JPH02200800A - Method for adjusting current distribution for electroplating - Google Patents
Method for adjusting current distribution for electroplatingInfo
- Publication number
- JPH02200800A JPH02200800A JP2061989A JP2061989A JPH02200800A JP H02200800 A JPH02200800 A JP H02200800A JP 2061989 A JP2061989 A JP 2061989A JP 2061989 A JP2061989 A JP 2061989A JP H02200800 A JPH02200800 A JP H02200800A
- Authority
- JP
- Japan
- Prior art keywords
- anode
- plated
- plating
- current
- current distribution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000009826 distribution Methods 0.000 title claims abstract description 28
- 238000000034 method Methods 0.000 title claims description 15
- 238000009713 electroplating Methods 0.000 title claims description 11
- 238000007747 plating Methods 0.000 claims abstract description 51
- 239000002131 composite material Substances 0.000 claims description 17
- 239000000758 substrate Substances 0.000 abstract description 14
- 239000007788 liquid Substances 0.000 abstract description 3
- 239000000243 solution Substances 0.000 description 10
- 239000010408 film Substances 0.000 description 6
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 5
- 238000000151 deposition Methods 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000008151 electrolyte solution Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000000638 solvent extraction Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
Landscapes
- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、電気めっきにおけるめっきi厚分布均一化の
為のめっき電流分布調節に関するもので、特に微細パタ
ーン選択電気めっき工法における、複数の個別に電流値
設定可能な小陽極の組機木を用いて行うめっき電流分布
調節方法に関する。[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to adjustment of plating current distribution for uniformity of plating thickness distribution in electroplating, and particularly in fine pattern selective electroplating method. This invention relates to a plating current distribution adjustment method using a small anode assembling machine whose current value can be set.
従来、電気めっきにおけるめっき膜厚分布の均一化は、
一般に電流が集中する(即ちめっき膜の厚くなる〉めっ
きエリア周囲部分に、電流集中を緩和する補助陰極や遮
蔽板を設ける方法によって行われていた4そして高度に
均一なめっき、投原を必要とするLSI搭載用等の高密
度配線基板を、選択電気めっき工法により製造する場合
においてら、めっきのエリアの周囲部分と中央部分のめ
っき膜厚差の改善を主目的としな、めっきエリア全体を
巨視的に捉えた電流分布調節方法が行われていた。Conventionally, the uniformity of plating film thickness distribution in electroplating is
Generally, this was done by installing an auxiliary cathode or shielding plate around the plating area where the current concentrates (that is, the plating film becomes thicker) to alleviate the current concentration. When manufacturing high-density wiring boards, such as those for mounting LSIs, using the selective electroplating method, the entire plating area is viewed macroscopically with the main purpose of improving the difference in plating film thickness between the periphery and the center of the plating area. A current distribution adjustment method that takes into account the
上述した従来の電流分布調節方法は、めっきエリア全体
について巨視的に捉え電流分布を調節しようとしている
ので、年々微細高密度化しさらに大型化するLSI搭載
用等の高密度配線基板を、選択電気めっき法により製造
する場合においては、めっきエリア内の配線パターンの
濃淡(即ちめっきエリアを小面積に区切って見た場合に
、各製品毎に固有の、設計ルールが許す最大限度いっば
いまで高密度に配線が有る部分や、反対にほとんど配線
の無い部分等があること)によって発生する、めっき電
流の局所的分配不f4.(即ちめっき膜厚の不均一)を
解決できないという欠点が有った。また補助陰極や遮蔽
板を、小区分しなめっきエリア毎にS流分布を調節でき
るように改良することは、被めっき物毎にそれらを交換
しなければならない欠点が有り、さらに電流分布を調節
する効果を充分発揮させるために、それらを被めっき物
に極めて接近させなければならず、めっき液の循環不良
によるメツキ析出不良が発生する欠点が有った。The conventional current distribution adjustment method described above attempts to adjust the current distribution by considering the entire plating area macroscopically, so it is difficult to selectively electroplat When manufacturing by the method, the density of the wiring pattern within the plating area (i.e., when the plating area is divided into small areas, the density is as high as the maximum allowed by the design rules unique to each product). Local distribution of plating current caused by areas with wiring and areas with almost no wiring f4. (i.e., non-uniformity of plating film thickness) cannot be solved. In addition, improving the auxiliary cathode and shielding plate so that the S flow distribution can be adjusted for each subdivided plating area has the disadvantage that they must be replaced for each object to be plated, and the current distribution can also be adjusted. In order to exhibit their full effect, they must be brought very close to the object to be plated, which has the disadvantage of causing poor plating deposition due to poor circulation of the plating solution.
本発明の目的は前記課題を解決した電気めっきの電流分
布調節方法を提供することにある。An object of the present invention is to provide a method for adjusting current distribution in electroplating that solves the above problems.
前記目的を達成するため、本発明の電気めっき電流分布
調節方法は、個々に所望の電流値設定可能な小陽極を少
なくとも2つ以上組み合せ組織した複合陽極を、被めっ
き面に対向して配置し、かつ個々の小陽極の電流を適性
に調節することによって、被めっきエリアのめつき電流
分布を調整するものである。In order to achieve the above object, the method for adjusting electroplating current distribution of the present invention includes disposing a composite anode, which is a combination of at least two small anodes each of which can individually set a desired current value, facing the surface to be plated. , and by appropriately adjusting the current of each small anode, the plating current distribution in the area to be plated is adjusted.
次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明の一実施例の電気めっき電流分布調節方
法に用いた複合陽極の正面図である0本実施例では16
個の小陽極1を組み合せ四角形の複合陽極としているが
、本発明の範囲はそれに限定するものでないことは熱論
である0図中、3は陽極フレーム、4は陽極リード線で
ある。FIG. 1 is a front view of a composite anode used in an electroplating current distribution adjustment method according to an embodiment of the present invention.
Although the small anodes 1 are combined to form a rectangular composite anode, it is a matter of course that the scope of the present invention is not limited thereto. In the figure, 3 is an anode frame and 4 is an anode lead wire.
第2図は第1図の縦断面図である。小陽極1は例えば白
金めっきチタンメツシュ等で製作した網状の陽極板であ
る。陽極枠2は例えば耐熱性塩化ビニル等で製作した、
16分割の仕切りを有する蓋及び底のない枠である。小
陽極1は陽極枠2に取り付は固定され、更に電気的に各
々絶縁されている。陽極フレーム3は例えば耐熱性塩化
ビニル等で製作した、陽極枠2をめっき槽等に取り付け
るための支持具である。陽極リード線4は例えば白金め
つきチタンワイヤーに樹脂コーティングした電線であり
、小陽極1個々に接続され陽極フレーム3を貫通し外部
に引き出される。FIG. 2 is a longitudinal sectional view of FIG. 1. The small anode 1 is a net-like anode plate made of, for example, platinum-plated titanium mesh. The anode frame 2 is made of heat-resistant vinyl chloride, for example.
It is a lid with 16 partitions and a frame without a bottom. The small anodes 1 are fixedly attached to the anode frame 2, and further electrically insulated from each other. The anode frame 3 is a support for attaching the anode frame 2 to a plating tank or the like, and is made of, for example, heat-resistant vinyl chloride. The anode lead wire 4 is, for example, a platinum-plated titanium wire coated with a resin, and is connected to each of the small anodes 1, penetrates the anode frame 3, and is drawn out.
第3図は本発明の電流分布調節方法を採用した電気めっ
き装置の一実施例の複合陽極作用説明用の縦断面図であ
る。複合111fi5は前記第1図及び第2図で説明し
た本発明による陽極である。めっき電源6は小陽極1の
数に対応したチャネル数を持つめっき電流の供給源であ
る。+給電線7はめつき電源6のプラス側各チャネルを
、小陽極1から各々引き出された陽極リード線4に接続
するリード線である。尚、第3図では緊雑になるので1
本の十給電線7を示し、他は省略した。−給電母線8は
めっき電源6のマイナス側を一括し被めっき基板側に接
続するリード線である。陰極端子っは被めっき基板11
に良好な電気的接触を行うための端子である。被めっき
面10は本発明の電流分布調節方法を用いてめっきする
部分である。被めっき基板11は被めっき面10を有す
る部品である。尚、第4図及び第5図で更に詳細を説明
する。ホルダー12は被めっき基板11を複合陽極5に
対し適正な位置に保持するための治具である。めっき液
13は被めっき面10に所定のめっき膜を析出させるた
めの電解液である。めっき[14はサービスタンク、め
っき液Wi環配管及びめっきチャンバーから成る電気め
っき装置本体である。ポンプ15はめつき液を循環させ
るためのポンプである。FIG. 3 is a longitudinal cross-sectional view for explaining the action of a composite anode of an embodiment of an electroplating apparatus employing the current distribution adjustment method of the present invention. Composite 111fi5 is the anode according to the invention described in FIGS. 1 and 2 above. The plating power source 6 is a plating current supply source having the number of channels corresponding to the number of small anodes 1. The + power supply line 7 is a lead wire that connects each positive side channel of the plating power supply 6 to the anode lead wire 4 drawn out from the small anode 1, respectively. In addition, in Figure 3, it becomes complicated, so 1
The ten feeder lines 7 of the book are shown, and the others are omitted. - The power supply bus 8 is a lead wire that collectively connects the negative side of the plating power source 6 to the substrate to be plated. The cathode terminal is plated on the substrate 11
A terminal for making good electrical contact with the terminal. The surface to be plated 10 is a part to be plated using the current distribution adjustment method of the present invention. The substrate 11 to be plated is a component having a surface 10 to be plated. Further details will be explained with reference to FIGS. 4 and 5. The holder 12 is a jig for holding the substrate 11 to be plated in an appropriate position relative to the composite anode 5. The plating solution 13 is an electrolytic solution for depositing a predetermined plating film on the surface 10 to be plated. Plating [14 is an electroplating apparatus main body consisting of a service tank, a plating solution Wi ring pipe, and a plating chamber. Pump 15 is a pump for circulating plating liquid.
次にその作用を説明する。まず、めっき液の循環経路に
ついて説明する。めっき液13はポンプ15によって循
環配管を矢印の方向に流れ複合陽極5に達する。複合陽
&i5に組み込まれている小陽極1は網状であるので、
めっき液13は小陽極1に接触しながら複合陽極5を通
過しさらに上昇し、被めっき面10に接触する。被めっ
き而10に達しためっき液13は被めっき基板11とホ
ルダー12の隙間から溢れ出て下部のサービスタンクに
戻る4次に、めっき電流の流れを説明する。めっき電源
6から十給電117を通じて各々の小陽極1に送られた
電流は、めっき液13を通じて被めっき而10に送られ
る。さらに陰極端子9に集められ、−給電母線8を通じ
てめっき電源6に戻る0次に電流分布調節方法について
説明する。各々適性に設定された小陽極1に供給された
電流は、はとんど全部が被めっき而10に向かって流れ
出す、ポンプ15側に向かう電流は無視できる。小陽極
1から流れ出た電流は複合陽ai5の内部を進む間、陽
極枠2によってお互いに絶縁されているため、設定値に
保たれている。複合陽極5から出た電流は陽極枠2の仕
切り効果が無くなるため、お互いに混じり合い、被めっ
き而10と複合陽極5とホルダー12とで形成される空
間形状によって決定される電流分布になっていくが、単
一の陽極から放出された電流分布とは違った、良く個々
の小陽極1の電流設定値を反映した電流分布とすること
ができる。従って、本発明の電流分布調節方法にとって
、複合111[i5は上面と被めっき而10の距離は重
要な意味をらち、本実施例では100 m以下の距離で
有効な電流調節の効果が得られた。Next, its effect will be explained. First, the circulation path of the plating solution will be explained. The plating solution 13 flows through the circulation pipe in the direction of the arrow by the pump 15 and reaches the composite anode 5 . Since the small anode 1 incorporated in the composite anode &i5 is reticulated,
The plating solution 13 passes through the composite anode 5 while contacting the small anode 1, rises further, and contacts the surface to be plated 10. The plating solution 13 that has reached the substrate 10 to be plated overflows from the gap between the substrate 11 to be plated and the holder 12 and returns to the service tank below.4 Next, the flow of plating current will be explained. The current sent from the plating power source 6 to each small anode 1 through the power supply 117 is sent to the plated object 10 through the plating solution 13. Furthermore, a method for adjusting the zero-order current distribution that is collected at the cathode terminal 9 and returned to the plating power source 6 through the -power supply bus 8 will be described. Almost all of the current supplied to the appropriately set small anodes 1 flows toward the plating target 10, and the current flowing toward the pump 15 can be ignored. The current flowing out from the small anode 1 is kept at a set value because it is insulated from each other by the anode frame 2 while it travels inside the composite anode ai5. The current emitted from the composite anode 5 no longer has the partitioning effect of the anode frame 2, so they mix with each other, resulting in a current distribution determined by the spatial shape formed by the plated object 10, the composite anode 5, and the holder 12. However, it is possible to obtain a current distribution that reflects the current setting value of each small anode 1, which is different from the current distribution emitted from a single anode. Therefore, for the current distribution adjustment method of the present invention, the distance between the composite 111 [i5 and the plated surface 10 has an important meaning, and in this example, an effective current adjustment effect can be obtained at a distance of 100 m or less. Ta.
第4図は被めっき基板11の説明正面図である。FIG. 4 is an explanatory front view of the substrate 11 to be plated.
めっきパターン16は配線として形成するためめっきを
析出させる部分であり、被めっき基板11 、にに(社
)在している。The plating pattern 16 is a part on which plating is deposited to form a wiring, and is located on the substrate 11 to be plated.
第5図は被めっき基板11の断面説明図である。FIG. 5 is an explanatory cross-sectional view of the substrate 11 to be plated.
電極薄膜17は例えばスパッタリング等によって形成す
るめ−)き電極となる金属薄膜である。絶縁基板18は
高密度配線基板のベースとなる基板である・スルーホー
ル19は外部出力等のための絶縁基板18を貫通する導
体である。めっきレジスト20は選択めっきを行うため
のコーテイング膜であり、フォトリソグラフィ等により
配線パターンが描かれる。The electrode thin film 17 is a metal thin film that becomes a plated electrode formed by, for example, sputtering or the like. The insulating substrate 18 is a base board of a high-density wiring board.Through holes 19 are conductors that pass through the insulating substrate 18 for external output and the like. The plating resist 20 is a coating film for performing selective plating, and a wiring pattern is drawn by photolithography or the like.
以上説明したように本発明は、個々に所望の電流値設定
可能な小陽極を少なくとも2つ以上組み合せ組織した複
合陽極を、被めっき面に対向して配置し、かつ個々の小
陽極の電流を適性に調節することにより、めっき液の循
環不足によるめっき析出不良を発生することなく、しか
も作業の容易な電流値の設定変更によって、小区分した
め−)きエリア毎に電流分布を調節できる効果が有る。As explained above, the present invention has a composite anode in which at least two small anodes, each of which can be individually set to a desired current value, are combined and arranged to face a surface to be plated, and the current of each small anode is controlled. By appropriately adjusting the current distribution, it is possible to adjust the current distribution for each subdivided area by changing the current value setting, which is easy to do, without causing plating deposition defects due to insufficient circulation of the plating solution. There is.
第1図は本発明の複合陽極の正面図、第2図は第1図の
A−A線断面図、第3図は本発明による複合陽極による
電流分布調節作用説明断面図、第4図は被めっき基板説
明図、第5図は被めっき基板断面の説明図である。
1・・・小陽極
3・・・陽極フレーム
5・・・複合陽極
7・・・十給電線
9 ・・・ # % @ 二f−
11・・・被めっき基板
13・・・めっき液
15・・・ボンフ。
17・・・電極薄膜
19・・・スルーホールFIG. 1 is a front view of the composite anode of the present invention, FIG. 2 is a sectional view taken along the line A-A in FIG. FIG. 5 is an explanatory diagram of a cross section of the substrate to be plated. 1...Small anode 3...Anode frame 5...Composite anode 7...Ten power supply lines 9...#%@2f- 11...Substrate to be plated 13...Plating solution 15. ... Bonfu. 17... Electrode thin film 19... Through hole
Claims (1)
も2つ以上組み合せ組織した複合陽極を、被めっき面に
対向して配置し、かつ個々の小陽極の電流を適性に調節
することによって、被めっきエリアのめっき電流分布を
調整することを特徴とする電気めっきの電流分布調節方
法。(1) By arranging a composite anode in which at least two or more small anodes, each of which can be individually set to a desired current value, face the surface to be plated, and appropriately adjusting the current of each small anode. , a method for adjusting current distribution in electroplating, which comprises adjusting the plating current distribution in an area to be plated.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1020619A JPH073000B2 (en) | 1989-01-30 | 1989-01-30 | Electroplating equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1020619A JPH073000B2 (en) | 1989-01-30 | 1989-01-30 | Electroplating equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02200800A true JPH02200800A (en) | 1990-08-09 |
| JPH073000B2 JPH073000B2 (en) | 1995-01-18 |
Family
ID=12032261
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1020619A Expired - Lifetime JPH073000B2 (en) | 1989-01-30 | 1989-01-30 | Electroplating equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH073000B2 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0499899A (en) * | 1990-08-15 | 1992-03-31 | Arumetsukusu:Kk | Plating device |
| JP2008019501A (en) * | 2006-06-14 | 2008-01-31 | Electroplating Eng Of Japan Co | Wafer plating method |
| US7794573B2 (en) | 2003-12-05 | 2010-09-14 | Semitool, Inc. | Systems and methods for electrochemically processing microfeature workpieces |
| JP2017115221A (en) * | 2015-12-25 | 2017-06-29 | 住友電工プリントサーキット株式会社 | Printed wiring board plating apparatus and printed wiring board manufacturing method |
| WO2025057488A1 (en) * | 2023-09-14 | 2025-03-20 | 株式会社Screenホールディングス | Plating apparatus and plating method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6235029U (en) * | 1985-08-20 | 1987-03-02 | ||
| JPS63259098A (en) * | 1987-04-15 | 1988-10-26 | Sumitomo Metal Ind Ltd | Plating current control method for continuous electroplating equipment |
| JPH0270099A (en) * | 1988-09-05 | 1990-03-08 | Sumitomo Metal Ind Ltd | Method and apparatus for electroplating |
-
1989
- 1989-01-30 JP JP1020619A patent/JPH073000B2/en not_active Expired - Lifetime
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6235029U (en) * | 1985-08-20 | 1987-03-02 | ||
| JPS63259098A (en) * | 1987-04-15 | 1988-10-26 | Sumitomo Metal Ind Ltd | Plating current control method for continuous electroplating equipment |
| JPH0270099A (en) * | 1988-09-05 | 1990-03-08 | Sumitomo Metal Ind Ltd | Method and apparatus for electroplating |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0499899A (en) * | 1990-08-15 | 1992-03-31 | Arumetsukusu:Kk | Plating device |
| US7794573B2 (en) | 2003-12-05 | 2010-09-14 | Semitool, Inc. | Systems and methods for electrochemically processing microfeature workpieces |
| JP2008019501A (en) * | 2006-06-14 | 2008-01-31 | Electroplating Eng Of Japan Co | Wafer plating method |
| JP2017115221A (en) * | 2015-12-25 | 2017-06-29 | 住友電工プリントサーキット株式会社 | Printed wiring board plating apparatus and printed wiring board manufacturing method |
| WO2025057488A1 (en) * | 2023-09-14 | 2025-03-20 | 株式会社Screenホールディングス | Plating apparatus and plating method |
| JP2025042227A (en) * | 2023-09-14 | 2025-03-27 | 株式会社Screenホールディングス | Plating apparatus and plating method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH073000B2 (en) | 1995-01-18 |
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