔は、散乱体300で広
げたビームの径の半分程度以下にすることが望ましい。
照射位置設定用の電磁石220,221の電源装置160を
制御装置132で制御する。
【効果】荷電粒子ビームの損失を少なくして、均一な照
射野を形成することができる。
(57) Abstract: Provided is a charged particle beam device in which the loss of a charged particle beam is reduced, and an operation method thereof. An arithmetic unit 131 determines in advance a horizontal irradiation point of a beam and a necessary dose based on information such as the shape of an affected part. It is desirable that the interval between the irradiation points in the horizontal direction is about half or less of the diameter of the beam spread by the scatterer 300.
The power supply 160 of the irradiation position setting electromagnets 220 and 221 is controlled by the controller 132. [Effect] A uniform irradiation field can be formed by reducing the loss of the charged particle beam.
Description
【0001】[0001]
【発明の属する技術分野】本発明は、荷電粒子ビームを
癌治療や患部の診断に利用する荷電粒子ビーム装置に関
する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a charged particle beam apparatus that uses a charged particle beam for treating cancer or diagnosing an affected part.
【0002】[0002]
【従来の技術】従来の荷電粒子ビーム装置は、実公平5
−40479 号公報に記載されている。この従来技術を図1
7を用いて説明する。2. Description of the Related Art Conventional charged particle beam devices are
-40479. This prior art is shown in FIG.
7 will be described.
【0003】図17において、荷電粒子ビーム82はz
方向に進む。x方向走査電磁石80,y方向走査電磁石
81に、位相差が90°の正弦波電流を流すと、それぞ
れの電磁石に発生する磁場によって、荷電粒子ビームは
円形に走査される。円形に走査される荷電粒子ビームを
散乱体83に当てると荷電粒子ビームの径は増大される
ので、照射領域での線量分布は図3(a)のようにな
る。2rにわたる領域では照射線量は均一になるが、2
rより外側になるほど照射線量は減少して不均一であ
る。従って、不均一な照射領域をコリメータでカット
し、照射線量の均一な照射領域のみを患部へ照射してい
た。In FIG. 17, a charged particle beam 82 has a z
Proceed in the direction. When a sinusoidal current having a phase difference of 90 ° flows through the x-direction scanning electromagnet 80 and the y-direction scanning electromagnet 81, the charged particle beam is scanned in a circular shape by the magnetic field generated in each electromagnet. When a charged particle beam scanned in a circular shape is applied to the scatterer 83, the diameter of the charged particle beam is increased, so that the dose distribution in the irradiation area is as shown in FIG. In the region over 2r, the irradiation dose becomes uniform,
The irradiation dose decreases and becomes non-uniform as it goes outside of r. Therefore, the non-uniform irradiation area is cut by the collimator, and only the irradiation area having a uniform irradiation dose is irradiated to the affected part.
【0004】また、特開平7−275381 号公報は、患部の
形状に合わせて電磁石を制御することにより、照射範囲
を任意の形状に成形することを記載する。[0004] Japanese Patent Application Laid-Open No. 7-275381 describes that an irradiation range is formed into an arbitrary shape by controlling an electromagnet according to the shape of an affected part.
【0005】[0005]
【発明が解決しようとする課題】しかし、従来技術で
は、不均一な照射領域をコリメータでカットしているの
で、荷電粒子ビームの損失が多い。また、広い照射野を
得るためには、ビーム径を増加させる散乱体83を厚く
しなくてはならず、荷電粒子ビームエネルギーの損失が
大きくなる問題がある。However, in the prior art, since the non-uniform irradiation area is cut by the collimator, the loss of the charged particle beam is large. Further, in order to obtain a wide irradiation field, the scatterer 83 for increasing the beam diameter must be thickened, which causes a problem that the energy loss of the charged particle beam increases.
【0006】本発明の目的は、荷電粒子ビームの損失を
低減した荷電粒子ビーム装置とその運転方法を提供する
ことにある。An object of the present invention is to provide a charged particle beam apparatus in which the loss of a charged particle beam is reduced and an operation method thereof.
【0007】[0007]
【課題を解決するための手段】上記目的を達成する本発
明の特徴は、散乱体が荷電粒子ビームの径を拡大し、出
射切り替え手段が荷電粒子ビームの出射および停止を切
り替え、電磁石が荷電粒子ビームの照射位置または照射
範囲を設定し、制御装置が荷電粒子ビームを停止中に電
磁石を制御して照射位置または照射範囲を変更させるこ
とにある。A feature of the present invention that achieves the above object is that the scatterer enlarges the diameter of the charged particle beam, the emission switching means switches between emission and stop of the charged particle beam, and the electromagnet switches the charged particle beam. An irradiation position or irradiation range of a beam is set, and a control device controls an electromagnet while the charged particle beam is stopped to change the irradiation position or irradiation range.
【0008】この特徴によれば、出射切り替え手段が荷
電粒子ビームの出射を停止している間に、制御装置が照
射位置または照射範囲を変更させて荷電粒子ビーム照射
対象に照射するので、照射対象には照射位置または照射
範囲ごとに荷電粒子ビームが照射され、照射対象の全域
を覆うように散乱体で拡大された荷電粒子ビームを拡大
さする場合に比べて、照射対象の回りにできる不均一な
照射領域を小さくでき、荷電粒子ビームの損失を低減で
きる。また、散乱体を用いない場合に比べて、ビーム径
が大きいので照射位置または照射範囲の変更回数が少な
く、制御が簡単である。According to this feature, while the emission switching means stops the emission of the charged particle beam, the control device changes the irradiation position or the irradiation range to irradiate the charged particle beam with the irradiation object. The charged particle beam is radiated at each irradiation position or irradiation range, and the non-uniformity around the irradiation target is larger than when the charged particle beam expanded by a scatterer to cover the entire irradiation target is enlarged. Irradiating area can be reduced, and the loss of the charged particle beam can be reduced. Further, compared to the case where no scatterer is used, the beam diameter is large, so that the number of times of changing the irradiation position or the irradiation range is small, and the control is simple.
【0009】また、本発明の他の特徴は、制御装置が拡
大された荷電粒子ビームの径に基づいて照射位置または
照射範囲を変更することにあり、散乱体で拡大された荷
電粒子ビームの照射線量は照射位置を中心として径方向
にほぼガウス分布であるので、荷電粒子ビームが重なっ
て照射線量が均一な照射領域をつくることができ、照射
対象に均一に荷電粒子ビームを照射できる。Another feature of the present invention is that the control device changes the irradiation position or the irradiation range based on the diameter of the expanded charged particle beam, and the irradiation of the charged particle beam expanded by the scatterer. Since the dose has a substantially Gaussian distribution in the radial direction with the irradiation position as the center, the charged particle beams overlap to form an irradiation region having a uniform irradiation dose, and the irradiation target can be uniformly irradiated with the charged particle beam.
【0010】本発明の他の特徴は、目標照射量設定装置
が照射対象の照射領域における目標照射量を定め、照射
量測定装置が各照射領域における荷電粒子ビームの照射
量を測定し、出射切り替え手段が目標照射量と照射量測
定装置で測定された照射量とに基づいて荷電粒子ビーム
の出射および停止を切り替えることにある。Another feature of the present invention is that a target dose setting device determines a target dose in an irradiation region to be irradiated, a dose measuring device measures a dose of a charged particle beam in each irradiation region, and switches emission. Means is to switch between emission and stop of the charged particle beam based on the target irradiation amount and the irradiation amount measured by the irradiation amount measuring device.
【0011】この特徴によれば、照射領域の照射量が目
標照射量に達するまで出射切り替え手段が照射を継続さ
せるので、荷電粒子ビームの強度が時間的に変化した場
合でも、照射対象にビームの密度を一様に照射できる。According to this feature, the emission switching means continues the irradiation until the irradiation amount of the irradiation area reaches the target irradiation amount. Therefore, even if the intensity of the charged particle beam changes with time, the irradiation target is irradiated with the beam. Irradiation with uniform density is possible.
【0012】また、出射切り替え手段が、荷電粒子加速
器を周回する前記荷電粒子ビームのベータトロン振動の
周波数を含む高周波電磁界を前記荷電粒子ビームに加え
る高周波印加装置であれば、荷電粒子加速器を周回する
荷電粒子ビームのベータトロン振動が共鳴状態であると
きに、印加される高周波電磁界により荷電粒子ビームの
ベータトロン振動振幅が増加して共鳴の安定限界を超
え、荷電粒子ビームは荷電粒子加速器から出射される。
このとき、荷電粒子ビームは一定に出射されるので、一
様なビームの密度で荷電粒子ビームを照射対象に照射で
きる。If the emission switching means is a high-frequency applying device for applying a high-frequency electromagnetic field including the frequency of the betatron oscillation of the charged particle beam circling the charged particle accelerator to the charged particle beam, the output switching means may circulate around the charged particle accelerator. When the betatron oscillation of the charged particle beam is in a resonance state, the applied high-frequency electromagnetic field increases the amplitude of the betatron oscillation of the charged particle beam to exceed the stability limit of resonance, and the charged particle beam is transmitted from the charged particle accelerator. Is emitted.
At this time, the charged particle beam is constantly emitted, so that the irradiation target can be irradiated with the charged particle beam at a uniform beam density.
【0013】本発明の他の特徴は、ネルギー変化手段が
荷電粒子ビームのエネルギーを変化させることにあり、
照射停止中に荷電粒子ビームのエネルギーを変化させ
て、照射対象の照射領域を変更することができる。Another feature of the present invention is that the energy changing means changes the energy of the charged particle beam,
The irradiation area of the irradiation target can be changed by changing the energy of the charged particle beam while the irradiation is stopped.
【0014】本発明の他の特徴は、荷電粒子加速器が荷
電粒子ビームの出射および停止を切り替える出射切り替
え手段を有し、荷電粒子ビーム輸送系が荷電粒子ビーム
の輸送および停止を切り替える輸送切り替え装置とを有
し、照射装置は、荷電粒子ビームを拡大する散乱体と、
荷電粒子ビームの照射位置または照射範囲を設定する電
磁石と、拡大された荷電粒子ビームの径に基づいて照射
位置または照射範囲を変更する制御装置を備えることに
ある。Another feature of the present invention is that the charged particle accelerator has emission switching means for switching between emission and stop of the charged particle beam, and the charged particle beam transport system switches between transport and stop of the charged particle beam. Having a scatterer for expanding the charged particle beam,
An electromagnet for setting the irradiation position or irradiation range of the charged particle beam, and a control device for changing the irradiation position or irradiation range based on the diameter of the enlarged charged particle beam are provided.
【0015】この特徴によれば、出射切り替え手段が荷
電粒子加速器を周回する荷電粒子ビームを照射装置へ出
射し、かつ、輸送切り替え装置が荷電粒子ビームを照射
装置へ輸送すれば、荷電粒子ビームは照射装置において
照射対象に照射される。出射切り替え手段が荷電粒子加
速器から照射装置への荷電粒子ビームの出射を停止、ま
たは、輸送切り替え装置が荷電粒子ビームを停止すれ
ば、荷電粒子ビームの照射対象への照射も停止される。
照射の切り替えが2つの切り替え手段によって行われる
から、より安全性が高い。また、出射切り替え手段もし
くは輸送切り替え装置がビームの出射を停止し、制御装
置が散乱体で拡大された荷電粒子ビームの径に基づいて
次の照射位置または照射範囲を変更し、それぞれの位置
で等しい線量を照射すると、散乱体で拡大された荷電粒
子ビームの照射線量は照射位置を中心として径方向にほ
ぼガウス分布であるので、荷電粒子ビームが重なって照
射線量が均一な照射領域をつくることができ、照射対象
に均一に荷電粒子ビームを照射できる。また、均一な照
射領域の周りにできる不均一な照射領域を小さくできる
ので、荷電粒子ビームの損失を低減できる。また、散乱
体を用いない場合に比べて、ビーム径が大きいので照射
位置または照射範囲の変更回数が少なく、制御が簡単で
ある。According to this feature, if the emission switching means emits the charged particle beam orbiting the charged particle accelerator to the irradiation device and the transport switching device transports the charged particle beam to the irradiation device, the charged particle beam is Irradiation is performed on the irradiation target in the irradiation device. When the emission switching unit stops emitting the charged particle beam from the charged particle accelerator to the irradiation device, or when the transport switching device stops the charged particle beam, irradiation of the irradiation target with the charged particle beam is also stopped.
Since the switching of the irradiation is performed by two switching means, the safety is higher. Further, the emission switching means or the transport switching device stops emitting the beam, and the control device changes the next irradiation position or irradiation range based on the diameter of the charged particle beam enlarged by the scatterer, and is equal at each position. When irradiating the dose, the irradiation dose of the charged particle beam expanded by the scatterer is almost Gaussian in the radial direction with the irradiation position as the center, so the charged particle beam can overlap and create an irradiation area where the irradiation dose is uniform The irradiation target can be uniformly irradiated with the charged particle beam. In addition, since the non-uniform irradiation area around the uniform irradiation area can be reduced, the loss of the charged particle beam can be reduced. Further, compared to the case where no scatterer is used, the beam diameter is large, so that the number of times of changing the irradiation position or the irradiation range is small, and the control is simple.
【0016】また、本発明の他の特徴は、患者の動きを
検出する動き検出手段を備え、制御装置が、動き検出で
検出された患者の動きに基づいて、出射切り替え手段を
制御することにあり、患者の呼吸,咳等に起因する体の
動きを検知して、患部がほぼ静止している時に荷電粒子
ビームを照射し、照射対象を精度良く照射することがで
きる。Another feature of the present invention is that the apparatus further comprises a movement detecting means for detecting a movement of the patient, and the control device controls the emission switching means based on the movement of the patient detected by the movement detection. In addition, the body movement caused by the patient's respiration, cough, and the like is detected, and the charged particle beam is irradiated when the affected part is almost stationary, so that the irradiation target can be accurately irradiated.
【0017】また、荷電粒子ビームによる癌治療では、
照射対象の深さによって照射する荷電粒子ビームのエネ
ルギーを変える必要がある。この場合、荷電粒子加速器
を周回する荷電粒子ビームのエネルギーを加速段階で変
更するか、照射装置の荷電粒子ビームが通過する所にグ
ラファイトなどの板上の物質を置いて、出射された荷電
粒子ビームのエネルギーを変えて照射する。[0017] In cancer treatment using a charged particle beam,
It is necessary to change the energy of the charged particle beam to be irradiated depending on the depth of the irradiation target. In this case, the energy of the charged particle beam orbiting the charged particle accelerator is changed in the acceleration stage, or the material on the plate such as graphite is placed where the charged particle beam of the irradiation device passes, and the emitted charged particle beam is Irradiation with varying energy.
【0018】上記目的を達成する本発明の特徴は、散乱
体が荷電粒子ビームの径を拡大し、ビーム出射手段が荷
電粒子加速器から荷電粒子ビームを出射し、電磁石が荷
電粒子ビームの照射位置または照射範囲を設定し、制御
装置が荷電粒子加速器の入射運転,加速運転、または減
速運転中に電磁石を制御して照射位置または照射範囲を
変更させることにある。A feature of the present invention that achieves the above object is that the scatterer enlarges the diameter of the charged particle beam, the beam emitting means emits the charged particle beam from the charged particle accelerator, and the electromagnet moves to the irradiation position of the charged particle beam or An irradiation range is set, and a control device controls an electromagnet during an injection operation, an acceleration operation, or a deceleration operation of the charged particle accelerator to change an irradiation position or an irradiation range.
【0019】この特徴によれば、ビーム出射手段が荷電
粒子ビームを出射した後、荷電粒子加速器が減速運転,
ビーム入射運転、または加速運転していてビームが出射
されていない間に、制御装置が照射位置または照射範囲
を変更させて荷電粒子ビーム照射対象に照射するので、
照射対象には照射位置または照射範囲ごとに荷電粒子ビ
ームが照射され、照射対象の全域を覆うように散乱体で
拡大された荷電粒子ビームを拡大する場合に比べて、照
射対象の回りにできる不均一な照射領域を小さくでき、
荷電粒子ビームの損失を低減できる。また、散乱体を用
いない場合に比べて、ビーム径が大きいので照射位置ま
たは照射範囲の変更回数が少なく、制御が簡単である。According to this feature, after the beam emitting means emits the charged particle beam, the charged particle accelerator operates in the deceleration mode,
Since the control device changes the irradiation position or irradiation range and irradiates the charged particle beam irradiation target while the beam incidence operation or acceleration operation is performed and the beam is not emitted,
The irradiation target is irradiated with the charged particle beam for each irradiation position or irradiation range, and the amount of radiation generated around the irradiation target is smaller than when the charged particle beam expanded by the scatterer to cover the entire irradiation target is enlarged. The uniform irradiation area can be reduced,
The loss of the charged particle beam can be reduced. Further, compared to the case where no scatterer is used, the beam diameter is large, so that the number of times of changing the irradiation position or irradiation range is small, and the control is simple.
【0020】上記目的を達成する本発明の特徴は、散乱
体が荷電粒子ビームの径を拡大し、キッカー電磁石が荷
電粒子ビームを周回軌道から出射軌道に移動させ、電磁
石が荷電粒子ビームの照射位置または照射範囲を設定
し、制御装置が拡大された荷電粒子ビームの径に基づい
て荷電粒子加速器の入射運転,加速運転、または減速運
転中に電磁石を制御して照射位置または照射範囲を変更
することにある。A feature of the present invention that achieves the above object is that the scatterer enlarges the diameter of the charged particle beam, the kicker magnet moves the charged particle beam from the orbit to the emission trajectory, and the electromagnet moves to the irradiation position of the charged particle beam. Alternatively, the irradiation range is set, and the control unit changes the irradiation position or irradiation range by controlling the electromagnet during the injection operation, acceleration operation, or deceleration operation of the charged particle accelerator based on the diameter of the enlarged charged particle beam. It is in.
【0021】この特徴によれば、キッカー電磁石が荷電
粒子ビームを周回軌道から出射軌道に移動させて出射し
た後、荷電粒子加速器が減速運転,ビーム入射運転、ま
たは加速運転していてビームが出射されていない間に、
制御装置が拡大された荷電粒子ビームの径に基づいて照
射位置または照射範囲を変更させて荷電粒子ビーム照射
対象に照射するので、照射対象には照射位置または照射
範囲ごとに荷電粒子ビームが照射され、照射対象の全域
を覆うように散乱体で拡大された荷電粒子ビームを拡大
する場合に比べて、照射対象の回りにできる不均一な照
射領域を小さくでき、荷電粒子ビームの損失を低減でき
る。また、散乱体を用いない場合に比べて、ビーム径が
大きいので照射位置または照射範囲の変更回数が少な
く、制御が簡単である。また、散乱体で拡大された荷電
粒子ビームの照射線量は照射位置を中心として径方向に
ほぼガウス分布であるので、荷電粒子ビームが重なって
照射線量が均一な照射領域をつくることができ、照射対
象に均一に荷電粒子ビームを照射できる。According to this feature, after the kicker magnet moves the charged particle beam from the orbit to the emission orbit and emits the beam, the charged particle accelerator performs the deceleration operation, the beam injection operation, or the acceleration operation to emit the beam. While not
The control device changes the irradiation position or irradiation range based on the diameter of the expanded charged particle beam and irradiates the charged particle beam irradiation target, so that the irradiation target is irradiated with the charged particle beam for each irradiation position or irradiation range. As compared with the case where the charged particle beam expanded by the scatterer so as to cover the entire area of the irradiation target, a non-uniform irradiation area formed around the irradiation target can be reduced, and the loss of the charged particle beam can be reduced. Further, compared to the case where no scatterer is used, the beam diameter is large, so that the number of times of changing the irradiation position or irradiation range is small, and the control is simple. In addition, since the irradiation dose of the charged particle beam expanded by the scatterer is almost Gaussian in the radial direction with the irradiation position as the center, the irradiation region can be created by overlapping the charged particle beams and the irradiation dose is uniform. The target can be uniformly irradiated with the charged particle beam.
【0022】また、キッカー電磁石が励磁されると直ち
に荷電粒子ビームは出射され、キッカー電磁石が励磁さ
れる時間はビームが周回軌道を1周する程度の時間であ
るから、加速器を周回する荷電粒子はこの時間ですべて
出射される。その後、荷電粒子加速器が減速運転,ビー
ム入射運転、または加速運転している間に、照射位置ま
たは照射範囲が変更されるから、ビームが周回軌道を1
周する程度の短い時間に出射されるビームを連続して利
用することができる。The charged particle beam is emitted immediately after the kicker electromagnet is excited, and the time during which the kicker electromagnet is excited is about the time that the beam makes one round of the orbit. It is all emitted at this time. Thereafter, while the charged particle accelerator performs the deceleration operation, the beam injection operation, or the acceleration operation, the irradiation position or the irradiation range is changed.
It is possible to continuously use the beam emitted in a short time to make a circuit.
【0023】[0023]
(実施例1)本発明の第1の実施例の荷電粒子ビーム装
置を図1を用いて説明する。本実施例の荷電粒子ビーム
装置は、前段加速器98,シンクロトロン型の加速器1
00,回転照射装置110および制御装置群140から
主に構成される。低エネルギーのイオンが前段加速器9
8から加速器100に入射され、加速器100において
加速された後、治療室101の回転照射装置110に出
射されて、イオンビームが治療に用いられる。(Embodiment 1) A charged particle beam apparatus according to a first embodiment of the present invention will be described with reference to FIG. The charged particle beam apparatus according to the present embodiment includes a pre-stage accelerator 98, a synchrotron type accelerator 1
00, a rotary irradiation device 110 and a control device group 140. Low-energy ions are in the pre-accelerator 9
8, the light is incident on the accelerator 100, accelerated by the accelerator 100, emitted to the rotating irradiation device 110 of the treatment room 101, and the ion beam is used for the treatment.
【0024】加速器100を構成する主な機器について
説明する。加速器100は、加速器100を周回する荷
電粒子ビームに高周波電磁界を印加して荷電粒子ビーム
のベータトロン振動を増加し、共鳴の安定限界を超えさ
せ、荷電粒子ビームのベータトロン振動を共鳴状態にし
て荷電粒子ビームを加速器から出射する加速器である。The main components of the accelerator 100 will be described. The accelerator 100 applies a high-frequency electromagnetic field to the charged particle beam orbiting the accelerator 100 to increase the betatron oscillation of the charged particle beam, to exceed the resonance stability limit, and to bring the betatron oscillation of the charged particle beam into a resonance state. This is an accelerator that emits a charged particle beam from the accelerator.
【0025】加速器100は、周回する荷電粒子ビーム
を曲げる偏向電磁石146,周回する荷電粒子ビームに
エネルギーを与える高周波加速空胴147,周回する荷
電粒子ビームに磁界を印加してベータトロン振動を共鳴
状態にする4極電磁石145や多極電磁石11、および
周回する荷電粒子ビームに高周波を印加してベータトロ
ン振動を増加する出射用高周波印加装置120を備えて
いる。また、偏向電磁石146,4極電磁石145、お
よび多極電磁石11に電流を、そして、高周波加速空胴
147に電力を供給する加速器用電源装置165と、出
射用高周波印加装置120に電力を供給する出射用高周
波電源166を備える。The accelerator 100 includes a bending electromagnet 146 for bending the orbiting charged particle beam, a high-frequency accelerating cavity 147 for applying energy to the orbiting charged particle beam, and a magnetic field applied to the orbiting charged particle beam to cause the betatron oscillation to resonate. The multi-pole electromagnet 145 and the multi-pole electromagnet 11, and a high frequency applying device 120 for applying high frequency to the orbiting charged particle beam to increase betatron oscillation are provided. Further, current is supplied to the bending electromagnet 146, quadrupole electromagnet 145, and multipole electromagnet 11, and power is supplied to the accelerator power supply device 165 that supplies power to the high-frequency acceleration cavity 147 and to the emission high-frequency application device 120. An emission high frequency power supply 166 is provided.
【0026】加速器100から出射されて、輸送系17
1で治療室101に輸送されたビームは回転照射装置1
10で患者に照射される。After being emitted from the accelerator 100, the transport system 17
The beam transported to the treatment room 101 in 1 is a rotary irradiation device 1
At 10 the patient is irradiated.
【0027】回転照射装置110を説明する。回転照射
装置110は、加速器100から出射された出射ビーム
を照射対象まで輸送するための4極電磁石150および
偏向電磁石151、および4極電磁石150および偏向
電磁石151に電流を供給する電源装置170を備え
る。The rotary irradiation device 110 will be described. The rotary irradiation device 110 includes a quadrupole electromagnet 150 and a bending electromagnet 151 for transporting an output beam emitted from the accelerator 100 to an irradiation target, and a power supply device 170 for supplying a current to the quadrupole electromagnet 150 and the deflection electromagnet 151. .
【0028】さらに、回転照射装置110は、照射ノズ
ル111を備える。照射ノズル111には、照射位置をx
方向およびy方向に動かすための電磁石220,221
を備える。ここで、x方向は偏向電磁石151の偏向面
に平行な方向、y方向は偏向電磁石151の偏向面に垂
直な方向である。電磁石220,221には電流を供給
する電源装置160が接続されている。電磁石220,
221の下流には、ビーム径を増加させるための散乱体
300を設置する。また、散乱体300のさらに下流に
は、ビームの照射線量分布を測定する線量モニタ301
を設置している。また、患部の周囲の正常組織を傷めな
いように、照射対象である患者の直前には、コリメータ
225を設置する。Further, the rotary irradiation device 110 has an irradiation nozzle 111. The irradiation position of the irradiation nozzle 111 is x
220, 221 for moving in the direction and the y direction
Is provided. Here, the x direction is a direction parallel to the deflection surface of the deflection electromagnet 151, and the y direction is a direction perpendicular to the deflection surface of the deflection electromagnet 151. A power supply device 160 for supplying a current is connected to the electromagnets 220 and 221. Electromagnet 220,
A scatterer 300 for increasing the beam diameter is provided downstream of 221. Further, further downstream of the scatterer 300, a dose monitor 301 for measuring the irradiation dose distribution of the beam.
Is installed. Further, a collimator 225 is installed immediately before the patient to be irradiated so as not to damage normal tissues around the affected part.
【0029】図2(b)に散乱体300で拡大されたビ
ーム強度分布302を示す。散乱体で広げられたビーム
は、ほぼガウス分布をしている。従って、加速器からビ
ームの出射を停止した状態で、図2(b)に示すように
散乱体300で拡大されたビームの径の半分程度ずら
し、それぞれの位置で等しい線量を照射すると、それら
の重畳により、ビームの照射中心位置以外の場所でも概
略等しい照射線量303になる。従って、予め、治療計
画で定めた照射線量を照射したことを線量モニタ301
で確認した後、加速器からのビームを停止し、照射位置
を移動して、加速器からビームを出射する手順を繰り返
していくことにより患部を均一に照射できる。FIG. 2B shows a beam intensity distribution 302 enlarged by the scatterer 300. The beam spread by the scatterers has a nearly Gaussian distribution. Therefore, in a state where the beam emission from the accelerator is stopped, as shown in FIG. 2B, when the beam is shifted by about half the diameter of the beam expanded by the scatterer 300 and the same dose is irradiated at each position, the superposition of the beams is performed. As a result, the irradiation dose 303 becomes substantially the same even at a position other than the irradiation center position of the beam. Therefore, it is determined that the irradiation dose determined in advance in the treatment plan has been irradiated.
After confirming in step (1), the beam from the accelerator is stopped, the irradiation position is moved, and the procedure for emitting the beam from the accelerator is repeated, so that the affected part can be uniformly irradiated.
【0030】一方、照射線量が不均一であるのは、2r
の外側の領域である。しかし、照射線量が均一な照射領
域2rを円形に荷電粒子ビームを走査して実現する場合
に比べると、不均一な領域は小さい。従って、荷電粒子
ビームの損失を少なくできる。また、散乱体300で広
げられたビームの径は、円形に荷電粒子ビームを走査す
る場合に比べて小さいから、散乱体300の厚さも薄く
できる。従って、荷電粒子ビームのエネルギー損失も低
減できる。On the other hand, the non-uniform irradiation dose
Is the area outside. However, the non-uniform area is small as compared with a case where the irradiation area 2r having a uniform irradiation dose is realized by scanning the charged particle beam in a circular shape. Therefore, the loss of the charged particle beam can be reduced. Further, since the diameter of the beam spread by the scatterer 300 is smaller than that in the case where the charged particle beam is scanned in a circular shape, the thickness of the scatterer 300 can be reduced. Therefore, the energy loss of the charged particle beam can be reduced.
【0031】図3に体内の深さとイオンビームの照射線
量の関係の例を示す。図3の照射線量のピークをブラッ
グピークと呼ぶ。ブラッグピークの位置は、ビームエネ
ルギーにより変化する。そこで、照射ノズル111で
は、図4に示すようにビームのエネルギーとエネルギー
幅を調整するためのレンジシフタ222とリッジフィル
タ223及び患部の深さ方向形状に従ってエネルギーを
変化させる患者ボーラス224を設置する。リッジフィ
ルタ223は、図4のx方向に、山と谷が繰り返す構造
にする。この山の部分を通過した粒子は、エネルギーの
減少が大きく、谷の部分を通過した粒子は、エネルギー
の減少が少なく、山の部分の高さと谷の部分の高さに応
じたエネルギー分布を持たせることができる。本実施例
では、荷電粒子ビームのエネルギー幅が、患部の厚さが
最も大きい位置に一致するリッジフィルタを使用する。FIG. 3 shows an example of the relationship between the depth in the body and the irradiation dose of the ion beam. The peak of the irradiation dose in FIG. 3 is called a Bragg peak. The position of the Bragg peak changes depending on the beam energy. Therefore, in the irradiation nozzle 111, as shown in FIG. 4, a range shifter 222 for adjusting the energy and the energy width of the beam, a ridge filter 223, and a patient bolus 224 for changing the energy in accordance with the shape of the affected part in the depth direction are installed. The ridge filter 223 has a structure in which peaks and valleys repeat in the x direction in FIG. Particles passing through this peak have a large decrease in energy, and particles passing through a valley have a small decrease in energy, and have an energy distribution corresponding to the height of the peak and the height of the valley. Can be made. In the present embodiment, a ridge filter is used in which the energy width of the charged particle beam matches the position where the thickness of the affected part is the largest.
【0032】演算装置131は、制御装置132が患部
への荷電粒子ビームの照射を制御するために必要なデー
タを求める装置である。The arithmetic unit 131 is a device for obtaining data necessary for the control unit 132 to control the irradiation of the charged particle beam to the affected part.
【0033】制御装置132は、前段加速器98から加
速器100への荷電粒子ビームの出射,加速器100を
周回する荷電粒子ビームの加速,加速器100から回転
照射装置110への荷電粒子ビームの出射および回転照
射装置110における荷電粒子ビームの輸送を制御する
ための装置である。加速器100から回転照射装置11
0へ出射された荷電粒子ビームは照射対象に照射される
ので、加速器100からの出射を制御することは、患部
への荷電粒子ビームの照射を制御することになる。The control device 132 emits a charged particle beam from the pre-accelerator 98 to the accelerator 100, accelerates the charged particle beam circulating around the accelerator 100, emits a charged particle beam from the accelerator 100 to the rotary irradiation device 110, and performs rotation irradiation. This is a device for controlling the transport of the charged particle beam in the device 110. Rotary irradiation device 11 from accelerator 100
Since the charged particle beam emitted to 0 is irradiated to the irradiation target, controlling the emission from the accelerator 100 controls the irradiation of the charged particle beam to the affected part.
【0034】まず、演算装置131の役割について説明
し、次に制御装置132による荷電粒子ビーム装置の運
転方法を説明する。First, the role of the arithmetic unit 131 will be described, and then the method of operating the charged particle beam device by the control unit 132 will be described.
【0035】演算装置131は、オペレーターから患部
の形状,深さ,必要な照射線量R等の患部情報と散乱体
300の厚さや材料等の情報を入力される。演算装置1
31は、入力された患部情報と散乱体情報に基づいて、
ビーム径,照射領域,ビームの水平方向の照射点,電磁
石220,221に供給される電流の大きさ,患部に照
射される荷電粒子ビームのエネルギー,必要な線量など
を演算して求める。水平方向の照射点の間隔は、散乱体
300で拡大されたビームの径の半分程度以下にするこ
とが望ましい。The arithmetic unit 131 receives information on the affected part, such as the shape and depth of the affected part, the required irradiation dose R, and information on the thickness and material of the scatterer 300 from the operator. Arithmetic unit 1
31 is based on the input affected part information and scattered body information,
The beam diameter, the irradiation area, the irradiation point in the horizontal direction of the beam, the magnitude of the current supplied to the electromagnets 220 and 221, the energy of the charged particle beam irradiated to the affected part, the necessary dose, and the like are calculated. It is desirable that the interval between the irradiation points in the horizontal direction be about half or less of the diameter of the beam expanded by the scatterer 300.
【0036】演算装置131を図5に示す。演算装置1
31の照射領域形成部133は、入力された患部情報に
基づいて、図6に示すように、患部を深さ方向の複数の
層Li(i=1,2…N)に分割する。エネルギー計算
部134は、それぞれの層の深さに応じて照射に適した
ビームエネルギーEiを求める。The arithmetic unit 131 is shown in FIG. Arithmetic unit 1
The irradiation area forming unit 133 divides the affected part into a plurality of layers Li (i = 1, 2,..., N) in the depth direction based on the input affected part information, as shown in FIG. The energy calculator 134 calculates a beam energy Ei suitable for irradiation according to the depth of each layer.
【0037】照射領域形成部133は、さらに、各層L
iの形状に応じて、荷電粒子ビームを照射する複数の照
射領域Ai,j(i=1,2…N,j=1,2…M),照射
領域Ai,j の中心点Pi,j 、およびその座標(xij,y
ij)を定める。荷電粒子ビームの強度は空間的にガウス
分布をしているので、演算装置131は、荷電粒子ビー
ムの径に基づいて、照射領域Ai,j と隣接する照射領域
とが重なって均一な照射線量の領域を作るように、各照
射領域Ai,j の中心点Pi,j を定める。各中心点Pi,j
は、ビーム径の半分程度離れているようにする。The irradiation region forming section 133 further includes
Depending on the shape of i, a plurality of irradiation areas Ai, j (i = 1, 2,... N, j = 1, 2,... M) for irradiating the charged particle beam, the center point Pi, j of the irradiation area Ai, j, And its coordinates (xij, y
ij). Since the intensity of the charged particle beam has a spatially Gaussian distribution, the arithmetic unit 131 determines, based on the diameter of the charged particle beam, that the irradiation area Ai, j overlaps with the adjacent irradiation area to obtain a uniform irradiation dose. The center point Pi, j of each irradiation area Ai, j is determined so as to form an area. Each center point Pi, j
Should be separated by about half the beam diameter.
【0038】照射線量計算部135は、必要な照射線量
Rに基づいて各中心点Pi,j の目標照射線量Rijを求め
る。The irradiation dose calculator 135 calculates a target irradiation dose Rij at each center point Pi, j based on the required irradiation dose R.
【0039】電磁石電流計算136は、中心点Pi,j と
荷電粒子ビームの中心と合わせるために、電磁石22
0,221に供給される電流IXij,IYijを定める。The electromagnet current calculation 136 calculates the electromagnet 22 to match the center point Pi, j with the center of the charged particle beam.
The currents IXij and IYij supplied to 0,221 are determined.
【0040】演算装置131は、各層Liにおけるビー
ムエネルギーEi,各照射領域Ai,j ,中心点Pi,j ,
中心点Pi,j の座標(xij,yij),目標照射線量Ri
j,電流IXij,IYijを制御装置132に出力する。The arithmetic unit 131 calculates the beam energy Ei in each layer Li, each irradiation area Ai, j, the center point Pi, j,
Coordinates (xij, yij) of center point Pi, j, target irradiation dose Ri
j and the currents IXij and IYij are output to the controller 132.
【0041】本実施例の荷電粒子ビーム装置の運転方法
を図7に示す。FIG. 7 shows an operation method of the charged particle beam apparatus according to this embodiment.
【0042】(1)制御装置132は、加速器100か
ら回転照射装置110に出射される荷電粒子ビームを照
射対象である患部まで輸送するために、4極電磁石15
0および偏向電磁石151に電流を供給するように、電
源装置170を制御する。(1) The control unit 132 controls the quadrupole electromagnet 15 to transport the charged particle beam emitted from the accelerator 100 to the rotary irradiation device 110 to the affected part to be irradiated.
The power supply device 170 is controlled so as to supply a current to the zero and the bending electromagnet 151.
【0043】(2)制御装置132は、前段加速器98
が荷電粒子ビームを出射するように、前段加速器98を
制御する。(2) The controller 132 controls the pre-accelerator 98
Controls the pre-accelerator 98 so that emits a charged particle beam.
【0044】(3)制御装置132は、周回する荷電粒
子ビームをエネルギーEiまで加速するために、偏向電
磁石146,4極電磁石145に電流を供給するよう
に、そして、高周波加速空胴147に電力を供給するよ
うに、加速器用電源装置165を制御する。(3) The control device 132 supplies current to the bending electromagnet 146 and the quadrupole electromagnet 145 in order to accelerate the orbiting charged particle beam to the energy Ei, and supplies electric power to the high-frequency accelerating cavity 147. To control the accelerator power supply 165 so as to supply the power.
【0045】(4)周回する荷電粒子ビームがエネルギ
ーEiまで加速されたら、制御装置132は、周回する
荷電粒子ビームのベータトロン振動を共鳴状態にするた
めに、4極電磁石145、および多極電磁石11に電流
を供給するように、加速器用電源装置165を制御す
る。(4) When the orbiting charged particle beam is accelerated to the energy Ei, the control unit 132 sets the quadrupole electromagnet 145 and the multipole electromagnet in order to bring the betatron oscillation of the orbiting charged particle beam into a resonance state. The accelerator power supply 165 is controlled so as to supply a current to the power supply 11.
【0046】4極電磁石145、および多極電磁石11
に電流が供給されると、出射のための共鳴の安定限界が
発生し、安定限界の外側に移動した周回荷電粒子ビーム
は、ベータトロン振動が共鳴状態になる。Quadrupole electromagnet 145 and multipole electromagnet 11
Is supplied with a current, a resonance stability limit for emission is generated, and the orbiting charged particle beam that has moved outside the stability limit has a betatron oscillation in a resonance state.
【0047】(5)制御装置132は、荷電粒子ビーム
の中心と中心点Pi,j とを合わせるために、電磁石22
0,221に電流IXij,IYijを供給するように、電
源装置160を制御する。(5) The controller 132 controls the electromagnet 22 to match the center of the charged particle beam with the center point Pi, j.
The power supply unit 160 is controlled so as to supply the currents IXij and IYij to 0,221.
【0048】(6)制御装置132は、目標照射線量R
ijと線量モニタ301で測定された中心点Pi,j の照射
線量を比較する。(6) The controller 132 sets the target irradiation dose R
ij and the irradiation dose at the center point Pi, j measured by the dose monitor 301 are compared.
【0049】(7)中心点Pi,j の照射線量が目標照射
線量Rijに達していない場合は、制御装置132は、加
速器100から回転照射装置110に出射を開始するた
めに、出射用高周波印加装置120に電力を供給するよ
うに、出射用高周波電源166を制御する。(7) If the irradiation dose at the center point Pi, j has not reached the target irradiation dose Rij, the control unit 132 applies the high-frequency emission beam to the rotation irradiation unit 110 to start the emission from the accelerator 100. The output high-frequency power supply 166 is controlled so as to supply power to the device 120.
【0050】出射用高周波印加装置120に電力が供給
されると、周回する荷電粒子ビームに高周波電磁界が印
加され、周回する荷電粒子ビームのベータトロン振動振
幅が増加する。ベータトロン振動振幅が増加して、ベー
タトロン振動の共鳴の安定限界を超えると荷電粒子ビー
ムは、加速器100から回転照射装置110へ出射され
る。回転照射装置110において、荷電粒子ビームは照
射領域Ai,j に照射される。When power is supplied to the output high frequency applying device 120, a high frequency electromagnetic field is applied to the circulating charged particle beam, and the betatron oscillation amplitude of the circulating charged particle beam increases. When the betatron oscillation amplitude increases and exceeds the stability limit of the resonance of the betatron oscillation, the charged particle beam is emitted from the accelerator 100 to the rotary irradiation device 110. In the rotary irradiation device 110, the charged particle beam is irradiated to the irradiation area Ai, j.
【0051】(8)制御装置132は、目標照射線量R
ijと線量モニタ301で測定された中心点Pi,j の照射
線量を比較する。中心点Pi,j の照射線量が目標照射線
量Rijに達していない場合は出射を続ける。(8) The controller 132 sets the target irradiation dose R
ij and the irradiation dose at the center point Pi, j measured by the dose monitor 301 are compared. If the irradiation dose at the center point Pi, j has not reached the target irradiation dose Rij, the emission continues.
【0052】(9)制御装置132は、中心点Pi,j の
照射線量が目標照射線量Rijに達していれば出射を停止
するように、出射用高周波電源166を制御する。そし
て次の照射領域Ai,j+1 の中心点Pi,j+1 に荷電粒子ビ
ームの中心を合わせるように電源装置160を制御す
る。(9) The controller 132 controls the high-frequency power source for emission 166 so as to stop the emission when the irradiation dose at the center point Pi, j has reached the target irradiation dose Rij. Then, the power supply unit 160 is controlled so that the center of the charged particle beam is aligned with the center point Pi, j + 1 of the next irradiation area Ai, j + 1.
【0053】(10)照射領域Ai,j の照射から照射領
域Ai,j+1 の照射へ移る際に、加速器100を周回して
いるビームを利用できる場合は、(5)からの運転を行
い、ビーム量,出射時間が不足する場合は、荷電粒子ビ
ームを補給するために(2)からの運転を行う。(10) When the beam circling the accelerator 100 can be used when the irradiation of the irradiation area Ai, j is shifted from the irradiation of the irradiation area Ai, j + 1, the operation from (5) is performed. If the beam amount and the emission time are insufficient, the operation from (2) is performed to replenish the charged particle beam.
【0054】(11)層Liの全ての照射領域Ai,j
で、照射線量が目標値に達したら、次の層Li+1 につい
て、(1)からの運転を行い、層Liの場合と同様に全
ての照射領域Ai+1,jを照射する。(11) All irradiation areas Ai, j of layer Li
When the irradiation dose reaches the target value, the operation from (1) is performed for the next layer Li + 1, and the entire irradiation area Ai + 1, j is irradiated similarly to the case of the layer Li.
【0055】患部の全ての層Liを照射したら、荷電粒
子ビーム装置の運転を終了する。When all layers Li of the affected area have been irradiated, the operation of the charged particle beam device is terminated.
【0056】実施例によれば、患部の層LIを均一な照
射線量で照射できる。患部の層LIの境界の外側にでき
る不均一な照射領域をコリメータ225で切り取るの
で、患部の形状に合った荷電粒子ビームの照射を行うこ
とができる。また、切り取られる領域は、従来の円形に
荷電粒子ビームを走査する場合に比べて小さいので、少
ないビーム損失で治療照射を行える。また、荷電粒子ビ
ームの照射位置設定を2台の電磁石で行っているが、患
者ベッド112を移動できる構造とし、制御装置132
から制御して照射位置を設定するようにしてもよい。According to the embodiment, the layer LI of the affected area can be irradiated with a uniform irradiation dose. Since the non-uniform irradiation area formed outside the boundary of the affected part layer LI is cut off by the collimator 225, it is possible to irradiate the charged particle beam according to the shape of the affected part. Further, since the area to be cut is smaller than that in the conventional case where the charged particle beam is scanned in a circular shape, the therapeutic irradiation can be performed with a small beam loss. Although the irradiation position of the charged particle beam is set by two electromagnets, the structure is such that the patient bed 112 can be moved.
May be set to control the irradiation position.
【0057】また、散乱体300を使用しないと、照射
される荷電粒子ビームの径は小さいので、均一な照射強
度分布を得るためには照射位置間隔を極めて小さくとる
必要が生じ、治療計画及び照射制御が極めて複雑にな
る。本実施例では、散乱体300の使用により、荷電粒子
ビームは、概略ガウス分布になるとともに、ビーム径を
適切な大きさに増加できるため、照射位置間隔を極めて
小さくとることなく、均一な照射線量分布を実現でき
る。If the scatterer 300 is not used, since the diameter of the charged particle beam to be irradiated is small, it is necessary to make the distance between irradiation positions extremely small in order to obtain a uniform irradiation intensity distribution. Control becomes extremely complicated. In the present embodiment, by using the scatterer 300, the charged particle beam has a roughly Gaussian distribution and the beam diameter can be increased to an appropriate size. Distribution can be realized.
【0058】以上述べたように、本実施例の荷電粒子ビ
ーム装置は、荷電粒子ビームの損失を低減して、均一な
照射野を形成することができる。As described above, the charged particle beam apparatus of the present embodiment can form a uniform irradiation field by reducing the loss of the charged particle beam.
【0059】また、本実施例によれば、照射目標が複雑
な形状をしている場合にも、精度よく患部を照射でき
る。また、照射線量が目標に達するまで照射を継続する
ため、ビーム強度が時間的に変化した場合でも、患部に
ビームの密度を一様に照射できる。According to the present embodiment, even when the irradiation target has a complicated shape, the affected part can be irradiated with high accuracy. Further, since the irradiation is continued until the irradiation dose reaches the target, even when the beam intensity changes over time, the affected part can be uniformly irradiated with the beam density.
【0060】本実施例では、加速器にシンクロトロンを
使用したが、図8に示すように、加速器にサイクロトロ
ン172を使用することもできる。サイクロトロン17
2からのビームの出射,停止は、制御装置132からの
信号により偏向器175用の偏向器電源174を制御
し、イオン源173からの荷電粒子ビームの供給と停止
により行う。In this embodiment, a synchrotron is used for the accelerator, but a cyclotron 172 can be used for the accelerator as shown in FIG. Cyclotron 17
Emission and stop of the beam from 2 are performed by controlling the deflector power supply 174 for the deflector 175 by a signal from the control device 132 and supplying and stopping the charged particle beam from the ion source 173.
【0061】(実施例2)次に、本発明の第2の実施例
を説明する。本実施例の機器構成は、第1の実施例と同
様である。ただし、本実施例では、患部の各層Liの照
射領域をx方向には分割せず、図9に示すように、y方
向にのみ分割する。すなわち、照射領域Ai,j はx方向
に広い。照射領域Ai,j を照射するときは、電磁石22
0がつくる磁場の強度を変化させて、荷電粒子ビームを
x方向に走査して照射する。(Embodiment 2) Next, a second embodiment of the present invention will be described. The device configuration of this embodiment is the same as that of the first embodiment. However, in the present embodiment, the irradiation area of each layer Li of the affected part is not divided in the x direction, but is divided only in the y direction as shown in FIG. That is, the irradiation area Ai, j is wide in the x direction. When irradiating the irradiation area Ai, j, the electromagnet 22
The intensity of the magnetic field generated by 0 is changed, and the charged particle beam is scanned in the x direction and irradiated.
【0062】演算装置131は、荷電粒子ビームの径に
基づいて、照射領域Ai,j と隣接する照射領域とが重な
って均一な照射線量の領域を作るように、各照射領域A
i,jの中心点Pi,j を定める。各中心点Pi,j は、ビー
ム径の半分程度離れているようにする。The arithmetic unit 131 controls each irradiation area Ai, j based on the diameter of the charged particle beam so that the irradiation area Ai, j and the adjacent irradiation area overlap each other to form a uniform irradiation dose area.
A center point Pi, j of i, j is determined. Each center point Pi, j is set to be separated by about half of the beam diameter.
【0063】そして、演算装置131は、各照射領域A
i,j のx方向の広がりに基づいて、電磁石220の磁場
強度を変化させる大きさΔIXijを求める。そして、実
施例1の場合と同様に、各層Liにおけるビームエネル
ギーEi,各照射領域Ai,jとその中心点Pi,j(xij,
yij),目標照射線量Rij,電流IXij,IYijを求
め、これらとΔIXij を制御装置132に出力する。Then, the arithmetic unit 131 calculates each irradiation area A
Based on the spread of i, j in the x direction, a magnitude ΔIXij that changes the magnetic field strength of the electromagnet 220 is obtained. Then, similarly to the case of the first embodiment, the beam energy Ei in each layer Li, each irradiation area Ai, j and its center point Pi, j (xij,
yij), target irradiation dose Rij, currents IXij and IYij are obtained, and these and ΔIXij are output to the controller 132.
【0064】本実施例の荷電粒子ビーム装置の運転方法
を図10に示す。(7)以外は第1の実施例と同じであ
る。FIG. 10 shows an operation method of the charged particle beam apparatus according to the present embodiment. Except for (7), it is the same as the first embodiment.
【0065】(7)で、制御装置132は、加速器10
0から回転照射装置110に出射を開始するために、出
射用高周波印加装置120に電力を供給するように、出
射用高周波電源166を制御するとともに、荷電粒子ビ
ームをx方向に走査して照射するために電磁石220の
電流IXij がΔIXij の範囲で変化するように、電源
装置160を制御する。In (7), the control unit 132 controls the accelerator 10
In order to start the emission to the rotary irradiation device 110 from 0, the emission high-frequency power supply 166 is controlled so as to supply power to the emission high-frequency application device 120, and the charged particle beam is scanned and irradiated in the x direction. For this purpose, the power supply 160 is controlled so that the current IXij of the electromagnet 220 changes in the range of ΔIXij.
【0066】本実施例では、照射領域Ai,j を照射する
ときに、電磁石220がつくる磁場の強度を変化させ
て、荷電粒子ビームをx方向に走査して照射するが、電
磁石221がつくる磁場の強度を変化させて、荷電粒子
ビームをy方向に走査して照射するようにしてもよい。In this embodiment, when irradiating the irradiation area Ai, j, the intensity of the magnetic field generated by the electromagnet 220 is changed to scan and irradiate the charged particle beam in the x direction. May be changed so that the charged particle beam is scanned and irradiated in the y direction.
【0067】本実施例によれば、第1の実施例と同様の
効果が得られるとともに、y方向(またはx方向)のみ
で荷電粒子ビームの出射と停止の切り替えが行われるの
で、第1の実施例よりも照射時間を短縮できる。According to this embodiment, the same effects as those of the first embodiment can be obtained, and the switching between the emission and the stop of the charged particle beam is performed only in the y direction (or the x direction). The irradiation time can be shorter than in the embodiment.
【0068】(実施例3)次に、本発明の第3の実施例
を説明する。本実施例では、図1と同じ構成の荷電粒子
ビーム装置を用いるが、照射ノズル111の構成とその
制御装置132が異なる。図11に本実施例の照射ノズ
ル111を示す。(Embodiment 3) Next, a third embodiment of the present invention will be described. In this embodiment, a charged particle beam device having the same configuration as that of FIG. 1 is used, but the configuration of the irradiation nozzle 111 and the control device 132 thereof are different. FIG. 11 shows the irradiation nozzle 111 of this embodiment.
【0069】本実施例では、散乱体300を、第1の実
施例よりも薄くする。散乱体300で拡大された荷電粒
子ビームの径は、第1の実施例の場合に比べて小さくな
るので、照射領域Ai,j の数は増加する。一方、ビーム
の径の広がりは小さいので、実施例1で使用した患者コ
リメータを使用しない。また、同様に、実施例1に比べ
てビーム径が小さくなるため、第1の実施例で使用した
リッジフィルタ及びボーラスを使用しない。In this embodiment, the scatterer 300 is made thinner than in the first embodiment. Since the diameter of the charged particle beam expanded by the scatterer 300 is smaller than that in the first embodiment, the number of irradiation areas Ai, j increases. On the other hand, since the spread of the beam diameter is small, the patient collimator used in the first embodiment is not used. Similarly, since the beam diameter is smaller than that in the first embodiment, the ridge filter and the bolus used in the first embodiment are not used.
【0070】また、第1の実施例では、加速器100に
おいて荷電粒子ビームのエネルギーをEiにしている
が、本実施例では、制御装置132が加速器100から
のビーム出射を停止中にレンジシフタ222の厚さを変
更することによって、荷電粒子ビームのエネルギーをE
iにする。In the first embodiment, the energy of the charged particle beam is set to Ei in the accelerator 100. However, in the present embodiment, the controller 132 stops the beam emission from the accelerator 100 and stops the thickness of the range shifter 222. By changing the energy of the charged particle beam,
i.
【0071】本実施例の荷電粒子ビーム装置の運転方法
を図12に示す。(3)および(4)以外は第1の実施例
と同じである。FIG. 12 shows an operation method of the charged particle beam apparatus according to the present embodiment. Except for (3) and (4), it is the same as the first embodiment.
【0072】(3)制御装置132は、各層のビームエ
ネルギーEiよりも大きい定格エネルギーEまで周回す
る荷電粒子ビームを加速するために、偏向電磁石14
6,4極電磁石145に電流を供給するように、そし
て、高周波加速空胴147に電力を供給するように、加
速器用電源装置165を制御する。そして、定格エネル
ギーEをビームをエネルギーEiまで低減するように、
レンジシフタ222の厚さを調整する。(3) The controller 132 controls the bending electromagnet 14 to accelerate the charged particle beam circulating to the rated energy E larger than the beam energy Ei of each layer.
The accelerator power supply 165 is controlled so as to supply current to the 6, 4-pole electromagnet 145 and to supply power to the high-frequency acceleration cavity 147. And, to reduce the rated energy E to the energy Ei,
The thickness of the range shifter 222 is adjusted.
【0073】(4)周回する荷電粒子ビームがエネルギ
ーEまで加速されたら、制御装置132は、周回する荷電
粒子ビームのベータトロン振動を共鳴状態にするため
に、4極電磁石145、および多極電磁石11に電流を
供給するように、加速器用電源装置165を制御する。(4) When the orbiting charged particle beam is accelerated to the energy E, the control unit 132 sets the quadrupole electromagnet 145 and the multipole electromagnet in order to bring the betatron oscillation of the orbiting charged particle beam into a resonance state. The accelerator power supply 165 is controlled so as to supply a current to the power supply 11.
【0074】以上述べたように、本実施例の荷電粒子ビ
ーム装置は、荷電粒子ビームの損失を少なくして、均一
な照射野を形成することができる。また、患者毎のコリ
メータやボーラスを使用しないで患部を精度良く照射で
きる。As described above, the charged particle beam apparatus of this embodiment can form a uniform irradiation field by reducing the loss of the charged particle beam. In addition, the affected part can be accurately irradiated without using a collimator or a bolus for each patient.
【0075】本実施例では、レンジシフタの厚さを一定
にして照射深さ一定の状態で照射位置設定用の電磁石2
20,221の強度を繰り返し変更して照射し、ある深
さの層を照射した後レンジシフタの厚さを変えて同様の
手順を繰り返しているが、荷電粒子ビームの進行方向に
平行に仮想的な層の分割を行い、電磁石220,221の
強度を一定にした状態で、照射,停止その後レンジシフ
タの厚さを変更して照射手順を行い、ある層の照射を終
えた後、電磁石220,221の強度を変更する方法で
も同様の照射治療を行える。In the present embodiment, the electromagnet 2 for setting the irradiation position is set in a state where the thickness of the range shifter is constant and the irradiation depth is constant.
The same procedure is repeated by irradiating a layer having a certain depth and then changing the thickness of the range shifter. The same procedure is repeated, but a virtual layer is formed parallel to the traveling direction of the charged particle beam. After the layers are divided and the irradiation of the electromagnets 220 and 221 is completed with the strength of the electromagnets 220 and 221 kept constant, the irradiation is stopped, and then the thickness of the range shifter is changed, the irradiation of a certain layer is completed. The same irradiation treatment can be performed by changing the intensity.
【0076】(実施例4)次に、本発明の第4の実施例
を説明する。本実施例の機器構成を図13に示す。機器
構成が第1の実施例と異なる点は、患者の体の動きを検
出する動き検出器250を設けている点と、荷電粒子ビ
ームを照射装置へ輸送するビーム輸送系171に、荷電
粒子ビームの輸送と停止を切り替える切り替え電磁石1
77とその電源176を設けていることで、その他の構
成は、第1の実施例1と同一である。ただし、電源17
6は、故障して電流が流れないときは、ビームが患者に
照射されないようにしておき、電流が正常に加えられた
ときのみ照射されるようにしておく。(Embodiment 4) Next, a fourth embodiment of the present invention will be described. FIG. 13 shows the device configuration of this embodiment. The equipment configuration is different from that of the first embodiment in that a motion detector 250 for detecting the motion of the patient's body is provided and a beam transport system 171 for transporting the charged particle beam to the irradiation device is provided with a charged particle beam. Electromagnet 1 to switch between transport and stop
The other configuration is the same as that of the first embodiment by providing the power supply 77 and the power supply 176. However, power supply 17
No. 6 keeps the beam from irradiating the patient when there is a failure and no current flows, and only when the current is normally applied.
【0077】動き検出器250は、体表面に設置した歪
み検出装置でも良いし、あるいは、カメラで患者の動き
を検出する装置でも良い。この動き検出器250からの
信号により、患者の体の動きを検出し、体の動きが少な
い時のみ、患者へビームを照射する信号を出射用高周波
電源166とビーム輸送系の切り替え電磁石177の電
源176に送る。前記信号がビーム照射可である時の
み、出射用高周波電源166から荷電粒子ビームに高周
波を加え、さらに、電源176からビーム輸送系の切り
替え電磁石177に電流を加えて荷電粒子ビームが回転
照射装置110へ供給されるようにする。この時の運転
方法を図14に示す。運転方法の(7)および(9)以
外は第1の実施例と同じである。The motion detector 250 may be a distortion detecting device installed on the body surface, or may be a device that detects a patient's motion by a camera. Based on the signal from the motion detector 250, the movement of the patient's body is detected, and only when the body movement is small, a signal for irradiating the patient with a beam is output from the high-frequency power source for emission 166 and the switching electromagnet 177 for switching the beam transport system. Send to 176. Only when the signal indicates that beam irradiation is possible, a high frequency is applied to the charged particle beam from the high-frequency power source for emission 166, and further, a current is applied from the power source 176 to the switching electromagnet 177 of the beam transport system, so that the charged particle beam is rotated by the rotating irradiation device 110. To be supplied to The driving method at this time is shown in FIG. The operation method is the same as that of the first embodiment except for (7) and (9).
【0078】(7)では、中心点Pi,j の照射線量が目
標照射線量Rijに達せず、かつ、動き検出器250から
の信号で、患者が静止していると判断される場合は、制
御装置132は、加速器100から回転照射装置110
に出射を開始するために、出射用高周波印加装置120
に電力を供給するように、出射用高周波電源166を制
御し、同時に、荷電粒子ビーム輸送系の切り替え電磁石
177に電源176から電流を加える。ただし、動き検
出器250からの信号で、患者が静止していないと判断
される場合は、出射用高周波電源166と荷電粒子ビー
ム輸送系の切り替え電磁石177の電源を制御して、荷
電粒子ビームの回転照射装置110への供給を停止す
る。In (7), when the irradiation dose at the center point Pi, j does not reach the target irradiation dose Rij and the signal from the motion detector 250 determines that the patient is stationary, the control is performed. The device 132 is provided by the rotation irradiation device 110 from the accelerator 100.
In order to start the emission at the
The high-frequency power source for emission 166 is controlled so as to supply power to the power supply, and at the same time, a current is applied from the power source 176 to the switching electromagnet 177 of the charged particle beam transport system. However, when it is determined from the signal from the motion detector 250 that the patient is not stationary, the power supply of the high-frequency power source for emission 166 and the switching electromagnet 177 of the charged particle beam transport system is controlled to control the charged particle beam. The supply to the rotating irradiation device 110 is stopped.
【0079】(9)では、制御装置132は、中心点P
i,j の照射線量が目標照射線量Rijに達していれば、出
射を停止するように、出射用高周波電源166を制御す
るとともに、ビーム輸送系の切り替え電磁石177の電
流を止めて、荷電粒子ビームの回転照射装置110への
供給を停止する。そして次の照射領域Ai,j+1 の中心点
Pi,j+1 に荷電粒子ビームの中心を合わせるように電源
装置160を制御する。In (9), the control device 132 sets the center point P
If the irradiation dose of i, j has reached the target irradiation dose Rij, the high-frequency power source for emission 166 is controlled so as to stop the emission, and the current of the switching electromagnet 177 of the beam transport system is stopped, and the charged particle beam is stopped. Supply to the rotary irradiation device 110 is stopped. Then, the power supply unit 160 is controlled so that the center of the charged particle beam is aligned with the center point Pi, j + 1 of the next irradiation area Ai, j + 1.
【0080】本実施例によれば、第1の実施例と同様の
効果が得られるとともに、照射も切り替えが2つの切り
替え手段によって行われるから、より安全性が高い。ま
た、患部がほぼ静止している時に荷電粒子ビームを照射
するので、照射対象を精度良く照射することができる。According to this embodiment, the same effects as those of the first embodiment can be obtained, and the irradiation is switched by two switching means, so that the safety is higher. In addition, since the charged particle beam is irradiated when the affected part is almost stationary, the irradiation target can be irradiated with high accuracy.
【0081】(実施例5)次に、本発明の第5の実施例
を説明する。本実施例の機器構成を図15に示す。機器
構成が第1の実施例と異なる点は、加速器からのビーム
出射にキッカー電磁石121を使う点である。患部の領
域分けは実施例1と同様に図6のように行う。(Embodiment 5) Next, a fifth embodiment of the present invention will be described. FIG. 15 shows the device configuration of this embodiment. The configuration of the apparatus differs from that of the first embodiment in that a kicker electromagnet 121 is used to emit a beam from the accelerator. The segmentation of the affected area is performed as shown in FIG.
【0082】キッカー電磁石121はキッカー電磁石の
電源167からパルス励磁される。制御装置132から
の信号により電源167からキッカー電磁石121にパ
ルス電流を供給されると、キッカー電磁石121はビー
ムが周回軌道を1周する程度の時間励磁されて、周回す
る荷電粒子ビームに磁場を与える。周回する荷電粒子ビ
ームは、キッカー電磁石121から磁場を与えられると
直ちに周回軌道から離れて輸送系171へ出射される。
ビームが周回軌道を1周する程度の時間,ビームに磁場
を与えるので、加速器を周回する荷電粒子はこの時間で
すべて出射される。従って、キッカー電磁石121を1
回パルス励磁すると、ビーム出射は終了する。本実施例
は、ビームが周回軌道を1周する程度の短い時間に出射
されるビームを、連続して利用する場合に適している。The kicker magnet 121 is pulse-excited from the power supply 167 of the kicker magnet. When a pulse current is supplied from the power supply 167 to the kicker electromagnet 121 according to a signal from the control device 132, the kicker electromagnet 121 is excited for a time that the beam makes one round of the orbit, and gives a magnetic field to the orbiting charged particle beam. . The orbiting charged particle beam is separated from the orbit and emitted to the transport system 171 as soon as a magnetic field is applied from the kicker magnet 121.
Since a magnetic field is applied to the beam for a period of time that the beam makes one round of the orbit, all charged particles orbiting the accelerator are emitted in this time. Therefore, the kicker magnet 121 is set to 1
After the first pulse excitation, the beam emission ends. This embodiment is suitable for a case where a beam emitted in a short time, such as one round of the orbit, is continuously used.
【0083】本実施例での運転方法を図16に示す。
(1)で、制御装置132からの信号により、エネルギ
ーEiの荷電粒子ビームを輸送できるように回転照射装
置110の電磁石の励磁量を設定した後、(2)から
(5)で、前段加速器98からの加速器100へのビー
ム入射,周回する荷電粒子ビームの加速、およびキッカ
ー電磁石121を励磁しての出射を繰り返す。(6)で
各部分領域Ai,j について所定線量に達していないと判
断される場合は、さらにビームの入射,加速、および出
射を繰り返す。そして、(6)で部分領域Ai,j につい
て所定線量を照射した後、制御装置132からの信号に
より、(4)でビーム照射位置設定用電磁石220,2
21の電流IXij,IYijを変化させ、照射位置を変更
する。そして、(7)で層Liの照射を終了したと判断
される場合は、(8)で照射層を変えて全ての層を終了
するまで、ビームの入射,加速,出射を繰り返す。FIG. 16 shows an operation method in this embodiment.
In (1), after the excitation amount of the electromagnet of the rotary irradiation device 110 is set so that the charged particle beam having the energy Ei can be transported by the signal from the control device 132, the pre-accelerator 98 is set in (2) to (5). From the laser beam to the accelerator 100, acceleration of the circulating charged particle beam, and emission by exciting the kicker electromagnet 121. If it is determined in (6) that the predetermined dose has not been reached for each of the partial areas Ai, j, the incidence, acceleration, and emission of the beam are repeated. Then, after irradiating a predetermined dose to the partial area Ai, j in (6), the beam irradiation position setting electromagnets 220 and 2 are used in (4) by a signal from the control device 132.
The irradiation position is changed by changing the currents IXij and IYij of FIG. If it is determined in (7) that the irradiation of the layer Li has been completed, the irradiation, acceleration, and emission of the beam are repeated until the irradiation layer is changed and all the layers are completed in (8).
【0084】[0084]
【発明の効果】本発明によれば、照射対象には照射位置
または照射範囲ごとに荷電粒子ビームが照射されるの
で、照射対象の全域を覆うように散乱体で拡大された荷
電粒子ビームを拡大する場合に比べて、照射対象の回り
にできる不均一な照射領域を小さくでき、荷電粒子ビー
ムの損失を低減できる。また、散乱体を用いない場合に
比べて、ビーム径が大きいので照射位置または照射範囲
の変更回数が少なく、制御が簡単である。According to the present invention, the irradiation target is irradiated with the charged particle beam for each irradiation position or irradiation range. Therefore, the charged particle beam expanded by the scatterer to cover the entire irradiation target is enlarged. As compared with the case where the irradiation is performed, a non-uniform irradiation area formed around the irradiation target can be reduced, and the loss of the charged particle beam can be reduced. Further, compared to the case where no scatterer is used, the beam diameter is large, so that the number of times of changing the irradiation position or the irradiation range is small, and the control is simple.
【0085】また、散乱体で拡大された荷電粒子ビーム
の照射線量は照射位置を中心として径方向にほぼガウス
分布であるので、荷電粒子ビームが重なって照射線量が
均一な照射領域をつくることができ、照射対象に均一に
荷電粒子ビームを照射できる。Since the irradiation dose of the charged particle beam expanded by the scatterer has a substantially Gaussian distribution in the radial direction centering on the irradiation position, the charged particle beams may overlap to form an irradiation region having a uniform irradiation dose. The irradiation target can be uniformly irradiated with the charged particle beam.
【0086】また、照射領域の照射量が目標照射量に達
するまで出射切り替え手段が照射を継続させるので、荷
電粒子ビームの強度が時間的に変化した場合でも、照射
対象にビームの密度を一様に照射できる。Further, since the emission switching means continues the irradiation until the irradiation amount of the irradiation area reaches the target irradiation amount, even if the intensity of the charged particle beam changes with time, the beam density can be uniformly applied to the irradiation target. Can be irradiated.
【0087】また、出射切り替え手段が荷電粒子ビーム
に高周波電磁界を印加することにより、荷電粒子ビーム
のベータトロン振動振幅が増加して共鳴の安定限界を超
え、荷電粒子ビームが荷電粒子加速器から出射されるの
で、荷電粒子ビームは一定に出射されて、一様なビーム
の密度で荷電粒子ビームを照射対象に照射できる。When the emission switching means applies a high-frequency electromagnetic field to the charged particle beam, the amplitude of the betatron oscillation of the charged particle beam increases to exceed the stability limit of resonance, and the charged particle beam is emitted from the charged particle accelerator. Therefore, the charged particle beam is emitted constantly, and the irradiation target can be irradiated with the charged particle beam at a uniform beam density.
【0088】また、照射の切り替えが、出射切り替え手
段と輸送切り替え装置の2つの切り替え手段によって行
われるから、より安全性が高い。Further, since the switching of the irradiation is performed by the two switching means of the emission switching means and the transport switching device, the safety is higher.
【0089】また、患者の呼吸,咳等に起因する体の動
きを検知して、患部がほぼ静止している時に荷電粒子ビ
ームを照射できるので、照射対象を精度良く照射するこ
とができる。Further, since the movement of the body caused by the patient's breathing, coughing, etc. can be detected and the charged particle beam can be irradiated when the affected part is almost stationary, the irradiation target can be irradiated with high accuracy.
【0090】また、キッカー電磁石が励磁されると直ち
に荷電粒子ビームは出射され、ビームが周回軌道を1周
する程度の時間に、加速器を周回する荷電粒子はすべて
出射されて、その後、照射位置または照射範囲が変更さ
れるので、ビームが周回軌道を1周する程度の短い時間
に出射されるビームを連続して利用することができる。Also, as soon as the kicker electromagnet is excited, the charged particle beam is emitted, and all the charged particles orbiting the accelerator are emitted in the time that the beam makes one round of the orbit, and then the irradiation position or Since the irradiation range is changed, it is possible to continuously use a beam emitted in a short time such that the beam makes one round of the orbit.
【図1】第1の実施例である荷電粒子ビーム装置を示す
図。FIG. 1 is a diagram showing a charged particle beam apparatus according to a first embodiment.
【図2】散乱体で拡大されたビーム強度分布302を示
す図。FIG. 2 is a diagram showing a beam intensity distribution 302 enlarged by a scatterer.
【図3】体内の深さとイオンビームの照射線量の関係の
例を示す図。FIG. 3 is a diagram showing an example of a relationship between a depth in a body and an irradiation dose of an ion beam.
【図4】実施例1の照射ノズル111を示す図。FIG. 4 is a diagram showing an irradiation nozzle 111 according to the first embodiment.
【図5】演算装置131を示す図。FIG. 5 is a diagram showing an arithmetic unit 131.
【図6】第1の実施例の患部の領域分けを示す図。FIG. 6 is a view showing division of an affected part according to the first embodiment.
【図7】第1の実施例の運転の手順を示すフローチャー
トを示す図。FIG. 7 is a flowchart showing a procedure of operation of the first embodiment.
【図8】サイクロトロン172を使用した荷電粒子ビー
ム装置を示す図。FIG. 8 is a diagram showing a charged particle beam device using a cyclotron 172.
【図9】第2の実施例の患部の領域分けを示す図。FIG. 9 is a diagram showing the division of the affected area according to the second embodiment.
【図10】第2の実施例の運転の手順を示すフローチャ
ートを示す図。FIG. 10 is a flowchart illustrating a procedure of an operation according to the second embodiment.
【図11】第3の実施例の照射ノズル111を示す図。FIG. 11 is a diagram showing an irradiation nozzle 111 according to a third embodiment.
【図12】第3の実施例の運転の手順を示すフローチャ
ートを示す図。FIG. 12 is a view showing a flowchart illustrating the operation procedure of the third embodiment.
【図13】第4の実施例の荷電粒子ビーム装置を示す図
である。FIG. 13 is a view showing a charged particle beam apparatus according to a fourth embodiment.
【図14】第4の実施例の荷電粒子ビーム装置の運転方
法を示す図である。FIG. 14 is a diagram illustrating an operation method of the charged particle beam device according to the fourth embodiment.
【図15】第5の実施例の荷電粒子ビーム装置を示す図
である。FIG. 15 is a view showing a charged particle beam apparatus according to a fifth embodiment.
【図16】第5の実施例の運転の手順を示すフローチャ
ートを示す図。FIG. 16 is a flowchart showing a procedure of operation according to the fifth embodiment.
【図17】従来の荷電粒子ビーム装置の概略構成図。FIG. 17 is a schematic configuration diagram of a conventional charged particle beam device.
11…多極電磁石、80…x方向走査電磁石、81…y
方向走査電磁石、82…荷電粒子ビーム、83,300
…散乱体、98…前段加速器、100…加速器、101
…治療室、110…回転照射装置、111…照射ノズ
ル、112…患者ベッド、120…出射用高周波印加装
置、121…キッカー電磁石、131…演算装置、13
2…制御装置、145,150…4極電磁石、146,
151…偏向電磁石、147…高周波加速空胴、16
0,170…電源装置、165…加速器用電源装置、1
67,176…電源、166…出射用高周波電源、17
1…ビーム輸送系、172…サイクロトロン、173…
イオン源、174…偏向器電源、175…偏向器、17
8…切り替え電磁石、220,221…電磁石、222
…レンジシフタ、223…リッジフィルタ、224…患
者ボーラス、225…コリメータ、250…動き検出
器、301…線量モニタ、302…拡大されたビーム強
度分布、303…照射線量。11 ... multi-pole electromagnet, 80 ... x-direction scanning electromagnet, 81 ... y
Direction scanning electromagnet, 82 ... charged particle beam, 83, 300
… Scatterer, 98… pre-accelerator, 100… accelerator, 101
... treatment room, 110 ... rotating irradiation device, 111 ... irradiation nozzle, 112 ... patient bed, 120 ... emission high frequency application device, 121 ... kicker electromagnet, 131 ... arithmetic device, 13
2 ... control device, 145, 150 ... 4-pole electromagnet, 146
151 ... bending magnet, 147 ... high frequency accelerating cavity, 16
0, 170: power supply unit, 165: power supply unit for accelerator, 1
67, 176: power supply, 166: high frequency power supply for emission, 17
1: beam transport system, 172: cyclotron, 173 ...
Ion source, 174: Deflector power supply, 175: Deflector, 17
8: switching electromagnet, 220, 221: electromagnet, 222
... Range shifter, 223, Ridge filter, 224, Patient bolus, 225, Collimator, 250, Motion detector, 301, Dose monitor, 302, Expanded beam intensity distribution, 303, Irradiation dose.
Claims (18)
器によって供給される荷電粒子ビームを照射対象に照射
する荷電粒子ビーム装置において、 荷電粒子ビームの径を拡大する散乱体と、 前記荷電粒子ビームの出射および停止を切り替える出射
切り替え手段と、 前記荷電粒子ビームの照射位置を設定する電磁石と、 前記荷電粒子ビームを停止中に前記電磁石を制御して前
記照射位置を変更させる制御装置とを備えることを特徴
とする荷電粒子ビーム装置。1. A charged particle beam apparatus comprising a charged particle accelerator, and irradiating an irradiation target with a charged particle beam supplied by the charged particle accelerator, comprising: a scatterer for expanding a diameter of the charged particle beam; An emission switching means for switching between emission and stop of the laser beam; an electromagnet for setting an irradiation position of the charged particle beam; and a control device for controlling the electromagnet while the charged particle beam is stopped to change the irradiation position. A charged particle beam device characterized by the above-mentioned.
の径に基づいて前記照射位置を変更することを特徴とす
る請求項2の荷電粒子ビーム装置。2. The charged particle beam apparatus according to claim 2, wherein the control unit changes the irradiation position based on an enlarged diameter of the charged particle beam.
器によって供給される荷電粒子ビームを照射対象に照射
する荷電粒子ビーム装置において、 荷電粒子ビームの径を拡大する散乱体と、 前記荷電粒子ビームの出射および停止を切り替える出射
切り替え手段と、 前記荷電粒子ビームの照射位置を設定する電磁石と、 前記荷電粒子ビームを出射中に前記電磁石の磁場強度、
もしくは、前記電磁石の磁場強度の変化範囲を略一定と
し、前記荷電粒子ビーム出射を停止中に前記磁場強度お
よび前記磁場強度の変化範囲を変更する制御装置とを備
えることを特徴とする荷電粒子ビーム装置。3. A charged particle beam apparatus comprising a charged particle accelerator, and irradiating an irradiation target with a charged particle beam supplied by the charged particle accelerator, wherein: a scatterer for expanding a diameter of the charged particle beam; An emission switching means for switching between emission and stop of the light, an electromagnet for setting an irradiation position of the charged particle beam, and a magnetic field strength of the electromagnet during emission of the charged particle beam;
Alternatively, a charged particle beam characterized by comprising a control device that changes the magnetic field strength of the electromagnet to a substantially constant range and changes the magnetic field strength and the change range of the magnetic field strength while stopping the emission of the charged particle beam. apparatus.
ームの径に基づいて前記磁場強度または前記変化範囲を
変更することを特徴とする請求項3の荷電粒子ビーム装
置。4. The charged particle beam apparatus according to claim 3, wherein the control device changes the magnetic field strength or the change range based on the diameter of the expanded charged particle beam.
射量を定める目標照射量設定手段と、前記照射領域にお
ける荷電粒子ビームの照射量を測定するビーム量測定手
段とを備え、前記出射切り替え手段は、前記目標照射量
と前記照射量測定手段で測定された照射量との比較に基
づいて前記荷電粒子ビームの出射および停止を切り替え
ることを特徴とする請求項1の荷電粒子ビーム装置。5. An emission switching means, comprising: target dose setting means for determining a target dose in an irradiation area on the irradiation target; and beam quantity measuring means for measuring a dose of a charged particle beam in the irradiation area. 2. The charged particle beam apparatus according to claim 1, wherein switching between the emission and the stop of the charged particle beam is performed based on a comparison between the target irradiation amount and the irradiation amount measured by the irradiation amount measuring unit.
動の周波数を含む高周波電磁界を前記荷電粒子ビームに
加える高周波印加装置であることを特徴とする請求項1
の荷電粒子ビーム装置。6. The apparatus according to claim 1, wherein said emission switching means is a high-frequency application device for applying a high-frequency electromagnetic field including a frequency of betatron oscillation to said charged particle beam.
Charged particle beam equipment.
せるエネルギー変化手段を有することを特徴とする請求
項1の荷電粒子ビーム装置。7. The charged particle beam apparatus according to claim 1, further comprising energy changing means for changing the energy of the charged particle beam.
ビームが前記荷電粒子加速器と前記照射対象との間に設
けられたことを特徴とする請求項5の荷電粒子ビーム装
置。8. The charged particle beam apparatus according to claim 5, wherein said energy changing means is provided between said charged particle accelerator and said irradiation target.
ら供給される荷電粒子ビームを照射対象に照射する照射
装置とを備える荷電粒子ビーム装置において、 前記荷電粒子加速器は、前記荷電粒子ビームの出射およ
び停止を切り替える出射切り替え装置を有し、 前記照射装置は、前記荷電粒子ビームの径を拡大する散
乱体と、 前記照射対象に設定された複数の照射領域のうちの1つ
に前記荷電粒子ビームを照射するために前記荷電粒子ビ
ームの照射位置または照射範囲を設定する電磁石と、 異なる照射領域に荷電粒子ビームを照射するために前記
荷電粒子ビームを停止中に前記電磁石を制御して前記照
射位置または照射範囲を変更させる制御装置とを備え、
前記制御装置は前記拡大された荷電粒子ビームの径に基
づいて前記照射位置または照射範囲を変更することを特
徴とする荷電粒子ビーム装置。9. A charged particle beam apparatus comprising: a charged particle accelerator; and an irradiation device for irradiating an irradiation target with a charged particle beam supplied from the charged particle accelerator, wherein the charged particle accelerator emits the charged particle beam. And an emission switching device that switches between a stop and a stop. The irradiation device includes a scatterer that enlarges the diameter of the charged particle beam, and the charged particle beam in one of a plurality of irradiation regions set in the irradiation target. An electromagnet for setting an irradiation position or an irradiation range of the charged particle beam to irradiate the charged particle beam; and controlling the electromagnet while the charged particle beam is stopped to irradiate a different irradiation area with the charged particle beam. Or a control device for changing the irradiation range,
The said control apparatus changes the said irradiation position or irradiation range based on the diameter of the said expanded charged particle beam, The charged particle beam apparatus characterized by the above-mentioned.
から供給される荷電粒子ビームを前記照射対象に照射す
る照射装置と、前記荷電粒子加速器から出射した荷電粒
子ビームを前記照射装置へ輸送する荷電粒子ビーム輸送
系を備える荷電粒子ビーム装置において、 前記荷電粒子加速器は、前記荷電粒子ビームの出射およ
び停止を切り替える出射切り替え手段を有し、前記荷電
粒子ビーム輸送系は、ビームの輸送および停止を切り替
える輸送切り替え装置を有し、前記照射装置は、前記荷
電粒子ビームの径を拡大する散乱体と、前記照射対象に
設定された複数の照射領域のうちの1つに前記荷電粒子
ビームを照射するために前記荷電粒子ビームの照射位置
または照射範囲を設定する電磁石と、該拡大された荷電
粒子ビームの径に基づいて前記照射位置または照射範囲
を異なる照射領域に荷電粒子ビームを照射するために前
記荷電粒子ビームを停止中に変更する制御装置とを備え
ることを特徴とする荷電粒子ビーム装置。10. A charged particle accelerator, an irradiation device for irradiating the irradiation target with a charged particle beam supplied from the charged particle accelerator, and a charged particle transporting the charged particle beam emitted from the charged particle accelerator to the irradiation device. In a charged particle beam device including a particle beam transport system, the charged particle accelerator has an emission switching unit that switches between emission and stop of the charged particle beam, and the charged particle beam transport system switches between transport and stop of the beam. Having a transport switching device, the irradiating device, for irradiating the charged particle beam to one of a plurality of irradiation regions set to the irradiation object and a scatterer for expanding the diameter of the charged particle beam An electromagnet that sets an irradiation position or an irradiation range of the charged particle beam, and based on a diameter of the expanded charged particle beam, A charged particle beam apparatus comprising: a control unit that changes the irradiation position or the irradiation range to a different irradiation area while the charged particle beam is stopped in order to irradiate the charged particle beam with a different irradiation area.
え、前記制御装置は、前記動き検出で検出された患者の
動きに基づいて、前記出射切り替え手段を制御するもの
であることを特徴とする請求項1または請求項5の荷電
粒子ビーム装置。11. The apparatus according to claim 1, further comprising a motion detecting means for detecting a motion of the patient, wherein the control device controls the emission switching means based on the motion of the patient detected by the motion detection. The charged particle beam device according to claim 1 or 5, wherein
ビームを照射対象に照射する荷電粒子ビーム装置の運転
方法において、 前記荷電粒子ビームの径を拡大するステップと、 前記荷電粒子ビームの出射および停止を切り替えるステ
ップと、 前記荷電粒子ビームを停止中に照射位置または照射範囲
を変更するステップとを有することを特徴とする荷電粒
子ビーム装置の運転方法。12. A method of operating a charged particle beam apparatus for irradiating a charged particle beam supplied from a charged particle accelerator to an irradiation target, comprising: expanding a diameter of the charged particle beam; and outputting and stopping the charged particle beam. And a step of changing the irradiation position or irradiation range while the charged particle beam is stopped.
た荷電粒子ビームの径に基づいて設定するステップとを
有することを特徴とする請求項12の荷電粒子ビーム装
置の運転方法。13. The method for operating a charged particle beam apparatus according to claim 12, further comprising the step of setting the irradiation position or the irradiation range based on an enlarged diameter of the charged particle beam.
切り替えるステップは、ベータトロン振動の周波数を含
む高周波電磁界を荷電粒子ビームに印加するステップを
含むことを特徴とする請求項12の荷電粒子ビーム装置
の運転方法。14. The charged particle beam according to claim 12, wherein the step of switching between the emission and the stop of the charged particle beam includes a step of applying a high-frequency electromagnetic field including a frequency of betatron oscillation to the charged particle beam. How to operate the device.
速器によって供給される荷電粒子ビームを照射対象に照
射する荷電粒子ビーム装置において、 荷電粒子ビームの径を拡大する散乱体と、 前記荷電粒子ビームを出射するビーム出射手段と、 前記荷電粒子ビームの照射位置または照射範囲を設定す
る電磁石と、 前記荷電粒子加速器の入射運転,加速運転、または減速
運転中に前記電磁石を制御して前記照射位置または照射
範囲を変更させる制御装置とを備えることを特徴とする
荷電粒子ビーム装置。15. A charged particle beam apparatus comprising a charged particle accelerator, and irradiating an irradiation target with a charged particle beam supplied by the charged particle accelerator, wherein: a scatterer for expanding a diameter of the charged particle beam; A beam emitting unit that sets an irradiation position or an irradiation range of the charged particle beam; and controls the electromagnet during the incident operation, the acceleration operation, or the deceleration operation of the charged particle accelerator to control the irradiation position or the irradiation position. A charged particle beam device comprising: a control device that changes an irradiation range.
ムの径に基づいて前記照射位置を変更することを特徴と
する請求項15の荷電粒子ビーム装置。16. The charged particle beam apparatus according to claim 15, wherein said control device changes said irradiation position based on the diameter of the expanded charged particle beam.
から供給される荷電粒子ビームを照射対象に照射する照
射装置とを備える荷電粒子ビーム装置において、 前記荷電粒子加速器は、前記荷電粒子ビームを周回軌道
から出射軌道に移動させるキッカー電磁石を有し、 前記照射装置は、前記荷電粒子ビームの径を拡大する散
乱体と、 前記照射対象に設定された複数の照射領域のうちの1つ
に前記荷電粒子ビームを照射するために前記荷電粒子ビ
ームの照射位置または照射範囲を設定する電磁石と、異
なる照射領域に荷電粒子ビームを照射するために前記荷
電粒子加速器の入射運転,加速運転、または減速運転中
に前記電磁石を制御して前記照射位置または照射範囲を
変更させる制御装置とを備え、前記制御装置は前記拡大
された荷電粒子ビームの径に基づいて前記照射位置また
は照射範囲を変更することを特徴とする荷電粒子ビーム
装置。17. A charged particle beam apparatus comprising: a charged particle accelerator; and an irradiation device for irradiating an irradiation target with a charged particle beam supplied from the charged particle accelerator, wherein the charged particle accelerator circulates the charged particle beam. The irradiation device has a kicker electromagnet that moves from an orbit to an emission orbit, the irradiation device includes a scatterer that enlarges the diameter of the charged particle beam, and the charged object is charged into one of a plurality of irradiation regions set in the irradiation target. An electromagnet for setting the irradiation position or irradiation range of the charged particle beam to irradiate the particle beam, and during the injection operation, acceleration operation, or deceleration operation of the charged particle accelerator to irradiate a different irradiation area with the charged particle beam A control device that controls the electromagnet to change the irradiation position or the irradiation range, and the control device includes the expanded charged particle beam. A charged particle beam apparatus characterized by changing the irradiation position or an irradiation range on the basis of the diameter of the beam.
ビームを照射対象に照射する荷電粒子ビーム装置の運転
方法において、 前記荷電粒子ビームの径を拡大するステップと、 前記荷電粒子加速器の入射運転,加速運転、または減速
運転中に、照射位置または照射範囲を変更するステップ
とを有することを特徴とする荷電粒子ビーム装置の運転
方法。18. A method of operating a charged particle beam apparatus for irradiating a charged particle beam supplied from a charged particle accelerator to an irradiation target, comprising: expanding a diameter of the charged particle beam; Changing the irradiation position or the irradiation range during the acceleration operation or the deceleration operation.
Priority Applications (1)
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JP22775997A JP3518270B2 (en) | 1996-08-30 | 1997-08-25 | Charged particle beam equipment |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
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JP8-229699 | 1996-08-30 | ||
JP22969996 | 1996-08-30 | ||
JP22775997A JP3518270B2 (en) | 1996-08-30 | 1997-08-25 | Charged particle beam equipment |
JP2003123119A JP2003320040A (en) | 1996-08-30 | 2003-04-28 | Device for charged particle beam, and operation method therefor |
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JPH10118204A true JPH10118204A (en) | 1998-05-12 |
JP3518270B2 JP3518270B2 (en) | 2004-04-12 |
Family
ID=29551563
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JP22775997A Expired - Lifetime JP3518270B2 (en) | 1996-08-30 | 1997-08-25 | Charged particle beam equipment |
JP2003123119A Pending JP2003320040A (en) | 1996-08-30 | 2003-04-28 | Device for charged particle beam, and operation method therefor |
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JP2003320040A (en) | 2003-11-11 |
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