JPH0233984B2 - - Google Patents
Info
- Publication number
- JPH0233984B2 JPH0233984B2 JP57014984A JP1498482A JPH0233984B2 JP H0233984 B2 JPH0233984 B2 JP H0233984B2 JP 57014984 A JP57014984 A JP 57014984A JP 1498482 A JP1498482 A JP 1498482A JP H0233984 B2 JPH0233984 B2 JP H0233984B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- holding plate
- plate
- hole
- ultrasonic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 claims description 5
- 238000005498 polishing Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 7
- 239000010409 thin film Substances 0.000 description 4
- 238000002604 ultrasonography Methods 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Sampling And Sample Adjustment (AREA)
Description
【発明の詳細な説明】
本発明は、超音波顕微鏡用試料の載置法に関す
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for mounting a sample for an ultrasonic microscope.
近年1GHzに及び超高周波の音波の発生検出が
可能となつたので、水中で約1μmの音波長が実
現できることになり、その結果、高い分解能の音
波撮像装置が得られるようになつた。即ち、凹面
レンズを用いて集束音波ビームを作り、1μmに
及び高い分解能を実現するのである。 In recent years, it has become possible to generate and detect ultrahigh frequency sound waves of up to 1 GHz, making it possible to realize sound wavelengths of about 1 μm underwater, and as a result, it has become possible to obtain high-resolution sound wave imaging devices. In other words, a concave lens is used to create a focused acoustic beam, achieving a resolution as high as 1 μm.
上記ビーム中に試料をそう入し、試料による反
射超音波を検出して試料の微細領域の弾性的性質
を解明したり、或は試料を機械的に2次元に走査
しながら、この信号の強度をブラウン管の輝度信
号として表示すれば、試料の微細構造を拡大して
みることができる。 By inserting a sample into the beam and detecting the reflected ultrasonic waves from the sample, we can elucidate the elastic properties of minute regions of the sample, or while mechanically scanning the sample in two dimensions, we can measure the intensity of this signal. By displaying this as a brightness signal on a cathode ray tube, it is possible to magnify the fine structure of the sample.
第1図は、その超音波顕微鏡の主要構成部を示
す図である。超音波の集束及び送受は球面レンズ
1により行つているが、その構造は円柱状の熔融
石英等をもちいた物質の一面を光学研磨し、その
上に圧電薄膜(ZnO)2を上下電極3によりはさ
む、このようなサンドウイツチ構造になつている
圧電薄膜2に、パルス発振器4から発生されたパ
ルス5を印加して、超音波6を発生させる。ま
た、他端部は口径0.1mmφ〜1.0mmφ程度の凹面状
の半球穴が形成されており、この半球穴と試料と
の間には、超音波6と試料7に伝播させるための
媒質(例えば水)8が満されている。 FIG. 1 is a diagram showing the main components of the ultrasound microscope. The focusing, transmission and reception of ultrasonic waves is carried out by a spherical lens 1, whose structure consists of optically polishing one side of a material made of cylindrical fused silica or the like, and then placing a piezoelectric thin film (ZnO) 2 on top of it with upper and lower electrodes 3. A pulse 5 generated from a pulse oscillator 4 is applied to the piezoelectric thin film 2 sandwiched in such a sandwich structure to generate an ultrasonic wave 6. In addition, a concave hemispherical hole with a diameter of about 0.1 mmφ to 1.0 mmφ is formed at the other end, and a medium (for example, Water) 8 is fulfilled.
圧電薄膜2によつて発生した超音波6は円柱の
中を平面波となつて伝播する。この平面波が半球
穴に達すると石英(音波6000m/s)と水(音速
1500m/s)との音速の差により屈折作用が生
じ、試料7面上に集束した超音波6を照射するこ
とができる。逆に試料7から反射されてくる超音
波は球面レンズにより集音整相され、平面波とな
つて圧電薄膜2に達し、ここでRF信号9に変換
される。このRF信号9を受信器10で受信し、
ここでダイオード検波してビデオ信号11に変換
し、CRTデイスプレイ12の入力信号として用
いている。 Ultrasonic waves 6 generated by the piezoelectric thin film 2 propagate in the cylinder as plane waves. When this plane wave reaches the hemispherical hole, quartz (sound wave 6000 m/s) and water (sound speed
1500 m/s) causes a refraction effect, allowing focused ultrasonic waves 6 to be irradiated onto the surface of the sample 7. Conversely, the ultrasonic waves reflected from the sample 7 are collected and phased by a spherical lens, become plane waves, reach the piezoelectric thin film 2, and are converted into an RF signal 9 here. This RF signal 9 is received by a receiver 10,
Here, the signal is detected by a diode and converted into a video signal 11, which is used as an input signal for a CRT display 12.
この様に構成された装置において、試料7が試
料台駆動電源13によりx−y平面内で2次元に
走査していると試料の走査にともなう試料面から
の反射の強弱が2次元的にCRT面12に表示さ
れる。 In the apparatus configured in this way, when the sample 7 is two-dimensionally scanned within the x-y plane by the sample stage drive power supply 13, the intensity of reflection from the sample surface as the sample scans changes two-dimensionally. displayed on screen 12.
而して、一般に超音波は物体の表面で一部分は
反射するが、かなりの部分は物体が光学的に透明
かどうかに関係なく、その中にはいつてゆき、物
体内部に存在する硬さや、密度、粘性の違いや欠
陥などを反映したエコーとなつて返つてくる。こ
の性質を利用して試料内部の様相を検出できるの
が超音波顕微鏡である。 Generally speaking, a portion of ultrasound waves is reflected from the surface of an object, but a large portion of the ultrasound waves are reflected within the object, regardless of whether the object is optically transparent or not. It returns as an echo that reflects differences in density, viscosity, and defects. Ultrasonic microscopes can utilize this property to detect aspects inside a sample.
このような特徴をもつ超音波顕微鏡をもちい
て、試料を観察する場合、試料の試料台14への
固定の方法は第2図aに示すように試料7の観察
面Aが試料台14のx−y走査面Bと平行に固定
されることが望ましい。なぜならば、若し試料7
の観察面Aが第2図bに示すように試料台14の
走査面Bに対して傾いている場合には焦点面が試
料7を横ぎる個所は点線Cで示すような状態とな
り、表面Aから一様な深さのところを観察するこ
とは不可能となる。 When observing a sample using an ultrasonic microscope with such characteristics, the method of fixing the sample to the sample stage 14 is as shown in FIG. - It is desirable that it be fixed parallel to the y scanning plane B. Because if sample 7
When the observation plane A of is tilted with respect to the scanning plane B of the sample stage 14 as shown in FIG. It becomes impossible to observe a uniform depth.
また、試料7の表面が傾斜していることによつ
て、超音波の試料への入斜角が正規の角度よりず
れ、表面より所定の位置に焦点を結ばないことも
生ずる。さらに試料表面で入射した音波が表面波
に転換し干渉縞を生ずるなど種々の障害が生ず
る。 Furthermore, since the surface of the sample 7 is inclined, the angle of incidence of the ultrasonic waves on the sample may deviate from the normal angle, and the ultrasonic wave may not be focused at a predetermined position from the surface. Furthermore, various problems occur, such as the sound waves incident on the sample surface being converted into surface waves, resulting in interference fringes.
試料7がもしも上下面が平行平面の平板の場合
においては試料7を第2図aの如く固定すること
は容易であるが、第3図に示すような形状の試料
7のA面を観察しようとする場合には、試料台1
4とA面との平行に固定することは、なかなか容
易でなく、何回か固定を調節しなおしながら、最
適条件をみいだしているのが現状であり、試料の
設定に時間を費いやしてしまう。 If the sample 7 is a flat plate whose upper and lower surfaces are parallel planes, it is easy to fix the sample 7 as shown in Figure 2 a, but let's observe the A side of the sample 7, which has a shape as shown in Figure 3. In this case, sample stage 1
It is not easy to fix the sample parallel to the A plane, and the current situation is to readjust the fixation several times to find the optimal conditions, and it takes a lot of time to set the sample. Put it away.
本発明は上述の問題点を解すするためになされ
たもので、超音波顕微鏡等の試料台にもちいて最
適な試料の載置法を提供するものである。 The present invention has been made to solve the above-mentioned problems, and is intended to provide an optimal method for mounting a sample when used on a sample stage of an ultrasonic microscope or the like.
第4図は本発明の一実施例の構成を示す図であ
る。上下面が平行平面の平板に研磨された試料保
持板15には少なくとも1個の試料を取りつける
ための穴16を設ける。 FIG. 4 is a diagram showing the configuration of an embodiment of the present invention. A hole 16 for mounting at least one sample is provided in the sample holding plate 15, which is polished into a flat plate with upper and lower surfaces parallel to each other.
以下試料保持板15に試料7を固定する手順に
ついて述べる。第5図aに示す如く、表面が鏡面
に研磨された支持台17の面上に試料保持板15
を載置する。この状態で第5図bに示すように試
料7を穴16内に設置する、この場合試料7のA
面が支持台17に接するよう設置する。つぎに第
5図cに示すごとく接着材18により試料7と、
試料保持板15とを固定する。接着材18が硬化
したのち、試料保持板15をうら返すと第5図d
のごとく、試料保持板15と試料7のA面は、同
一平面上に固定されることになる。 The procedure for fixing the sample 7 to the sample holding plate 15 will be described below. As shown in FIG.
Place. In this state, the sample 7 is placed in the hole 16 as shown in FIG.
It is installed so that the surface is in contact with the support stand 17. Next, as shown in FIG. 5c, the sample 7 is attached with adhesive 18,
The sample holding plate 15 is fixed. After the adhesive 18 has hardened, turn the sample holding plate 15 over and the image shown in Fig. 5d
As shown, the sample holding plate 15 and the A side of the sample 7 are fixed on the same plane.
上述の方法で試料7を試料保持板15に固定し
たものを試料台14に取付つければ試料台14の
走査面と試料7の観察面Aとは容易に一致させて
固定することができる。 If the sample 7 fixed to the sample holding plate 15 in the above-described manner is attached to the sample stand 14, the scanning plane of the sample stand 14 and the observation plane A of the sample 7 can be easily aligned and fixed.
このように試料保持板15を使用すれば、試料
7の裏面の形状は問わず観察面を試料台と平行に
載置することができる。 By using the sample holding plate 15 in this way, the observation surface can be placed parallel to the sample stage regardless of the shape of the back surface of the sample 7.
第1図は超音波顕微鏡の概略構成図、第2図は
試料取付け状態を示す図、第3図は試料の形状を
示す図、第4図は試料保持板の構造を示す図、第
5図は試料保持板に試料を取付ける順次を説明す
る図である。
Figure 1 is a schematic configuration diagram of the ultrasonic microscope, Figure 2 is a diagram showing the sample attachment state, Figure 3 is a diagram showing the shape of the sample, Figure 4 is a diagram showing the structure of the sample holding plate, and Figure 5. FIG. 2 is a diagram illustrating the sequence in which a sample is attached to a sample holding plate.
Claims (1)
なくとも1個の穴をもつ試料の保持板を、研磨さ
れた平面をもつ支持台の研磨面に載置し、前記試
料の観察面を前記保持板の穴に、前記支持台の研
磨面に接するように挿入して前記保持板の穴と試
料を固定し、その状態で前記保持板を裏板して、
超音波顕微鏡の試料台に載置することを特徴とす
る超音波顕微鏡用試料の載置法。1. Place a sample holding plate polished into a flat plate with upper and lower surfaces parallel to each other and having at least one hole on the polished surface of a support base having a polished flat surface, and place the observation surface of the sample on the holding plate. Insert into the hole of the plate so as to be in contact with the polishing surface of the support plate to fix the hole of the holding plate and the sample, and in this state, use the holding plate as a back plate,
A method for placing a sample for an ultrasonic microscope, characterized by placing the sample on a sample stage of the ultrasonic microscope.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57014984A JPS58132655A (en) | 1982-02-03 | 1982-02-03 | How to place a sample for ultrasonic microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57014984A JPS58132655A (en) | 1982-02-03 | 1982-02-03 | How to place a sample for ultrasonic microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58132655A JPS58132655A (en) | 1983-08-08 |
| JPH0233984B2 true JPH0233984B2 (en) | 1990-07-31 |
Family
ID=11876218
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57014984A Granted JPS58132655A (en) | 1982-02-03 | 1982-02-03 | How to place a sample for ultrasonic microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58132655A (en) |
-
1982
- 1982-02-03 JP JP57014984A patent/JPS58132655A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58132655A (en) | 1983-08-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0254503B2 (en) | ||
| US4510810A (en) | Ultrasonic microscope | |
| JPS59160755A (en) | sonic microscope | |
| US4614410A (en) | Ultrasonic microscope with optical microscope incorporated therein | |
| SU832449A1 (en) | Scanning acoustic microscope | |
| JPH0233984B2 (en) | ||
| JPS6255099B2 (en) | ||
| JPH0427501B2 (en) | ||
| JPH0230769Y2 (en) | ||
| JPS5928362Y2 (en) | ultrasound microscope | |
| JPS5815151A (en) | ultrasound microscope | |
| JPH0210379B2 (en) | ||
| JPS60171456A (en) | Treatment of specimen for ultrasonic microscope | |
| JPS5928361Y2 (en) | Sample holder for ultrasonic microscope | |
| JPS585646A (en) | Ultrasonic microscope | |
| JPS6188144A (en) | ultrasound microscope | |
| JPH0158458B2 (en) | ||
| JPS61170654A (en) | Ultrasonic microscope | |
| JPS58196453A (en) | Ultrasonic microscope | |
| JPS58166258A (en) | Ultrasonic microscopic lens | |
| JPS5831200Y2 (en) | ultrasonic focusing lens | |
| JPS58118958A (en) | Ultrasonic microscope | |
| JPS61111458A (en) | Ultrasonic microscope | |
| JPS60355A (en) | Ultrasonic microscope | |
| JPS6180043A (en) | ultrasound microscope |