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JPH03104011A - Manufacturing method of thin film magnetic head - Google Patents

Manufacturing method of thin film magnetic head

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Publication number
JPH03104011A
JPH03104011A JP23996189A JP23996189A JPH03104011A JP H03104011 A JPH03104011 A JP H03104011A JP 23996189 A JP23996189 A JP 23996189A JP 23996189 A JP23996189 A JP 23996189A JP H03104011 A JPH03104011 A JP H03104011A
Authority
JP
Japan
Prior art keywords
manufacturing
magnetic head
thin film
film magnetic
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23996189A
Other languages
Japanese (ja)
Inventor
Atsushi Kato
篤 加藤
Shunichiro Kuwazuka
鍬塚 俊一郎
Eisei Togawa
戸川 衛星
Naoki Iwashige
岩繁 尚基
Sho Kondo
祥 近藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP23996189A priority Critical patent/JPH03104011A/en
Publication of JPH03104011A publication Critical patent/JPH03104011A/en
Pending legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、薄膜磁気ヘッドに係り、特に良好な磁気特性
を得る多層コイル導体の絶縁層構造に関するものである
. 〔従来の技術〕 従来の薄膜磁気ヘッドの構造について、第1図のヘッド
断面を参考にして説明する. 基板11上に非磁性像12、下部磁性体13及びギャッ
プ層14を積層形成し、その上に有機樹脂からなる絶縁
層の第1層l5を形成する.その上に多層のコイル導体
層17、絶縁層の第2層18を形威し、さらにその最上
層絶縁層上に上部磁性体19を形威していた. 〔発明が解決しようとする課題〕 上記従来の薄膜ヘッド製造プロセスでは、コイル導体層
17の形或で行なうイオンミリングでギャップ14がエ
ッチングされてギャップ長Geが高精度に制御できない
というRMがあった。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a thin film magnetic head, and particularly to an insulating layer structure of a multilayer coil conductor that provides good magnetic properties. [Prior Art] The structure of a conventional thin film magnetic head will be explained with reference to the cross section of the head shown in FIG. A nonmagnetic image 12, a lower magnetic material 13, and a gap layer 14 are laminated on a substrate 11, and a first layer l5 of an insulating layer made of an organic resin is formed thereon. A multilayer coil conductor layer 17 and a second insulating layer 18 were formed thereon, and an upper magnetic material 19 was further formed on the topmost insulating layer. [Problems to be Solved by the Invention] In the above-mentioned conventional thin film head manufacturing process, there was an RM in which the gap 14 was etched during the ion milling performed in the form of the coil conductor layer 17, and the gap length Ge could not be controlled with high precision. .

本発明の目的は、ギャップを保護することにある. 〔課題を解決するための手段〕 この発明の薄膜磁気ヘッドでは、第1図に示すようにギ
ャップ14の上に形威したシラン系樹脂15の上にさら
にノボラック系樹脂16を積層して、絶縁層の第1層目
としている。
The purpose of the invention is to protect the gap. [Means for Solving the Problems] In the thin film magnetic head of the present invention, as shown in FIG. This is the first layer.

〔作 用〕[For production]

前記第1層絶縁層15.16の先端部の位置の差aの長
さ分のギャップ14が、コイル導体層17の形或で行な
うイオンミリングによるエッチングから保護されるので
,ギャップ長Geを高精度に決めることができる。
Since the gap 14 corresponding to the length difference a between the positions of the tips of the first insulating layer 15 and 16 is protected from etching by ion milling performed in the form of the coil conductor layer 17, the gap length Ge is increased. It can be determined with precision.

〔実施例〕〔Example〕

以下、本発明の実施例を説明する。 Examples of the present invention will be described below.

実施例1:磁極先端部だけを書いた第2図を参照して説
明する. ギャップ14の上にシラン系樹脂の絶縁層l5を形成し
、さらにその上にノボラック系樹脂の絶縁層16を形成
して第1層目の絶縁層とする.このとき第2図(a)に
示す寸法aはギャップ深さ(Gd)以上とする.その後
,多層のコイル導体層を有機樹脂からなる絶縁層を介在
して形成する.さらにその最上層絶縁増形或後に酸素エ
ッチングを行なう,このとき、シラン系樹脂とノボラッ
ク系樹脂の酸素に対する選択比が約100 : 1ある
ため、ノボラック系樹脂を完全にエッチングできるほど
十分に酸素エッチングを行なうと第2図(b)に示すよ
うに、第1層目の絶縁層の先端がシラン系樹脂の先端で
決まる. この方法により、第2図(a)に示す寸法aの部分のギ
ャップ14は、コイル導体層17形成時のイオンミリン
グによるエッチングから保護されて,ギャップ長Geの
ばらつきをGe形或時のそれだけに押さえることができ
る.さらに、シラン系樹脂15の先端も保護されている
ため、先端部の形状が滑らかな傾斜面となる.また,第
1層絶縁膜先端の並び精度もよくなる. 実施例2;第2図(b)までの積層実施後,さらにその
上に有機樹脂の絶縁層2oを形成する.この最上層絶縁
層20の端部は、第2図(c)に示すように所定の角度
をもった滑らかな傾斜面となっている.この上に形威さ
れる上部磁性体19の形状は、最上層絶縁層2oの形状
に追従するため,同じく滑らかな面となる. 実施例3;磁極先端部だけを書いた第3図を参照して説
明する. ギャップ14の上にシラン系樹脂の絶縁層l5を形威し
、さらにその上にノボラック系樹脂の絶縁層16を形成
して第1層目の絶縁層とする。このとき第3図(a)に
示す寸法aが、ギャップ深さ(Gd)の寸法と等しくな
るように絶縁層15,16を形或する.その後,多層の
コイル導体層を有機樹脂からなる絶縁層を介在して形或
する。さらにその最上層絶縁層形成後に,第1層の絶縁
層をマスクとして有機樹脂とギャップ材の選択比が高い
ガスを用いてギャップをイオンミリング第3図(b)に
示すように切る.次に,実施例lで書いた様に、酸素エ
ッチングを行なって第1層目の絶縁層の先端をシラン系
樹脂の先端で決める.すなわち,第3図(c)に示す通
りである。
Example 1: This will be explained with reference to Figure 2, which shows only the tip of the magnetic pole. An insulating layer 15 of silane resin is formed on the gap 14, and an insulating layer 16 of novolac resin is further formed thereon to form a first insulating layer. At this time, the dimension a shown in Fig. 2(a) is greater than or equal to the gap depth (Gd). After that, a multilayer coil conductor layer is formed with an insulating layer made of organic resin interposed. Further, oxygen etching is performed after the top layer insulation is increased.At this time, since the selectivity ratio of silane resin and novolac resin to oxygen is approximately 100:1, the oxygen etching is sufficient to completely etch the novolac resin. When this is done, the tip of the first insulating layer is determined by the tip of the silane resin, as shown in Figure 2(b). By this method, the gap 14 in the dimension a shown in FIG. be able to. Furthermore, since the tip of the silane resin 15 is also protected, the tip forms a smooth inclined surface. Additionally, the alignment accuracy of the tips of the first layer insulating film is improved. Example 2: After laminating the layers up to FIG. 2(b), an insulating layer 2o of organic resin is further formed thereon. The end of this uppermost insulating layer 20 is a smooth sloped surface with a predetermined angle, as shown in FIG. 2(c). The shape of the upper magnetic body 19 formed thereon follows the shape of the uppermost insulating layer 2o, so that it also has a smooth surface. Example 3: This will be explained with reference to FIG. 3, which shows only the tip of the magnetic pole. An insulating layer 15 made of silane resin is formed on the gap 14, and an insulating layer 16 made of novolac resin is further formed thereon to form a first insulating layer. At this time, the insulating layers 15 and 16 are shaped so that the dimension a shown in FIG. 3(a) is equal to the dimension of the gap depth (Gd). Thereafter, a multilayer coil conductor layer is formed with an insulating layer made of organic resin interposed therebetween. Furthermore, after forming the uppermost insulating layer, using the first insulating layer as a mask, the gap is cut by ion milling using a gas with a high selectivity between the organic resin and the gap material, as shown in Figure 3(b). Next, as described in Example 1, oxygen etching is performed to define the tip of the first insulating layer with the tip of the silane resin. That is, as shown in FIG. 3(c).

この方法により決まる第3図(c)に示す寸法bは第3
図(a)のa寸法すなわちギャップ深さGdに等しい.
以上説明したように、この発明のプロセスでギャップ深
さGdを高精度に決定することができる。また、実施例
1で説明したように、このプロセスでギャップ長Geを
精度よく決めることができ、さらに先端部の形状が滑ら
かな傾斜面となり,並び精度もよくなる。
The dimension b shown in FIG. 3(c) determined by this method is the third
It is equal to the dimension a in figure (a), that is, the gap depth Gd.
As explained above, the gap depth Gd can be determined with high precision by the process of the present invention. Furthermore, as explained in Example 1, the gap length Ge can be determined with high accuracy through this process, and the shape of the tip becomes a smooth sloped surface, which improves alignment accuracy.

実施例4;第3図(c)までの積層実施後,さらにその
上に有機樹脂の絶縁層20を形戒する.この最上層絶縁
層20の端部は、第3図(d)に示すように所定の角度
をもった滑らかな傾斜面となっている。この上に形或さ
れる上部磁性体19の形状は、最上層絶縁層20の形状
に追従するため、同じく滑らかな面となる。
Embodiment 4: After laminating the layers up to FIG. 3(c), an insulating layer 20 of organic resin is further formed thereon. The end of the uppermost insulating layer 20 is a smooth inclined surface with a predetermined angle, as shown in FIG. 3(d). The shape of the upper magnetic body 19 formed thereon follows the shape of the uppermost insulating layer 20, so that it also has a smooth surface.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、小さい寸法で高精度のギャップ深さ及
びギャップ長を有する薄膜磁気ヘッドが実現出来、電磁
気特性の均一なヘッドを安定して製造出来る。
According to the present invention, a thin film magnetic head having small dimensions and highly accurate gap depth and gap length can be realized, and a head with uniform electromagnetic characteristics can be stably manufactured.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は,本発明を説明するための薄膜磁気ヘッドの断
面図、第2図は、本発明の一実施例を磁極先端部で説明
する断面図,第3図は、本発明の他の実施例を磁極先端
部で説明する断面図である.第1図において、 11・・・基板、12・・・下地膜、13・・・下部磁
性体、l4・・・ギャップ、15,16,18・・・有
機絶縁層、17・・・コイル導体層、19・・・上部磁
性体第2図において、 20・・・有機絶縁層 晃う目 (α)
FIG. 1 is a cross-sectional view of a thin film magnetic head for explaining the present invention, FIG. 2 is a cross-sectional view for explaining one embodiment of the present invention at the tip of a magnetic pole, and FIG. FIG. 2 is a cross-sectional view illustrating an example at the tip of a magnetic pole. In FIG. 1, 11...substrate, 12... base film, 13... lower magnetic material, l4... gap, 15, 16, 18... organic insulating layer, 17... coil conductor Layer 19... Upper magnetic body In FIG. 2, 20... Organic insulating layer (α)

Claims (1)

【特許請求の範囲】 1、下部磁性体と上部磁性体の間に非磁性ギャップ材、
第1の絶縁層、導体コイル、第2の絶縁層をはさんでな
る薄膜磁気ヘッドの製造方法において、前記第1の絶縁
層の第一層目をシラン系レジストで構成し、さらにその
先端からギャップ深さ以上離れたところに、ノボラック
系レジストを積層することを特徴とする薄膜磁気ヘッド
の製造方法。 2、特許請求の範囲第1項記載の薄膜磁気ヘッドの製造
方法において、前記第1の絶縁膜の第一層目を無機絶縁
膜で構成し、さらにその先端からギャップ深さ以上離れ
たところに、ノボラック系レジストを積層することを特
徴とする薄膜磁気ヘッドの製造方法。 3、特許請求の範囲第1項若しくは第2項記載の薄膜磁
気ヘッドの製造方法において、前記第1の絶縁層第一層
目のシラン系ホトレジスト又は無機絶縁膜によりギャッ
プ深さゼロ位置を決定する薄膜磁気ヘッドの製造方法。 4、特許請求の範囲第1項若しくは第2項記載の薄膜磁
気ヘッドの製造方法において、ノボラック系ホトレジス
トを積層後、これをマスクとしてギャップ材をエッチン
グし、更に酸素ドライエッチングによりノボラック系ホ
トレジストを後退させることを特徴とする薄膜磁気ヘッ
ドの製造方法。 5、特許請求の範囲第4項記載の薄膜磁気ヘッドの製造
方法において、ノボラック系ホトレジストを後退させた
後、更にノボラック系ホトレジストを積層し、先端テー
パ形状を改善することを特徴とする薄膜磁気ヘッドの製
造方法。 6、特許請求の範囲第1項記載の薄膜磁気ヘッドの製造
方法において、前記第1の絶縁層の第一層目を酸素ドラ
イエッチに対して選択性のある材料で構成し、さらにそ
の先端からギャップ深さ以上離れたところに、酸素ドラ
イエッチに対して選択性の小さい材料を積層することを
特徴とした薄膜磁気ヘッドの製造方法。
[Claims] 1. A non-magnetic gap material between the lower magnetic body and the upper magnetic body;
In the method for manufacturing a thin film magnetic head comprising a first insulating layer, a conductor coil, and a second insulating layer, the first layer of the first insulating layer is made of a silane resist, and A method for manufacturing a thin film magnetic head, characterized by laminating a novolac resist at a distance of at least the gap depth. 2. In the method for manufacturing a thin film magnetic head as set forth in claim 1, the first layer of the first insulating film is composed of an inorganic insulating film, and further, the first layer of the first insulating film is made of an inorganic insulating film, and the first layer is further separated from the tip by a gap depth or more. , a method for manufacturing a thin film magnetic head characterized by laminating a novolak resist. 3. In the method for manufacturing a thin-film magnetic head according to claim 1 or 2, the zero gap depth position is determined by a silane-based photoresist or an inorganic insulating film as the first layer of the first insulating layer. A method for manufacturing a thin film magnetic head. 4. In the method for manufacturing a thin film magnetic head as set forth in claim 1 or 2, after laminating the novolac photoresist, the gap material is etched using this as a mask, and the novolac photoresist is further retreated by oxygen dry etching. A method of manufacturing a thin film magnetic head, characterized in that: 5. In the method for manufacturing a thin film magnetic head according to claim 4, the thin film magnetic head is characterized in that after the novolac photoresist is retreated, a novolac photoresist is further laminated to improve the tapered tip shape. manufacturing method. 6. In the method for manufacturing a thin film magnetic head according to claim 1, the first layer of the first insulating layer is made of a material that is selective to oxygen dry etching, and further, from the tip thereof, A method for manufacturing a thin-film magnetic head characterized by laminating a material with low selectivity to oxygen dry etching at a distance greater than the gap depth.
JP23996189A 1989-09-18 1989-09-18 Manufacturing method of thin film magnetic head Pending JPH03104011A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23996189A JPH03104011A (en) 1989-09-18 1989-09-18 Manufacturing method of thin film magnetic head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23996189A JPH03104011A (en) 1989-09-18 1989-09-18 Manufacturing method of thin film magnetic head

Publications (1)

Publication Number Publication Date
JPH03104011A true JPH03104011A (en) 1991-05-01

Family

ID=17052409

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23996189A Pending JPH03104011A (en) 1989-09-18 1989-09-18 Manufacturing method of thin film magnetic head

Country Status (1)

Country Link
JP (1) JPH03104011A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10490327B2 (en) 2010-04-19 2019-11-26 Murata Manufacturing Co., Ltd. Coil component

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10490327B2 (en) 2010-04-19 2019-11-26 Murata Manufacturing Co., Ltd. Coil component
US10796828B2 (en) 2017-04-19 2020-10-06 Murata Manufacturing Co., Ltd. Coil component
US11842833B2 (en) 2017-04-19 2023-12-12 Murata Manufacturing Co., Ltd. Coil component

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