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JPH02107978A - Setting device of component of tester - Google Patents

Setting device of component of tester

Info

Publication number
JPH02107978A
JPH02107978A JP63260974A JP26097488A JPH02107978A JP H02107978 A JPH02107978 A JP H02107978A JP 63260974 A JP63260974 A JP 63260974A JP 26097488 A JP26097488 A JP 26097488A JP H02107978 A JPH02107978 A JP H02107978A
Authority
JP
Japan
Prior art keywords
fixed
base
clamping piece
chip component
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63260974A
Other languages
Japanese (ja)
Inventor
Akihito Kito
鬼頭 章仁
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP63260974A priority Critical patent/JPH02107978A/en
Publication of JPH02107978A publication Critical patent/JPH02107978A/en
Pending legal-status Critical Current

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  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

PURPOSE:To simplify operations for setting and removing a chip component and to enable application of a device to chip components having different dimensions and shapes by a construction wherein a fixed holding piece is fixed on the upper surface of a base block in each accommodation space. CONSTITUTION:A movable holding piece 23 faces a fixed holding piece 22 with a chip component 1 held between in each accommodation space, and it is joined to a longitudinal beam member through the intermediary of a coil spring 25. The holding piece 23 is moved in the direction of separation from the holding piece 22 by the spring 25 acting as a tension coil spring. Therefore a large space can be formed between the holding pieces 22 and 23 and the component 1 can be put on a base block so that a base having an electrode 2 formed is brought into contact with the upper surfaces of a fixed-side electrode plate 32 and a movable-side electrode plate 33 corresponding thereto. When an opening-closing cover 30 is closed, a leaf spring 31 fitted oppositely to each accommodation space presses the component 1 onto the upper surface 11A side of the base block. Accordingly, the electrode 2 of the component 1 comes into close contact with the electrode plate 32 or 33 corresponding thereto and the electrode 2 is connected to the main body of a tester through a connection wire 8.

Description

【発明の詳細な説明】 〔概要〕 コンデンサ、抵抗体等の2電極型のチップ部品の特性試
験時に使用する、試験機の部品セット装置に関し、 チップ部品の着脱作業が簡単で、且つ寸法形状が異なる
チップ部品に適用し得る部品セット装置を提供すること
を目的とし、 チップ部品を基台にセットして、電極と試験機本体とを
接続線を介して接続し、該チップ部品の特性試験を実施
するよう構成した部品セット装置であって、複数の横梁
部材と複数の縦梁部材とが直交して枡がマトリックス状
に配列し、前記基台上に装着した外枠板の角形窓内に挿
入されて、左右に摺動し得るよう装着されたスライダー
と、それぞれの該樹内で、基台上面に固定した固定挟持
駒と、該樹内を摺動可能にコイルばねを介して該横梁部
材に連結し、該枡に挿入・載置した前記チップ部品を挟
んで、該固定挟持駒に対向して装着された可動挟持駒と
、裏面側が接続線を介して前記試験機本体に接続され、
双方の表面が該基台上面に一致し、それぞれの該枡に対
応した位置で並列して該基台に固着された、固定側電極
板及び可動側電極板と、それぞれの該枡に対向して、該
角形窓を覆う開閉カバーの内側面に装着され、該開閉カ
バーを閉じた状態で該チップ部品を押圧する板ばねとで
構成する。
[Detailed Description of the Invention] [Summary] Regarding a component setting device for a testing machine used when testing the characteristics of two-electrode chip components such as capacitors and resistors, the chip components can be easily attached and detached, and the size and shape are uniform. The purpose of this device is to provide a component setting device that can be applied to different chip components.The chip component is set on a base, the electrodes and the test machine body are connected via a connecting wire, and the characteristics of the chip component are tested. A parts setting device configured to carry out the process, wherein a plurality of horizontal beam members and a plurality of vertical beam members are orthogonal to each other and the cells are arranged in a matrix, and the cells are arranged in a rectangular window of an outer frame board mounted on the base. A slider is inserted and installed so that it can slide left and right, a fixed clamping piece is fixed to the top surface of the base within each tree, and the horizontal beam is slidable inside the tree via a coil spring. A movable clamping piece connected to the member and mounted opposite to the fixed clamping piece with the chip component inserted and placed in the cell sandwiched therebetween, and a movable clamping piece mounted opposite to the fixed clamping piece, and a back side connected to the testing machine main body via a connecting wire. ,
A fixed side electrode plate and a movable side electrode plate, both surfaces of which are aligned with the top surface of the base and are fixed to the base in parallel at positions corresponding to the respective squares, and facing the respective squares. and a leaf spring that is attached to the inner surface of the opening/closing cover that covers the rectangular window and presses the chip component when the opening/closing cover is closed.

〔産業上の利用分野〕[Industrial application field]

本発明は、コンデンサ、抵抗体等の2電極型のチップ部
品の特性試験時に使用する、試験機の部品セット装置に
関する。
TECHNICAL FIELD The present invention relates to a component setting device for a testing machine used when testing characteristics of two-electrode chip components such as capacitors and resistors.

コンデンサ、抵抗体、或いは半導体部品等のチップ部品
は、予め特性試験を実施した後に、回路基板に実装する
のが一般である。
Chip components such as capacitors, resistors, or semiconductor components are generally mounted on circuit boards after conducting characteristic tests in advance.

このような特性試験は、能率的に実施し得ることが望ま
しい。
It is desirable that such characteristic tests can be carried out efficiently.

〔従来の技術〕[Conventional technology]

特性試験を実施するにあたり、チップ部品をセットする
従来方法を、第3図に示す。
FIG. 3 shows a conventional method of setting chip components when performing a characteristic test.

第3図において、1は、コンデンサ、抵抗体等の2電極
型のチップ部品である。チップ部品1の低い直方体状の
本体の対向する一対の側面、及びその側面に繋がる底面
の一部にかけて、それぞれ電極2を設けである。
In FIG. 3, reference numeral 1 indicates a two-electrode chip component such as a capacitor or a resistor. Electrodes 2 are provided on a pair of opposing side surfaces of the low rectangular parallelepiped main body of the chip component 1 and a portion of the bottom surface connected to the side surfaces.

デツプ部品1の特性試験を行うにあたり、従来はチップ
部品1を、試験機本体(図示省略)にプラグインするよ
うに構成したプリント板3に、半田付けして仮実装して
いる。
Conventionally, when performing a characteristic test of the deep part 1, the chip part 1 is temporarily mounted by soldering onto a printed board 3 configured to be plugged into a testing machine main body (not shown).

詳述すると、プリント板3のカードエツジ形接栓部5に
、複数対のパターン4を平行に設け、それぞれの対のパ
ターン4の端末に、対向してパッド4Aを形成しである
To be more specific, a plurality of pairs of patterns 4 are provided in parallel on the card edge type plug portion 5 of the printed board 3, and pads 4A are formed at the terminals of each pair of patterns 4 to face each other.

これらのパッド4A上に電極2を位置合わせし、チップ
部品1を半田付けして、プリント板3に複数のチップ部
品1を並列に実装している。
The electrodes 2 are aligned on these pads 4A, the chip components 1 are soldered, and the plurality of chip components 1 are mounted in parallel on the printed board 3.

このように、複数のチップ部品lを並列して実装した状
態で、プリント板3のカードエツジ形接栓部5を、試験
機本体に装着したジャック側コネククに挿着し、それぞ
れのチップ部品1の電極2を、対応する試験機本体の電
気回路に接続して、チップ部品1の特性試験を実施して
いる。
In this way, with a plurality of chip components 1 mounted in parallel, the card edge type connector 5 of the printed board 3 is inserted into the jack side connector attached to the main body of the tester, and each chip component 1 is mounted in parallel. The characteristic test of the chip component 1 is carried out by connecting the electrode 2 to the electric circuit of the corresponding test machine main body.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述のように、チップ部品をその都度プリント板に半田
付けして、特性試験を実施し、試験終了後に、半田を加
熱熔融させて、チップ部品1をプリント板3から取り外
すという、従来方法は、チップ部品のセットに、多大の
時間を要するという問題点があった。
As mentioned above, the conventional method is to solder a chip component to a printed board each time, conduct a characteristic test, and after the test is completed, heat and melt the solder and remove the chip component 1 from the printed board 3. There was a problem in that it took a lot of time to set up the chip parts.

一方、半田付は固着、半田の再熔融の数回の繰り返し作
業により、プリント板のパッド部分が剥離し損傷する。
On the other hand, during soldering, repeating the process of sticking and remelting the solder several times causes the pad portion of the printed board to peel off and become damaged.

また、試験すべきチップ部品は、高さがほぼ同一で、平
面視の矩形寸法が異なる数種のタイプがある。
Furthermore, there are several types of chip components to be tested that have approximately the same height and different rectangular dimensions in plan view.

したがって、それぞれの電極形状にあったパッドが必要
であり、そのため多数のプリント板を準備しなければな
らないという、段取り上の問題点があった。
Therefore, pads matching the shape of each electrode are required, which poses a setup problem in that a large number of printed boards must be prepared.

本発明はこのような点に鑑みて創作されたもので、チッ
プ部品の着脱作業が簡単で、且つ寸法形状が異なるチッ
プ部品に適用し得る部品セット装置を提供することを目
的としている。
The present invention was created in view of these points, and an object of the present invention is to provide a component setting device that allows easy attachment and detachment of chip components and can be applied to chip components of different sizes and shapes.

〔課題を解決するための手段〕[Means to solve the problem]

上記の目的を達成するために本発明は、第1図に例示し
たように、チップ部品1を基台11に並列にセットして
、チップ部品1の電極2と試験機本体(図示省略)とを
接続線8を介して接続し、チップ部品1の特性試験を実
施するよう構成した部品セット装置fIOであって、部
品セット装置10は、基台11と外枠板12と、外枠板
12内に摺動可能に装着されたスライダー20と、外枠
板12の角形窓13上を覆う開閉カバー30とで構成し
である。
In order to achieve the above object, the present invention, as illustrated in FIG. The component setting device fIO is configured to conduct a characteristic test of the chip component 1 by connecting the components via a connection line 8, and the component setting device 10 includes a base 11, an outer frame plate 12, It consists of a slider 20 that is slidably mounted inside, and an opening/closing cover 30 that covers the rectangular window 13 of the outer frame plate 12.

外枠板12は、基台11に相似でそれよりも所望に小さ
い横長の角形窓13を有し、基台11の上面に密着する
ように取付けである。
The outer frame plate 12 has a horizontally long rectangular window 13 similar to the base 11 and desirably smaller than the base 11, and is attached so as to be in close contact with the upper surface of the base 11.

複数の横梁部材20Aと複数の縦梁部材20Bとにより
、枡21がマトリックス状に配列された外形が角形のス
ライダー20を、外枠板12の角形窓13内に挿入し、
左右方向に摺動し得るように装着する。
A slider 20 having a rectangular outer shape in which cells 21 are arranged in a matrix by a plurality of horizontal beam members 20A and a plurality of vertical beam members 20B is inserted into the rectangular window 13 of the outer frame board 12,
Attach it so that it can slide left and right.

そして、固定挟持駒22をそれぞれの枡21内で、一方
の縦梁部材20B寄りに、基台上面11八に固着する。
Then, the fixed clamping pieces 22 are fixed to the base top surface 118 within each square 21 near one of the vertical beam members 20B.

また、可動挟持駒23を枡21内で他方の縦梁部材20
B寄りに、チップ部品1を挟んで固定挟持駒22に対向
する如くに装着する。この可動挟持駒23は、コイルば
ね25を介して園縦梁部材20Bに連結し、それぞれの
枡21内を摺動し得るものとする。
In addition, the movable clamping piece 23 is moved to the other longitudinal beam member 20 within the square 21.
It is mounted on the side B so as to face the fixed clamping piece 22 with the chip component 1 sandwiched therebetween. This movable clamping piece 23 is connected to the vertical beam member 20B via a coil spring 25, and is capable of sliding within each square 21.

一方、裏面側が接続線8を介して試験機本体に接続され
、双方の表面が基台上面11Aに一致し、それぞれの枡
21に対応した位置で並列する、固定側電極板32と可
動側電極板33とを、基台11に設ける。
On the other hand, the fixed side electrode plate 32 and the movable side electrode are connected on the back side to the testing machine main body via the connecting wire 8, both surfaces are aligned with the base top surface 11A, and are arranged in parallel at positions corresponding to the respective squares 21. A plate 33 is provided on the base 11.

さらに、角形窓13を覆う開閉カバー30の内側面で、
それぞれの枡21に対向して個所に、板ばね31を装着
し、開閉カバー30を閉じた状態でチップ部品1を押圧
する構成とする。
Furthermore, on the inner surface of the opening/closing cover 30 covering the square window 13,
A plate spring 31 is attached to a location facing each cell 21, and the chip component 1 is pressed with the opening/closing cover 30 closed.

〔作用〕[Effect]

上述のように、可動挟持駒23は、それぞれの枡21内
でチップ部品lを中に挟んで固定挟持駒22とと対向し
、且つコイルばね25を介して園縦梁部材20Bに連結
している。
As described above, the movable clamping piece 23 faces the fixed clamping piece 22 with the chip component l sandwiched therein in each cell 21, and is connected to the vertical beam member 20B via the coil spring 25. There is.

したがって、第2図(a)に示すように、スライダー2
0を角形窓13の前後の縁を案内にして固定挟持駒22
とは反対方向、即ち矢印A方向に摺動させると、固定挟
持駒22は基台上面11八に固定されていて動かないが
、可動挟持駒23はコイルばね25が引張コイルばねと
して作用して固定挟持駒22とは離れる方向に移動する
Therefore, as shown in FIG. 2(a), the slider 2
0 is fixed using the front and rear edges of the square window 13 as guides for the clamping piece 22.
When sliding in the opposite direction, that is, in the direction of arrow A, the fixed clamping piece 22 is fixed to the top surface 118 of the base and does not move, but the movable clamping piece 23 is moved by the coil spring 25 acting as a tension coil spring. It moves in a direction away from the fixed clamping piece 22.

よって、それぞれの一対の固定挟持駒22と可動挟持駒
23の間に、最大寸法のチップ部品1の平面視形状より
も十分に大きい空間ができ、チップ部品1をそれぞれの
枡21内の固定挟持駒22と可動挟持駒23との間に挿
入し、電極2を形成した底面を、対応する固定側電極板
32.可動側電極板33の上面に当接するように、チッ
プ部品1を基台11に載せることができる。
Therefore, between each pair of fixed clamping pieces 22 and movable clamping pieces 23, there is a space that is sufficiently larger than the plan view shape of the chip component 1 of the maximum size, and the chip component 1 can be fixedly clamped in each square 21. It is inserted between the piece 22 and the movable clamping piece 23, and the bottom surface on which the electrode 2 is formed is attached to the corresponding fixed side electrode plate 32. The chip component 1 can be placed on the base 11 so as to be in contact with the upper surface of the movable electrode plate 33.

次に第2図fb)に示すように、スライダー20を角形
窓13の前後の縁を案内にして固定挟持駒22方向。
Next, as shown in FIG. 2 fb), move the slider 20 toward the fixed clamping piece 22 using the front and rear edges of the square window 13 as guides.

即ち矢印B方向に摺動させると、コイルばね25が圧縮
コイルばね引張コイルばねとして作用し、可動挟持駒2
3を固定挟持駒22方向に押圧し、移動させる。
That is, when sliding in the direction of arrow B, the coil spring 25 acts as a compression coil spring or tension coil spring, and the movable clamping piece 2
3 in the direction of the fixed clamping piece 22 and move it.

よって、チップ部品1は、底面が基台上面11A上を摺
動して固定挟持駒22側に移動し、それぞれの電極2が
対応する固定側電極板32.可動側電極板33に接する
ような所定の位置で、固定挟持駒22と可動挟持駒23
とによって挟持され、その位置を維持する。
Therefore, the chip component 1 moves toward the fixed clamping piece 22 with the bottom surface sliding on the base top surface 11A, and each electrode 2 moves to the corresponding fixed side electrode plate 32. The fixed clamping piece 22 and the movable clamping piece 23 are held at a predetermined position such that they are in contact with the movable side electrode plate 33.
It is held between the two and maintains its position.

その後、第1図に図示したように、開閉カバー30を閉
じると、それぞれの枡21に対向して装着した板ばね3
1が、チップ部品1を基台上面11^側に押圧する。し
たがって、チップ部品1の電極2が、対応する固定側電
極板32.或いは可動側電極板33に密着し、電極2が
接続線8を介して試験機本体に接続する。
Thereafter, as shown in FIG.
1 presses the chip component 1 toward the top surface 11^ of the base. Therefore, the electrodes 2 of the chip component 1 are connected to the corresponding fixed side electrode plate 32. Alternatively, it is brought into close contact with the movable electrode plate 33, and the electrode 2 is connected to the testing machine main body via the connecting wire 8.

即ち、形状寸法の異なるチップ部品を同時に、部品セッ
ト装置10に装着して、特性試験を実施することができ
るという、汎用性を有している。
In other words, it has the versatility of being able to simultaneously mount chip components of different shapes and sizes on the component setting device 10 and conduct characteristic tests.

〔実施例〕〔Example〕

以下図を参照しながら、本発明を具体的に説明する。な
お、企図を通じて同一符号は同一対象物を示す。
The present invention will be specifically described below with reference to the drawings. Note that the same reference numerals refer to the same objects throughout the plan.

第1図は本発明の一実施例の構成図で、(a)は斜視図
、(blは断面図である。
FIG. 1 is a configuration diagram of an embodiment of the present invention, in which (a) is a perspective view and (bl is a sectional view).

第1図において、10は、チップ部品lを基台11に並
列にセットして、チップ部品1の電極2と試験機本体(
図示省略)とを接続vA8を介して接続する部品セット
装置であって、基台11と外枠板12と、外枠板12内
に摺動可能に装着したスライダー20と、外枠板12の
角形窓13上を覆う開閉カバー30等より構成しである
In FIG. 1, reference numeral 10 indicates that the chip component 1 is set in parallel on the base 11, and the electrode 2 of the chip component 1 and the testing machine main body (
(not shown) via a connection vA8, which includes a base 11, an outer frame plate 12, a slider 20 slidably mounted inside the outer frame plate 12, and a It consists of an opening/closing cover 30 that covers the square window 13 and the like.

外枠板12はほぼ額縁形で、基台(合成樹脂等の絶縁体
)11に相僚でそれよりも所望に小さい横長の角形窓1
3を有し、その下面が基台11の上面に密着した状態で
、ねじ止め等して基台11に固着しである。
The outer frame board 12 is almost in the shape of a picture frame, and a horizontally long rectangular window 1 which is smaller than the base 11 and which is desirably smaller than the base 11 is provided.
3, and is fixed to the base 11 by screwing or the like with its lower surface in close contact with the upper surface of the base 11.

格子形のスライダー20は、外枠板12の角形窓13内
に挿入し、角形窓13の前後の側縁をガイドとして、下
側面が基台上面11Aを摺動して、外枠板12内を左右
方向に摺動可能に装着しである。
The lattice-shaped slider 20 is inserted into the rectangular window 13 of the outer frame board 12, and the lower surface slides on the base top surface 11A using the front and rear side edges of the rectangular window 13 as guides, so that the slider 20 slides inside the outer frame board 12. It is attached so that it can be slid in the left and right direction.

このスライダー20は、複数(図は4本)の横梁部材2
〇八と複数(図は4本)の縦梁部材20Bとで、左右方
向に長い矩形状の枡21を、マトリックス状に配列して
(図では9個の枡)設けである。
This slider 20 includes a plurality of (four in the figure) horizontal beam members 2.
Rectangular squares 21 that are long in the left-right direction are arranged in a matrix (nine squares in the figure) using 08 and a plurality (four in the figure) of vertical beam members 20B.

外枠板12の一方の縦枠部材の中央部を切欠き、この切
欠き部に、スライダー20を移動させる偏心カム36を
装着しである。
A notch is formed in the center of one vertical frame member of the outer frame plate 12, and an eccentric cam 36 for moving the slider 20 is mounted in this notch.

詳述すると、この偏心カム36は縦枠部材を、前後方向
に水平に貫通し軸支された駆動軸35に固着している。
To be more specific, the eccentric cam 36 passes through the vertical frame member horizontally in the front-rear direction and is fixed to the drive shaft 35 which is supported.

したがって、駆動軸35の一方の端部に設けたレーバー
を倒すと、偏心カム36が回動しその偏心した突出面が
、スライダー20の縦梁部材20Bの外側面に当接する
ので、スライダー20が角形窓13内で偏心カム36と
は反対方向(図の左方向)に、摺動移動する。
Therefore, when the lever provided at one end of the drive shaft 35 is tilted, the eccentric cam 36 rotates and its eccentric protruding surface comes into contact with the outer surface of the longitudinal beam member 20B of the slider 20, so that the slider 20 It slides within the rectangular window 13 in the opposite direction to the eccentric cam 36 (to the left in the figure).

一方、スライダー20の偏心カム36とは反対側の、縦
梁部材20Bと外枠板12の縦枠部材との間に、圧縮コ
イルばね37を装着しである。
On the other hand, a compression coil spring 37 is installed between the vertical beam member 20B of the slider 20 and the vertical frame member of the outer frame plate 12 on the opposite side of the eccentric cam 36.

したがって、偏心カム36を駆動しない時は、スライダ
ー20は圧縮コイルばね37の弾力により、角形窓13
内で偏心カム36側(図の右方向)に位置している。
Therefore, when the eccentric cam 36 is not driven, the slider 20 is moved around the rectangular window 13 by the elasticity of the compression coil spring 37.
It is located on the eccentric cam 36 side (toward the right in the figure).

22は、前後方向に長い直方体状の固定挟持駒であって
、可動挟持駒23に対向する垂直面の中央部に、楔形切
込22八を設け、楔形切込22Aの両垂直面が、チップ
部品1の角を挟む2個面に当接するようにしである。
Reference numeral 22 denotes a rectangular parallelepiped-shaped fixed clamping piece that is long in the front-rear direction, and a wedge-shaped notch 228 is provided in the center of the vertical plane facing the movable clamping piece 23, and both vertical surfaces of the wedge-shaped notch 22A are used to hold the chip. It is designed so as to come into contact with two surfaces sandwiching the corner of the component 1.

このような固定挟持駒22を、それぞれの枡21内で、
一方の縦梁部材20B(図では圧縮コイルばね37側の
縦梁部材20B)寄りに、基台上面11Aにその底面を
密着させて固着しである。
Such fixed clamping pieces 22 are placed in each square 21,
One of the vertical beam members 20B (in the figure, the vertical beam member 20B on the side of the compression coil spring 37) is fixed with its bottom surface in close contact with the base upper surface 11A.

23は、固定挟持駒22とほぼ同形状の可動挟持駒であ
って、固定挟持駒22に対向する垂直面の中央部に、楔
形切込23Aを設け、楔形切込23^の両垂直面が、チ
ップ部品1の角を挟む2個面に当接するようにしである
Reference numeral 23 denotes a movable clamping piece having almost the same shape as the fixed clamping piece 22, and a wedge-shaped notch 23A is provided in the center of the vertical plane facing the fixed clamping piece 22, so that both vertical surfaces of the wedge-shaped notch 23^ , so as to come into contact with two surfaces sandwiching the corner of the chip component 1.

このような可動挟持駒23を、枡21内で固定挟持駒2
2に対向させ、コイルばね25を介して、他方の縦梁部
材20Bに連結させである。
Such a movable clamping piece 23 is fixed to the fixed clamping piece 2 in the square 21.
2 and connected to the other vertical beam member 20B via a coil spring 25.

したがって、可動挟持駒23はスライダー20に追従し
て移動するとともに、枡21内で左右方向摺動して、ス
ライダー20を駆動することにより、固定挟持駒22に
近接したり、或いは離れたりする。
Therefore, the movable clamping piece 23 moves following the slider 20, and also slides in the horizontal direction within the square 21 to move closer to or away from the fixed clamping piece 22 by driving the slider 20.

一方、それぞれの固定挟持駒22.可動挟持駒23に対
応して、基台上面11八部分に、固定側電極板32、可
動側電極板33を設けである。
On the other hand, each fixed clamping piece 22. A fixed electrode plate 32 and a movable electrode plate 33 are provided on the upper surface 118 of the base in correspondence with the movable clamping piece 23.

それぞれの固定側電極板32.可動側電極板33は、板
厚が薄い短冊形で、裏面に基台11の底面を貫通する端
子32A 、33^を有し、それぞれの端子32A 、
33Aは、図示省略した試験機本体に繋がる接続18の
端末を接続しである。
Each fixed side electrode plate 32. The movable electrode plate 33 has a thin rectangular shape, and has terminals 32A and 33^ on the back surface that penetrate through the bottom surface of the base 11, respectively.
33A is a terminal connected to the connection 18 which is connected to the main body of the test machine (not shown).

固定側電極板32.可動側電極板33は、双方の表面が
基台上面11Aに一致し、それぞれの枡21に対応した
位置で並列している。
Fixed side electrode plate 32. Both surfaces of the movable electrode plates 33 correspond to the base upper surface 11A, and are arranged in parallel at positions corresponding to the respective cells 21.

30は、角形窓13を覆う開閉カバーであって、外枠板
12の側縁に蝶着しである。開閉カバー30の開閉側の
側縁に、外枠板12の側面に設けた係合凹部に押入し係
合する、舌片形の板ばねを設け、開閉カバー30を閉じ
た状態で保持できるように構成しである。
30 is an opening/closing cover that covers the rectangular window 13 and is hinged to the side edge of the outer frame board 12. A tongue-shaped plate spring is provided on the side edge of the opening/closing side of the opening/closing cover 30 to be pushed into and engaged with an engagement recess provided on the side surface of the outer frame plate 12, so that the opening/closing cover 30 can be held in a closed state. It is composed of:

さて、開閉カバー30の内側面で、それぞれの枡21に
対向して個所に、板ばね31を装着しである。
Now, leaf springs 31 are attached to the inner surface of the opening/closing cover 30 at locations facing each of the cells 21.

この板ばね31は、開閉カバー30を閉じた状態で、そ
れぞれの枡21内に挿入したチップ部品1を、W台上面
11Aに押圧させる。
This leaf spring 31 presses the chip component 1 inserted into each cell 21 against the top surface 11A of the W stand with the open/close cover 30 closed.

本発明の部品セット装置10は、上述のように構成しで
あるので、常時は圧縮コイルばね37の弾力により、ス
ライダー20が角形窓13の前後の縁を案内にして固定
挟持駒22とは反対方向、即ち偏心カム36方向に移動
した位置で停止している。
Since the component setting device 10 of the present invention is configured as described above, the slider 20 is normally guided by the front and rear edges of the rectangular window 13 by the elasticity of the compression coil spring 37, and is opposed to the fixed clamping piece 22. It stops at a position moved in the direction, that is, in the direction of the eccentric cam 36.

したがって、第1図、第2図に示したように、可動挟持
駒23はコイルばね25が引張コイルばねとして作用し
て固定挟持駒22とは離れる方向に移動しており、それ
ぞれの一対の固定挟持駒22と可動挟持駒23の間に、
最大寸法のチップ部品1の平面視形状よりも十分に大き
い空間ができている。
Therefore, as shown in FIGS. 1 and 2, the coil spring 25 acts as a tension coil spring, and the movable clamping piece 23 moves in a direction away from the fixed clamping piece 22. Between the clamping piece 22 and the movable clamping piece 23,
A space that is sufficiently larger than the plan view shape of the chip component 1 of the maximum size is created.

それぞれの枡21内に形成されたこのような空間に、チ
ップ部品1の一方の角が固定挟持駒22の樹形切込22
Aに、対角線上の他方の角が可動挟持駒23の樹形切込
23^に向い合い、かつ底面が基台上面11Aに載るよ
うに、チップ部品1を挿入する。
In such a space formed in each square 21, one corner of the chip component 1 is formed into a tree-shaped notch 22 of the fixed clamping piece 22.
The chip component 1 is inserted into A so that the other diagonal corner faces the tree-shaped notch 23^ of the movable clamping piece 23 and the bottom surface rests on the top surface 11A of the base.

次に、駆動軸35を手で回動駆動して偏心カム36を回
動させると、スライダー20が、圧縮コイルばね37の
弾力に抗して、角形窓13の前後の縁を案内にして固定
挟持駒22方向に摺動移動する。
Next, when the drive shaft 35 is rotated by hand to rotate the eccentric cam 36, the slider 20 is fixed using the front and rear edges of the rectangular window 13 as guides against the elasticity of the compression coil spring 37. The clamping piece 22 slides in the direction.

したがって、コイルばね25が圧縮コイルばね引張コイ
ルばねとして作用しして可動挟持駒23を固定挟持駒2
2方向に押し、可動挟持駒23がチップ部品1を押して
、チップ部品1は、底面が基台上面11A上を摺動して
固定挟持駒22側に移動し、固定挟持駒22と可動挟持
駒23とによって挟持される。
Therefore, the coil spring 25 acts as a compression coil spring and a tension coil spring to fix the movable clamping piece 23 to the clamping piece 2.
Pushing in two directions, the movable clamping piece 23 pushes the chip component 1, the bottom surface of the chip component 1 slides on the base top surface 11A and moves toward the fixed clamping piece 22, and the chip component 1 moves between the fixed clamping piece 22 and the movable clamping piece. 23.

この挟持される位置は、チ!ノブ部品1のそれぞれの電
極2が、対応する固定側電極板32.可動側電極板33
に接するような所定の位置である。
This sandwiched position is like, ! Each electrode 2 of the knob component 1 is attached to a corresponding fixed side electrode plate 32 . Movable side electrode plate 33
It is a predetermined position that is in contact with the .

そして、開閉カバー30を閉じると、それぞれの枡21
に対向して装着した板ばね31が、チップ部品1を基台
上面11A側に押圧する。よって、チップ部品1の電極
2が、対応する固定側電極板32.或いは可動側電極板
33に密着し、電極2が接続線8を介して試験機本体に
接続する。
Then, when the opening/closing cover 30 is closed, each cell 21
A leaf spring 31 mounted facing the presses the chip component 1 toward the top surface 11A of the base. Therefore, the electrodes 2 of the chip component 1 are connected to the corresponding fixed side electrode plate 32. Alternatively, it is brought into close contact with the movable electrode plate 33, and the electrode 2 is connected to the testing machine main body via the connecting wire 8.

特性試験が終了し駆動軸35を元の状態に回動すると、
圧縮コイルばね37の弾力により、スライダー20が移
動して元の状態に復帰する。
When the characteristic test is completed and the drive shaft 35 is rotated to its original state,
Due to the elasticity of the compression coil spring 37, the slider 20 moves and returns to its original state.

よってそれぞれの枡2I内から、チ・71部部品を容易
に取り出すことができる。
Therefore, the 71 parts can be easily taken out from inside each cell 2I.

本発明の部品セット装置10は、上述のように形状寸法
の異なるチップ部品をも同時に、セットすることができ
汎用性があるばかりでなく、チップ部品の着脱作業が極
めて容易である。
The component setting device 10 of the present invention is not only versatile because it can simultaneously set chip components having different shapes and dimensions as described above, but also extremely easy to attach and detach chip components.

なお、固定挟持駒22.可動挟持駒23は単に直方体形
でもよいが、樹形切込を設けた方が、チップ部品を挟持
する位置が所定に設定され、固定側電極板、可動側電極
板との接続の信軌度が高いというメリットがある。
Note that the fixed clamping piece 22. The movable clamping piece 23 may have a simple rectangular parallelepiped shape, but if it is provided with a tree-shaped cut, the position at which the chip component is clamped can be set to a predetermined value, and the reliability of the connection between the fixed side electrode plate and the movable side electrode plate can be improved. It has the advantage of being high.

さらにまた、スライダー20を移動する手段は、偏心カ
ム36と圧縮コイルばね37との組合わせ手段に限定さ
れるものでなく、例えば手で直接スライダー20を移動
させてても良い。
Furthermore, the means for moving the slider 20 is not limited to the combination of the eccentric cam 36 and the compression coil spring 37, and the slider 20 may be moved directly by hand, for example.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、固定挟持駒と可動挟持駒
とを、スライダーのそれぞれの樹内に装着して、チップ
部品を所定の位置に保持し、電極を対向する電極板に圧
接するように構成した部品セット装置であって、チップ
部品の着脱作業が簡単で、且つ寸法形状が異なるチップ
部品に適用して、汎用性がある等実用上で優れた効果が
ある。
As explained above, in the present invention, a fixed clamping piece and a movable clamping piece are installed in each of the sliders to hold the chip component in a predetermined position and press the electrode against the opposing electrode plate. This component setting device has excellent practical effects such as easy attachment and detachment of chip components, and is applicable to chip components of different sizes and shapes, and is versatile.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例の構成図で、 +a)は斜視図、 (b)は断面図、 第2図の+al、 (b)は本発明の詳細な説明する図
、第3図は従来例の斜視図である。 図において、 1はチップ部品、    2は電極、 3はプリント板、    8は接続線、10は部品セッ
ト装置、 11は基台、11八は基台上面、   12
は外枠板、13は角形窓、     20はスライダー
21は枡、       22は固定挟持駒、23は可
動挟持駒、 25はコイルばね、 30は開閉カバー、 31は板ばねをそれぞれ示す。
Fig. 1 is a configuration diagram of an embodiment of the present invention, +a) is a perspective view, (b) is a sectional view, +al in Fig. 2, (b) is a diagram explaining the present invention in detail, and Fig. 3 is a It is a perspective view of a conventional example. In the figure, 1 is a chip component, 2 is an electrode, 3 is a printed board, 8 is a connection line, 10 is a component setting device, 11 is a base, 118 is the top surface of the base, 12
13 is an outer frame plate, 13 is a rectangular window, 20 is a slider 21, 22 is a fixed clamping piece, 23 is a movable clamping piece, 25 is a coil spring, 30 is an opening/closing cover, and 31 is a leaf spring.

Claims (1)

【特許請求の範囲】 チップ部品(1)を基台(11)にセットして、電極(
2)と試験機本体とを接続線を介して接続し、該チップ
部品(1)の特性試験を実施するよう構成した部品セッ
ト装置であって、 複数の横梁部材(20A)と複数の縦梁部材(20B)
とが直交して枡(21)がマトリックス状に配列し、前
記基台(11)上に装着した外枠板(12)の角形窓(
13)内に挿入されて、左右に摺動し得るよう装着され
たスライダー(20)と、 それぞれの該枡(21)内で、基台上面(11A)に固
定した固定挟持駒(22)と、 該枡(21)内を摺動可能にコイルばね(25)を介し
て該横梁部材(20A)に連結し、該枡(21)に挿入
・載置した前記チップ部品(1)を挟んで、該固定挟持
駒(22)に対向して装着された可動挟持駒(23)と
、裏面側が接続線(8)を介して前記試験機本体に接続
され、双方の表面が該基台上面(11A)に一致し、そ
れぞれの該枡(21)に対応した位置で並列して該基台
(11)に固着された、固定側電極板(32)及び可動
側電極板(33)と、 それぞれの該枡(21)に対向して、該角形窓(13)
を覆う開閉カバー(30)の内側面に装着され、該開閉
カバー(30)を閉じた状態で該チップ部品(1)を押
圧する板ばね(31)と、 を備えたことを特徴とする試験機の部品セット装置。
[Claims] The chip component (1) is set on the base (11), and the electrode (
A component setting device configured to connect the chip component (2) and the testing machine main body via a connecting line to conduct a characteristic test of the chip component (1), which includes a plurality of horizontal beam members (20A) and a plurality of longitudinal beams. Parts (20B)
The square windows (21) of the outer frame board (12) mounted on the base (11) are arranged in a matrix with the square windows (21) orthogonal to each other.
13), a slider (20) inserted into the box and mounted so as to be able to slide left and right, and a fixed clamping piece (22) fixed to the top surface of the base (11A) in each of the squares (21). , connected to the cross beam member (20A) via a coil spring (25) so as to be able to slide inside the cell (21), and sandwiching the chip component (1) inserted and placed in the cell (21). , the movable clamping piece (23) mounted opposite to the fixed clamping piece (22) and the back side are connected to the tester main body via the connection line (8), and both surfaces are connected to the top surface of the base ( 11A) and fixed side electrode plates (32) and movable side electrode plates (33), which are fixed to the base (11) in parallel at positions corresponding to the respective cells (21), respectively. Opposing the square (21), the square window (13)
a leaf spring (31) attached to the inner surface of an opening/closing cover (30) that covers the opening/closing cover (30) and pressing the chip component (1) with the opening/closing cover (30) closed; Machine parts setting device.
JP63260974A 1988-10-17 1988-10-17 Setting device of component of tester Pending JPH02107978A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63260974A JPH02107978A (en) 1988-10-17 1988-10-17 Setting device of component of tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63260974A JPH02107978A (en) 1988-10-17 1988-10-17 Setting device of component of tester

Publications (1)

Publication Number Publication Date
JPH02107978A true JPH02107978A (en) 1990-04-19

Family

ID=17355333

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63260974A Pending JPH02107978A (en) 1988-10-17 1988-10-17 Setting device of component of tester

Country Status (1)

Country Link
JP (1) JPH02107978A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040001118A (en) * 2002-06-27 2004-01-07 대우전자주식회사 Accelerated life time test device of tantalum solid electrolytic capacitor
KR20040001117A (en) * 2002-06-27 2004-01-07 대우전자주식회사 Accelerated life time test device of multi-layer ceramic capacitor
KR100865890B1 (en) * 2007-03-23 2008-10-29 세크론 주식회사 Test aid
KR100917000B1 (en) * 2007-03-23 2009-09-14 세크론 주식회사 Test aid
CN104810166A (en) * 2015-05-07 2015-07-29 益阳市和天电子有限公司 Capacitor and capacitor experiment table

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040001118A (en) * 2002-06-27 2004-01-07 대우전자주식회사 Accelerated life time test device of tantalum solid electrolytic capacitor
KR20040001117A (en) * 2002-06-27 2004-01-07 대우전자주식회사 Accelerated life time test device of multi-layer ceramic capacitor
KR100865890B1 (en) * 2007-03-23 2008-10-29 세크론 주식회사 Test aid
KR100917000B1 (en) * 2007-03-23 2009-09-14 세크론 주식회사 Test aid
CN104810166A (en) * 2015-05-07 2015-07-29 益阳市和天电子有限公司 Capacitor and capacitor experiment table

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