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JPH02219000A - Automatic control device for X-ray equipment - Google Patents

Automatic control device for X-ray equipment

Info

Publication number
JPH02219000A
JPH02219000A JP3906989A JP3906989A JPH02219000A JP H02219000 A JPH02219000 A JP H02219000A JP 3906989 A JP3906989 A JP 3906989A JP 3906989 A JP3906989 A JP 3906989A JP H02219000 A JPH02219000 A JP H02219000A
Authority
JP
Japan
Prior art keywords
ray
pulse
selector
ray tube
identification code
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3906989A
Other languages
Japanese (ja)
Inventor
Zenichi Yasuda
善一 安田
Kazuo Koyanagi
和夫 小柳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP3906989A priority Critical patent/JPH02219000A/en
Publication of JPH02219000A publication Critical patent/JPH02219000A/en
Pending legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To facilitate an operation and to reduce false setting by a method wherein an identification code is displayed in an X-ray tube bulb and the upper and lower limit values of a selected pulse height of a pulse-height selector are set to be optimum values in accordance with the kind of the X-ray tube bulb discriminated from the identification code. CONSTITUTION:CPU 4 extracts from a memory 3 the upper and lower limit values of a selected pulse height of a pulse-height selector 5 corresponding to a bar code of an X-ray tube bulb 1 read by a bar code reading device 2 and sets these values in the selector 5. Moreover, the optimum value of an impression voltage on a filament of the tube bulb 1 is selected out of the memory 3 and the impression voltage on the filament is adjusted to be said optimum value. An X-ray is applied onto a sample by the tube bulb 1 and the X-ray diffracted by the sample is detected 7. On the X-ray detector 7, the X-ray having a pulse height distribution wherein the density of a pulse having a pulse height corresponding to the wavelength of the X-ray is high is incident, and the pulse having the pulse height corresponding to the wavelength of the incident X-ray is inputted to the selector 5. The selector 5 selects the pulse within a prescribed range on the basis of the upper and lower limit values which are set and counts the selected pulse, and a counted value thereof is displayed 8 as a measured value.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、X線回折装置において、X線検出パルスの選
別パルス波高値を使用するX線管球の種類に応じて最適
に自動的に設定する装置に関する(従来の技術) X線回折装置において、回折X線等を測定する場合、試
料に応じて照射X線を最適波長のX線に変更する必要が
あり、試料によってX線管球を選択するので、使用する
X線管球の種類によって、回折X線の検出波長が異なる
。X線検出器には、回折X線以外にもX線が入射される
ので、回折X線以外のX線(バックグランド)を除去す
るために、X線を比例計数管等で検出し、波長に対応す
る波高値を持つパルスに変換し、その検出パルスから回
折X線波長に対応する波高値のパルスだけを波高選別器
で選別して計数している。そこで検出すべき回折X線の
波長が変更されれば、波高選別器の選別波高値を変更し
なければならない。従来はこの変更処置を、X線管球の
種類を変更する都度、手動にて波高選別器の選別波長値
を変更していた。しかし、このような方法では、変更す
るのに手間がかかるし、また、変更において設定ミス等
が発生し易いと云う問題があった。
Detailed Description of the Invention (Industrial Field of Application) The present invention provides an X-ray diffraction apparatus that automatically and optimally selects pulse height values of X-ray detection pulses according to the type of X-ray tube used. Regarding equipment to be set up (prior art) When measuring diffracted X-rays, etc. using an X-ray diffraction device, it is necessary to change the irradiated X-rays to X-rays with the optimum wavelength depending on the sample, and the X-ray tube may vary depending on the sample. Therefore, the detection wavelength of diffracted X-rays differs depending on the type of X-ray tube used. Since X-rays other than diffracted X-rays are incident on the X-ray detector, in order to remove X-rays other than diffracted X-rays (background), X-rays are detected with a proportional counter, etc., and the wavelength From the detected pulses, only pulses with a peak value corresponding to the diffracted X-ray wavelength are selected by a pulse height selector and counted. If the wavelength of the diffracted X-rays to be detected is changed, the selection wave height value of the wave height selector must be changed. Conventionally, this change procedure was carried out by manually changing the selection wavelength value of the wave height selector each time the type of X-ray tube was changed. However, with this method, there is a problem that it takes time and effort to change, and setting errors are likely to occur during the change.

(発明が解決しようとする課題) 本発明は、X線回折装置において、X線管球を交換する
都度、自動でX線管球の種類を判別し、そのX線管球に
適合した選別波高値に波高選別器を設定させることを目
的とする。
(Problems to be Solved by the Invention) The present invention provides an X-ray diffraction apparatus that automatically determines the type of X-ray tube each time the X-ray tube is replaced, and selects a selected wave that is compatible with the X-ray tube. The purpose is to set the wave height selector to the highest value.

(課題を解決するための手段) X線装置の自動制御装置として、X線管球に識別コード
を表示し、表示された識別コードを読取る識別コード読
取り手段と、X線検出パルスの波高選別器の選別波高上
限値及び下限値を上記識別コード読取り手段によって判
別したX線管球の種類に応じて最適値に設定する選別波
高値設定手段とを設けた。
(Means for Solving the Problem) As an automatic control device for an X-ray device, an identification code reading means for displaying an identification code on an X-ray tube and reading the displayed identification code, and a pulse height selector for X-ray detection pulses are provided. and screening wave height value setting means for setting the upper and lower limit values of the screening wave height to optimum values according to the type of X-ray tube determined by the identification code reading means.

(作用) X線回折装置は、X線管球の種類によって、波高選別器
の波高選別値を調整しなければならない、従来はこれら
の設定を手動で行っていたが、本発明は、X線管球に識
別コードを付加し、同識別コードを識別コード読取り装
置で読み取らせることにより、X線管球の種類を自動的
に識別させ、その識別信号により、上記の波高選別器の
波高選別値を自動的に調整しようとするものである。
(Function) In an X-ray diffraction device, the wave height selection value of the wave height selector must be adjusted depending on the type of X-ray tube. Conventionally, these settings were manually performed, but the present invention By adding an identification code to the tube and having the identification code read by an identification code reader, the type of X-ray tube can be automatically identified, and the identification signal can be used to determine the wave height selection value of the above-mentioned wave height selector. It attempts to automatically adjust the

(実施例) 第1図に本発明の一実施例を示す、第1図において、1
はX線回折装置6に使用される識別コード付X線管球で
ある。2はX線管球1に表示されている識別コード例え
ばバーコード等を読み取る識別コード読取り装置、3は
メモリで上記識別コードに対応する波高選別器5の選別
波高の上限値と下限値のテーブルとX線管球フィラメン
トの最適印加電圧のテーブルを記憶させである。4はC
PUで識別コード読取り装置2で読取ったX線管球1の
識別コードに適応する波高選別器5の選別波高の上限値
と下限値を上記メモリ3がら抽出し、波高選別器5の選
別波高値を抽出した上記選別波高の上限値と下限値に設
定すると共に、X線管球フィラメントの印加電圧の最適
値を選択し、その最適値にX線管球フィラメントの印加
電圧を調整する。測定動作は、X線管球1によりX線が
試料に照射され、試料で回折されたX線をX線検出器7
で検出する。第2図に示すように、検出器7では、X線
管から放射されるX線波長に対応する波高を持つパルス
の密度が高いパルス波高分布のX線が入射する。X線検
出器7は入射しなX線波長に対応した波高を持つパルス
を波高選別器5に入力する。波高選別器5は、第2図に
示すように、測定したいX線波長に対応する波長範囲の
パルス(PIとP2間のパルス)を、上記で設定した上
限値と下限値によって選別し、その選別したパルスを計
数し、その計数値を測定値として、表示装置8により表
示する。
(Example) FIG. 1 shows an example of the present invention.
is an X-ray tube with an identification code used in the X-ray diffraction device 6. Reference numeral 2 denotes an identification code reader for reading an identification code, such as a bar code, displayed on the X-ray tube 1, and 3 a memory, which is a table of upper and lower limit values of screening wave heights of the wave height sorter 5 corresponding to the above-mentioned identification code. and a table of optimal applied voltages for the X-ray tube filament is memorized. 4 is C
The PU extracts from the memory 3 the upper and lower limits of the wave height for selection by the wave height selector 5 that are adapted to the identification code of the X-ray tube 1 read by the identification code reader 2, and extracts the wave height values for the selection by the wave height selector 5. are set as the upper and lower limits of the extracted screening wave height, and the optimum value of the voltage applied to the X-ray tube filament is selected, and the voltage applied to the X-ray tube filament is adjusted to the optimum value. In the measurement operation, the X-ray tube 1 irradiates the sample with X-rays, and the X-rays diffracted by the sample are transmitted to the X-ray detector 7.
Detect with. As shown in FIG. 2, X-rays with a pulse height distribution having a high density of pulses having a wave height corresponding to the X-ray wavelength emitted from the X-ray tube are incident on the detector 7. The X-ray detector 7 inputs pulses having a wave height corresponding to the incident X-ray wavelength to the wave height selector 5. As shown in FIG. 2, the pulse height selector 5 sorts pulses in the wavelength range corresponding to the X-ray wavelength to be measured (pulses between PI and P2) according to the upper and lower limit values set above, and The selected pulses are counted and the counted value is displayed on the display device 8 as a measured value.

(発明の効果) 本発明によれば、X線管球の種類に対応して、波高選別
器の選別波高値及びX線管球のフィラメント印加電圧を
自動的に設定できるようになったことにより、操作が容
易になると共に、誤設定が軽減された。
(Effects of the Invention) According to the present invention, the screening wave height value of the wave height selector and the voltage applied to the filament of the X-ray tube can be automatically set in accordance with the type of X-ray tube. , operation has become easier and incorrect settings have been reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の構成図、第2図はX線管か
ら放射されるX線による検出器の検出パルス波高分布図
である。 1・・・識別コード付X線管球、2・・・識別コード読
取り装置、3・・・メモリ、4・・・CPU、5・・・
波高選別器、6・・・X線回折装置、7・・・X線検出
器、8・・・表示装置。 第1図 第2図
FIG. 1 is a block diagram of an embodiment of the present invention, and FIG. 2 is a detection pulse height distribution diagram of a detector using X-rays emitted from an X-ray tube. 1... X-ray tube with identification code, 2... identification code reader, 3... memory, 4... CPU, 5...
Wave height sorter, 6... X-ray diffraction device, 7... X-ray detector, 8... Display device. Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] X線管球に表示された識別コードを読取る識別コード読
取り手段と、X線検出パルスの波高選別器の選別波高上
限値及び下限値を上記識別コード読取り手段によって判
別したX線管球の種類に応じて最適値に設定する選別波
高値設定手段とを有することを特徴とするX線装置の自
動制御装置。
an identification code reading means for reading an identification code displayed on the X-ray tube; and a selection wave height upper and lower limit value of a wave height selector for X-ray detection pulses according to the type of X-ray tube determined by the identification code reading means. 1. An automatic control device for an X-ray apparatus, comprising a screening wave height value setting means for setting an optimum value according to the selection wave height value.
JP3906989A 1989-02-18 1989-02-18 Automatic control device for X-ray equipment Pending JPH02219000A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3906989A JPH02219000A (en) 1989-02-18 1989-02-18 Automatic control device for X-ray equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3906989A JPH02219000A (en) 1989-02-18 1989-02-18 Automatic control device for X-ray equipment

Publications (1)

Publication Number Publication Date
JPH02219000A true JPH02219000A (en) 1990-08-31

Family

ID=12542836

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3906989A Pending JPH02219000A (en) 1989-02-18 1989-02-18 Automatic control device for X-ray equipment

Country Status (1)

Country Link
JP (1) JPH02219000A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05203589A (en) * 1991-09-19 1993-08-10 Internatl Business Mach Corp <Ibm> System and method for monitoring tempo- rary discharge
JP2001236295A (en) * 1999-11-29 2001-08-31 General Electric Co <Ge> Method and device for remotely performing environment setting and service with respect to field exchangeable unit in medical diagnostic system
WO2006095468A1 (en) * 2005-03-09 2006-09-14 National Institute For Materials Science X-ray diffraction analyzer and analyzing method
JP2014077714A (en) * 2012-10-11 2014-05-01 Rigaku Corp X-ray analyzer

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05203589A (en) * 1991-09-19 1993-08-10 Internatl Business Mach Corp <Ibm> System and method for monitoring tempo- rary discharge
JP2001236295A (en) * 1999-11-29 2001-08-31 General Electric Co <Ge> Method and device for remotely performing environment setting and service with respect to field exchangeable unit in medical diagnostic system
WO2006095468A1 (en) * 2005-03-09 2006-09-14 National Institute For Materials Science X-ray diffraction analyzer and analyzing method
JP2014077714A (en) * 2012-10-11 2014-05-01 Rigaku Corp X-ray analyzer
US9618461B2 (en) 2012-10-11 2017-04-11 Rigaku Corporation X-ray analysis apparatus

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