JPH0282104A - Measuring endoscope device - Google Patents

Abstract

PURPOSE:To check an extraction point correctly by displaying an image of extraction points of every plural orders in pattern extraction coordinates in a color different from extraction points of other orders. CONSTITUTION:Laser light from a laser light source 3 is projected on a subject through an optical fiber bundle 4 and a diffraction grating 7. Then the projection image of a diffraction pattern is sent out to a camera controller unit 9 through a solid image pickup element 8. A brightness signal from a unit 9 is inputted to an X-directional profile generation part 16 through a noise processing part 10 and a data gathering range detection part 15 for respective arrays. Then, an X-directional profile which is totalized 16 is converted by a spot center coordinate detection part 17 into a binary threshold level and a 0-order term coordinate detection part 18 detects the coordinates of a term of (0)th order. Further, a spot numbering part 19 finds the orders of all extraction points. Then a display control part 1 displays images of patterns extraction coordinates in yellow and white at intervals of three degrees.

Description

[Detailed Description of the Invention] [Object of the Invention] (Industrial Application Field) The present invention relates to a measurement endoscope device that is capable of measuring surface shapes such as unevenness of a subject by a pattern projection method, and in particular, relates to a measurement endoscope device that is capable of measuring surface shapes such as unevenness of a subject by a pattern projection method. The present invention relates to an improvement in image processing technology for checking and correcting extraction points and for making it easier to recognize W1 of unevenness of a subject.

(Prior art) Conventionally, this type of measurement endoscope device diffracts laser light with a diffraction grating and projects a diffraction pattern light onto a subject.
Based on the video signal obtained by capturing the projected image of the diffraction pattern using a solid-state positive image element, an image processing means extracts pixels having a signal intensity equal to or higher than a predetermined threshold value, and also adjusts the brightness for each extraction point. Accordingly, a measurement endoscope device has been proposed and put into practical use, which generates pattern extraction coordinates by recognizing the order of diffraction, and is capable of measuring the surface shape of a subject, such as unevenness, using the pattern extraction coordinates.

In the case of such a measurement endoscope device, if there is an extraction error in the pattern extraction coordinates, correct measurement of the subject cannot be performed. Therefore, conventionally, the presence or absence of extraction points due to extraction errors can be recognized by superimposing the pattern extraction coordinates on the current image, which has not been subjected to image processing to obtain the pattern extraction coordinates, and displaying the image. The points were to be corrected.

However, according to this conventional check-correction method, it is necessary to judge whether or not an extraction point is an extraction error based only on the display size of the extraction point, which indicates the order of diffraction at the extraction point. It was difficult to determine the existence of weak points.

Therefore, we first developed a check correction method that makes it easier to recognize the presence or absence of extraction points due to extraction errors by connecting extraction points with the same order of diffraction at the pattern extraction coordinates with lines and displaying the image, and then correcting the extraction points due to extraction errors. was suggested.

Furthermore, the pattern extraction coordinates displayed as an image by connecting the extraction points with lines have the advantage that the uneven shape of the subject can be more easily recognized than the pattern extraction coordinates simply showing only the extraction points.

(Problem to be Solved by the Invention) However, when displaying an image by connecting extraction points with the same order of diffraction in pattern coordinates with a line, as in the conventional FAIA system in this type of measurement, extraction points due to extraction errors are When correcting the presence/absence check, depending on the location of the extraction error, it may be more difficult to see than when the extraction points are not connected with a line. Furthermore, when recognizing the uneven shape of a subject, there is a problem in that the uneven shape may become difficult to see due to the presence of the lines, especially when the lines are very close together.

In addition, when the pattern extraction coordinates shown by connecting the extraction points with the same order of diffraction with lines are displayed as an image by superimposing the normal vA observation image, it is usually 11! In some cases, the images were extremely difficult to see.

The present invention has been made in view of the above-mentioned problems, and its purpose is to provide a measurement system that can easily check the extraction points correctly and that can always correctly recognize the uneven shape of the subject. The purpose of the present invention is to provide a viewing device.

[Structure of the Invention] (Means for Solving the Problem) In order to achieve the above object, the present invention diffracts laser light with a diffraction grating and projects a diffraction pattern light onto a subject,
Based on the video signal obtained by capturing the projected image of the diffraction pattern using the image carrier, pattern extraction coordinates are generated by the image processing means, and the surface shape such as unevenness of the subject can be measured using the pattern extraction coordinates. Inside? J! The gist of the mirror device is to include display control means for displaying an image of extraction points at every appropriately selected multiple orders in the pattern extraction coordinates in a color representation different from that of extraction points at other orders.

(Function) With the measurement endoscope device according to the present invention, the color expression of the extraction points for each appropriately selected multiple order on the screen will be different from the extraction points of other orders. When correcting the presence/absence check, it becomes easy to immediately find extraction points with extraction errors, and when recognizing the uneven shape of a subject, the uneven shape can always be correctly recognized.

(Example) Figure 1 shows the measurement results of an example to which the present invention is applied. J2
FIG. 2 is a block diagram schematically showing the entire mirror device.

In the measurement endoscope device of this embodiment, the configuration of the process up to obtaining pattern extraction coordinates is the same as that of the measurement endoscope device proposed earlier by the applicant. After that, the display control unit 1 performs control to display an image on the monitor 2 of the extraction points at every appropriately selected multiple orders in the pattern extraction coordinates in a color representation different from that of the extraction points at other orders.

That is, as shown in FIG.
is sent to the endoscope scope 5, and the endoscope scope 5
The laser beam is diffracted by a diffraction grating 7 in the rigid tip portion 6 of the laser beam, and is projected onto the subject as a diffraction pattern.

Then, a projected image of the diffraction pattern is captured by a solid path @column 8 disposed on the rigid tip portion 6 and photoelectrically converted, and the photoelectrically converted output of this solid image carrier 8 is transmitted to a camera controller unit (hereinafter referred to as CCU) 9. sent to. Although not shown, the light emitted from the light source for illuminating the subject is guided to the rigid tip portion 6 by a light guide (not shown) and illuminates the subject.

The CCU 9 can convert the photoelectric conversion output of the solid-state RI & element 8 into a video signal, and the color difference signal and luminance signal of this video signal are normally used to obtain the I2 dormitory image, and the luminance signal is used as a pattern. Used to obtain extraction coordinates.

When obtaining pattern extraction coordinates, the luminance signal obtained by the CCIJ9 is passed through the noise processing section 10 and then passed through the binarization processing section 11.
will be sent to. In this binarization processing unit 11, the noise-processed luminance signal Ey is binarized as "1" for the part whose luminance is higher than the reference threshold level Th, and as OII for the part whose luminance is smaller than the reference threshold level Th. As shown in the figure, the part of the subject that is irradiated with the spot light S has a high brightness, so it is set as "1".
The other parts become "0" and spot detection is performed.

When the detection output of this binarization processing section 11 is sent to the thinning processing section 12, the spot light S
Each vixel corresponding to each center point is obtained, and a spot light pattern indicating the state of each pixel is obtained.

In this spot light pattern, the interval between the spot lights changes according to the shape of the subject only in the X direction, which is the parallax direction, and the coordinates are the same in the Y direction. Note that here, in order to create parallax only in the row direction (X direction) and not in the column direction (Y direction) between the solid-state image sensor and the diffraction grating 7, as shown in FIG. , it is assumed that the corresponding portions of the X and Y directions on the image transport plane of the solid-state image sensor 8 and the X and Y directions of the diffraction grating 7 are accurately aligned in the Y direction.

In the Y-direction profile creation unit 13, the pixel size of one screen of the spot light pattern is set to, for example, 512 x 512, and the R direct data or binarized luminance data of each pixel is set as E ij (however, i-1 512, j=1 to 512), the profile in the Y direction is determined by the following equation in which all the data in the X direction are summed for each column (see FIG. 4).

Y-direction profile=Σnil1j(j) 1=1 For the Y-direction profile thus obtained, the threshold level T1 appropriately selected by the Y-direction center coordinate detection unit 14 is determined.
By performing binarization on 1+ and detecting its center coordinates, the center coordinates Yl,
Y2...Yn is found.

Next, the data collection range detecting unit 15 for each column detects the range 'y' ja, Y jl) in which the data for each column is taken. Note that the ranges Yja and Yjb are determined from the data of the center coordinates Y+, Y2, and Yn of each column.

Next, the X-direction profile creation unit 16 converts the brightness data Iij of each pixel into the above ranges Yja, Yj
b, and the profile in the X direction is determined by the following equation (see FIG. 5).

Next, in the spot center coordinate detection section 17, the above profile is binarized with respect to an appropriately selected threshold level Thz, and the center coordinates of the spots in each row are determined from the center bare area.

At the same time, the 0th order term coordinate detection unit 18 detects the 0th order term Ao from the X coordinate having the maximum value in the profile in the X direction.
The coordinates of So, Go, . . . are detected.

Note that this coordinate detection of the O-order term is performed by a known method of brightening only the diffracted light of the 0-order term.

Next, in step 19, the spots are numbered, with the coordinates of the extraction point by the O-order term spot as the center, and the spot extraction points in each column are numbered and diffraction orders are assigned, so that the coordinates are smaller than the zero-order term. -1, -2 in the direction
, . . , and the larger coordinate is given +1. +2
．． The order of ... is assigned. (See Figure 6). By performing the above-mentioned addressing operation for each column Yl, Y2, . . . Yn, the order is determined for all extraction points.

By obtaining the pattern extraction coordinates in which all the extraction points are addressed in this way, the display control unit 1 of the next stage Y-Y 21 can be operated.

In one example of this embodiment, the display control unit 1 controls the
The pattern extraction coordinates were displayed on the monitor 2 as an image as shown in FIG. 7 using a color representation in which every order was yellow and the other orders were white. In FIG. 7, the shaded extraction points are expressed in yellow, and the other extraction points are expressed in white.

Therefore, according to an embodiment of the present invention, when checking and correcting the presence or absence of an extraction point due to an extraction error, it becomes easy to immediately find the extraction point due to an extraction error, and when the uneven shape of the subject is Since there is no influence of line drawing, the uneven shape can always be recognized correctly.

[Effects of the Invention] As explained above, the measurement endoscope device to which the present invention is applied expresses the extraction points at every appropriately selected multiple orders in the pattern extraction coordinates in a different color from the extraction points at other orders. Since this configuration performs display processing to display an image, it is possible to accurately and quickly check the presence or absence of extraction points due to extraction errors and recognize the uneven shape of the subject.

[Brief explanation of the drawing]

Fig. 1 is a block diagram showing the overall outline of a measuring endoscope device according to an embodiment of the present invention, Fig. 2 is a detailed explanatory diagram of a projection situation of a diffraction pattern, and Fig. 3 is a diagram showing a diffraction grating and a solid state. Figure 4 is a pattern diagram schematically showing the profile in the Y direction, Figure 5 is a pattern diagram schematically showing the profile in the X direction, and Figure 6 is a state in which pattern extraction coordinates are obtained. FIG. 7 is an explanatory diagram of the display state of pattern extraction coordinates on the screen. 1...Display control unit 2...Monitor 3...Laser light source device 4...Optical fiber bundle 5...
Endoscope scope 6... rigid tip part 7... diffraction grating 8... solid ME element 9... ccu
i o...Noise processing section 11...2rIi
Thinning processing section 12... Thinning processing section 13... Y direction profile creation section 14... Y direction center coordinate detection section 15... Data collection range detection section for each column 6... X direction profile creation Part 7...Spot center coordinate detection part 8...O-order coordinate detection part 9...Spot numbering is done in part

Claims (1)

[Claims] (1) Laser light is diffracted by a diffraction grating, an analysis pattern light is projected onto the subject, and a projected image of the analysis pattern is captured by an imaging means.Based on the video signal obtained, pattern extraction coordinates are generated by an image processing means. However, in a measurement endoscope device that is capable of measuring surface shapes such as irregularities of a subject using these pattern extraction coordinates, extraction points are extracted at every appropriately selected multiple order in the pattern extraction coordinates, and extraction points at other orders are different from extraction points at other orders. A measuring endoscope device comprising a display control means for displaying images in different color expressions.