JPH0220844Y2 - - Google Patents
Info
- Publication number
- JPH0220844Y2 JPH0220844Y2 JP1983028837U JP2883783U JPH0220844Y2 JP H0220844 Y2 JPH0220844 Y2 JP H0220844Y2 JP 1983028837 U JP1983028837 U JP 1983028837U JP 2883783 U JP2883783 U JP 2883783U JP H0220844 Y2 JPH0220844 Y2 JP H0220844Y2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- package
- housing
- socket
- elastic arm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Connecting Device With Holders (AREA)
Description
【考案の詳細な説明】
本考案はICパツケージのICリードをICソケツ
トのコンタクトの上に載せ、コンタクトを下方に
弾性偏位させながらその復元力でICリードとの
圧接を得るようにしたICソケツトに関する。[Detailed description of the invention] This invention is an IC socket in which the IC lead of the IC package is placed on the contact of the IC socket, and the contact is elastically deflected downward, and the restoring force is used to create pressure contact with the IC lead. Regarding.
従来よりICパツケージとして底面端部に導電
箔を並列配置したICの外部接点としたICパツケ
ージ、若しくは側方へICリードを並列突出させ
ICの外部接点としたICパツケージが知られてい
る。 Traditionally, IC packages have been used as external contacts for the IC, with conductive foil arranged in parallel on the bottom edge, or with IC leads protruding in parallel to the sides.
An IC package is known as an external contact of an IC.
上記二者のICパツケージ用ICソケツトの接触
形態を例示すれば第6図に示す如くである。図に
略示するようにソケツト基盤1に植付けられた
IC接触用コンタクト3に略横U字形に曲げられ
た接触片3aを具備させ、該接触片3aをソケツ
ト基盤1上面側へ配し、該接触片の自由端部に各
ICパツケージICの例えばIC接点(導電箔)2を
載接してICパツケージ全体を支え、更にICパツ
ケージICを例えばソケツト基盤1に付属させた
IC押さえカバー等で下方力Fを与え押さえつけ
ることにより、上記接触片3aを下方へ弾性偏位
させ、その復元力でIC接点2との圧接を得るよ
うになつている。図中4は基盤1を貫いて下方へ
突出されたコンタクト3のプリント基盤接続ピン
である。 An example of the contact form of the above-mentioned two IC sockets for IC packages is as shown in FIG. planted in the socket base 1 as schematically shown in the figure.
The IC contact 3 is provided with a contact piece 3a bent into a substantially horizontal U-shape, and the contact piece 3a is arranged on the upper surface side of the socket base 1.
For example, IC contacts (conductive foil) 2 of the IC package IC are mounted to support the entire IC package, and the IC package IC is attached to, for example, the socket base 1.
By applying a downward force F using an IC pressing cover or the like to press down the contact piece 3a, the contact piece 3a is elastically deflected downward, and its restoring force is used to press the IC contact 2. In the figure, reference numeral 4 denotes a printed board connection pin of the contact 3 which penetrates the board 1 and projects downward.
上記のように、従来のICソケツトはソケツト
基盤上面側に配したコンタクトでICパツケージ
全体を支えながら、ICパツケージのボデイを浮
かした状態でIC接点との接触が得られるように
なつているのであるが、この方式ではICパツケ
ージを自由に浮沈させて追随的にコンタクト3を
弾性偏位させることができる反面、コンタクト3
の負担が大きく、殊にICパツケージICの厚みに
は公差があるので、同一種のICパツケージでも
その厚みの変化によつてコンタクト3の弾性偏位
量に変化を来たし、常に一定の接触圧が得られな
い欠点があり、又ICパツケージICの公差の他、
押さえ機構やコンタクト自身の製作誤差等によつ
て曲げ偏位量が大きくなるとコンタクト3の接触
片3aの曲げ支点に無用の負荷をかけ、これを繰
り返すと同曲げ支点より永久変形したり、折損を
生ずることがある。斯かる現象はコンタクト3の
微細化に伴い益々助長される。又IC接点2とコ
ンタクト3の接触保持にはICパツケージICに下
方力Fを与えることが必須となるが、例えば所定
の接触圧を得るのに1ピン当り100gの押さえ力
が必要であるとすると40ピンでは4Kgの下方力が
必要となり、これに上記弾性偏位量の増加による
力が加算されると、IC押さえカバー類の操作に
過大な負担がかかり、これを頻繁に行う作業員の
疲労助長の原因となつている。 As mentioned above, conventional IC sockets support the entire IC package with contacts placed on the top surface of the socket base, and are designed so that contact with the IC contacts can be made with the body of the IC package floating. However, with this method, the IC package can float freely and the contact 3 can be elastically deflected, but the contact 3
In particular, since there is a tolerance in the thickness of the IC package IC, the amount of elastic deflection of the contact 3 will change due to changes in the thickness of the IC package of the same type, and the contact pressure will always be constant. In addition to the tolerance of IC package IC,
If the amount of bending deviation increases due to manufacturing errors in the holding mechanism or the contact itself, an unnecessary load will be applied to the bending fulcrum of the contact piece 3a of the contact 3, and if this is repeated, the bending fulcrum may be permanently deformed or broken. This may occur. Such a phenomenon is further promoted as the contact 3 becomes finer. Also, in order to maintain contact between IC contacts 2 and 3, it is essential to apply a downward force F to the IC package IC, but for example, if a pressing force of 100 g is required per pin to obtain a specified contact pressure. For 40 pins, a downward force of 4 kg is required, and when the force due to the increase in elastic deflection mentioned above is added to this, it places an excessive burden on the operation of the IC holding covers, causing fatigue for workers who frequently do this. It is the cause of promotion.
本考案はこれらの欠点を改善すべく創案された
ものであり、第1図以降はその実施例を示す。以
下本考案を同図に基づいて詳述する。 The present invention was devised to improve these drawbacks, and FIG. 1 and subsequent figures show examples thereof. The present invention will be explained in detail below based on the same figure.
図において、10はICソケツトを構成する基
盤を示す。該基盤10はその略中央部にICパツ
ケージ収容空部11を備える。該ICパツケージ
収容空部11はICパツケージICの外形と同形の
方形を呈し、基盤上面側から同パツケージICを
受け入れ、ICパツケージICの接点が導電箔で突
出リードがない場合にはその四辺にてICパツケ
ージICの四辺を規制し殆んどガタなくこれを収
嵌する大きさを有する。即ちICパツケージ収容
空部11を画成する内壁はICパツケージの位置
規制作用を有し、これによつてICパツケージIC
の接点2と後記するコンタクトとの一対一対応を
図る。 In the figure, numeral 10 indicates a base that constitutes an IC socket. The base 10 has an IC package accommodating cavity 11 approximately in the center thereof. The IC package housing space 11 has a rectangular shape with the same shape as the outer shape of the IC package IC, and receives the package IC from the top side of the board.If the contacts of the IC package IC are conductive foil and there are no protruding leads, the IC package housing space 11 is rectangular in shape and has the same shape as the outer shape of the IC package IC. The IC package has a size that regulates the four sides of the IC and accommodates it with almost no looseness. That is, the inner wall defining the IC package accommodation space 11 has a position regulating function for the IC package, thereby preventing the IC package from being placed.
A one-to-one correspondence is established between the contact point 2 and the contact described later.
上記ICパツケージ収容空部11の底部にはIC
支持壁12を設ける。該IC支持壁12は図示の
如くIC収容空部11の四辺からICパツケージIC
の底面と平行に張出された額縁状底板によつて構
成され、中央部に放熱口13を形成する。同支持
壁12は図示の例の他、IC収容空部11の各コ
ーナー部又は各辺から部分的に突設した支持片に
よつて構成しても良い。 The bottom of the IC package housing space 11 is equipped with an IC.
A support wall 12 is provided. The IC support wall 12 extends from the four sides of the IC housing cavity 11 to the IC package IC as shown in the figure.
It is composed of a frame-shaped bottom plate extending parallel to the bottom surface of the frame, and a heat dissipation port 13 is formed in the center. In addition to the example shown in the drawings, the support wall 12 may be constructed of support pieces partially protruding from each corner or each side of the IC housing cavity 11.
更に上記ソケツト基盤10の底面、即ち上記
IC収容空部11を画成する基盤部底面にコンタ
クト収容溝14を横並列で設ける。該コンタクト
収容溝14は図示の如くIC収容空部11の周域
にその四辺と直角となるように並成するか、IC
パツケージICの接点配列に応じ、その二辺又は
三辺に並成し、その端部をIC収容空部11で開
放させる。図中14aは該開放部を示す。 Furthermore, the bottom surface of the socket base 10, that is, the
Contact accommodating grooves 14 are provided horizontally in parallel on the bottom surface of the base portion defining the IC accommodating cavity 11. The contact accommodating grooves 14 are arranged around the IC accommodating cavity 11 at right angles to its four sides as shown in the figure, or
Depending on the arrangement of the contacts of the package IC, they are arranged on two or three sides of the package IC, and the ends thereof are opened in the IC accommodation space 11. In the figure, 14a indicates the opening.
更に上記コンタクト収容溝14にはIC接触用
コンタクト15を配設する。該コンタクト15は
上方に向け起立された植込脚15aを有し、該植
込脚15aをコンタクト収容溝14の上底壁に予
め穿けられた孔に強制圧挿する等して強固に植付
けする。 Furthermore, an IC contact 15 is provided in the contact receiving groove 14. The contact 15 has an implanted leg 15a erected upward, and the implanted leg 15a is forcefully inserted into a hole pre-drilled in the upper bottom wall of the contact housing groove 14 to firmly implant it. .
コンタクト15は上記植込脚15aの下端に連
設されたIC接点接触用の弾性アーム15bとプ
リント基盤等への接続アーム15cとを有する。
IC接点接触用の弾性アーム15bはIC収容溝1
4内に沿いIC収容空部11に向け延ばされ、そ
の自由端部15dを上記IC収容溝端部の開放部
14aからIC収容空部11内に臨ませ、同自由
端部15dに図示の如き上反り端部15d′を形成
するか、又は上向き突起を形成して、これを上記
IC支持壁12の上位へ突出させる。 The contact 15 has an elastic arm 15b for contacting an IC contact, which is connected to the lower end of the implant leg 15a, and an arm 15c for connecting to a printed circuit board or the like.
The elastic arm 15b for IC contact contact is in the IC accommodation groove 1.
4 toward the IC housing cavity 11, and its free end 15d faces into the IC housing cavity 11 from the open part 14a at the end of the IC housing groove, and the free end 15d has a shape as shown in the figure. Form an upwardly curved end 15d' or form an upwardly directed protrusion, and
It is made to protrude above the IC support wall 12.
IC支持壁12には該弾性アーム自由端部15
dの突出を許容する孔12aを並列開穿し、IC
パツケージICの底面端部を支えた位置で同所に
配したIC接点2とコンタクト15との接触を図
る。 The IC supporting wall 12 has a free end portion 15 of the elastic arm.
Holes 12a that allow the protrusion of d are drilled in parallel, and the IC
At a position that supports the bottom end of the package IC, contact is made between the IC contact 2 and the contact 15 arranged at the same location.
又上記において、好ましくは上記弾性アーム1
5bを植込脚15aから略直角に曲げ、収容溝1
4の上底壁に添接支持させつつ、溝に沿い延ば
し、その端部を上記の如くIC収容空部11内に
臨ませる。 Further, in the above, preferably the elastic arm 1
5b at a substantially right angle from the implantation leg 15a, and
It extends along the groove while being attached and supported by the upper bottom wall of IC 4, with its end facing into the IC housing cavity 11 as described above.
上記によつて弾性アーム15bは植込脚15a
との連設点を支点として下方への弾性偏位作用が
付与される。植込脚15aの植付位置を図示の如
くIC収容空部11からなるべく離れた位置にと
る等して位置を設定すればアーム15bの長さを
より長くし弾性偏位を支点に負担をかけずより柔
軟に行わせることができる。 As a result of the above, the elastic arm 15b is connected to the implantable leg 15a.
A downward elastic deflection action is applied using the connection point as a fulcrum. If the planting position of the implantation leg 15a is set as far away from the IC storage cavity 11 as possible as shown in the figure, the length of the arm 15b will be made longer and the elastic deflection will be used as a fulcrum. This can be done more flexibly than before.
他方上記プリント基盤接続アーム15cは植込
脚15aの下端から上記弾性アーム15bと反対
方向に曲げ出し、コンタクト収容溝14他端から
側方へ突出させる。このプリント基盤接続アーム
15cは用途に応じ基盤下方へ垂直に突出させて
も良い。 On the other hand, the printed circuit board connecting arm 15c is bent from the lower end of the implant leg 15a in the opposite direction to the elastic arm 15b, and is caused to protrude laterally from the other end of the contact receiving groove 14. This printed board connecting arm 15c may be made to protrude vertically below the board depending on the application.
図において16はIC押さえ用の弾性帯掛板を
示す。該帯掛板16は中央部を下方に反り曲げて
IC押さえ部16cを形成し、一端に略L形の係
合舌片16aを、他端にフツク片16bを備え
る。他方ソケツト基盤10の上面にIC収容空部
11を対角線に横切る(従つてICパツケージIC
を対角線に横切る)帯状溝17を形成し、該帯状
溝17の一端を基盤端部で開放させ、他端に基盤
を貫通する係合窓18を穿け、該係合窓18に上
記帯掛板16一端の係合舌片16aを差し込みつ
つその窓縁に係合させると共に、他端フツク片1
6bを基盤端部に掛止めし、よつてIC押さえ部
16c下に存在するICパツケージICの上面をそ
の対角線上で弾性的に押さえ込む構成とする。 In the figure, 16 indicates an elastic band hanging plate for holding the IC. The belt hanging plate 16 is bent downward at the center.
An IC holding portion 16c is formed, and has a substantially L-shaped engagement tongue piece 16a at one end and a hook piece 16b at the other end. On the other hand, the IC accommodating space 11 is diagonally crossed on the upper surface of the socket base 10 (therefore, the IC package IC
A belt-shaped groove 17 (crossing diagonally across the base) is formed, one end of the belt-shaped groove 17 is opened at the end of the base, and an engagement window 18 passing through the base is bored at the other end, and the above-mentioned strap hanging plate is formed in the engagement window 18. 16 While inserting the engaging tongue piece 16a at one end and engaging it with the window edge, the hook piece 1 at the other end is inserted.
6b is latched to the end of the base, thereby elastically pressing down the upper surface of the IC package IC existing under the IC holding part 16c on its diagonal.
即ち、帯掛板16はその下反り部で形成された
IC押さえ部16cを有するので、先ずこのIC押
さえ部16cがICパツケージICの上面に当接し、
該当接下でフツク片16bを下方へ弾性に抗しつ
つ押し下げ上記基盤10へ掛止めすれば、ICパ
ツケージICは押さえ部16cの弾性押圧作用で
支持壁12に着座状態となつてIC収容空部11
内に確固に保持され、コンタクト15との圧接が
図られる。 That is, the obi hanging plate 16 is formed by its downward curvature.
Since it has an IC holding part 16c, first this IC holding part 16c comes into contact with the top surface of the IC package IC,
When the hook piece 16b is pushed down while resisting elasticity and hooked onto the base 10, the IC package IC will be seated on the support wall 12 by the elastic pressing action of the holding part 16c, and the IC housing cavity will be seated. 11
The contact 15 is firmly held within the contact 15, and is pressed into contact with the contact 15.
即ち、ICパツケージICをIC収容空部11へ収
嵌すればIC接点2は先ず、第3図A図に示す如
くIC支持壁12の上位へ突出された弾性アーム
15bの自由端15dへ載接され、引き続きこれ
を上記弾性帯掛板16又は既知の押さえカバーの
如きIC押さえ手段で押さえ込み下方力Fを付与
すれば弾性アーム15bは第3図B図及び第4図
に示す如く下方へ弾性偏位され、弾性アーム15
bの自由端部15dがIC支持壁12の上面より
下へ偏位され、且つICパツケージICの底面がIC
支持壁12へ着座した状態でコンタクト15の弾
性アーム15bとIC接点2との圧接が完了する。 That is, when the IC package IC is fitted into the IC housing cavity 11, the IC contact 2 is first placed on the free end 15d of the elastic arm 15b that protrudes upward from the IC support wall 12, as shown in FIG. 3A. Then, by pressing the IC pressing means such as the elastic band hanging plate 16 or a known pressing cover and applying a downward force F, the elastic arm 15b is elastically biased downward as shown in FIGS. 3B and 4. elastic arm 15
The free end portion 15d of b is offset below the top surface of the IC support wall 12, and the bottom surface of the IC package IC is
The pressure contact between the elastic arm 15b of the contact 15 and the IC contact 2 is completed while the contact 15 is seated on the support wall 12.
上記によれば、コンタクト15の弾性アーム1
5bの弾性偏位量は常に一定である。弾性偏位量
が一定であるからIC接点2とコンタクト15と
の接触圧も常に均一で高信頼の接触が得られる。
又弾性アーム15bを過偏位させることがないか
ら、曲げ支点に無理な負担がかからず、同アーム
15bの変形や折損も未然に防止できる。 According to the above, the elastic arm 1 of the contact 15
The amount of elastic deflection of 5b is always constant. Since the amount of elastic deflection is constant, the contact pressure between the IC contact 2 and the contact 15 is always uniform, and highly reliable contact can be obtained.
In addition, since the elastic arm 15b is not excessively deflected, no excessive load is placed on the bending fulcrum, and deformation or breakage of the arm 15b can be prevented.
加えて接触圧及び偏位量が一定であるから過大
な押さえ力を要することがなく、IC押さえカバ
ーや例示した帯掛板等のIC押さえ手段の閉合、
ロツク作業に負担がかからず、作業員の疲労を助
長させることがない。 In addition, since the contact pressure and deviation amount are constant, there is no need for excessive holding force, and it is possible to close the IC holding means such as the IC holding cover or the exemplified band hanging plate.
There is no burden on the locking work, and there is no increase in worker fatigue.
又弾性アーム15bは第6図に示した従来の接
触片に比べ厚み方向に崇高とならず、ソケツトの
薄形化、軽量化に寄与する等の利点がある。又コ
ンタクト14をソケツト基盤10の裏面へ並列配
置することによつて上面におけるIC押さえ手段
の設置のための設計が容易となり、プリント基盤
実装時に誤まつて短絡を発生させたり、損傷させ
たりすることもなくなる。又本考案に係るICソ
ケツトはプリント基盤等に搭載した時、コンタク
ト14の弾性アーム15bがソケツト基盤10底
面のコンタクト収容溝14内に収容された状態で
同基盤10底面とプリント基盤間に隠蔽された状
態に置かれ、外的要因による変形等から良好に保
護することができる。 In addition, the elastic arm 15b is not as thick in the thickness direction as compared to the conventional contact piece shown in FIG. 6, and has the advantage of contributing to making the socket thinner and lighter. Furthermore, by arranging the contacts 14 in parallel on the back surface of the socket board 10, the design for installing the IC holding means on the top surface is facilitated, which prevents accidental short circuits or damage when mounting the printed circuit board. It also disappears. Furthermore, when the IC socket according to the present invention is mounted on a printed circuit board etc., the elastic arm 15b of the contact 14 is housed in the contact housing groove 14 on the bottom surface of the socket base 10 and is hidden between the bottom surface of the socket base 10 and the printed circuit board. It can be placed in a stable condition and can be well protected from deformation caused by external factors.
加えて第6図の従来例と第4図の本考案の実施
例との対比から理解できるように、横U字形に曲
げた接触片3aをソケツト基盤1の上面側に配
し、その上にICパツケージICを搭載し接圧を与
える従来例に比べ、本考案の場合にはICパツケ
ージICを従来接触片が占有する部位までより深
く格納することができて、略ICパツケージICの
高さに匹適する程度の高さ削減が可能となり薄形
化を助長する効果がある。 In addition, as can be understood from the comparison between the conventional example shown in FIG. 6 and the embodiment of the present invention shown in FIG. Compared to the conventional example in which the IC package IC is mounted and contact pressure is applied, in the case of the present invention, the IC package IC can be stored deeper into the area occupied by the conventional contact piece, and the height of the IC package IC can be reduced to about the height of the IC package IC. This makes it possible to reduce the height to an extent suitable for the same size as the previous model, which has the effect of promoting thinning.
尚本ICソケツトはICリードを側方へ並列突出
させたICパツケージにも実施可能である。この
場合、ICパツケージのボデイ部側面を規制する
位置決手段をIC収容空部11内へ設ける等する
と良い。 This IC socket can also be used in an IC package with IC leads protruding sideways in parallel. In this case, it is preferable to provide positioning means for regulating the side surface of the body portion of the IC package in the IC housing cavity 11.
第1図は本考案の実施例を示すICソケツト平
面図、第2図は同裏面図、第3図A図は第1図A
−A線断面図でICパツケージの収嵌状態を示し、
同B図は同断面図で収嵌されたICパツケージに
下方力を与えた状態を示し、第4図は第1図B−
B線断面図でICパツケージに弾性帯掛板で下方
力を与えた状態を示し、第5図A図は弾性帯掛板
平面図、同B図は同側面図、第6図は従来のIC
ソケツトの接触状態を概示する断面図である。
IC……ICパツケージ、2……同接点、10…
…ソケツト基盤、11……IC収容空部、12…
…IC支持壁、14……コンタクト収容溝、14
a……同開放部、15……IC接触用コンタクト、
15a……同植込脚、15b……同IC接点接触
用弾性アーム、15c……同プリント基盤等の接
続アーム、15d……同自由端部、15d′……同
自由端部の上反り端部、16……IC押さえ用の
弾性帯掛板。
Figure 1 is a plan view of an IC socket showing an embodiment of the present invention, Figure 2 is a back view of the IC socket, and Figure 3A is a diagram of Figure 1A.
- A cross-sectional view showing the fitted state of the IC package,
Figure B shows the same sectional view in which a downward force is applied to the fitted IC package, and Figure 4 shows the state shown in Figure 1B-
The cross-sectional view taken along the line B shows a state in which a downward force is applied to the IC package cage by the elastic band hanging plate. Figure 5A is a plan view of the elastic band hanging plate, Figure B is a side view of the same, and Figure 6 is a conventional IC.
FIG. 3 is a sectional view schematically showing the contact state of the socket. IC...IC package, 2...Same contact, 10...
...Socket base, 11...IC storage space, 12...
...IC support wall, 14...Contact accommodation groove, 14
a... Same open part, 15... IC contact contact,
15a... The implanted leg, 15b... The elastic arm for contacting the IC contact, 15c... The connecting arm for the printed circuit board, etc., 15d... The free end, 15d'... The curved end of the free end. Section 16...Elastic band hanging plate for holding IC.
Claims (1)
同基盤上面側から受け入れるIC収容空部を備
え、該IC収容空部の底部にICパツケージの底
面を支持するIC支持壁を設け、上記ソケツト
基盤の底面にコンタクト収容溝を横並列で設
け、該コンタクト収容溝端部を上記IC収容空
部で解放させ、該IC収容溝内上底壁にIC接触
用コンタクトを植付け、該コンタクトに該IC
収容溝内に沿い延びる弾性アームを具備させ、
該弾性アームの自由端部を上記IC収容溝端部
の解放部から上記IC収容空部に臨ませ上記IC
支持壁の上位へ突出させたことを特徴とする
ICソケツト。 (2) 上記弾性アームをコンタクト収容壁の上底壁
に添接させたことを特徴とする実用新案登録請
求の範囲第1項記載のICソケツト。[Claims for Utility Model Registration] (1) A socket base having an IC accommodating cavity approximately in the center for receiving an IC package from the top side of the base, and an IC supporting the bottom of the IC package at the bottom of the IC accommodating cavity. A support wall is provided, contact housing grooves are provided in horizontal parallel on the bottom surface of the socket base, the ends of the contact housing grooves are released in the IC housing cavity, and IC contact contacts are planted on the upper bottom wall of the IC housing groove. , the contact is connected to the IC
an elastic arm extending along the accommodation groove;
The free end of the elastic arm faces the IC housing space from the open end of the IC housing groove, and the IC
It is characterized by protruding above the supporting wall.
IC socket. (2) The IC socket according to claim 1, wherein the elastic arm is attached to the upper bottom wall of the contact housing wall.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2883783U JPS59135646U (en) | 1983-02-28 | 1983-02-28 | IC socket |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2883783U JPS59135646U (en) | 1983-02-28 | 1983-02-28 | IC socket |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59135646U JPS59135646U (en) | 1984-09-10 |
| JPH0220844Y2 true JPH0220844Y2 (en) | 1990-06-06 |
Family
ID=30159716
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2883783U Granted JPS59135646U (en) | 1983-02-28 | 1983-02-28 | IC socket |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59135646U (en) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5436382Y2 (en) * | 1975-10-07 | 1979-11-02 |
-
1983
- 1983-02-28 JP JP2883783U patent/JPS59135646U/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59135646U (en) | 1984-09-10 |
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