JPH1010203A - Mechanism for straightening board to be tested in fixtureless in-circuit tester - Google Patents

Abstract

PROBLEM TO BE SOLVED: To enable the press straightening of a substrate with ease by pressing the dead space part of a substrate to be tested which is hold by a staightening bar and board carrier from top and inserting mounting brackets at both ends of the straightening bar into a straightening bar guide rail and fixing them there. SOLUTION: A board 5 to be tested is hold and carried by a board carrier 4. A straightening bar guide rail 1 is provided on a carrier 4. A straightening bar 2 is pressed and supported. And then the board 5 is pressed and straightened. The rail 1 is capable of straightening, pressing and fixing the bar 2 at a desired location and freely detachable with ease. The bar 2 presses and straightens the upward warpage of the board 5. Its bottom part which presses a dead space part 9 is provided with a linear pressing part. The both ends of the bar 2 are provided with nail part structures which insert, support and fix the mounting brackets 3 into rail grooves formed on the rail 1. Therefore it becomes possible to press and straighten the board 5 up to a horizontal position and to test the board 5 in a stable state of position.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a mechanism for correcting a bow of a board to be inspected in a fixtureless in-circuit tester as a board inspection apparatus.

[0002]

2. Description of the Related Art An electrical test inspection of a printed circuit board on which components are mounted is performed using an in-circuit tester which is a board inspection apparatus. In a fixtureless in-circuit tester as an in-circuit tester which is a conventional board inspection apparatus, as shown in FIG. 3, a probe pin 6 is usually moved from a top surface of a board 5 by a predetermined amount in the XY axis direction. Move to the individual circuit board 16 by the printed circuit board.
Mounted parts 15 or lands 7 for mounting parts
Inspection by contacting with a place that is also a test pad,
The whole pod 5 is inspected.

At this time, the fixtureless in-circuit tester is also used for inspecting a multi-panel board 5 on which a plurality of individual circuit boards 16 are formed as shown in FIG. At this time, if the printed circuit board is thin, warpage is likely to occur.

As shown in the side sectional view of the warpage of the board to be inspected and the probe pins in FIG. 3, when the board 5 is in a downward warped state 12, the horizontal position 13 is moved by the board support rod 14.
However, in the warped state 11, it cannot be easily corrected due to the mounting components. For this reason, there is a practical problem that a contact error between the probe pin 6 and the land 7 and a displacement occur. In particular, in recent micropatterns and electrode lands, if the amount of warpage 17 shown in FIG. 3 is large, the possibility that the tip of the probe pin 6 shown in FIG. 4 cannot correctly contact the land 7 serving as a test pad has increased. . Here, since the probe pins 6 are normally installed at an inclination of about 15 °, for example, when the amount of upward warpage 17 of the board 5 becomes a height warped by Δd8, the tip of the probe pins 6 becomes a contact thread with the land 7, If 2 × Δd7 is a warped height, it becomes difficult for the tip of the probe pin 6 to contact the predetermined land 7.

[0005]

SUMMARY OF THE INVENTION The problem to be solved by the present invention is mainly that the individual circuit board 16 has an upward warp state 11 of a printed circuit board composed of a plurality of multiple boards.
A mechanism for correcting a board to be inspected in a fixtureless in-circuit tester having a structure that can be corrected and pressed at a desired position and is easily detachable.

[0006]

In order to solve the above problems, according to the present invention, a board carrier 4 for holding a board 5 to be inspected at a predetermined position on a board transport rail 10 is provided.
And pressing the straightening bar guide rail 1 provided on the board carrier 4 and the dead space 9 of the board to be inspected 5 held by the board carrier 4 from above,
The metal fittings 3 provided at both ends are inserted into the straightening bar guide rail 1 and are fixed to a predetermined position. This implements a board-to-be-inspected correcting mechanism that corrects and presses the warpage of a printed board at a desired position and that can be easily detached.

In order to solve the above-mentioned problem, according to the configuration of the present invention, a straightening bar 2 for pressing down from an upper surface of a part free area with respect to a warpage of a board to be inspected 5;
At both ends of the straightening bar 2, mounting brackets 3 are formed to be hooked on rail-shaped grooves of the straightening bar guide rail 1 and removably supported and fixed, and are supported at arbitrary positions corresponding to the mounting brackets 3 of the straightening bar 2. A straightening bar guide rail 1 having a rail groove structure capable of being fixed is provided and fixed to the board carrier 4.

[0008]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The embodiments of the present invention will be described below in detail with examples.

[0009]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described with reference to FIGS. FIG. 1A is a perspective view showing the relationship between a straightening bar, a mounting bracket, and a board carrier-like straightening bar guide rail, and FIG.
(C) is an enlarged side sectional view showing the engagement relationship. FIG.
FIG. 3 is a perspective view showing a warp correcting mechanism of a board to be inspected in the fixtureless in-circuit tester of the present invention.

The main configuration of the present invention is as shown in FIG.
A board carrier 4 for transporting and holding the board 5 to be inspected, a straightening bar guide rail 1 provided on the board carrier 4 to hold down and support the straightening bar 2, and a straightening bar 2 for pressing and correcting the board 5 to be inspected from above. Become. Here, the components other than the straightening bar guide rail 1 and the straightening bar 2 are technical means elements common to those of the related art.

The straightening bar guide rail 1 has such a structure that the straightening bar 2 can be straightened and pressed at a desired position and is easily detachable. A rail groove is formed between the board carrier 4 and the straightening bar guide rail 1. Formed and fixed.

The straightening bar 2 corrects the upward warpage of the board 5 to be inspected, and has a linear pressing portion (a bottom portion) for pressing a non-component mounting portion (dead space 9 portion) of the board 5 to be inspected. Alternatively, a point-like pressing portion at a desired interval) is provided, and a claw portion structure is provided at both ends to be inserted into a rail groove formed in the straightening bar guide rail 1 by a mounting bracket 3 and supported and warped and fixed. One of the claws is short and the other is long. This straightening bar 2 is inserted and attached as shown in FIG.
As shown in the enlarged view of (C), one long claw portion is inserted into the rail groove first, and the other short claw portion is inserted into the board 5 to be inspected.
The correction bar 2 is moved in the direction of the short claw portion while pressing to hook and fix. This case can be applied when there are nine linear dead spaces. Although not shown in the drawing, as another applied structure example, in order to cope with nine dead spaces scattered in a point shape, a pressing portion below the correction bar 2 forms a plurality of point-shaped pressing structures, and further, a claw portion is formed. It is also possible to form a slide claw structure that can be taken in and out so that the correction bar 2 does not need to move.

As a result, the board 5 to be inspected is moved to the horizontal position 1
The pressure correction can be performed up to 3, and the board inspection can be performed in a stable position state, and the practical difficulty of contact error between the probe pin and the electrode land and displacement as in the related art can be solved. Further, the position of the dead space 9 varies depending on the type of the board 5 to be mounted on multiple surfaces, but since the desired plural correction bars 2 can be mounted at arbitrary positions, the dead space 9 can be used for most multi-plane boards. . Of course, the present invention may be applied to a non-multi-faced board.

The warpage correcting mechanism of the board to be inspected in the fixtureless in-circuit tester of the present invention may be used for a contact and non-contact inspection apparatus such as another visual inspection apparatus.

[0015]

According to the present invention, it is possible to obtain an effect that the warped state of the board to be inspected can be easily corrected by the correction bar 2 at an arbitrary position including the dead space 9 part. As a result, the probe pin and the electrode land can be obtained. This makes it possible to eliminate a test error due to a contact error with the device or a position shift, and the effect is great.

[Brief description of the drawings]

FIG. 1 is a perspective view showing a relationship between (A) a straightening bar, a mounting bracket, and a board carrier-like straightening bar guide rail of the present invention; (B) a side sectional view; and (C) an engagement relationship. FIG.

FIG. 2 is a perspective view showing a warp correcting mechanism of a board to be inspected in the fixtureless in-circuit tester of the present invention.

FIG. 3 is a diagram showing a side sectional relationship between a warp of a board to be inspected and a probe pin according to a conventional technique.

FIG. 4 is a cross-sectional view illustrating a positional relationship between a probe pin and a land serving as a test pad according to a warpage amount of a board.

FIG. 5 is a plan view showing a multiple board among the boards to be inspected.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Straightening bar guide rail 2 Straightening bar 3 Hardware 4 Board carrier 5 Board to be inspected 6 Probe pin 7 Land 9 Dead space 10 Board transfer rail 11 Upward warping state 12 Downward warping state 13 Horizontal position 14 Board support rod 15 Mounting parts 16 Individual circuit Substrate 17 Warpage

Claims (3)

[Claims] 1. A board carrier (4) for holding a board to be inspected (5) at a predetermined position on a board carrier rail (10), and a straightening bar guide rail (1) provided on the board carrier (4). The dead space (9) of the board to be inspected (5) held by the board carrier (4) is pressed down from above, and the mounting brackets (3) provided at both ends thereof are inserted into the straightening bar guide rail (1). A straightening bar (2) fixed at a predetermined position; and a board-inspection mechanism for a fixture-less in-circuit tester, comprising: 2. The method according to claim 1, wherein a plurality of straightening bars are provided.
The board-to-be-inspected correction mechanism in the fixtureless in-circuit tester described in the above. 3. A board inspection apparatus for inspecting a board on which components are mounted, wherein a straightening bar (2) for pressing down from a top surface of a component free area against a warpage of the board to be inspected (5).
At both ends of the straightening bar (2), mounting brackets (3) are formed, which are hooked on rail-shaped grooves of the straightening bar guide rail (1) and are detachably supported and fixed. Corresponding to the mounting bracket (3), a straightening bar guide rail (1) having a rail groove structure capable of being supported and fixed at an arbitrary position is provided and fixed to a board carrier (4). Inspection board correction mechanism for fixtureless in-circuit tester, characterized by realizing stable contact of electric contact probe and improvement of positioning accuracy due to warpage of board at the time.